Rapid calibration method and device suitable for analog quantity device

Abstract

The invention belongs to the technical field of device calibration, and discloses a rapid calibration method and device suitable for an analog quantity device. Comprising the following steps: constructing an initial simulation model corresponding to a reference analog quantity device, and carrying out iterative optimization on the initial simulation model to obtain a standard simulation model; inputting a step signal into the analog quantity device to be calibrated to obtain step response data of any two moments in a first preset time window; acquiring an actual gain speed based on the step response data at any two moments, and judging that the analog quantity device to be calibrated is an abnormal device when judging that the actual gain speed is not in a preset gain speed range; otherwise, inputting the step response data at the plurality of moments into a standard simulation model, and introducing an oscillation frequency equation to obtain a target simulation model corresponding to the analog quantity device to be calibrated; and determining an actual calibration range based on prediction of the target simulation model. According to the invention, the calibration time cost is greatly reduced.

Description

Technical Field

[0001] The invention relates to the technical field of device calibration, and in particular to a rapid calibration method and device suitable for analog devices. Background Art

[0002] Analog devices are a general term for components that use continuously changing analog signals as output signals. Calibration of various analog devices before leaving the factory is the key to ensuring that their output signals are accurate and reliable in actual applications.

[0003] The specific process of calibrating analog devices in the prior art is: first, a step signal of a self-calibration device is obtained as a test signal, and input into the analog device to be calibrated; second, the step response of the analog device to be calibrated is detected, and when the response output reaches a stable state based on the corresponding step response curve, the corresponding actual high point value and the actual low point value are obtained to determine the actual range; finally, the actual range is compared with the standard range, and the actual range is compensated based on the comparison result to achieve calibration.

[0004] However, in the actual calibration process, the above existing calibration methods need to wait for the output of the calibrated analog device to reach a stable state before measuring. Most analog devices are affected by internal characteristics or environmental factors and often take a long time to reach a stable state, especially for the output of high-point values, which leads to the defect of a long single calibration cycle. In particular, the time delay caused by waiting for the stable value will accumulate with the increase of the number of calibrations during large-scale production calibration or multi-system parallel calibration, thereby greatly increasing the time cost of calibration. Summary of the invention

[0005] The present invention aims to provide a rapid calibration method and device suitable for analog devices to solve the technical problem of long calibration time in the existing calibration process.

[0006] To achieve the above object, the present invention proposes the following technical solutions:

[0007] In a first aspect, the present technical solution provides a rapid calibration method applicable to analog devices, comprising:

[0008] An initial simulation model corresponding to a reference analog device is constructed based on the transfer function, and the initial simulation model is iteratively optimized until the difference between the simulation response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model;

[0009] Wherein, the reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal;

[0010] Inputting a step signal to the analog device to be calibrated obtains step response data at any number of moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in the rising stage;

[0011] Acquiring an actual gain speed based on the step response data at the plurality of moments, and then determining that the actual gain speed is not within a preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending the calibration of the analog device to be calibrated;

[0012] If it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated;

[0013] Based on the target simulation model, the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated are predicted to determine the calibration range.

[0014] Furthermore, the method of predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range includes:

[0015] When it is determined that the preset verification cycle has been reached, a number of actual step response data within a second preset time window is obtained based on the analog device to be calibrated, and corresponding predicted step response data is obtained based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable;

[0016] When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

[0017] Furthermore, the method of constructing an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimizing the initial simulation model until the difference between a simulation response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold value to obtain a standard simulation model; includes:

[0018] When the reference analog device is a second-order system, the corresponding response equation is:

[0019]

[0020] Where ζ is the damping ratio, wn is the natural frequency, t is the time, and φ=arccos(ζ).

[0021] Further, if the actual gain speed is judged to be within a preset gain speed range, the step response data at the several moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated; comprising:

[0022] Obtain the step response data at any two moments, and substitute them into the response equation to obtain a set of attenuation signal functions of the analog devices to be calibrated:

[0023]

[0024] Wherein, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to the time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to the time point t2;

[0025] The ratio of the attenuation signal function of the set of analog devices to be calibrated is solved to eliminate the phase angle, and an intermediate attenuation signal function of the analog device to be calibrated is obtained as follows:

[0026]

[0027] in,

[0028] Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency;

[0029] Among them, w d is the oscillation frequency, estimated from the peak interval in the step response signal.

[0030] Further, after predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range:

[0031] If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device fault report is generated and sent to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response;

[0032] If the determined calibration range does not exceed the expected tolerance range, it is compensated.

[0033] In a second aspect, the technical solution provides a rapid calibration device suitable for analog devices, comprising:

[0034] A first construction module is used to construct an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimize the initial simulation model until the difference between a simulation response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model;

[0035] Wherein, the reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal;

[0036] A first acquisition module is used to input a step signal to the analog device to be calibrated to obtain step response data at several moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising stage;

[0037] A first judgment module is used to obtain an actual gain speed based on the step response data at the plurality of moments, and then judge that the actual gain speed is not within a preset gain speed range, then judge that the analog quantity device to be calibrated is an abnormal device, and end the calibration of the analog quantity device to be calibrated;

[0038] The second construction module is used to determine that the actual gain speed is within a preset gain speed range, input the step response data at the several moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated;

[0039] The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range.

[0040] Further, including:

[0041] A second acquisition module is used to determine that when a preset verification cycle is reached, obtain a number of actual step response data within a second preset time window based on the analog device to be calibrated, and obtain corresponding predicted step response data based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable;

[0042] The model updating module is used to optimize the standard simulation model again when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

[0043] Further, including:

[0044] The second judgment module is used to judge that the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, and then generate a device fault report and send it to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response;

[0045] The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

[0046] In a third aspect, the technical solution provides an electronic device, comprising at least one processor, wherein the processor is coupled to a memory, wherein a computer program is stored in the memory, and wherein the computer program is configured to execute the method described when executed by the processor.

[0047] In a fourth aspect, the present technical solution provides a computer-readable storage medium having a computer program stored thereon, and the computer program implements the described method when executed by a computer.

[0048] Beneficial effects:

[0049] It can be seen from the above technical solutions that the technical solution of the present invention provides a fast calibration method suitable for analog devices to solve the technical defect of high time cost in the existing calibration methods.

[0050] Considering that the existing calibration method uses the actual stable value as the detection target, and the acquisition of the stable value requires a long stabilization time, which increases the calibration time cost. Based on this, this technical solution considers calibration from the perspective of transient response, so as to achieve the calibration purpose of improving time efficiency.

[0051] Specifically, first, an initial simulation model corresponding to a reference analog device is constructed based on a transfer function, and the initial simulation model is iteratively optimized until the difference between the simulation response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model. The reference analog device is a standard device corresponding to the analog device to be calibrated. In order to improve the accuracy of the standard simulation model and effectively obtain dynamic characteristics to reduce the time cost in calibration, in the process of building the initial simulation model, the damping ratio, natural frequency, transfer delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal.

[0052] Secondly, a step signal is input to the analog device to be calibrated to obtain step response data at several moments within the first preset time window; wherein, the first preset time window is a time window starting from the response start moment and in the rising stage. At this time, the actual data acquisition process will start from the step response, that is, only two data points need to be collected; there is no need to wait for the stable value to appear. Then, in order to further reduce the time cost, the actual gain speed is obtained based on the step response data at the several moments, and then it is determined that the actual gain speed is not within the preset gain speed range, then the analog device to be calibrated is determined to be an abnormal device, and the calibration of the analog device to be calibrated is terminated. At this time, the continued calibration of the abnormal device can be terminated through the intermediate judgment of this step, thereby avoiding invalid time cost consumption.

[0053] Continuing, if the actual gain speed is within the preset gain speed range, the step response data at the several moments are input into the standard simulation model, and the oscillation frequency equation is introduced to obtain the target simulation model corresponding to the analog device to be calibrated. At this time, the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated are predicted based on the target simulation model to determine the calibration range.

[0054] In summary, this technical solution constructs a standard simulation model to pre-model the dynamic behavior of the calibration system, and by collecting the transient response of the output, analyzes its changing trend within a short time window, and then predicts the final stable output value of the corresponding analog device to be calibrated, without having to wait for the calibration system to be completely stable, thereby achieving the purpose of greatly shortening the time required for calibration.

[0055] It should be appreciated that all combinations of the foregoing concepts, as well as additional concepts described in greater detail below, may be considered to be part of the inventive subject matter of the present disclosure, provided such concepts are not mutually inconsistent.

[0056] The foregoing and other aspects, embodiments and features of the present invention can be more fully understood from the following description in conjunction with the accompanying drawings. Other additional aspects of the present invention, such as the features and / or beneficial effects of the exemplary embodiments, will be apparent from the following description or learned from the practice of the specific embodiments according to the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] The drawings are not intended to be drawn to scale. In the drawings, each identical or nearly identical component shown in various figures may be represented by the same reference numeral. For clarity, not every component is labeled in every figure. Embodiments of various aspects of the present invention will now be described by way of example and with reference to the accompanying drawings, in which:

[0058] Figure 1 This is a flow chart of a rapid calibration method applicable to analog devices described in this embodiment;

[0059] Figure 2 A flowchart for obtaining a target simulation model;

[0060] Figure 3 Flowchart for optimization of standard simulation models;

[0061] Figure 4 Flow chart for post-calibration processing;

[0062] Figure 5 This is a structural block diagram of a rapid calibration device applicable to analog devices according to this embodiment;

[0063] Figure 6 is a structural block diagram of the electronic device described in this embodiment. DETAILED DESCRIPTION

[0064] In order to make the purpose, technical solution and advantages of the embodiment of the present invention clearer, the technical solution of the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings of the embodiment of the present invention. Obviously, the described embodiment is a part of the embodiment of the present invention, not all of the embodiments. Based on the described embodiment of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Unless otherwise defined, the technical terms or scientific terms used herein should be the common meaning understood by people with general skills in the field to which the present invention belongs.

[0065] The words "first", "second" and similar words used in the specification and claims of this application do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, unless the context clearly indicates otherwise, the singular form of "a", "an" or "the" and other similar words do not indicate a quantitative limitation, but rather indicate the presence of at least one. Words such as "include" or "comprise" and the like mean that the elements or objects appearing before "include" or "comprise" cover the features, wholes, steps, operations, elements and / or components listed after "include" or "comprise", and do not exclude the existence or addition of one or more other features, wholes, steps, operations, elements, components and / or their collections. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0066] The goal of calibration is to find the output range of the analog device to be calibrated, including high points and low points, that is, the maximum output response value and the minimum output response value. In the calibration of output deviation and overshoot of traditional analog devices, the analog device to be calibrated is usually driven by a step signal, and then the step response of the output of the analog device to be calibrated is stabilized (that is, the response value is close to the stable value) before data acquisition. However, due to internal characteristics or environmental factors (for example, for a second-order system with relatively low damping, due to oscillation and output deviation, overshoot phenomenon, the system needs a certain amount of time to reach a stable state) in the calibration of some analog devices, it may take a long time to stabilize, especially at the output high point. At the same time, this time delay will also accumulate, especially in the occasion where multiple calibrations are required, thereby greatly increasing the time cost of the overall calibration. Based on this, the present embodiment provides a fast calibration method suitable for analog devices to improve the above-mentioned technical defects.

[0067] The following is a detailed introduction to the rapid calibration method applicable to analog devices described in this embodiment in conjunction with the accompanying drawings.

[0068] Combination Figure 1 As shown, the method comprises the following steps:

[0069] Step S102, constructing an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimizing the initial simulation model until the difference between a simulation response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model.

[0070] In this embodiment, the reference analog device is a standard device corresponding to the analog device to be calibrated, and the specific modeling software used is MATLAB software.

[0071] In the specific implementation, the focus is on accurately modeling and optimizing the dynamic response from the following aspects:

[0072] In the modeling process, MATLAB is used to model the dynamic characteristics in the early stage, and the transfer function or state space model is usually used to describe the response characteristics. The modeling process will focus on key dynamic parameters such as the system's natural frequency, damping ratio, and response speed. These parameters directly affect the step response curve and thus affect the output stability of the system.

[0073] During the parameter tuning process, parameter identification methods such as frequency response method or least squares method are used, combined with the actual system data, to estimate the parameters in the model, and through repeated simulation, the model parameters are tuned to ensure that the simulation results match the actual measurement data to a certain degree of accuracy (specifically, in this embodiment, the error needs to be less than 5%).

[0074] In the process of simulation analysis and optimization standards, common excitation signals such as step response and pulse response are used to observe the response of the system under different excitation conditions, and dynamic indicators such as system stability time and peak time are recorded. "Short response time, small overshoot, and high stability" are used as the standard for dynamic response model optimization, with particular attention paid to the main characteristics of the system during transient response, so that high-point calibration can be accelerated without affecting accuracy.

[0075] Specifically, the following model parameters are concerned: First, the damping ratio and natural frequency, which directly determine the response speed and stability, and are crucial to the accuracy of gain speed measurement. Second, the transmission delay and system gain, which affect the output amplitude and response speed of the system. Through these parameters, the system response can be adjusted to approach the real dynamic characteristics. In order to reduce the impact of noise interference on the accuracy of the model, the Kalman filter is used in modeling to filter noise and eliminate the impact of noise on signal quality.

[0076] As a specific implementation method, considering the universality of the second-order system (that is, higher-order systems can be simplified to second-order system processing), the second-order system is taken as an example, and the simulation process based on MATLAB software is as follows:

[0077] Use MATLAB's Control System Toolbox to create the transfer function:

[0078] % Parameter definition

[0079] w n =1;% natural frequency

[0080] zeta=0.5;%damping ratio

[0081] % Create transfer function

[0082] num=[wn^2];%Number

[0083] den=[1,2*zeta*wn,wn^2];%denominator

[0084] sys=tf(num,den); %Create transfer function object

[0085] Use the step() function to simulate a step response, or use the lsim() function to simulate the response of an arbitrary input signal.

[0086] a. Step response simulation:

[0087] % Step response simulation

[0088] figure;

[0089] step(sys);

[0090] title('Second-order system step response');

[0091] grid on;

[0092] b. Arbitrary input signal response simulation:

[0093] If you want to use a custom input signal (like a sine wave or something else), you can use the lsim() function:

[0094] % time vector

[0095] t=0:0.01:10; %0 to 10 seconds, step length 0.01 second

[0096] %Custom input signal (such as sine wave)

[0097] input_signal = sin(2*pi*0.5*t); % 0.5Hz sine wave

[0098] % Simulation system response

[0099] figure;

[0100] lsim(sys,input_signal,t);

[0101] title('Response of a second-order system to a sinusoidal input signal');

[0102] grid on.

[0103] Specifically, in the graphics window, you can see the response of the second-order system to the input signal. Depending on the damping ratio and natural frequency, the response characteristics of the system will be different. You can adjust wn and zeta values ​​and observe the effect on the response.

[0104] If you need to export the results, you can use the saveas() function to save the graph:

[0105] saveas(gcf,'second_order_response.png').

[0106] Based on the above simulation process, when it is a second-order system, the response equation corresponding to the standard simulation model finally obtained in this embodiment is:

[0107]

[0108] Among them, ζ is the damping ratio, wn is the natural frequency, t is the time, and φ = arccos(ζ).

[0109] Step S104: input a step signal to the analog device to be calibrated to obtain step response data at any number of moments within a first preset time window.

[0110] In this embodiment, the step signal is automatically sent by an automatic test system controlled by PLC or LabVIEW to achieve automatic calibration. Wherein, the first preset time window is a time window starting from the response start time and in the rising stage.

[0111] When the analog device to be calibrated is a second-order system, it is only necessary to obtain the step response data at any two moments.

[0112] Step S106, obtaining the actual gain speed based on the step response data at the several moments, and then determining that the actual gain speed is not within the preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending the calibration of the analog device to be calibrated.

[0113] At this time, based on step S106, the abnormal device can be pre-identified by the gain speed, and then the calibration is terminated, thereby avoiding unnecessary time consumption.

[0114] Step S108: if it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated.

[0115] As a specific implementation method, Figure 2 As shown, when the analog device to be calibrated is a second-order system, the corresponding target simulation model acquisition process is:

[0116] Step S1082: Obtain the step response data at any two moments, and substitute them into the response equation to obtain a set of attenuation signal functions of the analog devices to be calibrated:

[0117]

[0118] Among them, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to the time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to the time point t2.

[0119] Step S1084, solving the ratio of the attenuation signal function of the group of analog devices to be calibrated to eliminate the phase angle, and obtaining an intermediate attenuation signal function of the analog device to be calibrated:

[0120]

[0121] in,

[0122] Step S1086: Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency.

[0123] Among them, w d is the oscillation frequency, estimated from the peak interval in the step response signal.

[0124] At this time, based on steps S1082 to S1086, the specific values ​​of the parameters in the simulation model corresponding to the analog device to be calibrated can be obtained, thereby realizing the subsequent calibration range prediction. Specifically, continue with the following steps:

[0125] Step S110 , predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range.

[0126] As a preferred implementation, in order to further improve the accuracy of the model and improve the accuracy of the obtained prediction calibration range, Figure 3 As shown, before step S110, it also includes:

[0127] Step S1092: when it is determined that the preset verification cycle has been reached, a number of actual step response data within a second preset time window are obtained based on the analog device to be calibrated, and corresponding predicted step response data are obtained based on the target simulation model.

[0128] In a specific implementation, the second preset time window is any time window after the actual response of the analog device to be calibrated is stable.

[0129] Step S1094: When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

[0130] At this time, the simulation model will be iteratively optimized based on steps S1092 to S1094, so that the accuracy of the model is confirmed and optimized during the calibration process, thereby achieving an improvement in prediction accuracy.

[0131] Combination Figure 4 As shown, the following steps are also included to process the calibration results:

[0132] Step S1122: If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device failure report is generated and sent to the control end.

[0133] In specific implementation, the device fault report includes: detection time, detection data, device number, fault type; wherein the fault type includes: output deviation, overshoot, oscillation, no response. The output deviation is: whether the steady-state output value is within the expected tolerance range; the overshoot is: the output response is greater than the maximum input value; the oscillation is: there is a continuous oscillation; the no response is: no output signal or the response is too slow.

[0134] Specifically, if the analog device to be calibrated is an abnormal device, step S1122 may be performed after step S106.

[0135] During the device fault report sending process, there will be sound and light alarms or interface prompts to facilitate relevant personnel to handle and confirm the abnormality as soon as possible, and the calibration will be terminated to avoid time consumption or damage to the calibration equipment or the analog device to be calibrated due to other reasons.

[0136] Step S1124: If the determined calibration range does not exceed the expected tolerance range, compensation is performed therefor.

[0137] In order to facilitate the traceability of the calibration process and support production decisions, this embodiment automatically stores a large amount of test data generated in each stage through a local database or a cloud database for subsequent analysis or fault diagnosis. Specifically, the stored data types include time series data, gain speed, system oscillation times, steady-state value, overshoot amplitude, etc.

[0138] In summary, the method described in this embodiment predicts the steady-state value by transient response measurement, avoiding a long wait for the system output to stabilize and greatly shortening the calibration time. At the same time, it can automatically detect faults during the test process, issue an early warning or automatically terminate the test to avoid further damage. The automatic storage of calibration data and production data ensures data traceability and also helps quality control and equipment maintenance.

[0139] The above program can be run in the processor, or it can be stored in the memory (or computer-readable storage medium), which includes permanent and non-permanent, removable and non-removable media. Information storage can be achieved by any method or technology. Information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, tape disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined in this article, computer-readable media does not include temporary computer-readable media, such as modulated data signals and carrier waves.

[0140] These computer programs can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, so that the instructions executed on the computer or other programmable device provide instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps of the functions specified in one or more blocks can be implemented by different modules corresponding to different steps.

[0141] This embodiment also provides a rapid calibration device suitable for analog devices. Figure 5 As shown, the device includes the following functional modules:

[0142] The first construction module is used to construct an initial simulation model corresponding to the reference analog device based on the transfer function, and iteratively optimize the initial simulation model until the difference between the simulation response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model. The reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transfer delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal.

[0143] The first acquisition module is used to input a step signal to the analog device to be calibrated to obtain step response data at any two moments in a first preset time window; wherein the first preset time window is a time window that takes the response start moment as the starting point and is in a rising phase.

[0144] The first judgment module is used to obtain the actual gain speed based on the step response data at any two moments, and then judge that the actual gain speed is not within a preset gain speed range, then judge that the analog device to be calibrated is an abnormal device, and end the calibration of the analog device to be calibrated.

[0145] The second construction module is used to determine that the actual gain speed is within a preset gain speed range, then input the step response data of any two moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated.

[0146] The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range.

[0147] Since the device is constructed based on the method, what has been described above will not be repeated here.

[0148] For example, the device further comprises:

[0149] The second acquisition module is used to determine that when a preset verification cycle is reached, a number of actual step response data within a second preset time window is acquired based on the analog device to be calibrated, and corresponding predicted step response data is acquired based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable.

[0150] The model updating module is used to optimize the standard simulation model again when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

[0151] For another example, the device further includes:

[0152] The second judgment module is used to judge whether the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, and then generate a device fault report and send it to the control end; wherein, the device fault report includes: detection time, detection data, device number, fault type; wherein, the fault type includes: output deviation, overshoot, oscillation, and no response.

[0153] The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

[0154] Combination Figure 6 As shown, this embodiment further provides an electronic device, including at least one processor, wherein the processor is coupled to a memory, wherein a computer program is stored in the memory, and wherein the computer program is configured to execute the method when executed by the processor.

[0155] At the same time, a computer-readable storage medium is also provided, on which a computer program is stored, and when the computer program is executed by a computer, the method described above is implemented.

[0156] Since the device, the electronic device and the computer-readable storage medium are all built based on the method, or are used to implement the method, they also have the technical advantage of greatly reducing the time cost of the calibration process in practical applications.

[0157] Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. A person with ordinary knowledge in the technical field to which the present invention belongs may make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be determined by the definition of the claims.

Claims

1. A rapid calibration method for analog devices, characterized in that: include: An initial simulation model corresponding to a reference analog device is constructed based on the transfer function, and the initial simulation model is iteratively optimized until the difference between the simulation response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model; Wherein, the reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal; Inputting a step signal to the analog device to be calibrated to obtain step response data at several moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in the rising stage; Acquiring an actual gain speed based on the step response data at the plurality of moments, and then determining that the actual gain speed is not within a preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending the calibration of the analog device to be calibrated; If it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated; Based on the target simulation model, the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated are predicted to determine the calibration range.

2. The rapid calibration method for analog devices according to claim 1, characterized in that: The method of predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range includes: When it is determined that the preset verification cycle has been reached, a number of actual step response data within a second preset time window is obtained based on the analog device to be calibrated, and corresponding predicted step response data is obtained based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable; When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

3. The rapid calibration method for analog devices according to claim 1, characterized in that: The method comprises: constructing an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimizing the initial simulation model until the difference between a simulation response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model; comprising: When the reference analog device is a second-order system, the corresponding response equation is: in, is the damping ratio, wn is the natural frequency, t is the time, 4. The rapid calibration method for analog devices according to claim 3, characterized in that: The method comprises: if the actual gain speed is within a preset gain speed range, inputting the step response data at the plurality of moments into the standard simulation model, and introducing an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated; comprising: Obtain the step response data at any two moments, and substitute them into the response equation to obtain a set of attenuation signal functions of the analog devices to be calibrated: Wherein, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to the time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to the time point t2; The ratio of the attenuation signal function of the set of analog devices to be calibrated is solved to eliminate the phase angle, and an intermediate attenuation signal function of the analog device to be calibrated is obtained as follows: in, Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency; Among them, w d is the oscillation frequency, estimated from the peak interval in the step response signal.

5. The rapid calibration method for analog devices according to claim 1, characterized in that: After predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range: If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device fault report is generated and sent to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response; If the determined calibration range does not exceed the expected tolerance range, it is compensated.

6. A rapid calibration device suitable for analog devices, characterized in that: include: A first construction module is used to construct an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimize the initial simulation model until the difference between a simulation response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model; Wherein, the reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and the Kalman filter algorithm is introduced to pre-process the output signal to obtain the final response signal; A first acquisition module is used to input a step signal to the analog device to be calibrated to obtain step response data at several moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising stage; A first judgment module is used to obtain an actual gain speed based on the step response data at the plurality of moments, and then judge that the actual gain speed is not within a preset gain speed range, then judge that the analog quantity device to be calibrated is an abnormal device, and end the calibration of the analog quantity device to be calibrated; A second construction module is used to determine that the actual gain speed is within a preset gain speed range, input the step response data at any number of moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated; The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog quantity device to be calibrated based on the target simulation model to determine the calibration range.

7. The rapid calibration device for analog devices according to claim 6, characterized in that: include: A second acquisition module is used to determine that when a preset verification cycle is reached, obtain a number of actual step response data within a second preset time window based on the analog device to be calibrated, and obtain corresponding predicted step response data based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable; The model updating module is used to optimize the standard simulation model again when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

8. The rapid calibration device for analog devices according to claim 6, characterized in that: include: The second judgment module is used to judge that the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, and then generate a device fault report and send it to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response; The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

9. An electronic device, characterized in that: The method comprises at least one processor, wherein the processor is coupled to a memory, wherein a computer program is stored in the memory, and wherein the computer program is configured to execute the method according to any one of claims 1 to 5 when executed by the processor.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed by a computer, the method according to any one of claims 1 to 5 is implemented.

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