Automatic parameter debugging method, system and equipment for thin-film lithium niobate modulator and medium

Abstract

An automatic parameter debugging method, system, device and medium for a thin-film lithium niobate modulator relate to the technical field of optical communication, and comprise the following steps: writing an initial temperature compensation table in an optical module; adjusting the temperature of the optical module to a certain preset temperature value in the temperature compensation table; respectively scanning modulation voltages of a plurality of channel modulators in the optical module by using an MCU (Microprogrammed Control Unit) of the optical module to obtain optical power-voltage data of modulation optical power of each optical channel; the upper computer draws a corresponding optical power-voltage scanning curve according to the modulated optical power-voltage data, and marks the maximum value on the scanning curve; determining a 3dB point based on the maximum value in each scanning curve; the ratio of the 3dB point to the corresponding optical power before modulation is calculated, and the ratio is supplemented to the temperature compensation table; repeating the steps S2-S6 until the temperature compensation table is completely supplemented; the problems of long acquisition time and low efficiency in a parameter debugging process and the problems of poor reliability and stability in the parameter debugging process can be solved.

Description

Technical Field

[0001] The present invention relates to the field of optical communication technology, and in particular to a parameter automatic debugging method, system, equipment and medium for a thin-film lithium niobate modulator. Background Art

[0002] Optical modulation technology is one of the core technologies in optical modules, which directly affects the transmission rate and application scope of optical modules. As optical modules continue to develop in the direction of high speed, low power consumption, miniaturization and long-distance transmission, the requirements for optical modulation technology are also increasing. As an important optical modulation scheme that has emerged in recent years, the thin-film lithium niobate modulator (TFLN) has gradually become the focus of industry attention due to its excellent electro-optical characteristics, wide working bandwidth, low loss and high modulation efficiency. These technical advantages are attracting many companies and research institutes to actively participate and promote the rapid development of thin-film lithium niobate modulators.

[0003] When applying a thin-film lithium niobate modulator, it is generally necessary to modulate the optical luminous power and temperature parameters. In order to ensure that the modulated light output by the modulator has good eye diagram characteristics, and also taking into account aspects such as signal processing, the maximum luminous power 3dB point is usually selected as the expected modulated light luminous power of the modulator. This process can be achieved by scanning the modulation voltage to obtain the modulated light power-modulation voltage curve. In addition, lithium niobate materials are very sensitive to temperature changes. Temperature fluctuations can cause large changes in their refractive index, thereby affecting the modulation effect of the modulator. Therefore, a temperature compensation table is obtained through preliminary experiments, and then based on the lookup table and interpolation method, the compensation parameters of the thin-film lithium niobate modulator are obtained to make certain corrections to the modulation voltage, and finally achieve temperature compensation for the thin-film lithium niobate modulator.

[0004] However, when actually modulating the parameters of the thin-film lithium niobate modulator, after setting the modulation voltage, the modulator output modulated optical power takes a long time to stabilize, which makes the modulation optical power-modulation voltage curve scanning time long and the result is unstable. Considering the temperature change and channel difference, generating a multi-channel temperature compensation table will significantly increase the complexity and time cost of debugging. Because of the above reasons, the application of thin-film lithium niobate modulators is greatly limited;

[0005] The existing solution mainly obtains the modulated optical power-voltage curve and the corresponding temperature compensation table of the thin-film lithium niobate modulator through manual debugging. During the debugging process, the debugger needs to manually build the corresponding debugging environment, set the initial voltage of the modulator and wait for a certain time before obtaining a stable modulated optical luminous power. After obtaining the stable modulated optical power, change the modulation voltage of the modulator according to a certain scanning step and repeat the above steps until a complete modulated optical power-modulation voltage curve is obtained. The acquisition of the temperature compensation table is based on the above, and the modulated optical power-modulation voltage curve of different channels is obtained at different temperatures, and the appropriate points are selected and written into the corresponding storage area of ​​the optical module after certain processing. In addition, for different types of optical modules, due to differences in software and hardware, it is very likely that the above steps need to be repeated to obtain the corresponding modulated optical power-voltage curve and temperature compensation table.

[0006] However, current technologies have several problems and limitations in the field of optical modulation parameter debugging, which are mainly reflected in the following two aspects:

[0007] First, the existing thin-film lithium niobate modulator parameter debugging lacks an efficient and fast debugging method. After setting the modulation voltage of the thin-film lithium niobate modulator, it often takes more than ten seconds or even longer for the modulated light luminous power to stabilize, and obtaining the modulated light power-modulation voltage curve requires repeating the above steps dozens to hundreds of times. In this process, some manual data selection and writing are also involved. Considering the multi-temperature and multi-channel situations, the time spent will be even longer, which means that a lot of time will be spent on parameter debugging, which seriously limits the large-scale application of thin-film lithium niobate modulators.

[0008] Second, the manual debugging method not only increases the manual workload, but also makes the debugged parameters vary from person to person. A large amount of repetitive parameter debugging and selection work will further increase the possibility of manual errors, and the reliability and stability of the debugging parameters are difficult to guarantee. Summary of the invention

[0009] The purpose of the present invention is to provide a method, system, device and medium for automatic parameter debugging of a thin film lithium niobate modulator, which can solve the problems of long acquisition time and low efficiency in the process of debugging parameters, as well as the problems of poor reliability and stability in the process of debugging parameters.

[0010] The present invention is achieved through the following technical solutions:

[0011] A parameter automatic debugging method for a thin film lithium niobate modulator, specifically comprising:

[0012] S1. Write the initial temperature compensation table in the optical module;

[0013] S2. Adjust the temperature of the optical module to a preset temperature value in the temperature compensation table;

[0014] S3. Use the MCU of the optical module to scan the modulation voltages of multiple channel modulators in the optical module to obtain the optical power-voltage data of the modulated optical power of each optical channel;

[0015] S4. The host computer draws the corresponding optical power-voltage scanning curve according to each modulated optical power-voltage data, and marks the maximum value on the scanning curve;

[0016] S5. Determine the 3dB point based on the maximum value of each scan curve;

[0017] S6. Calculate the ratio of the 3dB point to the corresponding optical power before modulation, and add the ratio to the temperature compensation table;

[0018] S7. Repeat S2-S6 until the temperature compensation table is complete.

[0019] Furthermore, the scanning step of the MCU is 0.02V, and the scanning range is 0.5V-1.8V.

[0020] A parameter automatic debugging system for a thin-film lithium niobate modulator comprises a communication device, a temperature control box, an optical module and a host computer. The communication device is placed in the temperature control box, the communication device is respectively connected to a plurality of optical modules for communication, and the temperature control box is used to adjust the ambient temperature of the optical modules in the box;

[0021] A temperature compensation table is written into each of the optical modules;

[0022] The host computer receives the modulated optical power-voltage data of multiple optical modules through the communication equipment, and based on each group of modulated optical power-voltage data, the host computer draws the corresponding optical power-voltage scanning curve, and sends the calculated ratio of the 3dB point of the maximum value of each optical module scanning curve to the corresponding optical power before modulation to the corresponding optical module.

[0023] Further, the optical module includes an MCU, an adjustable optical splitter, a photosensitive diode PD, a channel modulator and a photosensitive diode PDF, wherein the MCU is connected to a communication device, the communication device is connected to a host computer, and a scanning signal sampling end of the MCU is electrically connected to the photosensitive diode PD and the photosensitive diode PDF respectively;

[0024] The adjustable splitter is used to receive a light source and divide the light source into multiple beams; the channel modulator is set to multiple, each channel modulator is used to modulate a light path, and the front end and rear end of each channel modulator are respectively provided with a photosensitive diode PD and a photosensitive diode PDF; the photosensitive diode PD is used to sample the optical power of the optical path before modulation, and the photosensitive diode PDF is used to sample the optical power of the optical path after modulation.

[0025] Furthermore, the host computer includes a system initialization unit, an automation execution unit and a debugging result output unit.

[0026] Furthermore, the system initialization unit includes an optical module configuration module and an ambient temperature configuration module, wherein the optical module configuration module is used to check the state of the optical module and set the optical module to a working state suitable for parameter debugging; the ambient temperature configuration module is used to send temperature control instructions for adjusting the working temperature of the optical module to the variable temperature box according to the debugging conditions.

[0027] Further, the automation execution unit includes a data transceiver module, a data analysis and processing module, and a data storage module, wherein the data transceiver module is used to send a debugging instruction to the optical module, and after the optical module completes scanning the modulation voltage of each channel modulator, receive the optical power-voltage data of the modulated optical power of each optical channel;

[0028] The data analysis and processing module is used to analyze and process the received modulated optical power-voltage data respectively according to the different channel modulators;

[0029] The data storage module is used to store the received modulated optical power-voltage data.

[0030] Furthermore, the debugging result output unit includes a chart drawing module and a temperature compensation table updating module; wherein the chart drawing module is used to draw a scanning curve diagram according to the modulated optical power-voltage data, mark the maximum value in the diagram, and determine the ratio of the 3dB point of the maximum value to the corresponding optical power before modulation;

[0031] The temperature compensation table updating module is used to write the ratio determined by the chart drawing module into the temperature compensation table.

[0032] An electronic device comprises: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and the machine-readable instructions are executed by the processor to execute the steps of the above-mentioned parameter automatic debugging method.

[0033] A computer-readable storage medium stores a computer program, and when the computer program is run by a processor, the steps of the above-mentioned parameter automatic debugging method are executed.

[0034] The technical solution of the present invention has at least the following advantages and beneficial effects:

[0035] The present invention discloses an automatic parameter debugging method for a thin-film lithium niobate modulator, which can automatically and efficiently obtain the optical power-voltage scanning curve of each optical module, and analyze and adjust based on the curve, and then write the adjustment data into a temperature compensation table to complete the generation of the temperature compensation table, thereby reducing the time loss of steps such as manual parameter scanning, value selection and value writing to the module, thereby improving the parameter modulation efficiency.

[0036] This system integrates all operations together to make the debugging process more standardized, controllable and repeatable, avoiding the instability caused by manual operation errors. Through the variable temperature box, parameters can be debugged under more temperature conditions and the scanning curve of the debugging parameters can be obtained, thereby enriching the temperature compensation table of the optical module and realizing more accurate temperature compensation for the debugging parameters of the thin-film lithium niobate modulator.

[0037] In addition, combined with the advantages of high efficiency and speed of this method, more preliminary experiments can be carried out to explore the influence of scanning step size and scanning interval on the scanning curve of debugging parameters, so as to obtain more reasonable scanning setting conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 A method flow chart of the present invention;

[0039] Figure 2 A schematic diagram of a system structure of the present invention;

[0040] Figure 3 It is a schematic diagram of the structure of the optical modulation part of the optical module of the present invention. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0042] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0043] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0044] In the description of the present invention, it should be noted that if the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the accompanying drawings, or is the orientation or position relationship in which the product of the application is usually placed when used. It is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0045] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0046] Example 1

[0047] As attached Figure 1 The method for automatically adjusting parameters of a thin film lithium niobate modulator shown in the figure specifically includes:

[0048] S1. Write the initial temperature compensation table in the optical module;

[0049] S2. Adjust the temperature of the optical module to a preset temperature value in the temperature compensation table. However, if the temperature adjustment time of the optical module times out, a timeout error message is displayed, and then the debugging is exited;

[0050] S3. Use the MCU of the optical module to scan the modulation voltages of multiple channel modulators in the optical module to obtain the optical power-voltage data of the modulated optical power of each optical channel;

[0051] After the host computer sends a debugging parameter scan command to the optical module, the MCU of the optical module adjusts the modulation voltage V of the channel modulator of each channel of the optical module according to the preset scan step and scan range. m Scanning is performed, in particular, wherein the scanning step length is 0.02V and the scanning range is 0.5V-1.8V;

[0052] S4. The host computer calculates the optical power-voltage data after each modulation, namely PDF-V m Data, draw the corresponding optical power-voltage scanning curve, namely PDF-V m Scan the curve and mark the maximum value on the scan curve; the optical power-voltage scan curve and the maximum value on the marked scan curve are saved as pictures for subsequent analysis and tracing;

[0053] S5. Determine the 3dB point based on the maximum value of each scan curve;

[0054] S6. Calculate the ratio of the 3dB point to the corresponding optical power before modulation, and add the ratio to the temperature compensation table; that is, calculate That is, the target value, which represents the modulation effect expected by the modulator;

[0055] S7. Repeat S2-S6 until the temperature compensation table is complete, and the temperature compensation table is used as a reference for setting the modulation voltage when the optical module is working;

[0056] After obtaining the complete temperature compensation table, when the thin film lithium niobate modulator is at a preset temperature during operation, the system will calculate the temperature according to the corresponding PDF-V m Curve control of the optical module can ensure the stability and reliability of the optical module.

[0057] In addition, before S1 starts, the host computer also sends an initialization setting instruction to the optical module to initialize the optical module, and the parameters debugged by the present invention are not limited to the debugging of the parameters of the thin film lithium niobate modulator, but can also be used for the parameter debugging of other parts of the optical module, including but not limited to the debugging parameters of the Mod current of the TOSA part and the debugging parameters of the Bias current, and the debugging parameters of the FI R filter.

[0058] Example 2

[0059] As attached Figure 2The automatic parameter debugging system for a thin-film lithium niobate modulator shown in the figure includes a communication device, a temperature control box, an optical module and a host computer. The communication device is placed in the temperature control box, and the communication device is respectively connected to multiple optical modules for communication. The temperature control box is used to adjust the ambient temperature of the optical modules in the box. Since there are multiple temperature values ​​preset in the temperature compensation table, the temperature control box can increase the speed at which the optical module reaches each preset temperature value, thereby improving the completion efficiency of the temperature compensation table, that is, improving the efficiency of the automatic parameter debugging.

[0060] A temperature compensation table is written in each of the optical modules. After the temperature compensation table is completed, when the subsequent optical modules work independently, they can only rely on the temperature compensation table. When the optical modules reach any normal working temperature, the expected PDF / PD value is determined by table lookup and interpolation methods, and the modulation voltage is adjusted by the control algorithm until the actual PDF / PD is close to the expected PDF / PD, thereby ensuring that the optical modules work well under various temperature conditions;

[0061] The host computer receives modulated optical power-voltage data of multiple optical modules through a communication device, and the host computer draws a corresponding optical power-voltage scanning curve based on each group of modulated optical power-voltage data, and sends the calculated ratio of the 3dB point of the maximum value of the scanning curve of each optical module to the corresponding optical power before modulation to the corresponding optical module;

[0062] In the above parameter automatic debugging method, the host computer is used to obtain the PDF-V of the thin film lithium niobate modulator at a certain temperature according to the actual operation of the optical module. m curve.

[0063] In addition, the optical module includes an MCU, an adjustable optical splitter, a photosensitive diode PD, a channel modulator and a photosensitive diode PDF, wherein the MCU is connected to a communication device, the communication device is connected to a host computer, and a scanning signal sampling end of the MCU is electrically connected to the photosensitive diode PD and the photosensitive diode PDF respectively;

[0064] The adjustable splitter is used to receive a light source and divide the light source into multiple beams; the channel modulator is set to multiple, each channel modulator is used to modulate a light path, and the front end and rear end of each channel modulator are respectively provided with a photosensitive diode PD and a photosensitive diode PDF; the photosensitive diode PD is used to sample the optical power of the optical path before modulation, and the photosensitive diode PDF is used to sample the optical power of the optical path after modulation.

[0065] As attached Figure 3 The adjustable optical splitter shown in the figure splits two paths of light as an example, where the MCU is used to scan the modulation voltage V of the modulator m, obtain the luminous power before modulation and the luminous power after modulation obtained by sampling the photodiode PD and PDF; the light source, that is, the laser is fed into the optical module through the optical port, and the laser is split into two paths through the adjustable beam splitter (Tunable beam splitter), and the photodiode PD is set on both the upper and lower paths to detect the size of the optical power before modulation. When the light enters the thin film lithium niobate modulator (TFLN Modulator), referred to as the channel modulator, it is divided into two paths through the beam splitting structure of the channel modulator. The light of the upper and lower arms produces a phase difference under the action of the electric field of the modulation area of ​​the modulator. The modulated two paths of light interfere and combine in the beam combining structure of the modulator, and are output at the output end of the modulator. At the output end of the channel modulator, a photodiode PDF is also set to detect the size of the modulated optical power.

[0066] Example 3

[0067] The host computer includes a system initialization unit, an automation execution unit and a debugging result output unit.

[0068] According to the needs, the system initialization unit includes an optical module configuration module and an ambient temperature configuration module, wherein the optical module configuration module is used to check the state of the optical module and set the optical module to a working state suitable for parameter debugging;

[0069] The ambient temperature configuration module is used to send a temperature control instruction for adjusting the working temperature of the optical module to the temperature variable box according to the debugging conditions.

[0070] In addition, the automation execution unit includes a data transceiver module, a data analysis and processing module, and a data storage module, wherein the data transceiver module is used to send a debugging instruction to the optical module, and receive the optical power-voltage data of the modulated optical power of each optical channel after the optical module completes the scanning of the modulation voltage of each channel modulator;

[0071] The data analysis and processing module is used to analyze and process the received modulated optical power-voltage data respectively according to the different channel modulators;

[0072] The data storage module is used to store the received modulated optical power-voltage data.

[0073] In addition, the debugging result output unit includes a chart drawing module and a temperature compensation table updating module; wherein the chart drawing module is used to draw a scanning curve diagram according to the modulated optical power-voltage data, mark the maximum value in the diagram, and determine the ratio of the 3dB point of the maximum value to the corresponding optical power before modulation;

[0074] The temperature compensation table updating module is used to write the ratio determined by the chart drawing module into the temperature compensation table.

[0075] In addition, the parameters that can be quickly debugged by this system are not limited to the modulation parameters of the thin-film lithium niobate modulator, but can also be applied to other parts of the optical module that require parameter debugging, such as the debugging parameters of Imod and Ibias in the APC circuit, FI R, etc.

[0076] Example 4

[0077] An electronic device comprises: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate via the bus, and the machine-readable instructions are executed by the processor to perform the steps of a parameter automatic debugging method.

[0078] Example 5

[0079] A computer-readable storage medium stores a computer program, which executes the steps of a parameter automatic debugging method when executed by a processor.

[0080] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A method for automatically adjusting parameters of a thin film lithium niobate modulator, characterized in that: Specifically include: S1. Write the initial temperature compensation table in the optical module; S2. Adjust the temperature of the optical module to a preset temperature value in the temperature compensation table; S3. Use the MCU of the optical module to scan the modulation voltages of multiple channel modulators in the optical module to obtain the optical power-voltage data of the modulated optical power of each optical channel; S4. The host computer draws the corresponding optical power-voltage scanning curve according to each modulated optical power-voltage data, and marks the maximum value on the scanning curve; S5. Determine the 3dB point based on the maximum value of each scan curve; S6. Calculate the ratio of the 3dB point to the corresponding optical power before modulation, and add the ratio to the temperature compensation table; S7. Repeat S2-S6 until the temperature compensation table is complete.

2. The method for automatically adjusting parameters of a thin film lithium niobate modulator according to claim 1, characterized in that: The scanning step of the MCU is 0.02V, and the scanning range is 0.5V-1.8V.

3. A parameter automatic debugging system for a thin-film lithium niobate modulator, comprising a communication device, a temperature control box, an optical module and a host computer, wherein the communication device is fixedly placed in the temperature control box, the communication device is respectively connected to multiple optical modules for communication, and the temperature control box is used to adjust the ambient temperature of the optical module in the box; A temperature compensation table is written into each of the optical modules; The host computer receives the modulated optical power-voltage data of multiple optical modules through the communication equipment, and based on each group of modulated optical power-voltage data, the host computer draws the corresponding optical power-voltage scanning curve, and sends the calculated ratio of the 3dB point of the maximum value of each optical module scanning curve to the corresponding optical power before modulation to the corresponding optical module.

4. The automatic parameter adjustment system for thin film lithium niobate modulator according to claim 3, characterized in that: The optical module includes an MCU, an adjustable optical splitter, a photodiode PD, a channel modulator and a photodiode PDF, wherein the MCU is connected to a communication device, the communication device is connected to a host computer, and a scanning signal sampling end of the MCU is electrically connected to the photodiode PD and the photodiode PDF respectively; The adjustable splitter is used to receive a light source and divide the light source into multiple beams; the channel modulator is set to multiple, each channel modulator is used to modulate a light path, and the front end and rear end of each channel modulator are respectively provided with a photosensitive diode PD and a photosensitive diode PDF; the photosensitive diode PD is used to sample the optical power of the optical path before modulation, and the photosensitive diode PDF is used to sample the optical power of the optical path after modulation.

5. The automatic parameter adjustment system for thin film lithium niobate modulator according to claim 3, characterized in that: The host computer includes a system initialization unit, an automation execution unit and a debugging result output unit.

6. The automatic parameter adjustment system for thin film lithium niobate modulator according to claim 5, characterized in that: The system initialization unit includes an optical module configuration module and an ambient temperature configuration module, wherein the optical module configuration module is used to check the state of the optical module and set the optical module to a working state suitable for parameter debugging; the ambient temperature configuration module is used to send a temperature control instruction for adjusting the working temperature of the optical module to the variable temperature box according to the debugging conditions.

7. The automatic parameter adjustment system for thin film lithium niobate modulator according to claim 6, characterized in that: The automated execution unit includes a data transceiver module, a data analysis and processing module, and a data storage module, wherein the data transceiver module is used to send a debugging instruction to the optical module, and receive the optical power-voltage data of the modulated optical power of each optical channel after the optical module completes scanning the modulation voltage of each channel modulator; The data analysis and processing module is used to analyze and process the received modulated optical power-voltage data respectively according to the different channel modulators; The data storage module is used to store the received modulated optical power-voltage data.

8. The automatic parameter adjustment system for thin film lithium niobate modulator according to claim 7, characterized in that: The debugging result output unit includes a chart drawing module and a temperature compensation table updating module; wherein the chart drawing module is used to draw a scanning curve diagram according to the modulated optical power-voltage data, mark the maximum value in the diagram, and determine the ratio of the 3dB point of the maximum value to the corresponding optical power before modulation; The temperature compensation table updating module is used to write the ratio determined by the chart drawing module into the temperature compensation table.

9. An electronic device, comprising: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the parameter automatic debugging method as described in claims 1-2.

10. A computer-readable storage medium having a computer program stored thereon, wherein the computer program executes the steps of the automatic parameter debugging method according to claims 1-2 when executed by a processor.

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