Automatic test adapter and automatic test system

Abstract

The invention provides an automatic test adapter and an automatic test system, and relates to the technical field of automatic test. According to the invention, the first panel is provided with a plurality of first connectors which are used for being connected with the output end of the test equipment so as to obtain a test signal output by the test equipment. The second panel is provided with a plurality of second connectors which are used for being connected with the input end of the tested device so as to output the obtained at least one test signal to the connected tested device. The third panel is provided with a signal adaptation module, and the signal adaptation module is connected with the multiple first connectors and the multiple second connectors and used for responding to a received signal adaptation instruction and sending test signals output by the first connectors to corresponding tested equipment through the corresponding second connectors. And carrying out corresponding equipment testing operation on the tested equipment. Based on the above content, the problem of low test efficiency in the prior art can be improved.

Description

Technical Field

[0001] The present invention relates to the field of automatic testing technology, in particular to an automatic testing adapter and an automatic testing system. Background Art

[0002] In the testing field, adapters are mainly used for signal conditioning and routing, and to build a path between the test equipment and the device under test. Traditional adapters generally use manual wiring, which is characterized by low cost, but strong specialization and low change efficiency (for example, the adapter chassis needs to be constantly opened and the wiring needs to be constantly modified to meet different testing needs). Summary of the invention

[0003] In view of this, an object of the present invention is to provide an automatic test adapter and an automatic test system to improve the problem of low test efficiency in the prior art.

[0004] To achieve the above object, the present invention adopts the following technical solution: An automatic test adapter, the automatic test adapter is applied to an automatic test system, the automatic test system also includes at least one test device and at least one device under test respectively connected to the automatic test adapter, the automatic test adapter includes: A first panel, wherein the first panel has a plurality of first connectors, and the plurality of first connectors are used to connect to at least one output terminal of at least one of the test devices to obtain at least one test signal output by at least one of the test devices; A second panel, wherein the second panel has a plurality of second connectors, and the plurality of second connectors are used to be connected to at least one input terminal of at least one of the devices under test, so as to output the acquired at least one test signal to the connected device under test; A third panel, wherein the third panel has a signal adapter module, the signal adapter module is respectively connected to the multiple first connectors and the multiple second connectors, and the signal adapter module is used to, in response to a received signal adaptation instruction, send each test signal output by the multiple first connectors to the corresponding device under test through the corresponding second connector, so as to perform corresponding device test operations on the device under test.

[0005] In a preferred embodiment of the present invention, in the above automatic test adapter, the signal adaptation module includes: An embedded system, wherein the embedded system is connected to a host computer, and the embedded system is used to receive a signal adaptation instruction sent by the host computer; a digital signal adaptation module, wherein the digital signal adaptation module is connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, respectively, and the digital signal adaptation module is used to send each test signal output by the connected at least one first connector to the corresponding second connector in response to a signal adaptation instruction received by the embedded system; A relay array module, wherein the relay array module is respectively connected to the embedded system, at least one of the first connectors and at least one of the second connectors, and the relay array module is used to send each test signal output by the connected at least one first connector to the corresponding second connector in response to a signal adaptation instruction received by the embedded system.

[0006] In a preferred embodiment of the present invention, in the above automatic test adapter, the digital signal adaptation module includes: At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the first connectors connected thereto; An input serial interface conversion chip, wherein the input serial interface conversion chip is connected to the at least one input communication interface respectively, and the input serial interface conversion chip is used to perform protocol conversion processing on the test signal acquired by the at least one input communication interface and output the test signal; A field programmable gate array, wherein the field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the input serial interface conversion chip and output the signal; An output serial interface conversion chip, wherein the output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is used to perform protocol conversion processing on the test signal output by the field programmable gate array and output it; At least one output communication interface, wherein each of the output communication interfaces is connected to the output serial interface conversion chip and at least one second connector, and each of the output communication interfaces is used to obtain a test signal output by the output serial interface conversion chip and output the test signal to the connected second connector.

[0007] In a preferred embodiment of the present invention, in the above automatic test adapter, the digital signal adaptation module includes: At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the first connectors connected thereto; a first controller area network transceiver unit, wherein the first controller area network transceiver unit is connected to the at least one input communication interface respectively, and the first controller area network transceiver unit is used to perform signal adaptation processing on the test signal acquired by the at least one input communication interface and output the signal; A field programmable gate array, wherein the field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the first controller area network transceiver unit and output the signal; a second controller area network transceiver unit, wherein the second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is used to perform signal adaptation processing on the test signal output by the field programmable gate array and output the signal; At least one output communication interface, wherein each of the output communication interfaces is connected to the second controller local area network transceiver unit and at least one second connector, and each of the output communication interfaces is used to obtain a test signal output by the second controller local area network transceiver unit and output the test signal to the connected second connector.

[0008] In a preferred embodiment of the present invention, in the above automatic test adapter, the digital signal adaptation module includes: At least one digital input interface, wherein each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is used to obtain each test signal output by each of the first connectors connected thereto; An isolation unit, wherein the isolation unit is connected to the at least one digital input interface respectively, and the isolation unit is used to perform signal isolation processing on the test signal acquired by the at least one digital input interface and output the signal; A field programmable gate array, wherein the field programmable gate array is connected to the isolation unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the isolation unit and output the signal; A buffer unit, wherein the buffer unit is connected to the field programmable gate array, and the buffer unit is used to perform signal isolation and level conversion processing on the test signal output by the field programmable gate array and output the test signal; At least one digital output interface, wherein each of the digital output interfaces is connected to the buffer unit and at least one second connector respectively, and each of the digital output interfaces is used to obtain a test signal output by the buffer unit and output the test signal to the connected second connector.

[0009] In a preferred embodiment of the present invention, in the above automatic test adapter, the relay array module includes a pulse switching module, and the pulse switching module includes: At least one pulse input interface, wherein each of the pulse input interfaces is connected to at least one of the first connectors, and the pulse input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is a pulse signal; At least one pulse output interface, wherein each of the pulse output interfaces is connected to at least one second connector, and the pulse output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one pulse input interface and the at least one pulse output interface respectively, and the programmable relay is used to control the connection between at least one pulse input interface and at least one pulse output interface, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

[0010] In a preferred embodiment of the present invention, in the above automatic test adapter, the relay array module includes an analog switching module, and the analog switching module includes: At least one analog input interface, wherein each of the analog input interfaces is connected to at least one of the first connectors, and the analog input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is an analog signal; At least one analog output interface, wherein each of the analog output interfaces is connected to at least one second connector, and the analog output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one analog input interface and the at least one analog output interface respectively, and the programmable relay is used to control the connection between at least one analog input interface and at least one analog output interface, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

[0011] In a preferred embodiment of the present invention, in the above automatic test adapter, the relay array module includes a multimeter switching module, and the multimeter switching module includes: At least one multimeter input interface, wherein each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is used to obtain a test signal obtained by each of the first connectors connected thereto, the test signal being a multimeter signal; At least one multimeter output interface, wherein each of the multimeter output interfaces is connected to at least one second connector, and the multimeter output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one multimeter input interface and the at least one multimeter output interface respectively, and the programmable relay is used to control the connection between at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by the multimeter input interface is output to the connected multimeter output interface.

[0012] In a preferred embodiment of the present invention, in the above automatic test adapter, the relay array module includes a simulation module, and the simulation module includes: At least one simulation input interface, wherein each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is a simulation signal; At least one simulation output interface, wherein each of the simulation output interfaces is connected to at least one second connector, and the simulation output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one simulation input interface and the at least one simulation output interface respectively, and the programmable relay is used to control the at least one simulation input interface to be connected to the at least one simulation output interface, so that the test signal obtained by the simulation input interface is output to the connected simulation output interface.

[0013] On the basis of the above, the present invention also provides an automatic testing system, comprising: The above automatic test adapter; At least one test device and at least one device under test are respectively connected to the automatic test adapter, wherein at least one test signal output by at least one of the test devices is transmitted to at least one of the devices under test through the automatic test adapter, so that a corresponding device test operation is performed on at least one of the devices under test through at least one of the test signals.

[0014] In the automatic test adapter and automatic test system provided by the present invention, a plurality of first connectors are provided on the first panel, which are used to connect with the output end of the test device to obtain the test signal output by the test device. A plurality of second connectors are provided on the second panel, which are used to connect with the input end of the device under test to output at least one acquired test signal to the connected device under test. A signal adaptation module is provided on the third panel, and the signal adaptation module is respectively connected with the plurality of first connectors and the plurality of second connectors, and is used to respond to the received signal adaptation instruction, and send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, so as to perform the corresponding device test operation on the device under test. Based on the above content, since a plurality of first connectors and a plurality of second connectors are configured, and the signal adaptation module can send the test signal output by the first connector to the corresponding device under test through the corresponding second connector based on the signal adaptation instruction, in this way, the switching adaptation of the input and output based on the signal adaptation instruction can be realized, so that there is no need to manually change the line, and the efficiency of the test can be fully improved, thereby improving the problem of low test efficiency existing in the prior art, especially for the test scenario of multiple demands and multiple devices, the application value is high. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings.

[0016] Figure 1 A system block diagram of an automatic testing system provided by an embodiment of the present invention.

[0017] Figure 2 A schematic diagram of an automatic test adapter provided by an embodiment of the present invention.

[0018] Figure 3 A first schematic diagram of a digital signal adaptation module provided in an embodiment of the present invention.

[0019] Figure 4 A second schematic diagram of a digital signal adaptation module provided in an embodiment of the present invention.

[0020] Figure 5 A third schematic diagram of a digital signal adaptation module provided in an embodiment of the present invention.

[0021] Figure 6 A schematic diagram of a relay array module provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0023] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] like Figure 1 As shown, an embodiment of the present invention provides an automatic test system. The automatic test system may include an automatic test adapter, at least one test device and at least one device under test. In detail, the at least one test device and the at least one device under test are respectively connected to the automatic test adapter, so that at least one test signal output by at least one of the test devices can be transmitted to at least one of the devices under test through the automatic test adapter, so that at least one of the devices under test is subjected to a corresponding device test operation through at least one of the test signals, and the automatic test adapter is used to transmit the test signal output by the test device to the device under test that needs to be tested in response to the received signal adaptation instruction.

[0025] Combination Figure 2 The embodiment of the present invention further provides an automatic test adapter applicable to the above automatic test system, wherein the automatic test system further comprises at least one test device and at least one device under test respectively connected to the automatic test adapter.

[0026] In detail, the automatic test adapter may include a first panel, a second panel and a third panel. The first panel has a plurality of first connectors, and the plurality of first connectors are used to connect to at least one output terminal of at least one of the test devices to obtain at least one test signal output by at least one of the test devices. The second panel has a plurality of second connectors, and the plurality of second connectors are used to connect to at least one input terminal of at least one of the devices under test to output the obtained at least one test signal to the connected device under test. The third panel has a signal adapter module, and the signal adapter module is respectively connected to the plurality of first connectors and the plurality of second connectors, and the signal adapter module is used to, in response to the received signal adaptation instruction, send each test signal output by the plurality of first connectors to the corresponding device under test through the corresponding second connector, so as to perform corresponding device test operations on the device under test.

[0027] It should be noted that the first panel may refer to a rear panel, the second panel may refer to a front panel, and the third panel may refer to a bottom panel. In addition, for the connection between the first connector and the second connector and the signal adapter module, a corresponding cable base may be provided on the bottom panel, and then a multi-core shielded cable may be used to connect to the corresponding connector to avoid interference between signals. In addition, the automatic test adapter may further include a power module, which may be used to power the signal adapter module.

[0028] Based on the above content, since multiple first connectors and multiple second connectors will be configured, and the signal adaptation module can send the test signal output by the first connector to the corresponding device under test through the corresponding second connector based on the signal adaptation instruction, in this way, the switching adaptation of input and output based on the signal adaptation instruction can be realized. Therefore, there is no need to manually change the line, and the efficiency of the test can be fully improved, thereby improving the problem of low testing efficiency in the prior art, especially for test scenarios with multiple demands and multiple devices, the application value is relatively high.

[0029] It should be noted that the specific structure of the signal adaptation module is not limited and can be selected according to actual needs.

[0030] For example, in an alternative implementation, in order to ensure that the signal adaptation module can meet more testing requirements, the signal adaptation module may include an embedded system, a digital signal adaptation module and a relay array module.

[0031] In detail, the embedded system is connected to the host computer, and the embedded system (which may be a Linux-based system) is used to receive the signal adaptation instruction sent by the host computer. Exemplarily, the embedded system can communicate with the host computer through a network such as UDP / TCP to send the signal adaptation instruction. Specifically, the embedded system cooperates with the digital signal adaptation module according to the parameter setting file in XML format sent by the host computer to complete operations such as signal switching and docking. In addition, the embedded system may include components such as a communication module and a microprocessor.

[0032] In detail, the digital signal adaptation module is connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, respectively. The digital signal adaptation module is used to respond to the signal adaptation instruction received by the embedded system, and send each test signal output by the at least one first connector to the corresponding second connector. Exemplarily, the digital signal adaptation module can be based on FPGA as the core, and cooperate with peripheral protocols and level switching circuits to achieve corresponding switching adaptation.

[0033] In detail, the relay array module is connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, respectively. The relay array module is used to respond to the signal adaptation instruction received by the embedded system, and send each test signal output by the at least one first connector to the corresponding second connector. Exemplarily, the relay array module can form a switching network according to project requirements through large-scale, low-power, and low-latency relays to achieve switching adaptation of multiple test signals.

[0034] It is understandable that in an alternative implementation, in order to meet the requirements of adapting the test signals of different types of serial ports, Figure 3 The digital signal adaptation module may include at least one input communication interface, an input serial interface conversion chip, a field programmable gate array, an output serial interface conversion chip and at least one output communication interface.

[0035] In detail, each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the connected first connectors. The input serial interface conversion chip is respectively connected to the at least one input communication interface, and the input serial interface conversion chip is used to perform protocol conversion processing on the test signal obtained by the at least one input communication interface and output it. The field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the input serial interface conversion chip and output it. The output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is used to perform protocol conversion processing on the test signal output by the field programmable gate array and output it. Each of the output communication interfaces is respectively connected to the output serial interface conversion chip and at least one second connector, and each of the output communication interfaces is respectively used to obtain the test signal output by the output serial interface conversion chip, and output the test signal to the connected second connector.

[0036] It should be noted that the protocol conversion process may refer to the conversion between communication protocols such as RS485 / 422 / 232. The signal conditioning process may refer to the processes such as amplification, filtering and attenuation. In addition, the input serial interface conversion chip and the output serial interface conversion chip may be multiple, respectively, to form an input serial interface conversion chipset and an output serial interface conversion chip, so that the mutual conversion of multiple protocols can be realized.

[0037] It is understandable that in an alternative implementation, in order to achieve reliable processing of the test signal of the CAN (Controller Area Network) protocol, combined with Figure 4 The digital signal adaptation module may include at least one input communication interface, a first controller area network transceiver unit, a field programmable gate array, a second controller area network transceiver unit and at least one output communication interface.

[0038] In detail, each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the first connectors connected thereto. The first controller area network transceiver unit is connected to the at least one input communication interface, and the first controller area network transceiver unit is used to perform signal adaptation processing on the test signal obtained by the at least one input communication interface and output it. The field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the first controller area network transceiver unit and output it. The second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is used to perform signal adaptation processing on the test signal output by the field programmable gate array and output it. Each of the output communication interfaces is connected to the second controller area network transceiver unit and at least one second connector, and each of the output communication interfaces is used to obtain the test signal output by the second controller area network transceiver unit, and output the test signal to the connected second connector.

[0039] It is understandable that in an alternative implementation, in order to realize the interconnection of digital signals, Figure 5 The digital signal adaptation module may include at least one digital input interface, an isolation unit, a field programmable gate array, a buffer unit and at least one digital output interface.

[0040] In detail, each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is used to obtain each test signal output by each of the connected first connectors. The isolation unit (such as an optocoupler isolation device) is connected to the at least one digital input interface, and the isolation unit is used to perform signal isolation processing on the test signal obtained by the at least one digital input interface and output it. The field programmable gate array is connected to the isolation unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the isolation unit and output it. The buffer unit is connected to the field programmable gate array, and the buffer unit is used to perform signal isolation and level conversion processing on the test signal output by the field programmable gate array and output it. Each of the digital output interfaces is connected to the buffer unit and at least one second connector, and each of the digital output interfaces is used to obtain the test signal output by the buffer unit, and output the test signal to the connected second connector.

[0041] It is understandable that in an alternative implementation, in order to achieve the test requirements based on the pulse signal, combined with Figure 6The above-mentioned relay array module may include a pulse switching module.

[0042] In detail, the pulse switching module may include at least one pulse input interface, at least one pulse output interface and a programmable relay. Each of the pulse input interfaces is connected to at least one of the first connectors, and the pulse input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal belongs to a pulse signal. Each of the pulse output interfaces is connected to at least one second connector, and the pulse output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one pulse input interface and the at least one pulse output interface, and the programmable relay is used to control the connection between at least one of the pulse input interfaces and at least one of the pulse output interfaces, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

[0043] It should be noted that the pulse switching module may also include a controller, which is used to control the programmable relay in response to the signal adaptation instruction output by the embedded system, so that the corresponding pulse input interface and pulse output interface can be connected, thereby transmitting the corresponding test signal to the device under test.

[0044] It is understood that in an alternative embodiment, in combination with Figure 6 In order to realize the test requirements based on analog signals, the above-mentioned relay array module may include an analog switching module.

[0045] In detail, the analog switching module may include at least one analog input interface, at least one analog output interface and a programmable relay. Each of the analog input interfaces is connected to at least one of the first connectors, and the analog input interface is used to obtain a test signal obtained by each connected first connector, and the test signal belongs to an analog signal. Each of the analog output interfaces is connected to at least one second connector, and the analog output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one analog input interface and the at least one analog output interface, and the programmable relay is used to control the connection between at least one of the analog input interfaces and at least one of the analog output interfaces, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

[0046] It is understood that in an alternative embodiment, in combination with Figure 6 In order to realize the testing requirements based on a multimeter, the above-mentioned relay array module may include a multimeter switching module.

[0047] In detail, the multimeter switching module may include at least one multimeter input interface, at least one multimeter output interface and a programmable relay. Each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is used to obtain a test signal obtained by each connected first connector, and the test signal belongs to a multimeter signal. Each of the multimeter output interfaces is connected to at least one second connector, and the multimeter output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one multimeter input interface and the at least one multimeter output interface, and the programmable relay is used to control the connection between at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by the multimeter input interface is output to the connected multimeter output interface.

[0048] It is understandable that, in an alternative implementation, in order to achieve the test requirement based on the simulation signal, the above-mentioned relay array module may include a simulation module.

[0049] In detail, the simulation module may include at least one simulation input interface, at least one simulation output interface and a programmable relay. Each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is used to obtain a test signal obtained by each connected first connector, and the test signal belongs to a simulation signal. Each of the simulation output interfaces is connected to at least one second connector, and the simulation output interface is used to output the obtained test signal to the connected second connector. The programmable relay is respectively connected to the at least one simulation input interface and the at least one simulation output interface, and the programmable relay is used to control the at least one simulation input interface to be connected to the at least one simulation output interface, so that the test signal obtained by the simulation input interface is output to the connected simulation output interface.

[0050] It should be noted that, in an alternative implementation, the simulation module may be used to simulate the resistor, and in other implementations, other simulations may also be performed.

[0051] Based on the above settings, in a specific application scenario, the following can be achieved: To meet the self-test requirements of the test system, the connections on the rear panel are as follows: 1) 24 RS422 / 232 / 485 serial ports can be interconnected at will; 2) 4 CAN interfaces can be interconnected arbitrarily; 3) 6-way pulse PWM input and 6-way output are interconnected one by one; 4) DI (40 channels, digital signal input) and DO (40 channels, digital signal output) can be interconnected arbitrarily, and the IO level can be set to 5V / 10V / 15V / 28V; 5) 16-channel AD and 16-channel DA are interconnected one by one; 6) One multimeter port is connected to one resistor in simulation; 7) One multimeter port is interconnected with one voltage output.

[0052] In order to meet the resource reuse requirements, the connections of the front and rear panels are as follows: 1) The 24-channel RS422 / 232 / 485 serial ports on the rear panel and the 42-channel RS422 / 232 / 485 serial ports on the front panel can be interconnected at will; 2) The 4-way CAN interface on the rear panel and the 4-way CAN interface on the front panel can be interconnected at will; 3) The 6-channel pulse PWM output on the rear panel is interconnected with the 6-channel PWM output on the front panel; 4) The 8-way pulse PWM input on the rear panel is interconnected with the 8-way PWM input on the front panel; 5) The 1-channel pulse PWM output on the rear panel can be arbitrarily interconnected with the 6-channel PWM output on the front panel; 6) The 1-channel pulse PWM input on the rear panel can be arbitrarily interconnected with the 8-channel PWM input on the front panel; 7) The 40-channel DI on the rear panel and the 60-channel DI on the front panel can be interconnected arbitrarily, and the IO level can be set to 5V / 10V / 15V / 28V; 8) The 40-channel DO on the rear panel and the 50-channel DO on the front panel can be arbitrarily interconnected, and the IO level can be set to 5V / 10V / 15V / 28V; 9) SPDT switching between 15-channel DA on the rear panel and 30-channel DA on the front panel (divided into two groups, 15 channels in each group); 10) 1 DA channel on the rear panel and 31 DA channels on the front panel can be arbitrarily interconnected; 11) SPDT switch between 15-channel AD on the rear panel and 30-channel AD on the front panel (divided into two groups, 15 channels in each group); 12) 1-channel AD on the rear panel and 32-channel AD on the front panel can be arbitrarily interconnected; 13) The 2-way resistor simulation on the rear panel is interconnected with the 2-way resistor simulation on the front panel; 14) The 1-channel multimeter on the rear panel is interconnected with the 1-channel multimeter on the front panel; In order to meet the needs of virtual and real switching, the connections on the rear panel are as follows: 1) 42-channel RS422 / 232 / 485 serial ports can be interconnected at will; 2) 8 CAN interfaces can be interconnected arbitrarily; 3) 6-way pulse PWM input and 6-way output are interconnected one by one; 4) DI (60 channels) and DO (50 channels) can be interconnected arbitrarily, and the IO level can be set to 5V / 10V / 15V / 28V.

[0053] In summary, in the automatic test adapter and automatic test system provided by the present invention, a plurality of first connectors are provided on the first panel, which are used to connect to the output end of the test device to obtain the test signal output by the test device. A plurality of second connectors are provided on the second panel, which are used to connect to the input end of the device under test to output at least one acquired test signal to the connected device under test. A signal adapter module is provided on the third panel, and the signal adapter module is respectively connected to the plurality of first connectors and the plurality of second connectors, and is used to respond to the received signal adaptation instruction, and send the test signal output by the first connector to the corresponding device under test through the corresponding second connector, so as to perform the corresponding device test operation on the device under test. Based on the above content, since a plurality of first connectors and a plurality of second connectors are configured, and the signal adapter module can send the test signal output by the first connector to the corresponding device under test through the corresponding second connector based on the signal adaptation instruction, in this way, the switching adaptation of the input and output based on the signal adaptation instruction can be realized, so that there is no need to manually change the line, and the efficiency of the test can be fully improved, thereby improving the problem of low test efficiency existing in the prior art, especially for the test scenario of multiple demands and multiple devices, and the application value is high.

[0054] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An automatic test adapter, characterized in that: The automatic test adapter is applied to an automatic test system, the automatic test system further comprising at least one test device and at least one device under test respectively connected to the automatic test adapter, the automatic test adapter comprising: A first panel, wherein the first panel has a plurality of first connectors, and the plurality of first connectors are used to connect to at least one output terminal of at least one of the test devices to obtain at least one test signal output by at least one of the test devices; A second panel, wherein the second panel has a plurality of second connectors, and the plurality of second connectors are used to be connected to at least one input terminal of at least one of the devices under test, so as to output the acquired at least one test signal to the connected device under test; A third panel, wherein the third panel has a signal adapter module, the signal adapter module is respectively connected to the multiple first connectors and the multiple second connectors, and the signal adapter module is used to, in response to a received signal adaptation instruction, send each test signal output by the multiple first connectors to the corresponding device under test through the corresponding second connector, so as to perform corresponding device test operations on the device under test.

2. The automatic test adapter according to claim 1, characterized in that: The signal adaptation module comprises: An embedded system, wherein the embedded system is connected to a host computer, and the embedded system is used to receive a signal adaptation instruction sent by the host computer; a digital signal adaptation module, wherein the digital signal adaptation module is connected to the embedded system, at least one of the first connectors, and at least one of the second connectors, respectively, and the digital signal adaptation module is used to send each test signal output by the connected at least one first connector to the corresponding second connector in response to a signal adaptation instruction received by the embedded system; A relay array module, wherein the relay array module is respectively connected to the embedded system, at least one of the first connectors and at least one of the second connectors, and the relay array module is used to send each test signal output by the connected at least one first connector to the corresponding second connector in response to a signal adaptation instruction received by the embedded system.

3. The automatic test adapter according to claim 2, characterized in that: The digital signal adaptation module comprises: At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the first connectors connected thereto; An input serial interface conversion chip, wherein the input serial interface conversion chip is connected to the at least one input communication interface respectively, and the input serial interface conversion chip is used to perform protocol conversion processing on the test signal acquired by the at least one input communication interface and output the test signal; A field programmable gate array, wherein the field programmable gate array is connected to the input serial interface conversion chip, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the input serial interface conversion chip and output the signal; An output serial interface conversion chip, wherein the output serial interface conversion chip is connected to the field programmable gate array, and the output serial interface conversion chip is used to perform protocol conversion processing on the test signal output by the field programmable gate array and output it; At least one output communication interface, wherein each of the output communication interfaces is connected to the output serial interface conversion chip and at least one second connector, and each of the output communication interfaces is used to obtain a test signal output by the output serial interface conversion chip and output the test signal to the connected second connector.

4. The automatic test adapter according to claim 2, characterized in that: The digital signal adaptation module comprises: At least one input communication interface, wherein each of the input communication interfaces is connected to at least one of the first connectors, and each of the input communication interfaces is used to obtain each test signal output by each of the first connectors connected thereto; a first controller area network transceiver unit, wherein the first controller area network transceiver unit is connected to the at least one input communication interface respectively, and the first controller area network transceiver unit is used to perform signal adaptation processing on the test signal acquired by the at least one input communication interface and output the signal; A field programmable gate array, wherein the field programmable gate array is connected to the first controller area network transceiver unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the first controller area network transceiver unit and output the signal; a second controller area network transceiver unit, wherein the second controller area network transceiver unit is connected to the field programmable gate array, and the second controller area network transceiver unit is used to perform signal adaptation processing on the test signal output by the field programmable gate array and output the signal; At least one output communication interface, wherein each of the output communication interfaces is connected to the second controller local area network transceiver unit and at least one second connector, and each of the output communication interfaces is used to obtain a test signal output by the second controller local area network transceiver unit and output the test signal to the connected second connector.

5. The automatic test adapter according to claim 2, characterized in that: The digital signal adaptation module comprises: At least one digital input interface, wherein each of the digital input interfaces is connected to at least one of the first connectors, and each of the digital input interfaces is used to obtain each test signal output by each of the first connectors connected thereto; An isolation unit, wherein the isolation unit is connected to the at least one digital input interface respectively, and the isolation unit is used to perform signal isolation processing on the test signal acquired by the at least one digital input interface and output the signal; A field programmable gate array, wherein the field programmable gate array is connected to the isolation unit, and the field programmable gate array is used to perform signal conditioning processing on the test signal output by the isolation unit and output the signal; A buffer unit, wherein the buffer unit is connected to the field programmable gate array, and the buffer unit is used to perform signal isolation and level conversion processing on the test signal output by the field programmable gate array and output the test signal; At least one digital output interface, wherein each of the digital output interfaces is connected to the buffer unit and at least one second connector respectively, and each of the digital output interfaces is used to obtain a test signal output by the buffer unit and output the test signal to the connected second connector.

6. The automatic test adapter according to claim 2, characterized in that: The relay array module includes a pulse switching module, and the pulse switching module includes: At least one pulse input interface, wherein each of the pulse input interfaces is connected to at least one of the first connectors, and the pulse input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is a pulse signal; At least one pulse output interface, wherein each of the pulse output interfaces is connected to at least one second connector, and the pulse output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one pulse input interface and the at least one pulse output interface respectively, and the programmable relay is used to control the connection between at least one pulse input interface and at least one pulse output interface, so that the test signal obtained by the pulse input interface is output to the connected pulse output interface.

7. The automatic test adapter according to claim 2, characterized in that: The relay array module includes an analog switching module, and the analog switching module includes: At least one analog input interface, wherein each of the analog input interfaces is connected to at least one of the first connectors, and the analog input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is an analog signal; At least one analog output interface, wherein each of the analog output interfaces is connected to at least one second connector, and the analog output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one analog input interface and the at least one analog output interface respectively, and the programmable relay is used to control the connection between at least one analog input interface and at least one analog output interface, so that the test signal obtained by the analog input interface is output to the connected analog output interface.

8. The automatic test adapter according to claim 2, characterized in that: The relay array module includes a multimeter switching module, and the multimeter switching module includes: At least one multimeter input interface, wherein each of the multimeter input interfaces is connected to at least one of the first connectors, and the multimeter input interface is used to obtain a test signal obtained by each of the first connectors connected thereto, the test signal being a multimeter signal; At least one multimeter output interface, wherein each of the multimeter output interfaces is connected to at least one second connector, and the multimeter output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one multimeter input interface and the at least one multimeter output interface respectively, and the programmable relay is used to control the connection between at least one of the multimeter input interfaces and at least one of the multimeter output interfaces, so that the test signal obtained by the multimeter input interface is output to the connected multimeter output interface.

9. The automatic test adapter according to claim 2, characterized in that: The relay array module includes a simulation module, and the simulation module includes: At least one simulation input interface, wherein each of the simulation input interfaces is connected to at least one of the first connectors, and the simulation input interface is used to obtain a test signal obtained by each of the connected first connectors, and the test signal is a simulation signal; At least one simulation output interface, wherein each of the simulation output interfaces is connected to at least one second connector, and the simulation output interface is used to output the acquired test signal to the connected second connector; A programmable relay, wherein the programmable relay is connected to the at least one simulation input interface and the at least one simulation output interface respectively, and the programmable relay is used to control the at least one simulation input interface to be connected to the at least one simulation output interface, so that the test signal obtained by the simulation input interface is output to the connected simulation output interface.

10. An automatic testing system, characterized in that: include: The automatic test adapter according to any one of claims 1 to 9; At least one test device and at least one device under test are respectively connected to the automatic test adapter, wherein at least one test signal output by at least one of the test devices is transmitted to at least one of the devices under test through the automatic test adapter, so that a corresponding device test operation is performed on at least one of the devices under test through at least one of the test signals.

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