Test system and method

Abstract

The invention relates to the technical field of product testing, and discloses a testing system and method.The testing system comprises a testing computer, a measuring instrument and a plurality of testing tools, and each testing tool comprises a switching module, a gating module and an output module; the switching module is used for transmitting the operation signal generated by the test computer to the corresponding target to-be-tested mainboard, so that the target to-be-tested mainboard generates a mainboard signal; the gating module is used for conducting a target channel between the target to-be-tested mainboard and the corresponding output module according to a test signal generated by the test computer, and the test signal is generated by the test computer according to the corresponding target to-be-tested mainboard; and the gating module is also used for transmitting the main board signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target to-be-measured main board according to the main board signal. Compared with the prior art that only one test tool can be matched with one test computer, one test computer can be matched with a plurality of test tools for measurement.

Description

Technical Field

[0001] The present application relates to the field of product testing technology, and in particular to a testing system and method. Background Art

[0002] In the manufacturing process of electronic products, test fixtures are an indispensable part used to check whether the assembled products have defects. In the prior art, a test computer is generally connected to a test fixture, and the test fixture is then connected to the motherboard to be tested and the measuring instrument. The test computer first transmits the generated operation signal to the motherboard to be tested through the test fixture, and the motherboard to be tested runs. Then the measuring instrument collects the motherboard signal on the motherboard to be tested through the test fixture to complete the measurement.

[0003] Currently, since one test computer can only be used with one test fixture, how to enable one test computer to be used with multiple test fixtures for measurement is a technical problem that needs to be solved urgently. Summary of the invention

[0004] The main purpose of the present application is to provide a testing system and method, which aims to solve the existing technical problem of how to enable a computer to be tested with multiple test tools when testing a motherboard to be tested.

[0005] To achieve the above-mentioned purpose, the present application provides a test system, the test system comprising: a test computer, a measuring instrument and several test tools, the test tools comprising: a switching module, a gating module and an output module;

[0006] The adapter module is connected to the test computer and the corresponding mainboard to be tested, and the gating module is respectively connected to the test computer, the corresponding adapter module and each output module;

[0007] The adapter module is used to transmit the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal;

[0008] The gating module is used to conduct the target channel between the target motherboard to be tested and the corresponding output module according to the test signal generated by the test computer, and the test signal is generated by the test computer according to the corresponding target motherboard to be tested;

[0009] The gating module is also used to transmit the mainboard signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

[0010] In one embodiment, the adapter module is further used to use the connected mainboard to be tested as the target mainboard to be tested when the operating signal matches the connected mainboard to be tested, and transmit the operating signal to the target mainboard to be tested.

[0011] In one embodiment, the adapter module is further used to transmit the operating signal to the output module when the operating signal does not match the connected mainboard to be tested;

[0012] The output module is used to transmit the operating signal to the adapter module in the test tooling corresponding to the operating signal, so that the adapter module in the test tooling corresponding to the operating signal takes the connected motherboard to be tested as the target motherboard to be tested, and transmits the operating signal to the target motherboard to be tested.

[0013] In one embodiment, the gating module is further used to transmit the mainboard signal to the output module according to the target channel;

[0014] The output module is further used to transmit the mainboard signal to the measuring instrument when the received mainboard signal is generated by the corresponding mainboard to be tested.

[0015] In one embodiment, the output module is further used to transmit the motherboard signal to the gating module through the adapter module when the received motherboard signal is not generated by the corresponding motherboard to be tested;

[0016] The gating module is further used to transmit the mainboard signal to the output module according to the target channel;

[0017] The output module is also used to transmit the mainboard signal to the measuring instrument.

[0018] In one embodiment, the gating module includes: a processing unit and a multiplexing unit;

[0019] The processing unit is connected to the multiplexing unit and the corresponding output module, and the multiplexing unit is connected to the corresponding switching module and the corresponding output module;

[0020] The processing module is used to generate a corresponding conduction signal according to the test signal and transmit it to the multiplexing unit;

[0021] The multiplexing unit is used to control the on / off of the channel between the corresponding adapter module and the corresponding output module according to the conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module;

[0022] The multiplexing unit is also used to transmit the mainboard signal to the measuring instrument according to the target channel.

[0023] In one embodiment, the multiplexing unit includes: a first multiplexing subunit and a second multiplexing subunit;

[0024] The first multiplexing subunit is respectively connected to the second multiplexing subunit, the corresponding switching module and the corresponding processing unit, and the second multiplexing subunit is respectively connected to the corresponding processing module and the corresponding output module;

[0025] The processing module is used to generate a corresponding first conduction signal according to the test signal and transmit it to the first multiplexing subunit, and to generate a corresponding second conduction signal according to the test signal and transmit it to the second multiplexing subunit;

[0026] The first multiplexing subunit is used to control the on / off of the channel between the corresponding switching module and the second multiplexing subunit according to the first conduction signal;

[0027] The second multiplexing subunit is used to control the on / off of the channel between the first multiplexing subunit and the corresponding output module according to the second conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module.

[0028] In one embodiment, the test fixture further includes: a first buffer module;

[0029] The first buffer module is respectively connected to the corresponding switching module, the corresponding gating module and the corresponding output module;

[0030] The first buffer module is used for, when the target motherboard to be tested is the corresponding motherboard to be tested, buffering the motherboard signal output by the adapter module once, and transmitting the once-buffered motherboard signal to the output module, so that the output module transmits the once-buffered motherboard signal to the measuring instrument;

[0031] The first buffer module is also used to buffer the mainboard signal output by the adapter module when the target mainboard to be tested is not the corresponding mainboard to be tested, and transmit the buffered mainboard signal to the selection module, so that the selection module transmits the buffered mainboard signal to the measuring instrument according to the target channel.

[0032] In one embodiment, the test fixture further comprises: a second buffer module;

[0033] The second buffer module is respectively connected to the corresponding gating module and the corresponding output module;

[0034] The second buffer module is also used to perform secondary buffering on the primary buffered mainboard signal output by the selection module, and transmit the secondary buffered mainboard signal to the output module, so that the output module transmits the secondary buffered mainboard signal to the measuring instrument.

[0035] In addition, to achieve the above-mentioned purpose, the present application provides a testing method, which is applied to a testing tool in a testing system; the testing system further comprises: a testing computer and a measuring instrument, the testing tool being connected to the testing computer and the measuring instrument respectively;

[0036] The method comprises the following steps:

[0037] Transmitting the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal;

[0038] The target channel between the target motherboard to be tested and the target motherboard to be tested is connected according to the test signal generated by the test computer, and the test signal is generated by the test computer according to the corresponding target motherboard to be tested;

[0039] The mainboard signal is transmitted to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

[0040] The present application provides a test system and method, the test system includes: a test computer, a measuring instrument and a plurality of test tools, the test tools include: a switching module, a gating module and an output module; the switching module is connected to the test computer and the corresponding mainboard to be tested, the gating module is respectively connected to the test computer, the corresponding switching module and each output module; the switching module is used to transmit the operation signal generated by the test computer to the corresponding target mainboard to be tested, so that the target mainboard to be tested generates a mainboard signal; the gating module is used to conduct the target channel between the target mainboard to be tested and the corresponding output module according to the test signal generated by the test computer, the test signal is generated by the test computer according to the corresponding target mainboard to be tested; the gating module is also used to transmit the mainboard signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

[0041] Since the test fixture in the present application can be provided with a transfer module, a gating module and an output module, the transfer module can transmit the operation signal generated by the test computer to the corresponding target motherboard to be tested, and the target motherboard to be tested can operate according to the operation signal and generate a corresponding motherboard signal, and the gating module can conduct the target channel between the target motherboard to be tested and the corresponding output module, so that the gating module can transmit the motherboard signal through the target channel to the measuring instrument for measurement. Compared with the existing test computer that can only be used with one test fixture, in the present application, one test computer can be used with multiple test fixtures for measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0043] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0044] Figure 1 This is a connection diagram of a traditional test system;

[0045] Figure 2 This is a schematic diagram of the structure of the first embodiment of the test system of the present application;

[0046] Figure 3 This is a schematic diagram of the flow of operating signals in the first embodiment of the test system of the present application;

[0047] Figure 4 This is a schematic diagram of the flow of test signals in the first embodiment of the test system of the present application;

[0048] Figure 5 This is a schematic diagram of the flow of mainboard signals in the first embodiment of the test system of this application;

[0049] Figure 6 This is a practical connection diagram of the first embodiment of the test system of this application;

[0050] Figure 7 This is a schematic diagram of the structure of the test tooling in the second embodiment of the test system of the present application;

[0051] Figure 8 A circuit schematic diagram of a multiplexing unit in a second embodiment of the test system of the present application;

[0052] Fig. 9 This is a schematic diagram of the signal measurement process in the second embodiment of the test system of the present application;

[0053] Fig.10 This is a schematic diagram of the structure of the third embodiment of the test system of the present application;

[0054] Fig.11 This is a flow chart of the first embodiment of the testing method of the present application.

[0055] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0056] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0057] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0058] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0059] In addition, the descriptions of "first", "second", etc. in this application are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0060] It is understandable that in the manufacturing process of electronic products, test tools are an indispensable part used to check whether the assembled products have defects. Figure 1 , Figure 1 This is a schematic diagram of the traditional test system connection, such as Figure 1As shown, generally a test computer is connected to a test fixture, and the test fixture is then connected to the motherboard to be tested and the measuring instrument. The test computer first transmits the generated operating signal to the motherboard to be tested through the test fixture, and the motherboard to be tested runs. Then the measuring instrument collects the motherboard signal on the motherboard to be tested through the test fixture to complete the measurement.

[0061] Currently, since one test computer can only be used with one test fixture, how to enable one test computer to be used with multiple test fixtures for measurement is a technical problem that needs to be solved urgently.

[0062] Therefore, in order to solve the above defects, this embodiment provides a test system and method. The test system may include several test fixtures. The test fixtures may be provided with a switching module, a gating module and an output module. The switching module may transmit the operation signal generated by the test computer to the corresponding target motherboard to be tested. The target motherboard to be tested may run according to the operation signal and generate a corresponding motherboard signal. The gating module may connect the target channel between the target motherboard to be tested and the corresponding output module, so that the gating module can transmit the motherboard signal through the target channel to the measuring instrument for measurement. Compared with the existing test computer that can only be matched with one test fixture, in this embodiment, one test computer can be matched with multiple test fixtures for measurement.

[0063] For ease of understanding, the following combination Figures 2 to 10 The test system provided in the embodiment of the present application is introduced in detail.

[0064] Reference Figure 2 , Figure 2 The first embodiment of the test system of the present application is shown in FIG. Figure 2 As shown, in this embodiment, the test system includes: a test computer, a measuring instrument and a number of test tools, and the test tools include: a switching module, a gating module and an output module;

[0065] The adapter module is connected to the test computer and the corresponding mainboard to be tested, and the gating module is respectively connected to the test computer, the corresponding adapter module and each output module.

[0066] It should be noted that the test computer in this embodiment can be any computer used to control the operation of the motherboard to be tested, in which a host computer can be installed, and the host computer communicates with the test tooling to complete the control of the operation of the motherboard to be tested. The above-mentioned test instrument can be an instrument for measuring the signal quality of the motherboard to be tested, such as measuring the current and voltage of the motherboard to be tested, and this embodiment does not limit this.

[0067] It should also be noted that in this embodiment, multiple test fixtures may be provided. Of course, if only one test fixture is required, one test fixture may also be used. Figure 2 As shown, no matter a single test fixture is used for testing or multiple test fixtures are used for testing respectively, the internal structure of each test fixture can be consistent, that is, they can all include the above-mentioned switching module, gating module and output module.

[0068] For ease of understanding, Figure 2 As shown, this embodiment uses three test fixtures to measure three corresponding mainboards to be tested for illustration, and each test fixture is respectively recorded as test fixture 1 to test fixture 3, and each mainboard to be tested is respectively recorded as mainboard to be tested 1 to mainboard to be tested 3, and then the adapter modules in test fixture 1 to test fixture 3 can be correspondingly recorded as adapter module 1 to adapter module 3, the selection modules can be correspondingly recorded as selection module 1 to selection module 3, and the output modules can be correspondingly recorded as output module 1 to output module 3.

[0069] For the convenience of subsequent explanation, in this embodiment, the test jig connected to the test computer and the measuring instrument (i.e., the above-mentioned test jig 1) can be recorded as the main test jig, and the remaining test jigs can be recorded as slave test jigs because they are not directly connected to the test computer and the measuring instrument (i.e., the above-mentioned test jig 2 and test jig 3). Then, the adapter module (i.e., the above-mentioned adapter module 1) in the main test jig can be recorded as the main adapter module, the gating module (i.e., the above-mentioned gating module 1) can be recorded as the main gating module, and the output module (i.e., the above-mentioned output module 1) can be recorded as the main output module. Similarly, the adapter module (i.e., the above-mentioned adapter module 2 and adapter module 3) in the slave test jig can be recorded as the slave adapter module, the gating module (i.e., the above-mentioned gating module 2 and gating module 3) can be recorded as the slave gating module, and the output module (i.e., the above-mentioned output module 2 and output module 3) can be recorded as the slave output module.

[0070] It should be emphasized that when using at least two test fixtures, the connection relationship is as follows Figure 2 As shown, the main switching module of the main test fixture is respectively connected to the test computer, the main board 1 to be tested corresponding to the main test fixture, the main output module of the main test fixture and the main gating module of the main test fixture, the main gating module of the main test fixture is connected to the test computer and the main output module of the main test fixture, and the main output module of the main test fixture is respectively connected to the measuring instrument and the slave output modules of each slave test fixture. The switching module in the slave test fixture is respectively connected to the main board to be tested corresponding to the slave test fixture, the slave gating module corresponding to the slave test fixture and the slave output module corresponding to the slave test fixture, and the slave gating module of the slave test fixture is also connected to the slave output module of the slave test fixture.

[0071] Figure 2The connection method in the example is that the slave output modules of each slave test fixture are connected to the master output module of the master test fixture, which can be understood as a parallel form. As another implementation method, a series form can also be used in this embodiment, that is, the master output module of the master test fixture is connected to a slave output module of a slave test fixture, and the slave output module of the slave test fixture is connected to the slave output module of the next slave test fixture, so that the scheme can also be implemented by connecting in series in sequence. This embodiment uses the above-mentioned parallel form for illustration, but is not limited to this.

[0072] It is also important to emphasize that when only one test fixture is required, for example Figure 2 The test fixture 1 tests the mainboard 1 to be tested, and the output module 1 of the test fixture 1 only needs to be connected to the measuring instrument, and does not need to be connected to the output modules of other test fixtures, which will not be elaborated in this embodiment.

[0073] In this embodiment, when measuring the motherboard to be tested, the adapter module is used to transmit the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal.

[0074] It should be noted that the target motherboard to be tested can be the motherboard to be tested that is currently in need of testing, and can be selected according to the user's current measurement needs. The operation signal can be a signal that causes the target motherboard to be tested to operate and generate a motherboard signal, that is, the user can select the motherboard to be tested that needs to be measured on the test computer, and the motherboard to be tested can be used as the target motherboard to be tested, and the corresponding operation signal can be generated according to the motherboard to be tested.

[0075] It is understandable that the operating signal generated by the test computer can be transmitted to the corresponding target motherboard to be tested through the main adapter module of the main test tooling. Therefore, in order to enable the main adapter module to transmit the operating signal to the correct target motherboard to be tested, in this embodiment, the adapter module is also used to treat the connected motherboard to be tested as the target motherboard to be tested when the operating signal matches the connected motherboard to be tested, and transmit the operating signal to the target motherboard to be tested.

[0076] The adapter module is further used to transmit the operating signal to the output module when the operating signal does not match the connected mainboard to be tested;

[0077] The output module is used to transmit the operating signal to the adapter module in the test tooling corresponding to the operating signal, so that the adapter module in the test tooling corresponding to the operating signal takes the connected motherboard to be tested as the target motherboard to be tested, and transmits the operating signal to the target motherboard to be tested.

[0078] It should be understood that the output module may be a module having a signal transmission function, such as an output interface, etc., and this embodiment does not limit this. Figure 3 , Figure 3 This is a schematic diagram of the flow of operating signals in the first embodiment of the test system of this application. Figure 3 As shown, after the main adapter module of the main test fixture receives the running signal output by the test computer, it can first determine whether it matches the connected motherboard to be tested (i.e., motherboard to be tested 1), that is, whether the motherboard to be tested 1 is currently being tested; if so, the motherboard to be tested 1 can be used as the target motherboard to be tested, and the running signal can be transmitted to the target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal (i.e., Figure 3 The running signal is from the test power → the transfer module 1 → the mainboard to be tested 1);

[0079] If the main adapter module of the main test fixture determines that the connected motherboard to be tested 1 does not match the operating signal, the operating signal can be transmitted to the main output module in the main test fixture, and the main output module then transmits the operating signal to the corresponding slave output module in the slave test fixture according to the operating signal. Figure 2 Taking the test fixture 2 in the test fixture as an example, the main output module can transmit the operating signal to the output module 2 in the test fixture 2, and the slave output module in the slave test fixture can transmit the operating signal to the slave adapter module in the slave test fixture, that is, to the adapter module 2, and then the slave adapter module can use the connected motherboard to be tested (that is, motherboard to be tested 2) as the target motherboard to be tested, and transmit the operating signal to the target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal (that is Figure 3 The running signal is from test power → adapter module 1 → output module 1 → output module 2 → adapter module 2 → mainboard to be tested 2).

[0080] The gating module is used to conduct the target channel between the target motherboard to be tested and the corresponding output module according to the test signal generated by the test computer. The test signal is generated by the test computer according to the corresponding target motherboard to be tested.

[0081] It should be noted that, during measurement, the test computer can also generate a corresponding test signal according to the target motherboard to be tested, and transmit the test signal to the corresponding gating module. The gating module in this embodiment can be a module with a gating function, such as a multiplexer, etc., which is not limited in this embodiment. The above-mentioned target channel can be a channel for transmitting the motherboard signal of the target motherboard to be tested to the measuring instrument.

[0082] Reference Figure 4 , Figure 4 FIG. 1 is a flow diagram of the test signal in the first embodiment of the test system of the present application. Figure 4 As shown, when the motherboard to be tested (i.e., motherboard to be tested 1) connected to the main test fixture is the target motherboard to be tested, the test computer can transmit the corresponding test signal to the main gating module (i.e., gating module 1) of the main test fixture, and the main gating module can conduct the channel between the motherboard to be tested 1 and the output module 1 as the target channel according to the test signal (i.e., Figure 4 The test signal is from the test computer to the selection module 1);

[0083] When the main board to be tested connected to the main test tool is not the target main board to be tested, the main board to be tested connected to a slave test tool can be the target main board to be tested. Furthermore, in this embodiment, the output module is also used to transmit the test signal transmitted by the selection module to the selection module of the connected test tool, so that the selection module of the connected test tool turns on the target channel between the target main board to be tested and the corresponding output module according to the test signal.

[0084] Continue to combine Figure 4 For the main test fixture, the main gating module can connect the channel between the target mainboard to be tested and the measuring instrument connected to the main output module. At the same time, the main gating module can also transmit the test signal to the main output module. The main output module can transmit the test signal to the slave output module of the connected slave test fixture. The slave output module then transmits the test signal to the slave gating module in the slave test fixture. The slave gating module can connect the target mainboard to be tested with the corresponding slave output module according to the test signal, thereby connecting the target channel between the target mainboard to be tested and the measuring instrument connected to the main output module.

[0085] For example, continue as Figure 4 As shown, for example, when the motherboard 2 to be tested is the target motherboard to be tested, the gating module 1 can receive the test signal generated by the test computer and transmit the test signal to the output module 1. The output module 1 then transmits the test signal to the slave output modules in the slave test tooling, that is, to the output module 2 and the output module 3. The corresponding slave output module transmits the test signal to the corresponding slave gating module, that is, the output module 2 transmits the test signal to the gating module 2, and the output module 3 transmits the test signal to the gating module 3. Since the motherboard 2 to be tested needs to be measured, the gating module 1 can connect the channel corresponding to the motherboard 2 to be tested between the conversion module 1 and the output module 1 according to the test signal. Similarly, for the gating module 2, the channel of the motherboard 2 to be tested in the adapter module 2 and the output module 2 can be connected. For the gating module 3, since the motherboard 3 to be tested does not need to be used, all channels in the gating module 3 can be disconnected (that is, Figure 4The test signal goes from test computer → selection module 1 → output module 1 → output module 2 → selection module 2, and the test signal goes from test computer → selection module 1 → output module 1 → output module 3 → selection module 3).

[0086] After the target channel is turned on, the gating module is further used to transmit the mainboard signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

[0087] In this embodiment, when the target channel is turned on, the selection module can transmit the mainboard signal to the conversion module in the connected test tooling according to the corresponding target channel, and then transmit it to the selection module in the test tooling, and the selection module then transmits it to the output module in the test tooling according to the turned-on channel, and the output module then transmits it to the measuring instrument.

[0088] Specifically, the gating module is further used to transmit the mainboard signal to the output module according to the target channel;

[0089] The output module is further used to transmit the mainboard signal to the measuring instrument when the received mainboard signal is generated by the corresponding mainboard to be tested.

[0090] For ease of understanding, refer to Figure 5 , Figure 5 This is a schematic diagram of the flow of motherboard signals in the first embodiment of the test system of this application. Figure 5 As shown, when the motherboard to be tested 1 is the target motherboard to be tested, the motherboard signal can be transmitted to the main switching module, the main conversion module can transmit it to the main gating module according to the turned-on target channel, and the main gating module transmits it to the main output module. Since the motherboard signal is generated by the motherboard to be tested (i.e., motherboard to be tested 1) corresponding to the main output module, the main output module can transmit the motherboard signal to the measuring instrument (i.e., Figure 5 The main board signal goes from the main board to be tested 1 → adapter module 1 → selection module 1 → output module 1 → measuring instrument).

[0091] When the motherboard to be tested 2 is the target motherboard to be tested, the motherboard signal can be transmitted to the slave adapter module (i.e., adapter module 2) in the slave test fixture, and the slave adapter module can transmit it to the corresponding slave gating module (i.e., gating module 2) according to the turned-on target channel, and the gating module is then transmitted to the corresponding slave output module (i.e., output module 2), and the output module is then transmitted to the main output module (i.e., output module 1), and the main output module is then transmitted to the measuring instrument for measurement (i.e., Figure 5 The main board signal goes from the tested main board 2 → adapter module 2 → selection module 2 → output module 2 → output module 1 → measuring instrument).

[0092] Furthermore, considering that the input end of the measuring instrument is fixed, in this embodiment, since the interface in the output module is fixed to the measuring instrument, the mainboard signal received from the connected test fixture cannot be directly transmitted to the measuring instrument. Therefore, in this embodiment, the output module is also used to transmit the mainboard signal received to the gating module through the adapter module when the mainboard signal is not generated by the corresponding mainboard to be tested;

[0093] The gating module is further used to transmit the mainboard signal to the output module according to the target channel;

[0094] The output module is also used to transmit the mainboard signal to the measuring instrument.

[0095] It should be noted that, based on the above example, if the mainboard signal is generated by the mainboard 2 to be tested, after the main output module receives the mainboard signal output by the output module 2 of the test fixture 2, since the mainboard signal is not generated by the test mainboard 1, the main output module can first transmit the operation signal to the main adapter module, and then the main adapter module transmits it to the main selection module according to the target channel, the main selection module then transmits it to the main output module according to the target channel, and then the main output module transmits it to the measuring instrument (that is, Figure 5 The main board signal goes from the tested main board 2 → adapter module 2 → strobe module 2 → output module 2 → output module 1 → adapter module 1 → strobe module 1 → output module 1 → measuring instrument).

[0096] For ease of understanding, refer to Figure 6 , Figure 6 This is the actual connection diagram of the first embodiment of the test system of this application. Figure 6 As shown, in this embodiment, three motherboards to be tested need to be measured. Figure 6 A connection method is given, in which the test tool 1 is connected to the motherboard 1 to be tested, the test tool 2 is connected to the motherboard 2 to be tested, and the test tool 3 is connected to the motherboard 3 to be tested (for details, please refer to Figure 2 ), assuming that there are four signal lines on each motherboard to be tested and four signal lines on the measuring instrument, the output module of the test tooling may include a first output port and a second output port, wherein the first output port can be used to connect to the first output port of the measuring instrument or other test tooling, and the second output port can be connected to the second output port of other measuring instruments.

[0097] Since four signal lines need to be occupied, twelve first output ports can be set, which are respectively recorded as first output port 1 to first output port 12, and two second output ports can be set, which are respectively recorded as second output port 1 and second output port 1. For test fixture 1, first output port 1 to first output port 4 can be connected to the measuring instrument, first output port 5 to first output port 8 can be connected to first output port 1 to first output port 4 of test fixture 2, first output port 9 to first output port 12 of test fixture 1 can be connected to first output port 1 to first output port 4 of test fixture 3, second output port 1 and second output port 2 of test fixture 1 can be connected to second output port 1 and second output port 2 of test fixture 2, second output port 1 and second output port 2 of test fixture 2 can be connected to second output port 1 and second output port 2 of test fixture 3, Figure 6 The second output port may be connected in series or in parallel, which will not be elaborated in this embodiment.

[0098] Furthermore, in actual use, the operating signal can be transmitted to the test fixture 2 through the first output port 5 to the first output port 8 of the test fixture 1, and can also be transmitted to the test fixture 3 through the first output port 5 to the first output port 8 of the test fixture 1; the test signal can be transmitted to the test fixture 2 through the second output port 1 and the second output port 2 of the test fixture 1, and can also be transmitted to the test fixture 3 through the second output port 1 and the second output port 2 of the test fixture 1; the mainboard signal of the mainboard 1 to be tested can be transmitted to the measuring instrument through the first output port 1 to the first output port 4 of the test fixture 1, the mainboard signal of the mainboard 2 to be tested can be transmitted to the test fixture 1 through the first output port 1 to the first output port 4 of the test fixture 2, and then transmitted to the measuring instrument through the first output port 1 to the first output port 4 of the test fixture 1, and the mainboard signal of the mainboard 3 to be tested can be transmitted to the test fixture 1 through the first output port 1 to the first output port 4 of the test fixture 3, and then transmitted to the measuring instrument through the first output port 1 to the first output port 4 of the test fixture 1.

[0099] The test system of this embodiment may include several test fixtures, and the test fixture may be provided with a transfer module, a gating module and an output module. The transfer module may transmit the operation signal generated by the test computer to the corresponding target motherboard to be tested, and the target motherboard to be tested may run according to the operation signal and generate a corresponding motherboard signal. The gating module may connect the target channel between the target motherboard to be tested and the corresponding output module, so that the gating module can transmit the motherboard signal through the target channel to the measuring instrument for measurement. Compared with the existing test computer that can only be used with one test fixture, in this embodiment, one test computer can be used with multiple test fixtures for measurement. At the same time, in this embodiment, one measuring instrument can also be used with multiple test fixtures for measurement.

[0100] Reference Figure 7 , Figure 7 This is a structural schematic diagram of the test tooling in the second embodiment of the test system of the present application. Based on the above-mentioned first embodiment, the second embodiment of the test system of the present application is proposed.

[0101] In order to realize the gating function, such as Figure 7 As shown, the gating module includes: a processing unit and a multiplexing unit;

[0102] The processing unit is connected to the multiplexing unit and the corresponding output module, and the multiplexing unit is connected to the corresponding switching module and the corresponding output module.

[0103] It should be noted that in this embodiment, the processing unit can be any unit with a program running function, such as a microprocessor, etc., and this embodiment does not limit this. The multiplexing unit can be any unit with a gating function, such as a multiplexer, etc., and this embodiment does not limit this.

[0104] It should also be noted that the processing unit in this embodiment can be connected to the output module and the multiplexing unit in the test tooling, and the multiplexing unit can also be connected to the switching module and the output module in the test tooling.

[0105] The processing module is used to generate a corresponding conduction signal according to the test signal and transmit it to the multiplexing unit;

[0106] The multiplexing unit is used to control the on / off of the channel between the corresponding adapter module and the corresponding output module according to the conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module;

[0107] The multiplexing unit is also used to transmit the mainboard signal to the measuring instrument according to the target channel.

[0108] It is understandable that the above-mentioned conduction signal can be a signal for controlling the conduction of the channel corresponding to the multiplexing unit. In actual use, if the test fixture is used as the main test fixture, and the target motherboard to be tested is the motherboard to be tested connected to the main test fixture, the test computer directly transmits the test signal to the processing unit, and the processing unit generates a corresponding conduction signal according to the test signal and transmits it to the multiplexing unit, and the multiplexing unit conducts the channel between the adapter module and the output module according to the conduction signal, and the target channel between the target motherboard to be tested and the output module;

[0109] If the target motherboard to be tested is the motherboard to be tested connected to the slave test fixture, then for the master test fixture, after the processing unit generates the corresponding conduction signal and transmits it to the connected multiplexing unit, it combines Figure 4as well as Figure 7 As shown, the processing unit of the main test tooling can also transmit the test signal to the output module of the main test tooling, and the output module of the main test tooling transmits the test signal to the output module of the slave test tooling, and the output module of the slave test tooling transmits the test signal to the processing unit of the slave test tooling, and the processing unit of the slave test tooling can also generate a corresponding conduction signal according to the test signal and transmit it to the multiplexing unit of the slave test tooling.

[0110] When transmitting the motherboard signal, combined with Figure 5 as well as Figure 7 As shown, if the target motherboard to be tested is the motherboard to be tested connected to the main test fixture, the adapter module of the main test fixture can transmit the motherboard signal to the multiplexing unit of the main test fixture, and the multiplexing unit transmits it to the output module of the main test fixture according to the target channel, and the output module of the main test fixture then transmits the motherboard signal to the measuring instrument;

[0111] If the target motherboard to be tested is the motherboard to be tested connected to the slave test tooling, the adapter module of the slave test tooling can transmit the motherboard signal to the multiplexing unit of the slave test tooling, the multiplexing unit of the slave test tooling then transmits the motherboard signal to the output module of the slave test tooling according to the target channel, the output module of the slave test tooling then transmits the motherboard signal to the output module of the main test tooling, the output module of the main test tooling then transmits the motherboard signal to the adapter module of the main test tooling, the adapter module of the main test tooling then transmits the motherboard signal to the multiplexing unit of the main test tooling, the multiplexing unit of the main test tooling then transmits the motherboard signal to the output module of the main test tooling according to the target channel, and the output module of the main test tooling then transmits it to the measuring instrument for measurement.

[0112] Furthermore, considering that when the number of test fixtures is large, in order to facilitate conduction, continue as follows Figure 7 As shown, in this embodiment, the multiplexing unit includes: a first multiplexing subunit and a second multiplexing subunit;

[0113] The first multiplexing subunit is respectively connected to the second multiplexing subunit, the corresponding switching module and the corresponding processing unit, and the second multiplexing subunit is respectively connected to the corresponding processing module and the corresponding output module.

[0114] It should be understood that in this embodiment, the first multiplexing subunit in the test tooling can be respectively connected to the adapter module in the test tooling, the processing unit in the test tooling and the second multiplexing subunit, and the second multiplexing subunit in the test tooling can also be respectively connected to the processing unit in the test tooling and the output module in the test tooling.

[0115] The processing module is used to generate a corresponding first conduction signal according to the test signal and transmit it to the first multiplexing subunit, and to generate a corresponding second conduction signal according to the test signal and transmit it to the second multiplexing subunit;

[0116] The first multiplexing subunit is used to control the on / off of the channel between the corresponding switching module and the second multiplexing subunit according to the first conduction signal;

[0117] The second multiplexing subunit is used to control the on / off of the channel between the first multiplexing subunit and the corresponding output module according to the second conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module.

[0118] It should be noted that, in this embodiment, the above-mentioned conduction signal may include a first conduction signal for controlling the first multiplexing subunit and a second conduction signal for controlling the second multiplexing subunit.

[0119] In actual use, if the test fixture is used as the main test fixture, and the target mainboard to be tested is the mainboard to be tested connected to the main test fixture, the test computer will transmit the test signal directly to the processing unit, and the processing unit will generate a corresponding first conduction signal according to the test signal and transmit it to the first multiplexing subunit, generate a corresponding second conduction signal and transmit it to the second multiplexing subunit, the first multiplexing subunit will conduct the corresponding channel in the channel between the adapter module in the test fixture and the second multiplexing subunit according to the first conduction signal, and disconnect the other channels, the second multiplexing subunit will conduct the corresponding channel in the channel between the first multiplexing subunit and the output module according to the second conduction signal, and disconnect the other channels, so that the target channel between the target mainboard to be tested and the corresponding output module is conducted;

[0120] If the target motherboard to be tested is the motherboard to be tested connected to the slave test fixture, then for the master test fixture, after the processing unit generates a corresponding first conduction signal to transmit to the connected first multiplexing subunit and generates a corresponding second conduction signal to transmit to the corresponding second multiplexing subunit, the processing unit generates a corresponding first conduction signal to transmit to the connected first multiplexing subunit and generates a corresponding second conduction signal to transmit to the corresponding second multiplexing subunit, Figure 4 as well as Figure 7 As shown, the processing unit of the main test tooling can also transmit the test signal to the output module of the main test tooling, and the output module of the main test tooling then transmits the test signal to the output module of the slave test tooling, and the output module of the slave test tooling then transmits the test signal to the processing unit of the slave test tooling, and the processing unit of the slave test tooling can also generate corresponding first conduction signals and second conduction signals according to the test signal, and transmit them to the first multiplexing sub-unit and the second multiplexing sub-unit of the slave test tooling respectively.

[0121] When transmitting the motherboard signal, combined with Figure 5 as well as Figure 7As shown, if the target motherboard to be tested is the motherboard to be tested connected to the main test fixture, the adapter module of the main test fixture can transmit the motherboard signal to the first multiplexing subunit of the main test fixture, the first multiplexing subunit transmits it to the second multiplexing subunit of the main test fixture according to the target channel, the second multiplexing subunit transmits it to the output module of the main test fixture according to the target channel, and the output module of the main test fixture then transmits the motherboard signal to the measuring instrument;

[0122] If the target motherboard to be tested is the motherboard to be tested connected to the slave test tooling, the adapter module of the slave test tooling can transmit the motherboard signal to the first multiplexing subunit of the slave test tooling, the first multiplexing subunit of the slave test tooling then transmits the motherboard signal to the second multiplexing subunit of the slave test tooling according to the target channel, the second multiplexing subunit then transmits it to the output module of the slave test tooling according to the target channel, the output module of the slave test tooling then transmits the motherboard signal to the output module of the main test tooling, the output module of the main test tooling then transmits the motherboard signal to the adapter module of the main test tooling, the adapter module of the main test tooling then transmits the motherboard signal to the first multiplexing subunit of the main test tooling, the first multiplexing subunit of the main test tooling then transmits the motherboard signal to the second multiplexing subunit of the main test tooling according to the target channel, the second multiplexing subunit then transmits the motherboard signal to the output module of the main test tooling according to the target channel, and the output module of the main test tooling then transmits it to the measuring instrument for measurement.

[0123] It should be emphasized that the first multiplexing subunit and the second multiplexing subunit in this embodiment can be set according to the number of signal lines of the specific motherboard to be tested and the number of motherboards to be tested. For example, refer to Figure 8 , Figure 8 FIG. 1 is a circuit diagram of a multiplexing unit in the second embodiment of the test system of the present application. Figure 8 As shown, in this embodiment, if three motherboards to be tested are measured, there are four signal lines on each motherboard to be tested to transmit motherboard signals, and thus there are twelve signal lines. This embodiment can be implemented using two first multiplexing subunits and one second multiplexing subunit, wherein the first multiplexing subunit can be a six-to-two selector, and the second multiplexing subunit can use a four-to-two selector. If the signal lines of the output motherboard signals of the motherboard to be tested 1 are recorded as S11, S12, S13 and S14, the signal lines of the output motherboard signals of the motherboard to be tested 2 are recorded as S21, S22, S23 and S24, and the signal lines of the output motherboard signals of the motherboard to be tested 3 are recorded as S31, S32, S33 and S34. At the same time, the first multiplexing subunit can be provided with an enable terminal (i.e. Figure 8 EN1 and EN2), through which the first conduction signal can be received, the second multiplexing subunit can be provided with an enable terminal (i.e. Figure 8 EN3), through which the second conduction signal can be received.

[0124] Then, the two first multiplexing subunits are divided into four input groups and four output groups, each input group includes three signal lines, and each output group includes one signal line. The second multiplexing subunit is divided into four input groups and two output groups, and the number of signal lines in each input and output group is one.

[0125] In actual use, when the target motherboard to be tested is the motherboard to be tested 1 connected to the test fixture 1, for the test fixture 1, since the motherboard signals of the three motherboards to be tested need to be transmitted, all twelve signal lines are connected. Then, when turned on, the first multiplexing subunit can connect the signal lines S11, S12, S13 and S14 with the second multiplexing subunit, that is, the two first multiplexing subunits transmit the motherboard signals on the signal lines S11 and S12 to the second multiplexing subunit, and transmit the motherboard signals on the signal lines S13 and S14 to the second multiplexing subunit. The second multiplexing subunit selects a group of outputs of the motherboard signals on the signal lines S11, S12, S13 and S14 and transmits them to the output module;

[0126] For other slave test fixtures, since they only need to be connected to the motherboard to be tested, they can select any group, that is, four signal lines from S11, S12, S13 and S14, or S21, S22, S23 and S24, or S31, S32, S33 and S34 to connect to the test fixture;

[0127] When the target motherboard to be tested is the motherboard to be tested 2 connected to the test fixture 2, for the test fixture 1, when it is turned on, the first multiplexing subunit can connect the signal lines S21, S22, S23 and S24 with the second multiplexing subunit, that is, the two first multiplexing subunits transmit the motherboard signals on the signal lines S21 and S22 to the second multiplexing subunit, and transmit the motherboard signals on the signal lines S23 and S24 to the second multiplexing subunit. The second multiplexing subunit selects a group of outputs of the motherboard signals on the signal lines S21, S22, S23 and S24 to the output module;

[0128] When the target motherboard to be tested is the motherboard to be tested 3 connected to the test fixture 3, for the test fixture 1, when it is turned on, the first multiplexing subunit can connect the signal lines S31, S32, S33 and S34 with the second multiplexing subunit, that is, the two first multiplexing subunits transmit the motherboard signals on the signal lines S31 and S32 to the second multiplexing subunit, and transmit the motherboard signals on the signal lines S33 and S34 to the second multiplexing subunit. The second multiplexing subunit selects a group of outputs of the motherboard signals on the signal lines S31, S32, S33 and S34 to the output module.

[0129] Therefore, in actual use, refer to Fig. 9 , Fig. 9 FIG. 1 is a flow chart of signal measurement in the second embodiment of the test system of the present application. Fig. 9 As shown, first, the operating signal and the test signal (i.e. Fig. 9 The target motherboard to be tested runs according to the running signal and generates a motherboard signal. The processing unit controls the multiplexing unit to turn on the corresponding target channel, which can be turned on according to a certain preset measurement sequence (i.e. Fig. 9 The microprocessor controls the multiplexing unit to switch channels in sequence), and the specific preset measurement sequence can be set according to the actual situation. For example, the motherboard 1 to be tested is measured first, then the motherboard 2 to be tested is measured, and finally the motherboard 3 to be tested is measured, and then the conduction sequence is S11, S12, S13 and S14, then S21, S22, S23 and S24, and then S31, S32, S33 and S34;

[0130] Then the output module generates the mainboard signal according to the corresponding target channel to the measuring instrument for measurement (i.e. Fig. 9 When the measurement of the target motherboard to be tested is completed, the processing unit can also generate a measurement completion signal to indicate that the measurement of the target motherboard to be tested is completed and transmit it to the test computer. After receiving the measurement completion signal, the test computer determines whether all the motherboards to be tested have completed the measurement (i.e. Fig. 9 If all signal lines are measured, the test computer displays the measurement results (i.e. Fig. 9 If not, the operation signal of the next target motherboard to be tested is generated according to the preset measurement sequence, and the test signal is transmitted to the test fixture, so that the test fixture continues to switch the target channel in the above manner. Since the switching process is consistent, this embodiment will not elaborate on this.

[0131] Reference Fig.10 , Fig.10 This is a structural schematic diagram of the third embodiment of the test system of the present application. Based on the above embodiments, the third embodiment of the test system of the present application is proposed.

[0132] like Fig.10 As shown, in this embodiment, considering that there may be more interference in the mainboard signal, in this embodiment, the above-mentioned test tooling further includes: a first buffer module;

[0133] The first buffer module is respectively connected to the corresponding switching module, the corresponding gating module and the corresponding output module;

[0134] The first buffer module is used for, when the target motherboard to be tested is the corresponding motherboard to be tested, buffering the motherboard signal output by the adapter module once, and transmitting the once-buffered motherboard signal to the output module, so that the output module transmits the once-buffered motherboard signal to the measuring instrument;

[0135] The first buffer module is also used to buffer the mainboard signal output by the adapter module when the target mainboard to be tested is not the corresponding mainboard to be tested, and transmit the buffered mainboard signal to the selection module, so that the selection module transmits the buffered mainboard signal to the measuring instrument according to the target channel.

[0136] It should be noted that the first buffer module in this embodiment may be any module with the function of reducing interference, for example, it may be a follower, etc. This embodiment is not limited to this.

[0137] In actual use, the first buffer module can buffer the mainboard signal output by the adapter module once, and transmit the buffered mainboard signal to the first multiplexing subunit.

[0138] But it should be emphasized that Fig.10 As shown, in this embodiment, the first buffer module can also be connected to the output module. The purpose is that when the target motherboard to be tested is the motherboard to be tested connected to the test tooling, there is no need to go through the subsequent first multiplexing subunit and the second multiplexing subunit for selection.

[0139] In actual use, when the first buffer module receives the mainboard signal generated by the mainboard to be tested connected to the test fixture, the mainboard signal can be buffered once, and the buffered mainboard signal is directly transmitted to the output module of the test fixture without passing through the subsequent first multiplexing subunit and the second multiplexing subunit;

[0140] When the first buffer module receives the mainboard signal generated by the mainboard to be tested connected to other test tools, it can also buffer the mainboard signal once and transmit the buffered mainboard signal to the first multiplexing subunit, which then transmits it to the second multiplexing subunit according to the target channel, and the second multiplexing subunit then transmits it to the output module according to the target channel.

[0141] Further, in order to improve the signal quality, continue as follows Fig.10 As shown, in this embodiment, the test fixture further includes: a second buffer module;

[0142] The second buffer module is respectively connected to the corresponding gating module and the corresponding output module;

[0143] The second buffer module is also used to perform secondary buffering on the primary buffered mainboard signal output by the selection module, and transmit the secondary buffered mainboard signal to the output module, so that the output module transmits the secondary buffered mainboard signal to the measuring instrument.

[0144] It should be noted that the second buffer module in this embodiment may be any module with the function of reducing interference, for example, it may be a follower, etc. This embodiment is not limited to this.

[0145] In actual use, after the second multiplexing subunit outputs the mainboard signal, the second buffer module can perform secondary buffering on the mainboard signal and transmit the secondary buffered mainboard signal to the output module of the test fixture.

[0146] In addition, to achieve the above purpose, the present application also provides a testing method, referring to Fig.11 , Fig.11 The flowchart of the first embodiment of the testing method of the present application is shown in FIG. Fig.11 As shown, in this embodiment, the method is applied to a test fixture in a test system; the test system further comprises: a test computer and a measuring instrument, and the test fixture is connected to the test computer and the measuring instrument respectively;

[0147] The method comprises the following steps:

[0148] Step S10: transmitting the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal;

[0149] Step S20: connecting a target channel between the target motherboard to be tested and the target motherboard to be tested according to a test signal generated by the test computer, wherein the test signal is generated by the test computer according to the corresponding target motherboard to be tested;

[0150] Step S30: transmitting the motherboard signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target motherboard to be tested according to the motherboard signal.

[0151] It should be noted that the method of this embodiment can be used in the scenario of testing any device. This embodiment uses the scenario of testing the motherboard to be tested for illustration, but is not limited to this. The execution subject of the method of this embodiment can be a device with data processing, program running and testing functions, such as the above-mentioned test tooling, etc. This embodiment is not limited to this. The following describes this embodiment and the following embodiments with the above-mentioned test tooling as the execution subject.

[0152] It is understandable that the specific process of the test method in this embodiment can refer to the embodiment of the above-mentioned test system. It should be emphasized that since the execution subject of the test method in this embodiment is the above-mentioned test tooling, when referring to the embodiment of the above-mentioned test system, it can be converted into the steps executed when the test tooling is the execution subject according to the corresponding logic, and the beneficial effects of the test method in this embodiment are consistent with the beneficial effects of the above-mentioned test system embodiment, and this embodiment will not be repeated.

[0153] In this embodiment, the target channel between the target motherboard to be tested can be connected by the test signal generated by the test computer, and the motherboard signal can be transmitted to the measuring device according to the target channel for measurement. Compared with the existing test computer that can only be used with one test tool, in this embodiment, one test computer can be used with multiple test tools for measurement. At the same time, in this embodiment, one measuring instrument can also be used with multiple test tools for measurement.

[0154] Furthermore, the step of transmitting the operating signal generated by the test computer to the corresponding target motherboard to be tested includes:

[0155] When the operation signal matches the connected mainboard to be tested, the connected mainboard to be tested is used as the target mainboard to be tested, and the operation signal is transmitted to the target mainboard to be tested.

[0156] Furthermore, the step of transmitting the operating signal generated by the test computer to the corresponding target motherboard to be tested includes:

[0157] When the operating signal does not match the connected mainboard to be tested, the operating signal is transmitted to the test tool corresponding to the operating signal, so that the test tool corresponding to the operating signal takes the connected mainboard to be tested as the target mainboard to be tested and transmits the operating signal to the target mainboard to be tested.

[0158] Furthermore, the step of transmitting the mainboard signal to the measuring instrument according to the target channel includes:

[0159] When the mainboard signal is generated by the corresponding mainboard to be tested, the mainboard signal is transmitted to the measuring instrument according to the target channel.

[0160] Furthermore, the step of transmitting the mainboard signal to the measuring instrument according to the target channel includes:

[0161] When the mainboard signal is not generated by the corresponding mainboard to be tested, the mainboard signal is transmitted to the corresponding test tool according to the target channel, so that the corresponding test tool transmits the mainboard signal to the measuring instrument.

[0162] Furthermore, the step of transmitting the mainboard signal to the measuring instrument according to the target channel includes:

[0163] When the target motherboard to be tested is the corresponding motherboard to be tested, buffering the motherboard signal once, and transmitting the buffered motherboard signal to the measuring instrument;

[0164] When the target motherboard to be tested is not the corresponding motherboard to be tested, the motherboard signal is buffered once, and the buffered motherboard signal is transmitted to the measuring instrument according to the target channel.

[0165] Furthermore, the step of transmitting the mainboard signal after the primary buffering to the measuring instrument comprises:

[0166] The mainboard signal after the primary buffering is buffered for a secondary time, and the mainboard signal after the secondary buffering is transmitted to the measuring instrument.

[0167] Furthermore, the step of connecting the target channel between the target motherboard to be tested according to the test signal generated by the test computer includes:

[0168] According to the test signal generated by the test computer, a target channel between the target motherboard to be tested is turned on according to a preset measurement sequence.

[0169] Furthermore, after the step of transmitting the mainboard signal to the measuring instrument according to the target channel, the method further includes:

[0170] The generated measurement completion signal is transmitted to the test computer, so that when the test computer determines that the test is not completed according to the measurement completion signal, the test computer generates an operation signal and a test signal for the next target motherboard to be tested according to a preset measurement sequence, and when the test computer determines that the test is completed according to the measurement completion signal, the measurement result is displayed.

[0171] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A testing system, characterized in that: The test system includes: a test computer, a measuring instrument and several test tools, and the test tools include: a switching module, a gating module and an output module; The adapter module is connected to the test computer and the corresponding mainboard to be tested, and the gating module is respectively connected to the test computer, the corresponding adapter module and each output module; The adapter module is used to transmit the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal; The gating module is used to conduct the target channel between the target motherboard to be tested and the corresponding output module according to the test signal generated by the test computer, and the test signal is generated by the test computer according to the corresponding target motherboard to be tested; The gating module is also used to transmit the mainboard signal to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

2. The test system according to claim 1, characterized in that: The adapter module is further used to use the connected mainboard to be tested as the target mainboard to be tested when the operating signal matches the connected mainboard to be tested, and transmit the operating signal to the target mainboard to be tested.

3. The test system according to claim 2, characterized in that: The adapter module is further used to transmit the operating signal to the output module when the operating signal does not match the connected mainboard to be tested; The output module is used to transmit the operating signal to the adapter module in the test tooling corresponding to the operating signal, so that the adapter module in the test tooling corresponding to the operating signal takes the connected motherboard to be tested as the target motherboard to be tested, and transmits the operating signal to the target motherboard to be tested.

4. The test system according to claim 1, characterized in that: The gating module is further used to transmit the mainboard signal to the output module according to the target channel; The output module is further used to transmit the mainboard signal to the measuring instrument when the received mainboard signal is generated by the corresponding mainboard to be tested.

5. The test system according to claim 4, characterized in that: The output module is further used for transmitting the mainboard signal to the gating module through the adapter module when the received mainboard signal is not generated by the corresponding mainboard to be tested; The gating module is further used to transmit the mainboard signal to the output module according to the target channel; The output module is also used to transmit the mainboard signal to the measuring instrument.

6. The test system according to claim 1, characterized in that: The gating module includes: a processing unit and a multiplexing unit; The processing unit is connected to the multiplexing unit and the corresponding output module, and the multiplexing unit is connected to the corresponding switching module and the corresponding output module; The processing module is used to generate a corresponding conduction signal according to the test signal and transmit it to the multiplexing unit; The multiplexing unit is used to control the on / off of the channel between the corresponding adapter module and the corresponding output module according to the conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module; The multiplexing unit is also used to transmit the mainboard signal to the measuring instrument according to the target channel.

7. The test system according to claim 6, characterized in that: The multiplexing unit comprises: a first multiplexing subunit and a second multiplexing subunit; The first multiplexing subunit is respectively connected to the second multiplexing subunit, the corresponding switching module and the corresponding processing unit, and the second multiplexing subunit is respectively connected to the corresponding processing module and the corresponding output module; The processing module is used to generate a corresponding first conduction signal according to the test signal and transmit it to the first multiplexing subunit, and to generate a corresponding second conduction signal according to the test signal and transmit it to the second multiplexing subunit; The first multiplexing subunit is used to control the on / off of the channel between the corresponding switching module and the second multiplexing subunit according to the first conduction signal; The second multiplexing subunit is used to control the on / off of the channel between the first multiplexing subunit and the corresponding output module according to the second conduction signal, so as to conduct the target channel between the target mainboard to be tested and the corresponding output module.

8. The test system according to claim 1, characterized in that: The test fixture further includes: a first buffer module; The first buffer module is respectively connected to the corresponding switching module, the corresponding gating module and the corresponding output module; The first buffer module is used for, when the target motherboard to be tested is the corresponding motherboard to be tested, buffering the motherboard signal output by the adapter module once, and transmitting the once-buffered motherboard signal to the output module, so that the output module transmits the once-buffered motherboard signal to the measuring instrument; The first buffer module is also used to buffer the mainboard signal output by the adapter module when the target mainboard to be tested is not the corresponding mainboard to be tested, and transmit the buffered mainboard signal to the selection module, so that the selection module transmits the buffered mainboard signal to the measuring instrument according to the target channel.

9. The test system according to claim 8, characterized in that: The test fixture further includes: a second buffer module; The second buffer module is respectively connected to the corresponding gating module and the corresponding output module; The second buffer module is also used to perform secondary buffering on the primary buffered mainboard signal output by the selection module, and transmit the secondary buffered mainboard signal to the output module, so that the output module transmits the secondary buffered mainboard signal to the measuring instrument.

10. A testing method, characterized in that: The method is applied to a test fixture in a test system; the test system further comprises: a test computer and a measuring instrument, the test fixture being connected to the test computer and the measuring instrument respectively; The method comprises the following steps: Transmitting the operating signal generated by the test computer to the corresponding target motherboard to be tested, so that the target motherboard to be tested generates a motherboard signal; The target channel between the target motherboard to be tested and the target motherboard to be tested is connected according to the test signal generated by the test computer, and the test signal is generated by the test computer according to the corresponding target motherboard to be tested; The mainboard signal is transmitted to the measuring instrument according to the target channel, so that the measuring instrument measures the corresponding target mainboard to be tested according to the mainboard signal.

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