Method and device for testing transmittance of infrared optical system and electronic equipment

Abstract

The invention provides a method and a device for testing transmittance of an infrared optical system and electronic equipment, and relates to the technical field of photoelectric measurement, the method and the device are used for a test system, the test system comprises a standard blackbody radiation source, the infrared optical system and an infrared detector, and the test method comprises the following steps: under the condition that the infrared optical system is not added in the test system, the infrared detector is detected; determining the standard value of the average response voltage of the infrared detector; under the condition that an infrared optical system is additionally arranged in the test system, signal voltage values of an infrared detector of the standard blackbody radiation source at the first temperature and the second temperature are collected; calculating the measured value of the average response voltage of the infrared detector according to the signal voltage value; and calculating the transmittance of the infrared optical system according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value. By respectively determining the average response voltage of the infrared detector when the infrared optical system is added and not added, the transmittance is calculated according to the ratio of the average response voltage to the average response voltage, and the accuracy of transmittance calculation is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of photoelectric measurement, and in particular relates to a method, a device and an electronic device for testing the transmittance of an infrared optical system. Background Art

[0002] The transmittance of an optical system refers to the ratio of the outgoing radiation flux to the incident radiation flux of the optical system, which indicates the strength of the optical system's ability to transmit light radiation energy in a certain band. Its size has a great influence on many performance indicators of the infrared optical system and the fidelity of image simulation. In order to carefully study the infrared spectral transmittance characteristics of the optical system, it is necessary to accurately measure the transmittance of the optical system in different infrared spectral bands.

[0003] Therefore, how to propose a test method that can accurately measure the transmittance of infrared optical systems has become a technical problem that needs to be solved urgently. Summary of the invention

[0004] In view of this, the present invention aims to solve the problem that the test results of the transmittance of an infrared optical system are not accurate enough.

[0005] A first aspect of an embodiment of the present invention provides a method for testing the transmittance of an infrared optical system.

[0006] A second aspect of an embodiment of the present invention provides a device for testing the transmittance of an infrared optical system.

[0007] A third aspect of an embodiment of the present invention provides another device for testing the transmittance of an infrared optical system.

[0008] A fourth aspect of an embodiment of the present invention provides an electronic device.

[0009] In view of this, a first aspect of the present invention proposes a test method for the transmittance of an infrared optical system, which is used for the test system. The test system includes a standard blackbody radiation source, an infrared optical system and an infrared detector. The test method includes: determining a standard value of an average response voltage of the infrared detector when the infrared optical system is not added to the test system; collecting a signal voltage value of the infrared detector at a first temperature and a second temperature of the standard blackbody radiation source when the infrared optical system is added to the test system; calculating a measured value of the average response voltage of the infrared detector based on the signal voltage value; and calculating the transmittance of the infrared optical system based on a ratio of the measured value of the average response voltage of the infrared detector to the standard value.

[0010] Optionally, in some technical schemes, when an infrared optical system is added to the test system, the step of collecting the signal voltage value of the infrared detector at the first temperature and the second temperature of the standard black body radiation source includes: determining the number of pixels in the infrared detector; and continuously collecting the same pixel more than 100 times when the standard black body radiation source is at the first temperature and the second temperature to obtain multiple signal voltage values.

[0011] Optionally, in some technical schemes, the number of signal voltage values ​​includes multiple, and the step of calculating the measured value of the average response voltage of the infrared detector based on the signal voltage values ​​includes: calculating the first pixel signal voltage value of the same pixel at the first temperature based on the multiple signal voltage values; calculating the second pixel signal voltage value of the same pixel at the second temperature based on the multiple signal voltage values; recording the absolute value of the difference between the first pixel signal voltage value and the second pixel signal voltage value as the response voltage value of the pixel; calculating the response voltage value of each pixel, and calculating the measurement value based on the multiple response voltage values.

[0012] Optionally, in some technical solutions, the pixels include valid pixels and invalid pixels, and the method of calculating the measurement value includes:

[0013]

[0014] in, represents the measured value, M represents the number of rows of the pixel array, N represents the number of columns of the pixel array, ω represents the number of invalid pixels, i represents the row coordinate of the pixel array, j represents the column coordinate of the pixel array, and V(i,j) represents the response voltage value of the pixel.

[0015] Optionally, in some technical schemes, invalid pixels include dead pixels, and the testing method also includes: calculating the radiation power of each pixel at a first temperature; calculating the response rate of the pixel based on the radiation power and the corresponding response voltage value; calculating the average response rate based on the response rate of the pixel and the number of pixels; recording pixels with a response rate less than a first threshold as dead pixels; wherein the first threshold is one-tenth of the average response rate.

[0016] Optionally, in some technical schemes, invalid pixels also include overheated pixels, and the testing method also includes: calculating the noise voltage of the pixel; calculating the average noise voltage of the infrared detector after removing the dead pixels based on the noise voltage; recording the pixels whose average noise voltage is less than a second threshold as overheated pixels; wherein the second threshold is ten times the average noise voltage.

[0017] Optionally, in some technical schemes, when an infrared optical system is not added to the test system, the step of determining the standard value of the average response voltage of the infrared detector includes: collecting the standard signal voltage value of the infrared detector at the first temperature and the second temperature of a standard black body radiation source; and calculating the standard value of the average response voltage of the infrared detector based on the standard signal voltage value.

[0018] The second aspect of the present invention proposes a test device for the transmittance of an infrared optical system, which is used for the test system. The test system includes a standard blackbody radiation source, an infrared optical system and an infrared detector. The test device includes: a determination unit, which is used to determine the standard value of the average response voltage of the infrared detector when the infrared optical system is not added to the test system; a collection unit, which is used to collect the signal voltage value of the infrared detector at a first temperature and a second temperature of the standard blackbody radiation source when the infrared optical system is added to the test system; a calculation unit, which is used to calculate the measured value of the average response voltage of the infrared detector based on the signal voltage value; the calculation unit is also used to calculate the transmittance of the infrared optical system based on the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

[0019] The third aspect of the present invention provides a test device for the transmittance of an infrared optical system, on which a computer program is stored. When the computer program is executed by a processor, the steps of the test method for the transmittance of an infrared optical system as provided in the first aspect are implemented.

[0020] The fourth aspect of the present invention proposes an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the infrared optical system transmittance testing method proposed in the first aspect are implemented.

[0021] The technical solution provided by the present invention brings at least the following beneficial effects:

[0022] By determining the average response voltage of the infrared detector with and without the infrared optical system, and calculating the transmittance using the ratio of the two, the influence of various factors on the results during the measurement process is reduced. The standard value of the average response voltage determined without the addition of the optical system provides a benchmark for subsequent comparisons and improves the accuracy of the transmittance measurement of the infrared optical system. At the same time, collecting the signal voltage values ​​of the standard blackbody radiation source at two different temperatures to calculate the measured value of the average response voltage can effectively reduce the influence of noise on the measurement results and further improve the accuracy of the transmittance calculation. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A schematic flow chart of a method for testing transmittance of an infrared optical system provided by an embodiment of the present invention;

[0024] Figure 2 A schematic flow chart of another method for testing transmittance of an infrared optical system provided by an embodiment of the present invention;

[0025] Figure 3 A schematic flow chart of a method for determining dead pixels provided by an embodiment of the present invention;

[0026] Figure 4 A schematic flow chart of a method for determining overheated pixels provided by an embodiment of the present invention;

[0027] Figure 5 A block diagram of a testing device provided in an embodiment of the present invention;

[0028] Figure 6 A block diagram of an electronic device provided by an embodiment of the present invention;

[0029] Figure 7 A block diagram of a test system provided by an embodiment of the present invention;

[0030] Figure 8 A schematic diagram of a transmittance test process of an infrared optical system provided in an embodiment of the present invention.

[0031] in, Figures 5 to 7 The corresponding relationship between the reference numerals and component names in the figure is:

[0032] 1 test system, 11 standard black body radiation source, 12 infrared optical system, 13 infrared detector, 14 data acquisition card, 15 industrial computer, 100 test device, 110 determination unit, 120 acquisition unit, 130 calculation unit, 200 electronic device, 210 memory, 220 processor. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution in the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiment of the present invention. Obviously, the described embodiment is a part of the embodiment of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] The present invention provides a method for testing the transmittance of an infrared optical system, which is used for testing a system 1, wherein the testing system 1 includes a standard black body radiation source 11, an infrared optical system 12 and an infrared detector 13. Figure 1 As shown, the test methods for the transmittance of infrared optical systems include:

[0035] S101: Determine a standard value of an average response voltage of an infrared detector without adding an infrared optical system to the test system;

[0036] S102: When an infrared optical system is added to the test system, a signal voltage value of the infrared detector of a standard black body radiation source at the first temperature and the second temperature is collected;

[0037] S103: Calculating a measured value of an average response voltage of the infrared detector according to the signal voltage value;

[0038] S104: Calculate the transmittance of the infrared optical system according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

[0039] According to the test method for the transmittance of the infrared optical system provided by the present invention, the standard value of the average response voltage of the infrared detector is first determined, and then the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature is collected when the infrared optical system is added to the test system, and then the measured value of the average response voltage of the infrared detector is calculated according to the signal voltage value. Finally, the transmittance of the infrared optical system is calculated according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value. The present invention reduces the influence of various factors on the results during the measurement process by respectively determining the average response voltage of the infrared detector when the infrared optical system is added and not added, and calculating the transmittance using the ratio of the two. The standard value of the average response voltage determined when the optical system is not added provides a benchmark for subsequent comparisons, and improves the accuracy of the transmittance measurement of the infrared optical system. At the same time, the signal voltage values ​​of the standard black body radiation source at two different temperatures are collected to calculate the measured value of the average response voltage. Using the standard black body as a radiation source can ensure the consistency of the radiation energy when there is an optical system or not, can effectively reduce the influence of noise on the measurement results, and further improve the accuracy of the transmittance calculation.

[0040] like Figure 2 As shown, the present invention proposes another infrared optical system transmittance testing method comprising:

[0041] S201: Determine a standard value of an average response voltage of an infrared detector without adding an infrared optical system to the test system;

[0042] S202: Determine the number of pixels in the infrared detector;

[0043] S203: When the standard black body radiation source is at a first temperature and a second temperature, continuously collecting data for the same pixel for more than 100 times to obtain multiple signal voltage values;

[0044] S204: calculating a first pixel signal voltage value of the same pixel at a first temperature according to a plurality of signal voltage values;

[0045] S205: calculating a second pixel signal voltage value of the same pixel at a second temperature according to the multiple signal voltage values;

[0046] S206: Recording the absolute value of the difference between the first pixel signal voltage value and the second pixel signal voltage value as the response voltage value of the pixel;

[0047] S207: Calculate the transmittance of the infrared optical system according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

[0048] In some embodiments, when an infrared optical system is added to the test system, the step of collecting the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature includes: determining the number of pixels in the infrared detector; when the standard black body radiation source is at the first temperature and the second temperature, continuously collecting the same pixel more than 100 times to obtain multiple signal voltage values.

[0049] In this embodiment, determining the number of pixels in the infrared detector is conducive to a comprehensive analysis of the infrared detector, comprehensively considering the response of each pixel to radiation in the infrared detector, and avoiding ignoring the difference in the overall performance of the infrared detector due to only focusing on some pixels. At the same time, when the standard black body radiation source is at the first temperature and the second temperature, the same pixel is continuously collected for more than 100 times to obtain multiple signal voltage values, and the statistical characteristics of multiple measurements can be used to reduce the influence of noise on the measurement results, providing a reliable data basis for the subsequent calculation of the measured value of the average response voltage of the infrared detector, thereby improving the accuracy of the infrared optical system transmittance calculation.

[0050] Optionally, in some embodiments, the number of signal voltage values ​​includes multiple, and the step of calculating the measured value of the average response voltage of the infrared detector based on the signal voltage values ​​includes: calculating the first pixel signal voltage value of the same pixel at the first temperature based on the multiple signal voltage values; calculating the second pixel signal voltage value of the same pixel at the second temperature based on the multiple signal voltage values; recording the absolute value of the difference between the first pixel signal voltage value and the second pixel signal voltage value as the response voltage value of the pixel; calculating the response voltage value of each pixel, and calculating the measurement value based on the multiple response voltage values.

[0051] In this embodiment, the pixel signal voltage value is calculated by collecting multiple signal voltage values ​​at the first temperature and the second temperature for the same pixel, and the statistical average characteristics of multiple measurements are used to effectively reduce the influence of noise on the pixel signal voltage measurement. The absolute value of the difference between the first pixel signal voltage value and the second pixel signal voltage value is recorded as the pixel response voltage value. On the one hand, some fixed error factors that are not related to temperature can be eliminated. On the other hand, by measuring and calculating the difference at different temperatures, the response characteristics of the pixel to the radiation change caused by the temperature change can be more prominent. In addition, by calculating the measurement value based on multiple response voltage values, the response of all pixels of the infrared detector can be fully considered. By calculating the measurement value of the average response voltage, the performance change of the infrared detector after adding the infrared optical system can be evaluated as a whole, ensuring the reliability and effectiveness of the transmittance calculation results.

[0052] Optionally, in some embodiments, the pixels include valid pixels and invalid pixels, and the method of calculating the measurement value includes:

[0053]

[0054] in, represents the measured value, M represents the number of rows of the pixel array, N represents the number of columns of the pixel array, ω represents the number of invalid pixels, i represents the row coordinate of the pixel array, j represents the column coordinate of the pixel array, and V(i,j) represents the response voltage value of the pixel.

[0055] In this embodiment, invalid pixels may generate abnormal voltage values, which may interfere with the accurate evaluation of the overall performance of the detector, thereby affecting the accuracy of the transmittance measurement of the infrared optical system. The above formula describes the method of calculating the measured value, eliminating the influence of invalid pixels on the measured value, and improving the reliability of the entire test method and the accuracy of the measurement results.

[0056] Optionally, in some embodiments, the invalid pixels include dead pixels, such as Figure 3 As shown, the test method for the transmittance of the infrared optical system also includes a method for determining dead pixels, which specifically includes:

[0057] S301: Calculate the radiation power of each pixel at a first temperature;

[0058] S302: Calculating the response rate of the pixel according to the radiation power and the corresponding response voltage value;

[0059] S303: Calculating an average response rate according to the response rate of the pixel and the number of pixels;

[0060] S304: Recording pixels whose response rates are less than the first threshold as dead pixels.

[0061] In this embodiment, by calculating the radiation power of each pixel at the first temperature and calculating the response rate of the pixel in combination with its response voltage value, a quantitative basis is provided for accurately judging whether the pixel is a dead pixel. Through the above calculation and comparison, the dead pixels can be accurately screened out to avoid interference with the measurement results, thereby improving the accuracy of the measurement.

[0062] Optionally, in some embodiments, invalid pixels also include overheated pixels, such as Figure 4 As shown, the test method for the transmittance of the infrared optical system also includes a method for determining overheated pixels, specifically including:

[0063] S401: Calculate the noise voltage of the pixel;

[0064] S402: Calculating the average noise voltage of the infrared detector after removing dead pixels according to the noise voltage;

[0065] S403: Recording pixels whose average noise voltage is less than the second threshold as overheated pixels.

[0066] In this embodiment, by calculating the noise voltage of the pixel, and further calculating the average noise voltage of the infrared detector after removing the dead pixels based on the noise voltage, an effective quantitative standard is provided for judging whether the pixel is overheated. By accurately identifying and excluding overheated pixels, large errors in the calculated measurement values ​​are avoided, thereby improving the accuracy of the measurement results.

[0067] Optionally, in some embodiments, when no infrared optical system is added to the test system, the step of determining the standard value of the average response voltage of the infrared detector includes: collecting the standard signal voltage value of the infrared detector at the first temperature and the second temperature of a standard black body radiation source; and calculating the standard value of the average response voltage of the infrared detector based on the standard signal voltage value.

[0068] In this embodiment, the standard value of the average response voltage is determined by collecting the standard signal voltage value of the infrared detector at the first temperature and the second temperature of the standard black body radiation source, and a benchmark is established for the subsequent measurement after the infrared optical system is added. The signal voltage value is collected at the first temperature and the second temperature and the standard value is calculated, and the idea of ​​"differential measurement" is adopted. When there are some interference factors in the environment, such as background radiation and system noise, these interference factors can offset each other to a certain extent, so that the calculated standard value more accurately reflects the performance of the detector itself, providing a more reliable basis for subsequent transmittance measurement.

[0069] Based on the same inventive concept, the second aspect of the present invention provides a test device 100 for the transmittance of an infrared optical system, which is used for testing a system 1. The test system includes a standard black body radiation source 11, an infrared optical system 12, and an infrared detector 13. Figure 5As shown, the test device 100 includes: a determination unit 110, which is used to determine the standard value of the average response voltage of the infrared detector when the infrared optical system is not added to the test system; a collection unit 120, which is used to collect the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature when the infrared optical system is added to the test system; a calculation unit 130, which is used to calculate the measured value of the average response voltage of the infrared detector according to the signal voltage value; the calculation unit 130 is also used to calculate the transmittance of the infrared optical system according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

[0070] According to the infrared optical system transmittance test device 100 provided by the present invention, first, the determination unit 110 determines the standard value of the average response voltage of the infrared detector, and then the acquisition unit 120 acquires the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature when the infrared optical system is added to the test system, and the calculation unit 130 calculates the measured value of the average response voltage of the infrared detector according to the signal voltage value. Finally, the calculation unit 130 calculates the transmittance of the infrared optical system according to the ratio of the measured value and the standard value of the average response voltage of the infrared detector. The present invention reduces the influence of various factors on the results during the measurement process by respectively determining the average response voltage of the infrared detector when the infrared optical system is added and not added, and calculating the transmittance using the ratio of the two. The standard value of the average response voltage determined when the optical system is not added provides a benchmark for subsequent comparisons, and improves the accuracy of the infrared optical system transmittance measurement. At the same time, the signal voltage values ​​of the standard black body radiation source at two different temperatures are collected to calculate the measured value of the average response voltage. Using the standard black body as a radiation source can ensure the consistency of the radiation energy when there is an optical system or not, and can effectively reduce the influence of noise on the measurement results, and further improve the accuracy of the transmittance calculation.

[0071] Based on the same inventive concept, the third aspect of the present invention provides a test device for the transmittance of an infrared optical system, on which a computer program is stored. When the computer program is executed by a processor, the steps of the test method for the transmittance of an infrared optical system proposed in the first aspect are implemented.

[0072] Based on the same inventive concept, Figure 6 As shown, the fourth aspect of the present invention provides an electronic device 200, including a memory 210, a processor 220, and a computer program stored in the memory 210 and executable on the processor 220. When the processor 220 executes the computer program, the steps of the method for testing the transmittance of the infrared optical system proposed in the first aspect are implemented.

[0073] The implementation process of the functions and effects of each unit in the above-mentioned device is specifically described in the implementation process of the corresponding steps in the above-mentioned method, and will not be repeated here.

[0074] In a specific application, the present invention proposes a method for testing the transmittance of an infrared optical system based on the average response voltage of an infrared detector pixel, and the steps are as follows:

[0075] Step 1: Build the test system, adjust the test system to a normal working state, select a standard black body with uniform and stable radiation as the radiation source, and record the number of pixels M×N of the detector.

[0076] Step 2: Without adding the infrared optical system to be tested, continuously collect F at the standard black body temperature of T0 and the standard black body temperature of T. t Frame (F t >100) The corresponding signal voltage data of the detector.

[0077] Step 3: Collect the F t The signal voltage value of the same pixel in the frame is averaged to obtain the pixel signal voltage of the pixel (denoted as pixel (i, j)) when the standard black body temperature is T0 and T, respectively, denoted as and V T (i,j).

[0078] Step 4: Use the following formula to calculate the response voltage of the pixel:

[0079]

[0080] Among them, V(i,j) represents the response voltage of the pixel, Represents the pixel signal voltage at the standard black body temperature T0, V T (i, j) represents the pixel signal voltage at the standard black body temperature T, i represents the row coordinate of the pixel array, and j represents the column coordinate of the pixel array.

[0081] Step 5: Use the following formula to calculate the average response voltage of the effective pixels of the detector to obtain the average response voltage value of the detector, which is recorded as

[0082]

[0083] in, represents the average response voltage value, M represents the number of rows of the pixel array, N represents the number of columns of the pixel array, ω represents the number of invalid pixels, i represents the row coordinate of the pixel array, j represents the column coordinate of the pixel array, and V(i,j) represents the response voltage value of the pixel.

[0084] Step 6: Add the optical system to be tested and continuously collect F data at the standard blackbody temperature of T'0 and the standard blackbody temperature of T'. t Frame (F t >100) The corresponding response voltage data of the detector.

[0085] Step 7: Repeat steps 3, 4 and 5 to obtain the pixel's response voltage value V'(i, j) and the average response voltage value

[0086] Step 8: Use the following formula to calculate the transmittance τ of the infrared optical system under test:

[0087]

[0088] Where τ represents the transmittance, It indicates the average response voltage value without adding the optical system under test. It represents the average response voltage value added to the optical system under test.

[0089] The step three further comprises:

[0090] Step 1: The F collected when the standard blackbody temperature is T0 and T t The frame pixel signal voltage values ​​are recorded and recorded as and V T '[(i,j),f t ], where f t ∈[1,F t ], The meaning of this is the fth pixel of pixel (i, j) when the standard black body temperature is T0. t Signal voltage value of the frame;

[0091] Step 2: Use the following formula to calculate the pixel signal voltage V when the standard black body temperature is T0 and T T0 (i,j),V T (i,j) value;

[0092]

[0093] in, Indicates the signal voltage value of pixel (i, j) when the standard black body temperature is T0, F t represents the total number of collections, f represents the number of collections, Indicates the fth pixel (i, j) when the standard black body temperature is T0 t The signal voltage value of the frame, V T (i,j) indicates the standard black body temperature is V T The signal voltage value of the next pixel (i, j), V T '[(i,j),ft ] indicates that the standard black body temperature is V T At time pixel (i, j) f t The signal voltage value of the frame.

[0094] The step five further comprises:

[0095] In formula (2), ω is the number of invalid pixels, which are divided into dead pixels and overheated pixels. Their numbers need to be calculated separately. The steps are as follows:

[0096] Step 1: Find the number of dead pixels.

[0097] First, the response voltage of the pixel (i, j) calculated by formula (1) is combined with the radiation power P when the standard black body temperature is T0 to calculate the response rate of the pixel (i, j):

[0098]

[0099] The calculation method of the radiation power P when the black body temperature is T0 is:

[0100]

[0101] Where: R(i,j) represents the response rate of pixel (i,j), P represents the radiation power, V(i,j) represents the response voltage of pixel (i,j), T0 represents the first temperature, T represents the second temperature, d represents the standard black body radiation aperture, in cm; A d is the pixel area in cm 2 , L d is the distance between the standard black body and the lens, in cm.

[0102] Combined with formula (6), the average response rate of the detector at this time is calculated:

[0103]

[0104] The meanings of the letters in the above formula refer to the previous text. The number of dead pixels is calculated by counting the response rate R(i,j) less than The number of pixels (i, j) can be obtained, and the number is recorded as m.

[0105] Step 2: Find the number of overheated pixels.

[0106] First calculate the pixel (i, j) noise voltage U N (i,j):

[0107]

[0108] The meanings of the letters in the above formula refer to the previous text and will not be repeated here. After removing the number of dead pixels, the average noise voltage of the detector is obtained.

[0109]

[0110] The meanings of the letters in the above formula refer to the previous text and will not be repeated here. The number of overheated pixels is calculated by counting the noise voltage U N (i,j) is greater than The number of pixels (i, j) can be obtained, and the number is recorded as n.

[0111] Step 3: Calculate the number of invalid pixels.

[0112] ω=m+n (11)

[0113] The meanings of the letters in the above formula refer to the previous text and will not be repeated here.

[0114] The test system 1 constructed by the test method is as follows: Figure 7 As shown, it includes a standard black body radiation source 11, an infrared optical system 12, an infrared detector 13, a data acquisition card 14, and an industrial computer 15. The functions required to be realized by the test system 1 are as follows:

[0115] Function 1: Parameter setting, for standard blackbody radiation source, the blackbody radiation temperature can be accurately set.

[0116] Function 2: Collect and store image data, that is, it can collect the output voltage value of the detector response signal in real time as required, and store the digital signal converted from the analog signal in the computer frame by frame.

[0117] Function three: Detector parameters and infrared optical system transmittance test function, which can calculate the average response voltage value of the detector pixel and the transmittance of the infrared optical system based on the collected image data.

[0118] Infrared optical system transmittance test process Figure 8 As shown, the specific test steps are as follows:

[0119] S501: Collect the F values ​​of the standard blackbody radiation source when the temperature is T0, T and T'0, T' respectively without and with the infrared optical system under test. t Frame signal voltage value;

[0120] S502: Calculate the signal voltage of the pixel (i, j) when the temperature of the standard black body radiation source is T0, T and T'0, T' respectively without the infrared optical system under test and with the infrared optical system under test;

[0121] S503: Calculate the response voltage of the pixel (i, j) when the temperature of the standard black body radiation source is T0, T and T'0, T' respectively without the infrared optical system under test and with the infrared optical system under test;

[0122] S504: Calculate the number of invalid pixels;

[0123] S505: calculating the average response voltage under the conditions of not having the infrared optical system under test and having the infrared optical system under test respectively;

[0124] S506: Calculate the infrared relational system transmittance.

[0125] The above are preferred embodiments of the present invention. It should be pointed out that, for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as within the scope of protection of the present invention.

Claims

1. A method for testing the transmittance of an infrared optical system, characterized in that: Used for a test system, the test system includes a standard black body radiation source, an infrared optical system and an infrared detector, and the test method includes: Determining a standard value of an average response voltage of the infrared detector without adding the infrared optical system to the test system; When the infrared optical system is added to the test system, the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature is collected; Calculating a measured value of an average response voltage of the infrared detector according to the signal voltage value; The transmittance of the infrared optical system is calculated according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

2. The infrared optical system transmittance testing method according to claim 1, characterized in that: The step of collecting the signal voltage value of the infrared detector at the first temperature and the second temperature of the standard black body radiation source when the infrared optical system is added to the test system comprises: Determining the number of pixels in the infrared detector; When the standard black body radiation source is at the first temperature and the second temperature, the same pixel is continuously sampled for more than 100 times to obtain a plurality of signal voltage values.

3. The infrared optical system transmittance testing method according to claim 2, characterized in that: The number of the signal voltage values ​​includes a plurality of values, and the step of calculating the measured value of the average response voltage of the infrared detector according to the signal voltage values ​​includes: Calculating a first pixel signal voltage value of the same pixel at the first temperature according to a plurality of the signal voltage values; Calculating a second pixel signal voltage value of the same pixel at the second temperature according to the plurality of signal voltage values; Recording the absolute value of the difference between the first pixel signal voltage value and the second pixel signal voltage value as the response voltage value of the pixel; The response voltage value of each of the picture elements is calculated, and the measurement value is calculated according to the plurality of response voltage values.

4. The method for testing transmittance of an infrared optical system according to claim 3, characterized in that: The pixels include valid pixels and invalid pixels, and the method of calculating the measured value includes: in, represents the measured value, M represents the number of rows of the pixel array, N represents the number of columns of the pixel array, ω represents the number of invalid pixels, i represents the row coordinate of the pixel array, j represents the column coordinate of the pixel array, and V(i,j) represents the response voltage value of the pixel.

5. The method for testing transmittance of an infrared optical system according to claim 4, characterized in that: The invalid pixels include dead pixels, and the testing method further includes: Calculating the radiation power of each of the pixels at the first temperature; Calculating the response rate of the pixel according to the radiation power and the corresponding response voltage value; Calculating an average response rate according to the response rate of the pixel and the number of the pixel; Recording the pixels whose response rate is less than the first threshold as dead pixels; The first threshold is one tenth of the average response rate.

6. The method for testing transmittance of an infrared optical system according to claim 5, characterized in that: The invalid pixels also include overheated pixels, and the testing method further includes: Calculating the noise voltage of the pixel; Calculating the average noise voltage of the infrared detector after removing the dead pixels according to the noise voltage; Recording the pixel whose average noise voltage is less than the second threshold as an overheated pixel; The second threshold is ten times the average noise voltage.

7. The method for testing transmittance of an infrared optical system according to any one of claims 1 to 6, characterized in that: The step of determining the standard value of the average response voltage of the infrared detector without adding the infrared optical system to the test system comprises: Collecting standard signal voltage values ​​of the infrared detector of the standard black body radiation source at the first temperature and the second temperature; The standard value of the average response voltage of the infrared detector is calculated according to the standard signal voltage value.

8. A test device for infrared optical system transmittance, characterized in that: Used for testing a system, the testing system comprises a standard black body radiation source, an infrared optical system and an infrared detector, the testing device comprises: A determination unit, used for determining a standard value of an average response voltage of the infrared detector without adding the infrared optical system to the test system; A collection unit, used for collecting the signal voltage value of the infrared detector of the standard black body radiation source at the first temperature and the second temperature when the infrared optical system is added to the test system; a calculation unit, used for calculating a measured value of an average response voltage of the infrared detector according to the signal voltage value; The calculation unit is further used to calculate the transmittance of the infrared optical system according to the ratio of the measured value of the average response voltage of the infrared detector to the standard value.

9. A test device for infrared optical system transmittance, on which a computer program is stored, characterized in that: When the computer program is executed by a processor, the steps of the method for testing the transmittance of an infrared optical system according to any one of claims 1 to 7 are implemented.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method for testing the transmittance of an infrared optical system according to any one of claims 1 to 7 are implemented.

Images