A method for evaluating the life of a display device and a computer device

Abstract

Embodiments of the present application relate to the technical field of display testing, and disclose a display device life evaluation method, a computer device and a storage medium. The method comprises: obtaining a luminous flux test set, generating an acceleration model based on a plurality of luminous flux data sets, predicting a target time required for a light source to decay to different luminous fluxes under a standard test temperature based on the acceleration model, obtaining a plurality of life evaluation data, generating a life evaluation model based on the plurality of life evaluation data, and generating life evaluation information based on the life evaluation model. Embodiments of the present application establish and construct an acceleration model based on a luminous flux test set, do not need to collect luminous flux data for a super-long time, can equivalently predict luminous flux data corresponding to a super-long time based on the acceleration model, thus shortening the test time, accelerating the efficiency of constructing the life evaluation model, and further improving the evaluation efficiency of the life.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of display testing technology, and in particular to a method for evaluating the life of a display device and a computer device. Background Art

[0002] Display devices contain light sources, and the lifespan of these light sources is closely related to the lifespan of the display devices. Luminous flux is a primary optical performance indicator of a light source. According to industry requirements for light sources, a light source's lifespan is considered to meet requirements if its luminous flux remains above a preset luminous flux threshold even after operating for a period exceeding a preset time threshold, or if the operating time required for the luminous flux to decay to the preset luminous flux threshold exceeds the preset time threshold.

[0003] When related technologies evaluate the life of a light source, the light source is placed in a room temperature environment for testing, and the light source is continuously lit for an extremely long time. During the lighting process, the luminous flux of the light source at various time points is collected, and the luminous flux at various time points is comprehensively evaluated to evaluate the life of the light source. Therefore, this approach is time-consuming and the efficiency of life assessment is low. Summary of the Invention

[0004] One purpose of the embodiments of the present application is to provide a method for evaluating the life of a display device, a computer device, and a storage medium to solve the technical problem of low efficiency in evaluating the life of a light source in related technologies.

[0005] In a first aspect, an embodiment of the present application provides a life assessment method for a display device, comprising: obtaining a luminous flux test set, the luminous flux test set comprising a plurality of luminous flux data groups, one luminous flux data group corresponding to a light source sample group, and one luminous flux data group corresponding to a test temperature; generating an acceleration model based on the plurality of luminous flux data groups, the acceleration model being used to represent the changing relationship between a target acceleration coefficient and a test temperature, the target acceleration coefficient being the ratio of the luminous flux of the light source sample group at the standard test temperature to the luminous flux of the high-temperature test temperature at the same test time, the standard test temperature being lower than the high-temperature test temperature; predicting the target time required for the light source sample group to decay to different luminous fluxes at the standard test temperature based on the acceleration model, and obtaining a plurality of life assessment data, the life assessment data comprising a target time and a luminous flux corresponding to the target time; generating a life assessment model based on the plurality of life assessment data; and generating life assessment information based on the life assessment model.

[0006] In a second aspect, an embodiment of the present application provides a computer device comprising a memory and a processor, wherein the memory is connected to the processor, and the processor is used to execute one or more computer programs stored in the memory. When the processor executes the one or more computer programs, the computer device implements the above-mentioned method for evaluating the life of the display device.

[0007] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program, the computer program includes program instructions, and when the program instructions are executed by a processor, the processor executes the above-mentioned display device life assessment method.

[0008] The embodiments of the present application can achieve the following technical effects: the embodiments of the present application establish an acceleration model based on a luminous flux test set, and there is no need to collect luminous flux data for an extremely long time. The luminous flux data corresponding to the extremely long time can be equivalently predicted based on the acceleration model, thereby shortening the test time, speeding up the efficiency of constructing the life assessment model, and thereby improving the efficiency of life assessment. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0010] Figure 1 A schematic flow chart of a method for evaluating the lifespan of a display device provided in an embodiment of the present application;

[0011] Figure 2 Schematic diagram of the expression of two acceleration models provided in the embodiments of the present application in a coordinate system;

[0012] Figure 3 An equivalent diagram of the luminous flux at different test times provided in an embodiment of the present application;

[0013] Figure 4 A schematic structural diagram of a lifespan assessment device for a display device provided in an embodiment of the present application;

[0014] Figure 5 A schematic diagram of the structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0015] In order to make the purpose, technical solutions and advantages of this application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0016] It should be noted that, if there is no conflict, the various features in the embodiments of the present application can be combined with each other and are all within the scope of protection of the present application. In addition, although the functional modules are divided in the device schematic and the logical order is shown in the flow chart, in some cases, the steps shown or described can be performed in a different order than the module division in the device or the order in the flow chart. Furthermore, the words "first", "second", "third", etc. used in this application do not limit the data and execution order, but only distinguish between the same items or similar items with basically the same functions and effects.

[0017] Typically, a display device includes a light source, which generates light and assists the display device in performing related functions. In some embodiments, the display device can be a complete device, which can include a display component, an illumination component, a projection component, etc. For example, the light source serves as the backlight source of the display device, providing illumination for the display device to display normally.

[0018] Under normal operating conditions, display devices typically do not experience instantaneous failure. As operating time accumulates, the luminous flux output by the display device gradually decays. The display device includes a light source, coating, insulating glass, lens, reflector, polarizer, and other structures. In one embodiment, the light source can be an LED. Typically, LED light sources have a high operating temperature limit, exemplarily 85°C or 105°C. A test method based on the Arrhenius model can successfully assess the lifespan of the light source. However, for a complete display device, which includes a light source, coating, insulating glass, lens, reflector, polarizer, and other structures, these structures are not heat-resistant. When tested at 85°C, the display device is easily damaged. For example, a lens can deform if the temperature rises to 70°C. Therefore, the test temperature for display devices is typically not very high. To protect the display device from damage during testing, the test temperature is not applied excessively high during testing. Consequently, this test method does not shorten the test time.

[0019] Currently, according to technical requirements, a display device's lifespan is determined to have expired when its luminous flux at a constant current decays to 50% of its initial luminous flux. Prior to expiration, a display device's lifespan is determined to have met requirements if its operating time exceeds 10,000 hours or its luminous flux at 10,000 hours remains greater than 50% of its initial luminous flux, and its functional performance indicators (including resolution, image clarity, and visual quality) meet requirements.

[0020] This embodiment of the application constructs an acceleration model based on a luminous flux test set. The acceleration model predicts the target time required for a light source to decay to different luminous fluxes at a standard test temperature, generating multiple lifetime assessment data. This is then used to generate a lifetime assessment model based on the multiple lifetime assessment data. Finally, lifetime assessment information is generated based on the lifetime assessment model. This approach is fast and efficient, significantly shortening test time and improving the accuracy and reliability of lifetime assessments.

[0021] Hereinafter, the present application provides a method for evaluating the life of a display device. Figure 1 , the life evaluation method of the display device includes S11 to S15.

[0022] The embodiment of the present application executes S11 to obtain a luminous flux test set, where the luminous flux test set includes multiple luminous flux data groups, one luminous flux data group corresponds to one light source sample group, and one luminous flux data group corresponds to one test temperature.

[0023] The test temperature of any light source sample group is less than or equal to the preset maximum test temperature. The maximum test temperature is the highest temperature at which the test can be performed without causing the display device to fail. The embodiment of the present application uses a temperature stepping method to gradually find the limit operating temperature of the display device, and then determines the maximum test temperature based on the limit operating temperature. The process of the temperature stepping method is as follows:

[0024] a. Set up multiple sample groups, each sample group includes multiple display devices.

[0025] b. Taking room temperature (for the purpose of explaining the principle of the embodiment of the present application, room temperature is 25°C as an example, which should not be understood as limiting the room temperature of the embodiment of the present application) as the starting temperature, set the test temperature of each sample group in sequence according to the temperature step value. For example, if the temperature step value is 5°C, the test temperature of the first sample group (i.e., the room temperature sample group) is 25°C, the test temperature of the second sample group is 30°C, the test temperature of the third sample group is 35°C, and so on.

[0026] c. After waiting for the test temperature of each sample group to stabilize, the tester checks the functional performance and appearance of each display device in the sample group.

[0027] d. If the functional performance and appearance of the sample are abnormal, record the test temperature of the sample group showing damage to the equipment as the extreme operating temperature.

[0028] e. Subtract the preset buffer value from the maximum operating temperature to obtain the maximum test temperature. For example, if the maximum operating temperature is 60°C and the preset buffer value is 5°C, the maximum test temperature is 55°C.

[0029] The embodiment of the present application can gradually find the highest test temperature based on the temperature stepping method, avoiding the use of excessively high test temperatures in subsequent tests that may damage the display device, thereby ensuring that the display device is not damaged during the life assessment process.

[0030] In an embodiment of the present application, multiple test temperatures and multiple light source sample groups are set between normal temperature and the maximum test temperature. One light source sample group corresponds to one test temperature. The light source sample group is placed in an environment with an ambient temperature corresponding to the test temperature, and the luminous flux of the light source sample group is detected at intervals of a preset time.

[0031] For example, the normal temperature is 25°C, and the maximum test temperature is Tmax. In the embodiment of the present application, multiple test temperatures are selected within the temperature range of [25°C, Tmax]. For example, 25°C, 30°C, 35°C, and 40°C are selected as test temperatures. In the embodiment of the present application, the first light source sample group is placed in an environment of 25°C, and the luminous flux of the first light source sample group is detected every 192 hours. Similarly, in the embodiment of the present application, the second light source sample group is placed in an environment of 30°C, and the luminous flux of the second light source sample group is detected every 192 hours. In the embodiment of the present application, the third light source sample group is placed in an environment of 35°C, and the luminous flux of the third light source sample group is detected every 192 hours. In the embodiment of the present application, the fourth light source sample group is placed in an environment of 40°C, and the luminous flux of the fourth light source sample group is detected every 192 hours.

[0032] In some embodiments, the difference between the test temperatures of two adjacent light source sample groups may be unequal.

[0033] In some embodiments, the difference between the test temperatures of two adjacent light source sample groups can be equal, and the test temperatures of any two adjacent light source sample groups are separated by a preset temperature step. The preset temperature step is customized by the designer based on engineering experience. For example, the preset temperature step is any value between [3°C and 8°C], for example, the preset temperature step is 5°C.

[0034] Assume that the test temperature of the first light source sample group is 25°C, the test temperature of the second light source sample group is 28°C, and the test temperature of the third light source sample group is 35°C. The difference between the test temperature of the second light source sample group and the test temperature of the first light source sample group is 3°C, and the difference between the test temperature of the third light source sample group and the test temperature of the second light source sample group is 7°C. It can be seen that the second temperature change is not the same as the first temperature change, wherein the second temperature change is the temperature change of the third light source sample group relative to the second light source sample group, and the first temperature change is the temperature change of the second light source sample group relative to the first light source sample group.

[0035] In an embodiment of the present application, the test temperature interval of two adjacent light source sample groups is preset at a temperature step, which is conducive to ensuring that the luminous flux of the light source sample group changes according to a consistent preset temperature step, thereby ensuring that any two light source sample groups are comparable.

[0036] A luminous flux data set consists of a collection of luminous flux data collected from a light source sample group at the same test temperature and at different test times. Within each luminous flux data set, the interval between two adjacent test times is set to a preset time step, arranged in a preset time order. Each light source sample group includes multiple light sources, and the luminous flux set is the aggregate of the luminous fluxes of all light sources in that light source sample group. The preset time step is customized by the designer based on engineering experience; exemplary time steps include 192 hours, 164 hours, or 200 hours.

[0037] According to the principle of eternal performance degradation of display devices, the luminous flux decreases monotonically with the working time, and the decay rate becomes faster as the ambient temperature rises. Existing test data shows that when the display device works for about 1000 hours, the phenomenon of luminous flux decay has already appeared. Especially at extreme operating temperatures, the luminous flux decay of the display device can reach about 15%. Therefore, the embodiment of the present application sets 960 hours as the maximum test time for each luminous flux data group. When the display device works at room temperature for 960 hours, the phenomenon of luminous flux decay will occur. In this way, the changing luminous flux can be collected during the test, and an acceleration model can be constructed. In order to improve test efficiency, one embodiment of the present application sets the preset time step to 192 hours.

[0038] It is understandable that those skilled in the art can set the maximum test time as needed, such as 980 hours or 1000 hours.

[0039] In one embodiment of the present application, m light source sample groups are set according to the temperature range of [25°C, Tmax], each light source sample group includes n light sources, and the preset temperature step is 5°C. In this embodiment of the present application, the ambient temperature of each light source sample group is set to the test temperature corresponding to the light source sample group, and then the luminous flux of each light source in each light source sample group is sequentially collected according to the preset time step of 192h. represents the luminous flux of the i-th light source in the j-th light source sample group at the r-th time. The value range of j is 1 to m, the value range of i is 1 to n, and the value range of t is [0, 192, 384, 576, 768, 960].

[0040] For example, the test temperature of the first light source sample group is 25°C, and the embodiment of the present application records the following data: the luminous flux of the n light sources of the first light source sample group at the test time t=0h, the luminous flux of the n light sources of the first light source sample group at the test time t=192h, the luminous flux of the n light sources of the first light source sample group at the test time t=384h, the luminous flux of the n light sources of the first light source sample group at the test time t=576h, the luminous flux of the n light sources of the first light source sample group at the test time t=768h, and the luminous flux of the n light sources of the first light source sample group at the test time t=960h.

[0041] Similarly, the high temperature test temperature of the second light source sample group is 30° C. The embodiment of the present application obtains the luminous flux of n light sources of the second light source sample group at different times according to the above method, and so on, which is not repeated here.

[0042] The embodiment of the present application executes S12 to generate an acceleration model based on multiple luminous flux data groups. The acceleration model is used to represent the changing relationship between the target acceleration coefficient and the test temperature. The target acceleration coefficient is the ratio of the luminous flux of the standard test temperature to the luminous flux of the high-temperature test temperature for the light source sample group at the same test time. The standard test temperature is lower than the high-temperature test temperature.

[0043] The standard test temperature can be room temperature or a temperature customized by the designer. Room temperature is a temperature generally understood by people, for example, room temperature is 25°C. Luminous flux is the product of the radiant energy in a specified wavelength band per unit time and the relative visibility of the specified wavelength band.

[0044] In the same test time, the higher the test temperature, the faster the luminous flux of the light source sample group decays. Temperature difference ΔT = high temperature test temperature - standard test temperature, the expression of the target acceleration factor is:

[0045]

[0046] AF j1 is the target acceleration coefficient of the j-th light source sample group and the standard light source sample group at test time t, is the average luminous flux of the standard light source sample group at the test time t, is the average luminous flux of the jth light source sample group at test time t.

[0047] Generating an acceleration model based on a plurality of light flux data sets includes S121 and S122.

[0048] In the embodiment of the present application, S121 is executed to determine the intra-group acceleration coefficient of the high-temperature light source sample group based on the standard luminous flux data group and the high-temperature luminous flux data group.

[0049] The standard luminous flux data group is a luminous flux data group corresponding to the standard test temperature, and the standard light source sample group is a light source sample group corresponding to the standard test temperature. As mentioned above, 25°C is the standard test temperature, and the first light source sample group is the standard light source sample group. The standard luminous flux data group includes a set of luminous flux collected from the first light source sample group at different test times at a test temperature of 25°C.

[0050] The high-temperature luminous flux data set is the luminous flux data set corresponding to the high-temperature test temperature, and the high-temperature light source sample set is the light source sample set corresponding to the high-temperature test temperature. As mentioned above, the test temperatures of 30°C, 35°C, and 45°C are all higher than the standard temperature of 25°C. Therefore, the test temperatures of 30°C, 35°C, and 45°C are all high-temperature test temperatures. The second, third, and fourth luminous flux data sets are all high-temperature luminous flux data sets, and the second, third, and fourth light source sample sets are all high-temperature light source sample sets.

[0051] The intra-group acceleration factor is used to measure the attenuation of the luminous flux of the high-temperature light source sample group at the high-temperature test temperature relative to the standard test temperature.

[0052] Determining the intra-group acceleration coefficient of a high-temperature light source sample group based on a standard luminous flux data set and a high-temperature luminous flux data set includes the following steps: obtaining a set of standard luminous fluxes for the standard light source sample group at a target test time and a set of high-temperature luminous fluxes for the high-temperature light source sample group at a target test time; determining candidate acceleration coefficients for the high-temperature light source sample group at the target test time based on the standard luminous flux set and the high-temperature luminous flux set; and obtaining the average of the candidate acceleration coefficients for the high-temperature light source sample group at all target test times to obtain the intra-group acceleration coefficient for the high-temperature light source sample group. Because the high-temperature luminous flux data set contains luminous fluxes corresponding to multiple test times, the embodiment of the present application integrates the candidate acceleration coefficients corresponding to all test times of the high-temperature luminous flux data set and obtains the average of all candidate acceleration coefficients in the high-temperature luminous flux data set, thereby obtaining a reliable and accurate intra-group acceleration coefficient.

[0053] The target test time is any one of a plurality of test times, for example, the target test time is t=0, t=192, t=384, t=960, and so on.

[0054] As mentioned above, the light source sample group includes multiple light sources, the luminous flux set includes multiple luminous fluxes, one luminous flux corresponds to one light source, the standard luminous flux set is the set of luminous fluxes of all light sources in the standard light source sample collected at the target test time, and the high-temperature luminous flux set is the set of luminous fluxes of all light sources in the high-temperature light source sample collected at the target test time.

[0055] Determining the candidate acceleration coefficient of the high-temperature light source sample group at the target test time based on the standard luminous flux set and the high-temperature luminous flux set includes the following steps: obtaining the average value of the standard luminous flux set to obtain a first average luminous flux, obtaining the average value of the high-temperature luminous flux set to obtain a second average luminous flux, calculating the ratio of the first average luminous flux to the second average luminous flux, and obtaining the candidate acceleration coefficient of the high-temperature light source sample group at the target test time.

[0056] The average luminous flux is calculated according to the following formula in the embodiment of the present application, as shown below:

[0057]

[0058] It represents the average luminous flux of the j-th light source sample group at the r-th target test time.

[0059] When r=0h,

[0060] When r = 192h,

[0061] And so on, I won’t go into details here.

[0062] According to the above approach, the embodiment of the present application obtains the average luminous flux of each light source sample group at the target test time t=0 to t=960, as shown below:

[0063]

[0064] At the beginning (ie t = 0), the luminous flux of each light source sample group is basically the same, that is, the initial luminous flux of all light source sample groups is the same. According to the definition of the target acceleration coefficient, we have: AF 21 (t=0)=AF m1 (t=0)=1. Based on the expression of the target acceleration coefficient, the embodiment of the present application obtains the candidate acceleration coefficients of all high-temperature light source sample groups at various target test times, as shown below:

[0065]

[0066] The embodiment of the present application calculates the intra-group acceleration coefficient of the high-temperature light source sample group according to the following formula, as shown below:

[0067]

[0068] is the acceleration coefficient within the j-th light source sample group, where AF j1 (t) k is the candidate acceleration coefficient corresponding to the kth test time in the jth light source sample group. For example, for the case where the maximum test time is 960h, the value of k is 1 to 5. When k=1, it represents the candidate acceleration coefficient when t=192h.

[0069] The embodiment of the present application aggregates the intra-group acceleration coefficients of all light source sample groups as follows:

[0070]

[0071] Based on the intra-group acceleration coefficients of all light source sample groups, the following data points can be obtained in the embodiment of the present application, as shown below: (T1,1) Among them, T1=25℃, T2=30℃, and so on, Tm=Tmax.

[0072] In the embodiment of the present application, S122 is executed to perform fitting processing on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model.

[0073] The acceleration model is configured with a coordinate system, and the origin, the direction of the horizontal axis and the direction of the vertical axis of the coordinate system are all customized by the designer based on engineering experience.

[0074] In some embodiments, fitting processing is performed on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model, which includes the following steps: matching a linear relationship in response to the relationship between the acceleration coefficients within the group of all light source sample groups in the coordinate system, and performing linear fitting processing on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model.

[0075] The linear expression of the acceleration model is set as AF(T) = aT + b. The linear fitting parameter evaluation algorithm is used to fit the above data points to obtain the estimated values ​​of a and b. and Then, an acceleration model is obtained, wherein the linear fitting parameter evaluation algorithm includes the least square method and the like.

[0076] When the linear fitting parameter evaluation algorithm is the least squares method, the embodiment of the present application uses the least squares method to estimate the linear expression parameters, and its loss function is:

[0077]

[0078] In order to make the loss function obtain the extreme value, the partial derivatives of a and b are calculated and set to 0, as shown below:

[0079]

[0080]

[0081] Get an estimate and Then we get the following acceleration model:

[0082]

[0083] See also Figure 2 , the embodiment of the present application generates a linear acceleration model based on the above data points, wherein the acceleration model is represented by a straight line 21 of a linear function on a coordinate system.

[0084] In other embodiments, fitting processing is performed on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model, which includes the following steps: matching the nonlinear relationship of the relationship between the acceleration coefficients within the group of all light source sample groups in the coordinate system in response to the nonlinear relationship, and performing nonlinear fitting processing on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model.

[0085] The nonlinear expression of the acceleration model set in the embodiment of the present application is:

[0086] AF(T)=a×exp(bT)+c

[0087] The gradient descent method is used to estimate the parameters of the nonlinear expression, and its loss function is:

[0088]

[0089] The gradient vector is obtained by taking partial derivatives of the estimated parameters:

[0090]

[0091] Then the iterative function is:

[0092]

[0093] It is understandable that the learning rate ε is customized by the designer based on engineering experience. For example, the learning rate ε=0.001. Since the loss function is a multi-dimensional quadratic function, any value can be set when setting the initial value of the parameter to be estimated. When n=0, (a0, b0, c0)=(1, 2, 3). By continuously iterating the above function, the solution of the parameter to be estimated is obtained. and The acceleration model is as follows:

[0094]

[0095] Please combine Figure 2In the embodiment of the present application, a nonlinear acceleration model is generated based on the above data points, wherein the acceleration model is represented by a curve 22 of a nonlinear function on a coordinate system.

[0096] The embodiment of the present application can adaptively adapt the relationship between the intra-group acceleration coefficients of all light source sample groups in the coordinate system, and match the most appropriate function expression for the intra-group acceleration coefficients of all light source sample groups, so as to construct an accurate and reliable acceleration model, which is conducive to obtaining a more accurate and reliable target acceleration coefficient, and thus can more reliably and accurately evaluate the life of the light source.

[0097] The embodiment of the present application executes S13, and based on the acceleration model, predicts the target time required for the light source to decay to different luminous fluxes at the standard test temperature, and obtains multiple life assessment data, which include the target time and the luminous flux corresponding to the target time.

[0098] For example, the luminous flux of light source A operating at 25°C until the first time tp is w1, and the luminous flux of light source B operating at 30°C until the first time tp is w2. Within the same test time, the higher the test temperature, the faster the luminous flux of the light source in the high-temperature light source sample group decays. Therefore, w2 is smaller than w1.

[0099] If light source B works at 25°C and the working time is tp, the target acceleration coefficient corresponding to 30°C is determined by the embodiment of the present application as The time required for light source B to decay to a luminous flux of w2 at 25°C is This is equivalent to the target time required for light source B to decay to the luminous flux w2 at the standard test temperature.

[0100] Based on the above analysis, the embodiment of the present application does not need to test the luminous flux of the light source at room temperature and at the 10,000th hour. By the above operation, only the luminous flux of the light source at a limited test time is measured, which can predict the luminous flux for an ultra-long time, thereby shortening the test time and improving the test efficiency.

[0101] Similarly, if light source B works at 25°C and the working time is tp, the target acceleration coefficient corresponding to 30°C is determined by the embodiment of the present application as The luminous flux of light source B working at 25℃ tp is This is equivalent to the luminous flux of light source B at the standard test temperature when it is attenuated at tp.

[0102] In some embodiments, the present invention generates lifetime assessment information in response to the luminous flux data set not satisfying the decay continuation condition. Specifically, the present invention does not increase the test time in order to continue testing the luminous flux decay of the light source in this case, i.e., the luminous flux data set does not satisfy the decay continuation condition.

[0103] The life evaluation information includes life failure information and life qualification information. The life failure information is used to indicate that the life of the light source does not meet the requirements, and the life qualification information is used to indicate that the life of the light source meets the requirements.

[0104] In some embodiments, in response to the standard light source sample group not meeting the attenuation continuation condition, generating life assessment information includes the following steps: within the maximum test time, calculating the average luminous flux of the standard light source sample group at each test time, and in response to the average luminous flux of the standard light source sample group at each test time being less than or equal to a preset luminous flux threshold, determining that the standard light source sample group does not meet the attenuation continuation condition, and generating life failure information, wherein the preset luminous flux threshold is the result of multiplying the initial luminous flux by a preset coefficient, and the preset coefficient is a positive number and less than 1. According to industry standards, the preset coefficient can be 0.5. It is understood that the preset coefficient can also be customized by the designer according to business needs.

[0105] For example, within 960 hours, the embodiment of the present application determines the average luminous flux of the standard light source sample group at test times t = 0, t = 192, t = 384, t = 576, t = 768, and t = 960. When any of the six average luminous fluxes is less than or equal to half of the initial luminous flux, it means that the luminous flux of the standard light source sample group has decayed to half of the initial luminous flux or less than half of the initial luminous flux within a period of no more than 960 hours. Since the test time of the light source at room temperature is only 960 hours, which is less than 10,000 hours, the life of the light source does not meet the requirement.

[0106] In some embodiments, the method further includes the following steps: responding that the average luminous flux of the standard light source sample group at each test time is greater than a preset luminous flux threshold, and the average luminous flux of the high-temperature light source sample group at the candidate test time is less than or equal to the preset luminous flux threshold, recording the candidate test time, inputting the high temperature test temperature of the high temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient, multiplying the candidate test time by the reference acceleration coefficient to obtain the candidate test time, and generating life assessment information based on the candidate test time and the preset life time threshold.

[0107] Generating life assessment information based on the candidate test time and the preset life time threshold includes the following steps: generating life failure information in response to the candidate test time being less than the preset life time threshold, or generating life qualification information in response to the candidate test time being greater than or equal to the preset life time threshold.

[0108] For example, within 960 hours, the average luminous flux of the standard light source sample group at any test time within 960 hours does not decay to half of the initial luminous flux, but the average luminous flux of the j-th light source sample group (i.e., the high-temperature light source sample group) at a test time within 960 hours decays to half of the initial luminous flux, and this time (i.e., the candidate test time) t1 is recorded.

[0109] In this embodiment of the present application, the high temperature test temperature of the j-th light source sample group is input into the acceleration model to obtain the reference acceleration coefficient corresponding to the j-th light source sample group.

[0110] if Then L 0.5 <10000h,L 0.5 It is defined as the time required for the luminous flux to decay to half of the initial luminous flux. Therefore, the life of the light source does not meet the requirements.

[0111] if Then L 0.5 ≥10000h, the life of the light source meets the requirements.

[0112] In other embodiments, predicting the target time required for a light source to decay to different luminous fluxes at a standard test temperature based on an acceleration model to obtain a plurality of lifetime assessment data includes the following steps:

[0113] S131: In response to any light source sample group satisfying a preset attenuation continuation condition, determining a reference luminous flux of the high-temperature light source sample group under a maximum test time.

[0114] S132: Input the high temperature test temperature into the acceleration model to obtain a reference acceleration coefficient.

[0115] S133: Multiply the maximum test time by the reference acceleration factor to obtain the target time, which is the test time required for the high-temperature light source sample group to decay to the reference luminous flux at the standard test temperature.

[0116] S134: Combining the target time and the reference luminous flux to obtain life evaluation data.

[0117] In S131, the maximum test time is the maximum test time for the high-temperature light source sample group at the current time. For example, the maximum test time is 960 hours. It is understood that the maximum test time changes as the test progresses. For example, if any light source sample group meets the preset attenuation continuation condition, the user continues to increase the test time. By adding 192 hours to the previous maximum test time of 960 hours, the result is 1152 hours. Therefore, 1152 hours is the maximum test time corresponding to the current time.

[0118] The reference luminous flux is the average luminous flux of the high-temperature light source sample under the maximum test time.

[0119] In response to any light source sample group satisfying the preset attenuation continuation condition, determining the reference luminous flux of the high-temperature light source sample group at the maximum test time includes the following steps: in response to the average luminous flux of any light source sample group at the maximum test time being greater than the preset luminous flux threshold, and the equivalent luminous flux of any high-temperature light source sample group at the maximum test time being greater than the preset luminous flux threshold, determining that any light source sample group satisfies the preset attenuation continuation condition, and determining the reference luminous flux of the high-temperature light source sample group at the maximum test time.

[0120] The equivalent luminous flux is the result of multiplying the control luminous flux of the high-temperature light source sample group at the maximum test time by the reference acceleration factor, and the control luminous flux is the average luminous flux of the high-temperature light source sample group at the maximum test time.

[0121] At 960 hours, if the average luminous flux of all light source sample groups at any test time within 960 hours does not decay to half of the initial luminous flux, and the result of the control luminous flux of any high-temperature light source sample group at the maximum test time multiplied by the reference acceleration factor does not decay to half of the initial luminous flux, then it is determined that all light source sample groups meet the preset attenuation continuation conditions.

[0122] In S132 and S133, the average luminous flux of the high-temperature light source sample group at the 960th hour (i.e., the maximum test time) is less than the average luminous flux of the standard light source sample group at the 960th hour. In the embodiment of the present application, the high-temperature test temperature of each high-temperature light source sample group is input into the acceleration model to obtain a reference acceleration coefficient corresponding to the high-temperature light source sample group, and then the maximum test time is multiplied by the reference acceleration coefficient to obtain the target time.

[0123] See also Figure 3 The luminous flux wp1 of the first high-temperature light source sample group 31 at the 960th hour remains unchanged, and the test time 960h originally corresponding to the luminous flux wp1 is updated to The new data point wp1' is obtained, which is equivalent to shifting the horizontal coordinate of the luminous flux wp1 from 960h to the right. The above process reflects that the target time required for the light source to decay to the luminous flux wp1 at the standard test temperature is

[0124] Similarly, the luminous flux wp2 of the second high-temperature light source sample group 32 at the 960th hour remains unchanged, and the test time 960h originally corresponding to the luminous flux wp2 is updated to The new data point wp2' is obtained, which is equivalent to shifting the horizontal coordinate of the luminous flux wp2 from 960h to the right. The above process reflects that the target time required for the light source to decay to the luminous flux wp2 at the standard test temperature is

[0125] In S134 , the embodiment of the present application combines the target time and the reference luminous flux to obtain life assessment data.

[0126] After obtaining the life assessment data, the life assessment method also includes the following steps: adding the preset time step to the maximum test time to obtain an updated maximum test time, in response to the updated maximum test time being less than the preset time threshold, recording the newly added luminous flux of the light source sample group at the updated maximum test time, and adding the newly added luminous flux to the luminous flux data group of the light source sample group; or, in response to the updated maximum test time being greater than or equal to the preset time threshold, stopping the test operation.

[0127] As previously mentioned, the present embodiment initially sets the maximum test time at 960 hours. However, since the average luminous flux of the standard light source sample group at the 960th hour is greater than the preset luminous flux threshold, and the average luminous flux of the high-temperature light source sample group at the 960th hour is less than or equal to the preset luminous flux threshold, this indicates that the luminous flux of the high-temperature light source sample group is still sufficient after 960 hours of operation. In order to collect more life assessment data and generate an accurate life assessment model, the present embodiment can extend the test time.

[0128] The preset time step is 192 hours. In the embodiment of the present application, the test time is extended by 192 hours after the 960th hour. Therefore, the previous maximum test time is changed from 960 hours to 960+192=1152 hours, that is, 1152 hours is the updated maximum test time.

[0129] It can be seen from the expression of the target acceleration coefficient that the higher the test temperature, the greater the attenuation of the luminous flux, the smaller the denominator of the expression of the target acceleration coefficient (i.e., the real-time luminous flux), and the larger the target acceleration coefficient becomes. Therefore, the embodiment of the present application substitutes the highest test temperature Tmax into the acceleration model to obtain the maximum target acceleration coefficient, for example, the maximum target acceleration coefficient is 3.

[0130] As previously mentioned, the embodiments of the present application do not control the light source to operate for 10,000 hours. In addition, the embodiments of the present application use a method that equates the high-temperature test time to the normal temperature to generate the target time. Therefore, one embodiment of the present application extends the test time to a maximum of 10,000 / 3 ≈ 3,333 hours, that is, the maximum test time should be less than 3,333 hours. When the maximum test time exceeds 3,333 hours, since the estimated operating time of the light source at this time is greater than 10,000 hours, the embodiments of the present application need to terminate the test operation.

[0131] In one embodiment of the present application, the preset time threshold is 3333 hours. When the updated maximum test time is less than the preset time threshold, it indicates that it is meaningful to continue to extend the maximum test time for the test operation. Therefore, the embodiment of the present application records the additional luminous flux of the light source sample group under the updated maximum test time and adds the additional luminous flux to the luminous flux data group. Next, the embodiment of the present application collects life assessment data or determines whether the light source sample group meets the requirements according to the method described in the above embodiment.

[0132] The method further comprises the following steps:

[0133] A1. Obtain the high-temperature luminous flux, which is the average luminous flux of the high-temperature light source sample group under the updated maximum test time.

[0134] A2, inputting the high temperature test temperature of the high temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient, and the product of the reference acceleration coefficient and the high temperature luminous flux is the high temperature equivalent.

[0135] A3, in response to the high temperature equivalent being greater than a preset luminous flux threshold, multiplying the updated maximum test time by the reference acceleration factor to obtain an equivalent test time.

[0136] A4, in response to the equivalent test time being greater than or equal to the preset life time threshold, the updated maximum test time is combined with the high temperature equivalent to obtain life assessment data.

[0137] A5, in response to the high temperature equivalent being less than or equal to the preset luminous flux threshold, generates life failure information.

[0138] A6, if the response equivalent test time is less than the preset life time threshold, a life failure information is generated.

[0139] In A1, for example, the updated maximum test time is 1152h and the high temperature luminous flux is In A2, the embodiment of the present application inputs high temperature test temperatures such as 30°C, 35°C, and 40°C into the acceleration model to obtain the reference acceleration coefficient Etc. The high temperature equivalent is In A3, for example, if: The embodiment of the present application multiplies the updated maximum test time by the reference acceleration factor to obtain the equivalent test time In A4, if The life of the high-temperature light source sample group meets the requirements, and the updated maximum test time and high-temperature equivalent are combined to obtain the life evaluation data. In A5, if The embodiment of the present application generates life failure information. In A6, if The embodiment of the present application generates information on lifetime failure. The embodiment of the present application executes S14 to generate a lifetime assessment model based on multiple lifetime assessment data. Since multiple lifetime assessment data have basically covered the predicted value of the luminous flux of 10,000 hours, the embodiment of the present application can perform curve fitting on multiple lifetime assessment data. The attenuation law of the light source conforms to the exponential attenuation form, and its expression is as follows: Φ(t)=Φ0×exp(-at b ) Where Φ0 is the initial luminous flux, which is the average of the initial luminous flux of all light sources, as follows: The gradient descent method is used to estimate the parameters and the loss function is established as follows: The gradient vector is obtained by taking partial derivatives of the estimated parameters: The estimated values ​​of a and b of the life assessment model can be obtained, so the life assessment model is: In the embodiment of the present application, S15 is executed to generate lifespan assessment information based on the lifespan assessment model. The lifespan assessment model is constrained by both the luminous flux factor and the time factor.

[0140] In some embodiments, generating life assessment information based on a life assessment model includes the following steps: obtaining a preset luminous flux threshold, inputting the initial luminous flux and the preset luminous flux threshold into the life assessment model, obtaining a time assessment value, and generating life qualification information if the response time assessment value is greater than or equal to the preset time threshold, or generating life failure information if the response time assessment value is less than the preset time threshold.

[0141] According to the lifespan assessment model, when the luminous flux decays to half, the time required is:

[0142]

[0143] If L 0.5 ≥10000h, the light source meets the life requirement.

[0144] In other embodiments, generating life assessment information based on a life assessment model includes the following steps: obtaining a preset time threshold, inputting the initial luminous flux and the preset time threshold into the life assessment model to obtain a luminous flux assessment value, and generating life qualification information in response to the luminous flux assessment value being greater than or equal to the preset luminous flux threshold, or generating life failure information in response to the luminous flux assessment value being less than the preset luminous flux threshold.

[0145] When the preset time threshold is 10000h, it is substituted into the life assessment model. If the calculated luminous flux is greater than half of the initial luminous flux Φ0, as follows:

[0146]

[0147] The light source meets the life requirements.

[0148] In general, the embodiment of the present application establishes an acceleration model based on the luminous flux test set. There is no need to collect luminous flux data for a long time. The luminous flux data corresponding to the long time can be equivalently predicted based on the acceleration model, thus shortening the test time, speeding up the efficiency of building the life assessment model, and thus improving the efficiency of life assessment.

[0149] It should be noted that, in each of the above-mentioned embodiments, there is not necessarily a certain order between the above-mentioned steps. A person skilled in the art can understand, based on the description of the embodiments of this application, that in different embodiments, the above-mentioned steps may have different execution orders, that is, they may be executed in parallel, or may be executed interchangeably, etc.

[0150] As another aspect of the present invention, an embodiment of the present invention provides a device for evaluating the lifespan of a display device. The device for evaluating the lifespan of a display device may be a software module comprising several instructions stored in a memory. A processor may access the memory and execute the instructions to implement the method for evaluating the lifespan of a display device described in each of the above embodiments.

[0151] In some embodiments, the lifespan assessment device for a display device may also be constructed from hardware devices. For example, the lifespan assessment device for a display device may be constructed from one or more chips, and the chips may work in coordination with each other to complete the lifespan assessment methods for a display device described in the various embodiments above. For another example, the lifespan assessment device for a display device may also be constructed from various logic devices, such as a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), a single-chip microcomputer, an ARM (Acorn RISC Machine) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination of these components.

[0152] See also Figure 4 The life evaluation device 400 for a display device includes a data acquisition module 41 , an acceleration model construction module 42 , a life data acquisition module 43 , a life model construction module 44 and a life evaluation module 45 .

[0153] The data acquisition module 41 is used to obtain a luminous flux test set, which includes multiple luminous flux data groups, one luminous flux data group corresponds to one light source sample group, and one luminous flux data group corresponds to one test temperature. The acceleration model construction module 42 is used to generate an acceleration model based on multiple luminous flux data groups. The acceleration model is used to represent the changing relationship between the target acceleration coefficient and the test temperature. The target acceleration coefficient is the ratio of the luminous flux of the light source sample group at the standard test temperature to the luminous flux of the high-temperature test temperature at the same test time. The standard test temperature is lower than the high-temperature test temperature. The life data acquisition module 43 is used to predict the target time required for the light source sample group to decay to different luminous fluxes at the standard test temperature based on the acceleration model, and obtain multiple life assessment data. The life assessment data includes the target time and the luminous flux corresponding to the target time. The life model construction module 44 is used to generate a life assessment model based on multiple life assessment data. The life assessment module 45 is used to generate life assessment information based on the life assessment model.

[0154] In some embodiments, the acceleration model construction module 42 is specifically used to: determine the intra-group acceleration coefficient of the high-temperature light source sample group based on the standard luminous flux data group and the high-temperature luminous flux data group, the standard luminous flux data group is the luminous flux data group corresponding to the standard test temperature, the high-temperature luminous flux data group is the luminous flux data group corresponding to the high-temperature test temperature, and the high-temperature light source sample group is the light source sample group corresponding to the high-temperature test temperature, and fit the intra-group acceleration coefficients of all light source sample groups to obtain the acceleration model.

[0155] In some embodiments, the luminous flux data group includes a luminous flux set collected from a light source sample group at different test times at the same test temperature. The acceleration model construction module 42 is specifically used to: obtain a standard luminous flux set of the standard light source sample group at the target test time and a high-temperature luminous flux set of the high-temperature light source sample group at the target test time, determine the candidate acceleration coefficient of the high-temperature light source sample group at the target test time based on the standard luminous flux set and the high-temperature luminous flux set, calculate the average value of the candidate acceleration coefficients of the high-temperature light source sample group at all target test times, and obtain the intra-group acceleration coefficient of the high-temperature light source sample group.

[0156] In some embodiments, the light source sample group includes multiple light sources, the luminous flux set includes multiple luminous fluxes, one luminous flux corresponds to one light source, and the acceleration model construction module 42 is specifically used to: obtain the average value of the standard luminous flux set to obtain a first average luminous flux, obtain the average value of the high-temperature luminous flux set to obtain a second average luminous flux, calculate the ratio of the first average luminous flux to the second average luminous flux, and obtain a candidate acceleration coefficient of the high-temperature light source sample group under the target test time.

[0157] In some embodiments, the acceleration model is configured with a coordinate system, and the acceleration model construction module 42 is specifically used to: match the linear relationship of the acceleration coefficients within the group of all light source sample groups on the coordinate system, and perform linear fitting processing on the acceleration coefficients within the group of all light source sample groups to obtain the acceleration model; or, match the nonlinear relationship of the acceleration coefficients within the group of all light source sample groups on the coordinate system, and perform nonlinear fitting processing on the acceleration coefficients within the group of all light source sample groups to obtain the acceleration model.

[0158] In some embodiments, the test temperature interval between two adjacent light source sample groups is preset by a temperature step; and / or, the luminous flux data group includes a set of luminous fluxes collected from the light source sample group at different test times at the same test temperature, and in each luminous flux data group, the interval between two adjacent test times is preset by a time step in a preset time arrangement order; and / or, the test temperature of any light source sample group is less than or equal to a preset maximum test temperature.

[0159] In some embodiments, the luminous flux data group includes a set of luminous fluxes collected from a light source sample group at different test times at the same test temperature. The life data acquisition module 43 is specifically used to: in response to any light source sample group satisfying a preset attenuation continuation condition, determine the reference luminous flux of the high-temperature light source sample group at the maximum test time, the reference luminous flux is the average luminous flux of the high-temperature light source sample at the maximum test time, and the high-temperature light source sample group is the light source sample group corresponding to the high-temperature test temperature; input the high-temperature test temperature into the acceleration model to obtain a reference acceleration coefficient; multiply the maximum test time by the reference acceleration coefficient to obtain the target time, which is the test time required for the high-temperature light source sample group to decay to the reference luminous flux at the standard test temperature; combine the target time and the reference luminous flux to obtain life evaluation data.

[0160] In some embodiments, the life data acquisition module 43 is specifically used to: in response to the average luminous flux of any light source sample group at the maximum test time being greater than a preset luminous flux threshold, and the equivalent luminous flux of any high-temperature light source sample group at the maximum test time being greater than the preset luminous flux threshold, determine that any light source sample group meets the preset attenuation continuation condition, the equivalent luminous flux is the result of multiplying the control luminous flux of any high-temperature light source sample group at the maximum test time by the reference acceleration coefficient, the control luminous flux is the average luminous flux of any high-temperature light source sample group at the maximum test time, the preset luminous flux threshold is the result of multiplying the preset initial luminous flux by the preset coefficient, the preset coefficient is a positive number and less than 1; determine the reference luminous flux of the high-temperature light source sample group at the maximum test time.

[0161] In some embodiments, the lifetime data acquisition module 43 is specifically configured to generate lifetime evaluation information in response to the standard light source sample group not meeting the attenuation continuation condition, where the standard light source sample group is a light source sample group corresponding to a standard test temperature.

[0162] In some embodiments, the life assessment information includes life failure information, and the life data acquisition module 43 is specifically used to: calculate the average luminous flux of the standard light source sample group at each test time within the maximum test time; in response to the average luminous flux of the standard light source sample group at each test time being less than or equal to a preset luminous flux threshold, determine that the standard light source sample group does not meet the attenuation continuation condition, the preset luminous flux threshold is the result of multiplying the initial luminous flux by a preset coefficient, and the preset coefficient is a positive number and less than 1; generate life failure information.

[0163] The life data acquisition module 43 is specifically used to: respond to the fact that the average luminous flux of the standard light source sample group at each test time is greater than the preset luminous flux threshold, and the average luminous flux of the high-temperature light source sample group at the candidate test time is less than or equal to the preset luminous flux threshold, record the candidate test time, the preset luminous flux threshold is the result of multiplying the preset initial luminous flux by the preset coefficient, and the preset coefficient is a positive number and less than 1; input the high temperature test temperature of the high temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient; multiply the candidate test time by the reference acceleration coefficient to obtain the candidate test time; and generate life assessment information based on the candidate test time and the preset life time threshold.

[0164] The life data acquisition module 43 is specifically used to: add the preset time step to the maximum test time to obtain an updated maximum test time; in response to the updated maximum test time being less than the preset time threshold, record the newly added luminous flux of the light source sample group under the updated maximum test time, and add the newly added luminous flux to the luminous flux data group of the light source sample group; or, in response to the updated maximum test time being greater than or equal to the preset time threshold, stop the test operation.

[0165] The life data acquisition module 43 is specifically used to: obtain high-temperature luminous flux, which is the average luminous flux of the high-temperature light source sample group under the updated maximum test time; input the high-temperature test temperature of the high-temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient, and the multiplication result of the reference acceleration coefficient and the high-temperature luminous flux is the high-temperature equivalent; in response to the high-temperature equivalent being greater than the preset luminous flux threshold, multiply the updated maximum test time by the reference acceleration coefficient to obtain the equivalent test time; in response to the equivalent test time being greater than or equal to the preset life time threshold, combine the updated maximum test time and the high-temperature equivalent to obtain life assessment data.

[0166] In some embodiments, the life assessment information includes life qualification information and life failure information. The life assessment model is jointly constrained by the luminous flux factor and the time factor. The life assessment module 45 is specifically used to: obtain a preset luminous flux threshold, which is the result of multiplying the preset initial luminous flux by the preset coefficient, and the preset coefficient is a positive number and less than 1; input the initial luminous flux and the preset luminous flux threshold into the life assessment model to obtain a time assessment value; if the response time assessment value is greater than or equal to the preset time threshold, life qualification information is generated; if the response time assessment value is less than the preset time threshold, life failure information is generated.

[0167] In some embodiments, the life assessment information includes life qualification information and life failure information. The life assessment model is jointly constrained by the luminous flux factor and the time factor. The life assessment module 45 is specifically used to: obtain a preset time threshold; input the preset initial luminous flux and the preset time threshold into the life assessment model to obtain a luminous flux assessment value; in response to the luminous flux assessment value being greater than or equal to the preset luminous flux threshold, generate life qualification information; in response to the luminous flux assessment value being less than the preset luminous flux threshold, generate life failure information.

[0168] It should be noted that the above-described display device lifespan assessment device can implement the display device lifespan assessment method provided in the embodiments of this application, and has the corresponding functional modules and beneficial effects of executing the method. For technical details not fully described in the embodiments of the display device lifespan assessment device, please refer to the display device lifespan assessment method provided in the embodiments of this application.

[0169] See also Figure 5 , Figure 5 1 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application. The computer device 500 includes one or more processors 51 and a memory 52. ​​The memory 52 is connected to the one or more processors, for example, via a bus.

[0170] The processor 51 is configured to support the computer device in executing the corresponding functions of the method in the above method embodiment. The processor can be a central processing unit (CPU), a network processor (NP), a hardware chip, or any combination thereof. The above hardware chip can be an application specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The above PLD can be a complex programmable logic device (CPLD), a field programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof.

[0171] The memory 52 is used to store program code, etc. The memory may include volatile memory (VM), such as random access memory (RAM); non-volatile memory (NVM), such as read-only memory (ROM), flash memory, hard disk drive (HDD), or solid-state drive (SSD); or a combination of the above types of memory.

[0172] The memory 52 can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as the program instructions / modules corresponding to the display device lifespan assessment method in the embodiments of the present application. The processor executes the non-volatile software programs, instructions, and modules stored in the memory to execute the various functional applications and data processing of the display device lifespan assessment method and the display device lifespan assessment apparatus, thereby implementing the functions of the various modules or units of the display device lifespan assessment method and the display device lifespan assessment apparatus provided in the above-mentioned method embodiments.

[0173] The memory may include a program storage area and a data storage area. The program storage area may store an operating system and application programs required for at least one function. The data storage area may store data generated based on the use of the display device's lifespan assessment device. In some embodiments, the memory may optionally include a remote memory device located relative to the processor. Such remote memory device may be connected to the display device's lifespan assessment device via a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0174] One or more modules are stored in a memory and, when executed by one or more processors, execute the life assessment method of the display device in any of the above method embodiments, for example, execute the method steps described in the above method embodiments to realize the functions of the modules described in the above device embodiments.

[0175] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. The computer program includes program instructions. When the program instructions are executed by a computer device, the computer executes the method of the aforementioned embodiment.

[0176] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing related hardware through a computer program. The program can be stored in a computer-readable storage medium, and when executed, the program can include the processes in the above-described method embodiments. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0177] The above disclosure is only a preferred embodiment of the present application, and certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A method for evaluating the life of a display device, wherein the display device includes a light source, characterized in that: The lifespan assessment method comprises: Acquire a luminous flux test set, the luminous flux test set comprising a plurality of luminous flux data groups, one luminous flux data group corresponding to one light source sample group, and one luminous flux data group corresponding to one test temperature; generating an acceleration model based on the plurality of luminous flux data groups, the acceleration model being used to represent a changing relationship between a target acceleration coefficient and a test temperature, the target acceleration coefficient being a ratio of the luminous flux at a standard test temperature to the luminous flux at a high-temperature test temperature for the light source sample group at the same test time, the standard test temperature being lower than the high-temperature test temperature; Predicting target times required for the light source sample group to decay to different luminous fluxes at the standard test temperature based on the acceleration model, and obtaining a plurality of life assessment data, the life assessment data including target times and luminous fluxes corresponding to the target times; generating a lifespan assessment model based on a plurality of the lifespan assessment data; Lifespan assessment information is generated based on the lifespan assessment model.

2. The lifespan assessment method according to claim 1, wherein: Generating an acceleration model based on the plurality of light flux data groups comprises: Determining an intra-group acceleration coefficient of the high-temperature light source sample group based on a standard luminous flux data group and a high-temperature luminous flux data group, wherein the standard luminous flux data group is a luminous flux data group corresponding to the standard test temperature, the high-temperature luminous flux data group is a luminous flux data group corresponding to the high-temperature test temperature, and the high-temperature light source sample group is a light source sample group corresponding to the high-temperature test temperature; The acceleration coefficients within the group of all light source sample groups are fitted to obtain the acceleration model.

3. The lifespan assessment method according to claim 2, wherein: The luminous flux data set includes a set of luminous fluxes collected from the high-temperature light source sample group at different test times at the same test temperature. The determination of the intra-group acceleration coefficient of the high-temperature light source sample group based on the standard luminous flux data set and the high-temperature luminous flux data set includes: Obtaining a standard luminous flux set of the standard light source sample group at a target test time and a high-temperature luminous flux set of the high-temperature light source sample group at the target test time; Determining candidate acceleration factors for the high-temperature light source sample group at the target test time based on the standard luminous flux set and the high-temperature luminous flux set; An average value of the candidate acceleration coefficients of the high-temperature light source sample group at all target test times is calculated to obtain an intra-group acceleration coefficient of the high-temperature light source sample group.

4. The lifespan assessment method according to claim 3, wherein: The high-temperature light source sample group and the standard light source sample group each include a plurality of light sources, the high-temperature luminous flux set and the standard luminous flux set each include a plurality of luminous fluxes, one luminous flux corresponds to one light source, and determining the candidate acceleration coefficient of the high-temperature light source sample group at the target test time based on the standard luminous flux set and the high-temperature luminous flux set includes: Obtaining an average value of the standard luminous flux set to obtain a first average luminous flux; Obtaining an average value of the high-temperature luminous flux set to obtain a second average luminous flux; A ratio of the first average luminous flux to the second average luminous flux is calculated to obtain a candidate acceleration coefficient of the high-temperature light source sample group at the target test time.

5. The lifespan assessment method according to claim 2, wherein: The acceleration model is configured with a coordinate system, and the acceleration coefficients within the group of all light source sample groups are fitted to obtain the acceleration model, including: In response to the linear relationship between the acceleration coefficients of all light source sample groups on the coordinate system, a linear fitting process is performed on the acceleration coefficients of all light source sample groups to obtain an acceleration model; or, In response to the nonlinear relationship matching between the acceleration coefficients within the group of all light source sample groups on the coordinate system, a nonlinear fitting process is performed on the acceleration coefficients within the group of all light source sample groups to obtain an acceleration model.

6. The lifespan assessment method according to claim 1, wherein: The test temperature interval of two adjacent light source sample groups is a preset temperature step; and / or, The luminous flux data group includes a set of luminous fluxes collected from the light source sample group at different test times under the same test temperature. In each luminous flux data group, the time interval between two adjacent test times is preset according to a preset time sequence. and / or, The test temperature of any of the light source sample groups is less than or equal to a preset maximum test temperature.

7. The lifespan assessment method according to any one of claims 1 to 6, characterized in that: The luminous flux data set includes a set of luminous fluxes of the light source sample group collected at different test times at the same test temperature, and the target time required for the light source sample group to decay to different luminous fluxes at the standard test temperature is predicted based on the acceleration model, and multiple life assessment data are obtained, including: In response to any of the light source sample groups satisfying a preset attenuation continuation condition, determining a reference luminous flux of the high-temperature light source sample group at a maximum test time, wherein the reference luminous flux is an average luminous flux of the high-temperature light source sample at the maximum test time, and the high-temperature light source sample group is a light source sample group corresponding to the high-temperature test temperature; Inputting the high temperature test temperature into the acceleration model to obtain a reference acceleration coefficient; Multiplying the maximum test time by the reference acceleration factor to obtain a target time, where the target time is the test time required for the high-temperature light source sample group to decay to the reference luminous flux at the standard test temperature; The target time is combined with the reference luminous flux to obtain life evaluation data.

8. The lifespan assessment method according to claim 7, characterized in that: In response to any of the light source sample groups satisfying a preset attenuation continuation condition, determining the reference luminous flux of the high-temperature light source sample group at the maximum test time includes: In response to the average luminous flux of any of the light source sample groups at the maximum test time being greater than a preset luminous flux threshold, and the equivalent luminous flux of any of the high-temperature light source sample groups at the maximum test time being greater than a preset luminous flux threshold, determining that any of the light source sample groups meets a preset attenuation continuation condition, the equivalent luminous flux being a result of multiplying a control luminous flux of any of the high-temperature light source sample groups at the maximum test time by the reference acceleration coefficient, the control luminous flux being an average luminous flux of any of the high-temperature light source sample groups at the maximum test time, the preset luminous flux threshold being a result of multiplying a preset initial luminous flux by a preset coefficient, and the preset coefficient being a positive number and less than 1; Determine the reference luminous flux of the high-temperature light source sample group at the maximum test time.

9. The lifespan assessment method according to claim 7, characterized in that: Also includes: In response to the standard light source sample group not satisfying the attenuation continuation condition, lifetime evaluation information is generated, wherein the standard light source sample group is a light source sample group corresponding to the standard test temperature.

10. The lifespan assessment method according to claim 9, characterized in that: The life evaluation information includes life failure information, and the response standard light source sample group does not meet the attenuation continuation condition. Generating the life evaluation information includes: Calculating the average luminous flux of the standard light source sample group at each test time within the maximum test time; In response to an average luminous flux of the standard light source sample group at each test time being less than or equal to a preset luminous flux threshold, determining that the standard light source sample group does not meet the attenuation continuation condition, where the preset luminous flux threshold is a result of multiplying an initial luminous flux by a preset coefficient, where the preset coefficient is a positive number and less than 1; Generates life failure information.

11. The lifespan assessment method according to claim 7, wherein: Also includes: The average luminous flux of the response standard light source sample group at each test time is greater than a preset luminous flux threshold, and the average luminous flux of the high-temperature light source sample group at the candidate test time is less than or equal to the preset luminous flux threshold, and the candidate test time is recorded. The preset luminous flux threshold is the result of multiplying a preset initial luminous flux by a preset coefficient, and the preset coefficient is a positive number and less than 1; Inputting the high temperature test temperature of the high temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient; Multiplying the candidate test time by the reference acceleration coefficient to obtain a candidate test time; Life assessment information is generated based on the candidate test time and a preset life time threshold.

12. The lifespan assessment method according to claim 11, characterized in that: After obtaining the life assessment data, it also includes: Add the preset time step to the maximum test time to obtain the updated maximum test time; In response to the updated maximum test time being less than a preset time threshold, recording the newly added luminous flux of the light source sample group under the updated maximum test time, and adding the newly added luminous flux to the luminous flux data group of the light source sample group; or In response to the updated maximum test time being greater than or equal to a preset time threshold, the test operation is stopped.

13. The lifespan assessment method according to claim 12, characterized in that: Also includes: Obtaining a high-temperature luminous flux, where the high-temperature luminous flux is an average luminous flux of the high-temperature light source sample group under the updated maximum test time; Inputting the high temperature test temperature of the high temperature light source sample group into the acceleration model to obtain a reference acceleration coefficient, and multiplying the reference acceleration coefficient by the high temperature luminous flux is a high temperature equivalent; In response to the high temperature equivalent being greater than a preset luminous flux threshold, multiplying the updated maximum test time by the reference acceleration factor to obtain an equivalent test time; In response to the equivalent test time being greater than or equal to a preset life time threshold, the updated maximum test time is combined with the high temperature equivalent to obtain life assessment data.

14. The lifespan assessment method according to any one of claims 1 to 6, characterized in that: The life assessment information includes life qualification information and life failure information. The life assessment model is constrained by both a luminous flux factor and a time factor. Generating the life assessment information based on the life assessment model includes: Obtaining a preset luminous flux threshold, where the preset luminous flux threshold is a result of multiplying a preset initial luminous flux by a preset coefficient, where the preset coefficient is a positive number and less than 1; Inputting the initial luminous flux and the preset luminous flux threshold into the lifespan assessment model to obtain a time assessment value; In response to the time evaluation value being greater than or equal to a preset time threshold, generating life qualification information; In response to the time evaluation value being less than a preset time threshold, life failure information is generated.

15. The lifespan assessment method according to any one of claims 1 to 6, characterized in that: The life assessment information includes life qualification information and life failure information. The life assessment model is constrained by both a luminous flux factor and a time factor. Generating the life assessment information based on the life assessment model includes: Get the preset time threshold; Inputting a preset initial luminous flux and a preset time threshold into the lifespan assessment model to obtain a luminous flux assessment value; In response to the luminous flux evaluation value being greater than or equal to a preset luminous flux threshold, life qualification information is generated; in response to the luminous flux evaluation value being less than the preset luminous flux threshold, life failure information is generated.

16. A computer device, characterized in that: The device comprises a memory and a processor, wherein the memory is connected to the processor, and the processor is used to execute one or more computer programs stored in the memory. When the processor executes the one or more computer programs, the computer device implements the life assessment method of the display device as described in any one of claims 1 to 15.

17. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor executes the lifespan evaluation method for a display device according to any one of claims 1 to 15.

Images