Service life evaluation method and device of nuclear power instrument control equipment, medium and electronic equipment

Abstract

The invention discloses a service life evaluation method and device of nuclear power instrument control equipment, a medium and electronic equipment. The method comprises the following steps: determining a target circuit board component to be evaluated in circuit board components forming nuclear power instrument control equipment, and determining the expected service life of the target circuit board component; based on the working environment data and the historical fault data of the target circuit board, respectively determining an environment influence factor and a common mode failure factor which influence the expected service life; correcting the expected service life by adopting an environmental influence factor and / or a common mode failure factor to obtain a corrected service life of the target circuit board; and evaluating the service life of the nuclear power instrument control equipment based on the corrected service life and the electrical element parameters of the target circuit board. According to the invention, the service life of the nuclear power instrument control equipment can be evaluated, the nuclear power instrument control equipment is preventively maintained by referring to the service life of the nuclear power instrument control equipment, and the operation and maintenance economy and the operation safety of a nuclear power station can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of reliability management and operation and maintenance of nuclear power instrumentation and control equipment, and in particular to a service life assessment method, device, medium and electronic equipment for nuclear power instrumentation and control equipment. Background Art

[0002] Nuclear power instrumentation and control equipment is the nervous system of nuclear power plants. Its reliable and stable operation directly affects the safety of nuclear power units. In order to improve the safety level of nuclear power units, preventive maintenance of instrumentation and control equipment is required.

[0003] Preventive maintenance is performed on nuclear power instrumentation and control equipment before failure. Currently, nuclear power instrumentation and control equipment is often maintained based on experience or at fixed time intervals. This can easily lead to under-repair or over-repair of nuclear power instrumentation and control equipment. It is known that preventive maintenance is one of the main costs in the nuclear power operation and maintenance process. Over-repair will increase the operation and maintenance costs of nuclear power plants and affect the economic efficiency of nuclear power plant operation and maintenance. Under-repair will affect the operational safety of nuclear power plants.

[0004] Accurately evaluating the service life of nuclear power instrumentation and control equipment and performing preventive maintenance on nuclear power instrumentation and control equipment based on its service life are of great significance for improving the economic efficiency and operational safety of nuclear power plants. Summary of the invention

[0005] The present application provides a service life assessment method, device, medium and electronic equipment for nuclear power instrumentation and control equipment. Preventive maintenance of nuclear power instrumentation and control equipment is performed with reference to the service life of the nuclear power instrumentation and control equipment, which can achieve the purpose of improving the operation and maintenance economy and operation safety of nuclear power plants.

[0006] According to a first aspect of the present application, a method for evaluating the service life of nuclear power instrumentation and control equipment is provided, the method comprising:

[0007] Determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and determine the expected service life of the target circuit board component;

[0008] Based on the working environment data and historical failure data of the target circuit board component, respectively determining the environmental impact factor and the common mode failure factor affecting the expected service life;

[0009] Using the environmental impact factor and / or the common mode failure factor, the expected service life is corrected to obtain a corrected service life of the target circuit board component;

[0010] Based on the corrected service life and the electrical component parameters of the target circuit board component, the service life of the nuclear power instrumentation and control equipment is evaluated.

[0011] According to a second aspect of the present application, a service life assessment device for nuclear power instrumentation and control equipment is provided, the device comprising:

[0012] A life determination module, used to determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and to determine the expected service life of the target circuit board component;

[0013] A factor determination module, used to determine the environmental impact factor and the common mode failure factor affecting the expected service life based on the working environment data and historical failure data of the target circuit board component;

[0014] A life correction module, used to correct the expected service life by using the environmental impact factor and / or the common mode failure factor to obtain a corrected service life of the target circuit board component;

[0015] The life evaluation module is used to evaluate the service life of the nuclear power instrumentation and control equipment based on the corrected service life and the electrical component parameters of the target circuit board component.

[0016] According to a third aspect of the present invention, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the service life assessment method for nuclear power instrumentation and control equipment as described in the embodiment of the present application.

[0017] According to the fourth aspect of the present invention, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the service life assessment method for nuclear power instrumentation and control equipment as described in the embodiment of the present application is implemented.

[0018] According to the fifth aspect of the present application, an embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the service life assessment method of nuclear power instrumentation and control equipment as described in the embodiment of the present application.

[0019] The technical solution of the present application utilizes environmental impact factors and common mode failure factors to correct the expected service life of circuit board components in nuclear power instrumentation and control equipment to obtain the corrected service life of circuit board components, and then evaluates the service life of nuclear power instrumentation and control equipment in combination with the electrical component parameters of the circuit board components. The present application is based on the actual working conditions of circuit board components in nuclear power instrumentation and control equipment, comprehensively considers the impact of the working environment and common mode failure on circuit board components in nuclear power instrumentation and control equipment, and realizes an accurate evaluation of the service life of nuclear power instrumentation and control equipment. Preventive maintenance of nuclear power instrumentation and control equipment is performed on the nuclear power instrumentation and control equipment with reference to the service life of the nuclear power instrumentation and control equipment obtained by the evaluation, which can effectively avoid under-repair and over-repair of nuclear power instrumentation and control equipment, and is beneficial to improving the economical operation and maintenance of nuclear power plants and the operational safety.

[0020] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0022] Figure 1 is a flow chart of a method for evaluating the service life of nuclear power instrumentation and control equipment provided in accordance with the first embodiment;

[0023] Figure 2 is a flow chart of a method for evaluating the service life of nuclear power instrumentation and control equipment provided in Example 2;

[0024] Figure 3 It is a structural schematic diagram of a service life assessment device for nuclear power instrumentation and control equipment provided in Example 3 of the present application;

[0025] Figure 4 It is a structural schematic diagram of an electronic device provided in Example 4 of the present application. DETAILED DESCRIPTION

[0026] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0027] It should be noted that the terms "first", "second", "target" and "candidate" in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0028] Embodiment 1

[0029] Figure 1 It is a flow chart of a method for assessing the service life of nuclear power instrumentation and control equipment provided in Example 1. This embodiment can be applicable to the situation of performing preventive maintenance on nuclear power instrumentation and control equipment in nuclear power plants. The method can be configured to be executed by a service life assessment device for nuclear power instrumentation and control equipment. The service life assessment device for nuclear power instrumentation and control equipment is implemented in the form of hardware and / or software and can be integrated into electronic equipment that runs this system.

[0030] like Figure 1 As shown, the method includes:

[0031] S110. Determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and determine an expected service life of the target circuit board component.

[0032] Among them, nuclear power instrumentation and control equipment is configured in nuclear power plants and is used for instrumentation and control systems in nuclear power plants. Nuclear power instrumentation and control equipment is crucial to ensure the safe, reliable and economical operation of nuclear power plants. Circuit board components are an important component of nuclear power instrumentation and control equipment. Circuit board components mainly include circuit board substrates, electronic components, electronic connectors, welding materials and insulating materials. Nuclear power instrumentation and control equipment includes at least two circuit board components. Among them, the target circuit board component to be evaluated refers to the circuit board component in the nuclear power instrumentation and control equipment that needs to be evaluated for service life.

[0033] The expected service life of the target circuit board component refers to the service life of the target circuit board component under ideal working conditions, which can be determined based on the recommended service life provided by the manufacturer. Generally, since the actual working conditions of the target circuit board component are different from the ideal working conditions, the actual service life of the target circuit board component will be shorter than the expected service life of the target circuit board component.

[0034] Optional, based on Ts = T m×(1+ΔE) to determine the expected service life of the target circuit board component based on the recommended service life provided by the manufacturer. m It refers to the recommended service life provided by the manufacturer; ΔE refers to the life correction factor, which can be obtained by consulting international standards and reliability life standards.

[0035] S120. Based on the working environment data and historical failure data of the target circuit board component, respectively determine the environmental impact factors and common mode failure factors that affect the expected service life.

[0036] The working environment data is used to describe the actual working condition of the target circuit board component. The environmental influencing factors can be determined based on the environmental working data. Optionally, the working environment data includes at least two of the actual working temperature, the actual working humidity, the degree of dust accumulation, and the equipment vibration data. The equipment vibration data includes the equipment vibration frequency and the equipment vibration displacement.

[0037] Historical fault data refers to fault information that once existed in the target circuit board component but does not currently exist. Optionally, the historical fault data includes at least two of the fault location, fault component, fault cause, and number of faults. The historical fault data is used to determine the failure mode of the target circuit board component, and then determine whether the target circuit board component has a common mode failure. Among them, common mode failure refers to the simultaneous failure of multiple circuit board components caused by a common cause. The common mode failure factor can be determined based on the historical fault data.

[0038] Among them, the environmental impact factor is used to quantify the impact of the working environment on the service life of the target circuit board component. The common mode failure factor is used to quantify the impact of common mode failure on the service life of the target circuit board component.

[0039] In an optional embodiment, based on the historical failure data of the target circuit board component, the common mode failure factor affecting the expected service life is determined, including: determining the failure mode of the target circuit board component according to the fault location, fault component, fault cause and number of failures in the historical failure data; if the failure mode of the target circuit board component is common mode failure, determining the service life lost by the nuclear power instrumentation and control equipment due to common mode failure; based on the service life lost by the nuclear power instrumentation and control equipment due to common mode failure, determining the common mode failure factor affecting the expected service life.

[0040] Among them, the fault location refers to the location where the fault occurs on the target circuit board component. The fault component is the circuit component that fails in the target circuit board component. The fault cause refers to the reason why the target circuit board component fails. The number of faults refers to the number of times each fault occurs.

[0041] Among them, failure mode refers to the way in which nuclear power instrumentation and control equipment cannot continue to perform its expected functions within its expected service life. Failure mode usually describes the specific manifestation or state of problems with nuclear power instrumentation and control equipment. By determining the failure mode of the target circuit board component, it can be determined whether the nuclear power instrumentation and control equipment has common mode failure.

[0042] If the failure mode of the target circuit board component is common mode failure, the service life of the nuclear power instrumentation and control equipment lost due to common mode failure is determined. For example, the expected service life of the nuclear power instrumentation and control equipment is 20 years, but due to common mode failure, the nuclear power instrumentation and control equipment fails in the 12th year of service, then the service life lost by the nuclear power instrumentation and control equipment due to common mode failure is 8 years. The service life lost by the nuclear power instrumentation and control equipment due to common mode failure is used to determine the common mode failure factor that affects the expected service life.

[0043] Optionally, the life lost by the target circuit board component due to the common mode failure is directly used as the common mode failure factor affecting the life of the target circuit board component. Then the common mode failure factor in the above example is 8.

[0044] The above technical scheme provides a practical solution for determining the common mode failure factor, provides technical support for quantifying the impact of common mode failure on the service life of target circuit board components, and is conducive to improving the accuracy of service life assessment of nuclear power instrumentation and control equipment.

[0045] In an optional embodiment, the failure mode of the target circuit board component is determined based on the fault location, fault component, fault cause and number of failures in the historical fault data, including: if the number of failures of the same component at the same location is greater than a set number, then the failure mode of the target circuit board component is determined to be a common mode failure; or, if the probability of the target circuit board component failing due to the same fault cause is greater than a set threshold, then the failure mode of the target circuit board component is determined to be a common mode failure.

[0046] The set number of times is used to determine whether the failure mode of the target circuit board component is a common mode failure. The specific value of the set number of times is determined according to actual business requirements and is not limited here. For example, the set number of times is 3 times. In other words, if the same component installed at the same position causes damage to the target circuit board component more than 3 times, then it can be determined that the failure mode of the target circuit board component is a common mode failure.

[0047] The threshold is set to determine whether the failure mode of the target circuit board component is a common mode failure. The specific value of the threshold is determined according to the actual business requirements and is not limited here. For example, the threshold is set to 1%. In other words, when the probability of damage to the target circuit board component due to the same reason reaches 1%, it can be determined that the failure mode of the target circuit board component is a common mode failure.

[0048] The above technical solution provides a practical common mode failure judgment scheme, which can be used to determine whether the failure mode of the target circuit board component is a common mode failure, and provides data support for the subsequent quantification of the impact of common mode failure on the service life of the target circuit board component.

[0049] In an optional embodiment, the environmental influencing factors include at least two of a temperature influencing factor, a humidity influencing factor, a dust influencing factor and a vibration influencing factor; the temperature influencing factor is determined based on the ideal working temperature of the target circuit board component and the actual working temperature in the working environment data; the humidity influencing factor is determined based on the ideal working humidity of the target circuit board component and the actual working humidity in the working environment data; the dust influencing factor is determined based on the dust accumulation degree of the target circuit board component in the working environment data; and the vibration influencing factor is determined based on the equipment vibration data in the working environment data.

[0050] Among them, the temperature impact factor is used to quantify the impact of ambient temperature on the service life of the target circuit board components; the humidity impact factor is used to quantify the impact of ambient humidity on the service life of the target circuit board components; the dust impact factor is used to quantify the impact of dust accumulation on the service life of the target circuit board components; the vibration impact factor is used to quantify the impact of equipment vibration data such as equipment vibration frequency and equipment vibration displacement on the service life of the target circuit board components.

[0051] Since nuclear power instrumentation and control equipment is easily affected by temperature, the temperature impact factor can be determined by analyzing the main components and components of the equipment, such as semiconductor diodes, triodes, IC integrated circuits, thermistors, capacitors and other components, based on their installation location and heat dissipation layout. The specific value of the temperature impact factor is not limited here and is determined according to actual conditions. For example, the temperature impact factor can be 0.8 to 1.2.

[0052] Optional, temperature influence factor in K T Indicates that K T =e -α(T-Topt)2 Determine the temperature influence factor. Where T is the actual operating temperature, T opt is the ideal operating temperature, and α is the temperature sensitivity coefficient. The ideal operating temperature is not limited here and is determined according to the actual situation. For example, the ideal operating temperature can be 20°C to 25°C. The temperature sensitivity coefficient α can be queried through the manufacturer's data manual, professional component database, standards and specifications, etc. Alternatively, it can be obtained by building a circuit loop and measuring.

[0053] The specific value of the humidity impact factor is not limited here and is determined according to the actual situation. For example, the humidity impact factor can be 0.5 to 1.5. H Indicates that K H =e -β∣H-Hopt∣ Where H is the actual working humidity, H opt is the ideal working humidity (eg, 50%), and β is the humidity sensitivity coefficient. The ideal working humidity is not limited here and is determined according to actual conditions. For example, the ideal working humidity is 40%-60%.

[0054] The humidity sensitivity coefficient β is related to the humidity range and duration of the working environment of the target circuit board component. When the target circuit board component is in the ideal working humidity range, the weight factor is accumulated and superimposed with a quarterly cycle and the coefficient is increased by 0.1 every quarter. If the humidity sensitivity coefficient β in the first quarter is 1, then the humidity sensitivity coefficient β in the second quarter will be 1.1, and the humidity sensitivity coefficient β is accumulated accordingly; if the target circuit board component is not in the ideal working humidity range, the relative size and duration of the actual working humidity deviation from the ideal working humidity are taken into consideration. With a quarterly cycle, the humidity sensitivity coefficient β is decreased from the initial value of 1 by a step of 0.1 every time it deviates from the ideal working humidity by 10% and the cumulative duration is 3 months, and the humidity sensitivity coefficient β is summed up with a cycle of 6 years.

[0055] The dust impact factor is expressed in K D express,

[0056] K D =1 means dust accumulation, K D =e -γD Indicates dust accumulation, where D represents the degree of dust accumulation and γ is the dust influence coefficient. Optionally, the degree of dust accumulation is divided into general, good and severe. The γ dust influence coefficient can be determined based on the actual assembly conditions and maintenance experience of the target circuit board components. The vibration influence factor is expressed as K E Indicates that, where the vibration influence factor K E Related to the equipment vibration frequency and equipment vibration displacement.

[0057] The above technical scheme provides a practical scheme for determining environmental influencing factors, and provides data support for considering the impact of the working environment on the service life of the target circuit board components from multiple angles such as temperature, humidity, dust accumulation and equipment vibration, which is conducive to improving the accuracy of the assessment of the service life of nuclear power instrumentation and control equipment.

[0058] S130: Using the environmental impact factor and / or the common mode failure factor, correct the expected service life to obtain a corrected service life of the target circuit board component.

[0059] Optionally, only the environmental impact factor is used to correct the expected service life to obtain the corrected service life of the target circuit board component. For example, the environmental impact factor is multiplied by the expected service life, and the obtained product is determined as the corrected service life of the target circuit board component. Optionally, any two of the temperature impact factor, humidity impact factor, dust impact factor and vibration impact factor are multiplied, and the obtained product is determined as the environmental impact factor. Then, the correction of the expected service life using only the environmental impact factor can be expressed as Te=Ts×K T ×K H ×K D ×K E . Wherein, Te represents the modified service life.

[0060] Alternatively, only the common mode failure factor is used to correct the expected service life to obtain the corrected service life of the target circuit board component. For example, the common mode failure factor is subtracted from the expected service life, and the sum is determined as the corrected service life of the target circuit board component. cm It represents the common mode failure factor. The expected service life can be corrected by using only the common mode failure factor as Te = Ts-ΔT cm .

[0061] Alternatively, the expected service life can be corrected by using both the environmental impact factor and the common mode failure factor. For example, the common mode failure factor is subtracted from the product of the environmental impact factor and the expected service life. Then it can be expressed as Te = Ts × K T ×K H ×K D ×K E -ΔT cm .

[0062] In an optional embodiment, a component aging database is established based on the electrical component parameters of the target circuit board component. The aging process of the electronic components in the target circuit board component is predicted using data analysis methods (such as time series analysis and regression analysis). The aging degree of these electronic components is predicted using machine learning models (such as support vector machines and random forests). The aging influence factor K is calculated based on the component aging degree of these electronic components. E Based on T el =Te×K E , using the aging influence factor K E Further corrections were made to the modified service life.

[0063] S140. Evaluate the service life of the nuclear power instrumentation and control equipment based on the corrected service life and electrical component parameters of the target circuit board component.

[0064] Among them, the electrical component parameters include electrical parameters and state parameters of the circuit components on the target circuit board component. The electrical parameters are related to the component type of the circuit components on the target circuit board component, which can be the resistance value of the resistor, the capacitance value of the capacitor, and the amplification factor of the transistor. The state parameters of the circuit components can be component temperature and component voltage, etc. The state parameters of the circuit components can be acquired by sensors, such as temperature sensors and voltage sensors. Optionally, the electrical component parameters are collected in units of maintenance cycles. The electrical component parameters can reflect the actual working state of the target circuit board component in the current maintenance cycle.

[0065] Based on the actual working status of the target circuit board components in the current maintenance cycle, the corrected service life is adjusted, and the service life of the nuclear power instrumentation and control equipment is evaluated with reference to the adjusted results.

[0066] The technical solution of the present application utilizes environmental impact factors and common mode failure factors to correct the expected service life of circuit board components in nuclear power instrumentation and control equipment to obtain the corrected service life of circuit board components, and then evaluates the service life of nuclear power instrumentation and control equipment in combination with the electrical component parameters of the circuit board components. The present application is based on the actual working conditions of circuit board components in nuclear power instrumentation and control equipment, comprehensively considers the impact of the working environment and common mode failure on circuit board components in nuclear power instrumentation and control equipment, and realizes an accurate evaluation of the service life of nuclear power instrumentation and control equipment. Preventive maintenance of nuclear power instrumentation and control equipment is performed on the nuclear power instrumentation and control equipment with reference to the service life of the nuclear power instrumentation and control equipment obtained by the evaluation, which can effectively avoid under-repair and over-repair of nuclear power instrumentation and control equipment, and is beneficial to improving the economical operation and maintenance of nuclear power plants and the operational safety.

[0067] In an optional embodiment, the method further includes: acquiring current inventory data of the target circuit board component; and generating spare parts management recommendations for the target circuit board component based on the corrected service life of the target circuit board component and the current inventory data.

[0068] The current inventory data of the target circuit board components refers to real-time information related to the storage status of the target circuit board components in the warehouse. Based on the current inventory data of the target circuit board components, the quantity and status of the target circuit board components in the warehouse can be determined. The corrected service life of the target circuit board components can estimate the replacement time of the target circuit board components.

[0069] When the quantity and status of target circuit board components in the warehouse and the replacement time of the target circuit board components are known, spare parts management suggestions for the target circuit board components can be generated, wherein the spare parts management suggestions can provide guidance for adjusting inventory.

[0070] The above technical solution generates spare parts management suggestions for target circuit board components by referring to the corrected service life of target circuit board components and the current inventory data of target circuit board components, and provides guidance for adjusting inventory. This can deal with the situation where the circuit board components of some nuclear power instrumentation and control equipment have been discontinued or the supply is unstable, and even in the case of supply and production interruption, the normal operation of nuclear power instrumentation and control equipment can be guaranteed.

[0071] Embodiment 2

[0072] Figure 2 This is a flow chart of a service life assessment method for nuclear power instrumentation and control equipment provided according to Example 2. This embodiment is further optimized on the basis of the above embodiment.

[0073] like Figure 2 As shown, the method includes:

[0074] S210. Determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and determine an expected service life of the target circuit board component.

[0075] S220: Based on the working environment data and historical failure data of the target circuit board component, respectively determine the environmental impact factors and common mode failure factors that affect the expected service life.

[0076] S230: Using the environmental impact factor and / or the common mode failure factor, correct the expected service life to obtain a corrected service life of the target circuit board component.

[0077] S240. Determine, during the current maintenance cycle of the nuclear power instrumentation and control equipment, the magnitude and direction of parameter changes of the electrical component parameters compared to the previous maintenance cycle.

[0078] During the maintenance cycle, the circuit board components will be overhauled. The electrical component parameters of the nuclear power instrumentation and control equipment in the current maintenance cycle can reflect the actual working conditions of the target circuit board components in the current maintenance cycle. The parameter change range can determine the difference in the working conditions of the target circuit board components in adjacent maintenance cycles. The parameter change direction can determine the performance change trend of the target circuit board components in the current adjacent maintenance cycles.

[0079] S250. Determine a life adjustment strategy corresponding to the current maintenance cycle for the corrected service life based on the electrical component parameter, the parameter change amplitude, and the parameter change direction.

[0080] Each maintenance cycle has a corresponding life adjustment strategy, wherein the life adjustment strategy is used to determine how to adjust the corrected service life of the target circuit board component.

[0081] The electrical component parameters, parameter variation range and parameter variation direction respectively describe the actual working condition of the target circuit board component in the current maintenance cycle, the difference in working condition of the target circuit board component in adjacent maintenance cycles, and the performance change tendency of the target circuit board component in adjacent maintenance cycles. With reference to the electrical component parameters, parameter variation range and parameter variation direction, a life adjustment strategy corresponding to the current maintenance cycle is determined for correcting the service life. The corrected service life is adjusted using the life adjustment strategy, which can improve the accuracy of the corrected service life.

[0082] S260. Based on the corrected service life and the service life adjustment strategy, the service life of the nuclear power instrumentation and control equipment is evaluated.

[0083] Optionally, the life adjustment strategy includes extending the service life and shortening the service life, and also includes maintaining the service life and cautiously extending the service life. Optionally, the service life of nuclear power instrumentation and control equipment is evaluated by referring to the modified service life adjusted by the life adjustment strategy.

[0084] The target circuit board components in the nuclear power instrumentation and control equipment can be any number, and the specific number of the target circuit board components is not limited here and is determined according to the actual situation. When there are at least two target circuit board components, the shorter one is selected from the corrected service life adjusted by the life adjustment strategy as the service life of the nuclear power instrumentation and control equipment.

[0085] The technical solution of the present application determines a life adjustment strategy corresponding to the current maintenance cycle for correcting the service life based on electrical component parameters, parameter change amplitudes, and parameter change directions, and uses the life adjustment strategy to evaluate the service life of nuclear power instrumentation and control equipment. It can be known that the electrical component parameters, parameter change amplitudes, and parameter change directions respectively describe the actual working conditions of the target circuit board components in the current maintenance cycle, the differences in the working conditions of the target circuit board components in adjacent maintenance cycles, and the performance change trends of the target circuit board components in adjacent maintenance cycles. Referring to the electrical component parameters, parameter change amplitudes, and parameter change directions, the service life of the circuit board components in the nuclear power instrumentation and control equipment is evaluated based on the actual working conditions of the circuit board components in the nuclear power instrumentation and control equipment, thereby improving the accuracy of the service life evaluation.

[0086] In an optional embodiment, the life adjustment strategy corresponding to the current maintenance cycle is determined for the corrected service life based on the electrical component parameters, the parameter change amplitude and the parameter change direction, including: if the electrical component parameters are all within the normal working range, the life adjustment strategy corresponding to the current maintenance cycle is determined to extend the service life; if the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, and the parameter change amplitude is less than or equal to the preset amplitude range, the life adjustment strategy corresponding to the current maintenance cycle is still determined to extend the service life; if the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life life, but the parameter change amplitude is greater than the preset amplitude range, and the parameter change direction is different, then the life adjustment strategy corresponding to the current maintenance cycle is determined as cautiously extending the life; if there is an electrical component parameter that is out of the normal working range, the number of abnormal components in the target circuit board component is determined; if the number of abnormal components is less than the preset abnormal number, or the parameter change direction is the same, then the life adjustment strategy corresponding to the current maintenance cycle is determined as maintaining the service life; if the number of abnormal components is greater than the preset abnormal number, and the parameter change direction is the same, then the life adjustment strategy corresponding to the current maintenance cycle is determined as shortening the service life.

[0087] Among them, the electrical component parameters are all within the normal working range, indicating that the electronic components on the target circuit board are operating normally in the current maintenance cycle, and the life adjustment strategy corresponding to the current maintenance cycle can be determined to extend the service life.

[0088] Referring to the life adjustment strategy of the previous maintenance cycle, the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, which means that the electronic components on the target circuit board component operated normally in the previous maintenance cycle.

[0089] If the parameter change amplitude of the electronic components on the target circuit board component in the current maintenance cycle is less than or equal to the preset amplitude range, it can be said that the electronic components on the target circuit board component are still operating normally in the current maintenance cycle, and the life adjustment strategy corresponding to the current maintenance cycle can still be determined to extend the service life. Among them, the preset amplitude threshold is used to determine whether the difference in the working conditions of the electronic components on the target circuit board component in adjacent maintenance cycles is within a reasonable range. The preset amplitude threshold can be determined according to the actual situation and is not limited here.

[0090] However, the parameter change amplitude of the electronic components on the target circuit board in the current maintenance cycle is greater than the preset amplitude range and the parameter change direction is different, indicating that the working condition differences of the electronic components on the target circuit board in adjacent maintenance cycles are no longer within a reasonable range, and some electronic components have experienced performance degradation. Therefore, it is necessary to be cautious in extending the life in the current maintenance cycle.

[0091] The existence of electrical component parameters that are not within the normal operating range indicates that abnormal components have appeared in the electronic components on the target circuit board component. Among them, abnormal components refer to electronic components that may fail. The number of abnormal components refers to the number of electronic components that fail on the target circuit board component. The number of abnormal components can quantify the severity of the failure of the target circuit board component. Among them, the preset number of abnormalities is used to determine whether the failure of the target circuit board component is within an acceptable range. The specific value of the preset number of abnormalities is determined according to actual conditions and is not limited here. The number of abnormal components is greater than the preset number of abnormalities, and the direction of parameter change is the same, indicating that abnormal components beyond the acceptable range have appeared in the electronic components on the target circuit board component, and these components have all experienced performance degradation. Then the life adjustment strategy corresponding to the current maintenance cycle is determined to shorten the service life.

[0092] The above technical solution provides a practical solution for determining the life adjustment strategy, and provides technical support for the subsequent use of the life adjustment strategy in evaluating the service life of nuclear power instrumentation and control equipment.

[0093] Embodiment 3

[0094] Figure 3 This is a structural schematic diagram of the service life assessment device for nuclear power instrumentation and control equipment provided in Example 3 of the present application. This embodiment can be applied to the situation of performing preventive maintenance on nuclear power instrumentation and control equipment in nuclear power plants. The device can be implemented by software and / or hardware and can be integrated into electronic devices such as smart terminals.

[0095] like Figure 3 As shown, the device may include:

[0096] The life determination module 310 is used to determine the target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and determine the expected service life of the target circuit board component;

[0097] A factor determination module 320, for determining the environmental impact factor and the common mode failure factor affecting the expected service life based on the working environment data and the historical failure data of the target circuit board component;

[0098] A life correction module 330, configured to correct the expected service life by using the environmental impact factor and / or the common mode failure factor to obtain a corrected service life of the target circuit board component;

[0099] The life evaluation module 340 is used to evaluate the service life of the nuclear power instrumentation and control equipment based on the corrected service life and the electrical component parameters of the target circuit board component.

[0100] The technical solution of the present application utilizes environmental impact factors and common mode failure factors to correct the expected service life of circuit board components in nuclear power instrumentation and control equipment to obtain the corrected service life of circuit board components, and then evaluates the service life of nuclear power instrumentation and control equipment in combination with the electrical component parameters of the circuit board components. The present application is based on the actual working conditions of circuit board components in nuclear power instrumentation and control equipment, comprehensively considers the impact of the working environment and common mode failure on circuit board components in nuclear power instrumentation and control equipment, and realizes an accurate evaluation of the service life of nuclear power instrumentation and control equipment. Preventive maintenance of nuclear power instrumentation and control equipment is performed on the nuclear power instrumentation and control equipment with reference to the service life of the nuclear power instrumentation and control equipment obtained by the evaluation, which can effectively avoid under-repair and over-repair of nuclear power instrumentation and control equipment, and is beneficial to improving the economical operation and maintenance of nuclear power plants and the operational safety.

[0101] Optionally, the life assessment module 340 includes: a parameter change determination submodule, used to determine the parameter change amplitude and parameter change direction of the electrical component parameters compared with the previous maintenance cycle during the current maintenance cycle of the nuclear power instrumentation and control equipment; an adjustment strategy determination submodule, used to determine the life adjustment strategy corresponding to the current maintenance cycle for the corrected service life based on the electrical component parameters, the parameter change amplitude and the parameter change direction; and a life assessment submodule, used to evaluate the service life of the nuclear power instrumentation and control equipment based on the corrected service life and the life adjustment strategy.

[0102] Optionally, the adjustment strategy determination submodule includes: a first direction determination unit, which is used to determine the life adjustment strategy corresponding to the current maintenance cycle as extending the service life if the parameters of the electrical components are all within the normal operating range; a second direction determination unit, which is used to determine the life adjustment strategy corresponding to the current maintenance cycle as extending the service life if the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, and the parameter change amplitude is less than or equal to the preset amplitude range; a third direction determination unit, which is used to determine the life adjustment strategy corresponding to the current maintenance cycle as extending the service life if the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, but the parameter change amplitude is greater than the preset amplitude range, and the parameter change The direction is different, the life adjustment strategy corresponding to the current maintenance cycle is determined as cautiously extending the life; a component number determination unit is used to determine the number of abnormal components in the target circuit board component if the electrical component parameters are out of the normal working range; a fourth direction determination unit is used to determine the life adjustment strategy corresponding to the current maintenance cycle as maintaining the service life if the number of abnormal components is less than the preset abnormal number, or the parameter change directions are the same; a fifth direction determination unit is used to determine the life adjustment strategy corresponding to the current maintenance cycle as shortening the service life if the number of abnormal components is greater than the preset abnormal number and the parameter change directions are the same.

[0103] Optionally, the factor determination module includes: a failure mode determination submodule, used to determine the failure mode of the target circuit board component based on the fault location, fault component, fault cause and number of failures in the historical fault data; a lost life determination submodule, used to determine the service life lost by the nuclear power instrumentation and control equipment due to common mode failure if the failure mode of the target circuit board component is common mode failure; a failure factor determination submodule, used to determine the common mode failure factor affecting the expected service life based on the service life lost by the nuclear power instrumentation and control equipment due to common mode failure.

[0104] Optionally, the failure mode determination submodule includes: a first mode determination unit, used to determine that the failure mode of the target circuit board component is a common mode failure if the number of failures of the same component at the same location is greater than a set number; or, a second mode determination unit, used to determine that the failure mode of the target circuit board component is a common mode failure if the probability of the target circuit board component failing due to the same failure cause is greater than a set threshold.

[0105] Optionally, the environmental influencing factors include at least two of a temperature influencing factor, a humidity influencing factor, a dust influencing factor and a vibration influencing factor; the temperature influencing factor is determined based on the ideal working temperature of the target circuit board component and the actual working temperature in the working environment data; the humidity influencing factor is determined based on the ideal working humidity of the target circuit board component and the actual working humidity in the working environment data; the dust influencing factor is determined based on the dust accumulation degree of the target circuit board component in the working environment data; and the vibration influencing factor is determined based on the equipment vibration data in the working environment data.

[0106] Optionally, the device also includes: an inventory data acquisition module, used to acquire the current inventory data of the target circuit board component; and a spare parts management suggestion module, used to generate spare parts management suggestions about the target circuit board component based on the corrected service life of the target circuit board component and the current inventory data.

[0107] The service life assessment device for nuclear power instrumentation and control equipment provided in the embodiment of the invention can execute the service life assessment method for nuclear power instrumentation and control equipment provided in any embodiment of the present application, and has the corresponding performance modules and beneficial effects for executing the service life assessment method for nuclear power instrumentation and control equipment.

[0108] In the technical solution of this application, the collection, storage, use, processing, transmission, provision and disclosure of user data involved are in compliance with the provisions of relevant laws and regulations and do not violate public order and good morals.

[0109] Embodiment 4

[0110] According to an embodiment of the present application, the present application also provides an electronic device, a readable storage medium and a computer program product.

[0111] Figure 4 The schematic diagram of the structure of the electronic device 410 of the embodiment that can be used to implement is shown. The electronic device 410 includes at least one processor 411, and a memory connected to the at least one processor 411 in communication, such as a read-only memory (ROM) 412, a random access memory (RAM) 413, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 411 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 412 or the computer program loaded from the storage unit 418 to the random access memory (RAM) 413. In the RAM413, various programs and data required for the operation of the electronic device 410 can also be stored. The processor 411, the ROM 412, and the RAM413 are connected to each other via a bus 414. An input / output (I / O) interface 415 is also connected to the bus 414.

[0112] Multiple components in the electronic device 410 are connected to the I / O interface 415, including: an input unit 416, such as a keyboard, a mouse, etc.; an output unit 417, such as various types of displays, speakers, etc.; a storage unit 418, such as a disk, an optical disk, etc.; and a communication unit 419, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 419 allows the electronic device 410 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0113] The processor 411 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 411 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 411 executes the various methods and processes described above, such as a service life assessment method for nuclear power instrumentation and control equipment.

[0114] In some embodiments, the service life assessment method of nuclear power instrumentation and control equipment may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 418. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 410 via the ROM 412 and / or the communication unit 419. When the computer program is loaded into the RAM 413 and executed by the processor 411, one or more steps of the service life assessment method of nuclear power instrumentation and control equipment described above may be executed. Alternatively, in other embodiments, the processor 411 may be configured to execute the service life assessment method of nuclear power instrumentation and control equipment in any other appropriate manner (e.g., by means of firmware).

[0115] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0116] The computer programs for implementing the methods of the present application may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable nuclear power instrumentation and control equipment service life assessment device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0117] In the context of the present application, a computer readable storage medium may be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, device or equipment. A computer readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer readable storage medium may be a machine readable signal medium. A more specific example of a machine readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0118] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0119] The systems and techniques described herein may be implemented in a computing system including backend components (e.g., as a service life assessment server for nuclear power instrumentation and control equipment), or a computing system including middleware components (e.g., an application server), or a computing system including frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described herein), or a computing system including any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0120] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0121] The embodiment of the present application also discloses a computer program product, which includes a computer program, and when the computer program is executed by a processor, the service life assessment method of nuclear power instrumentation and control equipment provided in any embodiment of the present application is implemented. The program product and the service life assessment method of nuclear power instrumentation and control equipment disclosed in each embodiment of the present application belong to the same inventive concept, so it will not be repeated here.

[0122] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this application can be executed in parallel, sequentially or in different orders, as long as the expected results of the technical solution of this application can be achieved, and this document is not limited here.

[0123] The above specific implementations do not constitute a limitation on the protection scope of this application. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of this application should be included in the protection scope of this application.

Claims

1. A method for evaluating the service life of nuclear power instrumentation and control equipment, characterized in that: The method comprises: Determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and determine the expected service life of the target circuit board component; Based on the working environment data and historical failure data of the target circuit board component, respectively determining the environmental impact factor and the common mode failure factor affecting the expected service life; Using the environmental impact factor and / or the common mode failure factor, the expected service life is corrected to obtain a corrected service life of the target circuit board component; Based on the corrected service life and the electrical component parameters of the target circuit board component, the service life of the nuclear power instrumentation and control equipment is evaluated.

2. The method according to claim 1, characterized in that The method of evaluating the service life of the nuclear power instrumentation and control equipment based on the corrected service life and the electrical component parameters of the target circuit board component includes: During the current maintenance cycle of the nuclear power instrumentation and control equipment, determining the magnitude and direction of parameter changes of the electrical component parameters compared to the previous maintenance cycle; Determining a life adjustment strategy corresponding to the current maintenance cycle for the corrected service life based on the electrical component parameter, the parameter change amplitude, and the parameter change direction; Based on the corrected service life and the service life adjustment strategy, the service life of the nuclear power instrumentation and control equipment is evaluated.

3. The method according to claim 2, characterized in that The determining of a life adjustment strategy corresponding to the current maintenance cycle for the corrected service life based on the electrical component parameter, the parameter change amplitude and the parameter change direction includes: If the electrical component parameters are all within the normal working range, the life adjustment strategy corresponding to the current maintenance cycle is determined to extend the service life; If the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, and the parameter change amplitude is less than or equal to the preset amplitude range, the life adjustment strategy corresponding to the current maintenance cycle is still determined to be to extend the service life; If the life adjustment direction corresponding to the previous maintenance cycle is to extend the service life, but the parameter change amplitude is greater than the preset amplitude range, and the parameter change direction is different, then the life adjustment strategy corresponding to the current maintenance cycle is determined to be cautiously extending the life; If the electrical component parameters are outside the normal working range, determining the number of abnormal components in the target circuit board component; If the number of abnormal components is less than the preset number of abnormal components, or the parameter changes in the same direction, the life adjustment strategy corresponding to the current maintenance cycle is determined to maintain the service life; If the number of abnormal components is greater than the preset number of abnormal components, and the parameter changes in the same direction, the life adjustment strategy corresponding to the current maintenance cycle is determined to shorten the service life.

4. The method according to claim 1, characterized in that Determining a common mode failure factor affecting the expected service life based on historical failure data of the target circuit board component includes: Determine the failure mode of the target circuit board component according to the fault location, fault component, fault cause and fault number in the historical fault data; If the failure mode of the target circuit board component is a common mode failure, determining the service life lost by the nuclear power instrumentation and control equipment due to the common mode failure; Based on the service life lost by the nuclear power instrumentation and control equipment due to common mode failure, a common mode failure factor affecting the expected service life is determined.

5. The method according to claim 4, characterized in that The determining of the failure mode of the target circuit board component according to the fault location, fault component, fault cause and fault number in the historical fault data includes: If the number of failures of the same component at the same location is greater than the set number, it is determined that the failure mode of the target circuit board component is a common mode failure; or, If the probability that the target circuit board component fails due to the same fault cause is greater than a set threshold, it is determined that the failure mode of the target circuit board component is a common mode failure.

6. The method according to claim 1, characterized in that The environmental influencing factors include at least two of the temperature influencing factors, humidity influencing factors, dust influencing factors and vibration influencing factors; the temperature influencing factor is determined based on the ideal working temperature of the target circuit board component and the actual working temperature in the working environment data; the humidity influencing factor is determined based on the ideal working humidity of the target circuit board component and the actual working humidity in the working environment data; the dust influencing factor is determined based on the dust accumulation degree of the target circuit board component in the working environment data; and the vibration influencing factor is determined based on the equipment vibration data in the working environment data.

7. The method according to claim 1, characterized in that The method further comprises: Acquire current inventory data of the target circuit board component; Based on the revised service life of the target circuit board component and the current inventory data, a spare parts management suggestion for the target circuit board component is generated.

8. A service life assessment device for nuclear power instrumentation and control equipment, characterized in that: The device comprises: A life determination module, used to determine a target circuit board component to be evaluated among the circuit board components constituting the nuclear power instrumentation and control equipment, and to determine the expected service life of the target circuit board component; A factor determination module, used to determine the environmental impact factor and the common mode failure factor affecting the expected service life based on the working environment data and historical failure data of the target circuit board component; A life correction module, used to correct the expected service life by using the environmental impact factor and / or the common mode failure factor to obtain a corrected service life of the target circuit board component; The life evaluation module is used to evaluate the service life of the nuclear power instrumentation and control equipment based on the corrected service life and the electrical component parameters of the target circuit board component.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the service life assessment method of nuclear power instrumentation and control equipment as described in any one of claims 1 to 7 is implemented.

10. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the service life assessment method for nuclear power instrumentation and control equipment according to any one of claims 1 to 7 is implemented.

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