Impedance testing device and impedance testing method

Abstract

The invention provides an impedance testing device and an impedance testing method, and the device comprises a first tray which is provided with a resistor assembly; the second tray is detachably connected with the first tray, and the second tray is provided with a terminal; wherein the second tray is used for mounting a to-be-tested sample, and the terminal is used for connecting the sample and the resistor assembly respectively. According to the invention, the connection between the terminal and the resistor assembly is fixed, and the impedance test can be completed only by installing the samples to be tested to the second tray one by one and inserting the PINs into the terminal, so that the test efficiency can be improved, and the test time can be shortened.

Description

Technical Field

[0001] The present invention relates to the field of testing devices, and in particular to an impedance testing device and an impedance testing method. Background Art

[0002] High-frequency impedance testing is an important test method in the field of electronic engineering, which is used to measure the impedance characteristics of circuits or components at high frequencies. Impedance is one of the factors that hinder the flow of current in a circuit, and its size is related to parameters such as the frequency, resistance, capacitance, and inductance of the circuit. At high frequencies, the effects of capacitance and inductance in the circuit on current become more significant, so high-frequency impedance testing is of great significance for ensuring the stability and reliability of circuit performance. The basic principle of high-frequency impedance testing is to apply an AC signal of a certain frequency to the circuit or component to be tested, measure the relationship between its voltage and current, and thus obtain its impedance value.

[0003] However, in the related art, high-frequency impedance testing is mostly performed by connecting one by one, which will result in a long test time and low efficiency. Summary of the invention

[0004] The present invention is made to solve the above-mentioned technical problems, and its purpose is to provide an impedance testing device and an impedance testing method, which can reduce the testing time and improve the testing efficiency.

[0005] In a first aspect, the present invention discloses an impedance testing device, comprising: a first tray provided with a resistor assembly; a second tray detachably connected to the first tray, the second tray provided with terminals; wherein the second tray is used to mount a sample to be tested, and the terminals are used to respectively connect the sample and the resistor assembly.

[0006] Optionally, the second tray is provided with a sample holder.

[0007] Optionally, the resistor component is connected to the terminals via leads.

[0008] Optionally, the terminals are paired into multiple pairs.

[0009] Optionally, the second tray is located in an area surrounded by the plurality of resistor assemblies.

[0010] Optionally, the resistor assembly includes: a box body with an inner cavity; a box cover for sealing the cavity of the box body; a contact provided on the box body; and a resistor provided in the inner cavity of the box body, the resistor being connected to the terminal through the contact.

[0011] Optionally, the resistor assembly also includes an elastic member and a supporting member disposed in the inner cavity of the box body, the supporting member supports the resistor; the elastic member is elastically supported between the bottom of the box body and the supporting member so that the supporting member and the resistor, and the resistor and the box cover are in mutual contact; the resistor is connected to the terminal in sequence through the supporting member, the elastic member, and the contact.

[0012] Optionally, the resistor assembly includes a guide frame arranged in the inner cavity of the box body, the elastic member is arranged on the guide frame, and the bearing member is movably connected to the guide frame along the elastic supporting direction of the elastic member.

[0013] Optionally, a plurality of resistor components are provided, and the terminal is connected to one resistor component or to at least two resistor components connected in series.

[0014] In a second aspect, the present invention discloses an impedance testing method, which is performed using an impedance testing device, comprising:

[0015] mounting the second tray to the first tray;

[0016] Connect the resistor component to the terminals;

[0017] Performing a sample installation process includes: installing the sample to be tested on the second tray;

[0018] Performing an adjustment process includes: adjusting the resistance value of the resistor component, or adjusting the plugging position between the sample to be tested and the terminal;

[0019] Conduct impedance testing;

[0020] Check the test results, output them if they are correct, and return to the adjustment process if they are wrong;

[0021] Remove the sample to be tested and perform the sample installation process on the next sample to be tested until all samples to be tested are tested.

[0022] The beneficial effects of the present invention are as follows:

[0023] The impedance testing device of the present application includes: a first tray, provided with a resistor assembly; a second tray detachably connected to the first tray, the second tray being provided with terminals; wherein the second tray is used to mount a sample to be tested, and the terminals are used to respectively connect the sample and the resistor assembly.

[0024] In this application, the connection between the terminal and the resistor component has been fixed. The impedance test can be completed by simply installing the samples to be tested one by one on the second tray and plugging the PIN pins into the terminals. This can improve test efficiency and reduce test time. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above features and advantages of the present invention can be better understood after reading the detailed description of the embodiments of the present disclosure in conjunction with the following drawings. In the drawings, the components are not necessarily drawn to scale, and components with similar related properties or features may have the same or similar reference numerals.

[0026] Figure 1 It is a structural diagram of the impedance testing device of the present invention;

[0027] Figure 2 is another structural diagram of the impedance testing device of the present invention;

[0028] Figure 3 is another structural diagram of the impedance testing device of the present invention;

[0029] Figure 4 is a terminal layout diagram on the second tray of the present invention;

[0030] Figure 5 is another terminal layout diagram on the second tray of the present invention;

[0031] Figure 6 is a structural diagram of a resistor assembly of the present invention;

[0032] Figure 7 It is a test flow chart of the present invention.

[0033] Description of reference numerals:

[0034] 10-First Pallet,

[0035] 20-resistance components,

[0036] 21-box body, 22-contact, 23-resistance, 24-elastic member, 25-bearing member, 26-guide frame,

[0037] 30- Second tray,

[0038] 31-terminal,

[0039] 41-tray fixing part, 42-sample fixing part,

[0040] 50-lead. DETAILED DESCRIPTION

[0041] The present invention is further described below in conjunction with specific embodiments and drawings. More details are elaborated in the following description to facilitate a full understanding of the present invention. However, the present invention can obviously be implemented in a variety of other ways different from the description herein. Those skilled in the art can make similar generalizations and deductions based on actual application situations without violating the connotation of the present invention. Therefore, the protection scope of the present invention should not be limited by the content of this specific embodiment.

[0042] In the related art, high-frequency impedance testing is mostly done by connecting one by one. This connection method results in a long test time and low efficiency. Therefore, the technical solution of this application is generated. Figure 1 to Figure 7 To elaborate.

[0043] Figure 1 1 is a structural diagram of an impedance testing device of the present invention, wherein the impedance testing device comprises a first tray 10 , a resistor assembly 20 and a second tray 30 .

[0044] The first tray 10 and the second tray 30 are both disc-shaped structures. The resistor assembly 20 is arranged on the first tray 10. The second tray 30 is detachably connected to the first tray 10 through the tray fixing member 41. In the present application, the tray fixing member 41 is a tie bolt. Three tie bolts are arranged in a triangular position. Tightening the tie bolts can firmly tighten and fix the second tray 30 on the first tray 10. Removing the tie bolts can separate the second tray 30 from the first tray 10 so as to replace the second tray 30. Of course, the tray fixing member 41 can also be set as a fixing device such as a pressure claw or a suction cup, which will not be described in detail here.

[0045] The second tray 30 is used to install the sample to be tested. Specifically, the second tray 30 is provided with a terminal 31, which is made of metal material to achieve electrical conductivity. The PIN pins of the sample to be tested are plugged into the terminal 31; multiple terminals 31 are arranged in a ring shape around the center of the second tray 30, and can be paired into multiple pairs to be plugged into the multiple PIN pins of the sample to be tested one by one. At the same time, the terminals 31 are usually paired and electrically connected to the two ends of the resistor component 20 respectively, so that a conductive loop is formed between the PIN pins of the sample to be tested and the resistor component 20.

[0046] There will be a potential difference between the PIN pins of the sample to be tested. When the PIN pins actually come into contact with the human body, the sample to be tested will generate impedance, and the resistor component 20 is used to simulate the impedance of the human body. The conductive loop formed by the sample to be tested and the resistor component 20 facilitates impedance testing between the PIN pins of the sample to be tested.

[0047] In the present application, the connection between the terminal 31 and the resistor assembly 20 has been fixed, and the impedance test can be completed by simply installing the samples to be tested one by one to the second tray 30 and plugging the PIN pin into the terminal 31, which can improve the test efficiency and reduce the test time.

[0048] Optionally, at least one of the first tray 10 and the second tray 30 is an insulator, and the insulator can be made of insulating materials such as polyvinyl chloride (PVC), nylon (PA), polyimide (PI), liquid crystal polymer (LCP), polyether-ether-ketone (PEEK) to provide insulation protection and prevent abnormalities such as leakage and short circuit.

[0049] Optionally, the second tray 30 is provided with a detachable sample fixing part 42, the sample fixing part 42 is used to fix the sample to be tested, and the sample fixing part 42 can be set as a bolt, etc., and a plurality of terminals 31 are arranged around the sample fixing part 42. During installation, the sample fixing part 42 is first removed so that the sample to be tested can be loaded into the second tray 30, and then the sample fixing part 42 is loaded to fix the position of the sample to be tested and ensure close contact between the PIN corner of the sample to be tested and the terminal 31.

[0050] Optionally, the resistor assembly 20 is connected to the terminal 31 via a lead wire 50 , one end of the lead wire 50 is connected to the resistor assembly 20 , and the other end of the lead wire 50 can be quickly plugged in and out of the terminal 31 for easy assembly and disassembly.

[0051] Optionally, multiple resistor assemblies 20 may be provided, and the layout of the multiple resistor assemblies 20 in the first tray 10 is annular. The resistance values ​​of the multiple resistor assemblies 20 may be the same or different, so as to simulate the impedance of different positions of the human body, so as to perform a more comprehensive impedance test.

[0052] Optionally, the second tray 30 is located in an area surrounded by a plurality of resistor assemblies 20 to facilitate multiple groups of connections between the terminals 31 and the resistor assemblies 20 and control the wiring length.

[0053] Figure 2 This is another structural diagram of the impedance testing device of the present invention. The terminal 31 can be connected to a resistor component 20. If the impedance needs to be adjusted, multiple resistor components 20 can be connected in series first, and then the multiple resistor components 20 in series are connected to the terminal 31. The impedance can be adjusted by adjusting the number of resistor components 20 in series.

[0054] Figure 3 It is another structural diagram of the impedance testing device of the present invention. The resistor assembly 20 can be fixedly installed on the first tray 10, such as adhesively fixed, and the resistor assembly 20 can also be movably arranged on the first tray 10. For example, the side of the first tray 10 used for mounting the resistor assembly 20 is set as a suction cup surface, and the resistor assembly 20 can be placed in different suction cup adsorption positions to achieve the adsorption and fixation of the resistor assembly 20 after the position is adjusted; or the side of the first tray 10 used for mounting the resistor assembly 20 is set with a frosted surface, and the friction of the frosted surface is used to achieve the resistance of the resistor assembly 20 after the position is adjusted. Shake; or the side of the first tray 10 used for mounting the resistor assembly 20 is set with a smooth surface, so as to adjust the position of the resistor assembly 20 at will. In this way, for the case where some terminals 31 are arranged as special-shaped paths, the layout position of the resistor assembly 20 on the first tray 10 can be adjusted, such as adjusting some resistor assemblies 20 to be close to the second tray 30, and adjusting other resistor assemblies 20 to be away from the second tray 30, so as to prevent the leads 50 from crossing and overlapping when pulling the leads 50.

[0055] Figure 4 is a terminal layout diagram on the second tray of the present invention, and Figure 1 The layout of the terminals on the second tray is different in that: Figure 4 Specifically, the plurality of terminals 31 are arranged in a petal shape along the first path, and multiple petals are arranged around the center of the second tray 30. The first path is a path extending from the center of the second tray 30 and extending back to the center of the second tray 30. Figure 4 The petal-shaped terminal 31 layout of the second tray 30 is adapted to the sample to be tested with the same PIN pin layout.

[0056] Figure 5 is another terminal layout diagram on the second tray of the present invention, and Figure 1 The layout of the terminals on the second tray is different in that: Figure 5 The layout path of the plurality of terminals 31 is heart-shaped. Specifically, the plurality of terminals 31 are arranged along a second path, and the second path is a path extending from the center of the second tray 30 and extending back to the center of the second tray 30. Figure 5 The heart-shaped terminal 31 of the second tray 30 is arranged to be adapted to the sample to be tested having the same PIN pin arrangement.

[0057] It should be noted that the samples to be tested with different PIN pin layouts can be selectively installed on the first tray 10. Figure 1 The second tray 30 with the ring type terminal 31 arranged in the middle, Figure 4 The second tray 30 with the petal-shaped terminals 31 arranged in the middle, Figure 5 Any one of the second trays 30 with a center-type terminal 31 layout, or a second tray 30 with a terminal layout of other shapes, can be adapted to the sample to be tested.

[0058] Figure 6 The figure is a structural diagram of the resistor assembly of the present invention. The resistor assembly 20 includes: a box body 21, a box cover (not shown in the figure), a contact 22 and a resistor 23. The box body 21 is provided with an inner cavity; the box cover covers the cavity of the box body 21, and the box cover is movably connected to the box body 21, such as being hinged or detachably connected; the contact 22 is provided on the box body 21; the resistor 23 is provided in the inner cavity of the box body 21, and the resistor 23 is connected to the terminal 31 through the contact 22. In this way, the impedance to be tested can be adjusted by Figure 2 This can be achieved by changing the number of resistor components 20 connected in series, or by replacing resistors 23 with different resistance values ​​in the resistor component 20, so that the adjustment methods are more diverse.

[0059] Optionally, the resistor assembly 20 further includes an elastic member 24 and a bearing member 25 disposed in the inner cavity of the box body 21, wherein the bearing member 25 is configured as a metal spring, and the bearing member 25 carries the resistor 23. The elastic member 24 is configured as a spring and multiple elastic members 24 are provided, and multiple elastic members 24 are elastically supported between the bottom of the box body 21 and the bearing member 25, so that the bearing member 25 and the resistor 23, and the resistor 23 and the box cover are mutually abutted, thereby maintaining good contact between the bearing member 25 and the resistor 23.

[0060] The resistor 23, the carrier 25, the elastic member 24 and the contact 22 are all made of conductive materials such as metal. An electric wire is connected between the contact 22 and one of the elastic members 24, so that the resistor 23 can be connected to the terminal 31 through the carrier 25, the elastic member 24 and the contact 22 in sequence to test the impedance.

[0061] Optionally, at least one of the box body 21 and the box cover is an insulator, and the insulator can be made of insulating materials such as polyvinyl chloride (PVC), nylon (PA), polyimide (PI), liquid crystal polymer (LCP), polyether-ether-ketone (PEEK) to provide insulation protection and prevent abnormalities such as leakage and short circuit.

[0062] Optionally, when replacing the resistor 23, it is necessary to separate the current resistor 23 and the carrier 25, and then replace another resistor 23. During the replacement process, the elastic member 24 will be deformed and the carrier 25 will move. In order to prevent the carrier 25 from deviating from the predetermined path during its movement, causing the carrier 25 and the elastic member 24 to be stuck, skewed, and other abnormalities, thereby causing poor contact between the carrier 25 and the resistor 23, the resistor assembly 20 may also include a guide frame 26 disposed in the inner cavity of the box body 21. The elastic member 24 is disposed on the guide frame 26, and the carrier 25 is movably connected to the guide frame 26 along the elastic support direction of the elastic member 24. In this way, the guide frame 26 can guide the carrier 25 to constrain the movement of the carrier 25, thereby preventing the carrier 25 and the elastic member 24 from being stuck, skewed, and other abnormalities when replacing the resistor 23, thereby ensuring good contact between the carrier 25 and the resistor 23.

[0063] Figure 7 The test flow chart of the present invention is as follows:

[0064] The second tray 30 is mounted on the first tray 10 and fixed by the tray fixing member 41;

[0065] Connect the resistor assembly 20 to the terminal 31 via the lead wire 50;

[0066] The sample installation process includes: installing the sample to be tested on the second tray 30 so that the PIN pin of the sample to be tested is inserted into the terminal 31, and fixing the sample to be tested with the sample fixing member 42;

[0067] Performing an adjustment process includes: adjusting the resistance value of the resistor component 20, or adjusting the plugging position between the PIN pin of the sample to be tested and the terminal 31;

[0068] Conduct impedance testing;

[0069] Check the test results, output them if they are correct, and return to the adjustment process if they are wrong;

[0070] Remove the sample to be tested and perform the sample installation process on the next sample to be tested until all samples to be tested are tested.

[0071] Although the present invention is disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art may make possible changes and modifications without departing from the spirit and scope of the present invention. Therefore, any modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention without departing from the content of the technical solution of the present invention shall fall within the protection scope defined by the claims of the present invention.

Claims

1. An impedance testing device, characterized in that: include: A first tray (10) is provided with a resistor assembly (20); a second tray (30) detachably connected to the first tray (10), wherein the second tray (30) is provided with a terminal (31); in, The second tray (30) is used to mount a sample to be tested, and the terminals (31) are used to connect the sample and the resistor assembly (20) respectively.

2. The impedance testing device according to claim 1, characterized in that: The second tray (30) is provided with a sample fixing member (42).

3. The impedance testing device according to claim 1, characterized in that: The resistor component (20) is connected to the terminal (31) via a lead wire (50).

4. The impedance testing device according to claim 1, characterized in that: The terminals (31) are matched into a plurality of pairs.

5. The impedance testing device according to claim 4, characterized in that: The second tray (30) is located in an area surrounded by the plurality of resistor assemblies (20).

6. The impedance testing device according to claim 1, characterized in that: The resistor assembly (20) comprises: A box body (21) provided with an inner cavity; Sealing the cavity opening and the box cover of the box body (21); A contact (22) provided on the box body (21); A resistor (23) is arranged in the inner cavity of the box body (21), and the resistor (23) is connected to the terminal (31) through the contact (22).

7. The impedance testing device according to claim 6, characterized in that: The resistor assembly (20) further comprises an elastic member (24) and a bearing member (25) arranged in the inner cavity of the box body (21), wherein the bearing member (25) bears the resistor (23); The elastic member (24) is elastically supported between the bottom of the box body (21) and the carrier (25), so that the carrier (25) and the resistor (23), and the resistor (23) and the box cover are in contact with each other; The resistor (23) is connected to the terminal (31) in sequence through the carrier (25), the elastic member (24), and the contact (22).

8. The impedance testing device according to claim 7, characterized in that: The resistor assembly (20) comprises a guide frame (26) arranged in the inner cavity of the box body (21), the elastic member (24) is arranged on the guide frame (26), and the bearing member (25) is movably connected to the guide frame (26) along the elastic support direction of the elastic member (24).

9. The impedance testing device according to claim 1, characterized in that: A plurality of the resistor components (20) are provided, and the terminal (31) is connected to one of the resistor components (20) or to at least two of the resistor components (20) connected in series.

10. An impedance testing method, performed using the impedance testing device according to any one of claims 1 to 9, characterized in that: include: installing the second tray (30) to the first tray (10); Connecting the resistor component (20) to the terminal (31); Executing a sample installation process, including: installing the sample to be tested on the second tray (30); Performing an adjustment process includes: adjusting the resistance value of the resistor component (20), or adjusting the plugging position between the sample to be tested and the terminal (31); Conduct impedance testing; Check the test results, output them if they are correct, and return to the adjustment process if they are wrong; Remove the sample to be tested and perform the sample installation process on the next sample to be tested until all samples to be tested are tested.

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