System and method for detecting performance of FRD device

Abstract

A system and method for detecting performance of an FRD device. The system comprises an FRD electronic device module; a data acquisition module; a data processing module; an electric leakage detection module; a result output module; and the FRD electronic device module is electrically connected with the data acquisition module. The reverse recovery time of the FRD electronic device module is calculated through the calculation unit and is compared with a time threshold value, and the performance of the reverse recovery time of the FRD electronic device module is judged. Meanwhile, the voltage output unit is used for applying reverse voltage to the FRD electronic device module, the integration unit is used for obtaining the data value of the leakage current of the FRD electronic device module, the data value is compared with a standard current threshold value, and the advantages and disadvantages of the leakage current performance of the FRD electronic device module are judged. The performance of the FRD electronic device module product can be finally detected through double tests, and meanwhile, the performance defects of the FRD electronic device module with poor quality can be accurately positioned, so that the subsequent secondary processing of the FRD electronic device module is facilitated, and the recovery cost of the product is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of FRD device performance detection, and in particular to a system and method for detecting FRD device performance. Background Art

[0002] With the development of power semiconductor technology, the capacity and voltage level of high-power converters in industrial applications are gradually increasing. For example, modular multilevel converters and wind power converters used in DC transmission have put forward higher requirements for operational reliability. The reliability of hundreds or even thousands of insulated gate bipolar transistor modules is the cornerstone of the safe operation of power converters. The damage of any device unit will affect the safe and continuous operation of the power converter system, thereby causing immeasurable economic losses. The existing high-power converters have a long maintenance cycle and cannot be shut down for offline monitoring like inverters and electric vehicles. Therefore, potential problems cannot be discovered in real time, so online monitoring technology is needed to evaluate the status of the module in real time. Online monitoring technology can monitor the operating characteristics of the physical system during its operation and judge its health status. The changes in the monitored quantity can be used to determine whether to arrange maintenance before the system failure occurs. Online monitoring requires understanding the failure mechanism of a single component or the entire system, and integrating sensing technology, data acquisition and analysis, and knowledge of the ability to estimate the health status of the system. On this basis, combined with the life model, life prediction and active life management can be performed, ultimately achieving effective evaluation of system reliability and improvement of overall life.

[0003] The development of FRD is basically the same as that of IGBT, and has roughly evolved from PT structure to NPT structure and then to FS structure. Currently, the widely used carrier lifetime control technologies include particle irradiation and heavy metal diffusion. Among them, particle irradiation includes electron irradiation; hydrogen ion irradiation; helium ion irradiation, etc., and heavy metal diffusion includes metal diffusion such as gold and platinum. At present, the carrier lifetime control method has been widely used in the field of semiconductor device preparation.

[0004] At present, FRD devices are mainly used in electronic circuits such as switching power supplies, PWM pulse width modulators, and frequency converters. Among them, the reverse recovery time and leakage current of FRD devices are important factors affecting the quality of FRD devices, which greatly affect the shutdown efficiency of the circuit. However, it is difficult to accurately and efficiently detect the quality of FRD devices with the existing technology. Therefore, the present invention proposes a system and method for detecting the performance of FRD devices. Summary of the invention

[0005] The embodiments of the present invention provide a system and method for detecting the performance of an FRD device, which can detect the quality of the performance of the FRD device accordingly and accurately and efficiently detect problems existing in the FRD device.

[0006] In view of the above problems, the technical solution proposed by the present invention is:

[0007] A system and method for detecting the performance of an FRD device, comprising an FRD electronic device module; a data acquisition module; a data processing module; a leakage detection module; and a result output module;

[0008] The FRD electronic device module is electrically connected to the data acquisition module;

[0009] The data acquisition module is used to collect electrical parameters of the FRD electronic device module, wherein the electrical parameters include an operating voltage U and an output current I of the FRD electronic device module;

[0010] The data processing module is used to pre-process the collected electrical parameters, and the data processing module includes a data extraction unit; a data calculation unit and a comparison output unit;

[0011] The leakage detection module is used to detect the leakage current IR of the FRD electronic device module, and the leakage detection module includes a voltage output unit, an environment optimization unit and a data integration unit;

[0012] The result output module outputs corresponding display results based on data analysis and comparison.

[0013] Furthermore, the data acquisition module includes a pulse generator; an oscilloscope; a voltage sensor and a current sensor;

[0014] The pulse generator is preset with the required visual pulse amplitude, frequency and width in advance;

[0015] The oscilloscope is used to measure and analyze electrical signals and convert the acquired electrical signals into pulse waveform curve images;

[0016] The voltage sensor controls the circuit output voltage within a preset range;

[0017] The current sensor is used to obtain the value of the current I output by the circuit.

[0018] Furthermore, the pulse generator includes a control unit; a difference elimination unit; a correction unit;

[0019] The control unit is provided with standard pulse parameters for data comparison;

[0020] The difference elimination unit compares the acquired pulse signal with the standard pulse parameter, removes the deviation pulse signal, and marks the normal pulse signal;

[0021] The correction unit adjusts and corrects the pulse generator so that the difference between the acquired pulse signal and the standard pulse signal is within 0.1-1 nA.

[0022] Furthermore, the oscilloscope includes a sampling unit; a filtering unit; an interpolation unit and an image integration unit;

[0023] The sampling unit stores the received signal through a memory, and restores the stored signal to a connected analog signal through a digital-to-analog converter;

[0024] The filtering unit removes noise and distortion introduced during the sampling process;

[0025] The interpolation unit is used to estimate the signal values ​​between adjacent sampling points and digitally mark the signal values ​​in sequence;

[0026] The image integration unit connects the marked signal values ​​in order from small to large to restore them into a continuous pulse waveform curve.

[0027] Further, the data extraction unit is used to extract the data value on the pulse waveform curve restored by the image integration unit;

[0028] The data calculation unit calculates the reverse recovery time trr of the FRD electronic device module according to the extracted data value;

[0029] The comparison output unit is provided with a time threshold, and compares the reverse recovery time trr with a preset threshold, and outputs a corresponding disposal strategy according to the comparison result.

[0030] Further, the voltage output unit is electrically connected to the FRD electronic device module and applies a reverse voltage to the FRD electronic device module;

[0031] The environmental optimization unit is used to remove the influencing parameters of the external environment, which include environmental humidity, temperature, dust and other gases;

[0032] The data integration unit acquires leakage current data values ​​and removes abnormal data values.

[0033] Furthermore, the environment optimization unit includes a humidity control unit; a temperature control unit; a dust removal unit and a vacuum unit;

[0034] The humidity control unit includes a humidity sensor, which is used to monitor the humidity value in the detection environment, and the humidity control unit is used to control the humidity of the detection environment within a standard range;

[0035] The temperature control unit includes a temperature sensor, which is used to monitor the temperature value in the detection environment, and the temperature control unit is used to control the temperature of the detection environment within a standard range;

[0036] The dust removal unit removes dust in the detection environment;

[0037] The vacuum unit draws the detection environment into a vacuum state.

[0038] Furthermore, a standard current threshold is provided in the result output module, and the current data value acquired by the data integration unit is compared with the standard current threshold, and a conclusion is outputted according to the comparison result.

[0039] In another aspect, a method for detecting the performance of an FRD device comprises the following steps:

[0040] S; connecting the FRD electronic device module to the pulse generator and the oscilloscope, and obtaining a pulse waveform curve;

[0041] S; calculating the reverse recovery time value of the FRD electronic device module according to the acquired pulse waveform curve;

[0042] S; compare the calculated reverse recovery time value with the preset time threshold. If it is greater than the preset time threshold, it is output as a low-quality product. If it is less than the preset time threshold, it enters the next step;

[0043] S; applying an external voltage at the PN junction of the FRD electronic device module and measuring the leakage current value;

[0044] S; compare the measured leakage current value with the standard current threshold. If it is greater than the standard current threshold, it is output as a low-quality product. If it is less than the standard current threshold, it is output as a high-quality product.

[0045] The beneficial effects of the above technical solution provided by the embodiment of the present invention include at least:

[0046] The present invention calculates the reverse recovery time of the FRD electronic device module through a calculation unit and compares it with a time threshold to determine the quality of the reverse recovery time performance of the FRD electronic device module. At the same time, a voltage output unit is used to apply a reverse voltage to the FRD electronic device module and an integration unit is used to obtain a data value of a leakage current of the FRD electronic device module and compare it with a standard current threshold to determine the quality of the leakage current performance of the FRD electronic device module. The double test can ultimately detect the quality of the product performance of the FRD electronic device module and accurately locate the performance defects of the FRD electronic device module of inferior products, which is beneficial to the subsequent secondary processing of the FRD electronic device module, thereby reducing the recycling cost of the product.

[0047] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description; claims; and drawings.

[0048] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0050] Figure 1 A block diagram of a system for detecting the performance of an FRD device disclosed in an embodiment of the present invention;

[0051] Figure 2 A communication block diagram of a pulse generator disclosed in an embodiment of the present invention;

[0052] Figure 3 A communication block diagram of an oscilloscope disclosed in an embodiment of the present invention;

[0053] Figure 4 A communication block diagram of an environment optimization unit disclosed in an embodiment of the present invention;

[0054] Figure 5 The present invention is a flowchart of a method for detecting the performance of an FRD device disclosed in an embodiment of the present invention.

[0055] Figure numerals: 10, FRD electronic device module; 20, data acquisition module; 201, pulse generator; 202, oscilloscope; 203, voltage sensor; 204, current sensor; 2011, control unit; 2012, difference removal unit; 2013, correction unit; 2021, sampling unit; 2022, filtering unit; 2023, interpolation unit; 2024, image integration unit; 30, data processing module; 301, data extraction unit; 302, data calculation unit; 303, comparison output unit; 40, leakage detection module; 401, voltage output unit; 402, environment optimization unit; 403, data integration unit; 4021, humidity control unit; 4022, temperature control unit; 4023, dust removal unit; 4024, vacuum unit; 50, result output module. DETAILED DESCRIPTION

[0056] In order to make the purpose, technical scheme and advantages of the embodiments of the present invention clearer, the technical scheme in the embodiments of the present invention will be described clearly and completely in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0057] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0058] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0059] In the description of the present invention, it is to be understood that terms such as “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, and “counterclockwise” indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation; be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0060] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0061] Embodiment 1

[0062] Refer to the attached Figure 1-4 As shown, the present invention provides a technical solution: a system for detecting the performance of an FRD device, comprising an FRD electronic device module 10; a data acquisition module 20; a data processing module 30; a leakage detection module 40; and a result output module 50;

[0063] The FRD electronic device module 10 is electrically connected to the data acquisition module 20;

[0064] The data acquisition module 20 is used to collect electrical parameters of the FRD electronic device module 10 , and the electrical parameters include the operating voltage U and the output current I of the FRD electronic device module 10 ;

[0065] The data processing module 30 is used to pre-process the collected electrical parameters, and the data processing module 30 includes a data extraction unit 301; a data calculation unit 302 and a comparison output unit 303;

[0066] The leakage detection module 40 is used to detect the leakage current IR of the FRD electronic device module 10. The leakage detection module 40 includes a voltage output unit 401, an environment optimization unit 402 and a data integration unit 403.

[0067] The result output module 50 outputs corresponding display results according to data analysis and comparison.

[0068] Refer to the attached Figure 1 As shown, the data acquisition module 20 includes a pulse generator 201; an oscilloscope 202; a voltage sensor 203 and a current sensor 204;

[0069] The current sensor 204 is used to obtain the value of the current I output by the circuit.

[0070] In order to measure the reverse recovery time of the FRD electronic device module 10, the specific steps are as follows:

[0071] First, the forward end of the FRD electronic device module 10 is connected to the output end of the pulse generator 201, and two probes of the oscilloscope 202 are connected to the forward end and the reverse end of the FRD electronic device module 10 respectively;

[0072] Secondly, the pulse generator 201 is preset with the required visual pulse amplitude, frequency and width in advance;

[0073] Next, by triggering the pulse generator 201, a sudden voltage pulse is generated to make the FRD electronic device module 10 quickly change from the reverse cut-off state to the normal conduction state. In this process, the voltage sensor 203 controls the circuit output voltage within a preset range while continuously changing the voltage, and measures the reverse recovery time value of the FRD electronic device module 10 under different voltages. At the same time, the current sensor 204 is used to obtain the current I value of the circuit output. The oscilloscope 202 analyzes and measures the electrical signal, and records and displays the process of the reverse voltage change of the FRD electronic device module 10, and converts the acquired electrical signal into a pulse waveform curve image;

[0074] It should be noted that when the pulse generator 201 obtains the pulse signal,

[0075] Finally, the reverse recovery time value is measured and calculated according to the pulse waveform curve displayed by the oscilloscope 202 .

[0076] Refer to the attached Figure 2 As shown, the pulse generator 201 includes a control unit 2011; a difference elimination unit 2012; a correction unit 2013;

[0077] In the process of using the pulse generator 201 to obtain the pulse signal and converting the electrical signal into a pulse waveform curve image, the following processing is performed:

[0078] First, the reference unit 2011 is used to set the standard pulse parameters for subsequent data comparison.

[0079] Secondly, the difference removing unit 2012 compares the acquired pulse signal with the standard pulse parameter, removes the deviation pulse signal, and marks the normal pulse signal, which is beneficial to improve the efficiency of subsequent image generation;

[0080] At the same time, the correction unit 2013 is used to adjust and correct the pulse generator 201 so that the difference between the acquired pulse signal and the standard pulse signal is 0.1 to 1 nA. The correction unit 2013 compares the acquired pulse signal with the standard pulse signal to reduce the deviation value and improve the detection accuracy.

[0081] Refer to the attached Figure 3 As shown, the oscilloscope 202 includes a sampling unit 2021; a filtering unit 2022; an interpolation unit 2023 and an image integration unit 2024;

[0082] After data collection is completed, the following processing is performed:

[0083] First, the received signal is stored in a memory using the sampling unit 2021, and the stored signal is restored to a connected analog signal through a digital-to-analog converter;

[0084] Secondly, the filter unit 2022 is used to remove the noise and distortion introduced during the sampling process;

[0085] Next, the interpolation unit 2023 is used to estimate the signal values ​​between adjacent sampling points, and the signal values ​​are digitally marked in sequence;

[0086] Finally, the image integration unit 2024 connects the marked signal values ​​in order from small to large to restore them into a continuous pulse waveform curve.

[0087] Refer to the attached Figure 1 As shown, the data extraction unit 301 is used to extract the data value on the pulse waveform curve restored by the image integration unit 2024;

[0088] After the oscilloscope 202 acquires the pulse waveform curve, the following processing is performed:

[0089] First, the reverse recovery time trr of the FRD electronic device module 10 is calculated according to the extracted data value by the data calculation unit 302;

[0090] Then, the reverse recovery time trr is compared with the time threshold set by the comparison output unit 303;

[0091] Finally, the corresponding disposal strategy is output according to the comparison result. If the reverse recovery time trr is greater than the set time threshold, it is output as a low-quality product. If the reverse recovery time trr is less than the preset time threshold, it is output to enter the next stage.

[0092] The products entering the next stage are processed as follows:

[0093] First, the voltage output unit 401 is electrically connected to the FRD electronic device module 10, and a reverse voltage is applied to the FRD electronic device module 10;

[0094] At the same time, the environment optimization unit 402 is used to remove the influencing parameters of the external environment, which include environmental humidity, temperature, dust and other gases;

[0095] Secondly, the data integration unit 403 is used to obtain the leakage current data value and eliminate the abnormal data value.

[0096] Refer to the attached Figure 5 As shown, the environment optimization unit 402 includes a humidity control unit 4021; a temperature control unit 4022; a dust removal unit 4023 and a vacuum unit 4024;

[0097] The processing of the influencing parameters of the external environment by the environment optimization unit 402 is as follows:

[0098] Furthermore, the humidity control unit 4021 includes a humidity sensor, which is used to monitor the humidity value in the detection environment, and the humidity control unit 4021 is used to control the humidity of the detection environment within a standard range to prevent excessive humidity in the external environment from affecting the measurement of the leakage current of the FRD electronic device module 10;

[0099] Furthermore, the temperature control unit 4022 includes a temperature sensor, which is used to monitor the temperature value in the detection environment, and the temperature control unit 4022 is used to control the temperature of the detection environment within a standard range. When the FRD electronic device module 10 is reverse biased, the leakage current is mainly generated by minority carrier drift. The increase in temperature will increase the thermal motion of the semiconductor, so that more valence electrons obtain sufficient energy to transition to the conduction band and become free electrons. At the same time, the number of holes will also increase accordingly. These increased electrons are more likely to form leakage current under the action of the reverse bias electric field. Therefore, in order to ensure the accuracy of the detection, the temperature needs to be set within the standard range;

[0100] Furthermore, since impurity ions in the dust may adhere to the surface of the FRD electronic device module 10 and affect its electrical properties, thereby causing an increase in leakage current, the dust removal unit 4023 is used to remove dust in the detection environment to improve the accuracy of the detection;

[0101] Furthermore, the FRD electronic device module 10 can maintain its electrical characteristics in a vacuum environment, and the detection environment is evacuated into a vacuum state by the vacuum unit 4024, which can effectively improve the accuracy of the leakage current detection of the FRD electronic device module 10.

[0102] After the data integration unit 403 obtains the current data value of the product entering the next link, it compares its current data value with the standard current threshold set in the result output module 50, and outputs a conclusion based on the comparison result. If the obtained current data value is greater than the standard current threshold, it is output as a substandard product. If the obtained current data value is less than the standard current threshold, it is output as a high-quality product.

[0103] The products with too long reverse recovery time of the detected FRD electronic device module 10 are marked as inferior products, and the products with too large leakage current of the detected FRD electronic device module 10 are marked as sub-inferior products, while the products with short reverse recovery time and small leakage current are output as high-quality products. On the one hand, the quality of the products can be tested, and on the other hand, the defects of unqualified products can be clearly located, which is convenient for subsequent secondary processing and reduces the recycling cost of the FRD electronic device module 10.

[0104] Embodiment 2

[0105] Refer to the attached Figure 5 As shown, an embodiment of the present invention further provides a method for detecting the performance of an FRD device, comprising the following steps:

[0106] S1; connecting the FRD electronic device module 10 to the pulse generator 201 and the oscilloscope 202, and obtaining a pulse waveform curve;

[0107] S2; calculating the reverse recovery time value of the FRD electronic device module 10 according to the acquired pulse waveform curve;

[0108] S3: Compare the calculated reverse recovery time value with the preset time threshold. If it is greater than the preset time threshold, it is output as a low-quality product. If it is less than the preset time threshold, it proceeds to the next step.

[0109] S4; applying an external voltage to the PN junction of the FRD electronic device module 10 and measuring the leakage current value;

[0110] S5: Compare the measured leakage current value with the standard current threshold value. If it is greater than the standard current threshold value, it is output as a low-quality product. If it is less than the standard current threshold value, it is output as a high-quality product.

[0111] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may be subject to various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

[0112] It should be understood that the specific order or hierarchy of steps in the disclosed process is an example of an exemplary method. Based on design preferences, it should be understood that the specific order or hierarchy of steps in the process can be rearranged without departing from the scope of protection of the present disclosure. The attached method claims present the elements of the various steps in an exemplary order and are not intended to be limited to a specific order or hierarchy.

[0113] Those skilled in the art should also understand that the various illustrative logic boxes, modules, circuits and algorithm steps described in conjunction with the embodiments of this article can be implemented as electronic hardware, computer software or a combination thereof. In order to clearly illustrate the interchangeability between hardware and software, the various illustrative components, boxes, modules, circuits and steps are generally described above around their functions. Whether such functions are implemented as hardware or software depends on the specific application and the design constraints imposed on the entire system. A skilled technician can implement the described functions in a flexible manner for each specific application, but such implementation decisions should not be interpreted as departing from the scope of protection of this disclosure.

[0114] The steps of the method or algorithm described in conjunction with the embodiments of this document may be directly embodied as hardware; a software module executed by a processor, or a combination thereof. The software module may be located in a RAM memory; a flash memory; a ROM memory; an EPROM memory; an EEPROM memory; a register; a hard disk; a removable disk; a CD-ROM or any other form of storage medium known in the art. An exemplary storage medium is connected to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium may also be an integral part of the processor. The processor and the storage medium may be located in an ASIC. The ASIC may be located in a user terminal. Of course, the processor and the storage medium may also be present in a user terminal as discrete components.

[0115] For software implementation, the techniques described in this application can be implemented with modules (e.g., procedures; functions, etc.) that perform the functions described in this application. These software codes can be stored in a memory unit and executed by a processor. The memory unit can be implemented within the processor or outside the processor. In the latter case, it is coupled to the processor in a communication manner via various means, which are well known in the art.

[0116] The above description includes examples of one or more embodiments. Of course, it is not possible to describe all possible combinations of components or methods for the purpose of describing the above embodiments, but it should be recognized by those skilled in the art that the various embodiments may be further combined and arranged. Therefore, the embodiments described herein are intended to cover all such changes, modifications and variations that fall within the scope of protection of the appended claims. In addition, with respect to the term "comprising" used in the specification or claims, the word is encompassed in a manner similar to the term "including", as explained by "including," used as a transitional word in the claims. In addition, any term "or" used in the specification of the claims is intended to mean "non-exclusive or".

Claims

1. A system for detecting the performance of an FRD device, characterized in that: It comprises an FRD electronic device module (10); a data acquisition module (20); a data processing module (30); a leakage detection module (40); and a result output module (50); The FRD electronic device module (10) is electrically connected to the data acquisition module (20); The data acquisition module (20) is used to acquire electrical parameters of the FRD electronic device module (10), wherein the electrical parameters include an operating voltage U and an output current I of the FRD electronic device module (10); The data processing module (30) is used to pre-process the collected electrical parameters, and the data processing module (30) comprises a data extraction unit (301); a data calculation unit (302) and a comparison output unit (303); The leakage detection module (40) is used to detect the leakage current IR of the FRD electronic device module (10), and the leakage detection module (40) comprises a voltage output unit (401); an environment optimization unit (402) and a data integration unit (403); The result output module (50) outputs corresponding display results based on data analysis and comparison.

2. A system for detecting FRD device performance according to claim 1, characterized in that: The data acquisition module (20) comprises a pulse generator (201); an oscilloscope (202); a voltage sensor (203) and a current sensor (204); The pulse generator (201) is preset with the required visual pulse amplitude; frequency and width; The oscilloscope (202) is used to measure and analyze electrical signals, and convert the acquired electrical signals into pulse waveform curve images; The voltage sensor (203) controls the circuit output voltage within a preset range; The current sensor (204) is used to obtain the value of the current I output by the circuit.

3. A system for detecting FRD device performance as claimed in claim 2, characterized in that: The pulse generator (201) comprises a control unit (2011); a difference elimination unit (2012); and a correction unit (2013); The control unit (2011) is provided with standard pulse parameters for data comparison; The difference elimination unit (2012) compares the acquired pulse signal with the standard pulse parameter, removes the deviation pulse signal, and marks the normal pulse signal; The correction unit (2013) adjusts and corrects the pulse generator (201) so that the difference between the acquired pulse signal and the standard pulse signal is within the range of 0.1 to 10 nA.

4. A system for detecting the performance of an FRD device as claimed in claim 2, characterized in that: The oscilloscope (202) comprises a sampling unit (2021); a filtering unit (2022); an interpolation unit (2023) and an image integration unit (2024); The sampling unit (221) stores the received signal through a memory, and restores the stored signal to a connected analog signal through a digital-to-analog converter; The filtering unit (2022) removes noise and distortion introduced during the sampling process; The interpolation unit (2023) is used to estimate the signal values ​​between adjacent sampling points and digitally mark the signal values ​​in sequence; The image integration unit (2024) connects the marked signal values ​​in order from small to large to restore them into a continuous pulse waveform curve.

5. A system for detecting the performance of an FRD device as claimed in claim 4, characterized in that: The data extraction unit (301) is used to extract the data value on the pulse waveform curve restored by the image integration unit (2024); The data calculation unit (302) calculates the reverse recovery time trr of the FRD electronic device module (10) according to the extracted data value; The comparison output unit (303) is provided with a time threshold, and compares the reverse recovery time trr with a preset threshold, and outputs a corresponding treatment strategy according to the comparison result.

6. A system for detecting FRD device performance as claimed in claim 1, characterized in that: The voltage output unit (401) is electrically connected to the FRD electronic device module (10) and applies a reverse voltage to the FRD electronic device module (10); The environment optimization unit (402) is used to remove the influencing parameters of the external environment, which include environmental humidity, temperature, dust and other gases; The data integration unit (403) acquires leakage current data values ​​and removes abnormal data values.

7. A system for detecting the performance of an FRD device as claimed in claim 6, characterized in that: The environment optimization unit (402) includes a humidity control unit (4021); a temperature control unit (4022); a dust removal unit (4023) and a vacuum unit (4024); The humidity control unit (4021) comprises a humidity sensor, which is used to monitor the humidity value in the detection environment, and the humidity of the detection environment is controlled within a standard range by using the humidity control unit (4021); The temperature control unit (4022) comprises a temperature sensor, which is used to monitor the temperature value in the detection environment, and the temperature of the detection environment is controlled within a standard range by using the temperature control unit (4022); The dust removal unit (4023) removes dust in the detection environment; The vacuum unit (4024) evacuates the detection environment into a vacuum state.

8. A system for detecting the performance of an FRD device as claimed in claim 6, characterized in that: The result output module (50) is provided with a standard current threshold value, compares the current data value acquired by the data integration unit (403) with the standard current threshold value, and outputs a conclusion based on the comparison result.

9. The method for detecting the performance of an FRD device according to claim 1, applied to a system for detecting the performance of an FRD device according to any one of claims 1 to 8, characterized in that: The following steps are involved: S1: connecting the FRD electronic device module (10) to the pulse generator (201) and the oscilloscope (202), and obtaining a pulse waveform curve; S2: Calculating the reverse recovery time value of the FRD electronic device module (10) according to the acquired pulse waveform curve; S3: Compare the calculated reverse recovery time value with the preset time threshold. If it is greater than the preset time threshold, it is output as a low-quality product. If it is less than the preset time threshold, it proceeds to the next step. S4; applying an external voltage to the PN junction of the FRD electronic device module (10) and measuring the leakage current value; S5: Compare the measured leakage current value with the standard current threshold value. If it is greater than the standard current threshold value, it is output as a low-quality product. If it is less than the standard current threshold value, it is output as a high-quality product.

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