Precise fine-tuning chip test seat
By introducing a fine-tuned positioning system into the chip test base, the problem of difficulty in achieving accurate alignment of multi-pin chips in the prior art is solved, and high-precision chip testing is achieved, which is suitable for general factory production.
Patent Information
- Application Number
- CN202510232065.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-28
- Publication Date
- 2025-05-13
AI Technical Summary
When facing chips with multiple pins and small spacing, it is difficult to achieve accurate probe alignment with pads, resulting in insufficient processing accuracy, exceeding the limits of many processing companies.
A precision fine-tuning chip test seat is designed, and by introducing a fine-tuning positioning system into the test seat, including movable fixing screws, deformation sleeves and adjustment screws, the relative position of the probe plate and pin pads can be fine-tuned at the micron level.
It realizes precise fine-tuning of chip pin pads, meets the high-precision chip testing needs, and allows ordinary factories to produce economical and reliable precise positioning test seats.
Smart Images
Figure CN119986330A_ABST
Abstract
Description
(I) Technical field
[0001] The invention relates to the technical field of chip testing, and in particular to a precision fine-tuning chip testing seat. (II) Background technology
[0002] The development direction of mainstream chips nowadays is more and more pins, smaller chip area, and smaller pin spacing. Mobile phone chips generally use 0.35mm pin spacing chips, and even 0.2mm pin spacing chips are used. It is becoming more and more difficult to align the pin probes in the chip test socket with the chip pin pads, and the processing accuracy requirements of the chip test socket are getting higher and higher. It has exceeded the limits of many processing companies.
[0003] Therefore, it is necessary to develop a precision fine-tuning chip test socket that can meet the processing accuracy within the limit range of general processing companies and can achieve the purpose of precise matching with the chip pin pads by fine-tuning the pin probe position. (III) Summary of the invention
[0004] The purpose of the present invention is to develop a precision fine-tuning chip test socket so that the positioning hole of the test socket can be reliably fine-tuned at the micron level, thereby achieving the purpose of the test socket probe accurately locating the chip pad of the circuit board.
[0005] To achieve the above-mentioned purpose, the precision fine-tuning chip test seat proposed in the present invention includes: a base, a circuit board, a positioning plate, an upper cover, a chip; a probe board, a probe, a bottom frame, a fixing screw 1, a deformation sleeve, a positioning pin, an adjustment screw 1, an adjustment screw 2, an adjustment screw 3, a fixing screw 2, a pin pad, and a knob. The base is fixedly connected to the positioning plate below, and the positioning plate is positioned and connected to the circuit board, and the circuit board has a chip pin pad. The chip to be tested is fixed in the base by the upper cover and elastically contacts with the probe on the probe board. The base, the circuit board and the positioning plate are positioned by the positioning pins and fixed by the fixing screws 1 and the fixing screws 2. When the fixing screws are not tightened, the two fixing screws can move in the fixing holes; the deformation sleeve is an elastic material and can be slightly deformed; the adjustment screw 2 is perpendicular to the horizontal surface of the base, and the adjustment screw 1 has a certain angle with the adjustment screw 2; the adjustment screw 3 also has a certain angle with the adjustment screw 2. The position of the positioning pin is adjusted by adjusting the screws 1, 2 and 3, so as to adjust the relative position of the probe board and the pin pad. When adjusting screw 2 is upward, the positioning hole moves upward, and adjusting screw 2 is downward; when adjusting screw 1 and adjusting screw 3 are upward, the positioning hole moves downward; when adjusting screw 1 is upward, the positioning hole moves to the left; when adjusting screw 3 is upward, the positioning hole moves to the right.
[0006] Compared with the prior art, the beneficial effects of the present invention are: an economical, reliable, and precisely positioned test socket that can be produced by a general factory and can test today's mainstream chips. (IV) Description of the drawings
[0007] The specific structure of the present invention is given by the following embodiments and the accompanying drawings:
[0008] Attached Figure 1 It is an isometric view of the precision fine-tuning chip test seat of the present invention with the upper cover opened.
[0009] Attached Figure 2 It is an isometric view of the working state of the precision fine-tuning chip test socket of the present invention.
[0010] Attached Figure 3 It is a top view of the precision fine-tuning chip test socket of the present invention.
[0011] Attached Figure 4 It is a cross-sectional view of the AA section of the precision fine-tuning chip test socket of the present invention.
[0012] Attached Figure 5 It is a cross-sectional view of the precision fine-tuning chip test seat BB of the present invention.
[0013] Attached Figure 6 It is a cross-sectional view of the precision fine-tuning chip test seat CC of the present invention.
[0014] Wherein: (1) base, (2) circuit board, (3) positioning plate, (4) upper cover, (5) chip; (10) probe board, (11) probe, (12) bottom frame, (13) fixing screw 1, (14) deformation sleeve, (15) positioning pin, (16) adjustment screw 1, (17) adjustment screw 2, (18) adjustment screw 3, (19) fixing screw 2, (20) fixing hole, (21) pin pad, (41) knob. (V) Specific implementation methods
[0015] Refer to the attached Figure 1 To Attachment Figure 5 The base (1) is fixedly connected to a positioning plate (3) below, the positioning plate (3) is positioned and connected to a circuit board (2), and the circuit board (2) is provided with a pin pad (21). The chip to be tested (5) is fixed in the bottom frame (12) by an upper cover (4) and is in elastic contact with a probe (11) on a probe board (10).
[0016] Refer to the attached Figure 6 :The base (1) and the circuit board (2) and the positioning plate (3) are positioned by the positioning pin (15) and fixed by the fixing screw 1 (13) and the fixing screw 2 (19). When the fixing screw is not tightened, the two fixing screws can move in the fixing hole (20); the deformation sleeve (14) is made of elastic material and can be slightly deformed; the adjustment screw 2 (17) is perpendicular to the horizontal surface of the base, and the adjustment screw 1 (16) and the adjustment screw 2 (17) have a certain angle, which is 10 degrees in this example; the adjustment screw 3 (18) and the adjustment screw 2 (17) also have a certain angle, which is also 10 degrees in this example.
[0017] According to the attached Figure 1 , Attachment Figure 2 As shown, after all the components of the test socket are installed, the chip pin pads of the circuit board (3) are affixed with deformable film and fixed on the positioning plate (4). Then, the following operations are performed:
[0018] 1. Stick a film of the same size as the chip (5) on the pin pad (21), fix the circuit board (2) on the base (1), close the upper cover (4), twist the knob (41), and press the probe plate (10) into the film to leave an imprint.
[0019] 2. Remove the circuit board (2), observe the deviation between the stamping and the pin pad (21), and adjust the position of the positioning pin (14) by adjusting screws 1 (16), 2 (17), and 3 (18), thereby adjusting the relative position of the probe board (10) and the pin pad (21). Remove the patch adhesive.
[0020] 3. Return to step 1 until the deviations of the stamp and the pin pad (21) are precisely matched.
[0021] 4. Insert the chip (5) and test the chip (5).
[0022] The details of step 2 are as follows: Figure 6 When the deviation between the stamping and the pin pad (21) requires the positioning pin (15) to move slightly upward, the adjustment screw 2 (17) is twisted upward to compress the deformation sleeve (14) and drive the positioning pin (15) upward;
[0023] When the deviation between the stamping and the pin pad (21) requires the positioning pin (15) to move slightly downward, the adjusting screw 2 (17) is turned downward, and the deformation sleeve (14) has space to deform downward. At the same time, the adjusting screw 1 (16) and the adjusting screw 3 (18) are turned inward to compress the deformation sleeve (14) from the left and right sides, so that the deformation sleeve (14) moves downward, driving the positioning pin (15) downward;
[0024] When the deviation between the stamping and the pin pad (21) requires the positioning pin (15) to move slightly to the left, the adjustment screw 1 (16) is twisted upward to compress the deformation sleeve (14) so that the positioning pin (15) moves to the left;
[0025] When the deviation between the stamping and the pin pad (21) requires the positioning pin (15) to move slightly to the right, the adjustment screw 3 (18) is twisted upward to compress the deformation sleeve (14) so that the positioning pin (15) moves to the right.
[0026] The present invention has the following characteristics: the probe board can move slightly in the horizontal and vertical directions, and can rotate slightly in the plane, so as to accurately position the test seat. The purpose of accurate adjustment can be achieved by using 6 screws and a deformation sleeve without increasing the cost of the test seat. The economical and reliable accurate positioning test seat enables general factories to produce test seats for testing current mainstream chips.
Claims
1. A precision fine-tuning chip test socket, characterized by precision The fine-tuning chip test sockets include: Base (1), circuit board (2), positioning plate (3), upper cover (4), chip (5); probe plate (10), probe (11), bottom frame (12), fixing screw 1 (13), deformation sleeve (14), positioning pin (15), adjustment screw 1 (16), adjustment screw 2 (17), adjustment screw 3 (18), fixing screw 2 (19), fixing hole (20), pin pad (21), knob (41).
2. The precision fine-tuning chip test socket according to claim 1, characterized in that: A positioning plate (3) is fixedly connected to the bottom of the base (1), and the positioning plate (3) is positioned and connected to the circuit board (2), and the circuit board (2) has a pin pad (21). The chip to be tested (5) is fixed in the base (1) by the upper cover (4) and is in elastic contact with the probe (11) on the probe board (10).
3. The precision fine-tuning chip test socket according to claim 1, characterized in that: The base (1) and the circuit board (2) and the positioning plate (3) are positioned by means of positioning pins (15) and fixed by fixing screws 1 (13) and fixing screws 2 (19). When the fixing screws are not tightened, the two fixing screws can move in the fixing holes (20).
4. The precision fine-tuning chip test socket according to claim 1, characterized in that: The deformation sleeve (14) is made of elastic material and can be slightly deformed.
5. The precision fine-tuning chip test socket according to claim 1, characterized in that: The adjusting screw 2 (17) is perpendicular to the horizontal surface of the base, and there is a certain angle between the adjusting screw 1 (16) and the adjusting screw 2 (17); there is also a certain angle between the adjusting screw 3 (18) and the adjusting screw 2 (17).
6. The precision fine-tuning chip test socket according to claim 1, characterized in that: The adjusting screw 1 (16) and the adjusting screw 3 (18) are twisted inward to compress the deformation sleeve (14) from both sides, so that the deformation sleeve (14) moves downward, thereby driving the positioning pin (15) downward.