ATE test machine cloud burning method

Abstract

The invention discloses a cloud burning method for an ATE test machine. The cloud burning method comprises the steps that firmware is encrypted and uploaded to a cloud server; installing a chip to be tested in an ATE test machine, generating a downloading request and sending the downloading request to a cloud server; the cloud server transmits the firmware to the ATE test machine by using an encryption protocol; the ATE tester burns the encrypted firmware to the chip to be tested; after burning is completed, the ATE tester verifies the burning integrity of the firmware of the chip to be tested during data analysis; the ATE test machine executes the ATE test program to test the function and performance of the chip to be tested; the cloud server determines whether the to-be-tested chip is compliant or not according to the test data collected in the test process; and the ATE test machine generates a test result and a burning condition of the to-be-tested chip, and returns the test result and the burning condition to the cloud server. According to the method, the problems of large firmware, high logistics and time cost and poor confidentiality in the traditional firmware burning process are solved.

Description

Technical Field

[0001] The present invention relates to the field of chip testing technology, and in particular to a cloud-based burning method for an ATE testing machine. Background Art

[0002] ATE (Automatic Test Equipment) testing is an important part of the semiconductor chip production process, used to detect whether the chip's functions and performance meet the design requirements. In the ATE testing process, CP (Chip Probe) and FT (Final Test) are two key testing stages.

[0003] Whether in CP testing or FT testing, the basic process of firmware burning is roughly similar. Specifically, the firmware burning process includes firmware preparation, connection and configuration, firmware burning, burning verification, test execution, data collection and analysis, and exception handling.

[0004] Although the traditional firmware burning process is widely used in semiconductor chip testing, it does have some disadvantages and limitations. The following is a supplementary analysis of the disadvantages of the traditional burning process: Disadvantages 1. Firmware is usually large, and managing and storing these files requires a lot of space and resources. Firmware in file form needs to be redistributed and replaced when the version is updated, which increases logistics and time costs.

[0005] Disadvantage 2: The firmware is vulnerable to network attacks during transmission, such as hacker intrusion, which may cause the firmware to be tampered with or leaked. The lack of effective encryption and security measures makes it impossible to ensure the security of the firmware during storage and transmission.

[0006] The information disclosed in this background technology section is only intended to enhance the understanding of the overall background of the invention and should not be regarded as an acknowledgment or any form of suggestion that the information constitutes the prior art already known to a person skilled in the art. Summary of the invention

[0007] In order to overcome the defects of the prior art, a cloud burning method for an ATE test machine is provided to solve the problems of large firmware, high logistics and time costs, and poor confidentiality in the traditional firmware burning process.

[0008] To achieve the above purpose, a cloud burning method for an ATE test machine is provided, comprising the following steps: Providing a cloud server, and uploading the encrypted firmware to the cloud server; The chip to be tested is installed on an ATE tester, and the ATE tester generates a download request and sends it to the cloud server; After the cloud server verifies and passes the download request, the cloud server transmits the firmware to the ATE tester using an encryption protocol; The ATE tester burns the encrypted firmware to the chip to be tested; After the burning is completed, the ATE tester verifies the integrity of the firmware burning of the chip under test during data analysis; The ATE tester executes the ATE test program to test the function and performance of the chip to be tested; The cloud server determines whether the chip to be tested is compliant through the test data collected during the test process; The ATE test machine generates the test results and burning status of the chip under test and transmits them back to the cloud server.

[0009] Furthermore, the encryption protocol is the SSL / TLS encryption protocol.

[0010] Furthermore, during the burning process, the cloud server monitors the burning status of the chip to be tested.

[0011] Furthermore, during the burning process, when the cloud server remotely executes the ATE test program through the ATE test machine according to the burning firmware instruction, when the test data is abnormal, the cloud server re-burns the firmware or adjusts the test parameters of the chip to be tested.

[0012] The beneficial effect of the present invention is that the cloud-based burning method for the ATE tester of the present invention adopts end-to-end encryption, and the entire transmission process of the firmware from the cloud server to the inside of the chip to be tested is encrypted, thereby ensuring the security of the data. The cloud server in the cloud-based burning method for the ATE tester of the present invention controls the version and issuance of the firmware in real time, and can dynamically adjust the firmware according to the test requirements. The cloud server in the cloud-based burning method for the ATE tester of the present invention adopts advanced data encryption technology to ensure the security of the firmware data and prevent leakage. The firmware in the cloud-based burning method for the ATE tester of the present invention uses an encryption protocol for data transmission to prevent the data from being intercepted or tampered with during the transmission process. The chip production line in the cloud-based burning method for the ATE tester of the present invention does not need to know the specific content of the firmware, and all operations are completed in an encrypted state, thereby protecting the intellectual property rights. The cloud-based burning of the cloud-based burning method for the ATE tester of the present invention realizes the burning directly from the cloud server to the inside of the chip, reduces the intermediate links, and improves security.

[0013] The cloud burning method of the ATE tester of the present invention supports flexible burning of different chips and firmware, and adapts to different production requirements. The cloud burning method of the ATE tester of the present invention reduces the risk in the production process and ensures the continuity and stability of production through cloud control and encryption technology. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Other features, objects and advantages of the present application will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings: Figure 1 It is a flowchart of the cloud burning method of the ATE test machine according to an embodiment of the present invention. DETAILED DESCRIPTION

[0015] The present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the invention are shown in the accompanying drawings.

[0016] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0017] See also Figure 1 As shown, the present invention provides a cloud-based burning method for an ATE test machine, comprising the following steps: S1. Provide a cloud server and upload the encrypted firmware to the cloud server.

[0018] The cloud server is provided and initialized. The cloud server is configured, has high security measures, and is ready to receive firmware burning requests from customers.

[0019] Administrators encrypt the firmware when uploading it to the cloud server to ensure data confidentiality.

[0020] In this embodiment, the encryption process is to convert the contents of the firmware into an unreadable format using an encryption algorithm and a key to ensure that only authorized personnel with the correct key can access and decrypt the file.

[0021] The cloud server controls the firmware version to ensure that only authorized firmware can be downloaded and burned.

[0022] S2. Install the chip to be tested on the ATE tester. The ATE tester generates a download request and sends it to the cloud server.

[0023] Place the chip to be tested on the ATE test equipment and establish a secure communication connection with the cloud server.

[0024] The ATE tester generates a download request and sends it to the cloud server.

[0025] S3. After the cloud server verifies and approves the download request, the cloud server transmits the firmware to the ATE tester using an encrypted protocol.

[0026] As a preferred implementation, the encryption protocol is the SSL / TLS encryption protocol.

[0027] During the test, the ATE tester downloads the required firmware in real time according to the instructions of the server.

[0028] The firmware uses encryption protocols such as SSL / TLS during transmission to ensure the security of transmission.

[0029] S4. The ATE tester burns the encrypted firmware to the chip under test.

[0030] The encrypted firmware is transferred to the internal memory of the chip in real time through the burning function of the ATE test equipment.

[0031] As a preferred implementation, during the burning process, the cloud server monitors the burning status of the chip to be tested.

[0032] Specifically, during the burning process, the cloud server monitors the burning status to ensure that the data is written into the chip correctly.

[0033] S5. After the burning is completed, the ATE tester performs the firmware integrity during data analysis.

[0034] S6. The ATE tester executes the ATE test program to test the function and performance of the chip under test.

[0035] S7. The cloud server uses the test data collected during the test process to determine whether the chip under test is compliant.

[0036] The cloud server collects the data generated during the testing process and analyzes it to determine whether the chip meets the specification requirements.

[0037] The test results of each test site are transmitted to the customer server in real time for the customer to analyze and process.

[0038] As a preferred implementation, during the burning process, when the cloud server remotely executes the ATE test program through the ATE test machine according to the burning firmware instructions, when the test data is abnormal, the cloud server re-burns the firmware or adjusts the test parameters of the chip to be tested.

[0039] The cloud server monitors the test process and automatically handles any abnormalities, such as re-burning the firmware or adjusting the test parameters.

[0040] S8. The ATE test machine generates test results and burning status and transmits them back to the cloud server.

[0041] The cloud server records the test results and guides subsequent packaging and shipment preparation based on the results.

[0042] The cloud server remotely updates the firmware without manual intervention, ensuring that the firmware is always up to date.

[0043] The ATE test machine cloud burning method of the present invention adopts end-to-end encryption, and the entire transmission process of the firmware from the cloud server to the inside of the chip to be tested is encrypted, thereby ensuring the security of the data.

[0044] The cloud server in the cloud burning method for the ATE test machine of the present invention controls the version and distribution of the firmware in real time, and can dynamically adjust the firmware according to the test requirements.

[0045] The cloud server in the cloud burning method for the ATE test machine of the present invention adopts advanced data encryption technology to ensure the security of firmware data and prevent leakage.

[0046] The firmware in the ATE test machine cloud burning method of the present invention uses an encryption protocol for data transmission to prevent the data from being intercepted or tampered with during the transmission process.

[0047] The chip production line in the ATE test machine cloud burning method of the present invention does not need to know the specific content of the firmware, and all operations are completed in an encrypted state, thereby protecting the intellectual property rights.

[0048] The cloud server in the cloud burning method for the ATE test machine of the present invention controls the burning process throughout the entire process to ensure the accuracy and reliability of the burning.

[0049] The cloud-based burning method of the ATE test machine of the present invention realizes burning directly from the cloud server to the inside of the chip, reduces intermediate links, and improves security.

[0050] The cloud-based burning method of the ATE test machine of the present invention supports flexible burning of different chips and firmware, and adapts to different production requirements.

[0051] The ATE test machine cloud burning method of the present invention reduces the risk in the production process and ensures the continuity and stability of production through cloud control and encryption technology.

[0052] The ATE test machine cloud burning method of the present invention transmits the test results of each test site to the client server in real time, so that the client can analyze and process the data in time, improving the response speed and decision-making efficiency. The client can monitor the test progress and results in real time through the cloud server, enhancing the control and trust in the production process. The client can quickly adjust the production process according to the real-time test results, improving production efficiency and product quality.

[0053] The ATE test machine cloud burning method of the present invention increases the advantage of real-time test result transmission. The cloud burning process not only improves data security and production flexibility, but also provides customers with real-time data analysis capabilities, making the production process more transparent and controllable.

[0054] The above description is only a preferred embodiment of the present application and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present application is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the above features are replaced with (but not limited to) technical features with similar functions disclosed in the present application.

Claims

1. A cloud-based burning method for an ATE test machine, characterized in that: The following steps are involved: Providing a cloud server, and uploading the encrypted firmware to the cloud server; The chip to be tested is installed on an ATE tester, and the ATE tester generates a download request and sends it to the cloud server; After the cloud server verifies and passes the download request, the cloud server transmits the firmware to the ATE tester using an encryption protocol; The ATE tester burns the encrypted firmware to the chip to be tested; After the burning is completed, the ATE tester verifies the integrity of the firmware burning of the chip under test during data analysis; The ATE tester executes the ATE test program to test the function and performance of the chip to be tested; The cloud server determines whether the chip to be tested is compliant through the test data collected during the test process; The ATE test machine generates the test results and burning status of the chip under test and transmits them back to the cloud server.

2. The ATE test machine cloud burning method according to claim 1, characterized in that: During the burning process, the cloud server monitors the burning status of the chip to be tested.

3. The ATE test machine cloud burning method according to claim 2, characterized in that: During the burning process, when the cloud server remotely executes the ATE test program through the ATE test machine according to the burning firmware instruction, when the test data is abnormal, the cloud server re-burns the firmware or adjusts the test parameters of the chip to be tested.

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