Simulation driving method and system for improving power-on and power-off stability of multiple power supplies

Abstract

The invention discloses a simulation driving method and system for improving power-on and power-off stability of multiple power supplies. The method comprises the following steps: firstly, determining a test scene needing to be detected of a tested multi-power system; secondly, carrying out a power-on test, setting different power-on time and voltage values, carrying out comprehensive test, and recording data; then, executing a power-off test, setting different power-off amplitudes and time, testing one by one, and recording data; and finally, analyzing the stability of the system according to the recorded data. The method can predict and solve the power supply problem at the initial stage of product design, reduces the cost, improves the efficiency, and ensures the performance and reliability of a final product.

Description

Technical Field

[0001] The invention relates to a simulation driving method for improving the power-up and power-down stability of multiple power supplies, and also relates to a corresponding simulation driving system, belonging to the technical field of chip simulation design. Background Art

[0002] In electronic devices, power stability is a key factor to ensure the normal operation of the equipment. For example, modern cars increasingly use electronic control units (ECUs), which require multiple power systems to ensure stable and reliable power supply, especially in electric or hybrid vehicles. Because different circuits and peripherals in the ECU require different power supply voltages and currents, in order to provide a more stable and reliable power supply and ensure the normal operation of the ECU, a multiple power system is also required.

[0003] For multi-power systems that rely on multiple power supplies, power stability testing is particularly critical. This is because each power supply may face different electrical and environmental challenges, such as voltage fluctuations, frequency deviations, and interference from external and internal sources, which may affect the reliability and performance of the equipment.

[0004] Traditional single power supply test methods can evaluate the impact of power quality, environmental factors and interference on device performance, but they are often limited to testing a single power supply. This method is insufficient when facing a multi-power supply system, because a multi-power supply system may have mutual influence between power supplies and complex power management strategies.

[0005] Existing technologies usually focus on power-on and power-off tests and interference tests on a single power supply, which are usually performed during the physical testing phase after the chip or device is manufactured. However, this approach ignores the importance of evaluating power supply stability during the design and simulation phases. Power supply testing at the simulation level can predict and solve potential power supply problems before actual manufacturing, thereby reducing costs, improving efficiency, and ensuring the performance and reliability of the final product.

[0006] Therefore, it is increasingly important to test the power stability of multi-power supply devices through simulation. This requires the development of more advanced test methods that can comprehensively evaluate the stability of multi-power supply systems in the simulation stage to ensure that the equipment can operate stably in actual applications and meet the growing technical and performance requirements. Summary of the invention

[0007] The primary technical problem to be solved by the present invention is to provide a simulation driving method for improving the power-on and power-off stability of multiple power supplies.

[0008] Another technical problem to be solved by the present invention is to provide a simulation driving system for improving the power-on and power-off stability of multiple power supplies.

[0009] In order to achieve the above technical objectives, the present invention adopts the following technical solutions:

[0010] According to a first aspect of an embodiment of the present invention, there is provided a simulation driving method for improving the power-on and power-off stability of multiple power supplies, comprising the following steps:

[0011] S1: Determine the test scenarios that need to be tested for the multi-power system under test;

[0012] S2: If the power-on test is selected, go to step S3; if the power-off test is selected, go to step S6;

[0013] S3: Enter the power-on test state, select a power supply according to the test scenario, set different power-on times and power-on stable voltage values ​​for it, and then change the power-on stable voltage value and power-on time of another power supply according to the predetermined step size at different simulation time points, perform a comprehensive power-on test, and record the data;

[0014] S4: All power supplies are configured to be powered on at the same time. The configuration of each power supply is the same, and different power-on times and different power-on stable voltage values ​​are set respectively. The test is traversed at a preset time step and data is recorded.

[0015] S5: Enter the power-off test state, set the power-off range and power-off time of a power supply according to the test scenario, and configure the remaining power supplies with different power-off ranges and times. Then, these power supplies are powered on one by one and the power-off test is performed according to the set conditions;

[0016] S6: All power supplies are configured to be powered off simultaneously, each power supply has the same configuration, and has different power-off times and different power-off amplitudes, and the test is performed at a preset time step and data is recorded;

[0017] S7: Based on the aforementioned recorded data, a stability analysis is performed on the multi-power supply system under test.

[0018] Preferably, in step S1, a corresponding test scenario is generated by retrieving keywords of the internal unit.

[0019] Preferably, the keywords are divided into five levels, including:

[0020] ① The highest level is the PWM control unit. When PWM related keywords are retrieved, all test scenarios will be selected for testing;

[0021] ② The second level is the OTP unit, select the normal power-on and fast power-on test conditions;

[0022] ③Level 3 power supply is a power supply in the internal confidentiality security zone. It only tests the power-on process and does not need to test the power-off process;

[0023] ④Level 4 is the peripheral power supply, which only needs VDD to traverse the three conditions of normal power-on, fast power-on and slow power-on;

[0024] ⑤ When level 5 detects that there is only a single power supply, only the single power supply is tested.

[0025] Preferably, comprehensive testing of a single power supply includes multiple combinations of different VDD voltages, power-on speeds, and power-off speeds.

[0026] Among them, the VDD voltage is divided into normal voltage, VDDmin and VDDmax; the power-on speed is divided into normal power-on, fast power-on and slow power-on; the power-off speed is divided into normal power-off, fast power-off and slow power-off.

[0027] Preferably, the test scenarios include: setting different power-on stable voltage values ​​for the two power supplies; performing power-on operations on the two power supplies at the same time; performing power-off operations on the two power supplies at the same time; powering on the two power supplies at different rates; powering off the two power supplies at different rates; and one power supply is in a stable state while the other power supply is in the process of powering on or off.

[0028] Preferably, step S3 includes the following sub-steps:

[0029] S31: configure a power-on time, a power-on stable voltage value and a power-off time for one of the power supplies;

[0030] S32: Determine whether the power-on time or the power-on stable voltage value of the power supply has been tested. If the test is completed, jump to step S4; if the test is not completed, go to step S33;

[0031] S33: configure another power supply to be one of VDDmax, VDD or VDDmin and enter step S34, until the three power-on stable voltage values ​​are tested and then jump to S31;

[0032] S34: configure another power supply to have a normal power-on time and a normal power-off time, start a power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and jump to step S35;

[0033] S35: configure another power supply to have a slow power-on and normal power-off time, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and jump to step S36;

[0034] S36: Configure another power supply to have a fast power-on and normal power-off time, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S31.

[0035] Preferably, during the fast power-on test, data of 1 microsecond, 10 microseconds and 100 microseconds are tested.

[0036] Preferably, step S5 includes the following sub-steps:

[0037] S51: configuring a power-off time and a power-off range for one of the power supplies;

[0038] S52: Determine whether the power-off time or power-off amplitude of the power supply has been tested. If the test is completed, jump to step S6; if the test is not completed, go to step S53;

[0039] S53: configure another power supply to have a power-down amplitude of VDDmax, VDD or VDDmin and proceed to step S54, until all three power-down amplitudes are tested and then jump to S51;

[0040] S54: configure another power supply to a normal power-off time, start power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and enter step S55;

[0041] S55: configure another power supply to power off slowly, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and go to step S56;

[0042] S56: Configure another power supply to power off quickly, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S51.

[0043] Preferably, during the fast power-off test, data of 1 microsecond, 10 microseconds and 100 microseconds are tested.

[0044] According to a second aspect of an embodiment of the present invention, there is provided a simulation driving system for improving the power-on and power-off stability of multiple power supplies, comprising a processor and a memory, wherein the processor and the memory are coupled; wherein the memory is used to store a computer program; and the processor is used to run the computer program stored in the memory to execute the simulation driving method for improving the power-on and power-off stability of multiple power supplies as described above.

[0045] Compared with the prior art, the present invention has the following technical effects:

[0046] 1) By building an environment that matches reality and rich application scenarios, the performance of the power supply under various conditions can be simulated in a virtual environment, which helps to discover potential problems in the early stages of product design;

[0047] 2) Carry out testing in the early stages of design so that the power supply can be evaluated before the product is manufactured. This allows power supply-related problems to be identified and resolved at an early stage, reducing the cost and time of later modifications.

[0048] 3) Traditional testing methods may only focus on the performance of a single power supply, while this method expands the testing focus to multiple power supplies, considering the interactions and impacts between them, which helps to ensure the stability and reliability of the entire power supply system in practical applications;

[0049] 4) Pay special attention to the interference between power supplies and the impact of working timing on the product, which means that the test is not only static, but also includes the power supply performance under dynamic conditions, which is crucial to ensure the stability of the product in complex environments;

[0050] 5) Comprehensively consider power quality, environmental factors, internal and external interference, and the mutual influence between power supplies to provide a more comprehensive power supply testing solution, which helps to improve the robustness and robustness of the product;

[0051] 6) We use simulation tools to conduct tests and build a more comprehensive simulation method. We fix the details of the test, so that we can not only comprehensively identify problems with the product, but also reduce minor differences caused by manual operations, and realize automated collection and comparison simulation, which can accurately analyze large amounts of data and reduce differences caused by different data accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 This is a schematic table summarizing the multi-power supply power-on and power-off test scenarios in the first embodiment of the present invention;

[0053] Figure 2 for Figure 1 Schematic diagram of the specific operation of traversal;

[0054] Figure 3 A schematic diagram of each process in a test scenario of power supply test;

[0055] Figure 4 This is a test state diagram of a dual power supply where power supply B is powered on slowly and the stable power-on voltage value is VDDmax;

[0056] Figure 5 This is a test state diagram of a dual power supply where power supply A is powered on slowly and the power-on stable voltage value is VDDmax;

[0057] Figure 6 It is a test state diagram of a dual power supply, where power supply A and power supply B are powered on at the same time and the stable power-on voltage value is VDD;

[0058] Figure 7This is a test state diagram of a dual power supply, where power supply B is powered off slowly and the starting power-off stable voltage value is VDD;

[0059] Figure 8 This is a test state diagram of a dual power supply, where power supply A is powered off slowly and the starting power-off stable voltage value is VDD;

[0060] Fig. 9 It is a schematic diagram of a test state in which both power-off of the dual power supplies is slow and the stable voltage value at the beginning of power-off is VDD;

[0061] Fig.10 Schematic diagram of the structure of a simulation driving system for improving the power-on and power-off stability of multiple power supplies in the second embodiment of the present invention. DETAILED DESCRIPTION

[0062] The technical content of the present invention is described in detail below with reference to the accompanying drawings and specific embodiments.

[0063] The technical concept in the embodiment of the present invention is to construct multiple scenarios with different interference and timing during the simulation process, and classify all scenarios into typical scenarios for detection according to the actual application scenarios of the chip under test, so as to cover all application scenarios of multiple power supplies and different timings with the least test scenarios, test times and time. Therefore, the simulation test method of the present invention can ensure that the tested multi-power supply system can show stable performance in different actual application scenarios.

[0064] First embodiment

[0065] like Figure 1 and 2 As shown, the simulation driving method for improving the power-on and power-off stability of multiple power supplies provided by the first embodiment of the present invention comprehensively evaluates the stability of the multiple power supply system in different test scenarios through simulation, and includes the following steps.

[0066] S1: Determine the test scenarios that need to be tested for the multi-power system under test.

[0067] Here, there are multiple ways to determine the test scenarios that need to be tested for the multi-power system under test. The first way is that the simulation drive system automatically reads and finds the corresponding test scenarios from the test item table based on the model of the multi-power system under test. The second way is to determine the test scenarios based on the application scenarios of the multi-power system under test. The third way is to manually select the test scenarios for the multi-power system under test.

[0068] Selecting a test scenario based on the type of power supply means searching for keywords of internal units in the simulation environment to generate corresponding test scenarios (for example, there are five levels in the keyword):

[0069] ① The highest level is the PWM control unit. When PWM related keywords are retrieved, all test scenarios will be selected for testing.

[0070] ② The second level is the OTP unit. Select the normal power-on and fast power-on test scenarios.

[0071] ③Level 3 power supply is a power supply in the internal confidentiality security zone. This type of power supply is a power supply that will not be powered off, so during the test, there is only the power-on process, and there is no need to test the power-off process (it is considered that the signal after power-off is an error);

[0072] ④ Level 4 is the peripheral power supply, which only needs to be able to work normally, and has low stability requirements. It only needs to power on with a VDD amplitude and go through three scenarios: normal power-on, fast power-on, and slow power-on.

[0073] ⑤ When level 5 detects that there is only a single power supply, only the single power supply is tested.

[0074] There are multiple combinations of different VDD voltages, power-on speeds, and power-off speeds for different test scenarios. Among them, the VDD voltage is divided into normal voltage, VDDmin, and VDDmax; the power-on speed is divided into normal power-on, fast power-on, and slow power-on; the power-off speed is divided into normal power-off, fast power-off, and slow power-off. Therefore, by changing (combining) the VDD voltage, power-on speed, and power-off speed, a large number of test scenarios can be realized. In order to illustrate the test method of the present invention, only some of the scenarios are used as examples for illustration.

[0075] Figure 3 The figure shows multiple test processes in a test scenario: power-on process, stabilization process and power-off process, hereinafter referred to as power-on and power-off. In addition, the power-on and power-off time are not fixed according to the different requirements of the actual project. The normal, slow and fast times given in the embodiment are only examples of typical values ​​and do not represent all values. For example, the typical value of the normal power-off time is 200us, but it may actually reach 300us or even longer or shorter.

[0076] For each power supply, it is necessary to adopt the power-on and power-off test scheme shown in the following Table 1. Because each power supply is traversed and tested according to the time step, the power-on and power-off time relationship between different power supplies can be adjusted by adjusting the time step and the simulation duration, so as to test various usage scenarios of multiple power supplies in actual working conditions. For example, all test scenarios include setting multiple power supplies to: two power supplies with different power-on regulated voltage values; two power supplies are powered on at the same time; two power supplies are powered off at the same time; two power supplies have different power-on speeds; two power supplies have different power-off speeds; or one of the two power supplies is in the stable period and the other is powered on or powered off, etc. Therefore, the simulation test of this application is comprehensive. In this article, simultaneous power-on means that the power-on start time is the same, and the power-on completion time is also the same when the power supply stable voltage value is reached (the power-on process time is the same). Similarly, simultaneous power-off also means that the power-off process time is the same.

[0077] Table 1: Single power supply power-on and power-off test

[0078]

[0079]

[0080] It should be noted that the voltage value of the power supply stability is not fixed (as shown in Table 2), but depends on different modules and working scenarios. The values ​​listed in Table 1 are for better understanding, but they do not constitute a limitation of the present invention. For example, the typical value of VDD is 3.3V, and the typical value of duration is 200us.

[0081] Table 2: Relationship table of different power supply voltage values

[0082]

[0083] Based on the comprehensive test scenario of the single power supply mentioned above, Figure 1 and Figure 2 The following example shows a multi-power supply test scenario. Figure 1 As shown, the power-on test scenarios for a multi-power system (two power supplies, power supply A and power supply B, are used as examples in the figure) include three categories: power supply A power-on, power supply B power-on, and simultaneous power-on. That is, each power supply in the multi-power system is powered on one by one, or all the power supplies are powered on at the same time. The corresponding multi-power power-off test scenarios also include power supply A power-off, power supply B power-off, and simultaneous power-off.

[0084] Among them, in the scenario where a single power supply (power supply A) is powered on, different test scenarios are obtained by changing the power-on test conditions (power-on stable voltage value and power-on time) of another power supply (power supply B). Among them, as shown in Table 1, the power-on stable voltage values ​​of power supply B are the maximum safe voltage VDDmax (VDDmax=3.63V), the minimum voltage VDDmin (VDDmin=3V) required for normal operation, and VDD (3.3V); the power-on time of power supply B is normal power-on time, slow power-on, and fast power-on. Here, the slow power-on time (for example, 1 to 20 milliseconds)>normal power-on time>fast power-on time (for example, 1 to 100 microseconds). In this embodiment, the normal power-on time is X1 (for example, 200 microseconds to 1 millisecond); the normal power-off time is also Y (for example, 200 microseconds to 1 millisecond). The specific value can be set according to actual needs. The slow power-off time (eg, 1 to 100 microseconds)>the normal power-off time (eg, 200 microseconds to 1 millisecond)>the fast power-off time (eg, 1 to 20 milliseconds).

[0085] Similarly, when the power supply B is powered on, the power-on conditions (time and voltage) of the power supply A are changed respectively to obtain a variety of power-on test scenarios.

[0086] Similarly, when power supply A and power supply B are powered on at the same time, the power-on stable voltage value and power-on time of power supply A and power supply B are changed at the same time to obtain multiple test scenarios ( Figure 2 ). Under the premise that the power-on / power-off amplitude of power supplies A and B are both VDDmin, VDD or VDDmax, power supplies A and B are both powered on at normal time, fast time or slow time. Figure 2 shown.

[0087] S2: If the power-on test is selected, go to step S3; if the power-off test is selected, go to step S5.

[0088] S3: Enter the power-on test state, select a power supply (such as power supply A) according to the test scenario, set different power-on times (normal power-on time, slow power-on time or fast power-on time) and power-on stable voltage values ​​(VDD, VDDmin or VDDmax) for it, and then change the power-on stable voltage value and power-on time of another power supply according to the predetermined step size at different simulation time points, perform a comprehensive power-on test, and record the data.

[0089] For example, power supply A is configured to have a stable power-on voltage value of VDDmin=3V, and a normal power-on time of 200us; power supply B is configured to have a stable power-on voltage value of VDDmin, and a power-on test is started with a power-on time of 200us; then the power-on time of power supply B is changed in steps of 100us, that is, to 300us, 400us, ..., until 1ms, for a power-on test.

[0090] Then, power supply A is configured to a different power-on stable voltage value (for example, VDD=3V), with a normal power-on time of 200us, and power supply B is configured to a power-on stable voltage value VDDmin, with a power-on time of 200us, and traverses to 1ms according to a predetermined step length for power-on testing.

[0091] Afterwards, power supply A is configured to a different power-on stable voltage value (for example, VDDmax=3.63V), with a normal power-on time of 200us, and power supply B is configured to a power-on stable voltage value VDDmin, with a power-on time of 200us, and traverses to 1ms according to the predetermined step length for power-on testing.

[0092] Next, the power supply A is configured to have a power-on amplitude of VDDmin=3V, the power-on time is changed (for example, to fast power-on), and then the test conditions of the power supply B are changed in the above manner to perform traversal and power-on testing.

[0093] Therefore, if Figure 1 and Figure 2 As shown, this step includes the following sub-steps:

[0094] S31: configuring a power-on time, a power-on stable voltage value, and a power-off time for one of the power supplies (for example, power supply A);

[0095] The power-off time of other power supplies may be the same as or different from the power-off time of the power supply.

[0096] S32: Whether the power-on time or the power-on stable voltage value of the power supply has been tested. If so, jump to step S4; if not, go to step S33;

[0097] S33: configure another power supply (for example, power supply B) to one of VDDmax, VDD or VDDmin and proceed to step S34, until all three power-on stable voltage values ​​are tested and then jump to S31;

[0098] S34: configure power source B to have normal power-on time and normal power-off time, start power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and jump to step S35;

[0099] S35: configure power source B to have slow power-on and normal power-off time, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and jump to step S36;

[0100] S36: Configure power source B to have fast power-on and normal power-off time, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S31.

[0101] In the case of more than two power supplies, all power supplies except power supply A are configured according to the above steps S31 to S36, and then the power-on test is completed. For example, if there are three power supplies, power supply B and power supply C are tested according to the above power-on test and the data is recorded. That is, for all power supplies, the power-on time and the power-on stable voltage value are changed respectively (according to Table 1), and the power-on-stabilization-power-off test is repeatedly performed according to a certain time step, and all test scenarios are traversed ( Figure 1 and Figure 2 shown).

[0102] Specifically, Figure 4 This is the test state diagram when the power-on stable voltage value of power supply B is VDDmax. Figure 4 As shown, power supply A and power supply B are powered on at the same time. During the power-on process, power supply A reaches 3V (power-on stable voltage value VDD of power supply A) within 200 microseconds, but power supply B reaches 3.63V (power-on stable voltage value VDDmax of power supply B) within 2 milliseconds (slow power-on). Therefore, there are two test states during the power-on process: 1) power supply A and power supply B are powered on at the same time; 2) power supply A reaches a stable state, but power supply B is still in the power-on state. During the power-on process, the power-on time of power supply B is increased according to the step size of 2 milliseconds, and then tested again until 20 milliseconds. Since power supply A and power supply B are powered off at the same time, there are also two test states in the stable state: 1); power supply A is in a stable state and power supply B is in a powered-on state; 2) both power supply A and power supply B are in a stable state. During the power-off process, there is only one test state: both power supply A and power supply B are powered off with a normal power-off time.

[0103] S4: All power supplies are configured to be powered on at the same time. The configuration of each power supply is the same, and different power-on times and different power-on stable voltage values ​​are set respectively. The test is traversed at a preset time step and the data is recorded.

[0104] Figure 5 It shows a situation where power supply A and power supply B start to power on at the same time. In other words, it is used to detect whether there is mutual interference between multiple power supplies when a single power supply reaches a stable state in advance while another power supply is still in the process of rising.

[0105] Figure 5In the power-on process shown, the power-on stable voltage value of power supply A is 3.63V, and it reaches this voltage level within 10 microseconds. The power-on stable voltage value of power supply B is 3V, and it reaches this voltage level within 200 microseconds. This shows that the power-on process of power supply B is relatively slow. During the power-on process, there are two test states: 1) Power supplies A and B start to power on at the same time, but power supply A quickly reaches its power-on stable voltage value, while power supply B takes longer to reach its power-on stable voltage value; 2) Power supply A has reached a stable state, while power supply B is still in the power-on process and does not reach its power-on stable voltage value until 200 microseconds. In the stable state, due to the different power-on stable voltage values ​​of power supplies A and B, we can observe two situations: 1) Power supply A remains stable after reaching 3.63V, while power supply B also remains stable after reaching 3V; 2) Power supply A has stabilized before power supply B reaches a stable state, which means that for a period of time, the voltage of power supply A is higher than that of power supply B. During the power-off process, both power supply A and power supply B are powered off at a normal power-off time. There is a test state: power supply A and power supply B start to power off at the same time and complete the power-off process within 200 microseconds.

[0106] Figure 6 Another case is shown where power supply A and power supply B are powered on at the same time. During the power-on process, the power-on stable voltage values ​​of power supply A and power supply B are both 3.3V. Power supply A reaches its power-on stable voltage value of 3.3V within 200 microseconds, and power supply B also reaches the same power-on stable voltage value at the same time. During the power-on process, there is a test state: power supply A and power supply B are powered on at the same time and reach the power-on stable voltage value of 3.3V at the same time within 200 microseconds. In the stable state, both power supply A and power supply B remain at the voltage level of 3.3V, so there are no different test states caused by voltage differences. That is, there is only one test state: both power supply A and power supply B are in the stable state and the voltage is the same. During the power-off process, both power supply A and power supply B are powered off at the normal power-off time, and there is a test state: power supply A and power supply B start to power off at the same time and complete the power-off process within 200 microseconds.

[0107] S5: Enter the power-off test state, set the power-off amplitude and power-off time of a power supply according to the test scenario, and configure the remaining power supplies with different power-off amplitudes and times. Then, these power supplies are powered on one by one and the power-off test is performed according to the set conditions, and the data is recorded.

[0108] The power-off test can be a separate test, that is, all power supplies are configured with the same power-on time and power-on stable voltage value, and then the power-off amplitude and power-off time of different power supplies are configured and tested. The power-off test can also be combined with the power-on test, so that the power-on and power-off in the power supply test are tested in the same simulation process, and the order is power-on first, then power-off. That is, the power-on stable voltage value in the power-on test is used as the power-off amplitude, and the power-off time can be changed.

[0109] like Figure 1 As shown in Table 1, this step includes the following sub-steps:

[0110] S51: configuring a power-off time and a power-off range for one of the power supplies (for example, power supply A);

[0111] S52: Whether the power-off time or power-off amplitude of the power supply has been fully tested, if so, jump to step S6; if not, go to step S53;

[0112] S53: configure another power supply (for example, power supply B) to have a power-down amplitude of VDDmax, VDD or VDDmin and proceed to step S54, until all three power-down amplitudes are tested and then jump to S51;

[0113] S54: configure power source B to a normal power-off time, start power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and enter step S55;

[0114] S55: configure power source B to power off slowly, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and then go to step S56;

[0115] S56: Configure power source B to power off quickly, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S51.

[0116] Although the specific numerical values ​​in the embodiment of the present invention are only examples and can be adjusted according to actual test conditions and requirements, the data of 1 microsecond, 10 microseconds and 100 microseconds are tested during the fast power-off test.

[0117] Specifically, Figure 7 An example situation of step S64 is shown. Figure 7As shown, the power-on stable voltage values ​​of power supply A and power supply B are both 3V. The power-on process of both power supplies is normal, and both reach the power-on stable voltage value of 3V within 200 microseconds. During the power-on process, there is a test state: 1) Power supply A and power supply B are powered on at the same time, and reach the power-on stable voltage value of 3V at the same time within 200 microseconds. In the stable state, the states of power supply A and power supply B are the same, both remain at the voltage level of 3V, and the time of the stable state is the same. During the power-off process, the power-off time of power supply A and power supply B is different. The power-off process of power supply A is completed within 200 microseconds, while the power-off process of power supply B lasts for 10 milliseconds, which is longer than the power-off time of power supply A. Therefore, during the power-off process, there are two test states: 1) power supply A and power supply B are both powering off (within 200 microseconds); 2) power supply A has completed power-off and the voltage has returned to a low voltage; power supply B is still in the power-off process (after 200 microseconds).

[0118] Figure 8 shows another situation, with Figure 7 Power supply A and power supply B are both powered on at the normal power-on time, and the power-on stable voltage value is VDD (3V). Both are powered off at the same time, but power supply A is powered off slowly, with a power-off time of up to 10 milliseconds; power supply B is powered off normally.

[0119] S6: All power supplies are configured to be powered off at the same time. The configuration of each power supply is the same, and different power-off times and different power-off amplitudes are set. The test is traversed at a preset time step and data is recorded.

[0120] Fig. 9 The example shows that both power supply A and power supply B are powered on with normal power-on time (200 microseconds), the power-on stable voltage value is the same as VDD (3V), and they start to power off at the same time, and are in the test state of slow power off (10 milliseconds).

[0121] S7: Based on the aforementioned recorded data, a stability analysis is performed on the multi-power supply system under test.

[0122] In summary, the simulation driving method provided by the embodiment of the present invention is intended to improve the power-on and power-off stability of a multi-power supply system, and to comprehensively and accurately evaluate the power supply performance under dynamic conditions through automated testing. The method constructs a simulation test environment based on the actual environment and a variety of application scenarios, allowing the power supply to be tested in the early stages of product design in order to check the impact of the power supply on the overall product performance. Unlike traditional single power supply testing, the present invention takes into account the interactions and interferences between multiple power supplies, as well as the impact of the power supply operating timing on product performance. In this way, the present invention enhances the stability, robustness and robustness of the power supply system, and ensures the reliability of the power supply system in practical applications.

[0123] Second embodiment

[0124] Based on the above-mentioned simulation driving method for improving the stability of power up and down of multiple power supplies, a second embodiment of the present invention provides a simulation driving system for improving the stability of power up and down of multiple power supplies, such as Fig.10 The simulation driving system includes a processor and a memory. The memory is coupled to the processor and is used to store a program. When the program is executed by the processor, the processor implements the simulation driving method for improving the power-on and power-off stability of multiple power supplies provided in the above embodiment.

[0125] Wherein, the processor is used to control the overall operation of the simulation drive system to complete all or part of the steps of the simulation drive method for improving the stability of the upper and lower power supplies of the above-mentioned multi-power supply. The processor can be a central processing unit (CPU), a graphics processing unit (GPU), a field programmable gate array (FPGA), an application-specific integrated circuit (ASIC), a digital signal processing (DSP) chip, etc. The memory is used to store various types of data to support the operation of the simulation drive system, and these data may include, for example, instructions for any application or method for operating on the simulation drive system, and application-related data. The memory can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as a static random access memory (SRAM), an electrically erasable programmable read-only memory (EEPROM), an erasable programmable read-only memory (EPROM), a programmable read-only memory (PROM), a read-only memory (ROM), a magnetic memory, a flash memory, etc.

[0126] In another exemplary embodiment, the present invention further provides a computer-readable storage medium including program instructions, which, when executed by a processor, implements the steps of the simulation driving method for improving the stability of the power supply of multiple power supplies in any of the above embodiments. For example, the computer-readable storage medium may be the above-mentioned memory including program instructions, and the above-mentioned program instructions may be executed by a processor of a system to complete the above-mentioned simulation driving method for improving the stability of the power supply of multiple power supplies, and achieve the technical effect consistent with the above-mentioned method.

[0127] It should be noted that the above multiple embodiments are only examples. The technical solutions of the various embodiments can be combined, and the order of the steps can be changed, all within the scope of protection of this patent. Moreover, since the test processes are similar and there are many of them, the above text and drawings only describe in detail individual detection scenarios. Table 1, Figure 1 and Figure 2 The test scenarios are more fully illustrated in Table 1. Figure 1 and Figure 2 The statement shall prevail.

[0128] The above is a detailed description of the simulation driving method and system for improving the stability of multiple power supplies provided by the present invention. For those skilled in the art, any obvious changes made to it without departing from the essence of the present invention will constitute an infringement of the patent right of the present invention and will bear corresponding legal responsibilities.

Claims

1. A simulation driving method for improving the power-on and power-off stability of multiple power supplies, characterized in that The following steps are involved: S1: Determine the test scenarios that need to be tested for the multi-power system under test; S2: If power-on test is selected, go to step S3; If power-off test is selected, go to step S6; S3: Enter the power-on test state, select a power supply according to the test scenario, set different power-on times and power-on stable voltage values ​​for it, and then change the power-on stable voltage value and power-on time of another power supply according to the predetermined step size at different simulation time points, perform a comprehensive power-on test, and record the data; S4: All power supplies are configured to be powered on at the same time. The configuration of each power supply is the same, and different power-on times and different power-on stable voltage values ​​are set respectively. The test is traversed at a preset time step and data is recorded. S5: Enter the power-off test state, set the power-off range and power-off time of a power supply according to the test scenario, and configure the remaining power supplies with different power-off ranges and times. Then, these power supplies are powered on one by one and the power-off test is performed according to the set conditions; S6: All power supplies are configured to be powered off simultaneously, each power supply has the same configuration, and has different power-off times and different power-off amplitudes, and the test is performed at a preset time step and data is recorded; S7: Based on the aforementioned recorded data, a stability analysis is performed on the multi-power supply system under test.

2. The simulation driving method according to claim 1, characterized in that: In step S1, a corresponding test scenario is generated by retrieving keywords of internal units.

3. The simulation driving method according to claim 2, characterized in that The keywords are divided into five levels, including: ① The highest level is PWM control unit, retrieve PWM related keywords, and select all test scenarios for testing; ② The second level is the OTP unit, select the normal power-on and fast power-on test conditions; ③Level 3 power supply is a power supply in the internal confidentiality security zone. It only tests the power-on process and does not need to test the power-off process; ④Level 4 is the peripheral power supply, which only needs VDD to traverse the three conditions of normal power-on, fast power-on and slow power-on; ⑤ When level 5 detects that there is only a single power supply, only the single power supply is tested.

4. The simulation driving method according to claim 1, wherein: Comprehensive testing of a single power supply includes multiple combinations of different VDD voltages, power-on speeds, and power-off speeds. The VDD voltage is divided into normal voltage, VDDmin, and VDDmax; the power-on speed is divided into normal power-on, fast power-on, and slow power-on; and the power-off speed is divided into normal power-off, fast power-off, and slow power-off.

5. The simulation driving method according to claim 1, characterized in that The test scenarios include: setting different power-on stable voltage values ​​for the two power supplies; performing power-on operations on the two power supplies at the same time; performing power-off operations on the two power supplies at the same time; powering on the two power supplies at different rates; powering off the two power supplies at different rates; and one power supply is in a stable state while the other power supply is in the process of powering on or off.

6. The simulation driving method according to claim 4, characterized in that The step S3 comprises the following sub-steps: S31: configure a power-on time, a power-on stable voltage value and a power-off time for one of the power supplies; S32: Determine whether the power-on time or the power-on stable voltage value of the power supply has been tested. If the test is completed, jump to step S4; if the test is not completed, go to step S33; S33: configure another power supply to be one of VDDmax, VDD or VDDmin and enter step S34, until the three power-on stable voltage values ​​are tested and then jump to S31; S34: configure another power supply to have a normal power-on time and a normal power-off time, start a power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and jump to step S35; S35: configure another power supply to have a slow power-on and normal power-off time, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and jump to step S36; S36: Configure another power supply to have a fast power-on and normal power-off time, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S31.

7. The simulation driving method according to claim 6, characterized in that: During the fast power-on test, the data of 1 microsecond, 10 microseconds and 100 microseconds are tested respectively.

8. The simulation driving method according to claim 6, characterized in that The step S5 comprises the following sub-steps: S51: configuring a power-off time and a power-off range for one of the power supplies; S52: Determine whether the power-off time or power-off amplitude of the power supply has been tested. If the test is completed, jump to step S6; if the test is not completed, go to step S53; S53: configure another power supply to have a power-down amplitude of VDDmax, VDD or VDDmin and proceed to step S54, until all three power-down amplitudes are tested and then jump to S51; S54: configure another power supply to a normal power-off time, start power-on test and record data, and traverse from 200 microseconds to 1 millisecond with a step length of 100 microseconds until the end, and enter step S55; S55: configure another power supply to power off slowly, start powering on, and traverse from 1 millisecond to 20 milliseconds with a step length of 2 milliseconds until the end, and go to step S56; S56: Configure another power supply to power off quickly, start powering on, and traverse from 1 microsecond to 100 microseconds with a step length of 10 microseconds until the end, and jump to step S51.

9. The simulation driving method according to claim 7, characterized in that: During the fast power-off test, data of 1 microsecond, 10 microseconds, and 100 microseconds are tested respectively.

10. A simulation drive system for improving the stability of power on and off of multiple power supplies, characterized in that It includes a processor and a memory, the processor and the memory are coupled; wherein the memory is used to store a computer program; the processor is used to run the computer program stored in the memory, and execute the simulation driving method for improving the power-on and power-off stability of multiple power supplies as described in any one of claims 1 to 9.

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