Underwater plectropomus leopardus characterization measurement method, device, equipment and medium
By using binocular cameras and light refraction models underwater for pixel position compensation, combined with stereo vision technology to obtain the spatial position of leopard gilled azillary, the problems of efficiency and accuracy in traditional measurement methods are solved, and efficient and accurate characterization measurement is achieved.
CN120014016AActive Publication Date: 2025-05-16WUHAN UNIV OF TECH
Patent Information
- Application Number
- CN202510156093.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-12
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2045-02-12
Smart Images
Figure CN120014016A_ABST
Abstract
The invention discloses an underwater plectropomus leopardus characterization measurement method, device and equipment and a medium, and the method comprises the steps: obtaining an underwater image of the plectropomus leopardus underwater through a binocular camera, detecting key points of the plectropomus leopardus through a key point detection model, and obtaining the pixel position of each key point in the underwater image; establishing an underwater light refraction model; performing refraction offset compensation on the pixel position of the key point in the underwater image through an underwater light refraction model, and converting the pixel position of the key point in the underwater image into an equivalent pixel position corresponding to an air medium; obtaining the spatial position of each key point through a stereoscopic vision technology; and on the basis of the spatial position data of each key point, determining the characterization data of the underwater plectropomus leopardus. According to the invention, the pixel coordinates of the key points of the plectropomus leopardus in the underwater image are subjected to refraction offset compensation through the underwater light refraction model, the accuracy of key point detection is improved, and characterization measurement with millimeter-level precision can be realized.
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Citation Information
Patent Citations
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