Single-photon detector performance evaluation method and device, computer equipment and medium

Abstract

The invention relates to a single-photon detector performance evaluation method and device, computer equipment and a medium. The method comprises the following steps: connecting a to-be-tested detector into a performance test circuit to establish a performance test environment; according to a preset working voltage range of the to-be-tested detector, applying voltage to the to-be-tested detector in the performance test environment so as to enable the to-be-tested detector to be in a working state, and respectively sampling electric quantity parameters of the to-be-tested detector by adopting sampling frequencies corresponding to performance degradation parameters of the to-be-tested detector, obtaining an electric quantity time sequence corresponding to each performance degradation parameter; each performance degradation parameter at least comprises a dark current parameter, a breakdown voltage parameter and a noise parameter; determining an evaluation index value corresponding to each performance degradation parameter according to the electric quantity time sequence corresponding to each performance degradation parameter; and evaluating the performance degradation condition of the to-be-detected detector according to the evaluation index value corresponding to each performance degradation parameter. By adopting the method, the performance of the detector can be accurately evaluated.

Description

Technical Field

[0001] The present application relates to the field of detector technology, and in particular to a single-photon detector performance evaluation method, device, computer equipment and medium. Background Art

[0002] Single-photon detectors enable safe and efficient information transmission in the field of quantum communications; they capture weak light signals in astronomy and promote deep space exploration; at the same time, they also show important application value in the fields of biomedical imaging and lidar. Performance degradation is an important problem faced by single-photon detectors, which is mainly manifested in the long-term high reverse bias voltage operation leading to decreased device stability, the failure of avalanche current to be quenched in time causing performance degradation, and material aging and environmental factors such as radiation and temperature changes leading to gradual performance degradation. These factors work together to cause the detector performance to degrade over time.

[0003] At present, there are two methods for evaluating the performance degradation of single-photon detectors: the resistance method to measure the resistance change over time and the placement method to measure the performance change under external stress. However, the first method requires additional analysis and modeling, which increases the complexity and uncertainty of the analysis; the second method is difficult to accurately distinguish the degree of influence of each factor because the performance change may be caused by the combined effect of multiple factors, which increases the difficulty and uncertainty of data analysis. Summary of the invention

[0004] Based on this, it is necessary to provide a single-photon detector performance evaluation method, device, computer equipment and medium to address the above-mentioned technical problems, which can accurately evaluate the performance of the detector.

[0005] In a first aspect, the present application provides a single-photon detector performance evaluation method, comprising:

[0006] Connecting the detector to be tested to a performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0007] Applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state;

[0008] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0009] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0010] The performance degradation of the detector to be tested is evaluated according to the evaluation index value corresponding to each performance degradation parameter.

[0011] In one of the embodiments, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter and an ammeter;

[0012] The positive electrode of the voltage-stabilizing source is connected to the first end of the protection resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protection resistor is connected to the second end of the voltmeter;

[0013] Accordingly, the step of connecting the detector to be tested to the performance test circuit includes:

[0014] The positive electrode of the detector to be tested is connected to the second end of the ammeter, and the negative electrode of the detector to be tested is connected to the second end of the voltmeter.

[0015] In one of the embodiments, the performance test environment further includes a light shield; wherein the detector to be tested is located inside the light shield.

[0016] In one embodiment, determining the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter includes:

[0017] According to the electrical quantity time series corresponding to each performance degradation parameter, determining the voltage and current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter;

[0018] According to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined.

[0019] In one of the embodiments, the evaluation index value corresponding to the dark current parameter includes the dark current value, the ground fault current value and the short-circuit instantaneous current value, the evaluation index value corresponding to the breakdown voltage parameter includes the breakdown voltage value, and the evaluation index value corresponding to the noise parameter includes the noise value.

[0020] In one embodiment, determining the evaluation index value corresponding to each performance degradation parameter according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter includes:

[0021] Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter;

[0022] Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter;

[0023] Determine the voltage change information and current change information of the voltage to be measured at the sampling frequency corresponding to the noise parameter according to the voltage-current characteristic curve of the detector to be measured at the sampling frequency corresponding to the noise parameter;

[0024] According to the voltage change information and the current change information, the noise value of the detector under test in a positive pressure state, the noise value in a zero bias state, and the noise value in a negative pressure state are determined.

[0025] In one embodiment, the evaluating the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter includes:

[0026] Determining a first performance degradation result of the dark current parameter according to an evaluation index value corresponding to the dark current parameter;

[0027] Determining a second performance degradation result of the breakdown voltage parameter according to the evaluation index value corresponding to the breakdown voltage parameter;

[0028] Determining a third performance degradation result corresponding to the noise parameter according to the evaluation index value corresponding to the noise parameter;

[0029] The performance degradation of the detector to be tested is evaluated according to the first performance degradation result, the second performance degradation result and the third performance degradation result.

[0030] In a second aspect, the present application also provides a single-photon detector performance evaluation device, comprising:

[0031] An environment building module, used to connect the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single photon detector;

[0032] A voltage applying module, used for applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so as to put the detector under test in a working state;

[0033] An information determination module is used to sample the electrical quantity parameters of the detector under test respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector under test when the detector under test is in a working state, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector under test and the voltage across the two ends of the detector under test; and each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0034] An indicator evaluation module is used to determine the evaluation indicator value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0035] The performance evaluation module is used to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter.

[0036] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0037] Connecting the detector to be tested to a performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0038] Applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state;

[0039] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0040] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0041] The performance degradation of the detector to be tested is evaluated according to the evaluation index value corresponding to each performance degradation parameter.

[0042] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the following steps are implemented:

[0043] Connecting the detector to be tested to a performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0044] Applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state;

[0045] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0046] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0047] The performance degradation of the detector to be tested is evaluated according to the evaluation index value corresponding to each performance degradation parameter.

[0048] In a fifth aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0049] Connecting the detector to be tested to a performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0050] Applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state;

[0051] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0052] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0053] The performance degradation of the detector to be tested is evaluated according to the evaluation index value corresponding to each performance degradation parameter.

[0054] The above-mentioned single-photon detector performance evaluation method, device, computer equipment and medium build a performance test environment by connecting the detector to be tested to a performance test circuit, and apply voltage to the detector to be tested in the performance test environment according to the preset working voltage range of the detector to be tested, so that the detector to be tested is in a working state, thereby ensuring the flexibility of the performance test environment and the performance test process; further, when the detector to be tested is in a working state, the sampling frequency corresponding to each performance degradation parameter of the detector to be tested is used to sample the electrical parameters of the detector to be tested respectively, and the electrical time series corresponding to each performance degradation parameter is obtained, thereby realizing online real-time monitoring of the current and voltage of the detector to be tested, and the sampling frequency is flexibly adjustable; finally, according to the electrical time series corresponding to each performance degradation parameter, the evaluation index value corresponding to each determined performance degradation parameter is guaranteed, further ensuring the accuracy of the evaluation result of evaluating the performance degradation of the detector to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related technologies, the drawings required for use in the embodiments or the related technical descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0056] Figure 1 A diagram showing an application environment of a single-photon detector performance evaluation method in one embodiment;

[0057] Figure 2 A schematic diagram of a flow chart of a single photon detector performance evaluation method in one embodiment;

[0058] Figure 3A A schematic diagram of a performance test circuit provided in one embodiment;

[0059] Figure 3B A schematic diagram of a performance testing environment provided in an embodiment;

[0060] Figure 4 A schematic diagram of a process for determining evaluation index values ​​corresponding to each performance degradation parameter in an embodiment;

[0061] Figure 5A A schematic diagram of a process for determining evaluation index values ​​corresponding to each performance degradation parameter in another embodiment;

[0062] Figure 5B is a curve showing changes of dark current value, ground fault current value and short circuit instantaneous current value monitored in an embodiment over time;

[0063] Figure 5CA voltage-current characteristic curve obtained by monitoring in one embodiment;

[0064] Figure 5D is a curve showing the change of noise value monitored over time in an embodiment;

[0065] Figure 6 A schematic diagram of a flow chart of evaluating the performance degradation of a detector to be tested in one embodiment;

[0066] Figure 7 A schematic diagram of a flow chart of a single photon detector performance evaluation method in another embodiment;

[0067] Figure 8 is a structural block diagram of a single photon detector performance evaluation device in one embodiment;

[0068] Fig. 9 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0069] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0070] The single photon detector performance evaluation method provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown, the control device 101 is used to execute the single-photon detector performance evaluation method provided in the embodiment of the present application, that is, to control the detector to be tested 102 and the performance test circuit 103; the detector to be tested 102 may be a single-photon detector, and the performance test circuit is used to test the performance of the detector to be tested. Optionally, the control device 101 connects the detector to be tested 102 (i.e., a single-photon detector) to the performance test circuit 103 to build a performance test environment; according to the preset working voltage range of the detector to be tested, a voltage is applied to the detector to be tested in the performance test environment to put the detector to be tested in a working state; when the detector to be tested is in a working state, the sampling frequency corresponding to each performance degradation parameter of the detector to be tested is used to sample the electrical parameters of the detector to be tested respectively, and obtain the electrical time series corresponding to each performance degradation parameter; wherein the electrical parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter; according to the electrical time series corresponding to each performance degradation parameter, an evaluation index value corresponding to each performance degradation parameter is determined; according to the evaluation index value corresponding to each performance degradation parameter, the performance degradation of the detector to be tested is evaluated.

[0071] In one embodiment, Figure 2 As shown, a single photon detector performance evaluation method is provided, and the method is applied to Figure 1 The control device 101 in the embodiment is taken as an example to illustrate, and specifically includes the following steps:

[0072] S201, connecting the detector to be tested to the performance test circuit to build a performance test environment.

[0073] The performance test circuit is a pre-built circuit environment; the performance test environment is a circuit environment built according to the detector to be tested and used to test the performance of the detector to be tested. In the embodiment of the present application, the detector to be tested is a single photon detector.

[0074] For example, the performance test circuit can be as follows Figure 3A As shown, the performance test circuit includes a voltage regulator G, a protection resistor R C , voltmeter V R And the ammeter I D ; and the positive electrode of the voltage-stabilizing source is connected to the first end of the protective resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protective resistor is connected to the second end of the voltmeter.

[0075] Optionally, according to the circuit principle of the performance test circuit, the detector to be tested is connected to a pre-built performance test circuit to obtain a performance test environment for testing the performance of the detector to be tested.

[0076] For example, in Figure 3A Based on the performance test circuit shown in FIG. 1 , the positive electrode of the detector DUT to be tested is connected to the second terminal of the ammeter, and the negative electrode of the detector to be tested is connected to the second terminal of the voltmeter to build a performance test environment; Figure 3B As shown, the voltage stabilizer, the protection resistor, the detector to be tested and the ammeter are connected in series in sequence, the voltmeter is connected in parallel at both ends of the detector to be tested to monitor the voltage of the detector to be tested, and the ammeter is used to monitor the current flowing through the detector to be tested. It should be noted that the performance test environment also includes a light shield, wherein the detector to be tested is located in the light shield. It can be understood that placing the detector to be tested in the light shield can ensure that the detector to be tested is not exposed to light.

[0077] S202, applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state.

[0078] The preset operating voltage range is a preset range of the operating voltage of the detector to be tested, and the preset operating voltage range is generally related to the material of the detector to be tested; for example, for a silicon-based single-photon detector, the linear region of the preset operating voltage range is generally 0-30V. For an InGaAs single-photon detector, the linear region of the preset operating voltage range is generally 0-60V.

[0079] Optionally, within the preset working voltage range of the detector to be tested, the voltage regulator is controlled to generate a voltage to apply voltage to the detector to be tested so that the detector to be tested is in working state. Exemplarily, according to different test requirements of the detector to be tested, the voltage can be gradually increased within the preset working voltage range.

[0080] S203, when the detector to be tested is in working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters.

[0081] Among them, the performance degradation parameter is a parameter that characterizes the degree of performance degradation of the detector under test. The electrical quantity parameter includes the current flowing through the detector under test and the voltage across the two ends of the detector under test. The electrical quantity time series includes the voltage value and the current value arranged in time sequence. It should be noted that different performance parameters correspond to different sampling frequencies.

[0082] Understandably, dark current, breakdown voltage, and noise are critical degradation parameters of the detector, which have a significant impact on the performance of the detector. Dark current is the current in the detector when there is no photon irradiation, and its increase is a clear sign of performance degradation. The increase in dark current not only increases the power consumption of the detector, but may also introduce additional noise, thereby reducing the signal-to-noise ratio of the detection signal. The breakdown voltage is the voltage required for avalanche breakdown of the single photon avalanche diode (SPAD). As the detector is used, the breakdown voltage may drift, causing the detector's operating point to deviate from the optimal state, which in turn affects the detection efficiency and stability. Noise is the unwanted part of the detector's output signal, which may come from thermal noise, shot noise, or defects inside the detector. Performance degradation will lead to an increase in noise levels, making it more difficult for the detector to detect weak light signals and reducing detection accuracy. An increase in dark current is often accompanied by an increase in noise levels, and there is a close correlation between the two. High dark current and noise levels will jointly limit the dynamic range and sensitivity of the detector, reducing its performance in practical applications. The change of breakdown voltage not only affects the stability of the detector, but also may affect the detection efficiency by changing the conditions of avalanche breakdown. The drift of breakdown voltage may cause the detector to become insensitive to photons, thereby reducing the detection efficiency. During the use of the detector, continuous monitoring of degradation parameters such as dark current, breakdown voltage and noise is crucial to timely detect performance degradation, predict detector life and formulate maintenance strategies.

[0083] Noise is a key parameter in the performance of single-photon detectors, and its influence is mainly reflected in the following three aspects: ① Reduced signal-to-noise ratio: The increase in noise will significantly reduce the signal-to-noise ratio of the detector, making the useful signal submerged in the background noise and difficult to accurately extract, thereby affecting the detection accuracy and reliability of the detector. ② Limited detection efficiency: High noise levels will limit the detection efficiency of the detector, especially in weak light signal detection scenarios. The interference of noise makes it difficult for the detector to distinguish between real photon signals and background noise, resulting in a decrease in detection efficiency. ③ Performance evaluation and optimization: The noise level is one of the important indicators for measuring detector performance. By reducing noise, the overall performance of the detector can be significantly improved. Therefore, in an embodiment of the present application, various performance degradation parameters may include dark current parameters, breakdown voltage parameters, and noise parameters.

[0084] Optionally, when the detector to be tested is in a working state, the voltage and current of the detector to be tested are sampled according to the sampling frequencies corresponding to each performance degradation parameter, and the electrical quantity time series corresponding to each performance degradation parameter is constructed based on the voltage and current values ​​obtained by sampling at different sampling frequencies.

[0085] S204: Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter.

[0086] The evaluation index corresponding to each performance degradation parameter is the index that can characterize the performance degradation parameter, and the evaluation index value is the value of the evaluation index. The evaluation index corresponding to each performance degradation parameter can be one or more, and there is no limitation here.

[0087] Exemplarily, in the embodiments of the present application, the evaluation index values ​​corresponding to the dark current parameters include but are not limited to the dark current value, the ground fault current value and the short-circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include but are not limited to the breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include but are not limited to the noise value.

[0088] Optionally, for each performance degradation parameter, an evaluation index value corresponding to the performance degradation parameter may be calculated based on the parameter characteristics of the performance degradation parameter and according to the voltage value and current value in the electrical quantity time series corresponding to the performance degradation parameter.

[0089] S205 , evaluating the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter.

[0090] Optionally, a comprehensive analysis can be performed on the evaluation index values ​​corresponding to each performance degradation parameter; for example, the error between the evaluation index value corresponding to each performance degradation parameter and the corresponding evaluation index theoretical value can be calculated, and the errors corresponding to each performance degradation parameter can be summed, and then the performance degradation of the detector to be tested can be evaluated based on the obtained sum.

[0091] In the above-mentioned single-photon detector performance evaluation method, a performance test environment is built by connecting the detector to be tested to a performance test circuit, and a voltage is applied to the detector to be tested in the performance test environment according to a preset working voltage range of the detector to be tested, so that the detector to be tested is in a working state, thereby ensuring the flexibility of the performance test environment and the performance test process; further, when the detector to be tested is in a working state, the sampling frequencies corresponding to the various performance degradation parameters of the detector to be tested are used to sample the electrical parameters of the detector to be tested respectively, and the electrical time series corresponding to the various performance degradation parameters are obtained, thereby realizing online real-time monitoring of the current and voltage of the detector to be tested, and the sampling frequency is flexibly adjustable; finally, according to the electrical time series corresponding to the various performance degradation parameters, the evaluation index values ​​corresponding to the determined performance degradation parameters are guaranteed, thereby further ensuring the accuracy of the evaluation results of the performance degradation of the detector to be tested.

[0092] Optionally, in order to ensure the evaluation index value corresponding to each performance degradation parameter determined, in one embodiment, as Figure 4As shown, a method for determining the evaluation index value corresponding to each performance degradation parameter is provided to refine the above S204, specifically including the following steps:

[0093] S401, determining a voltage-current characteristic curve of the detector to be tested at a sampling frequency corresponding to each performance degradation parameter according to a time series of electric quantity corresponding to each performance degradation parameter.

[0094] The voltage-current characteristic curve is a characteristic curve that represents the corresponding relationship between voltage and current.

[0095] Optionally, for any performance degradation parameter, the voltage and current values ​​at the same time can be obtained based on the electrical quantity time series corresponding to the performance degradation parameter; further, based on the voltage and current values ​​at the same time, a fitting tool can be used to fit the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the performance degradation parameter.

[0096] S402, determining an evaluation index value corresponding to each performance degradation parameter according to a voltage-current characteristic curve of the detector to be tested at a sampling frequency corresponding to each performance degradation parameter.

[0097] Optionally, for any performance degradation parameter, characteristics related to the evaluation index of the performance degradation parameter are extracted from the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to the performance degradation parameter, such as voltage change characteristics, current change characteristics, current characteristics at a specific voltage value, etc., and the evaluation index value corresponding to the performance degradation parameter is determined based on the extracted characteristics.

[0098] In this embodiment, since the electrical quantity time series corresponding to each performance degradation parameter is the voltage value and current value sorted by time, and the change of the voltage value and the current value over time can reflect the characteristics of the detector to be tested to a certain extent, the accuracy of the evaluation index value corresponding to each determined performance degradation parameter is guaranteed.

[0099] Exemplarily, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value and the short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameter include the noise value. On this basis, in one embodiment, Figure 5A As shown, a method for determining the evaluation index value corresponding to each performance degradation parameter is provided to refine the above S402, specifically including the following steps:

[0100] S501, based on the test standard corresponding to the dark current parameter, and according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter, determine the dark current value, the ground fault current value and the short-circuit instantaneous current value.

[0101] Among them, the test standard corresponding to the dark current parameter indicates the voltage selection standard during the test of the dark current parameter; the dark current value (Id) refers to the unidirectional current flowing through the detector to be tested under the action of external voltage under no light conditions; the ground fault current value (ig) is the current caused by the direct contact of the equipment or line with the ground; the short-circuit instantaneous current value (is) refers to the instantaneous current when the short-circuit current reaches its maximum value when a short-circuit fault occurs in the circuit.

[0102] Optionally, based on the test standard corresponding to the dark current parameter, the dark current value of the detector to be tested can be extracted from the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; at the same time, the current when the detector to be tested is in a ground fault is extracted as the ground fault current value; further, when the detector to be tested is in a short circuit fault, the instantaneous current of the maximum short-circuit current is extracted as the short-circuit instantaneous current value.

[0103] For example, Figure 5B As shown, it is a curve showing the changes of the monitored dark current value, ground fault current value and short circuit instantaneous current value with time. Figure 5B In the curve graph in , the horizontal axis is time, the vertical axis is current, Id represents dark current, ig represents ground fault current value, and is represents short circuit instantaneous current value.

[0104] S502, based on the test standard corresponding to the breakdown voltage, and according to the voltage-current characteristic curve of the detector to be tested at a sampling frequency corresponding to the breakdown current parameter, determine the breakdown voltage value.

[0105] The breakdown voltage is the voltage at which the dielectric suddenly loses its insulation capacity and discharges when the dielectric exceeds a certain critical value under the action of voltage. The breakdown voltage is related to the type, thickness and use environment of the material.

[0106] Optionally, based on the test standard corresponding to the breakdown voltage, that is, the judgment condition of the breakdown voltage, and combined with the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter, the voltage value corresponding to the current value can be determined according to the current value when the detector to be tested discharges, and the voltage value corresponding to the current value can be further used as the breakdown voltage.

[0107] For example, Figure 5C As shown, it is the voltage-current characteristic curve monitored in the embodiment of the present application, that is, the curve of voltage changing with current. Figure 5C The horizontal axis vd of the middle curve is voltage, and the vertical axis Id is current. Figure 5CThe curve graphs in are respectively the current change curve when the voltage is in the range of (-100, 1), the current change curve when the voltage is in the range of (-10-1), the current change curve when the voltage is in the range of (-100, -60), and the current change curve when the voltage is in the range of (-60, -30).

[0108] S503, determining voltage change information and current change information of the voltage to be measured at the sampling frequency corresponding to the noise parameter according to the voltage-current characteristic curve of the detector to be measured at the sampling frequency corresponding to the noise parameter.

[0109] The voltage change information represents the change of voltage; the current change information represents the change of current.

[0110] Optionally, a statistical analysis can be performed on the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameters to obtain the change in voltage value at each sampling moment and the change in current value at each sampling moment at the sampling frequency corresponding to the noise parameters, and generate voltage change information and current change information respectively.

[0111] S504, determining the noise value of the detector under positive pressure, the noise value under zero bias, and the noise value under negative pressure according to the voltage change information and the current change information.

[0112] Among them, the noise value under the positive pressure state is the noise when the voltage of the detector to be tested is positive; the noise value under the zero bias state is the noise value when the detector to be tested is in the zero bias state; the noise value under the negative pressure state is the noise value when the detector to be tested is in the negative pressure state.

[0113] Optionally, the voltage change information and current change information of the detector to be tested in a positive pressure state, the voltage change information and current change information in a zero bias state, and the voltage change information and current change information in a negative pressure state can be extracted from the voltage change information and the current change information respectively; further, based on the voltage change information and the current change information in each state, the noise value of the detector to be tested in each state can be determined.

[0114] For example, Figure 5D , which is a curve showing the change of noise value over time obtained by monitoring in an embodiment of the present application. Figure 5D The horizontal axis of the middle curve is frequency, and the vertical axis is noise value. Figure 5D The curves in the figure are the noise curve when the voltage is 0.5, the noise curve when the voltage is -1, the noise curve when the voltage is -10, and the noise curve when the voltage is 0.

[0115] In this embodiment, the voltage-current characteristic curve of the detector to be tested is comprehensively considered, and the evaluation index values ​​of the dark current parameter, the breakdown voltage parameter and the noise parameter are calculated respectively, thereby ensuring the accuracy of the evaluation index values ​​of the determined performance degradation parameters.

[0116] Optionally, in order to ensure the accuracy of the degradation performance evaluation result of the detector to be tested, in one embodiment, Figure 6 As shown, a method for evaluating the performance degradation of a detector to be tested is provided to refine the above S205, specifically comprising the following steps:

[0117] S601, determining a first performance degradation result of a dark current parameter according to an evaluation index value corresponding to the dark current parameter.

[0118] Among them, the first degradation performance result characterizes the degradation of the dark current parameter.

[0119] Optionally, a comparative analysis may be performed based on the evaluation index value corresponding to the dark current parameter and the theoretical value of the dark current parameter, and based on the analysis result, a first performance degradation result of the dark current parameter may be determined.

[0120] Exemplarily, the first performance degradation degree can be graded, for example, into a low performance degradation degree, a medium performance degradation degree and a high performance degradation degree; further, an error threshold is set for each first performance degradation degree, and the first performance degradation result of the dark current parameter is determined based on the error between the evaluation index value corresponding to the dark current parameter and the theoretical value.

[0121] S602: Determine a second performance degradation result of the breakdown voltage parameter according to the evaluation index value corresponding to the breakdown voltage parameter.

[0122] The second degradation performance result characterizes the degradation of the breakdown voltage parameter.

[0123] Optionally, a comparative analysis may be performed based on the evaluation index value corresponding to the breakdown voltage parameter and the theoretical value of the breakdown voltage parameter, and a second performance degradation result of the breakdown voltage parameter may be determined based on the analysis result.

[0124] Exemplarily, the second performance degradation degree can be graded, for example, into a low performance degradation degree, a medium performance degradation degree and a high performance degradation degree; further, an error threshold is set for each second performance degradation degree, and the second performance degradation result of the breakdown voltage parameter is determined based on the error between the evaluation index value corresponding to the breakdown voltage parameter and the theoretical value.

[0125] For example, for a silicon-based single-photon detector, the theoretical value of the breakdown voltage is generally 20-30 V. For an InGaAs single-photon detector, the theoretical value of the breakdown voltage is generally 55-65 V.

[0126] S603: Determine a third performance degradation result corresponding to the noise parameter according to the evaluation index value corresponding to the noise parameter.

[0127] The third degradation performance result characterizes the degradation of the noise parameter.

[0128] Optionally, a comparative analysis may be performed based on the evaluation index value corresponding to the noise parameter and the theoretical value of the noise parameter, and a third performance degradation result of the noise parameter may be determined based on the analysis result.

[0129] Exemplarily, the third performance degradation degree can be graded, for example, into a low performance degradation degree, a medium performance degradation degree and a high performance degradation degree; further, an error threshold is set for each third performance degradation degree, and the third performance degradation result of the noise parameter is determined based on the error between the evaluation index value corresponding to the noise parameter and the theoretical value.

[0130] S604: Evaluate the performance degradation of the detector to be tested according to the first performance degradation result, the second performance degradation result, and the third performance degradation result.

[0131] Optionally, the first performance degradation result, the second performance degradation result and the third performance degradation result are comprehensively analyzed. For example, the degradation value in the first performance degradation result, the degradation value in the second performance degradation result and the degradation value in the third performance degradation result are accumulated, and the performance degradation of the detector to be tested is evaluated based on the accumulated value.

[0132] In this embodiment, by comprehensively considering the performance degradation results of different performance parameters, that is, introducing the first degradation result, the second degradation result and the third degradation result, the comprehensiveness and accuracy of the evaluation of the performance degradation of the detector to be tested are guaranteed.

[0133] Figure 7 FIG. 2 is a flow chart of a method for evaluating the performance of a single photon detector in another embodiment. Based on the above embodiment, this embodiment provides an optional example of a method for evaluating the performance of a single photon detector. Figure 7 The specific implementation process is as follows:

[0134] S701, connect the detector to be tested to the performance test circuit to build a performance test environment.

[0135] The performance test circuit includes a voltage regulator, a protection resistor, a voltmeter and an ammeter. The positive electrode of the voltage regulator is connected to the first end of the protection resistor, the negative electrode of the voltage regulator is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protection resistor is connected to the second end of the voltmeter. The detector to be tested is a single photon detector.

[0136] Optionally, the positive electrode of the detector to be tested is connected to the second end of the ammeter, and the negative electrode of the detector to be tested is connected to the second end of the voltmeter.

[0137] Optionally, the performance test environment further includes a light shield, wherein the detector to be tested is located inside the light shield.

[0138] S702, applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so as to put the detector under test in a working state.

[0139] S703 , when the detector to be tested is in working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters.

[0140] Among them, the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter.

[0141] S704, determining a voltage-current characteristic curve of the detector to be tested at a sampling frequency corresponding to each performance degradation parameter according to the electrical quantity time series corresponding to each performance degradation parameter.

[0142] S705, based on the test standard corresponding to the dark current parameter, and according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter, determine the dark current value, the ground fault current value and the short-circuit instantaneous current value.

[0143] S706, based on the test standard corresponding to the breakdown voltage, and according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter, determine the breakdown voltage value.

[0144] S707, determining voltage change information and current change information of the voltage to be measured at the sampling frequency corresponding to the noise parameter according to the voltage-current characteristic curve of the detector to be measured at the sampling frequency corresponding to the noise parameter.

[0145] S708, determining the noise value of the detector under positive pressure, the noise value under zero bias, and the noise value under negative pressure according to the voltage change information and the current change information.

[0146] S709, determining a first performance degradation result of a dark current parameter according to the dark current value, the ground fault current value and the short circuit instantaneous current value.

[0147] S710, determining a second performance degradation result of a breakdown voltage parameter according to the breakdown voltage value.

[0148] S711: Determine a third performance degradation result corresponding to the noise parameter according to the noise value.

[0149] S712: Evaluate the performance degradation of the detector to be tested according to the first performance degradation result, the second performance degradation result, and the third performance degradation result.

[0150] The specific process of S701-S712 above can refer to the description of the above method embodiment, and its implementation principle and technical effect are similar, which will not be repeated here.

[0151] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0152] Based on the same inventive concept, the embodiment of the present application also provides a single photon detector performance evaluation device for implementing the single photon detector performance evaluation method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in the one or more single photon detector performance evaluation device embodiments provided below can refer to the limitations of the single photon detector performance evaluation method above, and will not be repeated here.

[0153] In an exemplary embodiment, Figure 8 As shown, a single photon detector performance evaluation device 800 is provided, comprising: an environment building module 810, a voltage applying module 820, an information determining module 830, an index evaluation module 840 and a performance evaluation module 850, wherein:

[0154] The environment building module 810 is used to connect the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single photon detector.

[0155] The voltage applying module 820 is used to apply voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so as to put the detector under test into working state.

[0156] The information determination module 830 is used to sample the electrical parameters of the detector to be tested respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested when the detector to be tested is in a working state, so as to obtain the electrical time series corresponding to the performance degradation parameters; wherein the electrical parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter.

[0157] The indicator evaluation module 840 is used to determine the evaluation indicator value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter.

[0158] The performance evaluation module 850 is used to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter.

[0159] The above-mentioned single-photon detector performance evaluation device builds a performance test environment by connecting the detector to be tested to a performance test circuit, and applies voltage to the detector to be tested in the performance test environment according to a preset working voltage range of the detector to be tested, so that the detector to be tested is in a working state, thereby ensuring the flexibility of the performance test environment and the performance test process; further, when the detector to be tested is in a working state, the sampling frequencies corresponding to the various performance degradation parameters of the detector to be tested are used to sample the electrical parameters of the detector to be tested respectively, and the electrical time series corresponding to the various performance degradation parameters are obtained, thereby realizing online real-time monitoring of the current and voltage of the detector to be tested, and the sampling frequency is flexibly adjustable; finally, according to the electrical time series corresponding to the various performance degradation parameters, the evaluation index values ​​corresponding to the determined performance degradation parameters are guaranteed, thereby further ensuring the accuracy of the evaluation results of the performance degradation of the detector to be tested.

[0160] In one embodiment, the performance test circuit includes a voltage stabilizer, a protection resistor, a voltmeter and an ammeter; wherein the positive electrode of the voltage stabilizer is connected to the first end of the protection resistor, the negative electrode of the voltage stabilizer is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protection resistor is connected to the second end of the voltmeter;

[0161] Accordingly, the environment building module 810 is specifically used for:

[0162] Connect the positive pole of the detector to be tested to the second terminal of the ammeter, and connect the negative pole of the detector to be tested to the second terminal of the voltmeter.

[0163] In one embodiment, the performance test environment further includes a light shield; wherein the detector to be tested is located inside the light shield.

[0164] In one embodiment, the indicator evaluation module 840 includes:

[0165] The curve determination unit is used to determine the voltage and current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter according to the electrical quantity time series corresponding to each performance degradation parameter.

[0166] The index evaluation unit is used to determine the evaluation index value corresponding to each performance degradation parameter according to the voltage and current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter.

[0167] In one embodiment, the evaluation index values ​​corresponding to the dark current parameters include dark current value, ground fault current value and short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include noise value.

[0168] In one embodiment, the indicator evaluation unit is specifically used to:

[0169] Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter; based on the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the noise parameter, the voltage change information and the current change information of the voltage to be tested at the sampling frequency corresponding to the noise parameter are determined; based on the voltage change information and the current change information, the noise value of the detector to be tested in the positive pressure state, the noise value in the zero bias state, and the noise value in the negative pressure state are determined.

[0170] In one embodiment, the performance evaluation module 850 is specifically used to:

[0171] According to the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; according to the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; according to the evaluation index value corresponding to the noise parameter, the third performance degradation result corresponding to the noise parameter is determined; according to the first performance degradation result, the second performance degradation result and the third performance degradation result, the performance degradation of the detector to be tested is evaluated.

[0172] Each module in the above-mentioned single-photon detector performance evaluation device can be implemented in whole or in part by software, hardware, or a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0173] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Fig. 9 As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a single-photon detector performance evaluation method is implemented.

[0174] Those skilled in the art will understand that Fig. 9 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0175] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0176] Connecting the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0177] Applying voltage to the detector under test in the performance test environment according to the preset working voltage range of the detector under test, so that the detector under test is in working state;

[0178] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage at both ends of the detector to be tested; and each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0179] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0180] According to the evaluation index value corresponding to each performance degradation parameter, the performance degradation of the detector to be tested is evaluated.

[0181] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0182] The positive electrode of the voltage-stabilizing source is connected to the first end of the protective resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protective resistor is connected to the second end of the voltmeter; accordingly, when the processor executes the computer program to connect the detector to be tested to the performance test circuit, the following steps are also implemented:

[0183] Connect the positive pole of the detector to be tested to the second terminal of the ammeter, and connect the negative pole of the detector to be tested to the second terminal of the voltmeter.

[0184] In one embodiment, the performance test environment further includes a light shield; wherein the detector to be tested is located inside the light shield.

[0185] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter, the following steps are also implemented:

[0186] According to the electrical quantity time series corresponding to each performance degradation parameter, the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter is determined; according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined.

[0187] In one embodiment, the evaluation index values ​​corresponding to the dark current parameters include dark current value, ground fault current value and short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include noise value.

[0188] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the following steps are also implemented:

[0189] Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter; based on the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the noise parameter, the voltage change information and the current change information of the voltage to be tested at the sampling frequency corresponding to the noise parameter are determined; based on the voltage change information and the current change information, the noise value of the detector to be tested in the positive pressure state, the noise value in the zero bias state, and the noise value in the negative pressure state are determined.

[0190] In one embodiment, when the processor executes the computer program to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter, the processor further implements the following steps:

[0191] According to the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; according to the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; according to the evaluation index value corresponding to the noise parameter, the third performance degradation result corresponding to the noise parameter is determined; according to the first performance degradation result, the second performance degradation result and the third performance degradation result, the performance degradation of the detector to be tested is evaluated.

[0192] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0193] Connecting the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0194] Applying voltage to the detector under test in the performance test environment according to the preset working voltage range of the detector under test, so that the detector under test is in working state;

[0195] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage at both ends of the detector to be tested; and each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0196] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0197] According to the evaluation index value corresponding to each performance degradation parameter, the performance degradation of the detector to be tested is evaluated.

[0198] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0199] The positive electrode of the voltage-stabilizing source is connected to the first end of the protective resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protective resistor is connected to the second end of the voltmeter; accordingly, when the processor executes the computer program to connect the detector to be tested to the performance test circuit, the following steps are also implemented:

[0200] Connect the positive pole of the detector to be tested to the second terminal of the ammeter, and connect the negative pole of the detector to be tested to the second terminal of the voltmeter.

[0201] In one embodiment, the performance test environment further includes a light shield; wherein the detector to be tested is located in the light shield.

[0202] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter, the following steps are also implemented:

[0203] According to the electrical quantity time series corresponding to each performance degradation parameter, the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter is determined; according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined.

[0204] In one embodiment, the evaluation index values ​​corresponding to the dark current parameters include dark current value, ground fault current value and short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include noise value.

[0205] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the following steps are also implemented:

[0206] Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter; based on the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the noise parameter, the voltage change information and the current change information of the voltage to be tested at the sampling frequency corresponding to the noise parameter are determined; based on the voltage change information and the current change information, the noise value of the detector to be tested in the positive pressure state, the noise value in the zero bias state, and the noise value in the negative pressure state are determined.

[0207] In one embodiment, when the processor executes the computer program to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter, the processor further implements the following steps:

[0208] According to the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; according to the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; according to the evaluation index value corresponding to the noise parameter, the third performance degradation result corresponding to the noise parameter is determined; according to the first performance degradation result, the second performance degradation result and the third performance degradation result, the performance degradation of the detector to be tested is evaluated.

[0209] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0210] Connecting the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector;

[0211] Applying voltage to the detector under test in the performance test environment according to the preset working voltage range of the detector under test, so that the detector under test is in working state;

[0212] When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage at both ends of the detector to be tested; and each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter;

[0213] Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter;

[0214] According to the evaluation index value corresponding to each performance degradation parameter, the performance degradation of the detector to be tested is evaluated.

[0215] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0216] The positive electrode of the voltage-stabilizing source is connected to the first end of the protective resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protective resistor is connected to the second end of the voltmeter; accordingly, when the processor executes the computer program to connect the detector to be tested to the performance test circuit, the following steps are also implemented:

[0217] Connect the positive pole of the detector to be tested to the second terminal of the ammeter, and connect the negative pole of the detector to be tested to the second terminal of the voltmeter.

[0218] In one embodiment, the performance test environment further includes a light shield; wherein the detector to be tested is located in the light shield.

[0219] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter, the following steps are also implemented:

[0220] According to the electrical quantity time series corresponding to each performance degradation parameter, the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter is determined; according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined.

[0221] In one embodiment, the evaluation index values ​​corresponding to the dark current parameters include dark current value, ground fault current value and short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include noise value.

[0222] In one embodiment, when the processor executes the computer program to determine the evaluation index value corresponding to each performance degradation parameter according to the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, the following steps are also implemented:

[0223] Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter; based on the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the noise parameter, the voltage change information and the current change information of the voltage to be tested at the sampling frequency corresponding to the noise parameter are determined; based on the voltage change information and the current change information, the noise value of the detector to be tested in the positive pressure state, the noise value in the zero bias state, and the noise value in the negative pressure state are determined.

[0224] In one embodiment, when the processor executes the computer program to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter, the processor further implements the following steps:

[0225] According to the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; according to the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; according to the evaluation index value corresponding to the noise parameter, the third performance degradation result corresponding to the noise parameter is determined; according to the first performance degradation result, the second performance degradation result and the third performance degradation result, the performance degradation of the detector to be tested is evaluated.

[0226] It should be noted that the data involved in this application (including but not limited to data used for analysis, storage, display, etc.) are all information and data fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0227] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0228] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0229] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A single photon detector performance evaluation method, characterized in that: The method comprises: Connecting the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single-photon detector; Applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so that the detector under test is in a working state; When the detector to be tested is in a working state, the electrical quantity parameters of the detector to be tested are sampled respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector to be tested, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector to be tested and the voltage across the two ends of the detector to be tested; and the performance degradation parameters include at least a dark current parameter, a breakdown voltage parameter and a noise parameter; Determine the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter; The performance degradation of the detector to be tested is evaluated according to the evaluation index value corresponding to each performance degradation parameter.

2. The method according to claim 1, characterized in that The performance test circuit includes a voltage stabilizer, a protection resistor, a voltmeter and an ammeter; The positive electrode of the voltage-stabilizing source is connected to the first end of the protection resistor, the negative electrode of the voltage-stabilizing source is connected to the first end of the voltmeter and the first end of the ammeter, and the second end of the protection resistor is connected to the second end of the voltmeter; Accordingly, the step of connecting the detector to be tested to the performance test circuit includes: The positive electrode of the detector to be tested is connected to the second end of the ammeter, and the negative electrode of the detector to be tested is connected to the second end of the voltmeter.

3. The method according to claim 2, characterized in that The performance test environment further includes a light shield, wherein the detector to be tested is located inside the light shield.

4. The method according to claim 1, characterized in that: Determining the evaluation index value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter includes: According to the electrical quantity time series corresponding to each performance degradation parameter, determining the voltage and current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter; According to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined.

5. The method according to claim 4, characterized in that The evaluation index values ​​corresponding to the dark current parameters include dark current value, ground fault current value and short circuit instantaneous current value, the evaluation index values ​​corresponding to the breakdown voltage parameters include breakdown voltage value, and the evaluation index values ​​corresponding to the noise parameters include noise value.

6. The method according to claim 5, characterized in that Determining the evaluation index value corresponding to each performance degradation parameter according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to each performance degradation parameter includes: Based on the test standard corresponding to the dark current parameter, the dark current value, the ground fault current value and the short-circuit instantaneous current value are determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the dark current parameter; Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage-current characteristic curve of the detector to be tested at the sampling frequency corresponding to the breakdown current parameter; Determine the voltage change information and current change information of the voltage to be measured at the sampling frequency corresponding to the noise parameter according to the voltage-current characteristic curve of the detector to be measured at the sampling frequency corresponding to the noise parameter; According to the voltage change information and the current change information, the noise value of the detector under test in a positive pressure state, the noise value in a zero bias state, and the noise value in a negative pressure state are determined.

7. The method according to claim 1, characterized in that The step of evaluating the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter includes: Determining a first performance degradation result of the dark current parameter according to an evaluation index value corresponding to the dark current parameter; Determining a second performance degradation result of the breakdown voltage parameter according to the evaluation index value corresponding to the breakdown voltage parameter; Determining a third performance degradation result corresponding to the noise parameter according to the evaluation index value corresponding to the noise parameter; The performance degradation of the detector to be tested is evaluated according to the first performance degradation result, the second performance degradation result and the third performance degradation result.

8. A single photon detector performance evaluation device, characterized in that: The device comprises: An environment building module, used to connect the detector to be tested to the performance test circuit to build a performance test environment; wherein the detector to be tested is a single photon detector; A voltage applying module, used for applying voltage to the detector under test in the performance test environment according to a preset working voltage range of the detector under test, so as to put the detector under test in a working state; An information determination module is used to sample the electrical quantity parameters of the detector under test respectively using the sampling frequencies corresponding to the performance degradation parameters of the detector under test when the detector under test is in a working state, so as to obtain the electrical quantity time series corresponding to the performance degradation parameters; wherein the electrical quantity parameters include the current flowing through the detector under test and the voltage across the two ends of the detector under test; and each performance degradation parameter includes at least a dark current parameter, a breakdown voltage parameter and a noise parameter; An indicator evaluation module is used to determine the evaluation indicator value corresponding to each performance degradation parameter according to the power time series corresponding to each performance degradation parameter; The performance evaluation module is used to evaluate the performance degradation of the detector to be tested according to the evaluation index value corresponding to each performance degradation parameter.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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