Integrated test device, method and system, electronic equipment and readable storage medium

Abstract

The invention discloses an integrated test device, method and system, electronic equipment and a readable storage medium, and the device comprises an upper computer, a signal output module, a switch switching module, a first load resistor, a second load resistor, a non-inductive resistor, a first tested equipment connecting end and a second tested equipment connecting end. The switch switching module comprises a first switch circuit, a second switch circuit and a switch control circuit. The upper computer is respectively connected with the signal output module and the switch control circuit; the first switch circuit is connected with the output end of the signal output module, the first switch circuit is connected with the first tested equipment connecting end through the non-inductive resistor, and the first switch circuit is connected with the steel rail side of the second tested equipment connecting end. And the second switching circuit is connected with the cable side of the connecting end of the second tested equipment, the first load resistor and the second load resistor. The first switching circuit switches connection according to the switching state, and the second switching circuit switches connection according to the switching state. The equipment testing efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the field of track equipment detection, and more specifically, to an integrated test device, method, system, electronic device, and readable storage medium. Background Art

[0002] The outdoor equipment of the ZPW-2000A track circuit can be divided into: matching equipment, tuning equipment, and hollow coil equipment according to the equipment function. Before the outdoor equipment of the ZPW-2000A track circuit is put into use, it needs to be tested. Since the test methods and principles of the matching equipment are different from those of the tuning equipment and the hollow coil equipment, and the test instruments are also different, it is difficult to share the hardware and data between the test devices of the outdoor equipment of the ZPW-2000A track circuit, and it is difficult to meet the improvement of test efficiency. In the current technology, the BT01 type test device can be used for testing, which can simultaneously meet the testing of matching equipment, tuning equipment, and hollow coil equipment. However, during the testing process, the BT01 type test device needs to manually toggle the switch and replace the condition box for testing different types of equipment, resulting in low equipment test efficiency. Summary of the Invention

[0003] In view of this, the present application provides an integrated test device, method, system, electronic device, and readable storage medium for solving the problem of low equipment test efficiency.

[0004] In order to achieve the above object, the following solutions are proposed:

[0005] An integrated test device, the integrated test device includes a host computer, a signal output module, a switch switching module, a first load resistor, a second load resistor, a non-inductive resistor, a first device under test connection end, and a second device under test connection end. The switch switching module includes a first switch circuit, a second switch circuit, and a switch control circuit. The switch control circuit is used to control the first switch circuit and the second switch circuit. The first device under test connection end is used to connect tuning equipment or hollow coil equipment, and the second device under test connection end is used to connect matching equipment;

[0006] The signal control output end of the host computer is connected to the input end of the signal output module, and the switch control output end of the host computer is connected to the switch control circuit;

[0007] The first output terminal and the second output terminal of the signal output module are test signal output terminals. The first output terminal, the second output terminal, the first terminal of the first device under test connection terminal, one end of the non-inductive resistor, the first rail-side terminal of the second device under test connection terminal, and the second rail-side terminal of the second device under test connection terminal are all connected to the first switching circuit. The other end of the non-inductive resistor is connected to the second terminal of the first device under test connection terminal;

[0008] When the first switching circuit is in the first switching state, the first output terminal is connected to the first terminal of the first device under test connection terminal, and the second output terminal is connected to one end of the non-inductive resistor;

[0009] When the first switching circuit is in the second switching state, the first output terminal is connected to the first rail-side terminal of the second device under test connection terminal, and the second output terminal is connected to the second rail-side terminal of the second device under test connection terminal;

[0010] Both ends of the first load resistor, both ends of the second load resistor, the first cable-side terminal of the second device under test connection terminal, and the second cable-side terminal of the second device under test connection terminal are connected to the second switching circuit;

[0011] When the second switching circuit is in the third switching state, both ends of the first load resistor are respectively connected to the first cable-side terminal and the second cable-side terminal;

[0012] When the second switching circuit is in the fourth switching state, both ends of the second load resistor are respectively connected to the first cable-side terminal and the second cable-side terminal.

[0013] Optionally, the first switching circuit is a first relay, and the second switching circuit is a second relay.

[0014] The first output terminal is connected to one moving contact in the moving contact group of the first relay, the second output terminal is connected to the other moving contact in the moving contact group of the first relay, the first terminal of the first device under test connection terminal is connected to one static contact in the first static contact group of the first relay, one end of the non-inductive resistor is connected to the other static contact in the first static contact group of the first relay, the first rail-side terminal of the second device under test connection terminal is connected to one static contact in the second static contact group of the first relay, and the second rail-side terminal of the second device under test connection terminal is connected to the other static contact in the second static contact group of the first relay;

[0015] The first terminal on the cable side of the second device under test connection is connected to one moving contact in the moving contact group of the second relay, and the second terminal on the cable side of the second device under test connection is connected to the other moving contact in the moving contact group of the second relay. Both ends of the first load resistor are respectively connected to two static contacts in the first static contact group of the second relay, and both ends of the second load resistor are respectively connected to two static contacts in the second static contact group of the second relay.

[0016] Optionally, the integrated test device further includes a signal acquisition device;

[0017] The input end of the signal acquisition device is connected to the target test device in the integrated test device, and the output end of the signal acquisition device is connected to the input end of the host computer. The target test device includes at least one of the first load resistor, the second load resistor, the non-inductive resistor, the first device under test, and the second device under test.

[0018] An integrated test method is applied to the integrated test device described in any one of the above. The integrated test method includes:

[0019] Determine the device type of the current device under test, where the device type is one of a tuning device, an air-core coil device, and a matching device;

[0020] When the device type is a tuning device or an air-core coil device, control the first switch circuit to be in the first switch state through the switch control circuit, and control the signal output module to output a first test signal for testing the tuning device or the air-core coil device;

[0021] When the device type is a matching device, control the first switch circuit to be in the second switch state through the switch control circuit, and based on the preset ratio of the rail side voltage value and the cable side voltage value of the matching device, control the switch state of the second switch circuit through the switch control circuit, and control the signal output module to output a second test signal for testing the matching device.

[0022] Optionally, the controlling the signal output module to output a first test signal for testing the tuning device or the air-core coil device includes:

[0023] Determine the output frequency of the first test signal according to the model information of the tuning device or the air-core coil device;

[0024] When the first switch circuit is in the first switch state, adjust the output voltage of the first test signal with the output frequency so that the magnitude of the current in the test circuit of the tuning device or the air-core coil device meets the test conditions;

[0025] After the magnitude of the current in the test circuit meets the test conditions, the tuning device or the air-core coil device is tested by the first test signal to obtain impedance data, and it is determined whether the impedance data meets the standard.

[0026] Optionally, controlling the switching state of the second switching circuit by the switching control circuit based on a preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device includes:

[0027] Determine the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device;

[0028] Determine the target load resistance according to the preset ratio;

[0029] When the target load resistance is the first load resistance, control the second switching circuit to be in the third switching state by the switching control circuit;

[0030] When the target load resistance is the second load resistance, control the second switching circuit to be in the fourth switching state by the switching control circuit.

[0031] Optionally, controlling the signal output module to output a second test signal for testing the matching device includes:

[0032] Determine the preset amplitude range of the second test signal, determine the frequency of the second test signal according to the preset ratio, and input the second test signal with the frequency from the rail side of the matching device to the matching device;

[0033] When the effective value of the current voltage value on the rail side falls within the preset amplitude range, test whether the voltage value on the cable side of the matching device meets the standard.

[0034] An integrated test system is applied to the integrated test device described in any one of the above. The integrated test system includes:

[0035] A type determination unit for determining the device type of the current test device, where the device type is one of a tuning device, an air-core coil device, and a matching device;

[0036] A first test unit for, when the device type is a tuning device or an air-core coil device, controlling the first switching circuit to be in the first switching state by the switching control circuit, and controlling the signal output module to output a first test signal for testing the tuning device or the air-core coil device;

[0037] A second test unit, configured to, when the device type is a matching device, control the first switch circuit to be in a second switch state through the switch control circuit, control the switch state of the second switch circuit through the switch control circuit based on a preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device, and control the signal output module to output a second test signal for testing the matching device.

[0038] An electronic device includes a memory and a processor;

[0039] The memory is used to store a program;

[0040] The processor is configured to execute the program to implement each step of the integrated test method described in any one of the above.

[0041] A readable storage medium stores a computer program, and when the computer program is executed by a processor, each step of the integrated test method described in any one of the above is implemented.

[0042] This application provides an integrated test device, method, system, electronic device, and readable storage medium. The integrated test device integrates the test components for testing different types of devices into different test modules respectively, and connects different test modules by controlling the first switch circuit and the second switch circuit. When performing device testing, the host computer controls the signal output module to output a test signal and directly controls the switch control circuit to switch the switches, without manually replacing the condition boxes for different types of devices, effectively improving the efficiency of device testing. Description of the Drawings

[0043] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on the provided drawings without creative efforts.

[0044] Figure 1 It is a schematic diagram of the test structure of a tuning device and a hollow coil device provided by an embodiment of the present application;

[0045] Figure 2 It is a schematic diagram of the test structure of a matching device provided by an embodiment of the present application;

[0046] Figure 3 It is a schematic diagram of the structure of an integrated test device provided by an embodiment of the present application;

[0047] Figure 4 It is a schematic diagram of the structure of another integrated test device provided by an embodiment of the present application;

[0048] Figure 5 It is a schematic flowchart of an integration test method provided by an embodiment of the present application;

[0049] Figure 6 It is a schematic structural diagram of an integration test system provided by an embodiment of the present application;

[0050] Figure 7 It is a hardware structure block diagram of an electronic device provided by an embodiment of the present application.

[0051] Reference numerals:

[0052] 001 - Host computer; 003 - Signal output module; R1 - First load resistor; R2 - Second load resistor; R3 - Non - inductive resistor; K1 - First switch circuit; K2 - Second switch circuit; 002 - Switch control circuit; D1 - First output terminal; D2 - Second output terminal; D3 - First terminal of the first device under test connection end; D4 - One end of the non - inductive resistor; D5 - First rail - side terminal; D6 - Second rail - side terminal; D7 - First cable - side terminal; D8 - Second cable - side terminal; D0 - Second terminal of the first device under test connection end; 100 - Type determination unit; 110 - First test unit; 120 - Second test unit; 70 - Electronic device; 701 - Processor; 702 - Memory; 703 - Bus. Detailed implementation manners

[0053] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0054] In the prior art, the test structures of tuning - type devices and air - core coil - type devices are as Figure 1 shown. The test process can be: according to the model of the device under test, set the output frequency of the frequency response analyzer, adjust the output voltage of the frequency response analyzer so that the current passing through the 0.1Ω non - inductive standard resistor meets the requirements of the test current magnitude under different test conditions (the test current magnitude can be measured by a digital multimeter), and read whether the real - part and imaginary - part data of the impedance of the test device displayed by the frequency response analyzer meet the requirements. Tuning - type devices can refer to devices that adjust and select frequencies; air - core coil - type devices can refer to electronic devices with an air - core coil as the core component.

[0055] The test structure of the matching device is as Figure 2As shown, a test signal or a frequency-shift signal is respectively sent to the rail side of the matching device, and a load is connected to the cable side of the matching device. When the voltage value on the rail side of the matching device meets the requirements (the voltage value on the rail side can be obtained by measuring with a digital multimeter), it is tested whether the voltage value on the cable side of the matching device meets the requirements (the voltage value on the cable side can be obtained by measuring with a digital multimeter). The matching device can be simply regarded as a transformer.

[0056] An embodiment of the present application provides an integrated test device, as Figure 3 shown. The integrated test device may include a host computer 001, a signal output module 003, a switch switching module, a first load resistor R1, a second load resistor R2, a non-inductive resistor R3, a first DUT connection end, and a second DUT connection end. The switch switching module may include a first switch circuit K1, a second switch circuit K2, and a switch control circuit 002. The switch control circuit 002 may be used to control the first switch circuit K1 and the second switch circuit K2. The first DUT connection end may be used to connect to a first DUT, and the first DUT connection end may be Figure 3 D0 and D3 connected to the first DUT in Figure 3 The first DUT may be a tuning device or a hollow coil device. The second DUT connection end may be used to connect to a second DUT, and the second DUT connection end may be

[0057] D5 to D8 connected to the second DUT in

[0058] The second DUT may be a matching device. Among them, the host computer 001 may refer to a computer or system that communicates and controls with a lower computer or other devices, and may be an independent computer for monitoring, configuring, controlling, and managing the operations of the lower computer or devices. In this embodiment, the host computer 001 may control the signal output module 003 to output a test signal, and may also control the switch switching module to switch the switch circuit. Among them, in this embodiment, the signal control output end of the host computer 001 may be connected to the input end of the signal output module 003, and the switch control output end of the host computer 001 may be connected to the switch control circuit 002 to realize the control of the switch control circuit 002 by the host computer. The signal output module 003 may be a module that outputs a test signal, and may include a signal generating device and a power amplifier, and may output corresponding test signals according to different DUTs. Figure 3As shown, the first switch circuit K1 can be equivalent to setting a relay in the circuit, or setting a double-pole double-throw switch, or setting two single-pole double-throw switches. The same applies to the second switch circuit K2. The switch control circuit 002 can refer to realizing the conduction or disconnection of the circuit by controlling the on-off state of the switch in the circuit. The switch control circuit 002 receives digital signals from the host computer 001 and independently controls the first switch circuit K1 and the second switch circuit K2 according to the digital signals.

[0059] The first load resistor R1 and the second load resistor R2 can be resistors used to connect to the cable side of the matching device to prevent the cable side from being unloaded during the test of the matching device, which may cause damage to the matching device. The resistance values of the first load resistor R1 and the second load resistor R2 can be different from each other. Optionally, in this embodiment, the resistance value of the first load resistor R1 can be 100 Ω, and the resistance value of the second load resistor R2 can be 200 Ω. The non-inductive resistor R3 can refer to a resistor with zero parasitic inductance and can be used to limit the current flowing through the tuning device or the air-core coil device. The resistance value of the non-inductive resistor R3 can be determined according to the actual test requirements. In an optional embodiment, a 0.1-Ω non-inductive resistor is used.

[0060] The first device under test connection end can be the connection end in the above integrated test device for connecting the tuning device or the air-core coil device; the second device under test connection end can be the connection end in the above integrated test device for connecting the matching device.

[0061] As Figure 3 shown, the first output terminal D1 and the second output terminal D2 of the signal output module 003 are test signal output terminals. The first output terminal D1, the second output terminal D2, the first terminal D3 of the first device under test connection end, one end D4 of the non-inductive resistor R3, the first rail side terminal D5 of the second device under test connection end, and the second rail side terminal D6 of the second device under test connection end are all connected to the first switch circuit K1. The other end of the non-inductive resistor R3 is connected to the second terminal D0 of the first device under test connection end.

[0062] Both ends of the first load resistor R1, both ends of the second load resistor R2, the first cable side terminal D7 of the second device under test connection end, and the second cable side terminal D8 of the second device under test connection end are all connected to the second switch circuit K2.

[0063] Among them, the first switch circuit K1 can be connected to the test circuit of a tuning device or an air-core coil device, or can be connected to the test circuit of a matching device. The second switch circuit K2 can be fixedly connected to the cable-side terminal of the second device under test and can be switched to connect to the first load resistor R1 or the second load resistor R2. The switch switching module can control the first switch circuit K1 to connect to the test circuit of a tuning device or an air-core coil device or a matching device; and can control the second switch circuit K2 to switch to connect to the first load resistor R1 and the second load resistor R2.

[0064] When the first switch circuit K1 is in the first switch state, the first output terminal D1 is connected to the first terminal D3 of the connection end of the first device under test, and the second output terminal D2 is connected to one end D4 of the non-inductive resistor R3;

[0065] When the first switch circuit K1 is in the second switch state, the first output terminal D1 is connected to the first rail-side terminal D5 of the connection end of the second device under test, and the second output terminal D2 is connected to the second rail-side terminal D6 of the connection end of the second device under test;

[0066] When the second switch circuit K2 is in the third switch state, both ends of the first load resistor R1 are respectively connected to the first cable-side terminal D7 and the second cable-side terminal D8;

[0067] When the second switch circuit K2 is in the fourth switch state, both ends of the second load resistor R2 are respectively connected to the first cable-side terminal D7 and the second cable-side terminal D8.

[0068] Among them, when testing a tuning device or an air-core coil device in this embodiment, the first switch circuit K1 can be controlled to be in the first switch state. When testing a matching device in this embodiment, the first switch circuit K1 can be controlled to be in the second switch state, and according to the load resistor requirement in the test condition, the second switch circuit K2 can be controlled to be in the third switch state or the fourth switch state.

[0069] Furthermore, when the first switch circuit K1 is a first relay and the second switch circuit K2 is a second relay. The connection relationship in this embodiment can be specifically:

[0070] The first output terminal D1 is connected to one moving contact in the moving contact group of the first relay, the second output terminal D2 is connected to another moving contact in the moving contact group of the first relay, the first terminal D3 of the first device under test connection end is connected to one static contact in the first static contact group of the first relay, one end D4 of the non-inductive resistor R3 is connected to another static contact in the first static contact group of the first relay, the first rail-side terminal D5 of the second device under test connection end is connected to one static contact in the second static contact group of the first relay, and the second rail-side terminal D6 of the second device under test connection end is connected to another static contact in the second static contact group of the first relay;

[0071] The first cable-side terminal D7 of the second device under test connection end is connected to one moving contact in the moving contact group of the second relay, the second cable-side terminal D8 of the second device under test connection end is connected to another moving contact in the moving contact group of the second relay, both ends of the first load resistor R1 are respectively connected to two static contacts in the first static contact group of the second relay, and both ends of the second load resistor R2 are respectively connected to two static contacts in the second static contact group of the second relay.

[0072] In the embodiment of the present application, an integrated test device is provided. The integrated test device integrates the test components for testing different types of devices into different test modules respectively, and controls the first switch circuit K1 and the second switch circuit K2 to connect different test modules. When performing device testing, the host computer 001 controls the signal output module 003 to output test signals, and directly controls the switch control circuit 002 to switch the switches, without manually replacing the condition boxes for different types of devices, effectively improving the efficiency of device testing.

[0073] As Figure 4 shown, in another integrated test device provided by the embodiment of the present application, the integrated test device may further include a signal acquisition device 006;

[0074] The input end of the signal acquisition device 006 is connected to the target test device in the integrated test device, and the output end of the signal acquisition device 006 is connected to the input end of the host computer 001. The target test device may include at least one of the first load resistor R1, the second load resistor R2, the non-inductive resistor R3, the first device under test, and the second device under test.

[0075] Among them, the signal acquisition device 006 can be a device for acquiring test data of a target test device. In this embodiment, the signal acquisition device 006 can acquire the voltage values at both ends of the first load resistor R1 or the second load resistor R2 to obtain the voltage value on the cable side of the matching device; the signal acquisition device 006 can also acquire the current at both ends of the non-inductive resistor R3 (the current can be directly acquired, or the voltage value can be acquired and calculated through Ohm's law) to determine the test current flowing through the first device under test. Of course, the signal acquisition device 006 can directly acquire the voltage value or current at both ends of the first device under test; the signal acquisition device 006 can also acquire the voltage value on the rail side in the second device under test to determine whether the voltage value on the rail side meets the test requirements. When the voltage value on the rail side meets the test requirements, it is tested whether the voltage value on the cable side in the second device under test meets the test requirements.

[0076] As Figure 5 shown, the embodiment of the present application also provides an integrated test method, which can be applied to the integrated test device in the above embodiment. The integrated test method may include:

[0077] S10. Determine the device type of the current test device, where the device type is one of a tuning device, a hollow coil device, and a matching device;

[0078] S11. When the device type is a tuning device or a hollow coil device, control the first switch circuit to be in the first switch state through the switch control circuit, and control the signal output module to output a first test signal for testing the tuning device or the hollow coil device;

[0079] S12. When the device type is a matching device, control the first switch circuit to be in the second switch state through the switch control circuit, control the switch state of the second switch circuit based on the preset ratio of the voltage values on the rail side and the cable side of the matching device, and control the signal output module to output a second test signal for testing the matching device.

[0080] Among them, the sequence of steps in this embodiment does not limit the sequence of the test process.

[0081] When testing the tuning device or the hollow coil device in this embodiment, the host computer can control the first switch circuit to be in the first switch state through the switch switching module, and control the test signal output terminal of the signal output module to output a first test signal for testing the tuning device or the hollow coil device.

[0082] Specifically, the host computer can determine the output frequency of the first test signal according to the model information of the tuning device or the air-core coil device. When the first switching circuit is in the first switching state, adjust the output voltage of the first test signal with the output frequency so that the magnitude of the current in the test circuit of the tuning device or the air-core coil device meets the test conditions. After the magnitude of the current in the test circuit meets the test conditions, test the tuning device or the air-core coil device with the first test signal, obtain impedance data, and determine whether the impedance data meets the standard.

[0083] Among them, the impedance data can refer to the data related to the impedance of the tuning device. Specifically, it can include the pole impedance data and zero impedance data of the tuning device; it can also refer to the data related to the impedance of the air-core coil device. Specifically, it can include the real part data of the impedance (which can represent the resistance part in the circuit) and the imaginary part data (which can represent the reactance part in the circuit). Since different models of tuning devices or air-core coil devices correspond to different test signal frequencies, the output frequency of the first test signal can be determined according to the model information of the tuning device or the air-core coil device. Similarly, different models of tuning devices or air-core coil devices also correspond to different test currents. Optionally, it can be determined according to the test data table in Table 1.

[0084] Table 1 Test Data Table

[0085]

[0086]

[0087] When testing the matching device in this embodiment, the host computer can control the first switching circuit to be in the second switching state through the switch control circuit, and based on the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device, control the switching state of the second switching circuit through the switch control circuit, and control the signal output module to output the second test signal for testing the matching device.

[0088] Specifically, the second test signal can be divided into a sine signal and a frequency-shift signal. The host computer can first control the first switching circuit to be in the second switching state through the switch control circuit, and then determine the target load resistance according to the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device determined in advance, and determine the switching state of the second switching circuit according to the target load resistance. Specifically, when the target load resistance is the first load resistance, control the second switching circuit to be in the third switching state through the switch control circuit; when the target load resistance is the second load resistance, control the second switching circuit to be in the fourth switching state through the switch control circuit.

[0089] After both the first switch circuit and the second switch circuit are connected, the host computer determines the preset amplitude range of the second test signal, determines the frequency of the second test signal according to the preset ratio, and inputs the second test signal with the frequency from the rail side of the matching device to the matching device; when the effective value of the current voltage value on the rail side falls within the preset amplitude range, it is tested whether the voltage value on the cable side of the matching device meets the standard.

[0090] Among them, the test requirements of the matching device can be shown in the test condition table of Table 2.

[0091] Table 2 Test Condition Table

[0092] Test signal frequency Preset amplitude range Preset ratio Target load resistance Cable-side voltage value range 40 Hz sine signal 1.5 V ± 0.1 V 1:9 100 Ω 7～11V 40 Hz sine signal 1.5 V ± 0.1 V 1：12 200 Ω 10～13.5V 40 Hz sine signal 1.5 V ± 0.1 V 1：13.5 200 Ω 9～13.5V 2000 Hz frequency-shift signal 3 V ± 0.1 V 1:9 100 Ω 14.5～17V 2600 Hz frequency-shift signal 3 V ± 0.1 V 1：12 200 Ω 24～28V 2000 Hz frequency-shift signal 3 V ± 0.1 V 1：13.5 200 Ω 28.5～34V

[0093] The embodiment of the present application adopts an integrated test method. Through this integrated test method, the above integrated test device can be controlled to realize the rapid test of the device to be tested, and the efficiency of device test can be effectively improved.

[0094] Corresponding to an integrated test method provided by the embodiment of the present application, the embodiment of the present application also provides an integrated test system.

[0095] As Figure 6 shown, the embodiment of the present application also provides an integrated test system, which can be applied to the integrated test device in the above embodiment. The integrated test system may include:

[0096] A type determination unit 100, configured to determine the device type of the current test device, and the device type is one of a tuning device, a hollow coil device, and a matching device;

[0097] A first test unit 110, configured to, when the device type is a tuning device or a hollow coil device, control the first switch circuit to be in a first switch state through a switch control circuit, and control the signal output module to output a first test signal for testing the tuning device or the hollow coil device;

[0098] A second test unit 120, configured to, when the device type is a matching device, control the first switch circuit to be in a second switch state through the switch control circuit, control the switch state of the second switch circuit based on the preset ratio of the rail side voltage value and the cable side voltage value of the matching device, and control the signal output module to output a second test signal for testing the matching device.

[0099] In another integrated test system provided by an embodiment of the present application, in the first test unit 110, control the signal output module to output a first test signal for testing the tuning device or the air-core coil device, which can be specifically configured as follows:

[0100] Determine the output frequency of the first test signal according to the model information of the tuning device or the air-core coil device;

[0101] When the first switch circuit is in the first switch state, adjust the output voltage of the first test signal with the output frequency so that the magnitude of the current in the test circuit of the tuning device or the air-core coil device meets the test conditions;

[0102] After the magnitude of the current in the test circuit meets the test conditions, test the tuning device or the air-core coil device with the first test signal to obtain impedance data, and determine whether the impedance data meets the standard.

[0103] In another integrated test system provided by an embodiment of the present application, in the second test unit 120, based on a preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device, control the switch state of the second switch circuit through a switch control circuit, which can be specifically configured as follows:

[0104] Determine the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device;

[0105] Determine the target load resistance according to the preset ratio;

[0106] When the target load resistance is the first load resistance, control the second switch circuit to be in the third switch state through the switch control circuit;

[0107] When the target load resistance is the second load resistance, control the second switch circuit to be in the fourth switch state through the switch control circuit.

[0108] In another integrated test system provided by an embodiment of the present application, in the second test unit 120, control the signal output module to output a second test signal for testing the matching device, which can be specifically configured as follows:

[0109] Determine the preset amplitude range of the second test signal, determine the frequency of the second test signal according to the preset ratio, and input the second test signal with the frequency from the rail side of the matching device to the matching device;

[0110] When the effective value of the current voltage value on the rail side falls within the preset amplitude range, test whether the voltage value on the cable side of the matching device meets the standard.

[0111] So far, the test process of the complete integrated test system provided by the embodiments of the present application is completed.

[0112] The integrated test system responds to the user's operation to select the model of the device under test for this test, and receives the test information input by the user (information such as test date, test department, test personnel, and test indicators);

[0113] Scan to obtain the device number of the device under test (the test information of the devices under test of the same model is the same, and there is no need to input repeatedly);

[0114] Determine the type of the device under test according to the model of the device under test, and control the first switch circuit and the second switch circuit through the switch control circuit according to the type of the device under test to complete the connection of the circuit;

[0115] Control the output of the test signal according to the type of the device under test (control the amplitude and frequency of the test signal);

[0116] When the test conditions are met (for tuning devices or air-core coil devices: the test current magnitude in the test circuit is reached; for matching devices: the rail-side voltage value falls within the preset amplitude range), collect the test data. If the test conditions are not met, continue to adjust the test signal;

[0117] Judge whether the test data is qualified. If the test data is qualified, automatically save the test report and prompt to scan and input the next device under test; if the test data is unqualified, pause the test and debug the device under test, and the user manually clicks to retest.

[0118] If a device under test has multiple functions at the same time (for example, a device under test has both the functions of a tuning device and a matching device at the same time), the integrated test system can divide each function into a test item and test. When the test data is collected for a test item, the integrated test system can automatically switch to the next test item to continue the test.

[0119] As Figure 7 shown, the embodiments of the present application provide an electronic device 70, including at least one processor 701, and at least one memory 702 and a bus 703 connected to the processor 701; wherein, the processor 701 and the memory 702 complete communication with each other through the bus 703; the processor 701 is used to call the program instructions in the memory 702 to execute the above integrated test method. The electronic device 70 herein can be a server, a PC, a PAD, etc.

[0120] The embodiments of the present application also provide a readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, each step of the above-mentioned any integrated test method is implemented.

[0121] This application is described with reference to the flowcharts and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the present application. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and combinations of flows and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to the processors of general purpose computers, special purpose computers, embedded processors, or other programmable data processing devices to produce a machine, such that the instructions executed by the processors of the computer or other programmable data processing devices produce means for implementing the functions specified in one Figure 1 flow or multiple flows and / or blocks Figure 1 or in one block or multiple blocks.

[0122] In a typical configuration, the device includes one or more processors (CPUs), a memory, and a bus. The device may also include an input / output interface, a network interface, etc.

[0123] The memory may include non-permanent memory in the form of computer-readable storage media, random access memory (RAM), and / or non-volatile memory such as read-only memory (ROM) or flash RAM, and the memory includes at least one storage chip. The memory is an example of a computer-readable medium.

[0124] Computer-readable storage media includes both permanent and non-permanent, removable and non-removable media that can store information by any method or technology. The information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile discs (DVD) or other optical storage, magnetic cassettes, magnetic disk storage or other magnetic storage devices, or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include transitory media such as modulated data signals and carrier waves.

[0125] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

[0126] It should be noted that, in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. It should also be noted that the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements not only includes those elements, but also includes other elements not expressly listed, or also includes elements inherent to such process, method, commodity or device. Without further limitation, an element defined by the statement "including one..." does not exclude the existence of additional identical elements in the process, method, commodity or device including the element.

[0127] Each embodiment in this specification is described in a related manner. For the same or similar parts among the embodiments, reference can be made to each other. Each embodiment focuses on the differences from other embodiments. In particular, for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the method embodiment.

[0128] The above are only the embodiments of the present application and are not used to limit the present application. For those skilled in the art, various changes and modifications can be made to the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included within the scope of the claims of the present application.

Claims

1. An integrated test device, characterized in that, the integrated test device includes a host computer, a signal output module, a switch switching module, a first load resistor, a second load resistor, a non-inductive resistor, a first device under test connection end and a second device under test connection end. The switch switching module includes a first switch circuit, a second switch circuit and a switch control circuit. The switch control circuit is used to control the first switch circuit and the second switch circuit. The first device under test connection end is used to connect a tuning device or an air-core coil device, and the second device under test connection end is used to connect a matching device; the signal control output end of the host computer is connected to the input end of the signal output module, and the switch control output end of the host computer is connected to the switch control circuit; the first output end and the second output end of the signal output module are test signal output ends. The first output end, the second output end, the first terminal of the first device under test connection end, one end of the non-inductive resistor, the first rail-side terminal of the second device under test connection end and the second rail-side terminal of the second device under test connection end are all connected to the first switch circuit. The other end of the non-inductive resistor is connected to the second terminal of the first device under test connection end; when the first switch circuit is in the first switch state, the first output end is connected to the first terminal of the first device under test connection end, and the second output end is connected to one end of the non-inductive resistor; when the first switch circuit is in the second switch state, the first output end is connected to the first rail-side terminal of the second device under test connection end, and the second output end is connected to the second rail-side terminal of the second device under test connection end; both ends of the first load resistor, both ends of the second load resistor, the first cable-side terminal of the second device under test connection end and the second cable-side terminal of the second device under test connection end are all connected to the second switch circuit; when the second switch circuit is in the third switch state, both ends of the first load resistor are respectively connected to the first cable-side terminal and the second cable-side terminal; when the second switch circuit is in the fourth switch state, both ends of the second load resistor are respectively connected to the first cable-side terminal and the second cable-side terminal.

2. The integrated test device according to claim 1, characterized in that, the first switch circuit is a first relay, and the second switch circuit is a second relay, The first output terminal is connected to one moving contact in the moving contact group of the first relay, the second output terminal is connected to the other moving contact in the moving contact group of the first relay, the first terminal of the first device under test connection terminal is connected to one static contact in the first static contact group of the first relay, one end of the non-inductive resistor is connected to the other static contact in the first static contact group of the first relay, the first rail-side terminal of the second device under test connection terminal is connected to one static contact in the second static contact group of the first relay, and the second rail-side terminal of the second device under test connection terminal is connected to the other static contact in the second static contact group of the first relay; The first cable-side terminal of the second device under test connection terminal is connected to one moving contact in the moving contact group of the second relay, the second cable-side terminal of the second device under test connection terminal is connected to the other moving contact in the moving contact group of the second relay, both ends of the first load resistor are respectively connected to two static contacts in the first static contact group of the second relay, and both ends of the second load resistor are respectively connected to two static contacts in the second static contact group of the second relay.

3. The integrated test device according to claim 1, characterized in that, the integrated test device further includes a signal acquisition device; The input end of the signal acquisition device is connected to the target test device in the integrated test device, the output end of the signal acquisition device is connected to the input end of the host computer, and the target test device includes at least one of the first load resistor, the second load resistor, the non-inductive resistor, the first device under test, and the second device under test.

4. An integrated test method, characterized in that, applied to the integrated test device according to any one of claims 1 to 3, the integrated test method includes: determining the device type of the current test device, and the device type is one of a tuning device, a hollow coil device, and a matching device; When the device type is a tuning device or a hollow coil device, controlling the first switch circuit to be in the first switch state through the switch control circuit, and controlling the signal output module to output a first test signal for testing the tuning device or the hollow coil device; When the device type is a matching device, controlling the first switch circuit to be in the second switch state through the switch control circuit, based on a preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device, controlling the switch state of the second switch circuit through the switch control circuit, and controlling the signal output module to output a second test signal for testing the matching device.

5. The integrated test method according to claim 4, characterized in that, controlling the signal output module to output a first test signal for testing the tuning device or the hollow coil device includes: determining the output frequency of the first test signal according to the model information of the tuning device or the hollow coil device; When the first switch circuit is in the first switch state, adjust the output voltage of the first test signal having the output frequency so that the magnitude of the current in the test circuit of the tuning device or the air-core coil device meets the test conditions; After the magnitude of the current in the test circuit meets the test conditions, test the tuning device or the air-core coil device with the first test signal, obtain impedance data, and determine whether the impedance data meets the standard.

6. The integrated test method according to claim 4, wherein, The controlling the switching state of the second switch circuit by the switch control circuit based on the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device includes: Determine the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device; Determine the target load resistance according to the preset ratio; When the target load resistance is the first load resistance, control the second switch circuit to be in the third switch state by the switch control circuit; When the target load resistance is the second load resistance, control the second switch circuit to be in the fourth switch state by the switch control circuit.

7. The integrated test method according to claim 4, wherein, The controlling the signal output module to output a second test signal for testing the matching device includes: Determine the preset amplitude range of the second test signal, determine the frequency of the second test signal according to the preset ratio, and input the second test signal having the frequency from the rail side of the matching device to the matching device; When the effective value of the current voltage value on the rail side falls within the preset amplitude range, test whether the voltage value on the cable side of the matching device meets the standard.

8. An integrated test system, wherein, Applied to the integrated test device according to any one of claims 1 to 3, the integrated test system includes: A type determination unit for determining the device type of the current test device, and the device type is one of a tuning device, an air-core coil device, and a matching device; A first test unit for, when the device type is a tuning device or an air-core coil device, controlling the first switch circuit to be in the first switch state by the switch control circuit, and controlling the signal output module to output a first test signal for testing the tuning device or the air-core coil device; A second test unit for, when the device type is a matching device, controlling the first switch circuit to be in the second switch state by the switch control circuit, controlling the switching state of the second switch circuit based on the preset ratio of the rail-side voltage value and the cable-side voltage value of the matching device, and controlling the signal output module to output a second test signal for testing the matching device.

9. An electronic device, wherein, Comprises a memory and a processor; The memory is used for storing programs; The processor is used for executing the programs to implement each step of the integrated test method according to any one of claims 4-7.

10. A readable storage medium, on which a computer program is stored, characterized in that, when the computer program is executed by a processor, it implements each step of the integration test method according to any one of claims 4-7.

Images