Power module testing device and method
By using a power module test device in the controllable phase exchange flow valve IGBT module, and using the combination of control circuit and test power, the module is fully detected, which solves the IGBT module detection problem in the prior art and ensures effective evaluation of module performance.
Patent Information
- Application Number
- CN202311606772.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-11-28
- Publication Date
- 2025-05-30
AI Technical Summary
The prior art is difficult to conduct comprehensive inspection of the controllable phase exchange flow valve IGBT module, which leads to the inability to effectively determine whether the module meets the design requirements during production and operation.
A power module testing device is provided, including a control circuit and multiple test power supplies. By controlling the status of each test power supply, switching and combining, and adjusting the output voltage of each power supply, various types of testing of the power module are realized.
It realizes all-round detection of the IGBT module of the controllable phase exchange flow valve, which can effectively judge the electrical path, energy acquisition function, turn-off and other performance of the module, and ensures the correctness of module design and production.
Smart Images
Figure CN120064810A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical fields of power generation, power transmission and transformation, and particularly relates to a power module testing device and method. Background Art
[0002] The commutation valve plays an important role in the AC-DC power transmission conversion and is the core equipment of the high-voltage DC power transmission project. The conventional commutation valve based on the line-commutated-converter (LCC) has the advantages of large transmission capacity, long transmission distance, and low comprehensive cost, and is the mainstream technology adopted in current projects. However, the LCC is composed of thyristors in series and can only control the turn-on. It must rely on the power grid to provide a reverse voltage to turn off. When the AC fault causes a voltage drop, the reverse voltage is insufficient and it will turn on again, and commutation failure will inevitably occur. After the commutation failure occurs, when the other arm of the same phase in the converter is triggered to turn on, it will cause the upper and lower arms to conduct simultaneously to form a DC short circuit, resulting in the DC power dropping to zero. At the same time, the large changes in the DC current and trigger angle cause reactive power fluctuations in the converter, with an amplitude reaching 40%-50% of the commutation capacity, which will pose a serious threat to the stable operation of the power grid. Only by proposing a new converter topology is it possible to fundamentally avoid the occurrence of commutation failure.
[0003] The controllable line-commutated-converter (CLCC) is a forced commutation component intervention type topology improved based on the LCC converter. Usually, a high-power IGBT (Insulate-Gate Bipolar Transistor) is introduced on the basis of the LCC converter as the forced commutation component. On the one hand, it maintains the advantages of the semi-controlled device thyristor with large capacity and good tolerance, and on the other hand, it incorporates the advantages of the fully-controlled device IGBT with fast triggering and full-controlled commutation. Controllable commutation is achieved through the hybrid use of fully-controlled and semi-controlled devices, and low loss and low cost are achieved through the alternating use of fully-controlled and semi-controlled devices, so as to realize the commutation failure defense of the converter under the constraints of multiple economic and technical indicators.
[0004] The controllable commutation valve based on the CLCC converter uses two high-power power electronic devices: thyristors and IGBTs. The IGBT module takes the IGBT device as the core and is configured with accessories such as device stress balance protection, device energy extraction, device drive, device control and communication. It is one of the most critical components in the controllable commutation valve, such as Figure 1As shown in the figure. On the one hand, the IGBT module in the controllable commutation converter valve is a brand-new component. In order to achieve the established forced commutation function of the controllable commutation converter valve, its comprehensive design in terms of electricity, structure, control, etc. is completely different from that of the IGBT module in the existing power system power electronic equipment. On the other hand, the operating conditions of the IGBT module in the controllable commutation converter valve are also brand-new, and there are no applicable specifications and standards for its test methods. Since the IGBT module is used in a large quantity in the controllable commutation converter valve, it becomes an inevitable choice to design a functional test device and method to detect the IGBT module to determine whether it meets the design requirements.
[0005] Currently, there is no test device and method in engineering that can effectively detect the functions of the IGBT module of the controllable commutation converter valve. During the production process of the controllable commutation converter valve, the test device needs to conduct a comprehensive inspection on the electrical path, power-taking function, driving function, etc. of the IGBT module to ensure the correctness of the design and production of the IGBT module. During the operation and maintenance process of the controllable commutation converter valve, it is necessary to identify the IGBT modules with abnormal functions. Therefore, it is necessary to propose a functional test device and method to solve the problem of detecting the IGBT module of the controllable commutation converter valve. Summary of the Invention
[0006] Therefore, the technical problem to be solved by the present invention is to solve the problem of how to comprehensively detect the IGBT module of the controllable commutation converter valve, thereby providing a power module test device and method.
[0007] To achieve the above object, the present invention provides the following technical solutions:
[0008] In the first aspect, the present invention provides a power module test device, including: a control circuit and multiple test power supplies. Among them, the first end of the control circuit is connected to the control end of each test power supply, and the second end of the control circuit is connected to the control end of the power module; the first end of each test power supply is connected to the first end of the power module, and the second end of each test power supply is grounded after being connected to the second end of the power module; during the test, the control circuit controls the state, switching and combination of each test power supply, and adjusts the output voltage of each power supply to achieve various types of tests on the power module.
[0009] The power module test device of the present invention includes a variety of test power supplies. The control circuit controls the switching and combination of each test power supply and adjusts the output voltage of each power supply to apply specific voltage stress to the power module and achieve various types of tests, thereby realizing a comprehensive detection of the power module.
[0010] In an alternative embodiment, the test types include: module electrical path test, power extraction function test, high-potential board monitoring function test, power module turn-on and turn-off test, power extraction system power-off state test, module voltage monitoring and overvoltage test, module overvoltage monitoring and recovery test under fault conditions, and board function recovery test.
[0011] In an alternative embodiment, the test power supplies include: an electrical path test power supply, an adjustable power supply, and a high-voltage stress detection power supply. Among them, the first end of the electrical path test power supply is connected to the first end of the power module, the second end of the electrical path test power supply is grounded after being connected to the second end of the power module, and the control end of the electrical path test power supply is connected to the first end of the control circuit; the electrical path test power supply is used to inject a precisely adjustable DC voltage stress into the power module, and the DC voltage application is not sufficient to activate the power extraction function of the power module; the first end of the adjustable power supply is connected to the first end of the power module, the second end of the adjustable power supply is grounded after being connected to the second end of the power module, and the control end of the adjustable power supply is connected to the first end of the control circuit; the adjustable power supply is used to inject a discontinuous voltage stress with a controllable duty cycle into the power module, and the discontinuous voltage stress can make the power module in a critical state of power extraction start; the first end of the high-voltage stress detection power supply is connected to the first end of the power module, the second end of the high-voltage stress detection power supply is grounded after being connected to the second end of the power module, and the control end of the high-voltage stress detection power supply is connected to the first end of the control circuit; the high-voltage stress detection circuit is used to inject a transient DC high-voltage stress into the power module within several microseconds, and the transient DC high-voltage stress can be used to monitor the power module.
[0012] In an alternative embodiment, the electrical path test power supply includes: a DC low-voltage power supply, a first direction changeover switch, a second direction changeover switch, a first measuring resistor, a second measuring resistor, and a first power electronic switch. Among them, the first end of the DC low-voltage power supply is connected to the first static terminal of the first direction changeover switch, and the second end of the DC low-voltage power supply is connected to the first static terminal of the second direction changeover switch; the first moving terminal of the first direction changeover switch is connected to the first end of the first measuring resistor, the first end of the first power electronic switch, and the first end of the power module, and the control end of the first direction changeover switch is connected to the first end of the control circuit; the first moving terminal of the second direction changeover switch is connected to the second end of the first measuring resistor, the second moving terminal of the second direction changeover switch is connected to the second moving terminal of the first direction changeover switch, the first end of the second measuring resistor, and the second end of the power module, and the control end of the second direction changeover switch is connected to the first end of the control circuit; the second end of the second measuring resistor is connected to the second end of the first power electronic switch; the control end of the first power electronic switch is connected to the first end of the control circuit.
[0013] In an alternative embodiment, the DC low-voltage power supply includes: a first DC power supply, a first current-limiting resistor, and a first diode. Wherein, the first end of the first DC power supply is connected to the first end of the first current-limiting resistor, and the second end of the first DC power supply is connected to the first static terminal of the second-direction changeover switch; the cathode of the first diode is connected to the first static terminal of the first-direction changeover switch, and the anode of the first diode is connected to the second end of the first current-limiting resistor.
[0014] In an alternative embodiment, the adjustable power supply includes: a second power electronic switch, a third power electronic switch, a second current-limiting resistor, and a test power supply. Wherein, the first end of the second power electronic switch is connected to the first end of the third power electronic switch, the second end of the second power electronic switch is connected to the first end of the second current-limiting resistor, and the control end of the second power electronic switch is connected to the first end of the control circuit; the second end of the third power electronic switch is connected to the first end of the power module, and the control end of the third power electronic switch is connected to the first end of the control circuit; the first end of the test power supply is connected to the second end of the second current-limiting resistor, and the second end of the test power supply is connected to the first end of the control circuit.
[0015] In an alternative embodiment, the high-voltage stress detection power supply includes: a disconnecting switch, a second DC power supply, a third current-limiting resistor, and a second diode. Wherein, the first end of the second DC power supply is connected to the first end of the third current-limiting resistor, and the second end of the second DC power supply is connected to the first end of the control circuit through the disconnecting switch; the cathode of the second diode is connected to the first end of the power module, and the anode of the second diode is connected to the second end of the third current-limiting resistor.
[0016] In an alternative embodiment, the power module test device further includes: a first switch, a second switch, a third switch, and a fourth switch. Wherein, the first end of the electrical path test power supply is connected to the second end of the power module through the first switch, and the second end of the electrical path test power supply is connected to the first end of the power module through the second switch; the first end of the adjustable power supply is connected to the second end of the power module through the third switch, and the second end of the adjustable power supply is connected to the first end of the power module through the fourth switch.
[0017] In an alternative embodiment, the control circuit includes: a power supply regulation unit, a power device trigger control unit, and a voltage and current acquisition unit. Wherein, the first end of the power supply regulation unit is connected to the control end of each test power supply, and the power supply regulation unit is used to control the input or cut-off of each test power supply; the first end of the power device trigger control unit is connected to the control end of each test power supply, and the power device trigger control unit is used to adjust the output voltage of each test power supply; the voltage and current acquisition unit is used to detect the voltage and current of each test power supply and the voltage and current of the power module.
[0018] In a second aspect, the present invention provides a method for testing a power module. Based on the device of the first aspect, the method includes: according to the test requirements, the control circuit forms different test circuits by controlling the switching on and off and combination of each test power supply and adjusting the output voltage of each power supply, so as to implement corresponding types of tests on the power module.
[0019] In an optional implementation manner, according to the test requirements, the power supply regulation unit controls the switching on or off of each test power supply, and the power device trigger control unit adjusts the output voltage of each test power supply, so as to implement any one or several combinations of module electrical path test, energy taking function test, high-potential board monitoring function test, power module on-off test, energy taking system power-off state test, module voltage monitoring and overvoltage test, module overvoltage monitoring and recovery test under fault, and board function recovery test on the power module.
[0020] The technical solution of the present invention has the following advantages:
[0021] Provided by the present invention BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the following drawings are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0023] Figure 1 It is a schematic structural diagram of the IGBT module of the controllable commutation converter valve provided by the embodiment of the present invention;
[0024] Figure 2 It is a composition diagram of a specific example of the test device provided by the embodiment of the present invention;
[0025] Figure 3 It is a composition diagram of another specific example of the test device provided by the embodiment of the present invention;
[0026] Figure 4 It is a specific circuit structure diagram of the electrical path test power supply provided by the embodiment of the present invention;
[0027] Figure 5 It is a specific circuit structure diagram of the adjustable energy supply power supply provided by the embodiment of the present invention;
[0028] Figure 6 It is a specific circuit structure diagram of the high-voltage stress detection power supply provided by the embodiment of the present invention;
[0029] Figure 7It is a component diagram of a specific example of the test device provided by the embodiment of the present invention. Detailed implementation manners
[0030] Next, the technical solutions of the present invention will be clearly and completely described in conjunction with the accompanying drawings. Obviously, the described embodiments are some, rather than all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.
[0031] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, the terms "first", "second", and "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.
[0032] In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and can also be the communication inside two elements. It can be a wireless connection or a wired connection. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.
[0033] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.
[0034] The embodiment of the present invention provides a power module test device, as Figure 2 shown, including: a control circuit 1 and a plurality of test power supplies 2.
[0035] As Figure 2 shown, the first end of the control circuit 1 is connected to the control end of each test power supply 2, and the second end of the control circuit 1 is connected to the control end of the power module; the first end of each test power supply 2 is connected to the first end of the power module, and the second end of each test power supply is grounded after being connected to the second end of the power module.
[0036] Specifically, the test device is connected to the electrical signal interface of the power module through the electrical signal interface and to the optical fiber communication interface of the power module through the optical fiber communication interface. The electrical signal interface is used to apply specific electrical stresses to the power module, and the optical fiber communication interface is used to monitor and control the electrical states of the power devices.
[0037] Specifically, during the test process, the control circuit 1 controls the switching on and off and combination of each test power supply 2 and adjusts the output voltage of each power supply to achieve various types of tests on the power module. The control circuit 1 realizes the microsecond-level switching between multiple test power supplies 2 according to the test requirements, applies specific stresses to both ends of the controllable commutation converter valve IGBT module (i.e., the power module) according to the time sequence set by the program, and changes the switching state of the IGBT device through the control circuit 1 of the device. Finally, based on the measured values of the voltage and current of the controllable commutation converter valve IGBT module by the acquisition unit, it is judged whether the functions of the IGBT module, stress balance protection, energy extraction, drive, control, and communication are normal.
[0038] In some alternative embodiments, the test types include: module electrical path test, energy extraction function test, high-potential board monitoring function test, power module turn-on and turn-off test, energy extraction system power-off state test, module voltage monitoring and overvoltage test, module overvoltage monitoring and recovery test under fault conditions, and board function recovery test.
[0039] Specifically, the module electrical path test is used to test the integrity of the parameters and electrical performance of each component inside the IGBT module; the energy extraction function test is used to test the integrity of the critical energy extraction function of the IGBT module; the high-potential board monitoring function test is used to test the integrity of the high-potential control board function of the IGBT module; the IGBT turn-on and turn-off test is used to test the integrity of the turn-on and turn-off functions of the IGBT device in the IGBT module; the energy extraction system power-off state test is used to test the integrity of the energy extraction power-off protection function of the IGBT module; the module voltage monitoring and overvoltage test is used to test the integrity of the overvoltage protection function of the IGBT module; the module overvoltage monitoring and recovery test under fault conditions is used to test the integrity of the overvoltage monitoring and recovery functions of the IGBT module; the board function recovery test is used to test the integrity of the energy extraction power-off recovery function of the IGBT module.
[0040] In some alternative embodiments, such as Figure 3As shown in the figure, the test power supply 2 includes: an electrical path test power supply 21, an adjustable energy supply power supply 22, and a high-voltage stress detection power supply 23. By controlling the three power supplies, the coordinated operation of each power supply is controlled. The control circuit 1 can flexibly modulate the combination forms of the stress outputs of the electrical path test power supply 21, the adjustable energy supply power supply 22, and the high-voltage stress detection power supply 23. The switching between the three power supplies is completed within microseconds, and different test circuits are formed by controlling the switching on and off, adjustment, and combination of the electrical path test power supply 21, the adjustable energy supply power supply 22, and the high-voltage stress detection power supply 23.
[0041] As Figure 3 shown in the figure, the first end of the electrical path test power supply 21 is connected to the first end of the power module, the second end of the electrical path test power supply 21 is connected to the second end of the power module and then grounded, and the control end of the electrical path test power supply 21 is connected to the first end of the control circuit 1; the electrical path test power supply 21 is used to inject a precisely adjustable DC voltage stress into the power module, and the DC voltage application is not sufficient to activate the energy-taking function of the power module.
[0042] As Figure 3 shown in the figure, the first end of the adjustable energy supply power supply 22 is connected to the first end of the power module, the second end of the adjustable energy supply power supply 22 is connected to the second end of the power module and then grounded, and the control end of the adjustable energy supply power supply 22 is connected to the first end of the control circuit 1; the adjustable energy supply power supply 22 is used to inject a discontinuous voltage stress with a controllable duty cycle into the power module, and the discontinuous voltage stress can make the power module in the critical state of energy-taking startup.
[0043] As Figure 3 shown in the figure, the first end of the high-voltage stress detection power supply 23 is connected to the second end of the power module, the second end of the high-voltage stress detection power supply 23 is connected to the second end of the power module and then grounded, and the control end of the high-voltage stress detection power supply 23 is connected to the first end of the control circuit 1; the high-voltage stress detection circuit is used to inject a transient DC high-voltage stress into the power module within several microseconds, and the transient DC high-voltage stress can realize the monitoring of the power module.
[0044] Specifically, the electrical path test power supply 21 can perform module electrical path tests on the power module; the adjustable energy supply power supply 22 can perform energy-taking function tests on the power module; the high-voltage stress detection power supply 23 can perform high-potential board card monitoring function tests on the power module; the adjustable energy supply power supply 22 and the high-voltage stress detection power supply 23 cooperate to perform power module on-off tests on the power module, or the adjustable energy supply power supply 22 alone performs power module on-off tests on the power module; the adjustable energy supply power supply 22 performs energy-taking system power-off state tests on the power module; the high-voltage stress detection power supply 23 performs module voltage monitoring and overvoltage tests, module overvoltage monitoring and recovery tests under faults, and board card function recovery tests on the power module.
[0045] Specifically, the control circuit realizes the microsecond-level switching of the electrical path test power supply, adjustable power supply, and high-voltage stress detection power supply, applies specific stress to both ends of the IGBT module of the controllable phase-shifting and commutation valve according to the timing set by the program, and changes the switching state of the IGBT device through the control circuit of the device. Finally, based on the measured values of the voltage and current of the IGBT module of the controllable phase-shifting and commutation valve by the acquisition unit, it is judged whether the functions of the IGBT module, stress balance protection, energy extraction, drive, control, and communication are normal.
[0046] In some alternative embodiments, such as Figure 4 shown, the electrical path test power supply 21 includes: a DC low-voltage power supply 212, a first direction changeover switch S1, a second direction changeover switch S2, a first measuring resistor R1, a second measuring resistor R2, and a first power electronic switch Q1. Among them, the first end of the DC low-voltage power supply 212 is connected to the first static end of the first direction changeover switch S1, and the second end of the DC low-voltage power supply 212 is connected to the first static end of the second direction changeover switch S2; the first moving end of the first direction changeover switch S1 is connected to the first end of the first measuring resistor R1, the first end of the first power electronic switch Q1, and the first end of the power module, and the control end of the first direction changeover switch S1 is connected to the first end of the control circuit 1; the first moving end of the second direction changeover switch S2 is connected to the second end of the first measuring resistor R1, the second moving end of the second direction changeover switch S2 is connected to the second moving end of the first direction changeover switch S1, the first end of the second measuring resistor R2, and the second end of the power module, and the control end of the second direction changeover switch S2 is connected to the first end of the control circuit 1; the second end of the second measuring resistor R2 is connected to the second end of the first power electronic switch Q1; the control end of the first power electronic switch Q1 is connected to the first end of the control circuit 1.
[0047] Specifically, the control circuit 1 changes the polarity of the test voltage by controlling the on-off states of the two direction changeover switches, outputs a precisely adjustable DC voltage stress by controlling the duty cycle of the first power electronic switch Q1, and the output stress is not sufficient to activate the energy extraction function of the IGBT module.
[0048] Optionally, such as Figure 4 shown, the DC low-voltage power supply 212 includes: a first DC power supply V1, a first current-limiting resistor R3, and a first diode D1. Among them, the first end of the first DC power supply V1 is connected to the first end of the first current-limiting resistor R3, and the second end of the first DC power supply V1 is connected to the first static end of the second direction changeover switch S2; the cathode of the first diode D1 is connected to the first static end of the first direction changeover switch S1, and the anode of the first diode D1 is connected to the second end of the first current-limiting resistor R3.
[0049] In some alternative embodiments, such as Figure 5As shown in the figure, the adjustable power supply 22 includes: a second power electronic switch Q2, a third power electronic switch Q3, a second current-limiting resistor R4, and a test power supply V2. Among them, the first end of the second power electronic switch Q2 is connected to the first end of the third power electronic switch Q3, the second end of the second power electronic switch Q2 is connected to the first end of the second current-limiting resistor R4, and the control end of the second power electronic switch Q2 is connected to the first end of the control circuit 1; the second end of the third power electronic switch Q3 is connected to the first end of the power module, and the control end of the third power electronic switch Q3 is connected to the first end of the control circuit 1; the first end of the test power supply V2 is connected to the second end of the second current-limiting resistor R4, and the second end of the test power supply V2 is connected to the first end of the control circuit 1.
[0050] Specifically, the control circuit 1 injects a discontinuous voltage stress with a controllable duty cycle into the IGBT module by controlling the duty cycles of the second power electronic switch Q2 and the third power electronic switch Q3, and the stress output can be in the critical state of energy extraction and startup of the IGBT module.
[0051] In some alternative embodiments, as Figure 6 shown, the high-voltage stress detection power supply 23 includes: a disconnector S3, a second DC power supply V3, a third current-limiting resistor R5, and a second diode D2. Among them, the first end of the second DC power supply V3 is connected to the first end of the third current-limiting resistor R5, and the second end of the second DC power supply V3 is connected to the first end of the control circuit 1 through the disconnector S3; the cathode of the second diode D2 is connected to the first end of the power module, and the anode of the second diode D2 is connected to the second end of the third current-limiting resistor R5.
[0052] Specifically, the high-voltage stress detection power supply 23 is a high-voltage DC power supply with a microsecond-level injection, which can inject a transient DC high-voltage stress into the IGBT module within several microseconds, and the stress output can be monitored by the device control circuit 1.
[0053] In some alternative embodiments, as Figure 7 shown, the power module test device further includes: a first switch K1, a second switch K2, a third switch K3, and a fourth switch K4. Among them, the first end of the electrical path test power supply 21 is connected to the second end of the power module through the first switch K1, and the second end of the electrical path test power supply 21 is connected to the first end of the power module through the second switch K2; the first end of the adjustable power supply 22 is connected to the second end of the power module through the third switch K3, and the fourth end of the adjustable power supply 22 is connected to the first end of the power module through the fourth switch K4.
[0054] Specifically, Figure 7 in, the control circuit 1 can realize power switching by controlling the first switch K1, the second switch K2, the third switch K3, and the fourth switch K4.
[0055] In some alternative embodiments, such as Figure 7 shown, the control circuit 1 includes: a power supply regulation unit, a power device trigger control unit, and a voltage and current acquisition unit. Among them, the first end of the power supply regulation unit is connected to the control end of each test power supply 2, and the power supply regulation unit is used to control the input or cut-off of each test power supply 2; the first end of the power device trigger control unit is connected to the control end of each test power supply 2, and the power device trigger control unit is used to adjust the output voltage of each test power supply 2; the voltage and current acquisition unit is used to detect the voltage and current of each test power supply 2, and the voltage and current of the power module.
[0056] An embodiment of the present invention provides a power module testing method. Based on the device of the above embodiment, the method includes: according to the test requirements, the control circuit 1 forms different test circuits by controlling the switching and combination of each test power supply 2 and adjusting the output voltage of each power supply, so as to implement corresponding types of tests on the power module.
[0057] In some alternative embodiments, according to the test requirements, the power supply regulation unit controls the input or cut-off of each test power supply 2, and the power device trigger control unit adjusts the output voltage of each test power supply 2, so as to implement any one or several combinations of module electrical path testing, energy extraction function testing, high-potential board monitoring function testing, power module on-off testing, energy extraction system power-off state testing, module voltage monitoring and overvoltage testing, module overvoltage monitoring and recovery testing under faults, and board function recovery testing on the power module.
[0058] Obviously, the above embodiments are merely examples given for clear illustration and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation manners here. And the obvious changes or modifications derived therefrom are still within the protection scope of the present invention.
Claims
1. A power module testing device, characterized in that, it includes: a control circuit and multiple test power supplies, where, the first end of the control circuit is connected to the control end of each test power supply, and the second end of the control circuit is connected to the control end of the power module; the first end of each test power supply is connected to the first end of the power module, and the second end of each test power supply is grounded after being connected to the second end of the power module; during the testing process, the control circuit adjusts the output voltage of each power supply by controlling the state, switching, and combination of each test power supply to achieve various types of tests on the power module.
2. The power module testing device according to claim 1, characterized in that, the test types include: module electrical path test, energy-taking function test, high-potential board monitoring function test, power module turn-on and turn-off test, energy-taking system power-off state test, module voltage monitoring and overvoltage test, module overvoltage monitoring and recovery test under fault, and board function recovery test.
3. The power module testing device according to claim 2, characterized in that, the test power supplies include: an electrical path test power supply, an adjustable energy supply power supply, and a high-voltage stress detection power supply, where, the first end of the electrical path test power supply is connected to the first end of the power module, the second end of the electrical path test power supply is grounded after being connected to the second end of the power module, and the control end of the electrical path test power supply is connected to the first end of the control circuit; the electrical path test power supply is used to inject a precisely adjustable DC voltage stress into the power module, and the DC voltage application is not sufficient to start the energy-taking function of the power module; the first end of the adjustable energy supply power supply is connected to the first end of the power module, the second end of the adjustable energy supply power supply is grounded after being connected to the second end of the power module, and the control end of the adjustable energy supply power supply is connected to the first end of the control circuit; the adjustable energy supply power supply is used to inject a discontinuous voltage stress with a controllable duty cycle into the power module, and the discontinuous voltage stress can make the power module in the critical state of energy-taking startup; the first end of the high-voltage stress detection power supply is connected to the first end of the power module, the second end of the high-voltage stress detection power supply is grounded after being connected to the second end of the power module, and the control end of the high-voltage stress detection power supply is connected to the first end of the control circuit; the high-voltage stress detection circuit is used to inject a transient DC high-voltage stress into the power module within several microseconds, and the transient DC high-voltage stress can realize the monitoring of the power module.
4. The power module testing device according to claim 3, characterized in that, the electrical path test power supply includes: a DC low-voltage power supply, a first direction change switch, a second direction change switch, a first measurement resistor, a second measurement resistor, and a first power electronic switch, where, the first end of the DC low-voltage power supply is connected to the first static end of the first direction change switch, and the second end of the DC low-voltage power supply is connected to the first static end of the second direction change switch; The first moving end of the first direction changeover switch is connected to the first end of the first measuring resistor, the first end of the first power electronic switch, and the first end of the power module. The control end of the first direction changeover switch is connected to the first end of the control circuit; The first moving end of the second direction changeover switch is connected to the second end of the first measuring resistor. The second moving end of the second direction changeover switch is connected to the second moving end of the first direction changeover switch, the first end of the second measuring resistor, and the second end of the power module. The control end of the second direction changeover switch is connected to the first end of the control circuit; The second end of the second measuring resistor is connected to the second end of the first power electronic switch; The control end of the first power electronic switch is connected to the first end of the control circuit.
5. The power module testing device according to claim 4, wherein, the DC low-voltage power supply includes: a first DC power supply, a first current-limiting resistor, and a first diode, where the first end of the first DC power supply is connected to the first end of the first current-limiting resistor, and the second end of the first DC power supply is connected to the first static end of the second direction changeover switch; the cathode of the first diode is connected to the first static end of the first direction changeover switch, and the anode of the first diode is connected to the second end of the first current-limiting resistor.
6. The power module testing device according to claim 3, wherein, the adjustable power supply includes: a second power electronic switch, a third power electronic switch, a second current-limiting resistor, and a test power supply, where the first end of the second power electronic switch is connected to the first end of the third power electronic switch, the second end of the second power electronic switch is connected to the first end of the second current-limiting resistor, and the control end of the second power electronic switch is connected to the first end of the control circuit; the second end of the third power electronic switch is connected to the first end of the power module, and the control end of the third power electronic switch is connected to the first end of the control circuit; the first end of the test power supply is connected to the second end of the second current-limiting resistor, and the second end of the test power supply is connected to the first end of the control circuit.
7. The power module testing device according to claim 3, wherein, the high-voltage stress detection power supply includes: a disconnecting switch, a second DC power supply, a third current-limiting resistor, and a second diode, where the first end of the second DC power supply is connected to the first end of the third current-limiting resistor, and the second end of the second DC power supply is connected to the first end of the control circuit through the disconnecting switch; the cathode of the second diode is connected to the first end of the power module, and the anode of the second diode is connected to the second end of the third current-limiting resistor.
8. The power module testing device according to claim 4, wherein, it further includes: a first switch, a second switch, a third switch, and a fourth switch, where The first end of the electrical path test power supply is connected to the second end of the power module through the first switch, and the second end of the electrical path test power supply is connected to the first end of the power module through the second switch; The first end of the adjustable power supply is connected to the second end of the power module through the third switch, and the second end of the adjustable power supply is connected to the first end of the power module through the fourth switch.
9. The power module testing device according to claim 8, characterized in that the control circuit includes: a power supply regulation unit, a power device trigger control unit, and a voltage and current acquisition unit, where the first end of the power supply regulation unit is connected to the control end of each test power supply, and the power supply regulation unit is used to control the input or cut-off of each test power supply; the first end of the power device trigger control unit is connected to the control end of each test power supply, and the power device trigger control unit is used to adjust the output voltage of each test power supply; the voltage and current acquisition unit is used to detect the voltage and current of each test power supply and the voltage and current of the power module.
10. A power module testing method, characterized in that based on the device according to any one of claims 1-9, the method includes: According to the test requirements, the control circuit forms different test circuits by controlling the switching and combination of each test power supply and adjusting the output voltage of each power supply, so as to implement corresponding types of tests on the power module.
11. The power module testing method according to claim 10, characterized in that According to the test requirements, the power supply regulation unit controls the input or cut-off of each test power supply, and the power device trigger control unit adjusts the output voltage of each test power supply, so as to implement any one or several combinations of module electrical path test, energy extraction function test, high-potential board monitoring function test, power module on-off test, energy extraction system power-off state test, module voltage monitoring and overvoltage test, module overvoltage monitoring and recovery test under fault, and board function recovery test on the power module.