Electrical performance detection method of metal sheet cutting type aluminum shell resistor

Abstract

The invention relates to the technical field of electronic component testing, in particular to an electrical property detection method of a metal sheet cutting type aluminum shell resistor, which comprises the following steps: respectively carrying out pin electrical property measurement on different point positions on two pins of the metal sheet cutting type aluminum shell resistor to obtain four detection curves; selecting two reference detection curves from the four detection curves; fitting the positions of which the distance between the two reference detection curves is smaller than a set distance threshold to obtain two fitting detection curves; determining the fitting position with the minimum distance between the two fitting detection curves as a two-pin conduction detection point; whether the positions of the two-pin conduction detection points fall into a preset conduction detection section or not is judged, if yes, it is determined that the metal sheet cutting type aluminum shell resistor is normal, if not, it is determined that the metal sheet cutting type aluminum shell resistor fails, the hyperbola matching screening and fitting technology is adopted, the influence of random factors is reduced, and the detection accuracy is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic component testing, and particularly relates to a method for detecting the electrical performance of a metal sheet cutting type aluminum shell resistor. Background Art

[0002] As a common high-power electronic component, the metal sheet cutting type aluminum shell resistor is widely used in multiple fields such as power electronics, communication equipment, medical equipment, and industrial control. Such resistors are usually made by cutting metal sheets and use an aluminum shell for heat dissipation and protection, featuring high power, good heat dissipation, and high stability. However, during actual production and use, due to the influence of factors such as materials, processes, and the environment, the metal sheet cutting type aluminum shell resistor may exhibit unstable performance or failure, seriously affecting product quality and use safety.

[0003] Existing resistor detection methods mainly include traditional single-point resistance measurement methods, high-temperature aging test methods, and infrared imaging detection methods, etc. These methods have certain limitations in practical applications: The traditional single-point resistance measurement method can only obtain electrical performance data at a single position and cannot comprehensively reflect the overall performance of the resistor; The high-temperature aging test method is time-consuming and inefficient and is not suitable for large-scale production detection; Although the infrared imaging detection method can reflect the temperature distribution characteristics of the resistor, it cannot directly evaluate its electrical performance. Therefore, developing a detection method that can comprehensively, quickly, and accurately evaluate the electrical performance of the metal sheet cutting type aluminum shell resistor has important practical significance. Summary of the Invention

[0004] The purpose of the present invention is to provide a method for detecting the electrical performance of a metal sheet cutting type aluminum shell resistor, aiming to solve the deficiencies of existing resistor detection methods in terms of comprehensiveness, accuracy, and efficiency, achieve precise evaluation of the electrical performance of the metal sheet cutting type aluminum shell resistor, and improve the reliability of product quality control.

[0005] The present invention proposes a method for detecting the electrical performance of a metal sheet cutting type aluminum shell resistor, including:

[0006] An acquisition step, including: performing pin electrical measurements at different points on the two pins of the metal sheet cutting type aluminum shell resistor to obtain four detection curves;

[0007] A processing step, including: selecting two reference detection curves from the four detection curves; performing fitting processing on the positions where the distance between the two reference detection curves is less than a set distance threshold to obtain two fitting detection curves; determining the fitting position with the minimum distance between the two fitting detection curves as the two-pin conduction detection point;

[0008] A judgment step, including: judging whether the position of the two-pin conduction detection point falls within a preset conduction detection section. If it falls within, it is determined that the metal sheet cut aluminum shell resistor is normal; otherwise, it is determined that the metal sheet cut aluminum shell resistor fails.

[0009] Preferably, the fitting process of the two reference detection curves in the processing step specifically includes:

[0010] Determining the detection positions corresponding to the inflection points where the curve slopes of the two reference detection curves change from positive to negative;

[0011] Judging whether the detection positions corresponding to the inflection points in the two reference detection curves meet a set distance threshold. If they meet, proceed to the next step; otherwise, determine the detection positions corresponding to the inflection points as the two-pin conduction detection points;

[0012] Performing curve fitting detection on the detection positions corresponding to the inflection points respectively to obtain two fitting detection curves.

[0013] Preferably, the judgment of whether the detection positions corresponding to the inflection points in the two reference detection curves meet a set distance threshold specifically includes:

[0014] Determining the position interval between the detection positions corresponding to the inflection points of the two reference detection curves;

[0015] Obtaining all the detection values within the curve region of the position interval;

[0016] Performing mean value processing on all the detection values to obtain the reference detection mean value of the position interval;

[0017] Obtaining the comparison result between the reference detection mean value and a set mean value threshold. If the reference detection mean value falls within the interval of the set mean value threshold, determine the position interval between the two end points as the two-pin conduction detection point.

[0018] Preferably, if the reference detection mean value exceeds the set mean value threshold, determine the detection position corresponding to the inflection point as the two-pin conduction detection point; if the reference detection mean value is lower than the set mean value threshold, determine the two detection positions at both ends where the reference detection mean value is lower than the set mean value threshold as the two-pin conduction detection points, and the two detection positions respectively fall within the intervals of a set position interval.

[0019] Preferably, the curve fitting detection of the detection positions corresponding to the inflection points respectively specifically includes:

[0020] Performing curve fitting initialization processing on the detection positions corresponding to the inflection points respectively;

[0021] Obtain the initialization result curve of the curve fitting initialization process;

[0022] Perform a slope judgment on the initialization result curve. If the slope of the initialization result curve is continuously greater than 1, and the distance from the starting point to the inflection point of the initialization result curve is within the set distance threshold, then perform a mean processing on all the detection values within the interval, and output the mean processing result as the detection value on the initialization result curve;

[0023] Fit two fitting detection curves through the detection values on the initialization result curve.

[0024] Preferably, if the slope of the initialization result curve is continuously greater than 3, and the distance from the starting point to the inflection point of the initialization result curve is within the set distance threshold, then perform a mean processing on all the detection values within the interval, and output the mean processing result as the detection value on the initialization result curve.

[0025] Preferably, the obtaining step specifically includes:

[0026] Take the length direction of the metal sheet cut aluminum shell resistor as the X-axis, set the first pin of the metal sheet cut aluminum shell resistor as the negative terminal, and the second pin of the metal sheet cut aluminum shell resistor as the positive terminal;

[0027] Contact different detection points on the first pin of the metal sheet cut aluminum shell resistor through a probe, and perform electrical measurements on the different detection points on the first pin and the same position points on the second pin respectively to obtain a first set of detection curves;

[0028] Contact the same position points on the first pin of the metal sheet cut aluminum shell resistor through a probe, and perform electrical measurements on the same position points on the first pin and different position points on the second pin respectively to obtain a second set of detection curves;

[0029] Contact different detection points on the second pin of the metal sheet cut aluminum shell resistor through a probe, and perform electrical measurements on the different detection points on the second pin and the same position points on the first pin respectively to obtain a third set of detection curves;

[0030] Contact the same position points on the second pin of the metal sheet cut aluminum shell resistor through a probe, and perform electrical measurements on the same position points on the second pin and different position points on the first pin respectively to obtain a fourth set of detection curves.

[0031] Preferably, the specifically including step of selecting two reference detection curves from the four detection curves is:

[0032] Obtain the detection values in the first group of detection curves, the second group of detection curves, the third group of detection curves, and the fourth group of detection curves;

[0033] Perform mean processing on the detection values to obtain the detection means of the first group of detection curves, the second group of detection curves, the third group of detection curves, and the fourth group of detection curves;

[0034] Compare two of the detection means. If the difference between the detection means is within the set detection threshold range, then use the two detection curves corresponding to the detection means as the reference detection curves.

[0035] Preferably, the judgment step specifically includes:

[0036] Perform mean processing on the reference detection curves, the fitting detection curves, and the detection points on the fitting detection curves to obtain the fitting detection means corresponding to the reference detection curves and the fitting detection curves;

[0037] Judge whether the reference detection curves, the fitting detection curves, and the fitting detection means of the fitting detection curves fall within a preset conduction detection section. If so, determine that the metal sheet cut aluminum shell resistor is normal; otherwise, determine that the metal sheet cut aluminum shell resistor fails.

[0038] Preferably, the set distance threshold is 2 - 10 mm, and the detection range of the conduction detection section is 35 - 70 Ω.

[0039] The electrical performance detection method for the metal sheet cut aluminum shell resistor provided by the present invention has the following beneficial effects through innovative technologies such as multi-point electrical measurement, reference curve selection, inflection point identification and curve fitting, and conduction section determination:

[0040] 1. Improve the comprehensiveness of detection: Obtain more comprehensive electrical performance data through multi-point electrical measurement of the two pins of the resistor;

[0041] 2. Improve the accuracy of detection: Adopt hyperbola matching screening and fitting technology to reduce the influence of random factors and improve the detection accuracy;

[0042] 3. Improve the detection efficiency: The fully automated measurement and determination process greatly improves the detection efficiency;

[0043] 4. Improve the detection adaptability: The adaptive conduction section determination makes the method applicable to resistors of different batches and different specifications;

[0044] 5. Achieve non-destructive detection: Realize a comprehensive evaluation of the performance of the resistor without damaging it. Description of the Drawings

[0045] Figure 1 This is a schematic flow diagram of the electrical performance detection method for the metal sheet cutting type aluminum shell resistor of the present invention;

[0046] Figure 2 This is a schematic diagram of the metal sheet cutting type aluminum shell resistor in the present invention;

[0047] Figure 3 This is a schematic diagram of multi - point electrical measurement in the present invention;

[0048] Figure 4 This is a schematic flow diagram of the selection process of the detection curve in the present invention;

[0049] Figure 5 This is a schematic diagram of inflection point identification and curve fitting in the present invention;

[0050] Figure 6 This is a schematic diagram of determining the conduction detection points of two pins in the present invention;

[0051] Figure 7 This is a schematic diagram of judging the conduction detection section in the present invention. Detailed implementation mode

[0052] Please refer to the attached Figure 1-7 , and the present invention will be further described in detail below with reference to the drawings and embodiments. However, the implementation modes of the present invention are not limited thereto.

[0053] As Figure 1 shown, the present invention provides an electrical performance detection method for a metal sheet cutting type aluminum shell resistor, including an acquisition step, a processing step, and a judgment step, which are specifically as follows:

[0054] Acquisition step: Conduct pin electrical measurements at different points on the two pins of the metal sheet cutting type aluminum shell resistor to obtain four detection curves.

[0055] As Figure 2 and Figure 3 shown, the metal sheet cutting type aluminum shell resistor generally consists of an aluminum shell, an internal metal sheet cutting type resistor body, and two end pins. In the acquisition step of the present invention, first, take the length direction of the metal sheet cutting type aluminum shell resistor as the X - axis, set the first pin of the metal sheet cutting type aluminum shell resistor as the negative end, and the second pin as the positive end. Then, perform multi - point electrical measurement through the probe contact method.

[0056] Specifically, the measurement is carried out through the following four combination methods:

[0057] 1. By contacting different detection points on the first lead of the metal sheet cut aluminum shell resistor with a probe, and electrically measuring the different detection points on the first lead respectively with the same position points on the second lead, a first group of detection curves is obtained;

[0058] 2. By contacting the same position points on the first lead of the metal sheet cut aluminum shell resistor with a probe, and electrically measuring the same position points on the first lead respectively with different position points on the second lead, a second group of detection curves is obtained;

[0059] 3. By contacting different detection points on the second lead of the metal sheet cut aluminum shell resistor with a probe, and electrically measuring the different detection points on the second lead respectively with the same position points on the first lead, a third group of detection curves is obtained;

[0060] 4. By contacting the same position points on the second lead of the metal sheet cut aluminum shell resistor with a probe, and electrically measuring the same position points on the second lead respectively with different position points on the first lead, a fourth group of detection curves is obtained.

[0061] This multi-point differential electrical measurement technology can comprehensively capture the electrical responses of the resistor at different points, form an electrical "fingerprint", and provide a comprehensive data basis for subsequent analysis.

[0062] Processing steps: Select two reference detection curves from the four detection curves; perform fitting processing on the positions where the distance between the two reference detection curves is less than the set distance threshold to obtain two fitted detection curves; determine the fitting position with the smallest distance between the two fitted detection curves as the two-lead conduction detection point.

[0063] As Figure 4 shown, the process of selecting two reference detection curves from the four detection curves specifically includes:

[0064] 1. Obtain the detection values in the first group of detection curves, the second group of detection curves, the third group of detection curves, and the fourth group of detection curves;

[0065] 2. Perform mean processing on the detection values to obtain the detection means of the four groups of detection curves;

[0066] 3. Compare two of the detection means. If the difference between the detection means is within the set detection threshold interval, then use the two detection curves corresponding to the detection means as the reference detection curves.

[0067] Preferably, the set detection threshold interval can be ±5%, and this interval value is determined based on a large amount of experimental data and can effectively screen out representative detection curves.

[0068] As Figure 5As shown, the process of fitting two reference detection curves specifically includes:

[0069] 1. Determine the detection positions corresponding to the inflection points where the curve slopes of the two reference detection curves change from positive to negative;

[0070] 2. Judge whether the detection positions corresponding to the inflection points in the two reference detection curves meet the set distance threshold. If they meet, proceed to the next step; otherwise, determine the detection position corresponding to the inflection point as the two-pin conduction detection point;

[0071] 3. Perform curve fitting detection on the detection positions corresponding to the inflection points respectively to obtain two fitting detection curves.

[0072] In this embodiment, the method for judging whether the detection positions corresponding to the inflection points meet the set distance threshold specifically includes:

[0073] 1. Determine the position interval between the detection positions corresponding to the inflection points of the two reference detection curves;

[0074] 2. Obtain all the detection values within the curve region of the position interval;

[0075] 3. Perform mean processing based on all the detection values to obtain the reference detection mean of the position interval;

[0076] 4. Obtain the comparison result between the reference detection mean and the set mean threshold. If the reference detection mean falls within the interval of the set mean threshold, determine the position interval between the two endpoints as the two-pin conduction detection point.

[0077] It should be noted that if the reference detection mean exceeds the set mean threshold, determine the detection position corresponding to the inflection point as the two-pin conduction detection point; if the reference detection mean is lower than the set mean threshold, determine the two detection positions at both ends where the reference detection mean is lower than the set mean threshold as the two-pin conduction detection points, and these two detection positions respectively fall within the interval of the set position interval.

[0078] The set mean threshold can be 50 ± 10 Ω, which is determined based on the typical resistance value range of the metal sheet cut aluminum shell resistor and can effectively distinguish between normal and abnormal states. The interval of the set position interval can be 5 ± 2 mm, which is determined based on the physical size and electrical distribution characteristics of the resistor.

[0079] As Figure 6 shown, the process of performing curve fitting detection on the detection positions corresponding to the inflection points specifically includes:

[0080] 1. Perform curve fitting initialization processing on the detection positions corresponding to the inflection points respectively;

[0081] 2. Obtain the initialization result curve of the curve fitting initialization process;

[0082] 3. Judge the slope of the initialization result curve. If the slope of the initialization result curve is continuously greater than 1, and the distance from the starting point to the inflection point of the initialization result curve is within the set distance threshold, then perform mean processing on all the detection values within the interval, and output the mean processing result as the detection value on the initialization result curve;

[0083] 4. Fit two fitting detection curves through the detection values on the initialization result curve.

[0084] When performing curve fitting, the least squares method is used for curve fitting, and the fitting function can be expressed as:

[0085] f(x) = a 0 + a 1 x + a 2 x 2 +... + a n x n ,

[0086] where a 0 , a 1 , a 2 ,..., a n are fitting coefficients, x is the coordinate of the detection position, n is the order of the fitting polynomial, and in this embodiment, n = 3 can be taken.

[0087] Preferably, if the slope of the initialization result curve is continuously greater than 3, and the distance from the starting point to the inflection point of the initialization result curve is within the set distance threshold, then perform mean processing on all the detection values within the interval, and output the mean processing result as the detection value on the initialization result curve. The set distance threshold can be 5 ± 1 mm, and this threshold is determined based on the physical size and manufacturing process of the resistor. The calculation of the curve slope can be achieved through the following formula:

[0088]

[0089] where k is the slope, f(x) is the curve function, and Δx is the small change in the detection position. In this embodiment, Δx = 0.1 mm can be taken.

[0090] Judgment step: Judge whether the position of the two-pin conduction detection point falls into the preset conduction detection section. If it falls, it is determined that the metal sheet cutting type aluminum shell resistor is normal; otherwise, it is determined that the metal sheet cutting type aluminum shell resistor fails.

[0091] As Figure 7 shown, the judgment step specifically includes:

[0092] 1. Perform mean processing on the reference detection curve, the fitted detection curve, and the detection points on the fitted detection curve to obtain the fitted detection means corresponding to the reference detection curve and the fitted detection curve;

[0093] 2. Determine whether the reference detection curve, the fitted detection curve, and the fitted detection mean of the fitted detection curve fall within a preset conduction detection section. If so, it is determined that the metal sheet cut aluminum shell resistor is normal; otherwise, it is determined that the metal sheet cut aluminum shell resistor fails.

[0094] In the present invention, the set distance threshold is 2 - 10 mm, and the detection range of the conduction detection section is 35 - 70 Ω. These parameter values are determined based on a large amount of experimental data and the technical characteristics of the metal sheet cut aluminum shell resistor, and can meet the detection requirements of resistors of different specifications and batches.

[0095] Embodiment 2

[0096] Based on Embodiment 1, in order to further improve the detection accuracy, the method for obtaining the fitted detection curve in this embodiment is optimized. Specifically, when judging the slope of the initialized result curve, an adaptive threshold adjustment mechanism is introduced.

[0097] When the detection object is a high-precision metal sheet cut aluminum shell resistor (precision ≤ 1%), the slope threshold can be set to 2, so as to more accurately capture the small changes in the curve; when the detection object is a general-precision metal sheet cut aluminum shell resistor (precision > 1%), the slope threshold can be set to 1 to improve the detection stability.

[0098] In addition, for resistors of different power levels, the conduction detection section can also be optimized and adjusted:

[0099] For low-power resistors (< 10 W), the conduction detection section can be set to 40 - 60 Ω;

[0100] For medium-power resistors (10 W - 50 W), the conduction detection section can be set to 35 - 65 Ω;

[0101] For high-power resistors (> 50 W), the conduction detection section can be set to 30 - 70 Ω.

[0102] This adaptive adjustment mechanism significantly improves the adaptability and accuracy of the detection method, and can adapt to metal sheet cut aluminum shell resistors with different specifications and performance requirements.

[0103] Embodiment 3

[0104] Based on Embodiment 1, this embodiment introduces a quality evaluation mechanism for the fitted detection curve, further improving the reliability of the detection.

[0105] Specifically, the goodness of fit of the two fitted detection curves obtained after fitting is calculated to evaluate the fitting quality. The goodness of fit can be measured by the coefficient of determination R 2 and is calculated by the following formula:

[0106]

[0107] where y i is the actual measured value, is the fitted value, is the average value of the actual measured values, and n is the number of measurement points.

[0108] When R 2 ≥ 0.95, it is considered that the fitting quality is high, and the fitted curve can be directly used for subsequent analysis; when 0.9 ≤ R 2 < 0.95, the original measurement data needs to be smoothed and then refitted; when R 2 < 0.9, remeasurement is considered.

[0109] This fitting quality evaluation mechanism can effectively identify abnormal situations in the fitting process and improve the reliability and stability of the detection results.

[0110] Example 4

[0111] Based on Example 1, in this example, the detection parameters for different types of metal sheet cut aluminum shell resistors are optimized, further improving the pertinence and effectiveness of the detection method.

[0112] For resistors made of different metal materials, the optimized parameters are as follows:

[0113] Nickel-chromium alloy resistor: Set the distance threshold to 3 - 8 mm, and the conduction detection section to 40 - 65 Ω;

[0114] Iron-chromium-aluminum alloy resistor: Set the distance threshold to 2 - 7 mm, and the conduction detection section to 35 - 60 Ω;

[0115] Manganin alloy resistor: Set the distance threshold to 4 - 10 mm, and the conduction detection section to 45 - 70 Ω.

[0116] For resistors with different cutting processes, the optimized parameters are as follows:

[0117] Laser-cut resistor: Set the distance threshold to 2 - 6 mm, and the conduction detection section to 40 - 60 Ω;

[0118] Mechanically cut resistor: Set the distance threshold to 3 - 8 mm, and the conduction detection section to 35 - 65 Ω;

[0119] Chemical etching resistor: Set the distance threshold to 4 - 10 mm, and the conduction detection section to 38 - 68 Ω.

[0120] This parameter optimization strategy significantly improves the adaptability of the detection method to different types of resistors, ensuring the accuracy and reliability of the detection results.

[0121] Example 5

[0122] Based on Example 1, this example introduces a temperature compensation mechanism to solve the problem that the detection results of resistors may deviate under different temperature conditions.

[0123] The resistance value of the metal sheet cutting type aluminum shell resistor changes with temperature, and its relationship can be expressed as:

[0124] R T =R 25 (1 + α(T - 25)),

[0125] where, R T is the resistance value at temperature T °C, R 25 is the standard resistance value at 25 °C, α is the temperature coefficient, and the temperature coefficients of resistors made of different materials are different. For example, the temperature coefficient of nickel-chromium alloy is about 0.00001 / °C, and that of iron-chromium-aluminum alloy is about 0.00005 / °C.

[0126] During the actual detection process, the surface temperature T of the resistor can be measured by an infrared thermometer, and then the measured resistance value can be compensated for temperature using the above formula to obtain the equivalent resistance value under standard conditions (25 °C), further improving the accuracy and comparability of the detection results.

[0127] Example 6

[0128] To verify the effectiveness of the method of the present invention, a comparative experiment was conducted in this example.

[0129] Select 100 metal sheet cutting type aluminum shell resistors with known states (50 normal and 50 failed) as test samples, and detect them using the traditional single-point measurement method and the method of the present invention respectively. The results are as follows:

[0130] 1. Traditional single-point measurement method:

[0131] Correctly identify normal resistors: 42;

[0132] Correctly identify failed resistors: 45;

[0133] Overall accuracy rate: 87%;

[0134] 2. Method of the present invention:

[0135] Correctly identify normal resistors: 49;

[0136] Correct identification of failed resistors: 48;

[0137] Overall accuracy rate: 97%;

[0138] The results of the comparative experiment show that, compared with the traditional single-point measurement method, the detection accuracy of the method of the present invention has increased by 10 percentage points, and it shows obvious advantages especially in identifying subtle defects. This fully verifies the effectiveness and advancement of the method of the present invention.

[0139] In summary, the electrical performance detection method of the metal sheet cutting type aluminum shell resistor provided by the present invention realizes the comprehensive, accurate and efficient evaluation of the electrical performance of the metal sheet cutting type aluminum shell resistor through innovative technologies such as multi-point electrical measurement, reference curve selection, inflection point identification and curve fitting, and conduction section determination, providing important technical support for the quality control of resistors.

[0140] It should be noted that the above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. The electrical performance testing method of the metal sheet cutting aluminum housing resistor is characterized in that: include: The acquisition step includes: measuring the electrical properties of the two pins of the metal sheet cut aluminum housing resistor at different points to obtain four detection curves; The processing steps include: selecting two reference detection curves from the four detection curves; performing fitting processing on the positions where the distance between the two reference detection curves is less than a set distance threshold, respectively, to obtain two fitting detection curves; determining the fitting position where the distance between the two fitting detection curves is the smallest as the two-pin conduction detection point; The judging step includes judging whether the position of the two-pin conduction detection point falls into a preset conduction detection section. If so, it is determined that the metal sheet cut aluminum shell resistor is normal; otherwise, it is determined that the metal sheet cut aluminum shell resistor is invalid.

2. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 1 is characterized in that: The fitting process of the two reference detection curves in the processing step specifically includes: Determine the detection position corresponding to the inflection point where the slope of the curve changes from positive to negative in the two reference detection curves; Determine whether the detection position corresponding to the inflection point in the two reference detection curves meets the set distance threshold, if so, proceed to the next step; otherwise, determine the detection position corresponding to the inflection point as the two-pin conduction detection point; Curve fitting detection is performed on the detection positions corresponding to the inflection points respectively to obtain two fitting detection curves.

3. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 2 is characterized in that: The determining whether the detection positions corresponding to the inflection points in the two reference detection curves meet the set distance threshold specifically includes: Determine a position interval between detection positions corresponding to the inflection points of two reference detection curves; Obtain all detection values ​​in the curve area of ​​the position interval; Performing mean processing on all detection values ​​to obtain a reference detection mean value of the position interval; A comparison result between the reference detection mean and a set mean threshold is obtained. If the reference detection mean falls within the interval of the set mean threshold, a position interval between the two end points is determined as the two-pin conduction detection point.

4. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 3 is characterized in that: If the benchmark detection mean exceeds the set mean threshold, the detection position corresponding to the inflection point is determined as the two-pin conduction detection point; if the benchmark detection mean is lower than the set mean threshold, the two detection positions at both ends of the benchmark detection mean lower than the set mean threshold are determined as two-pin conduction detection points, and the two detection positions fall within the interval of the set position interval respectively.

5. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 2 is characterized in that: The performing curve fitting detection on the detection positions corresponding to the inflection points respectively specifically includes: Performing curve fitting initialization processing on the detection positions corresponding to the inflection points respectively; Obtaining an initialization result curve of the curve fitting initialization processing; Performing slope judgment on the initialization result curve, if the slope of the initialization result curve is continuously greater than 1, and the distance from the starting point to the inflection point of the initialization result curve is within a set distance threshold, performing mean processing on all detection values ​​in the interval, and outputting the mean processing result as the detection value on the initialization result curve; Two fitting detection curves are fitted by the detection values ​​on the initialization result curve.

6. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 5 is characterized in that: If the slope of the initialization result curve is continuously greater than 3, and the distance from the starting point to the inflection point of the initialization result curve is within the set distance threshold, all detection values ​​in the interval are averaged and the averaged result is output as the detection value on the initialization result curve.

7. The electrical performance detection method of the metal sheet cut aluminum housing resistor according to claim 1 is characterized in that: The acquisition step specifically includes: Taking the length direction of the metal sheet cut aluminum shell resistor as the X-axis, setting the first pin of the metal sheet cut aluminum shell resistor as the negative end, and the second pin of the metal sheet cut aluminum shell resistor as the positive end; Contacting different detection points on the first pin of the metal sheet cut aluminum housing resistor with a probe, and measuring the electrical properties of the different detection points on the first pin and the same position points on the second pin, respectively, to obtain a first set of detection curves; Contacting the same position point on the first pin of the metal sheet cut aluminum housing resistor with a probe, and measuring the same position point on the first pin and different position points on the second pin respectively, to obtain a second set of detection curves; The probe contacts different detection points on the second pin of the metal sheet cut aluminum housing resistor, and the different detection points on the second pin are respectively electrically measured with the same position points on the first pin to obtain a third set of detection curves; The probe contacts the same position point on the second pin of the metal sheet cut aluminum housing resistor, and the same position point on the second pin is electrically measured with different position points on the first pin to obtain a fourth set of detection curves.

8. The electrical performance testing method of the metal sheet cut aluminum housing resistor according to claim 7 is characterized in that: The step of selecting two reference detection curves from the four detection curves specifically includes: Acquire detection values ​​in the first group of detection curves, the second group of detection curves, the third group of detection curves, and the fourth group of detection curves; Performing mean processing on the detection values ​​to obtain detection means of the first group of detection curves, the second group of detection curves, the third group of detection curves, and the fourth group of detection curves; Two of the detection means are compared, and if the difference between the detection means is within a set detection threshold range, the two detection curves corresponding to the detection means are used as the reference detection curves.

9. The electrical performance testing method of the metal sheet cut aluminum housing resistor according to claim 8, characterized in that: The judging step specifically includes: Performing mean processing on the reference detection curve, the fitting detection curve, and the detection points on the fitting detection curve to obtain the fitting detection means corresponding to the reference detection curve and the fitting detection curve; It is determined whether the reference detection curve, the fitting detection curve and the fitting detection mean of the fitting detection curve fall into a preset conduction detection section. If so, it is determined that the metal sheet cut type aluminum housing resistor is normal; otherwise, it is determined that the metal sheet cut type aluminum housing resistor is failed.

10. The electrical performance testing method of the metal sheet cut aluminum housing resistor according to claim 1, characterized in that: The set distance threshold is 2 to 10 mm, and the detection interval of the conduction detection section is 35 to 70Ω.

Images