Test system, method and equipment based on ATE platform and medium
By introducing extended equipment with integrated programmable functional devices on the ATE platform, the ATE test system's insufficient pull-load capacity, limited output current and signal distortion problems when testing power supply devices are solved, and efficient and effective power supply testing device testing is achieved.
Patent Information
- Application Number
- CN202411978161.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2025-05-30
AI Technical Summary
When testing power supply devices, existing ATE testing systems have problems such as insufficient pulling capacity for a long time, limited maximum output current capacity and serious signal distortion, resulting in low test effectiveness.
The ATE platform introduces an extended device with integrated programmable functional devices, communicates with the ATE machine through a communication interface, and is electrically connected to the DUT board through a test signal interface, and performs extended testing functions such as providing test input signals, applying dynamic loads, and collecting test data.
It greatly improves the adaptability and functionality of the test system, can effectively test power-based test devices, and improves the real-time and accuracy of test effectiveness and data transmission.
Smart Images
Figure CN120065046A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of test technology, and specifically to a test system, method, device and medium based on an ATE (Automatic Test Equipment) platform. Background Art
[0002] ATE systems for analog devices play an important role in semiconductor testing. Relying on high measurement accuracy, a large measurement range, and stable measurement capabilities, ATE systems can cover the AC (Alternating Current) and DC (Direct Current) parameter testing of most analog chips. However, in actual chip R & D and mass production testing, there are still many limitations in relying solely on the ATE single system for testing, which limit its test performance and applicability in certain specific scenarios.
[0003] First of all, the ATE system has obvious deficiencies in the ability of long-term loading or carrying a load. For example, some ATE power supply boards can only provide pulse power with a time width of about 80 ms when inputting or outputting 5V / 3A, and another power supply board can only provide 10 ms of pulse power when inputting or outputting 5V / 1A. This characteristic limits its parameter measurement under the condition of full load of high-power DC / DC, because some DC / DC modules need dozens of milliseconds to reach the stable state of voltage and current after being loaded.
[0004] Secondly, the maximum output current capacity of the ATE system is limited and only supports pulse-type output. This is particularly disadvantageous for a few high-power power modules. For example, a high-power power module may require a higher current at the moment of startup, but since the output current of the ATE is clamped, such chips often cannot start normally during testing. In addition, for the non-linear power-on and fast power-on operations of power devices, it is difficult to meet the requirements only relying on the driving ability of the ATE machine itself.
[0005] Finally, due to the long signal path of the ATE machine board and the need for the signal to pass through the fixture and connector transfers multiple times, the parasitic parameters increase significantly. Although ATE systems such as STS8200 have high accuracy in measuring time parameters with good signal quality, in the test of weak drive signals, the distortion of the signal in the machine board path is serious, and the machine is difficult to accurately determine the preset trigger condition, thus affecting the accuracy of the test results.
[0006] In summary, when the ATE test system in the related art is used to test power devices, it is limited by the fact that the ATE test system itself cannot provide appropriate test functions, which easily leads to the situation where effective tests cannot be carried out in aspects such as testing of some key parameters, verification of system functions, and generation of parameter curves. Summary of the Invention
[0007] The main object of the present invention is to provide a test system, method, device and medium based on an ATE platform, aiming to at least solve the technical problem of low test effectiveness when the ATE test system in the related art tests power devices.
[0008] In the first aspect of the present invention, a test system based on an ATE platform is provided. The test system includes an ATE machine platform, a DUT board, and an extended device integrated with a programmable functional device. The ATE machine platform is electrically connected to the DUT board through a test harness. The extended device is communicatively connected to the ATE machine platform through a communication interface and is electrically connected to the DUT board through a test signal interface.
[0009] When the test system tests a power test device on the DUT board, the ATE machine platform is configured to send a test instruction to the extended device through the communication interface. The programmable functional device is configured to execute an extended test function of the test instruction on the power test device through the test signal interface. The ATE machine platform is configured to obtain a test result of the extended test function through the test harness. Wherein, the extended test function includes at least one of providing a test input signal, applying a dynamic load, and collecting test data.
[0010] In the second aspect of the present invention, a test method based on an ATE platform is provided, which is applied to the test system based on an ATE platform as described in the first aspect. The test method includes: when testing a power test device on the DUT board, controlling the ATE machine platform to send a test instruction to the extended device through the communication interface, controlling the programmable functional device to execute an extended test function corresponding to the test instruction on the power test device through the test signal interface, and controlling the ATE machine platform to obtain a test result of the extended test function through the test harness. Wherein, the extended test function includes at least one of providing a test input signal, applying a dynamic load, and collecting test data.
[0011] In a third aspect of the present invention, there is provided an electronic device, which includes a memory, a processor, and a bus; the bus is used to realize the connection and communication between the memory and the processor; the processor is used to execute a computer program stored on the memory; when the processor executes the computer program, the steps in the test method based on the ATE platform in the second aspect are realized.
[0012] In a fourth aspect of the present invention, there is provided a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps in the test method based on the ATE platform in the second aspect are realized.
[0013] The test system, method, device, and medium based on the ATE platform of the present invention introduce an extended device integrated with programmable functional devices on the basis of the original ATE platform, so that when testing power supply test devices, extended test functions such as providing test input signals, applying dynamic loads, and collecting test data (test functions that the original ATE platform cannot provide) can be executed, greatly improving the adaptability and functionality of the test system, thereby enabling effective testing of power supply test devices. At the same time, the extended device is communicatively connected to the ATE machine through a communication interface, enabling the ATE machine and the extended device to cooperate with each other to achieve flexible control and operation of the extended device, ensuring the high-efficiency testing ability for power supply test devices and improving the test effectiveness. In addition, the ATE machine obtains the test results through a test harness, simplifying the test process and improving the real-time performance and accuracy of data transmission. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings described below are only some embodiments recorded in the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0015] Figure 1 It is a schematic internal structure diagram of the test system based on the ATE platform provided by the embodiment of the present application;
[0016] Figure 2 It is a schematic diagram of the power port connection of the DUT board in the embodiment of the present application;
[0017] Figure 3 It is an internal program block diagram of the instrument control software module in the embodiment of the present application;
[0018] Figure 4 It is a schematic flow diagram of the test method based on the ATE platform provided by the embodiment of the present application;
[0019] Figure 5 It is a schematic diagram of the internal structural connection of the electronic device provided by the embodiment of the present application.
[0020] The realization of the object of the present invention, functional features and advantages will be further described in conjunction with the embodiments with reference to the accompanying drawings. Specific embodiments
[0021] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.
[0022] It should be noted that related terms such as "first", "second", etc. can be used to describe various components, but these terms do not limit the components. These terms are only used to distinguish one component from another. For example, without departing from the scope of the present invention, the first component can be called the second component, and similarly, the second component can also be called the first component. The term "and / or" refers to any combination of one or more of the related items and the described items. In addition, in the following embodiments of the present application, the Chinese meaning of "ATE machine platform" is "automatic test equipment machine platform", and the Chinese meaning of "DUT board" is "circuit board of the device under test".
[0023] Please refer to Figure 1 , the embodiment of the present application provides a test system based on an ATE platform. The test system includes an ATE machine platform 20, a DUT board 10, and an expansion device 30 integrated with programmable functional devices.
[0024] Specifically, the ATE machine platform 20 is electrically connected to the DUT board 10 through a test harness, and the expansion device 30 is communicatively connected to the ATE machine platform 20 through a communication interface and is electrically connected to the DUT board 10 through a test signal interface.
[0025] The core principle of the test system is to link the ATE machine platform 20, the DUT board 10, and the expansion device 30 through reasonable electrical and communication interfaces to form an efficient and modular ATE platform test environment, and to test the power supply type test devices in the DUT board through the formed test environment. Among them, the communication interface is used to transmit control instructions or data between the expansion device 30 and the ATE machine platform 20 to realize communication (logical control and information interaction) between the expansion device 30 and the ATE machine platform 20, and the transmitted signals are digital or encoded signals, such as USB interfaces, GPIB interfaces, etc. And, the electrical interface is used for power transfer or signal interaction between the ATE machine platform 20 and the DUT board 10, and the transmitted signals can be analog signals or digital signals, or direct power supply, such as for transmitting test input signals (such as voltage, current) or collecting test output signals (such as test results), etc.
[0026] When the test system tests the power supply test devices on the DUT board 10, the ATE machine 20 is used to send test instructions to the expansion device 30 through the communication interface. The programmable functional device in the expansion device 30 is used to execute the extended test function of the test instructions on the power supply test devices through the test signal interface. The ATE machine 20 is used to obtain the test results of the power supply test devices under the extended test function through the test harness, and analyze and output the analysis results.
[0027] The test system based on the ATE platform of the present invention introduces an expansion device integrated with a programmable functional device on the basis of the original ATE platform, so that when testing power supply test devices, it can execute extended test functions (providing at least one of test input signals, applying dynamic loads, and collecting test data). That is, this technical solution can provide test functions that the original ATE platform cannot provide, greatly improving the adaptability and functionality of the test system, so as to effectively test power supply test devices. At the same time, the expansion device is communicatively connected to the ATE machine through the communication interface, enabling the ATE machine and the expansion device to cooperate with each other to achieve flexible control operations of the expansion device, ensuring the high-efficiency test ability for power supply test devices, and improving test effectiveness. In addition, the ATE machine obtains the test results through the test harness, simplifies the test process, and improves the real-time and accuracy of data transmission.
[0028] In an alternative embodiment of this embodiment, the programmable functional device at least includes a programmable DC power supply 301, a programmable electronic load 302, and a programmable oscilloscope 303. Thus, the programmable functional device can realize test functions that the original ATE platform cannot provide, such as providing test input signals, applying dynamic loads, and collecting test data.
[0029] When the test instructions transmitted by the ATE machine 20 carry input signal configuration parameters, the programmable DC power supply is used to provide a programmable test input signal to the power supply test device according to the input signal configuration parameters; wherein, the test input signal includes constant or dynamic voltage, current or power. By coordinating the programmable DC power supply 301 with the ATE machine 20, a stable high input power and good transient response performance are continuously provided to the power supply test device, and after it stabilizes, relevant data measurements are carried out using the machine, solving the problem that the original ATE platform cannot provide a large output power for high-power power supply devices for a long time.
[0030] When the test instructions transmitted by the ATE machine 20 carry load conditions, the programmable electronic load 302 is used to apply dynamic or constant loads to the power supply test devices according to the load conditions. The loads include constant current mode, constant voltage mode, constant resistance mode, or constant power mode. By cooperating the ATE machine 20 with the programmable electronic load 302, a continuously increasing current load can be output to the device under test, and relevant data can be measured by the machine after it reaches a stable state, solving the problem that the original ATE platform cannot apply loads to high-power power supply devices for a long time.
[0031] When the test instructions transmitted by the ATE machine 20 carry a signal acquisition request, the programmable oscilloscope 303 is used to collect the test data of the power supply test devices according to the signal acquisition request, and return the analysis results after processing the collected test data to the ATE machine 20. By cooperating the ATE machine 20 with the programmable oscilloscope 303, the probe of the oscilloscope is used to measure relevant test points, automatically obtain ideal data or waveforms and send them to the ATE platform 20 to be saved to a specified external storage medium, solving the problem of inaccurate measurement of AC parameters of weak drive signals.
[0032] It should be noted that appropriate hardware interfaces are configured on the DUT10 board, such as power input, power output, signal test points, external bias injection points, etc. Various expansion devices (programmable DC power supply 301, programmable electronic load 302, programmable oscilloscope 303, etc.) are connected to the DUT board 10 according to the conventional measurement method to realize the functions of the programmable devices with different functions in the expansion devices for the power supply test devices, so as to solve the diverse requirements in the R & D test process. And a data processing software module is integrated in the system to automatically calculate and summarize to generate tables, curves, etc. Finally, on the basis of the existing technology, it can cover the tests of power supply devices with higher power and wider input and output voltage ranges, such as DC / DC, power modules, high-voltage and high-current power supplies, etc.
[0033] In an alternative embodiment of this embodiment, the programmable functional devices in the expansion device 30 have dynamic adaptive test capabilities. By analyzing the test instructions sent by the ATE machine 20 and the operating status of the DUT board 10 in real time, the expansion device 30 can automatically adjust the parameters of the test signals (such as frequency, amplitude, waveform, etc.) to achieve a more refined test process. For example, when the temperature of the power supply test device on the DUT board drifts, the programmable functional device can dynamically adjust the load or input signal to ensure the accuracy and consistency of the test results. In addition, an AI algorithm module is introduced into the expansion device. By analyzing historical test data through machine learning, the test scheme is automatically optimized. The AI module can predict possible fault points or performance bottlenecks and adjust the test process in advance, thereby reducing the test time and increasing the test coverage.
[0034] In an alternative embodiment of this embodiment, the programmable functional device may also be connected to the programmable spectrum analyzer 304 according to actual test requirements. Through the programmable spectrum analyzer 304, different control methods are adopted to achieve functional interaction. For example, control instructions can be directly sent through the ATE station 20, or the programmable spectrum analyzer 304 can be configured through an independent controller. The specific operation process can be adjusted according to the test target, such as selecting different frequency band ranges or signal analysis modes. In addition, the operating parameters of the programmable spectrum analyzer 304 can be adjusted according to actual test requirements, such as frequency range, signal sensitivity, and bandwidth. This adjustment range can cover conventional radio frequency signals (such as 100 MHz to 1 GHz) and higher frequency applications (such as 5G frequency bands).
[0035] Please refer to Figure 2 , the DUT board is configured with a power supply port, and this power supply port is electrically connected to the power source of the ATE station through a DC / DC module. The DC / DC module is used to convert the input voltage provided by the power source of the ATE station into a voltage suitable for the DUT board and supply input power to the DUT board; among them, the power supply port is also electrically connected to an external DC power supply (DC power supply terminal) through the DC / DC module, and is used to provide an input voltage or input current independent of the ATE station for the DUT board during a preset power supply stage. In addition, the output end of the DUT board is connected to a programmable electronic load through the DC / DC module, and is used to measure and verify the output characteristics of the DUT board.
[0036] Specifically, the power source of the ATE station 20 provides basic power supply, and the external DC power supply (DC power supply terminal) serves as a backup or high-current input source during a specific stage (preset power supply stage) to provide enhanced power supply support for the DUT board, while the programmable electronic load is used at the output end to monitor and evaluate the load characteristics and output performance of the DUT board. Based on the fact that the input voltage is less than the isolation voltage provided by the power source of the ATE station and the input current is greater than the isolation current provided by the power source, when it is necessary to use the external DC power supply (DC power supply terminal) for power supply, the internal channel relay of the power source of the ATE station is not turned on. At this time, the isolation voltage of the power source of the ATE station is much higher than the common input voltage of power supply devices and can be safely applied.
[0037] In an alternative embodiment of this embodiment, the test system further includes a test box 40, which is used to fix the DUT board 10 and electrically connect the DUT board 10 to the expansion device 30 and the ATE station 20 respectively through the built-in connection structure. And through the signal transmission channel in the test box, the output signal of the power supply type test device is transmitted to the programmable functional device of the expansion device 30 or the ATE station 20.
[0038] Specifically, the built-in connection structure of the test box 40 includes an electrical connector or a signal slot, which can be accurately docked with the interface of the DUT board 10 to complete the lossless transmission of electrical signals. In addition, the signal transmission channel inside the test box adopts a shielding design to reduce the influence of external electromagnetic interference on the signal, thereby improving the signal quality. Additionally, the test signals generated by power supply test devices (such as DC / DC modules, DC power supplies, etc.) are accurately distributed to the programmable functional devices of the expansion device 30 or the ATE machine 20 through the transmission channel of the test box 40 for processing and analysis, further improving the flexibility and adaptability of the system.
[0039] In an alternative embodiment of this embodiment, the ATE machine 20 includes a test board 202 and a host computer 201. The test board 202 is used to generate test signals and perform preliminary acquisition and processing on the output signals of power supply test devices. The host computer 201 is connected to the test board 202 through a communication interface and is used to send test instructions to the expansion device and the test board, and analyze and process the test data.
[0040] Specifically, the host computer 201 can be a PC (Personal Computer), and is connected to the test board 202 through a communication interface (such as USB, Ethernet, or PCIe) to execute control and coordination functions, that is, to send test instructions to the test board 202 and the expansion device 30, such as controlling the type, amplitude, or time series of test signals, and triggering the programmable functional devices of the expansion device to perform specific test tasks. In addition, the preliminary processed data returned by the test board 202 is deeply analyzed and processed, such as statistical analysis of signal characteristics, waveform comparison, error correction, and result storage. Finally, through the division of labor and cooperation between the test board 202 and the host computer 201, the ATE machine realizes the functions of efficient signal generation, acquisition, processing, and advanced analysis, further enhancing the performance and flexibility of the test system.
[0041] In an alternative embodiment of this embodiment, the host computer stores a VISA standard function library, and the test instructions corresponding to the test scheme are obtained by programming by calling the VISA standard function library, and the expansion test function of the test scheme is executed by controlling the expansion device that supports the VISA standard through the test instructions to complete the various parameter and function tests of the power supply test device.
[0042] Specifically, each programmable functional device in the expansion device 30 is connected to the PC through a GPIB interface or a USB interface. The common feature of each programmable functional device is that it needs to support the Virtual Instrument Software Architecture (VISA for short). VISA is a standard uniformly adopted by the instrument companies that make up the VXIplug&play system alliance. By adopting the VISA standard, the instrument manufacturer and the hardware interface do not need to be considered, and the driver software can be used compatibly with each other. VISA provides a standard I / O function library for instrument programming (VISA library). The VISA function library resides in the computer system and is the standard software communication interface between the computer and each programmable functional device. The computer controls each programmable functional device in the expansion device 30 through the VISA function library. Thus, by integrating the VISA standard function library on the PC, the VISA standard function library can be called during the test process to achieve unified control and programming of each programmable functional device in the expansion device 30.
[0043] Please refer to Figure 3 , the host computer is built-in with an instrument control software module, and the instrument control software module is used to communicate with the programmable functional devices in the expansion device through the standard commands for programmable instruments and perform initialization operations, instruction operations, reading operations, and error handling operations.
[0044] Specifically, the initialization operation includes initializing the programmable functional device and setting its function to a known default state to avoid damage to the test device or test failure caused by an unknown state; the instruction operation includes sending test instructions to the programmable functional device according to the test plan and querying its execution status or reading the returned data according to the instructions; the reading operation includes supporting the reading of various types of data (character data, single numerical data, and batch data), and the read data can be further saved as a table file, a text file, or a waveform file; the error handling operation includes error detection and error handling functions. When an abnormal state is detected, the corresponding handler is triggered according to the error type to avoid further damage to the test device or the expansion device. That is, through the instrument control software module built in the host computer, precise control of the programmable functional devices in the expansion device is achieved, ensuring the safety and stability of the test process, and at the same time improving the test efficiency and data processing ability.
[0045] Please refer to Figure 4 , which shows a test method based on the ATE platform provided by an embodiment of the present application, applied to the test system based on the ATE platform in the above embodiment. The test method includes:
[0046] In step S401, when testing the power supply test devices on the DUT board, control the ATE machine to send test instructions to the expansion device through the communication interface.
[0047] In step S402, control the programmable functional device to execute the extended test function of the test instructions on the power supply test devices through the test signal interface.
[0048] In step S403, control the ATE machine to obtain the test results of the extended test function through the test harness.
[0049] The test method based on the ATE platform of the present invention introduces an expansion device integrated with a programmable functional device on the basis of the original ATE platform, enabling extended test functions such as providing test input signals, applying dynamic loads, and collecting test data (test functions that the original ATE platform cannot provide) when testing power supply test devices, greatly improving the adaptability and functionality of the test system, and thus being able to effectively test power supply test devices. At the same time, the expansion device is communicatively connected to the ATE machine through the communication interface, enabling the ATE machine and the expansion device to cooperate with each other to achieve flexible control operations of the expansion device, ensuring the high-efficiency test ability for power supply test devices, and improving test effectiveness. In addition, the ATE machine obtains the test results through the test harness, simplifying the test process and improving the real-time and accuracy of data transmission.
[0050] Figure 5 The electronic device provided by the embodiment of the present invention is shown, and this electronic device can be used to implement the test method based on the ATE platform in any of the foregoing embodiments. The electronic device includes:
[0051] A memory 501, a processor 502, a bus 503, and a computer program stored on the memory 501 and executable on the processor 502. The memory 501 and the processor 502 are connected through the bus 503. When the processor 502 executes the computer program, the test method based on the ATE platform in the foregoing embodiments is implemented. Among them, the number of processors can be one or more.
[0052] The memory 501 can be a high-speed random access memory (RAM, Random Access Memory) or a non-volatile memory, such as a disk memory. The memory 501 is used to store executable program code, and the processor 502 is coupled to the memory 501.
[0053] Furthermore, an embodiment of the present application also provides a computer-readable storage medium, which can be disposed in the electronic device in the foregoing embodiments, and the computer-readable storage medium can be a memory.
[0054] A computer program is stored on the computer-readable storage medium. When the program is executed by a processor, it implements the test method based on the ATE platform in the foregoing embodiments. Further, the computer-readable storage medium may also be various media such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a RAM, a magnetic disk, or an optical disc that can store program codes.
[0055] In several embodiments provided in the present application, it should be understood that the disclosed apparatus and method can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed mutual coupling or direct coupling or communication connection can be through some interfaces. The indirect coupling or communication connection of the apparatus or module can be in electrical, mechanical or other forms.
[0056] The modules described as separate components may or may not be physically separated. The components displayed as modules may or may not be physical modules, that is, they may be located in one place, or may be distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0057] In addition, in each embodiment of the present application, the functional modules can be integrated in a processing module, or each module can exist physically alone, or two or more modules can be integrated in one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules.
[0058] If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a readable storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in each embodiment of the present application. And the foregoing readable storage medium includes: various media such as a USB flash drive, a mobile hard disk, a ROM, a RAM, a magnetic disk, or an optical disc that can store program codes.
[0059] It should be noted that, for the foregoing method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations. However, those skilled in the art should be aware that this application is not limited by the described action sequence, because according to this application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to this application.
[0060] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0061] The above are only the preferred embodiments of the present invention, and do not limit the patent scope of the present invention accordingly. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present invention.
Claims
1. A test system based on ATE platform, characterized in that: The test system includes an ATE machine, a DUT board and an expansion device integrated with a programmable functional device; The ATE machine is electrically connected to the DUT board via a test harness, the expansion device is communicatively connected to the ATE machine via a communication interface, and is electrically connected to the DUT board via a test signal interface; When the test system tests the power supply test device on the DUT board, the ATE machine is used to send the test instruction to the extension device through the communication interface, the programmable functional device is used to execute the extended test function of the test instruction on the power supply test device through the test signal interface, and the ATE machine is used to obtain the test result of the extended test function through the test harness; wherein, the extended test function includes at least one of providing a test input signal, applying a dynamic load, and collecting test data.
2. The test system based on the ATE platform as claimed in claim 1, characterized in that: The programmable functional devices include a programmable DC power supply, a programmable electronic load and a programmable oscilloscope; When the test instruction carries input signal configuration parameters, the programmable DC power supply is used to provide a programmable test input signal to the power supply test device according to the input signal configuration parameters; wherein the test input signal includes a constant or dynamic voltage, current or power; When the test instruction carries a load condition, the programmable electronic load is used to apply a dynamic or constant load to the power supply test device according to the load condition, and the load includes a constant current mode, a constant voltage mode, a constant resistance mode or a constant power mode; When the test instruction carries a signal acquisition request, the programmable oscilloscope is used to collect test data of the power supply test device according to the signal acquisition request, and return the analysis result of the collected test data to the ATE machine after processing.
3. The test system based on the ATE platform as claimed in claim 2, characterized in that: The DUT board is provided with a power port, and the power port is electrically connected to the power source of the ATE machine through a DC / DC module, and the DC / DC module is used to convert the input voltage provided by the power source of the ATE machine into a voltage adapted to the DUT board, and provide input power to the DUT board; The power port is also electrically connected to an external DC power supply through the DC / DC module, and is used to provide the DUT board with an input voltage or input current independent of the ATE machine in a preset power supply stage, and the output end of the DUT board is connected to the programmable electronic load through the DC / DC module; The input voltage is lower than the isolation voltage provided by the power source, and the input current is higher than the isolation current provided by the power source.
4. The test system based on the ATE platform as claimed in claim 3, characterized in that: The test system also includes a test box; The test box is used to fix the DUT board and electrically connect the DUT board to the expansion device and the ATE machine through a built-in connection structure; The test box has a signal transmission channel for transmitting the output signal of the power supply test device to the programmable functional device of the expansion equipment or the ATE machine.
5. The test system based on the ATE platform as claimed in claim 4, characterized in that: The ATE machine includes a test board and a host computer; The test board is used to generate test signals and preliminarily collect and process the output signals of the power supply test device. The host computer is connected to the test board via a communication interface, and is used to send test instructions to the expansion device and the test board, and analyze and process the test data transmitted from the expansion device or the DUT board.
6. The test system based on the ATE platform as claimed in claim 5, characterized in that: The host computer stores a VISA standard function library, and obtains test instructions corresponding to the test scheme by calling the VISA standard function library for programming, and controls the extended device supporting the VISA standard to execute the extended test function of the test scheme through the test instructions to complete various parameter and function tests on power supply test devices.
7. The test system based on the ATE platform as claimed in claim 5, characterized in that: The host computer is equipped with an instrument control software module, which is used to communicate with the programmable functional device in the expansion device through programmable instrument standard commands and perform initialization operations, instruction operations, reading operations and error handling operations; The initialization operation includes initializing the programmable functional device to set its function to a known default state; The instruction operation includes sending a test instruction to the programmable functional device according to a test plan, and querying its execution status or reading return data according to the test instruction; The reading operation includes reading character data, single numerical data and batch data; The error handling operation includes error detection and handling functions.
8. A testing method based on ATE platform, characterized in that: Applied to the test system based on the ATE platform as claimed in any one of claims 1 to 7, the test method comprises: When testing the power supply test device on the DUT board, the ATE machine is controlled to send the test instruction to the extension device through the communication interface, the programmable functional device is controlled to perform the extended test function corresponding to the test instruction on the power supply test device through the test signal interface, and the ATE machine is controlled to obtain the test result of the extended test function through the test harness; wherein the extended test function includes at least one of providing a test input signal, applying a dynamic load, and collecting test data.
9. An electronic device, characterized in that: Includes memory, processor and bus; The bus is used to realize the connection and communication between the memory and the processor; The processor is used to execute the computer program stored in the memory; When the processor executes the computer program, the steps in the testing method based on the ATE platform described in claim 8 are implemented.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps in the testing method based on the ATE platform described in claim 8 are implemented.