Test temperature control equipment for photovoltaic module and use method thereof
By using a combination of semiconductor refrigerator modules and thermocouples in photovoltaic module testing, precise control of the temperature of photovoltaic modules is achieved, the problem of uneven temperature distribution is solved, the test accuracy is improved, and it is suitable for testing environments with limited space.
Patent Information
- Application Number
- CN202510236530.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-28
- Publication Date
- 2025-05-30
AI Technical Summary
It is difficult for photovoltaic modules to achieve accurate local temperature control in steady-state IV tests, resulting in uneven temperature distribution, affecting the accuracy of the test results. At the same time, the test system has a large space occupancy, affecting the applicability.
Using a test temperature control device including a semiconductor refrigerator module and a thermocouple, the combination of a matrix-arranged semiconductor refrigerator module and multiple thermocouples can achieve accurate and rapid control of the temperature of the photovoltaic module. Each semiconductor refrigerator module is controlled by an independent power supply, contacts the photovoltaic module to be measured through thermally conductive grease, and combines an infrared imager to assist in adjusting the temperature to ensure uniform temperature distribution.
Accurate control of local temperature of photovoltaic modules, ensure uniform temperature distribution, improve the accuracy of steady-state IV testing, and is suitable for testing environments with limited space due to the compact equipment design.
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Figure CN120074374A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the technical field of photovoltaic module testing, and particularly relates to a temperature control device for testing photovoltaic modules and a using method thereof. Background Art
[0002] As a new type of high-efficiency photovoltaic material, perovskite solar cells have received extensive attention in the photovoltaic field in recent years. However, perovskite solar cells often exhibit a hysteresis phenomenon during current-voltage (IV) characteristic tests, that is, different IV curves are generated during forward voltage scanning and reverse voltage scanning. This hysteresis phenomenon makes the results of transient IV tests may not accurately reflect the actual performance of perovskite cells. In addition, transient light source test equipment has limitations in technology and cannot provide sufficiently accurate test results. The transient light source may not be able to provide a spectrum that exactly matches actual sunlight, resulting in deviations in test results. Therefore, in view of the various drawbacks of perovskite cells in transient IV tests, the IV tests of perovskite cells currently adopt the method of steady-state tests.
[0003] Steady-state IV test is a specific performance test for photovoltaic modules in the photovoltaic field. This test is mainly used to evaluate the electrical performance of photovoltaic modules under stable illumination conditions. Specifically, the steady-state IV test involves measuring the current-voltage (I-V) characteristic curve of a photovoltaic module under controlled environmental conditions (for example, a certain temperature and light intensity). This curve provides key information about the module performance and the calculated conversion efficiency, etc. In the steady-state IV test, "steady state" means that the test conditions (such as light intensity and temperature) remain constant throughout the test process to ensure the accuracy and repeatability of the measurement results. Such test conditions help to more accurately evaluate the performance of photovoltaic modules in actual applications.
[0004] Although the steady-state test method can avoid the hysteresis phenomenon and light source mismatch problem in transient tests to a certain extent, in practical applications, the temperature control of photovoltaic modules during steady-state IV tests is still a difficult problem. Especially when conducting a long-time delay time scan test on perovskite cells, how to accurately control the temperature of the module at the standard test temperature of 25°C has become a key issue.
[0005] In the prior art, the temperature control accuracy of air-conditioning for environmental cooling is insufficient, making it difficult to precisely control the local temperature of photovoltaic modules. Especially under the conditions of large-sized modules or high-power tests, the temperature difference is more obvious, thus affecting the accuracy of test results. In the test environment, the temperatures at different positions may vary, resulting in uneven temperature distribution on the surface of the photovoltaic module to be tested. This unevenness will directly affect the accuracy of the IV test results. Especially in scenarios that require high-precision tests, the problem of poor temperature uniformity is particularly prominent. Moreover, the current system occupies a relatively large amount of space, which is not conducive to the layout of laboratories or test sites. Especially in some test environments with limited space, it may cause inconvenience to the arrangement and operation of test equipment. To sum up, in the current steady-state test of photovoltaic modules, the local temperature of the photovoltaic modules cannot be precisely controlled, resulting in uneven component temperature distribution, affecting the accuracy of test results, and the large space occupancy rate of the test system affects its applicability. Summary of the Invention
[0006] The present invention provides a test temperature control device for photovoltaic modules and its usage method, aiming to solve the problems in the current steady-state test of photovoltaic modules, including the inability to precisely control the local temperature of photovoltaic modules, resulting in uneven component temperature distribution, affecting the accuracy of test results, and the large space occupancy rate of the test system, affecting its applicability.
[0007] To achieve the above object, the present invention adopts the following technical solutions: The present invention provides a test temperature control device for photovoltaic modules, including the following steps: A test temperature control device for photovoltaic modules includes a device body. The device body can be configured with a steady-state light source and a control unit to perform temperature tests on the photovoltaic module to be tested. The device body includes at least several combined thermoelectric cooler modules, and each thermoelectric cooler module is provided with at least one thermocouple, wherein: Each thermoelectric cooler module is controlled by an independent power supply, and the device body can be detachably installed with the photovoltaic module to be tested; In the installed state: the photovoltaic module to be tested is in contact with the thermoelectric cooler module through coated thermal conductive silicone grease. The steady-state light source can irradiate the photovoltaic module to be tested, the thermocouple can measure the temperature of the photovoltaic module to be tested, and the control unit can adjust the cooling capacity of any one thermoelectric cooler module to cool a local area of the photovoltaic module to be tested.
[0008] In some embodiments, the photovoltaic module to be tested and the device body can be fixed by a frame buckle.
[0009] Furthermore, the frame buckle includes a bayonet structure provided at the edge of the device body, and the bayonet structure is used to fix the frame of the photovoltaic module to be tested.
[0010] In some embodiments, in the installed state, thermal grease is evenly applied to the opposite surfaces of the photovoltaic module to be tested and the thermoelectric cooler module respectively, so as to achieve heat exchange between the photovoltaic module to be tested and the thermoelectric cooler module.
[0011] In some embodiments, a plurality of thermoelectric cooler modules are arranged in a matrix.
[0012] In some embodiments, a plurality of thermocouples are evenly distributed in the area of each thermoelectric cooler module corresponding to the photovoltaic module to be tested; the thermocouples are in contact with the back surface of the photovoltaic module to be tested, and are used to monitor the temperature in real time and assist in adjusting the power of the thermoelectric cooler module.
[0013] In some embodiments, an infrared imager is further included, and the infrared imager is used to collect the temperature data on the front surface of the photovoltaic module to be tested during the steady-state IV test and judge the uniformity of the temperature data.
[0014] In some embodiments, the equipment body and the photovoltaic module to be tested are vertically placed at the test position, and the power of the thermoelectric cooler module is adjusted to stabilize the temperature of the photovoltaic module to be tested at the preset test temperature.
[0015] In some embodiments, the control unit can dynamically adjust the input power of the corresponding thermoelectric cooler module according to the feedback signal of the thermocouple.
[0016] The present invention also provides a method for using a test temperature control device for a photovoltaic module, including the following steps: S1. Correspond the positions of the photovoltaic module to be tested and the thermocouples, assemble the thermoelectric cooler module and the photovoltaic module to be tested to form an assembled unit; S2. Place the assembled unit at the preset test position, turn on the steady-state light source and adjust the irradiation intensity to irradiate the photovoltaic module to be tested; S3. Test the temperature of the photovoltaic module to be tested through the thermocouple, and the control unit judges the magnitude of the input power value of the thermoelectric cooler module according to the data of the thermocouple; at the same time, judge whether the temperature of the photovoltaic module to be tested is uniform through the thermocouple, and if it is not uniform, change the power value of the thermoelectric cooler module in a specific area to increase the temperature of the specific area of the photovoltaic module to be tested; S4. Under the preset irradiation, adjust the power value of the thermoelectric cooler module so that the temperature of the photovoltaic module to be tested is stabilized at the preset test temperature. After the temperature of the photovoltaic module to be tested is maintained at the preset test temperature, perform a steady-state IV test on the photovoltaic module to be tested.
[0017] Compared with the prior art, the test temperature control device for a photovoltaic module and the method for using the same according to the present invention have the following beneficial effects: A temperature control device for testing photovoltaic modules according to the present invention includes a device body, which can be configured with a steady-state light source and a control unit for temperature testing of the photovoltaic module to be tested. The device body includes at least several combined semiconductor refrigeration module, and each semiconductor refrigeration module is provided with at least one thermocouple, wherein: each semiconductor refrigeration module is controlled by an independent power supply, and the device body can be detachably installed with the photovoltaic module to be tested; in the installed state: the photovoltaic module to be tested is in contact with the semiconductor refrigeration module through coated thermal conductive silicone grease, the steady-state light source can irradiate the photovoltaic module to be tested, the thermocouple can measure the temperature of the photovoltaic module to be tested, and the control unit can adjust the cooling capacity of any semiconductor refrigeration module to cool a local area of the photovoltaic module to be tested. Through the combination of the matrix-arranged semiconductor refrigeration modules and multiple thermocouples, the present invention can achieve precise and rapid control of the temperature of the photovoltaic module. By directly contacting the back of the photovoltaic module to be tested with thermal conductive silicone grease and combining with the semiconductor refrigeration module controlled by an independent power supply, the temperature of the module can be effectively reduced and the temperature uniformity can be maintained.
[0018] Through the cooperation of the semiconductor refrigeration module and the thermocouple, the present invention can precisely control the local temperature of the module to ensure uniform distribution of the module temperature. Moreover, the semiconductor refrigeration module of the present invention can quickly adjust the temperature, respond in a timely manner to the change of the module temperature, ensure the temperature stability during the test, occupy a small space, be applicable to more test environments, and have certain applicability. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] The accompanying drawings in the specification are used to provide a further understanding of the present invention and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention.
[0020] Figure 1 is a schematic structural diagram of a temperature control device for testing photovoltaic modules according to the present invention; Figure 2 is a schematic distribution structural diagram of the thermocouple in a temperature control device for testing photovoltaic modules according to the present invention.
[0021] Wherein, 1. Semiconductor refrigeration module, 2. Thermocouple. DETAILED DESCRIPTION OF THE INVENTION
[0022] In order to make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. Usually, the components of the embodiments of the present invention described and shown in the accompanying drawings here can be arranged and designed in various different configurations.
[0023] Accordingly, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the scope of protection of the present invention.
[0024] It should be noted that like reference numerals and letters denote like items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.
[0025] In the description of the embodiments of the present invention, it should be noted that if terms such as "upper", "lower", "horizontal", "inner", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the inventive product is habitually placed during use, it is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present invention. In addition, terms such as "first", "second", etc. are only used for descriptive distinction and cannot be construed as indicating or implying relative importance.
[0026] In addition, if the term "horizontal" appears, it does not mean that the component is required to be absolutely horizontal, but it can be slightly inclined. For example, "horizontal" only means that its direction is more horizontal relative to "vertical", and does not mean that the structure must be completely horizontal, but it can be slightly inclined.
[0027] In the description of the embodiments of the present invention, it should also be noted that unless otherwise clearly specified and limited, if terms such as "set", "installed", "connected", "connected" are understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.
[0028] How to provide a test temperature control device for a photovoltaic module, through which the measured speed temperature of the photovoltaic module to be tested during the steady-state IV test can be quickly, continuously and accurately maintained, thereby improving the accuracy of the steady-state IV test.
[0029] Such as Figure 1 and Figure 2As shown, a temperature control device for testing a photovoltaic module according to the present invention includes a device body, which can be configured with a steady-state light source and a control unit to perform temperature testing on the photovoltaic module to be tested. The device body includes at least several combined thermoelectric cooler modules 1, and each thermoelectric cooler module 1 is provided with at least one thermocouple 2, where: Each thermoelectric cooler module 1 is controlled by an independent power supply, and the device body can be detachably installed with the photovoltaic module to be tested; In the installed state: the photovoltaic module to be tested is in contact with the thermoelectric cooler module 1 through the applied thermal conductive silicone grease. The steady-state light source can irradiate the photovoltaic module to be tested, the thermocouple 2 can measure the temperature of the photovoltaic module to be tested, and the control unit can adjust the cooling capacity of any one of the thermoelectric cooler modules 1 to cool a local area of the photovoltaic module to be tested.
[0030] Through the combination of the thermoelectric cooler module 1 and the thermocouple 2, the present invention can accurately measure and control the temperature of the photovoltaic module to be tested. Each thermoelectric cooler module 1 is controlled by an independent power supply and can dynamically adjust the cooling capacity according to the feedback signal of the thermocouple 2, so as to achieve precise temperature control of the local area of the module, ensuring the stability and uniformity of the temperature during the test. The thermoelectric cooler module 1 has the characteristics of rapid cooling and heating, can promptly respond to the temperature change of the photovoltaic module to be tested, and ensures that the temperature can quickly reach and stabilize at the preset test temperature during the steady-state IV test. The thermoelectric cooler module 1 only controls the temperature of the photovoltaic module to be tested, avoiding unnecessary energy waste. The device body is detachably installed with the photovoltaic module to be tested, occupying a small space, suitable for laboratories or test sites with limited space. And the present invention realizes the direct contact between the photovoltaic module to be tested and the thermoelectric cooler module 1 through thermal conductive silicone grease, simplifies the disassembly and assembly process, and is convenient to operate.
[0031] In some embodiments, in the temperature control device for testing a photovoltaic module according to the present invention, the photovoltaic module to be tested is detachably installed by fixing it with a frame buckle. Specifically, a bayonet structure (not shown in the figure) can be adopted to ensure that the module remains stable during the test and avoid affecting the accuracy of the test results due to the movement or vibration of the module. The thermal silicone grease used in the present invention can effectively fill the tiny gaps between the photovoltaic module to be tested and the thermoelectric cooler module 1, improve the heat conduction efficiency, and uniformly applying the thermal conductive silicone grease can ensure the uniform distribution of heat on the back of the photovoltaic module to be tested, avoiding local overheating or overcooling phenomena and improving the accuracy of the test results.
[0032] Furthermore, the matrix-arranged thermoelectric cooler module 1 can cover the entire back surface of the photovoltaic module to be tested, ensuring uniform temperature distribution across the module. Multiple thermocouples 2 can monitor the temperatures of different regions of the photovoltaic module to be tested in real time, ensuring the accuracy of temperature data. The control unit can dynamically adjust the power of the thermoelectric cooler module 1 based on the real-time temperature data to achieve intelligent temperature control, which can avoid the impact of temperature fluctuations on test results, improve test accuracy, and ensure the temperature stability of the photovoltaic module to be tested during the testing process.
[0033] In some embodiments, in practical applications, the test temperature control device for photovoltaic modules of the present invention can use an infrared imager. The infrared imager can perform non-contact measurement of the temperature on the front surface of the photovoltaic module to be tested, providing comprehensive temperature distribution data for the photovoltaic module to be tested. Through the temperature data collected by the infrared imager, the uniformity of the temperature on the front surface of the module can be judged, and the power of the thermoelectric cooler module 1 can be assisted in adjusting to ensure uniform temperature distribution.
[0034] The following further details the test temperature control device for photovoltaic modules of the present invention and its usage method through specific embodiments.
[0035] The test temperature control device of the present invention includes a matrix-arranged thermoelectric cooler module 1. Each thermoelectric cooler module 1 is arranged opposite to the photovoltaic module to be tested with multiple thermocouples 2. The photovoltaic module to be tested and the matrix-arranged thermoelectric cooler module 1 are fixed by border buckles. The photovoltaic module to be tested and the thermoelectric cooler module 1 are in contact through thermal conductive silicone grease, and several thermocouples 2 are arranged therebetween for temperature measurement.
[0036] The matrix-arranged thermoelectric cooler modules 1 are all controlled by independent power supplies. The device body can adjust the cooling capacity of any one of the thermoelectric cooler modules 1 to effectively cool a specific part of the photovoltaic module to be tested corresponding to the thermoelectric cooler module 1.
[0037] The matrix-arranged thermoelectric cooler module 1 is in contact with the back surface of the photovoltaic module to be tested by applying thermal conductive silicone grease to achieve heat exchange. Multiple thermocouples 2 are evenly distributed in the area of the matrix-arranged thermoelectric cooler module 1 corresponding to the photovoltaic module to be tested and are in contact with the back surface of the photovoltaic module to be tested to achieve accurate testing and assist in accurate temperature adjustment. When performing the steady-state IV test of the photovoltaic module, an infrared imager is used to assist in testing the temperature value and temperature uniformity of the module.
[0038] The present invention also provides a usage method for the test temperature control device for photovoltaic modules, including the following steps: Apply thermal conductive grease evenly on the contact surface between the matrix-arranged semiconductor refrigeration module 1 and the photovoltaic module to be tested. Place the photovoltaic module to be tested inside the device and fix the two with a bayonet. The thermal conductive grease can effectively contact the back of the photovoltaic module to be tested and the semiconductor refrigeration module.
[0039] Vertically place the photovoltaic module to be tested and the test temperature control device at the test position, and turn on the steady-state light source to adjust the irradiation intensity to irradiate the photovoltaic module to be tested.
[0040] Test the temperature of the photovoltaic module to be tested through the thermocouple 2. Turn on the semiconductor refrigeration module 1 according to the temperature of the component. Judge the magnitude of the input power value of the semiconductor refrigeration module 1 through the value fed back by the thermocouple 2. At the same time, the thermocouples 2 evenly distributed can be used to judge whether the temperature of the photovoltaic module to be tested is uniform. If it is not uniform, the power value of the semiconductor refrigeration module 1 in a specific area can be changed to improve the temperature uniformity of the photovoltaic module to be tested.
[0041] Under standard irradiation, adjust the power value of the semiconductor refrigeration module 1 so that the temperature of the photovoltaic module to be tested is stable at the test temperature. At the same time, an infrared imager can be used to collect the front temperature of the component and judge the uniformity of the front temperature of the photovoltaic module to be tested to determine whether it is necessary to adjust the power of the semiconductor refrigeration module 1. After the component temperature is maintained at the test temperature in balance, perform a steady-state IV test on the photovoltaic module to be tested.
[0042] After the test of the photovoltaic module to be tested is completed, remove the bayonet to take out the photovoltaic module to be tested, and clean the thermal conductive grease on the back of the photovoltaic module to be tested and the semiconductor refrigeration module 1 for the next use. Complete the temperature test of the photovoltaic module to be tested.
[0043] In summary, the present invention relates to a test temperature control device for a photovoltaic module and its use method. When performing a steady-state IV test on a photovoltaic module, it can achieve more effective cooling control compared with the current environmental temperature control. The temperature of the photovoltaic module can be controlled more precisely and evenly by adjusting the power of a single or multiple semiconductor refrigeration modules. And compared with the air-conditioned environment cooling, the present invention provides a more efficient and precise temperature control device for the steady-state IV test of photovoltaic modules.
[0044] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and does not impose any form of limitation on the present invention. Any person skilled in the art can smoothly implement the present invention according to the description in the specification and the above description. Any equivalent changes made by making some modifications, decorations and evolutions using the technical content disclosed above are equivalent embodiments of the present invention. At the same time, any equivalent changes, modifications and evolutions made to the above embodiments based on the essential technology of the present invention still fall within the protection scope of the technical solution of the present invention.
Claims
1. A test temperature control device for photovoltaic modules, characterized in that: The device comprises a device body, which can be configured with a steady-state light source and a control unit so as to perform a temperature test on a photovoltaic module to be tested. The device body comprises at least a plurality of combined semiconductor refrigerator modules (1), each of which is provided with at least one thermocouple (2), wherein: Each of the semiconductor refrigerator modules (1) is controlled by an independent power supply, and the device body can be installed with a photovoltaic module to be tested in a detachable manner; In the installed state: the photovoltaic component to be tested is in contact with the semiconductor refrigerator module (1) via the applied thermal grease, the steady-state light source can illuminate the photovoltaic component to be tested, the thermocouple (2) can measure the temperature of the photovoltaic component to be tested, and the control unit can adjust the cooling capacity of any semiconductor refrigerator module (1) so as to cool down a local area of the photovoltaic component to be tested.
2. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: The photovoltaic assembly to be tested and the device body can be fixed by frame buckles.
3. The test temperature control device for photovoltaic modules according to claim 2, characterized in that: The frame buckle comprises a bayonet structure arranged at the edge of the device body, and the bayonet structure is used to fix the frame of the photovoltaic component to be tested.
4. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: In the installed state, the thermally conductive silicone grease is evenly applied to the opposite surfaces of the photovoltaic component to be tested and the semiconductor refrigerator module (1), so as to achieve heat exchange between the photovoltaic component to be tested and the semiconductor refrigerator module (1).
5. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: A plurality of the semiconductor refrigerator modules (1) are arranged in a matrix.
6. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: A plurality of thermocouples (2) are distributed in the region of each semiconductor refrigerator module (1) corresponding to the photovoltaic module to be tested; the thermocouples (2) are in contact with the back surface of the photovoltaic module to be tested and are used to monitor the temperature in real time and assist in adjusting the power of the semiconductor refrigerator module (1).
7. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: It also includes an infrared imager, which is used to collect temperature data on the front side of the photovoltaic component to be tested during the steady-state IV test and determine the uniformity of the temperature data.
8. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: The device body and the photovoltaic component to be tested are placed vertically at a test position, and the temperature of the photovoltaic component to be tested is stabilized at a preset test temperature by adjusting the power of the semiconductor refrigerator module (1).
9. The test temperature control device for photovoltaic modules according to claim 1, characterized in that: The control unit can dynamically adjust the input power of the corresponding semiconductor refrigerator module (1) according to the feedback signal of the thermocouple (2).
10. A method for using the test temperature control device for photovoltaic modules according to any one of claims 1 to 9, characterized in that: The steps include: S1, aligning the positions of the photovoltaic module to be tested with the thermocouple (2), assembling the semiconductor refrigerator module (1) and the photovoltaic module to be tested to form an assembly unit; S2, placing the assembly unit at a preset test position, turning on the steady-state light source and adjusting the irradiation intensity to irradiate the photovoltaic module to be tested; S3, testing the temperature of the photovoltaic module to be tested by means of the thermocouple (2), and the control unit determining the magnitude of the input power value of the semiconductor refrigerator module (1) according to the data of the thermocouple (2); and determining whether the temperature of the photovoltaic module to be tested is uniform by means of the thermocouple (2); if it is not uniform, increasing the temperature of a specific area of the photovoltaic module to be tested by changing the power value of the semiconductor refrigerator module (1) in the specific area; S4. Under the preset irradiation, the power value of the semiconductor cooler module is adjusted so that the temperature of the photovoltaic module to be tested is stabilized at the preset test temperature. After the temperature of the photovoltaic module to be tested is maintained at the preset test temperature, a steady-state IV test is performed on the photovoltaic module to be tested.
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