Electrical testing method and device for liquid crystal display panel and electronic equipment

Abstract

The invention provides an electrical testing method and device for a liquid crystal display panel and electronic equipment, and relates to the field of data processing. According to the method, a multi-channel signal generator is adopted to apply sine voltage signals to a liquid crystal display panel; acquiring a light intensity time sequence acquired by the high-speed camera for the liquid crystal display panel to which the sinusoidal voltage signal is applied; analyzing the light intensity time sequence through the mapping relation curve to obtain an analysis result aiming at the liquid crystal display panel; and an analysis result is converted into a two-dimensional distribution diagram, and an abnormal area is obtained through positioning by an image processing algorithm. By implementing the technical scheme provided by the invention, the electrical testing efficiency of the liquid crystal display panel can be improved.

Description

Technical Field

[0001] This application relates to the technical field of data processing, and particularly to a method, device and electronic device for electrical testing of a liquid crystal display panel. Background Art

[0002] As a core display component of modern electronic devices, the electrical performance indicators of a liquid crystal display panel directly affect the display effect, power consumption and service life.

[0003] Existing electrical performance tests for liquid crystal panels mostly rely on the microprobe point-by-point contact measurement technology. Usually, the probe is positioned at the edge of the panel glass substrate or at the pixel driving electrode, and an AC bias is applied to each single pixel or small area one by one using an LCR meter, oscilloscope or current source, and parameters such as voltage, current, capacitance and loss are measured. However, when the number of panel pixels is huge, point-by-point contact measurement requires frequent movement of the probe or the use of a complex probe array, and the test cycle often reaches several hours or even several days, resulting in low electrical testing efficiency for the liquid crystal display panel.

[0004] Therefore, there is an urgent need for a method, device and electronic device for electrical testing of a liquid crystal display panel. Summary of the Invention

[0005] This application provides a method, device and electronic device for electrical testing of a liquid crystal display panel, which is convenient for improving the electrical testing efficiency of the liquid crystal display panel.

[0006] In the first aspect of this application, a method for electrical testing of a liquid crystal display panel is provided. The method includes: applying a sine voltage signal to the liquid crystal display panel by using a multi-channel signal generator; obtaining the light intensity time series collected by a high-speed camera for the liquid crystal display panel after the sine voltage signal is applied; analyzing the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; converting the analysis result into a two-dimensional distribution map, and positioning the abnormal area through an image processing algorithm.

[0007] By adopting the above technical solution, applying a sine voltage signal to the liquid crystal display panel through a multi-channel signal generator can achieve high-frequency, high-resolution, and multi-point parallel excitation under non-contact conditions, avoiding problems such as glass scratching, electrode damage, and contact resistance interference caused by traditional probe point-by-point contact. Secondly, using a high-speed camera to collect the light intensity time series of the liquid crystal panel after applying the electrical signal can capture the response behavior of each pixel point under dynamic driving without contact and damage, realizing large-area, global, and synchronous electro-optical characteristic sampling. Thirdly, by inversely analyzing the light intensity data through the pre-constructed photoelectric mapping relationship curve, the optical response can be restored to electrical performance parameters such as equivalent capacitance, conductance, or phase shift, effectively bridging the gap that is difficult to intuitively convert between "optical signal" and "electrical parameters" in traditional testing. Further, after the analysis results are uniformly encoded to generate a two-dimensional electrical parameter distribution map, combined with image processing algorithms such as threshold segmentation, edge extraction, and connected component analysis, tiny but critical abnormal areas in the panel can be automatically identified, including parasitic capacitance mutation, signal path blockage, or uneven drive response, greatly improving the detection accuracy and defect localization ability. Therefore, it is convenient to improve the electrical measurement efficiency of the liquid crystal display panel.

[0008] Optionally, the method further includes: applying known DC voltage data to at least one group of test pixels on the liquid crystal display panel; acquiring the light intensity data of the liquid crystal display panel; and constructing a mapping relationship curve between light intensity and voltage according to the DC voltage data and the light intensity data.

[0009] By adopting the above technical solution, by applying known DC voltage data to at least one group of test pixels on the liquid crystal display panel and synchronously acquiring the corresponding light intensity response data, a mapping relationship curve between light intensity and voltage is constructed, which has extremely important technical significance and practical value. First of all, this process ensures that the electro-optical response of each pixel point under static conditions is stably collected by precisely controlling the applied voltage range and step interval, eliminating the complex interference caused by factors such as response lag and frequency coupling under dynamic driving, making the subsequent mapping relationship more reliable and controllable. Secondly, by establishing this one-to-one electro-optical mapping curve, the reverse decoding from light intensity data to electrical parameters can be effectively realized, enabling optical measurement to have the ability to analyze the electrical performance of the panel and breaking through the limitation of only obtaining brightness or color information in the traditional way. Thirdly, this mapping relationship has good repeatability and generalization ability, and can be adaptively adjusted through calibration between different test batches or different model panels, thus improving the versatility of the method. In addition, this curve can also be used as an important training basis for machine learning, electrical parameter reconstruction, or defect prediction models, realizing intelligent diagnosis and predictive maintenance driven by data.

[0010] Optionally, analyzing the light intensity time series through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel specifically includes: obtaining multiple excitation frequencies of the multi-channel signal generator; synchronously multiplying the light intensity time series with the sine and cosine signals of each excitation frequency to obtain multiplication results; performing low-pass filtering on the multiplication results, and obtaining the amplitudes and phases of each frequency component; using the mapping relationship curve to map the amplitudes and phases of each frequency component to corresponding voltage values and current values; according to the corresponding voltage values and current values, combining with the series resistance-capacitance equivalent circuit model, inversely calculating the analysis result of the liquid crystal display panel through multi-frequency point least squares fitting, where the analysis result includes the equivalent resistance, equivalent capacitance, and loss angle of each pixel on the liquid crystal display panel.

[0011] By adopting the above technical solution, by obtaining multiple excitation frequencies of the multi-channel signal generator and synchronously multiplying the light intensity time series with the sine and cosine waves of each frequency, coherent demodulation can be effectively achieved, so that multiple frequency responses originally mixed in the time signal are separately extracted. This processing method not only improves the resolution but also suppresses the interference of non-target frequencies, improving the signal-to-noise ratio and stability of the measurement. Secondly, by performing low-pass filtering on the above multiplication results, accurate amplitude and phase information of each frequency component can be obtained, which provides a core basis for reflecting the true response characteristics of liquid crystal pixels under different frequency drives. Further, with the help of the pre-constructed optoelectronic mapping curve, these optical information can be accurately converted into equivalent voltage and current data, thus realizing the cross-physical quantity conversion from the optical domain to the electrical domain, avoiding the inherent contact errors and damage risks in direct electrical measurement. Moreover, combining with the series resistance-capacitance equivalent circuit model and performing least squares fitting on the voltage and current data of multiple frequency points can comprehensively inversely calculate the electrical property parameters of each pixel point of the liquid crystal panel.

[0012] Optionally, obtaining the light intensity time series collected by the high-speed camera for the liquid crystal display panel after applying the sine voltage signal specifically includes: in a constant backlight environment, controlling the high-speed camera to continuously shoot the liquid crystal display panel at a frame rate preset to be a multiple of the excitation frequency to obtain captured images; according to the captured images, matching the power-on time stamps of the multi-channel signal generator, and outputting the light intensity time series.

[0013] By adopting the above technical solution, by controlling a high-speed camera to continuously shoot at a frame rate preset to be a multiple of the excitation frequency in a constant backlight environment, and synchronously aligning with the power-on timestamps of a multi-channel signal generator, the light intensity time series of the liquid crystal display panel is obtained with high precision, which has significant technical advantages and practical value. First, shooting under constant backlight conditions can effectively avoid the interference of ambient light changes or backlight fluctuations on the light intensity signal, ensure the consistency and stability of the collected data, and enhance the accuracy of subsequent optoelectronic mapping; second, sampling at a frame rate several times higher than the excitation frequency enables multiple key phase points within each period to be completely captured, ensuring that the time-domain details of the light intensity signal can be restored with high resolution, which is helpful for accurately calculating frequency-domain response characteristics such as amplitude and phase information.

[0014] Optionally, the converting the analysis result into a two-dimensional distribution map and locating the abnormal area through an image processing algorithm specifically includes: obtaining the target pixels of the liquid crystal display panel; mapping the voltage values and current values of the target pixels in the analysis result onto a two-dimensional grid and rendering them with pseudo colors to obtain a heat distribution map; adopting a gray-scale threshold segmentation algorithm and a connected component extraction algorithm to extract features from the heat distribution map, and combining morphological filtering for denoising to obtain target feature points; extracting the color values of the target feature points; and determining the abnormal area according to the magnitude relationship between the color values and the color threshold, where the abnormal area includes capacitance mutations and / or loss hotspots.

[0015] By adopting the above technical solution, by visually mapping the analysis result into a two-dimensional distribution map and realizing the efficient identification and accurate positioning of the abnormal area with the help of an image processing algorithm, it reflects a highly integrated multi-dimensional information fusion ability and the intelligent level of abnormal detection. First, by extracting the voltage values and current values of all target pixels in the liquid crystal display panel and mapping these data onto a two-dimensional grid to construct a pseudo-color heat distribution map, it not only realizes the intuitive expression of electrical performance parameters in the spatial dimension, but also makes the originally abstract electrical parameters have an observable, comparable, and quantifiable image form, greatly improving the intuitiveness and operation efficiency of human-computer interaction; second, adopting a gray-scale threshold segmentation algorithm and a connected component extraction algorithm to extract features from different color regions in the heat map can quickly screen out local areas with significant electrical deviations, and further performing image denoising processing through morphological filtering can effectively exclude misjudgment points caused by shooting noise or edge effects, enhancing the integrity and boundary clarity of the target feature area; third, by extracting the color values of the target feature points and comparing them with a preset color threshold, the nature of the abnormal area can be quantitatively identified.

[0016] Optionally, determining the abnormal area according to the magnitude relationship between the color value and the color threshold specifically includes: if it is determined that the color value is greater than the color threshold, calibrating the coordinates and boundaries of the target feature points according to a preset first range to obtain a first abnormal area, where the preset first range is determined by the difference between the color value and the color threshold; if it is determined that the color value is less than the color threshold, calibrating the coordinates and boundaries of the target feature points according to a preset second range to obtain a second abnormal area, where the preset second range is determined by the difference between the color value and the color threshold.

[0017] By adopting the above technical solution, by dynamically performing hierarchical judgment and regional boundary calibration on the target feature points in the liquid crystal display panel based on the magnitude relationship between the color value and the preset color threshold, the accuracy of abnormal detection, the fine-grained recognition ability, and the flexibility of regional definition are further improved. Specifically, this method first effectively distinguishes the abnormal response areas that may have different types or severity levels by determining the relative magnitude of the color value and the threshold; when the color value is higher than the threshold, it often represents that the electrical parameters of the target pixel are abnormally large, such as significant current leakage, loss hot spots, or high-frequency conduction abnormalities. At this time, calibrating the boundary according to the preset first range can accurately enclose such strong abnormal areas and ensure that their boundary ranges are dynamically adjusted according to the "excess amount", improving the accuracy and effectiveness of positioning; on the contrary, when the color value is lower than the threshold, it may indicate hidden defects such as capacitance drop, signal attenuation, or drive failure of the pixel. By setting the second range to perform refined calibration of coordinates and boundaries, the true boundaries of such weak response or electrical degradation areas can also be reasonably depicted.

[0018] Optionally, the method further includes: generating a detection report according to the abnormal area; sending the detection report to the staff corresponding to the liquid crystal display panel.

[0019] By adopting the above technical solution, after identifying and locating the abnormal area of the liquid crystal display panel, a structured report containing the detection results is automatically generated and sent to relevant staff, significantly improving the information closed-loop degree and response efficiency of the detection process, and having practical application value and management advantages in many aspects. First, by automatically generating a detection report, the content including the position information of the abnormal area, the distribution of electrical performance parameters, the judgment of the abnormal type, the degree of abnormality, etc. can be systematically output in the form of a combination of pictures and texts, realizing the whole-process data precipitation from image processing to information induction, and providing a visual and archivable basis for subsequent problem tracking, repair decision-making, quality control analysis, etc.; second, the generation of the detection report is based on an algorithm-driven data processing process, avoiding situations such as missed reports and incorrect writing that may occur during manual recording, and ensuring the accuracy and consistency of information; third, after the report is generated, it can be sent to relevant staff in the production or quality inspection of the liquid crystal panel in real time, enabling them to grasp the detection results and quickly respond to the problem area at the first time, not only accelerating the production rhythm and closed-loop feedback speed, but also improving the real-time performance and collaborative efficiency of the entire panel detection system.

[0020] In the second aspect of the present application, an electrical measurement device for a liquid crystal display panel is provided. The electrical measurement device includes an acquisition module and a processing module. Among them, the processing module is used to apply a sine voltage signal to the liquid crystal display panel by using a multi-channel signal generator; the acquisition module is used to acquire the light intensity time series collected by a high-speed camera for the liquid crystal display panel after the sine voltage signal is applied; the processing module is further used to analyze the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; the processing module is further used to convert the analysis result into a two-dimensional distribution map and locate the abnormal area through an image processing algorithm.

[0021] In the third aspect of the present application, an electronic device is provided. The electronic device includes a processor, a memory, a user interface, and a network interface. The memory is used to store instructions. Both the user interface and the network interface are used to communicate with other devices. The processor is used to execute the instructions stored in the memory so that the electronic device executes the method described above.

[0022] In the fourth aspect of the present application, a computer-readable storage medium is provided. The computer-readable storage medium stores instructions, and when the instructions are executed, the method described above is executed.

[0023] In summary, one or more technical solutions provided in the present application have at least the following technical effects or advantages: By using a multi-channel signal generator to apply a sine voltage signal to the liquid crystal display panel, high-frequency, high-resolution, and multi-point parallel excitation can be achieved under non-contact conditions, avoiding problems such as glass scratches, electrode damage, and contact resistance interference caused by the traditional probe's point-by-point contact; secondly, by using a high-speed camera to collect the light intensity time series of the liquid crystal panel after applying the electrical signal, the response behavior of each pixel point under dynamic driving can be captured without contact and damage, realizing large-area, global, and synchronous electro-optical characteristic sampling; thirdly, by performing inverse analysis on the light intensity data through a pre-constructed optoelectronic mapping relationship curve, the optical response can be restored to electrical performance parameters such as equivalent capacitance, conductance, or phase shift, effectively bridging the gap that is difficult to intuitively convert between "optical signals" and "electrical parameters" in traditional tests; further, after the analysis results are uniformly encoded, a two-dimensional electrical parameter distribution map is generated. Combining image processing algorithms such as threshold segmentation, edge extraction, and connected component analysis, tiny but critical abnormal areas in the panel can be automatically identified, including parasitic capacitance mutations, signal path blockages, or uneven driving responses, greatly improving the detection accuracy and defect localization ability. Therefore, it is convenient to improve the electrical measurement efficiency of the liquid crystal display panel. Description of the Drawings

[0024] Figure 1 It is a schematic flowchart of an electrical measurement method for a liquid crystal display panel provided by an embodiment of the present application; Figure 2 It is another schematic flowchart of an electrical measurement method for a liquid crystal display panel provided by an embodiment of the present application; Figure 3 It is a schematic block diagram of an electrical measurement device for a liquid crystal display panel provided by an embodiment of the present application; Figure 4 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application.

[0025] Description of the reference numerals: 31, acquisition module; 32, processing module; 41, processor; 42, communication bus; 43, user interface; 44, network interface; 45, memory. Detailed Embodiments

[0026] In order to enable those skilled in the art to better understand the technical solutions in this specification, the following will clearly and completely describe the technical solutions in the embodiments of this specification in conjunction with the accompanying drawings in the embodiments of this specification. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments.

[0027] In the description of the embodiments of the present application, words such as "for example" or "for instance" are used to give examples, illustrations or explanations. Any embodiment or design solution described as "for example" or "for instance" in the embodiments of the present application should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Rather, the use of words such as "for example" or "for instance" is intended to present relevant concepts in a specific manner.

[0028] In the description of the embodiments of the present application, the term "a plurality of" means two or more. For example, a plurality of systems means two or more systems, and a plurality of screen terminals means two or more screen terminals. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. The terms "comprise", "include", "have" and their variants all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0029] As an indispensable core display component in modern electronic devices, the electrical performance of a liquid crystal display panel largely determines the display quality, energy consumption performance and product life of the whole machine. The current mainstream electrical performance test method for liquid crystal panels still mainly focuses on point-by-point contact measurement with microprobes. This method usually accurately positions the microprobes at the edge of the glass substrate of the panel or the pixel driving electrode position, and cooperates with instruments such as an LCR meter, an oscilloscope or a precision current source to apply an alternating bias signal to each pixel or a small range area one by one, and measure key parameters such as the corresponding voltage, current, capacitance, loss factor, etc.

[0030] However, with the continuous improvement of the panel resolution and the increasing pixel density, the point-by-point contact test not only requires frequent movement of the probes or relies on a highly complex probe array for batch coverage, but the overall test process is extremely time-consuming, often taking several hours or even several days to complete the comprehensive measurement of the entire panel, seriously restricting the overall efficiency of electrical detection and mass production adaptability. In addition, the probe contact process may also introduce mechanical stress or contact resistance interference, posing a risk of damaging the panel or measurement errors.

[0031] To solve the above technical problems, the present application provides an electrical measurement method for a liquid crystal display panel, referring to Figure 1 , Figure 1 is a schematic flow chart of an electrical measurement method for a liquid crystal display panel provided by an embodiment of the present application. This electrical measurement method is applied to a server and includes steps S110 to S140. The above steps are as follows: S110. Apply a sine voltage signal to the liquid crystal display panel using a multi-channel signal generator.

[0032] Specifically, a sine wave signal generator capable of simultaneously outputting multiple independent and adjustable channels is used in the test system, and these voltage signals are directly applied to the row and column drive lines of the liquid crystal panel. Through the parallel output of multiple channels, different frequencies or amplitudes of excitation can be applied to the panel in the same test, simulating various driving conditions that the panel may encounter in actual operation, so as to obtain the response information of the panel at multiple frequency bands at one time, without repeating the loading and switching of the excitation of a single path, greatly improving the test efficiency and flexibility.

[0033] Among them, the server refers to the central control and data management unit in the entire test system. It communicates with the multi-channel signal generator through a network or bus interface to configure and issue commands for its output frequency, amplitude, phase and other parameters. The server is not only responsible for loading and storing the setting files of the excitation signals, but also plays the role of trigger and synchronization control. When the test starts, the server sends a start command to the signal generator, notifies the high-speed camera to start collecting at the same time, and records the timestamps of both in the log to ensure the accurate alignment and traceability management of the electrical signals and optical data in subsequent analysis.

[0034] For example, assume that three sine wave outputs are configured. Channel 1 simulates the normal refresh frequency of the panel with an amplitude of 240 Hz and 5 Vpp, Channel 2 is used to detect the medium-frequency dielectric loss with an amplitude of 1 kHz and 2 Vpp, and Channel 3 is used to analyze the high-frequency parasitic resistance effect with an amplitude of 10 kHz and 1 Vpp. After superimposing these three waveforms, the signal generator sends them to the row drive and column drive interfaces through an amplifier, and at the same time starts the high-speed camera for optical acquisition. In this way, the dynamic response of the panel under three driving conditions of low frequency, medium frequency and high frequency can be obtained within the same test cycle, laying a solid foundation for subsequent multi-frequency harmonic demodulation and electrical parameter inversion.

[0035] S120. Obtain the light intensity time series collected by the high-speed camera for the liquid crystal display panel after being applied with the sine voltage signal.

[0036] Specifically, after the liquid crystal display panel is applied with the sine voltage signal by the multi-channel signal generator, the server will control the high-speed camera to continuously shoot the panel at an extremely high frame rate, so as to record the brightness (i.e., light intensity) change generated by each pixel point under the voltage excitation. The high-speed camera uploads the collected image sequence to the server, and the server then extracts and sorts the pixel brightness changes in these images frame by frame to form a "light intensity time series" reflecting the pixel response process for subsequent electrical analysis. This process ensures non-contact, global and dynamic acquisition of the electrical response behavior of liquid crystal pixels, avoiding the efficiency and accuracy problems caused by point-by-point electrical contact.

[0037] In one possible implementation, obtaining a light intensity time series collected by a high-speed camera for a liquid crystal display panel after a sinusoidal voltage signal is applied specifically includes: in a constant backlight environment, controlling the high-speed camera to continuously photograph the liquid crystal display panel at a frame rate that is a preset multiple of the excitation frequency to obtain a captured image; and matching a power-on timestamp of a multi-channel signal generator according to the captured image to output a light intensity time series.

[0038] Specifically, in order to accurately capture the dynamic response process of liquid crystal pixels under voltage excitation, the test system will first set a stable backlighting environment to ensure that external light will not interfere with the shooting effect. Subsequently, the server controls the high-speed camera to continuously shoot the LCD display panel at a frame rate much higher than the frequency of the applied sinusoidal signal (for example, 5 times, 10 times or higher). Continuous images with high frame rates can carefully record the periodic fluctuations of pixel brightness with voltage changes. Since camera acquisition and signal application are carried out in parallel, the server will use the timestamp information sent by the signal generator to accurately align the time axis of the captured image, thereby accurately organizing the light intensity information of each pixel at each moment into a complete time series.

[0039] For example, assuming that the signal generator applies a sinusoidal excitation signal with a frequency of 200Hz to the LCD panel, the server sets the high-speed camera to continuously shoot at a speed of 2000 frames per second, which is equivalent to taking 10 frames of images in each sinusoidal cycle. In the image captured under constant backlight, the brightness change of each pixel in 10 frames will show a trend of fluctuating with the sinusoidal signal. The server then matches the time sequence of the image frames with the start time of the excitation voltage, and can accurately extract the complete curve of the pixel brightness changing with time, that is, the light intensity time series. This curve will serve as the core data basis for analyzing the electrical performance of the pixel.

[0040] S130 , analyzing the light intensity time series through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel.

[0041] Specifically, after obtaining the light intensity time series of each pixel of the liquid crystal display panel, the server does not directly use these optical data as the basis for judgment, but uses the pre-constructed "mapping relationship curve" to convert the physical meaning. This mapping relationship curve is based on experiments, and it reflects the regular relationship between the light intensity response of the liquid crystal pixel and its electrical parameters such as voltage and current. The server uses this curve to convert the fluctuation pattern of light intensity over time into corresponding electrical behavior parameters, such as voltage changes, current responses, impedance characteristics, etc., thereby realizing non-contact pixel electrical performance analysis.

[0042] In a possible implementation, a known DC voltage data is applied to at least one group of test pixels on a liquid crystal display panel; the light intensity data of the liquid crystal display panel is acquired; and a mapping relationship curve between the light intensity and the voltage is constructed based on the DC voltage data and the light intensity data.

[0043] Specifically, the system applies DC voltages with different amplitudes to these known pixels and records the light intensity performance of the corresponding pixels under each voltage condition. Since the liquid crystal response under DC signals is relatively stable, it can be ensured that each set of "voltage - light intensity" data is stable and repeatable, thus forming a set of basic mapping data points. The server fits these points into a "mapping relationship curve", and subsequent analysis can convert the light intensity value of unknown pixels into equivalent electrical parameters through this curve.

[0044] For example, select the pixels in 5 typical areas of the panel as test points, apply multiple voltage levels such as 0V, 1V, 2V, 3V to them in sequence, and use a high - speed camera to record the brightness values of the pixels under these voltages, such as the gray - scale change from dark to bright. After the server collects these data pairs of brightness and voltage, a curve is obtained through fitting: the higher the brightness, the greater the corresponding voltage. This curve becomes the "reference model" of the entire test system. In subsequent large - scale dynamic tests, only by looking at the light intensity, the voltage state of the current pixel can be accurately inferred, realizing efficient reduction of electrical parameters without electrical contact.

[0045] In a possible implementation, the light intensity time series is analyzed through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel, which specifically includes: acquiring multiple excitation frequencies of a multi - channel signal generator; synchronously multiplying the light intensity time series with the sine signal and cosine signal of each excitation frequency respectively to obtain multiplication results; performing low - pass filtering on the multiplication results and acquiring the amplitudes and phases of each frequency component; using the mapping relationship curve to map the amplitudes and phases of each frequency component into corresponding voltage values and current values; according to the corresponding voltage values and current values, combined with the series resistance - capacitance equivalent circuit model, inversely calculate the analysis result of the liquid crystal display panel through multi - frequency point least - squares fitting. The analysis result includes the equivalent resistance, equivalent capacitance, and loss angle of each pixel on the liquid crystal display panel.

[0046] Specifically, the server extracts the information of sine excitation signals with multiple different frequencies from the multi-channel signal generator. Subsequently, using these frequencies as references, the server synchronously multiplies the light intensity time series collected by the high-speed camera with the sine and cosine waveforms corresponding to the respective frequencies, thereby extracting each frequency component hidden in the light intensity. This process is similar to "sifting out" the response components consistent with a specific frequency from the signal. After multiplication, the system performs low-pass filtering on the result to remove noise interference, retaining only the key frequency components, and then calculates the response amplitude and phase information corresponding to each frequency. Subsequently, relying on the previously constructed mapping relationship curve, the server converts these optical response quantities into corresponding voltage and current data, serving as the basis for electrical performance analysis.

[0047] For example, if the excitation frequencies applied to the liquid crystal panel are 100Hz, 300Hz, and 500Hz, and the light intensity time series of a certain pixel also exactly contains the periodic variations of these frequencies. Through frequency demodulation, the system finds that the response amplitude of a certain pixel at 300Hz is relatively large and the phase delay is also relatively obvious. After mapping, the current response obtained is much smaller than the voltage response. According to the series resistance-capacitance equivalent model, this means that the equivalent resistance of this pixel is relatively high, the capacitance is relatively low, and there is a relatively large loss angle, indicating that there may be problems such as leakage, aging, or material defects. The entire process not only realizes the extraction of dynamic non-contact frequency-domain responses but also can efficiently and accurately deduce the detailed electrical performance parameters at the pixel level.

[0048] S140. Convert the analysis result into a two-dimensional distribution map and locate the abnormal area through image processing algorithms.

[0049] Specifically, after the server obtains the electrical performance analysis results corresponding to each pixel, it does not merely stay at the level of the original data. Instead, it maps these data onto a planar graph, enabling the analysis results to have a visual representation in space. The electrical parameters of each pixel point (such as equivalent resistance, capacitance, or loss angle) are projected onto a two-dimensional coordinate grid, and pseudo-color rendering means are used to represent the numerical differences, generating an intuitive heat distribution map. Subsequently, the system further applies image processing algorithms, such as gray-scale segmentation, connected component extraction, and morphological operations, to identify the prominent areas (abnormal colors) in the graph, thereby accurately locking the areas that may have defects or performance anomalies.

[0050] In a possible implementation, the analysis results are converted into a two-dimensional distribution map, and the abnormal area is located through an image processing algorithm, which specifically includes: obtaining the target pixels of the liquid crystal display panel; mapping the voltage value and current value of the target pixels in the analysis results onto a two-dimensional grid and rendering them with pseudo-color to obtain a heat distribution map; using a gray-scale threshold segmentation algorithm and a connected component extraction algorithm to extract features from the heat distribution map, and combining morphological filtering for denoising to obtain target feature points; extracting the color values of the target feature points; and determining the abnormal area according to the size relationship between the color value and the color threshold, where the abnormal area includes capacitance mutation and / or loss hot spots.

[0051] Specifically, the system extracts the target pixel points from all the pixels of the liquid crystal display panel, and maps the electrical performance parameters such as voltage and current obtained from these pixels in the analysis onto a two-dimensional image grid, just like attaching an electrical performance label to each pixel of the panel. Subsequently, these labels are presented in the form of colors to form a "heat distribution map", where the color depth represents the high or low parameter value. For example, pixels with a high voltage value may be represented by red, and those with a low voltage value may be represented by blue. Then, the system performs image processing on this map, including separating the significantly abnormal areas using the gray-scale threshold algorithm, identifying the shapes and boundaries of continuous areas using the connected component algorithm, and processing image noise using morphological filtering, so as to obtain clean and clear target feature points.

[0052] For example, in the heat distribution map of a certain liquid crystal panel, there is an obvious red mass in an area, which means that the capacitance values of these pixels are significantly higher than those in other areas. The system will identify the color values of these red pixels and compare them with a preset "abnormal color threshold". If the color value is higher than the threshold, the system will determine that this area is the first type of abnormal area of "capacitance mutation" and automatically mark the boundary. If the color value of another area is significantly lower than the threshold, it will also be identified as the second type of abnormal area, such as a "loss hot spot". The entire process can achieve fully automatic and high-precision abnormal location, avoiding the subjective errors and efficiency bottlenecks of manual identification.

[0053] In a possible implementation, the abnormal area is determined according to the size relationship between the color value and the color threshold, which specifically includes: if it is determined that the color value is greater than the color threshold, the coordinates and boundaries of the target feature points are calibrated according to a preset first range to obtain a first abnormal area, where the preset first range is determined by the difference between the color value and the color threshold; if it is determined that the color value is less than the color threshold, the coordinates and boundaries of the target feature points are calibrated according to a preset second range to obtain a second abnormal area, where the preset second range is determined by the difference between the color value and the color threshold.

[0054] Specifically, after the system completes the generation of the heat map and the extraction of feature points, it will judge the "color value" of each target feature point and compare it with the set "color threshold". If the color value of a feature point is higher than the threshold (for example, the color is very bright), it means that the electrical performance of the pixel is abnormally high, such as a sudden increase in the capacitance value. At this time, the system will set a "first range" based on the difference between the color value and the threshold, and use this range to calibrate the range and position of the abnormal area where the point is located, and finally form the first type of abnormal area. Similarly, if the color value is lower than the threshold (the color is dark or low in saturation), it means that the electrical performance parameters of the point are abnormally low, and the system will form the second type of abnormal area in a similar way.

[0055] For example, if the color value of an area in the detection result is very close to crimson, and the color threshold set by the system is in the orange area, then the crimson will obviously exceed the threshold, and the system will determine that there is a "capacitance mutation" phenomenon in the area, and set a marking range around these red pixels as the first abnormal area. On the contrary, a certain area may appear close to gray-blue, which is far below the set green threshold. In this case, the system will automatically infer that it may be a "loss hotspot" or signal loss according to the difference, and mark it as the second abnormal area. By dynamically adjusting the detection boundary based on color difference, intelligent abnormality recognition with high sensitivity and strong adaptability can be achieved.

[0056] In one possible implementation, refer to Figure 2 , Figure 2 Another flow chart of an electrical testing method for a liquid crystal display panel provided in an embodiment of the present application includes steps S210 to S220, which are as follows: S210, generating a test report according to the abnormal area; S220, sending the test report to the staff corresponding to the liquid crystal display panel.

[0057] Specifically, after the system identifies an abnormal area on the LCD panel, it will automatically generate a detailed test report. This report will include information about the abnormal area of ​​the LCD panel, such as the location of the abnormal area, the type of abnormality (such as capacitance mutation, current fluctuation, etc.), the severity of the abnormality, and may be combined with thermal maps, specific numerical data, etc., so that the staff can fully understand the manifestation and cause of the problem. The report is not only a text description, but also has corresponding image-assisted descriptions, so that the staff can see the problem more intuitively.

[0058] For example, assume that during the detection of a liquid crystal display panel, it is found that the current value in a certain area is higher than the normal range, which may cause overheating or uneven brightness in that part. The system will generate a detection report indicating the specific coordinates of the abnormal area, the type of abnormality (such as "abnormal current fluctuation"), and attach a thermal map of the abnormal area. This report will then be sent to relevant engineers or operators via email or the internal system to facilitate their quick location of the problem area for timely handling and repair, avoiding potential quality issues from affecting product delivery.

[0059] The present application also provides an electrical measurement device for a liquid crystal display panel. Referring to Figure 3 , Figure 3 is a schematic diagram of the modules of an electrical measurement device for a liquid crystal display panel provided by an embodiment of the present application. The electrical measurement device is a server, which includes an acquisition module 31 and a processing module 32. Among them, the processing module 32 applies a sine voltage signal to the liquid crystal display panel using a multi-channel signal generator; the acquisition module 31 acquires the light intensity time series collected by a high-speed camera for the liquid crystal display panel after the sine voltage signal is applied; the processing module 32 analyzes the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; the processing module 32 converts the analysis result into a two-dimensional distribution map and locates the abnormal area through an image processing algorithm.

[0060] In a possible implementation manner, the processing module 32 applies known DC voltage data to at least one group of test pixels on the liquid crystal display panel; the acquisition module 31 acquires the light intensity data of the liquid crystal display panel; the processing module 32 constructs a mapping relationship curve between light intensity and voltage based on the DC voltage data and the light intensity data.

[0061] In a possible implementation manner, the processing module 32 analyzes the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel, specifically including: the acquisition module 31 acquires multiple excitation frequencies of the multi-channel signal generator; the processing module 32 synchronously multiplies the light intensity time series with the sine signal and cosine signal of each excitation frequency respectively to obtain multiplication results; the processing module 32 performs low-pass filtering on the multiplication results and acquires the amplitude and phase of each frequency component; the processing module 32 maps the amplitude and phase of each frequency component to corresponding voltage values and current values using the mapping relationship curve; the processing module 32 inversely calculates the analysis result of the liquid crystal display panel through multi-frequency point least squares fitting based on the corresponding voltage values and current values in combination with a series resistance-capacitance equivalent circuit model. The analysis result includes the equivalent resistance, equivalent capacitance, and loss angle of each pixel on the liquid crystal display panel.

[0062] In a possible implementation, the acquisition module 31 acquires the light intensity time series collected by the high-speed camera for the liquid crystal display panel after a sine voltage signal is applied, specifically including: in a constant backlight environment, the processing module 32 controls the high-speed camera to continuously capture the liquid crystal display panel at a frame rate preset to be a multiple of the excitation frequency, obtaining captured images; the processing module 32 matches the power-on timestamps of the multi-channel signal generator according to the captured images and outputs the light intensity time series.

[0063] In a possible implementation, the processing module 32 converts the analysis result into a two-dimensional distribution map and locates the abnormal area through an image processing algorithm, specifically including: the acquisition module 31 acquires the target pixels of the liquid crystal display panel; the processing module 32 maps the voltage value and current value of the target pixels in the analysis result onto a two-dimensional grid and renders them with pseudo colors to obtain a heat distribution map; the processing module 32 uses a gray threshold segmentation algorithm and a connected component extraction algorithm to extract features from the heat distribution map, and combines morphological filtering for denoising to obtain target feature points; the processing module 32 extracts the color values of the target feature points; the processing module 32 determines the abnormal area according to the magnitude relationship between the color value and the color threshold, and the abnormal area includes capacitance mutation and / or loss hot spots.

[0064] In a possible implementation, the processing module 32 determines the abnormal area according to the magnitude relationship between the color value and the color threshold, specifically including: if the processing module 32 determines that the color value is greater than the color threshold, it calibrates the coordinates and boundaries of the target feature points according to a preset first range to obtain a first abnormal area, and the preset first range is determined by the difference between the color value and the color threshold; if the processing module 32 determines that the color value is less than the color threshold, it calibrates the coordinates and boundaries of the target feature points according to a preset second range to obtain a second abnormal area, and the preset second range is determined by the difference between the color value and the color threshold.

[0065] In a possible implementation, the processing module 32 generates a detection report according to the abnormal area; the processing module 32 sends the detection report to the staff corresponding to the liquid crystal display panel.

[0066] It should be noted that: when the device provided in the above embodiment realizes its functions, only the above-mentioned division of each functional module is used for illustration. In actual applications, the above functions can be allocated to different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the device and method embodiments provided in the above embodiments belong to the same concept, and the specific implementation process is detailed in the method embodiment, which will not be repeated here.

[0067] This application also provides an electronic device, referring to Figure 4 , Figure 4A schematic structural diagram of an electronic device provided by an embodiment of the present application. The electronic device may include: at least one processor 41, at least one network interface 44, a user interface 43, a memory 45, and at least one communication bus 42.

[0068] Among them, the communication bus 42 is used to realize the connection and communication between these components.

[0069] Among them, the user interface 43 may include a display screen (Display) and a camera (Camera). Optionally, the user interface 43 may further include a standard wired interface and a wireless interface.

[0070] Among them, the network interface 44 may optionally include a standard wired interface and a wireless interface (such as a Wi-Fi interface).

[0071] Among them, the processor 41 may include one or more processing cores. The processor 41 connects various parts within the entire server through various interfaces and lines, and executes various functions of the server and processes data by running or executing instructions, programs, code sets, or instruction sets stored in the memory 45, and by calling data stored in the memory 45. Optionally, the processor 41 may be implemented in at least one hardware form of digital signal processing (DSP), field-programmable gate array (FPGA), or programmable logic array (PLA). The processor 41 may integrate one or several combinations of a central processing unit (CPU), a graphics processing unit (GPU), and a modem, etc. Among them, the CPU mainly processes the operating system, user interface, and application programs, etc.; the GPU is responsible for the rendering and drawing of the content to be displayed on the display screen; the modem is used to process wireless communication. It can be understood that the above modem may not be integrated into the processor 41 and may be implemented separately by a single chip.

[0072] Among them, the memory 45 may include a Random Access Memory (RAM), or may include a Read-Only Memory. Optionally, the memory 45 includes a non-transitory computer-readable storage medium. The memory 45 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 45 may include a program storage area and a data storage area. Among them, the program storage area can store instructions for implementing the operating system, instructions for at least one function (such as touch function, sound playback function, image playback function, etc.), instructions for implementing the above-mentioned method embodiments, etc.; the data storage area can store the data involved in the above-mentioned method embodiments. Optionally, the memory 45 may also be at least one storage device located far from the aforementioned processor 41. As Figure 4 shown, in the memory 45 as a computer storage medium, there may be included an operating system, a network communication module, a user interface module, and an application program for an electrical measurement method of a liquid crystal display panel.

[0073] In Figure 4 the electronic device shown, the user interface 43 is mainly used to provide an input interface for the user to obtain the data input by the user; and the processor 41 can be used to call the application program for an electrical measurement method of a liquid crystal display panel stored in the memory 45. When executed by one or more processors, the electronic device is caused to execute the method as described in one or more of the above embodiments.

[0074] It should be noted that for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that this application is not limited by the described action sequence, because according to this application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0075] This application also provides a computer-readable storage medium, and the computer-readable storage medium stores instructions. When executed by one or more processors, the electronic device is caused to execute the method as described in one or more of the above embodiments.

[0076] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0077] In several embodiments provided by the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling, direct coupling, or communication connection between each other can be through some service interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical or other form.

[0078] The units described as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0079] In addition, in each embodiment of the present application, the functional units can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0080] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in each embodiment of the present application. And the aforementioned memory includes: various media such as USB flash drives, mobile hard disks, magnetic disks, or optical discs that can store program codes.

[0081] The above are only exemplary embodiments of the present disclosure and should not be used to limit the scope of the present disclosure. That is, any equivalent changes and modifications made in accordance with the teachings of the present disclosure still fall within the scope covered by the present disclosure. After considering the specification and the practice of the present disclosure, those skilled in the art will easily think of other implementation schemes of the present disclosure. The present application aims to cover any variations, uses, or adaptive changes of the present disclosure. These variations, uses, or adaptive changes follow the general principles of the present disclosure and include common general knowledge or conventional technical means in the technical field not recorded in the present disclosure. The specification and the embodiments are only regarded as exemplary, and the scope and spirit of the present disclosure are defined by the claims.

Claims

1. A method for electrical testing of a liquid crystal display panel, characterized in that: The method comprises: A multi-channel signal generator is used to apply a sinusoidal voltage signal to the liquid crystal display panel; Acquire a time series of light intensity collected by a high-speed camera on a liquid crystal display panel after the sinusoidal voltage signal is applied; Analyzing the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; The analysis result is converted into a two-dimensional distribution map, and the abnormal area is located by an image processing algorithm.

2. The electrical testing method of a liquid crystal display panel according to claim 1, characterized in that: The method further comprises: Applying known DC voltage data to at least one group of test pixels on the liquid crystal display panel; Acquiring light intensity data of the liquid crystal display panel; A mapping relationship curve between light intensity and voltage is constructed according to the DC voltage data and the light intensity data.

3. The electrical testing method of a liquid crystal display panel according to claim 1, characterized in that: The light intensity time series is analyzed by mapping the relationship curve to obtain the analysis result for the liquid crystal display panel, specifically including: Acquiring multiple excitation frequencies of the multi-channel signal generator; Synchronously multiplying the light intensity time series with the sine signal and the cosine signal of each of the excitation frequencies to obtain a multiplication result; Performing low-pass filtering on the multiplication result, and obtaining the amplitude and phase of each frequency component; The mapping relationship curve is used to map the amplitude and phase of each frequency component into corresponding voltage and current values; According to the corresponding voltage and current values, combined with the series resistor-capacitor equivalent circuit model, the analysis results of the liquid crystal display panel are inverted through multi-frequency least squares fitting, and the analysis results include the equivalent resistance, equivalent capacitance and loss angle of each pixel on the liquid crystal display panel.

4. The electrical testing method of a liquid crystal display panel according to claim 3, characterized in that: The step of acquiring the light intensity time series collected by the high-speed camera on the liquid crystal display panel after the sinusoidal voltage signal is applied specifically includes: In a constant backlight environment, controlling the high-speed camera to continuously photograph the liquid crystal display panel at a frame rate that is a preset multiple of the excitation frequency to obtain a photographed image; According to the captured image, the power-on timestamp of the multi-channel signal generator is matched, and the light intensity time series is output.

5. The electrical testing method of a liquid crystal display panel according to claim 1, characterized in that: The converting the analysis result into a two-dimensional distribution map and locating the abnormal area through an image processing algorithm specifically includes: Acquire a target pixel of the liquid crystal display panel; Mapping the voltage value and current value of the target pixel in the analysis result onto a two-dimensional grid, and rendering with pseudo-color to obtain a thermal distribution map; The grayscale threshold segmentation algorithm and the connected domain extraction algorithm are used to extract features from the thermal distribution map, and morphological filtering is used to perform denoising to obtain target feature points; Extracting the color value of the target feature point; The abnormal region is determined according to the size relationship between the color value and the color threshold, and the abnormal region includes a capacitance mutation and / or a loss hot spot.

6. The electrical testing method of a liquid crystal display panel according to claim 5, characterized in that: The determining the abnormal area according to the size relationship between the color value and the color threshold specifically includes: If it is determined that the color value is greater than the color threshold, the coordinates and boundaries of the target feature point are calibrated according to a preset first range to obtain a first abnormal area, where the preset first range is determined by the difference between the color value and the color threshold; If it is determined that the color value is less than the color threshold, the coordinates and boundaries of the target feature point are calibrated according to a preset second range to obtain a second abnormal area, and the preset second range is determined by the difference between the color value and the color threshold.

7. The electrical testing method of a liquid crystal display panel according to claim 1, characterized in that: The method further comprises: Generate a detection report based on the abnormal area; The detection report is sent to the staff corresponding to the liquid crystal display panel.

8. An electrical measuring device for a liquid crystal display panel, characterized in that: The electrical measuring device comprises an acquisition module (31) and a processing module (32), wherein: The processing module (32) is used to apply a sinusoidal voltage signal to the liquid crystal display panel using a multi-channel signal generator; The acquisition module (31) is used to acquire a light intensity time series collected by a high-speed camera on a liquid crystal display panel after the sinusoidal voltage signal is applied; The processing module (32) is further used to analyze the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; The processing module (32) is also used to convert the analysis result into a two-dimensional distribution map and locate the abnormal area through an image processing algorithm.

9. An electronic device, characterized in that: The electronic device comprises a processor (41), a memory (45), a user interface (43) and a network interface (44), wherein the memory (45) is used to store instructions, the user interface (43) and the network interface (44) are both used to communicate with other devices, and the processor (41) is used to execute the instructions stored in the memory (45) so that the electronic device executes the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores instructions, and when the instructions are executed, the method according to any one of claims 1 to 7 is performed.

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