Sine contour grating tooth staggered waveguide slow wave structure
By designing a sine profile grid-tooth interlaced waveguide slow wave structure, the problem of insufficient working bandwidth of the slow wave structure in the prior art is solved, and a wider working bandwidth and a higher working center frequency are achieved, which is suitable for high-speed communication and high-precision imaging detection.
Patent Information
- Application Number
- CN202510197373.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-21
- Publication Date
- 2025-06-03
AI Technical Summary
The existing slow wave structure has insufficient operating bandwidth, making it difficult to meet the needs of high-speed communication and high-precision imaging detection.
A sine profile grid tooth interlaced waveguide slow wave structure is designed, and the electronic injection channel is flowed by forming a hollow cavity between the first inner wall and the second inner wall, and the upper sinusoidal profile cavity and the lower sinusoidal profile cavity are provided in the hollow cavity.
The phase speed of this structure is flatter, manifested as a weak dispersion characteristic, which can greatly broaden the working bandwidth without weakening the coupling impedance, increase the working center frequency, and reduce processing difficulty.
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Figure CN120089574A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the field of vacuum electron technology, and particularly relates to a sine-profile grating-tooth interleaved waveguide slow-wave structure. Background Art
[0002] Terahertz waves have excellent characteristics such as ultra-wideband, high gain, penetrability, fingerprint spectrum, and non-ionization, making them have broad application prospects in many civil and military application fields such as satellite communication, millimeter-wave / terahertz radar, and electronic countermeasure. The terahertz radiation source is one of the key core devices in the terahertz technology application system. The vacuum electron terahertz radiation source has two major characteristics of high power and relatively wide bandwidth, and is an important terahertz radiation source.
[0003] The traveling-wave tube belongs to the microwave electron tube. As an important vacuum electron terahertz radiation source, it has been widely studied by domestic and foreign scholars in recent years. In the field of vacuum electron technology, a sufficiently wide bandwidth is a powerful guarantee for high-speed communication and high-precision imaging detection, and the bandwidth characteristic of the traveling-wave tube depends on its high-frequency system (composed of a slow-wave structure and an input / output system). The slow-wave structure with a wide bandwidth is one of the key factors for the traveling-wave tube to achieve wide-bandwidth operation. Therefore, in order to further improve the working bandwidth of the slow-wave structure, the present invention proposes a sine-profile grating-tooth interleaved waveguide slow-wave structure. Summary of the Invention
[0004] The technical problem to be solved by the present invention is: how to design a technical solution to further improve the working bandwidth of the slow-wave structure.
[0005] In a first aspect, the present invention proposes a sine-profile grating-tooth interleaved waveguide slow-wave structure, including: a first component and a second component, the first component and the second component are integrally formed, a first inner wall of the first component includes an upper arc band, a second inner wall of the second component includes a lower arc band, a hollow cavity is formed between the first component and the second component, and the upper arc band of the first inner wall and the lower arc band of the second inner wall are symmetrically arranged with respect to the geometric center of the hollow cavity. Further, a three-dimensional coordinate system of the x-axis, the y-axis, and the z-axis is established, and the upper arc band of the first inner wall and the lower arc band of the second inner wall are axially symmetrically arranged with respect to an axis parallel to the z-axis and passing through the geometric center of the hollow cavity.
[0006] A further technical solution thereof is that the hollow cavity of the sine-profile grating-tooth interleaved waveguide slow-wave structure is located between the first inner wall and the second inner wall, and a clearance is provided between the first inner wall and the second inner wall.
[0007] A further technical solution thereof is that the outer contour formed by integrally molding the first component and the second component of the sine-profile grating-tooth interleaved waveguide slow-wave structure constitutes a cuboid containing a hollow cavity, and the three side edges of the cuboid are respectively parallel to the x-axis, the y-axis, and the z-axis.
[0008] A further technical solution thereof is that the first inner wall of the first component of the sine-profile grating-tooth interleaved waveguide slow-wave structure further includes upper sine-profile grating teeth, and the upper sine-profile grating teeth and the upper arc-shaped band jointly enclose an upper sine-profile cavity; the second inner wall of the second component further includes lower sine-profile grating teeth, and the lower sine-profile grating teeth and the lower arc-shaped band jointly enclose a lower sine-profile cavity; an electron beam channel is provided between the upper sine-profile cavity and the lower sine-profile cavity in the hollow cavity, and the electron beam channel is used to realize the circulation of the electron beam.
[0009] A further technical solution thereof is that the upper sine-profile grating teeth include a plurality of upper sine-profile sub-teeth, the lower sine-profile grating teeth include a plurality of lower sine-profile sub-teeth, the plurality of upper sine-profile sub-teeth are arranged periodically and equidistantly along the z-axis direction, and the plurality of lower sine-profile sub-teeth are arranged periodically and equidistantly along the z-axis direction; along the z-axis direction, the thickness of the upper sine-profile sub-teeth is the pitch t, the width of the upper arc-shaped band is the pitch d, the thickness of the lower sine-profile sub-teeth is the pitch t, the width of the lower arc-shaped band is the pitch d, the value of the pitch t is less than the value of the pitch d, and the period pitch L is equal to the pitch t plus the pitch d; between the adjacent upper sine-profile sub-teeth and lower sine-profile sub-teeth from the perspective of the y-axis, the distance between the center points of the upper sine-profile sub-teeth and the lower sine-profile sub-teeth along the z-axis direction is half of the period pitch L.
[0010] Preferably, the cross-sectional shape of the upper sine-profile cavity perpendicular to the z-axis conforms to a sine distribution function, and the shape of the intersection line between the upper sine-profile grating teeth and the upper arc-shaped band conforms to a sine distribution function, and their sine distribution functions are the same, both being:
[0011] y = a max *sin(π / w * x), where 0 ≤ x ≤ w.
[0012] Preferably, the cross-sectional shape of the lower sine-profile cavity perpendicular to the z-axis conforms to a sine distribution function, and the shape of the intersection line between the lower sine-profile grating teeth and the lower arc-shaped band conforms to a sine distribution function, and their sine distribution functions are the same, both being:
[0013] y = -a min *sin(π / w * x), where 0 ≤ x ≤ w.
[0014] Preferably, the width of the electron beam channel along the y-axis is the same as the distance between the upper sinusoidal profile grid teeth and the lower sinusoidal profile grid teeth along the y-axis; the geometric central axis of the electron beam channel (i.e., the geometric central axis of the hollow cavity) intersects with the xoy plane; with any point formed after the intersection as the center, in the xoy plane, the contour curves of the upper sinusoidal profile cavity and the upper sinusoidal profile grid teeth are sinusoidal distribution functions:
[0015] y = h b / 2 + a max *sin(π / w * x), 0 ≤ x ≤ 0.7.
[0016] Preferably, the width of the electron beam channel along the y-axis is the same as the distance between the upper sinusoidal profile grid teeth and the lower sinusoidal profile grid teeth along the y-axis; the geometric central axis of the electron beam channel (i.e., the geometric central axis of the hollow cavity) intersects with the xoy plane; with any point formed after the intersection as the center, in the xoy plane, the contour curves of the lower sinusoidal profile cavity and the lower sinusoidal profile grid teeth are sinusoidal distribution functions:
[0017] y = -h b / 2 - a min *sin(π / w * x), 0 ≤ x ≤ 0.7.
[0018] Preferably, the specific structural dimensions are as follows: a max = 0.3 mm; a min = 0.3 mm; w = 0.7 mm; h b = 0.12 mm; L = 0.5 mm; t = 0.1 mm; d = 0.4 mm.
[0019] The traditional staggered grid slow-wave structure and the sinusoidal profile grid teeth staggered waveguide slow-wave structure of the present application are respectively simulated by using electromagnetic simulation software. The upper and lower grid tooth heights a max = a min = 0.3 mm, the height h b of the electron beam channel = 0.12 mm, the width w of the electron beam channel = 0.7 mm, the thickness t of the upper and lower grid teeth = 0.1 mm, and the period length L = 0.5 mm of the two slow-wave structures are the same.
[0020] In summary, the beneficial effects of the present invention include:
[0021] First, a novel sinusoidal profile grid teeth staggered waveguide slow-wave structure is invented. Compared with the traditional staggered grid slow-wave structure, the phase velocity of the novel slow-wave structure is more flat, showing weak dispersion characteristics, and can greatly broaden the working bandwidth without weakening the coupling impedance, thus facilitating the development of the sheet beam traveling wave tube towards a wider frequency band.
[0022] Second, compared with the traditional staggered grating slow-wave structure, the dispersion curve of the sine-profile grating-tooth staggered waveguide slow-wave structure will shift to higher frequencies as a whole, and its operating center frequency will increase significantly, which is beneficial to promoting the development of sheet-beam traveling-wave tubes towards higher frequencies.
[0023] Third, compared with the traditional staggered grating slow-wave structure, the sine-profile grating-tooth staggered waveguide slow-wave structure does not have a right-angle corner structure (which is not conducive to machining with a high-speed milling machine and will inevitably introduce an arc angle), which can reduce the adverse effects of machining errors on the electrical performance of the device and is beneficial to reducing the machining difficulty of this type of slow-wave structure. Brief Description of the Drawings
[0024] The drawings herein are incorporated into the specification and form a part of this specification, showing embodiments consistent with the present invention and, together with the specification, are used to explain the principles of the present invention.
[0025] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0026] Figure 1 Schematic diagram of the sine-profile grating-tooth staggered waveguide slow-wave structure provided by the present invention.
[0027] Figure 2 Cavity reverse mold diagram of the sine-profile grating-tooth staggered waveguide slow-wave structure provided by the present invention.
[0028] Figure 3 Phase velocity comparison diagram between the embodiment of the present invention and the traditional staggered grating slow-wave structure.
[0029] Figure 4 Dispersion curve comparison diagram between the embodiment of the present invention and the traditional staggered grating slow-wave structure.
[0030] Figure 5 Coupling impedance comparison diagram between the embodiment of the present invention and the traditional staggered grating slow-wave structure.
[0031] Figure 6 Stereogram of the vacuum model of the sine-profile grating-tooth staggered waveguide slow-wave structure of the present invention.
[0032] Figure 7 Transmission coefficient comparison diagram between the embodiment of the present invention and the traditional staggered grating slow-wave structure.
[0033] Figure 8 Table diagram for comparing the electrical performance between the embodiment of the present invention and the traditional staggered grating slow-wave structure.
[0034] Figure 9 This is a comparison chart of the output power between the embodiments of the present invention and the traditional interleaved grating slow-wave structure. Specific embodiments
[0035] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.
[0036] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, wholes, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or other features, wholes, steps, operations, elements, components, and / or their combinations.
[0037] It should also be understood that the terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.
[0038] It should be further understood that the term "and / or" used in the specification of the present invention and the appended claims refers to any one or any combination of the related listed items and all possible combinations, and includes these combinations.
[0039] As used in this specification and the appended claims, the term "if" can be interpreted as "when", "once", "in response to determining", or "in response to detecting" depending on the context. Similarly, the phrase "if determined" or "if detecting [the described condition or event]" can be interpreted as meaning "once determined", "in response to determining", "once detecting [the described condition or event]", or "in response to detecting [the described condition or event]" depending on the context.
[0040] In this specification and the appended claims, there may be multiple ways of expressing the same technical feature or professional term, such as using upper-level generalization, lower-level limitation, or synonymous substitution and other different expression forms; those skilled in the art can clearly understand the substantially identical technical meanings pointed to by different expression forms based on their professional knowledge and in combination with the overall content of the specification and the accompanying drawings; the differences in different expression forms only lie in the diversity of the text level, do not constitute a substantial modification or limitation to the technical solution, and will not affect the certainty of the protection scope of the patent claim and the full disclosure of the technical content of the specification.
[0041] Embodiment
[0042] Please refer to Figures 1 to 9 , specifically refer to Figure 1 and Figure 2 As shown in and , an embodiment of the present invention provides a sine-profile grating-tooth staggered waveguide slow-wave structure, including: a first component 21a and a second component 21b, the first component 21a and the second component 21b are integrally formed, a first inner wall 22 of the first component 21a includes an upper arc-shaped band 23a, a second inner wall 24 of the second component 21b includes a lower arc-shaped band 25b, a hollow cavity 2 is formed between the first component 21a and the second component 21b, the upper arc-shaped band 23a of the first inner wall 22 and the lower arc-shaped band 25b of the second inner wall 24 are symmetrically arranged with respect to the geometric center of the hollow cavity 2. Further, a three-dimensional coordinate system of the x-axis, y-axis, and z-axis is established, and the upper arc-shaped band 23a of the first inner wall 22 and the lower arc-shaped band 25b of the second inner wall 24 are axially symmetrically arranged with respect to an axis parallel to the z-axis and passing through the geometric center of the hollow cavity 2. Among them, the axis parallel to the z-axis and passing through the geometric center of the hollow cavity 2 is unique when the hollow cavity 2 itself has boundaries, that is, it can be confirmed by those skilled in the art.
[0043] In one embodiment, the hollow cavity 2 of the sine-profile grating-tooth staggered waveguide slow-wave structure is located between the first inner wall 22 and the second inner wall 24, and a clearance is provided between the first inner wall 22 and the second inner wall 24. Among them, the positional relationship of the clearance provided between the first inner wall 22 and the second inner wall 24 is known in the art.
[0044] In one embodiment, the outer contour of the integrally formed first component 21a and second component 21b of the sine-profile grating-tooth staggered waveguide slow-wave structure forms a cuboid including the hollow cavity 2, and three side edges of the cuboid are respectively parallel to the x-axis, y-axis, and z-axis.
[0045] In one embodiment, the first inner wall 22 of the first component 21a of the sine-profile grating-tooth staggered waveguide slow-wave structure further includes an upper sine-profile grating tooth 22a, and the upper sine-profile grating tooth 22a and the upper arc-shaped band 23a together enclose an upper sine-profile cavity 2a; the second inner wall 24 of the second component 21b further includes a lower sine-profile grating tooth 24b, and the lower sine-profile grating tooth 24b and the lower arc-shaped band 25b together enclose a lower sine-profile cavity 2b; an electron beam channel 26 is provided between the upper sine-profile cavity 2a and the lower sine-profile cavity 2b in the hollow cavity 2, and the electron beam channel 26 is used to realize the flow of the electron beam.
[0046] In one embodiment, the upper sinusoidal profile grid teeth 22a of the sinusoidal profile grid teeth interleaved waveguide slow-wave structure include a plurality of upper sinusoidal profile sub-teeth 22c, and the lower sinusoidal profile grid teeth 24b include a plurality of lower sinusoidal profile sub-teeth 24c. The plurality of upper sinusoidal profile sub-teeth 22c are arranged periodically and equidistantly along the z-axis direction, and the plurality of lower sinusoidal profile sub-teeth 24c are arranged periodically and equidistantly along the z-axis direction;
[0047] Along the z-axis direction, the thickness of the upper sinusoidal profile sub-tooth 22c is the pitch t, the width of the upper arc-shaped band 23a is the pitch d, the thickness of the lower sinusoidal profile sub-tooth 24c is the pitch t, and the width of the lower arc-shaped band 25b is the pitch d. The value of the pitch t is less than the value of the pitch d, and the period pitch L is equal to the pitch t plus the pitch d; between the adjacent upper sinusoidal profile sub-tooth 22c and the lower sinusoidal profile sub-tooth 24c viewed from the y-axis perspective, the distance between the center points of the upper sinusoidal profile sub-tooth 22c and the lower sinusoidal profile sub-tooth 24c along the z-axis direction is half of the period pitch L.
[0048] In one embodiment, the cross-sectional shape of the upper sinusoidal profile cavity 2a perpendicular to the z-axis conforms to the sine distribution function, and the shape of the intersection line between the upper sinusoidal profile grid teeth 22a and the upper arc-shaped band 23a conforms to the sine distribution function. Their sine distribution functions are the same, both being:
[0049] y = a max *sin(π / w*x), where 0 ≤ x ≤ w.
[0050] In one embodiment, the cross-sectional shape of the lower sinusoidal profile cavity 2b perpendicular to the z-axis conforms to the sine distribution function, and the shape of the intersection line between the lower sinusoidal profile grid teeth 24b and the lower arc-shaped band 25b conforms to the sine distribution function. Their sine distribution functions are the same, both being:
[0051] y = -a min *sin(π / w*x), where 0 ≤ x ≤ w.
[0052] In one embodiment, the width of the electron beam channel 26 along the y-axis and the distance between the upper sinusoidal profile grid teeth 22a and the lower sinusoidal profile grid teeth 24b along the y-axis have the same numerical value; the geometric central axis of the electron beam channel 26 (i.e., the geometric central axis of the hollow cavity) intersects the xoy plane; taking any point formed after the intersection as the center, in the xoy plane, the contour curves of the upper sinusoidal profile cavity 2a and the upper sinusoidal profile grid teeth 22a are the sine distribution function:
[0053] y = h b / 2 + a max *sin(π / w*x), 0 ≤ x ≤ 0.7.
[0054] In one embodiment, the width of the electron beam channel 26 along the y-axis is the same as the distance along the y-axis between the upper sinusoidal profile grating teeth 22a and the lower sinusoidal profile grating teeth 24b; the geometric central axis of the electron beam channel 26 (i.e., the geometric central axis of the hollow cavity) intersects the xoy plane; taking the intersection point as the center, in the xoy plane, the contour curves of the lower sinusoidal profile cavity 2b and the lower sinusoidal profile grating teeth 24b are sine distribution functions:
[0055] y = -h b / 2 - a min *sin(π / w * x), 0 ≤ x ≤ 0.7.
[0056] In one embodiment, the specific structural dimensions are as follows: a max = 0.3 mm; a min = 0.3 mm; w = 0.7 mm; h b = 0.12 mm; L = 0.5 mm; t = 0.1 mm; d = 0.4 mm.
[0057] The traditional staggered grating slow-wave structure and the sinusoidal profile grating teeth staggered waveguide slow-wave structure of the present application are respectively simulated by using electromagnetic simulation software. The upper and lower grating tooth heights a max = a min = 0.3 mm, the height h of the electron beam channel b = 0.12 mm, the width w of the electron beam channel = 0.7 mm, the thickness t of the upper and lower grating teeth = 0.1 mm, and the period length L = 0.5 mm of the two slow-wave structures are the same.
[0058] Figure 3 Fig. is the comparison diagram of the phase velocities of the sinusoidal profile grating teeth staggered waveguide slow-wave structure and the traditional staggered grating slow-wave structure. The simulation results show that: the phase velocity of the sinusoidal profile grating teeth staggered waveguide slow-wave structure can remain basically unchanged in a wider operating frequency band than that of the traditional staggered grating slow-wave structure, that is, it shows weak dispersion characteristics. Therefore, the sinusoidal profile grating teeth staggered waveguide slow-wave structure can achieve a wider operating bandwidth.
[0059] As Figure 4 shown, it is the comparison diagram of the dispersion curves of the sinusoidal profile grating teeth staggered waveguide slow-wave structure and the traditional staggered grating slow-wave structure. The simulation results show that: in the whole frequency band, the operating frequency of the sinusoidal profile grating teeth staggered waveguide slow-wave structure is greatly shifted upward compared with that of the traditional staggered grating slow-wave structure. In addition, from the dispersion curve, it can be obtained that: when the electron beam operating voltage is set to 31.5 kV, the present invention can achieve an operating bandwidth of 88 GHz.
[0060] As Figure 5As shown, it is a comparison diagram of the coupling impedance between the sine-profile grating-tooth staggered waveguide slow-wave structure and the traditional staggered-grating slow-wave structure. From the dispersion curve, it can be seen that the operating frequency of the sine-profile grating-tooth staggered waveguide slow-wave structure is shifted upward compared to that of the traditional staggered-grating slow-wave structure. Note that the wave injection interaction strength is proportional to the coupling impedance. The simulation results show that the coupling impedance magnitudes of the sine-profile grating-tooth staggered waveguide slow-wave structure and the traditional staggered-grating slow-wave structure are almost the same. Without affecting the coupling impedance magnitude, the sine-profile grating-tooth staggered waveguide slow-wave structure can operate at a higher frequency band and has a wider operating bandwidth.
[0061] In the solution proposed in this application, a 90-period sine-profile grating-tooth staggered waveguide slow-wave structure and a 90-period staggered-grating slow-wave structure were established using CSTMWS (MicrowaveStudio). The two were compared. There are differences in the specific structures of the two slow-wave structures, while other dimensions, simulation background materials, boundary conditions, etc. are all kept the same. Figure 6 It is a three-dimensional view of the vacuum model of the 90-period sine-profile grating-tooth staggered waveguide slow-wave structure. Using the time-domain solver, the S 21 (transmission coefficient) of the 90-period sine-profile grating-tooth staggered waveguide slow-wave structure and the 90-period staggered-grating slow-wave structure was obtained, as Figure 7 shown.
[0062] The simulation results show that for the staggered-grating slow-wave structure, S 21 ≥ -7.8 dB in the frequency range of 225 - 277 GHz. Its cold-cavity bandwidth is 53.0 GHz, and the corresponding relative cold-cavity bandwidth is 21.1%. Its cold-cavity bandwidth is 53.0 GHz, and the corresponding relative cold-cavity bandwidth is only 21.1%. For the sine-profile grating-tooth staggered waveguide slow-wave structure, S 21 ≥ -7.8 dB in the frequency range of 235 - 327 GHz. Its cold-cavity bandwidth is 92.0 GHz, and the corresponding relative cold-cavity bandwidth is 32.7%. (Higher than the existing index). Figure 8 It is a comparison table of the electrical performance of the sine-profile grating-tooth staggered waveguide slow-wave structure and the traditional staggered-grating slow-wave structure. From the table diagram, it can be obtained that the "cold-cavity bandwidth" of the sine-profile grating-tooth staggered waveguide slow-wave structure has increased by nearly twice. Secondly, the "center frequency" has increased from 251.5 GHz of the traditional staggered-grating slow-wave structure to 281.0 GHz of the sine-profile grating-tooth staggered waveguide slow-wave structure, with the center frequency increasing by 11.7%.
[0063] Using CST PIC (Particle-in-cell), the 90-period sine-profile grating-tooth staggered waveguide slow-wave structure and the 90-period staggered-grating slow-wave structure were simulated. The electron beam current, electron beam voltage, and feeding signal power were set to 0.2 A, 31.5 kV, and 0.18 W respectively. As Figure 9As shown, the simulation results indicate that: the sine-profile grating-tooth staggered waveguide slow-wave structure can achieve a stable output of more than 54.1 W in the frequency range of 230 - 318 GHz, with a corresponding gain greater than 24.8 dB; its hot cavity bandwidth is 88.0 GHz, and the corresponding relative hot cavity bandwidth is 31.5%. While the traditional staggered grating slow-wave structure can only achieve a stable output of more than 54.1 W in the frequency range of 224 - 264 GHz; its hot cavity bandwidth is only 40.0 GHz. From the comparison of the data of the two, it can be concluded that the hot cavity bandwidth of the sine-profile grating-tooth staggered waveguide slow-wave structure is more than twice that of the traditional staggered grating slow-wave structure and it operates in a higher frequency band.
[0064] In summary, the beneficial effects of the present invention include: First, a novel sine-profile grating-tooth staggered waveguide slow-wave structure is invented. Compared with the traditional staggered grating slow-wave structure, the phase velocity of the novel slow-wave structure is more flat, showing weak dispersion characteristics, and it can greatly broaden the operating bandwidth without weakening the coupling impedance, thus facilitating the development of the sheet beam traveling wave tube towards a wider frequency band. Second, compared with the traditional staggered grating slow-wave structure, the dispersion curve of the sine-profile grating-tooth staggered waveguide slow-wave structure will shift towards higher frequencies as a whole, and its operating center frequency is greatly increased, which is conducive to promoting the development of the sheet beam traveling wave tube towards higher frequencies. Third, compared with the traditional staggered grating slow-wave structure, the sine-profile grating-tooth staggered waveguide slow-wave structure does not have a right-angle corner structure (which is not conducive to machining with a high-speed milling machine and will inevitably introduce an arc angle), which can reduce the adverse effects of machining errors on the electrical performance of the device and is beneficial to reducing the machining difficulty of this type of slow-wave structure.
[0065] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions, but such implementation should not be considered to exceed the scope of the present invention.
[0066] In several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only illustrative. For example, the division of each unit is only a logical function division, and there can be other division methods in actual implementation. For example, a unit or component can be combined or integrated into another system, or some features can be ignored or not executed.
[0067] The steps in the method of the embodiments of the present invention can be adjusted in sequence, combined, and deleted according to actual needs. The units in the device of the embodiments of the present invention can be combined, divided, and deleted according to actual needs. In addition, the functional units in various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit.
[0068] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a terminal, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention.
[0069] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, provided that these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these changes and modifications therein.
[0070] As described above, the above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various equivalent modifications or substitutions, and these modifications or substitutions should all be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims
1. A sinusoidal profile grating teeth staggered waveguide slow wave structure, characterized in that: include: A first component and a second component, the first component and the second component are integrally formed, the first inner wall of the first component includes an upper arc-shaped band, the second inner wall of the second component includes a lower arc-shaped band, a hollow cavity is formed between the first component and the second component, and the upper arc-shaped band of the first inner wall and the lower arc-shaped band of the second inner wall are symmetrically arranged relative to the geometric center of the hollow cavity.
2. The sinusoidal profile grating teeth staggered waveguide slow-wave structure according to claim 1, characterized in that: The hollow cavity is located between the first inner wall and the second inner wall, and a space is provided between the first inner wall and the second inner wall.
3. The sinusoidal profile grating teeth staggered waveguide slow-wave structure according to claim 1, characterized in that: The outer contours of the first component and the second component formed integrally form a cuboid containing a hollow cavity, and the three sides of the cuboid are respectively parallel to the x-axis, the y-axis and the z-axis.
4. The sinusoidal profile grating teeth staggered waveguide slow-wave structure according to claim 3, characterized in that: The first inner wall of the first component further comprises upper sinusoidal profile grating teeth, and the upper sinusoidal profile grating teeth and the upper arc-shaped belt together form an upper sinusoidal profile cavity; The second inner wall of the second component further comprises lower sinusoidal profile grating teeth, and the lower sinusoidal profile grating teeth and the lower arc-shaped belt together form a lower sinusoidal profile cavity; An electron injection channel is provided between the upper sinusoidal profile cavity and the lower sinusoidal profile cavity in the hollow cavity, and the electron injection channel is used to realize the circulation of the electron injection.
5. The sinusoidal profile grating teeth staggered waveguide slow-wave structure according to claim 4, characterized in that: The upper sinusoidal profile grating tooth includes a plurality of upper sinusoidal profile sub-teeth, and the lower sinusoidal profile grating tooth includes a plurality of lower sinusoidal profile sub-teeth, the plurality of upper sinusoidal profile sub-teeth are periodically arranged at equal intervals along the z-axis direction, and the plurality of lower sinusoidal profile sub-teeth are periodically arranged at equal intervals along the z-axis direction; Along the z-axis direction, the thickness of the upper sinusoidal profile sub-tooth is the spacing t, the width of the upper arc-shaped belt is the spacing d, the thickness of the lower sinusoidal profile sub-tooth is the spacing t, the width of the lower arc-shaped belt is the spacing d, the value of the spacing t is smaller than the value of the spacing d, and the period spacing L is equal to the spacing t plus the spacing d; Between the adjacent upper sinusoidal profile sub-teeth and lower sinusoidal profile sub-teeth from the y-axis perspective, the distance between the center points of the upper sinusoidal profile sub-teeth and the center points of the lower sinusoidal profile sub-teeth along the z-axis direction is half of the periodic spacing L.
6. The sinusoidal profile grating teeth staggered waveguide slow-wave structure according to claim 5, characterized in that: The cross-sectional shape of the upper sinusoidal profile cavity along the vertical direction to the z-axis conforms to the sinusoidal distribution function, and the shape of the boundary line between the upper sinusoidal profile grating teeth and the upper arc-shaped belt conforms to the sinusoidal distribution function. The sinusoidal distribution functions are the same, which are: y=a max *sin(π / w*x), where 0≤x≤w; The cross-sectional shape of the lower sinusoidal profile cavity along the vertical direction to the z-axis conforms to the sinusoidal distribution function, and the shape of the boundary line between the lower sinusoidal profile grating teeth and the lower arc-shaped belt conforms to the sinusoidal distribution function. The sinusoidal distribution functions are the same, which are: y=-a min *sin(π / w*x), where 0≤x≤w.
7. A microwave electron tube, characterized in that: The microwave electron tube comprises the sinusoidal profile grating teeth interlaced waveguide slow-wave structure as claimed in any one of claims 1 to 6.