Ion optical module fault detection device, method and equipment and storage medium

Abstract

The invention provides an ion optical module fault detection device, method and equipment and a storage medium, and particularly relates to the technical field of ion optical module fault detection. The calculation module is used for calculating an output voltage set value of the output end of the nth direct-current voltage closed-loop output module according to a preset input voltage value of the input end of the nth direct-current voltage closed-loop output module; the nth load voltage value is calculated according to the output voltage value of the output end of the nth first sampling module; the nth load current value is calculated according to the output voltage set value of the output end of the nth direct-current voltage closed-loop output module and the nth load voltage value, and whether a fault exists or not is detected and judged in real time; and detecting the nth ion optical sub-module according to the nth load current value. According to the device, pause and vacuum recovery of the ion optical sub-module before and after detection are avoided, and the finding and positioning efficiency of the faulted ion optical sub-module is improved.

Description

Technical Field

[0001] The present application relates to the technical field of ion optical module fault detection, and particularly to an ion optical module fault detection device, method, equipment and storage medium. Background Art

[0002] With the development of science and technology and social economy, mass spectrometers have been more widely used, and the domestic mass spectrometry industry is also in a booming development stage. Among them, one of the most important core components of a mass spectrometer is an ion optical module.

[0003] The working environment of the ion optical module has a multi-stage differential vacuum degree, that is, it works in an almost completely closed vacuum cavity, and people cannot measure the current flowing through each part of the ion optical module in real time, resulting in the inability to detect in time when a certain part of the ion optical module fails. Summary of the Invention

[0004] In view of this, the purpose of the present application is to provide an ion optical module fault detection device, method, equipment and storage medium to solve the above problems, and to realize real-time measurement of the current flowing through each part of the ion optical module to timely detect the faults that occur in a certain part of the ion optical module.

[0005] In a first aspect, an embodiment of the present application provides an ion optical module fault detection device, the device includes: a fault detection module and an ion optical module; the fault detection module includes: N monitoring resistors, N DC voltage closed-loop output modules, a measurement and control module, a host computer and N first sampling modules; the ion optical module includes N ion optical sub-modules; the input end of the nth ion optical sub-module is respectively connected to the first end of the nth monitoring resistor and the input end of the nth first sampling module, the second end of the nth monitoring resistor is connected to the output end of the nth DC voltage closed-loop output module, the input end of the nth DC voltage closed-loop output module is connected to the nth output end of the measurement and control module, and the nth first input end of the measurement and control module is connected to the output end of the nth first sampling module; The measurement and control module is configured to obtain a preset input voltage value of the input end of the nth DC voltage closed-loop output module sent by the host computer; The measurement and control module is further configured to calculate the output voltage set value of the output end of the nth DC voltage closed-loop output module according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module; obtain the output voltage value at the output end of the nth first sampling module; calculate the nth load voltage value according to the output voltage value at the output end of the nth first sampling module; wherein, the nth load voltage value is the voltage value between the input end of the nth ion optical sub-module and the ground point of the DC voltage closed-loop output module; calculate the nth load current value according to the output voltage set value of the output end of the nth DC voltage closed-loop output module and the nth load voltage value; wherein, the nth load current value is the current value flowing from the output end of the nth DC voltage closed-loop output module through the nth monitoring resistor to the input end of the nth ion optical sub-module; detect the nth ion optical sub-module according to the nth load current value.

[0006] Preferably, the measurement and control module is specifically configured to calculate the output voltage set value of the output end of the nth DC voltage closed-loop output module according to the following formula:

[0007] Wherein, is the output voltage set value of the output end of the nth DC voltage closed-loop output module, is the preset input voltage value at the input end of the nth DC voltage closed-loop output module, is the first feedback coefficient; The measurement and control module is specifically configured to calculate the nth load voltage value according to the following formula:

[0008] Wherein, is the nth load voltage value, is the output voltage value at the output end of the nth first sampling module, is the second feedback coefficient; The measurement and control module is specifically configured to calculate the nth load current value according to the following formula:

[0009] Wherein, is the nth load current value, is the output voltage set value of the output end of the nth DC voltage closed-loop output module, is the nth load voltage value, is the resistance value of the nth monitoring resistor.

[0010] Preferably, the measurement and control module is specifically configured to determine that the nth ion optical sub-module is normal according to the nth load current value if the nth load current value is less than or equal to the preset current value; If the nth load current value is greater than the preset current value, it is determined that there is a fault in the nth ion optical sub-module and the nth DC voltage closed-loop output module according to the nth load current value.

[0011] Preferably, the nth second input end of the measurement and control module is connected to the output end of the nth second sampling module, and the input ends of the nth second sampling module are respectively connected to the second end of the nth monitoring resistor and the output end of the nth DC voltage closed-loop output module; The measurement and control module is further configured to calculate the output voltage value of the output end of the nth DC voltage closed-loop output module according to the output voltage value of the output end of the nth second sampling module, and calculate the nth first ratio according to the output voltage value of the output end of the nth DC voltage closed-loop output module and the preset output voltage value of the output end of the nth DC voltage closed-loop output module; If the nth first ratio is within the second preset ratio range, it is determined that the nth ion optical sub-module is normal.

[0012] Preferably, the measurement and control module is specifically configured to calculate the nth first ratio according to the following formula:

[0013] Wherein, is the nth first ratio, is the output voltage setting value of the output end of the nth DC voltage closed-loop output module, is the output voltage value of the output end of the nth DC voltage closed-loop output module; The calculation formula for the output voltage value of the output end of the nth DC voltage closed-loop output module is as follows:

[0014] Wherein, is the output voltage value of the output end of the nth DC voltage closed-loop output module, is the output voltage value of the output end of the nth second sampling module, is the third feedback coefficient.

[0015] Preferably, the measurement and control module is further configured to determine that the nth DC voltage closed-loop output module connected to the nth ion optical sub-module is faulty if the nth first ratio exceeds the first preset ratio range; If the nth first ratio does not exceed the first preset ratio range and the nth load current value exceeds the preset current value, it is determined that the nth ion optical sub-module is faulty.

[0016] The ion optical module fault detection device provided by the present application brings the following beneficial effects: The present application provides an ion optical module fault detection device. In this device, the measurement and control module calculates the output voltage set value at the output end of the nth DC voltage closed-loop output module according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module, and calculates the nth load voltage value according to the output voltage value at the output end of the nth first sampling module; calculates the nth load current value according to the output voltage set value at the output end of the nth DC voltage closed-loop output module and the nth load voltage value, and detects the nth ion optical sub-module according to the nth load current value. Through a simple algorithm, this device can calculate in real time the current values flowing through each ion optical sub-module, and then determine the specific faulty ion optical sub-module based on these current values. This device can monitor the operating states of each ion optical sub-module without damaging the vacuum working environment of the ion optical module, so as to detect faults in a timely manner. This device avoids the work of restoring the vacuum after detecting the ion optical sub-module, saves manpower, saves the detection time, and improves the positioning efficiency of the faulty ion optical sub-module.

[0017] In a second aspect, the present application further provides an ion optical module fault detection method, which is applied to an ion optical module fault detection device. The device includes: a fault detection module and an ion optical module; the fault detection module includes: N monitoring resistors, N DC voltage closed-loop output modules, a measurement and control module, a host computer, and N first sampling modules; the ion optical module includes N ion optical sub-modules; the input end of the nth ion optical sub-module is connected to the first end of the nth monitoring resistor, the second end of the nth monitoring resistor is connected to the output end of the nth DC voltage closed-loop output module, the input end of the nth DC voltage closed-loop output module is connected to the nth output end of the measurement and control module, the nth first input end of the measurement and control module is connected to the output end of the nth first sampling module, and the input end of the nth first sampling module is connected to the output end of the nth ion optical sub-module; the method includes: The measurement and control module obtains the preset input voltage value at the input end of the nth DC voltage closed-loop output module sent by the host computer; The measurement and control module calculates the output voltage set value at the output end of the nth DC voltage closed-loop output module according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module; The measurement and control module obtains the output voltage value at the output end of the nth first sampling module; The measurement and control module calculates the nth load voltage value based on the output voltage value at the output end of the nth first sampling module; wherein, the nth load voltage value is the voltage value between the input end of the nth ion optical sub-module and the ground point of the DC voltage closed-loop output module. The measurement and control module calculates the nth load current value based on the output voltage set value at the output end of the nth DC voltage closed-loop output module and the nth load voltage value. Wherein, the nth load current value is the current value flowing from the output end of the nth DC voltage closed-loop output module through the nth monitoring resistor to the input end of the nth ion optical sub-module. The measurement and control module detects the nth ion optical sub-module according to the nth load current value.

[0018] The ion optical module fault detection method provided by the embodiments of the present application has the same technical features as the ion optical module fault detection device provided by the above embodiments, so it can also solve the same technical problems and achieve the same technical effects.

[0019] In a third aspect, the present application provides a computing device, including a memory and a processor; Wherein, one or more computer programs are stored in the memory, and the one or more computer programs include instructions; when the instructions are executed by the processor, the computing device executes the method described in the second aspect.

[0020] In a fourth aspect, the present application provides a computer-readable storage medium, and the computer-readable storage medium is used to store a computer program, and the computer program is used to execute the method described in the second aspect.

[0021] In a fifth aspect, the present application provides a computer program product, and the computer program product includes one or more computer instructions. When the computer instructions are executed by a computer, the computer executes the method described in the second aspect.

[0022] Other features and advantages of the present application will be described in the subsequent description, and, in part, will become obvious from the description, or will be understood by implementing the present application. The objectives and other advantages of the present application are achieved and obtained by the structures specifically pointed out in the description and the drawings.

[0023] To make the above objectives, features, and advantages of the present application more obvious and understandable, the following specifically enumerates preferred embodiments and, in conjunction with the accompanying drawings, makes a detailed description as follows. Description of the Drawings

[0024] To more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0025] Figure 1 Schematic structural diagram of a fault detection device for an ion optical module provided by an embodiment of the present application; Figure 2 Schematic structural diagram of a DC voltage closed-loop output module provided by an embodiment of the present application; Figure 3 Schematic structural diagram of an ion optical module provided by an embodiment of the present application; Figure 4 Schematic flow diagram of a fault detection method for an ion optical module provided by an embodiment of the present application; Figure 5 Schematic structural diagram of an electronic device provided by an embodiment of the present application. Specific embodiments

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the following will clearly and completely describe the technical solutions of the present application with reference to the drawings. Obviously, the described embodiments are some, but not all, of the embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0027] For ease of understanding of this embodiment, the following will provide a detailed introduction to the embodiments of the present application.

[0028] The embodiment of the present application provides a fault detection device for an ion optical module 200, as Figure 1 shown Figure 1Schematic diagram of a fault detection device for an ion optical module provided by an embodiment of the present application. The device includes the following modules: a fault detection module 100 and an ion optical module 200; the fault detection module 100 includes: N monitoring resistors 101, N DC voltage closed-loop output modules 102, a measurement and control module 103, a host computer 104, and N first sampling modules 1051; the ion optical module 200 includes N ion optical sub-modules 201; the input end of the nth ion optical sub-module 201 is respectively connected to the first end of the nth monitoring resistor 101 and the input end of the nth first sampling module 1051, the second end of the nth monitoring resistor 101 is connected to the output end of the nth DC voltage closed-loop output module 102, the input end of the nth DC voltage closed-loop output module 102 is connected to the nth output end of the measurement and control module 103, and the nth first input end of the measurement and control module 103 is connected to the output end of the nth first sampling module 1051; The measurement and control module 103 is configured to obtain a preset input voltage value at the input end of the nth DC voltage closed-loop output module 102 sent by the host computer 104.

[0029] Specifically, as Figure 2 shown, Figure 2 Schematic diagram of the DC voltage closed-loop output module provided by an embodiment of the present application. The above-mentioned DC voltage closed-loop output module 102 includes a closed-loop control circuit 1021, a voltage output adjustment circuit 1022, and a closed-loop feedback circuit 1023. When the ion optical module 200 operates, it can generate a feedback signal in real time and send the feedback signal to the closed-loop feedback circuit 1023. The closed-loop feedback circuit 1023 generates a feedback voltage value according to the feedback signal and inputs the feedback voltage value to the closed-loop control circuit 1021. The closed-loop control circuit 1021 generates an output control quantity according to the difference between the preset input voltage value and the feedback voltage value. The output control quantity is used to control the voltage output adjustment circuit 1022 to generate a power supply voltage, and the power supply voltage is used to supply power to the ion optical module 200 to support the operation of the ion optical module 200.

[0030] With such a setting, due to the feedback adjustment effect of the feedback signal on the power supply voltage input to the ion optical module 200, the ion optical module 200 can operate under a stable voltage, improving the stability and reliability of the ion optical module 200 and ensuring the stable operation of the ion optical module 200.

[0031] The measurement and control module 103 is further configured to calculate an output voltage setting value at the output end of the nth DC voltage closed-loop output module 102 according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module 102; Specifically, the measurement and control module 103 is specifically configured to calculate the output voltage set value at the output end of the nth DC voltage closed-loop output module 102 according to the following formula:

[0032] Wherein, is the output voltage set value at the output end of the nth DC voltage closed-loop output module 102, is the preset input voltage value at the input end of the nth DC voltage closed-loop output module 102, is the first feedback coefficient.

[0033] More specifically, the output voltage set value at the output end of the above-mentioned nth DC voltage closed-loop output module 102 is the input voltage value of the nth ion optical sub-module 201, which is proportional to the preset input voltage value at the input end of the nth DC voltage closed-loop output module 102, and this ratio is pre-set by the staff, that is, the first feedback coefficient.

[0034] The measurement and control module 103 is further configured to obtain the output voltage value at the output end of the nth first sampling module 1051.

[0035] Specifically, each first sampling module 1051 samples the voltage value (load voltage value) between the input end and the output end of each ion optical sub-module 201 using the voltage division principle. After the output voltage value at the output end of each first sampling module 1051 is input to the measurement and control module 103, it is convenient for the subsequent measurement and control module 103 to calculate the output voltage value (load voltage value) of each ion optical sub-module 201.

[0036] The measurement and control module 103 is further configured to calculate the nth load voltage value according to the output voltage value at the output end of the nth first sampling module 1051.

[0037] Wherein, the nth load voltage value is the voltage value between the input end of the nth ion optical sub-module and the ground point of the DC voltage closed-loop output module.

[0038] Specifically, the measurement and control module 103 is specifically configured to calculate the nth load voltage value according to the following formula:

[0039] Wherein, is the nth load voltage value, is the output voltage value at the output end of the nth first sampling module 1051, is the second feedback coefficient.

[0040] More specifically, the output voltage value at the output terminal of the above-mentioned nth first sampling module 1051 is proportional to the nth load voltage value, and this proportion is preset by the staff, which is the second feedback coefficient.

[0041] The measurement and control module 103 is further configured to calculate the nth load current value according to the output voltage set value at the output terminal of the nth DC voltage closed-loop output module 102 and the nth load voltage value.

[0042] Wherein, the nth load current value is the current value flowing from the output terminal of the nth DC voltage closed-loop output module through the nth monitoring resistor to the input terminal of the nth ion optical sub-module.

[0043] Specifically, the measurement and control module 103 is specifically configured to calculate the nth load current value according to the following formula:

[0044] Wherein, is the nth load current value, is the output voltage set value at the output terminal of the nth DC voltage closed-loop output module 102, is the nth load voltage value, is the resistance value of the nth monitoring resistor 101.

[0045] More specifically, before calculating the nth load current value, it is necessary to first determine the resistance value of the nth monitoring resistor 101. The resistance value of the monitoring resistor 101 can be determined according to the maximum output voltage value, the maximum output current value and the dynamic response speed of the output voltage at the output terminal of the DC voltage closed-loop output module 102 under normal working conditions.

[0046] The maximum output voltage value Umax at the output terminal of the DC voltage closed-loop output module 102 is 500V. In the case of a short circuit of the load (ion optical sub-module 201), the maximum output current value Imax at the output terminal of the DC voltage closed-loop output module 102 should be within a specific safety value range, and the specific safety value range is 5mA to 10mA. At the instant when the voltage is applied to the ion optical sub-module 201, the impedance of the ion optical sub-module 201 is approximately 0. In order to ensure a high dynamic response speed of the output voltage at the output terminal of the DC voltage closed-loop output module 102, the maximum output current value at the output terminal of the DC voltage closed-loop output module 102 needs to be greater than or equal to a current specific value Imin, and the range of the current specific value is 1mA to 2mA. From the above, the following calculation formula for the resistance value of the monitoring resistor 101 is as follows:

[0047] Wherein, is the maximum output voltage value at the output end of the nth DC voltage closed-loop output module 102, is the maximum output current value at the output end of the nth DC voltage closed-loop output module 102, is the resistance value of the nth monitoring resistor 101.

[0048] After determining the resistance value of the monitoring resistor 101, the nth load current value can be calculated according to the resistance value of the monitoring resistor 101, the output voltage set value at the output end of the nth DC voltage closed-loop output module 102, and the nth load voltage value, so as to locate the faulty ion optical sub-module 201 through the nth load current value in the subsequent process.

[0049] The measurement and control module 103 is also used to detect the nth ion optical sub-module 201 according to the nth load current value.

[0050] Specifically, as Figure 3 shown, Figure 3 is the schematic structural diagram of the ion optical module provided by the embodiment of the present application. Since the mass spectrometer realizes the screening and control of ions by loading AC and DC electric fields on the ion optical module 200, the circuit of the ion optical module 200 under normal working conditions can be equivalently determined as a circuit in which multiple high-impedance resistors and multiple low-capacitance capacitors are connected in parallel. It can be seen from this that the working current of each part (ion optical sub-module 201) of the ion optical module 200 is less than or equal to 1 microampere, which is very small in the static working state. When a certain ion optical sub-module 201 discharges abnormally or is short-circuited to the ground (fault), the current value of this ion optical sub-module 201 will be much greater than 1 milliampere. Therefore, the above measurement and control module 103 can judge whether the ion optical sub-module 201 is faulty by judging whether the calculated nth load current value is much greater than 1 milliampere.

[0051] The ion optical module 200 fault detection device provided by the embodiment of the present application. In this device, the measurement and control module 103 calculates the output voltage set value at the output end of the nth DC voltage closed-loop output module 102 according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module 102, and calculates the nth load voltage value according to the output voltage value at the output end of the nth first sampling module 1051; calculates the nth load current value according to the output voltage set value at the output end of the nth DC voltage closed-loop output module 102 and the nth load voltage value, and detects the nth ion optical sub-module 201 according to the nth load current value. Through a simple algorithm, this device can calculate the current value flowing through each ion optical sub-module 201 in real time, and then judge the specific faulty ion optical sub-module 201 through this current value.

[0052] In the prior art, the ion optical module 200 is in a vacuum working environment. If it is necessary to detect each part (ion optical sub-module 201) of the ion optical module 200, the operation of the ion optical module 200 can only be temporarily stopped. After the detection is completed, the ion optical module 200 also needs to be restored to a vacuum. The detection process is very cumbersome, and it is impossible to monitor each part (ion optical sub-module 201) of the ion optical module 200 in real time, resulting in the failure of a certain part (ion optical sub-module 201) of the ion optical module 200 not being discovered in time. Through the measurement and control module 103, the device can calculate in real time the current value (load current value) flowing through each ion optical sub-module 201 in the static working state of the DC voltage closed-loop output module 102 without stopping the operation of the ion optical module 200. It can monitor the operation status of each ion optical sub-module 201 without damaging the vacuum working environment of the ion optical module 200, and discover faults in time. The device avoids the work of restoring the vacuum after detecting the ion optical sub-module 201, saves manpower, saves detection time, and improves the positioning efficiency of the faulty ion optical sub-module 201.

[0053] The measurement and control module 103 is introduced below. Specifically, the measurement and control module 103 is configured to determine that the nth ion optical sub-module 201 is normal according to the nth load current value if the nth load current value is less than or equal to the preset current value; if the nth load current value is greater than the preset current value, it is determined that there is a fault in the nth ion optical sub-module 201 and the nth DC voltage closed-loop output module 102 according to the nth load current value.

[0054] Specifically, as can be seen from the above, the preset current value is 1 mA. If the measurement and control module 103 determines that the nth load current value (the current value flowing through the nth ion optical sub-module 201) is greater than 1 mA, it indicates that the ion optical sub-module 201 discharges abnormally or is short-circuited to the ground. At this time, it is determined that the ion optical sub-module 201 and the DC voltage closed-loop output module 102 are faulty; if the measurement and control module 103 determines that the nth load current value (the current value flowing through the nth ion optical sub-module 201) is less than or equal to 1 mA, it indicates that the ion optical sub-module 201 is operating normally. At this time, it is determined that the ion optical sub-module 201 is normal.

[0055] With such a setting, the measurement and control module 103 can determine the faulty ion optical sub-module 201 and the DC voltage closed-loop output module 102 through a simple judgment logic, saves detection time, improves the positioning efficiency of the faulty ion optical sub-module 201, can avoid the ion optical sub-module 201 being damaged due to long-term abnormal operation, thereby extending the service life, ensuring the stable operation of the ion optical module 200, and improving the overall reliability of the ion optical module 200.

[0056] In one embodiment, the nth second input end of the measurement and control module 103 is connected to the output end of the nth second sampling module 10512, and the input ends of the nth second sampling module 10512 are respectively connected to the second end of the nth monitoring resistor 101 and the output end of the nth DC voltage closed-loop output module 102; The measurement and control module 103 is further configured to calculate the output voltage value of the output end of the nth DC voltage closed-loop output module 102 according to the output voltage value of the output end of the nth second sampling module 10512, and calculate the nth first ratio according to the output voltage value of the output end of the nth DC voltage closed-loop output module 102 and the preset output voltage value of the output end of the nth DC voltage closed-loop output module 102; if the nth first ratio is within the second preset ratio range, it is determined that the nth ion optical sub-module 201 is normal.

[0057] Specifically, the calculation formula for the output voltage value of the output end of the above-mentioned nth DC voltage closed-loop output module 102 is as follows:

[0058] wherein, is the output voltage value of the output end of the nth DC voltage closed-loop output module 102, is the output voltage value of the output end of the nth second sampling module 10512, is the third feedback coefficient.

[0059] The calculation formula for the above-mentioned nth first ratio is as follows:

[0060] wherein, is the nth first ratio, is the set output voltage value of the output end of the nth DC voltage closed-loop output module 102, is the output voltage value of the output end of the nth DC voltage closed-loop output module 102.

[0061] The above-mentioned measurement and control module 103 is further configured to, if the nth first ratio exceeds the first preset ratio range, determine that the nth DC voltage closed-loop output module connected to the nth ion optical sub-module is faulty; if the nth first ratio does not exceed the first preset ratio range, and the nth load current value exceeds the preset current value, determine that the nth ion optical sub-module is faulty.

[0062] More specifically, since the second output terminal of the nth DC voltage closed-loop output module 102 is connected to the nth second input terminal of the measurement and control module 103, the measurement and control module 103 can directly obtain the feedback voltage value generated by the closed-loop feedback circuit 1023 according to the feedback signal (the output voltage value of the second output terminal of the nth DC voltage closed-loop output module 102).

[0063] The above first preset ratio range is within 5%. If the nth first ratio is within the first preset ratio range, it indicates that the output voltage value of the output terminal of the nth DC voltage closed-loop output module 102 and the output voltage set value of the output terminal of the nth DC voltage closed-loop output module 102 do not differ much. Since the output voltage value of the output terminal of the nth DC voltage closed-loop output module 102 is obtained from the host computer 104, the output voltage value of the output terminal of the nth DC voltage closed-loop output module 102 meets the setting of the host computer 104. At this time, the nth ion optical sub-module 201 also operates according to the setting of the host computer 104, that is, the nth ion optical sub-module 201 is normal.

[0064] If the nth first ratio exceeds the first preset ratio range, it indicates that the output voltage value of the output terminal of the nth DC voltage closed-loop output module 102 and the output voltage set value of the output terminal of the nth DC voltage closed-loop output module 102 differ greatly. The output voltage value of the output terminal of the nth DC voltage closed-loop output module 102 does not meet the setting of the host computer 104. At this time, it can be determined that the nth DC voltage closed-loop output module is faulty.

[0065] If the nth first ratio does not exceed the first preset ratio range, and the nth load current value exceeds the preset current value, it indicates that the current value flowing through the nth ion optical sub-module 201 is not the preset current value set by the host computer 104, that is, it is determined that the nth ion optical sub-module 201 is faulty. In addition, if the output voltage value of the output terminal of the nth second sampling module 10512 exceeds the designed output voltage value range (less than 2V), it indicates that the nth ion optical sub-module 201 is faulty.

[0066] With such a setting, the calculation steps of the measurement and control module 103 are simplified. The measurement and control module 103 can more quickly determine the faulty ion optical sub-module 201, and the measurement and control module 103 is more efficient in processing data, thereby reducing the time for troubleshooting.

[0067] Based on the above device embodiments, an embodiment of the present application further provides a method for detecting faults in an ion optical module. This method is applied to a device for detecting faults in an ion optical module, and the device includes: a fault detection module and an ion optical module; the fault detection module includes: N monitoring resistors, N DC voltage closed-loop output modules, a measurement and control module, a host computer, and N first sampling modules; the ion optical module includes N ion optical sub-modules; the input end of the nth ion optical sub-module is connected to the first end of the nth monitoring resistor, the second end of the nth monitoring resistor is connected to the output end of the nth DC voltage closed-loop output module, the input end of the nth DC voltage closed-loop output module is connected to the nth output end of the measurement and control module, the nth first input end of the measurement and control module is connected to the output end of the nth first sampling module, and the input end of the nth first sampling module is connected to the output end of the nth ion optical sub-module. As Figure 4 shown, Figure 4 is a schematic flowchart of a method for detecting faults in an ion optical module provided by an embodiment of the present application. The method includes the following steps: S401, the measurement and control module obtains the preset input voltage value at the input end of the nth DC voltage closed-loop output module sent by the host computer.

[0068] S402, the measurement and control module calculates the output voltage setting value at the output end of the nth DC voltage closed-loop output module according to the preset input voltage value at the input end of the nth DC voltage closed-loop output module.

[0069] S403, the measurement and control module obtains the output voltage value at the output end of the nth first sampling module.

[0070] S404, the measurement and control module calculates the nth load voltage value according to the output voltage value at the output end of the nth first sampling module.

[0071] Wherein, the nth load voltage value is the voltage value between the input end of the nth ion optical sub-module and the ground connection point of the DC voltage closed-loop output module.

[0072] S405, the measurement and control module calculates the nth load current value according to the output voltage setting value at the output end of the nth DC voltage closed-loop output module and the nth load voltage value.

[0073] Wherein, the nth load current value is the current value flowing from the output end of the nth DC voltage closed-loop output module through the nth monitoring resistor to the input end of the nth ion optical sub-module.

[0074] S406, the measurement and control module detects the nth ion optical sub-module according to the nth load current value.

[0075] The ion optical module fault detection method provided by the embodiments of the present application has the same technical features as the ion optical module fault detection device provided by the above embodiments, so it can also solve the same technical problems and achieve the same technical effects.

[0076] The embodiments of the present application also provide a computing device. As Figure 5 shown, this figure is a schematic diagram of a computing device provided by the embodiments of the present application. The computing device 400 includes a bus 401, a processor 402, a communication interface 403, and a memory 404. The processor 402, the memory 404, and the communication interface 403 communicate with each other through the bus 401.

[0077] The bus 401 can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of simplicity of representation, Figure 5 only a thick line is used to represent it in the figure, but it does not mean that there is only one bus or one type of bus.

[0078] The processor 402 can be any one or more of a central processing unit (CPU), a graphics processing unit (GPU), a microprocessor (MP), or a digital signal processor (DSP), etc.

[0079] The communication interface 403 is used for external communication. The memory 404 can include a volatile memory, such as a random access memory (RAM). The memory 404 can also include a non-volatile memory, such as a read-only memory (ROM), a flash memory, a hard disk drive (HDD), or a solid state drive (SSD).

[0080] The memory 404 stores executable code, and the processor 402 executes the executable code to execute the foregoing method.

[0081] The embodiments of the present application also provide a computer-readable storage medium. The computer-readable storage medium can be any available medium that a computing device can store or a data storage device such as a data center that contains one or more available media. The available medium can be a magnetic medium (such as a floppy disk, hard disk, magnetic tape), an optical medium (such as a DVD), or a semiconductor medium (such as a solid-state drive), etc. The computer-readable storage medium includes instructions that direct the computing device to execute the above method.

[0082] The embodiments of the present application also provide a computer program product, which includes one or more computer instructions. When the computer instructions are loaded and executed on a computing device, they fully or partially generate the processes or functions described in the embodiments of the present application.

[0083] The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from a website, computer, or data center to another website, computer, or data center by wired (such as coaxial cable, optical fiber) or wireless (such as infrared, wireless, microwave, etc.) means.

[0084] When the computer program product is executed by a computer, the computer executes the foregoing method. The computer program product can be a software installation package. In the case where the foregoing method is required, the computer program product can be downloaded and executed on the computer.

[0085] The descriptions of the processes or structures corresponding to the above respective drawings each have their own emphases. For parts not detailed in a certain process or structure, reference can be made to the relevant descriptions of other processes or structures.

[0086] As described above, the above are only specific embodiments of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present application should be covered by the protection scope of the present application.

Claims

1. An ion optical module fault detection device, characterized in that: The device comprises: a fault detection module and an ion optical module; the fault detection module comprises: N monitoring resistors, N DC voltage closed-loop output modules, a measurement and control module, a host computer and N first sampling modules; the ion optical module comprises N ion optical submodules; the input end of the nth ion optical submodule is respectively connected to the first end of the nth monitoring resistor and the input end of the nth first sampling module, the second end of the nth monitoring resistor is connected to the output end of the nth DC voltage closed-loop output module, the input end of the nth DC voltage closed-loop output module is connected to the nth output end of the measurement and control module, and the nth first input end of the measurement and control module is connected to the output end of the nth first sampling module; The measurement and control module is used to obtain a preset input voltage value of the input end of the nth DC voltage closed-loop output module sent by the host computer; The measurement and control module is also used to calculate the output voltage setting value of the output end of the nth DC voltage closed-loop output module according to the preset input voltage value of the input end of the nth DC voltage closed-loop output module; obtain the output voltage value of the output end of the nth first sampling module; calculate the nth load voltage value according to the output voltage value of the output end of the nth first sampling module; wherein the nth load voltage value is the voltage value between the input end of the nth ion optical sub-module and the grounding point of the DC voltage closed-loop output module; calculate the nth load current value according to the output voltage setting value of the output end of the nth DC voltage closed-loop output module and the nth load voltage value; wherein the nth load current value is the current value flowing from the output end of the nth DC voltage closed-loop output module to the input end of the nth ion optical sub-module through the nth monitoring resistor; and detect the nth ion optical sub-module according to the nth load current value.

2. The ion optical module fault detection device according to claim 1, characterized in that: The measurement and control module is specifically used to calculate the output voltage setting value of the output end of the nth DC voltage closed-loop output module according to the following formula: in, is the output voltage setting value of the output terminal of the nth DC voltage closed-loop output module, is the preset input voltage value of the input terminal of the nth DC voltage closed-loop output module, is the first feedback coefficient; The measurement and control module is specifically used to calculate the nth load voltage value according to the following formula: in, is the nth load voltage value, is the output voltage value of the output terminal of the nth first sampling module, is the second feedback coefficient; The measurement and control module is specifically used to calculate the nth load current value according to the following formula: in, is the nth load current value, is the output voltage setting value of the output terminal of the nth DC voltage closed-loop output module, is the nth load voltage value, is the resistance value of the nth monitoring resistor.

3. The ion optical module fault detection device according to claim 1, characterized in that: The measurement and control module is specifically used to determine whether the nth ion optical submodule is normal according to the nth load current value if the nth load current value is less than or equal to the preset current value; If the nth load current value is greater than the preset current value, it is determined based on the nth load current value that a fault exists in the nth ion optical submodule and the nth DC voltage closed-loop output module.

4. The ion optical module fault detection device according to claim 1, characterized in that: The nth second input terminal of the measurement and control module is connected to the output terminal of the nth second sampling module, and the input terminal of the nth second sampling module is respectively connected to the second terminal of the nth monitoring resistor and the output terminal of the nth DC voltage closed-loop output module; The measurement and control module is further used to calculate the output voltage value of the output end of the nth DC voltage closed-loop output module according to the output voltage value of the output end of the nth second sampling module, and calculate the nth first ratio according to the output voltage value of the output end of the nth DC voltage closed-loop output module and the output voltage preset value of the output end of the nth DC voltage closed-loop output module; If the nth first ratio is within the second preset ratio range, it is determined that the nth ion optical submodule is normal.

5. The ion optical module fault detection device according to claim 4, characterized in that: The measurement and control module is specifically used to calculate the nth first ratio according to the following formula: in, is the nth first ratio, is the output voltage setting value of the output terminal of the nth DC voltage closed-loop output module, is the output voltage value of the output terminal of the nth DC voltage closed-loop output module; The calculation formula for the output voltage value at the output end of the nth DC voltage closed-loop output module is as follows: in, is the output voltage value of the output terminal of the nth DC voltage closed-loop output module, is the output voltage value of the output terminal of the nth second sampling module, is the third feedback coefficient.

6. The ion optical module fault detection device according to claim 4, characterized in that: The measurement and control module is further used to determine that the nth DC voltage closed-loop output module connected to the nth ion optical submodule is faulty if the nth first ratio exceeds the first preset ratio range; If the nth first ratio does not exceed the first preset ratio range, and the nth load current value exceeds the preset current value, it is determined that the nth ion optical submodule is faulty.

7. A method for detecting faults in an ion optical module, characterized in that: The invention is applied to an ion optical module fault detection device, the device comprising: a fault detection module and an ion optical module; the fault detection module comprising: N monitoring resistors, N DC voltage closed-loop output modules, a measurement and control module, a host computer and N first sampling modules; the ion optical module comprises N ion optical submodules; the input end of the nth ion optical submodule is connected to the first end of the nth monitoring resistor, the second end of the nth monitoring resistor is connected to the output end of the nth DC voltage closed-loop output module, the input end of the nth DC voltage closed-loop output module is connected to the nth output end of the measurement and control module, the nth first input end of the measurement and control module is connected to the output end of the nth first sampling module, and the input end of the nth first sampling module is connected to the output end of the nth ion optical submodule; the method comprises: The measurement and control module obtains a preset input voltage value of the input end of the nth DC voltage closed-loop output module sent by the host computer; The measurement and control module calculates the output voltage setting value of the output end of the nth DC voltage closed-loop output module according to the preset input voltage value of the input end of the nth DC voltage closed-loop output module; The measurement and control module obtains the output voltage value of the output end of the nth first sampling module; The measurement and control module calculates the nth load voltage value according to the output voltage value of the output end of the nth first sampling module; wherein the nth load voltage value is the voltage value between the input end of the nth ion optical submodule and the grounding point of the DC voltage closed-loop output module; The measurement and control module calculates the nth load current value according to the output voltage setting value of the output end of the nth DC voltage closed-loop output module and the nth load voltage value; The nth load current value is the current value flowing from the output end of the nth DC voltage closed-loop output module to the input end of the nth ion optical submodule through the nth monitoring resistor; The measurement and control module detects the nth ion optical submodule according to the nth load current value.

8. A computing device, characterized in that including memory and processor; One or more computer programs are stored in the memory, and the one or more computer programs include instructions; when the instructions are executed by the processor, the computing device executes the method as claimed in claim 7.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium is used to store a computer program, and the computer program is used to execute the method according to claim 7.

10. A computer program product, characterized in that The computer program product comprises one or more computer instructions, and when the computer instructions are executed by a computer, the computer performs the method according to claim 7.

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