Test method and system, storage medium and program product
By obtaining sensitive parameters and equipment data from the data set, controlling the generator to output an excitation signal, and conducting excitation tests on the test device, solving the complexity and compatibility problems of hardware combination testing in the prior art, and achieving efficient and stable test results.
Patent Information
- Application Number
- CN202510657395.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-21
- Publication Date
- 2025-06-20
- Estimated Expiration
- 2045-05-21
AI Technical Summary
In the prior art, hardware physical combination testing requires testing for each combination, which increases the complexity and workload of the test, and has compatibility problems, resulting in unstable testing.
By obtaining sensitive parameters and equipment data corresponding to the device to be tested from the data set, controlling multiple generators to output multiple excitation signals based on the equipment data, performing excitation tests on the device to be tested, and combining sensitive parameters, test data and environmental data, the test results of the device to be tested are obtained.
The stability and compatibility problems during physical hardware testing are avoided, and the multiple combinations of different generation devices and different devices to be tested are achieved, which improves the testing efficiency and reduces the testing time.
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Figure CN120179565A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of servers, and in particular, to a testing method, system, storage medium, and program product. Background Art
[0002] Enterprise applications, cloud computing, big data analysis and other application scenarios have high requirements for the read and write performance of hard disks in servers. Reliability testing can simulate various situations in actual applications and quantitatively evaluate performance indicators such as the read and write speed, latency, and throughput of hard disks. In related technologies, through combined testing of hard disks and fans from different manufacturers for the same server model, the performance of hard disks can be predicted according to noise to a certain extent. However, in the hardware physical combination testing in related technologies, each combination needs to be tested, which increases the complexity and workload of the testing. There are compatibility problems among different types of hardware, resulting in unstable testing. Summary of the Invention
[0003] In view of the above problems, the present invention provides a testing method, device, system, electronic device, storage medium, and program product.
[0004] According to a first aspect of the present invention, there is provided a testing method, including: obtaining sensitive parameters and device data corresponding to a device to be tested from a dataset, where the device to be tested is a replacement device of a target device, and the sensitive parameters characterize the influence degree of the device data on the performance of the target device; controlling a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform excitation testing on the device to be tested by using the plurality of excitation signals; and obtaining a test result of the device to be tested based on the sensitive parameters, test data obtained in the excitation testing, and environmental data.
[0005] A second aspect of the present invention provides a testing device, including: a data acquisition module, configured to obtain sensitive parameters and device data corresponding to a device to be tested from a dataset, where the device to be tested is a replacement device of a target device, and the sensitive parameters characterize the influence degree of the device data on the performance of the target device; a signal output module, configured to control a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform excitation testing on the device to be tested by using the plurality of excitation signals; and a result determination module, configured to obtain a test result of the device to be tested based on the sensitive parameters, test data obtained in the excitation testing, and environmental data.
[0006] A third aspect of the present invention provides a testing system, including: a memory; a processor configured to execute the above testing method according to instructions and data stored in the memory.
[0007] A fourth aspect of the present invention provides an electronic device, including: one or more processors; a memory for storing one or more computer programs, wherein the one or more processors execute the one or more computer programs to implement the steps of the above method.
[0008] A fifth aspect of the present invention further provides a computer-readable storage medium, on which a computer program or instruction is stored, and when the computer program or instruction is executed by a processor, the steps of the above method are implemented.
[0009] A sixth aspect of the present invention further provides a computer program product, including a computer program or instruction, and when the computer program or instruction is executed by a processor, the steps of the above method are implemented. Description of the Drawings
[0010] Through the following description of the embodiments of the present invention with reference to the drawings, the above content and other objects, features, and advantages of the present invention will become clearer. In the drawings:
[0011] Figure 1 A diagram showing an application scenario of a test method, device, system, electronic device, storage medium, and program product according to an embodiment of the present invention;
[0012] Figure 2 A flowchart showing a test method according to an embodiment of the present invention;
[0013] Figure 3 A flowchart showing another test method according to an embodiment of the present invention;
[0014] Figure 4 A block diagram showing the structure of a test device according to an embodiment of the present invention;
[0015] Figure 5 A block diagram showing a test system according to an embodiment of the present invention;
[0016] Figure 6 A block diagram showing an electronic device suitable for implementing a test method according to an embodiment of the present invention. Detailed Embodiments
[0017] Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, it should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present invention. In the following detailed description, for the sake of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present invention. However, obviously, one or more embodiments can also be implemented without these specific details. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessarily confusing the concepts of the present invention.
[0018] The terms used herein are merely for describing specific embodiments and are not intended to limit the present invention. The terms "comprising", "including" and the like used herein indicate the presence of the described features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.
[0019] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.
[0020] In cases where expressions similar to "at least one of A, B, and C, etc." are used, generally, it should be interpreted according to the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include, but is not limited to, a system having only A, only B, only C, having A and B, having A and C, having B and C, and / or having A, B, and C, etc.).
[0021] In some examples, combined tests are carried out on hard disks and fans from different manufacturers. For example, some hard disks may adopt the newer third-generation serial interface, while some fans may use a special pulse-width modulation interface. This requires a large number of compatibility tests to ensure that different components can work together properly. If the combination is incompatible, it may cause the server to fail to start properly or run unstably, and a large amount of time is required for troubleshooting and adjustment, resulting in low test efficiency.
[0022] At the same time, the firmware versions of hard disks and fans from different manufacturers also vary. The old version of the firmware may have known compatibility problems, while the new version may introduce new problems. This makes it necessary to test the firmware versions of various combinations during the test process, increasing the complexity and workload of the test.
[0023] In some examples, the read and write performance of some hard disks will decrease significantly under high load, while some other hard disks may have a better cache strategy and can provide more stable performance. To comprehensively evaluate the performance, it is necessary to conduct tests on each hard disk under different loads and different data modes, which will increase the test items and time.
[0024] In some examples, by establishing a benchmark curve for the different read and write performances of the hard disk; converting the measured noise signal of the hard disk to obtain the hard disk noise curve; comparing the hard disk noise curve with the benchmark curve and testing the hard disk performance based on a pre-designed calculation formula, this method can, to a certain extent, realize the prediction of the hard disk read and write performance according to the noise. However, this scheme only considers the influence of noise on the hard disk read and write performance and lacks a comprehensive consideration of the influence of multi-dimensional factors, resulting in a low accuracy rate of the prediction result.
[0025] In some examples, certain hard drives have high current demands during high-load operation, and fans may also increase power consumption at high speeds. If the combination of the hard drive and the fan exceeds the power supply capacity of the server power supply or the power distribution is unreasonable, it may lead to insufficient power supply, causing unstable phenomena such as server restart and crash.
[0026] For example, certain hard drives may experience cache overflow under specific workloads, resulting in a sudden drop in read and write speeds; and if the fan speed adjustment is not timely or stable, it may cause fluctuations in the internal temperature of the server, further affecting the performance of the hard drive and other hardware. This performance fluctuation and unpredictability pose risks to the stability testing of the server, and a large number of tests and adjustments are required to ensure that the server can operate stably under various conditions.
[0027] Based on the above problems, the present invention provides a testing method, including: obtaining sensitive parameters and device data corresponding to the device to be tested from a dataset, where the device to be tested is a replacement device of the target device, and the sensitive parameters characterize the degree of influence of the device data on the performance of the target device; controlling a plurality of generating devices to output a plurality of excitation signals based on the device data to perform an excitation test on the device to be tested; and obtaining a test result of the device to be tested based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data.
[0028] According to an embodiment of the present invention, by controlling a plurality of generating devices to output different excitation signals based on the device data in the dataset according to different test requirements to perform an excitation test on the device to be tested, since the test data and environmental data obtained in the excitation test are used as variables and combined with the sensitive parameters corresponding to the device to be tested for testing, the test results of replacing the physical test of the target device under different test conditions are obtained, avoiding the stability and compatibility problems in the physical hardware test process, realizing the test results of various combinations of different generating devices and different devices to be tested, improving the test efficiency, and reducing the test time.
[0029] Figure 1 The application scenario diagrams of the testing method, device, system, electronic device, storage medium, and program product according to the embodiments of the present invention are shown.
[0030] As Figure 1 shown, the application scenario according to this embodiment may include a processor 101, a device to be tested 102, and a generating device 103. The processor 101 may be a server providing various services, such as a baseboard controller. For example, the processor 101 may obtain relevant data corresponding to the device to be tested 102 in real time and control the generating device 103 according to the relevant data.
[0031] The device under test 102 can be integrally installed in the processor 101 to replace the real target device (such as a mechanical hard disk) in the processor 101, such as a hard disk dummy. The device under test 102 can include a signal interface and can be connected to the processor 101 through the signal interface to supply power to the device under test 102 and perform data transmission with other devices (such as a generating device).
[0032] The generating device 103 can be set at the position corresponding to the device under test 102 according to actual test requirements and is used to send an excitation signal to perform an excitation test on the device under test 102. It can be understood that the specific setting position of the generating device 103 is based on the standard of accurately sending the excitation signal, and specific limitations are not provided here.
[0033] It should be noted that the test method provided by the embodiments of the present invention can generally be executed by the processor 101. Correspondingly, the test device provided by the embodiments of the present invention can generally be set in the processor 101. The test method provided by the embodiments of the present invention can also be executed by a server or a server cluster different from the processor 101 and capable of communicating with the processor 101. Correspondingly, the test device provided by the embodiments of the present invention can also be set in a server or a server cluster different from the processor 101 and capable of communicating with the processor 101.
[0034] It should be understood that Figure 1 the numbers of the processor, the device under test, and the generator are merely illustrative. According to actual needs, any number of processors, devices under test, and generators can be provided.
[0035] Figure 2 shows a flowchart of the test method according to an embodiment of the present invention.
[0036] As Figure 2 shown, the test method of this embodiment includes operations S210 to S230.
[0037] In operation S210, sensitive parameters and device data corresponding to the device under test are obtained from the dataset, where the device under test is a replacement device for the target device, and the sensitive parameters characterize the degree of influence of the device data on the performance of the target device.
[0038] In an embodiment of the present invention, the data set can be used to store sensitive parameters, device data, and other relevant data related to the device to be tested. The data set can be stored in a target file on the server or in cloud storage, and the specific form is not limited herein. The target device can be a device in the server for reading and writing data, storing data, and data backup. Data such as the size, installation characteristics, weight, and moment of inertia of the device to be tested can be consistent with the target device, with the standard of satisfying the reception of the excitation signal by the replacement target device and no deviation in the signal transmission path. The device data can include the device data of the target device, the device data of the device generating the excitation signal in the server, and the data of other relevant devices.
[0039] For example, device data is obtained by collecting various device data of target devices and excitation signal devices of different types or different manufacturers; sensitive parameters are obtained through experiments or finite element analysis; thus, the obtained device data and sensitive parameters are stored in the target file of the server, and the device data and sensitive parameters are obtained in real time from the data set according to actual needs.
[0040] In operation S220, based on the device data, control multiple generating devices to output multiple excitation signals to perform an excitation test on the device to be tested using the multiple excitation signals.
[0041] In an embodiment of the present invention, the generating device can be a replacement device for the excitation signal device in the server, which can simulate the excitation signal device according to actual test requirements and emit different types of excitation signals.
[0042] For example, select a suitable generating device according to at least one of the excitation signal type, frequency range, and output power required by the device to be tested, and use the programmable control interface of the generating device to send control instructions through the processor to change the parameters of the output signal to perform an excitation test on the device to be tested.
[0043] In operation S230, based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data, obtain the test result of the device to be tested.
[0044] In an embodiment of the present invention, the test data can include various test data based on different generating devices. The environmental data can include at least one of temperature data and humidity data, and the environmental data can be obtained according to different types of sensors. The sensitive parameters can include various sensitive parameters based on different test data.
[0045] For example, use the test method or the finite element analysis method to determine the preset thresholds corresponding to different test data respectively, and thus determine the test result of the device to be tested based on the preset thresholds, the sensitive parameters corresponding to different test data respectively, different types of test data, and the environmental data.
[0046] According to an embodiment of the present invention, by using the device data in the dataset based on different test requirements to control multiple generating devices to output different excitation signals for performing excitation testing on the device under test, since the test data and environmental data obtained in the excitation testing are used as variables and combined with the sensitive parameters corresponding to the device under test for testing, the test results substituting for the physical testing of the target device under different test conditions are obtained, avoiding the stability and compatibility problems in the physical hardware testing process, realizing the test results of various combinations of different generating devices and different devices under test, improving the test efficiency and reducing the test time.
[0047] It can be understood that the above has described how to obtain the test results of the device under test. Next, the process of determining different thresholds for different test data will be described.
[0048] According to an embodiment of the present invention, the test data includes vibration test data and noise test data; the method further includes: determining a vibration threshold for the vibration test data, wherein when the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device shows a decline; determining a noise threshold for the noise test data, wherein when the sound pressure amplitude of the target device is greater than or equal to the noise threshold, the performance of the target device shows a decline.
[0049] In an embodiment of the present invention, the vibration test data may be the vibration frequency and vibration acceleration amplitude generated by the vibration generating device obtained through the excitation test. The noise test data may be the acoustic wave signal corresponding to the spectrum of the excitation signal device (such as a fan) generated by the noise generating device in the excitation test.
[0050] In an embodiment of the present invention, the vibration threshold may represent the critical value at which the target device (such as a mechanical hard disk) is about to lose performance under the influence of the vibration acceleration amplitude, that is, when the vibration acceleration amplitude emitted by the external device is greater than or equal to the vibration threshold, the performance of the target device begins to decline. The noise threshold may represent the critical value at which the target device is about to lose performance under the influence of the sound pressure amplitude, that is, when the sound pressure amplitude emitted by the external device is greater than or equal to the noise threshold, the performance of the target device begins to decline.
[0051] In a feasible embodiment, the noise threshold can be determined by vibration analysis method or finite element analysis method. The vibration threshold is determined by using modal analysis and finite element analysis method.
[0052] For example, the method of determining the noise threshold using vibration analysis may include: according to the structure and material parameters of the hard disk, using methods such as finite element analysis to simulate the vibration responses of the hard disk under different sound pressures, including acceleration, displacement, velocity, etc.; thereby analyzing the relationship between the hard disk vibration and its performance indicators. For example, vibration may cause a change in the spacing between the head and the disk of the hard disk, thereby affecting the read / write performance. The quantitative relationship between the vibration amplitude and the performance loss of the hard disk can be determined through experiments or theoretical analysis; and then, combined with the vibration model and the relationship between vibration and performance, the sound pressure amplitude that causes the performance loss of the hard disk to reach a certain threshold, that is, the critical sound pressure, can be calculated.
[0053] According to an embodiment of the present invention, by focusing on the vibration characteristics of the hard disk, the response of the internal structure of the hard disk under the vibration caused by the sound pressure can be deeply analyzed, which has strong pertinence to the problem of the performance degradation of the hard disk caused by vibration, and can more accurately find the critical sound pressure values such as the head-disk collision and data read / write errors caused by vibration, improving the accuracy of the noise threshold.
[0054] For example, the method of determining the vibration threshold using modal analysis and finite element analysis may include: the geometric dimension data of the hard disk, such as the disk diameter, thickness, head arm length, etc., and the material properties of the main components of the hard disk, such as density, elastic modulus, Poisson's ratio, etc., can be obtained from the hard disk manufacturer; thereby creating a three-dimensional geometric model of the hard disk using finite element analysis software; the boundary conditions of the three-dimensional geometric model can be defined according to the actual installation and use conditions of the hard disk, such as fixing the positions of the mounting screw holes of the hard disk; and then, by solving the modes of the hard disk through the finite element analysis software, the natural frequencies and modal vibration modes of the hard disk can be obtained, and the response characteristics of the hard disk under different vibration frequencies can be obtained.
[0055] For example, different amplitudes of vibration acceleration loads can be applied to the model, and combined with the modal analysis results, the response of the hard disk at different frequencies can be considered. The response quantities such as stress, strain, and displacement of the hard disk under the action of vibration acceleration are calculated through finite element analysis; according to the calculated response quantities, the degree to which the performance of the hard disk may be affected is evaluated. For example, when the displacement of the head arm is too large, it may cause a change in the spacing between the head and the disk, affecting the read / write performance. By setting the threshold of the performance index, such as the maximum allowable displacement of the head arm, the corresponding critical acceleration can be determined.
[0056] According to an embodiment of the present invention, the combined method of modal analysis and finite element analysis mainly relies on computer software and hardware, without the need for a large number of experimental devices, and the software cost is relatively low. Compared with the traditional experimental test method, it can greatly save costs and time.
[0057] According to an embodiment of the present invention, the sensitive parameters include vibration-sensitive parameters corresponding to vibration test data and noise-sensitive parameters corresponding to noise test data; based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data, the test result of the device to be tested is obtained, including: determining a first change amount corresponding to the vibration test data based on the vibration-sensitive parameters, the vibration test data, the vibration threshold, and the environmental data; determining a second change amount corresponding to the noise test data based on the noise-sensitive parameters, the noise test data, the noise threshold, and the environmental data; and obtaining the test result of the performance change amount of the device to be tested by weighting the first change amount with a first weight and weighting the second change amount with a second weight.
[0058] In an embodiment of the present invention, the vibration-sensitive parameter can characterize the sensitivity coefficient of the performance of the target device under different combinations of vibration test data and different environmental data. The noise-sensitive parameter can characterize the performance sensitivity coefficient of the target device under different combinations of noise test data and different environmental data. It can be understood that the sensitive parameter is proportional to the performance degradation rate of the target device.
[0059] In an embodiment of the present invention, the first change amount can characterize the degradation value of the performance of the target device under different environmental data and different vibration test data. The second change amount can characterize the degradation value of the performance of the target device under different environmental data and different noise test data.
[0060] Considering that in the related art, to test all combinations of N types of fans and M types of hard disks, N×M tests need to be performed, and each test requires a certain amount of time to set up the environment, run the test program, record and analyze data, etc. To solve this technical problem, the present invention performs performance testing by using the performance influence function between temperature data, vibration test data, and noise test data and the read-write performance of the mechanical hard disk. The performance test can characterize the ratio of the hard disk read-write rate under different excitation conditions to that in the reference case, and the reference case can be the read-write rate of the hard disk in the idle state or the low-load state.
[0061] For example, by performing read-write performance tests on multiple mechanical hard disks under different temperature data, different device vibration characteristics, and different device noise characteristics, the influence of temperature data, vibration test data, and noise test data on the read-write performance of the mechanical hard disk can be analyzed. A mathematical function relationship among the three is established. The read-write loss caused by different device vibration characteristics under different temperature data can be as shown in the following formula (1):
[0062] (1);
[0063] Wherein, ΔIOPS V can represent the hard disk read-write degradation value under different temperature data and different device vibration characteristics, that is, the first change amount. K VIt can be the sensitivity coefficient of the hard disk read and write performance under the combination of device vibration characteristics and temperature data, which is a function of the vibration frequency f1 and temperature T. A can represent the vibration acceleration amplitude, including the acceleration peak value. A0 can represent the vibration threshold, indicating that the hard disk vibration starts to decline when it exceeds this value.
[0064] Similarly, the read and write losses caused by different device noise characteristics at different temperatures can be shown as the following formula (2):
[0065] (2);
[0066] Among them, ΔIOPS N can represent the hard disk read and write decline value under different temperature data and different device noise characteristics, that is, the second change amount. K N It can be the sensitivity coefficient of the hard disk read and write performance under the combination of device noise characteristics and temperature data, which is a function of the noise frequency f2 and temperature T. P can represent the noise sound pressure value, and P0 can represent the noise threshold, indicating that the hard disk read and write performance starts to decline after exceeding this sound pressure value.
[0067] Furthermore, after determining the first change amount and the second change amount, the first change amount can be weighted by the first weight, and the second change amount can be weighted by the second weight to obtain the test result of the performance change amount of the device to be tested, as shown in the following formula (3):
[0068] (3);
[0069] Among them, w1 can be the first weight corresponding to the first change amount, and w2 can be the second weight corresponding to the second change amount.
[0070] For example, the temperature can be set to 40 °C, the vibration frequency of the vibration table is adjusted to 50 Hz, and the vibration acceleration amplitude is 0.1 g. A certain model of hard disk is fixed on the vibration table, and the vibration table is started to vibrate while the read and write performance of the hard disk is tested. Gradually adjust the vibration level to obtain the vibration threshold under the vibration conditions of 40 °C and 50 Hz, as well as the function of the vibration frequency f1 and temperature T. By analogy, through a large number of experiments, the noise thresholds, vibration thresholds, functions of vibration frequency and temperature, and functions of noise frequency and temperature of hard disks of different models and different manufacturers can be obtained.
[0071] According to an embodiment of the present invention, through the above performance influence function, only N tests are required to obtain the results of N×M combinations, greatly reducing the test time. The test cycle can be shortened to 1 / M of the original, improving the test efficiency. At the same time, when using the performance influence function to evaluate the combined results, when it is necessary to test new types of fans or hard disks, there is no need to make large-scale adjustments to the test process. Just incorporate the new devices into the function algorithm model and perform a small number of tests to obtain new combined results, which has strong adaptability and flexibility and can quickly respond to market demands and technological changes.
[0072] According to an embodiment of the present invention, the method further includes: determining a vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold, and the current performance data of the target device; determining a noise sensitivity parameter based on the device noise signal detected at the current moment, the noise threshold, and the current performance data.
[0073] In an embodiment of the present invention, the device vibration signal may include the vibration acceleration amplitude of the measured target device at the vibration-sensitive frequency; the device noise signal may include the sound pressure amplitude measured at the noise-sensitive frequency. The vibration sensitivity parameter may be determined based on the difference between the measured vibration acceleration amplitude of the device at the noise-sensitive frequency and the vibration threshold, and the performance degradation value of the target device. The noise sensitivity parameter may be determined based on the difference between the measured sound pressure amplitude at the vibration-sensitive frequency and the noise threshold, and the performance degradation value of the target device.
[0074] For example, respectively determine the difference between the measured vibration acceleration amplitude of the device at the vibration-sensitive frequency and the vibration threshold, and the difference between the measured sound pressure amplitude at the noise-sensitive frequency and the noise threshold; and then determine the ratio of each difference to the performance degradation value of the target device as the respective sensitivity parameter.
[0075] According to an embodiment of the present invention, determining a vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold, and the current performance data of the target device includes: determining a first difference between the device vibration signal and the vibration threshold; and determining the ratio of the first difference to the current performance data as the vibration sensitivity parameter.
[0076] In an embodiment of the present invention, the measured vibration acceleration amplitude at the current moment may be subtracted from the vibration threshold to obtain the first difference; determine the current performance data of the target device at the current moment, and then calculate the ratio of the first difference to the current performance data to obtain the vibration sensitivity parameter. Further, the vibration sensitivity parameter may be stored in the target file or the data set in cloud storage.
[0077] According to an embodiment of the present invention, based on the device noise signal detected at the current moment, the noise threshold, and the current performance data, a noise sensitivity parameter is determined, including: determining a second difference between the device noise signal and the noise threshold; and determining the ratio between the second difference and the current performance data as the noise sensitivity parameter.
[0078] In an embodiment of the present invention, the measured sound pressure amplitude at the current moment can be subtracted from the noise threshold to obtain a first difference; the current performance data of the target device at the current moment is determined, and thus the ratio between the second difference and the current performance data is calculated to obtain the noise sensitivity parameter. Further, the noise sensitivity data can be stored in a target file or a dataset in cloud storage.
[0079] For example, after the server is powered on and started, the baseboard controller can use the hard disk backplane array card to read the unique identification code of the inserted hard disk. Through the unique identification code, information such as the manufacturer and model of the hard disk can be determined, and the unique identification code of the hard disk is associated with the hard disk noise sensitivity database.
[0080] According to an embodiment of the present invention, the method further includes: determining a test sensitivity parameter of the device to be tested by using a plurality of initial frequency data and a plurality of initial amplitude data in the device data; and determining the target position information of each of the plurality of detection devices from the initial position information of each of the plurality of detection devices based on the test sensitivity parameter, the sensitivity parameter, and the parameter threshold.
[0081] In an embodiment of the present invention, the test sensitivity parameter can be obtained by pre-testing the device to be tested before the performance test to obtain the sensitivity parameter of the device to be tested under different initial position information. The parameter threshold can be used to detect the error between the test sensitivity parameter and the sensitive parameter of the actual target device. The detection device can include various sensors based on actual detection requirements, such as temperature sensors, vibration sensors, and temperature sensors, and the detection device can be arranged inside the device to be tested.
[0082] For example, sensors can be used to collect the sensitivity parameters of the device to be tested at different positions, such as temperature, vibration acceleration, noise, etc., so that the sampling rate and accuracy of the sensors meet the test requirements; thus, key feature parameters, such as temperature change rate, vibration frequency and amplitude, noise intensity, etc., are extracted from the collected data; and then the extracted feature parameters are compared with the sensitive parameters in the database by using the threshold method. If the difference between the collected parameters and the parameters in the database is within the preset threshold range, it is considered a match.
[0083] For example, at multiple candidate positions of a marker detection device, each position has a unique identifier. Data collected at each candidate position can be verified for parameter matching. If the matching conditions are met (for example, the sensitive parameters are basically consistent or the parameter thresholds meet the preset conditions), then that position is determined as a response point. Record the position information of the determined response point, including coordinates, identifiers, etc. Further, use an automated robot or robotic arm to precisely place the detection device (such as a temperature sensor, vibration sensor, noise sensor) at the determined response point, and obtain environmental data and test data in real time according to actual test requirements. It can be understood that the hard disk response point can represent the corresponding positions of the vibration sensor and noise sensor on the hard disk during testing. By the characteristics of the vibration and noise test results at this point, combined with the temperature conditions, the hard disk read / write performance can be judged.
[0084] According to an embodiment of the present invention, by matching the test sensitive parameters with the parameters in the database, the response point can be automatically determined and the detection device can be arranged, thereby improving the test efficiency and the accuracy of data collection.
[0085] According to an embodiment of the present invention, based on the test sensitive parameters, sensitive parameters, and parameter thresholds, the target position information of each of the multiple detection devices is determined from the respective initial position information of each of the multiple detection devices, including: determining the difference between the test sensitive parameters and the sensitive parameters; obtaining the target position information when the difference is less than or equal to the parameter threshold, so as to use the multiple detection devices at the target position information to obtain test data and environmental data.
[0086] In an embodiment of the present invention, the detection devices can be respectively arranged at different positions of the hard disk to perform performance tests under different frequencies and different sound pressure amplitudes, and obtain the test sensitive parameters of the device to be tested. When the obtained test sensitive parameters are basically consistent with the sensitive parameters in the database, or the parameter thresholds meet the preset conditions, the target position information is determined as the response point of the device to be tested, and the detection device is arranged at this position.
[0087] According to an embodiment of the present invention, since the signals at the target position information (response point) have high representativeness and stability, the data collected by the detection device at this position is relatively less affected by external interference factors, which can effectively reduce the measurement error and improve the credibility and reliability of the data.
[0088] According to an embodiment of the present invention, the device data includes the device identifier of the target device, the device vibration data and device vibration characteristics of the target device, the device noise data and device noise characteristics, and the generating device includes a vibration generating device and a noise generating device; controlling a plurality of generating devices to output a plurality of excitation signals based on the device data includes: controlling the vibration generating device to output a vibration excitation signal based on the device identifier and the device vibration characteristics, and controlling the noise generating device to output a noise excitation signal based on the device identifier and the device noise characteristics.
[0089] In an embodiment of the present invention, the vibration generator may be a device that emits different vibration excitation signals according to actual test requirements. The noise generator may be a device that emits different noise excitation signals according to actual test requirements. It can be understood that the types of the vibration generator and the noise generator are based on meeting the excitation signal devices in the simulation server as the standard, and the specific types are not limited herein.
[0090] In an embodiment of the present invention, the device identifier may be determined by combining the model number of the target device, the manufacturer data, and the version signal. The device vibration data may be the vibration signal directly obtained by using the vibration generator, and the device vibration characteristics may be the characteristics obtained after feature extraction of the device vibration data. The device noise data may be the noise signal directly obtained by using the noise generator, and the device noise characteristics may be the characteristics obtained after feature extraction of the device noise data.
[0091] For example, the method of using a vibration generator to generate a vibration signal with controllable frequency and amplitude may include: placing an electrodynamic shaker on a stable foundation to ensure its level and stability, connecting the output end of a function generator to the input end of a power amplifier, and connecting the output end of the power amplifier to the vibration generator; installing an acceleration sensor on the vibration tabletop to ensure that the sensor is in close contact with the tabletop, setting the required vibration signal frequency and amplitude on the function generator; turning on the power, starting the vibration generator, observing whether the signal collected by the sensor is consistent with the set value, and using a data acquisition system to monitor the vibration signal in real time, and adjusting the output of the power amplifier through a feedback control system to ensure the stability and accuracy of the vibration signal.
[0092] For example, the method of using a noise generator to generate white noise that matches the fan noise spectrum may include: extracting the key characteristics of the fan noise spectrum, such as the main frequency components, peak frequencies, and band energy distributions, etc., and then establishing a mathematical model of the fan noise spectrum according to the key characteristics; using a noise generator to generate broadband white noise with an output frequency range that meets the fan noise frequency range; and using a spectrum analyzer to monitor the spectrum of the white noise in real time, and adjusting the output signal of the noise generator to make the spectrum of the white noise match the fan noise spectrum.
[0093] According to an embodiment of the present invention, by comprehensively considering the influence of vibration data, noise data, and environmental data on the hard disk performance in the actual environment, it avoids only unilaterally considering the influence of noise or vibration, and improves the accuracy of the test results.
[0094] According to an embodiment of the present invention, the method further includes: updating the test data using an update coefficient to obtain updated test data; performing segmentation processing on the updated test data using a window function to obtain multiple segmented test data; converting the multiple segmented test data into the frequency domain to obtain frequency domain features corresponding to the test data; and obtaining device vibration characteristics and device noise characteristics based on the frequency domain features and power spectrum data determined from the frequency domain features.
[0095] In an embodiment of the present invention, the update coefficient can be used to calibrate the obtained test data. The window function can smooth the signals in the updated test data, such as a rectangular window function. The frequency domain features can be the features obtained by converting the time domain features of the segmented test data. The power spectrum data can be obtained by processing the frequency domain features. The device vibration characteristics can include vibration frequency and vibration intensity. The device noise characteristics can be the frequency distribution characteristics of the noise.
[0096] For example, update and calibrate the test data using the update coefficients corresponding to the vibration test data and the noise test data respectively to obtain updated vibration data and updated noise data; use a rectangular window to perform segmentation processing on the updated vibration data and the updated noise data respectively to obtain the spectral changes in different time periods, that is, segmented test data; perform a fast Fourier transform on the small segment signals in the segmented test data to obtain the frequency domain representation of the signals; and then calculate the power spectrum and power spectral density spectrum (Power Spectral Density, PSD) corresponding to the vibration test data and the noise test data respectively according to the frequency domain representation. By analyzing the vibration PSD spectrum, the vibration characteristics of the hard disk, such as resonance frequency, vibration intensity, etc., can be identified; by analyzing the noise PSD spectrum, the frequency distribution of the noise can be obtained, and the main noise sources and interference frequencies can be identified.
[0097] According to an embodiment of the present invention, the update coefficient includes a first update coefficient corresponding to the vibration test data; the method further includes: determining the actual amplitude corresponding to the vibration test data based on the peak value of the vibration test data; and determining the first update coefficient using the standard amplitude generated by the vibration calibration device and the actual amplitude.
[0098] In an embodiment of the present invention, the actual amplitude can be obtained by calculating the peak value or the root mean square value of the time domain signal. The standard amplitude of the vibration test data can be generated using a calibrator.
[0099] For example, a vibration calibrator is used to generate vibration signals with known frequencies and amplitudes as a standard reference, and it is ensured that the frequency range and amplitude range of the calibrator cover the measurement range of the hard disk vibration signals. A vibration sensor is used to collect vibration signals in real time and process them to obtain the actual amplitude, and then the ratio between the standard amplitude and the actual amplitude is determined as the first update coefficient.
[0100] According to an embodiment of the present invention, the update coefficient includes a second update coefficient corresponding to the noise test data; the method further includes: determining the actual sound pressure data of the noise test data based on the sampled data of the noise test data; and determining the ratio between the standard sound pressure data generated by the noise calibration device and the actual sound pressure data as the second update coefficient.
[0101] In an embodiment of the present invention, the actual sound pressure data can be obtained by calculating the noise signal acquired by the noise sensor through the root mean square method. The standard sound pressure data can be generated by a sound level calibrator.
[0102] For example, a sound level calibrator is used to generate a standard noise signal with a known sound pressure level, and the frequency range and sound pressure level range of the sound level calibrator can match the hard disk noise test requirements; a noise sensor (such as a microphone) is placed at the measurement position specified by the calibrator (at the target position information), and it is ensured that the sound field environment of the sensor and the calibrator meets the calibration requirements; the sound level calibrator is started to generate a noise signal with a standard sound pressure level, the signal output by the sensor at this time is collected using a data acquisition system, and the actual sound pressure data of the collected noise test data is calculated through the root mean square value; the ratio between the standard sound pressure data and the actual sound pressure data is used as the second update coefficient.
[0103] According to an embodiment of the present invention, considering that even for sensors of the same model, there are differences in their sensitivities. Signal calibration can determine the calibration coefficient according to the standard signal and adjust the sensor output to accurately reflect the actual vibration or noise level. Environmental factors (such as temperature, humidity, etc.) will affect the performance of the sensor. Calibration can be carried out under specific environmental conditions to compensate for the detection deviation caused by environmental factors and improve the accuracy of the test results.
[0104] Figure 3 The flowchart of another test method according to an embodiment of the present invention is shown.
[0105] As Figure 3 shown, the test method of this embodiment can be implemented through multiple devices in the test system, and the devices can include a detection device, a processor, a generating device, and a device to be tested. The test method can include operations S301 to S305.
[0106] In operation S301, a plurality of detection devices are used to detect the signals received by the target device at the current moment, which may include device noise signals and device vibration signals.
[0107] In operation S302, the processor determines sensitive parameters based on the acquired signals, preset thresholds, and the current performance data of the target device, and stores them in a dataset. The preset thresholds may include a vibration threshold and a noise threshold, and the sensitive parameters may include vibration-sensitive parameters and noise-sensitive parameters.
[0108] In operation S303, the device data of the target device is obtained from the dataset, and a plurality of generating devices are controlled based on the device data.
[0109] In operation S304, the generating device outputs an excitation signal for the test requirement to perform an excitation test on the device under test, and test data and environmental data are obtained.
[0110] In operation S305, based on the acquired sensitive parameters, test data, and environmental data, the test result of the device under test is obtained.
[0111] In another feasible embodiment, the test method may include operations S310 to S340.
[0112] In operation S310, a vibration and noise generating device is designed. For example, fan unit vibration and noise excitation tests are carried out in different types of servers to obtain a vibration and noise excitation database for different models and manufacturers of fans. A programmable vibration and noise generating device is designed to simulate the vibration and noise generated during the operation of the server fan. The generating device may include: a vibration generator, a noise generator, and a controller. The vibration generator can generate vibration signals with controllable frequencies and amplitudes, the noise generator can generate white noise matching the fan noise spectrum, and the controller can adjust the intensity of vibration and noise according to preset parameters.
[0113] In operation S320, a data acquisition device is designed. For example, a hard disk Dummy is designed, and parameters such as the size, installation characteristics, weight, and moment of inertia of the hard disk Dummy are the same as those of a real mechanical hard disk to ensure that there is no deviation in the vibration and noise transmission paths. The hard disk Dummy contains temperature sensors, vibration acceleration sensors, and noise sensors for real-time acquisition of temperature, vibration, and noise signals.
[0114] In operation S330, a mechanical hard disk read and write performance function is constructed. For example, large-scale mechanical hard disk read and write performance tests can be carried out under different temperatures, different vibration characteristics, and noise characteristics, analyze the influence of temperature data, vibration data, and noise data on the mechanical hard disk read and write performance, and establish a mathematical function relationship among the three.
[0115] In operation S340, test data is collected and processed. A server, a hard disk dummy, a vibration and noise generating device, and a signal acquisition device are deployed in a test environment. The vibration and noise generating device is powered by the server motherboard, and the control program is integrated into the baseboard controller. The sensor of the hard disk dummy is connected to the signal acquisition device. The server is started, and the vibration and noise generating device is made to emit the vibration and noise of different brands and models of fans respectively through the control program. After the hard disk dummy finishes the acquisition, it is input into the signal acquisition device. The signal acquisition device first decomposes the collected signals into features, queries the sensitivity coefficients of different hard disks through the database, and predicts the performance results of this hard disk under this fan through a prediction function. The performance results can represent the ratio of the hard disk read / write rate under different excitation conditions to that in the reference case.
[0116] Based on the above test method, the present invention also provides a test device. The following will be combined with Figure 4 to describe this device in detail.
[0117] Figure 4 The structural block diagram of the test device according to an embodiment of the present invention is shown.
[0118] As Figure 4 shown, the test device of this embodiment includes a data acquisition module 410, a signal output module 420, and a result determination module 430.
[0119] The data acquisition module 410 is used to obtain the sensitive parameters and device data corresponding to the device to be tested from the dataset, where the device to be tested is a replacement device for the target device, and the sensitive parameters characterize the influence degree of the device data on the performance of the target device. In one embodiment, the data acquisition module 410 can be used to perform the operation S210 described above, which will not be elaborated here.
[0120] The signal output module 420 is used to control a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform an excitation test on the device to be tested by using the plurality of excitation signals. In one embodiment, the signal output module 420 can be used to perform the operation S220 described above, which will not be elaborated here.
[0121] The result determination module 430 is used to obtain the test results of the device to be tested based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data. In one embodiment, the result determination module 430 can be used to perform the operation S230 described above, which will not be elaborated here.
[0122] According to an embodiment of the present invention, through the data acquisition module 410, the signal output module 420, and the result determination module 430 in the test device, by using the device data in the dataset based on different test requirements to control multiple generating devices to output different excitation signals for performing excitation tests on the device under test. Since the test data and environmental data obtained in the excitation test are used as variables and combined with the sensitive parameters corresponding to the device under test for testing, the test results substituting the physical test of the target device under different test conditions are obtained, avoiding the stability and compatibility problems in the physical hardware test process, realizing the test results of various combinations of different generating devices and different devices under test, improving the test efficiency, and reducing the test time.
[0123] According to an embodiment of the present invention, the test data includes vibration test data and noise test data; the device further includes: a vibration threshold determination module and a noise threshold determination module. The vibration threshold determination module is used to determine the vibration threshold for the vibration test data, wherein when the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device shows a decline; the noise threshold determination module is used to determine the noise threshold for the noise test data, wherein when the sound pressure amplitude of the target device is greater than or equal to the noise threshold, the performance of the target device shows a decline.
[0124] According to an embodiment of the present invention, the sensitive parameters include vibration sensitive parameters corresponding to the vibration test data and noise sensitive parameters corresponding to the noise test data; the result determination module 430 includes: a first change amount determination sub-module, a second change amount determination sub-module, and a weighting sub-module. The first change amount determination sub-module is used to determine the first change amount corresponding to the vibration test data based on the vibration sensitive parameters, the vibration test data, the vibration threshold, and the environmental data; the second change amount determination sub-module is used to determine the second change amount corresponding to the noise test data based on the noise sensitive parameters, the noise test data, the noise threshold, and the environmental data; the weighting sub-module is used to obtain the test result of the performance change amount of the device under test by weighting the first change amount with the first weight and weighting the second change amount with the second weight.
[0125] According to an embodiment of the present invention, the device further includes: a first parameter determination module and a second parameter determination module. The first parameter determination module is used to determine the vibration sensitive parameters based on the device vibration signal detected at the current moment, the vibration threshold, and the current performance data of the target device; the second parameter determination module is used to determine the noise sensitive parameters based on the device noise signal detected at the current moment, the noise threshold, and the current performance data.
[0126] According to an embodiment of the present invention, the first parameter determination module includes: a first difference determination sub-module and a parameter determination sub-module. The first difference determination sub-module is configured to determine a first difference between the device vibration signal and the vibration threshold; the parameter determination sub-module is configured to determine the ratio between the first difference and the current performance data as the vibration sensitivity parameter.
[0127] According to an embodiment of the present invention, the second parameter determination module includes: a second difference determination sub-module and a noise sensitivity parameter determination sub-module. The second difference determination sub-module is configured to determine a second difference between the device noise signal and the noise threshold; the noise sensitivity parameter determination sub-module is configured to determine the ratio between the second difference and the current performance data as the noise sensitivity parameter.
[0128] According to an embodiment of the present invention, the device further includes: a test sensitivity parameter determination module and a location information determination module. The test sensitivity parameter determination module is configured to determine the test sensitivity parameter of the device to be tested by using a plurality of initial frequency data and a plurality of initial amplitude data in the device data; the location information determination module is configured to determine the target location information of each of the plurality of detection devices from the respective initial location information of the plurality of detection devices based on the test sensitivity parameter, the sensitivity parameter, and the parameter threshold.
[0129] According to an embodiment of the present invention, the location information determination module includes: a difference determination sub-module and a data acquisition sub-module. The difference determination sub-module is configured to determine the difference between the test sensitivity parameter and the sensitivity parameter; the data acquisition sub-module is configured to obtain the target location information when the difference is less than or equal to the parameter threshold, so as to use the plurality of detection devices at the target location information to acquire test data and environmental data.
[0130] According to an embodiment of the present invention, the device data includes the device identifier of the target device, the device vibration data and vibration characteristics of the target device, the device noise data and noise characteristics of the target device, the generating device includes a vibration generating device and a noise generating device; the signal output module 420 includes: a signal output sub-module, configured to control the vibration generating device to output a vibration excitation signal based on the device identifier and the device vibration characteristics, and control the noise generating device to output a noise excitation signal based on the device identifier and the device noise characteristics.
[0131] According to an embodiment of the present invention, the device further includes: a data update module, a segmentation module, a conversion module, and a feature determination module. The data update module is configured to update the test data by using an update coefficient to obtain updated test data; the segmentation module is configured to perform segmentation processing on the updated test data by using a window function to obtain a plurality of segmented test data; the conversion module is configured to convert the plurality of segmented test data into the frequency domain to obtain the frequency domain characteristics corresponding to the test data; the feature determination module is configured to obtain the device vibration characteristics and the device noise characteristics based on the frequency domain characteristics and the power spectrum data determined from the frequency domain characteristics.
[0132] According to an embodiment of the present invention, the update coefficient includes a first update coefficient corresponding to vibration test data; the device further includes: an amplitude determination module and an update coefficient determination module. The amplitude determination module is configured to determine an actual amplitude corresponding to the vibration test data based on the peak value of the vibration test data; the update coefficient determination module is configured to determine the first update coefficient by using the standard amplitude generated by the vibration calibration device and the actual amplitude.
[0133] According to an embodiment of the present invention, the update coefficient includes a second update coefficient corresponding to noise test data; the device further includes: a sound pressure data determination module and a coefficient determination module. The sound pressure data determination module is configured to determine the actual sound pressure data of the noise test data based on the sampled data of the noise test data; the coefficient determination module is configured to determine the ratio between the standard sound pressure data generated by the noise calibration device and the actual sound pressure data as the second update coefficient.
[0134] According to an embodiment of the present invention, any plurality of modules among the data acquisition module 410, the signal output module 420, and the result determination module 430 may be combined and implemented in one module, or any one of them may be split into multiple modules. Alternatively, at least part of the functions of one or more of these modules may be combined with at least part of the functions of other modules and implemented in one module. According to an embodiment of the present invention, at least one of the data acquisition module 410, the signal output module 420, and the result determination module 430 may be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on chip, a system on a substrate, a system in a package, an application specific integrated circuit (ASIC), or any other reasonable manner of integrating or packaging circuits, etc., implemented by hardware or firmware, or implemented in any one of the three implementation manners of software, hardware, and firmware, or in an appropriate combination of any several of them. Alternatively, at least one of the data acquisition module 410, the signal output module 420, and the result determination module 430 may be at least partially implemented as a computer program module, and when the computer program module is run, it can execute the corresponding functions.
[0135] Figure 5 A block diagram of a test system according to an embodiment of the present invention is shown.
[0136] As Figure 5 shown, the test system includes: a memory 501 and a processor 101; the processor 101 is configured to execute the above test method according to the instructions and data stored in the memory 501.
[0137] The memory 501 may store different types of instructions and data. The instructions may include test instructions, data acquisition instructions, and control instructions, and the data may include sensitive parameters, device data, environmental data, test data, and test results obtained from tests.
[0138] The processor 101 may be used to perform test operations, such as obtaining sensitive parameters and device data from a dataset, controlling a generating device to output an excitation signal based on the device data, and using the excitation signal to perform an excitation test on a device under test, and then obtaining a test result based on the sensitive parameters, test data, and environmental data.
[0139] Figure 6 The block diagram of an electronic device suitable for implementing a test method according to an embodiment of the present invention is shown.
[0140] As Figure 6 shown, the electronic device according to an embodiment of the present invention includes a processor 601, which may perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 602 or a program loaded from a storage section 608 into a random access memory (RAM) 603. The processor 601 may include, for example, a general microprocessor (such as a CPU), an instruction set processor, and / or a dedicated microprocessor (such as an application specific integrated circuit (ASIC)), and so on. The processor 601 may also include on-board memory for caching purposes. The processor 601 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present invention.
[0141] In the RAM 603, various programs and data required for the operation of the electronic device are stored. The processor 601, the ROM 602, and the RAM 603 are connected to each other via a bus 604. The processor 601 performs various operations of the method flow according to an embodiment of the present invention by executing the programs in the ROM 602 and / or the RAM 603. It should be noted that the program may also be stored in one or more memories other than the ROM 602 and the RAM 603. The processor 601 may also perform various operations of the method flow according to an embodiment of the present invention by executing the programs stored in the one or more memories.
[0142] According to an embodiment of the present invention, the electronic device may further include an input / output (I / O) interface 605, and the input / output (I / O) interface 605 is also connected to the bus 604. The electronic device may further include one or more of the following components connected to the input / output (I / O) interface 605: an input portion 606 including a keyboard, a mouse, etc.; an output portion 607 including, for example, a cathode ray tube (CRT), a liquid crystal display (LCD), etc. and a speaker, etc.; a storage portion 608 including a hard disk, etc.; and a communication portion 609 including a network interface card such as a LAN card, a modem, etc. The communication portion 609 performs communication processing via a network such as the Internet. A drive 610 is also connected to the input / output (I / O) interface 605 as needed. A removable medium 611, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 610 as needed so that a computer program read therefrom is installed into the storage portion 608 as needed.
[0143] The present invention also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments; or may exist separately without being assembled into the device / apparatus / system. The above computer-readable storage medium carries one or more programs, and when the above one or more programs are executed, the method according to the embodiments of the present invention is implemented.
[0144] According to an embodiment of the present invention, the computer-readable storage medium may be a non-volatile computer-readable storage medium, for example, it may include but is not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present invention, the computer-readable storage medium may be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, device, or apparatus. For example, according to an embodiment of the present invention, the computer-readable storage medium may include the above-described ROM 602 and / or RAM 603 and / or one or more memories other than ROM 602 and RAM 603.
[0145] An embodiment of the present invention further includes a computer program product, which includes a computer program, and the computer program includes program codes for executing the method shown in the flowchart. When the computer program product runs in a computer system, the program codes are used to cause the computer system to implement the test method provided by the embodiments of the present invention.
[0146] When the computer program is executed by the processor 601, the above functions defined in the system / apparatus of the embodiments of the present invention are executed. According to an embodiment of the present invention, the above-described systems, apparatuses, modules, units, etc. can be implemented by computer program modules.
[0147] In one embodiment, the computer program can rely on tangible storage media such as optical storage devices, magnetic storage devices, etc. In another embodiment, the computer program can also be transmitted and distributed in the form of signals on a network medium, and be downloaded and installed through the communication part 609, and / or be installed from the removable medium 611. The program code included in the computer program can be transmitted by any suitable network medium, including but not limited to: wireless, wired, etc., or any suitable combination of the above.
[0148] In such an embodiment, the computer program can be downloaded and installed from the network through the communication part 609, and / or be installed from the removable medium 611. When the computer program is executed by the processor 601, the above functions defined in the system of the embodiments of the present invention are executed. According to an embodiment of the present invention, the above-described systems, devices, apparatuses, modules, units, etc. can be implemented by computer program modules.
[0149] According to an embodiment of the present invention, the program code for executing the computer program provided by the embodiments of the present invention can be written in any combination of one or more programming languages. Specifically, these computing programs can be implemented using high-level procedural and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages include but are not limited to, such as Java, C++, python, the "C" language, or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on a remote computing device, or entirely on a remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (for example, by using an Internet service provider to connect through the Internet).
[0150] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagram may represent a module, a segment of a program, or a portion of code that contains one or more executable instructions for implementing a specified logical function. It should also be noted that, in some alternative implementations, the functions noted in the blocks may occur in a different order than that noted in the accompanying drawings. For example, two consecutive blocks shown may actually be executed substantially in parallel, or they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram or flowchart, and combinations of blocks in the block diagram or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or can be implemented by a combination of dedicated hardware and computer instructions.
[0151] Those skilled in the art will appreciate that the features described in the various embodiments of the present invention can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present invention. In particular, without departing from the spirit and teachings of the present invention, the features described in the various embodiments of the present invention can be combined and / or combined in various ways. All such combinations and / or combinations fall within the scope of the present invention.
[0152] The embodiments of the present invention have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although the embodiments have been described separately above, this does not mean that the measures in the various embodiments cannot be used advantageously in combination. Without departing from the scope of the present invention, those skilled in the art can make various substitutions and modifications, and all such substitutions and modifications should fall within the scope of the present invention.
Claims
1. A testing method, characterized in that: The method comprises: Acquire sensitive parameters and device data corresponding to the device to be tested from the data set, wherein the device to be tested is a substitute device for the target device, and the sensitive parameters represent the degree of influence of the device data on the performance of the target device; Controlling a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform an excitation test on the device to be tested using the plurality of excitation signals; Based on the sensitive parameters, the test data and the environmental data acquired in the stimulus test, the test result of the device to be tested is obtained.
2. The method according to claim 1, characterized in that The test data includes vibration test data and noise test data; The method further comprises: determining a vibration threshold for the vibration test data, wherein when the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device is degraded; A noise threshold for the noise test data is determined, wherein when the sound pressure amplitude of the target device is greater than or equal to the noise threshold, the performance of the target device is degraded.
3. The method according to claim 2, characterized in that The sensitive parameters include a vibration sensitive parameter corresponding to the vibration test data and a noise sensitive parameter corresponding to the noise test data; Based on the sensitive parameters, the test data and the environmental data obtained in the stimulus test, the test results of the device to be tested are obtained, including: determining a first variation corresponding to the vibration test data based on the vibration sensitivity parameter, the vibration test data, the vibration threshold value and the environmental data; Determine a second variation corresponding to the noise test data based on the noise sensitive parameter, the noise test data, the noise threshold and the environmental data; By weighting the first variation with a first weight and weighting the second variation with a second weight, a test result for the variation of the performance of the device to be tested is obtained.
4. The method according to claim 3, characterized in that The method further comprises: Determining the vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold and current performance data of the target device; The noise sensitivity parameter is determined based on the device noise signal detected at the current moment, the noise threshold and the current performance data.
5. The method according to claim 4, characterized in that Determining the vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold and the current performance data of the target device includes: determining a first difference between the device vibration signal and the vibration threshold; A ratio between the first difference and the current performance data is determined as the vibration sensitivity parameter.
6. The method according to claim 4, characterized in that Determining the noise sensitivity parameter based on the device noise signal detected at the current moment, the noise threshold and the current performance data includes: determining a second difference between the device noise signal and the noise threshold; A ratio between the second difference and the current performance data is determined as the noise sensitive parameter.
7. The method according to claim 1, characterized in that The method further comprises: Determine the test sensitive parameters of the device to be tested by using a plurality of initial frequency data and a plurality of initial amplitude data in the device data; Based on the test sensitive parameter, the sensitive parameter and the parameter threshold, target position information of each of the multiple detection devices is determined from initial position information of each of the multiple detection devices.
8. The method according to claim 7, characterized in that Based on the test sensitive parameter, the sensitive parameter and the parameter threshold, determining the target position information of each of the plurality of detection devices from the initial position information of each of the plurality of detection devices, comprising: determining a difference between the test sensitive parameter and the sensitive parameter; The target position information is obtained when the difference is less than or equal to the parameter threshold, so as to acquire the test data and the environmental data by using the multiple detection devices located at the target position information.
9. The method according to claim 2, characterized in that: The device data includes a device identification of the target device, device vibration data and device vibration characteristics of the target device, device noise data and device noise characteristics, and the generating device includes a vibration generating device and a noise generating device; Controlling a plurality of generating devices to output a plurality of excitation signals based on the device data includes: The vibration generating device is controlled to output a vibration excitation signal based on the device identification and the device vibration characteristics, and the noise generating device is controlled to output a noise excitation signal based on the device identification and the device noise characteristics.
10. The method according to claim 9, characterized in that The method further comprises: Updating the test data using an update coefficient to obtain updated test data; Using a window function to process the update test data in segments to obtain a plurality of segmented test data; Convert the plurality of segmented test data into frequency domain to obtain frequency domain features corresponding to the test data; The device vibration feature and the device noise feature are obtained based on the frequency domain feature and the power spectrum data determined by the frequency domain feature.
11. The method according to claim 10, characterized in that The update coefficient includes a first update coefficient corresponding to the vibration test data; The method further comprises: determining an actual amplitude corresponding to the vibration test data based on a peak value of the vibration test data; The first update coefficient is determined by using a standard amplitude generated by a vibration calibration device and the actual amplitude.
12. The method according to claim 10, characterized in that The update coefficient includes a second update coefficient corresponding to the noise test data; The method further comprises: Determine actual sound pressure data of the noise test data based on the sampled data of the noise test data; The ratio between the standard sound pressure data generated by the noise calibration device and the actual sound pressure data is determined as the second update coefficient.
13. A testing system, characterized in that: include: Memory; A processor, configured to execute the method according to any one of claims 1 to 12 according to the instructions and data stored in the memory.
14. A computer-readable storage medium having a computer program or instruction stored thereon, characterized in that: When the computer program or instruction is executed by a processor, the steps of the method according to any one of claims 1 to 12 are implemented.
15. A computer program product comprising a computer program or instructions, characterized in that When the computer program or instruction is executed by a processor, the steps of the method according to any one of claims 1 to 12 are implemented.
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