Axis parallelism error detection method and related equipment

Abstract

The invention discloses a shaft parallelism error detection method and related equipment, and relates to the technical field of parallelism, and the method comprises the steps: obtaining the diameter data of a reference shaft and a to-be-detected shaft; based on the diameter data, determining a first diameter variable quantity of the reference shaft and a second diameter variable quantity of the shaft to be measured; acquiring the busbar displacement variation of the to-be-measured shaft; and determining a parallelism error between the reference axis and the to-be-measured axis based on a combination relationship among the first diameter variation, the second diameter variation and the bus displacement variation.

Description

Technical Field

[0001] The present application relates to the technical field of parallelism, and in particular to a method for detecting shaft parallelism error and related equipment. Background Art

[0002] In the field of mechanical manufacturing, parallelism error detection of shaft parts is an important link to ensure the accuracy and performance of equipment. Traditional parallelism detection methods usually rely on simple distance measurement or bubble levels. Although these methods are easy to operate, they have large errors. For example, in the prior art, parallelism is often judged by measuring the distance between the two ends of the same side of the two axes, but when the two axes are in a crossed state, the distance measurement results may be the same, leading to misjudgment. In addition, the bubble level itself may have errors, further affecting the accuracy of the test results. With the continuous improvement of precision requirements in industrial manufacturing, there is an urgent need for a method for detecting shaft parallelism errors to solve the above-mentioned problems. Summary of the invention

[0003] A series of simplified concepts are introduced in the Summary of the Invention section, which will be further described in detail in the Detailed Description of the Invention section. The Summary of the Invention section of this application does not mean to attempt to define the key features and essential technical features of the claimed technical solution, nor does it mean to attempt to determine the scope of protection of the claimed technical solution.

[0004] In a first aspect, the present application provides a method for detecting an axis parallelism error, characterized in that the method comprises:

[0005] Obtaining diameter data of the reference shaft and the shaft to be measured, wherein the diameter data includes the diameter values ​​at both ends and the middle diameter value of the reference shaft and the diameter values ​​at both ends and the middle diameter value of the shaft to be measured;

[0006] Based on the diameter data, determining a first diameter change of the reference shaft and a second diameter change of the shaft to be measured;

[0007] Obtaining the busbar displacement change of the shaft to be measured; wherein the busbar displacement change is determined based on the upper busbar displacement change and the side busbar displacement change, the upper busbar displacement change is measured by a first micrometer, and the side busbar displacement change is measured by a second micrometer;

[0008] Based on the combined relationship among the first diameter change, the second diameter change and the generatrix displacement change, the parallelism error between the reference axis and the axis to be measured is determined.

[0009] In some embodiments, determining a first diameter change of the reference shaft and a second diameter change of the shaft to be measured based on the diameter data includes:

[0010] Determine the maximum value among the differences between the diameter values at both ends and the middle diameter value of the reference axis as the first diameter change amount;

[0011] Determine the maximum value among the differences between the diameter values at both ends and the middle diameter value of the axis to be measured as the second diameter change amount.

[0012] In some embodiments, before obtaining the bus displacement change amount of the axis to be measured, the method further includes:

[0013] Set the measuring device at the preset positions of the reference axis and the axis to be measured;

[0014] Based on the leveling structure, adjust the horizontal state of the measuring device to optimize the error of the level bubble gauge.

[0015] In some embodiments, the step of adjusting the horizontal state of the measuring device includes:

[0016] Make the bubble of the level bubble gauge centered by rotating the leveling screw;

[0017] Obtain the first offset value of the level bubble gauge and the second offset value after rotating 180°;

[0018] Based on the first offset value and the second offset value, calculate the systematic error value of the level bubble gauge and the correction offset amount of the workpiece to be measured, wherein the correction offset amount is half of the difference between the second offset value and the first offset value; the systematic error value is half of the sum value of the second offset value and the first offset value;

[0019] Based on the correction offset amount, adjust the horizontal state of the measuring device.

[0020] In some embodiments, obtaining the bus displacement change amount of the axis to be measured includes:

[0021] Contact the measuring head of the first micrometer with the upper bus of the axis to be measured, and move the measuring device along the axial direction of the axis to be measured, record the change value of the pointer of the first micrometer to obtain the upper bus displacement change amount;

[0022] Contact the measuring head of the second micrometer with the side bus of the axis to be measured, and move the measuring device along the axial direction of the axis to be measured, record the change value of the pointer of the second micrometer to obtain the side bus displacement change amount.

[0023] In some embodiments, based on the combined relationship of the first diameter change amount, the second diameter change amount and the bus displacement change amount, determine the parallelism error between the reference axis and the axis to be measured, including:

[0024] When both the first diameter change amount and the second diameter change amount are less than the preset threshold, the parallelism error is the bus displacement change amount;

[0025] When the first diameter change amount or the second diameter change amount is greater than or equal to a preset threshold value, based on the first diameter change amount and the second diameter change amount, a compensation calculation is performed on the bus displacement change amount to obtain a parallelism error; wherein, the bus displacement change amount is the maximum value among the differences between the upper bus displacement change amount and the side bus displacement change amount.

[0026] In some embodiments, the preset threshold value is a threshold value determined based on the taper values of the reference axis and the axis to be measured, wherein the taper value is the value obtained by dividing the absolute value of the difference between the first diameter change amount and the second diameter change amount by the second diameter change amount.

[0027] In a second aspect, the present application provides a device for detecting the parallelism error of an axis, including:

[0028] An axis diameter data acquisition unit, configured to acquire the diameter data of the reference axis and the axis to be measured, wherein the diameter data includes the two-end diameter values and the middle diameter value of the reference axis and the two-end diameter values and the middle diameter value of the axis to be measured;

[0029] A diameter change amount determination unit, configured to determine the first diameter change amount of the reference axis and the second diameter change amount of the axis to be measured based on the diameter data;

[0030] A bus change amount acquisition unit, configured to acquire the bus displacement change amount of the axis to be measured; wherein, the bus displacement change amount is determined based on the upper bus displacement change amount and the side bus displacement change amount, the upper bus displacement change amount is measured by a first micrometer, and the side bus displacement change amount is measured by a second micrometer;

[0031] A parallelism error calculation unit, configured to determine the parallelism error between the reference axis and the axis to be measured based on the combined relationship among the first diameter change amount, the second diameter change amount, and the bus displacement change amount.

[0032] In a third aspect, an electronic device includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor is configured to implement the steps of the method for detecting the parallelism error of an axis according to any one of the first aspects when executing the computer program stored in the memory.

[0033] In a fourth aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the method for detecting the parallelism error of an axis according to any one of the first aspects is implemented.

[0034] In summary, the present application calculates the diameter change amount by obtaining the diameter data of the reference axis and the axis to be measured, combining the diameter differences at both ends and in the middle, and synchronously measures the change amount of the bus displacement with a micrometer. The parallelism error is determined by comprehensively considering the combined relationship between the diameter change and the displacement change. This method not only solves the problem that the traditional distance measurement method cannot identify the cross-axis error, but also optimizes the error compensation logic through the threshold determination of the taper value, effectively eliminating the influence of the systematic error of the level gauge and the change in the axis diameter on the detection result, and improving the accuracy and reliability of the parallelism detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] By reading the following detailed description of the preferred embodiments, various other advantages and benefits will become clear to those of ordinary skill in the art. The drawings are only for the purpose of illustrating the preferred embodiments and are not considered to be a limitation of this specification. Moreover, throughout the drawings, the same reference numerals are used to represent the same components. In the drawings:

[0036] Figure 1 is a schematic flow chart of a method for detecting the parallelism error of an axis provided by an embodiment of the present application;

[0037] Figure 2 is a schematic structural diagram of a device for measuring the parallelism of a horizontal axis provided by an embodiment of the present application;

[0038] Figure 3 is a schematic structural diagram of a device for measuring the parallelism of a vertical axis provided by an embodiment of the present application;

[0039] Figure 4 is a schematic structural diagram of a device for measuring the parallelism of an inclined axis provided by an embodiment of the present application;

[0040] Figure 5 is a first schematic diagram for error correction of a horizontal bubble level provided by an embodiment of the present application;

[0041] Figure 6 is a second schematic diagram for error correction of a horizontal bubble level provided by an embodiment of the present application;

[0042] Figure 7 is a schematic structural diagram of a device for detecting the parallelism error of an axis provided by an embodiment of the present application;

[0043] Figure 8 is a schematic structural diagram of a device for detecting the parallelism error of an axis provided by an embodiment of the present application.

[0044] Among them, Figure 2 、 Figure 3 and Figure 4 the corresponding relationship between the reference numerals and the component names in is:

[0045] 101 Bracket, 201 Level bubble, 301 Leveling structure, 401 First dial indicator, 402 Second dial indicator, 501 Axis to be measured, 601 Reference axis. Specific embodiments

[0046] In the description and claims of this application and the above-mentioned drawings, the terms "first", "second", "third", "fourth", etc. (if any) are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments described here can be implemented in an order other than those illustrated or described here. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices. The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them.

[0047] Please refer to Figure 1 , which is a schematic flowchart of a method for detecting the parallelism error of an axis provided by an embodiment of this application, and specifically may include:

[0048] S110. Obtain the diameter data of the reference axis and the axis to be measured. Among them, the diameter data includes the diameter values at both ends and the middle diameter value of the reference axis, and the diameter values at both ends and the middle diameter value of the axis to be measured;

[0049] Exemplarily, obtaining the diameter data of the reference axis and the axis to be measured is to quantify the diameter change characteristics of the axis, so as to provide basic parameters for the calculation of the parallelism error. The diameter differences between the reference axis and the axis to be measured may be caused by manufacturing errors, long-term wear or material property fluctuations, which directly affect the determination of the parallelism of the two axes. By measuring the diameter values at different positions, the diameter distribution characteristics of the axis in the length direction can be reflected, such as taper or non-uniform deformation. These characteristics directly affect the relative spatial position relationship between the two axes and are the key basis for evaluating the parallelism error.

[0050] The diameter change amounts of the reference axis and the axis to be measured reflect the geometric consistency of the axis. By comparing these data, local deformations or machining errors of the axis can be identified, and then the contribution of the diameter change to the parallelism error can be clarified. This step provides data support for subsequent error compensation by comprehensively considering the change amount of the busbar displacement, ensuring that the detection method can adapt to the actual geometric state of the axis and improving the accuracy of the parallelism determination.

[0051] S120. Determine the first diameter change of the reference axis and the second diameter change of the axis to be measured based on the diameter data;

[0052] Exemplarily, by calculating the maximum differences between the two ends and the middle diameter values of the reference axis and the axis to be measured, the first diameter change and the second diameter change are respectively determined. This process aims to quantify the local diameter fluctuation characteristics of the axis, such as the taper change caused by manufacturing deviation or long-term wear. The reference axis serves as the measurement reference, and its diameter change reflects the potential source of the system's inherent error, while the diameter change of the axis to be measured is directly related to the degree of deviation of its actual geometric shape, providing key parameters for subsequent parallelism error analysis.

[0053] By extracting the maximum difference between the two ends and the middle diameter, the non-uniform deformation or local wear characteristics of the axis can be effectively captured. This quantification method based on the diameter change can not only characterize the overall taper trend of the axis but also provide a data basis for subsequent error compensation logic, ensuring the robustness of the parallelism detection result to the axis shape change and avoiding misjudgment or missed detection caused by local size fluctuation.

[0054] S130. Obtain the busbar displacement change of the axis to be measured; wherein, the busbar displacement change is determined based on the upper busbar displacement change and the side busbar displacement change. The upper busbar displacement change is measured by the first dial indicator, and the side busbar displacement change is measured by the second dial indicator;

[0055] Exemplarily, measure the displacement changes of the upper busbar and the side busbar of the axis to be measured by the first dial indicator and the second dial indicator respectively, and comprehensively evaluate the geometric deviation of the axis in the vertical and horizontal directions. The upper busbar displacement change reflects the offset degree of the axis in the vertical plane, and the side busbar displacement change characterizes the offset trend of the axis in the horizontal plane. The combination of the two can comprehensively capture the actual shape of the axis in three-dimensional space and avoid the detection blind area caused by single-direction measurement.

[0056] The collaborative measurement design of the two dial indicators effectively solves the problem of misjudgment of parallelism caused by cross-axis or local deformation in traditional methods. By simultaneously monitoring the displacement changes of the upper and side busbars, the tilt or twist state of the axis can be more accurately identified, providing multi-dimensional data support for the precise calculation of subsequent parallelism error and ensuring the adaptability of the detection result to the complex geometric characteristics of the axis.

[0057] S140. Determine the parallelism error between the reference axis and the axis to be measured based on the combined relationship of the first diameter change, the second diameter change, and the busbar displacement change.

[0058] Exemplarily, by comprehensively considering the combined relationship between the diameter change amount and the busbar displacement change amount of the reference axis and the axis to be measured, the calculation result of the parallelism error is dynamically corrected. The first diameter change amount of the reference axis reflects its own taper or wear characteristics, and the second diameter change amount of the axis to be measured characterizes its morphological deviation. Combining the displacement change amounts of the upper and side busbars can synergistically evaluate the actual parallel state of the two axes from two dimensions of axial geometric shape and spatial offset, avoiding the limitations of single-dimension detection.

[0059] Through the correlation analysis of the diameter change amount and the displacement change amount, this method can adaptively identify the influence of the shaft diameter fluctuation on the parallelism. When the diameter change amount is significant, the displacement change amount is compensated and corrected based on the combined relationship; when the diameter change is negligible, the parallelism error is directly characterized by the displacement change amount. This logic effectively balances the superposition effect of the shaft morphological difference and the spatial offset, ensuring the robustness and accuracy of the detection result for complex working conditions.

[0060] In summary, the present application can accurately calculate the parallelism error between the two axes by obtaining the diameter data of the reference axis and the axis to be measured and combining the busbar displacement change amount. This method can not only eliminate the systematic error of the horizontal bubble level, but also perform compensation calculation on the displacement change amount according to the diameter change amount, thereby significantly improving the detection accuracy. In addition, by dealing with the relationship between the diameter change amount and the preset threshold in different cases, the accuracy of the error calculation is further optimized, realizing efficient, intuitive and low-cost detection of the shaft parallelism error.

[0061] The method proposed in the present application is applicable to the detection of the parallelism error of horizontal axes, vertical axes and inclined axes. The devices for measuring the parallelism of horizontal axes, vertical axes and inclined axes are as Figure 2 , Figure 3 and Figure 4 shown. The measuring device mainly includes a bracket 101, a horizontal bubble level 201, a leveling structure 301, a first micrometer 401, a second micrometer 402, a shaft to be measured 501 and a reference axis 601.

[0062] The bracket 101 serves as the basic support component of the entire measuring device, providing a stable installation platform for other components. Whether measuring a horizontal axis, a vertical axis or an inclined axis, the bracket 101 plays an indispensable supporting role, ensuring the relative positions of all components are stable during the entire measurement process and avoiding affecting the measurement accuracy due to shaking or displacement. When measuring a horizontal axis, the bracket 101 needs to be placed horizontally to provide a stable reference for subsequent measurements; when measuring a vertical axis, the bracket 101 should be able to firmly support the device to maintain a suitable measurement attitude with the vertical axis; when measuring an inclined axis, the bracket 101 needs to be adjusted accordingly according to the inclination angle of the axis to maintain the balance and stability of the device.

[0063] The horizontal bubble level 201 is used to judge the horizontal state of the measuring device. Before measurement, it is necessary to adjust the device with the help of the horizontal bubble level 201 to make it in a horizontal position, so as to reduce the measurement error caused by the inclination of the device. In actual operation, after placing the measuring device on the shaft, by observing the position of the bubble in the horizontal bubble level 201, the levelness of the device can be intuitively understood. If the bubble deviates from the center position, it means that the device is inclined and needs to be adjusted through the leveling structure 301. When measuring different types of shafts, the function of the horizontal bubble level 201 is the same, but during the adjustment process, it is necessary to ensure that the device is in the best measurement horizontal state according to the state of the shaft.

[0064] The leveling structure 301 is used in conjunction with the horizontal bubble level 201. By operating the leveling structure 301, the horizontal state of the measuring device can be adjusted. Common leveling structures 301 may include components such as leveling screws. By rotating the leveling screws, the local height of the device can be changed, thereby making the bubble in the horizontal bubble level 201 centered and achieving precise leveling of the measuring device. Before measuring horizontal shafts, vertical shafts, and inclined shafts, it is necessary to use the leveling structure 301 to level the device. For example, when measuring an inclined shaft, the adjustment of the leveling structure 301 is more critical, and it is necessary to overcome the influence of the inclination of the shaft to ensure that the measuring device is horizontal and provide guarantee for accurate measurement.

[0065] The first micrometer 401 and the second micrometer 402 are key components for measuring the change in the displacement of the shaft bus. The first micrometer 401 is used to measure the change in the displacement of the upper bus of the shaft 501 to be measured, and the second micrometer 402 is used to measure the change in the displacement of the side bus of the shaft 501 to be measured. During the measurement process, the measuring head of the first micrometer 401 is brought into contact with the upper bus of the shaft 501 to be measured, and the measuring device is moved along the axial direction of the shaft 501 to be measured, and the change value of the pointer of the first micrometer 401 is recorded to obtain the change in the displacement of the upper bus; similarly, the measuring head of the second micrometer 402 is brought into contact with the side bus of the shaft 501 to be measured, and the measuring device is moved along the axial direction to record the change value of the pointer of the second micrometer 402 to obtain the change in the displacement of the side bus. When measuring horizontal shafts, vertical shafts, and inclined shafts, the measurement principle of the micrometer is the same, but during the operation process, it is necessary to flexibly adjust the installation and measurement angles of the micrometer according to the position and direction of the shaft to ensure that the measuring head can accurately contact the bus and obtain accurate displacement change data.

[0066] The axis to be measured 501 is the object whose parallelism error needs to be detected, and the reference axis 601 serves as the reference for measurement. Before measurement, the diameter data of the reference axis 601 and the axis to be measured 501 need to be obtained, including the diameter values at both ends and the middle diameter value. The first diameter change amount and the second diameter change amount are calculated from these data, providing important parameters for the subsequent calculation of the parallelism error. During the entire measurement process, the relative positional relationship between the reference axis 601 and the axis to be measured 501 is the core focus of the measurement. By comprehensively analyzing their diameter change amounts and the change amount of the busbar displacement, the parallelism error between the two axes is determined. Whether it is a horizontal axis, a vertical axis, or an inclined axis measurement scenario, the measurement and calculation work are carried out around these two axes.

[0067] It should be noted that in the embodiments of the present application, the reference axis 601 and the axis to be measured 501 are cylindrical structures extending along the axial direction, and their diameter values at both ends and the middle diameter value respectively refer to three key cross-section measurement points of the shaft body in the axial extension direction. Specifically: the diameter values at both ends correspond to the diameters of the two end cross-sections of the shaft body in the axial direction, that is, the starting end and the terminating end of the shaft body in the extension direction; the middle diameter value is the diameter of the middle cross-section of the shaft body in the axial direction, located at the central position between the two ends, or generally the area near the midpoint in the axial length direction of the shaft; the measurement of the above diameter values is based on the geometric symmetry of the shaft. By obtaining the diameter differences between the two ends and the middle cross-section, the taper or local deformation characteristics of the shaft can be effectively characterized. Combining with the detection method of the present application, these data provide the basic input for calculating the diameter change amounts of the reference axis 601 and the axis to be measured 501, and then cooperate with the change amount of the busbar displacement for analysis to ensure the accurate determination of the parallelism error. This definition method takes into account the three-dimensional extension characteristics of the shaft and the scientific nature of the detection logic, and is applicable to the multi-scenario detection requirements of horizontal, vertical, and inclined axes.

[0068] When using this device to detect the parallelism error of the shaft, first place the measuring device on the reference axis 601 and the axis to be measured 501 of the workpiece to be measured, and use the leveling structure 301 combined with the spirit level 201 to adjust the device to a horizontal state. Then obtain the diameter data of the reference axis 601 and the axis to be measured 501, and calculate their respective diameter change amounts. Then measure the change amounts of the upper busbar and the side busbar displacements of the axis to be measured 501 through the first micrometer 401 and the second micrometer 402 respectively. Finally, according to the combined relationship between the diameter change amount and the busbar displacement change amount, determine the parallelism error between the reference axis 601 and the axis to be measured 501. Through such a complete device structure and detection method, the drawbacks of the traditional measurement method can be effectively solved, the accuracy and reliability of the shaft parallelism error detection can be improved, and the requirements for high-precision measurement in industrial manufacturing can be met.

[0069] In some examples, based on the diameter data, determining the first diameter change amount of the reference axis and the second diameter change amount of the axis to be measured includes:

[0070] Determine the maximum value among the differences between the diameter values at both ends and the middle diameter value of the reference axis as the first diameter change amount;

[0071] Determine the maximum value among the differences between the diameter values at both ends and the middle diameter value of the axis to be measured as the second diameter change amount.

[0072] Exemplarily, obtain the diameter values at both ends (i.e., the diameters of the starting end and the terminating end in the axial extension direction) and the middle diameter value (i.e., the diameter of the axial central cross-section) of the reference axis 601. By calculating the differences between the diameter values at both ends and the middle diameter value of the reference axis 601, and selecting the maximum value among the differences as the first diameter change amount. This logic is based on the assumption of the geometric symmetry of the axis, and the maximum value reflects the local maximum diameter deviation of the reference axis 601 due to manufacturing errors, long-term wear, or material deformation during axial extension. Similarly, perform the same operation on the axis to be measured 501, calculate the differences between its diameter values at both ends and the middle diameter value, and select the maximum value as the second diameter change amount.

[0073] The core principle of selecting the maximum difference as the diameter change amount lies in: in the actual use scenario of the axis, local deformation or wear often exhibits non-uniform distribution characteristics. For example, during long-term loading, significant wear may occur at one end of the reference axis 601, while the middle region remains relatively stable. By capturing the maximum difference between the diameters at both ends and the middle, the overall taper trend of the axis or the extreme situation of local defects can be effectively characterized, avoiding masking key deviations due to averaging. In addition, the selection of the maximum value ensures the coverage of the most adverse working conditions in the subsequent parallelism error calculation, thereby improving the robustness of the detection results.

[0074] In some instances, before obtaining the change amount of the generatrix displacement of the axis to be measured, the method further includes:

[0075] Set the measuring device at the preset positions of the reference axis and the axis to be measured;

[0076] Based on the leveling structure, adjust the horizontal state of the measuring device to optimize the error of the spirit level.

[0077] Among them, the step of adjusting the horizontal state of the measuring device includes:

[0078] Make the bubble of the spirit level centered by rotating the leveling screw;

[0079] Obtain the first offset value of the spirit level and the second offset value after rotating 180°;

[0080] Based on the first offset value and the second offset value, calculate the systematic error value of the spirit level and the correction offset amount of the workpiece to be measured. Among them, the correction offset amount is half of the difference between the second offset value and the first offset value; the systematic error value is half of the sum of the second offset value and the first offset value;

[0081] Adjust the horizontal state of the measuring device based on the calibration offset.

[0082] Exemplarily, during the detection of the shaft parallelism error, the adjustment of the horizontal state of the measuring device is an important prerequisite for obtaining the accurate change amount of the busbar displacement. Since the levelness of the measuring device directly affects the accuracy of the measurement result, if the measuring device itself is tilted, it will cause the measured change amount of the busbar displacement to include the error caused by the tilt of the device, thereby affecting the accuracy of the shaft parallelism error detection. Therefore, before obtaining the change amount of the busbar displacement of the shaft 501 to be measured, the measuring device needs to be set at the preset positions of the reference shaft 601 and the shaft 501 to be measured, and the horizontal state of the measuring device is adjusted based on the leveling structure 301 to optimize the error of the level bubble instrument 201.

[0083] When specifically adjusting the horizontal state of the measuring device, first rotate the leveling screw to preliminarily center the bubble of the level bubble instrument 201. At this time, the measuring device is in an approximately horizontal state. Then, obtain the first offset value a of the level bubble instrument 201 and the second offset value b after rotating 180°. Since the level bubble instrument 201 may have its own systematic error, these two measurements can distinguish the tilt of the measuring device (i.e., the offset of the workpiece to be measured) and the systematic error of the level bubble instrument 201 itself. Based on the first offset value a and the second offset value b, according to a specific calculation method, that is, the calibration offset X is half of the difference between the second offset value b and the first offset value a, and the systematic error value Y is half of the sum of the second offset value b and the first offset value a, to calculate the systematic error value of the level bubble instrument 201 and the calibration offset of the workpiece to be measured respectively. If the positive value area of the reading part of the level bubble instrument 201 is specified on the right side of the level bubble instrument 201, then the right deviation of the bubble is positive and the left deviation of the bubble is negative, and a, b, X, and Y are integers.

[0084] As Figure 5 and Figure 6 shown, they are respectively the first schematic diagram and the second schematic diagram of the error correction of the level bubble instrument of the present application; in Figure 5In an example, during the first measurement, the bubble of the level gauge is deflected 1 grid to the right (i.e., the first offset value a = +1). After rotating 180° in place, during the second measurement, the bubble is deflected 3 grids to the left (i.e., the second offset value b = 3). Based on the values in the positive value region, positive and negative numbers are determined. Then, the correction offset X = (b - a) / 2 = (3 - 1) / 2 = 1 grid, and the systematic error value Y = (b + a) / 2 = (3 + 1) / 2 = 2 grids. The calculation result shows that the right side of the workpiece to be measured is 1 grid higher, and the level gauge 201 itself has a systematic error of 2 grids. Based on the correction offset X, the leveling structure 301 is adjusted to move the bubble of the level gauge 201 by |X| grids in the opposite direction. For example, if X = 1 grid (it is necessary to correct 1 grid to the right), that is, after rotating 180° in place, the bubble moves 1 grid to the right (negative value direction), and the two surfaces of the workpiece to be measured are parallel. At this time, the horizontal state of the device is calibrated.

[0085] Similarly, in Figure 6 In an example, during the first measurement, the bubble of the level gauge is deflected 3 grids to the right (i.e., the first offset value a = +3). After rotating 180° in place, during the second measurement, the bubble is deflected 1 grid to the right (i.e., the second offset value b = -1). Then, the correction offset X = (b - a) / 2 = (-1 - 3) / 2 = -2 grids, and the systematic error value Y = (b + a) / 2 = (-1 + 3) / 2 = 1 grid. The calculation result shows that the left side of the workpiece to be measured is 2 grids higher, and the level gauge 201 itself has a systematic error of 1 grid. Based on the correction offset X, the leveling structure 301 is adjusted to move the bubble of the level gauge 201 by |X| grids in the opposite direction. For example, if X = -2 grids (it is necessary to correct 2 grids to the left), that is, after rotating 180° in place, the bubble moves 2 grids to the left (positive value direction), and the two surfaces of the workpiece to be measured are parallel. At this time, the horizontal state of the device is calibrated.

[0086] Finally, based on the calculated correction offset, the horizontal state of the measuring device is further adjusted. By adjustment, the levelness of the measuring device is optimized, and the error caused by the inclination of the device is eliminated, so that the change amount of the generatrix displacement of the shaft 501 to be measured obtained by the first micrometer 401 and the second micrometer 402 subsequently is more accurate and reliable, providing a guarantee for accurately calculating the shaft parallelism error.

[0087] In some examples, obtaining the change amount of the generatrix displacement of the shaft to be measured includes:

[0088] Bring the measuring head of the first micrometer into contact with the upper generatrix of the shaft to be measured, and move the measuring device along the axial direction of the shaft to be measured, record the change value of the pointer of the first micrometer, and obtain the change amount of the upper generatrix displacement;

[0089] Bring the measuring head of the second micrometer into contact with the side generatrix of the shaft to be measured, and move the measuring device along the axial direction of the shaft to be measured, record the change value of the pointer of the second micrometer, and obtain the change amount of the side generatrix displacement.

[0090] Exemplarily, the parallelism condition of the shaft is not only affected by the change in its own diameter, but is also closely related to the position change of the generatrix. The change amount of the generatrix displacement can directly reflect the position difference between the shaft 501 to be measured and the reference shaft 601 in the generatrix direction. Before obtaining this change amount, the measuring device has been placed at the preset positions on the reference shaft 601 and the shaft 501 to be measured, and the leveling structure 301 and the spirit level 201 are used to optimize the horizontal state of the measuring device, eliminating the interference of the device tilt on the measurement result and creating conditions for the accurate measurement of the generatrix displacement change amount.

[0091] The first dial indicator 401 and the second dial indicator 402 are the key tools for obtaining the generatrix displacement change amount. When the measuring head of the first dial indicator 401 contacts the upper generatrix of the shaft 501 to be measured and the measuring device is moved along the axial direction of the shaft 501 to be measured, if there is a shape error in the upper generatrix of the shaft 501 to be measured, or the relative position in the vertical direction with the reference shaft 601 is not ideally parallel, the pointer of the first dial indicator 401 will swing accordingly, and the change value of the pointer represents the displacement condition of the upper generatrix during the measurement process, that is, the upper generatrix displacement change amount. Similarly, for the second dial indicator 402, when its measuring head contacts the side generatrix of the shaft 501 to be measured and the measuring device is moved along the axial direction, by recording the change value of its pointer, the side generatrix displacement change amount can be obtained, and this value reflects the displacement change of the side generatrix of the shaft 501 to be measured relative to the ideal state in the horizontal direction.

[0092] These generatrix displacement change amounts obtained through the dial indicator, in cooperation with the previously obtained first diameter change amount of the reference shaft 601 and the second diameter change amount of the shaft 501 to be measured, are comprehensively considered from the diameter dimension and the generatrix dimension of the shaft, and can comprehensively and accurately judge the parallelism condition between the reference shaft 601 and the shaft 501 to be measured. This multi-dimensional combined analysis method avoids the errors that may occur when judging based on single-dimensional data, improves the accuracy and reliability of the shaft parallelism error detection, and meets the strict requirements for high-precision shaft parallelism detection in industrial production.

[0093] In some instances, based on the combined relationship of the first diameter change amount, the second diameter change amount, and the generatrix displacement change amount, determining the parallelism error between the reference shaft and the shaft to be measured includes:

[0094] When both the first diameter change amount and the second diameter change amount are less than the preset threshold, the parallelism error is the generatrix displacement change amount;

[0095] When the first diameter change or the second diameter change is greater than or equal to a preset threshold, based on the first diameter change and the second diameter change, a compensation calculation is performed on the bus displacement change to obtain a parallelism error; wherein, the bus displacement change is the maximum value of the difference between the upper bus displacement change and the side bus displacement change; the preset threshold is a threshold determined based on the taper values of the reference axis and the axis to be measured, where the taper value is the absolute value of the difference between the first diameter change and the second diameter change divided by the value of the second diameter change.

[0096] Exemplarily, in the method for detecting the parallelism error of an axis in the present application, the determination of the parallelism error f is based on the combined relationship of the first diameter change ΔJ1 of the reference axis 601, the second diameter change ΔD1 of the axis 501 to be measured, and the bus displacement change Δ1, and specifically includes:

[0097] When both the first diameter change and the second diameter change are less than the preset threshold, it means that the diameter changes of the reference axis 601 and the axis 501 to be measured are very small, and the taper of the axis is also very small, that is, when the taper = |first diameter change - second diameter change| ÷ second diameter change ≤ 1 / 100, the influence of the diameter change on the parallelism can be ignored. At this time, the bus displacement change can more accurately reflect the parallelism between the two axes, so the parallelism error is equal to the bus displacement change, that is, the parallelism error f between the two axes is equal to the measured value Δ1 (the measured value Δ1 here is understood as the bus displacement change), denoted as f = Δ1. For example, if it is measured and calculated that both the first diameter change and the second diameter change are extremely small, satisfying the condition that the taper is less than or equal to 1 / 100, and the bus displacement change measured by the first dial indicator 401 and the second dial indicator 402 is 0.05 mm, then the parallelism error between the two axes at this time is 0.05 mm.

[0098] When the first diameter change or the second diameter change is greater than or equal to the preset threshold, it indicates that the diameter change of the axis is relatively large, and its influence on the parallelism cannot be ignored. It is necessary to perform a compensation calculation on the bus displacement change based on the first diameter change and the second diameter change to obtain an accurate parallelism error. The specific compensation calculation method is divided into single-axis diameter change, two-axis diameter coordinated change, and two-axis diameter reverse change according to different situations of the diameter changes of the two axes.

[0099] In the case of a single-axis diameter change, it includes:

[0100] If the diameter of the axis 501 to be measured does not change, while the diameter of the reference axis 601 becomes larger or smaller, the parallelism error value between the two axes is equal to the measured value plus or minus half of the increase or decrease value of the diameter of the reference positioning axis, expressed as:

[0101] f = Δ1 ± J1 / 2

[0102] For example, if the change in the busbar displacement is 0.08 mm and the diameter of the reference axis 601 increases by 0.02 mm, then the parallelism error f = 0.08 + 0.02 / 2 = 0.09 mm.

[0103] If the diameter of the reference axis 601 does not change, while the diameter of the axis under test 501 increases or decreases, the parallelism error value between the two axes is equal to the measured value minus or plus half of the increase or decrease value of the diameter of the axis under test, expressed as:

[0104]

[0105] For example, if the change in the busbar displacement is 0.1 mm and the diameter of the axis under test 501 decreases by 0.03 mm, then the parallelism error f = 0.1 + 0.03 / 2 = 0.115 mm.

[0106] In the case where both the diameter of the reference axis 601 and the diameter of the axis under test 501 change, including:

[0107] If the diameters of the reference axis 601 and the axis under test 501 increase or decrease by equal values simultaneously, the parallelism error value between the two axes is equal to the maximum value of the change in the measured value, expressed as f = Δ1.

[0108] If the increase value of the diameter of the reference axis 601 is greater than the increase value of the diameter of the axis under test 501, the parallelism error between the two axes is equal to the measured value plus half of the difference between the increase value of the diameter of the reference axis 601 and the increase value of the diameter of the axis under test 501, expressed as f = Δ1 + (ΔJ1 - ΔD1) / 2.

[0109] If the increase value of the diameter of the reference axis 601 is less than the increase value of the diameter of the axis under test 501, the parallelism error between the two axes is equal to the measured value minus half of the difference between the increase value of the diameter of the axis under test 501 and the increase value of the diameter of the reference axis 601, expressed as f = Δ1 - (ΔD1 - ΔJ1) / 2.

[0110] In the case where the reference axis 601 increases or decreases, while the diameter of the axis under test 501 decreases or increases, including:

[0111] If the reference axis 601 increases or decreases, while the diameter of the axis under test 501 decreases, the parallelism error value between the two axes is equal to the measured value plus or minus half of the sum of the increase or decrease of the reference axis 601 and the decrease or increase value of the diameter of the axis under test 501, expressed as f = Δ1 ± (ΔJ1 + ΔD1) / 2.

[0112] If the reference axis 601 increases or decreases, while the diameter of the axis under test 501 increases, the parallelism error value between the two axes is equal to the measured value plus or minus half of the difference between the increase or decrease of the reference axis 601 and the decrease or increase value of the diameter of the axis under test 501, expressed as f = Δ1 ± (ΔJ1 - ΔD1) / 2.

[0113] Please refer to Figure 7, which is a schematic structural diagram of a detection device for the axial parallelism error provided by an embodiment of the present application, including:

[0114] An axial diameter data acquisition unit 21, configured to acquire the diameter data of a reference axis and a to-be-tested axis, where the diameter data includes the two-end diameter values and the middle diameter value of the reference axis, and the two-end diameter values and the middle diameter value of the to-be-tested axis;

[0115] A diameter change amount determination unit 22, configured to determine a first diameter change amount of the reference axis and a second diameter change amount of the to-be-tested axis based on the diameter data;

[0116] A generatrix change amount acquisition unit 23, configured to acquire the generatrix displacement change amount of the to-be-tested axis; wherein, the generatrix displacement change amount is determined based on the upper generatrix displacement change amount and the side generatrix displacement change amount, the upper generatrix displacement change amount is measured by a first micrometer, and the side generatrix displacement change amount is measured by a second micrometer;

[0117] A parallelism error calculation unit 24, configured to determine the parallelism error between the reference axis and the to-be-tested axis based on the combined relationship of the first diameter change amount, the second diameter change amount, and the generatrix displacement change amount.

[0118] Please refer to Figure 8 , an embodiment of the present application further provides an electronic device 300, including a memory 310, a processor 320, and a computer program 311 stored on the memory 310 and executable on the processor. When the processor 320 executes the computer program 311, the steps of any method of the detection device for the axial parallelism error are implemented.

[0119] Since the electronic device introduced in this embodiment is the device adopted for implementing a detection device for the axial parallelism error in an embodiment of the present application, based on the method introduced in the embodiment of the present application, those skilled in the art can understand the specific implementation manners and various variations of the electronic device in this embodiment. Therefore, the specific implementation of how this electronic device implements the method in the embodiment of the present application will not be described in detail here. As long as the device adopted by those skilled in the art to implement the method in the embodiment of the present application belongs to the scope protected by the present application.

[0120] In a specific implementation process, when the computer program 311 is executed by the processor, it can implement any implementation manner in the corresponding embodiment of the first aspect.

[0121] It should be noted that in the above embodiments, the descriptions of each embodiment have their own emphases. For the parts not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0122] Those skilled in the art should understand that the embodiments of the present application can provide a method, a system, or a computer program product. Therefore, the present application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-readable storage media (including but not limited to disk memory, CD-ROM, optical memory, etc.) that contain computer-readable program code.

[0123] The present application is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to the embodiments of the present application. It should be understood that each flow and / or block in the flowchart and / or block diagram can be implemented by computer program instructions, and the combination of the flows and / or blocks in the flowchart and / or block diagram can also be implemented. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded computer, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the functions specified in one Figure 1 flow or multiple flows and / or blocks Figure 1 or multiple blocks.

[0124] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory generate a manufactured article including instruction means, and the instruction means implements the functions specified in one Figure 1 flow or multiple flows and / or blocks Figure 1 or multiple blocks.

[0125] These computer program instructions can also be loaded onto a computer or other programmable data processing device, so that a series of operation steps are executed on the computer or other programmable device to generate a computer-implemented process. Thus, the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one Figure 1 flow or multiple flows and / or blocks Figure 1 or multiple blocks.

[0126] The embodiments of the present application also provide a computer program product, which includes computer software instructions. When the computer software instructions run on a processing device, the processing device is caused to execute Figure 1 the process of a method for detecting the axial parallelism error in a corresponding embodiment.

[0127] A computer program product includes one or more computer instructions. When the computer instructions are loaded and executed on a computer, they implement all or part of the processes or functions in accordance with the embodiments of the present application. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center in a wired or wireless manner. The computer-readable storage medium may be any available medium that can be stored by a computer or a data storage device such as a server or data center that includes one or more integrated available media. The available medium may be a magnetic medium, an optical medium, or a semiconductor medium, etc.

[0128] Those skilled in the art can clearly understand that for the convenience and conciseness of description, the specific working processes of the systems, devices, and units described above can refer to the corresponding processes in the foregoing method embodiments and will not be elaborated herein.

[0129] In several embodiments provided in the present application, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other may be through some interfaces, and the indirect couplings or communication connections of devices or units may be in electrical, mechanical, or other forms.

[0130] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0131] In addition, the functional units in various embodiments of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware and / or software functional units.

[0132] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to enable a computer device to execute all or part of the steps of the methods in various embodiments of this application. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, read-only memories, magnetic disks, or optical discs.

[0133] The above embodiments are only used to illustrate the technical solutions of this application, rather than to limit them; although this application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of various embodiments of this application.

[0134] Although the preferred embodiments of this specification have been described, those skilled in the art can make additional changes and modifications once they know the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of this specification.

[0135] Obviously, those skilled in the art can make various changes and deformations to this specification without departing from the spirit and scope of this specification. Thus, if these modifications and deformations of this specification fall within the scope of the claims of this specification and their equivalent technologies, this specification also intends to include these changes and deformations.

Claims

1. A method for detecting axis parallelism error, characterized in that: The method comprises: Obtaining diameter data of a reference shaft and a shaft to be measured, wherein the diameter data includes diameter values ​​at both ends and a middle diameter value of the reference shaft and diameter values ​​at both ends and a middle diameter value of the shaft to be measured; Based on the diameter data, determining a first diameter change of the reference shaft and a second diameter change of the shaft to be measured; Obtaining the busbar displacement change of the shaft to be measured; wherein the busbar displacement change is determined based on the upper busbar displacement change and the side busbar displacement change, the upper busbar displacement change is measured by a first micrometer, and the side busbar displacement change is measured by a second micrometer; Based on the combined relationship between the first diameter change, the second diameter change and the generatrix displacement change, the parallelism error between the reference axis and the axis to be measured is determined.

2. The method according to claim 1, characterized in that The step of determining a first diameter change of the reference shaft and a second diameter change of the shaft to be measured based on the diameter data comprises: The maximum value of the difference between the diameter values ​​at both ends and the middle diameter value of the reference shaft is determined as the first diameter variation; The maximum value of the difference between the diameter values ​​at both ends and the middle diameter value of the shaft to be measured is determined as the second diameter change.

3. The method according to claim 1, characterized in that Before obtaining the generatrix displacement variation of the axis to be measured, the method further includes: Setting the measuring device at the preset positions of the reference axis and the axis to be measured; Based on the leveling structure, the horizontal state of the measuring device is adjusted to optimize the error of the level bubble meter.

4. The method according to claim 3, characterized in that The step of adjusting the horizontal state of the measuring device comprises: Center the bubble of the level bubble gauge by rotating the leveling screw; Obtaining a first offset value of the level bubble gauge and a second offset value after rotating 180°; Based on the first offset value and the second offset value, a system error value of the level bubble meter and a correction offset of the workpiece to be measured are calculated, wherein the correction offset is half of the difference between the second offset value and the first offset value; and the system error value is half of the sum of the second offset value and the first offset value; Based on the correction offset, the levelness of the measuring device is adjusted.

5. The method according to claim 3, characterized in that: The step of obtaining the displacement change of the generatrix of the axis to be measured comprises: The measuring head of the first micrometer is brought into contact with the upper generatrix of the shaft to be measured, and the measuring device is moved along the axial direction of the shaft to be measured, and the change value of the pointer of the first micrometer is recorded to obtain the displacement change of the upper generatrix; The measuring head of the second micrometer is brought into contact with the lateral busbar of the shaft to be measured, and the measuring device is moved along the axial direction of the shaft to be measured, and the change value of the pointer of the second micrometer is recorded to obtain the displacement change of the lateral busbar.

6. The method according to claim 1, characterized in that The determining of the parallelism error between the reference axis and the axis to be measured based on the combined relationship among the first diameter change, the second diameter change and the generatrix displacement change comprises: When the first diameter change and the second diameter change are both less than a preset threshold, the parallelism error is the generatrix displacement change; When the first diameter change or the second diameter change is greater than or equal to the preset threshold, a compensation calculation is performed on the busbar displacement change based on the first diameter change and the second diameter change to obtain a parallelism error; The busbar displacement change is the maximum value of the difference between the upper busbar displacement change and the side busbar displacement change.

7. The method according to claim 6, characterized in that The preset threshold is a threshold determined based on the taper values ​​of the reference shaft and the shaft to be measured, wherein the taper value is the absolute value of the difference between the first diameter change and the second diameter change divided by the second diameter change.

8. A device for detecting shaft parallelism error, characterized in that: include: A shaft diameter data acquisition unit, used to acquire diameter data of a reference shaft and a shaft to be measured, wherein the diameter data includes diameter values ​​at both ends and a middle diameter value of the reference shaft and diameter values ​​at both ends and a middle diameter value of the shaft to be measured; a diameter change determination unit, which determines a first diameter change of the reference shaft and a second diameter change of the shaft to be measured based on the diameter data; A busbar displacement acquisition unit, used to acquire the busbar displacement variation of the axis to be measured; wherein the busbar displacement variation is determined based on the upper busbar displacement variation and the side busbar displacement variation, the upper busbar displacement variation is measured by a first micrometer, and the side busbar displacement variation is measured by a second micrometer; The parallelism error calculation unit determines the parallelism error between the reference axis and the axis to be measured based on the combined relationship between the first diameter change, the second diameter change and the generatrix displacement change.

9. An electronic device, comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor is used to implement the steps of the method for detecting shaft parallelism error as described in any one of claims 1 to 7 when executing the computer program stored in the memory.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for detecting shaft parallelism error according to any one of claims 1 to 7 is implemented.

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