Electronic equipment lighting test method, device and system

Abstract

The embodiment of the invention provides an electronic equipment lighting test method, device and system, and relates to the technical field of test.The method comprises the steps that when an Ethernet port corresponding to each LED lamp is in a UP state after enabling operation, the first level state of a pin of the LED lamp is collected, and the first level state of the pin of the LED lamp is obtained; determining a first preset state of a pin of the LED lamp when the Ethernet port is enabled and is in a UP state, and determining a preset rate configured by the LED lamp corresponding to the Ethernet port when the first level state is consistent with the first preset state, and when the flow exists in the Ethernet port and the flicker frequency of the LED lamp is consistent with the preset rate when the high-low level change exists in the preset time period, determining that the lighting function test of the tested electronic equipment passes. The on-off state of the LED is judged by collecting the level state, the on-off state of the LED is judged through the level signal high-low change frequency, and the measurement precision is higher.

Description

Technical Field

[0001] The present invention relates to the field of testing technologies, and in particular, to a method, device, and system for testing the lighting of an electronic device. Background Art

[0002] Common electronic devices, such as switches and routers, mostly use LED lights to display the operating status of ports.

[0003] Currently, the testing method for the LEDs of electronic devices mainly tests by manual verification and visual observation, which is not only inefficient but also extremely prone to missed testing. Moreover, the status of the LEDs is closely related to the software and hardware of the electronic device, and the frequently updated software and hardware versions during the product testing phase may all cause abnormal LED status. Therefore, there is an urgent need for an automated testing method. Summary of the Invention

[0004] The purpose of the present invention is to provide a method, device, and system for testing the lighting of an electronic device, which can improve the accuracy of the lighting test.

[0005] To achieve the above purpose, the technical solutions adopted in the embodiments of the present invention are as follows:

[0006] In a first aspect, an embodiment of the present invention provides a method for testing the lighting of an electronic device, the method including:

[0007] For each LED light, when the Ethernet port corresponding to each LED light is in the UP state after enabling the operation on the Ethernet port, collect the first level state of the pin of the LED light, where each LED light is correspondingly set with each IO port of the electronic device under test, each IO port is used to transmit a driving signal to the corresponding LED light, and each LED light is correspondingly set with each Ethernet port;

[0008] Obtain the first preset state of the pin of the LED light corresponding to when the Ethernet port is in the UP state;

[0009] When the first level state is consistent with the first preset state, determine the preset rate configured for the Ethernet port corresponding to the LED light;

[0010] When there is traffic on the Ethernet port and the LED light has high and low level changes within a preset time period, collect the flashing frequency of the LED light;

[0011] When the flashing frequency is consistent with the preset rate, determine that the lighting function test of the electronic device under test passes.

[0012] In an alternative embodiment, the method further includes:

[0013] For each of the LED lights, when the Ethernet port corresponding to each LED light is in the down state after performing a shutdown operation on the Ethernet port, collect the second level state of the pins of the LED light.

[0014] Obtain the second preset state of the pins of the LED light corresponding to when the Ethernet port is in the down state.

[0015] When the second level state is consistent with the second preset state, return to the step of determining the preset rate of the Ethernet port configuration corresponding to the LED light.

[0016] In an alternative embodiment, the method further includes:

[0017] When the first level state is inconsistent with the first preset state, it is determined that the lighting function test of the DUT fails.

[0018] In an alternative embodiment, the method further includes:

[0019] When the second level state is inconsistent with the second preset state, it is determined that the lighting function test of the DUT fails.

[0020] In an alternative embodiment, the DUT further includes a PHY unit or a MAC unit, and the PHY unit or the MAC unit is connected to the CPLD module. The method includes:

[0021] Control the PHY unit or the MAC unit to send serial signals of each LED light.

[0022] Control the CPLD to split the serial signal to obtain each sub-signal.

[0023] Transmit each sub-signal to the IO port corresponding to the corresponding LED light so that the sub-signal drives the corresponding LED light.

[0024] In an alternative embodiment, the step of determining that the LED light test passes when the rate is consistent with the preset rate includes:

[0025] When the rate is consistent with the preset rate, it is determined that the hardware design and software program tests of the DUT pass.

[0026] In a second aspect, an embodiment of the present invention provides an electronic device lighting test device, and the device includes:

[0027] A collection module, configured to collect the first level state of the pins of each LED lamp when the Ethernet port corresponding to each LED lamp is in the UP state after enabling the Ethernet port corresponding to each LED lamp. Each of the LED lamps is correspondingly set with each IO port of the electronic device under test, and each of the IO ports is used to transmit a driving signal to the corresponding LED lamp. Each of the LED lamps is correspondingly set with each Ethernet port;

[0028] An acquisition module, configured to acquire the first preset state of the pins of the corresponding LED lamp when the Ethernet port is in the UP state; when the first level state is consistent with the first preset state, determine the preset rate configured for the Ethernet port corresponding to the LED lamp;

[0029] The collection module is further configured to: collect the blinking frequency of the LED lamp when there is traffic on the Ethernet port and the LED lamp has high and low level changes within a preset time period;

[0030] A test module, configured to determine that the lighting function test of the electronic device under test passes when the blinking frequency is consistent with the preset rate.

[0031] In a third aspect, an embodiment of the present invention provides an electronic device lighting test system, which includes an electronic device under test and a test device, and an acquisition circuit is provided on the electronic device under test;

[0032] The test device sends a control instruction to the electronic device under test to make the Ethernet port corresponding to each LED lamp of the electronic device under test in the UP state;

[0033] The test device collects the first level state of the pins of each LED lamp of the electronic device under test, and acquires the first preset state of the pins of the corresponding LED lamp when the Ethernet port is in the UP state. When the first level state is consistent with the first preset state, the test device sends test data to the electronic device under test to make there be traffic on the Ethernet port corresponding to each LED lamp of the electronic device under test and the LED lamp have high and low level changes within a preset time period, determine the preset rate configured for the Ethernet port corresponding to the LED lamp of the electronic device under test and the blinking frequency of the LED lamp, and determine that the lighting function test of the electronic device under test passes when the blinking frequency is consistent with the preset rate.

[0034] The present invention has the following beneficial effects:

[0035] In the present invention, for each LED lamp, after enabling the Ethernet port corresponding to each LED lamp and when the Ethernet port is in the UP state, the first level state of the pins of the LED lamp is collected. Among them, each LED lamp is correspondingly set with each IO port of the electronic device under test, and each IO port is used to transmit a driving signal to the corresponding LED lamp. Each LED lamp is correspondingly set with each Ethernet port, and the first preset state of the pins of the LED lamp when the Ethernet port is in the UP state is obtained. When the first level state is consistent with the first preset state, the preset rate configured for the Ethernet port corresponding to the LED lamp is determined. When there is traffic on the Ethernet port and there are high and low level changes in the LED lamp within a preset time period, the flashing frequency of the LED lamp is collected. When the flashing frequency is consistent with the preset rate, it is determined that the lighting function test of the electronic device under test passes. By collecting the level state to judge the on / off state of the LED, and using the high and low change frequency of the level signal to judge the on / off state of the LED. Compared with using a light sensor or a camera to collect the LED state, the measurement accuracy is higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the drawings required for the embodiments. It should be understood that the following drawings only show some embodiments of the present invention, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0037] Figure 1 It is a block diagram of the test device provided by the embodiment of the present invention;

[0038] Figure 2 It is one of the flow diagrams of the method for testing the lighting of an electronic device provided by the embodiment of the present invention;

[0039] Figure 3 It is a block diagram of the electronic device lighting test system provided by the embodiment of the present invention;

[0040] Figure 4 It is the second of the flow diagrams of the method for testing the lighting of an electronic device provided by the embodiment of the present invention;

[0041] Figure 5 It is a block diagram of the structure of the device for testing the lighting of an electronic device provided by the embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0042] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. The components of the embodiments of the present invention described and illustrated herein can be arranged and designed in various different configurations.

[0043] Therefore, the detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the scope of protection of the present invention.

[0044] It should be noted that like reference numerals and letters denote like items in the following figures. Therefore, once an item is defined in one figure, it does not require further definition and explanation in subsequent figures.

[0045] In the description of the present invention, it should be noted that if terms such as "upper", "lower", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, or the orientations or positional relationships in which the inventive product is customarily placed during use, it is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present invention.

[0046] In addition, terms such as "first", "second", etc. are only used for descriptive distinction and should not be construed as indicating or implying relative importance.

[0047] In the description of the present invention, it should also be noted that unless otherwise clearly defined and limited, the terms "arrange", "install", "connect", and "couple" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0048] This embodiment provides a test device that can test the lighting of a device under test. In a possible implementation, the test device can be a user terminal. For example, the test device can be, but is not limited to, a server, a smart phone, a personal computer (PC), a tablet computer, a personal digital assistant (PDA), a mobile Internet device (MID), and an image acquisition device, etc.

[0049] Please refer to Figure 1 , Figure 1 which is a schematic structural diagram of the test device 100 provided by an embodiment of the present invention. The test device 100 may further include more or fewer components than those shown in Figure 1 or have a different configuration from that shown in Figure 1 . Figure 1 Each component shown in

[0050] can be implemented by hardware, software, or a combination thereof.

[0051] The test device 100 includes an electronic device lighting test device 110, a memory 120, and a processor 130.

[0052] Among them, the memory 120 can be, but is not limited to, a Random Access Memory (RAM), a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), an Erasable Programmable Read-Only Memory (EPROM), an Electric Erasable Programmable Read-Only Memory (EEPROM), etc. Among them, the memory 120 is used to store a program, and after receiving an execution instruction, the processor 130 executes the program.

[0053] Please refer to Figure 2 , Figure 2 A flowchart of a method for testing the lighting of an electronic device applied to Figure 1 the test device 100 will be elaborated in detail for each step included in the method below.

[0054] S201: For each LED lamp, when the Ethernet port corresponding to each LED lamp is in the UP state after enabling the operation, collect the first level state of the pins of the LED lamp.

[0055] Among them, each LED lamp is correspondingly set with each IO port of the electronic device under test. Each IO port is used to transmit a driving signal to the corresponding LED lamp, and each LED lamp is correspondingly set with each Ethernet port.

[0056] S202: Obtain the first preset state of the pins of the LED lamp corresponding to the Ethernet port when the Ethernet port is in the UP state.

[0057] S203: When the first level state is consistent with the first preset state, determine the preset rate configured for the Ethernet port corresponding to the LED lamp.

[0058] S204: When there is traffic on the Ethernet port and the LED lamp has high and low level changes within a preset time period, collect the blinking frequency of the LED lamp.

[0059] S205: When the blinking frequency is consistent with the preset rate, determine that the lighting function test of the electronic device under test passes.

[0060] All the electronic devices under test come with a CPU (Central Processing Unit). By using the IO ports on the CPU for connection and data exchange with external devices and memory, a test circuit is led out. Through an IO expansion chip, it is connected to the drive circuits of all the panel LED lights on the electronic device under test. Each IO port corresponds to an LED light, and the LED lights are set corresponding to the Ethernet ports. The status of the LED lights is used to represent the status of the corresponding Ethernet ports.

[0061] It should be noted that the Ethernet port can be a network card port. The IO port drives the strobe status and frequency of the corresponding LED light. The strobe status represents the status of the LED light, and the frequency represents the blinking frequency of the LED light.

[0062] The electronic device under test may include a CPLD (Complex Programmable Logic Device) module and a lighting module. Among them, the lighting module may include a MAC unit or a PHY (Physical, port physical layer) unit. When the electronic device under test realizes lighting based on the MAC unit, the MAC unit outputs a serial lighting signal to the CPLD module. The CPLD module divides the received serial lighting signal to obtain the lighting signals corresponding to each LED light. The CPLD module sends the lighting signals corresponding to each LED light to the corresponding IO ports so that the sub-signals drive the corresponding LED lights.

[0063] When the electronic device under test realizes lighting based on the PHY unit, the PHY unit outputs a serial lighting signal to the CPLD module. The CPLD module divides the received serial lighting signal to obtain the lighting signals corresponding to each LED light, that is, sub-signals. The CPLD module sends the lighting signals corresponding to each LED light to the corresponding IO ports so that the sub-signals drive the corresponding LED lights.

[0064] It should be noted that the test circuit can be made into a separate buckling plate. By adding a corresponding buckling plate base on the electronic device under test, the test circuit can be set on the electronic device under test to complete the test of the lighting function.

[0065] The implementation method for collecting data of the electronic device under test can be as follows: After enabling the Ethernet port corresponding to the LED light and when the Ethernet port is in the UP state, it means that the Ethernet port is in the enabled state and the negotiation with the peer device is successful. Then, collect the first level status of the pins of the LED light. And obtain the first preset status when the Ethernet port enabling is in the UP state. When the collected first level status is consistent with the first preset status, it indicates that this test passes, and then proceed to the next test.

[0066] Exemplarily, when the first preset state when the enabled Ethernet port is set to the UP state is high level, and when the first level state collected is high level, it is determined that the first preset state and the first level state are consistent, and this test passes, and the next test is carried out. When the first preset state when the enabled Ethernet port is set to the UP state is low level, and when the first level state collected is high level, when it is determined that the first preset state and the first level state are inconsistent, it indicates that this test fails, that is, the lighting function of the electronic device under test is abnormal, and the test failure is reported.

[0067] When the lighting function of the electronic device under test is abnormal, it indicates that the hardware design or software program test of the electronic device under test fails, resulting in the abnormal lighting test function of the electronic device under test. It is necessary to detect the hardware part and software part of the electronic device under test to determine the specific reason for the abnormal lighting test function of the electronic device under test.

[0068] When the first level state collected is consistent with the first preset state, the flashing frequency of the LED lamp is collected again. When the Ethernet port is normally enabled and in the UP state and there is traffic passing through, the Ethernet port will flash at a certain frequency. By judging the consistency between the flashing frequency and the preset rate set for the Ethernet port, the lighting function of the electronic device under test is tested.

[0069] In one example, the flashing frequency of the LED lamp is collected, and when it is determined that the Ethernet port is enabled and in the UP state and there is traffic passing through the Ethernet port, the preset rate configured for the Ethernet port is set. The flashing frequency of the pin of the collected LED lamp is compared with the set preset rate. When the flashing frequency of the collected LED lamp is consistent with the set preset rate, it is determined that the lighting function test of the electronic device under test passes. When the flashing frequency of the collected LED lamp is inconsistent with the set preset rate, it is determined that the lighting function test of the electronic device under test fails, and the hardware part or software part of the electronic device under test is abnormal, resulting in the abnormal lighting test function of the electronic device under test. It is necessary to detect the hardware part and software part of the electronic device under test to determine the specific reason for the abnormal lighting test function of the electronic device under test. When specifically testing the lighting function of the electronic device under test, the CPU in the electronic device under test can receive the data sent by the test circuit and test the lighting function of the electronic device under test. The CPU of the electronic device under test can also send the test data to the circuit with the lighting test proxy module to the automation server, and the lighting function of the electronic device under test is tested based on the automation server.

[0070] Such as Figure 3As shown, it is a block diagram of the lighting function test system. The system includes the electronic device under test 10 and the test device 11; a collection circuit is provided on the electronic device under test; the test device sends an enable instruction to the electronic device under test to make the Ethernet port corresponding to each LED lamp of the electronic device under test in the UP state; the test device collects the first level state of the pins of each LED lamp of the electronic device under test, and obtains the first preset state of the pins of the LED lamp corresponding to the Ethernet port when the Ethernet port is in the UP state. When the first level state is consistent with the first preset state, the test device sends test data to the electronic device under test to make there be traffic on the Ethernet port corresponding to each LED lamp of the electronic device under test and there be high and low level changes of the LED lamp within a preset time period, determines the preset rate configured for the Ethernet port corresponding to the LED lamp of the electronic device under test and the flashing frequency of the LED lamp. When the flashing frequency is consistent with the preset rate, it is determined that the lighting function test of the electronic device under test passes.

[0071] The following explanation is given taking the test device as an automated server:

[0072] The automated server controls the electronic device under test to make all Ethernet ports of the electronic device under test in the disabled state. The automated server can collect the level states of the pins of all LED lamps of the electronic device under test, or the electronic device under test sends the level states of the pins of all LED lamps to the automated server. The automated server compares the preset state of the pins of the LED lamp corresponding to the Ethernet port in the down state due to being disabled with the collected or received level states of the pins of all LED lamps of the electronic device under test. When the preset state of the pins of the LED lamp corresponding to the Ethernet port in the down state due to being disabled is in the low level state, and the collected or received level states of the pins of all LED lamps of the electronic device under test are in the low level state, this test item passes and the next test is carried out.

[0073] The automated server controls the electronic device under test, and the electronic device under test enables the Ethernet port based on the control of the automated server. After the Ethernet port of the electronic device under test negotiates and establishes a connection with the peer device and the Ethernet port is in the UP state, the automated server collects the level state of the pins of the LED lamp of the electronic device under test. When the high level indicates that the Ethernet port is enabled and in the UP state, it is judged whether the level state of the LED lamp is in the high level. If the level state of the pins of the LED lamp of the electronic device under test is in the high level, this test item passes and the next test is carried out.

[0074] When the automated server does not send traffic to the Ethernet port, it determines whether there is a jump in the level of the LED light corresponding to the Ethernet port of the electronic device under test within a preset time period. If there is no jump, the next test is carried out.

[0075] The automated server controls the traffic generator to send traffic to the enabled Ethernet port in the UP state. The automated server detects whether there is a change in the high and low levels of the LED light corresponding to this Ethernet port within a preset time period. When there is a change in the high and low levels of the LED light within the preset time period, this test passes and the next test is carried out.

[0076] When there is traffic on the Ethernet port and there is a change in the high and low levels of the corresponding LED light within a preset time period, the automated server sets the rate of this Ethernet port. The automated server collects the blinking frequency of the LED light of the Ethernet port and matches the blinking frequency with the set rate of the Ethernet port. If the blinking rate is consistent with the preset rate, the lighting function test of the electronic device under test passes.

[0077] In another implementation of collecting the level state of the pins of the LED light, as Figure 4 shown, it includes the following steps:

[0078] S301: For each LED light, when the Ethernet port corresponding to each LED light is in the down state after the close operation is performed on the Ethernet port, collect the second level state of the first collection point of the pins of the LED light.

[0079] S302: Obtain the second preset state of the pins of the LED light corresponding to the Ethernet port in the down state.

[0080] S303: When the second level state is consistent with the second preset state, determine the preset rate configured for the Ethernet port corresponding to the LED light.

[0081] The implementation of data collection for the electronic device under test can be: After the Ethernet port corresponding to the LED light is closed and in the down state operation, it means that this Ethernet port is in the disabled state, and collect the second level state of the pins of the LED light. And determine the second preset state when the Ethernet port is closed and in the down state. When the collected second level state is consistent with the second preset state, it indicates that this test passes and the next test is carried out.

[0082] Exemplarily, when the second preset state when the set Ethernet port is closed and in the down state is at a low level, and when the second level state collected is at a low level state, it is determined that the second preset state and the second level state are consistent, and this test passes, and the next test is carried out. When the second preset state when the set Ethernet port is closed and in the down state is at a high level, and when the second level state collected is at a low level state, it is determined that the second preset state and the second level state are inconsistent, indicating that this test fails, that is, the lighting function of the electronic device under test is abnormal, and the test failure is reported.

[0083] It should be noted that when detecting one of the lighting functions of the electronic device under test based on the level state, the lighting function of the electronic device under test can be tested in two states where the enable of the Ethernet port corresponding to the LED lamp is in the UP state or closed in the DOWN state.

[0084] Exemplarily: when the enable of the Ethernet port corresponding to the LED lamp is in the UP state, when the first level state collected is consistent with the first preset state when the Ethernet port is enabled, and then it is determined that when the Ethernet port corresponding to the LED lamp is closed and in the down state, when the second level state collected is consistent with the second preset state when the Ethernet port is closed, the next test is carried out. When the first level state is inconsistent with the first preset state, or the second level state is inconsistent with the second preset state, it is considered that the lighting function test of the electronic device under test fails.

[0085] When setting the LED lamp, a single-color lamp or a two-color lamp can be set. When the LED lamp is a single-color lamp, the lamp being on indicates that the enable of the corresponding Ethernet port is in the UP state, the lamp being off indicates that the corresponding Ethernet port is closed and in the DOWN state. If the lamp has high and low level changes within a preset time period, it represents that there is traffic passing through. If the lamp does not have high and low level changes within a preset time period, it represents that there is no traffic passing through. When there is traffic, the blinking frequency of the lamp can represent the rate configured for the Ethernet port.

[0086] When the LED lamp is a two-color lamp, a yellow lamp and a green lamp can be set. When both lamps are off, it indicates that the corresponding Ethernet port is closed and in the DOWN state. When any one of the lamps is on, it indicates that the enable of the corresponding Ethernet port is in the UP state. If the lamp has high and low level changes within a preset time period, it represents that there is traffic passing through. If the lamp does not have high and low level changes within a preset time period, it represents that there is no traffic passing through. When the green lamp blinks, it can indicate that the rate configured for the Ethernet port is 10M. When the yellow lamp blinks, it can indicate that the rate configured for the Ethernet port is 100M. When the yellow lamp and the green lamp blink simultaneously, it can indicate that the rate configured for the Ethernet port is 1000M.

[0087] Please refer to Figure 5 , the embodiment of the present invention also provides an application forFigure 1 The electronic device lighting test device 110 of the test device 100, the electronic device lighting test device 110 includes:

[0088] An acquisition module 111, which is used to collect the first level state of the pins of each LED lamp when the Ethernet port corresponding to each LED lamp is in the UP state after enabling operations are performed on the Ethernet ports corresponding to each LED lamp. Among them, each of the LED lamps is correspondingly arranged with each IO port of the electronic device under test, each of the IO ports is used to transmit drive signals to the corresponding LED lamps, and each of the LED lamps is correspondingly arranged with each Ethernet port;

[0089] An acquisition module 112, which is used to acquire the first preset state of the pins of the LED lamp corresponding to when the Ethernet port is in the UP state; when the first level state is consistent with the first preset state, then determine the preset rate configured for the Ethernet port corresponding to the LED lamp;

[0090] The acquisition module 111 is further used to: collect the flashing frequency of the LED lamp when there is traffic on the Ethernet port and there are high and low level changes in the LED lamp within a preset time period;

[0091] A test module 113, which is used to determine that the lighting function test of the electronic device under test passes when the flashing frequency is consistent with the preset rate.

[0092] In the embodiments provided by the present invention, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are only illustrative. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architectures, functions, and operations of devices, methods, and computer program products according to multiple embodiments of the present invention. In this regard, each block in the flowchart or block diagram may represent a module, a program segment, or a part of code, and the module, program segment, or part of code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, as well as the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0093] In addition, each functional module in various embodiments of the present invention may be integrated together to form an independent part, or each module may exist alone, or two or more modules may be integrated to form an independent part. If the function is implemented in the form of a software functional module and sold or used as an independent product, it may be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of this technical solution, may be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs that can store program codes.

[0094] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the existence of additional identical elements in the process, method, article or device comprising the element.

[0095] The above is only various embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of changes or substitutions, which should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A method for lighting test of an electronic device, characterized in that, The method includes: For each LED lamp, when the Ethernet port corresponding to each LED lamp is in the UP state after enabling the operation on the Ethernet port, collect the first level state of the pins of the LED lamp. Wherein, each of the LED lamps is correspondingly set with each IO port of the electronic device under test, and each of the IO ports is used to transmit a driving signal to the corresponding LED lamp, and each of the LED lamps is correspondingly set with each Ethernet port; Obtain the first preset state of the pins of the corresponding LED lamp when the Ethernet port is in the UP state; When the first level state is consistent with the first preset state, determine the preset rate configured for the Ethernet port corresponding to the LED lamp; When there is traffic on the Ethernet port and the LED lamp has high and low level changes within a preset time period, collect the flashing frequency of the LED lamp; When the flashing frequency is consistent with the preset rate, determine that the lighting function test of the electronic device under test passes.

2. The method according to claim 1, characterized in that The method further includes: For each LED lamp, when the Ethernet port corresponding to each LED lamp is in the down state after performing a shutdown operation on the Ethernet port, collect the second level state of the pins of the LED lamp; Obtain the second preset state of the pins of the corresponding LED lamp when the Ethernet port is in the down state; When the second level state is consistent with the second preset state, return to the step of determining the preset rate configured for the Ethernet port corresponding to the LED lamp.

3. The method according to claim 1, characterized in that The method further includes: When the first level state is inconsistent with the first preset state, determine that the lighting function test of the electronic device under test fails.

4. The method according to claim 2, wherein The method further includes: When the second level state is inconsistent with the second preset state, determine that the lighting function test of the electronic device under test fails.

5. The method according to claim 1, wherein The electronic device under test further includes a PHY unit or a MAC unit, and the PHY unit or the MAC unit is connected to a CPLD module. The method includes: Control the PHY unit or MAC unit to send serial signals of each LED lamp; Control the CPLD to split the serial signals to obtain each sub-signal; Transmit each of the sub-signals to the IO port corresponding to the corresponding LED lamp so that the sub-signal drives the corresponding LED lamp.

6. The method according to claim 5, wherein The step of determining that the LED lamp test passes when the flashing frequency is consistent with the preset rate includes: When the flashing frequency is consistent with the preset rate, determine that the hardware design and software program test of the electronic device under test pass.

7. An electronic device lighting test device, characterized in that, The device includes: An acquisition module, configured to, for each LED lamp, when the Ethernet port corresponding to each LED lamp is in the UP state after enabling the operation on the Ethernet port, collect the first level state of the pins of the LED lamp. Wherein, each of the LED lamps is correspondingly set with each IO port of the electronic device under test, and each of the IO ports is used to transmit a driving signal to the corresponding LED lamp, and each of the LED lamps is correspondingly set with each Ethernet port; An acquisition module, configured to acquire a first preset state of a pin of the LED lamp corresponding to when the Ethernet port is in the UP state; when the first level state is consistent with the first preset state, determine a preset rate configured for the Ethernet port corresponding to the LED lamp. The acquisition module is further configured to: when there is traffic on the Ethernet port and there are high and low level changes in the LED lamp within a preset time period, acquire the blinking frequency of the LED lamp. A test module, configured to determine that the lighting function test of the electronic device under test passes when the blinking frequency is consistent with the preset rate.

8. An electronic device lighting test system, characterized in that, The system includes an electronic device under test and a test device, and an acquisition circuit is provided on the electronic device under test. The test device sends an enable instruction to the electronic device under test to make the Ethernet port corresponding to each LED lamp of the electronic device under test be in the UP state. The test device acquires a first level state of a pin of each LED lamp of the electronic device under test, and acquires a first preset state of the pin of the LED lamp corresponding to when the Ethernet port is in the UP state. When the first level state is consistent with the first preset state, the test device sends test data to the electronic device under test to make there be traffic on the Ethernet port corresponding to each LED lamp of the electronic device under test and there be high and low level changes in the LED lamp within a preset time period, determine the preset rate configured for the Ethernet port corresponding to the LED lamp of the electronic device under test and the blinking frequency of the LED lamp. When the blinking frequency is consistent with the preset rate, determine that the lighting function test of the electronic device under test passes.

9. The system according to claim 8, characterized in that, The test device sends a shutdown instruction to the electronic device under test to make the Ethernet port corresponding to each LED lamp of the electronic device under test be closed and in the down state. The test device acquires a second level state of a pin of each LED lamp of the electronic device under test, acquires a second preset state of the pin of the LED lamp corresponding to when the Ethernet port is in the down state, and determines the preset rate configured for the Ethernet port corresponding to the LED lamp when the second level state is consistent with the second preset state.

10. The system according to claim 8, characterized in that When the test device determines that the first level state is inconsistent with the first preset state, it determines that the lighting function test of the electronic device under test fails.

Images