DC fault arc simulation method and device, storage medium and program product

Abstract

The invention relates to a direct-current fault arc simulation method and device, a storage medium and a program product. The method comprises the steps that an initial current signal is generated through a direct current module according to power generation parameters; performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a target current signal after the DC fault arc phenomenon occurs; performing frequency domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal; and determining fault arc information corresponding to the DC fault arc phenomenon based on the target spectrogram. By adopting the method, accurate analysis of the fault arc can be realized.

Description

Technical Field

[0001] The present application relates to the technical field of electrical fault detection in photovoltaic systems, and particularly to a method, device, storage medium and program product for simulating DC fault arcs. Background Art

[0002] With the development of renewable energy technologies and the transformation of the energy structure, DC power systems have been widely used in modern power systems.

[0003] However, during the operation of a photovoltaic system, it is vulnerable to problems such as environmental factors, component aging, loose connections, and decreased insulation performance, resulting in the generation of fault arcs. Fault arcs can cause power losses, equipment damage, and serious safety hazards such as fires, endangering the surrounding environment and personnel safety.

[0004] Therefore, the analysis of fault arcs is crucial for photovoltaic systems and DC power systems. Summary of the Invention

[0005] Based on this, in view of the above technical problems, it is necessary to provide a method, device, storage medium and program product for simulating DC fault arcs, which can achieve accurate analysis of fault arcs.

[0006] In a first aspect, the present application provides a method for simulating DC fault arcs, the method comprising:

[0007] Generating an initial current signal by a DC module according to power generation parameters;

[0008] Performing arc simulation on the initial current signal flowing through the arc model by the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon;

[0009] Performing frequency domain conversion on the target current signal to obtain a target frequency spectrum diagram corresponding to the target current signal;

[0010] Determining fault arc information corresponding to the DC fault arc phenomenon based on the target frequency spectrum diagram.

[0011] In one embodiment, performing arc simulation on the initial current signal flowing through the arc model by the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon, includes:

[0012] Performing line impedance simulation on the initial current signal by an impedance network module to obtain a loss current signal; performing arc simulation on the loss current signal flowing through the arc model by the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon.

[0013] In one embodiment, through an arc model, an arc simulation is performed on an initial current signal flowing through the arc model, and a target current signal after a DC fault arc phenomenon occurs is output, including:

[0014] Through the arc model, an arc simulation is performed on the initial current signal flowing through the arc model, and a fault current signal after a DC fault arc phenomenon occurs is output; a noise signal is added to the fault current signal to obtain a target current signal.

[0015] In one embodiment, it includes:

[0016] A white noise signal is generated by a first noise generation module according to white noise parameters; the white noise signal is input into a second noise generation module to obtain a pink noise signal.

[0017] In one embodiment, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

[0018] In one embodiment, the impedance network module and the arc model are connected through a capacitor component.

[0019] In a second aspect, the present application also provides a DC fault arc simulation device, and the device includes:

[0020] A signal generation module, configured to generate an initial current signal through a DC module according to power generation parameters;

[0021] A signal output module, configured to perform an arc simulation on the initial current signal flowing through the arc model through the arc model, and output a target current signal after a DC fault arc phenomenon occurs;

[0022] A spectrogram determination module, configured to perform a frequency domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal;

[0023] An arc determination module, configured to determine fault arc information corresponding to the DC fault arc phenomenon based on the target spectrogram.

[0024] In a third aspect, the present application also provides a computer device, including a memory and a processor, the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0025] Generate an initial current signal through a DC module according to power generation parameters;

[0026] Perform an arc simulation on the initial current signal flowing through the arc model through the arc model, and output a target current signal after a DC fault arc phenomenon occurs;

[0027] Perform a frequency-domain conversion on the target current signal to obtain the target spectrogram corresponding to the target current signal;

[0028] Based on the target spectrogram, determine the fault arc information corresponding to the DC fault arc phenomenon.

[0029] In a fourth aspect, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0030] Generate an initial current signal through a DC module according to the power generation parameters;

[0031] Through an arc model, perform arc simulation on the initial current signal flowing through the arc model, and output the target current signal after the occurrence of the DC fault arc phenomenon;

[0032] Perform a frequency-domain conversion on the target current signal to obtain the target spectrogram corresponding to the target current signal;

[0033] Based on the target spectrogram, determine the fault arc information corresponding to the DC fault arc phenomenon.

[0034] In a fifth aspect, the present application also provides a computer program product, including a computer program. When the computer program is executed by a processor, the following steps are implemented:

[0035] Generate an initial current signal through a DC module according to the power generation parameters;

[0036] Through an arc model, perform arc simulation on the initial current signal flowing through the arc model, and output the target current signal after the occurrence of the DC fault arc phenomenon;

[0037] Perform a frequency-domain conversion on the target current signal to obtain the target spectrogram corresponding to the target current signal;

[0038] Based on the target spectrogram, determine the fault arc information corresponding to the DC fault arc phenomenon.

[0039] The above-mentioned DC fault arc simulation method, device, storage medium, and program product generate an initial current signal according to the power generation parameters through a DC module, providing a prerequisite for arc simulation. Further, an arc model can be used to simulate the initial current signal flowing through the arc model and output a target current signal after the occurrence of the DC fault arc phenomenon, providing data for analyzing the fault arc. Furthermore, the target current signal can be subjected to frequency-domain conversion to obtain the target frequency spectrum diagram corresponding to the target current signal, realizing clear identification of noise and interference. Finally, based on the target frequency spectrum diagram, the fault arc information corresponding to the DC fault arc phenomenon can be determined. This solution realizes the simulation of the initial current signal by introducing a DC module, laying a foundation for subsequent realization of fault arc simulation. Moreover, by introducing an arc model, a solution for realizing fault arc simulation is provided, and finally, accurate analysis of the fault arc is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0041] Figure 1 It is an application environment diagram of a DC fault arc simulation method provided in an embodiment of the present application;

[0042] Figure 2 It is a flowchart of a DC fault arc simulation provided in an embodiment of the present application;

[0043] Figure 3 It is a structural diagram of an arc model provided in an embodiment of the present application;

[0044] Figure 4 It is a flowchart of outputting a target current signal provided in an embodiment of the present application;

[0045] Figure 5 It is another flowchart of outputting a target current signal provided in an embodiment of the present application;

[0046] Figure 6 It is a structural block diagram of a DC fault arc simulation device provided in an embodiment of the present application;

[0047] Figure 7 It is an internal structure diagram of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0048] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] The DC fault arc simulation method provided in the embodiment of the present application can be applied to Figure 1 In the simulation system shown.

[0050] In an exemplary embodiment, Figure 2 As shown, a DC fault arc simulation method is provided, which is applied to Figure 1 Taking the server 104 in the example as an example, the following steps may be included:

[0051] S201, generating an initial current signal according to power generation parameters through a DC module.

[0052] The DC module can be used to simulate the generation of DC current; the initial current signal can represent the current signal before a fault occurs.

[0053] Optionally, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity. For example, the photovoltaic module can simulate the changes in solar radiation, such as light intensity, sunshine time and temperature. To simplify the modeling, the light intensity can be given as 1000W / m 2 and temperature 25°C.

[0054] For example, the power generation parameters in the DC module can be set (such as Figure 1 S and T in the DC module) to simulate the generation environment or generation conditions of current in the DC power system to achieve simulation of the actual environment.

[0055] S202, performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a target current signal after the DC fault arc phenomenon occurs.

[0056] The arc model can realize the simulation or simulation of the fault arc; the target current signal can represent the current data after the fault arc phenomenon occurs.

[0057] Optional, such as Figure 3 As shown, Figure 3 yes Figure 1 The structural diagram of the arc model can reflect the arcing process before the current passes through zero.

[0058] Exemplarily, after the DC module generates the initial current signal, the initial current signal is Figure 1The structure will pass through an arc model to simulate the DC fault arc phenomenon, and obtain the target current signal after passing through the arc model to achieve a specific analysis of the fault arc information.

[0059] S203. Perform a frequency-domain conversion on the target current signal to obtain the target spectrogram corresponding to the target current signal.

[0060] Among them, the target spectrogram is a two-dimensional representation of the target current signal in the time-frequency domain; optionally, the frequency components in the target current signal can be known from the target spectrogram, and information such as noise and interference can be identified from the stray frequency bands or peaks in the target spectrogram.

[0061] Exemplarily, based on the Fast Fourier Transform (FFT), the target current signal can be converted to the frequency domain to obtain a target spectrogram that more easily reflects the component and energy distribution information of the target current signal in the frequency domain.

[0062] S204. Based on the target spectrogram, determine the fault arc information corresponding to the DC fault arc phenomenon.

[0063] Among them, the fault arc information may include but is not limited to arc type, arc intensity, arc voltage, arc duration, and fault consequences, etc.

[0064] Exemplarily, based on the target spectrogram, information such as the frequency distribution, amplitude characteristics, and spectral shape of the target current signal can be determined; further, the arc type can be judged based on the frequency distribution of the target current signal, the arc intensity can be estimated according to the amplitude of the high-frequency components, and the duration of the high-frequency components can be analyzed according to the time axis of the target spectrogram, etc.

[0065] The above DC fault arc simulation method generates an initial current signal by a DC module according to the power generation parameters, providing a prerequisite for arc simulation; further, through the arc model, the initial current signal flowing through the arc model can be subjected to arc simulation, and the target current signal after the occurrence of the DC fault arc phenomenon can be output, providing data for analyzing the fault arc; furthermore, the target current signal can be subjected to frequency-domain conversion to obtain the target spectrogram corresponding to the target current signal, realizing a clear identification of noise and interference; finally, based on the target spectrogram, the fault arc information corresponding to the DC fault arc phenomenon can be determined. This solution realizes the simulation of the initial current signal by introducing a DC module, laying a foundation for subsequent realization of fault arc simulation; moreover, by introducing an arc model, a solution for realizing fault arc simulation is provided, and finally, an accurate analysis of the fault arc is realized.

[0066] Based on the above embodiments, the embodiments of the present application will explain the above embodiment S202 in detail. Specifically, in the embodiments of the present application, the process of outputting the target current signal is involved, as Figure 4 shown, and specifically includes the following steps:

[0067] S401, through the impedance network module, simulate the line impedance of the initial current signal to obtain the loss current signal.

[0068] Among them, the loss current signal can represent the data when the line impedance is considered and no fault arc phenomenon occurs.

[0069] Exemplarily, as shown in Figure 1 , after the DC module generates the initial current signal, according to the Figure 1 structure, the initial current signal will first pass through the impedance network module and obtain the loss current signal considering the line impedance loss; that is, by considering the line impedance, it is closer to the actual situation.

[0070] S402, through the arc model, simulate the loss current signal flowing through the arc model to output the target current signal after the DC fault arc phenomenon occurs.

[0071] Exemplarily, as shown in Figure 1 , after the initial current signal passes through the impedance network module, the loss current signal considering the line impedance loss is obtained; further, the loss current signal will pass through the arc model, thereby realizing the simulation of the DC fault arc phenomenon and obtaining the target current signal after flowing through the arc model.

[0072] Optionally, the impedance network module and the arc model are connected through a capacitor component.

[0073] It should be noted that in the actual simulation process, the Cassie arc model in the arc model cannot be connected in series with the inductor in the impedance network. Therefore, a very small capacitor is incorporated between the impedance network module and the arc model to ensure the normal operation of the simulation.

[0074] Among them, the differential equation of the Cassie arc model is as follows:

[0075]

[0076] Among them, R is the dynamic resistance, τ is the time constant, u is the arc voltage, and u c is the arc voltage constant. Optionally, τ can be 2.25e-4s, and u c can be 30V, and the conductance g(0) at time 0 is 1.17e3S.

[0077] In the embodiments of the present application, by introducing a line impedance module and taking into account the line consumption in the actual situation, a foundation is laid for realizing accurate fault arc analysis.

[0078] Based on the above embodiments, the embodiments of the present application will explain the above embodiment S202 in detail. Specifically, in the embodiments of the present application, the process of outputting the target current signal is involved, as Figure 5 shown, which specifically includes the following steps:

[0079] S501, through the arc model, perform arc simulation on the initial current signal flowing through the arc model, and output the fault current signal after the occurrence of the DC fault arc phenomenon.

[0080] Among them, the fault current signal can represent the current data after the occurrence of the fault arc phenomenon.

[0081] Exemplarily, as combined with Figure 1 shown, after the DC module generates the initial current signal, according to the Figure 1 structure, the initial current signal will first pass through the impedance network module and then through the arc model (such as the Cassie arc model) to realize the simulation of the DC fault arc phenomenon, and finally obtain the fault current signal after the occurrence of the DC fault arc phenomenon.

[0082] S502, add a noise signal to the fault current signal to obtain the target current signal.

[0083] Among them, the noise signal can be a pink noise signal.

[0084] Exemplarily, as Figure 1 shown, by adding a noise generation unit to the arc model to realize the simulation of the noise in the actual situation; that is, superimposing the fault current signal and the noise signal to obtain the target current signal.

[0085] Optionally, the generation process of the pink noise signal can be expressed as: the first noise generation module generates a white noise signal according to the white noise parameters; input the white noise signal into the second noise generation module to obtain the pink noise signal.

[0086] For example, through the first noise generation module, set the white noise parameters, such as the mean value is 0 and the variance is 0.001, to generate the white noise signal z; further, input the white noise signal into the second noise generation module, and set the input power density of the white noise signal to 10 -5 , to obtain the pink noise signal H(z); optionally, the generation process of the pink noise signal H(z) can be expressed as:

[0087] .

[0088] In the embodiments of the present application, by introducing a noise signal, the existence of noise in the actual situation is considered, which conforms to the actual situation and lays a foundation for obtaining accurate fault arc information.

[0089] It should be understood that although the steps in the flowcharts involved in the above-described embodiments are sequentially shown according to the indications of the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps does not have a strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-described embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily executed at the same moment, but can be executed at different moments. The execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps in other steps.

[0090] Based on the same inventive concept, the embodiments of the present application also provide a DC fault arc simulation device for implementing the DC fault arc simulation method described above. The solution provided by this device to solve the problem is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the following DC fault arc simulation devices can refer to the limitations on the DC fault arc simulation method in the above text, and will not be repeated here.

[0091] In an exemplary embodiment, as Figure 6 shown, a DC fault arc simulation device 1 is provided, including: a signal generation module 10, a signal output module 20, a spectrogram determination module 30, and an arc determination module 40, where:

[0092] The signal generation module 10 is used to generate an initial current signal through a DC module according to power generation parameters.

[0093] The signal output module 20 is used to perform arc simulation on the initial current signal flowing through the arc model through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon.

[0094] The spectrogram determination module 30 is used to perform frequency domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal.

[0095] The arc determination module 40 is used to determine fault arc information corresponding to the DC fault arc phenomenon based on the target spectrogram.

[0096] In one embodiment, the signal output module 20 is specifically used for:

[0097] Through the impedance network module, the line impedance of the initial current signal is simulated to obtain the loss current signal; through the arc model, the loss current signal flowing through the arc model is simulated to output the target current signal after the occurrence of the DC fault arc phenomenon.

[0098] In one embodiment, the signal output module 20 is further specifically configured to:

[0099] Through the arc model, the initial current signal flowing through the arc model is simulated to output the fault current signal after the occurrence of the DC fault arc phenomenon; a noise signal is added to the fault current signal to obtain the target current signal.

[0100] In one embodiment, the DC fault arc simulation device 1 further includes:

[0101] A noise generation module, configured to generate a white noise signal by the first noise generation module according to the white noise parameters; and input the white noise signal to the second noise generation module to obtain a pink noise signal.

[0102] In one embodiment, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

[0103] In one embodiment, the impedance network module and the arc model are connected through a capacitor device.

[0104] Each module in the above DC fault arc simulation device can be implemented in whole or in part by software, hardware, and their combination. The above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above respective modules.

[0105] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as Figure 7As shown in the figure. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O), and a communication interface. Among them, the processor, the memory, and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store current data. The input / output interface of the computer device is used to exchange information between the processor and external devices. The communication interface of the computer device is used to communicate with external terminals through a network connection. When the computer program is executed by the processor, it implements a DC fault arc simulation method.

[0106] Those skilled in the art can understand that Figure 7 the structure shown in the figure is only a block diagram of some structures related to the solution of this application, and does not constitute a limitation on the computer device to which the solution of this application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine some components, or have different component arrangements.

[0107] In an exemplary embodiment, a computer device is provided, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the following steps are implemented:

[0108] Generate an initial current signal through a DC module according to power generation parameters;

[0109] Perform arc simulation on the initial current signal flowing through the arc model through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon;

[0110] Perform frequency domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal;

[0111] Based on the target spectrogram, determine the fault arc information corresponding to the DC fault arc phenomenon.

[0112] In one embodiment, when the processor executes the computer program, the following steps are also implemented:

[0113] Perform line impedance simulation on the initial current signal through an impedance network module to obtain a loss current signal; perform arc simulation on the loss current signal flowing through the arc model through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon.

[0114] In one embodiment, when the processor executes a computer program, the following steps are further implemented:

[0115] Through an arc model, perform arc simulation on the initial current signal flowing through the arc model, and output a fault current signal after the occurrence of a DC fault arc phenomenon; add a noise signal to the fault current signal to obtain a target current signal.

[0116] In one embodiment, when the processor executes a computer program, the following steps are further implemented:

[0117] Generate a white noise signal by a first noise generation module according to white noise parameters; input the white noise signal into a second noise generation module to obtain a pink noise signal.

[0118] In one embodiment, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

[0119] In one embodiment, the impedance network module and the arc model are connected through a capacitor component.

[0120] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0121] Generate an initial current signal by a DC module according to power generation parameters;

[0122] Through an arc model, perform arc simulation on the initial current signal flowing through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon;

[0123] Perform frequency-domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal;

[0124] Based on the target spectrogram, determine fault arc information corresponding to the DC fault arc phenomenon.

[0125] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0126] Through an impedance network module, perform line impedance simulation on the initial current signal to obtain a loss current signal; through an arc model, perform arc simulation on the loss current signal flowing through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon.

[0127] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0128] Through an arc model, arc simulation is performed on an initial current signal flowing through the arc model, and a fault current signal after a DC fault arc phenomenon occurs is output; a noise signal is added to the fault current signal to obtain a target current signal.

[0129] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0130] A white noise signal is generated by a first noise generation module according to white noise parameters; the white noise signal is input into a second noise generation module to obtain a pink noise signal.

[0131] In one embodiment, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

[0132] In one embodiment, the impedance network module and the arc model are connected through a capacitor component.

[0133] In one embodiment, a computer program product is provided, including a computer program, which when executed by a processor, implements the following steps:

[0134] An initial current signal is generated by a DC module according to power generation parameters;

[0135] Through an arc model, arc simulation is performed on the initial current signal flowing through the arc model, and a target current signal after a DC fault arc phenomenon occurs is output;

[0136] Frequency domain conversion is performed on the target current signal to obtain a target spectrogram corresponding to the target current signal;

[0137] Based on the target spectrogram, fault arc information corresponding to the DC fault arc phenomenon is determined.

[0138] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0139] Through an impedance network module, line impedance simulation is performed on the initial current signal to obtain a loss current signal; through an arc model, arc simulation is performed on the loss current signal flowing through the arc model, and a target current signal after a DC fault arc phenomenon occurs is output.

[0140] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0141] Through an arc model, arc simulation is performed on the initial current signal flowing through the arc model, and a fault current signal after a DC fault arc phenomenon occurs is output; a noise signal is added to the fault current signal to obtain a target current signal.

[0142] In one embodiment, when the computer program is executed by a processor, the following steps are further implemented:

[0143] Generate a white noise signal by a first noise generation module according to white noise parameters; input the white noise signal into a second noise generation module to obtain a pink noise signal.

[0144] In one embodiment, when the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

[0145] In one embodiment, the impedance network module and the arc model are connected through a capacitor component.

[0146] It should be noted that the information (including but not limited to device information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in this application are all information and data that have been fully authorized by all parties, and the collection, use, and processing of relevant data need to comply with relevant regulations.

[0147] Those of ordinary skill in the art can understand that all or part of the processes in the above-described embodiment methods can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above various methods. Among them, any reference to a memory, database, or other medium used in the various embodiments provided in the present application can include at least one of non-volatile and volatile memories. Non-volatile memories can include read-only memory (ROM), magnetic tapes, floppy disks, flash memories, optical memories, high-density embedded non-volatile memories, resistive random access memories (ReRAMs), magnetoresistive random access memories (MRAMs), ferroelectric random access memories (FRAMs), phase change memories (PCMs), graphene memories, etc. Volatile memories can include random access memory (RAM) or external cache memories, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The databases involved in the various embodiments provided in the present application can include at least one of relational databases and non-relational databases. Non-relational databases can include distributed databases based on blockchain, etc., without limitation. The processors involved in the various embodiments provided in the present application can be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logics, data processing logics based on quantum computing, etc., without limitation.

[0148] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as falling within the scope described in this specification.

[0149] The above-described embodiments merely represent several implementation manners of the present application. Their descriptions are relatively specific and detailed, but they should not be construed as limiting the patent scope of the present application. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A DC fault arc simulation method, characterized in that, The method includes: generating an initial current signal by a DC module according to power generation parameters; performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon; performing frequency-domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal; determining fault arc information corresponding to the DC fault arc phenomenon based on the target spectrogram.

2. The method according to claim 1, wherein The performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon includes: performing line impedance simulation on the initial current signal through an impedance network module to obtain a loss current signal; performing arc simulation on the loss current signal flowing through the arc model through the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon.

3. The method according to claim 1, characterized in that, The performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a target current signal after the occurrence of a DC fault arc phenomenon includes: performing arc simulation on the initial current signal flowing through the arc model through the arc model, and outputting a fault current signal after the occurrence of a DC fault arc phenomenon; adding a noise signal to the fault current signal to obtain a target current signal.

4. The method according to claim 3, wherein The noise signal includes a pink noise signal, and the method further includes: generating a white noise signal by a first noise generation module according to white noise parameters; inputting the white noise signal into a second noise generation module to obtain the pink noise signal.

5. The method according to claim 1, characterized in that, When the DC module includes a photovoltaic module, the power generation parameters include temperature and light intensity.

6. The method according to claim 2, wherein The impedance network module and the arc model are connected through a capacitor component.

7. A DC fault arc simulation device, characterized in that, The device includes: a signal generation module, configured to generate an initial current signal by a DC module according to power generation parameters; a signal output module, configured to perform arc simulation on the initial current signal flowing through the arc model through the arc model, and output a target current signal after the occurrence of a DC fault arc phenomenon; a spectrogram determination module, configured to perform frequency-domain conversion on the target current signal to obtain a target spectrogram corresponding to the target current signal; an arc determination module, configured to determine fault arc information corresponding to the DC fault arc phenomenon based on the target spectrogram.

8. A computer device, comprising a memory and a processor, the memory storing a computer program, characterized in that, When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product comprising a computer program, characterized in that, When the computer program is executed by the processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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