Gate testing apparatus, method, device and storage medium

Abstract

The application provides a gate testing device, method and storage medium. It relates to the field of machinery and automation. The device comprises a support component, a force measuring component and a speed measuring component. The force measuring component is connected to the support component, and the speed measuring component is connected to the support component. The support component is connected to a first gate and a second gate. The force measuring component is used to measure the impact force of the first gate and the second gate, and the speed measuring component is used to measure the speed of the first gate and the second gate. The efficiency and accuracy of gate testing are improved.

Description

Technical Field

[0001] The present application relates to the field of mechanics and automation, and in particular to a gate machine testing device, method, apparatus and storage medium. Background Art

[0002] In the rail transit industry, gate equipment is widely used in subways, airports and other access areas. In order to ensure the safety of gate equipment operation, the performance of the gate swing needs to be tested.

[0003] In related technologies, when performing a performance test on the gate swing of a gate machine, the staff needs to replace the gate swing to be tested and perform a performance test on it through a professional testing platform.

[0004] However, in the above process, it usually takes a long time to disassemble the gate swing to be tested, and it also takes a long time to perform performance testing on it. This process is time-consuming, resulting in low efficiency in testing the gate swing. Summary of the Invention

[0005] The present application provides a gate machine testing device, method, apparatus and storage medium to solve the problem of low efficiency in gate swing testing.

[0006] In a first aspect, the present application provides a gate machine testing device, comprising a support component, a force measuring component, and a speed measuring component, wherein:

[0007] The force measuring component is connected to the supporting component, the speed measuring component is connected to the supporting component, and the supporting component is connected to the first gate and the second gate;

[0008] The force measuring component is used to measure the impact force of the first gate and the second gate, and the speed measuring component is used to measure the speed of the first gate and the second gate.

[0009] In a possible implementation, the speed measuring component is a photosensitive component, the speed measuring component is mounted on the supporting component, and the speed measuring component corresponds to the gate swing of the first gate and the second gate.

[0010] In a possible embodiment, the gate testing equipment further includes a sliding component, the sliding component is connected to the supporting component, the sliding component corresponds to the gate swing of the first gate and the second gate, and the force measuring component is installed on the sliding component.

[0011] In a possible implementation, the gate test device further includes a first suction cup and a second suction cup, and the supporting component includes a first end and a second end, wherein:

[0012] The first suction cup is connected to the first end, the second suction cup is connected to the second end, the first suction cup is adsorbed on the inner side of the first gate, and the second suction cup is adsorbed on the inner side of the second gate.

[0013] In a possible implementation manner, the gate testing device further includes a screw, and the first suction cup and the second suction cup are connected to the supporting component via the screw.

[0014] In a second aspect, the present application provides a gate machine testing method, comprising:

[0015] determining a first striking force and / or a first duration of the gate swing, wherein the first duration is used to indicate a speed of the gate swing;

[0016] Based on the first striking force and / or the first duration, a state of the gate is determined, where the state is an alarm state or a non-alarm state.

[0017] In a possible implementation, determining the first duration of the gate swing includes:

[0018] determining a first parameter of a speed measuring component, where the first parameter is used to indicate a degree to which the speed measuring component is blocked;

[0019] Based on the first parameter, the first duration is determined.

[0020] In a third aspect, the present application provides a gate machine testing device, comprising: a determination module and a processing module, wherein:

[0021] The determining module is used to determine a first striking force and / or a first duration of the gate swing, wherein the first duration is used to indicate a speed of the gate swing;

[0022] The processing module is configured to determine a state of the gate based on the first striking force and / or the first duration, where the state is an alarm state or a non-alarm state.

[0023] In a possible implementation, the determining module is specifically configured to:

[0024] determining a first parameter of a speed measuring component, where the first parameter is used to indicate a degree to which the speed measuring component is blocked;

[0025] Based on the first parameter, the first duration is determined.

[0026] In a fourth aspect, an embodiment of the present application provides an electronic device comprising: at least one processor and a memory; the memory stores computer-executable instructions; at least one processor executes the computer-executable instructions stored in the memory, so that at least one processor executes the gate testing method as described in the second aspect above and any item of the second aspect that may be involved.

[0027] In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the gate testing method as described in the second aspect above and any item of the second aspect is implemented.

[0028] In a sixth aspect, an embodiment of the present application provides a computer program product, including a computer program. When the computer program is executed by a processor, it implements the gate testing method as described in the second aspect above and any item of the second aspect that may be involved.

[0029] The gate test equipment, method, device and storage medium provided in the present application, the gate test equipment may include a support component, a force measuring component and a speed measuring component, wherein the force measuring component is connected to the support component, the speed measuring component is also connected to the support component, and the support component can be connected to the first gate and the second gate. The force measuring component can measure the impact force of the gate pendulum, and the speed measuring component can measure the rotation speed of the gate pendulum. In the above structure, since the gate test equipment can be fixed on the inner side of the first gate and the second gate, the gate test equipment can perform on-site testing on the gate pendulum without manually disassembling the gate pendulum or sending it for inspection, and the terminal device can accurately determine whether the motion performance of the gate pendulum meets the requirements based on the impact force and speed measured by the gate test equipment. In this case, the gate test equipment can adapt to the testing needs of gates with different spacings. This process takes less time, which improves the efficiency and accuracy of the gate test. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0031] Figure 1 Schematic diagram of application scenarios provided by embodiments of the present application;

[0032] Figure 2 A schematic diagram of the structure of a gate test device provided in an embodiment of the present application;

[0033] Figure 3 A schematic diagram of the test process of the gate test equipment provided in an embodiment of the present application;

[0034] Figure 4 A schematic diagram of the structure of another gate test device provided in an embodiment of the present application;

[0035] Figure 5 for Figure 4 A side view of the gate test equipment;

[0036] Figure 6 A schematic diagram of the test process of the gate test equipment provided in an embodiment of the present application;

[0037] Figure 7 A schematic structural diagram of another gate test device provided in an embodiment of the present application;

[0038] Figure 8 A schematic structural diagram of a support component provided in an embodiment of the present application;

[0039] Figure 9 A schematic structural diagram of another gate test device provided in an embodiment of the present application;

[0040] Figure 10 A schematic diagram of the structure of a control device provided in an embodiment of the present application;

[0041] Figure 11 A schematic flow chart of a gate machine testing method provided in an embodiment of the present application;

[0042] Figure 12 A schematic structural diagram of a gate test device provided in an embodiment of the present application;

[0043] Figure 13 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0044] Description of reference numerals:

[0045] 100-gate test equipment;

[0046] 101-First Gate;

[0047] 102-Second gate;

[0048] 103-first gate swing;

[0049] 104-Second gate swing;

[0050] 200-support component;

[0051] 201-first suction cup;

[0052] 202-second suction cup;

[0053] 203-screw;

[0054] 204-first screw;

[0055] 205- second screw;

[0056] 300-Force measuring component;

[0057] 301-sliding parts;

[0058] 400-speed measuring components;

[0059] 401-photosensitive component;

[0060] 500-Control device.

[0061] The above drawings illustrate specific embodiments of the present application, which will be described in more detail below. These drawings and the textual description are not intended to limit the scope of the present application in any way, but rather to illustrate the concepts of the present application to those skilled in the art by reference to specific embodiments. DETAILED DESCRIPTION

[0062] Exemplary embodiments will be described in detail herein, with examples illustrated in the accompanying drawings. In the following description, when referring to the drawings, identical numerals in different figures represent identical or similar elements, unless otherwise indicated. The embodiments described in the following exemplary embodiments are not intended to represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.

[0063] It should be noted that in the embodiments of the present application, certain software, components, models and other existing solutions in the industry may be mentioned. They should be regarded as exemplary. Their purpose is only to illustrate the feasibility of implementing the technical solution of the present application, but it does not mean that the applicant has or will necessarily use the solution.

[0064] For ease of understanding, the following Figure 1 , describes the application scenarios to which the embodiments of the present application are applicable.

[0065] Figure 1 This is a schematic diagram of the application scenario provided by the embodiment of this application. Figure 1 , including a first gate 101, a second gate 102, a first gate pendulum 103 and a second gate pendulum 104, wherein one side of the first gate pendulum 103 is fixed on the inner side of the first gate 101, and one side of the second gate pendulum 104 is fixed on the inner side of the second gate 102.

[0066] The first gate machine 101 can control the opening and closing of the first gate swing 103, and the second gate machine 102 can control the opening and closing of the second gate swing 104. For example, the initial position relationship between the gate machine and the gate swing is a vertical relationship. The first gate machine 101 controls the first gate swing 103 to open the door, and the position relationship between the first gate machine 101 and the first gate swing 103 becomes a parallel relationship; the first gate machine 101 controls the first gate swing 103 to close the door, and the position relationship between the first gate machine 101 and the first gate swing 103 becomes a vertical relationship.

[0067] The gate test equipment can be on the other side of the first gate pendulum 103 and the second gate pendulum 104 opening and closing the door, that is, the position corresponding to the closing of the first gate pendulum 103 and the second gate pendulum 104 (drawn in a dotted rectangular box in the figure).

[0068] In related technologies, when performing performance testing on a gate swing, workers need to replace the gate swing to be tested and perform performance testing on it using a professional testing platform. However, during this process, disassembling the gate swing to be tested typically takes a long time, and performing performance testing on it also takes a long time. This time-consuming process results in low gate swing testing efficiency.

[0069] In response to the above technical problems, in an embodiment of the present application, the gate test equipment includes a supporting component, a force measuring component and a speed measuring component. The force measuring component can measure the impact force of the gate pendulum, and the speed measuring component can measure the rotation speed of the gate pendulum. For example, when the gate pendulum is closed, the force measuring component can measure the impact force of the gate pendulum, and the speed measuring component can measure the time from the gate pendulum opening to closing, wherein the time from the gate pendulum opening to closing is used to indicate the rotation speed of the gate pendulum. In the above process, since the gate test equipment can be fixed on the inner side of the first gate and the second gate, the gate test equipment can perform on-site testing on the gate pendulum without manually disassembling the gate pendulum or sending it for inspection. Moreover, the terminal device can accurately determine whether the motion performance of the gate pendulum meets the requirements based on the impact force and speed measured by the gate test equipment. In this case, the gate test equipment can adapt to the testing requirements of gates with different spacings. This process is less time-consuming, which improves the efficiency and accuracy of the gate test.

[0070] The following specific embodiments describe in detail the technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0071] Figure 2 This is a schematic diagram of the structure of a gate test device provided in an embodiment of the present application. Figure 2 As shown, the gate testing device 100 provided in the embodiment of the present application is applied to the first gate 101 and the second gate 102, and includes a supporting component 200, a force measuring component 300 and a speed measuring component 400.

[0072] The force measuring component 300 is connected to the support component 200 , the speed measuring component 400 is connected to the support component 200 , and the support component 200 is connected to the first gate 101 and the second gate 102 .

[0073] The support component 200 can be used to support the force measuring component 300 and the speed measuring component 400. For example, the support component 200 can be a frame, a support rod, etc.

[0074] In some embodiments, the structure of the support component 200 may be a retractable structure. For example, the support component 200 may be a retractable frame, a retractable rod, or the like.

[0075] In some embodiments, the support component 200 can be based on a retractable structure to adapt to different distances between the first gate 101 and the second gate 102. For example, the distance between the first gate 101 and the second gate 102 is 80 cm. The support component 200 can be based on a retractable structure and can be retracted to 80 cm, thereby matching the distance between the first gate 101 and the second gate 102.

[0076] Optionally, the force measuring component 300 may be adhered to the supporting component 200 or may be sleeved on the supporting component 200 , which is not limited in the embodiment of the present application.

[0077] Illustratively, one side of the support component 200 may include a slide rail of a preset length, and the force measuring component 300 may move left and right along the slide rail of the support component 200, wherein the preset length is used to indicate the single movement length of the force measuring component 300. For example, the preset length of the slide rail is 60 cm, and the force measuring component 300 can move from one end of the slide rail to the other end of the slide rail based on the slide rail, and the single movement length is 60 cm.

[0078] In some embodiments, the force measuring component 300 may further include a motor, which may drive the force measuring component 300 to move to different positions based on a preset movement mode. For example, the preset movement mode may be intermittent movement, that is, the motor drives the force measuring component 300 to move on the support component 200 at a constant speed, and the motor may stop driving the force measuring component 300 at the same time interval so that the force measuring component 300 measures the impact force of the gate swing.

[0079] Exemplarily, the motor can drive the force measuring component to move on the supporting component at a constant speed. After the motor drives the force measuring component to move for 5 seconds, the motor stops driving the force measuring component 300, that is, the force measuring component 300 stops moving on the supporting component. In this way, the force measuring component 300 can measure the impact force of the gate swing at this position of the supporting component. Moreover, after the force measuring component 300 measures the impact force of the gate swing at this position, the motor can drive the force measuring component to continue moving at a constant speed for 5 seconds. Based on this driving method, the force measuring component can measure the impact force of the gate swing multiple times at multiple positions, thereby improving the measurement accuracy of the impact force, and thereby improving the accuracy of the gate swing test.

[0080] The force measuring component 300 is used to measure the impact force of the first gate 101 and the second gate 102. For example, the force measuring component 300 can be a force gauge, a pressure sensor, etc.

[0081] In some embodiments, the force measuring component 300 may include one or more components, and the shape of each component is not limited in this embodiment of the application. When the force measuring component 300 includes one component, the force measuring component 300 may be considered as an integrally formed device.

[0082] In some embodiments, when the force measuring component 300 is a pressure sensor, the force measuring component 300 can measure the impact force of the first gate 101 and the second gate 102 based on the collected pressure signal, and the force measuring component 300 can convert the pressure signal into an electrical signal, and the terminal device can determine whether the impact force meets the requirements based on the electrical signal.

[0083] In some embodiments, the force measuring component 300 can measure the impact force of the first gate 101 and the second gate 102 according to the degree of deformation of the surface structure. For example, the surface structure of the force measuring component 300 can be an elastic structure. When the gate swing is closed, the elastic structure deforms and displaces. The force measuring component 300 can convert the deformation displacement of the elastic structure into the impact force value of the gate swing.

[0084] The speed measuring component 400 is used to measure the speeds of the first gate 101 and the second gate 102 . For example, the speed measuring component 400 may be a photosensitive component 401 .

[0085] The speed measuring component 400 is installed on the supporting component 200 , and the speed measuring component 400 corresponds to the gate swing of the first gate 101 and the second gate 102 .

[0086] Optionally, the speed measuring component 400 can be pasted on the supporting component 200, or can be passed through the supporting component 200, and the exposed part of the speed measuring component 400 can correspond to the gate swing of the first gate 101 and the second gate 102 to ensure that the speed measuring component 400 can accurately measure the speed of the gate swing.

[0087] The photosensitive component 401 can determine the gate swing speed of the gate machine according to the degree of obstruction.

[0088] In some embodiments, the photosensitive component 401 may be a grating roller, wherein the grating roller is a cylindrical device comprising a plurality of gratings, and the grating roller realizes the emission and reception of light through unilateral diffuse reflection.

[0089] For example, when the gate swing starts to operate, the photosensitive component 401 can emit multiple light rays toward the gate swing, wherein some of the light rays will be periodically blocked by the gate swing. The photosensitive component 401 can determine the degree of blocking based on the reflected light rays, and thus obtain the speed of the gate swing.

[0090] In some embodiments, the photosensitive component 401 can be a grating sensor, which can determine the gate swing speed based on the change of the light signal. For example, the speed measuring component 400 can include multiple grating sensors, wherein the grating sensor can be located at the connection between the support component 200 and the first gate 101, or the grating sensor can be located at the connection between the support component 200 and the second gate 102, and can also be located at other positions of the support component 200.

[0091] Exemplarily, the speed measuring component 400 may include two grating sensors, wherein the first grating sensor is located at the connection between the supporting component 200 and the first gate machine 101, and the second grating sensor is located at the first position of the supporting component 200, wherein the first position may be the position where the edge of the gate swing corresponds to the support component when the gate swing is closed. The speed measuring component 400 can obtain the speed of the gate swing based on the changes in the light signals of the first grating sensor and the second grating sensor.

[0092] It should be noted that the first position can be a position where the second grating sensor is located 5 cm, 10 cm or 15 cm away from one end of the support component. This embodiment of the present application does not limit this. It is preferably a position corresponding to the gate swing edge on the support component.

[0093] For example, when the second grating sensor is in the first position 1, it indicates that the distance between the second grating sensor and one end of the supporting component is 5 cm; when the second grating sensor is in the first position 2, it indicates that the distance between the second grating sensor and one end of the supporting component is 10 cm; when the second grating sensor is in the first position 3, it indicates that the distance between the second grating sensor and one end of the supporting component is 15 cm.

[0094] Next, combine Figure 3 , through specific examples, the testing process of the gate test equipment is explained.

[0095] Figure 3 For a schematic diagram of the test process of the gate test equipment provided in the embodiment of this application, please see Figure 3 , including a supporting component 200, a force measuring component 300, a speed measuring component 400, a first gate 101 and a second gate 102.

[0096] The gate test equipment 100 is based on the support component 200 and is connected to the first gate 101 and the second gate 102. After the gate test equipment 100 determines that the force measuring component 300 and the speed measuring component 400 are turned on, if the force measuring component 300 does not receive the impact force, the force measuring component 300 can remain in a standby state; if the speed measuring component 400 does not receive the information of being blocked by the gate swing, the speed measuring component 400 can remain in a standby state.

[0097] If the force measuring component 300 receives the impact force of the gate swing, the gate test equipment 100 can obtain the impact force measured by the force measuring component 300. If the force measuring component 300 receives information blocked by the gate swing, the gate test equipment 100 can obtain the gate swing speed measured by the speed measuring component 400. For any test, the force measuring component 300 can be moved to different positions to measure the impact force of the gate swing.

[0098] In an embodiment of the present application, the gate test equipment includes a supporting component, a force measuring component and a speed measuring component. The force measuring component can measure the impact force of the gate pendulum, and the speed measuring component can measure the rotation speed of the gate pendulum. In the above process, since the gate test equipment can be fixed on the inner side of the first gate and the second gate, the gate test equipment can perform on-site testing on the gate pendulum without the need for manual disassembly of the gate pendulum or inspection. Moreover, the terminal device can accurately determine whether the motion performance of the gate pendulum meets the requirements based on the impact force and speed measured by the gate test equipment. In this case, the gate test equipment can adapt to the testing needs of gates with different spacings. This process is less time-consuming and improves the efficiency and accuracy of the gate test.

[0099] Based on any of the above embodiments, Figure 4 、 Figure 5 and Figure 6 , the structure of the gate test equipment is explained in detail.

[0100] Figure 4 This is a structural diagram of another gate test device provided in an embodiment of the present application. Figure 5 for Figure 4 Side view of the gate test equipment.

[0101] The gate test equipment 100 further includes a sliding component 301 , which is connected to the supporting component 200 . The sliding component 301 corresponds to the gate swing of the first gate 101 and the second gate 102 . The force measuring component 300 is mounted on the sliding component 301 .

[0102] The sliding component 301 can be used to fix the force measuring component 300 . For example, the sliding component 301 can be a slider.

[0103] The sliding component 301 can be sleeved on the supporting component 200 , and the force measuring component 300 can be fixed on one side of the sliding component 301 , and the force measuring component 300 is aligned with the gate swing.

[0104] In some embodiments, there is a groove, i.e., a slide groove, on the side of the support component 200 close to the gate swing, and correspondingly, there is a protruding portion on one side of the inner surface of the sliding component 301 (close to the gate swing), wherein the protruding portion of the sliding component 301 matches the groove of the support component 200, and the protruding portion is slid into the slide groove.

[0105] Exemplarily, the sliding component 301 can move in the slide groove on the surface of the support component 200, that is, the force measuring component 300 can move on the support component 200 based on the sliding component 301 to measure the impact force at multiple positions on the gate swing, and the sliding component 301 can be fixed to the support component by a lock to avoid measurement deviation during the force measurement process. For example, the lock can be located at the bottom of the sliding component 301.

[0106] Optionally, the sliding component 301 may include a motor, that is, the motor may drive the sliding component 301 and the force-measuring component 300 to move on the supporting component 200 .

[0107] Figure 6 Schematic diagram of the test process of the gate test equipment provided in an embodiment of the present application.

[0108] Next, the working process of the gate test device 100 is described through the sliding component 301:

[0109] like Figure 6 As shown, when the gate test equipment 100 performs the first test, the force measuring component 300 can slide to the first position of the support component 200 based on the sliding component 301, and the force measuring component 300 can measure the impact force of the gate swing at the first position. When the gate test equipment 100 performs the second test, the force measuring component can slide to the second position of the support component 200 based on the sliding component 301, and the force measuring component 300 can measure the impact force on the gate swing at the second position. By analogy, the force measuring component can measure the impact force at multiple positions on the gate swing, thereby improving the accuracy of the gate swing test.

[0110] In the embodiment of the present application, because the force-measuring component can be moved on the support component based on the sliding component, the force-measuring component can measure the impact force at multiple positions of the gate swing without repeated disassembly and assembly, thereby reducing human error during the measurement process. In this structure, while improving the reliability of the gate test equipment, it also improves the accuracy of the impact force measurement results.

[0111] Based on any of the above embodiments, Figure 7 , the structure of the gate test equipment is explained in detail.

[0112] Figure 7 This is a structural diagram of another gate test device provided in an embodiment of the present application. The gate test device 100 further includes a first suction cup 201 and a second suction cup 202. The support component 200 includes a first end and a second end, wherein:

[0113] The first suction cup 201 is connected to the first end, and the second suction cup 202 is connected to the second end. The first suction cup is adsorbed on the inner side of the first gate 101 , and the second suction cup 202 is adsorbed on the inner side of the second gate 102 .

[0114] The gate testing device 100 can be connected to the first gate 101 and the inner side of the first gate 101 based on the first suction cup 201 and the second suction cup 202 .

[0115] The first suction cup 201 can be used to fix the first end of the supporting component 200 on the first gate 101, wherein one end of the first suction cup 201 is adsorbed and connected to the first gate 101, and the other end of the first suction cup 201 is connected to the first end of the supporting component 200 to ensure that the gate test equipment is easy to disassemble.

[0116] The second suction cup 202 can be used to fix the second end of the supporting component 200 on the second gate 102, wherein one end of the second suction cup 202 is adsorbed and connected to the second gate 102, and the other end of the second suction cup 202 is connected to the second end of the supporting component 200. In this way, the complexity of disassembly of the gate test equipment can be reduced, thereby improving the disassembly efficiency of the gate test equipment.

[0117] Optionally, the first suction cup 201 and the second suction cup 202 may be adhered to the support component 200 or may be fixedly connected to the support component, which is not limited in this embodiment of the present application.

[0118] Next, combine Figure 8 , the structure of the supporting component is explained through specific examples.

[0119] Figure 8 For a schematic diagram of the structure of the support component provided in the embodiment of this application, please see Figure 5 The first end of the support component 200 is connected to the first gate 101 through the first suction cup 201, and the second end of the support component 200 is connected to the second gate 102 through the second suction cup 202, wherein the first end and the second end of the support component 200 are represented by a dotted rectangular frame.

[0120] The gate test device 100 further includes a screw 203, and the first suction cup 201 and the second suction cup 202 are connected to the support component 200 via the screw 203. For example, the gate test device 100 may include a plurality of screws 203 to adjust the length in real time.

[0121] The screw 203 can be used to adjust the length of the gate testing device 100 .

[0122] Exemplarily, the gate test device 100 includes a first screw 204 and a second screw 205. The first screw 204 and the second screw 205 can be inserted into the support member 200. The support member 200 has a first threaded hole at a first end and a second threaded hole at a second end. One end of the first screw 204 is inserted into and engaged with the first threaded hole, and the other end of the first screw 204 is connected to the first suction cup 201. One end of the second screw 205 is inserted into and engaged with the second threaded hole, and the other end of the second screw 205 is connected to the second suction cup 202.

[0123] In the embodiment of the present application, since the first suction cup and the second suction cup can fix the gate test device to the inner side of the first gate and the second gate, the gate test device can be quickly installed and disassembled. Moreover, since the screw has the telescopic characteristic, this characteristic can change the length of the gate test device to adapt to the dual gate channels with different spacings. In the above structure, the gate test device can be quickly installed and disassembled on site, thereby reducing the time for installing and disassembling the gate swing. Moreover, based on the telescopic characteristic of the screw, the gate test device can meet different gate test requirements, thereby improving the efficiency and accuracy of the gate test device.

[0124] Based on any of the above embodiments, Figure 9 , the structure of the gate test equipment is explained in detail.

[0125] Figure 9 This is a structural diagram of another gate testing device provided in an embodiment of the present application. The gate testing device 100 also includes a control device 500.

[0126] Optionally, the control device 500 may be connected to the supporting component 200 .

[0127] Exemplarily, the control device 500 is located inside the support component 200 and is laid on the bottom of the support component 200 to ensure communication connection with other components.

[0128] In some embodiments, the control device 500 can be connected to the force measuring component 300 and the speed measuring component 400, and the control device 500 can also be connected to an external terminal device. For example, the control device 500 can be connected to the terminal device through an RS485, Wife or other interface.

[0129] Next, combine Figure 10 , the structure of the control device is explained through specific examples.

[0130] Figure 10 For a schematic diagram of the structure of the control device provided in the embodiment of the present application, please refer to Figure 10The control device 500 includes a first interface, a second interface, a third interface and a power interface.

[0131] Among them, the first interface of the control device 500 is connected to the force measuring component 300 to receive the information of the impact force measured by the force measuring component 300; the second interface of the control device 500 is connected to the speed measuring component 400 to receive the information of the speed measured by the speed measuring component 400; the terminal device can send control instructions to the control device 500 based on the information of the impact force measured by the force measuring component 300 of the control device 500 and the information of the speed measured by the speed measuring component 400; the control device 500 can be connected to a DC 24V (DC24V) power supply through the power interface.

[0132] Below, the working process of the gate test equipment is explained through the control device:

[0133] The gate test device 100 is connected to the first gate 101 and the second gate 102 based on the first suction cup 201 and the second suction cup 202. The force measuring component 300 can move to position 1, position 2, position 3, etc. of the support component 200 based on the sliding component 301.

[0134] For the position of any supporting component 200, after the gate test equipment 100 determines that the force measuring component 300, the sliding component 301 and the speed measuring component 400 are in the open state, the force measuring component 300 can measure the impact force and send the impact force to the control device 500. The control device 500 can send the impact force to the terminal device. The terminal device determines whether the impact force of the gate swing meets the requirements based on the impact force. The speed measuring component 400 can measure information associated with the time length from opening to closing of the gate swing and send the information to the control device 500. The control device 500 can determine the time length from opening to closing of the gate swing based on the information and send the time length to the terminal device. The terminal device can determine whether the speed of the gate swing meets the requirements based on the time length.

[0135] In an embodiment of the present application, the gate test equipment can be connected to the inner side of the first gate and the second gate based on the first suction cup and the second suction cup, and the gate test equipment can adapt to dual gate channels with different spacings based on the retractable characteristics of the screw, and the control device can obtain the impact force measured by the force measuring component, and determine the speed of the gate swing based on the information measured by the speed measuring component, and send these data to the terminal device. In the above process, the gate test equipment can be quickly installed and disassembled on site without the need for manual disassembly of the gate swing or inspection, and the terminal device can accurately determine whether the movement performance of the gate swing meets the requirements based on the impact force and the gate swing speed, thereby improving the efficiency and accuracy of the gate test.

[0136] Based on any of the above embodiments, Figure 11 , a detailed description is given of the method for the above-mentioned gate machine testing equipment to test the status of the gate machine.

[0137] Figure 11 This is a flow chart of a gate test method provided in an embodiment of the present application. Figure 11 , the method may include:

[0138] S1101. Determine a first striking force and / or a first duration of a gate swing.

[0139] The first striking force may be used to indicate the striking force generated when the gate swing rotates, wherein the unit of the first striking force is Newton (N).

[0140] In some embodiments, the first striking force may include multiple striking forces. For example, the gate test equipment may test the striking forces at multiple positions on the gate swing, and the terminal device may obtain the striking forces at multiple positions on the gate swing, and determine the striking forces at multiple positions on the gate swing as the first striking force. For example, the positions on the gate swing may include position 1, position 2, and position 3. The terminal device may obtain striking force A corresponding to position 1, striking force B corresponding to position 2, and striking force C corresponding to position 3. The terminal device may determine striking force A, striking force B, and striking force C as the first striking force.

[0141] In some embodiments, the terminal device can determine the first striking force based on a signal measured by a force-measuring component. For example, the force-measuring component is a pressure sensor. When the gate swing strikes the pressure sensor, the pressure sensor can receive a pressure signal. After the pressure sensor converts the pressure signal into an electrical signal, the electrical signal can be sent to a control device. The control device can send the electrical signal to the terminal device. The terminal device can determine the first striking force of the gate swing based on the electrical signal. For example, the terminal device can determine a correspondence between the electrical signal and the striking force, and determine the first striking force of the gate swing based on the received electrical signal and the correspondence.

[0142] In some embodiments, the terminal device can determine the first striking force of the gate swing based on the pressure measured by the force-measuring component. For example, when the gate swing strikes the force-measuring component, the elastic structure on the surface of the force-measuring component deforms. The force-measuring component can determine a pressure value based on the degree of deformation and send the pressure value to the control device. The control device can send the pressure value to the terminal device, and the terminal device can determine the striking force of the gate swing based on the pressure value. For example, the force-measuring component can be a dynamometer. When the gate swing strikes the dynamometer, if the pressure measured by the dynamometer is 10N, the terminal device can determine that the first striking force of the gate swing is 10N.

[0143] The first duration can be used to indicate the speed of the gate swing. For example, the first duration can be used to indicate the speed of the gate swing. For example, the first duration can be used to indicate the angular velocity of the gate swing. For example, after determining the first duration, the terminal device can determine the speed of the gate swing based on the angle of the gate swing rotation during the first duration and the first duration.

[0144] It should be noted that when the gate swing rotates at the same angle, the shorter the time required for the gate swing, the faster the gate swing speed, and the longer the time required for the gate swing, the slower the gate swing speed.

[0145] In some embodiments, the unit of the first duration is milliseconds (ms). It should be noted that the unit of the first duration may also be any time unit such as seconds, and the embodiments of the present disclosure are not limited to this.

[0146] The terminal device can determine the first duration of the gate swing based on the following feasible implementation method: determine the first parameter of the speed measuring component; and determine the first duration based on the first parameter.

[0147] The first parameter may be used to indicate the degree to which the speed measuring component is blocked. For example, the degree to which the speed measuring component is blocked by the gate swing, in other words, the degree to which the speed measuring component is blocked by the gate swing.

[0148] In some embodiments, the first parameter may be the number of reflected light spots, and the speed measuring component may be a grating roller. The control device may determine the number of blocked light spots on the grating roller by analyzing the changes in the unilateral diffusely reflected light spots on the grating roller, and send the number of blocked light spots to the terminal device. The terminal device may determine the number of blocked light spots as the first parameter.

[0149] In some embodiments, the number of reflected light spots is proportional to the degree to which the speed measuring component is obscured. For example, a fewer number of reflected light spots indicates a smaller area on the gate swing that reflects light, i.e., a smaller area of ​​the speed measuring component obscured by the gate swing. A greater number of reflected light spots indicates a larger area on the gate swing that reflects light, i.e., a larger area of ​​the speed measuring component obscured by the gate swing.

[0150] In some embodiments, the speed measuring component may include a sensor, and the first parameter may indicate the state of an indicator light of the sensor. The terminal device may determine whether the sensor is blocked by the gate swing based on the state of the indicator light of the sensor. For example, if the indicator light of the sensor is on, the terminal device may determine that the position of the sensor is blocked by the gate swing; if the indicator light of the sensor is off, the terminal device may determine that the position of the sensor is not blocked by the gate swing.

[0151] In some embodiments, the speed measuring component may include multiple sensors, and the terminal device may determine the degree to which the speed measuring component is blocked based on the states of indicator lights of the multiple sensors.

[0152] For example, the speed measuring component includes sensors 1, 2, 3, and 4. The length of the speed measuring component is 40 centimeters. Sensor 1 is located 10 centimeters from the left edge of the speed measuring component, sensor 2 is located 20 centimeters from the left edge of the speed measuring component, sensor 3 is located 30 centimeters from the left edge of the speed measuring component, and sensor 4 is located 40 centimeters from the left edge of the speed measuring component (sensor 4 is located on the right edge of the speed measuring component). When the indicator light of sensor 1 changes from off to on, the terminal device can determine that the speed measuring component is 25% blocked. When the indicator light of sensor 2 changes from off to on, the terminal device can determine that the speed measuring component is 50% blocked. When the indicator light of sensor 3 changes from off to on, the terminal device can determine that the speed measuring component is 75% blocked. When the indicator light of sensor 4 changes from off to on, the terminal device can determine that the speed measuring component is 100% blocked.

[0153] It should be noted that the terminal device can determine the first parameter of the speed measurement component based on any feasible implementation method, and the embodiment of the present disclosure is not limited to this.

[0154] In some embodiments, the terminal device may determine the first duration based on the degree of obstruction of the speed measuring component indicated by the first parameter. For example, the first duration may be the duration required for the speed measuring component to be completely obstructed by the gate swing. For example, the first duration may also be the duration required for the gate swing to transition from open to closed. In other words, the first duration may be the duration required for the gate swing to achieve maximum obstruction of the speed measuring component (maximum area of ​​the speed measuring component obstructed by the gate swing).

[0155] For example, if the gate swing can completely block the speed measuring component when it is closed, the first time duration may be the time duration between the moment when the speed measuring component begins to be blocked by the gate swing and the moment when the speed measuring component is completely blocked by the gate swing. If the gate swing cannot completely block the speed measuring component when it is closed, the first time duration may be the time duration between the moment when the speed measuring component begins to be blocked by the gate swing and the moment when the gate swing blocks the speed measuring component to the maximum extent.

[0156] In some embodiments, the first duration may also be the duration required for the speed measuring component to be blocked by 50%, the duration required for the speed measuring component to be blocked by 75%, etc., which is not limited in the embodiments of the present disclosure.

[0157] In some embodiments, the terminal device may determine the time corresponding to the degree of obstruction based on the time at which the speed measuring component determines the first parameter. For example, the speed measuring component determines first parameter A at time 1 and first parameter B at time 2. If first parameter A indicates that the speed measuring component is 50% obstructed and first parameter B indicates that the speed measuring component is 100% obstructed, the terminal device may determine that the speed measuring component is 50% obstructed by the gate swing at time 1 and 100% obstructed by the gate swing at time 2.

[0158] Exemplarily, the first duration may be the duration required for the speed measuring component to be completely blocked by the gate swing, where first parameter A indicates that the speed measuring component is blocked by 1%, and first parameter B indicates that the speed measuring component is blocked by 100%. The speed measuring component determines first parameter A at 1ms and first parameter B at 10ms. The terminal device may determine that the duration required for the speed measuring component to be completely blocked is 9ms, that is, the terminal device may determine that the first duration is 9ms.

[0159] S1102: Determine the state of the gate based on the first striking force and / or the first duration.

[0160] The status is an alarm status or a non-alarm status.

[0161] When the gate is in the alarm state, the terminal device may determine that the gate has failed the test. For example, if the gate is in the alarm state, it means that the first striking force and / or first duration of the gate swing of the gate do not meet the requirements.

[0162] The non-alarm state can indicate that the gate test has passed.

[0163] In some embodiments, the terminal device may determine the state of the gate based on the first striking force. If the difference between the first striking force and the standard striking force is greater than a first preset deviation, the terminal device may determine that the gate is in an alarm state; if the difference between the first striking force and the standard striking force is less than or equal to the first preset deviation, the terminal device may determine that the gate is in a non-alarm state. The standard striking force is used to indicate a preset maximum striking force value that the gate can achieve.

[0164] In some embodiments, the terminal device may determine the state of the gate based on multiple first striking forces. Among the multiple first striking forces, if at least one first striking force exceeds a preset threshold, the terminal device may determine that the gate is in an alarm state; if all first striking forces do not exceed the preset threshold, the terminal device may determine that the gate is in a non-alarm state. The preset threshold is used to indicate a preset maximum striking force reached by the gate swing.

[0165] Optionally, among multiple first striking forces, if the number of times the first striking force exceeds the preset threshold exceeds the preset number, the terminal device can determine that the state of the gate is an alarm state; if the number of times the first striking force exceeds the threshold does not exceed the preset number, the terminal device can determine that the state of the gate is a non-alarm state, wherein the preset number is used to indicate a pre-set maximum number of first striking forces that does not meet the requirements.

[0166] In some embodiments, the terminal device may determine the state of the gate based on a first duration. If the difference between the first duration and the standard duration is greater than a second preset deviation, the terminal device may determine that the gate is in an alarm state; if the difference between the first duration and the standard duration is less than or equal to the second preset deviation, the terminal device may determine that the gate is in a non-alarm state. The standard duration is used to indicate a preset speed that the gate needs to reach.

[0167] In some embodiments, the terminal device may determine the state of the gate based on the first striking force and the first duration. Specifically, if the difference between the first striking force and the standard striking force is greater than a first preset deviation, or the difference between the first duration and the standard duration is greater than a second preset deviation, the terminal device may determine that the gate is in an alarm state; if the difference between the first striking force and the standard striking force is less than or equal to the first preset deviation, and the difference between the first duration and the standard duration is less than or equal to the second preset deviation, the terminal device may determine that the gate is in a non-alarm state.

[0168] In some embodiments, the terminal device may also display a prompt message, wherein the prompt message may be associated with the alarm status. For example, the prompt message may be used to indicate whether the gate is in an alarm state or a non-alarm state. For example, after determining the gate state, the terminal device may determine a prompt message based on the gate state and display the prompt message.

[0169] Exemplarily, when the terminal device determines that the state of the gate is an alarm state, the terminal device generates a text message, the text content of which is that the first time length is 2ms, and displays that the first time length has exceeded the preset time length of 5ms, and an alarm is issued.

[0170] In some embodiments, after the terminal device determines the status of the gate, it can indicate the status of the gate based on the alarm light. For example, when the alarm light is green, it means the gate is in a non-alarm state, when it is red, it means the gate is in an alarm state, and when it is flashing, it means the gate is in an alarm state.

[0171] In actual application, the terminal device can increase the first duration by increasing the gate swing speed, and can increase the first impact force by increasing the gate swing torque.

[0172] In an embodiment of the present application, the terminal device determines the state of the gate by obtaining the first striking force and / or the first duration of the gate swing from opening to closing, and based on the first striking force and / or the first duration, the terminal device can also determine whether the motion performance of the gate swing meets the requirements based on the state of the gate. In the above process, the terminal device can analyze the striking force and speed of the gate swing through the gate test equipment to ensure the reliability and safety of the gate swing, thereby improving the efficiency and accuracy of the gate test.

[0173] Figure 12 This is a schematic diagram of the structure of a gate test device provided in an embodiment of the present application. Figure 12 The gate test device 10 includes: a determination module 11 and a processing module 12, wherein:

[0174] The determining module 11 is used to determine a first striking force and / or a first duration of the gate swing, wherein the first duration is used to indicate a speed of the gate swing;

[0175] The processing module 12 is configured to determine a state of the gate based on the first striking force and / or the first duration, where the state is an alarm state or a non-alarm state.

[0176] In a possible implementation, the determining module 11 is specifically configured to:

[0177] determining a first parameter of a speed measuring component, where the first parameter is used to indicate a degree to which the speed measuring component is blocked;

[0178] Based on the first parameter, the first duration is determined.

[0179] The gate testing device provided in the embodiment of the present application can execute the method shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0180] Figure 13 This is a schematic diagram of the structure of the electronic device provided in the embodiment of the present application. Figure 13 As shown, the electronic device 20 may include: a transceiver 21 , a processor 22 , and a memory 23 .

[0181] The processor 22 executes the computer-executable instructions stored in the memory, so that the processor 22 implements the solutions in the above-mentioned embodiments. The processor 22 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0182] The memory 23 is connected to the processor 22 via a system bus and communicates with the processor 22. The memory 23 is used to store computer program instructions.

[0183] The transceiver 21 may be used to obtain tasks to be executed and configuration information of the tasks to be executed.

[0184] The system bus can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, among others. System buses can be divided into address buses, data buses, and control buses. For ease of illustration, the diagram uses only a single thick line, but this does not imply a single bus or type of bus. Transceivers enable communication between the database access device and other computers (such as clients, read-write libraries, and read-only libraries). Memory may include random access memory (RAM) and non-volatile memory.

[0185] The electronic device provided in the embodiment of the present application may be the terminal device of the above embodiment.

[0186] An embodiment of the present application also provides a chip for running instructions, which is used to execute the technical solution of the gate test method in the above embodiment.

[0187] An embodiment of the present application further provides a computer-readable storage medium, in which computer instructions are stored. When the computer instructions are executed on a computer, the computer executes the technical solution of the gate testing method in the above embodiment.

[0188] An embodiment of the present application also provides a computer program product, which includes a computer program stored in a computer-readable storage medium. At least one processor can read the computer program from the computer-readable storage medium. When at least one processor executes the computer program, it can implement the technical solution of the gate testing method in the above embodiment.

[0189] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods, such as multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interface, device or module, which can be electrical, mechanical or other forms.

[0190] Modules described as separate components may or may not be physically separate, and components shown as modules may or may not be physical units, that is, they may be located in one place or distributed across multiple network elements. Some or all of these modules may be selected to implement the solution of this embodiment based on actual needs.

[0191] In addition, the functional modules in the various embodiments of the present application may be integrated into a single processing unit, or each module may exist physically separately, or two or more modules may be integrated into a single unit. The above-mentioned modules may be implemented in the form of hardware or hardware plus software functional units.

[0192] The integrated modules implemented in the form of software function modules can be stored in a computer-readable storage medium. The software function modules stored in a storage medium include a number of instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) or a processor to execute some of the steps of the methods of various embodiments of the present application.

[0193] It should be understood that the processor described above may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. A general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the present invention may be directly executed by a hardware processor or by a combination of hardware and software modules within the processor.

[0194] The memory may include a high-speed RAM memory, and may also include non-volatile storage NVM, such as at least one disk memory, and may also be a USB flash drive, a mobile hard disk, a read-only memory, a magnetic disk or an optical disk.

[0195] A bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Buses can be categorized as address buses, data buses, and control buses. For ease of illustration, the buses in the drawings of this application are not limited to just one bus or just one type of bus.

[0196] The storage medium may be implemented by any type of volatile or non-volatile memory device, or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. The storage medium may be any available medium that can be accessed by a general-purpose or special-purpose computer.

[0197] An exemplary storage medium is coupled to a processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be an integral part of the processor. The processor and the storage medium can be located in an application specific integrated circuit (ASIC). Of course, the processor and the storage medium can also exist as discrete components in an electronic control unit or a main control device.

[0198] Those skilled in the art will appreciate that all or part of the steps in the above-described method embodiments can be implemented using hardware associated with program instructions. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above-described method embodiments. The aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.

[0199] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some or all of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A gate test device, applied to a first gate and a second gate, characterized in that: It includes supporting parts, sliding parts, force measuring parts and speed measuring parts, among which: The force measuring component is connected to the supporting component, the speed measuring component is connected to the supporting component, the supporting component is connected to the first gate and the second gate, and the supporting component is a retractable structure; The force measuring component is used to measure the impact force of the first gate machine and the second gate machine, and the speed measuring component is used to measure the speed of the first gate machine and the second gate machine; The sliding component is connected to the supporting component, the sliding component corresponds to the gate swings of the first gate machine and the second gate machine, and the force measuring component is installed on the sliding component.

2. The gate test equipment according to claim 1, characterized in that: The speed measuring component is a photosensitive component, which is installed on the supporting component and corresponds to the gate swing of the first gate machine and the second gate machine.

3. The gate test equipment according to any one of claims 1-2, characterized in that: The gate test device further includes a first suction cup and a second suction cup, and the supporting component includes a first end and a second end, wherein: The first suction cup is connected to the first end, the second suction cup is connected to the second end, the first suction cup is adsorbed on the inner side of the first gate, and the second suction cup is adsorbed on the inner side of the second gate.

4. The gate test equipment according to claim 3, characterized in that: The gate testing device further includes a screw, and the first suction cup and the second suction cup are connected to the supporting component via the screw.

5. A gate machine testing method, characterized in that: The method for detecting the state of a gate machine using the gate machine testing device according to any one of claims 1 to 4 comprises: determining a first striking force of a gate pendulum and / or a first duration indicating a speed of the gate pendulum; Based on the first striking force and / or the first duration, a state of the gate is determined, where the state is an alarm state or a non-alarm state.

6. The method according to claim 5, characterized in that Determine the first duration of the gate swing, including: determining a first parameter of a speed measuring component, where the first parameter is used to indicate a degree to which the speed measuring component is blocked; Based on the first parameter, the first duration is determined.

7. A gate machine testing device, characterized in that: The gate test device applied to any one of claims 1 to 4 comprises: a determination module and a processing module, wherein: The determining module is used to determine a first striking force of the gate swing and / or a first duration for indicating a speed of the gate swing; The processing module is configured to determine a state of the gate based on the first striking force and / or the first duration, where the state is an alarm state or a non-alarm state.

8. An electronic device, characterized in that: include: a processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 5 to 6.

9. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 5 to 6 when executed by a processor.

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