Automatic equipment testing method and device, electronic equipment and readable storage medium

Abstract

The invention provides an automatic equipment testing method and device, electronic equipment and a readable storage medium. The method comprises the steps that a mechanical arm is controlled to put equipment to be tested into a first testing jig for testing; acquiring a first test result of the to-be-tested equipment, and judging whether the first test result is abnormal or not; if the first test result is abnormal, controlling a mechanical arm to move the to-be-tested equipment into a second test fixture for testing; and a second test result of the to-be-tested device is acquired, a target test result of the to-be-tested device is determined according to the second test result, and the second test result is a test result output by the second test fixture. When the test result of the to-be-tested equipment is abnormal, the to-be-tested equipment is tested through another test fixture, so that the deviation of the test result caused by the test fixture can be eliminated as much as possible, and the more accurate test result can be determined; meanwhile, manual intervention for retesting is not needed, and the testing efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the field of device testing, and particularly to an automatic device testing method, apparatus, electronic device, and readable storage medium. Background Art

[0002] Traditionally, the testing of intelligent devices such as mobile phones is usually carried out manually; manual operation has low efficiency, it is difficult to guarantee the testing accuracy, repetitive work is prone to cause fatigue and errors, etc., and it is difficult to ensure the accuracy and consistency of testing; for this reason, an automatic testing solution is set in the prior art; however, during the automatic testing process, when the testing result of the device is abnormal, manual retesting is required, which reduces the testing efficiency. Summary of the Invention

[0003] The main object of the present invention is to propose an automatic device testing method, apparatus, electronic device, and readable storage medium, aiming to solve the problem that manual retesting is required when the testing result of the device is abnormal in the prior art.

[0004] To achieve the above object, the present invention provides an automatic device testing method, and the method includes the steps of:

[0005] Controlling a robotic arm to place a device under test into a first test fixture for testing;

[0006] Obtaining a first test result of the device under test, and determining whether the first test result is abnormal, wherein the first test result is the test result output by the first test fixture;

[0007] If the first test result is abnormal, controlling the robotic arm to move the device under test to a second test fixture for testing;

[0008] Obtaining a second test result of the device under test, and determining a target test result of the device under test according to the second test result, wherein the second test result is the test result output by the second test fixture.

[0009] Optionally, the controlling the robotic arm to move the device under test to a second test fixture for testing includes:

[0010] Controlling the robotic arm to move the device under test to an abnormal station;

[0011] Determining the second test fixture from optional test fixtures, wherein the optional test fixtures do not include the first test fixture;

[0012] Controlling the robotic arm to move the device under test from the abnormal station to the second test fixture for testing.

[0013] Optionally, determining the second test fixture in the optional test fixture includes:

[0014] Determining the test yield corresponding to each of the optional test fixtures;

[0015] Taking the optional test fixture with the highest test yield as the second test fixture.

[0016] Optionally, if the first test result is abnormal, controlling the robotic arm to move the device under test to the second test fixture for testing includes:

[0017] If the first test result is abnormal, determining the target retest fixture;

[0018] Judging whether the first test fixture belongs to the target retest fixture;

[0019] If the first test fixture belongs to the target retest fixture, controlling the robotic arm to move the device under test to the second test fixture for testing.

[0020] Optionally, controlling the robotic arm to place the device under test into the first test fixture for testing includes:

[0021] Determining the first test fixture in the test fixture and controlling the robotic arm to move to the waiting position corresponding to the first test fixture;

[0022] Obtaining the current position state of the first test fixture and judging whether the current position state is the same as the preset placement state;

[0023] If the current position state is different from the preset placement state, adjusting the position state of the first test fixture to the preset placement state and then controlling the robotic arm to place the device under test into the first test fixture for testing.

[0024] Optionally, after judging whether the first test result is abnormal includes:

[0025] Obtaining the cumulative number of abnormal times of the first test fixture, where the cumulative number of abnormal times is the number of times that the first test result output by the first test fixture is abnormal;

[0026] Judging whether the cumulative number of abnormal times is greater than the preset abnormal threshold;

[0027] If the cumulative number of abnormal times is greater than the preset abnormal threshold, stopping the test operation through the first test fixture.

[0028] Optionally, after determining the target test result of the device under test according to the second test result includes:

[0029] Determine whether the second test result is abnormal or passed;

[0030] If the second test result is abnormal, move the device under test to the abnormal position by the robotic arm;

[0031] If the second test result is passed, move the device under test to the discharging position by the robotic arm.

[0032] To achieve the above object, the present invention further provides an automatic device for testing equipment, the automatic device for testing equipment includes a control terminal, a robotic arm and a test fixture; the control terminal is respectively connected to the robotic arm and the test fixture; wherein, the control terminal includes:

[0033] A first control module, configured to control the robotic arm to place the device under test into a first test fixture for testing;

[0034] A first acquisition module, configured to acquire the first test result of the device under test and determine whether the first test result is abnormal, wherein the first test result is the test result output by the first test fixture;

[0035] A second control module, configured to, if the first test result is abnormal, control the robotic arm to move the device under test into a second test fixture for testing;

[0036] A second acquisition module, configured to acquire the second test result of the device under test and determine the target test result of the device under test according to the second test result, wherein the second test result is the test result output by the second test fixture.

[0037] To achieve the above object, the present invention further provides an electronic device, the electronic device includes a memory, a processor and a computer program stored on the memory and executable on the processor, and when the computer program is executed by the processor, the steps of the above-mentioned automatic device testing method are implemented.

[0038] To achieve the above object, the present invention further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the above-mentioned automatic device testing method are implemented.

[0039] An automatic device testing method, device, electronic device, and readable storage medium proposed by the present invention control a robotic arm to place a device under test into a first test fixture for testing; obtain a first test result of the device under test and determine whether the first test result is abnormal, where the first test result is the test result output by the first test fixture; if the first test result is abnormal, control the robotic arm to move the device under test to a second test fixture for testing; obtain a second test result of the device under test and determine a target test result of the device under test according to the second test result, where the second test result is the test result output by the second test fixture. When the test result of the device under test is abnormal, re-test it with another test fixture, so as to eliminate the deviation of the test result caused by the test fixture itself as much as possible, and then determine a more accurate test result; at the same time, there is no need for manual intervention in re-testing, improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The accompanying drawings herein are incorporated into the specification and form a part of the specification, showing embodiments consistent with the present invention and, together with the specification, are used to explain the principles of the present invention.

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings required for use in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative efforts.

[0042] Figure 1 It is a schematic flowchart of the first embodiment of the automatic device testing method of the present invention;

[0043] Figure 2 It is a schematic diagram of the overall structure of the automatic device testing device of the present invention;

[0044] Figure 3 It is a schematic diagram of the structure of the automatic device testing device of the present invention;

[0045] Figure 4 It is a schematic diagram of the structure of the test rack assembly in the automatic device testing device of the present invention;

[0046] Figure 5 It is a schematic diagram of the structure of the test station rack in the automatic device testing device of the present invention;

[0047] Figure 6 It is a schematic diagram of the structure of the test station rack in the automatic device testing device of the present invention;

[0048] Figure 7 It is a schematic diagram of the structure of the shelf combination in the automatic device testing device of the present invention;

[0049] Figure 8 It is a schematic structural diagram of the pulling mechanism in the automatic test device of the equipment of the present invention;

[0050] Figure 9 It is a schematic structural diagram of the pulling mechanism in the automatic test device of the equipment of the present invention;

[0051] Figure 10 It is a schematic structural diagram of the electric control box assembly in the automatic test device of the equipment of the present invention;

[0052] Figure 11 It is a schematic structural diagram of the pulling bottom plate of the electric control box in the automatic test device of the equipment of the present invention;

[0053] Figure 12 It is a schematic structural diagram of the electric control box in the automatic test device of the equipment of the present invention;

[0054] Figure 13 It is a schematic structural diagram of the robot assembly in the automatic test device of the equipment of the present invention;

[0055] Figure 14 It is a schematic structural diagram of the robot protective cover in the automatic test device of the equipment of the present invention;

[0056] Figure 15 It is a schematic structural diagram of the robotic arm in the automatic test device of the equipment of the present invention;

[0057] Figure 16 It is a schematic structural diagram of the buffer position in the automatic test device of the equipment of the present invention;

[0058] Figure 17 It is a schematic structural diagram of the abnormal station in the automatic test device of the equipment of the present invention;

[0059] Figure 18 It is a schematic structural diagram of the pipeline assembly in the automatic test device of the equipment of the present invention;

[0060] Figure 19 It is a schematic structural diagram of the pipeline body in the automatic test device of the equipment of the present invention;

[0061] Figure 20 It is a schematic structural diagram of the material taking position in the automatic test device of the equipment of the present invention;

[0062] Figure 21 It is a schematic structural diagram of the material distribution position in the automatic test device of the equipment of the present invention;

[0063] Figure 22 It is a schematic structural diagram of the motor module in the automatic test device of the equipment of the present invention;

[0064] Figure 23Schematic diagram of the translation and rotation component in the automatic test device of the equipment of the present invention;

[0065] Figure 24 Schematic diagram of the translation and rotation module in the automatic test device of the equipment of the present invention;

[0066] Figure 25 Schematic diagram of the structure with a flipping channel in the automatic test device of the equipment of the present invention;

[0067] Figure 26 Schematic diagram of the flipping mechanism in the automatic test device of the equipment of the present invention;

[0068] Figure 27 Schematic diagram of the material distribution module in the automatic test device of the equipment of the present invention;

[0069] Figure 28 Schematic diagram of the secondary positioning module in the automatic test device of the equipment of the present invention;

[0070] Figure 29 Schematic diagram of the lifting and material taking module in the automatic test device of the equipment of the present invention;

[0071] Figure 30 Schematic diagram of the communication structure of the automatic test device of the equipment of the present invention;

[0072] Figure 31 Schematic diagram of the flow direction of the device under test in the automatic test device of the equipment of the present invention;

[0073] Figure 32 Overall flowchart of the automatic test method of the equipment of the present invention;

[0074] Figure 33 Schematic diagram of the module structure of the electronic device of the present invention.

[0075] Explanation of the reference numerals in the drawings:

[0076]

[0077]

[0078] Detailed implementation manners

[0079] It should be understood that the specific embodiments described herein are only for explaining the present invention and are not used to limit the present invention. To enable those skilled in the art to better understand the solution of this application, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in this application without creative efforts shall fall within the scope of protection of this application.

[0080] For the convenience of subsequent description, the structure of the device automatic testing device applied to the device automatic testing method of this application will be described below. Refer to Figure 2 , Figure 2 which is a schematic diagram of the overall structure of the device automatic testing device; the device automatic testing device includes a test rack assembly 1, a robot assembly 2, a pipeline assembly 3, and a pipeline protective cover 4; the test rack assembly 1, the robot assembly 2, and the pipeline protective cover 4 are internally connected, and the pipeline assembly 3 is arranged through the pipeline protective cover 4.

[0081] Refer to Figure 3 , the test rack assembly 1 includes a plurality of test station racks 11, a test fixture 111 is arranged inside the test station rack 11, a fixture display screen 112 is arranged on the side of the test station rack 11, the fixture display screen 112 is correspondingly arranged with the test fixture 111, and the fixture display screen 112 is used to display relevant information of the test fixture 111.

[0082] Refer to Figure 4 , a display screen 113, a keyboard 114, a control button 115, and a card insertion editing program interface 116, etc. are arranged on the back of the test station rack 11; the keyboard 114, the display screen 113, and the control button 115 are used to control the test station rack and display based on the control content; the card insertion editing program interface 116 is used for programming.

[0083] The back of the robot assembly 2 includes an NG position 21, that is, an abnormal position.

[0084] Refer to Figure 5 , the test station rack 11 is provided with an intermediate layer rack combination 117 and an electric control box assembly 118; the intermediate layer rack combination 117 is composed of a base 1171 and a test fixture 111 arranged on the base, and the base 1171 is set to be pullable and slidable, which is convenient for pulling out and repairing separately without affecting the normal operation of other stations.

[0085] Refer to Figure 6, the base 1171 includes a shelf assembly 11711 and a drawer mechanism 11712. The drawer mechanism 11712 is provided corresponding to the test fixture 111 one by one; the drawer mechanism 11712 is arranged on the shelf assembly 11711;

[0086] See Figure 7 , the shelf assembly 11711 includes a partition support 117111, a fixing plate 117112, and an adjusting block 117113; four fixing plates 117112 are respectively arranged at the four corners of the upper plane of the partition support 117111, and four adjusting blocks 117113 are arranged at the four corners of the lower plane of the partition support 117111; the four corners of the partition support 117111 are respectively fixed on the fixed bottom plate by screws and nuts.

[0087] See Figure 8 、 9 , the drawer mechanism 11712 includes a test cabinet drawer bottom plate 117121, a first guide bar 117122, a second guide bar 117123, a bearing carrier plate 117124, a height limit adjusting block 117125, a height limit block 117126, a pin fixing seat 117127, an optical fiber mounting plate 117128, an induction sheet mounting plate 117129, an induction sheet 11712A, a fixing block 11712B, a fixing pin 11712C, a mounting member 11712D, a roller assembly 11712E, a terminal block 11712F, a roller component 11712G, a photoelectric sensor 11712H, and a proximity switch 11712I; wherein, a bearing carrier plate 117124 is arranged on the test cabinet drawer bottom plate 117121, a roller component 11712G is arranged on the bearing carrier plate 117124, a roller assembly 11712E is arranged on the side, and parallel first guide bar 117122 and second guide bar 117123 are arranged on the roller component 11712G; an induction sheet 11712A is arranged through the induction sheet mounting plate 117129 on the inner side of the roller component 11712G, and a height limit adjusting block 117125 and an optical fiber mounting plate 117128 are arranged; the test cabinet drawer bottom plate 117121 is slidably arranged on the roller component 11712G through the first guide bar 117122 and the second guide bar 117123; a height limit block 117126 is arranged at the corresponding position of the inner side of the test cabinet drawer bottom plate 117121 and the height limit adjusting block 117125; the fixing pin 11712C is used to fix the test fixture 111; the mounting member 11712D, the photoelectric sensor 11712H, and the proximity switch 11712I are arranged on the side of the fixed bottom plate.

[0088] See Figure 10, the electric control box assembly 118 is also set to be pull-out and slidable at the bottom, and the internal electrical components of the electric control box can be pulled out for troubleshooting during abnormal troubleshooting. The electric control box assembly 118 includes an electric control box pull-out bottom plate 1181 and an electric control box 1182; the electric control box 1182 is arranged on the electric control box pull-out bottom plate 1181; see Figure 11 , on the electric control box pull-out bottom plate 1181, there are an upper stop block 11812 and a lower stop block 11813 for fixing the correct position of the electric control box 1182, and a pin block 11814 for fixing the side position; on the electric control box pull-out bottom plate 1181, there is also a linear guide rail 11815 for carrying the electric control box; on both sides of the electric control box pull-out bottom plate 1181, there is a first drag chain 11816 for holding.

[0089] See Figure 12 , the electric control box 1182 is provided with an electric control board inside, and the inside of the electric control box is communicated with the outside through a fan 11821 arranged on the electric control box shell; a box door 11822 is arranged on the front of the electric control box, and a platform lock 11823 is arranged on the box door 11822; the bottom of the electric control box 1182 is fixedly connected to the electric control box pull-out bottom plate 11811 through a knob plunger 11824.

[0090] See Figure 13 , the robot assembly 2 includes an external square tube frame 22 and a robot protective cover 23; on the back of the external square tube frame 22, there are a robot touch screen 221, a power electrical switch 222 and an electric control box 223; a robotic arm 224, an industrial computer 225, a robot controller 226, a buffer position 227, and an abnormal station 21 are arranged inside the external square tube frame 22; the robotic arm 224 is respectively connected to the industrial computer 225 and the robot controller 226.

[0091] See Figure 14 , on the front of the robot protective cover 23, there are a touch screen 231 and an operation panel 232 for realizing relevant settings of the robotic arm.

[0092] See Figure 15 , the robotic arm 224 is provided with a jaw structure; on the jaw structure, there are a compression spring 2241, a silica gel suction cup 2242, a first pressing block 2243, a first rubber-coated jaw 2244, a pressure sensor 2245 and a position-inducing sheet 2246; when grasping the device to be tested, the robotic arm 224 presses down, the compression spring 2241 and the guide rod contract to the opposite point height, and the pressure sensor 2245 performs pressure detection to determine whether the device to be tested is pressed; when the device to be tested is pressed, the silica gel suction cup 2242 adsorbs the device to be tested, and the first rubber-coated jaw 2244 contracts to clamp the device to be tested.

[0093] See Figure 16, adjustable limit blocks are arranged around the buffer position 227, such as the front-back and left-right adjustable limit blocks 2271 and the left-right adjustable limit blocks 2272; a in-position sensor 2273 is arranged on the side of the buffer position 227 to detect whether there is a device to be tested on the buffer position 227; a ball plunger 2274 is arranged on the side to block the spacer block.

[0094] See Figure 17 , adjustable limit blocks are arranged around the abnormal station 21, such as the abnormal left-right adjustable limit block 211; an unpacking ejection assembly 212, an in-position groove switch 213, a three-axis cylinder 214 and a surrounding limit block 215 are also arranged under the abnormal station; when there is a device to be tested at the abnormal station 21, press the external button to trigger the three-axis cylinder 214 to descend, so as to eject the abnormal station drawer, so that the device to be tested therein can be taken out.

[0095] See Figure 18 , the pipeline assembly 3 includes a pipeline body 31, a transfer protection cover 32, a transfer module 33, an electric control box 34 and a flipping runner 35; the transfer protection cover 32 is arranged on the pipeline body 31, and the transfer module 33 is arranged in the transfer protection cover 32; the electric control box 34 is connected to the control devices in the pipeline assembly 3.

[0096] See Figure 19 , a material taking position 311, a blanking position 312, a material distributing position 313, a first belt motor 314, a translation and rotation assembly 315, a flipping runner 316, a translation blanking position 317 and a translation material distributing and taking position 318 are arranged on the pipeline body 31; See Figure 20 , a polyoxymethylene (POM) stop block 3111, a three-axis cylinder 3112, a buffer spring 3113, a first pair of photoelectric sensors 3114, a secondary positioning cylinder 3115 and a buffer component 3116 are arranged on the material taking position 311;

[0097] See Figure 21 , a laser sensor 3131, a blocking assembly 3132, a second pair of photoelectric sensors 3133 and a lifting buffer assembly 3134 are arranged on the material distributing position 313; after the blocking assembly 3132 blocks and stops the device to be tested, the second pair of photoelectric sensors 3133 judges whether the incoming material direction of the device to be tested is correct by irradiating the hole features on the product. If it is incorrect, an alarm will be given to take away the product. If it is correct, it will flow to the next station.

[0098] See Figure 22 , the first belt motor 314 is composed of a first motor 3141, a driving wheel 3142, a first transmission belt 3143, a tensioning wheel 3144, a driven wheel 3145, a synchronous wheel 3146, a parallel rod 3147, an idler wheel 3148, an idler wheel adjusting device 3149 and a speed regulator.

[0099] See Figure 23The translation and rotation assembly 315 is composed of a second motor 3151, a tension spring 3152, a slide cylinder 3153, a rotation cylinder 3154, a side plate limit block 3155, a supporting side plate 3156, a second drag chain 3157, a vacuum generator 3158, a limit column 3159, a buffer silicone suction cup 315A, a second rubber-coated clamping claw, and a translation and rotation module; see Figure 24 The translation and rotation module includes a feed lifting cylinder 315B, a material picking upper and lower cylinders 315C, a clamping claw cylinder 315D, a transverse axis motor 315E and a discharge lifting cylinder 315F; the steps for rotating the equipment to be tested include 1. There is material at the feed port (triggering a material signal in the feed area); 2. Feed lifting and jacking (triggering a signal that the feed area is in place); 3. The transverse axis moves to the material picking position, and the upper and lower cylinders press down; 4. Turn on the vacuum suction and clamp the clamping claw (judgment signal); 5. After the conditions are met, the clamping claw is raised and moved to the discharge position; 6. The clamping claw cylinder is pressed down to release the material, and the discharge cylinder descends.

[0100] See also Figure 25 The belt turning flow channel 35 is composed of a turning mechanism 351, a material dividing module 352, a secondary positioning module 353, a lifting and taking material module 354 and a second belt motor 355; see Figure 26 The flipping mechanism 351 is composed of a flipping motor 3511, a coupling 3512, an in-position sensor 3513, a three-axis cylinder 3514, an oil pressure buffer 3515, a second transmission belt 3516, a high-strength rubber 3517, and a parallel mechanical clamp 3518; the process of flipping the device to be tested includes: 1. The product to be tested flows in, and the parallel mechanical clamp 3518 clamps the product to be tested; 2. The three-axis cylinder 3514 extends, and the product to be tested rises; 3. The flipping motor 3511 drives the parallel mechanical clamp 3518 to rotate to be parallel to the assembly line; 4. The three-axis cylinder 3514 retracts, the product to be tested descends, and the product to be tested is released.

[0101] See also Figure 27 The material dividing module 352 is composed of a blocking wheel 3521, a third beam sensor 3522, an adjustable material dividing block 3523, a lifting three-axis cylinder 3524, and a second pressure block 3525; wherein, the blocking wheel 3521 and the adjustable material dividing block 3523 are made of Saigang to avoid scratching the equipment to be tested; when dividing the materials, the material dividing module is first lowered, the product to be tested is blocked, and the equipment to be tested is placed closely together, and after the material dividing module is lifted by the lifting three-axis cylinder 3524, the equipment to be tested behind is blocked, and the current equipment to be tested enters the next station.

[0102] See also Figure 28 The secondary positioning module 353 is composed of a push rod 3531, a spring 3532, and a first three-axis cylinder 3533; wherein the push rod 3531 is made of Saigang steel to prevent the product from being scratched during the secondary positioning process; the spring 3532 plays a buffering role to prevent the product from being scratched during the secondary positioning process.

[0103] See Figure 29 Figure 29 , the lifting and material taking module 354 is composed of a blocking block 3541, a fourth pair of light sensors 3542, and a second three-axis cylinder 3543; when lifting the device under test, when the lifting and material taking module is in the descending state, the device under test flows in, and when the lifting and material taking module is in the lifting state, the manipulator can grasp the device under test after secondary positioning; among them. The contact surface between the blocking block 3541 and the product is rubber-coated to avoid scratching the device under test.

[0104] See Figure 30 Figure 30 , the communication main body of the device automatic testing device mainly includes an assembly line, a robotic arm, a control terminal, and a fixing device; among them, the robotic arm is connected to a router through TCP, and the router is respectively connected to the control terminal and the IPC through TCP, and the control terminal is connected to the fixing device through USB; the IPC is connected to the assembly line through a switch to realize communication, and among them, the number of control terminals can be set to multiple based on actual needs.

[0105] See Figure 31 Figure 31 , the device under test flows in from the assembly line component 3, the robotic arm 224 grabs the device under test from the assembly line, and places the device under test into the test rack component 1 for testing; if the test result of the device under test is OK, the robotic arm 224 grabs the device under test and returns it to the assembly line output along the outflow path; if the test result of the device under test is NG, the robotic arm 224 grabs the device under test and places it in the NG position.

[0106] The present invention provides a device automatic testing method, referring to Figure 1 , Figure 1 Figure 1 is a schematic flowchart of the first embodiment of the device automatic testing method of the present invention, and the method includes the steps:

[0107] Step S10, controlling the robotic arm to place the device under test into the first test fixture for testing;

[0108] The test fixture is used to test the device under test.

[0109] The first test fixture is the first fixture for testing the device under test; the specific structure of the test fixture can be set based on actual needs. The specific type of the device under test can be set based on actual needs, such as mobile phones, watches.

[0110] After the device under test flows from the assembly line to the material taking position, the robotic arm grabs the device under test from the material taking position and moves the device under test to the first test fixture for testing.

[0111] In practical applications, the test status of each currently set test fixture can be monitored. After it is detected that the test of the test fixture is completed, the test fixture is used as the first test fixture for the next device to be tested. At this time, the robotic arm is controlled to grab the device to be tested from the material taking position and move the device to be tested to the first test fixture for testing.

[0112] Step S20: Obtain the first test result of the device to be tested and determine whether the first test result is abnormal, where the first test result is the test result output by the first test fixture.

[0113] After the test operation of the first test fixture on the device to be tested is completed, the first test fixture outputs the first test result.

[0114] The test fixture tests relevant items of the device to be tested. When the test indicates that the device to be tested does not meet the qualified requirements, the output test result indicates that the device to be tested is abnormal; specifically, the qualified requirements can be set based on actual needs.

[0115] Step S30: If the first test result is abnormal, control the robotic arm to move the device to be tested to the second test fixture for testing.

[0116] If the first test result is passed, control the robotic arm to move the device to be tested to the discharging position.

[0117] When the first test result indicates that the device to be tested is abnormal, it may be that the device to be tested does not meet the qualified requirements, or it may be that the problem of the first test fixture causes the test result to deviate, and the device to be tested that originally meets the qualified requirements is determined to be abnormal; therefore, in order to eliminate the influence of the problems of the test fixture itself on the test of the device to be tested as much as possible, in this embodiment, when the first test result is abnormal, the device to be tested is tested again by another test fixture, that is, the second test fixture.

[0118] Step S40: Obtain the second test result of the device to be tested and determine the target test result of the device to be tested according to the second test result, where the second test result is the test result output by the second test fixture.

[0119] After the test operation of the second test fixture on the device to be tested is completed, the second test fixture outputs the second test result.

[0120] After determining the second test result, that is, based on the second test result to determine the final target test result; this embodiment combines multiple test fixtures to determine the test result of the device to be tested, so as to eliminate the deviation of the test result caused by the problems of the test fixture itself and ensure the accuracy of the test result.

[0121] After obtaining the target test result, the device under test can be directly abnormally executed or corresponding subsequent operations can be performed based on the target test result; it can also be retested manually.

[0122] The number of second test fixtures can be one or more. For example, it can be pre-set that when the first test result is abnormal, it is necessary to retest again using several other second test fixtures. If the second test results output by the second test fixtures that reach the preset passing number all indicate that the device under test has passed, the target test result is set to pass. When the second test results output by the second test fixtures that are less than the preset passing number indicate that the device under test is abnormal, the target test result is set to abnormal. The specific value of the preset passing number can be set based on actual needs.

[0123] This embodiment uses another test fixture to test the device under test when the test result is abnormal, thereby eliminating the deviation of the test result caused by the test fixture itself as much as possible, thereby achieving more accurate test result determination; at the same time, there is no need for manual intervention in retesting, which improves test efficiency.

[0124] Further, see also Figure 32 In the second embodiment of the automatic device testing method of the present invention proposed based on the first embodiment of the present invention, the step S10 includes the steps of:

[0125] Step S11, controlling the robot arm to move the device under test to an abnormal position;

[0126] Step S12, determining the second test fixture from the optional test fixtures, wherein the optional test fixtures do not include the first test fixture;

[0127] Step S13, controlling the robot arm to move the device under test from the abnormal workstation to a second test fixture for testing.

[0128] The abnormal workstation is a workstation used to temporarily store the equipment to be tested whose first test result is abnormal.

[0129] After the first test fixture outputs the first test result, other test fixtures are not necessarily in an idle state. Therefore, the device to be tested needs to be moved to an abnormal workstation first to wait for the second test fixture to be idle.

[0130] The optional test fixture is a test fixture other than the first test fixture among the test fixtures that can test the device under test; the first test fixture is not included in the optional test fixtures, and the second test fixture is determined from the optional test fixtures. Therefore, the first test fixture and the second test fixture must be different test fixtures.

[0131] It can be understood that when moving the device under test from the abnormal station to the second test fixture, the moving operation is also performed after detecting that the second test fixture is in an idle state.

[0132] Further, the step S12 includes the steps of:

[0133] Step S121, determining the test yield corresponding to each of the optional test fixtures;

[0134] Step S122, using the optional test fixture with the highest test yield as the second test fixture.

[0135] The test yield indicates the proportion of the test results of the test fixture that pass; the test yield can be obtained from the test results generated within a preset period; the specific value of the preset period can be set based on actual needs. For example, if the preset period is set to 1 hour, for a specific test fixture, obtain the test results of the test fixture within 1 hour, and count the number of times the test results pass. Divide the number of times the test results pass by the number of test results to obtain the test yield corresponding to the test fixture.

[0136] It can be understood that the higher the test yield, the more devices under test pass on the test fixture. The purpose of retesting with the second test fixture is to eliminate the influence of the deviation of the test results of the first test fixture being abnormal due to its own problems. Therefore, using the optional test fixture with the highest test yield as the second test fixture can ensure that the selected second test fixture will not have a situation where the test results deviate abnormally due to its own problems, and can improve the test accuracy of the device under test.

[0137] Further, in the third embodiment of the automatic test method for the device of the present invention proposed based on the first embodiment of the present invention, the step S30 includes the steps of:

[0138] Step S31, if the first test result is abnormal, determining the target retest fixture;

[0139] Step S32, determining whether the first test fixture belongs to the target retest fixture;

[0140] Step S33, if the first test fixture belongs to the target retest fixture, controlling the robotic arm to move the device under test into the second test fixture for testing.

[0141] If the first test fixture does not belong to the target retest fixture, using the first test result as the target test result.

[0142] The target retest fixture is a test fixture that is preset to perform automatic retesting when the test results are abnormal.

[0143] In practical applications, different devices under test have different requirements for testing, and different test fixtures have different test conditions. Therefore, the target retest fixture can be set based on the actual needs of the devices under test and the test fixtures. For example, the test fixture corresponding to the device under test with a relatively low overall yield can be set as the target retest fixture; or the test fixture with a relatively low test yield can be used as the target retest fixture. Specifically, which test fixtures are used as the target retest fixtures can be set based on actual needs.

[0144] When the first test fixture belongs to the target retest fixture, it means that it needs to be retested. Therefore, when the first test result is abnormal, the device under test is tested again through the second test fixture; when the first test fixture does not belong to the target retest fixture, it means that it does not need to be retested. Therefore, regardless of whether the first test result is pass or abnormal, the first test result is used as the final target test result.

[0145] In other embodiments, a retest flag can also be set for a specific device under test. When the device under test is set with a retest flag, retesting is performed when the corresponding first test result is abnormal. In practical applications, retest settings can be made for both the device under test and the test fixture at the same time. When the device under test or the test fixture indicates that retesting is required, retesting is performed when the corresponding first test result is abnormal.

[0146] In this embodiment, by setting the target retest fixture, it is possible to select the test fixture that needs to be retested based on actual needs, avoiding the reduction of test efficiency caused by retesting all test fixtures.

[0147] Furthermore, in the fourth embodiment of the automatic test method for the device of the present invention proposed based on the first embodiment of the present invention, the step S10 includes the steps:

[0148] Step S14, determining the first test fixture in the test fixture, and controlling the robotic arm to move to the waiting position corresponding to the first test fixture;

[0149] Step S15, obtaining the current position state of the first test fixture, and determining whether the current position state is the same as the preset placement state;

[0150] Step S16, if the current position state is different from the preset placement state, after adjusting the position state of the first test fixture to the preset placement state, controlling the robotic arm to place the device under test into the first test fixture for testing.

[0151] The waiting position is the waiting position corresponding to the first test fixture; after the robotic arm grabs the device under test, it stays at the waiting position and places the device under test into the first test fixture when the current position state of the first test fixture is the preset placement state.

[0152] The current position state indicates the attitude of the first test fixture; for example, the current position state may include the height of the test fixture, the projected position on the plane, etc.; generally, the specific position and height when the first test fixture can receive the device will be preset, that is, the preset placement state. The robotic arm places the device under test when the first test fixture is in the preset placement state; when the current position state of the first test fixture is not the preset placement state, placing the device under test by the robotic arm may collide with the first test fixture. Therefore, to avoid this problem, the device under test is placed after determining that the current position state of the first test fixture is the preset placement state. It can be understood that when other test fixtures place the device under test, the judgment of the preset placement state also needs to be carried out.

[0153] When specifically judging the preset placement state, the origin position of the cylinder of the first test device can be used as the preset placement state, and the current position state is the position of the cylinder in the first test device. When the cylinder is at the origin position, the current position state is the same as the preset placement state; when the cylinder is not at the origin position, the current position state is different from the preset placement state.

[0154] When it is detected that the current position state is different from the preset placement state, the cylinder of the first test device can be automatically triggered to reset to the origin position; in some cases, there may be a problem that the cylinder is stuck and cannot be reset. At this time, an alarm operation can be performed to remind the staff so that the staff can manually reset the cylinder.

[0155] In other embodiments, the current position state of the first test fixture can also be determined, and the placement trajectory of the robotic arm can be determined according to the current position state, and the device under test can be placed into the first test fixture along the placement trajectory, so that even if the current position state of the first test fixture is not the preset placement state, the device under test can still be smoothly placed into the first test fixture without colliding with the machine.

[0156] When the system starts, the robotic arm can be initialized first. After the initialization is completed, the robotic arm enters the automatic operation mode to perform subsequent operations.

[0157] Furthermore, in the fifth embodiment of the automatic test method of the device of the present invention proposed based on the first embodiment of the present invention, after the step S20, the following steps are included:

[0158] Step S50: Obtain the cumulative number of anomalies of the first test fixture, where the cumulative number of anomalies is the number of times the first test result output by the first test fixture is abnormal.

[0159] Step S60: Determine whether the cumulative number of anomalies is greater than a preset anomaly threshold.

[0160] Step S70: If the cumulative number of anomalies is greater than the preset anomaly threshold, stop the test operation performed by the first test fixture.

[0161] The cumulative number of anomalies is the number of times the first test result generated by the first test fixture indicates an anomaly. It should be noted that the cumulative number of anomalies can be the number of all historical abnormal test results. It can also be the total number of anomalies after the first test fixture is started, or the number of anomalies within a set anomaly statistical period; for example, if the anomaly statistical period is one day, the corresponding cumulative number of anomalies is the number of times the first test result generated on the same day indicates an anomaly.

[0162] When the cumulative number of anomalies of the first test fixture is greater than the preset anomaly threshold, it indicates that there are many abnormal situations for the device under test tested by the first test fixture. This situation may be caused by a relatively serious problem with the first test fixture. Therefore, at this time, stop the first test fixture from performing the test operation. After that, the first test fixture can be restarted software-wise and then put back into the test after restart; when the number of times the test operation is stopped reaches the preset restart number, an alarm will be given and wait for the staff to troubleshoot the problem before putting it back into the test again; it can be understood that after putting it back into the test, the cumulative number of anomalies will be cleared and start accumulating again.

[0163] Further, in the sixth embodiment of the automatic test method for the device of the present invention proposed based on the first embodiment of the present invention, after the step S40, the following steps are included:

[0164] Step S80: Determine whether the second test result is abnormal or passed.

[0165] Step S90: If the second test result is abnormal, move the device under test to the abnormal position through the robotic arm.

[0166] Step S100: If the second test result is passed, move the device under test to the discharging position through the robotic arm.

[0167] The abnormal position is the output position of the device under test with an abnormal test result; the discharging position is the output position of the device under test with a passed test result.

[0168] If the second test result is abnormal, it is considered that the final target test result is abnormal. For the device under test with abnormal results, it can be transferred to the centralized processing area for abnormalities or wait for the staff to determine. Therefore, the abnormal location can be set based on the subsequent needs of the actual device under test with abnormalities.

[0169] If the second test result is passed, it is considered that the final target test result is passed. For the device under test that has passed, it needs to be transferred to the next process. Therefore, the device under test is moved to the unloading position, such as a conveyor belt, and transferred to the corresponding station of the next process for processing.

[0170] It should be noted that for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to the present application.

[0171] Through the description of the above embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by means of software plus a necessary general hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. The computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disc), and includes several instructions for causing a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in various embodiments of the present application.

[0172] The present application also provides an automatic device testing apparatus for implementing the above-mentioned automatic device testing method. The automatic device testing apparatus includes a control terminal, a robotic arm, and a test fixture; the control terminal is respectively connected to the robotic arm and the test fixture; wherein, the control terminal includes:

[0173] A first control module for controlling the robotic arm to place the device under test into the first test fixture for testing;

[0174] A first acquisition module for acquiring the first test result of the device under test and determining whether the first test result is abnormal, wherein the first test result is the test result output by the first test fixture;

[0175] A second control module, configured to control the robot arm to move the device under test to a second test fixture for testing if the first test result is abnormal;

[0176] The second acquisition module is used to acquire a second test result of the device under test, and determine a target test result of the device under test according to the second test result, wherein the second test result is a test result output by the second test fixture.

[0177] The automatic testing device of the equipment can eliminate the deviation of the test result caused by the test fixture itself as much as possible by using another test fixture to test the device under test when the test result of the device under test is abnormal, thereby achieving more accurate test result determination; at the same time, there is no need for manual intervention in retesting, which improves test efficiency.

[0178] It should be noted that the first control module in this embodiment can be used to execute step S10 in the embodiment of the present application, the first acquisition module in this embodiment can be used to execute step S20 in the embodiment of the present application, the second control module in this embodiment can be used to execute step S30 in the embodiment of the present application, and the second acquisition module in this embodiment can be used to execute step S40 in the embodiment of the present application.

[0179] Furthermore, the second control module includes:

[0180] A first control unit, used for controlling the mechanical arm to move the device under test to an abnormal position;

[0181] A first determining unit, configured to determine the second test fixture from optional test fixtures, wherein the optional test fixtures do not include the first test fixture;

[0182] The second control unit is used to control the robot arm to move the device under test from the abnormal workstation to a second test fixture for testing.

[0183] Further, the first determining unit includes:

[0184] A first determining subunit, used to determine the test yield corresponding to each of the optional test fixtures;

[0185] The first execution subunit is configured to use the optional test fixture with the highest test yield as the second test fixture.

[0186] Furthermore, the second control module includes:

[0187] A second determining unit, configured to determine a target retest fixture if the first test result is abnormal;

[0188] The first judgment unit is used to judge whether the first test fixture belongs to the target retest fixture;

[0189] The third control unit is used to control the robotic arm to move the device under test into the second test fixture for testing if the first test fixture belongs to the target retest fixture.

[0190] Further, the first control module includes:

[0191] The third determination unit is used to determine the first test fixture among the test fixtures, and control the robotic arm to move to the waiting position corresponding to the first test fixture;

[0192] The first acquisition unit is used to acquire the current position state of the first test fixture, and judge whether the current position state is the same as the preset placement state;

[0193] The first execution unit is used to, if the current position state is different from the preset placement state, adjust the position state of the first test fixture to the preset placement state, and then control the robotic arm to place the device under test into the first test fixture for testing.

[0194] Further, the control terminal further includes:

[0195] The third acquisition module is used to acquire the cumulative number of abnormal times of the first test fixture, where the cumulative number of abnormal times is the number of times that the first test result output by the first test fixture is abnormal;

[0196] The first judgment module is used to judge whether the cumulative number of abnormal times is greater than the preset abnormal threshold;

[0197] The first execution module is used to, if the cumulative number of abnormal times is greater than the preset abnormal threshold, stop the test operation through the first test fixture.

[0198] Further, after determining the target test result of the device under test according to the second test result, it includes:

[0199] The first determination module is used to determine whether the second test result is abnormal or passed;

[0200] The first movement module is used to, if the second test result is abnormal, move the device under test to the abnormal position through the robotic arm;

[0201] The second movement module is used to, if the second test result is passed, move the device under test to the blanking position through the robotic arm.

[0202] Refer to Figure 33, in terms of the hardware structure, the electronic device may include components such as a communication module 10, a memory 20, and a processor 30. In the electronic device, the processor 30 is respectively connected to the memory 20 and the communication module 10. A computer program is stored on the memory 20 and is simultaneously executed by the processor 30. When the computer program is executed, the steps of the above method embodiment are implemented.

[0203] The communication module 10 can be connected to an external communication device through a network. The communication module 10 can receive requests sent by the external communication device, and can also send requests, instructions, and information to the external communication device. The external communication device can be other electronic devices, servers, or Internet of Things devices, such as a TV, etc.

[0204] The memory 20 can be used to store software programs and various data. The memory 20 mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system, application programs required for at least one function (such as controlling a robotic arm to place a device to be tested into a first test fixture for testing), etc.; the data storage area can include a database, and the data storage area can store data or information created according to the use of the system. In addition, the memory 20 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage devices.

[0205] The processor 30 is the control center of the electronic device, and connects various parts of the entire electronic device through various interfaces and lines. By running or executing the software programs and / or modules stored in the memory 20, and calling the data stored in the memory 20, it executes various functions of the electronic device and processes data, thereby monitoring the electronic device as a whole. The processor 30 may include one or more processing units; optionally, the processor 30 may integrate an application processor and a modulation and demodulation processor. Among them, the application processor mainly processes the operating system, user interface, and application programs, etc., and the modulation and demodulation processor mainly processes wireless communication. It can be understood that the above modulation and demodulation processor may not be integrated into the processor 30 either.

[0206] Although Figure 33 not shown, the above electronic device may further include a circuit control module, and the circuit control module is used to connect to a power source to ensure the normal operation of other components. Those skilled in the art can understand that Figure 33 the structure of the electronic device shown in

[0207] The present invention also proposes a computer-readable storage medium, on which a computer program is stored. The computer-readable storage medium may beFigure 33 The memory 20 in the electronic device may also be at least one of ROM (Read-Only Memory), RAM (Random Access Memory), magnetic disk, and optical disk. The computer-readable storage medium includes several instructions for causing a terminal device having a processor (which may be a television, a car, a mobile phone, a computer, a server, a terminal, or a network device, etc.) to execute the methods described in various embodiments of the present invention.

[0208] In the present invention, the terms "first", "second", "third", "fourth", and "fifth" are used only for the purpose of description and cannot be understood as indicating or implying relative importance. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0209] In the description of this specification, the description with reference to terms such as "an embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0210] Although the embodiments of the present invention have been shown and described above, the scope of protection of the present invention is not limited thereto. It can be understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those of ordinary skill in the art can make changes, modifications, and substitutions to the above embodiments within the scope of the present invention, and these changes, modifications, and substitutions should all be covered by the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be subject to the scope of protection of the claims.

Claims

1. An automatic device testing method, characterized in that, The automatic testing method of the device includes: Controlling the robotic arm to place the device under test into the first test fixture for testing; Obtaining the first test result of the device under test and determining whether the first test result is abnormal, where the first test result is the test result output by the first test fixture; If the first test result is abnormal, controlling the robotic arm to move the device under test to the second test fixture for testing; Obtaining the second test result of the device under test and determining the target test result of the device under test according to the second test result, where the second test result is the test result output by the second test fixture.

2. The automatic test method for the device according to claim 1, characterized in that, The controlling the robotic arm to move the device under test to the second test fixture for testing includes: Controlling the robotic arm to move the device under test to the abnormal station; Determining the second test fixture among the optional test fixtures, where the optional test fixtures do not include the first test fixture; Controlling the robotic arm to move the device under test from the abnormal station to the second test fixture for testing.

3. The method for automatically testing a device according to claim 2, wherein, The determining the second test fixture among the optional test fixtures includes: Determining the test yield rates corresponding to the respective optional test fixtures; Taking the optional test fixture with the highest test yield rate as the second test fixture.

4. The automatic test method for the device according to claim 1, characterized in that, The if the first test result is abnormal, controlling the robotic arm to move the device under test to the second test fixture for testing includes: If the first test result is abnormal, determining the target retest fixture; Judging whether the first test fixture belongs to the target retest fixture; If the first test fixture belongs to the target retest fixture, controlling the robotic arm to move the device under test to the second test fixture for testing.

5. The method for automatically testing a device according to claim 1, wherein The controlling the robotic arm to place the device under test into the first test fixture for testing includes: Determining the first test fixture among the test fixtures, controlling the robotic arm to move to the waiting position corresponding to the first test fixture; Obtaining the current position state of the first test fixture and judging whether the current position state is the same as the preset placing state; If the current position state is different from the preset placing state, after adjusting the position state of the first test fixture to the preset placing state, controlling the robotic arm to place the device under test into the first test fixture for testing.

6. The automatic test method for the device according to claim 1, wherein, After judging whether the first test result is abnormal includes: Obtaining the cumulative abnormal times of the first test fixture, where the cumulative abnormal times is the number of times that the first test result output by the first test fixture is abnormal; Judging whether the cumulative abnormal times is greater than the preset abnormal threshold; If the cumulative abnormal times is greater than the preset abnormal threshold, stopping the test operation performed by the first test fixture.

7. The automatic test method for the device according to claim 1, characterized in that, After determining the target test result of the device under test according to the second test result includes: Determining whether the second test result is abnormal or passed; If the second test result is abnormal, moving the device under test to the abnormal position through the robotic arm; If the second test result is passed, the device under test is moved to the discharging position by the robotic arm.

8. An automatic device testing apparatus, characterized in that, The device automatic testing apparatus includes a control terminal, a robotic arm, and a test fixture; the control terminal is respectively connected to the robotic arm and the test fixture; wherein, the control terminal includes: A first control module, configured to control the robotic arm to place the device under test into a first test fixture for testing; A first acquisition module, configured to acquire the first test result of the device under test and determine whether the first test result is abnormal, wherein the first test result is the test result output by the first test fixture; A second control module, configured to control the robotic arm to move the device under test to a second test fixture for testing if the first test result is abnormal; A second acquisition module, configured to acquire the second test result of the device under test and determine the target test result of the device under test according to the second test result, wherein the second test result is the test result output by the second test fixture.

9. An electronic device, characterized in that, The electronic device includes a memory, a processor, and a computer program stored on the memory and executable on the processor, and when the computer program is executed by the processor, the steps of the device automatic testing method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium, and when the computer program is executed by the processor, the steps of the device automatic testing method according to any one of claims 1 to 7 are implemented.

Images