Vehicle lamp and vehicle lamp controller test system

Abstract

The invention discloses a test system for a vehicle lamp and a vehicle lamp controller. The test system comprises a power supply device, a temperature adjustable test box, an image acquisition device, a temperature acquisition device, an HIL test bench and a control device. The temperature-adjustable test box is suitable for placing a to-be-tested vehicle lamp and a vehicle lamp controller and is used for providing temperatures of the vehicle lamp and the vehicle lamp controller under various different working conditions, and a transparent observation window is arranged on the temperature-adjustable test box; the image acquisition device is used for acquiring image information of a to-be-tested vehicle lamp and a vehicle lamp controller in the temperature-adjustable test box; the temperature acquisition device is used for acquiring the ambient temperature around heating components in the vehicle lamp and the vehicle lamp controller; the HIL test bench is used for simulating an electrical environment of a vehicle under a real working condition; the control device is used for controlling the working state of each device. The test system can realize automatic test, improve the coverage degree of a test scene under a limit working condition, reduce manpower and material resources, improve the test efficiency and accuracy, and improve the product quality and reliability.

Description

Technical Field

[0001] The present invention relates to the field of hardware testing, and particularly to a test system for vehicle lamps and lamp controllers. Background Art

[0002] In the related art, during the testing of vehicle lamps and lamp controllers, generally, test engineers conduct in-vehicle or bench tests, performing various function and logic combination tests at normal temperature. Therefore, it is time-consuming and laborious. Especially for the tests in terms of fault diagnosis, test engineers need to spend a large amount of time simulating various faults and then conducting tests. For the tests in various extreme environments, more requirements are needed, which are even more time-consuming and laborious, with low test scenario coverage, low test efficiency and accuracy. Summary of the Invention

[0003] The present invention aims to at least solve one of the technical problems existing in the prior art. For this purpose, an object of the present invention is to provide a test system for vehicle lamps and lamp controllers, which can realize automated testing, improve the coverage of extreme working condition test scenarios, reduce human and material resources, improve test efficiency and accuracy, and improve product quality and reliability.

[0004] To solve the above problems, an embodiment of the first aspect of the present invention provides a test system for vehicle lamps and lamp controllers, including: a power supply device; a temperature-adjustable test chamber, in which the vehicle lamp and the lamp controller to be tested are suitable to be placed, for providing the temperature of the vehicle lamp and the lamp controller under various different working conditions, and a transparent observation window is provided on the temperature-adjustable test chamber, wherein the temperature under various different working conditions includes the temperature under extreme working conditions; an image acquisition device, located outside the transparent observation window, for acquiring image information of the vehicle lamp and the lamp controller to be tested in the temperature-adjustable test chamber; a temperature acquisition device, arranged in the temperature-adjustable test chamber, for acquiring the ambient temperature around the heat-generating components in the vehicle lamp and the lamp controller; a HIL (Hardware in the Loop) test bench, which is connected to the power supply device, the vehicle lamp to be tested and the lamp controller, to simulate the electrical environment under the real working conditions of the vehicle, and perform function and logic combination tests on the vehicle lamp and the lamp controller according to the interaction between the lamp controller and the vehicle lamp; a control device, connected to the power supply device, the temperature-adjustable test chamber, the image acquisition device, the temperature acquisition device and the HIL test bench, for controlling the working states of the power supply device, the temperature-adjustable test chamber, the image acquisition device, the temperature acquisition device and the HIL test bench.

[0005] The test system for a vehicle headlight and a headlight controller according to an embodiment of the present invention includes a temperature-adjustable test chamber, a Hardware-in-the-Loop (HIL) test bench, an image acquisition device, a temperature acquisition device, a power supply device, and a control device. The headlight and the headlight controller are placed in the temperature-adjustable test chamber. The power supply device and the temperature-adjustable test chamber are used to set an extreme environment to simulate different ambient temperature conditions, so as to verify the performance of the headlight and the headlight controller at various temperatures. The HIL test bench, the image acquisition device, and the temperature acquisition device are used to collect and process relevant information, collect the image information of the headlight and the controller in real time, evaluate key indicators such as the lighting effect and brightness, and monitor the temperature change in real time to ensure that the test conditions are accurately consistent. Automated testing is achieved, the coverage of extreme working condition test scenarios is improved, manpower and material resources are reduced, the test efficiency and accuracy are improved, and the product quality and reliability are enhanced.

[0006] In some embodiments, the HIL test bench includes: a power board card, which is connected to the power supply device and is used to monitor the current of the headlight.

[0007] In some embodiments, the HIL test bench further includes: a bus communication card, which is respectively connected to the headlight and the headlight controller and is used to send control instructions for the headlight and the headlight controller and monitor the feedback messages of the headlight and the headlight controller.

[0008] In some embodiments, the HIL test bench further includes: a relay matrix board card, which is connected to the headlight and the headlight controller. The relay matrix board card includes a plurality of relay modules, and each relay module is respectively connected to both ends of the corresponding headlight to achieve short-circuit control of the corresponding headlight.

[0009] In some embodiments, the HIL test bench further includes: a general-purpose analog input / output board card, which is connected to the headlight and the headlight controller.

[0010] In some embodiments, the control device is used to test the lighting state of the headlight according to the image information of the headlight to be tested and the headlight controller.

[0011] In some embodiments, the control device is further used to analyze whether the temperature of the heat-generating component exceeds the device junction temperature at the temperature of the extreme working condition according to the ambient temperature around the heat-generating component in the headlight and the headlight controller.

[0012] In some embodiments, the temperature acquisition device is further configured to acquire the temperature around the temperature sampling resistor in the vehicle lamp and the lamp controller; the HIL test bench is further configured to acquire the output current of the lamp controller; and the control device is further configured to detect whether the self-protection current function of the vehicle lamp and the lamp controller is normal at the temperature under the extreme working condition according to the temperature around the temperature sampling resistor and the output current of the lamp controller.

[0013] In some embodiments, when performing various function and logic combination tests on the vehicle lamp and the lamp controller, the HIL test bench is further configured to monitor the fault feedback information of the lamp controller and the occasional fault feedback information of the lamp controller and feed them back to the control device.

[0014] In some embodiments, the control device is further configured to prompt the test results of the vehicle lamp and the lamp controller and generate a test report of the vehicle lamp and the lamp controller.

[0015] Additional aspects and advantages of the present invention will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present invention. Description of the Drawings

[0016] The above and / or additional aspects and advantages of the present invention will become apparent and be readily understood from the description of the embodiments in conjunction with the following drawings, wherein: Figure 1 is a structural block diagram of a test system for a vehicle lamp and a lamp controller according to the present invention; Figure 2 is a structural block diagram of an HIL test bench according to an embodiment of the present invention; Figure 3 is a flowchart of a vehicle lamp and a lamp controller test according to an embodiment of the present invention.

[0017] Reference Numerals: Test system 100 for a vehicle lamp and a lamp controller; Power supply device 110; Temperature adjustable test chamber 120; Image acquisition device 130; Temperature acquisition device 140; HIL test bench 150; Control device 160; Vehicle lamp 101; Lamp controller 102; Power board 151; Bus communication board 152; Relay matrix board 153; General purpose analog input / output board 154. Detailed Description of the Embodiments

[0018] Embodiments of the present invention will be described in detail below. The embodiments described with reference to the drawings are exemplary. Embodiments of the present invention will be described in detail below.

[0019] Automobile headlights provide a good lighting vision for drivers, thus ensuring the safety of passengers. With the continuous development of the automotive industry, people have put forward higher and higher requirements for the normal operation of headlights in various scenarios and extreme working conditions.

[0020] Existing headlights and headlight controllers generally conduct various function and logic combination tests at room temperature, and there are also additional tests for vehicle body lamps in the three-high experiments. This testing method requires a large amount of manpower and material resources for manual testing. Moreover, when testing under extreme high and low temperature working conditions, only the basic function of lighting the headlights and headlight controllers is carried out, and various function and logic combination tests are not conducted, which cannot cover the actual operation scenarios of automobile users. The testing scenarios are limited. When testing under extreme high and low temperature working conditions, only the voltage and current of the headlights and headlight controllers during the test are recorded, and the lamp states before and after the test are checked; the headlight states during the test, the fault feedback of the headlight controller, and the occasional fault feedback of the headlight controller are not monitored. In extreme cases, it is possible that the headlights cannot be used and the headlight controller alarms; moreover, when testing under extreme high and low temperature working conditions, a large amount of manpower and material resources are required for manual testing, there is a risk of human error, resulting in inaccurate test data, a long test cycle, and high costs.

[0021] To solve the above problems, the first aspect of the embodiments of the present invention provides a test system for headlights and headlight controllers. This test system can achieve automated testing, improve the coverage of extreme working condition test scenarios, reduce manpower and material resources, improve test efficiency and accuracy, and improve product quality and reliability.

[0022] As Figure 1 shown, the test system 100 for headlights and headlight controllers according to the embodiments of the present invention includes: a power supply device 110, a temperature-adjustable test chamber 120, an image acquisition device 130, a temperature acquisition device 140, a HIL test bench 150, and a control device 160.

[0023] Among them, the temperature-adjustable test chamber 120 is suitable for placing the headlight 101 to be tested and the headlight controller 102, and is used to provide the temperatures of the headlight 101 and the headlight controller 102 under various different working conditions. A transparent observation window is provided on the temperature-adjustable test chamber 120, and the temperatures under various different working conditions include the temperatures under extreme working conditions; the image acquisition device 130 is located outside the transparent observation window and is used to acquire the image information of the headlight 101 to be tested and the headlight controller 102 in the temperature-adjustable test chamber 120; the temperature acquisition device 140 is arranged in the temperature-adjustable test chamber 120 and is used to acquire the ambient temperature around the heat-generating components in the headlight 101 and the headlight controller 102; the HIL test bench 150 is connected to the power supply device 110, the headlight 101 to be tested and the headlight control 102 to simulate the electrical environment under the real vehicle working conditions, and perform functional and logical combination tests on the headlight 101 and the headlight controller 102 according to the interaction between the headlight controller 102 and the headlight 101; the control device 160 is connected to the power supply device 110, the temperature-adjustable test chamber 120, the image acquisition device 130, the temperature acquisition device 140 and the HIL test bench 150, and is used to control the working states of the power supply device 110, the temperature-adjustable test chamber 120, the image acquisition device 130, the temperature acquisition device 140 and the HIL test bench 150.

[0024] Specifically, when testing the headlight 101 and the headlight controller 102, place the headlight 101 and the headlight control 102 in the temperature-adjustable test chamber 120. The temperature-adjustable test chamber 120 can be set to different temperatures for testing the headlight 101 and the headlight controller 102. The temperatures under different working conditions include the temperatures under extreme working conditions. For example, the lowest test temperature can be set to -40°C and the highest test temperature can be set to 80°C; before testing the headlight 101 and the headlight controller 102, it is necessary to first connect and check all the devices. After confirming that all the devices are connected correctly, the control device 160 controls all the devices to start working. The temperature-adjustable test chamber 120 provides the test temperature for the headlight 101 and the headlight controller 102, and the HIL test bench 150 controls the headlight controller 102 to interact with the headlight 101 to achieve functional and logical combination tests of the headlight 101 and the headlight controller 102. At the same time, the image acquisition device 130 acquires the image information of the headlight 101 to be tested and the headlight controller 102 in the temperature-adjustable test chamber 120 through the transparent observation window, and the temperature acquisition device 140 acquires the ambient temperature around the heat-generating components in the headlight 101 and the headlight controller 102.

[0025] The test system for a vehicle lamp and a vehicle lamp controller according to an embodiment of the present invention includes a temperature-adjustable test chamber, a HIL test bench, an image acquisition device, a temperature acquisition device, a power supply device, and a control device. The vehicle lamp and the vehicle lamp controller are placed in the temperature-adjustable test chamber. The power supply device and the temperature-adjustable test chamber are used to set extreme environments and simulate different ambient temperature conditions to verify the performance of the vehicle lamp and the vehicle lamp controller at various temperatures. The HIL test bench, the image acquisition device, and the temperature acquisition device are used to collect and process relevant information, real-time collect the image information of the vehicle lamp and the controller, evaluate key indicators such as illumination effect and brightness, and real-time monitor the temperature change to ensure that the test conditions are accurate and consistent. It realizes automated testing, improves the coverage of extreme working condition test scenarios, reduces manpower and material resources, improves test efficiency and accuracy, and improves product quality and reliability.

[0026] In some embodiments, as Figure 2 shown, the HIL test bench 150 includes: a power supply board 151.

[0027] Among them, the power supply board 151 is connected to the power supply device 110 and is used to monitor the current of the vehicle lamp 101.

[0028] Specifically, the power supply device 110 provides stable electrical energy input for the entire system. It can be a programmable power supply and can adjust the voltage and current as needed. The power supply board 151 can be a VT01A power supply board, which is used to input DC voltage control and current measurement for the vehicle lamp 101 and the vehicle lamp controller 102, control the power supply device 110 to supply power to the vehicle lamp 101, and at the same time, perform high-precision current measurement to ensure the stable operation of the system.

[0029] In some embodiments, as Figure 2 shown, the HIL test bench 150 further includes: a bus communication card 152.

[0030] Among them, the bus communication card 152 is respectively connected to the vehicle lamp 101 and the vehicle lamp controller 102, and is used to send control instructions for the vehicle lamp 101 and the vehicle lamp controller 102 and monitor the feedback messages of the vehicle lamp 101 and the vehicle lamp controller 102.

[0031] Specifically, the bus communication card 152 may be a VT64 bus communication card, which supports 4-channel bus communication interfaces, including CAN (Controller Area Network) / CAN FD (CAN with Flexible Data Rate), FlexRay (Flexible Ray Constoller), LIN (Local Interconnect Network), etc. The bus communication card 152 is used to connect to the CAN / LIN bus of the vehicle lamp controller 102, send bus message data, control the lighting and extinguishing of the vehicle lamp 101 and the vehicle lamp controller 102, and switch the lighting of various logical combinations; monitor the bus message data fed back by the vehicle lamp 101 and the vehicle lamp controller 102, and monitor and feedback the fault feedback of the vehicle lamp controller 102 and the occasional fault feedback of the vehicle lamp controller 102. Among them, the lighting switching mode of various logical combinations includes the combination of the lighting sequence and the extinguishing sequence.

[0032] In some embodiments, as Figure 2 shown, the HIL test bench 150 further includes: a relay matrix board 153.

[0033] Among them, the relay matrix board 153 is connected to the vehicle lamp 101 and the vehicle lamp controller 102. The relay matrix board 153 includes a plurality of relay modules, and each relay module is respectively connected to both ends of the corresponding vehicle lamp 101 to achieve short-circuit control of the corresponding vehicle lamp 101.

[0034] Specifically, the relay matrix board 153 may be a VT2832 relay matrix board. Connect one relay module in the VT2832 relay matrix board to the positive and negative ends of a string of LEDs (Light Emitting Diodes) of the vehicle lamp 101. By setting the VT2832 relay matrix board, the short circuit of the low beam LEDs is achieved; by setting the VT6204 bus communication card, the feedback message of the low beam is monitored; by setting the VT7001A power supply board, the low beam current is monitored; according to the feedback message and the current value, it is judged whether the low beam feedbacks a fault message when the low beam is turned on and a short circuit fault occurs.

[0035] In some embodiments, as Figure 2 shown, the HIL test bench 150 further includes: a general-purpose analog input / output board 154.

[0036] Among them, the general-purpose analog input / output board 154 is connected to the vehicle lamp 101 and the vehicle lamp controller 102. The general-purpose analog input / output board 154 may be a VT2816 general-purpose analog input / output board.

[0037] For example, the test system for the vehicle lamp and the vehicle lamp controller of the present invention includes: a temperature-adjustable test chamber, a HIL test bench, an image acquisition device, a temperature acquisition device, and a power supply device; the vehicle lamp and the vehicle lamp controller to be tested are placed in the temperature-adjustable test chamber, the image acquisition device and the temperature acquisition device are installed on the temperature-adjustable test chamber, and the HIL test bench is respectively connected to the power supply device, the vehicle lamp controller, and the vehicle lamp; it further includes a control device (including a terminal), and the temperature-adjustable test chamber, the image acquisition device, the temperature acquisition device, and the power supply device are respectively connected to the control device. The temperature-adjustable test chamber is provided with a transparent observation window, and the image acquisition device is located outside the transparent observation window.

[0038] The HIL test bench includes a power supply board card, a bus communication board card, a relay matrix board card, and a general-purpose analog input / output board card. For example, a VT01A power supply board card, a VT64 bus communication board card, a VT2832 relay matrix board card, and a VT2816 general-purpose analog input / output board card; the power supply board card is connected to the power supply device, the bus communication board card is respectively connected to the vehicle lamp controller and the vehicle lamp, the relay matrix board card is respectively connected to the vehicle lamp controller and the vehicle lamp, and the general-purpose analog input / output board card is respectively connected to the vehicle lamp controller and the vehicle lamp.

[0039] In the present invention, the vehicle lamp and the vehicle lamp controller are placed in the temperature-adjustable test chamber, and the extreme environment is set by using the power supply unit and the temperature-adjustable test chamber. The relevant information is collected and processed by using the HIL test bench, the image acquisition unit, and the temperature acquisition unit to realize automatic testing. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be covered within the protection scope of the present invention.

[0040] In some embodiments, the control device is used to test the lighting state of the vehicle lamp according to the image information of the vehicle lamp to be tested and the vehicle lamp controller.

[0041] Specifically, the control device 160 is the core control part of the entire test device. The control device 160 is responsible for receiving and processing various input signals of the test device and controlling the corresponding operations. The control device 160 can control the working states of the temperature-adjustable test chamber 120, the image acquisition device 130, the temperature acquisition device 140, and the power supply device 110 according to a preset test scheme; the image acquisition device 130 is located outside the temperature-adjustable test chamber 120 and obtains the image information of the vehicle lamp 101 and the vehicle lamp controller 102 through the transparent observation window. During the test, the image acquisition device 130 will collect the images of the vehicle lamp 101 and the vehicle lamp controller 102 in real time, transmit the data to the control device 160 for analysis and processing, and compare with the normal and qualified pictures of the vehicle lamp 101, and feedback the pictures with abnormal lighting of the vehicle lamp 101 to evaluate the key indicators such as the lighting effect and brightness of the product to ensure the product quality.

[0042] In some embodiments, the control device is further configured to analyze whether the temperature of the heat-generating components exceeds the device junction temperature at the limit operating conditions based on the ambient temperature around the heat-generating components in the vehicle lamp and the lamp controller.

[0043] Specifically, the temperature acquisition device 140 is used to acquire the ambient temperature around the heat-generating components in the vehicle lamp 101 and the lamp controller 102, and to detect in real time whether the key heat-generating components of the vehicle lamp 101 and the lamp controller 102 exceed the junction temperature of the used components under limit operating conditions. During the test process, the temperature can be adjusted in a timely manner to ensure the accuracy and consistency of the test conditions.

[0044] In some embodiments, the temperature acquisition device is further configured to acquire the temperature around the temperature sampling resistor in the vehicle lamp and the lamp controller; the HIL test bench is further configured to acquire the output current of the lamp controller; and the control device is further configured to detect whether the self-protection current function of the vehicle lamp and the lamp controller is normal at the temperature under limit operating conditions based on the temperature around the temperature sampling resistor and the output current of the lamp controller.

[0045] Specifically, the temperature acquisition device 140 is used to acquire the temperature beside the temperature sampling resistor in the vehicle lamp 101 and the lamp controller 102, and the HIL test bench 150 is used to acquire the output current of the lamp controller 102. After obtaining the temperature around the temperature sampling resistor and the output current of the lamp controller 102, the control device detects in real time whether the self-protection current reduction function of the vehicle lamp 101 and the lamp controller 102 is normal at the temperature under limit operating conditions based on the acquired temperature around the temperature sampling resistor and the output current of the lamp controller 102.

[0046] In some embodiments, the HIL test bench is further configured to monitor and feedback the fault feedback information of the lamp controller and the occasional fault feedback information of the lamp controller to the control device when performing various function and logic combination tests on the vehicle lamp and the lamp controller.

[0047] Specifically, the HIL test bench 150 is used to control the vehicle lamp 101 and the lamp controller 102 to perform various function and logic combination automated tests. Various faults may occur during the test process. Therefore, the HIL test bench 150 monitors and feedbacks the fault feedback information of the lamp controller 102 and the occasional fault feedback situation of the lamp controller 102 to the control device 160, and the control device 160 analyzes and stores the received fault information to avoid the recurrence of faults during the next test.

[0048] In some embodiments, the control device is further configured to prompt the test results of the vehicle lamp and the lamp controller and generate a test report for the vehicle lamp and the lamp controller.

[0049] Specifically, after the test is completed, the control device 160 prompts the test results of the vehicle lamp 101 and the vehicle lamp controller 102 according to the acquired test information and generates a test report for the vehicle lamp 101 and the vehicle lamp controller 102. For example, if there is no fault in the test of the vehicle lamp 101 and the vehicle lamp controller 102, the control device 160 prompts that the test is passed and generates a report indicating that the test is passed. If a fault occurs during the test of the vehicle lamp 101 and the vehicle lamp controller 102, the control device 160 prompts that the test is not passed and generates a report indicating that the test is not passed, and describes the cause of the fault in the report.

[0050] For example, the test system for the vehicle lamp and the vehicle lamp controller of the present invention includes: a temperature-adjustable test chamber, a HIL test bench, an image acquisition device, a temperature acquisition device, and a power supply device. The vehicle lamp and the vehicle lamp controller to be tested are placed in the temperature-adjustable test chamber. An image acquisition device and a temperature acquisition device are installed on the temperature-adjustable test chamber. The HIL test bench is respectively connected to the power supply device, the vehicle lamp controller, and the vehicle lamp. The above devices realize the automated test of various functions and logic combinations under extreme high and low temperature conditions, and detect the state of the vehicle lamp under extreme conditions, the fault feedback of the vehicle lamp controller, the key heat-generating components, and the high-temperature self-protection current reduction function through the image acquisition device, the HIL test bench, and the temperature acquisition device. Simulating the actual operation scenario of automobile users improves the coverage of extreme condition test scenarios, realizes automated testing, reduces manpower and material resources, and improves test efficiency. The vehicle lamp and the vehicle lamp controller to be tested are placed in the temperature-adjustable test chamber, which can simulate high and low temperature environments. An image acquisition device and a temperature acquisition device are installed on the test chamber to collect image information and temperature data during the test. The HIL test bench is connected to the power supply device, the vehicle lamp controller, and the vehicle lamp to simulate the electrical environment under the real working conditions of the automobile, and conducts tests on functions and logic combinations through the interaction between the controller and the vehicle lamp. The automated test software controls the entire test device and simulates the actual operation scenarios of automobile users according to the preset test plan, including operations such as turning the vehicle lamp on and off and adjusting the brightness. The image acquisition device, the HIL test bench, and the temperature acquisition device work together to collect data such as the state of the vehicle lamp under extreme conditions, the fault feedback of the vehicle lamp controller, the temperature of the key heat-generating components, and the high-temperature self-protection current reduction function in real time.

[0051] The following refers to Figure 3 to illustrate the test steps of the vehicle lamp and the vehicle lamp controller according to the embodiments of the present invention, and the specific content is as follows.

[0052] Step S1, place the vehicle lamp and the vehicle lamp controller in the temperature-adjustable test chamber, drive the power supply unit to provide the supply voltage under different voltage extreme conditions, and adjust the temperature in the temperature-adjustable test chamber within the temperature range of different extreme conditions.

[0053] Step S2: Control the vehicle lamp and the vehicle lamp controller through the HIL test bench to conduct automated tests on various functions and logic combinations, and monitor and feedback the fault feedback situation of the vehicle lamp controller and the occasional fault feedback situation of the vehicle lamp controller.

[0054] Step S3: Monitor the light-emitting state of the vehicle lamp through the image acquisition device, compare the pictures of the vehicle lamp that are normal and qualified, and feedback the pictures of abnormal light emission of the vehicle lamp.

[0055] Step S4: Collect the temperature of the surrounding environment of the heat-generating components in the vehicle lamp and the vehicle lamp controller through the temperature acquisition device, and detect in real time whether the key heat-generating components of the vehicle lamp and the vehicle lamp controller exceed the junction temperature of the used components under extreme working conditions.

[0056] Step S5: Collect the temperature beside the temperature sampling resistor in the vehicle lamp and the vehicle lamp controller through the temperature acquisition device, and collect the output current of the vehicle lamp controller through the HIL test bench, and detect in real time whether the high-temperature self-protection current reduction function of the vehicle lamp and the vehicle lamp controller is normal.

[0057] Step S6: Program the HIL test bench, the image acquisition device, the temperature acquisition device, the power supply device, and the temperature-adjustable test chamber through the control device, and issue a test report.

[0058] Specifically, for the detailed steps of the terminal to control various functions, automated testing of logical combinations, and fault injection testing: First, open the CANoe software of the terminal, create a CANoe project, add a DBC / LDF database and network nodes in the project; configure the hardware resources, select Adapt to Connected VTSystem in the configuration of the Hardware menu, click the Scan button, and then click the OK button to automatically identify the VT board installed in the HIL bench; open the vTESTstudio software, create a new project, associate the CANoe project with the vTESTstudio project, and vTESTstudio can then call all the parameters in CANoe; right-click on the project file vTESTstudio_Project to display the menu bar, create a New TestUnit, name it custom, such as 01 - Logical Combination Test, right-click on the newly created Test Unit (01 - Logical Combination Test) to display the menu bar, add a Test Table, name it custom, such as 01 - Exterior Lights. Click on 01 - Exterior Lights, right-click on the Test Tree to display the menu bar, and select Add Test Fixture, name it custom, such as 01 - Position Low Beam Logic Test. Right-click on the Test Fixture to display the menu bar and add Fixture Preparation and Fixture Completion as the device preparation and device reset for each test function point, and some hardware-related control programs can be added inside. Right-click on the Test Fixture to display the menu bar and add Test Case, name it custom (usually the same as the test case number for easy search of the test case). Right-click on the Test Case to display the menu bar and add Add Preparation and Add Completion as the initial conditions and status reset of this test case. Write the test steps in the Test Case according to the test case, with basic instructions such as Set, Wait, Check, Send, etc. In the Test Case, conduct logical combination testing: by setting the VT6204 bus communication card, sending the low beam headlight on command, and monitoring the feedback messages of the low beam headlight and the position light; by setting the VT7001A power supply board, monitoring the currents of the low beam headlight and the position light; based on the feedback messages and the current values, determine whether the position light is on and feedback the headlight on message when the low beam is on.If it is correct, the Test Case gives a feedback of OK; if it is incorrect, the Test Case gives a feedback of NG; in the Test Case, a fault injection test is carried out: by setting the VT6204 bus communication card, a near light turn-on instruction is sent; one relay module in the VT2832 relay matrix board is connected to the positive and negative ends of a string of LEDs of the near light, and by setting the VT2832 relay matrix board, a short circuit of the near light LEDs is achieved; by setting the VT6204 bus communication card, the feedback message of the near light is monitored; by setting the VT7001A power supply board, the current of the near light is monitored; according to the feedback message and the current value, it is judged whether the near light gives a fault message when the near light is turned on and a short circuit fault occurs. If it is correct, the Test Case gives a feedback of OK; if it is incorrect, the Test Case gives a feedback of NG.

[0059] The working method of the test system for vehicle lights and vehicle light controllers of the present invention reduces manual operations, improves test efficiency and accuracy; simulates different ambient temperature conditions to verify the performance of vehicle lights and controllers at various temperatures; collects image information of vehicle lights and controllers in real time to evaluate key indicators such as lighting effect and brightness; monitors temperature changes in real time to ensure accurate and consistent test conditions; comprehensively evaluates product performance, reduces failure rate, and improves product quality. Generally speaking, through automated testing and the collaborative work of multiple functional modules, the test system can more comprehensively and efficiently evaluate the performance of vehicle lights and controllers, improving product quality and reliability.

[0060] In the description of this specification, the description with reference to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example.

[0061] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and purposes of the present invention, and the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test system for a vehicle lamp and a vehicle lamp controller, characterized in that Comprising: A power supply device; A temperature-adjustable test chamber, in which a vehicle headlight to be tested and a headlight controller are suitable to be placed, for providing temperatures of the vehicle headlight and the headlight controller under various different working conditions, and a transparent observation window is arranged on the temperature-adjustable test chamber, wherein the temperatures of the various different working conditions include the temperature under extreme working conditions; An image acquisition device, which is located outside the transparent observation window and is used for acquiring image information of the vehicle headlight to be tested and the headlight controller in the temperature-adjustable test chamber; A temperature acquisition device, which is arranged in the temperature-adjustable test chamber and is used for acquiring the ambient temperature around the heat-generating components in the vehicle headlight and the headlight controller; A HIL test bench, which is connected to the power supply device, the vehicle headlight to be tested and the headlight controller to simulate the electrical environment under the real working conditions of a vehicle, and perform functional and logical combination tests on the vehicle headlight and the headlight controller according to the interaction between the headlight controller and the vehicle headlight; A control device, which is connected to the power supply device, the temperature-adjustable test chamber, the image acquisition device, the temperature acquisition device and the HIL test bench, and is used for controlling the working states of the power supply device, the temperature-adjustable test chamber, the image acquisition device, the temperature acquisition device and the HIL test bench.

2. The test system according to claim 1, wherein The HIL test bench comprises: A power board card, which is connected to the power supply device and is used for monitoring the current of the vehicle headlight.

3. The test system according to claim 2, wherein The HIL test bench further comprises: A bus communication card, which is respectively connected to the vehicle headlight and the headlight controller, and is used for sending control instructions of the vehicle headlight and the headlight controller and monitoring feedback messages of the vehicle headlight and the headlight controller.

4. The test system according to claim 3, characterized in that, The HIL test bench further comprises: A relay matrix board card, which is connected to the vehicle headlight and the headlight controller, and the relay matrix board card comprises a plurality of relay modules, and each relay module is respectively connected to both ends of the corresponding vehicle headlight to realize short-circuit control of the corresponding vehicle headlight.

5. The test system according to claim 4, wherein The HIL test bench further comprises: A general-purpose analog input / output board card, which is connected to the vehicle headlight and the headlight controller.

6. The test system according to any one of claims 1-5, characterized in that, The control device is used for testing the light-emitting state of the vehicle headlight according to the image information of the vehicle headlight to be tested and the headlight controller.

7. The test system according to claim 6, characterized in that, The control device is further used for analyzing whether the heat-generating components exceed the device junction temperature at the temperature under the extreme working conditions according to the ambient temperature around the heat-generating components in the vehicle headlight and the headlight controller.

8. The test system according to claim 1, wherein The temperature acquisition device is further used for acquiring the temperature around the temperature sampling resistor in the vehicle headlight and the headlight controller; The HIL test bench is further used for acquiring the output current of the headlight controller; The control device is further used for detecting whether the self-protection current function of the vehicle headlight and the headlight controller is normal at the temperature under the extreme working conditions according to the temperature around the temperature sampling resistor and the output current of the headlight controller.

9. The test system according to claim 1, characterized in that, The HIL test bench is also used to monitor and feedback the fault feedback information of the headlight controller and the occasional fault feedback information of the headlight controller to the control device when performing various function and logic combination tests on the headlight and the headlight controller.

10. The test system according to claim 1, characterized in that, The control device is also used to prompt the test results of the headlight and the headlight controller and generate a test report for the headlight and the headlight controller.

Images