Test method and device based on mapping index, equipment and medium

Abstract

The invention provides a test method and device based on a mapping index, equipment and a medium, relates to the field of automatic test, and is used for solving the problem of low test efficiency caused by low efficiency of manual hardware configuration in a general test strategy. The method comprises the following steps: establishing a mapping relation table; the mapping relation table is used for indicating a mapping relation between the plurality of product electrical interface identifiers and the plurality of test equipment electrical interface identifiers; determining a target product electrical interface identifier of the target tested product; according to the mapping relation table, determining a target test equipment electrical interface identifier corresponding to the target product electrical interface identifier; and testing the target tested product by adopting a general test strategy through an electrical interface indicated by the electrical interface identifier of the target test equipment. The electrical interface of the test equipment is automatically indexed based on the mapping relation table, so that the hardware configuration efficiency can be improved, and the test efficiency is further improved.

Description

Technical Field

[0001] This application relates to the field of automated testing, and provides a testing method, device, equipment and medium based on mapping index. Background Art

[0002] In the field of general automated testing, the development of signal-oriented testing systems is the basis for realizing the reusability of testing strategies. The formed testing strategies are independent of specific testing hardware, so they are called general testing strategies. These general testing strategies cannot be directly run and need to match corresponding hardware acquisition and excitation ports to execute the testing tasks.

[0003] The traditional method is to manually add hardware ports for each general testing strategy, which is cumbersome and leads to low testing efficiency. Summary of the Invention

[0004] This application provides a testing method, device, equipment and medium based on mapping index, which is used to solve the problem of low testing efficiency caused by the low efficiency of manual hardware configuration for general testing strategies.

[0005] In a first aspect, a testing method based on mapping index is provided, including:

[0006] Establish a mapping relation table; the mapping relation table is used to indicate the mapping relation between multiple product electrical interface identifiers and multiple test device electrical interface identifiers;

[0007] Determine the target product electrical interface identifier of the target product to be tested;

[0008] According to the mapping relation table, determine the target test device electrical interface identifier corresponding to the target product electrical interface identifier;

[0009] Test the target product to be tested by using the general testing strategy through the electrical interface indicated by the target test device electrical interface identifier.

[0010] Optionally, the establishing of the mapping relation table includes:

[0011] Assign product electrical interface identifiers to each electrical interface of each product among multiple products to be tested, and obtain multiple product electrical interface identifiers;

[0012] Assign test device electrical interface identifiers to each electrical interface of each test device among multiple test devices, and obtain multiple test device electrical interface identifiers;

[0013] Bind the multiple product electrical interface identifiers and the multiple test device electrical interface identifiers to obtain the mapping relation table.

[0014] Optionally, after assigning product electrical interface identifiers to each electrical interface of each product under test and obtaining multiple product electrical interface identifiers, the method further includes:

[0015] Assigning communication interface protocol type identifiers to the protocols adopted by each electrical interface of each product under test to obtain multiple communication interface protocol type identifiers;

[0016] Binding the multiple communication interface protocol type identifiers to the multiple product electrical interface identifiers to obtain a first correspondence;

[0017] The determining the target product electrical interface identifier of the target product under test includes:

[0018] Determining the target communication interface protocol type identifier of the target product under test;

[0019] According to the first correspondence, determining the target product electrical interface identifier corresponding to the target communication interface protocol type identifier.

[0020] Optionally, after assigning communication interface protocol type identifiers to the protocols adopted by the electrical interfaces of each product under test and obtaining multiple communication interface protocol type identifiers, the method further includes:

[0021] Based on each communication interface protocol type identifier, assigning communication interface protocol version models to each protocol;

[0022] Based on each communication interface protocol version model, assigning underlying information identifiers to each underlying information;

[0023] The determining the target communication interface protocol type identifier of the target product under test includes:

[0024] Obtaining the target underlying information identifier of the target product under test;

[0025] Indexing to the target communication interface protocol type identifier based on the target underlying information identifier.

[0026] Optionally, if the protocol type indicated by the communication interface protocol type identifier is a bus type, the underlying information identifier includes a frame / block identifier and a bit / field identifier; if the protocol type indicated by the target communication interface protocol type identifier is a non-bus type, the underlying information identifier includes a signal variable identifier.

[0027] Optionally, the mapping relation table further includes first-class attribute information of the electrical interface indicated by each product electrical interface identifier and second-class attribute information of the electrical interface indicated by each test device electrical interface identifier, the first-class attribute information includes the number of the connector and the pin information, and the second-class attribute information includes the pin information.

[0028] Optionally, the mapping relationship includes a first mapping relationship between a plurality of product electrical interface identifiers and a plurality of adapter front panel electrical interface identifiers, a second mapping relationship between the plurality of adapter front panel electrical interface identifiers and a plurality of adapter rear panel electrical interface identifiers, a third mapping relationship between the plurality of adapter rear panel electrical interface identifiers and a plurality of test station ICA interface identifiers, and a fourth mapping relationship between the plurality of test station ICA interface identifiers and a plurality of test equipment point electrical interface identifiers;

[0029] Determining the target test equipment electrical interface identifier corresponding to the target product electrical interface identifier according to the pre-established mapping relationship table includes:

[0030] Determining the target adapter front panel electrical interface identifier corresponding to the target product electrical interface identifier according to the first mapping relationship;

[0031] Determining the target adapter rear panel electrical interface identifier corresponding to the target adapter front panel electrical interface identifier according to the second mapping relationship;

[0032] Determining the target test station ICA interface identifier corresponding to the target adapter rear panel electrical interface identifier according to the third mapping relationship;

[0033] Determining the target test equipment electrical interface identifier corresponding to the target test station ICA interface identifier according to the fourth mapping relationship.

[0034] In a second aspect, a test device based on mapping index is provided, including:

[0035] A building module, configured to build a mapping relationship table; the mapping relationship table is used to indicate the mapping relationship between a plurality of product electrical interface identifiers and a plurality of test equipment electrical interface identifiers;

[0036] A determining module, configured to determine the target product electrical interface identifier of the target product to be tested;

[0037] The determining module is further configured to determine the target test equipment electrical interface identifier corresponding to the target product electrical interface identifier according to the mapping relationship table;

[0038] A test module is further configured to test the target product to be tested by using a general test strategy through the electrical interface indicated by the target test equipment electrical interface identifier.

[0039] In a third aspect, the present application provides a computer device, which includes a memory and a processor. A computer program is stored in the memory, and the processor executes the computer program to implement the mapping index-based test method described in the first aspect.

[0040] In a fourth aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, and when a processor executes the computer program, the test method based on mapping index described in the first aspect is implemented.

[0041] Compared with the prior art, the beneficial effects of the present application are as follows:

[0042] The present application provides a test method based on mapping index, and the method includes: establishing a mapping relation table, where the mapping relation table is used to indicate the mapping relation between multiple product electrical interface identifiers and multiple test device electrical interface identifiers; determining a target product electrical interface identifier of a target product to be tested; according to the mapping relation table, determining a target test device electrical interface identifier corresponding to the target product electrical interface identifier; and testing the target product to be tested by using a general test strategy through the electrical interface indicated by the target test device electrical interface identifier.

[0043] Based on the mapping relation table, the present application performs automatic indexing. Testers do not need to manually configure the electrical interfaces of each test device, which can improve the configuration efficiency of the hardware, and further improve the test efficiency of the product to be tested. And through the mapping relation table, the occurrence of human errors can be reduced, ensuring that each electrical interface of the product to be tested can be correctly mapped to the corresponding electrical interface of the test device during the test process, which can reduce the problems caused by connection errors and ensure the reliability and accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, the drawings in the following description are only the embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained according to the provided drawings.

[0045] Figure 1 It is a schematic structural diagram of a computer device for the hardware operating environment related to the solution of the embodiment of the present application;

[0046] Figure 2 It is a schematic flowchart of a test method based on mapping index provided by the embodiment of the present application;

[0047] Figure 3 It is a schematic diagram of the mapping relation table provided by the embodiment of the present application Figure 1 ;

[0048] Figure 4 It is a schematic diagram of the mapping relation table provided by the embodiment of the present application Figure 2 ;

[0049] Figure 5A hierarchical schematic diagram of the identifier provided by an embodiment of the present application;

[0050] Figure 6 A schematic diagram of the mapping relation table provided by an embodiment of the present application Figure 3 ;

[0051] Figure 7 A structural schematic diagram of a test device based on mapping index provided by an embodiment of the present application.

[0052] Reference numerals in the figure: 101 - processor, 102 - communication bus, 103 - network interface, 104 - user interface, 105 - memory. Detailed implementation manners

[0053] To make the objectives, technical solutions and advantages of the present application clearer and more understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part rather than all of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the scope of protection of the present application. Without conflict, the embodiments in the present application and the features in the embodiments may be combined with each other arbitrarily. And although the logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than here.

[0054] To solve the problem that the general test strategy has low test efficiency due to low efficiency of manual hardware configuration, an embodiment of the present application provides a test method based on mapping index. Please refer to Figure 1 , which is a structural schematic diagram of a computer device for the hardware operating environment involved in the solution of an embodiment of the present application.

[0055] As Figure 1As shown in the figure, the computer device may include: a processor 101, such as a Central Processing Unit (CPU), a communication bus 102, a user interface 104, a network interface 103, and a memory 105. Among them, the communication bus 102 is used to realize the connection and communication between these components. The user interface 104 may include a display screen and an input unit such as a keyboard. Optionally, the user interface 104 may also include a standard wired interface and a wireless interface. The network interface 103 may optionally include a standard wired interface and a wireless interface (such as a Wireless-Fidelity (WI-FI) interface). The memory 105 may be a high-speed Random Access Memory (RAM) or a stable Non-Volatile Memory (NVM), such as a disk memory. Optionally, the memory 105 may also be a storage device independent of the aforementioned processor 101.

[0056] Those skilled in the art can understand that Figure 1 the structure shown in does not constitute a limitation on the computer device, and it may include more or fewer components than shown in the figure, or combine certain components, or have a different component layout.

[0057] As Figure 1 shown, the memory 105, as a storage medium, may include an operating system, a network communication module, a user interface module, and a test device based on mapping indexes.

[0058] In Figure 1 the computer device shown, the network interface 103 is mainly used for data communication with a network server; the user interface 104 is mainly used for data interaction with a user; the processor 101 and the memory 105 in the computer device of the present invention may be provided in the computer device. The computer device calls the test device based on mapping indexes stored in the memory 105 through the processor 101 and executes the test method based on mapping indexes provided in the embodiments of the present application.

[0059] Based on the computer device of the foregoing embodiments, the following introduces Figure 2 a test method based on mapping indexes provided in the embodiments of the present application.

[0060] S201. Establish a mapping relationship table.

[0061] The mapping relationship table is used to indicate the mapping relationship between multiple product electrical interface identifiers and multiple test device electrical interface identifiers. The following introduces the specific establishment process of the mapping relationship table.

[0062] In a possible embodiment, a product electrical interface identifier is assigned to each electrical interface of each product under test among multiple products under test, obtaining multiple product electrical interface identifiers; a test device electrical interface identifier is assigned to each electrical interface of each test device among multiple test devices, obtaining multiple test device electrical interface identifiers; the multiple product electrical interface identifiers are bound to the multiple test device electrical interface identifiers, obtaining a mapping relation table.

[0063] Embodiments of this application are for general signal testing. Before formal testing, it is necessary to model multiple units under test (UUTs). List all the units under test, assign a product identifier ID_U to each unit under test, obtaining multiple product identifiers ID_U. The product identifier ID_U is used to uniquely identify each unit under test. Each unit under test may have one or more electrical interfaces. For each unit under test, list all the electrical interfaces, assign a product electrical interface identifier ID_DQ to each electrical interface. The product electrical interface identifier ID_DQ is used to uniquely identify each electrical interface of each product. Bind the multiple product identifiers ID_U to the multiple product electrical interface identifiers ID_DQ, obtaining a second corresponding relationship.

[0064] Each test device may have one or more electrical interfaces. For each test device, also list all the electrical interfaces, assign a test device electrical interface identifier to each electrical interface. The test device electrical interface identifier is used to uniquely identify each electrical interface of each test device. The product electrical interface identifier ID_DQ can be directly bound to the corresponding test device electrical interface identifier, obtaining a mapping relation table.

[0065] In the embodiments of this application, through identification, each electrical interface has a unique identity, avoiding confusion and incorrect connection. Through binding, the electrical interfaces of the products under test are ensured to be correctly connected to the electrical interfaces of the corresponding test devices, thereby improving the accuracy and efficiency of testing. Through identification and binding, managers and operators can more easily identify and track various interfaces.

[0066] In a possible embodiment, the mapping relation table further includes first type attribute information of the electrical interface indicated by each product electrical interface identifier, and second type attribute information of the electrical interface indicated by each test device electrical interface identifier. The first type attribute information includes the connector number and pin information, and the second type attribute information includes pin information.

[0067] Among them, the connector number is used to uniquely identify the connector to which different electrical interfaces belong, and the pin information includes the electrical signal type of each pin, such as power supply, ground wire, signal wire, etc.

[0068] Such as Figure 3As shown, it is a schematic diagram of the mapping relationship table provided by the embodiment of the present application Figure 1 , and this mapping relationship table includes a fifth mapping relationship between multiple product electrical interface identifiers and multiple test equipment electrical interface identifiers. The content in the brackets is the attribute information of the electrical interface.

[0069] In the embodiment of the present application, including the attribute information of each electrical interface in the mapping relationship table helps to ensure the correct pin connection between each product and the test equipment. When a problem occurs, the attribute information can quickly guide the technician to find the root cause of the problem, such as determining whether there is a wrong pin connection or a mismatch in the connector number, which can significantly reduce the time for fault diagnosis and repair.

[0070] In a possible embodiment, an adapter front panel electrical interface identifier is assigned to the electrical interface on the front panel of each adapter among multiple adapters, and the adapter front panel electrical interface identifier is used to uniquely identify the electrical interface on the front panel of each adapter. An adapter rear panel electrical interface identifier is assigned to the electrical interface on the rear panel of each adapter among multiple adapters, and the adapter rear panel electrical interface identifier is used to uniquely identify the electrical interface on the rear panel of each adapter. A test station ICA interface identifier is assigned to the signal interface (Interface Connector Assembly, ICA) of each test station among multiple test stations, and the test station ICA interface identifier is used to uniquely identify the ICA interface of each test station.

[0071] Multiple product electrical interface identifiers are sequentially bound to multiple adapter front panel electrical interface identifiers, multiple adapter front panel electrical interface identifiers are bound to multiple adapter rear panel electrical interface identifiers, and multiple test station ICA interface identifiers are bound to multiple test equipment point electrical interface identifiers to obtain the mapping relationship table.

[0072] In a possible embodiment, the mapping relationship table further includes third type of attribute information of the electrical interface indicated by each adapter front panel electrical interface identifier, fourth type of attribute information of the electrical interface indicated by each adapter rear panel electrical interface identifier, and fifth type of attribute information of the electrical interface indicated by each test station ICA interface identifier. The third type of attribute information includes the connector number and pin information, the fourth type of attribute information includes the connector number and pin information, and the fifth type of attribute information includes the pin information.

[0073] As Figure 4 shown, it is a schematic diagram of the mapping relationship table provided by the embodiment of the present application Figure 2, the mapping relation table includes a first mapping relation between multiple product electrical interface identifiers and multiple adapter front panel electrical interface identifiers, a second mapping relation between multiple adapter front panel electrical interface identifiers and multiple adapter rear panel electrical interface identifiers, a third mapping relation between multiple adapter rear panel electrical interface identifiers and multiple test station ICA interface identifiers, and a fourth mapping relation between multiple test station ICA interface identifiers and multiple test equipment point electrical interface identifiers. The content in the brackets is the attribute information of the electrical interface.

[0074] In the embodiment of the present application, the mapping relation table can clearly indicate the positions of each adapter front panel, rear panel, and test station ICA interface and the corresponding electrical interfaces, which ensures that when connecting devices, the operator can quickly find the correct interfaces and avoid confusion or incorrect connection.

[0075] S202. Determine the target product electrical interface identifier of the target product to be measured.

[0076] In a possible embodiment, after obtaining multiple product electrical interface identifiers, a communication interface protocol type identifier may also be assigned to the protocol adopted by each electrical interface of each product to be measured, and multiple communication interface protocol type identifiers are obtained; the multiple communication interface protocol type identifiers are bound to the multiple product electrical interface identifiers to obtain a one-to-one correspondence;

[0077] The steps of determining the target product electrical interface identifier of the target product to be measured include:

[0078] Determine the target communication interface protocol type identifier of the target product to be measured;

[0079] According to the one-to-one correspondence, determine the target product electrical interface identifier corresponding to the target communication interface protocol type identifier.

[0080] In the specific implementation process, there is a corresponding communication interface protocol type under each electrical interface of each product under test, which is divided into bus types and non-bus types. Bus types include, for example, RS422 / 232 / 485, Controller Area Network (CAN), GJB289A, 1394B, Local Area Network (LAN), etc. Among them, CAN is a serial communication protocol bus for real-time applications. GJB289A is also known as the 1553B bus, which is a centralized / time-division serial bus. The 1394B bus is a high-bandwidth, low-latency, and highly reliable high-speed serial bus, which is widely used in industrial control, aerospace, automotive and other fields. LAN is a network type, and its common Ethernet protocol is IEEE 802.3. Non-bus types include, for example, Analog to Digital (AD) / Digital to Analog (DA), Discrete Digital Input (DI) / Discrete Digital Output (DO), Pulse Width Modulation (PWM), etc.

[0081] Assign the communication interface protocol type identifier ID_C of the protocol adopted for each electrical interface of each product under test. The communication interface protocol type identifier ID_C is used to uniquely identify each communication interface protocol. Bind multiple ID_Cs with multiple ID_DQs to obtain the first corresponding relationship. According to this first corresponding relationship, determine the product electrical interface identifier corresponding to the target communication interface protocol type identifier of the target product under test as the target product electrical interface identifier of the target product under test.

[0082] In a possible embodiment, after assigning the communication interface protocol type identifier to the protocol adopted by the electrical interface of each product under test to obtain multiple communication interface protocol type identifiers, the communication interface protocol version model can also be assigned to each protocol based on each communication interface protocol type identifier; based on each communication interface protocol version model, assign the underlying information identifier to each underlying information.

[0083] The steps for determining the target communication interface protocol type identifier of the target product under test include:

[0084] Obtain the target underlying information identifier of the target product under test; index to the target communication interface protocol type identifier based on the target underlying information identifier.

[0085] In a possible embodiment, if the protocol type indicated by the communication interface protocol type identifier is a bus type, the underlying information identifier includes a frame / block identifier and a bit / field identifier. If the protocol type indicated by the target communication interface protocol type identifier is a non-bus type, the underlying information identifier includes a signal variable identifier.

[0086] In the specific implementation process, for the bus type, based on the traditional three-level architecture, namely the bus, frame / block, and bit / field for marking. The frame / block is the data unit transmitted on the bus, and the bit / field is the smallest data unit in the frame / block. For the bus type protocol, a communication interface protocol version model ID_C_V is assigned to each bus, a frame / block identifier ID_C_V_B is assigned to each frame / block in each version model of the bus, and a bit / field identifier ID_C_V_S can also be assigned to each bit / field in each frame / block. For the non-bus type protocol, a communication interface protocol version model ID_C_V is assigned to each non-bus, and a signal variable identifier ID_C_V_S is assigned to each signal variable.

[0087] Please refer to Figure 5 , which is a hierarchical schematic diagram of the identifiers provided in the embodiments of the present application. From top to bottom in sequence are: product identifier ID_U, product electrical interface identifier ID_DQ, communication interface protocol type identifier ID_C, communication interface protocol version model ID_C_V, frame / block identifier ID_C_V_B, and bit / field identifier ID_C_V_S.

[0088] In addition to additional operation types such as waiting, judging, pop-up windows, looping, and jumping, the most core operation types of the test strategy are the sending type and the receiving type. When editing the test strategy, for the sending type, directly use the communication interface (i.e., the electrical interface) of the product under test and assign it the product electrical interface identifier. For the receiving type, intercept the segments in the data stream according to the communication interface (i.e., the electrical interface) and assign the product electrical interface identifier. Therefore, whether it is receiving or transmitting, it is bound to the communication interface during the test strategy editing process.

[0089] By querying the frame / block identifier ID_C_V_B or bit / field identifier ID_C_V_S or signal variable identifier ID_C_V_S of the communication interface of each test strategy, the communication interface protocol version model ID_C_V and the communication interface protocol type identifier ID_C can be indexed. According to the communication interface protocol type identifier ID_C and the first corresponding relationship, the corresponding product electrical interface identifier ID_DQ is determined. According to the product electrical interface identifier ID_DQ and the second corresponding relationship, the product identifier ID_U is determined, that is, which electrical interface of which product under test it corresponds to.

[0090] S203. According to the pre-established mapping relationship table, determine the target test equipment electrical interface identifier corresponding to the target product electrical interface identifier.

[0091] In a possible embodiment, if the mapping relationship table is Figure 3 the mapping relationship table shown, then directly determine the test equipment electrical interface identifier corresponding to the target product electrical interface identifier as the target test equipment electrical interface identifier.

[0092] In the embodiment of the present application, the electrical interface identifier of the target test device is directly determined according to the electrical interface identifier of the target product, which improves the configuration efficiency and thus improves the test efficiency.

[0093] In another possible embodiment, if the mapping relationship table is Figure 4 the mapping relationship table shown, including the first mapping relationship, the second mapping relationship, the third mapping relationship, and the fourth mapping relationship, then according to the first mapping relationship, determine the electrical interface identifier of the front panel of the target adapter corresponding to the electrical interface identifier of the target product; according to the second mapping relationship, determine the electrical interface identifier of the rear panel of the target adapter corresponding to the electrical interface identifier of the front panel of the target adapter; according to the third mapping relationship, determine the ICA interface identifier of the target test station corresponding to the electrical interface identifier of the rear panel of the target adapter; according to the fourth mapping relationship, determine the electrical interface identifier of the target test device corresponding to the ICA interface identifier of the target test station.

[0094] In the embodiment of the present application, according to the electrical interface identifier of the target product, the electrical interface identifier of the front panel of the target adapter, the electrical interface identifier of the rear panel of the target adapter, the ICA interface identifier of the target test station, and the electrical interface identifier of the target test device are determined in sequence, making the device configuration process simpler and clearer, improving the configuration accuracy, and thus improving the test accuracy.

[0095] S203. Test the target product to be tested by using a general test strategy through the electrical interface indicated by the electrical interface identifier of the target test device.

[0096] In the specific implementation process, after obtaining the electrical interface identifier of the target test device, that is, the port number of the specific test device is determined, and the test can be carried out in two forms.

[0097] The first is that the upper computer sends it to the controller of the lower computer in the form of a configuration file, and the controller calls the hardware driver to make the target port of the test device (that is, the electrical interface indicated by the electrical interface identifier of the target test device) execute the send or receive command, and uses the general test strategy to test the target product to be tested.

[0098] The second is that the upper computer directly calls the hardware driver to make the target port of the test device (that is, the electrical interface indicated by the electrical interface identifier of the target test device) execute the send or receive command, and uses the general test strategy to test the target product to be tested.

[0099] It should be noted that all the identifiers mentioned in the embodiments of the present application can be combinations of letters, numbers or symbols, and the embodiments of the present application do not make specific limitations.

[0100] For example, a product under test (ID_U = M1) has 1 RS422 port, ID_DQ = XT_3to12, ID_C = RS422, ID_C_V = 1.0, ID_C_V_B = 1.0_001, ID_C_V_S = 1.0_001_35. The established mapping table is as follows Figure 6 as shown.

[0101] The test strategy contains the keyword ID_C_V_S. Based on ID_C_V_S = 1.0_001_35, ID_C_V = 1.0 is obtained by indexing. Based on ID_C_V = 1.0, ID_DQ = XT_3to12 is obtained by indexing. Then, query Figure 6 the mapping table as shown, and find that the test device electrical interface identifier corresponding to ID_DQ = XT_3to12 is RS422_port1.

[0102] In summary, the embodiment of the present application provides a test method based on mapping indexing, which solves the problem of low test efficiency caused by low efficiency of manual hardware configuration in general test strategies. At the same time, this method is also applicable to multiple products under test UUT, and has wide generality.

[0103] Based on the same inventive concept, please refer to Figure 7 , the present application also provides a test device based on mapping indexing, including:

[0104] A building module for establishing a mapping table; the mapping table is used to indicate the mapping relationship between multiple product electrical interface identifiers and multiple test device electrical interface identifiers;

[0105] A determination module for determining the target product electrical interface identifier of the target product under test;

[0106] The determination module is further configured to determine the target test device electrical interface identifier corresponding to the target product electrical interface identifier according to the mapping table;

[0107] A test module is further configured to test the target product under test by using the general test strategy through the electrical interface indicated by the target test device electrical interface identifier.

[0108] Optionally, the building module is specifically configured to:

[0109] Assign product electrical interface identifiers to each electrical interface of each product under test among multiple products under test to obtain multiple product electrical interface identifiers;

[0110] Assign test device electrical interface identifiers to each electrical interface of each test device among multiple test devices to obtain multiple test device electrical interface identifiers;

[0111] Bind multiple product electrical interface identifiers to multiple test device electrical interface identifiers to obtain a mapping relation table.

[0112] Optionally, the device further includes an identification module, and the identification module is used for:

[0113] After assigning product electrical interface identifiers to each electrical interface of each product under test among multiple products under test to obtain multiple product electrical interface identifiers, assign communication interface protocol type identifiers to the protocols adopted by each electrical interface of each product under test to obtain multiple communication interface protocol type identifiers;

[0114] Bind multiple communication interface protocol type identifiers to multiple product electrical interface identifiers to obtain a first correspondence;

[0115] The determination module is specifically used for:

[0116] Determine the target communication interface protocol type identifier of the target product under test;

[0117] According to the first correspondence, determine the target product electrical interface identifier corresponding to the target communication interface protocol type identifier.

[0118] Optionally, the identification module is further used for: After assigning communication interface protocol type identifiers to the protocols adopted by the electrical interfaces of each product under test to obtain multiple communication interface protocol type identifiers, based on each communication interface protocol type identifier, assign communication interface protocol version models to each protocol;

[0119] Based on each communication interface protocol version model, assign underlying information identifiers to each underlying information;

[0120] The determination module is specifically used for:

[0121] Obtain the target underlying information identifier of the target product under test;

[0122] Index to the target communication interface protocol type identifier based on the target underlying information identifier.

[0123] Optionally, if the protocol type indicated by the communication interface protocol type identifier is a bus type, the underlying information identifier includes frame / block identifier, bit / field identifier; if the protocol type indicated by the target communication interface protocol type identifier is a non-bus type, the underlying information identifier includes signal variable identifier.

[0124] Optionally, the mapping relation table further includes first-class attribute information of the electrical interfaces indicated by each product electrical interface identifier, and second-class attribute information of the electrical interfaces indicated by each test device electrical interface identifier. The first-class attribute information includes the connector number and pin information, and the second-class attribute information includes pin information.

[0125] Optionally, the mapping relationship includes a first mapping relationship between multiple product electrical interface identifiers and multiple adapter front panel electrical interface identifiers, a second mapping relationship between multiple adapter front panel electrical interface identifiers and multiple adapter rear panel electrical interface identifiers, a third mapping relationship between multiple adapter rear panel electrical interface identifiers and multiple test station ICA interface identifiers, and a fourth mapping relationship between multiple test station ICA interface identifiers and multiple test equipment point electrical interface identifiers;

[0126] The determining module is specifically configured to:

[0127] Determine the target adapter front panel electrical interface identifier corresponding to the target product electrical interface identifier according to the first mapping relationship;

[0128] Determine the target adapter rear panel electrical interface identifier corresponding to the target adapter front panel electrical interface identifier according to the second mapping relationship;

[0129] Determine the target test station ICA interface identifier corresponding to the target adapter rear panel electrical interface identifier according to the third mapping relationship;

[0130] Determine the target test equipment electrical interface identifier corresponding to the target test station ICA interface identifier according to the fourth mapping relationship.

[0131] It should be noted that in this embodiment, each module in the test device based on the mapping index corresponds one-to-one to each step in the test method based on the mapping index in the foregoing embodiment. Therefore, the specific implementation manner of this embodiment can refer to the implementation manner of the foregoing test method based on the mapping index, which will not be elaborated here.

[0132] Based on the same inventive concept, the present application further provides a computer device, which includes a processor, a memory, and a computer program stored in the memory. When the computer program is run by the processor, the foregoing test method based on the mapping index is implemented.

[0133] Based on the same inventive concept, the present application further provides a computer storage medium, on which a computer program is stored. When the computer program is run by the processor, the foregoing test method based on the mapping index is implemented.

[0134] In some embodiments, the computer-readable storage medium may be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, flash memory, magnetic surface memory, optical disc, or CD-ROM; or may be various devices including one or any combination of the foregoing memories. The computer may be various computing devices including smart terminals and servers.

[0135] In some embodiments, executable instructions may be in the form of a program, software, software module, script or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as a stand-alone program or as a module, component, subroutine or other unit suitable for use in a computing environment.

[0136] As an example, executable instructions may, but need not, correspond to a file in a file system, may be stored as part of a file that stores other programs or data, such as in one or more scripts in a HyperText Markup Language (HTML) document, in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files storing one or more modules, subroutines, or code portions).

[0137] By way of example, executable instructions may be deployed to be executed on one computing device, or on multiple computing devices located at one site, or on multiple computing devices distributed across multiple sites and interconnected by a communication network.

[0138] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0139] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0140] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as a read-only memory / random access memory, a magnetic disk, or an optical disk), and includes a number of instructions for a multimedia terminal device (which can be a mobile phone, a computer, a television receiver, or a network device, etc.) to execute the methods of each embodiment of the present application.

[0141] The above are only the preferred embodiments of the present application, and do not limit the patent scope of the present application accordingly. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, shall be similarly included in the patent protection scope of the present application.

Claims

1. A test method based on mapping index, characterized in that Including: Establishing a mapping relation table; The mapping relation table is used to indicate the mapping relation between multiple product electrical interface identifiers and multiple test device electrical interface identifiers; Determining the target product electrical interface identifier of the target product under test; According to the mapping relation table, determining the target test device electrical interface identifier corresponding to the target product electrical interface identifier; Testing the target product under test by using a general test strategy through the electrical interface indicated by the target test device electrical interface identifier.

2. The test method based on mapping index according to claim 1, wherein The establishing of the mapping relation table includes: Assigning product electrical interface identifiers to each electrical interface of each product among multiple products under test to obtain multiple product electrical interface identifiers; Assigning test device electrical interface identifiers to each electrical interface of each test device among multiple test devices to obtain multiple test device electrical interface identifiers; Binding the multiple product electrical interface identifiers and the multiple test device electrical interface identifiers to obtain a mapping relation table.

3. The test method based on mapping index according to claim 2, wherein After assigning product electrical interface identifiers to each electrical interface of each product among multiple products under test to obtain multiple product electrical interface identifiers, the method further includes: Assigning communication interface protocol type identifiers to the protocols adopted by each electrical interface of each product under test to obtain multiple communication interface protocol type identifiers; Binding the multiple communication interface protocol type identifiers and the multiple product electrical interface identifiers to obtain a first corresponding relation; The determining of the target product electrical interface identifier of the target product under test includes: Determining the target communication interface protocol type identifier of the target product under test; According to the first corresponding relation, determining the target product electrical interface identifier corresponding to the target communication interface protocol type identifier.

4. The test method based on mapping index according to claim 3, wherein After assigning communication interface protocol type identifiers to the protocols adopted by the electrical interfaces of each product under test to obtain multiple communication interface protocol type identifiers, the method further includes: Based on each communication interface protocol type identifier, assigning communication interface protocol version models to each protocol; Based on each communication interface protocol version model, assigning underlying information identifiers to each underlying information; The determining of the target communication interface protocol type identifier of the target product under test includes: Obtaining the target underlying information identifier of the target product under test; Indexing to the target communication interface protocol type identifier based on the target underlying information identifier.

5. The test method based on mapping index according to claim 4, wherein If the protocol type indicated by the communication interface protocol type identifier is a bus type, the underlying information identifier includes a frame / block identifier and a bit / field identifier; if the protocol type indicated by the target communication interface protocol type identifier is a non-bus type, the underlying information identifier includes a signal variable identifier.

6. The test method based on mapping index according to claim 1, characterized in that The mapping relation table further includes first type attribute information of the electrical interface indicated by each product electrical interface identifier and second type attribute information of the electrical interface indicated by each test device electrical interface identifier, the first type attribute information includes the number of the connector and pin information, and the second type attribute information includes pin information.

7. The test method based on mapping index according to claim 1, characterized in that The mapping relationship includes a first mapping relationship between multiple product electrical interface identifiers and multiple adapter front panel electrical interface identifiers, a second mapping relationship between multiple adapter front panel electrical interface identifiers and multiple adapter rear panel electrical interface identifiers, a third mapping relationship between multiple adapter rear panel electrical interface identifiers and multiple test station ICA interface identifiers, and a fourth mapping relationship between multiple test station ICA interface identifiers and multiple test equipment point electrical interface identifiers; Determining the target test equipment electrical interface identifier corresponding to the target product electrical interface identifier according to the pre-established mapping relationship table includes: Determining the target adapter front panel electrical interface identifier corresponding to the target product electrical interface identifier according to the first mapping relationship; Determining the target adapter rear panel electrical interface identifier corresponding to the target adapter front panel electrical interface identifier according to the second mapping relationship; Determining the target test station ICA interface identifier corresponding to the target adapter rear panel electrical interface identifier according to the third mapping relationship; Determining the target test equipment electrical interface identifier corresponding to the target test station ICA interface identifier according to the fourth mapping relationship.

8. A test device based on mapping index, characterized in that It includes: A establishing module for establishing a mapping relationship table; The mapping relationship table is used to indicate the mapping relationship between multiple product electrical interface identifiers and multiple test equipment electrical interface identifiers; A determining module for determining the target product electrical interface identifier of the target product to be tested; The determining module is further configured to determine the target test equipment electrical interface identifier corresponding to the target product electrical interface identifier according to the mapping relationship table; A testing module is further configured to test the target product to be tested by using a general testing strategy through the electrical interface indicated by the target test equipment electrical interface identifier.

9. A computer device, characterized in that, The computer device includes a memory and a processor. A computer program is stored in the memory, and the processor executes the computer program to implement the mapping index-based testing method according to any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium, and the processor executes the computer program to implement the mapping index-based testing method according to any one of claims 1-7.

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