System, method and equipment for testing optimal placement orientation of wireless equipment and storage medium

Abstract

The invention provides a wireless device optimal placement orientation test system, method and device and a storage medium, and the test system comprises a lifting turntable which is arranged in a designated space and is provided with a to-be-tested device; the controller is connected with the lifting rotary table and used for controlling the lifting rotary table to rotate at a specified speed and a specified stepping angle and controlling the lifting rotary table to ascend and descend for multiple times in a specified range every time the movement of one stepping angle is completed; the measuring antenna is arranged in a specified space, and the measuring antenna directly faces the equipment to be measured at a vertical polarization angle or a horizontal polarization angle; the spectrum analyzer is connected with the measuring antenna and is used for acquiring level data of the measuring antenna when the lifting turntable is lifted in place every time; the upper computer is connected with the spectrum analyzer and the controller and used for receiving all the level data and determining the placement position of the to-be-tested equipment when the transmitting level is maximum based on all the level data, the optimal transmitting level position is rapidly positioned, and the testing precision and efficiency are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of wireless device testing, and particularly to a testing system, method, device and storage medium for the optimal placement orientation of wireless devices. Background Art

[0002] In the evaluation of radio frequency transmission performance, the method of receiving by antenna coupling is often used to measure the transmission level. Due to the differences in the types and installation positions of the antennas used in the test, the placement angles of the device under test in different spatial orientations will significantly affect the measured level value. Therefore, in order to obtain the optimal test results, it is necessary to adjust the placement angle of the device multiple times, collect multiple groups of level data, and select the placement position with the best transmission performance from them.

[0003] However, under the current test conditions, this process still mainly relies on manual operations, including the adjustment of the sample angle, the reading and recording of test data, etc. Since a large number of repetitive measurements are required to find the best placement position, the entire process not only has a large workload and low efficiency, but also is prone to affecting the accuracy of the final test results due to human operation errors or omissions, which may lead to abnormal determination or misjudgment of the transmission level, and affect the consistency and reliability of product testing. Summary of the Invention

[0004] Embodiments of the present invention provide a testing system, method, device and storage medium for the optimal placement orientation of wireless devices to solve the problems existing in the related technologies. The technical solutions are as follows:

[0005] In a first aspect, embodiments of the present invention provide a testing system for the optimal placement orientation of wireless devices, including:

[0006] A lifting turntable, arranged in a specified space, on which the device under test is set;

[0007] A controller, connected to the lifting turntable, for controlling the lifting turntable to rotate at a specified speed and a specified step angle, and controlling the lifting turntable to perform multiple liftings within a specified range every time a step angle movement is completed;

[0008] A measuring antenna, arranged in the specified space, with the measuring antenna facing the device under test at a vertical polarization or horizontal polarization angle;

[0009] A spectrum analyzer, connected to the measuring antenna, for obtaining the level data of the measuring antenna every time the lifting turntable reaches the lifting position;

[0010] An upper computer, connected to the spectrum analyzer and the controller, for receiving all the level data and determining the placement orientation when the transmission level of the device under test is the maximum based on all the level data.

[0011] In an implementation manner, the lifting turntable includes:

[0012] An electric turntable, which is used to rotate at a specified speed and a specified step angle;

[0013] An electric lift column, which is arranged on the electric turntable and is used to lift within a specified range based on the initial height of the device under test;

[0014] A placement platform, which is arranged at the top of the electric lift column and is used to place the device under test, so that the device under test rotates and lifts along with the electric turntable and the electric lift column.

[0015] In one embodiment, the supply voltage of the device under test is maintained within the range of rated supply voltage ±1%.

[0016] In one embodiment, the device under test continuously emits a test signal in its maximum transmit power level state, and the spectrum analyzer scans within a specified frequency band in peak or rms detection mode.

[0017] In a second aspect, an embodiment of the present invention provides a method for testing the optimal placement orientation of a wireless device, which is applied to the wireless device optimal placement orientation test system as described above; the method includes:

[0018] Obtain a test request, and control the lifting turntable to rotate at a specified speed and a specified step angle according to the test request; wherein, a device under test is arranged on the lifting turntable, and the device under test faces the measurement antenna at a vertical polarization or horizontal polarization angle;

[0019] When each step angle movement is completed, determine the current rotation angle of the device under test, control the lifting turntable to lift multiple times within a specified range based on a preset motion rule, and obtain the level data corresponding to the current rotation angle through a spectrum analyzer connected to the measurement antenna every time the lifting is in place;

[0020] Determine the placement orientation when the transmit level of the device under test is the maximum based on all the level data.

[0021] In one embodiment, it further includes:

[0022] Before obtaining the test request, control the lifting turntable to move the device under test to a state horizontally aligned with the measurement antenna; wherein, the horizontal distance between the center points of the device under test and the measurement antenna is within the range of 0 mm to 100 mm.

[0023] In one embodiment, controlling the lifting turntable to lift multiple times within a specified range based on a preset motion rule includes:

[0024] When each step angle movement is completed, control the lifting turntable to lift multiple times within the range of ±200 mm of the initial height of the device under test at a step speed of 50 mm / S;

[0025] When the lifting is in place and stable each time, at least three current-level readings are continuously obtained through a spectrum analyzer to obtain 8 groups of level data.

[0026] In one embodiment, determining the placement orientation when the emission level of the device under test is the maximum based on all the level data includes:

[0027] When the lifting turntable completes a 360° rotation at a specified step angle, the level data corresponding to each rotation angle is obtained;

[0028] The maximum level value and its corresponding azimuth parameters are screened out from the level data corresponding to all rotation angles to determine the placement orientation when the emission level of the device under test is the maximum. The azimuth parameters include the rotation angle of the lifting turntable and the height of the lifting turntable.

[0029] In a third aspect, an embodiment of the present invention provides an electronic device, which includes: a memory and a processor. Among them, the memory and the processor communicate with each other through an internal connection path. The memory is used to store instructions, and the processor is used to execute the instructions stored in the memory. When the processor executes the instructions stored in the memory, the processor executes the method in any one of the above aspects.

[0030] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, and the computer-readable storage medium stores a computer program. When the computer program runs on a computer, the method in any one of the above aspects is executed.

[0031] The advantages or beneficial effects in the above technical solutions at least include:

[0032] In the present invention, a lifting turntable is arranged in a specified space, and a device under test is arranged on the lifting turntable to drive the device under test to rotate and lift. Among them, a measuring antenna is also arranged in the specified space, and the measuring antenna is vertically polarized or horizontally polarized facing the device under test. During the test, the lifting turntable is controlled to rotate at a specified speed and a specified step angle. When each step angle movement is completed, the lifting turntable is controlled to perform multiple liftings within a specified range, and when the lifting is in place each time, the level data corresponding to the current rotation angle is obtained through a spectrum analyzer connected to the measuring antenna, and the placement orientation when the emission level of the device under test is the maximum is determined based on all the level data. The present invention realizes the precise synchronization of turntable positioning, spectrum analyzer data acquisition, and the lifting of the device under test through a host computer, ensures the spatio-temporal consistency of test data, and eliminates manual operation errors; through automated multi-dimensional scanning (azimuth angle + height + polarization) and combined with intelligent data analysis, quickly locates the position with the best emission level, improving the test accuracy and efficiency.

[0033] The above summary is for the purpose of the specification only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features of the present invention will be readily apparent by reference to the drawings and the following detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In the drawings, unless otherwise specified, the same reference numerals throughout the several views represent the same or similar components or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings depict only some embodiments disclosed in accordance with the present invention and should not be considered as limiting the scope of the present invention.

[0035] Figure 1 It is a schematic diagram of the modules of the test system for the optimal placement orientation of the wireless device of the present invention;

[0036] Figure 2 It is an exploded view of the lifting turntable of the present invention;

[0037] Figure 3 It is a schematic flowchart of the method for testing the optimal placement orientation of the wireless device of the present invention;

[0038] Figure 4 It is a block diagram of the structure of an electronic device according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0039] In the following, only some exemplary embodiments are briefly described. As those skilled in the art will recognize, the described embodiments can be modified in various different ways without departing from the spirit or scope of the present invention. Therefore, the drawings and the description are considered to be exemplary in nature and not restrictive.

[0040] Embodiment 1

[0041] This embodiment provides a test system for the optimal placement orientation of a wireless device. As Figure 1 shown, the test system mainly consists of a device under test (abbreviated as EUT), a measurement antenna, a spectrum analyzer, a controller, and a test system host computer.

[0042] The test system of this embodiment is mainly deployed in a specified space. Among them, the specified space refers to an anechoic chamber, which is a shielded chamber specially designed for electromagnetic compatibility (EMC) testing and radio frequency (RF) performance evaluation, providing a highly controllable and pure electromagnetic environment, minimizing internal and external electromagnetic interference, and ensuring a highly pure test environment.

[0043] Inside the anechoic chamber, there is a measurement antenna. The fixed position of the measurement antenna is about 900 mm away from the floor of the anechoic chamber. The purpose is to provide an ideal test condition that is both close to the actual application scenario and can minimize external interference, which helps to obtain more accurate and reliable test data.

[0044] In this embodiment, the measurement antenna is connected to a spectrum analyzer. The spectrum analyzer scans within a specified frequency band and is used to measure the emission level or radiation level of the device under test in different orientations. The spectrum analyzer is connected to a host computer through a GPIB interface. The host computer automatically reads the level data of the spectrum analyzer and determines the placement orientation of the device under test when the emission level is the maximum based on all the level data.

[0045] There is also a lifting turntable in the anechoic chamber. The device under test is installed on the lifting turntable. The device under test can be installed horizontally or vertically on the lifting turntable, and the height of the lifting turntable can be adjusted within the range of 600 mm to 1200 mm.

[0046] To improve the test accuracy, the horizontal distance between the center points of the device under test and the measurement antenna in the anechoic chamber is within the range of 0 mm to 100 mm, and the initial placement height of the device under test is horizontally aligned with the measurement antenna.

[0047] The lifting turntable is connected to a controller through a communication cable, and the controller is connected to the host computer. The host computer adjusts the lifting and rotation actions of the lifting turntable through the controller. In this embodiment, to ensure the purity of the test environment, the communication cable for control should use a shielded cable and be routed under the floor; at the same time, ensure that there are no conductive objects with a diameter greater than λ / 4 (λ is the radio wave wavelength) of the highest test frequency near the test site, further reducing the electromagnetic interference generated by other devices in the working environment.

[0048] As Figure 2 shown, Figure 2 is an exploded view of the lifting turntable. In this embodiment, the lifting turntable includes an electric turntable 3, an electric lifting column 2, and a placement platform 1.

[0049] The electric turntable 3 is used to rotate horizontally at a specified speed and a specified step angle to adjust the spatial orientation angle of the device under test.

[0050] Among them, the electric turntable 3 can use a servo motor or a stepper motor as the power source, and converts the high-speed low-torque into low-speed high-torque output through a reduction mechanism (such as a planetary reducer or a harmonic reducer); and its transmission method is that after the motor output shaft is connected to the reducer, it drives the main gear to mesh with the large gear ring on the turntable base to achieve the rotational motion.

[0051] The electric lifting column 2 is a linear motion actuator in the vertical direction, mainly used to realize the automatic lifting and adjustment of the device under test in the Z-axis direction. The electric lifting column 2 is integrated on the electric turntable 3 to achieve multi-degree-of-freedom positioning in space, and is used for lifting motion within a specified range based on the initial height of the device under test.

[0052] The placement platform 1 is the terminal structure for carrying the device under test, located at the top of the electric lifting column 2, and completes the lifting and rotation actions together with it.

[0053] It should be noted that the internal structure and working principle of the electric turntable 3 and the electric lifting column 2 in the lifting and rotating table in this embodiment have been disclosed in the prior art and will not be described in detail here.

[0054] In this embodiment, the supply voltage of the device under test is maintained within the range of ±1% of the rated supply voltage, which can ensure the stable operation of the device while ensuring that the test results reflect the true performance of the device under ideal working conditions, thereby improving the accuracy and reliability of the measurement.

[0055] After arranging the measurement antenna and the device under test in the anechoic chamber in the above manner, the test steps can be entered. The test steps are as follows:

[0056] (1) The test site should meet the test requirements of the specified frequency band. The device under test is placed on the lifting and rotating table. Among them, the measurement antenna is vertically polarized and faces the device under test.

[0057] (2) Configure the device under test to work in the maximum transmit power level state and continuously transmit test signals.

[0058] (3) Set the spectrum analyzer to peak or rms detection mode and scan within the specified frequency band.

[0059] (4) Set the rotation speed and step angle of the lifting and rotating table through the interface of the upper computer to drive the device under test to rotate at a specified speed and a specified step angle; in this embodiment, the specified speed and the specified step angle are preferably 15° / S.

[0060] (5) When the lifting and rotating table completes a movement of one step angle, the upper computer controls the lifting and rotating table to perform multiple liftings within the specified range of the initial height of the device under test; in this embodiment, the device under test is controlled to lift within the range of ±200 mm of the initial height at a step speed of 50 mm / S; after each lifting of the lifting and rotating table is in place, continuously obtain at least 3 level readings in the current state through the spectrum analyzer, calculate the average value of the readings, and record the level readings, the current average level, the turntable angle (the azimuth of the device under test), and the height of the device under test. Calculating the average value of the level readings can obtain more accurate measurement results.

[0061] Among them, the device under test is controlled to move vertically up and down within the range of ±200 mm from the initial height at a stepping speed of 50 mm / s. The total moving range is 400 mm in total, the stepping distance is 50 mm. After each movement reaches the position and stabilizes, the spectrum analyzer collects at least 3 sets of current level data. During the entire vertical scanning process, a total of 8 sets of level data are collected (400 mm ÷ 50 mm / step = 8 steps). The upper computer will obtain 8 sets of level data in the vertical direction and record the relevant azimuth data of the maximum level, such as the level, turntable angle, and the height of the device under test, etc. Among them, the maximum level can refer to the maximum average level or the maximum level reading.

[0062] (6) Control the lifting turntable to step to the next angle.

[0063] (7) Repeat the process of (5) - (6). After the lifting turntable rotates 360°, the upper computer automatically selects the maximum level and its corresponding azimuth data from the 192 (360° / 15° * 8) sets of level data obtained by the spectrum analyzer. The azimuth data includes the rotation angle of the lifting turntable, the height of the device under test, and the height of the measurement antenna, etc. Among them, the maximum level can be the maximum average level or the maximum level reading.

[0064] (8) Complete the vertical polarization scanning test.

[0065] (9) Horizontally install the device under test on the lifting turntable and repeat the process of (2) - (7), and record the azimuth data such as the maximum level, the corresponding turntable angle, and the height of the device under test.

[0066] (10) Complete the horizontal polarization scanning test.

[0067] (11) After the tests in the vertical and horizontal directions are completed respectively, the upper computer automatically finds the larger level from the data measured in steps (7) and (9), and records the corresponding azimuth data (the maximum emission level, the rotation angle of the lifting turntable, and the height of the device under test). Finally, this set of data is stored in the level data set of the best azimuth for direct call in later tests.

[0068] Through the above test process, the data obtained in step (11) is the placement position data of the best emission level of the device under test. The later test can directly call out this set of data for testing.

[0069] Embodiment 2

[0070] This embodiment provides a method for testing the best placement azimuth of a wireless device, which is applied to the wireless device best placement azimuth test system as described in Embodiment 1. The execution object of the test method in this embodiment is the upper computer, which quickly locates the best emission level position of the device under test to improve the test accuracy and efficiency.

[0071] As shown in Figure 3 , the method for testing the optimal placement orientation of the wireless device in this embodiment specifically includes:

[0072] Step S1: Obtain a test request, and control the lifting turntable to rotate at a specified speed and a specified step angle according to the test request; wherein, the device under test is provided on the lifting turntable, and the device under test faces the measurement antenna at a vertical polarization or horizontal polarization angle.

[0073] Before obtaining the test request, control the lifting turntable to move the device under test to a state where it is horizontally aligned with the measurement antenna; wherein, the horizontal distance between the center points of the device under test and the measurement antenna is within the range of 0 mm to 100 mm. When the device under test and the measurement antenna are on the same horizontal line, the measurement error caused by the angle difference can be reduced.

[0074] The test request can be initiated by the user through the upper computer interface, and the rotation speed and step angle of the lifting turntable are set in advance through the upper computer interface.

[0075] When performing vertical polarization scanning, the device under test is vertically installed on the lifting turntable, that is, the measurement antenna is vertically polarized and faces the device under test. After the user initiates a test request through the upper computer, the upper computer sends a control instruction to the controller to control the lifting turntable to rotate at a specified speed and a specified step speed.

[0076] When performing horizontal polarization scanning, the device under test is horizontally installed on the lifting turntable. After the user initiates a test request through the upper computer, the upper computer sends a control instruction to the controller to control the lifting turntable to rotate at a specified speed and a specified step speed.

[0077] Step S2: When each step angle movement is completed, determine the current rotation angle of the device under test, control the lifting turntable to perform multiple lifts within a specified range based on a preset motion rule, and obtain the level data corresponding to the current rotation angle through a spectrum analyzer connected to the measurement antenna each time the lift reaches the position.

[0078] After each step angle reaches the position, the upper computer controls the lifting turntable to make the device under test lift within ±200 mm of the initial height at a step speed of 50 mm / S. After each lift reaches the position and stabilizes, continuously obtain 3 level readings in the current state through the spectrum analyzer, calculate the average value of the readings, and record the level readings, average level, rotation angle of the lifting turntable (orientation of the device under test), height of the device under test, height of the measurement antenna, etc.

[0079] Step S3: Determine the placement orientation when the transmission level of the device under test is the maximum based on all the level data.

[0080] In step S2, every time a movement of one stepping angle is completed, the host computer can obtain 8 groups of level data in the vertical direction; after the lifting turntable completes a 360° rotation, the host computer automatically obtains 192 (360° / 15° x 8) groups of level data from the spectrum analyzer, and filters out one or more groups of data with the largest level reading or the largest average level, and their corresponding azimuth parameters. The azimuth parameters include the rotation angle of the lifting turntable and the height of the device under test, etc. According to this group of data, the placement azimuth when the emission level of the device under test is the largest is determined, and this group of data is stored in the level data set of the best azimuth for direct call in later tests.

[0081] For the functions implemented by the method of the embodiment of the present invention, reference can be made to the corresponding description in the above system, which will not be elaborated here.

[0082] Embodiment III

[0083] This embodiment provides an electronic device. Figure 3 The structural block diagram of the electronic device according to an embodiment of the present invention is shown. As Figure 3 shown, the electronic device includes: a memory 100 and a processor 200. A computer program that can run on the processor 200 is stored in the memory 100. When the processor 200 executes the computer program, the method for testing the best placement azimuth of the wireless device in the above embodiment is implemented. The number of the memory 100 and the processor 200 can be one or more.

[0084] The electronic device further includes:

[0085] A communication interface 300, which is used to communicate with external devices and perform data interaction and transmission.

[0086] If the memory 100, the processor 200, and the communication interface 300 are implemented independently, the memory 100, the processor 200, and the communication interface 300 can be connected to each other through a bus and communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc.

[0087] Optionally, in specific implementation, if the memory 100, the processor 200, and the communication interface 300 are integrated on a chip, the memory 100, the processor 200, and the communication interface 300 can communicate with each other through an internal interface.

[0088] An embodiment of the present invention provides a computer-readable storage medium storing a computer program, which when executed by a processor, implements the method provided in the embodiment of the present invention.

[0089] An embodiment of the present invention further provides a chip, which includes a processor for calling and running instructions stored in a memory, so that a communication device equipped with the chip executes the method provided in the embodiment of the present invention.

[0090] An embodiment of the present invention further provides a chip, including: an input interface, an output interface, a processor, and a memory. The input interface, the output interface, the processor, and the memory are connected through an internal connection path. The processor is configured to execute code in the memory, and when the code is executed, the processor is configured to execute the method provided in the embodiment of the invention.

[0091] It should be understood that the above-mentioned processor may be a central processing unit (CPU), or may also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. It is worth noting that the processor may be a processor supporting the advanced RISC machines (ARM) architecture.

[0092] Further, optionally, the above-mentioned memory may include a read-only memory and a random access memory, and may further include a non-volatile random access memory. The memory may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may include a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may include a random access memory (RAM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available. For example, static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchlink dynamic random access memory (SLDRAM), and direct rambus random access memory (DR RAM).

[0093] In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using software, it may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the processes or functions according to the present invention are generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium.

[0094] In the description of this specification, the descriptions referring to terms such as "one embodiment", "some embodiments", "example", "specific example", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. Moreover, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0095] In addition, the terms "first" and "second" are used only for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present invention, "a plurality of" means two or more unless otherwise specifically defined.

[0096] As described above, the above are only the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various changes or substitutions, and these should all be covered by the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A testing system for the optimal placement orientation of a wireless device, characterized in that, Comprising: A lifting turntable, arranged in a specified space and provided with a device under test; A controller, connected to the lifting turntable, for controlling the lifting turntable to rotate at a specified speed and a specified step angle, and controlling the lifting turntable to perform multiple liftings within a specified range each time a movement of one step angle is completed; A measuring antenna, arranged in the specified space, with the measuring antenna facing the device under test at a vertical polarization or horizontal polarization angle; A spectrum analyzer, connected to the measuring antenna, for obtaining the level data of the measuring antenna each time the lifting turntable reaches the end of a lift; An upper computer, connected to the spectrum analyzer and the controller, for receiving all the level data and determining the placement orientation when the emission level of the device under test is the maximum based on all the level data.

2. The wireless device optimal placement orientation testing system according to claim 1, characterized in that The lifting turntable includes: An electric turntable, for rotating at a specified speed and a specified step angle; An electric lifting column, arranged on the electric turntable, for performing the lifting within the specified range based on the initial height of the device under test; A placement platform, arranged at the top of the electric lifting column, for placing the device under test, such that the device under test rotates and moves up and down along with the electric turntable and the electric lifting column.

3. The wireless device optimal placement orientation testing system according to claim 1, characterized in that, The supply voltage of the device under test is maintained within the range of rated supply voltage ±1%.

4. The wireless device optimal placement orientation testing system according to claim 1, characterized in that, The device under test continuously emits a test signal in its maximum transmit power level state, and the spectrum analyzer scans within a specified frequency band in a peak or RMS detection mode.

5. A method for testing the optimal placement orientation of a wireless device, characterized in that, Applied in the wireless device optimal placement orientation test system as described in any one of claims 1 to 4; the method includes: Obtaining a test request, and controlling the lifting turntable to rotate at a specified speed and a specified step angle according to the test request; wherein, a device under test is arranged on the lifting turntable, and the device under test faces the measuring antenna at a vertical polarization or horizontal polarization angle; Each time a movement of one step angle is completed, determining the current rotation angle of the device under test, controlling the lifting turntable to perform multiple liftings within a specified range based on a preset motion rule, and obtaining the level data corresponding to the current rotation angle through a spectrum analyzer connected to the measuring antenna each time the lift reaches the end; Determining the placement orientation when the emission level of the device under test is the maximum based on all the level data.

6. The method for testing the optimal placement orientation of a wireless device according to claim 5, characterized in that, Further comprising: Before obtaining the test request, controlling the lifting turntable to move the device under test to a state horizontally aligned with the measuring antenna; wherein, the horizontal distance between the center points of the device under test and the measuring antenna is within the range of 0 mm to 100 mm.

7. The method for testing the optimal placement orientation of a wireless device according to claim 5, wherein The controlling the lifting turntable to perform multiple liftings within a specified range based on a preset motion rule includes: Each time a movement of one step angle is completed, controlling the lifting turntable to perform multiple liftings within the range of ±200 mm of the initial height of the device under test at a step speed of 50 mm / S; Continuously obtaining at least three level readings in the current state through the spectrum analyzer each time the lift reaches the end and stabilizes, to obtain 8 groups of level data.

8. The method for testing the optimal placement orientation of a wireless device according to claim 5, wherein Determining the placement orientation when the transmission level of the device under test is the maximum based on all the level data includes: When the lifting turntable completes a 360° rotation at the specified step angle, obtaining the level data corresponding to each rotation angle; Screening out the maximum level value and its corresponding azimuth parameters from the level data corresponding to all rotation angles to determine the placement orientation when the transmission level of the device under test is the maximum, where the azimuth parameters include the rotation angle of the lifting turntable and the height of the device under test.

9. An electronic device, characterized in that, Includes: A processor and a memory, where instructions are stored in the memory and loaded and executed by the processor to implement the wireless device optimal placement orientation testing method according to any one of claims 5 to 8.

10. A computer-readable storage medium, characterized in that, A computer program is stored in the computer-readable storage medium, and when the computer program is executed by the processor, it implements the wireless device optimal placement orientation testing method according to any one of claims 5 to 8.

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