Bearing device for testing energy-saving MOS (Metal Oxide Semiconductor) tube

Abstract

The invention relates to a bearing device for testing an energy-saving MOS (Metal Oxide Semiconductor) tube, which belongs to the technical field of MOS tube testing and comprises a main body assembly, the main body assembly comprises a shell, a rotating assembly is rotationally mounted on the shell, a driving assembly is rotationally mounted on the shell, a connecting column is mounted on the shell, the rotating assembly comprises a rotating disc, and a vertical plate is fixedly mounted at the lower end of the rotating disc. An elastic clamp is fixedly installed on the vertical plate, the elastic clamp is intermittently and electrically connected with the connecting column, a placement assembly is fixedly installed on the rotating disc, one end of the placement assembly is electrically connected with the elastic clamp at the corresponding position, the placement assembly clamps the MOS tube, damage to pins of the MOS tube is reduced, the MOS tube is driven by the rotating disc to rotate, and the MOS tube is clamped by the placement assembly. The device is simple in structure and convenient to operate, connection of an external testing device is facilitated, the device is convenient to adapt to MOS tubes of different specifications by adjusting the positions of the clamping plates and the adjusting plates, the MOS tubes can be automatically pulled out from the interior of the containing groove conveniently through the pulling plates and the rotating pieces, and operation is convenient.

Description

Technical Field

[0001] The present invention relates to the technical field of MOS tube testing, and in particular to a load-bearing device for testing an energy-saving MOS tube. Background Art

[0002] In electronic design, energy-saving MOS tubes (metal-oxide semiconductor field-effect transistors) are core components for improving system energy efficiency, especially in the fields of power management, motor drive and power conversion. They are insulated gate devices in field effect tubes, which control current conduction and cutoff through electric field effects. They are widely used in power conversion, motor drive, new energy and other fields. When MOS tubes are produced, after a large batch of MOS tubes are packaged, they need to be tested one by one to test whether their performance is normal. At present, multimeters are mostly used to test resistance during testing. However, MOS tubes are small in size, so they need to be tested one by one during testing. The test is complicated to operate, easy to fall, and inconvenient to test. Therefore, a carrying device is needed to clamp and carry the MOS tube for testing. However, most of the current carrying devices have a single function. For different batches of MOS tubes, the specifications are often different, and the pin positions or sizes are different. As a result, the carrying device cannot carry and use MOS tubes from different batches, and the applicability is poor. Moreover, when carrying, most of the current carrying devices adopt the plug-in form of carrying. When carrying, not only is the plug-in laborious, but the pins are also easily bent during plug-in, resulting in damage and affecting the test efficiency. Summary of the invention

[0003] In order to overcome the technical defects of the prior art, the present invention provides an energy-saving MOS tube testing carrying device, which is easy to carry, improves the applicability of MOS tubes of different specifications when carrying, is easy to operate, saves time and effort, and improves testing efficiency.

[0004] The technical solution adopted by the present invention is as follows: a bearing device for testing energy-saving MOS transistors, including a main body component. The main body component includes a housing. A rotating component is rotatably installed on the housing, and a driving component is rotatably installed on one side of the rotating component on the housing. The driving component drives the rotating component. A plurality of connecting columns are fixedly installed in an array on one side of the rotating component on the housing. The rotating component includes a rotating disk. A plurality of vertical plates are fixedly installed in a circumferential array at the lower end of the rotating disk. Elastic clips are fixedly installed on the vertical plates. The elastic clips are intermittently electrically connected to the connecting columns. A placing component for fixing the energy-saving MOS transistors is fixedly installed on one side of the vertical plates on the rotating disk. One end of the placing component is electrically connected to the elastic clip at the corresponding position. When in use, an external testing device is clamped and connected to the connecting columns, and the MOS transistors to be tested are placed one by one on the placing component. The placing component clamps and fixes the MOS transistors, and the rotating disk drives the MOS transistors to rotate. When manually driving the driving component, when the driving component rotates one circle, the distance that the rotating disk rotates is the arc distance between the vertical plates. When installing the MOS transistors, the pins on the MOS transistors are electrically connected to the elastic clips, and when the vertical plates rotate to the position of the connecting columns, the elastic clips are electrically connected to the connecting columns, so that the MOS transistors are electrically connected to the connecting columns, facilitating individual testing. During testing, it does not affect the installation of new MOS transistors on other placing components, improving the testing efficiency.

[0005] Preferably, a hollow groove is formed at the lower end of the housing. The rotating component and the driving component are linked inside the hollow groove. The axial center position of the rotating disk penetrates through the housing and extends into the hollow groove. A first belt pulley is fixedly installed at the lower end of the axial center position of the rotating disk. One end of the driving component is sleeved on the first belt pulley. When in use, the lower end of the driving component rotates, causing the first belt pulley to rotate, and then the rotating disk drives the placing component to rotate. The placing component drives the external MOS transistors to rotate. While carrying, the MOS transistors are rotated and individually tested, which is convenient for operation.

[0006] Preferably, a connecting plate is fixedly installed on one side of the connecting column on the upper surface of the housing. A connecting piece is fixedly installed horizontally on the connecting plate. The connecting piece is electrically connected to the connecting column, and the connecting piece is intermittently in contact with the elastic clip. On the other side of the connecting column on the upper surface of the housing, a storage groove for placing an external test instrument is provided, and a slider for guiding the rotating disk is fixedly installed on the upper surface of the housing. The rotating disk is rotatably installed on the slider. Through the connecting plate and the connecting piece, when the rotating disk drives the elastic clip to move, when the elastic clip moves to the position of the connecting piece, the connecting piece enters the inside of the elastic clip. Similar to the connection method of a plug and a socket, the elastic clip is electrically connected to the connecting piece, and further the elastic clip is electrically connected to the connecting column, facilitating the testing of the MOS transistor. Through the slider, it is convenient to guide the rotation of the rotating disk and improve the stability of the rotating disk during rotation.

[0007] Preferably, a hemispherical groove is provided on the upper surface of the housing on one side of the driving component. One end of the driving component is clamped inside the groove. On the other side of the upper surface of the housing, a fixing frame is fixedly installed. One end of the fixing frame is fixedly installed with a dial plate. One end of the dial plate is of an inclined structure. Through the groove, it is convenient to position the driving component for one circle. When the driving component rotates one circle, one end of the driving component is clamped inside the groove to form a pause, so that one of the elastic clips clamps the connecting piece. And through the fixing frame and the dial plate, when the rotating disk drives the placing component to rotate, after the rotating piece in the placing component contacts the dial plate, the rotating piece rotates along the inclined surface of the dial plate, achieving the effect of pulling out the MOS transistor in the placing component, facilitating automatic ejection and convenient for taking out the MOS transistor.

[0008] Preferably, a chute is fixedly installed on the lower surface of the rotating disk. The chute coincides with the slider, and the placing components are distributed in a circular array on the rotating disk. Through the chute, it is convenient to guide the rotation of the rotating disk and improve the stability during rotation.

[0009] Preferably, the driving assembly includes a handle, a rotating plate rotatably mounted at the lower end of the handle, and the other end of the rotating plate is rotatably mounted on the shell, a second pulley is fixedly mounted below the position where the rotating plate is rotatably connected to the shell, a connecting belt is sleeved on the second pulley, and the other end of the connecting belt is sleeved with the first pulley, an elastic telescopic rod is vertically fixedly mounted on the rotating plate at one side of the handle, a ball is rotatably mounted on the lower end of the elastic telescopic rod, the lower end of the ball is consistent with the groove, and the rotating plate is driven to rotate by the handle, so that the second pulley drives the The connecting belt rotates, thereby causing the first pulley in the rotating assembly to rotate, and the circumference of the second pulley is smaller than the circumference of the first pulley. When the second pulley rotates one circle, the length of the first pulley rotation is the length of the arc formed between the placement components. Through the elastic telescopic rod and the ball, when rotating one circle, the ball is clamped inside the groove to form a pause. When it pauses, it means that the elastic clip is connected to the connecting piece. When the ball is out of the groove, the elastic telescopic rod is in a contracted state, and the ball rolls along the upper surface of the shell.

[0010] Preferably, the placement assembly includes a placement plate, and the placement plate is fixedly connected to the upper surface of the rotating disk, a placement groove is opened in the middle position of the upper surface of the placement plate, an adjustment plate is clamped in an array on one side of the placement groove, a spring sheet is fixed to the upper surface of the adjustment plate, a connecting soft wire is fixedly installed on one side of the spring sheet, the outer surface of the connecting soft wire is covered with an insulating layer, and the other end of the connecting soft wire is electrically connected to the elastic clip, through the placement groove, it is convenient to place the MOS tube to be carried flat, and after placement, the pins on the MOS tube are in contact with the spring sheet, and through the connecting soft wire, the pins of the MOS tube are electrically connected to the elastic clip, so that it is convenient to connect with an external test device through the connecting column, and when contact is made, the spring sheet produces a micro-deformation, thereby improving the electrical connection effect between the MOS tube and the elastic clip.

[0011] Preferably, blind holes are formed on both inner sides of the placement groove. A clamping plate is inserted into each blind hole. The upper ends of the opposite sides of the clamping plate are of inclined surface structure. Waist-shaped holes are formed in the placement plate above the blind holes. A plurality of springs are fixedly installed in an array on one side of the clamping plate inside the blind hole. A push plate is fixedly installed between the other ends of the springs. The upper end of one side of the push plate is connected with a limit bolt in a threaded manner. The upper end of the limit bolt is of T-shaped structure. One end of the limit bolt penetrates through the waist-shaped hole and extends to the upper surface of the placement plate. The upper end of the limit bolt is pressed against the upper surface of the placement plate. When placing the MOS transistor, place the MOS transistor between the two clamping plates. The clamping plates apply clamping force to both sides of the MOS transistor, facilitating the fixed bearing of the MOS transistor and preventing it from moving during testing. When clamping and fixing different MOS transistors, by adjusting the position of the push plate, the distance between the two clamping plates can be adjusted, improving the applicability during clamping. And through the limit bolt, it is convenient to fix the position of the push plate after adjusting the position of the push plate.

[0012] Preferably, a notch is formed in the placement plate on one side of the placement groove. A rotating piece of L-shaped structure is rotatably installed in the notch. The corner position of the rotating piece is of arc-shaped structure. By the rotatably installed rotating piece, when clamping the MOS transistor, one end of the rotating piece is inside the notch. The rotating piece is in a vertical L-shaped structure. When the rotating disk rotates, after the rotating piece contacts the dial plate, the rotating piece rotates, and then the rotating piece rotates in an inclined direction. One end of the rotating piece tilts the bottom of the MOS transistor, causing the MOS transistor to be pulled out from between the clamping plates.

[0013] Preferably, one end of the adjusting plate is of U-shaped structure. A tongue is fixedly installed at the lower end of the adjusting plate. A clamping groove is formed on one side of the lower surface of the placement plate. The tongue is clamped inside the clamping groove. A screw is connected to one side of the adjusting plate in a threaded manner. One end of the screw is pressed against one side of the placement plate. When adjusting the position of the elastic piece, the adjusting plate slides inside the clamping groove through the tongue, facilitating the adjustment of the distance between the elastic pieces. After the adjustment is completed, by screwing the screw, one end of the screw is pressed against one side of the placement plate to limit the movement of the adjusting plate.

[0014] The beneficial effects of the present invention are as follows: By using the placement component to hold the MOS transistor flat, during the clamping process, the pins of the MOS transistor are in contact with the elastic pieces, and the MOS transistor is driven to rotate by the rotating disk. When the elastic clamp contacts the connecting piece, the MOS transistor is electrically connected to the connecting column, facilitating the external testing device to perform tests, improving the testing efficiency. By adjusting the positions of the clamping plate and the adjusting plate, it is convenient to accommodate MOS transistors of different specifications, improving the applicability during loading. When the rotating disk rotates, through the dial and the rotating piece, it is convenient to automatically push the MOS transistor out of the placement groove, facilitating removal, with convenient operation, saving time and effort. When in use, it has the effects of improving the testing efficiency, enhancing wide compatibility, convenient operation, and facilitating batch testing and loading. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic structural diagram of the whole of the present invention.

[0016] Figure 2 It is a schematic structural diagram of the whole of the present invention from another angle.

[0017] Figure 3 It is a schematic structural diagram of the lower end of the housing of the present invention after being opened.

[0018] Figure 4 It is a schematic structural diagram of the main body component of the present invention.

[0019] Figure 5 For the present invention Figure 4 It is a schematic structural diagram of the partial enlargement of the position A in the present invention.

[0020] Figure 6 It is a schematic structural diagram of the present invention after removing the main body component.

[0021] Figure 7 For the present invention Figure 6 It is a schematic structural diagram of the partial enlargement of the position B in the present invention.

[0022] Figure 8 It is a schematic structural diagram of the present invention from another angle after removing the main body component.

[0023] Figure 9 For the present invention Figure 8 It is a schematic structural diagram of the partial enlargement of the position C in the present invention.

[0024] Figure 10 It is a schematic structural diagram of the placement component of the present invention.

[0025] Figure 11 It is an exploded schematic structural diagram of the placement component of the present invention.

[0026] Figure 12 It is an exploded schematic structural diagram of the placement component of the present invention from another angle.

[0027] Figure 13 This is a schematic structural diagram of the position adjusting plate in the present invention.

[0028] Explanation of reference numerals in the drawings: In the figure: 1. Main body assembly; 101. Shell; 102. Connecting column; 103. Hollow groove; 104. Connecting piece; 105. Placing groove; 106. Slide block; 107. Groove; 108. Fixed bracket; 109. Dial; 1010. Connecting plate; 2. Rotating assembly; 201. Rotating disk; 202. Vertical plate; 203. Elastic clip; 204. First pulley; 205. Chute; 3. Driving assembly; 301. Handle; 302. Rotating plate; 303. Second pulley; 304. Connecting belt; 305. Elastic telescopic rod; 306. Ball; 4. Placing assembly; 401. Placing plate; 402. Placing groove; 403. Adjusting plate; 404. Elastic piece; 405. Connecting flexible wire; 406. Blind hole; 407. Clamp plate; 408. Waist-shaped hole; 409. Spring; 4010. Pushing plate; 4011. Limit bolt; 4012. Notch; 4013. Rotating piece; 4014. Latching tongue; 4015. Latching groove; 4016. Screw. Detailed implementation manners

[0029] The present invention will be further described below with reference to the accompanying drawings:

[0030] As Figures 1 - 13As shown in the figure, this embodiment provides a bearing device for testing energy-saving MOS transistors, including a main body component 1. The main body component 1 includes a housing 101. A rotating component 2 is rotatably installed on the housing 101, and a driving component 3 is rotatably installed on one side of the rotating component 2 on the housing 101. The driving component 3 drives the rotating component 2. A plurality of connecting columns 102 are fixedly installed in an array on one side of the rotating component 2 on the housing 101. The rotating component 2 includes a rotating disk 201. A plurality of vertical plates 202 are fixedly installed in a circumferential array at the lower end of the rotating disk 201. Elastic clips 203 are fixedly installed on the vertical plates 202. The elastic clips 203 are intermittently electrically connected to the connecting columns 102. A placing component 4 for fixing the energy-saving MOS transistors is fixedly installed on one side of the rotating disk 201 where the vertical plates 202 are located. One end of the placing component 4 is electrically connected to the elastic clip 203 at the corresponding position. When in use, an external testing device is clamped and connected to the connecting columns 102, and the MOS transistors to be tested are placed on the placing component 4 one by one. The placing component 4 clamps and fixes the MOS transistors, and the rotating disk 201 drives the MOS transistors to rotate. When manually driving the driving component 3, when the driving component 3 rotates one circle, the distance that the rotating disk 201 rotates is the arc distance between the vertical plates 202. When installing the MOS transistors, the pins on the MOS transistors are electrically connected to the elastic clips 203, and when the vertical plates 202 rotate to the position of the connecting columns 102, the elastic clips 203 are electrically connected to the connecting columns 102, enabling electrical connection between the MOS transistors and the connecting columns 102, facilitating the external testing device to test the MOS transistors, facilitating individual testing, and during testing, it does not affect the installation of new MOS transistors on other placing components 4, improving the testing efficiency, facilitating the testing of a batch of MOS transistors, and being convenient to use.

[0031] As a technical optimization scheme of the present invention, specifically as Figures 3 - 5As shown, a hollowed-out groove 103 is provided at the lower end of the housing 101. The rotating assembly 2 and the driving assembly 3 are linked inside the hollowed-out groove 103. The axial center position of the rotating disk 201 penetrates through the housing 101 and extends into the hollowed-out groove 103. And a first pulley 204 is fixedly installed at the lower end of the axial center position of the rotating disk 201. One end of the driving assembly 3 is sleeved on the first pulley 204. During use, through the hollowed-out groove 103, it is convenient to store the lower ends of the driving assembly 3 and the rotating assembly 2. And when the lower end of the driving assembly 3 rotates, the first pulley 204 rotates, and then the rotating disk 201 drives the placing assembly 4 to rotate. The placing assembly 4 drives the external MOS transistor to rotate. While carrying, the MOS transistor is rotated and tested one by one, which is convenient for operation and improves the testing efficiency. A connecting plate 1010 is fixedly installed on the upper surface of the housing 101 on one side of the connecting column 102. A connecting piece 104 is horizontally fixedly installed on the connecting plate 1010. The connecting piece 104 is electrically connected to the connecting column 102, and the connecting piece 104 is intermittently in contact with the elastic clip 203. A placing groove 105 for placing an external testing instrument is provided on the upper surface of the housing 101 on the other side of the connecting column 102. And a slider 106 for guiding the rotating disk 201 is fixedly installed on the upper surface of the housing 101. The rotating disk 201 is rotatably installed on the slider 106. Through the connecting plate 1010 and the connecting piece 104, when the rotating disk 201 drives the elastic clip 203 to move, when the elastic clip 203 moves to the position of the connecting piece 104, the connecting piece 104 enters the inside of the elastic clip 203. Similar to the connection method of a plug and a socket, the elastic clip 203 is electrically connected to the connecting piece 104, and then the elastic clip 203 is electrically connected to the connecting column 102, which is convenient for testing the MOS transistor. And during testing, an external testing device, such as a multimeter, is placed inside the placing groove 105, which is convenient for placement and storage. And through the slider 106, it is convenient to guide the rotation of the rotating disk 201 and improve the stability of the rotating disk 201 during rotation. A hemispherical groove 107 is provided on the upper surface of the housing 101 on one side of the driving assembly 3. One end of the driving assembly 3 is clamped inside the groove 107. A fixing frame 108 is fixedly installed on the other side of the upper surface of the housing 101. One end of the fixing frame 108 is fixedly installed with a dial 109. One end of the dial 109 is of an inclined structure. Through the groove 107, it is convenient to position the driving assembly 3 for one circle. When the driving assembly 3 rotates one circle, one end of the driving assembly 3 is clamped inside the groove 107 to form a pause. The driving assembly 3 rotates one circle and drives the rotating assembly 2 to rotate a specific length. Then when one side of the driving assembly 3 is clamped inside the groove 107, one of the elastic clips 203 clamps the connecting piece 104, so that the placing assembly 4 is in a connected state with the connecting column 102. And through the fixing frame 108 and the dial 109, when the rotating disk 201 drives the placing assembly 4 to rotate,After the rotating piece 4013 in the placement component 4 contacts the dial plate 109, the rotating piece 4013 rotates along the inclined surface on the dial plate 109 to achieve the effect of pulling out the MOS tube in the placement component 4, which is convenient for automatic pop-up and taking out the MOS tube, saving time and effort. The lower surface of the rotating disk 201 is fixedly installed with a slide groove 205, which coincides with the slider 106, and the placement component 4 is distributed in a circular array on the rotating disk 201. Through the slide groove 205, it is convenient to guide the rotation of the rotating disk 201, improve the stability during rotation, and facilitate the loading and testing of the MOS tube.

[0032] As a technical optimization solution of the present invention, specifically Figure 6 and Figure 7 As shown, the driving assembly 3 includes a handle 301, a rotating plate 302 is rotatably installed at the lower end of the handle 301, and the other end of the rotating plate 302 is rotatably installed on the shell 101, and a second pulley 303 is fixedly installed below the position where the rotating plate 302 is rotatably connected to the shell 101, and a connecting belt 304 is sleeved on the second pulley 303, and the other end of the connecting belt 304 is sleeved with the first pulley 204, and an elastic telescopic rod 305 is vertically fixedly installed on the rotating plate 302 at one side of the handle 301, and a ball 306 is rotatably installed at the lower end of the elastic telescopic rod 305, and the lower end of the ball 306 is consistent with the groove 107, and the rotating plate 302 is driven to rotate by the handle 301, so that the second pulley 303 drives the connecting belt 304 to rotate, thereby causing the first pulley 204 in the rotating assembly 2 to rotate, and the second pulley The circumference of the pulley 303 is smaller than that of the first pulley 204. The circumference of the second pulley 303 multiplied by the number of placement components 4 is the same as the circumference of the first pulley 204. Therefore, when the second pulley 303 rotates one circle, the length of the rotation of the first pulley 204 is the length of the arc formed between the placement components 4, which is convenient for the placement components 4 to be electrically connected to the connecting piece 104 in the main component 1 one by one, and through the elastic telescopic rod 305 and the ball 306, it is convenient to judge whether the second pulley 303 rotates one circle. When rotating one circle, the ball 306 is clamped in the inside of the groove 107 to form a pause. When it pauses, it means that the elastic clip 203 is connected to the connecting piece 104. When the ball 306 is out of the groove 107, the elastic telescopic rod 305 is in a contracted state, and the ball 306 rolls along the upper surface of the shell 101.

[0033] As a technical optimization solution of the present invention, specifically Figures 10 - 13As shown, the placement component 4 includes a placement plate 401, and the placement plate 401 is fixedly connected to the upper surface of the rotating disk 201. A placement groove 402 is provided at the middle position of the upper surface of the placement plate 401. One side of the placement groove 402 is snap-connected with adjustment plates 403 in an array. A shrapnel 404 is fixed on the upper surface of the adjustment plate 403. A connecting flexible wire 405 is fixedly installed on one side of the shrapnel 404. The outer surface of the connecting flexible wire 405 is coated with an insulating layer, and the other end of the connecting flexible wire 405 is electrically connected to the elastic clip 203. Through the placement groove 402, it is convenient to place the MOS transistor to be carried flat. After placement, the pins on the MOS transistor contact the shrapnel 404, and through the connecting flexible wire 405, the pins of the MOS transistor are electrically connected to the elastic clip 203, which is convenient to be connected to an external testing device through the connecting column 102. And through the adjustment plate 403, it is convenient to adjust the position of the shrapnel 404, so as to be suitable for MOS transistors of different specifications and be compatible with different types of pins. When making contact, the shrapnel 404 generates a micro-deformation, improving the electrical connection effect between the MOS transistor and the elastic clip 203. Blind holes 406 are provided on both sides inside the placement groove 402. A clamping plate 407 is inserted into the blind hole 406. The upper ends of the opposite sides of the clamping plate 407 are of an inclined surface structure. A waist-shaped hole 408 is provided on the placement plate 401 above the blind hole 406. And on one side of the clamping plate 407 inside the blind hole 406, springs 409 are fixedly installed in an array. A push plate 4010 is fixedly installed between the other ends of the springs 409. A limit bolt 4011 is threadedly connected to the upper end of one side of the push plate 4010. The upper end of the limit bolt 4011 is of a T-shaped structure, and one end of the limit bolt 4011 penetrates through the waist-shaped hole 408 and extends to the upper surface of the placement plate 401. The upper end of the limit bolt 4011 is pressed against the upper surface of the placement plate 401. When placing the MOS transistor, place the MOS transistor between the two clamping plates 407 and press it. The springs 409 are compressed, and the clamping plates 407 move towards the inside of the blind hole 406, increasing the distance between the clamping plates 407. The clamping plates 407 apply a clamping force to both sides of the MOS transistor, facilitating the fixed bearing of the MOS transistor and preventing it from moving during testing. And one side of the upper surface of the clamping plate 407 is provided with an inclined surface, improving the convenience during clamping, facilitating the automatic movement of the clamping plate 407 towards the inside of the blind hole 406 when pressing the MOS transistor, so that the springs 409 are compressed to achieve the clamping effect. And when clamping and fixing different MOS transistors, by adjusting the position of the push plate 4010, it is convenient to adjust the distance between the two clamping plates 407, improving the applicability during clamping. And through the limit bolt 4011, it is convenient to fix the position of the push plate 4010 after adjusting the position of the push plate 4010, improving the applicability during use. A notch 4012 is provided on the placement plate 401 on one side of the placement groove 402. A rotating piece 4013 with an L-shaped structure is rotatably installed in the notch 4012.The rotation angle position of the rotating piece 4013 is an arc structure. When the MOS tube is clamped by the rotatably mounted rotating piece 4013, one end of the rotating piece 4013 is located inside the notch 4012. The rotating piece 4013 has an L-shaped structure in the vertical state. When the rotating disk 201 rotates, after the rotating piece 4013 contacts the dial 109, the rotating piece 4013 rotates, and then the rotating piece 4013 rotates in an inclined direction. One end of the rotating piece 4013 lifts the bottom of the MOS tube, so that the MOS tube is pulled out from between the clamping plates 407, which is convenient for automatic removal and use. One end of the adjusting plate 403 is a U-shaped structure, and a tongue 4014 is fixedly installed at the lower end of the adjusting plate 403. A clamping groove 4015 is formed on one side of the lower surface of the placing plate 401. The tongue 4014 is clamped inside the clamping groove 4015. One side of the adjusting plate 403 is threadedly connected with a screw 4016. One end of the screw 4016 presses against one side of the placing plate 401. When adjusting the position of the elastic piece 404, the adjusting plate 403 slides inside the clamping groove 4015 through the tongue 4014, so as to facilitate the adjustment of the distance between the elastic pieces 404 for use with different specifications of pins. After the adjustment is completed, by turning the screw 4016, one end of the screw 4016 presses against one side of the placing plate 401 to limit the movement of the adjusting plate 403, so as to facilitate fixation and convenient use during testing.

[0034] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. The above embodiments and the descriptions in the specification only illustrate the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements all fall within the scope of the present invention claimed. The scope of the present invention claimed is defined by the appended claims and their equivalents.

Claims

1. A loading device for testing energy-saving MOS transistors, characterized in that: It includes a main body component (1), the main body component (1) includes a housing (101), a rotating component (2) is rotatably installed on the housing (101), and a driving component (3) is rotatably installed on one side of the rotating component (2) on the housing (101). The driving component (3) drives the rotating component (2). Connecting columns (102) are fixedly installed in an array on one side of the rotating component (2) on the housing (101). The rotating component (2) includes a rotating disk (201). Vertical plates (202) are fixedly installed in a circumferential array at the lower end of the rotating disk (201). Elastic clips (203) are fixedly installed on the vertical plates (202). The elastic clips (203) are intermittently electrically connected to the connecting columns (102). A placement component (4) for fixing an energy-saving MOS transistor is fixedly installed on one side of the rotating disk (201) where the vertical plates (202) are located. One end of the placement component (4) is electrically connected to the corresponding elastic clip (203).

2. The bearing device for testing energy-saving MOS transistors according to claim 1, wherein: A hollowed-out groove (103) is opened at the lower end of the housing (101). The rotating component (2) and the driving component (3) are linked inside the hollowed-out groove (103). The axial center position of the rotating disk (201) penetrates through the housing (101) and extends into the hollowed-out groove (103). A first belt pulley (204) is fixedly installed at the lower end of the axial center position of the rotating disk (201). One end of the driving component (3) is sleeved on the first belt pulley (204).

3. The bearing device for testing energy-saving MOS transistors according to claim 1, characterized in that: A connecting plate (1010) is fixedly installed on the upper surface of the housing (101) on one side of the connecting columns (102). A connecting piece (104) is horizontally fixedly installed on the connecting plate (1010). The connecting piece (104) is electrically connected to the connecting columns (102). And the connecting piece (104) is intermittently in contact with the elastic clip (203). A placement groove (105) for placing an external test instrument is opened on the upper surface of the housing (101) on the other side of the connecting columns (102). And a slider (106) for guiding the rotating disk (201) is fixedly installed on the upper surface of the housing (101). The rotating disk (201) is rotatably installed on the slider (106).

4. The loading device for testing energy-saving MOS transistors according to claim 2, characterized in that: A hemispherical groove (107) is opened on the upper surface of the housing (101) on one side of the driving component (3). One end of the driving component (3) is clamped inside the groove (107). A fixing frame (108) is fixedly installed on the other side of the upper surface of the housing (101). A dialing plate (109) is fixedly installed at one end of the fixing frame (108). One end of the dialing plate (109) is of an inclined structure.

5. The bearing device for energy-saving MOS transistor testing according to claim 3, wherein: A sliding groove (205) is fixedly installed on the lower surface of the rotating disk (201). The sliding groove (205) is in conformity with the slider (106). And the placement components (4) are distributed in a circumferential array on the rotating disk (201).

6. The bearing device for energy-saving MOS transistor testing according to claim 4, wherein: The driving component (3) includes a handle (301). A rotating plate (302) is rotatably installed at the lower end of the handle (301). The other end of the rotating plate (302) is rotatably installed on the housing (101). A second pulley (303) is fixedly installed below the position where the rotating plate (302) is rotatably connected to the housing (101). A connecting belt (304) is sleeved on the second pulley (303). The other end of the connecting belt (304) is sleeved with the first pulley (204). An elastic telescopic rod (305) is vertically and fixedly installed on one side of the handle (301) on the rotating plate (302). A ball (306) is rotatably installed at the lower end of the elastic telescopic rod (305). The lower end of the ball (306) fits with the groove (107).

7. The bearing device for energy-saving MOS transistor testing according to claim 1, wherein: The placing component (4) includes a placing plate (401), and the placing plate (401) is fixedly connected to the upper surface of the rotating disc (201). A placing groove (402) is formed in the middle of the upper surface of the placing plate (401). Adjusting plates (403) are arranged in an array on one side of the placing groove (402). A shrapnel (404) is fixed on the upper surface of the adjusting plate (403). A connecting flexible wire (405) is fixedly installed on one side of the shrapnel (404). The outer surface of the connecting flexible wire (405) is coated with an insulating layer, and the other end of the connecting flexible wire (405) is electrically connected to the elastic clip (203).

8. The loading device for energy-saving MOS transistor testing according to claim 7, characterized in that: Blind holes (406) are formed on both sides inside the placing groove (402). A clamping plate (407) is inserted into the blind holes (406). The upper ends of the opposite sides of the clamping plate (407) are of an inclined surface structure. A waist-shaped hole (408) is formed in the placing plate (401) above the blind holes (406). Springs (409) are fixedly installed in an array on one side of the clamping plate (407) inside the blind holes (406). A push plate (4010) is fixedly installed between the other ends of the springs (409). A limit bolt (4011) is threadedly connected to the upper end of one side of the push plate (4010). The upper end of the limit bolt (4011) is of a T-shaped structure, and one end of the limit bolt (4011) passes through the waist-shaped hole (408) and extends to the upper surface of the placing plate (401). The upper end of the limit bolt (4011) is pressed against the upper surface of the placing plate (401).

9. The bearing device for testing energy-saving MOS transistors according to claim 8, wherein: A notch (4012) is formed on one side of the placing plate (401) where the placing groove (402) is located. A rotating piece (4013) with an L-shaped structure is rotatably installed in the notch (4012). The corner position of the rotating piece (4013) is of an arc structure.

10. The bearing device for testing energy-saving MOS transistors according to claim 7, characterized in that: One end of the adjusting plate (403) is of a U-shaped structure, and a tongue (4014) is fixedly installed at the lower end of the adjusting plate (403). A slot (4015) is formed on one side of the lower surface of the placing plate (401). The tongue (4014) is clamped inside the slot (4015). One side of the adjusting plate (403) is threadedly connected with a screw (4016), and one end of the screw (4016) is pressed against one side of the placing plate (401).

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