Photon receiving simulation method of time-of-flight measurement system and electronic equipment

Abstract

The embodiment of the invention is suitable for the technical field of computers, and provides a photon receiving simulation method of a flight time measurement system and electronic equipment, and the method comprises the steps: for each analysis moment in an analysis period, obtaining the number of incident photons reaching a detection array at the analysis moment; based on the number of the incident photons and the distribution area of the incident photons, obtaining the number of received photons corresponding to each detection unit at the analysis moment; according to the number of received photons corresponding to each detection unit at the analysis moment and a photon event triggering model, obtaining the triggering times of photon events corresponding to the detection array at the analysis moment; and accumulating the triggering times of the photon events corresponding to the detection array in the analysis period to obtain histogram data corresponding to the detection array. According to the method provided by the embodiment of the invention, the accuracy of photon receiving simulation can be improved.

Description

Technical Field

[0001] The embodiments of the present application belong to the technical field of time-of-flight measurement systems, and particularly relate to a photon reception simulation method for a time-of-flight measurement system and an electronic device. Background Art

[0002] A time-of-flight measurement system is a measurement system that combines photon detection technology and the principle of time-of-flight measurement. Compared with ranging sensors such as ultrasonic sensors, infrared ranging sensors, and millimeter-wave radars, the time-of-flight measurement system has the advantages of high precision, high resolution, strong anti-interference ability, and ultra-long detection distance. Therefore, the time-of-flight measurement system is widely used in scenarios such as topographic mapping, environmental monitoring, robot perception, and autonomous navigation.

[0003] During the product R & D process, in order to further understand the performance of the time-of-flight measurement system in different complex scenarios and measure various indicators of the time-of-flight measurement system, R & D personnel usually need to build a simulation model of the time-of-flight measurement system. Since the time-of-flight measurement system calculates the distance information of the target object by statistically processing photon events within a certain time period, and the process of photons reaching the detection array after being reflected by the target from the emission source is a random process, that is, the number of photon events occurring on the detection array at different times is different. Therefore, when building a simulation model of the time-of-flight measurement system, R & D personnel need to simulate the number of photons received by the detection array at each moment, and then determine the number of photon events occurring on the detection array at each moment according to the simulated number of photons.

[0004] However, the number of received photons corresponding to the detection unit calculated by the existing photon reception simulation method of the time-of-flight measurement system differs greatly from the number of received photons under actual working conditions. Therefore, the accuracy of the existing photon reception simulation operation is relatively low. Summary of the Invention

[0005] In view of this, the embodiments of the present application provide a photon reception simulation method for a time-of-flight measurement system and an electronic device, so as to improve the accuracy of the photon reception simulation operation.

[0006] The first aspect of the embodiments of the present application provides a photon reception simulation method for a time-of-flight measurement system. The time-of-flight measurement system includes a transmitter and a detection array. The transmitter is used to emit detection light, and the detection array includes a plurality of detection units. The detection array is used to receive the echo light formed by the detection light reflected by the target object. The method includes: For each analysis moment within the analysis period, obtain the number of incident photons reaching the detection array at the analysis moment; Based on the number of the incident photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment; According to the number of received photons corresponding to each detection unit at the analysis moment and the photon event trigger model, obtain the number of trigger times of the photon events corresponding to the detection array at the analysis moment; Accumulate the number of trigger times of the photon events corresponding to the detection array within the analysis period to obtain the histogram data corresponding to the detection array, and the histogram data is used to determine the performance index of the detection array.

[0007] This embodiment has the following advantages: In the embodiment of the present application, the electronic device can determine the number of received photons corresponding to each detection unit by combining the number of incident photons and the distribution area of the incident photons; since when the R & D personnel design the time-of-flight measurement system, they usually set the area of the detection array to be larger than the area of the reflected light reaching the detection array, therefore, when the time-of-flight measurement system actually operates, usually only part of the area on the detection array can receive the incident photons. In view of this, the method provided by the embodiment of the present application can make the calculated distribution of the number of received photons closer to the distribution in actual operation, and further make the number of trigger times of the photon events corresponding to the detection array closer to the number in actual operation, thereby improving the accuracy of the photon reception simulation operation and the accuracy of the histogram data.

[0008] In a possible implementation manner of the first aspect, the obtaining the number of received photons corresponding to each detection unit at the analysis moment based on the number of the incident photons and the distribution area of the incident photons includes: Based on the number of the incident photons and the spot divergence, calculate the number of received photons corresponding to the detection array; According to the number of received photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment.

[0009] This embodiment has the following advantages: Since the spot divergence can reflect the divergence degree of the detection light, therefore, the electronic device combines the number of incident photons with the spot divergence to calculate the number of received photons, which can more realistically simulate the propagation loss of the received photons in space, thereby improving the accuracy of the simulation operation.

[0010] In a possible implementation manner of the first aspect, the incident photons include echo photons and noise photons, the received photons include echo received photons and noise received photons, and the calculating the number of received photons corresponding to the detection array based on the number of the incident photons and the spot divergence includes: Determine the spot divergence; Calculate the number of received echo photons according to the spot divergence, the number of echo photons, and the negative binomial distribution function; Calculate the number of received noise photons according to the spot divergence, the number of noise photons, and the negative binomial distribution function.

[0011] This embodiment has the following advantages: The electronic device can perform negative binomial distribution operations in combination with the spot divergence to calculate the number of received photons corresponding to the detection array at each analysis moment. Since the number of received photons obtained by performing negative binomial distribution operations according to the spot divergence is closer to the number of photons that the detection array can receive under actual working conditions. Therefore, the method provided in this embodiment can improve the accuracy of the number of received photons corresponding to the detection array calculated by the time-of-flight measurement system simulation model, thereby improving the accuracy of the simulation results generated by the simulation model.

[0012] In a possible implementation manner of the first aspect, the obtaining the number of received photons corresponding to each detection unit at the analysis moment according to the number of received photons and the distribution area of the incident photons includes: Obtain the echo area where the echo photons are distributed on the detection array and the noise area where the noise photons are distributed on the detection array; Randomly generate the first coordinates of each echo received photon on the detection array according to the number of echo received photons and the echo area; Randomly generate the second coordinates of each noise received photon on the detection array according to the number of noise received photons and the noise area; Obtain the number of received photons corresponding to each detection unit at the analysis moment according to the first coordinates of all the echo received photons and the second coordinates of all the noise received photons.

[0013] This embodiment has the following advantages: Since in the actual operation process of the time-of-flight measurement system, there are often differences between the echo area where the detection array can receive echo photons and the noise area where the detection array can receive noise photons. Therefore, the electronic device generates the first coordinates of the echo received photons according to the echo area and generates the second coordinates of each noise received photon according to the noise area, which can make the photon distribution closer to the real detection scenario and reduce the errors caused by simplified models (such as uniform distribution assumptions), thereby improving the accuracy of the simulation operation.

[0014] In a possible implementation of the first aspect, obtaining the number of photon event triggers corresponding to the detection array at the analysis moment according to the number of received photons corresponding to each detection unit at the analysis moment and the photon event trigger model includes: For each detection unit, determine the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment, where the trigger state includes a triggered state and an untriggered state; According to the trigger state of the photon event on each detection unit, obtain the number of photon event triggers corresponding to the detection array at the analysis moment.

[0015] This embodiment has the following advantages: Through the method provided in this embodiment, the electronic device can directly determine whether a photon event occurs on the detection unit according to the trigger moment and trigger state corresponding to the detection unit. Compared with the dead time model in the prior art, the method provided in this embodiment has a smaller amount of computation, thereby improving the computation efficiency of the simulation model.

[0016] In a possible implementation of the first aspect, obtaining the number of photon event triggers corresponding to the detection array at the analysis moment according to the trigger state of the photon event on each detection unit includes: Count the number of detection units whose trigger state is the triggered state to obtain the number of photon event triggers corresponding to the detection array at the analysis moment.

[0017] In a possible implementation of the first aspect, determining the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment includes: When the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0, determine the trigger state of the photon event on the detection unit as the triggered state; or When the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0, determine the trigger state of the photon event on the detection unit as the untriggered state.

[0018] In a possible implementation of the first aspect, determining the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment includes: When the trigger moment is not empty, calculate the time difference between the analysis moment and the trigger moment, where the trigger moment is earlier than the analysis moment; When the time difference is greater than or equal to the dead time of the detection unit, and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0, the trigger state of the photon event on the detection unit is determined to be the triggered state; or When the time difference is greater than or equal to the dead time of the detection unit, and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0, the trigger state of the photon event on the detection unit is determined to be the untriggered state; or When the time difference is less than the dead time of the detection unit, the trigger state of the photon event on the detection unit is determined to be the untriggered state.

[0019] In a possible implementation manner of the first aspect, after determining that the trigger state of the photon event on the detection unit is the triggered state, it further includes: Updating the trigger time of the detection unit according to the analysis moment.

[0020] In a possible implementation manner of the first aspect, the obtaining of the number of incident photons reaching the detection array at the analysis moment includes: Calculating the number of incident photons according to the first parameter of the time-of-flight measurement system, the second parameter of the target, the third parameter of the detection light, and the fourth parameter of the sunlight; the first parameter includes the optical efficiency of the time-of-flight measurement system, the optical efficiency of the emitter, the emission power of the emitter, the photon detection efficiency of the detection array, the atmospheric transmittance, the first receiving area of the detection array, and the distance between the emitter and the target; the second parameter includes the reflectivity of the target and the second receiving area of the target, the third parameter includes the power of the detection light, the frequency of the detection light, the pulse interval of the detection light, and the divergence angle of the detection light; the fourth parameter includes the solar irradiance, the angle between the sunlight and the normal of the target surface, and the bandwidth of the filter in the time-of-flight measurement system.

[0021] In a possible implementation manner of the first aspect, the incident photons include echo photons and noise photons, and the calculating of the number of incident photons according to the first parameter of the time-of-flight measurement system, the second parameter of the target, the third parameter of the detection light, and the fourth parameter of the sunlight includes: Calculating the number of echo photons according to the first parameter, the second parameter, and the third parameter; Calculating the number of noise photons according to the first parameter, the second parameter, and the fourth parameter.

[0022] The second aspect of the embodiments of the present application provides a photon reception simulation device for a time-of-flight measurement system. The time-of-flight measurement system includes a transmitter and a detection array. The transmitter is configured to emit detection light, and the detection array includes a plurality of detection units. The detection array is configured to receive the echo light formed by the reflection of the detection light by the target object. The device includes: An incident photon acquisition module, configured to acquire the number of incident photons reaching the detection array at each analysis moment within an analysis period; A photon number determination module, configured to obtain the number of received photons corresponding to each detection unit at the analysis moment based on the number of incident photons and the distribution area of the incident photons; A trigger count determination module, configured to obtain the trigger count of the photon events corresponding to the detection array at the analysis moment according to the number of received photons corresponding to each detection unit at the analysis moment and a photon event trigger model; A histogram generation module, configured to accumulate the trigger count of the photon events corresponding to the detection array within the analysis period to obtain histogram data corresponding to the detection array, and the histogram data is used to determine the performance index of the detection array.

[0023] The third aspect of the embodiments of the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the photon reception simulation method of the time-of-flight measurement system as described in the first aspect above.

[0024] The fourth aspect of the embodiments of the present application provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, it implements the photon reception simulation method of the time-of-flight measurement system as described in the first aspect above.

[0025] The fifth aspect of the embodiments of the present application provides a computer program product, which, when running on a computer, causes the computer to execute the photon reception simulation method of the time-of-flight measurement system as described in the first aspect above. Description of the Drawings

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0027] Figure 1It is a schematic diagram of a triggering mechanism of a single - photon avalanche photodiode provided by an embodiment of the present application; Figure 2 It is a flowchart of a photon reception simulation method for a time - of - flight measurement system provided by an embodiment of the present application; Figure 3 It is a schematic diagram of a simulation process of a time - of - flight measurement system provided by an embodiment of the present application; Figure 4 It is a schematic diagram of a time - of - flight measurement system receiving noise photons provided by an embodiment of the present application; Figure 5 It is a flowchart of another photon reception simulation method for a time - of - flight measurement system provided by an embodiment of the present application; Figure 6 It is a schematic diagram of a calculation process flow of spot divergence provided by an embodiment of the present application; Figure 7 It is a schematic diagram of a calculation process flow of the number of received photons provided by an embodiment of the present application; Figure 8 It is a schematic diagram of a distribution area and a reception area provided by an embodiment of the present application; Figure 9 It is a flowchart of another photon reception simulation method for a time - of - flight measurement system provided by an embodiment of the present application; Figure 10 It is a simulation method for a time - of - flight measurement system based on a single - photon avalanche diode provided by an embodiment of the present application; Figure 11 It is a schematic diagram of a photon reception simulation device for a time - of - flight measurement system provided by an embodiment of the present application; Figure 12 It is a schematic diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0028] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well - known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.

[0029] A time-of-flight measurement system is a system that calculates the distance to a target by measuring the time difference between the emission and reception of the detection light, such as lidar. Compared with common measurement systems such as ultrasonic sensors, infrared ranging sensors, and millimeter-wave radars, the time-of-flight measurement system has significant advantages. It can not only achieve high-precision measurement, accurately capture target details, and present high-resolution imaging effects, but also has strong anti-interference ability and can work stably in complex environments. Moreover, the detection distance of the time-of-flight measurement system is relatively far, which can meet the needs of large-scale monitoring. Given the above outstanding characteristics, in the field of topographic mapping, the time-of-flight measurement system can be used to draw high-precision maps and provide reliable data for urban planning and geological research. In the field of environmental monitoring, the time-of-flight measurement system can accurately detect the distribution of atmospheric pollutants and monitor changes in vegetation cover. In the field of robot perception and autonomous navigation, the time-of-flight measurement system can help robots perceive the surrounding environment in real time and achieve precise positioning and path planning.

[0030] The simulation model of the time-of-flight measurement system is a model that simulates the working principle, performance, and behavior of the time-of-flight measurement system in different environments through a computer program. Using the simulation model of the time-of-flight measurement system, researchers can simulate the transmission trajectory of photons in different environments after the emission of the detection light, as well as the reflection of photons on the surfaces of various target objects. In addition, by changing the parameters in the simulation model, such as the sensitivity of the photon detector and the emission frequency of the detection light, researchers can quickly test the performance of the time-of-flight measurement system under different settings, and then optimize the system design of the time-of-flight measurement system to improve the ranging accuracy and stability of the time-of-flight measurement system. Therefore, by establishing the simulation model of the time-of-flight measurement system, researchers can deeply understand the working principle and performance of the time-of-flight measurement system during the research and development process and before actual production and application.

[0031] Among many time-of-flight measurement systems, the time-of-flight measurement system based on photon detection counting is widely popular due to its longer ranging ability and stronger echo detection ability. The time-of-flight measurement system based on photon detection counting is a time-of-flight measurement system that uses a photon detector to count the echo photons of the detected light pulse to obtain target information. Common time-of-flight measurement systems based on photon detection counting include the time-of-flight measurement system based on single photon avalanche diode (SPAD), the time-of-flight measurement system based on photomultiplier tube (PMT), the time-of-flight measurement system based on silicon photomultiplier (SiPM), the time-of-flight measurement system based on avalanche photodiode (APD), etc.

[0032] In actual devices, in order to ensure the reliability of the time-of-flight measurement system when receiving echoes, the surface area of the detection array of the time-of-flight measurement system is often larger than the area of the echo. Therefore, during the actual operation of the time-of-flight measurement system, only part of the area on the detection array can receive incident photons. However, in the prior art, the photon reception simulation method of the time-of-flight measurement system based on photon detection counting does not perform simulation calculations in combination with the distribution area of incident photons on the detection array. Therefore, performing simulation operations through the prior art easily leads to a certain deviation between the number of received photons of each detection unit on the detection array obtained by calculation and the actual working conditions, and further leads to a certain deviation between the histogram data obtained by the simulation operation and the actual working conditions, and the accuracy of the simulation results is relatively low.

[0033] In view of this, in the embodiments of the present application, the electronic device can calculate the number of received photons corresponding to each detection unit at the analysis moment according to the distribution area of incident photons on the detection array. Therefore, the method provided by the embodiments of the present application can make the distribution of the calculated number of received photons closer to the distribution in actual operation, and further make the number of trigger times of photon events corresponding to the detection array closer to the number in actual operation, thereby improving the accuracy of photon reception simulation and the accuracy of histogram data.

[0034] Furthermore, since the time-of-flight measurement system based on photon detection counting is a time-of-flight measurement system that detects and counts the echo photons reflected by the target object to obtain the distance information of the target object, when the R & D personnel establish the simulation model of the time-of-flight measurement system based on photon detection counting, they need to use the Poisson distribution function to simulate the number of photons received by the detection array on the time-of-flight measurement system at each moment, and then determine the number of photon events occurring in the detection array at each moment according to the simulated number of photons.

[0035] However, the Poisson distribution function assumes that each photon reception event is independent of each other and the average incidence rate is constant. However, the scattering and interference of photons in the detection light make the photon reception events correlated, and the incidence rate of photon reception events is not constant, but will change with the change of spatial position. Therefore, using the Poisson distribution function to approximate the number of received photons will ignore some approximation conditions when describing the speckle phenomenon of the detection light, resulting in a lower accuracy of the number of photons simulated by the Poisson distribution function.

[0036] In view of this, the embodiment of the present application provides a simulation method for performing negative binomial distribution operation based on the number of incident photons and the spot divergence. In the method provided by the embodiment of the present application, the electronic device can perform negative binomial distribution operation based on the number of incident photons and the spot divergence to calculate the number of received photons by the detection array at each analysis moment. Since the negative binomial distribution function can reflect the correlation between photon reception events, the negative binomial distribution function meets the relevant approximation conditions when describing the speckle phenomenon of the detection light. In addition, the mixed distribution characteristic of the negative binomial distribution function is more consistent with the physical mechanism of the formation of the detection light speckle. Therefore, by performing negative binomial distribution operation to simulate the number of received photons corresponding to each detection unit at the analysis moment, the accuracy of the simulation result is higher. This method can be applied to the simulation models of any time-of-flight measurement system, such as the time-of-flight measurement system based on single-photon avalanche photodiodes, the time-of-flight measurement system based on photomultiplier tubes, the time-of-flight measurement system based on silicon photomultiplier tubes, the time-of-flight measurement system based on avalanche photodiodes, etc. That is, the method provided by the embodiment of the present application can be applied to the simulation models of any time-of-flight measurement system that needs to simulate the number of received photons by the detection unit during the simulation process.

[0037] Among many time-of-flight measurement systems based on photon detection counting, the time-of-flight measurement system based on single-photon avalanche photodiodes has extremely prominent long-distance detection capabilities. Therefore, the time-of-flight measurement system based on single-photon avalanche photodiodes has become the main force in vehicle-mounted radars and robot perception detectors and is the key object of simulation research. Further, since the time-of-flight measurement system based on single-photon avalanche photodiodes is a type of time-of-flight measurement system based on photon detection counting, when performing simulation operations, the time-of-flight measurement system based on single-photon avalanche photodiodes also needs to calculate the number of received photons corresponding to each detection unit at the analysis moment through negative binomial distribution operations. That is, the above-mentioned simulation method based on negative binomial distribution operations can also be applied to the simulation model of the simulation method based on negative binomial distribution operations.

[0038] However, different from other time-of-flight measurement systems, the time-of-flight measurement system based on single-photon avalanche photodiodes has the characteristic of dead time. Therefore, during the simulation process of the time-of-flight measurement system based on single-photon avalanche photodiodes, it is also necessary to further combine the dead time of the detection unit based on the number of received photons to determine the trigger times of photon events. Figure 1 Fig. shows a schematic diagram of the trigger mechanism of a single-photon avalanche photodiode provided by an embodiment of the present application. As Figure 1 shown, after the single-photon avalanche photodiode receives a photon at time T1, a photon event will be triggered. Subsequently, the single-photon avalanche photodiode will undergo a quenching process and a recovery process. During the quenching process and the recovery process, the single-photon avalanche photodiode cannot trigger a photon event again. Therefore, the duration of the quenching process and the recovery process can be referred to as the dead time of the single-photon avalanche photodiode. Since the single-photon avalanche photodiode will not trigger a photon event even if it receives a photon again during the dead time, the photon arriving at time T2 will not trigger a photon event. When a photon arrives at the single-photon avalanche photodiode at time T3, since the time difference between time T3 and time T1 is greater than the dead time, the photon arriving at time T3 will trigger a photon event again.

[0039] Due to the characteristic of the dead time of the single-photon avalanche photodiode, in the existing simulation models of time-of-flight measurement systems based on single-photon avalanche photodiodes, complex trigger models often need to be used to simulate the dead time characteristics of the single-photon avalanche photodiodes, thus increasing the computational amount and computational time of the simulation model.

[0040] In view of this, an embodiment of the present application provides a photon event trigger model. Through the photon event trigger model provided in this embodiment, after the electronic device obtains the number of received photons of each detection unit at the analysis moment through negative binomial distribution operation, the photon event trigger model can update the trigger state corresponding to the detection unit according to the trigger moment and the number of received photons of each detection unit at the current analysis moment. Then, the electronic device can determine the number of trigger times of the photon event in the detection array at the current analysis moment through the trigger states of all detection units. Through the method provided in this embodiment, the electronic device does not need to perform a large number of complex operations, but can determine the trigger state of the detection unit by simply comparing the trigger moment and the number of received photons of each detection unit, so as to determine the number of trigger times of the photon event. Therefore, the method provided in this embodiment can simplify the operation of the time-of-flight measurement system simulation model, reduce the amount of operation and operation time of the time-of-flight measurement system simulation model, and thus improve the operation efficiency.

[0041] The technical solution of the present application will be described below through specific embodiments.

[0042] Refer to Figure 2 , which shows a flowchart of a photon reception simulation method for a time-of-flight measurement system provided by an embodiment of the present application. The time-of-flight measurement system may include a transmitter and a detection array. The transmitter in the time-of-flight measurement system can be used to emit detection light. The detection array in the time-of-flight measurement system may include multiple detection units for receiving the reflected light formed by the detection light reflected by the target object. This method can be applied to any electronic device such as a computer, a mobile phone, a tablet computer, a server, etc. that can perform simulation operations on the time-of-flight measurement system. The photon reception simulation method of the above time-of-flight measurement system may specifically include the following steps: S201. For each analysis moment within the analysis period, obtain the number of incident photons reaching the detection array at the analysis moment.

[0043] In this embodiment, when the user needs to perform simulation operations on the time-of-flight measurement system through the simulation model, the user can send a simulation instruction to the electronic device. The electronic device can respond to the simulation instruction and obtain the number of incident photons reaching the detection array at each analysis moment for each analysis moment within the analysis period. The analysis period may be the duration during which the time-of-flight measurement system can receive photons during the photon reception simulation operation, and the analysis moment may be any moment within the analysis period.

[0044] In a possible implementation, when a researcher needs to make specific settings for the time-of-flight measurement system or application environment of the simulation operation, the simulation instruction may further include, but is not limited to, parameters such as the first parameter corresponding to the time-of-flight measurement system, the second parameter of the target object, the third parameter of the detection light, and the fourth parameter corresponding to the sunlight. The electronic device can respond to the simulation instruction and calculate the number of incident photons reaching the detection array at any analysis moment in the analysis period according to the first parameter of the time-of-flight measurement system, the second parameter of the target object, the third parameter of the detection light, and the fourth parameter of the sunlight.

[0045] Specifically, the first parameter corresponding to the time-of-flight measurement system can be a parameter representing the optical performance of the time-of-flight measurement system that needs to perform simulation operations currently. Specifically, the first parameter may include at least one of the optical efficiency of the time-of-flight measurement system, the optical efficiency of the emitter in the time-of-flight measurement system, the emission power of the emitter in the time-of-flight measurement system, the photon detection efficiency of the detection array in the time-of-flight measurement system, the atmospheric transmittance, the first receiving area of the detection array in the time-of-flight measurement system, and the distance between the emitter and the target object. Among them, the first receiving area can be the area corresponding to the echo region where the echo photons are distributed on the detection array. The second parameter of the target object can be a parameter used to describe the characteristics when the target object interacts with light. Specifically, the second parameter may include at least one of the second receiving area on the target object that can receive the detection light and the reflectivity of the target object. The third parameter of the detection light can be a parameter used to describe a certain characteristic of the detection light emitted by the time-of-flight measurement system. Specifically, the third parameter of the detection light may include at least one of the power of the detection light, the frequency of the detection light, the pulse interval of the detection light, and the divergence angle of the detection light. The fourth parameter corresponding to the sunlight can be a parameter used to represent the characteristics of the sunlight. Specifically, the fourth parameter may include at least one of the solar irradiance, the angle between the sunlight and the normal of the target object surface, and the bandwidth of the filter in the time-of-flight measurement system.

[0046] In a possible implementation, since the actual operating environment of the time-of-flight measurement system includes not only the detection light but also often sunlight, the photons reaching the detection array of the time-of-flight measurement system can include the echo photons of the detection light and the noise photons of sunlight. Therefore, the incident photons reaching the detection array can include echo photons and noise photons. In view of this, the number of incident photons reaching the detection array at the analysis moment can include the number of echo photons and the number of noise photons. Specifically, for any analysis moment in the analysis period, the electronic device can first calculate the number of echo photons reaching the detection array at this analysis moment according to the first parameter of the time-of-flight measurement system, the second parameter of the target, and the third parameter of the detection light. The electronic device can also calculate the number of noise photons reaching the detection array at this analysis moment according to the first parameter of the time-of-flight measurement system, the second parameter of the target, and the fourth parameter of sunlight.

[0047] In a possible implementation, the electronic device can calculate the number of echo photons reaching the detection array at each analysis moment according to the first parameter of the time-of-flight measurement system, the second parameter of the target, and the third parameter of the detection light.

[0048] Specifically, Figure 3 shows a schematic diagram of the simulation process of a time-of-flight measurement system provided by an embodiment of the present application. As Figure 3 shown, the time-of-flight measurement system can include a transmitter and a detection array. As Figure 3 shown in (a) of, in response to the simulation instruction, the transmitter can emit detection light to the target. Among them, the divergence angle of the detection light can be expressed as and the solid angle of the detection light can be expressed as . The second receiving area on the target that can receive the detection light can be expressed as . The distance between the target and the transmitter can be expressed as R, and the coverage area when the detection light reaches the plane where the target is located can be expressed as . Specifically, the solid angle can be calculated according to the divergence angle, that is . Among them, the divergence angle can be the angle between the central axis of the light beam and the edge of the light beam. The solid angle is centered on the vertex of the cone formed by the light beam, and is the solid angle formed when the generatrix of the cone formed by the light beam coincides with the boundary of the light beam, and is used to describe the angular range occupied by the light beam in space. The area regions corresponding to the divergence angle and the solid angle can both increase as the transmission distance of the light beam increases.

[0049] In the time domain of the detection light emitted by the transmitter, the detection light energy can be Gaussian-distributed according to the maximum width of the detection light. Therefore, the standard deviation of the detection light energy can be: 。The equation for the change of the detected light intensity over time can be: 。Among them, can represent the detected light intensity; can represent the analysis time, which is the independent variable; can represent the starting time of the analysis period; can represent the initial value of the detected light intensity; can represent the standard deviation of the detected light energy; can represent the exponential function. The power of the detected light emitted by the emitter when it reaches the target can be expressed as ; among them , can represent the power of the detected light when the emitter emits, can be the optical efficiency of the emitter of the time-of-flight measurement system, can be the optical efficiency of the time-of-flight measurement system, can be the second receiving area on the target that can receive the detected light, can be the coverage area when the detected light reaches the plane where the target is located.

[0050] As Figure 3 shown in (b) of Figure 3 , after the target receives the detected light, it will reflect the detected light back to the time-of-flight measurement system. At this time, the detection array on the time-of-flight measurement system can start to receive the echo reflected by the target. As shown in (b) of , the solid angle of the echo can be expressed as The area of the echo on the detection array can be expressed as

[0051] In view of this, when the target is a standard Lambert reflector, the electronic device can combine the area corresponding to the echo region of the echo photons on the detection array and the second receiving area on the target that can receive the detected light to calculate the expected number of echo photons reaching the detection array at each analysis time. Specifically, for any analysis time in the analysis period, the expected number of echo photons reaching the detection array can be calculated by the electronic device according to the optical efficiency of the emitter of the time-of-flight measurement system, the optical efficiency of the time-of-flight measurement system, the atmospheric transmittance, the photon detection efficiency of the detection array on the time-of-flight measurement system, the first receiving area corresponding to the detection array, the pulse interval of the emitter emitting the detected light, the power of the detected light, the frequency of the detected light, the divergence angle of the detected light, the second receiving area on the target that can receive the detected light, and the reflectivity of the target. The specific calculation formula for the number of echo photons reaching the detection array at any analysis time can be as follows:

[0052] Among them, can represent the number of echo photons reaching the detection array at any analysis moment. can be the pulse interval of the detection light. can be the power of the detection light. can be the optical efficiency of the transmitter in the time-of-flight measurement system. can be the optical efficiency of the time-of-flight measurement system. can be the photon detection efficiency of the detection array on the time-of-flight measurement system. can be the atmospheric transmittance. can be the second receiving area corresponding to the area on the target object that can receive the detection light. can be the reflectivity of the target object. can be the first receiving area of the detection array, where the first receiving area can be the area corresponding to the echo area where the echo photons are distributed on the detection array. can be the Planck constant. can be the frequency of the detection light. can be the divergence angle of the detection light. can be the distance between the target object and the transmitter on the time-of-flight measurement system.

[0053] In a possible implementation, the electronic device can calculate the number of noise photons reaching the detection array at each analysis moment according to the first parameter of the time-of-flight measurement system, the second parameter of the target object, and the fourth parameter of the sunlight.

[0054] Specifically, Figure 4 shows a schematic diagram of a time-of-flight measurement system receiving noise photons provided by an embodiment of the present application. When the sun shines on the target object, the target object will also reflect the sunlight onto the detection array of the time-of-flight measurement system. Therefore, the photons received by the detection array include not only the echo photons of the detection light, but also the noise photons of the sunlight reflected by the target object. As Figure 4 shown, the angle between the sunlight and the normal of the target object surface can be expressed as , and the area of the region on the target object that can receive the sunlight can be expressed as .

[0055] Specifically, for a certain analysis moment, the expected number of noise photons reaching the detection array can be calculated by the electronic device based on the solar irradiance, the atmospheric transmittance of the time-of-flight measurement system, the photon detection efficiency of the detection array on the time-of-flight measurement system, the second receiving area of the target object receiving the detection light, the angle between the sunlight and the normal of the target object surface, the solar irradiance, and the bandwidth of the filter in the time-of-flight measurement system. The specific calculation formula for the number of noise photons reaching the detection array at any analysis moment can be shown as follows:

[0056] Among them, can represent the number of noise photons reaching the detection array at any analysis moment. can be the solar irradiance. can be the pulse interval of the detection light emitted by the transmitter. can be the bandwidth of the filter in the time-of-flight measurement system. can be the reflectivity of the target object. can be the angle between the sunlight and the normal of the target object surface. can be the optical efficiency of the time-of-flight measurement system. can be the photon detection efficiency of the detection array. can be the atmospheric transmittance. can be the second receiving area of the target object receiving the detection light. can be the first receiving area of the detection array, where the first receiving area can be the area corresponding to the echo region where the echo photons are distributed on the detection array. can be the Planck constant. can be the frequency of the detection light. can be the distance value between the target object and the transmitter of the time-of-flight measurement system.

[0057] S202. Based on the number of incident photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment.

[0058] In this embodiment, the simulation instruction initiated by the user can include at least the distribution area of the incident photons. Among them, the distribution area of the incident photons can represent the time-of-flight measurement system that needs to perform simulation operations currently, and the area on the detection array where the incident photons can be received during its actual operation. After the electronic device determines the number of incident photons reaching the detection array at each analysis moment, it can determine the number of received photons corresponding to each detection unit at the analysis moment according to the number of incident photons of the detection array and the distribution area of the incident photons set by the user in the simulation instruction.

[0059] In a possible implementation, the incident photons may include echo photons and noise photons. The distribution region may include an echo region where the echo photons are distributed on the detection array and a noise region where the noise photons are distributed on the detection array. Specifically, the distribution region of the echo photons on the detection array may be determined by the user according to the experience during the actual operation of the time-of-flight measurement system, or may be set by the user according to the current simulation requirements. During the design process of the time-of-flight measurement system, in order to enable the detection array of the time-of-flight measurement system to effectively receive the detection optical signal reflected by the target, the detection array is usually designed with a large field of view angle and a wide spectral response optical system. Moreover, the reflection characteristics of the target to sunlight are diverse, and coupled with the atmospheric scattering effect, it is possible for the entire surface of the detection array to receive the sunlight reflected by the target. In view of this, the noise region where the noise photons are distributed on the detection array may be the entire receiving region of the detection array.

[0060] S203. According to the number of received photons corresponding to each detection unit at the analysis moment and the photon event triggering model, obtain the number of trigger times of the photon events corresponding to the detection array at the analysis moment.

[0061] In this embodiment, after the electronic device calculates the number of received photons corresponding to each detection unit on the detection array at a certain analysis moment, it may input the number of received photons corresponding to each detection unit into the photon event triggering model to determine the number of trigger times of the photon events of the detection array at this analysis moment through the photon event triggering model.

[0062] Specifically, the photon event triggering model may determine whether the current detection unit can trigger a photon event according to the trigger moment corresponding to each detection unit. Then, for the detection units that can trigger a photon event and the number of received photons is greater than 0, the photon event triggering model may update the trigger state corresponding to this detection unit to the triggered state. Among them, the triggered state may indicate that this detection unit triggers a photon event at the current analysis moment. For the detection units that cannot trigger a photon event or the number of received photons is equal to 0, the photon event triggering model may update their corresponding trigger states to the untriggered state. Among them, the untriggered state may indicate that this detection unit does not trigger a photon event at the current analysis moment. Then, the photon event triggering model may determine the number of trigger times of the photon events at this analysis moment according to the number of detection units with the triggered state at the current analysis moment.

[0063] S204. Accumulate the number of trigger times of the photon events corresponding to the detection array within the analysis period to obtain the histogram data corresponding to the detection array.

[0064] In this embodiment, after the electronic device determines the number of trigger times of photon events at each analysis moment of the detection array, it can accumulate the number of trigger times of photon events corresponding to each analysis moment within the analysis period to determine the histogram data of the detection array within the analysis period.

[0065] Through the method provided in this embodiment, since only part of the detection array can receive incident photons during the actual operation of the time-of-flight measurement system, calculating the number of received photons of each detection unit in combination with the distribution area of the incident photons can make the number of received photons obtained by the simulation operation more in line with the actual working conditions. Thus, it can be seen that the method provided in this embodiment can improve the distribution accuracy of incident photons during the simulation process, thereby improving the authenticity of the simulation results.

[0066] In a possible implementation manner, after the electronic device generates the histogram data, it can perform target detection and recognition based on the distribution of photon events in the histogram data to generate a target detection result (such as whether there is a target object in the scene, the detected reflectivity of the target object, the detected distance and detection position of the target object, etc.). Then, the electronic device can perform a comparison and analysis based on the target detection result and the target object information input by the user during the simulation operation (such as the fourth parameter of the target object, the distance between the target object and the time-of-flight measurement system set in the simulation model, etc.) to determine the performance index of the time-of-flight measurement system currently performing the simulation operation. For example, the electronic device can determine the performance index of the time-of-flight measurement system currently performing the simulation operation based on the difference between the detected distance of the target object and the distance between the target object and the time-of-flight measurement system set in the simulation model.

[0067] Figure 5 FIG. shows a specific implementation flowchart of a photon reception simulation method S202 of a time-of-flight measurement system provided in the second embodiment of the present application. Refer to Figure 5 compared with Figure 2 In the embodiment described above, S202 in a photon reception simulation method of a time-of-flight measurement system provided in this embodiment includes: S2021 to S2022, which are specifically described in detail as follows: S2021. Calculate the number of received photons corresponding to the detection array based on the number of incident photons and the spot divergence.

[0068] In this embodiment, for any analysis moment in the analysis period, after the electronic device determines the number of incident photons corresponding to this analysis moment, it can calculate the number of received photons received by the detection array at this analysis moment based on the number of incident photons and the spot divergence at this analysis moment.

[0069] In a possible implementation, the incident photons can include echo photons and noise photons. Therefore, the number of incident photons can include the number of echo photons and the number of noise photons. The received photons received by the detection array can include echo received photons and noise received photons. Therefore, the number of received photons received by the detection array at any analysis moment can include the number of echo received photons and the number of noise received photons. In view of this, the electronic device can obtain the spot divergence, and calculate the number of echo received photons according to the spot divergence, the number of echo photons, and the negative binomial distribution function. The electronic device can also calculate the number of noise received photons according to the spot divergence, the number of noise photons, and the negative binomial distribution function.

[0070] In a possible implementation, in view of this, the negative binomial distribution function in the electronic device can include a first negative binomial distribution function for calculating the number of echo received photons corresponding to echo photons, and a second negative binomial distribution function for calculating the number of noise received photons corresponding to noise photons.

[0071] Subsequently, the electronic device can input the expected number of echo photons and the spot divergence into the first negative binomial distribution function to calculate the number of echo received photons reaching the detection array at this analysis moment. Subsequently, the electronic device can input the expected number of noise photons and the spot divergence into the second negative binomial distribution function to calculate the number of noise received photons reaching the detection array at this analysis moment.

[0072] Specifically, the first negative binomial distribution function can be specifically as follows:

[0073] Among them, can represent the negative binomial distribution function. can represent the number of echo received photons. can represent the spot divergence. can represent the number of echo photons reaching the detection array at the current analysis moment.

[0074] Specifically, the second negative binomial distribution function can be specifically as follows:

[0075] Among them, can represent the number of noise received photons. can represent the number of noise photons reaching the detection array at the current analysis moment.

[0076] In a possible implementation, the spot divergence can be obtained by the R & D personnel through a time-of-flight measurement system that has been produced to conduct test experiments on test objects with at least three different reflectivities before issuing the simulation instruction. Specifically,Figure 6 It shows a schematic diagram of the calculation process of the spot divergence provided by the embodiments of the present application. As Figure 6 shown, R & D personnel can emit detection light to test objects with at least three different reflectivities through a time-of-flight measurement system with a certain known parameter, and measure the photon count distribution histograms corresponding to each test object respectively. The time-of-flight measurement system can transmit the measured multiple photon count distribution histograms to an electronic device, and the electronic device can determine the photon number peaks corresponding to each test object according to the photon count distribution histograms. Then, the electronic device can construct a spot divergence function according to the reflectivities and photon number peaks of any two test objects. Then, the electronic device can solve at least two different spot divergence functions according to the divergence range and photon number range preset by the R & D personnel, determine the intersection points within the divergence range and photon number range, and determine the spot divergence in the negative binomial distribution function as the divergence value corresponding to the intersection point.

[0077] Among them, the spot divergence function can be specifically shown as follows:

[0078] Among them, the spot divergence function can be a binary nonlinear function containing two independent variables. can be the spot divergence function constructed according to the reflectivity and photon number peak of the i-th test object, and the reflectivity and photon number peak of the j-th test object. can represent the photon number, which is one of the independent variables in the spot divergence function. can represent the divergence value, which is the other independent variable in the spot divergence function. can be the photon number peak corresponding to the i-th test object. can be the reflectivity corresponding to the i-th test object. can be the photon number peak corresponding to the j-th test object. can be the reflectivity corresponding to the j-th test object.

[0079] Exemplarily, when the number of test objects is 3, the electronic device can solve the following formulas simultaneously to calculate the spot divergence in the negative binomial distribution function.

[0080]

[0081] Among them, can represent the spot divergence function constructed according to the reflectivity and photon number peak of the first test object, and the reflectivity and photon number peak of the second test object. can represent the photon number peak of the first test object. can represent the reflectivity of the first test object. It can represent the peak number of photons of the second test object. It can represent the reflectivity of the second test object. It can represent a spot divergence function constructed based on the reflectivity and peak number of photons of the second test object, as well as the reflectivity and peak number of photons of the third test object. It can represent the peak number of photons of the third test object. It can represent the reflectivity of the third test object.

[0082] Through the method provided in this embodiment, since the electronic device can determine the spot divergence based on the reflectivity and peak number of photons of at least three test objects, the method provided in this embodiment can simplify the calculation difficulty of the spot divergence, reduce the operation time required for the electronic device to calculate the spot divergence, and thus improve the operation efficiency when calculating the spot divergence.

[0083] S2022. Obtain the number of received photons corresponding to each detection unit at the analysis moment according to the number of received photons and the distribution area of incident photons.

[0084] In this embodiment, after the electronic device calculates the number of received photons reaching the detection array at a certain analysis moment, it can calculate the number of received photons corresponding to each detection unit at the analysis moment according to the number of received photons and the distribution area of incident photons.

[0085] In this embodiment, since the spot divergence can reflect the divergence degree of the detection light, the electronic device combines the number of incident photons with the spot divergence to calculate the number of received photons, which can more realistically simulate the propagation loss of the received photons in space, thereby improving the accuracy of the simulation operation.

[0086] In addition, in this embodiment, the electronic device can also perform a negative binomial distribution operation according to the spot divergence to calculate the number of received photons corresponding to the detection array at each analysis moment. Since the number of received photons obtained through the negative binomial distribution operation is closer to the number of photons that the detection array can receive under actual working conditions. Therefore, the method provided in this embodiment can improve the accuracy of the number of received photons corresponding to the detection array calculated by the time-of-flight measurement system simulation model, thereby improving the accuracy of the simulation results generated by the simulation model.

[0087] In a possible implementation, the number of received photons received by the detection array at any analysis moment may include the number of echo-received photons and the number of noise-received photons. For any analysis moment in the analysis period, after the electronic device determines the number of echo-received photons in this analysis moment, it may obtain the echo area where the echo photons are distributed on the detection array, and randomly generate the first coordinates of each echo-received photon on the detection array according to the number of echo-received photons and the echo area. For any analysis moment in the analysis period, after the electronic device determines the number of noise-received photons in this analysis moment, it may obtain the noise area where the noise photons are distributed on the detection array, and randomly generate the second coordinates of each noise-received photon on the detection array according to the number of noise-received photons and the noise area. Then, for any analysis moment in the analysis period, the electronic device may obtain the number of received photons corresponding to each detection unit at this analysis moment according to the first coordinates of all echo-received photons and the second coordinates of all noise-received photons.

[0088] During the actual operation of the time-of-flight measurement system, there are often differences between the echo area on the detection array where echo photons can be received and the noise area where noise photons can be received. Therefore, in this embodiment, the electronic device generates the first coordinates of the echo-received photons according to the echo area and generates the second coordinates of each noise-received photon according to the noise area, which can make the photon distribution closer to the real detection scenario, reduce the errors caused by simplified models (such as the uniform distribution assumption), and thus improve the accuracy of the simulation operation.

[0089] Figure 7 It shows a schematic diagram of the calculation process of the number of received photons provided by the embodiment of the present application. As Figure 7 shown, after the electronic device calculates the number of echo-received photons reaching the detection array at a certain analysis moment, it may randomly generate a plurality of first coordinates according to the number of echo-received photons and the echo area where the echo photons are distributed on the detection array. Among them, the first coordinates may be used to represent the position of the echo-received photons when they reach the detection array. The number of first coordinates generated by the electronic device at a certain analysis moment may be equal to the number of echo-received photons corresponding to this analysis moment, and all the first coordinates may be located within the echo area.

[0090] After calculating the number of noise-receiving photons reaching the detection array at a certain analysis moment, the electronic device can also randomly generate multiple second coordinates according to the noise area where the noise photons are distributed on the detection array. Specifically, the noise area where the noise photons are distributed on the detection array can be equal to the reception area of the detection array, and the echo area where the echo photons are distributed on the detection array can be smaller than the reception area of the detection array. The second coordinates can be used to represent the positions of the noise-receiving photons when they reach the detection array. The number of second coordinates generated by the electronic device at a certain analysis moment can be equal to the number of noise-receiving photons corresponding to this analysis moment.

[0091] As Figure 7 shown, a coordinate point on the detection array can correspond to a detection unit. After the electronic device determines the first coordinates corresponding to each echo photon and the second coordinates corresponding to each noise photon, the electronic device can determine the number of received photons corresponding to the detection unit according to the first coordinates and the second coordinates.

[0092] In a possible implementation manner, after the electronic device determines the number of echo-receiving photons at a certain analysis moment, it can input the number of echo-receiving photons, the horizontal coordinate value range corresponding to the echo area, and the vertical coordinate value range corresponding to the echo area into the first random function to generate multiple first coordinates through the first random function. After the electronic device determines the number of noise-receiving photons at a certain analysis moment, it can also input the number of noise-receiving photons, the horizontal coordinate value range corresponding to the noise area, and the vertical coordinate value range corresponding to the noise area into the second random function to generate multiple second coordinates through the second random function. Among them, the first random function and the second random function can be the Monte Carlo algorithm.

[0093] The first random function can also be the following function.

[0094]

[0095] Among them, can represent the horizontal coordinate value in the first coordinates. can represent the vertical coordinate value in the first coordinates. can represent the random function. can represent the minimum horizontal coordinate in the horizontal coordinate value range corresponding to the echo area. can represent the maximum horizontal coordinate in the horizontal coordinate value range corresponding to the echo area. can represent the minimum vertical coordinate in the vertical coordinate value range corresponding to the echo area. can represent the maximum vertical coordinate in the vertical coordinate value range corresponding to the echo area. can represent the number of echo-receiving photons. Exemplarily, when the distribution area of the echo photons is , the receiving area of the detection array is , where , when can be 1, can be m, can be 1, can be n.

[0096] The second random function can also be the following function.

[0097]

[0098] Among them, can represent the abscissa value in the second coordinate. can represent the ordinate value in the second coordinate. can represent the minimum abscissa value in the abscissa value range corresponding to the noise area. can represent the maximum abscissa value in the abscissa value range corresponding to the noise area. can represent the minimum ordinate value in the ordinate value range corresponding to the noise area. can represent the maximum ordinate value in the ordinate value range corresponding to the noise area. can represent the number of photons received by the noise.

[0099] Figure 8 shows a schematic diagram of a distribution area and a receiving area provided by an embodiment of the present application. As Figure 8 shown, the area 81 in the figure can represent the receiving area of the detection array, and the receiving area can be . Since all areas on the detection array may receive noise photons, the noise photons can reach any position in the receiving area, that is, the noise area can be equal to the receiving area of the detection array. The area 82 in the figure can represent the area on the detection array that can receive echo photons, that is, the echo area where the echo photons are distributed on the detection array, and the echo area can be . Since the receiving area of the detection array is usually larger than the echo area, . Thus, in Figure 8 the detection array shown, in the first random function can be 1, can be M; in the second random function can be 1, can be N.

[0100] Figure 9 shows a specific implementation flowchart of a photon reception simulation method S203 of a time-of-flight measurement system provided by the third embodiment of the present application. Refer to Figure 9 , compared with Figure 2In the described embodiment, S203 in the method for simulating photon reception of a time-of-flight measurement system provided by this embodiment includes: S2031 to S2032, which are specifically described as follows: S2031. For each detection unit, determine the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit and the trigger moment at the analysis moment.

[0101] In this embodiment, at any analysis moment, for any detection unit on the detection array, after the electronic device calculates the number of received photons of the detection unit at the analysis moment, it can determine the trigger state of the photon event on the detection unit according to the trigger moment and the number of received photons corresponding to the detection unit. Among them, the trigger moment corresponding to a certain detection unit can be the moment when the photon event was last triggered on the detection unit. The trigger state corresponding to the detection unit can be used to indicate whether a photon event has been triggered on the detection unit. The trigger state of the detection unit can include a triggered state and an untriggered state.

[0102] In a possible implementation manner, the electronic device determines the trigger state of the photon event according to the number of received photons and the trigger moment, which can specifically include the following two cases: Case 1: The trigger moment is empty At any analysis moment, for any detection unit on the detection array, if the electronic device determines that the trigger moment corresponding to the detection unit is empty, that is, the detection unit has not triggered a photon event during the current simulation process, the electronic device can further determine whether the number of received photons of the detection unit at the current analysis moment is greater than 0.

[0103] In the case where the trigger moment corresponding to the detection unit is empty and the number of received photons of the detection unit at the analysis moment is greater than 0, the electronic device can determine the trigger state of the photon event on the detection unit as the triggered state and update the corresponding trigger moment of the detection unit according to the current analysis moment.

[0104] At any analysis moment, for any detection unit on the detection array, in the case where the trigger moment is empty and the number of received photons of the detection unit at the analysis moment is equal to 0, the electronic device can determine the trigger state of the photon event on the detection unit as the untriggered state.

[0105] Case 2: The trigger moment is not empty At any analysis moment, for any detection unit on the detection array, if the electronic device determines that the trigger moment corresponding to the detection unit is not empty, that is, the detection unit has triggered a photon event during the current simulation process. Since the single-photon avalanche photodiode will experience a quenching process and a recovery process after triggering a photon event, and during the quenching process and the recovery process, the single-photon avalanche photodiode cannot trigger a photon event again. Among them, the duration of the quenching process and the recovery process can be called the dead time. Therefore, when the trigger moment corresponding to the detection unit is not empty, the electronic device can calculate the time difference between the current analysis moment and the trigger moment corresponding to the detection unit. Among them, the trigger moment corresponding to the detection unit can be earlier than the analysis moment.

[0106] When the time difference corresponding to the detection unit is greater than or equal to the dead time of the detection unit, and the number of received photons corresponding to the detection unit is greater than 0, the electronic device can determine the trigger state of the photon event on the detection unit as the triggered state and update the trigger moment corresponding to the detection unit according to the current analysis moment.

[0107] When the time difference corresponding to the detection unit is greater than or equal to the dead time of the detection unit, and the number of received photons corresponding to the detection unit is equal to 0, the electronic device can determine the trigger state of the photon event on the detection unit as the untriggered state.

[0108] When the time difference corresponding to the detection unit is less than the dead time of the detection unit, the electronic device can determine the trigger state of the photon event on the detection unit as the untriggered state.

[0109] In a possible implementation, the trigger moment can be stored in the form of a time matrix. The trigger moment can also be stored in the form of a time array. The trigger moment can also be stored in the form of a time vector. For the trigger state of the photon event on a certain detection unit, the electronic device can store it in the form of a state matrix. The electronic device can also store the trigger state of the photon event on the detection unit in forms such as state identifiers, state arrays, and state vectors.

[0110] In a possible implementation, when the trigger moment is a time matrix for recording the trigger moment of the photon event, and the trigger state of the photon event on the detection unit is represented by a state matrix, at a certain analysis moment during the simulation process, for any detection unit on the detection array, after the electronic device determines the number of received photons of the detection unit at the current analysis moment, it can first judge whether the trigger moment in the time matrix corresponding to the detection unit is empty. Among them, the trigger moment in the time matrix is earlier than the current analysis moment. Among them, the trigger moment in the time matrix can include the following two cases: Case 1: The trigger moment is empty When the trigger time is empty, if the electronic device determines that the number of received photons of the detection unit at the current analysis time is greater than 0, that is, at the current analysis time, the trigger time in the time matrix of the detection unit is empty and the number of received photons is greater than 0, the electronic device can update the state matrix corresponding to the detection unit to the first state matrix, and write the current analysis time as the trigger time into the time matrix corresponding to the detection unit. Among them, the first state matrix can be used to represent that the detection unit changes from the state of not triggering a photon event to the state of triggering a photon event. When the trigger time is empty, if the electronic device determines that the number of received photons of the detection unit at the current analysis time is equal to 0, that is, at the current analysis time, the trigger time in the time matrix of the detection unit is empty and the number of received photons is equal to 0, the electronic device can update the state matrix corresponding to the detection unit to the fourth state matrix, and the electronic device can also not write the current analysis time as the trigger time into the time matrix corresponding to the detection unit, that is, at this time, the trigger time in the time matrix is still empty. Among them, the fourth state matrix can be used to represent that the detection unit is in the state of not triggering a photon event.

[0111] Case 2: The trigger time is not empty When the trigger time is not empty, the electronic device can calculate the time difference between the current analysis time and the trigger time in the time matrix, and determine whether the time difference is greater than or equal to the dead time corresponding to the detection unit. If the electronic device determines that the time difference is less than the dead time, the electronic device can update the state matrix corresponding to the detection unit to the third state matrix, and the electronic device can also not update the trigger time in the time matrix. Among them, the third state matrix is used to represent that the detection unit is in the state of not being able to trigger a photon event.

[0112] When the trigger time is not empty, if the electronic device determines that the time difference is greater than or equal to the dead time, the electronic device can further determine whether the number of received photons of the detection unit at the current analysis time is greater than 0. When the trigger time is not empty and the time difference is greater than or equal to the dead time, if the electronic device determines that the number of received photons of the detection unit at the current analysis time is greater than 0, the electronic device can determine that a photon event has been triggered again on the detection unit. At this time, the electronic device can update the state matrix corresponding to the detection unit to the second state matrix and update the trigger time in the time matrix corresponding to the detection unit according to the current analysis time. Among them, the second state matrix can be used to represent the state transition of the detection unit from the state of triggering a photon event to the state of triggering a photon event again. When the trigger time is not empty and the time difference is greater than or equal to the dead time, if the electronic device determines that the number of received photons of the detection unit at the current analysis time is equal to 0, the electronic device can update the state matrix corresponding to the detection unit to the fourth state matrix and does not update the time matrix corresponding to the detection unit.

[0113] Exemplarily, the specific time matrix of the detection unit located at the position (x i , y j ) at a certain analysis time can be TT = [T(x i , y j k t ), T(x i , y j , k t+1 )], where T(x i , y j k t ) can be the trigger time of the latest photon event on the detection unit, and T(x i , y j , k t+1 ) can be the current analysis time. The specific state matrix of the detection unit located at the position (x i , y j ) at a certain analysis time can be represented as SS = [S(x i , y j , k t ), S(x i , y j , k t+1 )]. Among them, the first state matrix can be represented as [0, 1], the second state matrix can be represented as [1, 1], the third state matrix can be represented as [1, 0], and the fourth state matrix can be represented as [0, 0].

[0114] In this embodiment, the electronic device records the trigger moments corresponding to the detection units in the form of a time matrix, and records the trigger states of the detection units in the form of a state matrix, which can facilitate the parallel computing of the electronic device, thereby improving the data processing speed and accelerating the operation efficiency of the simulation model.

[0115] S2032. Obtain the trigger times of the photon events corresponding to the detection array at the analysis moment according to the trigger states of the photon events on each detection unit.

[0116] In this embodiment, for any analysis moment during the simulation process, after the electronic device determines the trigger states corresponding to each detection unit at this analysis moment, it can determine the trigger times of the photon events of the detection array at this analysis moment according to the trigger states corresponding to all detection units.

[0117] In a possible implementation manner, for any analysis moment during the simulation process, the electronic device can count the number of detection units on the detection array whose trigger states are triggered states to determine the trigger times of the photon events corresponding to the detection array at this analysis moment.

[0118] In a possible implementation manner, when the trigger states of the photon events on the detection units are represented in the form of a state matrix, for any analysis moment during the simulation process, the electronic device can count the number of detection units whose state matrices are the first state matrix or the second state matrix, and determine the number of detection units whose state matrices are the first state matrix or the second state matrix as the trigger times of the photon events of the detection array at the current analysis moment.

[0119] Through the method provided in this embodiment, the electronic device can determine whether a photon event occurs on the detection unit according to the trigger moment and trigger state corresponding to the detection unit. Compared with the dead time model in the prior art, the method provided in this embodiment has a smaller amount of computation, thereby improving the operation efficiency of the simulation model.

[0120] Figure 10 Shows a simulation method for a time-of-flight measurement system based on a single-photon avalanche diode provided by an embodiment of the present application. As Figure 10As shown, when a user needs to perform simulation operations on a time-of-flight measurement system based on a single-photon avalanche photodiode, the user can input the distribution area of echo photons on the detection array of the time-of-flight measurement system, the first parameter of the time-of-flight measurement system, the second parameter of the target object, and the fourth parameter of sunlight into an electronic device. The electronic device can perform negative binomial distribution operations based on the distribution area, the first parameter of the time-of-flight measurement system, the second parameter of the target object, and the fourth parameter of sunlight to calculate the number of echo received photons and the number of noise received photons arriving at the detection array at each analysis moment. Then, the electronic device can input the number of echo received photons into the first random function to generate the first coordinate corresponding to each echo photon to determine the detection unit where each echo photon arrives within the distribution area. The electronic device can also input the number of noise received photons into the second random function to generate the second coordinate corresponding to each noise photon to determine the detection unit where each noise photon arrives within the reception area.

[0121] For the detection unit that receives echo photons and / or noise photons, the electronic device can obtain the time matrix of the detection unit. If the time matrix of the detection unit does not contain the trigger moment, the electronic device can write the current analysis moment as the trigger moment into the time matrix and update the state matrix of the detection unit to the first state matrix.

[0122] If the time matrix of the detection unit contains the trigger moment, the electronic device can calculate the time difference between the trigger moment in the time matrix and the current analysis moment. The electronic device can determine whether the time difference between the trigger moment and the current analysis moment is less than the dead time. If the time difference between the trigger moment and the current analysis moment is less than the dead time, the electronic device can not update the trigger moment in the time matrix and update the state matrix corresponding to the detection unit to the third state matrix. If the time difference between the trigger moment and the current analysis moment is greater than or equal to the dead time, the electronic device can update the trigger moment of the detection unit according to the current analysis moment and update the state matrix of the detection unit to the second state matrix.

[0123] Then, the electronic device can perform iterative counting on the state matrices of all detection units, count the number of detection units whose state matrices are the first state matrix or the second state matrix at the current analysis moment, and determine the number of detection units whose state matrices are the first state matrix or the second state matrix as the trigger times of photon events. The electronic device can accumulate the trigger times of photon events corresponding to the detection array within the analysis period and generate histogram data corresponding to the detection array.

[0124] It should be noted that the sequence numbers of the steps in the above embodiments do not represent the order of execution. The order of execution of each process should be determined according to its function and internal logic, and should not impose any limitation on the implementation process of the embodiments of the present application.

[0125] Figure 11 FIG. shows a schematic diagram of a photon reception simulation device of a time-of-flight measurement system provided by an embodiment of the present application, which may specifically include an incident photon acquisition module 1101, a photon number determination module 1102, a trigger count determination module 1103, and a histogram generation module 1104, where: The incident photon acquisition module 1101 is configured to obtain the number of incident photons reaching the detection array at each analysis moment within an analysis period. The photon number determination module 1102 is configured to obtain the number of received photons corresponding to each detection unit at the analysis moment based on the number of incident photons and the distribution area of the incident photons. The trigger count determination module 1103 is configured to obtain the trigger count of the photon event corresponding to the detection array at the analysis moment according to the number of received photons corresponding to each detection unit at the analysis moment and a photon event trigger model. The histogram generation module 1104 is configured to accumulate the trigger count of the photon event corresponding to the detection array within the analysis period to obtain histogram data corresponding to the detection array, and the histogram data is used to determine the performance index of the detection array.

[0126] The photon number determination module 1102 may also be configured to calculate the number of received photons corresponding to the detection array based on the number of incident photons and the spot divergence; and obtain the number of received photons corresponding to each detection unit at the analysis moment according to the number of received photons and the distribution area of the incident photons.

[0127] The photon number determination module 1102 may also be configured to determine the spot divergence; calculate the number of received echo photons according to the spot divergence, the number of echo photons, and a negative binomial distribution function; and calculate the number of received noise photons according to the spot divergence, the number of noise photons, and a negative binomial distribution function.

[0128] The photon number determination module 1102 can also be used to obtain the echo region where the echo photons are distributed on the detection array and the noise region where the noise photons are distributed on the detection array; randomly generate the first coordinates of each echo received photon on the detection array according to the number of echo received photons and the echo region; randomly generate the second coordinates of each noise received photon on the detection array according to the number of noise received photons and the noise region; and obtain the number of received photons corresponding to each detection unit at the analysis moment according to the first coordinates of all the echo received photons and the second coordinates of all the noise received photons.

[0129] The trigger count determination module 1103 can also be used to determine, for each detection unit, the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment, where the trigger state includes a triggered state and an untriggered state; and obtain the trigger count of the photon event corresponding to the detection array at the analysis moment according to the trigger state of the photon event on each detection unit.

[0130] The trigger count determination module 1103 can also be used to count the number of detection units in the triggered state to obtain the trigger count of the photon event corresponding to the detection array at the analysis moment.

[0131] The trigger count determination module 1103 can also be used to determine the trigger state of the photon event on the detection unit as the triggered state when the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0; or determine the trigger state of the photon event on the detection unit as the untriggered state when the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0.

[0132] The trigger count determination module 1103 can also be used to calculate the time difference between the analysis moment and the trigger moment when the trigger moment is not empty, where the trigger moment is earlier than the analysis moment; determine the trigger state of the photon event on the detection unit as the triggered state when the time difference is greater than or equal to the dead time of the detection unit and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0; or determine the trigger state of the photon event on the detection unit as the untriggered state when the time difference is greater than or equal to the dead time of the detection unit and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0; or determine the trigger state of the photon event on the detection unit as the untriggered state when the time difference is less than the dead time of the detection unit.

[0133] The trigger count determination module 1103 can also be used to update the trigger time of the detection unit according to the analysis time.

[0134] The incident photon acquisition module 1101 can also be used to calculate the number of incident photons according to the first parameter of the time-of-flight measurement system, the second parameter of the target, the third parameter of the detection light, and the fourth parameter of sunlight; the first parameter includes the optical efficiency of the time-of-flight measurement system, the optical efficiency of the transmitter, the transmission power of the transmitter, the photon detection efficiency of the detection array, the atmospheric transmittance, the first receiving area of the detection array, and the distance between the transmitter and the target; the second parameter includes the reflectivity of the target and the second receiving area of the target, and the third parameter includes the power of the detection light, the frequency of the detection light, the pulse interval of the detection light, and the divergence angle of the detection light; the fourth parameter includes the solar irradiance, the angle between the sunlight and the surface normal of the target, and the bandwidth of the filter in the time-of-flight measurement system.

[0135] The incident photon acquisition module 1101 can also be used to calculate the number of echo photons according to the first parameter, the second parameter, and the third parameter; calculate the number of noise photons according to the first parameter, the second parameter, and the fourth parameter.

[0136] For the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple. For related parts, please refer to the description in the method embodiment section.

[0137] Refer to Figure 12 , which shows a schematic diagram of an electronic device provided by an embodiment of the present application. As Figure 12 shown, the electronic device 1200 in the embodiment of the present application includes: a processor 1210, a memory 1220, and a computer program 1221 stored in the memory 1220 and executable on the processor 1210. When the processor 1210 executes the computer program 1221, it implements the steps in each embodiment of the photon reception simulation method of the above time-of-flight measurement system, such as Figure 2 the steps S201 to S204 shown. Alternatively, when the processor 1210 executes the computer program 1221, it implements the functions of each module / unit in each device embodiment above, such as Figure 11 the functions of the modules 1101 to 1104 shown.

[0138] Exemplarily, the computer program 1221 can be divided into one or more modules / units, which are stored in the memory 1220 and executed by the processor 1210 to complete this application. The one or more modules / units can be a series of computer program instruction segments capable of performing specific functions, and these instruction segments can be used to describe the execution process of the computer program 1221 in the electronic device 1200. For example, the computer program 1221 can be divided into an incident photon acquisition module, a photon number determination module, a trigger count determination module, and a histogram generation module. The specific functions of each module are as follows: The incident photon acquisition module is configured to, for each analysis moment within an analysis period, acquire the number of incident photons reaching the detection array at the analysis moment; The photon number determination module is configured to, based on the number of incident photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment; The trigger count determination module is configured to, according to the number of received photons corresponding to each detection unit at the analysis moment and a photon event trigger model, obtain the trigger count of the photon events corresponding to the detection array at the analysis moment; The histogram generation module is configured to accumulate the trigger count of the photon events corresponding to the detection array within the analysis period to obtain histogram data corresponding to the detection array, and the histogram data is used to determine the performance metrics of the detection array.

[0139] The electronic device 1200 can be a computing device such as a desktop computer or a cloud server. The electronic device 1200 may include, but is not limited to, a processor 1210 and a memory 1220. Those skilled in the art can understand that Figure 12 This is merely an example of the electronic device 1200 and does not constitute a limitation on the electronic device 1200. It may include more or fewer components than shown in the figure, or combine certain components, or have different components. For example, the electronic device 1200 may further include input / output devices, network access devices, a bus, etc.

[0140] The processor 1210 may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor, or the processor may also be any conventional processor, etc.

[0141] The memory 1220 may be an internal storage unit of the electronic device 1200, such as the hard disk or memory of the electronic device 1200. The memory 1220 may also be an external storage device of the electronic device 1200, such as a plug-in hard disk, Smart Media Card (SMC), Secure Digital (SD) card, Flash Card, etc. equipped on the electronic device 1200. Further, the memory 1220 may also include both the internal storage unit and the external storage device of the electronic device 1200. The memory 1220 is used to store the computer program 1221 and other programs and data required by the electronic device 1200. The memory 1220 may also be used to temporarily store data that has been output or is to be output.

[0142] An embodiment of the present application also discloses an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the photon reception simulation method of the time-of-flight measurement system as described in the foregoing various embodiments.

[0143] An embodiment of the present application also discloses a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, it implements the photon reception simulation method of the time-of-flight measurement system as described in the foregoing various embodiments.

[0144] An embodiment of the present application also discloses a computer program product. When the computer program product runs on a computer, it causes the computer to execute the photon reception simulation method of the time-of-flight measurement system as described in the foregoing various embodiments.

[0145] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A photon reception simulation method for a time-of-flight measurement system, characterized in that, The time-of-flight measurement system includes a transmitter and a detection array. The transmitter is used to emit detection light. The detection array includes a plurality of detection units and is used to receive the echo light formed by the reflection of the detection light by the target. The method includes: For each analysis moment within the analysis period, obtain the number of incident photons reaching the detection array at the analysis moment; Based on the number of incident photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment; According to the number of received photons corresponding to each detection unit at the analysis moment and the photon event trigger model, obtain the number of trigger times of the photon events corresponding to the detection array at the analysis moment; Accumulate the number of trigger times of the photon events corresponding to the detection array within the analysis period to obtain the histogram data corresponding to the detection array. The histogram data is used to determine the performance index of the detection array.

2. The method according to claim 1, characterized in that The obtaining the number of received photons corresponding to each detection unit at the analysis moment based on the number of incident photons and the distribution area of the incident photons includes: Based on the number of incident photons and the spot divergence, calculate the number of received photons corresponding to the detection array; According to the number of received photons and the distribution area of the incident photons, obtain the number of received photons corresponding to each detection unit at the analysis moment.

3. The method according to claim 2, characterized in that, The incident photons include echo photons and noise photons, and the received photons include echo received photons and noise received photons. The calculating the number of received photons corresponding to the detection array based on the number of incident photons and the spot divergence includes: Determine the spot divergence; According to the spot divergence, the number of echo photons, and the negative binomial distribution function, calculate the number of echo received photons; According to the spot divergence, the number of noise photons, and the negative binomial distribution function, calculate the number of noise received photons.

4. The method according to claim 3, characterized in that The obtaining the number of received photons corresponding to each detection unit at the analysis moment according to the number of received photons and the distribution area of the incident photons includes: Obtain the echo area where the echo photons are distributed on the detection array and the noise area where the noise photons are distributed on the detection array; According to the number of echo received photons and the echo area, randomly generate the first coordinates of each echo received photon on the detection array; According to the number of noise received photons and the noise area, randomly generate the second coordinates of each noise received photon on the detection array; According to the first coordinates of all the echo received photons and the second coordinates of all the noise received photons, obtain the number of received photons corresponding to each detection unit at the analysis moment.

5. The method according to claim 1, wherein The obtaining the number of trigger times of the photon events corresponding to the detection array at the analysis moment according to the number of received photons corresponding to each detection unit at the analysis moment and the photon event trigger model includes: For each of the detection units, determine the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment, where the trigger state includes a triggered state and an untriggered state; According to the trigger state of the photon event on each detection unit, obtain the trigger count of the photon event corresponding to the detection array at the analysis moment.

6. The method according to claim 5, wherein The obtaining the trigger count of the photon event corresponding to the detection array at the analysis moment according to the trigger state of the photon event on each detection unit includes: Count the number of detection units with the trigger state being the triggered state to obtain the trigger count of the photon event corresponding to the detection array at the analysis moment.

7. The method according to claim 5, characterized in that, The determining the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment includes: When the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0, determine the trigger state of the photon event on the detection unit as the triggered state; or When the trigger moment is empty and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0, determine the trigger state of the photon event on the detection unit as the untriggered state.

8. The method according to claim 5, wherein The determining the trigger state of the photon event on the detection unit according to the number of received photons corresponding to the detection unit at the analysis moment and the trigger moment includes: When the trigger moment is not empty, calculate the time difference between the analysis moment and the trigger moment, where the trigger moment is earlier than the analysis moment; When the time difference is greater than or equal to the dead time of the detection unit and the number of received photons corresponding to the detection unit at the analysis moment is greater than 0, determine the trigger state of the photon event on the detection unit as the triggered state; or When the time difference is greater than or equal to the dead time of the detection unit and the number of received photons corresponding to the detection unit at the analysis moment is equal to 0, determine the trigger state of the photon event on the detection unit as the untriggered state; or When the time difference is less than the dead time of the detection unit, determine the trigger state of the photon event on the detection unit as the untriggered state.

9. The method according to claim 7 or 8, characterized in that After determining the trigger state of the photon event on the detection unit as the triggered state, it further includes: Update the trigger moment of the detection unit according to the analysis moment.

10. The method according to claim 1, wherein The obtaining the number of incident photons reaching the detection array at the analysis moment includes: Calculate the number of incident photons based on a first parameter of the time-of-flight measurement system, a second parameter of the target, a third parameter of the detection light, and a fourth parameter of sunlight; the first parameter includes the optical efficiency of the time-of-flight measurement system, the optical efficiency of the emitter, the emission power of the emitter, the photon detection efficiency of the detection array, the atmospheric transmittance, the first receiving area of the detection array, and the distance between the emitter and the target; the second parameter includes the reflectivity of the target and the second receiving area of the target, the third parameter includes the power of the detection light, the frequency of the detection light, the pulse interval of the detection light, and the divergence angle of the detection light; the fourth parameter includes the solar irradiance, the angle between the sunlight and the normal of the target surface, and the bandwidth of the filter in the time-of-flight measurement system.

11. The method according to claim 10, wherein The incident photons include echo photons and noise photons, and the calculating the number of incident photons based on a first parameter of the time-of-flight measurement system, a second parameter of the target, a third parameter of the detection light, and a fourth parameter of sunlight includes: Calculate the number of echo photons according to the first parameter, the second parameter, and the third parameter; Calculate the number of noise photons according to the first parameter, the second parameter, and the fourth parameter.

12. An electronic device, characterized in that, Includes: A memory for storing executable program code; A processor for calling and running the executable program code from the memory, so that the electronic device executes the photon reception simulation method of the time-of-flight measurement system according to any one of claims 1-11.

13. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, which when executed, implements the photon reception simulation method of the time-of-flight measurement system according to any one of claims 1-11.

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