Test method and test device
By storing and releasing test files in the memory buffer of electronic devices, the problem of long testing time of electronic devices is solved, and faster production and manufacturing speed and more efficient testing preparation are achieved.
Patent Information
- Application Number
- CN202510292365.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-12
- Publication Date
- 2025-07-22
AI Technical Summary
In the prior art, the storage of test files of electronic devices in the local storage space causes the system file size to increase, the testing time is long, and the production and manufacturing speed is slow.
Store the test files in the memory buffer of the electronic device and release them directly from the memory buffer after the test is completed to avoid storage in the local storage space. Use the streaming module to obtain the test files wirelessly, and support multiple devices to connect and test at the same time.
It shortens the test preparation time, improves the production and manufacturing speed, reduces manual operation costs, and improves the speed of copying test files.
Smart Images
Figure CN120353765A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing technologies, and particularly to a testing method and a testing device. Background Art
[0002] In the related art, when manufacturing electronic devices, the test files are often copied to the local storage space of the electronic device for storage, and then the electronic device is tested before leaving the factory according to the test files stored in the local storage space. However, storing the test files in the local storage space will increase the size of the system files in the local storage space, and after the test is completed, it is necessary to manually delete the test files from the local storage space, resulting in a long test time for the electronic device and a slow production and manufacturing speed. Summary of the Invention
[0003] In view of this, the embodiments of this application aim to at least solve one of the problems in the related art to some extent. For this reason, the purpose of this application is to provide a testing method and a testing device.
[0004] The embodiments of this application provide a testing method for an electronic device, and the testing method includes:
[0005] Obtain a preset test file;
[0006] Store the preset test file in the memory buffer of the electronic device, and test the electronic device according to the preset test file;
[0007] Release the preset test file after testing from the memory buffer.
[0008] In some embodiments, the obtaining of the preset test file includes:
[0009] Establish a communication connection between the electronic device and the sending end according to a preset instruction, and receive the preset test file transmitted in blocks by the sending end.
[0010] In some embodiments, the obtaining of the preset test file includes:
[0011] Confirm whether the communication connection established between the electronic device and the sending end is abnormal. When the communication connection between the electronic device and the sending end is abnormal, re - establish the communication connection between the electronic device and the sending end;
[0012] Receive the data that has not been transmitted in the preset test file transmitted by the sending end.
[0013] In some embodiments, the receiving of the preset test file transmitted in blocks by the sending end includes:
[0014] When the electronic device performs a routine test, receive the preset test file transmitted in blocks by the sending end.
[0015] In some embodiments, the obtaining the preset test file includes:
[0016] Adjust the bandwidth of the sending end according to a preset priority.
[0017] In some embodiments, the sending end includes a master end and at least one slave end. Before obtaining the preset test file, the test method includes:
[0018] Configure the preset test file and the sending end;
[0019] Establish a communication connection between the master end and the slave end.
[0020] In some embodiments, the test method includes:
[0021] When multiple electronic devices establish communication connections with the slave end, assign an address segment to each electronic device according to a preset Internet protocol address range, and the address segment corresponds to the electronic device one by one.
[0022] In some embodiments, after multiple electronic devices establish communication connections with the slave end, the test method includes:
[0023] Transmit the preset test file to multiple electronic devices simultaneously.
[0024] In some embodiments, after testing the electronic device according to the preset test file, the test method includes:
[0025] Verify the electronic device by a preset method according to the preset test file.
[0026] An embodiment of the present application also provides a test device. The test device includes an obtaining module, a storage module, and a releasing module. The obtaining module is used to obtain a preset test file. The storage module is used to store the preset test file in the memory buffer of the electronic device and test the electronic device according to the preset test file. The releasing module is used to release the preset test file after testing from the memory buffer.
[0027] After obtaining the preset test file, the test method and test device according to the embodiments of the present application store the preset test file in the memory buffer of the electronic device, and test the electronic device according to the preset test file. After the test is completed, the tested preset test file is directly released from the memory buffer, so that the preset test file will not be stored in the local storage space of the electronic device all the time, the system file of the electronic device will not increase, and when storing the preset test file in the electronic device, there is no need to manually copy the preset test file to the electronic device one by one, which can greatly shorten the test preparation time of the electronic device and improve the production and manufacturing speed.
[0028] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present application. Brief Description of the Drawings
[0029] The above and / or additional aspects and advantages of the present application will become apparent and be readily understood from the description of the embodiments in conjunction with the following drawings, wherein:
[0030] Figure 1 is a flowchart of the test method according to some embodiments of the present application;
[0031] Figure 2 is a schematic structural diagram of the test device according to some embodiments of the present application;
[0032] Figure 3 is a schematic structural diagram of the computer device according to some embodiments of the present application;
[0033] Figure 4 is one of the schematic diagrams of the scenario of the test method according to some embodiments of the present application;
[0034] Figure 5 is a flowchart of the test method according to some embodiments of the present application;
[0035] Figure 6 is a schematic diagram of the scenario of the interaction between the RuntimeTest interface of the electronic device and the background thread according to some embodiments of the present application;
[0036] Figure 7 is a flowchart of the test method according to some embodiments of the present application;
[0037] Figure 8 is a flowchart of the test method according to some embodiments of the present application;
[0038] Figure 9 is a flowchart of the test method according to some embodiments of the present application;
[0039] Figure 10It is the second schematic diagram of the scenario of the test method according to some embodiments of the present application;
[0040] Figure 11 It is the schematic flow diagram of the test method according to some embodiments of the present application;
[0041] Figure 12 It is the schematic flow diagram of the test method according to some embodiments of the present application;
[0042] Figure 13 It is the schematic flow diagram of the test method according to some embodiments of the present application;
[0043] Figure 14 It is the schematic flow diagram of the test method according to some embodiments of the present application. Detailed Embodiments
[0044] The following details the embodiments of the present application. The examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary only for explaining the embodiments of the present application and should not be construed as limiting the embodiments of the present application.
[0045] Please refer to Figure 1 , the present application provides a test method for an electronic device 100 (as Figure 4 shown), and the prediction method includes:
[0046] 01: Obtain a preset test file.
[0047] 02: Store the preset test file in the memory buffer of the electronic device and test the electronic device 100 according to the preset test file.
[0048] 03: Release the tested preset test file from the memory buffer.
[0049] Please refer to Figure 2 , the present application also provides a test device 200. The test device 200 includes an acquisition module 210, a storage module 230, and a release module 250. Step 01 can be implemented by the acquisition module 210. Step 02 can be implemented by the storage module 230. Step 03 can be implemented by the release module 250. That is, the acquisition module 210 is used to obtain a preset test file. The storage module 230 is used to store the preset test file in the memory buffer of the electronic device 100 and test the electronic device 100 according to the preset test file. The release module 250 is used to release the tested preset test file from the memory buffer.
[0050] Please refer to Figure 3, this application also provides a computer device 300. The computer device 300 includes a memory 310 and a processor 330. The memory 310 is used to store computer programs. The processor 330 is used to execute step 01, step 02, and step 03. That is, the processor 330 is used to obtain a preset test file; store the preset test file in the memory buffer of the electronic device 100, and test the electronic device 100 according to the preset test file; release the tested preset test file from the memory buffer.
[0051] Specifically, the preset test file can be pre-stored in a file server 400 as shown in Figure 4 . When aging testing of the electronic device 100 is required, the electronic device 100 can obtain the preset test file from the file server 400 through a streaming module built into the electronic device 100. Then, after the electronic device 100 obtains the preset test file, the preset test file can be stored in the memory buffer, and the electronic device 100 can be aged tested according to the test data in the preset test file. Finally, after aging testing the electronic device 100 through the preset test file, the memory buffer can automatically delete the data in the tested preset test file from the memory buffer to dynamically release the tested data in the memory buffer, so that the preset test file does not directly occupy the local storage space of the electronic device 100, the system files of the electronic device 100 do not increase, the testing time of the electronic device 100 is shortened, and the production and manufacturing speed is improved.
[0052] It should be noted that the preset test file can refer to an aging test file pre-stored in the file server 400. The aging test file can include files such as audio, video, and compressed packages that require a large amount of memory of the electronic device 100, and there is no limit here. The memory buffer can be used to temporarily store the preset test file transmitted into the electronic device 100, that is, the preset test file stored in the memory buffer will not be directly stored in the local storage space of the electronic device 100 and occupy the memory of the local storage space, and when aging testing is required, the data stored in the memory buffer can be easily read quickly to shorten the testing time of the aging test. The electronic device 100 can refer to devices such as mobile phones, tablets, or computers that require aging testing, and there is no limit here.
[0053] In one embodiment, when an aging stress test needs to be performed on the audio capabilities of the electronic device 100, the streaming module of the electronic device 100 can obtain the audio in the aging test file from the file server 400 and store the audio in the memory buffer of the electronic device 100. Then, the electronic device 100 can retrieve the audio in the memory buffer for the audio aging test, and automatically delete the tested audio after the audio aging test, so that the audio does not directly occupy the local storage space of the electronic device 100, the system files of the electronic device 100 do not increase, the test time of the electronic device 100 is shortened, and the production and manufacturing speed is increased.
[0054] In this way, after obtaining the preset test file, the test method of the embodiment of the present application stores the preset test file in the memory buffer of the electronic device 100, and tests the electronic device 100 according to the preset test file. After the test is completed, the tested preset test file is directly released from the memory buffer, so that the preset test file is not always stored in the local storage space of the electronic device 100, the system files of the electronic device 100 do not increase, and when storing the preset test file in the electronic device 100, there is no need to manually copy the preset test file to the electronic device 100 one by one, which can greatly shorten the test preparation time of the electronic device 100 and increase the production and manufacturing speed.
[0055] In addition, when an aging test needs to be performed on the electronic device 100 in the related art, it is necessary to manually copy the aging test file to the electronic device 100 one by one. In the present application, the streaming module built in the electronic device 100 directly wirelessly obtains the preset test file from the file server 400, reducing the manual operation cost and increasing the copying speed of the preset test file.
[0056] Please refer to Figure 5 , in some embodiments, step 01 includes:
[0057] 011: Establish a communication connection between the electronic device and the sending end according to a preset instruction, and receive the preset test file transmitted in blocks by the sending end.
[0058] Please refer to Figure 2 , in some embodiments, step 011 can be implemented by the acquisition module 210. That is, the acquisition module 210 is used to establish a communication connection between the electronic device 100 and the sending end 500 according to a preset instruction, and receive the preset test file transmitted in blocks by the sending end 500.
[0059] Please refer to Figure 3 , the processor 330 is used to execute step 011. That is, the processor 330 is used to establish a communication connection between the electronic device 100 and the sending end 500 according to a preset instruction, and receive the preset test file transmitted in blocks by the sending end 500.
[0060] Among them, the preset instruction can refer to a control instruction that is pre-set to invoke the RuntimeTest mode interface of the electronic device 100 (as shown in Figure 6 ). The preset instruction can be composed of one or more numbers and characters, and the user can customize the settings, which are not limited here. The sending end 500 can be wirelessly communicatively connected to the file server 400 and the electronic device 100 respectively, so that the file server 400 transmits the preset test file in chunks to the electronic device 100 through the sending end 500. The sending end 500 can be a router or a switch, etc., which are not limited here. Chunk transmission can refer to segmenting and transmitting data of various types of aging test data (such as audio, video, and compressed packages, etc.) included in the preset test file according to the type to the electronic device 100, so that the electronic device 100 can write the aging test data in the preset test file into the memory buffer in real time.
[0061] In one embodiment, the preset instruction can be, for example, *#*#6688#*#*. When the electronic device 100 needs to obtain the preset test file, after entering the RuntimeTest mode by inputting *#*#6688#*#* in the electronic device 100, check Figure 6 "Download" in and click the Start button. At this time, the electronic device 100 will automatically establish a wireless communication connection with the sending end 500 (as shown in Figure 4 ) to obtain an Internet protocol address (the Internet protocol address can be, for example, 192.168.8.10). The file server 400 will automatically start a background download thread according to the priority of the preset test file and the size of the memory buffer occupied by the preset test file, so that the file server 400 transmits the preset test file in chunks to the electronic device 100 through the sending end 500, thereby eliminating the need for manual communication connection between the electronic device 100 and the sending end 500 by wire, preventing the cumbersome and error-prone situation caused by frequent plugging and unplugging of the data cable, and enabling wireless communication between the electronic device 100 and the sending end 500, which can support simultaneous communication connections of multiple electronic devices 100 with the sending end 500, and sending the preset test file to multiple electronic devices 100 at the same time, greatly improving the copy speed of the preset test file.
[0062] In addition, as shown in Figure 6 , the present application can also be provided with a DL only option in the RuntimeTest mode interface. When the electronic device 1 needs to obtain the preset test file but does not need to immediately perform aging tests, the DL only option can be checked, so that the electronic device 100 only downloads the preset test file but does not perform aging tests.
[0063] Please refer to Figure 7, in some embodiments, step 01 further includes:
[0064] 012: Confirm whether the communication connection established between the electronic device and the sending end is abnormal. When the communication connection between the electronic device and the sending end is abnormal, re - establish the communication connection between the electronic device and the sending end.
[0065] 013: Receive the data in the preset test file that has not been transmitted by the sending end.
[0066] Please refer to Figure 2 , in some embodiments, step 012 and step 013 can be implemented by the acquisition module 210. That is, the acquisition module 210 is used to confirm whether the communication connection established between the electronic device 100 and the sending end 500 is abnormal. When the communication connection between the electronic device 100 and the sending end 500 is abnormal, re - establish the communication connection between the electronic device 100 and the sending end 500; receive the data in the preset test file that has not been transmitted by the sending end 500.
[0067] Please refer to Figure 3 , the processor 330 is used to execute step 012 and step 013. That is, the processor 330 is used to confirm whether the communication connection established between the electronic device 100 and the sending end 500 is abnormal. When the communication connection between the electronic device 100 and the sending end 500 is abnormal, re - establish the communication connection between the electronic device 100 and the sending end 500; receive the data in the preset test file that has not been transmitted by the sending end 500.
[0068] Specifically, during the process of the electronic device 100 acquiring the preset test file, it can be confirmed in real - time whether the communication connection established between the electronic device 100 and the sending end 500 is abnormal. If it is confirmed that the communication connection between the electronic device 100 and the sending end 500 is abnormal, the electronic device 100 can automatically re - establish the communication connection with the sending end 500, so that the file server 400 can transmit the data in the preset test file that has not been transmitted through the sending end 500. Thus, after the communication connection between the electronic device 100 and the sending end 500 is disconnected and re - connected, there is no need to re - transmit the data of the entire preset test file, but only the data in the preset test file that has not been transmitted, which avoids the duplication of the data of the preset test file from occupying the memory buffer space and can ensure the integrity of the preset test file at the same time. It should be noted that the abnormal communication connection can refer to the disconnection of the communication connection between the electronic device 100 and the sending end 500, or it can refer to the communication error between the electronic device 100 and the sending end 500, which is not limited here.
[0069] In one embodiment, when the electronic device 100 obtains a preset test file including audio and video, if the communication connection established between the electronic device 100 and the sending end 500 is abnormal after the electronic device 100 only obtains the audio in the preset test file, the electronic device 100 can automatically re - establish the communication connection with the sending end 500, so that the file server 400 can continue to transmit the video of the preset test file to the electronic device 100 through the sending end 500 to achieve resume - interrupted transfer.
[0070] Please refer to Figure 8 , in some embodiments, step 013 includes:
[0071] 0131: When the electronic device conducts a routine test, receive the preset test file transmitted in blocks by the sending end.
[0072] Please refer to Figure 2 , in some embodiments, step 0131 can be implemented by the acquisition module 210. That is, the acquisition module 210 is used to receive the preset test file transmitted in blocks by the sending end 500 when the electronic device 100 conducts a routine test.
[0073] Please refer to Figure 3 , the processor 330 is used to execute step 0131. That is, the processor 330 is used to receive the preset test file transmitted in blocks by the sending end 500 when the electronic device 100 conducts a routine test.
[0074] Among them, the routine aging test items corresponding to the routine test can be the test items in area A as shown in Figure 6 . Since the routine aging test file is small and does not occupy too much memory in the local storage space of the electronic device 100, the routine aging test file can be directly built - in to the local storage space of the electronic device 100.
[0075] Specifically, as shown in Figure 6 , when the electronic device 100 conducts a routine test according to the routine aging test items selected in area A, the background of the electronic device 100 can simultaneously receive the preset test file transmitted in blocks by the sending end 500, so that the routine test and the download thread for obtaining the preset test file can run in coordination, improving the test speed of the electronic device 100.
[0076] Please refer to Figure 9 , in some embodiments, step 01 further includes:
[0077] 014: Adjust the bandwidth of the sending end 500 according to the preset priority.
[0078] Please refer to Figure 2, in some embodiments, step 014 may be implemented by the acquisition module 210. That is, the acquisition module 210 is used to adjust the bandwidth of the transmitter 500 according to a preset priority.
[0079] Please refer to Figure 3 , in some embodiments, the processor 330 is used to execute step 014. That is, the processor 330 is used to adjust the bandwidth of the transmitter 500 according to a preset priority.
[0080] Specifically, the preset priority may refer to preferentially obtaining a preset test file when the electronic device 100 simultaneously obtains a preset test file and other test files from the file server 400. When the electronic device 100 needs to simultaneously obtain a preset test file and other files, the bandwidth of the transmitter 500 can be dynamically adjusted according to the preset priority to preferentially transmit the preset test file and ensure the resource occupancy rate of the aging test process.
[0081] Please refer to Figure 10 and Figure 11 , in some embodiments, the transmitter 500 includes a main end 510 and at least one sub-end 530. Before step 01, the test method includes:
[0082] 04: Configure a preset test file and the transmitter;
[0083] 05: Establish a communication connection between the main end and the sub-end.
[0084] Please refer to Figure 2 , in some embodiments, steps 04 and 05 may be implemented by the acquisition module 210. That is, the acquisition module 210 is used to configure a preset test file and the transmitter 500; establish a communication connection between the main end 510 and the sub-end 530.
[0085] Please refer to Figure 3 , in some embodiments, the processor 330 is used to execute steps 04 and 05. That is, the processor 330 is used to configure a preset test file and the transmitter 500; establish a communication connection between the main end 510 and the sub-end 530.
[0086] Among them, the sub - end 530 can refer to a wireless hotspot or a branch router. That is, the main - end 510 can be connected to one or more wireless hotspots or branch routers simultaneously. The number of wireless hotspots or branch routers can be, for example, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, or 12, without limitation here. It should be noted that under one wireless hotspot or branch router, it can also be connected to one or more wireless hotspots or branch routers, and so on to form a multi - level network, enabling the file server 400 to transmit preset test files to dozens, hundreds, or thousands of electronic devices 100 through the sending - end 500 simultaneously, improving the stability of parallel transmission of preset test files.
[0087] Specifically, before the electronic device 100 obtains the preset test file, to prevent the antivirus software of the electronic device 100 from mistakenly intercepting the preset test file as a file with security risks, the preset test file can be added to the trust zone (whitelist) of the antivirus software to prevent misinterception, and configure the Internet Protocol address of the file server 400 (such as 192.168.8.40), and prepare the data (such as audio and video, etc.) in the preset test file according to the aging test requirements of the electronic device 100. It should be noted that the Internet Protocol address of the file server 400 can be fixed, so that there will be no situation of Internet Protocol address conflict when the file server 400 is connected to the main - end 510.
[0088] Then, set the gateway and subnet mask of the main - end 510, and the name and password of the sub - end 530, and establish a communication connection between the main - end 510 and the sub - end 530 through a wired connection or a wireless connection. For example, the gateway of the main - end 510 can be set to 192.168.8.1, the subnet mask can be set to 255.255.255.0, and the name of the sub - end 530 can be Figure 10 shown as AutoDownload 1, AutoDownload 2, AutoDownload 3, AutoDownload 4, AutoDownload 5, AutoDownload 6, or AutoDownload 7, and the password of the sub - end 530 can be uniformly set to Inone1234.
[0089] It should be noted that the sub - end name and password can be built - in when the software of the electronic device 100 leaves the factory, or can be customized by the user according to the actual situation. There is no limitation here.
[0090] Please refer to Figure 12 , in some embodiments, the test method includes:
[0091] 06: When establishing communication connections between multiple electronic devices and the sub - end, allocate an address segment to each electronic device according to a preset Internet Protocol (IP) address range, and the address segments correspond one - to - one with the electronic devices.
[0092] Please refer to Figure 2 , in some embodiments, step 06 can be implemented by the acquisition module 210. That is, the acquisition module 210 is used to allocate an address segment to each electronic device 100 according to a preset Internet Protocol address range when establishing communication connections between multiple electronic devices 100 and the sub - end 530, and the address segments correspond one - to - one with the electronic devices 100.
[0093] Please refer to Figure 3 , in some embodiments, the processor 330 is used to execute step 06. That is, the processor 330 is used to allocate an address segment to each electronic device 100 according to a preset Internet Protocol address range when establishing communication connections between multiple electronic devices 100 and the sub - end 530, and the address segments correspond one - to - one with the electronic devices 100.
[0094] Among them, in order to prevent Internet Protocol address conflicts or insufficient Internet Protocol addresses at the sending end 500, a preset Internet Protocol address range can be set for the gateways of the main end 510 and the sub - end 530 respectively. When the main end 510 and the sub - end 530 start the Dynamic Host Configuration Protocol (DHCP) service, the address segments of the Internet Protocol addresses can be automatically allocated to prevent Internet Protocol address conflicts or insufficient Internet Protocol addresses at the sending end 500. The preset Internet Protocol address range can be, for example, 192.168.1.1~192.168.254.1, and there is no limitation here.
[0095] Specifically, as Figure 10 shown, when multiple electronic devices 100 need to obtain a preset test file simultaneously and establish communication connections with the sending end 500, an address segment is automatically allocated to each electronic device 100 according to the preset Internet Protocol address range of 192.168.1.1~192.168.254.1 (for example, 192.168.1.2 - 192.168.1.254 / ... / 192.168.254.2 - 192.168.254.254, and the subnet mask is default: 255.255.255.0), improving the stability of the communication connections between multiple electronic devices 100 and the sub - end 530, ensuring Internet Protocol address conflicts between electronic devices 100 when the electronic devices 100 are connected to the sub - end 530, and facilitating subsequent multiple electronic devices 100 to obtain the preset test file transmitted by the file server 400 simultaneously. It should be noted that Figure 10The connection between the main end 510 and the 7 sub - ends 530 shown is only for illustration. In actual applications, the main end 510 can be connected to at most 255 sub - ends 530. Connecting each sub - end 530 to one electronic device 100 is only for illustration. In actual applications, each sub - end 530 can be connected to at most 255 electronic devices 100.
[0096] Please refer to Figure 13 , in some embodiments, after establishing a communication connection between multiple electronic devices 100 and the sub - end 530, the testing method includes:
[0097] 07: Simultaneously transmit a preset test file to multiple electronic devices.
[0098] Please refer to Figure 2 , in some embodiments, step 07 can be implemented by the acquisition module 210. That is, the acquisition module 210 is used to simultaneously transmit a preset test file to multiple electronic devices 100.
[0099] Please refer to Figure 3 , in some embodiments, the processor 330 is used to execute step 07. That is, the processor 330 is used to simultaneously transmit a preset test file to multiple electronic devices 100.
[0100] Specifically, after multiple electronic devices 100 have all established a communication connection with the sub - end 530, the file server 400 can simultaneously transmit a preset test file to multiple electronic devices 100 through the sending end 500, improving the efficiency of transmitting the preset test file to the electronic devices 100 and reducing the manual operation cost and time.
[0101] Please refer to Figure 14 , in some embodiments, after testing the electronic device 100 according to the preset test file, the testing method includes:
[0102] 08: Verify the electronic device according to the preset test file using a preset method.
[0103] Please refer to Figure 2 , in some embodiments, step 08 can be implemented by the storage module 230. That is, the storage module 230 is used to verify the electronic device 100 according to the preset test file using a preset method.
[0104] Please refer to Figure 3 , in some embodiments, the processor 330 is used to execute step 08. That is, the processor 330 is used to verify the electronic device 100 according to the preset test file using a preset method.
[0105] Among them, the preset method may include Message Digest Algorithm MD5, block comparison logic algorithm, etc., which are not limited here.
[0106] Specifically, after the electronic device 100 performs an aging test, the data in the preset test file can be verified according to the preset method to determine whether the data in the preset test file is complete, avoiding the occurrence of missed tests during the aging test of the electronic device 100.
[0107] In addition, when the conventional test and the download thread for obtaining the preset test file are carried out in parallel, the data in the transmitted preset test file can also be verified according to the preset method to prevent the situation where the data of the preset test file is incomplete due to network anomalies, facilitating the subsequent aging test of the electronic device 100 through the preset test file.
[0108] Please refer to Figure 2 , this application provides a test device 200. The specific test device 200 is as described above. For the sake of brevity of the article, it will not be elaborated here.
[0109] In this way, after the test device 200 of this application obtains the preset test file, it stores the preset test file in the memory buffer of the electronic device 100, and tests the electronic device 100 according to the preset test file. After the test is completed, the tested preset test file is directly released from the memory buffer, so that the preset test file will not be stored in the local storage space of the electronic device 100 all the time, the system file of the electronic device 100 does not increase, and when storing the preset test file in the electronic device 100, there is no need to manually copy the preset test file to the electronic device 100 one by one, which can greatly shorten the test preparation time of the electronic device 100 and improve the production and manufacturing speed.
[0110] Please refer to Figure 3 , this application also provides a computer device 300. The specific computer device 300 is as described above. For the sake of brevity of the article, it will not be elaborated here.
[0111] In this way, after the computer device 300 of this application obtains the preset test file, it stores the preset test file in the memory buffer of the electronic device 100, and tests the electronic device 100 according to the preset test file. After the test is completed, the tested preset test file is directly released from the memory buffer, so that the preset test file will not be stored in the local storage space of the electronic device 100 all the time, the system file of the electronic device 100 does not increase, and when storing the preset test file in the electronic device 100, there is no need to manually copy the preset test file to the electronic device 100 one by one, which can greatly shorten the test preparation time of the electronic device 100 and improve the production and manufacturing speed.
[0112] Any process or method description represented in the flowchart or described otherwise herein can be understood to represent a module, segment, or portion of code including one or more executable instructions for implementing a specific logical function or process. The scope of the embodiments of the present application includes additional implementations, where functions may be executed in a substantially simultaneous manner or in an order opposite to that shown or discussed, according to the functions involved, which should be understood by those skilled in the art to which the embodiments of the present application pertain.
[0113] The logic and / or steps represented in the flowchart or described otherwise herein. For example, it can be considered a sequenced list of executable instructions for implementing a logical function, which can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processing module, or other systems that can obtain and execute instructions from the instruction execution system, apparatus, or device), or used in conjunction with these instruction execution systems, apparatuses, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion having one or more wirings (electronic device), a portable computer diskette (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which the program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpretation, or other suitable processing as necessary, and then stored in a computer memory.
[0114] The processor can be a central processing unit (CPU), or can also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.
[0115] It should be understood that each part of the embodiments of the present application can be implemented by hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits having logic gate circuits for implementing logical functions on data signals, application specific integrated circuits having appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.
[0116] Those of ordinary skill in the art can understand that all or part of the steps carried by the method of implementing the above embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments.
[0117] In addition, in each of the embodiments of the present application, the functional units can be integrated into a processing module, or each unit can exist physically alone, or two or more units can be integrated into one module. The above integrated module can be implemented in the form of hardware or in the form of a software functional module. When the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.
[0118] The above-mentioned storage medium can be a read-only memory, a magnetic disk, an optical disc, etc.
[0119] In the description of this specification, the description with reference to terms such as "one embodiment", "certain embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.
[0120] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the claims and their equivalents.
Claims
1. A testing method for an electronic device, characterized in that, The described test method includes: Obtain a preset test file; Store the preset test file in the memory buffer of the electronic device, and test the electronic device according to the preset test file; Release the preset test file after testing from the memory buffer.
2. The test method according to claim 1, wherein The obtaining of the preset test file includes: Establish a communication connection between the electronic device and the sending end according to a preset instruction, and receive the preset test file transmitted in blocks by the sending end.
3. The test method according to claim 2, wherein The obtaining of the preset test file includes: Confirm whether the communication connection established between the electronic device and the sending end is abnormal. When the communication connection between the electronic device and the sending end is abnormal, re - establish the communication connection between the electronic device and the sending end; Receive the data that has not been transmitted in the preset test file transmitted by the sending end.
4. The test method according to claim 2, wherein The receiving of the preset test file transmitted in blocks by the sending end includes: When the electronic device is performing a regular test, receive the preset test file transmitted in blocks by the sending end.
5. The test method according to claim 2, wherein The obtaining of the preset test file includes: Adjust the bandwidth of the sending end according to a preset priority.
6. The testing method according to claim 2, wherein The sending end includes a main end and at least one sub - end. Before obtaining the preset test file, the test method includes: Configure the preset test file and the sending end; Establish a communication connection between the main end and the sub - end.
7. The testing method according to claim 6, wherein The test method includes: When multiple electronic devices establish communication connections with the sub - end, allocate an address segment to each electronic device according to a preset Internet protocol address range, and the address segment corresponds to the electronic device one by one.
8. The test method according to claim 6, characterized in that After multiple electronic devices establish communication connections with the sub - end, the test method includes: Transmit the preset test file to multiple electronic devices simultaneously.
9. The test method according to claim 1, wherein After testing the electronic device according to the preset test file, the test method includes: Verify the electronic device using a preset method according to the preset test file.
10. A testing device, characterized in that, The test device includes: An obtaining module, which is used to obtain a preset test file; A storage module, which is used to store the preset test file in the memory buffer of the electronic device and test the electronic device according to the preset test file; A release module, which is used to release the preset test file after testing from the memory buffer.