Device simulation parameter matching degree detection method and device, electronic equipment and medium

Abstract

This invention provides a method, apparatus, electronic device, and medium for detecting the matching degree of device simulation parameters. The detection method includes: extracting device parameter definition information for all devices in each model file of at least one target simulation software; generating circuit schematics for all devices in the parameterized cell library based on the library file of the parameterized cell library; generating a pre-simulation netlist corresponding to the target simulation software based on the circuit schematics; extracting device simulation parameter information for all devices in the parameterized cell library from the pre-simulation netlist; and for each target simulation software, obtaining the detection result of the parameterized cell library corresponding to that target simulation software based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized cell library. This invention not only significantly improves detection efficiency but also improves the accuracy of device simulation parameters in the parameterized cell library, thereby improving the timeliness of circuit design.

Description

Technical Field

[0001] This invention relates to the field of semiconductor technology, and in particular to a method, apparatus, electronic device, and readable storage medium for detecting the matching degree of device simulation parameters. Background Technology

[0002] A Process Design Kit (PDK) serves as a bridge between semiconductor manufacturing and design, forming the foundation for circuit and layout design. Designers perform a pre-simulation process during circuit design. If the pre-simulation results meet the circuit design specifications, layout design proceeds; otherwise, the circuit design is modified until the pre-simulation results satisfy the specifications. The pre-simulation results are generated by combining simulation parameters from the pre-simulation netlist in the parametric cell library with a SPICE (Simulation Program with Integrated Circuit Emphasis) model. Currently, the mainstream circuit simulation software includes Hspice and Spectre, and foundries typically provide Hspice and Spectre model files. If the pre-simulation parameters in the parametric cell library are fewer than those required by the device in the SPICE model file, the simulation will use the default parameter settings from the SPICE model file, leading to inaccurate pre-simulation results and impacting circuit design efficiency. On the other hand, as integrated circuit process dimensions continue to shrink, the number of effects affecting circuit performance is increasing, such as the LOD effect (Length of Diffusion, also known as STI stress effect) and the WPE effect (well proximity effect). Each effect introduces 3-4 simulation parameters. Each device requires calculation of more than a dozen parameters, and advanced processes require 20-30 parameters per device. Furthermore, a parameterized cell library typically contains hundreds of device types, with BCD (Bipolar-CMOS-DMOS, a single-chip integrated process technology encompassing Bipolar, CMOS, and DMOS) technology containing 200-300 types. Generally, PDKs provide at least two mainstream tool models, such as Hspice and Spectre. Therefore, a parameterized cell library may contain approximately 3000-6000 device parameters that need to be checked.

[0003] In existing technologies, manual visual inspection is often used to check the matching of device simulation parameters in a parametric cell library. This involves first using the parametric cell library and generating a pre-simulation netlist of the device using simulation tools. Then, the corresponding device is located in the SPICE model file, and the simulation parameters in the pre-simulation netlist are manually checked to ensure they match the device parameter definitions in the SPICE model file. However, for a massive dataset of thousands of device parameters, traditional manual visual inspection is not only costly in terms of manpower and time, and inefficient, but also prone to omissions or misidentifications, affecting the accuracy of the pre-simulation results and consequently impacting the timeliness of circuit design.

[0004] It should be noted that the information disclosed in the background section of this invention is intended only to enhance the understanding of the general background of this invention, and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention

[0005] The purpose of this invention is to address one or more of the problems in the existing technology of using manual visual inspection to detect the matching degree of device simulation parameters, such as easy omissions or false detections and poor timeliness. This invention provides a method, device, electronic device, and readable storage medium for detecting the matching degree of device simulation parameters. This invention can not only significantly improve the detection efficiency, but also improve the accuracy of device simulation parameters in the parameterized unit library, thereby improving the timeliness of circuit design.

[0006] To achieve the above objectives, the present invention provides a method for detecting the matching degree of device simulation parameters in a parameterized cell library, used to detect the simulation parameters of devices in the parameterized cell library, the detection method comprising:

[0007] The system receives model files from at least one target simulation software and extracts device parameter definition information for all devices in each model file; generates circuit schematics for all devices in the parameterized unit library based on the library file of the parameterized unit library; generates a pre-simulation netlist corresponding to the target simulation software based on the circuit schematics; extracts device simulation parameter information for all devices in the parameterized unit library from the pre-simulation netlist; and for each target simulation software, obtains the detection result of the parameterized unit library corresponding to the target simulation software based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library.

[0008] Optionally, for each target simulation software, after obtaining the detection result of the parameterized unit library corresponding to the target simulation software, the detection method further includes: determining whether there are any devices in the detection result whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software; if so, modifying the device simulation parameters of all inconsistent devices in the parameterized unit library, and returning to execute the relevant steps from generating the pre-simulation netlist to determining whether there are any devices whose device parameter simulation information is inconsistent with the device parameter definition information, until the device parameter simulation information in the parameterized unit library is consistent with the device parameter definition information of the target simulation software, thus completing the device simulation parameter matching degree detection.

[0009] Optionally, the device parameter definition information includes the device name, device parameters, the name of the target simulation software, and the line number of the device in the model file of the target simulation software; the device simulation parameter information includes the device name and device parameters of the device in the parameterized unit library; for each target simulation software: after extracting the device parameter definition information of all devices in the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; after extracting the device simulation parameter information of all devices in the parameterized unit library, the detection method further includes: storing the device simulation parameter information in a second storage area.

[0010] Optionally, for each target simulation software, a detection result is obtained based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, including: for each target simulation software, detecting whether the device name, device type, and device parameters of the device simulation parameter information in the second storage area are consistent with those of the device parameter definition information in the first storage area, so as to obtain the detection result of the parameterized unit library corresponding to the target simulation software.

[0011] Optionally, the detection results include: the device name, the line number of the device in the corresponding model file of the target simulation software, and the parameter comparison results; the parameter comparison results include those that passed the detection and those that failed the detection, as well as the parameter set of all devices that failed the detection.

[0012] Optionally, the detection method further includes: outputting the detection results according to the categories of passing and failing detection.

[0013] Optionally, the target simulation software includes Hspice and Spectre.

[0014] To achieve the above objectives, the present invention also provides a device simulation parameter matching degree detection device for detecting the simulation parameters of devices in a parameterized unit library. The detection device includes: an interaction module for acquiring the library file of the parameterized unit library, the model file of at least one target simulation software, and the detection result storage path; and an execution module for implementing the device simulation parameter matching degree detection method described above according to the library file and the model file, and storing the detection result in the detection result storage path.

[0015] To achieve the above objectives, the present invention also provides an electronic device, which includes a processor and a memory, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, it implements the device simulation parameter matching degree detection method described in any of the above claims.

[0016] To achieve the above objectives, the present invention also provides a readable storage medium storing a computer program, which, when executed by a processor, implements the device simulation parameter matching degree detection method described in any of the above claims.

[0017] Compared with existing technologies, the device, electronic device, and readable storage medium provided by this invention for detecting the matching degree of device simulation parameters have the following advantages: The device simulation parameter matching degree detection method provided by this invention first extracts the device parameter definition information of all devices in each model file of at least one target simulation software. This not only realizes the automatic extraction of parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized unit library match the corresponding target simulation software. Then, based on the library file of the parameterized unit library, it generates the circuit schematic diagram of all devices in the parameterized unit library. The invention generates a pre-simulation netlist corresponding to the target simulation software based on the circuit schematic, and extracts the device simulation parameter information of all devices in the parameterized unit library from the pre-simulation netlist. This achieves automatic extraction of parameter information for all devices in the parameterized unit library, laying a solid foundation for improving the detection efficiency of device parameter matching in the parameterized unit library. Finally, for each target simulation software, the detection result of the parameterized unit library corresponding to the target simulation software is obtained based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, thereby achieving automatic detection of device simulation parameter matching. Therefore, this invention not only significantly improves detection efficiency but also enhances the accuracy of device simulation parameters in the parameterized unit library, thereby improving the timeliness of circuit design.

[0018] Since the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by this invention belong to the same inventive concept as the device simulation parameter matching degree detection method provided by this invention, the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by this invention have at least all the advantages of the device simulation parameter matching degree detection method provided by this invention. For details on the beneficial effects of the device simulation parameter matching degree detection device, electronic device, and readable storage medium provided by this invention, please refer to the above description of the beneficial effects of the device simulation parameter matching degree detection method provided by this invention, which will not be repeated here. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall process of the device simulation parameter matching degree detection method provided in the first embodiment of the present invention.

[0020] Figure 2 It is given schematically. Figure 1 An example diagram of a portion of the device parameter definition information obtained in step S1 in the first storage area.

[0021] Figure 3 It is given schematically. Figure 1 An example diagram of a portion of the circuit schematic obtained in step S2.

[0022] Figure 4 It is given schematically. Figure 1 An example diagram of a portion of the pre-simulation netlist obtained in step S3.

[0023] Figure 5 It is given schematically. Figure 1 An example diagram of a portion of the device simulation parameter information obtained in step S4 in the second storage area.

[0024] Figure 6 It is given schematically. Figure 1 An example image of a portion of the detection results obtained in step S5.

[0025] Figure 7 The structural block diagram of the device simulation parameter matching degree detection device provided in the second embodiment of the present invention is shown.

[0026] Figure 8 This is a schematic diagram of the operation interface of the interactive module of a specific example of the device simulation parameter matching degree detection device provided by the present invention.

[0027] Figure 9 This is a block diagram of the electronic device provided in the third embodiment of the present invention.

[0028] The reference numerals in the attached drawings are as follows: Interaction module-110, Execution module-120; Processor-210, Memory-220, Communication interface-230, Communication bus-240. Detailed Implementation

[0029] The following detailed description, in conjunction with the accompanying drawings, further illustrates the device simulation parameter matching degree detection method, apparatus, electronic device, and readable storage medium proposed in this invention. The advantages and features of this invention will become clearer from the following description. It should be noted that the drawings are in a very simplified form and use non-precise proportions, used only to facilitate and clearly illustrate the purpose of the embodiments of this invention. Please refer to the drawings to make the objectives, features, and advantages of this invention more apparent and understandable. It should be understood that the structures, proportions, sizes, etc., depicted in the accompanying drawings are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed in the specification, and are not intended to limit the implementation conditions of this invention. Any modifications to the structure, changes in proportions, or adjustments to the size, provided that the effects and objectives achieved by this invention are the same or similar, should still fall within the scope of the technical content disclosed in this invention. Specific design features of the invention disclosed herein, including, for example, specific dimensions, orientations, positions, and shapes, will be determined in part by the specific application and usage environment. Furthermore, in the embodiments described below, the same reference numerals are sometimes used across different drawings to denote the same parts or parts having the same function, omitting repeated descriptions. In this specification, similar reference numerals and letters are used to denote similar items; therefore, once an item is defined in one figure, it need not be discussed further in subsequent figures. Furthermore, if the methods described herein involve a series of steps, and the order of these steps presented herein is not necessarily the only possible order in which they can be performed, some of the described steps may be omitted and / or other steps not described herein may be added to the method.

[0030] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. The singular forms “a,” “an,” and “the” include plural objects. The term “or” is generally used to mean “and / or,” the term “several” is generally used to mean “at least one,” and the term “at least two” is generally used to mean “two or more.” Furthermore, the terms “first,” “second,” and “third” are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated.

[0031] The core idea of ​​this invention is to provide a method, device, electronic device and readable storage medium for detecting the matching degree of device simulation parameters. This invention can not only significantly improve the detection efficiency, but also improve the accuracy of device simulation parameters in the parameterized unit library, thereby improving the timeliness of circuit design.

[0032] To achieve the above-mentioned goals, a first embodiment of the present invention provides a method for detecting the matching degree of device simulation parameters, used to detect the simulation parameters of devices in a parameterized cell library. For details, please refer to... Figure 1 , Figure 1 This is a schematic diagram of the overall process of the device simulation parameter matching degree detection method provided in this embodiment. From Figure 1As can be seen, the device simulation parameter matching degree detection method provided in this embodiment includes the following steps: Step S1: Receive model files of at least one target simulation software and extract device parameter definition information of all devices in each model file; Step S2: Generate circuit schematics of all devices in the parameterized unit library according to the library file of the parameterized unit library; Step S3: Generate a pre-simulation netlist corresponding to the target simulation software according to the circuit schematics; Step S4: Extract device simulation parameter information of all devices in the parameterized unit library from the pre-simulation netlist; Step S5: For each target simulation software, obtain the detection result of the parameterized unit library corresponding to the target simulation software according to the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library.

[0033] The device simulation parameter matching degree detection method provided by this invention first extracts the device parameter definition information of all devices in each model file of at least one target simulation software. This not only realizes the automatic extraction of parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized unit library match the corresponding target simulation software. Next, based on the library file of the parameterized unit library, a circuit schematic diagram of all devices in the parameterized unit library is generated, and a pre-simulation netlist corresponding to the target simulation software is generated based on the circuit schematic diagram. Then, the device simulation parameter information of all devices in the parameterized unit library is extracted from the pre-simulation netlist, realizing the automatic extraction of parameter information of all devices in the parameterized unit library. This lays a good foundation for improving the detection efficiency of device parameter matching degree detection in the parameterized unit library. Finally, for each target simulation software, based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, the detection result of the parameterized unit library corresponding to the target simulation software is obtained, thereby realizing the automatic detection of device simulation parameter matching degree. Therefore, this invention can not only significantly improve detection efficiency, but also improve the accuracy of device simulation parameters in the parameterized unit library, thereby improving the timeliness of circuit design.

[0034] It should be noted that those skilled in the art should understand that the present invention does not limit the specific number or type of the target simulation software. For example, the target simulation software may be one, two, or more. Exemplarily, in some preferred embodiments, the target simulation software includes, but is not limited to, Hspice and Spectre. Hspice is a classic analog circuit simulation tool that focuses on describing circuit models through a circuit netlist; Spectre is also an analog integrated circuit design and simulation tool, widely used in the design and verification of CMOS (Metal-Oxide Semiconductor Transistor) analog circuits and mixed-signal circuits, and has a good graphical design interface.

[0035] It is clear that when there is only one target simulation software (e.g., Hspice), there is one set of device parameter definition information (corresponding to Hspice); when there are two target simulation software programs (e.g., Hspice and Spectre), there are two sets of device parameter definition information (e.g., one set corresponds to Hspice, and the other to Spectre). Correspondingly, step S1, extracting the device parameter definition information of all devices in each model file, includes extracting the device parameters of all devices in the target simulation software Hspice and the device parameters of all devices in the target simulation software Spectre. For ease of understanding, this paper uses Hspice and Spectre as examples for illustration.

[0036] Furthermore, the present invention does not impose too many restrictions on the order of steps S1 and S2. For example, in some exemplary embodiments, step S1 can be executed first and then step S2; in other exemplary embodiments, step S2 can be executed first and then step S1; in other embodiments, steps S1 and S2 can be executed in parallel.

[0037] Preferably, please continue to see Figure 1 ,like Figure 1As shown, in some exemplary embodiments, after obtaining the detection result of the parameterized unit library corresponding to the target simulation software in step S5 for each target simulation software, the detection method further includes: Step S6: Determining whether there are any devices in the detection result whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software; if yes, then proceed to step S7; if no, then proceed to step S8. Step S7: Modifying the device simulation parameters of all inconsistent devices in the parameterized unit library, and returning to execute the relevant steps from the pre-generation simulation netlist until determining whether there are any devices whose device parameter simulation information is inconsistent with the device parameter definition information (i.e., steps S3 to S6), until the device parameter simulation information in the parameterized unit library is consistent with the device parameter definition information of the target simulation software. Step S8: Completing the device simulation parameter matching degree detection.

[0038] Therefore, the device simulation parameter matching degree detection method provided by the present invention can further improve the accuracy of device simulation parameters in the parameterized unit library by modifying the device simulation parameters of all inconsistent devices in the parameterized unit library and iteratively executing the device simulation parameters of all inconsistent devices in the parameterized unit library, thereby improving the timeliness of circuit design. Exemplarily, in some exemplary embodiments, the device parameter definition information includes the device name, device parameters, name of the target simulation software, and line number of the device in the model file of the target simulation software; the device simulation parameter information includes the device name and device parameters of the device in the parameterized unit library. Further, for each target simulation software: after extracting the device parameter definition information of all devices in the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; after extracting the device simulation parameter information of all devices in the parameterized unit library, the detection method further includes: storing the device simulation parameter information in a second storage area.

[0039] Therefore, the device simulation parameter matching degree detection method provided by the present invention adopts a design method in which the device parameter definition information includes the device name, device parameters, name of the target simulation software, and line number of the device in the model file of the target simulation software, and the device simulation parameter information includes the device name and device parameters of the device in the parameterized unit library. This not only makes it easier to obtain the detection result based on the device parameter definition information and the device simulation parameter information, but also facilitates the revision of the device simulation parameters of the inconsistent device in the parameterized unit library when there is an inconsistency between the device parameter simulation information and the device parameter definition information.

[0040] It should be noted that the present invention does not limit the first storage area and the second storage area. For example, the first storage area may be a first register and the second storage area may be a second register.

[0041] To facilitate a more intuitive understanding of the outputs of steps S1 to S4 in the device simulation parameter matching degree detection method provided by this invention, please refer to the example provided. Figure 2 , Figure 3 , Figure 4 and Figure 5 ,in, Figure 2 It is given schematically. Figure 1 Example diagram of a portion of the device parameter definition information obtained in step S1 in the first storage area; Figure 3 It is given schematically. Figure 1 An example diagram of a portion of the circuit schematic obtained in step S2; Figure 4 It is given schematically. Figure 1 An example diagram of a portion of the pre-simulation netlist obtained in step S3. Figure 5 It is given schematically. Figure 1 An example diagram of a portion of the device simulation parameter information obtained in step S4 within the second storage area. Specifically, Figure 2In the diagram, “m_n18_4t_rvt” is the device name, “wl sa sb sca scb scc sd as ad pspd nrd nrs nf mr mismod” and “wl sa sb sd as ad ps pd nrd nrs sca scb scc nfmr mismod” are the device parameters of device m_n18_4t_rvt corresponding to the target simulation software Hspice and Spectre, respectively, “hspice_view” and “spectre_view” are the names of the target simulation software Hspice and Spectre, respectively, “line_1256” is the line number of device m_n18_4t_rvt in the model file of the target simulation software Hspice, and “line_2890” is the line number of device m_n18_4t_rvt in the model file of the target simulation software Spectre. Figure 5 In the table, “m_n18_4t_rvt” is the device name, “wl sa sb sd as ad ps pd nrd nrs nf mr mismod hspice_view” and “w lsa sb sd as ad ps pd nrd nrs sca scb scc nf mr mismod” are the device parameters of the target simulation software Hspice and Spectre respectively, and “hspice_view” and “spectre_view” are the names of the target simulation software Hspice and Spectre respectively.

[0042] Preferably, in some exemplary embodiments, step S5, for each target simulation software, obtains a detection result based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library corresponding to the target simulation software, including: for each target simulation software, comparing whether the device name, device type, and device parameters of the device simulation parameter information in the second storage area are consistent with those of the device parameter definition information in the first storage area, so as to obtain the detection result of the parameterized unit library corresponding to the target simulation software.

[0043] Therefore, the device simulation parameter matching degree detection method provided by the present invention has clear logic, is easy to implement, and does not require any additional hardware costs.

[0044] Preferably, in some exemplary embodiments, the detection result includes: the device name of the device, the line number of the device in the corresponding model file of the target simulation software, and the parameter comparison result; the parameter comparison result includes those that pass the detection and those that fail the detection, as well as the parameter set of all devices that fail the detection.

[0045] Therefore, the detection results include the device name, the line number of the device in the corresponding model file of the target simulation software, and the parameter comparison results. The parameter comparison results include the parameter set of all devices that failed the detection, which makes it easier for users to quickly locate devices with inconsistent parameters in the parameterized unit library and lays a good foundation for modifying the device simulation parameters of all inconsistent devices in the parameterized unit library.

[0046] Preferably, in some exemplary embodiments, the detection method further includes outputting the detection results according to whether the detection passed or failed. This makes it easier for users to locate devices that failed the detection, thereby further improving detection efficiency.

[0047] To facilitate a more intuitive understanding of the detection results provided in step S5 by the device simulation parameter matching degree detection method of this invention, please refer to the example provided. Figure 6 , Figure 6 It is given schematically. Figure 1 An example image of a portion of the detection results obtained in step S5. Figure 6 In the file, hspice_results.cvs contains the detection results (report file) for the target simulation software Hspice, and spectre_results.cvs contains the detection results (report file) for the target simulation software Spectre. An example of the detection results for the target simulation software Hspice is shown below. Figure 6 As shown, all devices that passed the test are displayed in the "pass" area, and all devices that failed the test are displayed in the "fail" area. The devices that failed the test (…) Figure 6 Taking m_n50_4t_rvt (marked with a dashed box) as an example, the first column "m_n50_4t_rvt" is the device name, the second column "183" is the line number of device m_n50_4t_rvt in the model file of the target simulation software Hspice, to facilitate subsequent comparison and correction; the third column "fail" (failed the test) is the parameter comparison result, and the fourth column "sca,scb, scc" are the parameters that do not match.

[0048] It should be noted that, although Figure 6The detection results are provided in .cvs file format, with one detection result corresponding to each target simulation software. However, this is clearly not a limitation of the present invention. In other embodiments, other file formats can be used to provide the detection results, such as .txt format. Furthermore, the detection results of all target simulation software can be centralized in a single detection report file.

[0049] A second embodiment of the present invention provides a device for detecting the matching degree of device simulation parameters, used to detect the simulation parameters of devices in a parameterized cell library. For an example, please refer to... Figure 7 , Figure 7 This is a structural block diagram of the device simulation parameter matching degree detection device provided in this embodiment. From... Figure 7 As can be seen, the device simulation parameter matching degree detection device provided in this embodiment includes an interaction module 110 and an execution module 120. Exemplarily, the interaction module 110 is used to obtain the library file of the parameterized unit library, the model file of at least one target simulation software, and the detection result storage path; the execution module 120 is used to implement the device simulation parameter matching degree detection method described in any of the embodiments of the first embodiment based on the library file and the model file, and store the detection result in the detection result storage path. Therefore, the device simulation parameter matching degree detection device provided by this invention includes the interaction module 110, which is convenient for users. Furthermore, since the device simulation parameter matching degree detection device provided in this embodiment and the device simulation parameter matching degree detection method provided by this invention belong to the same inventive concept, the device simulation parameter matching degree detection device provided in this embodiment has at least all the advantages of the device simulation parameter matching degree detection method provided by this invention. For details, please refer to the above description of the beneficial effects of the device simulation parameter matching degree detection method; further details will not be repeated here.

[0050] For example, please see Figure 8 , Figure 8 This is a schematic diagram of the operation interface of the interactive module of a specific example of the device simulation parameter matching degree detection device provided by the present invention. Figure 8In the diagram, the "PDK Instancecheck Tool" at the top schematically indicates the name of the device simulation parameter matching detection device provided by this invention, which can be set as needed; the "PDK_library" (library file of the parameterized cell library) at the top left and the "select" (selection) at the top right are used to prompt and set the library file of the parameterized cell library, and the area between "PDK_library" and "select" is used to display the path of the library file of the parameterized cell library selected by the user; the "Hspice_File" (model file of the Hspice simulation software) at the top center left and the "select" (selection) at the top center right are used to prompt and set the model file of the target simulation software Hspice, and the area between "Hspice_File" and "select" is used to display the path of the model file of the target simulation software Hspice selected by the user. The left-hand side of the diagram, slightly below the center, displays "Spectre_File" (the model file for the Spectre simulation software), and the right-hand side, slightly below the center, displays "select" (selection). These prompts and settings indicate the path to the target Spectre simulation software model file. The area between "Spectre_File" and "select" displays the path to the user-provided Spectre model file. The left-hand side of the diagram, slightly below the center, displays "Run_Directory" (the directory for test results), and the right-hand side, slightly below the center, displays "select" (selection). These prompts and settings indicate the path to the storage of the test results. The area between "Run_Directory" and "select" displays the user-defined path to the storage of the test results. The bottommost "Run" (execute test) indicates that the execution module 120 has been started to begin the device simulation parameter matching test.

[0051] To further understand the present invention, in conjunction with Figure 8 The method of using the device simulation parameter matching degree detection device provided by the present invention is briefly described as follows:

[0052] First, such as Figure 8As shown, the parameterized unit library file is specified through the "select" option corresponding to "PDK_library", the model file of the target simulation software Hspice is specified through the "select" option corresponding to "Hspice_File", the storage path of the detection results is specified through the "select" option corresponding to "Run_Directory", and then the detection results are obtained through "Run". Finally, the detection results (detection report) are viewed in the storage path specified by "Run_Directory". For details of the detection results, please refer to the section above about... Figure 6 The explanation. Furthermore, if found... Figure 6 If there are devices that fail the test, the above operation can be continued after modifying the device simulation parameters of all inconsistent devices in the parameterized unit library until there are no devices that fail the test in the test results (that is, the device parameter simulation information of all devices in the parameterized unit library is consistent with the device parameter definition information of the corresponding target simulation software).

[0053] In summary, the device simulation parameter matching degree detection method provided by this invention can not only significantly improve the accuracy of device simulation parameters in the parameterized unit library, but also, according to relevant statistical data, save 99% of the time compared with manual visual inspection, significantly improve detection efficiency, and greatly save manpower and material costs.

[0054] A third embodiment of the present invention provides an electronic device, for example, please refer to [link to relevant documentation]. Figure 9 , Figure 9 This is a block diagram of the electronic device provided in this embodiment. Figure 9 As shown, the electronic device provided in this embodiment includes a processor 210 and a memory 220. The memory 220 stores a computer program. When the computer program is executed by the processor 210, it implements the device simulation parameter matching degree detection method provided in any of the above embodiments.

[0055] Since the electronic device provided in this embodiment and the device simulation parameter matching degree detection method provided in this invention belong to the same inventive concept, the electronic device provided in this embodiment has at least all the advantages of the device simulation parameter matching degree detection method provided in this invention. For details, please refer to the above description of the beneficial effects of the device simulation parameter matching degree detection method, which will not be repeated here.

[0056] For example, such as Figure 9As shown, the electronic device may further include a communication interface 230 and a communication bus 240, wherein the processor 210, the communication interface 230, and the memory 220 communicate with each other via the communication bus 240. For ease of illustration, only one thick line is used to represent the device in the figure, but this does not indicate that there is only one bus or one type of bus. The communication interface 230 is used for communication between the aforementioned electronic device and other electronic devices.

[0057] The processor 210 referred to in this invention can be a microcontroller unit (MCU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor. The processor 210 is the control center of the electronic device, connecting various parts of the entire electronic device through various interfaces and lines.

[0058] The memory 220 can be used to store the computer program. The processor 210 implements various functions of the electronic device by running or executing the computer program stored in the memory 220 and calling the data stored in the memory 220.

[0059] The memory 220 may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0060] A fourth embodiment of the present invention provides a readable storage medium storing a computer program. When executed by a processor, the computer program can implement the device simulation parameter matching degree detection method described above. Since the readable storage medium provided by the present invention and the device simulation parameter matching degree detection method provided by the present invention belong to the same inventive concept, the readable storage medium provided by the present invention possesses at least all the advantages of the device simulation parameter matching degree detection method provided by the present invention. For details regarding the beneficial effects of the readable storage medium provided by the present invention, please refer to the above description of the beneficial effects of the device simulation parameter matching degree detection method provided by the present invention; further details will not be repeated here.

[0061] The readable storage medium of embodiments of the present invention can be any combination of one or more computer-readable media. The readable medium can be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (not exhaustive examples) of a computer-readable storage medium include: an electrical connection having one or more wires, a portable computer hard disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, apparatus, or device.

[0062] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of sending, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0063] Computer program code for performing the operations of this invention can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, as well as conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0064] Compared with existing technologies, the device, electronic device, and readable storage medium provided by this invention for detecting the matching degree of device simulation parameters have the following advantages: The device simulation parameter matching degree detection method provided by this invention first extracts the device parameter definition information of all devices in each model file of at least one target simulation software. This not only realizes the automatic extraction of parameter information of all devices in the model files of multiple target simulation software, but also lays a good foundation for detecting whether the device parameters in the parameterized unit library match the corresponding target simulation software. Then, based on the library file of the parameterized unit library, it generates the circuit schematic diagram of all devices in the parameterized unit library. The invention generates a pre-simulation netlist corresponding to the target simulation software based on the circuit schematic, and extracts the device simulation parameter information of all devices in the parameterized unit library from the pre-simulation netlist. This achieves automatic extraction of parameter information for all devices in the parameterized unit library, laying a solid foundation for improving the detection efficiency of device parameter matching in the parameterized unit library. Finally, for each target simulation software, the detection result of the parameterized unit library corresponding to the target simulation software is obtained based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, thereby achieving automatic detection of device simulation parameter matching. Therefore, this invention not only significantly improves detection efficiency but also enhances the accuracy of device simulation parameters in the parameterized unit library, thereby improving the timeliness of circuit design.

[0065] It should be noted that the apparatus and methods disclosed in the embodiments herein can also be implemented in other ways. The apparatus embodiments described above are merely illustrative; for example, the flowcharts and block diagrams in the accompanying drawings show the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments herein. In this regard, each block in a flowchart or block diagram may represent a module, program, or part of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram and / or flowchart, and combinations of blocks in block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system to perform the specified function or action, or can be implemented using a combination of dedicated hardware and computer instructions.

[0066] In addition, the functional modules in the various embodiments of this article can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0067] The above description is merely a preferred embodiment of the device simulation parameter matching degree detection method, apparatus, electronic device, and readable storage medium provided by the present invention, and is not intended to limit the scope of the present invention in any way. Any changes or modifications made by those skilled in the art based on the above disclosure are within the protection scope of the present invention. Obviously, those skilled in the art can make various modifications and variations to the present invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the present invention and its equivalents, the present invention also intends to include these modifications and variations.

Claims

1. A method for detecting the matching degree of device simulation parameters, characterized in that, The method for detecting simulation parameters of devices in a parameterized cell library during the pre-simulation phase of circuit design includes: Receive model files from at least one target simulation software and extract device parameter definition information for all devices in each model file; Based on the library files of the parameterized unit library, generate the circuit schematics of all devices in the parameterized unit library; Based on the circuit schematic, generate a pre-simulation netlist corresponding to the target simulation software; Extract device simulation parameter information of all devices in the parameterized cell library from the pre-simulation netlist; For each target simulation software, the detection result of the parameterized unit library corresponding to the target simulation software is obtained based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library.

2. The device simulation parameter matching degree detection method according to claim 1, characterized in that, For each target simulation software, after obtaining the detection result of the parameterized unit library corresponding to that target simulation software, the detection method further includes: Determine whether the detection results contain any devices whose device parameter simulation information is inconsistent with the device parameter definition information of the target simulation software. If so, modify the device simulation parameters of all inconsistent devices in the parameterized unit library, and return to execute the relevant steps from generating the pre-simulation netlist until determining whether there are any devices whose device parameter simulation information is inconsistent with the device parameter definition information, until the device parameter simulation information in the parameterized unit library is consistent with the device parameter definition information of the target simulation software, and complete the device simulation parameter matching degree detection.

3. The device simulation parameter matching degree detection method according to claim 1, characterized in that, The device parameter definition information includes the device name, device parameters, the name of the target simulation software, and the line number of the device in the model file of the target simulation software. The device simulation parameter information includes the device name and device parameters of the device in the parameterized unit library; For each of the target simulation software: After extracting the device parameter definition information of all devices from the model file of the target simulation software, the detection method further includes: storing the device parameter definition information in a first storage area; After extracting the device simulation parameter information of all devices in the parameterized unit library, the detection method further includes: storing the device simulation parameter information in a second storage area.

4. The device simulation parameter matching degree detection method according to claim 3, characterized in that, For each target simulation software, based on the device parameter definition information of the target simulation software and the device simulation parameter information of the parameterized unit library, the detection result of the parameterized unit library corresponding to the target simulation software is obtained, including: For each target simulation software, the device name, device type, and device parameters in the device simulation parameter information in the second storage area are checked to see if they are consistent with the device parameter definition information in the first storage area, so as to obtain the detection result of the parameterized unit library corresponding to the target simulation software.

5. The device simulation parameter matching degree detection method according to claim 1, characterized in that, The detection results include: the device name, the line number of the device in the corresponding model file of the target simulation software, and the parameter comparison results; the parameter comparison results include those that passed the detection and those that failed the detection, as well as the parameter set of all devices that failed the detection.

6. The device simulation parameter matching degree detection method according to claim 5, characterized in that, The detection method further includes: The test results are output according to the categories of passing and failing the test.

7. The device simulation parameter matching degree detection method according to any one of claims 1 to 6, characterized in that, The target simulation software includes Hspice and Spectre.

8. A device for detecting the matching degree of device simulation parameters, characterized in that, The detection device is used to detect the simulation parameters of devices in a parameterized cell library during the pre-simulation flow stage of circuit design. The detection device includes: The interaction module is used to obtain the library files of the parameterized unit library, the model files of at least one target simulation software, and the storage path of the detection results; An execution module is configured to implement the device simulation parameter matching degree detection method as described in any one of claims 1 to 7, based on the library file and the model file, and store the detection result in the detection result storage path.

9. An electronic device, characterized in that, It includes a processor and a memory, wherein the memory stores a computer program, and when the computer program is executed by the processor, it implements the device simulation parameter matching degree detection method according to any one of claims 1 to 7.

10. A readable storage medium, characterized in that, The readable storage medium stores a computer program, which, when executed by a processor, implements the device simulation parameter matching degree detection method according to any one of claims 1 to 7.

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