Measurement of light source performance
By receiving electromagnetic radiation images and using the relationship between intensity data and performance indicators, the problem of time-consuming and labor-consuming light source performance measurement in the prior art is solved, and fast and reliable light source performance measurement is achieved, which is suitable for automated analysis of multi-spot light sources.
Patent Information
- Application Number
- CN202380087413.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-12-21
- Filing Date
- 2023-12-13
- Publication Date
- 2025-07-25
AI Technical Summary
The prior art consumes time and effort when measuring the light source performance of multi-spot lasers, and it is difficult to quickly and reliably meet the performance characteristics requirements of the light source, especially when producing mobile phones and other equipment, resources are seriously wasted.
By receiving images of electromagnetic radiation onto the object, using the relationship between intensity data and performance indicators, quickly determine performance indicators, use cameras and interface devices to perform automated measurements, simplify measurement settings and adapt to multi-spot light sources.
It realizes rapid and reliable measurement of light source performance, reduces resource waste, improves measurement efficiency and accuracy, and is suitable for automated analysis of multi-spot light sources.
Smart Images

Figure CN120380307A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to a method for measuring the performance of an irradiation source, the use of performance indicators, a computer program element, a non-transitory computer-readable data medium, a measuring device, a system for measuring the performance of an irradiation source, and the use of the measuring device. Background Art
[0002] Light sources sold on the market must meet certain requirements regarding their performance characteristics and are therefore tested after production. In an example, the performance characteristics are related to, for example but not limited to, application characteristics or eye safety, but not limited to eye safety as specified by a specification (such as the maximum power of light captured by the eye at a certain distance). The light source may be a laser that emits patterned light, and this patterned light has several light spots and the power of each light spot is different. Therefore, it is necessary to study multiple light spots to ensure sufficient performance characteristics.
[0003] CN105510004A provides a method for using a photodiode to detect the performance of a laser diode. For multiple light sources, this cumbersome work consumes a large amount of time and resources, especially when producing light sources (such as the light source of a mobile phone).
[0004] Therefore, a fast and reliable measurement method is desired. Summary of the Invention
[0005] In one aspect, the present disclosure relates to a method for measuring the performance of an irradiation source that emits electromagnetic radiation, the method comprising:
[0006] a. Receiving one or more images showing the projection of the electromagnetic radiation onto an object, wherein the one or more images are associated with intensity data, and the intensity data is associated with the intensity of at least a part of the one or more images,
[0007] b. Determining the one or more performance indicators from the intensity data by using the relationship between the intensity and one or more performance indicators associated with the power of the irradiation source,
[0008] c. Providing the one or more performance indicators.
[0009] In an embodiment, the present disclosure further relates to a method for measuring the performance of an irradiation source that emits electromagnetic radiation, the method comprising:
[0010] a. Receiving a first image showing the projection of the electromagnetic radiation onto an object, the first image being associated with a first quantity indicating the intensity corresponding to a first part of the first image,
[0011] b. Determine a first performance metric from the first quantity indicative of the intensity by using a relationship between the quantity indicative of the intensity and a performance metric of the illumination source corresponding to a first portion of the first image.
[0012] c. Provide the first performance metric.
[0013] In one aspect, the present disclosure relates to a method for measuring the performance of an illumination source that emits electromagnetic radiation, the method comprising:
[0014] a. Receive a first image showing a projection of electromagnetic radiation, the first image being associated with a first quantity indicative of the intensity corresponding to a first portion of the first image.
[0015] b. Determine a first performance metric from the first quantity indicative of the intensity by using a relationship between the quantity indicative of the intensity and a performance metric of the illumination source corresponding to a first portion of the first image.
[0016] c. Provide the first performance metric.
[0017] In an embodiment, the present disclosure further relates to a measuring device for measuring the performance of an illumination source that emits electromagnetic radiation, the device comprising:
[0018] a. A camera configured to generate one or more images showing a projection of electromagnetic radiation onto an object, the one or more images being associated with intensity data related to the intensity of at least a portion of the one or more images.
[0019] b. An interface configured to: receive one or more images showing a projection of electromagnetic radiation onto an object, the one or more images being associated with intensity data related to the intensity of at least a portion of the one or more images; determine the one or more performance metrics from the intensity data by using a relationship between the intensity and one or more performance metrics associated with the power of the illumination source; and provide the one or more performance metrics.
[0020] In another aspect, the present disclosure relates to a method for measuring a quantity indicative of the power of electromagnetic radiation, the method comprising:
[0021] a. Receive an image showing a projection of electromagnetic radiation onto an object, the image being associated with a first quantity indicative of the intensity corresponding to at least one first portion of the image.
[0022] b. Determine a first quantity indicative of the power of electromagnetic radiation corresponding to at least one first portion of the image from the first quantity indicative of the intensity by using a relationship between the quantity indicative of the intensity associated with the image and the quantity indicative of the power of electromagnetic radiation.
[0023] c. Provide a first quantity indicative of the power of the indicated electromagnetic radiation.
[0024] In another aspect, the present disclosure relates to the use of a quantity related to the power of electromagnetic radiation obtained by the method as described herein for evaluating the safety requirements of an irradiation source.
[0025] In another aspect, the present disclosure relates to the use of a first performance metric obtained by the method as described herein for evaluating the quality requirements of an irradiation source.
[0026] In another aspect, the present disclosure relates to a computer program element having instructions which, when executed on a processing device, are configured to perform the steps of the method as described herein.
[0027] In another aspect, the present disclosure relates to a measuring device for measuring the performance of an irradiation source emitting electromagnetic radiation, the device comprising:
[0028] a. A camera configured to generate a first image showing a projection of the electromagnetic radiation onto an object, the first image being associated with a first quantity indicative of the intensity corresponding to a first part of the first image,
[0029] b. An interface configured to receive the first image, wherein the interface is an interface to a processor, the interface being configured to determine, from the first quantity indicative of the intensity, a first performance metric of the irradiation source corresponding to the first part of the first image by using the relationship between the quantity indicative of the intensity and the performance metric, and wherein the interface is configured to provide the performance metric first.
[0030] In another aspect, the present disclosure relates to a measuring device for measuring a quantity indicative of the power of electromagnetic radiation, the device comprising:
[0031] a. A camera configured to generate an image showing a projection of the electromagnetic radiation onto an object, the image being associated with a first quantity indicative of the intensity corresponding to at least one first part of the image,
[0032] b. An interface configured to receive the image, wherein the interface is an interface to a processor, the interface being configured to determine, from the first quantity indicative of the intensity, a first quantity indicative of the power of the electromagnetic radiation corresponding to at least one first part of the image by using the relationship between the quantity indicative of the intensity associated with the image and the quantity indicative of the power of the electromagnetic radiation, and wherein the interface is configured to provide the determined first quantity indicative of the power of the electromagnetic radiation.
[0033] In another aspect, the present disclosure relates to the use of the measuring device as described herein for evaluating the quality requirements of an irradiation source.
[0034] In another aspect, the present disclosure relates to a non-transitory computer-readable data medium storing a computer program comprising instructions for performing the steps of the method as described herein.
[0035] The methods and apparatuses of the present disclosure allow for a fast and reliable measurement of the performance of an illumination source. To measure the performance, the methods and apparatuses use the relationship between a quantity indicating intensity and a performance metric. By receiving the quantity indicating intensity, the performance metric can be determined. The process is faster because it does not rely on mechanically adjusting the measurement settings prior to measurement and can be easily repeated. In particular, when the illumination source includes multiple emitters or in cases where multiple illumination sources should be analyzed, the automated workflow for measuring the performance of the illumination source can save a significant amount of time. Additionally, the measurement apparatuses and methods are easier to adjust the measurement settings for each illumination source than the apparatuses and methods known in the prior art. Additionally, the projection portion for which the performance should be determined can be fine-tuned such that an accurate performance analysis of the individual parts of the light beam or patterned electromagnetic radiation can be performed. The hardware required to evaluate the performance of the illumination source is common and inexpensive in the art, enabling the reuse of existing measurement settings.
[0036] In the following, terms and / or the technical field of the present disclosure as used herein will be outlined by way of definition and / or example. In the case of giving examples, it should be understood that the present disclosure is not limited to the examples.
[0037] In an embodiment, the object may be associated with a transmittance of less than 0.2. The object may be opaque. Subsequently, the angle between the optical axis associated with an image generation unit for generating one or more images and the optical axis associated with an illumination source for projecting electromagnetic radiation may be less than 180°. In an embodiment, the angle between the optical axis associated with an image generation unit for generating one or more images and the optical axis associated with an illumination source for projecting electromagnetic radiation may be less than 30°. By doing so, a spatially efficient measurement of the performance of the illumination source can be performed. Additionally, the measurement apparatus for measuring the performance can be easily measured with available and low-cost hardware. Additionally, the measurement is reliable because ambient light can be easily eliminated.
[0038] In an embodiment, the illumination source may include at least one active light source. The illumination source may be adapted to emit electromagnetic radiation. The illumination source may emit light based on an incandescent lamp and / or a luminescence principle. The illumination source may include diodes, in particular light-emitting diodes. Preferably, the illumination source may emit coherent electromagnetic radiation. The illumination source may include at least one line laser. The line laser may be adapted to send a laser line to an object, such as a horizontal or vertical laser line. The illumination source may include a plurality of line lasers. For example, the illumination source may include at least two line lasers, and the at least two line lasers may be arranged such that the illumination pattern includes at least two parallel lines or intersecting lines. The illumination source may include at least one light projector adapted to generate a point cloud such that the illumination pattern may include a plurality of point patterns. The illumination source may include at least one mask adapted to generate an illumination pattern from at least one light beam generated by the illumination source. Additionally or alternatively, the illumination source may include a laser source. The laser source may include at least one line laser. The laser source may include at least one laser diode. The illumination source may emit patterned electromagnetic radiation. Subsequently, an image may show a pattern, and a part of the image may refer to a part of the pattern, preferably a pattern feature, more preferably a first pattern feature. The pattern may include a plurality of pattern features. A second part of the image may refer to a second part of the pattern, preferably a second pattern feature. The illumination source may include a plurality of emitters. Examples of illumination sources with a plurality of emitters may be a VCSEL array, a laser with a DOE, or any other arrangement of emitters.
[0039] In an embodiment, the electromagnetic radiation may be adapted to generate an image, in particular for generating an image with a camera. The electromagnetic radiation may be ultraviolet light, visible light, infrared light, or a combination thereof. The electromagnetic radiation may be infrared light. The infrared light may include near-infrared light, mid-infrared light, and / or far-infrared light. The electromagnetic radiation may include ultraviolet light and / or infrared light. The electromagnetic radiation may include infrared light and / or visible light. The electromagnetic radiation may include patterned electromagnetic radiation. The ultraviolet light may be in the range of 10 nm to 380 nm, and the value of 380 nm is not included in this range. The visible light may be in the range of 380 nm to 750 nm, and the value of 750 nm is not included in this range. The infrared light may be in the range of 750 nm to 1000 μm. The near-infrared light may be in the range of 780 nm to 3000 nm, and the value of 3000 nm is not included in this range. The mid-infrared light may be in the range of 3 μm to 15 μm, and the value of 15 μm is not included in this range. The far-infrared light may be in the range of 15 μm to 1000 μm.
[0040] The term "camera" can specifically refer to, but is not limited to, a device having at least one imaging element configured to record or record spatially resolved one-dimensional, two-dimensional or even three-dimensional optical data or information. The camera can be a digital camera. By way of example, the camera can include at least one camera chip, such as at least one CCD chip and / or at least one CMOS chip configured to record images. The camera can be or can include at least one near-infrared camera and / or RGB camera. In addition, in addition to at least one camera chip or imaging chip, the camera can include additional elements, such as one or more optical elements, such as one or more lenses.
[0041] In an embodiment, the performance of the irradiation source can be indicated by a performance metric. The performance metric can be associated with at least a portion of the irradiation source. In particular, the performance metric can be associated with at least one emitter of the irradiation source. In an embodiment, the irradiation source can include a plurality of emitters, and the performance metric can be associated with at least a portion of the irradiation source, preferably associated with at least one emitter, or a plurality of performance metrics can be associated with at least one irradiation source, preferably associated with a plurality of emitters. The performance metric can be suitable for determining or can include a quantity indicating the power of the electromagnetic radiation. The performance metric and / or the quantity indicating the power of the electromagnetic radiation can be suitable for determining whether the irradiation source complies with safety regulations regarding the irradiation source. In particular, the performance metric and / or the quantity indicating the power of the electromagnetic radiation can be suitable for determining compliance with at least one of the following: IEC 60825-1 14:2004, DIN EN 62471:2006, IEC 62471 2006, EN 62471:2003 or a combination thereof. The performance metric and / or the quantity indicating the power of the electromagnetic radiation can indicate at least one of power, maximum permissible exposure (MPE), radiance, radiant flux, irradiance, luminance, radiant energy or a combination thereof. The performance metric and / or the quantity indicating the power of the electromagnetic radiation can include at least one of power, radiant intensity, maximum permissible exposure (MPE), radiance, radiant flux, irradiance, luminance, radiant energy, emittance or a combination thereof. The MPE, radiance, radiant flux, irradiance and / or radiant energy can be referenced according to the definitions of EN60825-1 14:2004. The radiance can include spectral radiance, weighted radiance and / or integrated radiance. The irradiance can include spectral irradiance and / or integrated irradiance.
[0042] In an embodiment, determining whether a first performance metric falls within a range of performance metrics that specify meeting quality requirements may include comparing the first performance metric with performance metrics specified in at least one of the following: IEC60825-1 14:2004, DIN EN 62471:2006, IEC 62471 2006, EN 62471:2003, or a combination thereof. The quality requirements may include application requirements and / or safety requirements. The application requirements may include requirements necessary for implementing an application. The safety requirements may include requirements established to ensure user safety.
[0043] In an embodiment, the intensity data may include one or more quantities indicative of intensity. The one or more intensity quantities may be suitable for obtaining and / or determining intensity. Additionally or alternatively, the quantity indicative of intensity may include intensity associated with a portion of an image, maximum intensity associated with a portion of an image, sum of intensities associated with a portion of an image, pixel value, integrated intensity associated with a portion of an image, and / or contrast associated with a portion of an image. The quantity indicative of intensity may be obtained from one pixel. The intensity may refer to the intensity associated with one pixel. A pixel may include one, two, three, and / or four pixel values. The integrated intensity may be obtained from more than one pixel. The integrated intensity may refer to the intensity associated with more than one pixel. The intensity may refer to the maximum intensity, sum of intensities, pixel value, and / or contrast associated with at least a portion of an image.
[0044] In an embodiment, a portion of an image may refer to at least one pixel associated with the image. In an embodiment, a portion of an image may refer to a plurality of pixels associated with the image. In an embodiment, a portion of an image may refer to all possible pixel subgroups within a group of pixels associated with the image. Subsequently, a portion of an image may refer to the entire image and / or a portion less than the entire image. Preferably, a portion of an image may refer to a feature in the image. For example, if the image includes a pattern projected onto an object, a feature of the image may be a portion of the pattern, a so-called pattern feature. A portion of an image may include a first portion of a first image, a second portion of a first image, a third portion of a second image, and / or any other portion of an image as mentioned herein. The second portion of the first image and / or the third portion of the second image may be different from the first portion of the first image.
[0045] In an embodiment, a processor may refer to any logic circuit configured to perform the basic operations of a computer or system, and / or generally to a device configured to perform computing or logical operations. In particular, a processor or computer processor may be configured to process the basic instructions that drive a computer or system. A processor may be a semiconductor-based processor, a quantum processor, or any other type of processor configured to process instructions. By way of example, a processor may be or may include a central processing unit (“CPU”). A processor may be a graphics processing unit (“GPU”), a tensor processing unit (“TPU”), a complex instruction set computing microprocessor (“CISC”), a reduced instruction set computing (“RISC”) microprocessor, a very long instruction word (“VLIW”) microprocessor, or one processor implementing other instruction sets or multiple processors implementing a combination of instruction sets. The processing device may also be one or more dedicated processing devices, such as an application specific integrated circuit (“ASIC”), a field programmable gate array (“FPGA”), a complex programmable logic device (“CPLD”), a digital signal processor (“DSP”), a network processor, and the like. The methods, systems, and devices described herein may be implemented as software in a DSP, a microcontroller, or any other auxiliary processor, or as hardware circuits within an ASIC, a CPLD, or an FPGA. It should be understood that the term processor may also refer to one or more processing devices, such as a distributed processing device system located on multiple computer systems (e.g., cloud computing), and is not limited to a single device, unless otherwise specified.
[0046] In an embodiment, a measurement device may be used by a service provider. The service provider may receive an image from a user. The user may desire to determine a performance metric. The service provider may determine the desired performance metric based on the received image and provide the desired performance metric to the user. The service provider may provide a user interface to the user for providing the image such that the service provider may receive the image. The image may be received via an interface (e.g., a network interface or a user interface) such that the processor may determine the performance metric. The performance metric may be provided via an interface (e.g., a network interface or a user interface).
[0047] In an embodiment, a computer-readable data medium and / or a computer program element may refer to any suitable data storage device or computer-readable memory on which a set or multiple sets of instructions (e.g., software) are stored, which embody any one or more of the methods or functions described herein. The instructions may also reside, completely or at least partially, in the main memory and / or the processor during the execution of the instructions by a computer, main memory, and processing device that may constitute a computer-readable storage medium. These instructions may further be sent or received over a network via a network interface device. Computer-readable data media include, for example, hard disk drives on servers, USB storage devices, CDs, DVDs, or Blu-ray discs. A computer program may contain all the functions and data required to execute the method according to the present disclosure, or may provide an interface to enable parts of the method to be processed on a remote system (e.g., on a cloud system). The term non-transitory may mean that the purpose of the data storage medium is to permanently store a computer program, especially without the need for permanent power supply.
[0048] In an embodiment, an interface may be a shared boundary between at least two components of a processing unit. The interface may be part of the processing unit. The interface may allow the exchange of information between at least two components. The processing unit may include at least one processor. At least two components of the processing unit may correspond to a decentralized computing environment, a distributed computing environment, a centralized computing environment, a system including multiple devices (such as computers, laptops, smartphones, databases, etc.). The interface may be a network interface or a user interface. The user interface may be an interface to a user, where the user may input information and / or the user interface may be used to provide information to the user. The network interface may be a virtual network interface.
[0049] These and other objects are solved by the subject matter of the independent claims, which will become apparent when reading the following description. The dependent claims relate to embodiments of the invention.
[0050] In an embodiment, the relationship between the quantity indicating intensity and the performance metric may be stored in a memory and / or a database. By doing so, the relationship can be easily used and there is no need to generate the relationship when it is desired to access the relationship. This allows the separation of relationship generation from the measurement of the performance of the irradiation source. In addition, different relationships may also be stored for different use cases of the measurement device or method as described herein.
[0051] In an embodiment, when referring to the images herein, it may include a first image, a second image, a third image, and / or any other image. When referring to performance metrics, it may include a first performance metric, a second performance metric, a third performance metric, and / or any other performance metric. When referring to a quantity indicating intensity, it may include a first quantity indicating intensity, a second quantity indicating intensity, a third quantity indicating intensity, and / or any other quantity indicating intensity. The first performance metric, the second performance metric, the first quantity indicating intensity, and / or the second quantity indicating intensity may be associated with the first image. The third performance metric and / or the third quantity indicating intensity may be associated with the second image and / or the third image.
[0052] In an embodiment, a second performance metric corresponding to a second part of the image of the irradiation source may be determined. The second performance metric may be at least partially different from the determined performance metric. The determined performance metric may be referred to as the first performance metric. The second performance metric may be at least partially different from the first performance metric. The second part of the image may be at least partially different from the image part associated with the determined performance metric, preferably the first performance metric. The image part associated with the determined performance metric may be referred to as the first part of the image. Additionally or alternatively, the second part of the image may at least partially overlap with the image part associated with the determined performance metric, preferably the first part of the image.
[0053] In an embodiment, a performance metric map may be generated based on the second performance metric and the first performance metric. A performance metric map may be generated based on the second performance metric and the determined performance metric associated with a part in the image. A performance metric map may be generated based on the second performance metric and the first performance metric associated with the first part in the image.
[0054] In an embodiment, two or more performance metrics associated with two or more different parts of one or more images may be determined. Providing one or more performance metrics may include generating a performance metric map associated with the two or more performance metrics. The performance metric map may include the spatial distribution of the two or more performance metrics according to the spatial distribution of the intensity data associated with one or more images.
[0055] In an embodiment, a second performance metric corresponding to a second part of the first image of the irradiation source may be determined, and a performance metric map may be generated based on the second performance metric and the first performance metric.
[0056] In an embodiment, a second performance metric corresponding to a second part of the first image of the irradiation source may be determined, and a performance metric map may be generated based on the second performance metric and the first performance metric. The second part of the first image may be different from the first part of the first image.
[0057] In an embodiment, a second portion of the first image can be at least partially different from a first portion in the first image, and / or wherein the performance metric map can include a spatial distribution of a first performance metric and a second performance metric. The spatial distribution of the performance metric can correspond to a pattern emitted from an illumination source. This is advantageous because the illumination source can emit patterned electromagnetic radiation and each part of the pattern should be evaluated individually. In such a scenario, the illumination source can include a plurality of emitters, each emitter emitting electromagnetic radiation that forms a pattern. To meet the performance characteristics, each emission ray of such an illumination source and thus each emitter needs to comply with its respective safety requirements. Therefore, it is not sufficient to measure only a single performance metric of the illumination source, and a number of performance metrics need to be determined.
[0058] In an embodiment, the projection position of the first portion of the first image can be determined based on beam profile analysis applied to the first image, a first shape of the first portion of the first image, a first distance of the first portion of the first image from the second portion, and / or a first size of the first portion of the first image.
[0059] In an embodiment, determining the performance metrics of the illumination source can be further based on the position of at least that portion in one or more images and / or the shape associated with the projection of the electromagnetic radiation onto the object of at least that portion in one or more images and / or the size associated with at least that portion of one or more images.
[0060] The position can be determined based on beam profile analysis, shape, distance between two or more different portions, and / or size applied to one or more images.
[0061] In an embodiment, determining a first performance metric of an illumination source can be further based on a position in a first image and / or a first shape and / or a first size associated with a first portion of the first image. The method can further include determining a quantity indicative of intensity and / or measuring a performance metric of the illumination source based on the position in the first image and / or the first shape and / or the first size associated with the first portion of the first image. The position in the first image can include a position relative to any point (such as a corner point, a center point, etc.) in the first image. Additionally or alternatively, the position in the first image can include a position relative to another portion of the first image. In particular, a portion in the image is the first portion, and the position of the first portion in the image is determined relative to a second portion in the image. The first shape associated with the first portion of the first image can include a first shape of a portion of a pattern. The first size associated with the first portion of the first image can include a first size of the first portion of the pattern. The quantity indicative of intensity and / or the performance metric can depend on a distance at which electromagnetic radiation is projected from the illumination source and / or the camera. Additionally or alternatively, the quantity indicative of intensity and / or the performance metric can depend on an orientation of the illumination source and / or the camera relative to an object on which the electromagnetic radiation is projected. The position, shape, and / or size of a portion of the image can indicate a distance at which electromagnetic radiation is projected from the illumination source and / or the camera. The performance metric can be determined for a predetermined distance from the illumination source and / or the camera. Additionally or alternatively, the performance metric can be determined for a predetermined orientation of the illumination source and / or the camera relative to an object on which the electromagnetic radiation is projected. Additionally or alternatively, the position, shape, and / or size of a portion of the image can indicate an orientation of the illumination source and / or the camera relative to an object on which the electromagnetic radiation is projected. Both distance and orientation can be requirements for a standardized safety test of the illumination source, but the object may have a physical extent that may not provide the required orientation of the illumination source and / or the camera relative to the object; and / or the required distance of the projection from the illumination source and / or the camera. Thus, it is desirable to correct the quantity indicative of intensity and / or the performance metric for distance and / or orientation. In particular, if multiple portions of the image are to be analyzed, it is advantageous to generate one image of the light projected onto an object (such as a screen) rather than realigning the object and / or the illumination source and / or the camera again for multiple portions of the image. This is particularly advantageous for patterned light having multiple pattern features. Due to the spherical expansion of the light beam, the size of a portion of the image can vary with the distance from the illumination source of the projection. Due to the spherical expansion of the light beam, the shape of a portion of the image can change with the distance of that portion of the image from the center and / or the orientation of the illumination source relative to the object. By using trigonometric identities, the quantity indicative of intensity and / or the performance metric can be determined for a predetermined distance and / or orientation of the projection of the electromagnetic radiation onto the object.
[0062] In an embodiment, the electromagnetic radiation may be coherent and / or may be emitted from a light-emitting diode and / or from a superluminescent diode. In particular, the electromagnetic radiation may be emitted from an emitter array included in an illumination source. In particular, the electromagnetic radiation may be emitted from a laser and / or a laser diode. This is particularly advantageous because both LEDs and lasers are high-power illumination sources and thus the requirements regarding their performance are particularly stringent. Additionally, LEDs and lasers (such as VCSELs) are widely used and thus need to be analyzed in a time-efficient manner.
[0063] It should be noted that the term "plurality" may be interchanged with the term "at least two". Thus, when the term is referred to as a plurality, it should also be understood as at least two.
[0064] In an embodiment, the object may include a screen and / or an image is generated with a camera. The method as described herein may further include generating an image with a camera. Screens are readily available and the projection onto the screen can be easily oriented relative to the camera and / or the illumination source. The screen may be a flat screen. For measuring the performance known in the prior art using a photodiode, it is necessary to individually orient each part of the image before the measurement, and thus it is necessary to accurately move the photodiode or the illumination source on a sphere. Such spherical movement is both cumbersome and time-consuming. Thus, using a screen increases the measurement speed and reduces the measurement complexity, and thus increases the error frequency.
[0065] In an embodiment, the relationship between the quantity indicating intensity and the performance metric may be obtained based on a reference measurement result of a reference performance metric corresponding to a reference part of a reference image obtained with a performance measurement device and a reference quantity indicating the intensity associated with at least one reference part of the reference image. The performance measurement device may be a photodiode and / or a reference camera. Thus, the relationship between the quantity indicating intensity and the performance metric may be obtained based on the measurement results using a photodiode and / or a reference camera. The reference camera may be a camera based on a well-known illumination source reference. The well-known illumination source may emit a continuous electromagnetic radiation spectrum and / or may well characterize its illumination characteristics. An example of a well-known illumination source may be a tungsten filament lamp. The reference camera may include at least one photodiode, such as a photodiode array, the light sensitivity of which, preferably the absolute light sensitivity, may have been determined. The relationship between intensity and the performance metric may be obtained based on a reference measurement result of a reference performance metric corresponding to at least a part of a reference image obtained with a performance measurement device and a reference intensity associated with at least this part of the reference image.
[0066] In an embodiment, two or more different parts of one or more images may be associated with different shapes and / or sizes of the projection of the electromagnetic radiation.
[0067] In an embodiment, intensity data associated with intensity can be corrected for background radiation independently of an illumination source of electromagnetic radiation. One or more performance metrics can be determined from the corrected intensity by using a relationship between the intensity and one or more performance metrics.
[0068] In an embodiment, the relationship between the quantity indicative of intensity and the performance metric can be obtained based on reference measurement results of a reference performance metric corresponding to a reference portion of a reference image obtained with a performance measurement device and a reference quantity indicative of intensity associated with at least the reference portion of the reference image. By referring to the reference image, there is no need to develop an approximate physical model for relating the quantity indicative of intensity to the performance metric, but rather an accurate relationship specific to the measuring device can be determined. Obtaining the relationship between the quantity indicative of intensity and the performance metric can include obtaining a function that assigns a performance metric to a given quantity indicative of intensity. The relationship between the quantity indicative of intensity and the performance metric can be an equation, in particular a function such as PI = f(QI), where PI can be the performance metric and QI can be the quantity indicative of intensity. Obtaining the relationship between the quantity indicative of intensity and the performance metric can include determining at least one variable that relates the quantity indicative of intensity to the performance metric. The variable can be suitable for calculating a first performance metric based on the quantity indicative of intensity. Determining the first performance metric can include inserting a first quantity indicative of intensity into an equation including at least one variable.
[0069] The means for obtaining the relationship between the quantity indicative of intensity and the performance metric can include mathematical operations (e.g., rule of three), or fitting a dataset including the quantity indicative of intensity and the performance metric with a fitting function.
[0070] In an embodiment, the second image can be the first image and / or an image other than the first image. The second performance metric can be a performance metric other than the first performance metric and / or can be the determined performance metric. The first performance metric can be the first performance metric, and the second performance metric can be a performance metric other than the first performance metric and / or can be the first performance metric.
[0071] In an embodiment, the projection position of a first portion of a first image can be determined based on beam profile analysis applied to the first image, the shape of the portion of the image, the distance of the portion of the image from a second portion, and / or the size of the portion of the image. Determining the position based on beam profile analysis can include determining the distance of an illumination source and / or a camera from an object onto which electromagnetic radiation is projected. Determining the distance of the illumination source and / or the camera from the object onto which electromagnetic radiation is projected can include determining a third quantity indicative of the intensity associated with a first sub-portion of a first portion of the first image and determining a fourth quantity indicative of the intensity associated with a second sub-portion of the first portion of the first image. The first sub-portion of the first portion of the first image can substantially include edge information of the beam profile, and the second sub-portion of the first portion of the first image associated with the beam profile can substantially include center information of the beam profile.
[0072] The electromagnetic radiation for illumination can be associated with at least one beam profile. The edge information can include information related to the number of photons in the first sub-portion of the first portion of the first image of the beam profile, and the center information can include information related to the number of photons in the second sub-portion of the first portion of the first image of the beam profile. Determining the distance based on a quotient can include dividing the edge information by the center information, dividing a multiple of the edge information by the center information, or dividing a linear combination of the edge information and the center information. The quotient Q can be expressed as
[0073]
[0074] where x and y are lateral coordinates in the image, A1 and A2 are regions of the beam profile, and E(x,y,z o ) represents at object distance z oThe beam profile given herein. Beam profile analysis is described, for example, in WO 2020 / 187719 A1 and is described below. The disclosure of WO 2020 / 187719 A1 is incorporated herein by reference. The second part of the first image can be the part of the first image other than the first part of the first image. Further, it can be determined whether the projection position of the first part of the first image corresponding to the first performance metric matches a predetermined position. The predetermined position can be obtained from the standard regulations of the light source performance. Examples of such standards include IEC 60825-1 14:2004, DIN EN 62471:2006, IEC 62471 2006, and EN 62471:2003. Determining that the projection position of the first part of the first image corresponding to the first performance metric matches the predetermined position can enable verification of the first performance metric. Determining that the projection position of the first part of the first image corresponding to the determined performance metric does not match the predetermined position can enable receiving another image (e.g., other images), and determining performance metrics other than the first performance metric corresponding to the part other than the first part in the other images, and providing the performance metrics determined based on the received other images. Determining whether the projection position of the first part of the first image corresponding to the first performance metric matches the predetermined position can include comparing the projection position of the first part of the first image corresponding to the first performance metric with the predetermined position. Determining that the projection position of the first part of the first image corresponding to the first performance metric does not match the predetermined position can enable adjusting the projection position of the part in the other image. This is advantageous because the measurement result of the performance metric is verified by measuring the distance and the accuracy is further improved. In addition, errors can be detected and error data can be eliminated. In particular, when security requirements are involved, eliminating any possible errors is crucial and it is desirable to re-verify the correctness of the measurement result.
[0075] In an embodiment, a first portion of an image may be associated with a first shape and / or a first size, and wherein the first shape and / or the first size may be different from a second shape and / or a second size of at least one second portion of the first image. A portion of the image may be the first portion of the image. The size and / or shape associated with the first portion of the image may be the first size and / or the first shape. The second portion of the image may be at least partially different from the portion of the image for which a performance metric may be determined. The object may be a screen. In particular, the object may be at least partially opaque. Thus, the reflectivity of the object may exceed 70%, preferably exceed 80%, more preferably exceed 90%, and most preferably exceed 95%. Additionally or alternatively, the object may allow less than 30%, preferably less than 20%, more preferably less than 10%, and most preferably less than 5% of the incident light to pass through the object. The object may be planar. Thus, at least portions of the first image may be distorted, particularly when comparing the first image with another image, wherein the electromagnetic radiation has passed through a medium of an optical path for parallel electromagnetic radiation, such as a collimator. Alternatively, the degree of distortion at the edges of the image may be higher than that of the central portion of the image. The orientation of the illumination source and / or the camera relative to the object, and / or the distance of the illumination source and / or the camera relative to portions of the image may cause distortion of at least portions of the image. The reason for such distortion is the spherical expansion of the light beam. Further, the distortion may be an optical distortion associated with an optical device, particularly the optical device of the illumination source and / or the optical device of the image generation unit.
[0076] In an embodiment, the method may further include determining whether a first performance metric falls within a range that specifies a performance metric that meets a quality requirement. The method may further include classifying an illumination source associated with the first performance metric as meeting the quality requirement if at least one first performance metric falls within a range that specifies a performance metric that meets a safety requirement. By doing so, the illumination source may be directly evaluated, and the evaluation result may be a boolean value such that a non-expert can also evaluate the light source.
[0077] In an embodiment, a first quantity indicative of intensity can be corrected for background radiation independent of an illumination source of electromagnetic radiation, and wherein a first performance metric can be determined from the corrected first quantity of the indicative intensity by using a relationship between the quantity of the indicative intensity and a performance metric of the illumination source corresponding to a first portion of a first image. For accurate measurement of the performance metric of the illumination source, it is most important that the quantity of the indicative intensity includes the intensity emitted from the illumination source to be analyzed. Thus, electromagnetic radiation from other sources should be avoided. Since this requires perfect measurement conditions, correction for background radiation can be introduced. Background radiation can refer to radiation emitted independent of the illumination source. Examples of background radiation can be daylight or light emitted from a device independent of the measurement apparatus. The quantity of the indicative intensity can be corrected for background radiation by eliminating the intensity contribution independent of the illumination source. In particular, the quantity of the indicative intensity can be corrected for background radiation by eliminating the intensity contribution independent of the illumination emitted when generating the first image. Eliminating the intensity contribution independent of the illumination source can include determining the contribution independent of the illumination source and correcting the quantity of the indicative intensity by the determined contribution. A correction factor can be determined to determine the contribution independent of the illumination source. The correction factor can correspond to the contribution independent of the illumination source. In an example, the correction factor can be subtracted from the determined quantity of the indicative intensity. The correction factor can include the quantity of the indicative intensity associated with a correction image. The correction image can be an image independent of the first image and / or the second image. BRIEF DESCRIPTION OF THE DRAWINGS
[0078] In the following, the present disclosure will be further described with reference to the drawings. In the drawings and the present disclosure, the same reference numerals are intended to refer to the same or similar elements, components, and / or parts.
[0079] Figures 1a to 1c Examples of a centralized computing environment ( Figure 1a ) and a decentralized computing environment ( Figure 1b ) and a distributed computing environment ( Figure 1c ) are shown.
[0080] Figure 2 An example embodiment of a method 200 for measuring the performance of an illumination source is shown.
[0081] Figure 3 An example embodiment of a ray path 300 is shown.
[0082] Figure 4 An example embodiment of a measurement apparatus 400 for measuring the performance of an illumination source is shown.
[0083] Figure 5 An example embodiment of a performance metric graph 530 is shown.
[0084] Figure 6Disclosed is an example embodiment of a performance metric graph 630. Detailed Description
[0085] The following embodiments are merely examples for implementing the methods, systems, or application devices disclosed herein and should not be considered restrictive.
[0086] Figures 1a to 1c Shown are different computing environments, centralized, decentralized, and distributed computing environments. The methods, apparatuses, systems, uses, computer elements of the present disclosure can be implemented in a decentralized or at least partially decentralized computing environment. The provision, determination, or processing of data can be achieved by different computing nodes, which can be implemented in a centralized, decentralized, or distributed computing environment.
[0087] Figure 1a and Figure 1b Shown are example embodiments of centralized and decentralized computing environments with computing nodes. Figure 1c Shown is an example embodiment of a distributed computing environment.
[0088] In this example, the peripheral computing nodes 101.1 to 101.n can be connected to a central computing system (or server). In another example, the peripheral computing nodes 101.1 to 101.n can be attached to the central computing node via, for example, a terminal server (not shown). Most functions can be performed by or obtained from the central computing node (also referred to as a remote centralized location). One of the peripheral computing nodes 101.n has been expanded to provide an overview of the components present in the peripheral computing nodes. The central computing node 101 can include the same components as those described with respect to the peripheral computing node 101.n. Each computing node 101, 101.1 to 101.n can include at least one hardware processor 102 and a memory 104.
[0089] The computing nodes 101, 101.1…101.n may include a plurality of structures 106 that are commonly referred to as executable components, executable instructions, computer-executable instructions, or instructions. For example, the memory 104 of the computing nodes 101, 101.1…101.n may be shown as including executable components 106. The executable component or any equivalent thereof may be a name for a structure well-known to those of ordinary skill in the art of computing, which may be software, hardware, or a combination thereof, or may be implemented in software, hardware, or a combination. For example, when implemented in software, those of ordinary skill in the art will understand that the structure of the executable component includes software objects, routines, methods, etc. executed on the computing nodes 101, 101.1…101.n, regardless of whether such executable components exist in the heap of the computing nodes 101, 101.1…101.n or the executable components exist on a computer-readable storage medium. In this case, those of ordinary skill in the art will recognize that the structure of the executable component exists on the computer-readable medium such that when interpreted by one or more processors (e.g., by processor threads) of the computing nodes 101, 101.1…101n, the computing nodes 101, 101.1…101n will perform functions. Such a structure may be directly computer-readable by a processor (as in the case where the executable component is binary). Alternatively, the structure may be configured to be interpretable and / or compilable (whether in a single stage or in multiple stages) to generate such a binary that can be directly interpreted by a processor. This understanding of the example structures of executable components is well within the understanding of those of ordinary skill in the art of computing. Examples of executable components implemented in hardware include hard-coded or hard-wired logic gates that are implemented specifically or almost exclusively in hardware, such as within a field-programmable gate array (FPGA), an application-specific integrated circuit (ASIC), or any other special-purpose circuit. In this specification, terms such as component, agent, manager, service, engine, module, virtual machine, etc. are used synonymously with executable component.
[0090] The processor 102 of each computing node 101, 101.1…101.n can guide the operation of each computing node 101, 101.1…101.n in response to the execution of computer-executable instructions that constitute an executable component. For example, such computer-executable instructions can be embodied on one or more computer-readable media that form a computer program product. The computer-executable instructions can be stored in the memory 104 of each computing node 101, 101.1…101.n. The computer-executable instructions include, for example, instructions and data that, when executed at the processor 101, cause the general computing node 101, 101.1…101.n, the dedicated computing node 101, 101.1…101.n, or the dedicated processing device to perform a specific function or group of functions. Alternatively or additionally, the computer-executable instructions can configure the computing node 101, 101.1…101.n to perform a specific function or group of functions. The computer-executable instructions can be, for example, binary or even instructions that undergo some transformation (such as compilation) before being directly executed by the processor, such as intermediate format instructions, such as assembly language, or even source code.
[0091] Each computing node 101, 101.1…101.n can include a communication channel 108 that allows each computing node 101.1…101.n to communicate with the central computing node 101, for example, a network capable of transmitting electronic data between the computing nodes 101, 101.1…101.n and / or modules and / or other electronic devices. When information is transmitted or provided to the computing node 101, 101.1…101.n via a network or another communication connection (wired, wireless, or a combination of wired or wireless), the computing node 101, 101.1…101.n correctly treats the connection as a transmission medium. The transmission medium can include a network and / or a data link that can be used to carry the desired program code means in the form of computer-executable instructions or data structures and can be accessed by the general or dedicated computing node 101, 101.1…101.n. Combinations of the above can also be included within the scope of computer-readable media.
[0092] (Multiple) computing nodes 101, 101.1 to 101.n can further include a user interface system 110 for establishing an interface connection with a user. The user interface system 110 can include an output mechanism 110A and an input mechanism 110B. The principles described herein are not limited to the exact output mechanism 110A or input mechanism 110B, as this will depend on the nature of the device. However, the output mechanism 110A can include, for example, a display, a speaker, a tactile output, a hologram, etc. Examples of the input mechanism 110B can include, for example, a microphone, a touch screen, a hologram, a camera, a keyboard, a mouse or other pointer input, any type of sensor, etc.
[0093] Figure 1b shows an example embodiment of a distributed computing environment 100', in which a number of computing nodes 101.1' to 101.n' are represented as solid circles. Compared with Figure 1a the centralized computing environment 100 shown, the computing nodes 101.1' to 101.n' in the distributed computing environment are not connected to a central computing node 101 and thus are not under the control of the central computing node. Instead, both hardware resources and software resources can be allocated to each individual computing node 101.1'... 101.n' (local or remote computing systems), and data can be distributed among the various computing nodes 101.1'... 101.n' to perform tasks. Thus, in a distributed system environment, program modules can be located in local and remote memory storage devices. One of the computing nodes 101' has been expanded to provide an overview of the components present in the computing node 101'. In this example, the computing node 101' includes the same components as those Figure 1a described.
[0094] Figure 1c shows an example embodiment of a distributed computing environment 103. In this example, the distributed cloud computing environment 103 can include the following computing resources: (one or more) mobile devices 114, applications 116, databases 118, data storage 120, and (one or more) servers 122. The cloud computing environment 103 can be deployed as a public cloud 124, a private cloud 126, or a hybrid cloud 128. The private cloud 124 can be owned by an organization, and only organization members with appropriate access rights can use the private cloud 126, thus keeping the data in the private cloud at least confidential. In contrast, the data stored in the public cloud 126 can be open to anyone via the Internet. The hybrid cloud 128 can be a combination of both the private cloud 124 and the public cloud 126, and can keep some of the data confidential while other data can be publicly available.
[0095] Figure 2An example embodiment of a method 200 for measuring the performance of an illumination source is shown. First, an image 210 showing a projection of electromagnetic radiation is received, the image being associated with a quantity indicating the intensity corresponding to at least a portion of the image. The image can be generated by and / or received from a camera. The image can be provided and / or received via an interface. To generate the image, the electromagnetic radiation can be projected onto an object (such as a whiteboard, a screen, a table, a spherical object, etc.). Additionally, a performance metric 220 is determined from the quantity indicating the intensity by using a relationship between the quantity indicating the intensity and a performance metric of the illumination source corresponding to a portion of the image. For this purpose, the relationship can be determined before using the relationship to determine the performance metric, or the relationship can be received. The relationship can be received via an interface. The relationship can be provided by a database or a memory storing the relationship. In an embodiment, more than one relationship can be stored and / or received and / or provided. Since the relationship can be measurement device specific, multiple relationships can be easily used to determine the performance metrics of different measurement devices. The relationship can be an equation. The equation can include a quantity indicating the intensity related to a variable, for example via multiplication. The equation can yield the performance metric. Additionally, the performance metric 230 can be provided. Preferably, the performance metric can be received after determining the performance metric. In some embodiments, providing the performance metric can include providing an evaluated performance metric. The evaluated performance metric can be a performance metric associated with a portion of the image, wherein the projection distance of the electromagnetic radiation corresponding to this portion of the image onto the object matches a predetermined performance metric.
[0096] Figure 3Shows an exemplary embodiment of a ray path 300. The circle constitutes the spherical expansion of a light beam associated with electromagnetic radiation emitted from an illumination source. In an exemplary case, the electromagnetic radiation can be patterned electromagnetic radiation. Here, the light beam projected onto an object can correspond to a part of an image. Each light beam can be emitted from one illumination source combined with an optical element to divide the light beam into three light beams. Another example would be an illumination source including a plurality of emitters (such as a VCSEL array). In this example, the object is a screen, which is an object that is easily obtainable and easy to adjust to project electromagnetic radiation onto it. Due to the spherical expansion of the light beam, the size of the light beam at different distances is different. The circle can mark points in space or a plane, where the distance of all light beams emitted from the center of the circle can be the same. When projecting this radiation onto a flat screen, the outer light beams may expand more than the central light beam. Therefore, the image part corresponding to the outer light beams can be expanded. In addition, the image part corresponding to the outer light beams may be distorted because the outer light beams are not perpendicular to the screen but are more oriented towards the edges of the screen. When projecting electromagnetic radiation onto an object, this expansion and / or distortion that has nothing to do with making the (multiple) light beams parallel before may result in a relationship between the shape or size of a part of the image. In addition, the distance between individual light beams increases with the distance between the illumination source and / or the camera and the object. Therefore, the distance can also be determined based on the size or shape of a part of the image. References can be used to determine the relationship between the shape and / or size and the orientation, distance, etc. References can include measuring the distance, orientation, etc. of one measurement setup and obtaining variables that relate the size or shape to the distance, orientation, etc.
[0097] In this example, the projection of the left outer light beam onto the object can correspond to the first part of the image, the projection of the right outer light beam onto the object can correspond to the second part of the image, and the projection of the central light beam onto the object can correspond to the third part of the image. The described light beams can correspond to the parts of the image as described in the context of Figure 2 the image.
[0098] Figure 4 Shows an exemplary embodiment of a measuring device 400 for measuring the performance of an illumination source. The measuring device can be suitable for performing the method as described in the context of Figure 2 and can include as described in Figure 3The ray paths described in the context of. The measuring device may include a camera 410 configured to generate an image showing a projection of electromagnetic radiation, the projection being associated with a first quantity indicating the intensity corresponding to at least a portion of the image. Additionally, the measuring device may include an interface 420 configured to receive the image, wherein the interface is an interface to a processor 430 for determining, from the quantity indicating the intensity, a performance metric corresponding to at least a portion of the image of the illumination source by using the relationship between the quantity indicating the intensity and the performance metric, and wherein the interface 420 is configured to provide the performance metric. The measuring device may further include an illumination source 440 configured to illuminate an object with electromagnetic radiation and / or configured to project electromagnetic radiation onto the object. Using the camera 410 of the measuring device 400, an image 450 may be generated, provided, received, and analyzed. An exemplary image may be an image generated by patterned electromagnetic radiation.
[0099] Figure 5 An example embodiment of a performance metric graph 530 is shown. The generated image 510 may include a quantity indicating intensity, and thus, the image may be represented as an intensity graph 520. Thus, in an example, one or more images may be associated with intensity data including a plurality of intensity values. The intensity values may be obtained from the pixel values of one or more images. Based on the quantity indicating intensity, particularly a plurality of intensities, a performance metric, particularly the power of the illumination source, may be determined. Thus, based on the intensity graph 520, a performance metric graph may be determined. The performance metric graph may be generated by generating a plurality of performance metrics described in the context of Figure 2 and Figure 4 . The image 510 may include a plurality of pattern features, such as light spots generated by patterned electromagnetic radiation. Each pattern feature may be associated with a quantity indicating intensity, particularly the sum of intensities associated with at least a portion of the image 510. The intensity graph may include a plurality of quantities indicating intensity. By using a function such as f(QI) = a*PI, where QI may be a quantity indicating intensity, particularly intensity, and PI may be a performance metric, particularly the power of the illumination source, and where a may be a variable, the performance metric may be determined, and a corresponding graph may be generated by representing the spatial distribution of the performance metrics associated with the respective portions of the image. However, other relationships are possible. The quantity indicating intensity may include one or more intensity values associated with the image 510, the sum of intensities, for example, by summing the intensities associated with one or more reflection features, etc. In an embodiment, one or more images may include two or more reflection features generated by the projection of patterned electromagnetic radiation. Two or more performance metrics may be determined for each reflection feature based on two or more quantities indicating the intensities associated with the two or more reflection features.
[0100] In an example, the variable a can be a scaling factor, particularly for relating a quantity indicative of intensity to a performance metric. The scaling factor a can be obtained by measuring a reference intensity associated with a reference image and a reference performance metric associated with an illumination source for projecting electromagnetic radiation onto an object. The reference image can show the electromagnetic radiation projected onto the object by the illumination source associated with the reference intensity.
[0101] However, other examples are also feasible, such as a non-linear relationship between the performance metric and the quantity indicative of intensity. In examples where a variable is used to calculate the performance metric, the variable can depend on the spatial position of a region associated with the image. Preferably, the characteristics of the image generation unit (such as a camera) can vary with the precise spatial position. In particular, a first region of a first image can be associated with a first variable a1, and a second region in the first image can be associated with a second variable a2. Thus, to determine the performance metric associated with the first region, the first variable can be used. This also applies to the second region and the second variable. When using more complex relationships, such as using more than one variable, more than one variable can depend on the spatial position within the image and thus also on the spatial position of the object part relative to the camera. It should be noted that the spatial dependencies of more than one variable can be independent of each other, meaning that each variable can have its own dependence on the spatial position within the image. Further, the variable can depend on the illumination source associated with the image and / or the image generation unit. The intensity map 520 and / or the performance metric map 530 can be represented as Figure 5 seen. However, other embodiments are also feasible. In another example, the intensity map 520 and / or the performance metric map 530 can be represented in color or grayscale.
[0102] Figure 6 An example embodiment of the performance metric map 630 is shown. Similarly, the performance metric map 630 can be generated based on the image 610 and the intensity map described in the context of Figure 5 . Compared with the image in Figure 5 , the image here can show a light beam. The projection of the light beam can show a gradient of the quantity indicative of intensity. In an embodiment, the gradient can be continuous or stepped. The image can be segmented, and the parts obtained by segmenting the image can be associated with corresponding quantities indicative of intensity. Multiple intensities can be represented in the intensity map 620. Based on the intensity map 620, the performance metric map 630 can be determined as described in the context of Figure 5 .
[0103] The present disclosure has been described in connection with various preferred embodiments and examples. However, other variations can be understood and achieved by those skilled in the art and those practicing the claimed invention by studying the drawings, the present disclosure, and the claims. In particular, any steps proposed can be performed in any order, i.e., the present invention is not limited to a particular order of these steps. Additionally, it is not required that different steps be performed at a particular location or node in a distributed system, i.e., each step can be performed using different devices / data processing at different nodes.
[0104] In the present disclosure, "a / an" or "the" should not be regarded as referring only to "exactly one", but rather to one or more. Thus, unless otherwise explicitly stated, "the" and "a / an" refer to "at least one".
[0105] As used herein, "determine" also includes "initiate or cause to determine", "generate" also includes "initiate and / or cause to generate", and "provide" also includes "initiate or cause to determine, generate, select, send, and / or receive". "Initiate or cause to perform an action" includes any processing signal that triggers a computing node or device to perform the corresponding action.
[0106] In the claims and the specification, "comprising" does not exclude other elements or steps, and the indefinite article "a" or "an" does not exclude a plurality. A single element or other unit can perform the functions of several entities or items recited in the claims. The fact that certain measures are recited only in mutually different dependent claims does not indicate that a combination of these measures cannot be used in an advantageous embodiment.
[0107] Any disclosure and embodiment described herein relates to the methods, systems, devices, computer program elements listed above, and vice versa. Advantageously, the benefits provided by any embodiment and example apply equally to all other embodiments and examples, and vice versa.
Claims
1. A method for measuring the performance of an illumination source that emits electromagnetic radiation, the method comprising: a. receiving one or more images showing the projection of electromagnetic radiation onto an object, wherein the one or more images are associated with intensity data that is associated with the intensity of at least a portion of the one or more images, b. determining the one or more performance metrics from the intensity data by using a relationship between the intensity and one or more performance metrics associated with the power of the illumination source, c. providing the one or more performance metrics.
2. The method according to any one of the preceding claims, wherein, The object is associated with a transmittance of less than 0.2, and / or wherein the object is opaque.
3. The method according to any one of the preceding claims, wherein, Determining two or more performance metrics associated with two or more different portions of the one or more images, and wherein providing the one or more performance metrics includes generating a performance metric map associated with the two or more performance metrics.
4. The method according to claim 2, wherein The performance metric map includes a spatial distribution of the two or more performance metrics according to a spatial distribution of the intensity data associated with the one or more images.
5. The method according to any one of the preceding claims, wherein, Determining the performance metrics of the illumination source is further based on the position of at least the portion in the one or more images and / or the shape associated with the projection of the electromagnetic radiation onto the object of at least the portion in the one or more images and / or the size associated with at least the portion of the one or more images.
6. The method according to claim 4, wherein, The position is determined based on beam profile analysis applied to the one or more images, the shape, the distance between the two or more different portions, and / or the size.
7. The method according to any one of the preceding claims, wherein, The electromagnetic radiation is coherent and / or is emitted from a light-emitting diode and / or from a superluminescent diode.
8. The method according to any one of the preceding claims, wherein, The relationship between the intensity and the performance metric is obtained based on reference measurement results of reference performance metrics corresponding to at least a portion of a reference image obtained with a performance measurement device and a reference intensity associated with at least the portion of the reference image.
9. The method according to any one of the preceding claims, wherein, Two or more different portions of the one or more images are associated with different shapes and / or sizes of the projection of the electromagnetic radiation.
10. The method according to any one of the preceding claims, further comprising: Determining whether the one or more performance metrics fall within a range that specifies performance metrics that meet quality requirements.
11. The method according to any one of the preceding claims, wherein, Independently of the illumination source of the electromagnetic radiation, correcting the intensity data associated with the intensity for background radiation, and wherein the one or more performance metrics are determined from the corrected intensity by using the relationship between the intensity and the one or more performance metrics.
12. Use of a first performance metric obtained by the method according to claims 1 to 11 for evaluating the quality requirements of an illumination source.
13. A computer program element having instructions that, when executed on a processing device, are configured to perform the steps of the method according to any one of claims 1 to 11.
14. A measuring device for measuring the performance of an illumination source that emits electromagnetic radiation, the device comprising: a. a camera configured to generate one or more images showing the projection of electromagnetic radiation onto an object, the one or more images being associated with intensity data that is associated with the intensity of at least a portion of the one or more images, b. An interface configured to: receive one or more images showing a projection of electromagnetic radiation onto an object, the one or more images being associated with intensity data related to the intensity of at least a portion of the one or more images; determine, from the intensity data, one or more performance metrics by using a relationship between the intensity and one or more performance metrics associated with the power of the irradiation source; and provide the one or more performance metrics.
15. Use of the measuring device according to claim 14 for evaluating the quality requirements of the irradiation source.
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