Test fixtures and test systems

Abstract

The application discloses a test fixture and a test system, the test fixture comprising a base, a junction box, a test connecting assembly and a supporting plate; the base comprises a shell, a first recess provided on the upper surface of the shell, and a test connecting end provided on the shell and used for connecting a test device; a side wall of the first recess is provided with a first clamping terminal; the first clamping terminal is electrically connected with the test connecting end; the outer wall of the junction box is provided with a second clamping terminal corresponding to the first clamping terminal; the junction box is embedded in the first recess, and the first clamping terminal is clamped with the second clamping terminal; the test connecting assembly is arranged on the junction box and comprises a test pin, and the test pin is electrically connected with the second clamping terminal; the supporting plate is provided with a through hole and is arranged on the test connecting assembly and used for placing a PCB; the test pin is electrically connected with a test pad on the PCB through the through hole, and the test device is used for testing the PCB. The technical scheme can reduce the test cost and improve the test efficiency.

Description

Technical Field

[0001] This invention relates to the field of testing technology, and in particular to a testing fixture and testing system. Background Technology

[0002] Currently, electric vehicles are gaining increasing acceptance and popularity, leading to ever-increasing technical requirements for electric vehicle charging stations. Electric vehicle charging stations typically undergo factory testing before leaving the factory to ensure product reliability.

[0003] As charging piles become increasingly intelligent, their testing systems and technologies have remained stagnant. Traditional factory testing of charging piles requires different test fixtures for different control boards, leading to high costs and hindering efficient testing of various control boards. Summary of the Invention

[0004] This invention provides a test fixture and test system to solve the problem of high testing costs for testing different charging pile control boards.

[0005] A test fixture includes a base, a junction box, a test connection assembly, and a tray;

[0006] The base includes a housing, a first groove disposed on the upper surface of the housing, and a test connection end disposed on the housing, the test connection end being used to connect to a test device; a first locking terminal is provided on the side wall of the first groove; the first locking terminal is electrically connected to the test connection end;

[0007] The outer wall of the junction box is provided with a second locking terminal corresponding to the first locking terminal; the junction box is embedded in the first groove, and the first locking terminal is engaged with the second locking terminal;

[0008] The test connection assembly is disposed on the junction box, and the test connection assembly includes a test pin, which is electrically connected to the second locking terminal.

[0009] The tray has a through hole and is disposed on the test connection assembly for placing the PCB board; the test pin passes through the through hole and is electrically connected to the test pad on the PCB board, and the test equipment is used to test the PCB board.

[0010] Furthermore, the test fixture also includes a fixing component, which is connected to the junction box and used to fix the PCB board on the tray.

[0011] Furthermore, the fixing assembly includes a fixing bracket, a guide rod, a snap-fit ​​fixing plate, and a snap-fit ​​handle; the fixing bracket is disposed on the junction box; the fixing bracket has a guide groove in the middle; the guide rod is slidably connected to the guide groove; the snap-fit ​​fixing plate is connected to the guide rod; the snap-fit ​​handle is connected to the guide rod and is used to drive the guide rod to slide relative to the guide groove, so that the snap-fit ​​fixing plate fixes the PCB board on the support plate.

[0012] Furthermore, the test connection assembly includes a pin fixing plate and the test pin;

[0013] The ejector pin fixing plate is provided with an ejector pin fixing platform, and the test ejector pin is set on the ejector pin fixing platform.

[0014] A testing system includes testing equipment and the aforementioned testing fixture;

[0015] The testing equipment is connected to the test connection end of the test fixture and is used to test the PCB board on the test fixture.

[0016] Furthermore, the PCB board is a charging pile control board; the testing equipment is used to perform vehicle charging tests and vehicle discharging tests on the PCB board.

[0017] Furthermore, the test connection terminal includes a power connection terminal, a load connection terminal, and a first signal connection terminal; the power connection terminal is disposed on the first outer wall of the housing; the load connection terminal is disposed on the second outer wall of the housing; and the first signal connection terminal is disposed on the third outer wall of the housing.

[0018] The testing equipment includes a main control unit, an adjustable power supply, a load tester, and a multi-functional load.

[0019] The output terminal of the adjustable power supply is connected to the power supply connection terminal or the load connection terminal, and the second signal connection terminal of the adjustable power supply is connected to the first signal connection terminal.

[0020] The input terminal of the multi-functional load is connected to the load connection terminal or the power connection terminal, and the third signal connection terminal of the multi-functional load is connected to the first signal connection terminal.

[0021] The load tester is connected to the load connection terminal and the first signal connection terminal, or the load tester is connected to the power connection terminal and the first signal connection terminal.

[0022] The main control device is connected to the adjustable power supply, the load tester, and the multi-functional load.

[0023] Furthermore, the upper surface of the housing is also provided with a charging gun holder, a plug, a socket, and a wire crimping terminal block;

[0024] The first locking terminal is electrically connected to the charging gun socket, the plug, the socket, and the wire clamping terminal.

[0025] Furthermore, the testing equipment also includes a leakage current switch; the output terminal of the adjustable power supply is connected to the power supply connection terminal or the load connection terminal through the leakage current switch; the main control device is also connected to the leakage current switch.

[0026] Furthermore, the testing system also includes a rotatable gimbal; the rotatable gimbal is used to place the testing fixture.

[0027] This invention provides a test fixture and a test system. The test fixture includes a base, a junction box, a test connection assembly, and a tray. The base includes a housing, a first groove on the upper surface of the housing, and a test connection end on the housing for connecting to a test device. The side wall of the first groove has a first locking terminal, which is electrically connected to the test connection end. The outer wall of the junction box has a second locking terminal corresponding to the first locking terminal. The junction box is embedded in the first groove, and the first locking terminal engages with the second locking terminal. The test connection assembly is mounted on the junction box and includes a test pin, which is electrically connected to the second locking terminal. The tray has a through hole and is mounted on the test connection assembly for placing a PCB board. The test pin passes through the through hole and is electrically connected to the test pads on the PCB board. The test device is used to test the PCB board. Therefore, when replacing a PCB board for testing, only the layout of the test pins in the test connection assembly and the wiring connected to the test pins in the junction box need to be readjusted to retest the replaced PCB board, avoiding the need to replace the entire test fixture, thereby reducing testing costs and improving testing efficiency. Attached Figure Description

[0028] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0029] Figure 1 This is a top view of a test fixture in one embodiment of the present invention;

[0030] Figure 2 This is a schematic diagram of a test fixture in one embodiment of the present invention;

[0031] Figure 3This is another schematic diagram of the test fixture in one embodiment of the present invention;

[0032] Figure 4 This is a schematic diagram of a test system according to an embodiment of the present invention;

[0033] Figure 5 This is another schematic diagram of the test system in one embodiment of the present invention.

[0034] In the diagram: 1. Test fixture; 11. Base; 111. First locking terminal; 112. Test connection terminal; 113. Charging gun holder; 114. Plug; 115. Socket; 116. Wire crimping terminal block; 12. Junction box; 121. Second locking terminal; 13. Test connection assembly; 131. Ejector pin fixing plate; 132. Test ejector pin; 14. Support plate; 15. Fixing assembly; 151. Fixing bracket; 152. Guide rod; 153. Snap-on fixing plate; 2. Main control equipment; 3. Adjustable power supply; 4. Load tester; 5. Multifunctional load; 6. Leakage circuit breaker; 7. Rotatable pan-tilt head; 8. PCB board. Detailed Implementation

[0035] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0036] It should be understood that the invention can be embodied in various forms and should not be construed as being limited to the embodiments set forth herein. Rather, providing these embodiments will make the disclosure thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, for clarity, the dimensions and relative dimensions of layers and regions may be exaggerated. The same reference numerals denote the same elements throughout.

[0037] It should be understood that when an element or layer is referred to as "on," "adjacent to," "connected to," or "coupled to" other elements or layers, it may be directly on, adjacent to, connected to, or coupled to other elements or layers, or there may be intervening elements or layers. Conversely, when an element is referred to as "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" other elements or layers, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc., may be used to describe various elements, components, areas, layers, and / or portions, these elements, components, areas, layers, and / or portions should not be limited by these terms. These terms are only used to distinguish one element, component, area, layer, or portion from another element, component, area, layer, or portion. Therefore, without departing from the teachings of this invention, the first element, component, area, layer, or portion discussed below may be referred to as the second element, component, area, layer, or portion.

[0038] Spatial relation terms such as “below,” “under,” “below,” “under,” “above,” “above,” etc., are used herein for convenience of description to describe the relationship between one element or feature shown in the figure and other elements or features. It should be understood that, in addition to the orientation shown in the figure, spatial relation terms are intended to also include different orientations of the device in use and operation. For example, if the device in the figure is flipped, then the element or feature described as “below,” “under,” or “below” other elements or features will be oriented “above” other elements or features. Therefore, the exemplary terms “below” and “under” can include both above and below orientations. The device may be otherwise oriented (rotated 90 degrees or otherwise) and the spatial descriptive terms used herein will be interpreted accordingly.

[0039] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the invention. When used herein, the singular forms “a,” “an,” and “ / the” are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising” and / or “comprising,” when used in this specification, identify the presence of features, integers, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups. When used herein, the term “and / or” includes any and all combinations of the associated listed items.

[0040] To fully understand this invention, detailed structures and steps will be presented in the following description to illustrate the technical solution proposed by this invention. Preferred embodiments of the invention are described in detail below; however, in addition to these detailed descriptions, the invention may have other embodiments.

[0041] This embodiment provides a test fixture 1, such as... Figures 1 to 3 As shown, the assembly includes a base 11, a junction box 12, a test connection assembly 13, and a tray 14. The base 11 includes a housing, a first groove on the upper surface of the housing, and a test connection end 112 on the housing, which is used to connect to a test device. The side wall of the first groove is provided with a first locking terminal 111, which is electrically connected to the test connection end 112. The outer wall of the junction box 12 is provided with a second locking terminal 121 corresponding to the first locking terminal 111. The junction box 12 is embedded in the first groove, and the first locking terminal 111 and the second locking terminal 121 are engaged. The test connection assembly 13 is disposed on the junction box 12 and includes a test pin 132, which is electrically connected to the second locking terminal 121. The tray 14 has a through hole and is disposed on the test connection assembly 13 for placing a PCB board 8. The test pin 132 passes through the through hole and is electrically connected to the test pads on the PCB board 8. The test device is used to test the PCB board 8.

[0042] The PCB board 8 is the charging pile control board in the charging pile. For example, the testing equipment is used to perform vehicle charging and discharging tests on the PCB board 8.

[0043] Understandably, the number and position of the first locking terminal 111, the second locking terminal 121, and the test connection terminal 112 can be determined based on the actual PCB board 8 being tested, and are not limited here.

[0044] As an example, the test connector 112 is connected to the test equipment via an adapter plug 114, which facilitates replacement according to test requirements.

[0045] As an example, the PCB board 8 can be fixed to the tray 14 by an additional fixing component 15, or the PCB can be fixed to the tray 14 by a fixing structure on the tray 14. This fixing structure can be a limiting structure or a snap-fit ​​structure, to ensure the accuracy and reliability of the test results.

[0046] As an example, when testing PCB board 8, PCB board 8 is placed on tray 14, ensuring that the test pads on PCB board 8 are electrically connected to the test pins 132. This allows the test pads to be electrically connected to the testing equipment via the test pins 132, the wiring in the junction box 12, the second locking terminal 121, the first locking terminal 111, and the test connection terminal 112, enabling the testing equipment to test the PCB. When it is necessary to replace PCB board 8 for testing, simply remove tray 14, test connection assembly 13, and junction box 12 in sequence, and readjust the layout of the test pins 132 in test connection assembly 13 and the wiring in junction box 12 connected to the test pins 132. This allows the replaced PCB board 8 to be retested, avoiding the need to replace the entire test fixture 1, thereby reducing testing costs and improving testing efficiency.

[0047] Furthermore, the test fixture 1 also includes a junction box fixing structure; this junction box fixing structure is connected to the base 11 and the junction box 12, and is used to fix the junction box 12 in the first groove when the junction box 12 is embedded in the first groove. Exemplarily, the junction box fixing structure includes a snap-fit ​​structure; the snap-fit ​​structure includes a snap-fit ​​and a limiting member; one snap-fit ​​and the limiting member are disposed on the base 11, and the other is disposed on the junction box 12, the snap-fit ​​and the limiting member engaging or disengaging. Optionally, the number of snap-fit ​​structures can be selected according to actual needs and is not limited here.

[0048] In this embodiment, the test fixture 1 includes a base 11, a junction box 12, a test connection assembly 13, and a support plate 14. The base 11 includes a housing, a first groove on the upper surface of the housing, and a test connection end 112 on the housing, which is used to connect to a test device. The side wall of the first groove is provided with a first locking terminal 111, which is electrically connected to the test connection end 112. The outer wall of the junction box 12 is provided with a second locking terminal 121 corresponding to the first locking terminal 111. The junction box 12 is embedded in the first groove, and the first locking terminal 111 and the second locking terminal 121 are engaged. The test connection assembly 13 is disposed on the junction box 12 for testing... The test connection assembly 13 includes a test pin 132, which is electrically connected to the second locking terminal 121. The tray 14 has a through hole and is set on the test connection assembly 13 for placing the PCB board 8. The test pin 132 passes through the through hole and is electrically connected to the test pad on the PCB board 8. The test equipment is used to test the PCB board 8. Thus, when the PCB board 8 is replaced for testing, only the layout of the test pin 132 in the test connection assembly 13 and the wiring connected to the test pin 132 in the junction box 12 need to be readjusted to retest the replaced PCB board 8, avoiding the need to replace the entire test fixture 1, thereby reducing testing costs and improving testing efficiency.

[0049] In one embodiment, the test fixture 1 further includes a fixing component 15, which is connected to the test box and is used to fix the PCB board 8 on the tray 14.

[0050] In this embodiment, the fixing component 15 is connected to the test box and is used to fix the PCB board 8 on the tray 14. When testing the PCB board 8, the PCB board 8 is fixed on the tray 14 to ensure stability and reliability during the testing process and improve the accuracy of the test results.

[0051] In one embodiment, the fixing assembly 15 includes a fixing bracket 151, a guide rod 152, a snap-fit ​​fixing plate 153, and a snap-fit ​​handle; the fixing bracket 151 is disposed on the test box; the fixing bracket 151 has a guide groove in the middle; the guide rod 152 is slidably connected to the guide groove; the snap-fit ​​fixing plate 153 is connected to the guide rod 152; the snap-fit ​​handle is connected to the guide rod 152 and is used to drive the guide rod 152 to slide relative to the guide groove, so that the snap-fit ​​fixing plate 153 fixes the PCB board 8 on the support plate 14.

[0052] As an example, the fixed bracket 151 is fixedly installed on the test box. The user adjusts the guide rod 152 to slide relative to the guide groove by pressing the handle, so that the guide rod 152 drives the pressing fixing plate 153 to fix the PCB board 8 on the tray 14, or loosens the PCB board 8 to replace different PCB boards 8 for testing.

[0053] As an example, the snap-fit ​​fixing plate 153 has a snap-fit ​​protrusion on the side opposite to the PCB board 8. When the snap-fit ​​fixing plate 153 fixes the PCB board 8 onto the support plate 14, the snap-fit ​​protrusion abuts against the PCB board 8. Exemplarily, the number and position of the snap-fit ​​protrusions can be set according to actual needs. The snap-fit ​​fixing plate 153 is detachably connected to the guide rod 152 to facilitate the replacement of different snap-fit ​​fixing plates 153 to adapt to different PCB boards 8.

[0054] In this embodiment, a fixed bracket 151 is mounted on the test box; a guide groove is provided in the middle of the fixed bracket 151; a guide rod 152 is slidably connected to the guide groove; a snap-fit ​​fixing plate 153 is connected to the guide rod 152; a snap-fit ​​handle is connected to the guide rod 152 and is used to drive the guide rod 152 to slide relative to the guide groove, so that the snap-fit ​​fixing plate 153 fixes the PCB board 8 on the support plate 14. The structure is simple, and at the same time, it ensures the stability and reliability of the PCB board 8 during the test.

[0055] In one embodiment, the test connection assembly 13 includes a pin fixing plate 131 and a test pin 132; the pin fixing plate 131 is provided with a pin fixing platform, and the test pin 132 is disposed on the pin fixing platform.

[0056] As an example, one side of the ejector pin fixing plate 131 is mounted on the junction box 12, and the other side is provided with ejector pin fixing platforms. The number, position, and height of the ejector pin fixing platforms can be set according to actual needs, and are used to fix the test ejector pins 132. The test ejector pins 132 pass through the ejector pin fixing platforms and are electrically connected to the wiring in the junction box 12, thereby realizing the transmission of electrical signals.

[0057] In this embodiment, the test connection assembly 13 includes a pin fixing plate 131 and a test pin 132. The pin fixing plate 131 is provided with a pin fixing platform, and the test pin 132 is placed on the pin fixing platform to fix the test pin 132 and ensure that the test pin 132 is more stable during the test.

[0058] This embodiment provides a testing system, such as Figure 4 As shown, it includes a testing device and the aforementioned testing fixture 1; the testing device is connected to the testing connection terminal 112 of the testing fixture 1 and is used to test the PCB board 8 on the testing fixture 1.

[0059] In one embodiment, PCB board 8 is a charging pile control board; the testing equipment is used to perform vehicle charging test and vehicle discharging test on PCB board 8.

[0060] In related technologies, vehicle charging and discharging tests of charging pile control boards only involve metrological testing of purely resistive loads and single detection ports. In this embodiment, the vehicle charging and discharging tests include multi-level adjustments to the power input to the charging pile control board, and multi-load cyclic testing with switching between resistive, inductive, and capacitive loads. This is to avoid safety hazards caused by overlooking detection of a single output port of the charging pile control board.

[0061] In one embodiment, the test connection terminal 112 includes a power connection terminal, a load connection terminal, and a first signal connection terminal; the power connection terminal is disposed on the first outer wall of the housing; the load connection terminal is disposed on the second outer wall of the housing; the first signal connection terminal is disposed on the third outer wall of the housing; the test equipment includes a main control device 2, an adjustable power supply 3, a load tester 4, and a multi-functional load 5; the output terminal of the adjustable power supply 3 is connected to the power connection terminal or the load connection terminal, and the second signal connection terminal of the adjustable power supply 3 is connected to the first signal connection terminal; the input terminal of the multi-functional load 5 is connected to the load connection terminal or the power connection terminal, and the third signal connection terminal of the multi-functional load 5 is connected to the first signal connection terminal; the load tester 4 is connected to the load connection terminal and the first signal connection terminal, or the load tester 4 is connected to the power connection terminal and the first signal connection terminal; the main control device 2 is connected to the adjustable power supply 3, the load tester 4, and the multi-functional load 5.

[0062] The first signal connection terminal, the second signal connection terminal, and the third signal connection terminal are used to test the CC signal and the CP signal.

[0063] As an example, when conducting a vehicle charging test, the adjustable power supply 3 acts as an external power source, and the multi-functional load 5 acts as the vehicle, enabling the vehicle charging test on the PCB board 8. When conducting a vehicle discharging test, the adjustable power supply 3 acts as the vehicle discharging source, and the multi-functional load 5 acts as the electrical load, enabling the vehicle discharging test on the PCB board.

[0064] As an example, the PCB board 8 is fixed in place by the test fixture 1 and electrically connected to the main control device 2, the adjustable power supply 3, the load tester 4, and the multi-functional load 5. The user can configure the operating parameters of the adjustable power supply 3, the load tester 4, and the multi-functional load 5 through the main control device 2. Then, the main control device 2 receives information such as voltage, current, frequency, leakage current, grounding continuity, and CP value from the adjustable power supply 3, the load tester 4, the test fixture 1, and the multi-functional load 5, and performs test analysis. For example, the main control device 2 comprehensively judges normal and abnormal conditions based on the information fed back from the adjustable power supply 3, the load tester 4, and the multi-functional load 5. If all information is normal, all test data of the PCB board 8 is stored, and the unique SN code of the PCB board 8 is written into the Flash memory of the PCB board 8. If there is an abnormality, an alarm is displayed on the main control device 2's interface. Furthermore, abnormal items can be tested step-by-step until the test data is normal. Furthermore, if an abnormal item is eliminated, the test process must be repeated to ensure that all test items are normal at once.

[0065] For example, the operating state of the multi-function load 5 can be adjusted, such as adjusting the resistive state of the multi-function load 5 to half-load output, adjusting the resistive state of the multi-function load 5 to full-load output, adjusting the resistive state of the multi-function load 5 to 1.25 times load output, adjusting the capacitive state of the multi-function load 5 to full-load output, adjusting the inductive state of the multi-function load 5 to full-load output, etc., thereby improving the test conditions and adapting to different test environments.

[0066] For example, leakage voltage and current are injected through adjustable power supply 3; for example, the adjustable power supply 3 is controlled to adjust the injected standard leakage voltage and current value according to the Type B leakage standard; the adjustable power supply 3 is controlled to adjust the injected standard leakage voltage and current value to 85% according to the Type B leakage standard; the adjustable power supply 3 is controlled to adjust the injected standard leakage voltage and current value to 115% according to the Type B leakage standard, thereby testing the performance of PCB board 8 under different leakage conditions.

[0067] In this embodiment, the testing equipment includes a main control device 2, an adjustable power supply 3, a load tester 4, and a multi-functional load 5. The output terminal of the adjustable power supply 3 is connected to the power connection terminal or the load connection terminal, and the second signal connection terminal of the adjustable power supply 3 is connected to the first signal connection terminal. The input terminal of the multi-functional load 5 is connected to the load connection terminal or the power connection terminal, and the third signal connection terminal of the multi-functional load 5 is connected to the first signal connection terminal. The load tester 4 is connected to the load connection terminal and the first signal connection terminal, or the load tester 4 is connected to the power connection terminal and the first signal connection terminal. The main control device 2 is connected to the adjustable power supply 3, the load tester 4, and the multi-functional load 5, thereby enabling multi-level adjustment of the power input to the charging pile control board, as well as multi-load cycle testing of resistive, inductive, and capacitive load switching, to avoid safety hazards caused by the omission of detection of a single output port of the charging pile control board.

[0068] In one embodiment, the upper surface of the housing is further provided with a charging gun holder 113, a plug 114, a socket 115 and a wire crimping terminal block 116; the first locking terminal 111 is electrically connected to the charging gun holder 113, the plug 114, the socket 115 and the wire crimping terminal block 116.

[0069] As an example, this allows the test equipment to be electrically connected not only to the PCB board 8 via the test connection terminal 112, but also to the PCB board 8 via the charging gun holder 113, plug 114, socket 115 and wire crimping terminal block 116 provided on the upper surface of the housing, thereby improving the flexibility of the electrical connection.

[0070] Exemplarily, the upper surface of the housing includes a first charging gun holder 113, a second charging gun holder 113, a plug 114, a socket 115, a first wire clamping terminal block 116, and a second wire clamping terminal block 116. The first charging gun holder 113, the first wire clamping terminal block 116, and the plug 114 are sequentially disposed on one side of the first groove, and the second charging gun holder 113, the second wire clamping terminal block 116, and the socket 115 are disposed on the other side of the first groove. The first charging gun holder 113 and the socket 115 are used together, the plug 114 and the second charging gun holder 113 are used together, and the first wire clamping terminal block 116 and the second wire clamping terminal block 116 are used together.

[0071] In one embodiment, the testing equipment further includes a leakage current switch 6; the output terminal of the adjustable power supply 3 is connected to the power supply connection terminal or the load connection terminal via the leakage current switch 6; the main control device 2 is also connected to the leakage current switch 6. In this embodiment, the output terminal of the adjustable power supply 3 is connected to the power supply connection terminal or the load connection terminal via the leakage current switch 6; the main control device 2 is also connected to the leakage current switch 6, so that the main control device 2 can also perform leakage current testing on the PCB board 8. For example, the leakage current switch 6 can be a type A leakage current switch 6 with a leakage current parameter of 30mA. During the test, the leakage current switch 6 can be manually observed to see if it trips automatically, which serves as a judgment on whether the system leakage current parameter and CCID parameter are normal.

[0072] In one embodiment, such as Figure 5 As shown, the testing system also includes a rotatable gimbal 7; the rotatable gimbal 7 is used to place the test fixture 1. In this embodiment, when the vehicle charging test is adjusted to the vehicle discharging test, the rotatable gimbal 7 can be rotated 180 degrees to adjust the relative positions of the first, second, and third outer walls of the base 11 housing relative to the adjustable power supply 3, the load tester 4, and the multi-functional load 5, thereby adjusting the relative positions between the power connection terminal, the load connection terminal, and the first signal connection terminal, facilitating interface wiring when the vehicle charging test is adjusted to the vehicle discharging test.

[0073] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included within the protection scope of the present invention.

Claims

1. A test system, characterized by, The test fixture, the test device and the rotatable holder are included; the test fixture includes a base, a terminal box, a test connection assembly and a supporting plate; The base includes a shell, a first groove arranged on the upper surface of the shell and a test connection end arranged on the shell, the test connection end being used for connecting the test device; a side wall of the first groove is provided with a first clamping terminal; the first clamping terminal is electrically connected with the test connection end; The outer wall of the terminal box is provided with a second clamping terminal corresponding to the first clamping terminal; the terminal box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal; The test connection assembly is arranged on the terminal box, and the test connection assembly includes a test pin, which is electrically connected with the second clamping terminal; The supporting plate is provided with a through hole arranged on the test connection assembly and used for placing a PCB board; the test pin passes through the through hole and is electrically connected with a test pad on the PCB board, and the test device is used for testing the PCB board; The test fixture further includes a terminal box fixing structure connected with the base and the terminal box, which is used for fixing the terminal box in the first groove when the terminal box is embedded in the first groove; The test connection end includes a power connection end, a load connection end and a first signal connection end; the test device includes a master control device, an adjustable power supply, a load tester and a multifunctional load; The power connection end is arranged on a first outer wall of the shell; the load connection end is arranged on a second outer wall of the shell; and the first signal connection end is arranged on a third outer wall of the shell; The first signal connection end is used for connecting a second signal connection end of the adjustable power supply, a third signal connection end of the multifunctional load and the load tester; The power connection end is used for connecting the adjustable power supply, and the load connection end is used for connecting the multifunctional load and the load tester; or the power connection end is used for connecting the multifunctional load and the load tester, and the load connection end is used for connecting the adjustable power supply; The master control device is connected with the adjustable power supply, the load tester and the multifunctional load; The rotatable holder is used for placing the test fixture, and interface wiring is performed when vehicle charging test is adjusted to vehicle discharging test.

2. The test system of claim 1, wherein, The test fixture further includes a fixing assembly connected with the terminal box and used for fixing the PCB board on the supporting plate.

3. The test system of claim 2, wherein, The fixing assembly includes a fixing support, a guide rod, a press buckle fixing plate and a press buckle handle; the fixing support is arranged on the terminal box; a middle part of the fixing support is provided with a guide groove; the guide rod is slidably connected with the guide groove; the press buckle fixing plate is connected with the guide rod; and the press buckle handle is connected with the guide rod and used for driving the guide rod to slide relative to the guide groove, so that the press buckle fixing plate fixes the PCB board on the supporting plate.

4. The test system of claim 1, wherein, The test connection assembly includes a test pin fixing plate and the test pin; A test pin fixing table is arranged on the test pin fixing plate, and the test pin is arranged on the test pin fixing table.

5. The test system of claim 1, wherein, The PCB board is a charging pile control board; the test equipment is used for vehicle charging test and vehicle discharging test on the PCB board.

6. The test system of claim 1, wherein, The upper surface of the shell is further provided with a charging gun seat, a plug, a socket and a wire pressing terminal table. The first clamping terminal is electrically connected with the charging gun seat, the plug, the socket and the wire pressing terminal table.

7. The test system of claim 1, wherein, The test equipment further comprises a leakage switch; an output end of the adjustable power supply is connected with the power supply connection end or the load connection end through the leakage switch; the master control equipment is further connected with the leakage switch.

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