A method and system for testing performance parameters of a DC regulated power supply

Abstract

The present application relates to the technical field of DC regulated power supply performance testing, and specifically to a method and system for testing the performance parameters of a DC regulated power supply. The method comprises: collecting output voltage data of the DC regulated power supply within a preset time period at each preset target output voltage; evenly dividing each preset time period into sub-time periods and numbering them according to a time sequence, obtaining the amplitude distribution coefficient of each identical frequency at each target output voltage; screening each ripple characteristic frequency; obtaining the amplitude change characteristic value of each identical ripple characteristic frequency in each identical sub-time period at all target output voltages; obtaining the ripple frequency difference of each identical ripple characteristic frequency; screening each ripple frequency from all identical ripple characteristic frequencies to obtain the ripple floating ratio of each target output voltage; and evaluating abnormal performance of the DC regulated power supply. The present application aims to achieve a comprehensive and accurate evaluation of the performance of a DC regulated power supply.

Description

Technical Field

[0001] The present application relates to the technical field of DC regulated power supply performance testing, and in particular to a method and system for testing performance parameters of a DC regulated power supply. Background Art

[0002] A DC regulated power supply is a device that outputs a stable DC voltage. Its primary function is to provide stable power to electronic devices, ensuring their proper operation and preventing damage from voltage fluctuations. A DC regulated power supply converts alternating current (AC) into direct current (DC) and utilizes a voltage stabilization circuit to ensure the output voltage remains stable despite load changes or input voltage fluctuations. Therefore, when using a DC regulated power supply, its performance must be tested.

[0003] Traditional methods typically check the stability of a DC regulated power supply's output voltage by measuring its output voltage threshold. However, due to the presence of significant electromagnetic waves during operation, which can affect the accuracy of measurement data, traditional methods fail to fully account for the impact of electromagnetic waves on DC regulated power supply measurement data. This leads to inaccurate test results when directly measuring DC regulated power supply performance. Summary of the Invention

[0004] In view of the above, it is necessary to provide a DC regulated power supply performance parameter testing method and system, which can achieve a comprehensive and accurate evaluation of the DC regulated power supply performance compared to the traditional DC regulated power supply performance parameter testing method:

[0005] In a first aspect, an embodiment of the present application provides a method for testing performance parameters of a DC regulated power supply, the method comprising the following steps:

[0006] Setting target output voltages of the DC regulated power supply and collecting output voltage data of the DC regulated power supply within a preset time period at each target output voltage;

[0007] Each preset time period is evenly divided into sub-time periods and numbered according to time sequence, the output voltage data in each sub-time period is converted to the frequency domain, and the amplitude distribution coefficient of each same frequency under each target output voltage is obtained by the distribution of the frequency amplitude of all sub-time periods under each target output voltage;

[0008] Filtering each ripple characteristic frequency from all the same frequencies by distributing the amplitude distribution coefficients of all the same frequencies at each target output voltage; obtaining the amplitude change characteristic value of each of the same ripple characteristic frequencies in each sub-period with the same sequence number by comparing the change in the frequency amplitude of each of the same ripple characteristic frequencies in each sub-period with the same sequence number at all target output voltages; obtaining the ripple same-frequency difference of each of the same ripple characteristic frequencies by comparing the increase in the frequency amplitude of each of the same ripple characteristic frequencies in each sub-period with the increase in the target output voltage, combined with the dispersion of the amplitude change characteristic value of each of the same ripple characteristic frequencies in all sub-periods with the same sequence number;

[0009] By distributing the ripple frequency differences of all the same ripple characteristic frequencies under all target output voltages, each ripple frequency is selected from all the same ripple characteristic frequencies. All ripple frequencies and frequency amplitudes under each target output voltage are converted to the time domain. By comparing each target output voltage with its time domain conversion result, the ripple floating ratio of each target output voltage is obtained.

[0010] The ripple-to-floating ratio is used to evaluate abnormalities in the performance of the DC regulated power supply.

[0011] In one embodiment, the process of obtaining the amplitude distribution coefficient is as follows:

[0012] Counting the minimum value of the frequency amplitudes of all sub-periods at the same frequency under each target output voltage, and calculating the kurtosis of the frequency amplitudes of all sub-periods at the same frequency under each target output voltage in the time series;

[0013] The amplitude distribution coefficient is proportional to the minimum value and inversely proportional to the kurtosis.

[0014] In one embodiment, the process of screening each ripple characteristic frequency from all the same frequencies is:

[0015] For each target output voltage, the maximum value of all amplitude distribution coefficients of the same frequency is counted, and the product of the maximum value and a preset positive number less than 1 is used as the segmentation threshold. The same frequency with an amplitude distribution coefficient greater than the segmentation threshold among all the same frequencies is taken as the ripple characteristic frequency.

[0016] In one embodiment, the process of obtaining the amplitude change characteristic value is as follows:

[0017] The frequency amplitudes of the same ripple characteristic frequencies in the same sub-periods are arranged in ascending order according to the size of the target output voltage to form frequency amplitude column vectors, and the mean of all positive numbers in the first-order difference vector of each frequency amplitude column vector is used as the amplitude change characteristic value of the same ripple characteristic frequency in the same sub-period.

[0018] In one embodiment, the process of obtaining the ripple same-frequency difference is as follows:

[0019] For the frequency amplitude column vectors of the same ripple characteristic frequency in all sub-periods with the same sequence number, count the total number of negative numbers and the total number of all elements in the first-order difference vectors of all frequency amplitude column vectors;

[0020] The ratio of the total number to the total number is calculated, and the ripple same-frequency difference is the product of the ratio and the dispersion.

[0021] In one embodiment, the process of screening each ripple frequency from all identical ripple characteristic frequencies is as follows:

[0022] The maximum value of the ripple same-frequency difference of all the same ripple characteristic frequencies is counted, and the difference between the maximum value and the ripple same-frequency difference of each same ripple characteristic frequency is recorded as the same-frequency difference. The product of the maximum value of all the same-frequency differences and a preset positive number less than 1 is used as the segmentation threshold, and the same ripple characteristic frequency corresponding to the same frequency difference greater than the segmentation threshold in all the same ripple characteristic frequencies is used as the ripple frequency.

[0023] In one embodiment, the process of obtaining the ripple floating ratio is as follows:

[0024] The difference between the maximum value of the time domain conversion result under each target output voltage and each target output voltage is recorded as the upward difference; the difference between each target output voltage and the minimum value of its time domain conversion result is recorded as the downward difference;

[0025] The ratios of the upward difference and the downward difference to each target output voltage are recorded as a first ratio and a second ratio respectively;

[0026] The ripple-to-floating ratio may be further determined by comparing the first ratio and the second ratio of each target output voltage.

[0027] In one embodiment, the ripple-to-floating ratio is the maximum value between the first ratio and the second ratio of each target output voltage.

[0028] In one embodiment, the method for evaluating the abnormal performance of a DC regulated power supply is as follows: when the ripple floating ratios of all target output voltages are less than a preset performance abnormality threshold, the performance of the DC regulated power supply is determined to be normal; otherwise, the performance of the DC regulated power supply is determined to be abnormal.

[0029] In the second aspect, an embodiment of the present application also provides a DC regulated power supply performance parameter testing system, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the processor executes the computer program, the steps of any one of the above-mentioned methods for testing the performance parameters of a DC regulated power supply are implemented.

[0030] This application has at least the following beneficial effects:

[0031] This application presets multiple target output voltages and collects actual output voltage data of the DC regulated power supply under multiple preset output voltages, providing more comprehensive basic data for subsequent analysis. It can more comprehensively reflect the output conditions of the DC regulated power supply under different working conditions, making the performance test results of the DC regulated power supply more reliable. The preset time period is divided into sub-time periods, and the output voltage data is converted to the frequency domain to obtain the amplitude distribution coefficient of the frequency. This can quantify the ripple effect of the DC regulated power supply, which is conducive to analyzing whether the voltage fluctuation of the DC regulated power supply is caused by noise or performance abnormality of the DC regulated power supply.

[0032] Furthermore, by screening the ripple characteristic frequencies and calculating the ripple same-frequency difference, the ripple characteristic frequencies that may represent the ripple effect can be identified, and the frequency amplitude change pattern and difference degree of the ripple characteristic frequencies under different target output voltages can be analyzed, thereby gaining a deeper understanding of the performance of the DC regulated power supply; by screening the ripple frequencies through the ripple same-frequency difference and converting them into the time domain to calculate the ripple floating ratio, the influence of sporadic noise such as electromagnetic interference can be eliminated, and the focus can be placed on the periodic ripple changes caused by abnormal performance of the DC regulated power supply, accurately quantifying the degree of fluctuation of the target output voltage; by evaluating the performance abnormalities of the DC regulated power supply through the ripple floating ratio, a comprehensive and accurate evaluation of the performance of the DC regulated power supply can be achieved, and potential faults can be discovered in a timely manner. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present application or the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0034] Figure 1 A flowchart of a method for testing performance parameters of a DC regulated power supply provided in one embodiment of the present application;

[0035] Figure 2 Schematic diagram of the process of obtaining the ripple frequency. DETAILED DESCRIPTION

[0036] In the description of the embodiments of this application, words such as "exemplary," "or," and "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary," "or," and "for example" is intended to present the relevant concepts in a concrete manner.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application relates. The terms used in this application are for the purpose of describing specific embodiments only and are not intended to limit this application. It should be understood that, unless otherwise indicated, " / " represents or.

[0038] It should also be noted that the terms "first" and "second" in this application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0039] The following describes in detail a method and system for testing performance parameters of a DC regulated power supply provided by the present application with reference to the accompanying drawings.

[0040] See also Figure 1 , which shows a flowchart of a method for testing performance parameters of a DC regulated power supply provided by an embodiment of the present application, the method comprising the following steps:

[0041] Step 1: Set target output voltages of the DC regulated power supply, and collect output voltage data of the DC regulated power supply within a preset time period at each target output voltage.

[0042] First, connect the smart meter in series to the output port of the DC regulated power supply. Adjust the output voltage using the knob on the power supply panel, set N different output voltages, and record them as target output voltages. After setting the target output voltage each time, use the smart meter to collect output voltage data at a sampling frequency of 1kHz for 10 seconds. Fill in the missing values ​​in the collected output voltage data. Among them, 1kHz and 10 seconds are only one embodiment of the present application. The implementer can set them according to the actual situation. This application does not impose any special restrictions.

[0043] In this embodiment, the value of N is 6, and the target output voltages are 6V, 12V, 18V, 24V, 30V and 36V respectively. The value of N and the target output voltage can be set by the implementer, and this application does not impose any special restrictions.

[0044] In this embodiment, the mean interpolation method is used to fill the missing values. The mean interpolation method is a well-known technology and will not be described in detail in this application. As other implementation methods, on the basis of being able to fill the missing values, the implementer can adopt other existing technologies, such as polynomial interpolation method, etc., and this application does not impose any special restrictions.

[0045] Step 2: Divide each preset time period evenly into sub-time periods and number them according to the time sequence, convert the output voltage data in each sub-time period into the frequency domain, and obtain the amplitude distribution coefficient of each same frequency under each target output voltage through the distribution of the frequency amplitude of all sub-time periods at each same frequency under each target output voltage.

[0046] When a DC regulated power supply experiences an anomaly, its output voltage will fluctuate, creating a phenomenon called ripple. Ripple is a periodic voltage fluctuation that causes the output voltage of a DC regulated power supply to fluctuate around the set value. This fluctuation can disrupt the stability of the power supply output, preventing electronic devices from receiving a stable DC voltage. In severe cases, the voltage fluctuation can cause electronic devices to malfunction, experience performance degradation, or even be damaged.

[0047] During operation, a DC regulated power supply is also subject to interference from the surrounding environment, such as electromagnetic waves and temperature, which can cause noise in the output voltage. Noise is sporadic and not periodic. Therefore, the preset time period at each target output voltage is evenly divided into sub-periods and arranged in a time sequence to analyze the output voltage variation of the DC regulated power supply within each sub-period.

[0048] In this embodiment, each preset time period is evenly divided into 10 sub-time periods. 10 is only one embodiment of the present application. The implementer can set the specific value according to the actual situation. This application does not impose any special restrictions.

[0049] Because periodic fluctuation is a frequency change, the output voltage data for each sub-interval at each target output voltage is converted to the frequency domain to obtain the frequencies and frequency amplitudes for each sub-interval at each target output voltage. This is used to characterize the degree and amplitude of fluctuation in the output voltage data for each sub-interval. The Fourier transform is used to convert the output voltage data for each sub-interval to the frequency domain. Fourier transform is a well-known technique and will not be described in detail in this application.

[0050] The ripple of the DC regulated power supply will cause all sub-intervals at each target output voltage to have the same frequency and the same frequency amplitude. Based on the above analysis, the amplitude distribution coefficient of each same frequency at each target output voltage is obtained by the distribution of the frequency amplitude of all sub-intervals at each target output voltage. The expression is:

[0051] Where, represents the amplitude distribution coefficient of all sub-periods at the same frequency of the i-th frequency under the f-th target output voltage; represents the minimum value of the frequency amplitude of the i-th frequency in all sub-periods under the f-th target output voltage; represents the kurtosis of the frequency amplitude of all sub-periods at the i-th same frequency under the f-th target output voltage in the time series; σ represents a preset positive number used to avoid the denominator being 0. The value of σ is preset manually and can be set by the implementer. In this embodiment, the value of σ is 0.01; wherein, the calculation of kurtosis is a well-known technology and will not be repeated in this application.

[0052] It should be noted that: when the performance of the DC regulated power supply is abnormal, the output voltage of the DC regulated power supply will produce ripples, and the ripples will cause periodic changes in the voltage. If the periodic change of the ripple is stronger, the frequency amplitude of the corresponding frequency will be larger, that is, the larger the minimum value of the frequency amplitude of the same frequency is, the stronger the ripple effect caused by the abnormal performance of the DC regulated power supply is; at the same time, in different sub-time periods, if the frequency amplitudes of the i-th same frequency are closer, the i-th same frequency can better represent the ripple effect, making the peak degree of the frequency amplitude of the i-th same frequency smaller.

[0053] Step 3: Filter each ripple characteristic frequency from all the same frequencies through the distribution of the amplitude distribution coefficients of all the same frequencies under each target output voltage; obtain the amplitude change characteristic value of each same ripple characteristic frequency in each sub-period with the same serial number through the change of the frequency amplitude of each same ripple characteristic frequency in each sub-period with the same serial number under all target output voltages; obtain the ripple same-frequency difference of each same ripple characteristic frequency through the growth of the frequency amplitude of each same ripple characteristic frequency in each sub-period with the increase of the target output voltage, combined with the discreteness of the amplitude change characteristic value of each same ripple characteristic frequency in all sub-periods with the same serial number.

[0054] Furthermore, the output voltage ripple caused by abnormal performance of the DC regulated power supply is a long-term effect, that is, it should exist in each sub-period, not just in a short period of time. Therefore, the larger the amplitude distribution coefficient of any same frequency is, the more representative the ripple effect of any same frequency is. Based on the above analysis, the maximum value of the amplitude distribution coefficient of all the same frequencies under each target output voltage is counted, and the product of the maximum value and a preset positive number less than 1 is used as the segmentation threshold. The same frequency with an amplitude distribution coefficient greater than the segmentation threshold among all the same frequencies under each target output voltage is used as the ripple characteristic frequency.

[0055] In this embodiment, in the process of screening the ripple characteristic frequency, the value of the preset positive number less than 1 is 0.5. The specific value of the preset positive number less than 1 is preset manually, and the implementer can set it according to actual conditions. This application does not impose any special restrictions.

[0056] When the performance of the DC regulated power supply is abnormal, as the output voltage increases, the filter circuit cannot work normally, causing the amplitude of the ripple to increase with the increase of the output voltage. However, the magnitude of the amplitude will not affect the change of the period, that is, the change of the ripple frequency. Therefore, the amplitude change characteristic value of each same ripple characteristic frequency in each same sub-period under all target output voltages is obtained by the change of the frequency amplitude of each same ripple characteristic frequency in each same sub-period under the same sequence number. Specifically, the frequency amplitude of each same ripple characteristic frequency in each same sub-period under all target output voltages is arranged in ascending order according to the size of the target output voltage to form a frequency amplitude column vector of each same ripple characteristic frequency in each same sub-period under the same sequence number, and the mean of all positive numbers in the first-order difference vector of each frequency amplitude column vector is used as the amplitude change characteristic value of each same ripple characteristic frequency in each same sub-period under the same sequence number. Among them, the first-order difference vector of each frequency amplitude column vector is obtained by the first-order difference method. The first-order difference method is a well-known technology and will not be described in detail in this application.

[0057] Furthermore, the ripple amplitude under different target output voltages will increase as the target output voltage increases. Therefore, when the same ripple characteristic frequency is formed by the ripple effect, the elements in the first-order difference vector of each frequency amplitude column vector are all positive. Based on the above analysis, the frequency amplitude of each same ripple characteristic frequency under all target output voltages in each sub-period with the same serial number increases as the target output voltage increases, combined with the discreteness of the amplitude change characteristic value of each same ripple characteristic frequency in all sub-periods with the same serial number, the ripple same-frequency difference of each same ripple characteristic frequency under all target output voltages is obtained. The expression is:

[0058] Where, Represents the ripple frequency difference of the jth same ripple characteristic frequency under all target output voltages; for the frequency amplitude column vectors of each same ripple characteristic frequency in all sub-periods with the same sequence number under all target output voltages, count the total number of negative numbers and the total number of all elements in the first-order difference vectors of all frequency amplitude column vectors; 、 represents the total quantity and the total number of the j-th ripple characteristic frequency with the same characteristic frequency under all target output voltages; It represents the dispersion of the amplitude change characteristic values ​​of the j-th same ripple characteristic frequency in all sub-intervals with the same sequence number under all target output voltages.

[0059] In this embodiment, the discreteness is the mean absolute deviation. The calculation of the mean absolute deviation is a well-known technology and will not be described in detail in this application. As other implementation methods, on the basis of being able to measure the degree of uneven distribution of the amplitude change characteristic value, the implementer may adopt other existing technologies, such as variance, standard deviation, etc., and this application does not impose any special restrictions.

[0060] It should be noted that when the DC regulated power supply exhibits abnormal performance, the ripple amplitude of the jth ripple characteristic frequency at different target output voltages will vary as the target output voltage increases. When the ripple amplitude of the jth ripple characteristic frequency exhibits regular changes as the target output voltage increases, the first-order difference vector of the frequency amplitude column vector will have fewer negative elements. Furthermore, more regular changes will result in smaller differences between the amplitude variation eigenvalues, i.e., smaller dispersion of the variation eigenvalues. This, in turn, results in smaller ripple frequency variance for the jth ripple characteristic frequency. The smaller the ripple frequency variance, the more likely the jth ripple characteristic frequency is caused by a performance issue with the DC regulated power supply.

[0061] Step 4: Filter each ripple frequency from all the same ripple characteristic frequencies through the distribution of the ripple same-frequency difference of all the same ripple characteristic frequencies under all target output voltages, convert all the ripple frequencies and frequency amplitudes under each target output voltage into the time domain respectively, and obtain the ripple floating ratio of each target output voltage by comparing each target output voltage with its time domain conversion result.

[0062] In order to obtain frequency data caused by performance problems of the DC regulated power supply, rather than frequency changes caused by electromagnetic interference. Through the distribution of ripple same-frequency differences of all the same ripple characteristic frequencies under all target output voltages, each ripple frequency is screened from all the same ripple characteristic frequencies, specifically: the maximum value of the ripple same-frequency differences of all the same ripple characteristic frequencies is counted, and the difference between the maximum value and the ripple same-frequency difference of each same ripple characteristic frequency is recorded as the same-frequency difference. The product of the maximum value of all the same-frequency differences and a preset positive number less than 1 is used as the segmentation threshold, and the same ripple characteristic frequency corresponding to the same frequency difference greater than the segmentation threshold in all the same ripple characteristic frequencies is used as the ripple frequency. The schematic diagram of the ripple frequency acquisition process is shown as follows. Figure 2 shown.

[0063] In this embodiment, in the process of screening the ripple frequency, the value of the preset positive number less than 1 is 0.5. The specific value of the preset positive number less than 1 is preset manually, and the implementer can set it according to actual conditions. This application does not impose any special restrictions.

[0064] Furthermore, all ripple frequencies and their frequency amplitudes at each target output voltage, as well as the frequency and its frequency amplitude at a frequency of 0, are used as inputs to the inverse Fourier transform algorithm, outputting a ripple data sequence at each target output voltage. The inverse Fourier transform algorithm is a well-known technique and will not be described in detail in this application. By comparing each target output voltage with the elements in its ripple data sequence, the ripple floating ratio of each target output voltage is obtained, as expressed by:

[0065] Where, Indicates the ripple floating ratio of the kth target output voltage; max() indicates the maximum value operation; min() indicates the minimum value operation; represents the ripple data sequence under the kth target output voltage; Indicates the kth target output voltage. Recorded as the first difference, Recorded as the second difference, Recorded as the first ratio, Recorded as the second ratio.

[0066] It should be noted that: the stronger the ripple effect of the DC regulated power supply, the greater the fluctuation amplitude of the ripple data, the greater the difference between the maximum fluctuation value and the target output voltage, and the larger the ripple floating ratio of the target output voltage; the larger the ripple floating ratio, the more likely the performance of the DC regulated power supply is to be abnormal.

[0067] Step 5: Evaluate the abnormality of the performance of the DC regulated power supply through the ripple-to-floating ratio.

[0068] Furthermore, the ripple floating ratio is used to evaluate the abnormal performance of the DC regulated power supply. Specifically, when the ripple floating ratios of all target output voltages are less than the preset performance abnormality threshold, the performance of the DC regulated power supply is determined to be normal; otherwise, the performance of the DC regulated power supply is determined to be abnormal.

[0069] In this embodiment, the value of the preset performance abnormality threshold is 1%. The value of the preset performance abnormality threshold is preset manually and can be set by the implementer. This application does not impose any special restrictions.

[0070] Based on the same inventive concept as the above method, an embodiment of the present application also provides a DC regulated power supply performance parameter testing system, including a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, the steps of any one of the above-mentioned DC regulated power supply performance parameter testing methods are implemented.

[0071] In summary, the present application presets multiple target output voltages and collects actual output voltage data of the DC regulated power supply under multiple preset output voltages, thereby providing more comprehensive basic data for subsequent analysis, and can more comprehensively reflect the output conditions of the DC regulated power supply under different working conditions, making the performance test results of the DC regulated power supply more reliable; by dividing the preset time period into sub-time periods and converting the output voltage data into the frequency domain to obtain the amplitude distribution coefficient of the frequency, the ripple effect of the DC regulated power supply can be quantified, which is conducive to analyzing whether the voltage fluctuation of the DC regulated power supply is caused by noise or by abnormal performance of the DC regulated power supply;

[0072] Furthermore, by screening the ripple characteristic frequencies and calculating the ripple same-frequency difference, the ripple characteristic frequencies that may represent the ripple effect can be identified, and the frequency amplitude change pattern and difference degree of the ripple characteristic frequencies under different target output voltages can be analyzed, thereby gaining a deeper understanding of the performance of the DC regulated power supply; by screening the ripple frequencies through the ripple same-frequency difference and converting them into the time domain to calculate the ripple floating ratio, the influence of sporadic noise such as electromagnetic interference can be eliminated, and the focus can be placed on the periodic ripple changes caused by abnormal performance of the DC regulated power supply, accurately quantifying the degree of fluctuation of the target output voltage; by evaluating the performance abnormalities of the DC regulated power supply through the ripple floating ratio, a comprehensive and accurate evaluation of the performance of the DC regulated power supply can be achieved, and potential faults can be discovered in a timely manner.

[0073] The flowcharts and block diagrams in the accompanying drawings show the possible implementation architectures, functions and operations of the systems, methods and computer program products according to the embodiments of the present disclosure. In this regard, each box in the flowchart or block diagram can represent a module, program segment or part of the code, and the module, program segment or part of the code contains one or more executable instructions for implementing the specified logical functions. In some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, or they can sometimes be executed in the opposite order, which can depend on the functions involved. In the descriptions corresponding to the flowcharts and block diagrams in the accompanying drawings, the operations or steps corresponding to different boxes can also occur in an order different from that disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two consecutive operations or steps can actually be executed substantially in parallel, or they can sometimes be executed in the opposite order, which can depend on the functions involved. Each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented by a dedicated hardware-based system that performs the specified function or action, or may be implemented by a combination of dedicated hardware and computer instructions.

[0074] It is obvious to those skilled in the art that the present application is not limited to the details of the above exemplary embodiments, and that the present application can be implemented in other specific forms without departing from the basic characteristics of the present application. Therefore, from all perspectives, the above embodiments of the present application should be regarded as exemplary and non-restrictive.

Claims

1. A method for testing performance parameters of a DC regulated power supply, characterized in that: The method comprises the following steps: Setting target output voltages of the DC regulated power supply and collecting output voltage data of the DC regulated power supply within a preset time period at each target output voltage; Each preset time period is evenly divided into sub-time periods and numbered according to time sequence, the output voltage data in each sub-time period is converted to the frequency domain, and the amplitude distribution coefficient of each same frequency under each target output voltage is obtained by the distribution of the frequency amplitude of all sub-time periods under each target output voltage; Filtering each ripple characteristic frequency from all the same frequencies by distributing the amplitude distribution coefficients of all the same frequencies at each target output voltage; obtaining the amplitude change characteristic value of each of the same ripple characteristic frequencies in each sub-period with the same sequence number by comparing the change in the frequency amplitude of each of the same ripple characteristic frequencies in each sub-period with the same sequence number at all target output voltages; obtaining the ripple same-frequency difference of each of the same ripple characteristic frequencies by comparing the increase in the frequency amplitude of each of the same ripple characteristic frequencies in each sub-period with the increase in the target output voltage, combined with the dispersion of the amplitude change characteristic value of each of the same ripple characteristic frequencies in all sub-periods with the same sequence number; By distributing the ripple frequency differences of all the same ripple characteristic frequencies under all target output voltages, each ripple frequency is selected from all the same ripple characteristic frequencies. All ripple frequencies and frequency amplitudes under each target output voltage are converted to the time domain. By comparing each target output voltage with its time domain conversion result, the ripple floating ratio of each target output voltage is obtained. The ripple-to-floating ratio is used to evaluate abnormalities in the performance of the DC regulated power supply.

2. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The process of obtaining the amplitude distribution coefficient is as follows: Counting the minimum value of the frequency amplitudes of all sub-periods at the same frequency under each target output voltage, and calculating the kurtosis of the frequency amplitudes of all sub-periods at the same frequency under each target output voltage in the time series; The amplitude distribution coefficient is proportional to the minimum value and inversely proportional to the kurtosis.

3. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The process of screening each ripple characteristic frequency from all the same frequencies is as follows: For each target output voltage, the maximum value of all amplitude distribution coefficients of the same frequency is counted, and the product of the maximum value and a preset positive number less than 1 is used as the segmentation threshold. The same frequency with an amplitude distribution coefficient greater than the segmentation threshold among all the same frequencies is taken as the ripple characteristic frequency.

4. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The process of obtaining the amplitude change characteristic value is as follows: The frequency amplitudes of the same ripple characteristic frequencies in the same sub-periods are arranged in ascending order according to the size of the target output voltage to form frequency amplitude column vectors, and the mean of all positive numbers in the first-order difference vector of each frequency amplitude column vector is used as the amplitude change characteristic value of the same ripple characteristic frequency in the same sub-period.

5. A method for testing performance parameters of a DC regulated power supply according to claim 4, characterized in that: The process of obtaining the ripple frequency difference is as follows: For the frequency amplitude column vectors of the same ripple characteristic frequency in all sub-periods with the same sequence number, count the total number of negative numbers and the total number of all elements in the first-order difference vectors of all frequency amplitude column vectors; The ratio of the total number to the total number is calculated, and the ripple same-frequency difference is the product of the ratio and the dispersion.

6. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The process of screening each ripple frequency from all the same ripple characteristic frequencies is as follows: The maximum value of the ripple same-frequency difference of all the same ripple characteristic frequencies is counted, and the difference between the maximum value and the ripple same-frequency difference of each same ripple characteristic frequency is recorded as the same-frequency difference. The product of the maximum value of all the same-frequency differences and a preset positive number less than 1 is used as the segmentation threshold, and the same ripple characteristic frequency corresponding to the same frequency difference greater than the segmentation threshold in all the same ripple characteristic frequencies is used as the ripple frequency.

7. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The process of obtaining the ripple floating ratio is as follows: The difference between the maximum value of the time domain conversion result at each target output voltage and each target output voltage is recorded as the upward difference; The difference between each target output voltage and the minimum value in the time domain conversion result is recorded as the downward difference; The ratios of the upward difference and the downward difference to each target output voltage are recorded as a first ratio and a second ratio respectively; The ripple-to-floating ratio may be further determined by comparing the first ratio and the second ratio of each target output voltage.

8. A method for testing performance parameters of a DC regulated power supply according to claim 7, characterized in that: The ripple-to-floating ratio is a maximum value between the first ratio and the second ratio of each target output voltage.

9. A method for testing performance parameters of a DC regulated power supply according to claim 1, characterized in that: The method for evaluating the abnormal performance of the DC regulated power supply is as follows: when the ripple floating ratio of all target output voltages is less than a preset performance abnormality threshold, the performance of the DC regulated power supply is determined to be normal; otherwise, the performance of the DC regulated power supply is determined to be abnormal.

10. A DC regulated power supply performance parameter testing system, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method for testing performance parameters of a DC regulated power supply as described in any one of claims 1 to 9 are implemented.

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