IO function test system and automatic test method

Abstract

The invention relates to the technical field of communication, and provides an IO function test system and an automatic test method. The system comprises a testing device, a signal input device and a device to be tested. And the test device is used for sending an input instruction to the signal input device, and the input instruction is used for indicating the signal input device to send a test input signal to the at least one input port. And the signal input device is used for responding to the received input instruction and respectively sending a test input signal to the at least one input port. And the to-be-tested device is used for responding to the received test input signal, executing calibration processing on the test input signal to obtain a calibration signal, and sending at least one calibration signal to the test device. And the testing device is also used for outputting a first testing result in response to the received at least one calibration signal. The test efficiency of the IO controller can be improved, the manual test cost is reduced, and the influence of the test environment on the test accuracy is reduced.

Description

Technical Field

[0001] This application relates to the field of communication technologies, and in particular, to an IO function test system and an automated test method. Background Art

[0002] IO controllers (Input / Output Controllers) are widely used in technical fields such as industrial automation, embedded systems, the Internet of Things, and computer systems, and are core components connecting physical devices and digital systems. The port test of an IO controller is a key link to ensure the reliability, security, and efficiency of the system, including the tests of DI (Digital Input) ports, DO (Digital Output) ports, and AI (Analog Input) ports.

[0003] In traditional technical solutions, testers can perform tests on different test items for each port of the IO controller one by one. However, with the increase in the number of ports, the manual testing method not only requires a large amount of time and labor costs, but also has a high risk of misoperation; in addition, due to environmental factors (temperature and humidity factors) affecting the input signals received by the input ports of the IO controller (including DI ports and AI ports), the accuracy of port testing of the IO controller is different in different environments, that is, the same test standard cannot adapt to different test environments. Summary of the Invention

[0004] Embodiments of this application provide an IO function test system and an automated test method, which solve the problems of low manual test efficiency and large test errors caused by environmental factor interference through an automated test process and a signal calibration mechanism, and significantly improve the test accuracy, test efficiency, and test reliability of the IO controller.

[0005] In a first aspect, this application provides an IO function test system. The IO function test system at least includes: a test device, a signal input device, and a device under test. The test device and the device under test are in a first connection state, the test device and the signal input device are in a second connection state, and the device under test at least includes a plurality of input ports. The signal input device and the plurality of input ports are in a third connection state respectively.

[0006] The test device is configured to send an input instruction to the signal input device. The input instruction is used to instruct the signal input device to send test input signals to at least one input port respectively, and the at least one input port is at least one of the plurality of input ports.

[0007] The signal input device is configured to, in response to the received input instruction, send test input signals to at least one input port respectively.

[0008] The device under test is configured to perform calibration processing on the received test input signal in response to the received test input signal, obtain a calibration signal, and thus obtain at least one calibration signal. The at least one calibration signal corresponds one-to-one with at least one input port.

[0009] The device under test is further configured to send at least one calibration signal to the test device.

[0010] The test device is further configured to output a first test result in response to the received at least one calibration signal.

[0011] In some embodiments, the IO function test system further includes: a signal output device. The signal output device is in a second connection state with the test device. The device under test further includes at least one output port. The test device is further configured to: send a first configuration instruction to the device under test, where the first configuration instruction is used to instruct the device under test to determine at least one updated output signal corresponding to the at least one output port, and the at least one updated output signal corresponds one-to-one with the at least one output port. Send a first query instruction to the signal output device, where the first query instruction is used to obtain the at least one updated output signal. In response to the received at least one updated output signal, based on the first configuration instruction and the at least one updated output signal, output a second test result.

[0012] In some embodiments, the first test result is an input normal result or an input abnormal result, and the second test result is an output normal result or an output abnormal result.

[0013] The steps for the test device to output the first test result based on at least one calibration signal include: determining whether at least one calibration signal is within a preset signal range. If all of the at least one calibration signals are within the preset signal range, then output an input normal result. If there is an abnormal calibration signal among the at least one calibration signals, then output an input abnormal result. The abnormal calibration signal is a signal among the at least one calibration signals that is not within the preset signal range, and the input abnormal result is used to indicate that the input port corresponding to the abnormal calibration signal is abnormal.

[0014] The steps for the test device to output the second test result in response to the received at least one updated output signal, based on the first configuration instruction and the at least one updated output signal, include: determining whether the configuration signal corresponding to the first configuration instruction is the same as the at least one updated output signal. If the configuration signal is the same as all of the at least one updated output signals, then output a normal result. If there is an abnormal updated output signal among the at least one updated output signals, then output an abnormal result. The abnormal updated output signal is a signal among the at least one updated output signals that is different from the configuration signal, and the output abnormal result is used to indicate that the output port corresponding to the abnormal updated output signal is abnormal.

[0015] In some embodiments, if the first test result is a normal input result and the second test result is a normal output result, the test device is further configured to: send a linkage control instruction to the device under test, record the current moment as the first moment, and the linkage control instruction is used to instruct the device under test to determine a linkage output signal. Send a second query instruction to the signal output device at the second moment, where the second query instruction is used to obtain the linkage output signal, and the second moment is a moment after the first moment and at an interval of a first preset time period from the first moment. In response to the received linkage output signal, based on the linkage control instruction, output a third test result. If the linkage output signal matches the linkage control instruction, the third test result is used to characterize that the device under test is in a normal linkage control state. If the linkage output signal does not match the linkage control instruction, the third test result is used to characterize that the device under test is in an abnormal linkage control state.

[0016] In some embodiments, the linkage control instruction at least includes a preset time condition, and the device under test is further configured to: in response to the received linkage control instruction, determine the linkage output signal, and record the current moment as the third moment. Determine whether the third moment meets the preset time condition. If the third moment meets the preset time condition, send the linkage output signal to the signal output device.

[0017] In some embodiments, the linkage control instruction further includes a preset influence condition, and the device under test is further configured to: send the preset influence condition to the signal input device, and the preset influence condition is used to obtain an influence signal corresponding to the preset influence condition. The step of the device under test determining the linkage output signal in response to the received linkage control instruction includes: in response to the received linkage control instruction and the influence signal, determining the linkage output signal.

[0018] In some embodiments, the test device is further configured to: send an active reporting instruction to the device under test, and the active reporting instruction is used to instruct the device under test to send a target response message to the test device after detecting a target input signal. Send a target input instruction to the signal input device, and the target input instruction is used to instruct the signal input device to send a target input signal to the device under test. If the target response message is monitored, output a fourth test result, and the fourth test result is used to characterize that the active reporting function of the device under test is normal.

[0019] In some embodiments, the test device is further configured to: send a reset instruction to the device under test, and the reset instruction is used to instruct the device under test to change the current state to the initial state.

[0020] In some embodiments, at least one input port is a digital input port or an analog input port.

[0021] In some embodiments, the test input signal is a voltage signal or a current signal.

[0022] Second aspect, the present application provides an automated testing method, which is applied to the IO function testing system in any one of the above first aspects. The automated testing method includes: sending an input instruction to the signal input device through the testing device, where the input instruction is used to instruct the signal input device to send a test input signal to the device under test. The signal input device responds to the received input instruction and sends a test input signal to the device under test. The device under test responds to the received test input signal, performs calibration processing on the test input signal, and obtains a calibration signal. The device under test sends the calibration signal to the testing device. The testing device responds to the received calibration signal and outputs a first test result.

[0023] Third aspect, the present application provides a chip, which is applied to the IO function testing system in any one of the above first aspects.

[0024] Fourth aspect, the present application provides an electronic device, including a processor and a memory. The processor is used to execute a computer program stored in the memory to implement the IO function testing system in any one of the above first aspects. Or,

[0025] The electronic device includes the chip in the third aspect.

[0026] Fifth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. The computer program is applied to the IO function testing system in any one of the above first aspects by a processor.

[0027] In the technical solution provided by the present application, the IO function testing system can send an input instruction to the signal input device through the testing device, instructing the signal input device to send a test input signal to at least one input port respectively. After receiving the test input signal, the device under test performs calibration processing on the test input signal to obtain a calibration signal, so as to obtain at least one calibration signal, and the at least one calibration signal corresponds to the at least one input port one by one. After generating at least one calibration signal, the device under test sends at least one calibration signal to the testing device. The testing device can output a first test result based on the received at least one calibration signal. The IO function testing system can automatically test the device under test through the testing device, avoid operation errors caused by manual testing, improve the accuracy of the test result, reduce the cost of manual testing, and improve the testing efficiency of the IO controller. In addition, the device under test can also perform calibration processing on the read test input signal to reduce the influence of the test environment on the test result, thereby further improving the accuracy of the test result. Description of the Drawings

[0028] To more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0029] Figure 1 It is a schematic structural diagram of an IO function test system provided by an embodiment of the present application;

[0030] Figure 2 It is a schematic diagram of the input port test process of an IO function test system provided by an embodiment of the present application;

[0031] Figure 3 It is a schematic diagram of the output port test process of an IO function test system provided by an embodiment of the present application;

[0032] Figure 4 It is a schematic diagram of the linkage control function test process of an IO function test system provided by an embodiment of the present application;

[0033] Figure 5 It is a schematic diagram of the active reporting function test process of an IO function test system provided by an embodiment of the present application;

[0034] Figure 6 It is a schematic diagram of the process of an automated test method provided by an embodiment of the present application;

[0035] Figure 7 It is a schematic structural diagram of an electronic device provided by an embodiment of the present application. Detailed implementation manners

[0036] It should be understood that, on the premise of no logical conflict, the above-mentioned various embodiments of the application can be combined and implemented with each other to meet the actual application requirements. The specific embodiments or implementation schemes obtained after these combinations still fall within the protection scope of the present application.

[0037] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. However, those skilled in the art should clearly understand that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from interfering with the description of the present application.

[0038] It should be understood that, as used in the specification of this application and the appended claims, the term "comprising" indicates the presence of the described features, integers, steps, operations, elements and / or components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or their combinations.

[0039] It should also be understood that the term "and / or" as used in the specification of this application and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0040] As used in the specification of this application and the appended claims, the term "if" can be interpreted, depending on the context, as "when", "once", "in response to determining", or "in response to detecting". Similarly, the phrase "if determined" or "if [the described condition or event] is detected" can be interpreted, depending on the context, to mean "once determined", "in response to determining", "once [the described condition or event] is detected", or "in response to detecting [the described condition or event]".

[0041] In addition, in the description of the specification of this application and the appended claims, the terms "first", "second", "third", etc. are used only for differentiating descriptions and should not be construed as indicating or implying relative importance.

[0042] Reference to "one embodiment" or "some embodiments" or the like described in the specification of this application means that a particular feature, structure, or characteristic described in connection with that embodiment is included in one or more embodiments of this application. Thus, statements such as "in one embodiment", "in some embodiments", "in other some embodiments", "in still other embodiments", etc. that appear in different places in this specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized. The terms "comprising", "including", "having", and their variants all mean "including but not limited to", unless otherwise specifically emphasized.

[0043] The IO controller can be applied to fields that require real-time data acquisition, signal processing, and device control, such as industrial automation, robotics, intelligent building and building automation, automotive electronics, medical devices, energy management, Internet of Things and smart home, aerospace, and other technical fields. The IO controller can include DI ports, DO ports, and AI ports.

[0044] Among them, the DI port can be used to detect the switch state of external devices (0 or 1, corresponding to low level / high level, open / closed, etc.). The DO port can be used to send switch commands to external devices (0 or 1, corresponding to off / on). The AI port can be used to collect analog quantities of voltage (such as 0 - 10V) or current (such as 4 - 20mA), reflecting the continuous change of physical quantities.

[0045] In some application scenarios, when the IO controller detects that the currently collected data meets the preset trigger conditions, it can also perform an active reporting function or a linkage control function.

[0046] The port test of the IO controller is a key link to ensure the reliability, security, and efficiency of the system. In traditional technical solutions, testers can test multiple ports of the IO controller one by one for different test items. However, as the number of ports of the IO controller increases, the manual testing method not only consumes a large amount of time and labor costs, but also has a high risk of misoperation.

[0047] In addition, due to environmental factors (temperature and humidity factors) affecting the input signals received by the input ports of the IO controller (including DI ports and AI ports), the accuracy rate of port testing of the IO controller is different in different environments (that is, the same test standard cannot adapt to different test environments), and the test difficulty of the IO controller is relatively high.

[0048] In view of this, the present application provides an IO function test system, which can improve the test efficiency of the IO controller, reduce the manual test cost, and reduce the influence of the test environment on the test accuracy rate.

[0049] As Figure 1 shown, it is a schematic structural diagram of an IO function test system provided by an embodiment of the present application. As Figure 1 shown, the IO function test system may include: a test device, a device under test, a signal input device, and a signal output device.

[0050] Among them, the test device can be a host computer. The host computer can be deployed with a test script, and the host computer can send signals to the device under test, the signal input device, or the signal output device according to the test script. The test script can be a basic process framework for testing built based on the pytest library and developed by the Python language (a computer programming language), or a script developed by other languages. The present application does not make any limitations here.

[0051] The test device and the device under test can be in a first connection state. In the embodiment of the present application, the first connection state can be a network cable connection or an RS485 - 2 serial cable connection.

[0052] In some embodiments, the first connection state can also be an Ethernet connection and an RS485-2 serial port connection.

[0053] The device under test can be an IO controller or a device or equipment provided with an IO controller. The device under test can include one or more AI ports, one or more DI ports, and one or more DO ports.

[0054] The test device can be in a second connection state with the signal input device, and the second connection state can be a USB connection.

[0055] The signal input device (IO co-test device 1) can be a device with voltage / current generation function and multi-channel voltage / current output function. Exemplarily, the test device can send an input instruction to the signal input device based on a USB connection cable, and the signal input device generates a test input signal in response to the received input instruction. It should be understood that when the input instruction is a current generation instruction, the test input signal is a current signal, and when the input instruction is a voltage generation instruction, the test input signal is a voltage signal.

[0056] The signal input device can be in a third connection state with one or more AI ports and one or more DI ports of the device under test, and the third connection state can be a line connection state.

[0057] The test device can also be in a second connection state with the signal output device, and the signal output device can be in a third connection state with one or more DO ports of the device under test.

[0058] The signal output device can be a device supporting multi-channel voltage input detection function. Exemplarily, the test device can send a query instruction to the signal output device, and the signal output device then obtains the updated output signals of one or more DO ports of the device under test in response to the received query instruction and sends the updated output signals to the test device.

[0059] In the technical solution provided by the embodiments of the present application, the IO function test system can be used to detect the input ports (including AI ports and DI ports) of the device under test, can also be used to detect the output ports (such as DO ports) of the device under test, and can also be used to test the active reporting function and linkage control function of the device under test.

[0060] The following combines Figures 2 to 5 the examples in

[0061] to describe the technical solution of the embodiments of the present application. Figure 2 As shown in

[0062] Step S201: The test device sends an input instruction to the signal input device. The input instruction is used to instruct the signal input device to send test input signals to at least one input port respectively, and the at least one input port is at least one of multiple input ports.

[0063] In the embodiment of the present application, before the test device sends an input instruction to the signal input device, it may also send a reset instruction to the device under test. In response to the received reset instruction, the device under test changes its current state to the initial state. It should be understood that the initial state is the state in which the test device is restored to the preset initial value.

[0064] In the embodiment of the present application, before the test device detects the input ports of the device under test, it sends a reset instruction to the device under test, instructing the device under test to change its current state to the initial state. It can clear the temporary error state of the device under test and re-initialize the peripheral parameters of the device under test, ensuring that the device under test starts running from a known stable starting point, so as to improve the accuracy of the input port test of the device under test and the reliability of the test results.

[0065] The input instruction can be the input instruction corresponding to the test script deployed in the test device, or the input instruction deployed by the user through the test device. The embodiment of the present application does not limit the generation method of the input instruction.

[0066] The input instruction is used to instruct the signal input device to send test input signals to at least one input port respectively. When the input instruction is a current input instruction, the test input signal is a current signal. When the input instruction is a voltage input instruction, the test input signal is a voltage signal.

[0067] In the embodiment of the present application, the input instruction may include a signal input value and port information. The signal input value is used to limit the numerical value of the test input signal, and the port information is used to limit the input port.

[0068] For example, when the input instruction is a voltage input instruction, the signal input value is 1V, and the port information is all DI ports, the signal input device responds to the input instruction and sends a 1V voltage signal to each of the multiple DI ports of the device under test.

[0069] For another example, when the input instruction is a current input instruction, the signal input value is 2A, and the port information is all AI ports, the signal input device responds to the input instruction and sends a 2A current signal to each of the multiple AI ports of the device under test.

[0070] Step S202: The signal input device responds to the received input instruction and sends test input signals to at least one input port respectively.

[0071] The signal input device generates a test input signal in response to the received input instruction, and sends the test input signal to at least one input port corresponding to the port information in the input instruction.

[0072] Step S203: The device under test responds to the received test input signal, performs calibration processing on the test input signal to obtain a calibration signal, so as to obtain at least one calibration signal, and the at least one calibration signal corresponds to the at least one input port one by one.

[0073] In the embodiment of the present application, before the test starts, the test device can determine calibration parameters (such as step size or formula coefficient) according to the current test environment (temperature and humidity factors), and send the calibration parameters (such as step size or formula coefficient) to the device under test. The device under test can then perform calibration processing on the test input signal according to the calibration parameters (such as step size or formula coefficient) to obtain a calibration signal, so as to obtain at least one calibration signal.

[0074] Exemplarily, if the voltage difference between the voltage value read and the true voltage value is usually about -0.2V when the device under test is in the first test environment, the calibration step size can be 0.2V.

[0075] For example, the current test environment is the first test environment, the calibration parameter is the step size, and the step size is 0.2V. If the test input signal received by the device under test through the first DI port is 0.8V, then after the device under test performs calibration processing on the test input signal, the calibration signal corresponding to the first DI port obtained is 0.8V + 0.2V = 1V.

[0076] The test device can perform calibration processing on at least one test input signal received by at least one input port (AI port or DI port) according to the calibration step size or calibration formula, so as to obtain at least one calibration signal.

[0077] Step S204: The device under test sends at least one calibration signal to the test device.

[0078] In the embodiment of the present application, after the test device executes the above step S201 to send an input instruction to the signal input device, it can also send a query instruction to the device under test at an interval of a preset time period to obtain at least one calibration signal. After receiving the query instruction, the device under test sends at least one calibration signal to the test device.

[0079] Specifically, after the test device executes the above step S201, it can also record the moment when the input instruction is sent to the signal input device as the starting moment, and send a query instruction to the device under test at the ending moment that is at an interval of a preset time interval from the starting moment.

[0080] In the embodiments of the present application, the preset time interval between the start time and the end time can be time intervals such as 0.1 s, 0.15 s, 0.5 s, etc., and the present application does not limit this. It should be understood that the preset time interval is positively correlated with the time required for the device under test to generate at least one calibration signal after receiving the test input instruction.

[0081] Step S205: The test device outputs a first test result in response to at least one received calibration signal.

[0082] The test device can determine the first test result based on at least one received calibration signal, according to at least one calibration signal and the input instruction, and generate a first test report according to the first test result. The test device can generate the first test report through the allure library or by other means, and the present application does not limit this.

[0083] Specifically, the first test result is a normal input result or an abnormal input result. The test device can determine a preset signal range according to the signal input value corresponding to the input instruction, and judge whether at least one calibration signal is within the preset signal range. If at least one calibration signal is within the preset signal range, a normal input result is output. If there is an abnormal calibration signal among at least one calibration signal, an abnormal input result is output. The abnormal calibration signal is a signal that is not within the preset signal range among at least one calibration signal, and the abnormal input result is used to characterize that the input port corresponding to the abnormal calibration signal is abnormal.

[0084] In some embodiments, after the test device outputs the first test result, it can also send a reset instruction to the device under test, instructing the device under test to change the current state to the initial state. To re-initialize the peripheral parameters of the device under test, facilitate the test device to execute the subsequent test process, and improve the reliability of the test result of the IO controller.

[0085] In the technical solution provided by the embodiment of the present application, the IO function test system can send an input instruction to the signal input device through the test device, instructing the signal input device to send test input signals to at least one input port respectively. After receiving the test input signals, the device under test performs calibration processing on the test input signals to obtain calibration signals, so as to obtain at least one calibration signal, and the at least one calibration signal corresponds to the at least one input port one by one. After generating at least one calibration signal, the device under test sends at least one calibration signal to the test device. The test device can output a first test result based on the at least one calibration signal received. The IO function test system can automatically test the device under test through the test device, avoid operation errors caused by manual testing, improve the accuracy of the test result, reduce the manual test cost, and improve the test efficiency of the IO controller. In addition, the device under test can also perform calibration processing on the read test input signals to reduce the influence of the test environment on the test result, thereby further improving the accuracy of the test result.

[0086] As Figure 3 shown, it is a schematic diagram of the output port test process of an IO function test system provided by an embodiment of the present application. The method for the IO function test system to test the output port of the device under test may include:

[0087] Step S301: The test device sends a first configuration instruction to the device under test, and the first configuration instruction is used to instruct the device under test to determine at least one updated output signal corresponding to at least one output port, and the at least one updated output signal corresponds to the at least one output port one by one.

[0088] Continuing to refer to Figure 1 , the test device can send a first configuration instruction to the device under test to set the output value of the DO port of the device under test.

[0089] For example, the first configuration instruction can be used to set the DO port of the device under test to be in an on / off state.

[0090] In the embodiment of the present application, before sending the first configuration instruction to the device under test, the test device can also send a reset instruction to the device under test, and in response to the received reset instruction, the device under test changes its current state to the initial state. It should be understood that the initial state is the state in which the test device is restored to the preset initial value.

[0091] In the embodiment of the present application, before sending the first configuration instruction to the device under test, a reset instruction is sent to the device under test, instructing the device under test to change its current state to the initial state. It can clear the temporary error state of the device under test, re-initialize the peripheral parameters of the device under test, and ensure that the device under test starts running from a known stable starting point, so as to improve the accuracy of the output port test of the device under test and the reliability of the test result.

[0092] Step S302: In response to the received first configuration instruction, the device under test determines at least one updated output signal corresponding to at least one output port.

[0093] After receiving the first configuration instruction, the device under test updates the output value of the DO port. It should be understood that if the device under test is provided with multiple DO ports and the first configuration instruction is used to instruct the device under test to update the output values of multiple DO ports, the device under test updates the output values of multiple DO ports after receiving the first configuration instruction to obtain multiple updated output signals.

[0094] Step S303: The test device sends a first query instruction to the signal output device, and the first query instruction is used to obtain at least one updated output signal.

[0095] In the embodiment of the present application, after the test device executes the above step S301 to send the first configuration instruction to the device under test, it can also send the first query instruction to the signal output device after an interval of a preset time period to obtain at least one updated output signal.

[0096] Step S304: In response to the received first query instruction, the signal output device obtains at least one updated output signal corresponding one-to-one to at least one output port, and sends at least one updated output signal to the test device.

[0097] Continue to refer to Figure 1 , the signal output device can obtain at least one updated output signal corresponding to at least one DO port based on the first query instruction, and send the obtained at least one updated output signal to the test device.

[0098] Step S305: In response to the received at least one updated output signal, the test device outputs a second test result based on the first configuration instruction and at least one updated output signal.

[0099] The test device can determine the configuration signal corresponding to the first configuration instruction according to the first configuration instruction, determine the second test result based on the configuration signal corresponding to the first configuration instruction and at least one updated output signal, and generate a second test report according to the second test result. The test device can generate the second test report through the allure library or in other ways, which is not limited in this application.

[0100] Specifically, the second test result is a normal output result or an abnormal output result. The test device can determine at least one switch state corresponding to at least one output port (i.e., the configuration signal corresponding to the first configuration instruction) according to the first configuration instruction, and determine whether at least one switch state corresponding to at least one updated output signal is the same. If the switch states corresponding to at least one output port determined by the first configuration instruction are the same as the switch states corresponding to at least one updated output signal, the test device generates a normal output result. If there is a switch state among at least one switch state corresponding to at least one updated output signal that is different from the switch state corresponding to at least one output port determined by the first configuration instruction, the test device generates an abnormal output result.

[0101] The abnormal output result generated by the test device may include output port information, which is used to characterize that the output port corresponding to the abnormal updated output signal is abnormal.

[0102] In some embodiments, after outputting the second test result, the test device may further send a reset instruction to the device under test.

[0103] In the embodiments of the present application, after outputting the second test result, the test device sends a reset instruction to the device under test, instructing the device under test to change the current state to the initial state. The peripheral parameters of the device under test can be re-initialized, which is convenient for the device under test to execute subsequent test processes, so as to improve the reliability of the results of the device under test.

[0104] In the technical solution provided by the embodiments of the present application, the IO function test system can configure the updated output signal of the device under test through the test device, and obtain the actually generated updated output signal of the device under test through the signal output device. Based on the actually generated updated output signal of the device under test and the configured updated output signal, it is tested whether there is an abnormality in the output port of the device under test. It can avoid operation errors caused by manual testing, improve the accuracy of test results, reduce the cost of manual testing, and improve the test efficiency of the output port of the device under test.

[0105] As Figure 4 shown, it is a schematic diagram of the linkage control function test process of an IO function test system provided by an embodiment of the present application. The method for the IO function test system to test the linkage control function of the device under test may include:

[0106] Step S401: The test device sends a linkage control instruction to the device under test, and records the current moment as the first moment. The linkage control instruction is used to instruct the device under test to determine the linkage output signal.

[0107] In the embodiments of the present application, when both the input and output ports of the device under test can be used normally, the IO function test system can also test whether there is an abnormality in the linkage control function of the device under test.

[0108] Specifically, if in the above Figure 2 corresponding embodiment, the first test result is a normal input result, and in the above Figure 3 corresponding embodiment, the second test result is a normal output result. The test device can also send a linkage control instruction to the device under test to test whether there is an abnormality in the linkage control function of the device under test. The test device can send a linkage control instruction to the device under test in the form of sending a data packet to the device under test.

[0109] In the embodiment of the present application, before sending a linkage control instruction to the device under test, the test device can also send a reset instruction to the device under test. In response to the received reset instruction, the device under test changes its current state to the initial state. It should be understood that the initial state is the state in which the test device is restored to the preset initial value.

[0110] Before sending a linkage control instruction to the device under test, the test device sends a reset instruction to the device under test, instructing the device under test to change its current state to the initial state. It can clear the temporary error state of the device under test and re-initialize the peripheral parameters of the device under test, ensuring that the device under test starts running from a known stable starting point, so as to improve the accuracy of the linkage control function test of the device under test and the reliability of the test result.

[0111] In the embodiment of the present application, the linkage control instruction can include at least one of a preset time condition and a preset influence condition. If the linkage control instruction only includes a preset time condition, the level of the linkage output signal output by the device under test only depends on the preset time condition; if the linkage control instruction only includes a preset influence condition, the level of the linkage output signal output by the device under test only depends on the preset influence condition; if the linkage control instruction includes both a preset time condition and a preset influence condition, the level of the linkage output signal output by the device under test depends on the preset time condition and the preset influence condition.

[0112] Step S402: In response to the received linkage control instruction, the device under test parses the linkage control instruction.

[0113] After receiving the linkage control instruction, the device under test can parse the linkage control instruction.

[0114] If the linkage control instruction only includes a preset influence condition, after parsing the linkage control instruction, the device under test executes step S403.

[0115] Step S403: The device under test sends a preset influence condition to the signal input device, and the preset influence condition is used to obtain an influence signal corresponding to the preset influence condition.

[0116] In the embodiments of the present application, the preset influence condition is used to characterize that the linkage output signal output by the device under test is affected by the signal input device.

[0117] Step S404: The signal input device sends an influence signal to the device under test in response to the received preset influence condition.

[0118] After receiving the preset influence condition, the signal input device sends an influence signal to the device under test through the AI port or DI port in response to the preset influence condition.

[0119] For example, if the preset influence condition is used to characterize that the temperature affects the linkage output signal output by the device under test, the signal input device can convert the temperature value collected by the temperature sensing module (temperature sensor) into a corresponding voltage signal and send the voltage signal to the device under test through the AI port.

[0120] Step S405: The device under test determines the linkage output signal in response to the received influence signal.

[0121] In the embodiments of the present application, if the linkage control instruction only includes the preset influence condition, after the device under test determines the linkage output signal based on the influence signal, it can directly send the linkage output signal to the signal output device.

[0122] For example, the linkage control instruction only includes the preset influence condition, and the preset influence condition is used to characterize that the temperature affects the linkage output signal output by the device under test. When the influence signal meets the high-level condition, the device under test sends a linkage output signal to turn on the air conditioner switch through the DO port. It should be understood that if the influence signal does not meet the high-level condition, the device under test may not output the linkage output signal or output a linkage output signal that does not turn on the air conditioner switch.

[0123] If the linkage control instruction includes the preset influence condition and the preset time condition, after the device under test executes step S405, it executes step S406.

[0124] If the linkage control instruction only includes the preset time condition, after the device under test parses the linkage control instruction (after executing step S402), it generates a linkage output signal according to the linkage control instruction and executes step S406.

[0125] Step S406: When the current moment of the device under test meets the preset time condition, it sends a linkage output signal to the signal output device.

[0126] Specifically, the device under test can record the current moment as the third moment in response to the received linkage control instruction, and determine whether the third moment meets the preset time condition. If the third moment meets the preset time condition, it sends a linkage output signal to the signal output device.

[0127] For example, the signal output device can be a lighting device or a device with a lighting module. The preset time condition can be from 18:00 to 22:00. When the device under test monitors that the current time is within the time range from 18:00 to 22:00, it sends a linkage output signal to the signal output device. The linkage output signal can be used to instruct the signal output device to change its current state to the lighting state.

[0128] Step S407: The test device sends a second query instruction to the signal output device at the second moment. The second query instruction is used to obtain the linkage output signal. The second moment is after the first moment and is the moment separated from the first moment by a first preset time period.

[0129] If the linkage control instruction includes a preset time condition, the second moment can be the moment that meets the preset time condition. If the linkage control instruction does not include a preset time condition, the first preset time period can be the time period to ensure that the device under test can generate a linkage output signal.

[0130] Step S408: The test device outputs a third test result based on the linkage control instruction in response to the received linkage output signal.

[0131] After receiving the second query instruction, the signal output device sends a linkage output signal to the test device in response to the second query instruction. The test device outputs a third test result based on the linkage control instruction in response to the received linkage output signal.

[0132] Specifically, if the linkage output signal matches the linkage control instruction, the third test result is used to represent that the device under test is in a normal state of linkage control. If the linkage output signal does not match the linkage control instruction, the third test result is used to represent that the device under test is in an abnormal state of linkage control.

[0133] For example, if the linkage control instruction is used to instruct the device under test to control the signal output device to be at a high level at 18:00, and the linkage output signal obtained by the test device through the signal output device at 18:00 is used to represent that the signal output device is at a high level, then the third test result is used to represent that the device under test is in a normal state of linkage control.

[0134] The test device can generate a third test report according to the third test result after determining the third test result. The test device can generate the third test report through the allure library or other methods. This application does not make a limitation here.

[0135] In some embodiments, after the test device outputs the third test result, it may also send a reset instruction to the device under test, instructing the device under test to change its current state to the initial state. The peripheral parameters of the device under test can be re-initialized to facilitate the device under test to execute subsequent test processes, so as to improve the reliability of the results of the device under test.

[0136] In the technical solution provided by the embodiments of the present application, the IO function test system can configure the linkage control instruction of the device under test through the test device, and after the device under test generates a linkage output signal, send a second query instruction to the signal output device to detect whether there is an abnormality in the linkage control function of the device under test. It can avoid operation errors caused by manual testing and improve the accuracy and test efficiency of the test results of the linkage control function.

[0137] As Figure 5 shown, it is a schematic diagram of the active reporting function test process of an IO function test system provided by the embodiments of the present application. The method for the IO function test system to test the active reporting function of the device under test may include:

[0138] Step S501: The test device sends an active reporting instruction to the device under test, and the active reporting instruction is used to instruct the device under test to send a target response message to the test device after detecting a target input signal.

[0139] In the embodiments of the present application, before the test device sends an active reporting instruction to the device under test, it may also send a reset instruction to the device under test, and the device under test responds to the received reset instruction and changes its current state to the initial state. It should be understood that the initial state is the state in which the test device is restored to the preset initial value.

[0140] Before the test device sends an active reporting instruction to the device under test, it sends a reset instruction to the device under test, instructing the device under test to change its current state to the initial state. The temporary error state of the device under test can be cleared, and the peripheral parameters of the device under test can be re-initialized to ensure that the device under test starts running from a known stable starting point, so as to improve the accuracy of the linkage control function test of the device under test and the reliability of the test results.

[0141] In the embodiments of the present application, when the input and output ports of the device under test can be used normally, the IO function test system can also test whether there is an abnormality in the active reporting function of the device under test.

[0142] The test device can send an active reporting instruction to the device under test through a network cable or an RS485-2 serial cable, and the present application does not limit this here.

[0143] The target input signal can be a voltage signal or a current signal.

[0144] In the embodiments of the present application, the target input signal may be a high-low level state switching signal detected by the device under test through the DI port (including: switching from high level to low level, and switching from low level to high level); it may also be a closed-open state switching signal detected by the device under test through the DO port (including: switching from the closed state to the open state, and switching from the open state to the closed state); it may also be an input value change signal detected by the device under test through the AI port. The input value change signal may be the difference between the current input value and the input value corresponding to the moment when active reporting is enabled, greater than a preset change threshold, or the current input value is within or not within a preset input value range. The present application does not limit the target input signal.

[0145] In some embodiments, the active reporting instruction may also be used to instruct the device under test to directly reply with the target response message after receiving the active reporting instruction, without detecting the target input signal. That is, after the test device executes step S501 to send the active reporting instruction to the device under test, it directly executes step S504.

[0146] Step S502: The test device sends a target input instruction to the signal input device, and the target input instruction is used to instruct the signal input device to send a target input signal to the device under test.

[0147] If the active reporting instruction is used to instruct the device under test to send a target response message to the test device when it detects that the voltage signal is greater than the target input signal, then the target input instruction is used to instruct the signal input device to send a voltage signal that meets the active reporting condition to the device under test (that is, the target input signal is an input signal greater than the preset signal threshold). If the active reporting instruction is used to instruct the device under test to send a target response message to the test device when it detects that the current signal is greater than the target input signal, then the target input instruction is used to instruct the signal input device to send a current signal that meets the active reporting condition to the device under test (that is, the target input signal is an input signal greater than the preset signal threshold).

[0148] Step S503: In response to the received target input instruction, the signal input device sends a target input signal to the device under test.

[0149] It should be understood that if the active reporting function of the device under test is normal, the device under test sends a target response message to the test device after receiving the target input signal. If the active reporting function of the device under test is abnormal, the device under test may not be able to send a response message to the test device or send a non-target response message to the test device after receiving the target input signal.

[0150] Step S504: After the test device monitors the target response message, it outputs a fourth test result, and the fourth test result is used to characterize that the active reporting function of the device under test is normal.

[0151] After determining the fourth test result, the test device can generate a fourth test report according to the fourth test result. The test device can generate the fourth test report through the allure library or other means, which is not limited in this application.

[0152] In some embodiments, after outputting the fourth test result, the test device can also send a reset instruction to the device under test, instructing the device under test to change the current state to the initial state. The peripheral parameters of the device under test can be re-initialized to facilitate the device under test to execute subsequent test processes, so as to improve the reliability of the results of the device under test.

[0153] In the technical solution provided by the embodiments of the present application, the IO function test system can configure an active reporting instruction for the device under test through the test device. The active reporting instruction is used to instruct the device under test to send a target response message to the test device after detecting a target input signal. And send a target input signal to the device under test through the signal output device. Determine whether there is an abnormality in the active reporting function of the device under test by whether the target response message is monitored. It can avoid operation errors caused by manual testing, improve the accuracy of test results, reduce the cost of manual testing, and improve the test efficiency of the output port of the device under test.

[0154] It should be understood that, on the premise of no logical conflict, the above-mentioned various application embodiments can be combined and implemented with each other to meet the actual application requirements. The specific embodiments or implementation schemes obtained after these combinations still fall within the protection scope of this application.

[0155] Corresponding to the IO function test system in the above embodiments, the embodiments of the present application provide an automated test method, and this automated test method can be applied to the above IO function test system.

[0156] Figure 6 The flowchart of an automated test method provided by the embodiments of the present application is shown. For the convenience of description, only the parts related to the embodiments of the present application are shown. Include:

[0157] Step S601: Send an input instruction to the signal input device through the test device, and the input instruction is used to instruct the signal input device to send a test input signal to the device under test.

[0158] Step S602: In response to the received input instruction, the signal input device sends a test input signal to the device under test.

[0159] Step S603: In response to the received test input signal, the device under test performs calibration processing on the test input signal to obtain a calibration signal.

[0160] Step S604: The device under test sends the calibration signal to the test device.

[0161] Step S605: The testing device outputs a first test result in response to the received calibration signal.

[0162] It should be noted that for the information interaction, execution process, etc. between the devices / units in the above method embodiments, since they are based on the same concept as the embodiments of the IO function testing system of the present application, for their specific functions and the technical effects brought, reference can be specifically made to the embodiments of the IO function testing system part, which will not be elaborated here.

[0163] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not mean the order of execution. The execution order of each process should be determined according to its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0164] Based on the same inventive concept, an embodiment of the present application also provides an electronic device.

[0165] Figure 7 is a schematic structural diagram of an electronic device provided by an embodiment of the present application. As Figure 7 shown, the electronic device 7 in this embodiment includes: at least one processor 710 ( Figure 7 only one is shown in the figure), a memory 720, and a communication module 740. A computer program 730 that may run on the processor 710 is stored in the memory 720. When the processor 710 executes the computer program 730, it implements the steps in the above embodiment of the automated testing method, such as Figure 6 steps S601 to S605 shown in the figure. When the processor 710 executes the computer program 730, it implements the functions of each device / module / unit in the above system embodiments, such as Figure 2 the functions of steps S201 to S205 shown in the figure. The communication module 740 may be a separate communication unit for communicating with an external server or a terminal device.

[0166] The electronic device 7 may include, but is not limited to: a processor 710 and a memory 720. Those skilled in the art can understand that Figure 7 this is only an example of the electronic device 7 and does not constitute a limitation to the electronic device 7. It may include more or fewer components than shown in the figure, or combine some components, or different components. For example, the electronic device 7 may further include an input and sending device, a network access device, a bus, etc.

[0167] The processor 710 may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor, or the processor may also be any conventional processor, etc.

[0168] In some embodiments, the memory 720 may be an internal storage unit of the electronic device 7, such as the hard disk or memory of the electronic device 7. The memory 720 may also be an external storage device of the electronic device 7, such as a plug-in hard disk equipped on the electronic device 7, a Smart Media Card (SMC), a Secure Digital (SD) card, a Flash Card, etc. The memory 720 may also include both the internal storage unit of the electronic device 7 and the external storage device. The memory 720 is used to store an operating system, application programs, a BootLoader, data, and other programs, such as the program code of the computer program 730. The memory 720 may also be used to temporarily store data that has been sent or will be sent.

[0169] In addition, those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the above division of each functional unit and module is used as an example for illustration. In actual applications, the above functions can be allocated to different functional units and modules according to needs, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. In each embodiment of the present application, each functional unit may be integrated in one processing unit, or each unit may exist physically alone, or two or more units may be integrated in one unit. The above integrated unit may be implemented in the form of hardware or in the form of a software functional unit.

[0170] The embodiments of the present application provide a computer-readable storage medium storing a computer program, and when the computer program runs on an electronic device, the electronic device is caused to execute the steps in the above method embodiments.

[0171] An embodiment of the present application provides a chip, which includes a processor and a memory. A computer program is stored in the memory, and when the computer program is executed by the processor, the steps in the above-mentioned method embodiments are implemented.

[0172] An embodiment of the present application provides a computer program product. When the computer program product runs on an electronic device, the electronic device is enabled to execute the steps in the above-mentioned method embodiments.

[0173] It should be understood that the processor mentioned in the embodiments of the present application may be a central processing unit (CPU), or may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0174] It should also be understood that the memory mentioned in the embodiments of the present application may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable ROM (PROM), an erasable programmable ROM (EPROM), an electrically erasable programmable ROM (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchlink DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0175] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above division of each functional unit and module is used for illustration. In practical applications, the above functions can be allocated to different functional units and modules according to needs, that is, the internal structure of the device is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiments can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of mutual distinction and do not limit the protection scope of the present application. The specific working processes of the units and modules in the above system can refer to the corresponding processes in the foregoing method embodiments and will not be described herein again.

[0176] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0177] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. A professional technician can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of this application.

[0178] In the embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of the devices or units can be in electrical, mechanical or other forms.

[0179] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place, or they can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0180] In addition, the functional units in each embodiment of this application can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units.

[0181] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-described embodiment methods of this application, a computer program can be used to instruct relevant hardware to complete. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-described various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can at least include: any entity or device that can carry the computer program code to the large-screen device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk, or an optical disc, etc. In some jurisdictions, according to legislation and patent practice, the computer-readable medium cannot be an electrical carrier signal and a telecommunication signal.

[0182] Finally, it should be noted that: The above is only the specific implementation manner of this application, but the protection scope of this application is not limited thereto. Any changes or substitutions within the technical scope disclosed in this application should be covered by the protection scope of this application. Therefore, the protection scope of this application should be subject to the protection scope of the claims.

Claims

1. An IO function test system, characterized in that, The IO function test system at least includes: a test device, a signal input device and a device under test, wherein the test device and the device under test are in a first connection state, the test device and the signal input device are in a second connection state, the device under test includes at least a plurality of input ports, and the signal input device and the plurality of input ports are respectively in a third connection state; The testing device is configured to send an input instruction to the signal input device, wherein the input instruction is configured to instruct the signal input device to send a test input signal to at least one input port, wherein the at least one input port is at least one of the plurality of input ports; The signal input device is configured to send the test input signal to the at least one input port in response to the received input instruction; The device under test is configured to, in response to the received test input signal, perform calibration processing on the test input signal to obtain a calibration signal, thereby obtaining at least one calibration signal, wherein the at least one calibration signal corresponds one-to-one to the at least one input port; The device under test is further configured to send at least one calibration signal to the testing device; The testing device is further configured to output a first test result in response to at least one of the received calibration signals.

2. The IO function test system according to claim 1, wherein The IO function test system further includes: a signal output device, wherein the signal output device and the test device are in the second connection state, the device under test further includes at least one output port, and the test device is further configured to: Sending a first configuration instruction to the device under test, wherein the first configuration instruction is used to instruct the device under test to determine at least one updated output signal corresponding to at least one output port, wherein the at least one updated output signal corresponds to the at least one output port in a one-to-one manner; Sending a first query instruction to the signal output device, wherein the first query instruction is used to obtain the at least one updated output signal; In response to receiving the at least one updated output signal, a second test result is output based on the first configuration instruction and the at least one updated output signal.

3. The IO function test system according to claim 2, wherein The first test result is a normal input result or an abnormal input result, and the second test result is a normal output result or an abnormal output result; The step of the testing device outputting a first test result based on at least one calibration signal comprises: determining whether at least one of the calibration signals is within a preset signal range; If at least one of the calibration signals is within the preset signal range, outputting the input normal result; If there is an abnormal calibration signal in at least one of the calibration signals, outputting the input abnormality result, wherein the abnormal calibration signal is a signal in at least one of the calibration signals that is not within the preset signal range, and the input abnormality result is used to indicate that the input port corresponding to the abnormal calibration signal is abnormal; The step of the testing device outputting a second test result in response to the received at least one updated output signal based on the first configuration instruction and the at least one updated output signal comprises: Determine whether the configuration signal corresponding to the first configuration instruction is the same as the at least one updated output signal; If the configuration signal is the same as all of the at least one updated output signals, output the output normal result; If there is an abnormal updated output signal among the at least one updated output signals, output the output abnormal result, where the abnormal updated output signal is the signal among the at least one updated output signals that is different from the configuration signal, and the output abnormal result is used to characterize that the output port corresponding to the abnormal updated output signal is abnormal.

4. The IO function test system according to claim 3, characterized in that, If the first test result is the input normal result and the second test result is the output normal result, the test device is further configured to: Send a linkage control instruction to the device under test, and record the current moment as the first moment, where the linkage control instruction is used to instruct the device under test to determine a linkage output signal; Send a second query instruction to the signal output device at the second moment, where the second query instruction is used to obtain the linkage output signal, and the second moment is a moment after the first moment and is separated from the first moment by a first preset time period; In response to receiving the linkage output signal, output a third test result based on the linkage control instruction; If the linkage output signal matches the linkage control instruction, the third test result is used to characterize that the device under test is in a normal linkage control state; If the linkage output signal does not match the linkage control instruction, the third test result is used to characterize that the device under test is in an abnormal linkage control state.

5. The IO function test system according to claim 4, characterized in that, The linkage control instruction at least includes a preset time condition, and the device under test is further configured to: In response to receiving the linkage control instruction, determine the linkage output signal, and record the current moment as the third moment; Determine whether the third moment meets the preset time condition; If the third moment meets the preset time condition, send the linkage output signal to the signal output device.

6. The IO function test system according to claim 5, characterized in that The linkage control instruction further includes a preset influence condition, and the device under test is further configured to: Send the preset influence condition to the signal input device, where the preset influence condition is used to obtain an influence signal corresponding to the preset influence condition; The step of the device under test determining the linkage output signal in response to receiving the linkage control instruction includes: In response to receiving the linkage control instruction and the influence signal, determine the linkage output signal.

7. The IO function test system according to claim 1, wherein The test device is further configured to: Send an active reporting instruction to the device under test, where the active reporting instruction is used to instruct the device under test to send a target response message to the test device after detecting a target input signal; Send a target input instruction to the signal input device, where the target input instruction is used to instruct the signal input device to send the target input signal to the device under test; If the target response message is monitored, output a fourth test result, where the fourth test result is used to characterize that the active reporting function of the device under test is normal.

8. The IO function test system according to claim 1, wherein, The test device is further configured to: Send a reset instruction to the device under test, where the reset instruction is used to instruct the device under test to change its current state to the initial state.

9. The IO function test system according to any one of claims 1 to 8, characterized in that, The at least one input port is a digital input port or an analog input port.

10. The IO function test system according to claim 9, characterized in that, The test input signal is a voltage signal or a current signal.

11. An automated testing method, characterized in that, The method is applied to the IO function test system according to any one of claims 1 to 10, and the automated test method includes: Send an input instruction to the signal input device through the test device, where the input instruction is used to instruct the signal input device to send a test input signal to the device under test; The signal input device responds to the received input instruction and sends the test input signal to the device under test; The device under test responds to the received test input signal, performs calibration processing on the test input signal, and obtains a calibration signal; The device under test sends the calibration signal to the test device; The test device responds to the received calibration signal and outputs a first test result.

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