Equipment testing system and method and electronic equipment

Abstract

The invention provides an equipment testing system and method and electronic equipment, relates to the technical field of electronics, and can quickly realize input testing of the equipment. The system comprises a control terminal, power supply equipment and an intelligent digital power meter, the control terminal is in communication connection with the power supply equipment and the intelligent digital power meter; the control terminal is used for generating a test list based on input information and sending the test list to the power supply equipment, and the input information at least comprises rated voltage, rated frequency and voltage tolerance of the tested equipment; the test list records test voltage and test frequency corresponding to at least one test item of the tested equipment; the power supply equipment is used for supplying power to the tested equipment according to the test voltage and the test frequency corresponding to each test item; and the intelligent digital power meter is connected between the power supply equipment and the tested equipment and is used for determining an input test result of the tested equipment corresponding to each test item and uploading the input test result to the control terminal.

Description

Technical Field

[0001] The present application relates to the field of electronic technology, and in particular to a device testing system, method, and electronic equipment. Background Art

[0002] Equipment input testing is the process of testing the input voltage, input current, and input power of a device. It aims to verify whether the device matches the nominal value marked on the nameplate, and that the input circuit can withstand the required current when the device is operating normally, thereby ensuring the electrical safety of the device during use.

[0003] The traditional input testing method is cumbersome and time-consuming throughout the entire testing process, and may result in reading errors that lead to low test result accuracy. Summary of the Invention

[0004] The embodiments of the present application provide a device testing system, method, and electronic device, which can improve the accuracy of test results.

[0005] To achieve the above technical objectives, the embodiments of the present application adopt the following technical solutions:

[0006] In the first aspect, an embodiment of the present application provides an equipment testing system, which includes a control terminal, a power supply device, and an intelligent digital power meter; the control terminal is communicatively connected to the power supply device and the intelligent digital power meter; wherein the control terminal is used to generate a test list based on input information and send the test list to the power supply device, wherein the input information includes at least the rated voltage, rated frequency and voltage tolerance of the device under test; the test list records the test voltage and test frequency corresponding to at least one test item of the device under test; the power supply device is used to supply power to the device under test according to the test voltage and test frequency corresponding to each test item; the intelligent digital power meter is connected between the power supply device and the device under test, and is used to determine the input test results of the device under test corresponding to each test item, and upload the input test results to the control terminal.

[0007] In this solution, the control terminal generates a test list for the device under test based on input information such as the rated voltage, rated frequency, and voltage tolerance of the device under test. This test list records the test voltage and test frequency corresponding to at least one test item of the device under test. The power supply device supplies power to the device under test according to the test voltage and test frequency corresponding to each test item. The intelligent digital power meter connected between the power supply device and the device under test determines the input test results of the device under test corresponding to each test item and uploads the input test results to the control terminal. The control terminal, power supply device, and intelligent digital power meter cooperate with each other through communication to quickly perform input testing on the device under test. This eliminates the need for testers to frequently adjust the power supply device and read test data, saving time and effort, improving the efficiency of input testing, and avoiding the possibility of test data errors caused by tester operational errors, thereby improving the accuracy of input testing.

[0008] In one possible implementation, the control terminal generates a test list based on the input information, including: determining a set of candidate test voltages for the device under test based on the rated voltage, voltage tolerance, and pre-stored common test voltages; determining a set of candidate test frequencies for the device under test based on the rated frequency; and generating a test list by combining a test voltage in the candidate test voltage set and a test frequency in the candidate test frequency set as the test voltage and test frequency corresponding to a test item.

[0009] In this implementation, a test list for the device under test is intelligently generated based on information such as the device's rated voltage, rated frequency, and voltage tolerance. This eliminates the need for testers to enumerate every test voltage and test frequency combination for the device under test, reducing their workload. Furthermore, when determining the test voltage for the device under test, in addition to the device's rated voltage, pre-stored commonly used test voltages for electrical equipment are also considered. The test voltage is generated based on the rated voltage and commonly used test voltages for electrical equipment, combined with the device's voltage tolerance. This ensures a comprehensive and diverse selection of test voltages, thereby improving the effectiveness of input testing.

[0010] In a possible implementation, the control terminal is further configured to display a test list; and in response to receiving a correction instruction within a third preset time, correct the test list, where the correction instruction is used to correct at least one test item in the test list.

[0011] In this implementation, the control terminal can display the test list to the tester through pop-up windows, message prompts, etc. The tester can correct the test list according to actual needs, such as adding or deleting test items, correcting the test voltage and / or test frequency in at least one test item in the test list, and by correcting the test list, the input test can be more in line with actual needs.

[0012] In one possible implementation, the control terminal is also used to send a power supply control instruction to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item, wherein the interval time for updating the target test item is a first preset time, and the position of the updated target test item in the test list is after the target test item before the update.

[0013] In this implementation method, the control terminal can control the power supply equipment to supply power to the test equipment according to the test voltage and test frequency corresponding to each test item by sending power supply control instructions. The tester does not need to adjust the power supply voltage and power supply frequency of the power supply equipment, which reduces the workload of the tester.

[0014] In one possible implementation, the power supply device includes a power supply controller and a power supply; wherein the power supply controller is used to sequentially traverse the test items in the test list and use the traversed test items as target test items; the power supply is controlled to supply power to the device under test according to the test voltage and test frequency corresponding to the target test items, and the power supply duration under each target test item is a first preset time.

[0015] In this implementation, the power supply device includes a power controller and a power supply. The power controller controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to each test item. The tester does not need to adjust the power supply voltage and power supply frequency, which reduces the workload of the tester.

[0016] In one possible implementation, the above-mentioned intelligent digital power meter determines the input test result of the power supply device corresponding to each test item, including: in response to monitoring a jump in the power supply voltage and / or power supply frequency of the power supply device, performing an input test on the test device at a moment after the jump moment and at a second preset time apart, wherein the first preset time is greater than the second preset time; determining the input test result as the input test result of the test device corresponding to the test item sorted as the target value in the test list, wherein the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device is monitored to jump.

[0017] In this implementation, the intelligent digital power meter monitors the jump of the power supply voltage and / or power supply frequency of the power supply equipment in real time based on the changes in the voltage and / or frequency at its own location. If a jump is detected, it means that the test item based on which the power supply equipment supplies power to the test equipment has changed. At this time, the intelligent digital power meter performs an input test on the test equipment for the changed test item and uploads the input test result to the control terminal. In this way, there is no need for the tester to record the input test result of the test equipment, which reduces the workload of the tester.

[0018] In a possible implementation, the control terminal is further configured to add the input test result to the corresponding test item.

[0019] In this implementation, the intelligent digital power meter uploads the input test results of the device under test corresponding to each test item to the control terminal, which saves and integrates them. The tester no longer needs to integrate the input test results of the device under test, which reduces the tester's workload.

[0020] In a possible implementation, the input test result includes a test result of at least one input test item, and the input test item includes an input current test and an input power test.

[0021] In this implementation, the input test items include different test items, including input current test, input power test and input power test, etc., which perform different item input tests on the test equipment respectively, and comprehensively and carefully verify the electrical performance of the test equipment, thereby ensuring the electrical safety of the test equipment in subsequent use.

[0022] In a possible implementation, the control terminal is further configured to mark the test result of the input test item in response to the test result of the input test item not being within a standard limit range of the input test item.

[0023] In this implementation, the control terminal independently determines whether the test results of the input test items meet the standard limit range of the input test items, and then marks the non-compliant test results so that the tester can quickly identify the test items that do not meet the requirements.

[0024] In a second aspect, an embodiment of the present application provides a device testing method, the method comprising: generating a test list based on input information, wherein the input information includes at least the rated voltage, rated frequency and voltage tolerance of the device under test; the test list records the test voltage and test frequency corresponding to at least one test item of the device under test; based on the test list, controlling the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item; and using an intelligent digital power meter connected between the power supply device and the device under test to determine the input test result of the device under test corresponding to each test item.

[0025] In one possible implementation, the above-mentioned control of the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item based on the test list includes: sending a test list and a power supply control instruction to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item, wherein the interval time for updating the target test item is a first preset time, and the position of the updated target test item in the test list is one position after the target test item before the update.

[0026] In one possible implementation, the power supply device includes a power supply controller and a power supply. The power supply device is controlled based on a test list to supply power to the device under test according to the test voltage and test frequency corresponding to each test item, including: sending a test list to the power supply controller so that the power supply controller controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to each test item based on the test list; wherein the power supply controller sequentially traverses the test items in the test list and takes the traversed test items as target test items; controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to the target test items, and the power supply duration under each target test item is a first preset time.

[0027] In one possible implementation, the above-mentioned generation of a test list based on input information includes: determining a set of candidate test voltages for the device under test based on the rated voltage, voltage tolerance and pre-stored common test voltages; determining a set of candidate test frequencies for the device under test based on the rated frequency; and generating a test list by taking a combination of a test voltage in the candidate test voltage set and a test frequency in the candidate test frequency set as the test voltage and test frequency corresponding to a test item.

[0028] In a possible implementation, the method further includes displaying a test list; and in response to receiving a correction instruction within a third preset time, correcting the test list, wherein the correction instruction is used to correct at least one test item in the test list.

[0029] In one possible implementation, the above-mentioned determination of the input test result of the power supply device corresponding to each test item includes: receiving the input test result of the test device corresponding to each test item uploaded by the intelligent digital power meter, wherein the intelligent digital power meter responds to monitoring that the power supply voltage and / or power supply frequency of the power supply device has jumped, performs an input test on the test device at a moment after the jump moment and at a second preset time away, and determines the input test result as the input test result of the test device corresponding to the test item sorted as the target value in the test list, the first preset time is greater than the second preset time; the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device has jumped.

[0030] In a possible implementation, the method further includes: adding the input test result to the corresponding test item.

[0031] In a possible implementation, the input test result includes a test result of at least one input test item, and the input test item includes an input current test and an input power test.

[0032] In a possible implementation, the method further includes marking the test result of the input test item in response to the test result of the input test item not being within a standard defined range of the input test item.

[0033] In a third aspect, embodiments of the present application provide an electronic device comprising a memory and a processor. The memory and the processor are coupled; the memory is configured to store computer program code, which includes computer instructions. When the processor executes the computer instructions, the electronic device performs the device testing method according to the second aspect and any possible implementation thereof.

[0034] In a fourth aspect, an embodiment of the present application provides an electronic device, comprising a processor, wherein the processor executes a device testing method as described in the second aspect and any possible implementation thereof.

[0035] Illustratively, the electronic device may be a server, a tablet computer, a desktop computer, a laptop computer, a notebook computer, a netbook computer, and the like.

[0036] In a fifth aspect, embodiments of the present application provide a computer-readable storage medium comprising computer instructions. When the computer instructions are executed on an electronic device, the electronic device executes the device testing method according to the second aspect and any possible implementation thereof.

[0037] In a sixth aspect, embodiments of the present application provide a computer program product comprising computer instructions, wherein when the computer instructions are executed on an electronic device, the electronic device executes the device testing method according to the second aspect and any possible implementation thereof.

[0038] For the specific description of the third to sixth aspects and their various implementations in the embodiments of the present application, reference can be made to the detailed description in the second aspect and its various implementations; and for the beneficial effects of the second to sixth aspects and their various implementations, reference can be made to the analysis of the beneficial effects in the first aspect and its various implementations, which will not be repeated here.

[0039] These and other aspects of the embodiments of the present application will be more clearly understood in the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 A schematic diagram of the structure of a device testing system provided in an embodiment of the present application;

[0041] Figure 2 A schematic diagram of the structure of a device testing apparatus provided in an embodiment of the present application;

[0042] Figure 3 A schematic diagram of a device testing process provided in an embodiment of the present application;

[0043] Figure 4 A schematic diagram of another device testing process provided in an embodiment of the present application;

[0044] Figure 5 A schematic diagram of another device testing process provided in an embodiment of the present application;

[0045] Figure 6 A schematic diagram of the structure of another device testing system provided in an embodiment of the present application;

[0046] Figure 7 A schematic diagram of an implementation environment for a device testing method provided in an embodiment of the present application;

[0047] Figure 8 A schematic diagram of the hardware structure of an electronic device provided in an embodiment of the present application;

[0048] Figure 9 A schematic diagram of a device testing method provided in an embodiment of the present application;

[0049] Figure 10 A schematic structural diagram of another device testing apparatus provided in an embodiment of the present application. DETAILED DESCRIPTION

[0050] In the following, to facilitate a clear description of the technical solutions of the embodiments of the present application, the words "first" and "second" are used in the embodiments of the present application to distinguish between identical or similar items with substantially the same functions and effects. Those skilled in the art will understand that the words "first" and "second" do not limit the quantity or execution order, and the words "first" and "second" do not necessarily mean different.

[0051] In the description of the embodiments of the present application, unless otherwise specified, " / " means "or", for example, A / B can mean A or B. "And / or" in this article is merely a description of the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, "at least one" means one or more, and "a plurality" means two or more. Words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not limit them to be necessarily different.

[0052] It should be noted that in the embodiments of this application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be interpreted as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0053] For ease of understanding, the following briefly introduces the relevant terms involved in the embodiments of this application:

[0054] (1) Input Test: This is the process of testing the input characteristics of a product. Its purpose is to examine whether the current required by the input circuit during normal operation is fully considered during product design, and to verify whether the input circuit can withstand this current without malfunctioning. At the same time, input testing also helps ensure the electrical safety of the product and prevent overload, injury, or other safety hazards caused by excessive input power.

[0055] (2) Rated Voltage: This refers to the optimal voltage for electrical equipment to operate normally for a long period of time. Rated voltage is also called nominal voltage. When the operating voltage of electrical equipment is higher than the rated voltage, the equipment is easily damaged. When the operating voltage is lower than the rated voltage, the equipment will not work properly (for example, light bulbs will not light normally, motors will not operate normally). The rated voltage can correspond to the rated voltage range of AC power or the rated voltage value of DC power.

[0056] (3) Rated Frequency: Rated frequency refers to the number of cycles that the alternating current is allowed to change within one second in an alternating current circuit.

[0057] (4) AC & DC Power Source: power supply equipment used to provide AC or DC power to electrical equipment.

[0058] (5) Smart Digital Power Meter: It is a high-precision, digital instrument mainly used to measure electrical parameters such as voltage, current, frequency, and power.

[0059] The device testing system provided in the embodiments of this application can be applied to input testing scenarios for electronic products. Input testing can assess a product's power supply compatibility, performance stability, and safety, providing strong support for product development and production. Input testing also helps ensure product compliance with relevant standards, improving product market competitiveness.

[0060] The embodiment of the present application provides a device testing system, wherein a control terminal of the system generates a test list of the device under test based on input information such as the rated voltage, rated frequency, and voltage tolerance of the device under test, and the test list records the test voltage and test frequency corresponding to each of the multiple test items of the device under test; the power supply device supplies power to the device under test according to the test voltage and test frequency corresponding to each test item, and the intelligent digital power meter connected between the power supply device and the device under test determines the input test result of the device under test corresponding to each test item, and uploads the input test result to the control terminal. The control terminal, the power supply device, and the intelligent digital power meter cooperate with each other through communication to quickly realize the input test of the device under test, greatly reducing the workload of the tester, saving time and effort, and improving the efficiency of the input test. At the same time, it avoids the possibility of test data errors caused by tester operation errors and improves the accuracy of the input test.

[0061] The implementation of the embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0062] Figure 1 A schematic diagram of the structure of a device testing system provided in an embodiment of the present application is shown in FIG. Figure 1 As shown, the system includes: a control terminal 100, a power supply device 110 and an intelligent digital power meter 120, the power supply device 110 is electrically connected to the input end of the intelligent digital power meter 120, the output end of the intelligent digital power meter 120 is electrically connected to the test device 130, and the control terminal 100 is communicatively connected to the power supply device 110 and the intelligent digital power meter 120;

[0063] Among them, the control terminal 100 is used to generate a test list based on the input information and send the test list to the power supply device 110, wherein the input information includes at least the rated voltage, rated frequency and voltage tolerance of the test device 130; the test list records the test voltage and test frequency corresponding to at least one test item of the test device 130.

[0064] It is understood that the device under test 130 generally refers to various types of electrical equipment that uses electrical energy, such as motors, lighting equipment, electric heating equipment, household appliances, servers, and other devices with power sources. Its type is not limited here. The device under test 130 in the embodiment of the present application can be a server. The control terminal 100 is an electronic device that includes an external interactive interface and receives input information from the tester through the external interactive interface.

[0065] Note that for an AC power supply, the rated voltage of the device under test 130 is a voltage range, and the rated frequency is a frequency value, such as 50 Hz or 60 Hz. For a DC power supply, the rated voltage of the device under test 130 is a voltage value. Since DC power supply does not involve the concept of frequency, the default rated frequency is 0 Hz.

[0066] In an embodiment of the present application, the control terminal 100 intelligently generates a test list for the device under test 130 based on information such as the rated voltage, rated frequency, and voltage tolerance of the device under test 130. This eliminates the need for testers to manually list each combination of test voltage and test frequency of the device under test 130, thereby reducing the workload of testers.

[0067] In one possible implementation, the control terminal 100 generates a test list based on the input information, including: determining a set of test voltages to be selected for the device under test 130 based on the rated voltage and voltage tolerance; determining a set of test frequencies to be selected for the device under test 130 based on the rated frequency, that is, determining a rated frequency as a test frequency to generate a set of test frequencies to be selected; taking a combination of a test voltage in the set of test voltages to be selected and a test frequency in the set of test frequencies to be selected as the test voltage and test frequency corresponding to a test item to generate a test list.

[0068] Determining the candidate test voltage set for the device under test 130 based on the rated voltage and voltage tolerance may include querying a pre-stored database for a candidate test voltage set corresponding to the rated voltage and voltage tolerance. It should be noted that the candidate test voltage set corresponding to the rated voltage and voltage tolerance stored in the database may be pre-written by a tester or may be statistically derived from past input test data of the device under test 130.

[0069] The above-mentioned determination of the set of candidate test voltages for the device under test 130 based on the rated voltage and the voltage tolerance may also include: in response to the rated voltage being a voltage range, determining the endpoint voltage of the voltage range as a first voltage; determining a second voltage based on the first voltage and the voltage tolerance; and determining the set consisting of the first voltage and the second voltage as the set of candidate test voltages.

[0070] For example, the rated voltage of the test device 130 is 200-240VAC, and the voltage tolerance is ±10%, so the first voltage can be determined to be 200VAC and 240VAC; the voltage value obtained by multiplying the first voltage by (1+voltage tolerance) can be determined as the second voltage, that is, 200×(1-10%), 200×(1+10%), 240×(1-10%) and 240×(1+10%) are calculated to obtain the second voltages of 180VAC, 220VAC, 216VAC and 264VAC; the set consisting of the first voltage and the second voltage {180VAC, 200VAC, 216VAC, 220VAC, 240VAC and 264VAC} is determined as the test voltage set to be selected.

[0071] The above-mentioned determination of the set of candidate test voltages for the device under test 130 based on the rated voltage and the voltage tolerance may also include: in response to the rated voltage being a voltage range, determining the endpoint voltage of the voltage range and the commonly used test voltage within the voltage range as the first voltage; determining the second voltage based on the first voltage and the voltage tolerance; and determining the set consisting of the first voltage and the second voltage as the set of candidate test voltages. In this way, when determining the test voltage of the device under test 130, the pre-stored commonly used test voltages of electrical equipment are additionally taken into consideration, thereby ensuring the comprehensive richness of the test voltage selection.

[0072] For example, the rated voltage of the device under test 130 is 200-240VAC, the voltage tolerance is ±10%, and the commonly used test voltage within the voltage range is 220V. Therefore, the first voltage can be determined to be 200VAC, 220VAC, and 240VAC; the voltage value obtained by multiplying the first voltage by (1+voltage tolerance) can be determined as the second voltage, that is, 200×(1-10%), 200×(1+10%), 220×(1-10%), 2 20×(1+10%), 240×(1-10%) and 240×(1+10%) to obtain the second voltage of 180VAC, 220VAC, 198VAC, 242VAC, 216VAC and 264VAC; the set consisting of the first voltage and the second voltage {180VAC, 198VAC, 200VAC, 216VAC, 220VAC, 240VAC, 242VAC, 264VAC} is determined as the test voltage set to be selected.

[0073] The above-mentioned determination of the set of test voltages to be selected for the device under test 130 based on the rated voltage and the voltage tolerance may also include: in response to the rated voltage being a voltage value, determining the voltage value as a first voltage; determining a second voltage based on the first voltage and the voltage tolerance; and determining the set consisting of the first voltage and the second voltage as the set of test voltages to be selected.

[0074] For example, the rated voltage of the device under test 130 is 240 VDC, and the voltage tolerance is ±20% (declared by the manufacturer), so the first voltage can be determined to be 240 VDC; the voltage value obtained by multiplying the first voltage by (1 + voltage tolerance) can be determined as the second voltage, that is, 240×(1-20%) and 240×(1+20%) are calculated to obtain the second voltages of 192 VDC and 288 VDC; the set consisting of the first voltage and the second voltage {192 VDC, 240 VDC and 288 VDC} is determined as the set of test voltages to be selected.

[0075] In a possible implementation, the control terminal 100 further includes a display screen 101 , which is used to display a test list.

[0076] The control terminal 100 may display the test list on the display screen 101 through a pop-up window, a message link, etc., so that the test personnel can know the test items of the device under test 130 .

[0077] In one possible implementation, the control terminal 100 further includes an input module 102, which may be a touch screen, a mouse, a keyboard, or the like, for receiving input information entered by a tester. The input information includes at least the rated voltage, rated frequency, and voltage tolerance of the device under test 130. The control terminal 100 may also receive correction instructions entered by the tester, which are used to add or delete test items in a test list, or to correct the test voltage and / or test frequency of at least one test item in the test list.

[0078] It is understandable that an operation interface is provided in the control terminal 100, and a check menu is provided on the operation interface. The menu contains at least commonly used test voltages and commonly used test frequencies. The tester can issue correction instructions by checking the menu.

[0079] The control terminal 100 is further configured to correct the test list in response to receiving a correction instruction within a third preset time.

[0080] In addition, the control terminal 100 is also provided with buttons for controlling the start and end of the input test. At the same time, the control terminal 100 also supports starting the input test in response to not receiving a correction instruction within a third preset time, or receiving a correction instruction within a third preset time after correcting the test list. The input test is stopped after all test items are executed.

[0081] In this implementation, the control terminal 100 displays the test list to the tester, and the tester can correct the test list according to actual needs, so that the input test is more in line with the actual needs.

[0082] The power supply device 110 is used to supply power to the device under test 130 according to the test voltage and test frequency corresponding to each test item.

[0083] The intelligent digital power meter 120 is used to determine the input test result of the device under test 130 corresponding to each test item, and upload the input test result to the control terminal 100 .

[0084] In one possible implementation, the control terminal 100 communicates with the power supply device 110 so that the power supply device 110 supplies power to the device under test 130 according to the test voltage and test frequency corresponding to each test item in the test list. Furthermore, the intelligent digital power meter 120 performs an input test on the device under test 130 for each test item in the test list, and uploads the input test results to the control terminal 100 through communication with the control terminal 100.

[0085] In this implementation, the control terminal 100 communicates with the power supply device 110, enabling the power supply device 110 to adjust the supply voltage and frequency. This eliminates the need for test personnel to adjust the supply voltage and frequency of the power supply device 110, thereby reducing the tester's workload. Furthermore, the intelligent digital power meter 120 determines the input test results of the device under test 130 corresponding to each test item and uploads them to the control terminal 100. This eliminates the need for test personnel to record the input test results of the device under test 130, thereby reducing the tester's workload.

[0086] It should be noted that when performing an input test on the device under test 130 , the device under test 130 needs to be powered on first, and the input test can be started only after the device under test 130 runs stably.

[0087] In one possible implementation, the input test result includes the test result of at least one input test item, including an input current test and an input power test. It is understood that the current and power displayed on the intelligent digital power meter 120 are the test values of the input current test and the input power test, respectively, of the device under test 130.

[0088] The control terminal 100 is further configured to add the input test results to the corresponding test items. The control terminal 100 integrates the test data, eliminating the need for test personnel to integrate the input test results of the device under test 130 , thereby reducing the workload of test personnel.

[0089] In a possible implementation, the control terminal 100 is further configured to mark the test result of the input test item in response to the test result of the input test item not being within a standard limit range of the input test item.

[0090] In this implementation, the control terminal 100 independently determines whether the test results of the input test items meet the standard limit range of the input test items, and then marks the non-compliant test results so that the tester can quickly identify the test items that do not meet the requirements.

[0091] In a possible implementation, a current sensor is integrated into the intelligent digital power meter 120 . The current sensor is used to limit power output and protect the intelligent digital power meter 120 .

[0092] Exemplarily, the above-mentioned current sensor detects that the current power is greater than the preset power, reduces the current flowing through the intelligent digital power meter 120 according to a preset ratio, and reversely amplifies the current and power displayed by the intelligent digital power meter 120 according to a preset ratio. By reducing the current, the power output is limited to protect the intelligent digital power meter 120.

[0093] Figure 2 A schematic diagram of the structure of a device testing device provided in an embodiment of the present application is shown in FIG. Figure 2 As shown, the above system also includes a standard test bench 140 with a built-in test station, and the above test station is used to access the test device 130; the control terminal 100, power supply equipment 110, intelligent digital power meter 120 and standard test bench 140 in the above system are integrated in a box to form an integrated equipment testing device; the above box can be a fixed box or a movable box.

[0094] In an embodiment of the present application, the control terminal 100 generates a test list for the device under test 130 based on input information such as the rated voltage, rated frequency, and voltage tolerance of the device under test 130. The test list records the test voltage and test frequency corresponding to at least one test item of the device under test 130; the power supply device 110 supplies power to the device under test 130 according to the test voltage and test frequency corresponding to each test item; the intelligent digital power meter 120 connected between the power supply device 110 and the device under test 130 determines the input test result of the device under test 130 corresponding to each test item and uploads the input test result to the control terminal 100. The control terminal 100, the power supply device 110, and the intelligent digital power meter 120 cooperate with each other through communication to quickly implement the input test of the device under test 130, greatly reducing the workload of the tester, saving time and effort, and improving the efficiency of the input test. At the same time, it avoids the possibility of test data errors caused by tester operation errors and improves the accuracy of the input test.

[0095] Figure 3 A schematic diagram of a device testing process provided in an embodiment of the present application is shown as follows: Figure 3 As shown, the process includes:

[0096] S301 : The control terminal 100 generates a test list based on input information, and sends the test list to the power supply device 110 .

[0097] The above step S301 has been Figure 1 The control terminal 100 of the illustrated embodiment has been described in detail and will not be repeated here.

[0098] S302 : The control terminal 100 sends a target instruction to the power supply device 110 , where the target instruction indicates the sequence number of the test item that currently needs to be executed.

[0099] In a possible implementation, the serial number is different from the serial numbers of test items executed in the past.

[0100] S303 : The power supply device 110 searches the test list for the corresponding test voltage and test frequency according to the serial number, and supplies power to the device under test 130 according to the searched test voltage and test frequency.

[0101] S304 : In response to monitoring a jump in the supply voltage and / or supply frequency of the power supply device 110 , the intelligent digital power meter 120 performs an input test on the device under test 130 at a time after the jump and a second preset time.

[0102] In one possible implementation, the second preset time is the time it takes for the input test value of the device under test 130 to become stable again after the power supply voltage and / or power supply frequency of the power supply device 110 changes. For example, the second preset time can be 15 seconds.

[0103] S305 : The intelligent digital power meter 120 uploads the input test result to the control terminal 100 .

[0104] S306 . In response to receiving the uploaded input test result, the control terminal 100 fills the input test result into the test item corresponding to the serial number indicated by the target instruction.

[0105] S307 . The control terminal 100 determines whether there are any unexecuted test items in the test list. In response to a check that there are unexecuted test items in the test list, step S302 is re-executed. In response to a check that there are no unexecuted test items in the test list, the process ends.

[0106] In the embodiment of the present application, for each test item in the test list, the control terminal 100 sends an instruction to the power supply device 110 to supply power to the device under test 130 according to the test voltage and test frequency in the test item, so that the device under test 130 can adjust the power supply voltage and power supply frequency. In this way, there is no need for the tester to operate the power supply device 110 to set up the test environment, which improves the safety of the test process. In addition, the intelligent digital power meter 120 performs input testing on the device under test 130 and uploads the results to the control terminal 100, so that the control terminal 100 records a large amount of test data, reducing the time for testers to record and integrate data, and also eliminating the situation of human error in recording data, thereby ensuring data accuracy.

[0107] Figure 4 A schematic diagram of another device testing process provided in an embodiment of the present application is shown in FIG. Figure 4 As shown, the process includes:

[0108] S401 : The control terminal 100 generates a test list based on input information, and sends the test list to the power supply device 110 .

[0109] The above step S401 has been Figure 1 The control terminal 100 of the illustrated embodiment has been described in detail and will not be repeated here.

[0110] S402. The control terminal 100 sends a power supply control instruction to the power supply device 110, wherein the power supply control instruction is used to instruct the power supply device 110 to supply power to the device under test 130 according to the test voltage and test frequency corresponding to the target test item; and the interval time for updating the target test item is a first preset time, and the position of the updated target test item in the test list is one position after the target test item before the update.

[0111] In one possible implementation, the second preset time is the time it takes for the input test value of the test device 130 to become stable again after the power supply voltage and / or power supply frequency of the power supply device 110 jumps. The first preset time is greater than the second preset time. For example, the second preset time can be 15 seconds, and the first preset time can be 20 seconds.

[0112] S403 : The power supply device 110 supplies power to the device under test 130 according to the power supply control instruction.

[0113] S404 : In response to monitoring a jump in the supply voltage and / or supply frequency of the power supply device 110 , the intelligent digital power meter 120 performs an input test on the device under test at a time after the jump and a second preset time.

[0114] In one possible implementation, the second preset time is the time it takes for the input test value of the test device 130 to become stable again after the power supply voltage and / or power supply frequency of the power supply device 110 jumps. The first preset time is greater than the second preset time. For example, the second preset time can be 15 seconds, and the first preset time can be 20 seconds.

[0115] S405 : The intelligent digital power meter 120 determines the input test result as the input test result of the device under test 130 corresponding to the test item ranked as the target value in the test list, and uploads it to the control terminal 100 .

[0116] In a possible implementation, the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device is monitored to jump.

[0117] S406 . In response to receiving the uploaded input test result, the control terminal 100 fills the input test result into the corresponding test item.

[0118] In an embodiment of the present application, the control terminal 100 sends a power supply control instruction to the power supply device 110, which indicates a method for adjusting the power supply voltage and / or power supply frequency during the entire test process based on the test list. In this way, the control terminal 100 only needs to send a power supply control instruction to the power supply device 110 once to enable the power supply device 110 to self-adjust the power supply voltage and / or power supply frequency, eliminating the need for test personnel to frequently operate the power supply device 110 to set up the test environment, thereby improving the safety of the test process. Accordingly, the intelligent digital power meter 120 determines the test item change in response to the jump of the power supply voltage and / or power supply frequency of the power supply device 110, determines the position of the changed test item in the test list based on the number of jumps that have occurred, and then performs an input test on the test device 130 for the changed test item, and feeds back the test results to the control terminal 100, thereby allowing the control terminal 100 to record a large amount of test data, reducing the time for test personnel to record and integrate data, and also eliminating the situation of human error in recording data, thereby ensuring data accuracy.

[0119] Figure 5 A schematic diagram of another device testing process provided in an embodiment of the present application is shown in FIG. Figure 5 As shown, the process includes:

[0120] S501 : The control terminal 100 generates a test list based on input information, and sends the test list to the power supply device 110 .

[0121] The above step S501 has been Figure 1 The control terminal 100 of the illustrated embodiment has been described in detail and will not be repeated here.

[0122] S502 : The power controller in the power supply device 110 sequentially traverses the test items in the test list, and uses the traversed test items as target test items.

[0123] It can be understood that the power controller is a control device that receives input signals, processes logic and outputs control instructions to the power supply. It can be a hardware controller such as a programmable logic controller, a microcontroller, or a control chip such as an FPGA or CPLD.

[0124] S503 : The power controller in the power supply device 110 controls the power supply in the power supply device 110 to supply power to the device under test 130 according to the test voltage and test frequency corresponding to the target test item.

[0125] In one possible implementation, the power supply duration for each target test item is a first preset time, which is greater than a second preset time. For example, the second preset time may be 15 seconds, and the first preset time may be 20 seconds. The second preset time is the time it takes for the input test value of the device under test 130 to regain stability after the power supply voltage and / or power supply frequency of the power supply device 110 changes.

[0126] S504 : In response to monitoring a jump in the supply voltage and / or supply frequency of the power supply device 110 , the intelligent digital power meter 120 performs an input test on the device under test 130 at a time after the jump and a second preset time.

[0127] S505 : The intelligent digital power meter 120 determines the input test result as the input test result of the device under test 130 corresponding to the test item ranked as the target value in the test list, and uploads it to the control terminal 100 .

[0128] In a possible implementation, the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device 110 is monitored to jump.

[0129] S506 . In response to receiving the uploaded input test result, the control terminal 100 fills the input test result into the corresponding test item.

[0130] In the embodiment of the present application, the control terminal 100 only needs to send a test list to the power supply device 110, and the power controller contained in the power supply device 110 can adjust the power supply voltage and / or power supply frequency of the power supply to the test device 130 according to the order of the list items in the test list, without the tester having to frequently operate the power supply device 110 to connect the test environment, thereby improving the safety of the test process. Accordingly, the intelligent digital power meter 120 determines the change of the test item in response to the jump of the power supply voltage and / or power supply frequency of the power supply device 110, determines the position of the changed test item in the test list based on the number of jumps that have occurred, and then performs an input test on the test device 130 for the changed test item, and feeds back the test results to the control terminal 100, so that the control terminal 100 records a large amount of test data, reduces the time for the tester to record and integrate data, and also eliminates the situation of human error in recording data, thereby ensuring data accuracy.

[0131] Figure 6 A structural diagram of another device testing system provided in an embodiment of the present application is shown as follows: Figure 6 As shown, the system includes: a control terminal 600, a power supply device 610 and multiple intelligent digital power meters 620, the power supply device 610 is electrically connected to the input terminals of the multiple intelligent digital power meters 620 respectively, the output terminals of the multiple intelligent digital power meters 620 are electrically connected one by one to multiple test devices 630, and the control terminal 600 is communicatively connected to the power supply device 610 and the multiple intelligent digital power meters 620;

[0132] The control terminal 600 is configured to generate a test list based on input information and send the test list to the power supply device 610. The input information of the multiple devices under test 630 is consistent, and the input information includes at least a rated voltage, a rated frequency, and a voltage tolerance. The test list records the test voltage and test frequency corresponding to at least one test item. At least one means one or more, and multiple means two or more.

[0133] The power supply device 610 is used to supply power to the device under test 630 according to the test voltage and test frequency corresponding to each test item.

[0134] The intelligent digital power meter 620 is used to determine the input test result of the connected device under test 630 corresponding to each test item, and upload the input test result to the control terminal 600 .

[0135] In one possible implementation, multiple message receiving processes are provided at the control terminal 600. Each message receiving process receives an input test result of a test device 630 connected to the smart digital power meter 620 uploaded by the smart digital power meter 620, and adds it to the corresponding test item.

[0136] In the embodiment of the present application, multiple products with the same input information can be tested simultaneously, thereby improving resource utilization of the test equipment and enhancing test efficiency.

[0137] Further, Figure 7 This is a schematic diagram of the implementation environment involved in a device testing method provided in an embodiment of the present application. Figure 7 As shown, the implementation environment may include: a control terminal 700, a power supply device 710, an intelligent digital power meter 720, a test device 730 and a first server 740; the power supply device 710 is electrically connected to the input end of the intelligent digital power meter 720, the output end of the intelligent digital power meter 720 is electrically connected to the test device 730, and the control terminal 700 is communicatively connected to the power supply device 710 and the intelligent digital power meter 720;

[0138] The control terminal 700 is configured to receive input information, including the rated voltage, rated frequency, and voltage tolerance of the device under test 730. It is also configured to send the input information to the first server 740 and receive a test list from the first server 740, which records the test voltage and test frequency corresponding to at least one test item of the device under test 730. The control terminal 700 is also configured to send the test list to the power supply device 710 and record the input test results of the device under test 730, uploaded by the intelligent digital power meter 720, into the corresponding test item.

[0139] First server 740 can be a server providing query services. Based on the input information sent by control terminal 700, it can query a database for a test list corresponding to the input information. First server 740 can also be a server providing calculation services. Based on the input information sent by control terminal 700, it can determine a set of candidate test voltages and a set of candidate test frequencies. It can then generate a test list by combining a test voltage from the candidate test voltage set and a test frequency from the candidate test frequency set as the test voltage and test frequency corresponding to a test item. First server 740 returns the test list to control terminal 700.

[0140] The power supply device 710 provides power support to the test device 730. It can, under the control of the power supply control instruction sent by the control terminal 700, supply power to the test device 730 in accordance with the test frequency and test voltage corresponding to each test item in the test list. It can also, under the control of its own power supply controller, supply power to the test device 730 in accordance with the test frequency and test voltage corresponding to each test item in the test list.

[0141] After the test item based on which the power supply device 710 supplies power is changed, the intelligent digital power meter 720 performs an input test on the device under test 730, identifies the position of the changed test item in the test list, and uploads the position and input test results to the control terminal 700. The input test results include the test results of at least one input test item, including input current test and input power test.

[0142] Illustratively, the control terminal 700 in the embodiment of the present application may be a mobile phone, a tablet computer, a desktop, a laptop, a notebook computer, a netbook, etc. The embodiment of the present application does not impose any special restrictions on the specific form of the terminal 700.

[0143] The first server 740 can be an independent physical server, or a server cluster or distributed file system composed of multiple physical servers, or at least one of the cloud servers that provide basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communications, middleware services, domain name services, security services, content distribution networks, and big data or artificial intelligence platforms. The embodiments of the present application are not limited to this.

[0144] Figure 8 This is a hardware structure diagram of an electronic device provided in an embodiment of the present application. Figure 8 , Figure 8 The electronic device 800 shown may include: a processor 801 , a memory 802 , a communication interface 803 , and a bus 804 . The processor 801 , the memory 802 , and the communication interface 803 may be connected via a bus 804 .

[0145] The processor 801 is the control center of the terminal device, and can be a general-purpose central processing unit such as a CPU, or other general-purpose processors, etc. The general-purpose processor can be a microprocessor or any conventional processor, etc.

[0146] As an example, the processor 801 may include one or more CPUs, such as Figure 8 CPU 0 and CPU 1 are shown in Figure 1.

[0147] The memory 802 may be a read-only memory (ROM) or other type of static storage device that can store static information and instructions, a random access memory (RAM) or other type of dynamic storage device that can store information and instructions, an electrically erasable programmable read-only memory (EEPROM), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

[0148] In one possible implementation, memory 802 may exist independently of processor 801. Memory 802 may be connected to processor 801 via bus 804 and configured to store data, instructions, or program code. When processor 801 calls and executes the instructions or program code stored in memory 802, the device testing method provided in the embodiments of the present application may be implemented.

[0149] In another possible implementation, the memory 802 may also be integrated with the processor 801 .

[0150] The communication interface 803 is used to connect the terminal device to other devices through a communication network, which can be Ethernet, a radio access network (RAN), a wireless local area network (WLAN), etc. The communication interface 803 may include a receiving unit for receiving data and a sending unit for sending data.

[0151] Bus 804 can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. This bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 8 Only one thick line is used in the diagram, but this does not mean that there is only one bus or one type of bus.

[0152] It should be pointed out that Figure 8 The structure shown in the figure does not constitute a limitation on the electronic device, except Figure 8In addition to the components shown, the electronic device may include more or fewer components than shown, or combine certain components, or arrange the components differently.

[0153] Further, Figure 9 This is a flow chart of a device testing method provided in an embodiment of the present application. Figure 9 As shown, the device testing method includes:

[0154] S901. Generate a test list based on input information, where the input information includes at least a rated voltage, a rated frequency, and a voltage tolerance of the device under test; the test list records a test voltage and a test frequency corresponding to at least one test item of the device under test;

[0155] S902. Based on the test list, control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item;

[0156] S903 : Determine the input test result of the device under test corresponding to each test item using an intelligent digital power meter connected between the power supply device and the device under test.

[0157] The technical solution provided by the embodiment of the present application generates a test list for the device under test based on input information such as the rated voltage, rated frequency, and voltage tolerance of the device under test, and the test list records the test voltage and test frequency corresponding to each of the multiple test items of the device under test; controls the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item, utilizes the intelligent digital power meter connected between the power supply device and the device under test to determine the input test result of the device under test corresponding to each test item, and uploads the input test result to this end. Through communication and coordination between the power supply device and the intelligent digital power meter, the input test of the device under test is quickly realized, which greatly reduces the workload of the tester's operation, saves time and effort, improves the efficiency of the input test, and at the same time avoids the possibility of test data errors caused by tester's operational errors, thereby improving the accuracy of the input test.

[0158] In some possible implementations, the above S901 includes: determining a set of candidate test voltages for the device under test based on the rated voltage, voltage tolerance and pre-stored common test voltages; determining a set of candidate test frequencies for the device under test based on the rated frequency; and generating a test list by taking a combination of a test voltage in the candidate test voltage set and a test frequency in the candidate test frequency set as the test voltage and test frequency corresponding to a test item.

[0159] In some possible implementations, the method further includes displaying a test list; and in response to receiving a correction instruction within a third preset time, correcting the test list, wherein the correction instruction is used to correct at least one test item in the test list.

[0160] In some possible implementations, the above S902 includes: sending a test list and a power supply control instruction to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item; wherein the interval time for updating the target test item is a first preset time, and the position of the updated target test item in the test list is one position after the target test item before the update.

[0161] In some possible implementations, the power supply device includes a power controller and a power supply, and the step S802 includes:

[0162] A test list is sent to the power supply controller so that the power supply controller controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to each test item based on the test list; wherein the power supply controller sequentially traverses the test items in the test list and takes the traversed test items as target test items; the power supply is controlled to supply power to the device under test according to the test voltage and test frequency corresponding to the target test items, and the power supply duration under each target test item is a first preset time.

[0163] In some possible implementations, the above-mentioned S903 includes: receiving the input test results of the device under test corresponding to each test item uploaded by the intelligent digital power meter, wherein the intelligent digital power meter responds to monitoring that the power supply voltage and / or power supply frequency of the power supply device has jumped, and performs an input test on the device under test at a time after the jump moment and at a second preset time away, and determines the input test result as the input test result of the device under test corresponding to the test item sorted as the target value in the test list, the first preset time is greater than the second preset time; the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device is monitored to jump.

[0164] In some possible implementations, the above method further includes: adding the input test result to the corresponding test item.

[0165] In some possible implementations, the input test result includes a test result of at least one input test item, and the input test item includes an input current test and an input power test.

[0166] In some possible implementations, the method further includes: in response to the test result of the input test item not being within a standard defined range of the input test item, marking the test result of the input test item.

[0167] Further, Figure 10 A structural diagram of another device testing device provided in an embodiment of the present application is shown as follows: Figure 10 As shown, the device includes a generating module 1001, a controlling module 1002 and a determining module 1003.

[0168] The generation module 1001 is used to generate a test list based on input information, wherein the input information includes at least the rated voltage, rated frequency and voltage tolerance of the device under test; the test list records the test voltage and test frequency corresponding to at least one test item of the device under test.

[0169] The control module 1002 is used to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item based on the test list;

[0170] The determination module 1003 is configured to determine the input test result of the device under test corresponding to each test item using an intelligent digital power meter connected between the power supply device and the device under test.

[0171] The technical solution provided by the embodiment of the present application generates a test list for the device under test based on input information such as the rated voltage, rated frequency, and voltage tolerance of the device under test, and the test list records the test voltage and test frequency corresponding to each of the multiple test items of the device under test; controls the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item, utilizes the intelligent digital power meter connected between the power supply device and the device under test to determine the input test result of the device under test corresponding to each test item, and uploads the input test result to this end. Through communication and coordination between the power supply device and the intelligent digital power meter, the input test of the device under test is quickly realized, which greatly reduces the workload of the tester's operation, saves time and effort, improves the efficiency of the input test, and at the same time avoids the possibility of test data errors caused by tester's operational errors, thereby improving the accuracy of the input test.

[0172] In some possible implementations, the generating module 1001 includes: a first determining unit, a second determining unit, and a generating unit.

[0173] A first determining unit is configured to determine a set of candidate test voltages for the device under test based on a rated voltage, a voltage tolerance, and pre-stored common test voltages;

[0174] A second determining unit is configured to determine a set of candidate test frequencies for the device under test based on the rated frequency;

[0175] The generating unit is configured to generate a test list by taking a combination of a test voltage in a candidate test voltage set and a test frequency in a candidate test frequency set as a test voltage and a test frequency corresponding to a test item.

[0176] In some possible implementations, the apparatus further includes a display module, wherein the display module is configured to display the test list.

[0177] In some possible implementations, the apparatus further includes a correction module, wherein the correction module is configured to correct the test list in response to receiving a correction indication within a third preset time, wherein the correction indication is used to correct at least one test item in the test list.

[0178] In some possible implementations, the control module 1002 is specifically used to: send a test list and a power supply control instruction to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item; wherein the interval time for updating the target test item is a first preset time, and the position of the updated target test item in the test list is one position after the target test item before the update.

[0179] In some possible implementations, the power supply device includes a power supply controller and a power supply. In some possible implementations, the control module 1002 is specifically used to: send a test list to the power supply controller, so that the power supply controller controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to each test item based on the test list; wherein the power supply controller sequentially traverses the test items in the test list and takes the traversed test items as target test items; controls the power supply to supply power to the device under test according to the test voltage and test frequency corresponding to the target test items, and the power supply duration under each target test item is a first preset time.

[0180] In some possible implementations, the above-mentioned generation module is specifically used to: receive the input test results of the test device corresponding to each test item uploaded by the intelligent digital power meter, wherein the intelligent digital power meter responds to monitoring the power supply voltage and / or power supply frequency of the power supply device to jump, and performs an input test on the test device at a time after the jump moment and at a second preset time away, and determines the input test result as the input test result of the test device corresponding to the test item sorted as the target value in the test list, the first preset time is greater than the second preset time; the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device is monitored to jump.

[0181] In some possible implementations, the apparatus further includes a recording module, wherein the recording module is configured to add the input test result to the corresponding test item.

[0182] In some possible implementations, the input test result includes a test result of at least one input test item, and the input test item includes an input current test and an input power test.

[0183] In some possible implementations, the apparatus further includes a marking module, wherein the marking module is configured to mark the test result of the input test item in response to the test result of the input test item not being within a standard defined range of the input test item.

[0184] An embodiment of the present application further provides a computer-readable storage medium, which stores computer program instructions. The computer program instructions are used to enable an electronic device to execute the device testing method shown in the above embodiment.

[0185] An embodiment of the present application further provides a computer program product, including computer program instructions. When the computer program instructions are executed on an electronic device, the electronic device executes the device testing method shown in the above embodiment.

[0186] The electronic device, computer-readable storage medium, or computer program product provided in the embodiments of the present application are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects of the corresponding methods provided above, and will not be repeated here.

[0187] Through the description of the above implementation methods, those skilled in the art can clearly understand that for the convenience and brevity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device (such as an electronic device) is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device (such as an electronic device) and unit described above can refer to the corresponding process in the aforementioned method embodiment and will not be repeated here.

[0188] In the several embodiments provided in the embodiments of the present application, it should be understood that the disclosed systems, devices (such as electronic devices) and methods can be implemented in other ways. For example, the device (such as electronic device) embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0189] The units described above as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solutions in the embodiments of the present application.

[0190] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0191] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiment of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) or a processor to execute all or part of the steps of the method of each embodiment of the embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as flash memory, mobile hard disk, read-only memory, random access memory, magnetic disk or optical disk.

[0192] The above is only a specific implementation of the embodiment of the present application, but the scope of protection of the embodiment of the present application is not limited to this. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the embodiment of the present application, and they should be included in the scope of protection of the embodiment of the present application. Therefore, the scope of protection of the embodiment of the present application should be based on the scope of protection of the claims.

Claims

1. A device testing system, characterized in that: The system includes: a control terminal, a power supply device, and an intelligent digital power meter; the control terminal is communicatively connected with the power supply device and the intelligent digital power meter; The control terminal is configured to generate a test list based on input information and send the test list to the power supply device, wherein the input information includes at least the rated voltage, rated frequency, and voltage tolerance of the device under test; the test list records the test voltage and test frequency corresponding to at least one test item of the device under test; The power supply device is used to supply power to the device under test according to the test voltage and test frequency corresponding to each test item; The intelligent digital power meter is connected between the power supply device and the device under test, and is used to determine the input test result of the device under test corresponding to each test item, and upload the input test result to the control terminal.

2. The device testing system according to claim 1, characterized in that: The control terminal generates a test list based on the input information, including: Determining a set of candidate test voltages for the device under test based on the rated voltage, the voltage tolerance, and pre-stored common test voltages; Determining a set of candidate test frequencies for the device under test based on the rated frequency; The test list is generated by taking a combination of a test voltage in the candidate test voltage set and a test frequency in the candidate test frequency set as a test voltage and a test frequency corresponding to a test item.

3. The device testing system according to claim 1, wherein: The control terminal is further configured to send a power supply control instruction to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item; The target test item update interval is a first preset time, and the updated target test item is located one position after the target test item before the update in the test list.

4. The device testing system according to claim 1, wherein: The power supply device includes a power controller and a power supply; The power supply controller is used to sequentially traverse the test items in the test list and use the traversed test items as target test items; The power supply is controlled to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item, and the power supply duration under each target test item is a first preset time.

5. The device testing system according to claim 3 or 4, characterized in that: The intelligent digital power meter determines the input test result of the power supply device corresponding to each test item, including: In response to monitoring a jump in the power supply voltage and / or power supply frequency of the power supply device, performing an input test on the device under test at a time after the jump and at a second preset time, wherein the first preset time is greater than the second preset time; The input test result is determined as the input test result of the device under test corresponding to the test item sorted as the target value in the test list, wherein the target value is the number of jumps in the power supply voltage and / or power supply frequency of the power supply device monitored.

6. A device testing method, characterized in that: The method comprises: Generate a test list based on input information, wherein the input information includes at least a rated voltage, a rated frequency, and a voltage tolerance of the device under test; the test list records a test voltage and a test frequency corresponding to at least one test item of the device under test; Based on the test list, controlling the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item; An intelligent digital power meter connected between the power supply device and the device under test is used to determine an input test result of the device under test corresponding to each test item.

7. The device testing method according to claim 6, characterized in that: Generating a test list based on input information includes: Determining a set of candidate test voltages for the device under test based on the rated voltage, the voltage tolerance, and pre-stored common test voltages; Determining a set of candidate test frequencies for the device under test based on the rated frequency; The test list is generated by taking a combination of a test voltage in the candidate test voltage set and a test frequency in the candidate test frequency set as a test voltage and a test frequency corresponding to a test item.

8. The device testing method according to claim 6, characterized in that: The controlling, based on the test list, the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to each test item includes: Sending the test list and power supply control instructions to the power supply device to control the power supply device to supply power to the device under test according to the test voltage and test frequency corresponding to the target test item; The target test item update interval is a first preset time, and the updated target test item is located one position after the target test item before the update in the test list.

9. The device testing method according to claim 8, characterized in that: Determining the input test result of the device under test corresponding to each test item includes: Receive the input test results of the device under test corresponding to each of the test items uploaded by the intelligent digital power meter, wherein the intelligent digital power meter, in response to monitoring a jump in the power supply voltage and / or power supply frequency of the power supply device, performs an input test on the device under test at a moment after the jump and at a second preset time, and determines the input test result as the input test result of the device under test corresponding to the test item sorted as the target value in the test list, the first preset time is greater than the second preset time; the target value is the number of times the power supply voltage and / or power supply frequency of the power supply device is monitored to jump.

10. An electronic device, characterized in that: The method comprises a memory and a processor; the memory and the processor are coupled; the memory is used to store computer program code, and the computer program code includes computer instructions; wherein, when the processor calls the program instructions to execute the method according to any one of claims 6 to 9.

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