Method suitable for automatic testing of measuring core of single-phase Internet of Things meter

Abstract

The invention discloses an automatic test method suitable for a single-phase Internet of Things meter metering core, and relates to the field of automatic test.The method comprises the steps that an experiment voltage set and an experiment current set are obtained by obtaining basic parameters of a target single-phase Internet of Things meter metering core, and an experiment interference set is obtained by presetting the power value of an electromagnetic interference device; constructing a corresponding test environment through elements in the experiment voltage set, the experiment current set and the experiment interference set, and respectively collecting curves of display power, communication delay and data loss rate along with time change in the test environment; analyzing the three curves to respectively obtain a power indication value, a communication indication value and a data indication value; according to the method, the defects of traditional manual testing can be overcome, the data value is deeply mined, comprehensive evaluation of the performance of the metering core is achieved, and powerful support is provided for quality control of the single-phase Internet-of-things meter.

Description

Technical Field

[0001] The present invention relates to the field of automated testing, in particular to a method suitable for automated testing of a measuring core of a single-phase IoT meter. Background Art

[0002] With the rapid development of digital and intelligent technologies, single-phase IoT meters are widely used in energy metering fields such as electricity and water, thanks to their remote data transmission and real-time monitoring capabilities. As the core component of single-phase IoT meters, the metering core undertakes the critical task of accurately collecting and processing data. Its performance directly affects the meter's accuracy, reliability, and stability. Therefore, comprehensive and efficient testing of the metering core has become an important part of ensuring the quality of IoT meters. Traditional single-phase IoT meter core testing relies primarily on manual operation. Testers must manually connect test equipment, set test parameters, and read and record test data. This method is not only inefficient and time-consuming, but also prone to human error, making it difficult to ensure the consistency and accuracy of test results. Existing solutions for testing single-phase IoT meter cores often rely on simple data storage and basic statistics, which prevents in-depth data mining and makes it difficult to fully evaluate the performance of the core. Achieving a comprehensive evaluation of the metering core is a problem we need to solve. To this end, a method suitable for automated testing of the metering core of a single-phase IoT meter is provided. Summary of the Invention

[0003] The object of the present invention is to provide a method suitable for automatic testing of a measuring core of a single-phase IoT meter.

[0004] The purpose of the present invention can be achieved by the following technical solution: A method for automated testing of a single-phase IoT meter core, comprising the following steps: S1: Obtain the basic parameters of the target single-phase IoT meter core, build multiple test environments based on the basic parameters, and collect fault data in the test environments; S2: Analyze the curve showing the change of power over time to obtain a power indication value; S3: Analyze the curve of communication delay changing with time to obtain a communication indicator value; S4: Analyze the curve of data loss rate changing with time to obtain a data indication value; S5: Fill the power indication value, communication indication value and data indication value corresponding to the elements in the experimental voltage set, experimental current set and experimental interference set into a preset test report template to obtain a test report of the single-phase IoT meter core.

[0005] Preferably, the basic parameters include: rated voltage, rated current, voltage operating range and current operating range; The test environment includes: a voltage abnormality test environment, a current abnormality test environment and a communication abnormality test environment; The fault data includes: a curve showing power changes over time, a curve showing communication delay changes over time, and a curve showing data loss rate changes over time.

[0006] Preferably, the process of constructing multiple test environments according to basic parameters is: Taking the rated voltage as the benchmark, the voltage change value is preset, and the experimental voltage set is obtained according to the rated voltage, voltage operating range and voltage change value. The voltage anomaly test environment is constructed based on the elements in the experimental voltage set; Based on the rated current, the current change value is preset, and the experimental current set is obtained according to the rated current, the current working range and the current change value. The current abnormality test environment is constructed based on the elements in the experimental current set. The operating power value of the electromagnetic interference generator is preset to obtain an experimental interference set, and a communication anomaly test environment is constructed based on the elements in the experimental interference set.

[0007] Preferably, the process of analyzing the curve showing the change of power over time to obtain the power indication value is: G1: Draw a threshold line about the actual power on the curve showing the change of power over time, and obtain the area enclosed by the threshold line and the curve showing the change of power over time as the difference area; G2: Obtain the display interval of the displayed power, divide the display interval into several subintervals, and obtain different power abnormality values according to the curve of the displayed power changing over time. The power error value is obtained based on the power abnormality value and power frequency. G3: A sliding window and sliding step are preset. The power-over-time curve is slid according to the sliding step to obtain a slope set. The standard deviation of the elements in the slope set is taken as the power fluctuation index. G4: The difference area, power error value, and power fluctuation index are integrated to obtain a comprehensive power value.

[0008] Preferably, the process of analyzing the curve of communication delay changing with time to obtain the communication indicator value is: A delay threshold is preset, and low and high delay times are obtained according to the delay threshold, and a high-low ratio is obtained according to the low and high delay times; Set several marking points in the curve of communication delay changing with time, obtain the slope values between adjacent marking points, and obtain a delay slope set; Obtain the number of elements greater than 0 and the number of elements less than 0 in the delay slope set, record them as the delay increase number and the delay decrease number respectively, and divide the delay increase number by the delay decrease number to obtain the positive and negative ratio; Divide the delay slope set into an increasing set and a decreasing set according to the sign of the elements in the delay slope set, obtain the slope mean of the increasing set and the decreasing set, and divide the slope mean of the increasing set by the slope mean of the decreasing set to obtain the delay ratio; The high-low ratio, positive-negative ratio, and delay ratio are fused to obtain a communication indication value.

[0009] Preferably, the process of analyzing the curve of data loss rate changing with time to obtain the data indication value is as follows: Obtain extreme points in the curve of data loss rate changing with time, and classify the extreme points into positive extreme points and negative extreme points according to the sign of the second-order derivative of the extreme points; Obtain the time values between adjacent extreme points, divide the time values into positive time values and negative time values according to the positive and negative order of the adjacent extreme points, and obtain the time ratio based on the positive time values and the negative time values; Obtain the slope value between adjacent extreme value points as the extreme value slope, preset the extreme value slope threshold, and obtain the extreme value ratio based on the extreme value slope and the extreme value slope threshold; Obtain the number of positive slopes and the number of negative slopes, and divide the number of positive slopes by the number of negative slopes to obtain the number ratio; The number ratio, extreme value ratio and progress ratio are fused to obtain the data indicator value.

[0010] Preferably, the process of obtaining the extreme value ratio according to the extreme value slope and the extreme value slope threshold is: The extreme value slope includes a positive extreme value slope and a negative extreme value slope; According to the positive and negative slope values between adjacent extreme points, the slope values are divided into positive slope and negative slope; The number of positive slopes greater than the positive extreme value slope is obtained as the number of high extreme values, the number of negative slopes less than the negative extreme value slope is obtained as the number of low extreme values, and the number of high extreme values is divided by the number of low extreme values to obtain the extreme value ratio.

[0011] Compared with the prior art, the present invention has the following beneficial effects: The present invention obtains the basic parameters of the target single-phase Internet of Things meter core to obtain an experimental voltage set and an experimental current set, and obtains an experimental interference set by presetting the power value of the electromagnetic interferer; a corresponding test environment is constructed through the elements in the experimental voltage set, the experimental current set, and the experimental interference set, and curves showing how the power, communication delay, and data loss rate change with time are collected in the test environment; the three curves are analyzed to obtain the power indication value, the communication indication value, and the data indication value, respectively; the present invention can overcome the drawbacks of traditional manual testing, deeply mine the value of data, realize the comprehensive evaluation of the metering core performance, and provide strong support for the quality control of single-phase Internet of Things meters. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments described in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0013] Figure 1 This is a schematic diagram of the present invention. DETAILED DESCRIPTION

[0014] like Figure 1 As shown, a method for automated testing of a single-phase IoT meter core includes: S1: Obtain the basic parameters of the target single-phase IoT meter core, build multiple test environments based on the basic parameters, and collect fault data in the test environments; The basic parameters include: rated voltage, rated current, voltage operating range and current operating range; The test environment includes: a voltage abnormality test environment, a current abnormality test environment and a communication abnormality test environment; Taking the rated voltage as the benchmark, the voltage change value is preset, and the experimental voltage set is obtained according to the rated voltage, voltage operating range and voltage change value. The voltage anomaly test environment is constructed based on the elements in the experimental voltage set; Based on the rated current, the current change value is preset, and the experimental current set is obtained according to the rated current, the current working range and the current change value. The current abnormality test environment is constructed based on the elements in the experimental current set. Preset the operating power value of the electromagnetic interference generator to obtain an experimental interference set, and build a communication anomaly test environment based on the elements in the experimental interference set; Specifically, if the rated voltage is 220V, the voltage variation value is 10, and the voltage operating range is [180, 260], then the experimental voltage set is {180, 190, 200, 210, 220, 230, 240, 250, 260}; Specifically, the process of constructing a voltage anomaly test environment involves using a linear regulator to provide a corresponding voltage to a single-item IoT meter based on the data in the experimental voltage set. A constant current source circuit is used to maintain a constant current supplied to the single-item IoT meter and to ensure that the single-item IoT meter is not affected by external electromagnetic interference. During the experiment, fault data corresponding to each element in the experimental voltage set is obtained. The process of constructing the current anomaly test environment refers to the process of constructing the voltage anomaly test environment; The process of building a communication anomaly test environment is as follows: ensure that the voltage and current provided to the single-item IoT meter are at the rated voltage and rated current, and use an electromagnetic interference generator to interfere with the single-item IoT meter according to the elements in the experimental interference set. During the experiment, the fault data corresponding to each element in the experimental interference set is obtained. The fault data includes: a curve showing power changes over time, a curve showing communication delay changes over time, and a curve showing data loss rate changes over time; In detail, each element in the experimental voltage set, the experimental current set, and the experimental interference set corresponds to a set of fault data.

[0015] S2: Analyze the curve showing the change of power over time to obtain a power indication value; G1: Draw a threshold line about the actual power on the curve showing the change of power over time, and obtain the area enclosed by the threshold line and the curve showing the change of power over time as the difference area; G2: Obtain the display interval of the displayed power, divide the display interval into several subintervals, and obtain different power abnormality values according to the curve of the displayed power changing over time. The power error value is obtained based on the power abnormality value and power frequency. Specifically, the maximum and minimum values of the display power are extracted from the curve showing the change of the display power over time, the maximum value of the display power is used as the upper limit of the display interval, and the minimum value of the display power is used as the lower limit of the display interval, thereby obtaining the display interval; Specifically, the greater the absolute value of the difference between the maximum value of a subinterval and the actual power, the greater the power anomaly value corresponding to the subinterval; Specifically, two threshold lines are drawn for the maximum and minimum values of the subinterval in a curve showing power changes over time, and the sum of the times corresponding to the curve segments between the two threshold lines is counted. The result is used as the abnormal time of the corresponding subinterval, and the abnormal time of the subinterval is divided by the sum of the abnormal times of all subintervals to obtain the power frequency of the corresponding subinterval. In detail, the power frequency corresponding to the subinterval is multiplied by the power anomaly value to obtain the power error value; G3: A sliding window and sliding step are preset. The power-over-time curve is slid according to the sliding step to obtain a slope set. The standard deviation of the elements in the slope set is taken as the power fluctuation index. In detail, the curve showing the change of power over time is referred to as a curve. Each time the curve is slid according to the sliding step, the slope value within the sliding window is recorded, and all the slope values obtained are referred to as a slope set. Specifically, the size of the sliding window and sliding step is determined according to the experimental time. The shorter the experimental time, the smaller the corresponding sliding window and sliding step. The sliding step should be less than or equal to the sliding window. Specifically, the intersection points of the first and last ends of the sliding window with the curve are obtained, and the slope value between the two points is calculated as the slope value of the sliding window; G4: Fusion the difference area, power error value, and power fluctuation index to obtain a comprehensive power value; In detail, fusion processing refers to a data processing method that combines data from multiple dimensions into one data, making the synthesized data more representative while avoiding the randomness caused by a single factor; In detail, this embodiment presets the weight influence factors corresponding to the difference area, power error value and power fluctuation index, and performs weighted processing on the difference area, power error value and power fluctuation index based on the preset weight influence factors to obtain the power indication value. The smaller the power indication value, the more accurate the measurement of the single-phase IoT meter.

[0016] S3: Analyze the curve of communication delay changing with time to obtain a communication indicator value; A delay threshold is preset, and low and high delay times are obtained according to the delay threshold, and a high-low ratio is obtained according to the low and high delay times; Specifically, the curve showing the change of communication delay over time is referred to as a delay line. A threshold line about the delay threshold is drawn in the delay line. The sum of the time above and below the threshold line in the delay line is counted as the high delay and low delay, respectively. The high delay is divided by the low delay, and the result is taken as the high-low ratio. The smaller the high-low ratio, the better the performance of the single-phase IoT meter. Set several marking points in the curve of communication delay changing with time, obtain the slope values between adjacent marking points, and obtain a delay slope set; Specifically, take points at equal distances on the x-axis and draw straight lines perpendicular to the x-axis through these points. These straight lines will intersect with the delay lines and use these intersections as marking points. Obtain the number of elements greater than 0 and the number of elements less than 0 in the delay slope set, record them as the delay increase number and the delay decrease number respectively, and divide the delay increase number by the delay decrease number to obtain the positive and negative ratio; Divide the delay slope set into an increasing set and a decreasing set according to the sign of the elements in the delay slope set, obtain the slope mean of the increasing set and the decreasing set, and divide the slope mean of the increasing set by the slope mean of the decreasing set to obtain the delay ratio; Specifically, if an element in the delay slope set is greater than or equal to 0, the element is classified into the increasing set, otherwise, it is classified into the decreasing set; Specifically, the slant mean of the ascending set is obtained by averaging the elements in the ascending set to obtain the slant mean; the slant mean of the descending set is obtained by averaging the elements in the descending set and taking the absolute value to obtain the slant mean; In detail, the smaller the delay ratio, the better the performance of the single-phase IoT meter; The high-low ratio, positive-negative ratio, and delay ratio are integrated to obtain a communication indication value; In detail, the weight influence factors corresponding to the high-low ratio, positive-negative ratio and delay ratio are preset, and the high-low ratio, positive-negative ratio and delay ratio are weighted based on the preset weight influence factors to obtain a communication indication value. The smaller the communication indication value, the better the communication effect of the single-phase IoT meter.

[0017] S4: Analyze the curve of data loss rate changing with time to obtain a data indication value; Obtain extreme points in the curve of data loss rate changing with time, and classify the extreme points into positive extreme points and negative extreme points according to the sign of the second-order derivative of the extreme points; Specifically, if the second-order derivative of an extreme point is less than 0, the extreme point is marked as a positive extreme point; otherwise, the extreme point is marked as a negative extreme point; Obtain the time values between adjacent extreme points, divide the time values into positive time values and negative time values according to the positive and negative order of the adjacent extreme points, and obtain the time ratio based on the positive time values and the negative time values; Specifically, the curve of the data loss rate changing with time between adjacent extreme value points is marked as an extreme value segment. If the extreme value segment has a positive extreme value point on the left and a negative extreme value point on the right, the time corresponding to the extreme value segment is recorded as the positive time value; if the extreme value segment has a negative extreme value point on the left and a positive extreme value point on the right, the time corresponding to the extreme value segment is recorded as the negative time value. Specifically, the positive time values corresponding to all extreme value segments are accumulated to obtain the positive cumulative sum, and the negative time values corresponding to all extreme value segments are accumulated to obtain the negative cumulative sum. The positive cumulative sum is divided by the negative cumulative sum, and the result is used as the progress ratio. Obtain the slope value between adjacent extreme value points as the extreme value slope, preset the extreme value slope threshold, and obtain the extreme value ratio based on the extreme value slope and the extreme value slope threshold; Specifically, based on the positive and negative slope values between adjacent extreme value points, the slope values are divided into positive slopes and negative slopes. A positive slope value is regarded as a positive slope, and a negative slope value is regarded as a negative slope. At the same time, the extreme value slopes are also divided into positive extreme value slopes and negative extreme value slopes. The number of points with a positive slope greater than the positive extreme value slope is obtained as the number of high extreme values, and the number of points with a negative slope less than the negative extreme value slope is obtained as the number of low extreme values. The number of high extreme values is divided by the number of low extreme values to obtain the extreme value ratio. Obtain the number of positive slopes and the number of negative slopes, and divide the number of positive slopes by the number of negative slopes to obtain the number ratio; The number ratio, extreme value ratio and progress ratio are fused to obtain the data indicator value; In detail, the weight influence factors corresponding to the number ratio, extreme value ratio and progress ratio are preset, and the number ratio, extreme value ratio and progress ratio are weighted based on the preset weight influence factors to obtain a data indication value. The smaller the data indication value, the better the data preservation effect of the single-phase IoT table.

[0018] S5: Fill the power indication value, communication indication value and data indication value corresponding to the elements in the experimental voltage set, experimental current set and experimental interference set into a preset test report template to obtain a test report of the single-phase IoT meter core.

[0019] The above description is merely a preferred embodiment of the present invention and does not constitute any form of limitation to the present invention. Although the present invention has been disclosed as a preferred embodiment as above, it is not intended to limit the present invention. Any person skilled in the art can make some changes or modifications to equivalent embodiments using the technical contents disclosed above without departing from the scope of the technical solution of the present invention. However, any modification or equivalent replacement of the above embodiments made according to the technical essence of the present invention without departing from the content of the technical solution of the present invention still falls within the scope of the technical solution of the present invention.

Claims

1. A method for automated testing of a single-phase IoT meter core, characterized in that: The following steps are involved: S1: Obtain the basic parameters of the target single-phase IoT meter core, build multiple test environments based on the basic parameters, and collect fault data in the test environments; S2: Analyze the curve showing the change of power over time to obtain a power indication value; S3: Analyze the curve of communication delay changing with time to obtain a communication indicator value; S4: Analyze the curve of data loss rate changing with time to obtain a data indication value; S5: Fill the power indication value, communication indication value and data indication value corresponding to the elements in the experimental voltage set, experimental current set and experimental interference set into a preset test report template to obtain a test report of the single-phase IoT meter core.

2. A method for automated testing of a single-phase IoT meter core according to claim 1, characterized in that: The basic parameters include: rated voltage, rated current, voltage operating range and current operating range; The test environment includes: a voltage abnormality test environment, a current abnormality test environment and a communication abnormality test environment; The fault data includes: a curve showing power changes over time, a curve showing communication delay changes over time, and a curve showing data loss rate changes over time.

3. The method for automated testing of a single-phase IoT meter core according to claim 1, wherein: The process of building multiple test environments based on basic parameters is as follows: Taking the rated voltage as the benchmark, the voltage change value is preset, and the experimental voltage set is obtained according to the rated voltage, voltage operating range and voltage change value. The voltage anomaly test environment is constructed based on the elements in the experimental voltage set; Based on the rated current, the current change value is preset, and the experimental current set is obtained according to the rated current, the current working range and the current change value. The current abnormality test environment is constructed based on the elements in the experimental current set. The operating power value of the electromagnetic interference generator is preset to obtain an experimental interference set, and a communication anomaly test environment is constructed based on the elements in the experimental interference set.

4. A method for automated testing of a single-phase IoT meter core according to claim 1, characterized in that: The process of analyzing the curve showing the change of power over time and obtaining the power indication value is as follows: G1: Draw a threshold line about the actual power on the curve showing the change of power over time, and obtain the area enclosed by the threshold line and the curve showing the change of power over time as the difference area; G2: Obtain the display interval of the displayed power, divide the display interval into several subintervals, and obtain different power abnormality values according to the curve of the displayed power changing over time. The power error value is obtained based on the power abnormality value and power frequency. G3: A sliding window and sliding step are preset. The power-over-time curve is slid according to the sliding step to obtain a slope set. The standard deviation of the elements in the slope set is taken as the power fluctuation index. G4: The difference area, power error value, and power fluctuation index are integrated to obtain a comprehensive power value.

5. The method for automated testing of a single-phase IoT meter core according to claim 1, characterized in that: The process of analyzing the curve of communication delay changing with time and obtaining the communication indicator value is as follows: A delay threshold is preset, and low and high delay times are obtained according to the delay threshold, and a high-low ratio is obtained according to the low and high delay times; Set several marking points in the curve of communication delay changing with time, obtain the slope values between adjacent marking points, and obtain a delay slope set; Obtain the number of elements greater than 0 and the number of elements less than 0 in the delay slope set, record them as the delay increase number and the delay decrease number respectively, and divide the delay increase number by the delay decrease number to obtain the positive and negative ratio; Divide the delay slope set into an increasing set and a decreasing set according to the sign of the elements in the delay slope set, obtain the slope mean of the increasing set and the decreasing set, and divide the slope mean of the increasing set by the slope mean of the decreasing set to obtain the delay ratio; The high-low ratio, positive-negative ratio, and delay ratio are fused to obtain a communication indication value.

6. The method for automated testing of a single-phase IoT meter core according to claim 1, characterized in that: The process of analyzing the curve of data loss rate changing with time and obtaining the data indication value is as follows: Obtain extreme points in the curve of data loss rate changing with time, and classify the extreme points into positive extreme points and negative extreme points according to the sign of the second-order derivative of the extreme points; Obtain the time values between adjacent extreme points, divide the time values into positive time values and negative time values according to the positive and negative order of the adjacent extreme points, and obtain the time ratio based on the positive time values and the negative time values; Obtain the slope value between adjacent extreme value points as the extreme value slope, preset the extreme value slope threshold, and obtain the extreme value ratio based on the extreme value slope and the extreme value slope threshold; Obtain the number of positive slopes and the number of negative slopes, and divide the number of positive slopes by the number of negative slopes to obtain the number ratio; The number ratio, extreme value ratio and progress ratio are fused to obtain the data indicator value.

7. A method for automated testing of a single-phase IoT meter core according to claim 6, characterized in that: The process of obtaining the extreme value ratio based on the extreme value slope and the extreme value slope threshold is: The extreme value slope includes a positive extreme value slope and a negative extreme value slope; According to the positive and negative slope values between adjacent extreme points, the slope values are divided into positive slope and negative slope; The number of positive slopes greater than the positive extreme value slope is obtained as the number of high extreme values, the number of negative slopes less than the negative extreme value slope is obtained as the number of low extreme values, and the number of high extreme values is divided by the number of low extreme values to obtain the extreme value ratio.

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