Surge testing device

Abstract

The invention provides a surge testing device, and relates to the technical field of semiconductor device testing, a first end of a high voltage generator in the surge testing device is connected with a first end of a window period module, a second end of the window period module is connected with a first end of a tested device, and a second end of the tested device is connected with a second end of the high voltage generator; the window period module is in a closed state when the high-voltage generator outputs the surge pulse and is in a disconnected state when the high-voltage generator stops outputting the surge pulse, which is equivalent to disconnecting a circuit for connecting the high-voltage generator and the tested equipment when the waveform of a complete surge pulse is finished. The problems that after the high-voltage generator releases a complete surge pulse waveform, current in the tested equipment flows back into the high-voltage generator connected with the tested equipment, the high-voltage generator breaks down, waveform distortion is caused, and impact waveform parameter errors become large are solved, so that the accuracy of a test result is guaranteed, and the test efficiency is improved. And the reliability and the safety of equipment are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor device testing, and more specifically, to a surge testing device. Background Art

[0002] A surge is a severe pulse that occurs within only a few millionths of a second. The possible sources of surges can be divided into external lightning reasons and internal electrical equipment startup and faults, etc. Surges widely exist in industrial control and the working environments of electronic and electrical products, and can frequently cause abnormal operation, equipment failures or damages. The impact voltage of surges is mostly in the range of several hundred volts to several tens of kilovolts, and the impact current of surges is mostly in the range of several hundred amperes to several tens of kiloamperes. Therefore, taking protective measures for circuits is a common practice at present.

[0003] Currently, a surge protector is usually added to the device under test to protect the circuit. When a high-voltage generator generates a surge, the surge protector can effectively absorb the sudden huge energy to protect the device under test from being damaged. The basic components used in surge protectors include gas discharge tubes, varistors, etc. However, after the gas discharge tube conducts, if the working voltage of the device under test is higher than the on-state voltage of the gas discharge tube, the gas discharge tube will remain in the conducting state all the time, and a large current at the ampere level passes through the circuit for a long time, which easily causes the gas discharge tube in the surge protector to still maintain the existence of the arc channel of the gas discharge tube after discharging the overcurrent, resulting in a follow-current phenomenon.

[0004] The existence of the follow-current phenomenon is very harmful to the gas discharge tube itself and the protected device under test. The continuous follow-current phenomenon will cause the gas discharge tube to generate a large amount of heat in a short time, resulting in damage to components such as switches, relays, fuses, etc. in the circuit of the device under test. In severe cases, it will also cause the device under test to heat up and catch fire, resulting in sample damage and inability to work normally. The follow-current phenomenon may also cause the current in the device under test to flow back into the high-voltage generator connected to the device under test, causing faults in the high-voltage generator, resulting in problems such as waveform distortion and increased impact waveform parameter errors, and ultimately causing a decline in the performance of the high-voltage generator. In severe cases, it will cause damage to the high-voltage generator.

[0005] Therefore, how to avoid the current in the device under test flowing back into the high-voltage generator connected to the device under test and causing faults in the high-voltage generator is a technical problem that needs to be urgently solved by those skilled in the art. Summary of the Invention

[0006] In view of this, to solve the above problems, the present invention provides a surge testing device, which can solve the technical problem that the current in the device under test flows back into the high-voltage generator connected to the device under test and causes faults in the high-voltage generator. The technical solution is as follows:

[0007] The present application provides a surge test device, and the surge test device includes:

[0008] A high-voltage generator and a window period module;

[0009] The first end of the high-voltage generator is connected to the first end of the window period module, the second end of the window period module is connected to the first end of the device under test, and the second end of the device under test is connected to the second end of the high-voltage generator;

[0010] The window period module is configured to be in a closed state when the high-voltage generator outputs a surge pulse and in an open state when the high-voltage generator stops outputting the surge pulse.

[0011] Preferably, in the above-mentioned surge test device, the ratio of the duration of the window period module in the closed state to the half-peak time of the surge pulse is greater than or equal to 1.

[0012] Preferably, in the above-mentioned surge test device, the window period module includes: a window period switch, the first end of the window period switch is connected to the first end of the high-voltage generator, and the second end of the window period switch is connected to the first end of the device under test.

[0013] Preferably, in the above-mentioned surge test device, the high-voltage generator includes: an energy storage unit, a surge pulse forming unit, and a first switch;

[0014] The first end of the energy storage unit is connected to the first end of the first switch, the second end of the first switch is connected to the first end of the surge pulse forming unit, the second end of the surge pulse forming unit is connected to the second end of the energy storage unit, the third end of the surge pulse forming unit is connected to the first end of the window period module, and the fourth end of the surge pulse forming unit is connected to the second end of the device under test;

[0015] The energy storage unit outputs the surge pulse to the device under test through the surge pulse forming unit.

[0016] Preferably, in the above-mentioned surge test device, the energy storage unit includes: a voltage source, a charging resistor, and an energy storage capacitor;

[0017] The first end of the voltage source is connected to the first end of the charging resistor, the second end of the voltage source is connected to the energy storage capacitor and forms a first connection node, the second end of the charging resistor is connected to the energy storage capacitor and forms a second connection node, the first end of the first switch is connected to the first connection node, and the second end of the surge pulse forming unit is connected to the second connection node.

[0018] Preferably, in the above surge test device, the surge pulse forming unit includes: a first resistor, a second resistor, a third resistor, and a first inductor;

[0019] The first end of the first resistor is connected to the second end of the first switch, and a third connection node is formed. The second end of the first resistor is connected to the second end of the energy storage unit, and a fourth connection node is formed;

[0020] The first end of the second resistor is connected to the third connection node. The second end of the second resistor is connected to the first end of the first inductor. The second end of the first inductor is connected to the first end of the third resistor, and a fifth connection node is formed. The second end of the third resistor is connected to the fourth connection node;

[0021] The first end of the window period module is connected to the fifth connection node. The second end of the device under test is connected to the fourth connection node;

[0022] The surge pulse forming unit is used to adjust the parameters of the output surge pulse based on the first resistor, the second resistor, the third resistor, and the first inductor.

[0023] Preferably, in the above surge test device, when the voltage waveform of the surge pulse output by the high-voltage generator is a 1.2 / 50 μs open-circuit voltage waveform, and the current waveform of the surge pulse is an 8 / 20 μs short-circuit current waveform, the duration of the window period module in the closed state ranges from not less than 50 μs.

[0024] Preferably, in the above surge test device, when the voltage waveform of the surge pulse output by the high-voltage generator is a 10 / 700 μs open-circuit voltage waveform, and the current waveform of the surge pulse is a 5 / 320 μs short-circuit current waveform, the duration of the window period module in the closed state ranges from not less than 700 μs.

[0025] Compared with the prior art, the beneficial effects achieved by the present invention are:

[0026] A surge test device provided by the present invention, the surge test device includes: a high-voltage generator and a window period module; a first end of the high-voltage generator is connected to a first end of the window period module, a second end of the window period module is connected to a first end of a device under test, and a second end of the device under test is connected to a second end of the high-voltage generator; the window period module is configured to be in a closed state when the high-voltage generator outputs a surge pulse, and in an open state when the high-voltage generator stops outputting the surge pulse, which is equivalent to disconnecting the circuit connecting the high-voltage generator and the device under test at the end of the waveform of a complete surge pulse, so as to form a trigger window period, and the trigger window period should include a complete surge pulse waveform, thereby avoiding the current in the device under test flowing back to the high-voltage generator connected to the device under test after the high-voltage generator releases the waveform of a complete surge pulse, causing faults in the high-voltage generator connected to the device under test, resulting in waveform distortion and large errors in impact waveform parameters, etc., so as to ensure the accuracy of the test results and improve the reliability and safety of the device; at the same time, it can also avoid the phenomenon of continuous current in the gas discharge tube in the device under test, and further avoid damage to components such as switches, relays, fuses, etc. in the circuit of the device under test caused by the continuous current phenomenon, resulting in overheating and ignition of the device under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained according to the provided drawings.

[0028] Figure 1 It is a circuit schematic diagram of a surge test device provided by an embodiment of the present invention;

[0029] Figure 2 It is a circuit schematic diagram of another surge test device provided by an embodiment of the present invention;

[0030] Figure 3 It is a circuit schematic diagram of yet another surge test device provided by an embodiment of the present invention;

[0031] Figure 4 It is a circuit schematic diagram of yet another surge test device provided by an embodiment of the present invention;

[0032] Figure 5 It is a circuit schematic diagram of yet another surge test device provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0033] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0034] Based on the content recorded in the background art, the inventor found that during the invention and creation process of the present invention, a surge protector is usually added to the test equipment to protect the circuit. When the high-voltage generator generates a surge, the surge protector can limit the instantaneous overvoltage that intrudes into the power line and signal transmission line within the voltage range that the test equipment can withstand, or discharge the powerful lightning current into the ground to protect the test equipment from being damaged by the impact. The basic components used in the surge protector include gas discharge tubes, varistors, etc. However, after the gas discharge tube is turned on, if the working voltage of the test equipment is higher than the on-state voltage of the gas discharge tube, the gas discharge tube will always be in the on state, and a large current of amperage level will pass through the circuit for a long time, which is likely to cause the gas discharge tube in the surge protector to still maintain the existence of the arc channel of the gas discharge tube after discharging the overcurrent, resulting in a follow-current phenomenon.

[0035] The existence of the follow-current phenomenon is very harmful to the gas discharge tube itself and the protected test equipment. The continuous follow-current phenomenon will cause the gas discharge tube to generate a large amount of heat in a short time, resulting in damage to the components in the circuit of the test equipment such as switches, relays, fuses, etc. In severe cases, it will also cause the test equipment to heat up and catch fire, resulting in sample damage and inability to work normally; the follow-current phenomenon may also cause the current in the test equipment to flow back to the high-voltage generator connected to the test equipment, causing the high-voltage generator to malfunction, resulting in problems such as waveform distortion and increased error of the impact waveform parameters, ultimately resulting in a decline in the performance of the high-voltage generator, and in severe cases, it will cause damage to the high-voltage generator; therefore, how to avoid the current in the test equipment flowing back to the high-voltage generator connected to the test equipment and causing the high-voltage generator to malfunction is a technical problem that needs to be solved urgently by those skilled in the art.

[0036] Based on this, the present application provides a surge test device, which solves the technical problem that the current in the test equipment flows back to the high-voltage generator connected to the test equipment and causes the high-voltage generator to malfunction.

[0037] To make the above objects, features, and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0038] The embodiments of the present invention provide a surge test device, refer to Figure 1 , Figure 1Schematic diagram of a surge test device provided by an embodiment of the present invention, in combination with Figure 1 , the surge test device includes: a high-voltage generator 1 and a window period module 2; the first end of the high-voltage generator 1 is connected to the first end of the window period module 2, the second end of the window period module 2 is connected to the first end of the device under test 3, and the second end of the device under test 3 is connected to the second end of the high-voltage generator 1; the window period module 2 is configured to be in a closed state when the high-voltage generator 1 outputs a surge pulse, and in an open state when the high-voltage generator 1 stops outputting the surge pulse.

[0039] Specifically, in the embodiment of the present invention, the high-voltage generator 1 is a highly reliable simulated lightning surge generator specifically designed and produced for lightning protection product manufacturers. It is applicable to the lightning surge immunity test in electromagnetic compatibility tests. The high-voltage generator 1 can test the impulse current absorption capacity of relevant electronic components, overvoltage protectors, electrical circuits, etc., as well as the anti-interference ability to impulse current, so as to provide an accurate and ideal basis for evaluating the immunity of each port of the device under test 3 when subjected to instantaneous overvoltage disturbances, and has the advantages of stable performance, intelligence, simple operation, etc.; the device under test 3 includes but is not limited to a lightning protection module, etc. When performing a surge test on the device under test 3, generally, the device under test 3 is connected to the power supply port for power-on testing. When the discharge channel of the high-voltage generator 1 is opened, the current of the device under test 3 will also flow back into the high-voltage generator 1, resulting in burning out the high-voltage generator 1; and the window period module 2 in the surge test device provided by the embodiment of the present invention will timely disconnect the circuit connecting the high-voltage generator 1 and the device under test 3 after the high-voltage generator 1 releases a surge pulse, avoiding the current in the device under test 3 from flowing back into the high-voltage generator 1 and playing a role in protecting the high-voltage generator 1; in addition, as Figure 2 shown, Figure 2 Schematic diagram of another surge test device provided by an embodiment of the present invention, Figure 2 in which the window period module 2 includes but is not limited to a window period switch, the first end of the window period switch is connected to the first end of the high-voltage generator 1, and the second end of the window period switch is connected to the first end of the device under test 3.

[0040] As can be seen from the above description, a surge test device provided by an embodiment of the present invention includes a high-voltage generator 1 and a window period module 2. The first end of the high-voltage generator 1 is connected to the first end of the window period module 2. The second end of the window period module 2 is connected to the first end of the device under test 3. The second end of the device under test 3 is connected to the second end of the high-voltage generator 1. The window period module 2 is configured to be in a closed state when the high-voltage generator 1 outputs a surge pulse and in an open state when the high-voltage generator 1 stops outputting the surge pulse. It is equivalent to disconnecting the circuit connecting the high-voltage generator 1 and the device under test 3 at the end of the waveform of a complete surge pulse to form a trigger window period, and the trigger window period should include a complete surge pulse waveform, so as to avoid the current in the device under test 3 flowing back into the high-voltage generator 1 connected to the device under test 3 after the high-voltage generator 1 releases a complete surge pulse waveform, causing the high-voltage generator 1 connected to the device under test 3 to malfunction, resulting in waveform distortion and an increase in the error of the impact waveform parameters, thereby ensuring the accuracy of the test results and improving the reliability and safety of the device. At the same time, it can also avoid the phenomenon of continuous current in the gas discharge tube of the device under test 3, and further avoid the components in the circuit of the device under test 3 such as switches, relays, and fuses being damaged due to the continuous current phenomenon, causing the device under test 3 to heat up and catch fire, and being able to reduce the occurrence of abnormal tripping of the device under test 3 due to the continuous current phenomenon.

[0041] Optionally, in another embodiment of the present invention, the technical feature that the window period module 2 in the above-mentioned surge test device is in a closed state when the high-voltage generator 1 outputs a surge pulse and in an open state when the high-voltage generator 1 stops outputting the surge pulse is further described as follows:

[0042] The ratio of the duration of the window period module 2 in the closed state to the half-peak time of the surge pulse is greater than or equal to 1.

[0043] Specifically, in the embodiment of the present invention, the half-peak time of the surge pulse refers to the time interval from the starting point of the occurrence of the surge pulse to when the voltage or current of the surge pulse drops to 50% of its peak value. The duration of the window period module 2 in the closed state is more than 1 times this time interval. It should be noted that the shorter the duration of the window period module 2 in the closed state, the better, but it is necessary to ensure that when the window period module 2 is in the closed state, the high-voltage generator 1 can output a complete surge pulse waveform. The duration of the window period module 2 in the closed state should not be too long, otherwise it will cause the voltage in the device under test 3 to be continuously applied to the internal resistance of the high-voltage generator 1, resulting in the high-voltage generator 1 being burned out.

[0044] When the voltage waveform of the surge pulse output by the high-voltage generator 1 is a 1.2 / 50 μs open-circuit voltage waveform and the current waveform of the surge pulse is an 8 / 20 μs short-circuit current waveform, the duration range of the window period module 2 in the closed state is not less than 50 μs.

[0045] Specifically, in the embodiment of the present invention, the 1.2 / 50 μs open-circuit voltage waveform means that the time for the voltage of the surge pulse to rise from the occurrence starting point to its peak value is 1.2 μs, and the time for the voltage of the surge pulse to drop from the occurrence starting point to 50% of its peak value is 50 μs; the 8 / 20 μs short-circuit current waveform means that the time for the current of the surge pulse to rise from the occurrence starting point to its peak value is 8 μs, and the time for the current of the surge pulse to drop from the occurrence starting point to 50% of its peak value is 20 μs; to ensure that the duration of the window period module 2 in the closed state can enable the high-voltage generator 1 to output a complete surge pulse waveform, the duration range of the window period module 2 in the closed state should not be less than 50 μs, that is to say, when the surge test device conducts a high-voltage impact test of 1.2 / 50 μs - 8 / 20 μs, the window period of the window period module 2 should not be less than 50 μs.

[0046] When the voltage waveform of the surge pulse output by the high-voltage generator 1 is a 10 / 700 μs open-circuit voltage waveform and the current waveform of the surge pulse is a 5 / 320 μs short-circuit current waveform, the duration range of the window period module 2 in the closed state is not less than 700 μs.

[0047] Specifically, in the embodiment of the present invention, the 10 / 700 μs open-circuit voltage waveform means that the time for the voltage of the surge pulse to rise from the occurrence starting point to its peak value is 10 μs, and the time for the current of the surge pulse to drop from the occurrence starting point to 50% of its peak value is 700 μs; the 5 / 320 μs short-circuit current waveform means that the time for the current of the surge pulse to rise from the occurrence starting point to its peak value is 5 μs, and the time for the current of the surge pulse to drop from the occurrence starting point to 50% of its peak value is 320 μs; to ensure that the duration of the window period module 2 in the closed state can enable the high-voltage generator 1 to output a complete surge pulse waveform, the duration range of the window period module 2 in the closed state is not less than 700 μs, that is to say, when the surge test device conducts a high-voltage impact test of 10 / 700 μs - 5 / 320 μs, the window period of the window period module 2 should not be less than 700 μs.

[0048] It should be noted that the voltage waveform and current waveform of the surge pulse output by the high-voltage generator 1 include, but are not limited to, the voltage waveform and current waveform of the surge pulse illustrated in the above two examples. The durations of different types of surge pulses are different, and the duration for which the window period module 2 is in the closed state can be determined according to the duration of different types of surge pulses output by the high-voltage generator 1. That is to say, the window period module 2 can automatically control the cut-off time according to the types of surge pulses output by the high-voltage generator 1.

[0049] Optionally, in another embodiment of the present invention, the high-voltage generator 1 in the above-mentioned surge test device is further described. Refer to Figure 3 , Figure 3 which is a circuit schematic diagram of another surge test device provided by an embodiment of the present invention. In combination with Figure 3 , the specific description of the high-voltage generator 1 is as follows:

[0050] The high-voltage generator 1 includes: an energy storage unit 4, a surge pulse forming unit 5, and a first switch 6; the first end of the energy storage unit 4 is connected to the first end of the first switch 6, the second end of the first switch 6 is connected to the first end of the surge pulse forming unit 5, the second end of the surge pulse forming unit 5 is connected to the second end of the energy storage unit 4, the third end of the surge pulse forming unit 5 is connected to the first end of the window period module 2, and the fourth end of the surge pulse forming unit 5 is connected to the second end of the device under test 3; the energy storage unit 4 outputs the surge pulse to the device under test 3 through the surge pulse forming unit 5.

[0051] Specifically, in the embodiment of the present invention, the connection of the third end of the surge pulse forming unit 5 to the first end of the window period module 2 is equivalent to the first end of the high-voltage generator 1; the connection of the fourth end of the surge pulse forming unit 5 to the second end of the device under test 3 is equivalent to the second end of the high-voltage generator 1.

[0052] As Figure 4 shown, Figure 4 which is a circuit schematic diagram of another surge test device provided by an embodiment of the present invention. In Figure 4 , the energy storage unit 4 includes: a voltage source U, a charging resistor R1, and an energy storage capacitor C; the first end of the voltage source U is connected to the first end of the charging resistor R1, the second end of the voltage source U is connected to the energy storage capacitor C and forms a first connection node, the second end of the charging resistor R1 is connected to the energy storage capacitor C and forms a second connection node, the first end of the first switch 6 is connected to the first connection node, and the second end of the surge pulse forming unit 5 is connected to the second connection node.

[0053] Specifically, in the embodiment of the present invention, when the high-voltage generator 1 is in the working state, the voltage source U charges the energy storage capacitor C through the charging resistor R1. When the voltage across the energy storage capacitor C reaches the expected voltage value, the charging of the energy storage capacitor C is stopped. The function of the charging resistor R1 is to limit the current output by the voltage source U to the energy storage capacitor C. When the first switch 6 is closed, the energy storage capacitor C outputs the surge pulse to the DUT 3 through the surge pulse forming unit 5.

[0054] As Figure 5 shown, Figure 5 FIG. is a circuit schematic diagram of another surge test device provided by the embodiment of the present invention. In Figure 5 it, the surge pulse forming unit 5 includes: a first resistor Rs1, a second resistor Rm, a third resistor Rs2, and a first inductor Lm.

[0055] The first end of the first resistor Rs1 is connected to the second end of the first switch 6, and a third connection node is formed. The second end of the first resistor Rs1 is connected to the second end of the energy storage unit 4, and a fourth connection node is formed. The first end of the second resistor Rm is connected to the third connection node. The second end of the second resistor Rm is connected to the first end of the first inductor Lm. The second end of the first inductor Lm is connected to the first end of the third resistor Rs2, and a fifth connection node is formed. The second end of the third resistor Rs2 is connected to the fourth connection node. The first end of the window period module 2 is connected to the fifth connection node. The second end of the window period module 2 is connected to the first end of the DUT 3. The second end of the DUT 3 is connected to the fourth connection node. The surge pulse forming unit 5 is used to adjust the parameters of the output surge pulse based on the first resistor Rs1, the second resistor Rm, the third resistor Rs2, and the first inductor Lm.

[0056] Specifically, in the embodiment of the present invention, the first resistor Rs1 is a pulse duration forming resistor. By setting the first resistor Rs1 with different parameters, the waveform of the surge pulse formed by the high-voltage generator 1 during the pulse duration can be adjusted. The second resistor Rm is an impedance matching resistor. By setting the second resistor Rm with different parameters, the standard required impedance of the surge pulse output by the high-voltage generator 1 can be achieved. The third resistor Rs2 is a pulse duration forming resistor. By setting the third resistor Rs2 with different parameters, the waveform of the surge pulse formed by the high-voltage generator 1 during the pulse duration can be adjusted. The first inductor Lm is a rise time forming inductor. By setting the first inductor Lm with different parameters, the waveform of the surge pulse formed by the high-voltage generator 1 during the pulse rise time can be adjusted.

[0057] It should be noted that the connection manner among the first resistor Rs1, the second resistor Rm, the third resistor Rs2, and the first inductor Lm includes but is not limited to the connection manner exemplified in the embodiments of the present invention; by setting the first resistor Rs1, the second resistor Rm, the third resistor Rs2, and the first inductor Lm with different parameters, and setting different connection manners among the first resistor Rs1, the second resistor Rm, the third resistor Rs2, and the first inductor Lm, parameters such as the rising edge, duration, voltage value, etc. of the waveform of the surge pulse output by the high-voltage generator 1 can be adjusted, so as to realize the output of different types of surge pulse waveforms by the high-voltage generator 1.

[0058] The above has introduced in detail a surge test device provided by the present invention. Specific examples are used in this article to elaborate on the principle and implementation manner of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those of ordinary skill in the art, according to the idea of the present invention, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present invention.

[0059] It should be noted that the embodiments in this specification are all described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The same or similar parts among the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the method part.

[0060] It also should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device that includes a series of elements includes not only those elements inherent to the process, method, article or device, but also other elements inherent to these process, method, article or device. Without further limitation, an element defined by the statement "including one..." does not exclude the existence of another identical element in the process, method, article or device that includes the element.

[0061] The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A surge test device, characterized in that: The surge testing device comprises: High voltage generator and window period module; The first end of the high-voltage generator is connected to the first end of the window period module, the second end of the window period module is connected to the first end of the test device, and the second end of the test device is connected to the second end of the high-voltage generator; The window period module is configured to be in a closed state when the high voltage generator outputs a surge pulse, and to be in an open state when the high voltage generator stops outputting the surge pulse.

2. The surge test device according to claim 1, characterized in that: A ratio of a duration of the window period module being in the closed state to a half-peak time of the surge pulse is greater than or equal to 1.

3. The surge test device according to claim 1, characterized in that: The window period module includes: a window period switch, a first end of the window period switch is connected to the first end of the high voltage generator, and a second end of the window period switch is connected to the first end of the device under test.

4. The surge test device according to claim 1, characterized in that: The high voltage generator includes: an energy storage unit, a surge pulse forming unit and a first switch; The first end of the energy storage unit is connected to the first end of the first switch, the second end of the first switch is connected to the first end of the surge pulse forming unit, the second end of the surge pulse forming unit is connected to the second end of the energy storage unit, the third end of the surge pulse forming unit is connected to the first end of the window period module, and the fourth end of the surge pulse forming unit is connected to the second end of the device under test; The energy storage unit outputs the surge pulse to the device under test through the surge pulse forming unit.

5. The surge test device according to claim 4, characterized in that: The energy storage unit includes: a voltage source, a charging resistor and an energy storage capacitor; The first end of the voltage source is connected to the first end of the charging resistor, the second end of the voltage source is connected to the energy storage capacitor to form a first connection node, the second end of the charging resistor is connected to the energy storage capacitor to form a second connection node, the first end of the first switch is connected to the first connection node, and the second end of the surge pulse forming unit is connected to the second connection node.

6. The surge test device according to claim 4, characterized in that: The surge pulse forming unit includes: a first resistor, a second resistor, a third resistor and a first inductor; The first end of the first resistor is connected to the second end of the first switch to form a third connection node, and the second end of the first resistor is connected to the second end of the energy storage unit to form a fourth connection node; The first end of the second resistor is connected to the third connection node, the second end of the second resistor is connected to the first end of the first inductor, the second end of the first inductor is connected to the first end of the third resistor, and form a fifth connection node, and the second end of the third resistor is connected to the fourth connection node; The first end of the window period module is connected to the fifth connection node, and the second end of the device under test is connected to the fourth connection node; The surge pulse forming unit is configured to adjust parameters of the output surge pulse based on the first resistor, the second resistor, the third resistor, and the first inductor.

7. The surge test device according to claim 1, characterized in that: When the voltage waveform of the surge pulse output by the high-voltage generator is a 1.2 / 50μs open-circuit voltage waveform, and the current waveform of the surge pulse is an 8 / 20μs short-circuit current waveform, the duration of the window period module in the closed state has a value range of not less than 50μs.

8. The surge test device according to claim 1, characterized in that: When the voltage waveform of the surge pulse output by the high-voltage generator is a 10 / 700μs open-circuit voltage waveform, and the current waveform of the surge pulse is a 5 / 320μs short-circuit current waveform, the duration of the window period module in the closed state has a value range of not less than 700μs.

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