Test equipment

Abstract

The invention discloses a test device comprising a box body, the box body comprises a test box and a storage box located below the test box, and the storage box stores parts used for testing; wherein the test box comprises a test area and a carrying table, the test area comprises a plurality of sub-test areas which are mutually independent and can shield signals mutually, test assemblies and signal sources are arranged in the sub-test areas, the signal sources are used for transmitting signals, and the test assemblies in the sub-test areas are different; the carrying platform is arranged on one side of the testing area and used for placing equipment to be tested, and when the equipment to be tested is located at the position opposite to any sub-testing area, the equipment to be tested can test any sub-testing area when the signal source of any sub-testing area transmits signals. According to the test equipment, multiple test scenes can be realized, the test efficiency is improved, and a more stable test environment is provided due to the fact that the sub test areas are mutually independent and shielded.

Description

Technical Field

[0001] The present invention relates to the technical field of mobile terminal testing, and in particular to a testing device. Background Art

[0002] With advancements in mobile communication network technology, demands for mobile terminal signal quality are becoming increasingly stringent. Consequently, complex scenarios are now being incorporated into network signal testing requirements. However, testing these complex scenarios in real-world environments is not only costly and inefficient, but also creates unstable test environments and hinders debugging due to communication difficulties between R&D and testers.

[0003] Although existing test equipment can perform some tests that simulate some simple scenarios, it can only implement one or two at most, and the test environment is relatively unstable, resulting in inaccurate test data. Summary of the Invention

[0004] An embodiment of the present application discloses a testing device that not only enables the device under test to perform tests in different scenarios through different sub-test areas, thereby improving test efficiency and reducing test costs, but also provides a relatively stable testing environment due to the presence of multiple independent and shieldable sub-test areas, thereby obtaining more accurate test data and facilitating debugging of the device under test.

[0005] A first aspect of an embodiment of the present application discloses a testing device, comprising: a box body, the box body comprising a test box and a storage box located below the test box, the storage box storing components for testing; wherein the test box comprises a test area and a carrier,

[0006] The test area includes a plurality of sub-test areas that are independent of each other and can shield signals from each other. The sub-test areas are provided with test components and signal sources, the signal sources are used to transmit signals, and the test components in each sub-test area are different;

[0007] The carrier is arranged at one side of the test area and is used to place the device under test. When the device under test is located at a position opposite to any sub-test area, the device under test can be tested on any sub-test area when the signal source of any sub-test area transmits a signal.

[0008] As an optional implementation, in the first aspect of this embodiment, the carrier is movably arranged on one side of the test area, and during the movement of the carrier relative to the test area, the device under test can switch from testing for one sub-test area to testing for another sub-test area.

[0009] As an optional implementation, in the first aspect of this embodiment, at least some of the test components of at least some of the multiple sub-test areas are configured to be able to move vertically between the test areas and the storage box, and when the carrier moves at a target speed relative to the test area, at least some of the test components of at least some of the sub-test areas are moved to the storage box, and the device to be tested can switch between the sub-test areas to achieve switching between different cells, and the target speed is greater than the speed threshold.

[0010] As an optional implementation, in the first aspect of this embodiment, the box further includes a lifting assembly,

[0011] The lifting assembly is connected to at least some of the test assemblies in at least some of the sub-testing areas, and is used to vertically move at least some of the test assemblies in at least some of the sub-testing areas between the test area and the storage box.

[0012] As an optional implementation, in the first aspect of this embodiment, the multiple sub-test areas include a first sub-test area, the test assembly in the first sub-test area includes a plurality of reflectors, and the reflectors are used to reflect signals emitted by a signal source in the first sub-test area; and / or,

[0013] The multiple sub-test areas include a second sub-test area, the test component in the second sub-test area includes a plurality of receiving antennas, and the plurality of receiving antennas are used to receive signals sent by a signal source in the second sub-test area; and / or,

[0014] The multiple sub-test areas include a third sub-test area, the test component in the third sub-test area includes a metal piece, and the metal piece and the third sub-test area form a closed space; and / or,

[0015] The plurality of sub-test areas include a fourth sub-test area, and the test component in the fourth sub-test area includes a heat exchange device.

[0016] As an optional implementation, in the first aspect of this embodiment, the carrier includes multiple installation areas, each of which is used to install the device to be tested. The multiple installation areas correspond to the multiple sub-test areas, and the device to be tested placed on each installation area can be located at a position corresponding to each sub-test area.

[0017] As an optional implementation manner, in the first aspect of this embodiment, a shielding member for shielding signals is provided between any two adjacent installation areas of the plurality of installation areas.

[0018] As an optional implementation manner, in the first aspect of this embodiment, a controller is further included, and the controller is stored in the storage box;

[0019] The controller is configured to control the test device to perform a test of a target test scenario under a target test scenario, where the target test scenario includes a motion scene of the device under test or at least one non-motion scene of a plurality of non-motion scenes;

[0020] In the motion scene, the carrier moves relative to the test area at the target speed, and at least part of the test components of at least part of the sub-test area are moved to the storage box.

[0021] The multiple non-motion scenes correspond to the multiple sub-test areas. In the non-motion scenes, the test components of the sub-test areas corresponding to the non-motion scenes are located within the sub-test areas.

[0022] As an optional implementation manner, in the first aspect of this embodiment, it further includes a display device arranged on the outer wall of the box;

[0023] The controller is further configured to control the display device to display an interface including multiple test scenarios;

[0024] The controller is specifically used to control the test device to perform testing of the target test scenario under the target test scenario in response to an operation of selecting the target test scenario from the multiple test scenarios, wherein the multiple test scenarios include a motion scene and multiple non-motion scenes of the device under test.

[0025] As an optional implementation, in the first aspect of this embodiment, the target test scene includes the motion scene, and the controller is specifically configured to: in response to an operation of selecting the motion test scene from the multiple test scenes and an operation of setting the motion speed of the motion scene, control the test device to perform the test of the motion scene under the motion scene; and / or,

[0026] The target test scenario includes a temperature test scenario, and the controller is specifically used to: in response to the operation of selecting the temperature test scenario from the multiple test scenarios and setting the temperature of the temperature test scenario, control the test device to perform the test of the temperature test scenario under the temperature test scenario.

[0027] Compared with the related art, the embodiments of the present application have at least the following beneficial effects:

[0028] A test device disclosed in an embodiment of the present application includes: a box body, the box body includes a test box and a storage box located below the test box, the storage box stores components for testing; wherein, the test box includes a test area and a carrier, the test area includes a plurality of sub-test areas that are independent of each other and can shield signals from each other, test components and signal sources are provided in the sub-test areas, the signal source is used to transmit signals, and the test components in each sub-test area are different; the carrier is provided on one side of the test area, for placing a device to be tested, and when the device to be tested is located at a position opposite to any sub-test area, the device to be tested can be tested on any sub-test area when the signal source in any sub-test area transmits a signal. In this way, the test components of each sub-test area of the above-mentioned test equipment are different, which can simulate test scenarios of different real environments. Testing based on each sub-test area can save the cost of field testing and improve test efficiency; more importantly, since each sub-test area is independent of each other and can shield each other, there is less interference between any two sub-test areas. When the device to be tested placed on the carrier is located at a position relative to each sub-test area, different scenarios can be tested in a relatively stable test environment, and more accurate test data can be obtained, which is convenient for debugging the device to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0030] Figure 1 A three-dimensional diagram of a test device disclosed in an embodiment of the present application;

[0031] Figure 2 A side view of a testing device disclosed in an embodiment of the present application;

[0032] Figure 3 A top view of a test box of a test device disclosed in an embodiment of the present application;

[0033] Figure 4 A top view of a test box of another test device disclosed in an embodiment of the present application;

[0034] Figure 5 A schematic diagram of a display interface for selecting multiple scenarios disclosed in an embodiment of the present application;

[0035] Figure 6 A schematic diagram of a speed setting display interface disclosed in an embodiment of the present application;

[0036] Figure 7This is a schematic diagram of a temperature setting display interface disclosed in an embodiment of the present application. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0038] It should be pointed out that the terms "first\second\third" involved in the embodiments of the present application are used to distinguish similar or different objects, and do not represent a specific ordering of the objects. It can be understood that "first\second\third" can be interchanged with a specific order or sequence where permitted, so that the embodiments of the present application described here can be implemented in an order other than that illustrated or described here.

[0039] It should be noted that the terms "including," "having," and any variations thereof in the embodiments and drawings of this application are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to the process, method, product, or apparatus.

[0040] With the continuous advancement of mobile communication technology, especially with the advancement of 5G and future 6G technologies, people's requirements for mobile terminal signal quality and network performance are becoming increasingly higher. Users' expectations for network stability, speed, latency, and coverage are also constantly increasing. This is especially true in complex environments such as urban areas with dense high-rise buildings, large underground garages, high-speed rail sites, and large gatherings, which often have a significant impact on signal quality.

[0041] While testing directly in a live environment can yield authentic test data, it also presents numerous challenges. First, testing in a live environment often requires significant investment, not only in terms of equipment costs but also in terms of manpower and material resources. Second, the external environment is highly variable, with factors such as weather, building interference, and traffic density all potentially impacting the accuracy and repeatability of test results. Furthermore, communication issues between R&D personnel and on-site testers during testing can also impact test efficiency and debugging speed. Especially in complex environments, network testing and debugging often require the coordinated efforts of multiple teams. Faced with environmental changes and unexpected issues, adjustment and optimization time can be significantly extended, reducing overall work efficiency. Therefore, to avoid testing in a live environment, it is necessary to use test equipment that can simulate real-world scenarios.

[0042] However, in the related art, the test equipment that simulates real-life scenarios is relatively simple in function. Most of them can only simulate one or two scenarios, and the test environment is relatively unstable, resulting in inaccurate test data.

[0043] In order to solve the above problems, an embodiment of the present application discloses a test device, in which each sub-test area has different test components and can simulate test scenarios of different real environments. Testing based on each sub-test area can save the cost of field testing and improve test efficiency; more importantly, since each sub-test area is independent of each other and can shield each other, there is less interference between any two sub-test areas. When the device to be tested placed on the carrier is located at a position relative to each sub-test area, different scenarios can be tested in a relatively stable test environment, and more accurate test data can be obtained, which is convenient for debugging the device to be tested.

[0044] It can be understood that the testing equipment disclosed in the embodiments of the present application can be applicable to various types of terminal devices, such as mobile phones, tablets, notebooks, routers, smart watches, fitness trackers, air quality monitors and monitoring equipment, etc., and no specific restrictions are made here.

[0045] Next, taking the terminal device to be tested as a mobile phone as an example, the test device proposed in the embodiment of the present application and the control method of the controller based on the test device will be introduced in sequence.

[0046] Please also see Figure 1 and Figure 2 , Figure 1 This is a three-dimensional diagram of a test device disclosed in an embodiment of the present application. Figure 2A side view of a testing device provided in an embodiment of the present application includes a box body 100 , wherein the box body 100 includes a test box 10 and a storage box 20 located below the test box 10 , wherein the storage box 20 stores components for testing; the test box 10 includes a test area 101 and a carrier 12 .

[0047] The test area 101 in the test box 10 includes multiple sub-test areas 30 that are independent of each other and can shield signals from each other. Test components 31 and signal sources 32 are set in the sub-test areas. The signal source 32 is used to transmit signals. The test components 31 in each sub-test area are different, which can realize the simulation of various different complex scenarios.

[0048] The carrier 12 in the test box 10 is set on one side of the test area for placing the device under test. When the device under test is located at a position opposite to any sub-test area, the device under test can be tested on any sub-test area when the signal source 32 in any sub-test area transmits a signal.

[0049] The relative position for placing the device under test on stage 12 can be the position of stage 12 corresponding to the extension line of the boundary of each sub-test area. Alternatively, it can be the position of stage 12 corresponding to the extension direction of the center line of the sub-test area. To prevent interference from other factors to the device under test and to better receive the signal from signal source 32, thereby enhancing the stability and reliability of the test results, the relative position is preferably the position of stage 12 corresponding to the extension direction of the center line of the sub-test area.

[0050] It can be understood that in order to prevent the test equipment from being interfered by electromagnetic signals in the environment during the test process, the box 100 is made of shielding material.

[0051] It is understandable that in order to prevent the test components in the storage box from affecting the test area in the test box, the platform 11 and the carrier 12 for placing the test components between the storage box and the test box are also made of shielding materials.

[0052] Optionally, the platform 11 between the storage box and the test box for placing the test components may also include another sub-test platform for placing the carrier 12. The sub-test platform can be slidably connected to the platform for placing the test components. The sub-test platform can also be made of shielding material to prevent the test components in the storage box from affecting the test area.

[0053] Optionally, there are many types of shielding materials, which can be selected according to actual conditions. For example, copper, aluminum, iron, steel, copper-nickel alloy or molybdenum alloy in metal shielding materials are not specifically limited here. For another example, conductive plastic or conductive rubber in conductive polymer materials are not specifically limited here. For another example, ferrite or Permalloy in magnetic shielding materials are not specifically limited here. For another example, metal-coated composite materials in composite shielding materials are not specifically limited here. For another example, carbon fiber, graphene, silicon carbide and ferrite ceramics in absorbing materials are not specifically limited here.

[0054] Optionally, the shielding material may also be a plasma shielding material or a metamaterial, etc., which is not specifically limited here.

[0055] In some embodiments, in order to place the device under test into the box 100 of the test device for testing, the test device further includes an upper cover 200. Figure 2 , including an upper cover 200. When the device under test needs to be placed in the test device box 100 for testing, the upper cover 200 is opened and the device under test is placed on the carrier 12 of the corresponding sub-test area. When the test device is testing the device under test, the upper cover 200 is closed to prevent the test device from being interfered with by other electromagnetic signals in the environment when performing simulated scenario testing on the device under test.

[0056] In some embodiments, the housing of the test device may be Figure 1 The cylindrical body, the carrier 12 can be annular. In the case where the box of the test device is cylindrical, the top view of the test box of the test device is circular. Figure 3 , Figure 3 This is a top view of a test box 10 disclosed in an embodiment of the present application, wherein the test area includes multiple sub-test areas that are independent of each other and can shield each other, each sub-test area is provided with a test component 31, each sub-test area is fan-shaped, and the sub-test areas are combined into a circular test area, and the carrier 12 corresponding to each sub-test area is on one side of each sub-test area, and the carriers 12 corresponding to all sub-test areas are an annular device.

[0057] In other embodiments, the box 100 of the test device may also be in the shape of a square structure, see Figure 4 , Figure 4 This is a top view of a test box 10 of a square-structured test device disclosed in an embodiment of the present application. When the box body is a square structure, the top view of the test box is rectangular, as shown in FIG. Figure 4 As shown in (1), Figure 4(1) is a top view of a test box 10 having a rectangular test area, wherein the test area includes a plurality of sub-test areas that are independent of each other and can shield signals from each other, each sub-test area is provided with a test component 31, and each sub-test area is rectangular in shape and arranged horizontally, wherein the carrier 12 corresponding to each sub-test area is on one side of each sub-test area, and the carriers 12 of each sub-test area are also arranged horizontally.

[0058] In other embodiments, the box 100 may also be a square structure and the test area of the test device may also be circular, such as Figure 4 As shown in (2), Figure 4 (2) A top view of a test box 10 having a circular test area is disclosed, wherein the test area includes a plurality of sub-test areas that are independent of each other and can shield each other, each sub-test area is provided with a test component 31, each sub-test area is fan-shaped, and the sub-test areas together form a circular test area, and each sub-test area corresponds to a sub-carrier, and the first sub-carrier 121, the second sub-carrier 122, the third sub-carrier 123 and the fourth sub-carrier 124 together constitute the carrier 12 of the test area.

[0059] In the embodiment of the present application, since the test area in the test box 10 includes multiple sub-test areas that are independent of each other and can shield signals from each other, shielding devices can be provided between the multiple sub-test areas in the test area. This not only can isolate each sub-test area separately to maintain an independent test space, but also because the shielding device can shield signals, it can also avoid mutual interference between signals in different sub-test areas during the test process.

[0060] Optionally, there are many kinds of materials for making the shielding devices arranged between each sub-test area, which can be selected according to actual conditions. For example, copper, aluminum, iron, steel, copper-nickel alloy or molybdenum alloy in metal shielding materials are not specifically limited here. For another example, conductive plastic or conductive rubber in conductive polymer materials are not specifically limited here. For another example, ferrite or Permalloy in magnetic shielding materials are not specifically limited here. For another example, metal-coated composite materials in composite shielding materials are not specifically limited here. For another example, carbon fiber, graphene, silicon carbide and ferrite ceramics in absorbing materials are not specifically limited here.

[0061] Optionally, the shielding device may also be made of plasma shielding materials or metamaterials, etc., which are not specifically limited here.

[0062] In some embodiments, if a sub-test area of the test equipment needs to be isolated from heat transfer, a composite shielding material can be used to make a shielding device between the sub-test area and its adjacent sub-test area, so that the shielding device can not only isolate electromagnetic waves, but also isolate heat, thereby preventing the heat and signals of the sub-test area from being transferred to other sub-test areas.

[0063] The test device disclosed in the embodiment of the present application has multiple independent and shieldable sub-test areas, and since the test components of each sub-test area are different, as long as the device to be tested is placed on the carrier at a position relative to the sub-test area, testing of different scenarios can be achieved, saving the cost of field testing and improving test efficiency. In addition, since the test environment is stable, more accurate test data can be obtained, which is convenient for debugging the device to be tested.

[0064] Optionally, the carrier 12 of the embodiment of the present application can be movably set on one side of the test area. During the movement of the carrier 12 relative to the test area, the carrier 12 can carry the device to be tested and move quickly to simulate a scenario in which a person carries a terminal device on a means of transportation; such as high-speed rail scenarios, train scenarios, and tourist bus scenarios and other fast-moving scenarios, which are not specifically limited here, thereby further enriching the complex scenarios that can be simulated by the test equipment.

[0065] In other embodiments, the carrier 12 of the embodiment of the present application can be movably set on one side of the test area. During the movement of the carrier 12 relative to the test area, the device under test can switch from testing for one sub-test area to testing for another sub-test area, so that the same device under test can be tested in multiple different scenarios through the movement of the carrier 12, thereby improving the efficiency of the test equipment in performing complex simulation scenario tests on the device under test.

[0066] Optionally, the movement of the carrier 12 relative to the test area may be movement of the carrier 12 .

[0067] Optionally, the movement of the carrier 12 relative to the test area may also be the movement of another structure on the carrier 12 on which the device to be tested is mounted.

[0068] Optionally, the movement of the carrier 12 relative to the test area may be that the carrier 12 moves, or that the platform 11 on which the test components are placed in the test area can move while the carrier 12 does not move.

[0069] Optionally, the carrier 12 and the test area may be slidably connected via a sliding component. If the test device needs to perform a fast-moving scenario test on the device under test, or if the test device needs to move the device under test from the current sub-test area to another sub-test area for testing the other sub-test area, the carrier 12 may slide relative to the test area via the sliding component, thereby driving the device under test on the carrier 12 to move, so as to perform a fast-moving scenario test on the device under test, or to perform another simulated scenario test on the device under test.

[0070] Optionally, the carrier 12 may not be connected to the test area and slide via a guide rail located in the storage box 20; when the test equipment needs to perform a fast-moving scenario test on the device under test, or when the test equipment needs to move the device under test from the current sub-test area to another sub-test area for testing the other sub-test area, the guide rail located in the storage box 20 controls the movement of the carrier 12 so that the carrier 12 slides relative to the test area, thereby driving the device under test on the carrier 12 to move, so as to perform a fast-moving scenario test on the device under test, or to perform another simulated scenario test on the device under test.

[0071] In order to avoid the test components 31 of some sub-test areas from affecting the network test when the device under test moves quickly, to ensure the stability of the experimental environment and enhance the reliability of the experiment, in some embodiments, at least some of the test components 31 of the multiple sub-test areas of the test device are configured to be able to move vertically between the test area and the storage box 20, and when the carrier 12 moves relative to the test area at a target speed, at least some of the test components 31 of at least some of the sub-test areas are moved to the storage box 20, and the device under test can switch between the various sub-test areas to achieve switching between different cells, and the target speed is greater than the speed threshold.

[0072] It can be understood that the carrier 12 can carry the device to be tested and move quickly, and the device to be tested can switch between each sub-test area to achieve switching between different cells, thereby simulating a scenario in which a person carries a terminal device on a means of transportation; such as high-speed rail scenarios, train scenarios, and tourist bus scenarios and other fast-moving scenarios, which are not specifically limited here, thereby further enriching the complex scenarios that the test equipment can simulate.

[0073] Optionally, in order to realize a fast-moving test scenario, at least part of the test components 31 of at least part of the sub-test area are moved to the storage box 20, and the box body 100 of the test device further includes a lifting component.

[0074] The lifting assembly is connected to at least part of the test assemblies 31 of at least part of the multiple sub-test areas, and is used to vertically move at least part of the test assemblies 31 of at least part of the sub-test areas between the test area and the storage box 20.

[0075] The lifting assembly is a mechanical device that realizes vertical movement or height adjustment. The lifting assembly in the embodiment of the present application can be set in the storage box 20 on the lower side of the box body 100. In the case of a test scenario that does not require rapid movement, if it is necessary to use some test assemblies 31 of a sub-test area to implement the scenario test of the corresponding sub-test area, the lifting assembly is required to lift the test assemblies 31 of the sub-test area to the corresponding sub-test area in the test box 10. In a test scenario that requires rapid movement, in order to prevent the test assemblies 31 of some sub-test areas from affecting the rapidly moving test scenario, the lifting assembly is required to move all the test assemblies 31 in the sub-test scenarios that can affect the moving test scenario to the storage box 20 below the test box 10.

[0076] There are many optional lifting assemblies, and the choice can be based on actual needs. For example, hydraulic cylinders and hydraulic lifting platforms in hydraulically driven lifting assemblies. Another example is pneumatic lifting columns in pneumatically driven lifting assemblies. Another example is trapezoidal screws, ball screws, and worm gear and screw assemblies in electrically driven lifting assemblies, without specific limitations here.

[0077] The multiple sub-test areas of the test equipment disclosed in the embodiments of this application can implement testing in a variety of simulated scenarios. In some embodiments, the simulated scenarios implemented by this application can include those simulating an underground garage, i.e., multipath effects. This is due to the numerous concrete walls, pillars, vehicles, and other objects in underground garages. When the signal from the mobile phone waiting for test device encounters these obstacles during propagation, it undergoes multiple reflections before reaching the mobile phone waiting for test device. The reflected signals from different paths superimpose at the mobile phone waiting for test device, creating a multipath effect. Furthermore, irregular objects in the parking lot, such as various pipes and lamps, can cause signal scattering. The scattered signals propagate in different directions and eventually reach the mobile phone waiting for test device, where they superimpose with other signals, further enhancing the multipath effect. Furthermore, in underground garages, the edges of objects such as vehicles and walls can diffract the signal, and the diffracted signal also becomes part of the multipath signal. This scenario can lead to problems such as signal fading, distortion, and delay spread, adversely affecting the transmission and reception of the mobile phone waiting for test device signal.

[0078] In order to simulate the signal reception performance and anti-interference ability of the mobile phone waiting test device in such a complex scenario of multipath effect, the multiple sub-test areas disclosed in the embodiment of the present application include a first sub-test area 111, and the test component 31 in the first sub-test area 111 includes multiple reflectors 311, which are used to reflect the signal emitted by the signal source 32 of the first sub-test area 111.

[0079] Optionally, the plurality of reflective elements 311 may be irregularly scattered on the platform within the first sub-test area 111 .

[0080] Optionally, the multiple reflective elements 311 can be made of a variety of materials, which can be selected based on actual needs and are not specifically limited here. For example, metal reflective materials include aluminum alloy, copper foil, and stainless steel. Another example is conductive coating materials such as conductive paint (silver / copper based) and silver-coated polyester film. Another example is non-metallic reflective materials such as concrete, brick, and metal-coated glass.

[0081] In some embodiments, to further enhance reflection and achieve better multipath simulation, the reflector can be geometrically designed to enhance reflection. For example, aluminum alloy sheets can be welded into right-angled triangular prisms. This allows the signal to be reflected in the original direction regardless of its incident angle, with a reflection efficiency exceeding 95%.

[0082] Optionally, in order to better simulate the real scene and ensure the accuracy and reliability of the test results, the multiple reflectors 311 of the first sub-test area 111 can be a variety of different types of reflectors made of different materials, such as including metal types and conductive layer types, etc., and no specific restrictions are made here.

[0083] Optionally, in order to better simulate real-life scenarios and ensure the accuracy and reliability of test results, the multiple reflectors 311 can also be arranged into multiple different types of geometric shapes to simulate various different shapes of buildings and vehicles in reality, such as rhombus, triangle, square, circle, etc., without specific limitation here.

[0084] For example, taking a mobile phone as an example, when the mobile phone is placed on the platform 12 corresponding to the second sub-test area 112, the signal source 32 emits a signal, and the multiple reflectors 311 reflect the signal from the signal source, forming multiple signal propagation paths to reach the mobile phone placed on the platform, thereby testing the mobile phone's ability to withstand multipath effects in an underground garage. It will be appreciated that when the test equipment is testing the mobile phone in rapid motion, in order to avoid interference from the multiple reflectors 311 in the first sub-test area 111, a lifting assembly connected to the multiple reflectors 311 can be used to lower the multiple reflectors 311 into the storage box 20 below the test box 10.

[0085] In other embodiments, the present application can implement tests that simulate large gathering scenarios, that is, evaluate the performance of mobile phone waiting test devices under conditions of high crowds and high communication demands. This is because large crowds gather at events such as concerts, sporting events, and large parties, resulting in a large number of mobile phone waiting test devices per unit area, and fierce competition for network resources. In addition, the simultaneous use of many mobile phone waiting test devices will generate various signal interferences. On the one hand, the signals of different mobile phone waiting test devices may interfere with each other during transmission; on the other hand, various electronic devices may be present on site, such as lighting equipment, audio equipment, etc., which may also interfere with the signals of mobile phone waiting test devices. This may cause a single mobile phone waiting test device to have problems with network connection and network performance due to network competition and interference from other electronic devices.

[0086] In order to evaluate the network competitiveness and anti-interference ability of the mobile phone waiting test device in large gatherings, the multiple sub-test areas disclosed in the embodiment of the present application also include a second sub-test area 112. The test component 31 in the second sub-test area 112 includes multiple receiving antennas 312, and the multiple receiving antennas 312 are used to receive signals emitted by the signal source 32 of the second sub-test area 112.

[0087] Optionally, the multiple receiving antennas 312 may include dipole antennas, monopole antennas, Yagi antennas, parabolic antennas, helical antennas, microstrip antennas, log-periodic antennas, and loop antennas, etc., which are not specifically limited here and can be selected according to actual circumstances.

[0088] For example, taking a mobile phone as an example, when the mobile phone is placed on the position of the carrier 12 corresponding to the second sub-test area 112, the signal source 32 emits a signal, and the multiple receiving antennas 312 also receive the signal from the signal source, competing with the mobile phone placed on the carrier for the signal from the signal source 32, thereby testing the mobile phone's network competitiveness in a simulated large gathering. It will be appreciated that when the test equipment is testing the mobile phone in rapid motion, in order to avoid interference from the multiple receiving antennas in the second sub-test area 112, a lifting assembly connected to the multiple receiving antennas 312 can be used to lower the multiple receiving antennas 312 into the storage box 20 below the test box 10.

[0089] In other embodiments, the test equipment of the present application can also perform tests that simulate elevator scenarios, i.e., tests in confined spaces. In elevator scenarios, the elevator shaft and car are constructed of stainless steel or aluminum alloy, creating a shielding effect similar to a "Faraday cage," resulting in signal attenuation. This can cause the mobile phone waiting for test equipment to experience reduced receiving sensitivity in this highly attenuated environment, and may even result in problems such as a lack of signal reception, resulting in call interruptions and web page loading failures.

[0090] In order to evaluate the receiving sensitivity of the mobile phone waiting test device in a closed environment with strong attenuation, multiple sub-test areas include a third sub-test area 113. The test component 31 in the third sub-test area 113 includes a metal part 313, and the metal part 313 and the third sub-test area 113 form a closed space.

[0091] It can be understood that the metal member 313 can isolate the signal source 32 of the third sub-test area 113 from the device under test placed corresponding to the third sub-test area 113 .

[0092] Optionally, the metal member 313 may be a sheet metal material standing vertically in the third sub-test area 113 , and may form a closed space with the shielding material surrounding the third test area.

[0093] Optionally, the material of the metal part 313 may include stainless steel, aluminum alloy, copper, iron, low carbon steel, titanium alloy, etc., which can be selected according to actual needs and is not specifically limited here.

[0094] For example, taking a mobile phone as an example, when the mobile phone is placed on the platform 12 corresponding to the third sub-test area 113, the signal source 32 emits a signal, and the metal member 313 isolates the signal source 32 from the mobile phone on the platform, allowing the mobile phone to be tested in a confined space. It will be appreciated that when the test equipment is testing the mobile phone in rapid motion, in order to avoid interference from the metal member 313 in the third sub-test area 113, a lifting assembly connected to the metal member 313 can be used to lower the metal member 313 into the storage box 20 below the test box 10.

[0095] In other embodiments, the test equipment of the present application can also simulate outdoor high and low temperature scenes to test the performance of the mobile phone test equipment in extreme temperature environments. Such as testing of mobile phone test equipment in extremely cold areas, high temperature scenes in cars in summer, or high and low temperature alternating scenes of aircraft takeoff and landing. In low temperature environments, the battery life of the mobile phone test equipment may be greatly shortened due to the reduction of ion mobility of lithium batteries at low temperatures, the screen touch may fail due to the deterioration of fluidity of liquid crystal materials at low temperatures, and the camera may focus slowly due to the increase in viscosity of motor grease. Under high temperature conditions, the casing, screen, battery, chip and other components of the mobile phone test equipment may be deformed, cracked, and solder joints may fall off under extreme temperatures. In high and low temperature alternating scenes, the sealing performance of the fuselage and the stress cracking resistance of the PCB board may also deteriorate.

[0096] In order to test the performance of various components of the mobile phone test equipment under these extreme environments, to help development and design personnel better evaluate and prepare for subsequent optimization of the performance of the mobile phone test equipment, the multiple sub-test areas also include a fourth sub-test area 114, and the test component 31 in the fourth sub-test area 114 includes a heat exchange device 314.

[0097] Optionally, the heat exchange device 314 can achieve a heating effect to simulate an extreme high-temperature environment to test the performance of the mobile phone test device.

[0098] Optionally, the heat exchange device 314 can also achieve a cooling effect to simulate the performance test of the mobile phone under test in an extreme low-temperature environment.

[0099] Optionally, the heat exchange device 314 can also achieve cooling and heating effects at the same time. It can not only simulate extreme high-temperature environments and extreme low-temperature environments, but also simulate high-temperature and low-temperature alternating environments to test the mobile phone waiting test equipment, thereby realizing more different extreme temperature environment tests, thereby obtaining more types of performance of the mobile phone waiting test equipment, and thus making better evaluation of the mobile phone waiting test equipment to prepare for the subsequent optimization of the performance of the mobile phone waiting test equipment.

[0100] For example, taking a mobile phone as an example, when the mobile phone is placed at the position of the carrier 12 corresponding to the fourth sub-test area 114, the signal source 32 sends a signal, and the heat exchange device 314 cools or heats to change the temperature of the fourth sub-test area, so that the performance of the mobile phone can be tested at different temperatures.

[0101] Optionally, in order to prevent the temperature of the fourth sub-test area 114 from affecting its adjacent sub-test areas, the shielding device between the fourth sub-test area 114 and the first sub-test area 111 and the third sub-test area 113 can be made of a composite shielding material, so that the shielding device can not only isolate electromagnetic waves, but also isolate heat, thereby preventing the heat and signals of the fourth sub-test area 114 from being transmitted to other sub-test areas.

[0102] In some embodiments, in order to prevent the instability of the placement of the mobile phone waiting for test equipment during the test process, the test equipment disclosed in the present application is provided with an installation area 13 at the position where the device to be tested is placed on the carrier 12 corresponding to the sub-test area, so as to fix the position of the mobile phone waiting for test equipment and prevent the mobile phone waiting for test equipment from sliding left and right during the test process, thereby affecting the test effect.

[0103] Optionally, the installation area 13 may be provided with a suction cup type fixture and a strong clamp, etc., which is not specifically limited here.

[0104] Optionally, in order to ensure the test effect, the mobile phone waiting test device can better receive the signal from the signal source 32. The installation area 13 is set in the middle of the position of the carrier 12 in the sub-test area, and is equidistant from the installation areas of two adjacent sub-test areas.

[0105] Optionally, in order to ensure that the mobile phone waiting for testing device is not interfered by other devices receiving signals during the test process, a sub-test area is provided with only one installation area 13. Each sub-test area can only perform a corresponding simulation scenario test on one device at a time.

[0106] In some embodiments, in order to avoid mutual interference among multiple sub-test areas during the test process and further improve the stability of the test environment, when conducting tests on simulation scenarios corresponding to corresponding sub-test areas, a shielding member for shielding signals is provided between any two adjacent installation areas 13 of the multiple installation areas 13 on the carrier 12.

[0107] Optionally, the shielding member may be disposed between two adjacent sub-test areas. The shielding member may be connected to the lifting device and disposed on the carrier 12 without being physically connected to the test area.

[0108] For example, when the test equipment performs simulated scenario tests corresponding to multiple sub-test areas, the shielding component is lifted by the lifting assembly to the carrier 12 in the test box 10, completely isolating the sub-test areas. When a mobile phone in a sub-test area is waiting for the test equipment to perform a simulated scenario test in the corresponding sub-test area, signal interference from other sub-test areas is completely shielded, thereby ensuring the stability of the test environment and obtaining more accurate test results.

[0109] When the test equipment is conducting a simulated scenario test on a mobile phone waiting for test, the shielding member can be lowered into the storage box 20. At this time, the signal sources 32 in each sub-test area are turned on. At the same time, all test components 31 in the sub-test area that may affect the test performance are lowered into the storage box 20 by the lifting device. As a result, when the mobile phone waiting for test is rapidly rotated on the carrier 12, the signal sources 32 in different sub-test areas pass through to simulate the switching ability of the mobile phone waiting for test to different base station or cell signals. This allows for better debugging and optimization of the mobile phone waiting for test, ensuring the communication stability of the mobile phone waiting for test under high-speed movement.

[0110] Optionally, the shielding member can be set in a shielding device that isolates each sub-test area. Specifically, a receiving hole can be set in the shielding device between each two adjacent sub-test areas. A retractable shielding member connected to the shielding device by a retractable member is set in the receiving hole. The shielding member can be extended onto the carrier 12 to isolate the installation area 13 of each sub-test area.

[0111] Illustratively, when the test device performs simulated scenario tests corresponding to multiple sub-test areas, the shielding component extends onto the carrier 12 to completely isolate the sub-test areas, so that when a mobile phone in a sub-test area is waiting for the test device to perform a simulated scenario test in the corresponding sub-test area, signal interference from other sub-test areas is completely shielded, thereby ensuring the stability of the test environment and obtaining more accurate test results.

[0112] When the test equipment is conducting a simulated scenario test on a mobile phone waiting for test, in which the test equipment is moving rapidly, the shielding member can be retracted into the shielding device in the sub-test area. At this time, the signal source 32 in each sub-test area is turned on. At the same time, the test components 31 in all sub-test areas that may affect the test performance are lowered by the lifting device into the storage box 20. As a result, when the mobile phone waiting for test is rapidly rotating on the carrier 12, the signal sources 32 in different sub-test areas pass through to simulate the switching ability of the mobile phone waiting for test to different base station or cell signals. This allows for better debugging and optimization of the mobile phone waiting for test, ensuring the communication stability of the mobile phone waiting for test under high-speed movement.

[0113] In some embodiments, the test device disclosed in the embodiment of the present application further includes a controller 50, which is stored in the storage box 20. Please refer to the Figure 1 , including a controller 50, the controller 50 is used to control the test device to perform a target test scenario test under the target test scenario, the target test scenario including a motion scene of the device under test or at least one non-motion scene of multiple non-motion scenes;

[0114] In the motion scenario, the carrier 12 moves relative to the test area at a target speed, and at least part of the test components 31 in at least part of the sub-test area are moved to the storage box 20.

[0115] The plurality of non-motion scenes correspond to the plurality of sub-test areas. In the non-motion scene, the test component 31 of the sub-test area corresponding to the non-motion scene is located within the sub-test area.

[0116] In the motion scenario, the platform 12 moves relative to the test area at a target speed. Therefore, the motion scenario can include a high-speed train scenario. Multiple non-motion scenarios correspond to multiple sub-test areas. Therefore, the non-motion scenarios can include multipath effect scenarios, high and low temperature scenarios, confined space scenarios, and large gathering scenarios.

[0117] For example, when the tester uses the test equipment to conduct a target scene test, if the selected target test scene is a fast-moving high-speed rail scene, the controller 50 will control the carrier 12 to move at the target speed relative to the test area. In addition, it will also control the test components 31 in other sub-test areas that will affect the test environment to move to the storage box 20.

[0118] It can be understood that when the target test scene is a fast-moving high-speed rail scene, since the scene test cannot be interfered with by the test components 31 of other sub-test areas, the controller 50 can only control the test equipment to perform the fast-moving high-speed rail scene.

[0119] When the target test scenario is a non-motion scenario, the controller 50 can control multiple mobile phone test devices to simultaneously perform one or more of the multipath effect scenarios, high and low temperature scenarios, confined space scenarios, and large gathering scenarios, thereby improving the test efficiency of the simulated scenario test.

[0120] In some embodiments, when the mobile phone waiting for test device is performing a non-motion scene test, the controller 50 can set a test time for each scene test. After the mobile phone waiting for test device completes the test according to the set test time, the controller 50 automatically rotates the stage 12 to rotate each mobile phone waiting for test device to the next sub-testing area to complete the test of the target scene corresponding to the next sub-testing area.

[0121] In some embodiments, when the mobile phone waiting for test device is performing a non-motion scene test, the controller 50 can set a test time for each scene test. After the mobile phone waiting for test device completes the test according to the set test time, the controller 50 automatically rotates the carrier 12, which drives the mobile phone waiting for test device to rotate at a set speed to perform a fast-moving scene test on the mobile phone waiting for test device. At the same time, the test components 31 in other sub-test areas that may affect the test environment are moved to the storage box 20.

[0122] For example, four mobile phones are tested in four non-motion scenarios at the same time, and further reference is made to Figure 3 A top view of the cylindrical test equipment, in which the multipath effect scene, the confined space scene, the large gathering scene, and the high and low temperature scene are adjacent in a clockwise direction.

[0123] During the test, four mobile phones were simultaneously placed on the platform 12 in the corresponding sub-test area, and tested for the target scenario corresponding to that sub-test area. The first mobile phone was placed in the mounting position on the platform 12 corresponding to the first sub-test area 111 for multipath effect scenario testing. The second mobile phone was placed in the mounting position on the platform 12 corresponding to the fourth sub-test area for high and low temperature scenario testing. The third mobile phone was placed in the mounting position on the platform 12 corresponding to the third sub-test area 113 for confined space scenario testing. The fourth mobile phone was placed in the mounting position on the platform 12 corresponding to the second sub-test area for large gathering scenario testing. The controller 50 set the test time for each scenario to 20 minutes. After performing the corresponding 20-minute test on the mobile phones in each sub-test area, the controller 50 rotated the platform 12 clockwise a certain distance, so that the first mobile phone entered the fourth sub-test area for high and low temperature scenario testing, the second mobile phone entered the third sub-test area 113 for confined space scenario testing, the third mobile phone entered the second sub-test area for large gathering scenario testing, and the fourth mobile phone entered the first test area for multipath effect scenario testing. Thus, when the carrier 12 rotates four times, four different scene tests can be performed on each of the four mobile phones, thereby greatly improving the efficiency of mobile phone testing in complex scenes.

[0124] Optionally, the carrier 12 may also rotate counterclockwise.

[0125] For example, Figure 3 For example, in a high-speed rail scenario where the test equipment is moving rapidly, the carrier 12 moves rapidly, and there are four installation areas 13 on the carrier 12. Therefore, four mobile phone test equipment terminals can be tested simultaneously in the same time period, thereby greatly improving the test efficiency.

[0126] In some embodiments, in order to be able to visually control the operation of the test device and improve the user experience of using the test device, the test device further includes a display device 40 provided on the outer wall of the box 100;

[0127] Therefore, the controller 50 is also used to control the display device 40 to display an interface including multiple test scenarios. Figure 5 , Figure 5 An embodiment of the present application provides an interface 400 including multiple test scenarios. The interface includes a selection area 41 for multiple test scenarios and a test button area 42. The selection area includes simulation scenario 1: high-speed rail; simulation scenario 2: elevator; simulation scenario 3: underground garage; simulation scenario 4: high and low temperature; and simulation scenario 5: large gathering. The test button area includes a start test button 421 and an end test button 422.

[0128] In an embodiment of the present application, the tester can select a corresponding target simulation scenario from the selection area 41 of multiple test scenarios as needed in the test area. After the tester selects the target simulation scenario, he or she can select the Start Test button in the Test Button area. In response to the operation of selecting the target test scenario from the selection area 41 of multiple test scenarios, the controller 50 controls the test device to perform a test of the target test scenario under the target test scenario. If the tester wants to stop the test, the controller 50 stops the test of the target test scenario in progress by the test device in response to the operation of the End Test button.

[0129] For example, Figure 3 For example, in the test equipment with a cylindrical structure, the tester can select the high-speed rail scene as the target test scene in the multiple test scene selection area 41. However, when the tester selects the high-speed rail scene as the target test scene, other non-sports scene tests cannot be selected. When selecting non-sports scenes, one or more of the elevator scene, the underground garage scene, the high and low temperature scene, and the large-scale gathering scene can be selected simultaneously. When the tester selects the target simulation scene as the simulation scene two elevator and the simulation scene three underground garage in the selection area 41 of multiple test scenes, the tester clicks the start test in the test button area, and the controller 50 responds to the operation from the selected simulation scene two elevator and the simulation scene three underground garage, controls the multiple receiving antennas 312 of the second sub-test area 112 to rise into the second sub-test area 112, and also controls the metal parts 313 of the third sub-test area 113 to rise into the third sub-test area 113, and also controls the signal source 32 of the third test area, the signal source 32 of the second test area and the multiple receiving antennas 312 of the third sub-test area 113 to be in the on state, and also controls the shielding parts set between each adjacent installation area 13 to move to the carrier 12, thereby starting to test the mobile phone placed in the installation area 13 corresponding to the second sub-test area 112 and the mobile phone placed in the installation area 13 corresponding to the third sub-test area 113.

[0130] In some embodiments, in order to control the movement speed of the device under test driven by the carrier 12 in the fast motion scene test, a variety of test scenes with different movement speeds can be realized to improve the accuracy and reliability of the test. The interface including multiple test scenes on the display device 40 can also include a speed setting button 43 to set the movement speed of the carrier 12, so that the controller 50 responds to the operation of selecting a motion test scene from multiple test scenes and the operation of setting the movement speed of the motion scene, and controls the test device to perform the motion scene test at the set speed in the motion scene.

[0131] Optionally, when the user selects the speed setting button, the display device 40 may jump to the speed setting interface, see Figure 6 , Figure 6 This is a schematic structural diagram of a speed setting interface disclosed in an embodiment of the present application, including a return button 51, a speed setting area 52, and an OK button 53. The speed setting area includes two speed setting methods. The first is to manually enter the test speed in the rectangular box with the speed setting text. The second is to manually slide the label 521 on the line from 0km / h to 400km / h to set the speed. Among them, the line from 0km / h to 400km / h includes all integer speeds between 0 and 400 from left to right.

[0132] Clicking the return button 51 returns to the multiple test scenario interface 400. Clicking the OK button saves the set speed as the moving speed of the carrier 12 in the high-speed rail simulation scenario, so that when the test device tests the mobile phone waiting for test device, the carrier 12 drives the mobile phone waiting for test device to move according to the set speed.

[0133] In other embodiments, in order to control the temperature of the corresponding sub-test area in the high and low temperature scenes to realize multiple test scenes with different temperatures and improve the accuracy and reliability of the test, the interface including multiple test scenes on the display device 40 may further include a temperature setting button 44 to set the temperature of the fourth sub-test area 114, so that the controller 50 responds to the operation of selecting a temperature test scene from the multiple test scenes and setting the temperature of the temperature test scene, and controls the test device to perform the test of the temperature test scene according to the set temperature in the temperature test scene.

[0134] Optionally, when the user selects the temperature setting button, the display device 40 may jump to the temperature setting interface, see Figure 7 , Figure 7 This is a schematic structural diagram of a temperature setting interface disclosed in an embodiment of the present application. It includes a return button 61, a temperature setting area 62 and an OK button 63. Among them, the temperature setting area includes three temperature modes. The first is the low temperature mode. When the low temperature mode is selected, the user can manually enter the low temperature temperature in the selection box with the word low temperature. The second is the high temperature mode. When the high temperature mode is selected, the user can manually enter the high temperature temperature in the selection box with the word high temperature. The third is the temperature cycle mode. When the temperature cycle mode is selected, the user can manually enter the low temperature temperature in the selection box with the word low temperature, or manually enter the high temperature temperature in the selection box with the word high temperature to set the range of the temperature cycle.

[0135] Clicking the return button 61 returns to the multiple test scenario interface 400. Clicking the OK button saves the set temperature as the temperature of the heat exchange device 314 in the fourth sub-test area 114 during the high and low temperature simulation scenario 4, so that when the test device tests the mobile phone waiting to be tested, the heat exchange device 314 heats or cools according to the set temperature.

[0136] Based on the above-mentioned test device, the embodiment of the present application further discloses a controller 50, which is disposed in the storage box 20 and is used to control the test device to perform a test of a target test scenario under a target test scenario, wherein the target test scenario includes a motion scene of the device under test or at least one non-motion scene of multiple non-motion scenes;

[0137] In the motion scenario, the carrier 12 moves relative to the test area at a target speed, and at least part of the test components 31 in at least part of the sub-test area are moved to the storage box 20.

[0138] The plurality of non-motion scenes correspond to the plurality of sub-test areas. In the non-motion scene, the test component 31 of the sub-test area corresponding to the non-motion scene is located within the sub-test area.

[0139] Based on the above-described test device and controller 50, an embodiment of the present application further discloses a testing method. With the device under test placed in mounting area 13 on carrier 12 corresponding to a sub-test area, the device under test is covered with upper cover 200. A target test scenario is selected from a plurality of test scenarios via display device 40, and then a click is made to start the test. In response to the operation of selecting a target test scenario from the plurality of test scenarios, controller 50 of the device under test controls the test device to perform a test of the target test scenario under the target test scenario.

[0140] The target test scene includes a motion scene of the device under test or at least one non-motion scene among a plurality of non-motion scenes;

[0141] In the motion scenario, the carrier 12 moves relative to the test area at a target speed, and at least part of the test components 31 in at least part of the sub-test area are moved to the storage box 20.

[0142] The plurality of non-motion scenes correspond to the plurality of sub-test areas. In the non-motion scene, the test component 31 of the sub-test area corresponding to the non-motion scene is located within the sub-test area.

[0143] Based on the above-mentioned test equipment, controller 50 and test method, an embodiment of the present application also discloses a computer-readable storage medium, on which a computer program is stored, which implements any of the above-mentioned introduction video generation methods when the computer program is executed by a processor.

[0144] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing related hardware through a computer program. The program can be stored in a non-volatile computer-readable storage medium. When executed, the program can include the processes in the above-described method embodiments. The storage medium can be a magnetic disk, an optical disk, a ROM, or the like.

[0145] As used herein, any reference to memory, storage, database, or other medium may include nonvolatile and / or volatile memory. Suitable nonvolatile memory may include ROM, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM), which serves as external cache memory. By way of illustration and not limitation, RAM may be in various forms, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced synchronous DRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus DRAM (RDRAM), and direct Rambus DRAM (DRDRAM).

[0146] It should be understood that the references to "one embodiment" or "an embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "in one embodiment" or "in an embodiment" throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. Those skilled in the art should also be aware that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required for the present application.

[0147] In the various embodiments of the present application, it should be understood that the size of the serial numbers of the above-mentioned processes does not necessarily mean the order of execution. The order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0148] The units described above as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one place or distributed across multiple network units. Some or all of these units may be selected based on actual needs to achieve the objectives of this embodiment.

[0149] In addition, the functional units in the embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0150] The term "and / or" in this article is only a description of the association relationship between associated objects, indicating that there can be three relationships. For example, object A and / or object B can mean: object A exists alone, object A and object B exist at the same time, and object B exists alone.

[0151] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or apparatus comprising the element.

[0152] The methods disclosed in the several method embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments.

[0153] The features disclosed in the several product embodiments provided in this application can be arbitrarily combined without conflict to obtain new product embodiments.

[0154] The features disclosed in the several method or device embodiments provided in this application can be arbitrarily combined without conflict to obtain new method embodiments or device embodiments.

[0155] The above is a detailed introduction to the introduction video generation method disclosed in the embodiments of this application. Specific examples are used herein to illustrate the principles and implementation methods of this application. The description of the above embodiments is only intended to help understand the method and core concept of this application. At the same time, for those skilled in the art, according to the concept of this application, there may be changes in the specific implementation method and scope of application. In summary, the contents of this specification should not be understood as limiting this application.

Claims

1. A testing device, characterized in that: include: The box body includes a test box and a storage box located below the test box, wherein the storage box stores components for testing; wherein the test box includes a test area and a carrier, The test area includes a plurality of sub-test areas that are independent of each other and can shield signals from each other. The sub-test areas are provided with test components and signal sources, the signal sources are used to transmit signals, and the test components in each sub-test area are different; The carrier is arranged at one side of the test area and is used to place the device under test. When the device under test is located at a position opposite to any sub-test area, the device under test can be tested on any sub-test area when the signal source of any sub-test area transmits a signal.

2. The testing device according to claim 1, characterized in that The carrier is movably arranged at one side of the test area. During the movement of the carrier relative to the test area, the device under test can switch from testing on one sub-test area to testing on another sub-test area.

3. The testing device according to claim 2, characterized in that At least some of the test components of at least some of the multiple sub-test areas are configured to be able to move vertically between the test areas and the storage box, and when the carrier moves relative to the test area at a target speed, at least some of the test components of at least some of the sub-test areas are moved to the storage box, and the device to be tested can switch between the sub-test areas to achieve switching between different cells, and the target speed is greater than the speed threshold.

4. The testing device according to claim 3, characterized in that The box body also includes a lifting assembly, The lifting assembly is connected to at least some of the test assemblies in at least some of the sub-testing areas, and is used to vertically move at least some of the test assemblies in at least some of the sub-testing areas between the test area and the storage box.

5. The testing device according to any one of claims 1 to 4, characterized in that: The multiple sub-test areas include a first sub-test area, the test assembly in the first sub-test area includes a plurality of reflectors, the reflectors are used to reflect signals emitted by a signal source in the first sub-test area; and / or, The multiple sub-test areas include a second sub-test area, the test component in the second sub-test area includes a plurality of receiving antennas, and the plurality of receiving antennas are used to receive signals sent by a signal source in the second sub-test area; and / or, The multiple sub-test areas include a third sub-test area, the test component in the third sub-test area includes a metal piece, and the metal piece and the third sub-test area form a closed space; and / or, The plurality of sub-test areas include a fourth sub-test area, and the test component in the fourth sub-test area includes a heat exchange device.

6. The testing device according to any one of claims 1 to 4, characterized in that: The carrier includes a plurality of installation areas for installing the device under test. The plurality of installation areas correspond to the plurality of sub-test areas. The device under test placed on each installation area can be located at a position corresponding to each sub-test area.

7. The testing device according to claim 6, characterized in that A shielding member for shielding signals is provided between any two adjacent mounting areas of the plurality of mounting areas.

8. The testing device according to claim 4, characterized in that: Also included is a controller, which is stored in the storage box; The controller is configured to control the test device to perform a test of a target test scenario under a target test scenario, where the target test scenario includes a motion scene of the device under test or at least one non-motion scene of a plurality of non-motion scenes; In the motion scene, the carrier moves relative to the test area at the target speed, and at least part of the test components of at least part of the sub-test area are moved to the storage box. The multiple non-motion scenes correspond to the multiple sub-test areas. In the non-motion scenes, the test components of the sub-test areas corresponding to the non-motion scenes are located within the sub-test areas.

9. The testing device according to claim 8, characterized in that Also included is a display device arranged on the outer wall of the box; The controller is further configured to control the display device to display an interface including multiple test scenarios; The controller is specifically configured to, in response to an operation of selecting the target test scene from the multiple test scenes, control the test device to perform a test of the target test scene under the target test scene; wherein the multiple test scenes include a motion scene and multiple non-motion scenes of the device under test.

10. The testing device according to claim 9, characterized in that The target test scene includes the motion scene, and the controller is specifically configured to: in response to an operation of selecting the motion test scene from the plurality of test scenes and an operation of setting a motion speed of the motion scene, control the test device to perform a test of the motion scene under the motion scene; and / or, The target test scenario includes a temperature test scenario, and the controller is specifically used to: in response to the operation of selecting the temperature test scenario from the multiple test scenarios and setting the temperature of the temperature test scenario, control the test device to perform the test of the temperature test scenario under the temperature test scenario.

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