Aided design method and device of test fixture, electronic equipment and storage medium
By obtaining the target file and determining the network name of the printed circuit board functional terminal, fast and accurate test point positioning is achieved, the problem of inefficient testing point determination is solved, and the PCBA testing efficiency is improved.
Patent Information
- Application Number
- CN202510200163.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-21
- Publication Date
- 2025-08-08
AI Technical Summary
In the prior art, during the printed circuit board (PCBA) testing process, the determination of the test points is inefficient, resulting in inefficient testing.
By obtaining the target file, determine the network name corresponding to the functional terminals and pins of the printed circuit board to be tested, and use the predetermined test point location to realize functional testing, instead of manual experience selection.
Quickly and accurately position the test points of the functional terminals to be tested, which improves the efficiency of determining the test points and thus improves the testing efficiency of the printed circuit board.
Smart Images
Figure CN120446714A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of circuit board testing, and in particular to a test fixture auxiliary design method, device, electronic equipment and storage medium. Background Art
[0002] After circuit board processing, printed circuit board assembly (PCBA) testing is required to ensure the quality and performance of the final electronic product.
[0003] In related technologies, the PCBA testing process specifically includes: customizing a test fixture, placing the PCBA board on a test frame, connecting the test points and the test frame through the test fixture, connecting the PCBA board to a computer and a burner, uploading and running the MCU program, observing the voltage and current values between the test points on the test frame, and verifying whether they are consistent with the design.
[0004] In the related art, test points are selected by technicians based on their experience, so the determination of test points is inefficient, resulting in low PCBA test efficiency. Summary of the Invention
[0005] The present application proposes a test fixture auxiliary design method, device, electronic device and storage medium.
[0006] In a first aspect, an embodiment of the present application provides an auxiliary design method for a test fixture, the method comprising: obtaining a target file, the target file indicating at least one of the following: functional terminals included in a printed circuit board mainboard to be tested, pins of the functional terminals, and network names corresponding to the pins of the functional terminals; determining multiple target functional terminals to be tested among the functional terminals included in the printed circuit board to be tested; for each target functional terminal, determining the network name corresponding to the pin of the target functional terminal based on the target file, obtaining a test point selection file, the network name corresponding to the pin is configured to determine the target test point, and the target test point is configured to cooperate with the test fixture to implement functional testing of the target functional terminal.
[0007] In a second aspect, an embodiment of the present application provides an auxiliary design device for a test fixture, the device comprising: a file acquisition module for acquiring a target file, the target file indicating at least one of the following: functional terminals included in the printed circuit board mainboard to be tested, the pins of the functional terminals, and the network names corresponding to the pins of the functional terminals; a functional terminal determination module for determining multiple target functional terminals to be tested among the functional terminals included in the printed circuit board to be tested; a file generation module for determining, for each target functional terminal, the network name corresponding to the pin of the target functional terminal based on the target file, to obtain a test point selection file, the network name corresponding to the pin is configured to determine the target test point, and the target test point is configured to cooperate with the test fixture to implement functional testing of the target functional terminal.
[0008] In a third aspect, an embodiment of the present application provides an electronic device comprising: a memory; one or more processors coupled to the memory; and one or more programs, wherein the one or more applications are stored in the memory and configured to be executed by the one or more processors, and the one or more programs are configured for the method of the first aspect.
[0009] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, in which computer program instructions are stored. The computer program instructions can be called by a processor to execute the method of the first aspect.
[0010] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when instructions in the computer program product are executed, is used to implement the method of the first aspect.
[0011] Compared with the prior art, the technical solution provided by the embodiment of the present application is that after the electronic device obtains the target file, it first determines the target functional terminal to be tested, and then determines the network names corresponding to each pin of the target functional terminal based on the target file. Since the network name is used to indicate the position of the pin on the pin on the printed circuit board to be tested, and the test point corresponding to each network name is predetermined and stored, the network name corresponding to the pin can be used to determine the target test point, and the test fixture implements the test of the target functional terminal through the target test point. Compared with the related technology in which the technicians select the test points based on their experience, the technical solution provided by the embodiment of the present application can quickly and accurately locate the test points corresponding to the functional terminals to be tested, thereby improving the efficiency of determining the test points and thereby improving the testing efficiency of the printed circuit board. BRIEF DESCRIPTION OF THE DRAWINGS
[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.
[0013] Figure 1 This is a flowchart of a test fixture auxiliary design method provided by one embodiment of the present application.
[0014] Figure 2 This is a flowchart of a test fixture auxiliary design method provided by another embodiment of the present application.
[0015] Figure 3 yes Figure 2 Schematic diagram of the interface of the functional terminal selection interface involved in the embodiment.
[0016] Figure 4 yes Figure 2 Schematic diagram of the interface of the functional terminal selection interface involved in the embodiment.
[0017] Figure 5 This is a test point distribution diagram provided by an embodiment of the present application.
[0018] Figure 6 This is a flowchart of a test fixture auxiliary design method provided by another embodiment of the present application.
[0019] Figure 7 yes Figure 6 Schematic diagram of the test fixture debugging interface involved in the embodiment.
[0020] Figure 8 This is a block diagram of an auxiliary design device for a test fixture provided in one embodiment of the present application.
[0021] Figure 9 This is a structural block diagram of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION
[0022] The embodiments of the present application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and are not to be construed as limiting the present application.
[0023] In order to enable those skilled in the art to better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.
[0024] The implementation environment applicable to the embodiments of the present application may include an electronic device. In the embodiments of the present application, the electronic device may provide auxiliary design and debugging functions for the test fixture. Optionally, the electronic device is provided with a designated application that provides auxiliary design and debugging functions for the test fixture. The electronic device may be a personal computer, a tablet computer, or the like.
[0025] A test fixture is a device used to inspect and test electronic components or circuit networks, primarily for checking the electrical performance and connections of in-circuit components. When testing functional terminals on a printed circuit board (PCB), appropriate test points must be selected. The test fixture then inserts a needle at the selected test point to test the functional terminal. In related art, test points are typically selected by testers based on experience, resulting in low testing efficiency.
[0026] Based on the problems existing in the related technology, an embodiment of the present application provides an auxiliary design method for a test fixture. After the electronic device obtains the target file, it first determines the target functional terminal to be tested, and then determines the network names corresponding to each pin of the target functional terminal based on the target file. Since the network name is used to indicate the position of the pin on the pin on the printed circuit board to be tested, and the test point corresponding to each network name is predetermined and stored, the network name corresponding to the pin can be used to determine the target test point. The test fixture implements the test of the target functional terminal through the target test point. Compared with the related technology in which technicians select test points based on experience, the technical solution provided by the embodiment of the present application can quickly and accurately locate the test points corresponding to the functional terminals to be tested, improve the efficiency of determining the test points, and thus improve the test efficiency.
[0027] Please refer to Figure 1 , which shows a flow chart of a testing method provided by an embodiment of the present application, the method includes the following process.
[0028] S101, obtaining a target file.
[0029] In the embodiment of the present application, the target file is used to describe multiple functional terminals of the printed circuit board to be tested and connection information between the multiple functional terminals.
[0030] Optionally, the target file includes multiple functional terminals of the PCBA motherboard to be tested, the pin information of each functional terminal, and the network name corresponding to the pin of each functional terminal. The network name corresponding to the pin refers to the name of the pin's routing on the printed circuit board motherboard to be tested. Optionally, the target file also includes the test point location corresponding to each network name. The test point location corresponding to the network name refers to the location of the test point corresponding to the network name on the printed circuit board to be tested, which can be represented by test point coordinates. Exemplarily, the target file refers to the PCB file of the printed circuit board motherboard to be tested.
[0031] Optionally, the electronic device displays a file import interface, which includes an import control. After receiving a trigger signal for the import control, the electronic device displays an input box, through which the technician can select the storage path of the above-mentioned target file. After that, the electronic device reads the target file from the above-mentioned storage path.
[0032] S102: Determine a target functional terminal to be tested among multiple functional terminals.
[0033] The technician can select the target functional terminal to be tested on the printed circuit board to be tested, or the electronic device can set the target functional terminal to be tested by default. The process of determining the target functional terminal will be described in the following embodiments.
[0034] S103 , for each target functional terminal, determining the net name corresponding to the pin of the target functional terminal based on the target file, and obtaining a test point selection file.
[0035] The network name corresponding to the pin is configured to determine the target test point. The test point refers to the contact position between the probe of the test fixture and the printed circuit board motherboard to be tested, so it can also be called the needle point. Specifically, since the target file stores the test point position corresponding to the network name, the test point position corresponding to each network name can be found in the target file. The target test point is configured to cooperate with the test fixture to realize the functional test of the target functional terminal. Specifically, when processing the test fixture, it is necessary to associate the network name number with the test fixture, so that each needle point number on the test fixture is associated with the corresponding test point, network name and pin of the target functional terminal.
[0036] To sum up, the technical solution provided by the embodiment of the present application is that after the electronic device obtains the target file, it first determines the target functional terminal to be tested, and then determines the network names corresponding to each pin of the target functional terminal based on the target file. Since the network name is used to indicate the position of the pin on the pin on the printed circuit board to be tested, and the test point corresponding to each network name is predetermined and stored, the network name corresponding to the pin can be used to determine the target test point, and the test fixture implements the test of the target functional terminal through the target test point. Compared with the related technology in which the technicians select the test points based on their experience, the technical solution provided by the embodiment of the present application can quickly and accurately locate the test points corresponding to the functional terminals to be tested, improve the efficiency of determining the test points, and thereby improve the testing efficiency of the printed circuit board.
[0037] Please refer to Figure 2 , which shows a flow chart of a test fixture auxiliary design method according to an embodiment of the present application. The method includes the following process.
[0038] S201, obtaining a target file.
[0039] The target file is used to describe the multiple functional terminals of the printed circuit board to be tested and the connection information between the multiple functional terminals. Optionally, the target file includes the multiple functional terminals of the PCBA motherboard to be tested, the pin information of each functional terminal, and the network name corresponding to the pin of each functional terminal.
[0040] S202: Displaying a function terminal selection interface based on the target file.
[0041] The function terminal selection interface includes a first area and a second area. The first area is configured to interact with a technician to determine a target function terminal. The second area is configured to display the function terminal selection result.
[0042] The first area includes a plurality of functional terminals, each of which corresponds to a selection control, and the selection control corresponding to the functional terminal is used to trigger the functional terminal to be determined as a target functional terminal.
[0043] Optionally, the first area includes a first sub-area, and the first sub-area is used to display multiple functional terminals and related information in a list format, wherein the related information includes the serial number, the number of pins, and the selection control of the functional terminal. Figure 3, which shows a schematic diagram of a functional terminal selection interface 300 shown in one embodiment of the present application. The functional terminal selection interface 30 includes a first area 3100 and a second area 3200. The first area 3100 includes a first sub-area 3110. The first column 3111 of the first sub-area 3110 contains the serial number of the functional terminal, and a selection control is placed before the serial number of the functional terminal. The second column 3112 of the first sub-area 3110 contains the functional terminal, and the third column 3113 of the first sub-area 3110 contains the number of pins of the functional terminal. Each row of the first sub-area 3110 includes a one-to-one correspondence of a selection control, the serial number of the functional terminal, the functional terminal, and the number of pins.
[0044] S203: Determine the function terminal corresponding to the selection control that obtains the trigger signal as the target function terminal.
[0045] The trigger signal can be any one of a single-click signal, a double-click signal, a sliding signal, and a drag signal. In the embodiment of the present application, only the single-click signal is used as an example for explanation.
[0046] Optionally, after receiving a trigger signal for a certain selection control, the electronic device displays the target functional terminal in the list of checked functional terminals. Optionally, the first area further includes a second sub-area, and the second sub-area is used to display the selected functional terminals and their serial numbers in a list format. Please refer to Figure 3 The first area 3100 includes a second sub-area 3120, the first column of the second sub-area 3120 is the serial number of the selected functional terminal, the second column of the second sub-area 3120 is the selected functional terminal, and each row of the second sub-area 3120 includes a one-to-one corresponding serial number of the functional terminal and the functional terminal.
[0047] Optionally, the first area includes a confirmation control. After the electronic device obtains a trigger signal for the confirmation control, it determines the function terminal corresponding to the selection control that obtains the trigger signal as the target function terminal. Figure 4 , the first area 4100 includes a confirmation control 4130.
[0048] Optionally, the first area also includes an inspection control and a third sub-area, and the third sub-area is used to display the inspection results in a list form. After the electronic device obtains the trigger signal for the inspection control, the inspection result is displayed in the third sub-area. The inspection result includes the functional terminal being inspected, the serial number and the number of pins thereof. Please refer to Figure 3The first area 3100 includes an inspection control 3140 and a third sub-area 3150. The first column of the third sub-area 3150 is the serial number of the inspected functional terminal, the second column of the third sub-area 3150 is the inspected functional terminal, and the third column of the third sub-area 3150 is the number of pins of the inspected functional terminal. Each row of the third sub-area 3150 includes a one-to-one corresponding serial number of the functional terminal, the functional terminal, and the pin of the functional terminal.
[0049] Optionally, the first area further includes a function terminal input box, a pin input box, and a single input control. The function terminal input box is used to input the target function terminal to be tested, the pin input box is used to input the pin to be tested, and the single input control is used to trigger the input information in the function terminal input box, or / and the input information in the pin input box to be determined as the object to be tested. Please refer to Figure 3 The first area 3100 also includes a function terminal input box 3160 , a pin input box 3170 and a single entry control 3180 .
[0050] S204 , respectively determining the network names corresponding to the pins of the target functional terminals, and respectively generating numbers for the network names.
[0051] The electronic device can obtain the network names corresponding to the pins of the target functional terminals from the target file. In addition, the electronic device sequentially numbers the network names corresponding to all the pins of all the target functional terminals according to the order in which the functional terminals are selected.
[0052] S205 , displaying the pin of the target functional terminal, the network name corresponding to the pin, and the number of the network name in the second area.
[0053] The second area is used to display the pins of the target functional terminal, the network names corresponding to the pins, and the numbers of the network names in a list format.
[0054] Combined with reference Figure 4 In the second area 3200, the first column 3210 is the net name number, the second column 3220 is the function terminal, the third column 3230 is the pin of the function terminal, and the fourth column 3240 is the net name corresponding to the pin of the function terminal. Each row in the second area 3200 includes a one-to-one correspondence between the net name number, the function terminal, the pin of the function terminal, and the net name.
[0055] S206: Generate a test point selection file based on the display content of the second area.
[0056] The electronic device saves the displayed content of the second area to obtain a test point selection file. In some embodiments, after receiving the export instruction, the electronic device saves the displayed content of the second area to generate a test point selection file. Once the network name is determined, the test fixture designer can use the test point selection file to sequentially search for the network name in the drawings of the printed circuit board to be manufactured, thereby completing the test point selection process.
[0057] Optionally, if at least two sets of data in the second area have the same net name, the at least two sets of data displayed in the second area are deleted and reduced to one set of data, where the at least two sets of data include the pins of the corresponding target functional terminals, the net names corresponding to the pins, and the numbers of the net names. This can avoid selecting duplicate test points.
[0058] With reference to Table 1, it exemplarily shows a test point selection file shown in an embodiment of the present application.
[0059] serial number Network Name 1 AHS1 10 P_O 11 P_S 12 P_D …… ……
[0060] Table-1
[0061] In Table 1, the first column is the network name number and the second column is the network name.
[0062] To sum up, the technical solution provided by the embodiment of the present application is that after the electronic device obtains the target file, it first determines the target functional terminal to be tested, and then determines the network names corresponding to each pin of the target functional terminal based on the target file. Since the network name is used to indicate the position of the pin on the pin on the printed circuit board to be tested, and the test point corresponding to each network name is predetermined and stored, the network name corresponding to the pin can be used to determine the target test point, and the test fixture implements the test of the target functional terminal through the target test point. Compared with the related technology in which the technicians select the test points based on their experience, the technical solution provided by the embodiment of the present application can quickly and accurately locate the test points corresponding to the functional terminals to be tested, improve the efficiency of determining the test points, and thereby improve the testing efficiency of the printed circuit board.
[0063] In some embodiments, after obtaining the test point selection file, the electronic device may further obtain the test point location information corresponding to the network name; and generate a test point distribution map based on the test point location information corresponding to the network name.
[0064] The test point location information corresponding to the network name represents the location of the test point corresponding to the network name on the printed circuit board to be tested, which can be represented by coordinates. The electronic device directly reads the test point location information corresponding to the network name from the target file.
[0065] The test point distribution map is used to graphically represent the location of the test points on the main board of the printed circuit board to be printed. The test point distribution map includes the location identifiers of the test points corresponding to the network names. The position of the location identifiers on the test point distribution map is determined based on the test point location information. The location identifiers can be of any shape, such as square or circle. The preset range of the location identifiers of the test points corresponding to the network names includes the number of the network names, that is, the network name number is displayed around the test point location identifiers.
[0066] Combined with reference Figure 5 , which shows a schematic diagram of a test point distribution map 500 according to an embodiment of the present application. The test point distribution map 500 includes location identifiers 510 of multiple test points, and network name numbers 520 corresponding to the test points are displayed around the location identifiers 510 of the test points.
[0067] To sum up, the technical solution provided in the embodiment of the present application also generates a test point distribution map by using the test point location information based on the network name. When the test fixture is subsequently processed, the needle point number of the test fixture can be associated with the test point, network name and pin of the target functional terminal, which is conducive to the processing of the test fixture.
[0068] In some embodiments, for each of the target functional terminals, after determining the network name corresponding to the pin of the target functional terminal based on the target file and obtaining the test point selection file, the electronic device will also separately determine the test equipment channels corresponding to the pins of multiple target functional terminals to obtain the test fixture standard wiring file.
[0069] Specifically, the electronic device arranges and numbers the test equipment channels in a certain order. Each test equipment channel corresponds to an input box, and the target functional terminal is input into the input box, thereby realizing the binding of the test equipment channel and the target functional terminal. The tester can quickly locate the test equipment channel to which the functional terminal needs to be connected according to the standard wiring file of the test fixture, and find the needle point on the printed circuit board to be tested for testing the functional terminal. When wiring, the technician only needs to find the needle point position engraved with the same number on the test fixture according to the standard wiring file of the test fixture, and connect it to the corresponding test equipment channel number to complete the wiring work.
[0070] With reference to Table 2, it exemplarily shows a standard wiring file of a test fixture shown in one embodiment of the present application.
[0071] Test equipment channel number Test device channel name Functional port pins Test fixture needle point number CN1-1 Voltage detection channel 1+ CN1-1 3 CN1-2 Voltage detection channel 1- CN1-2 2 CN1-3 Voltage detection channel 2+ CN2-1 5 CN1-4 Voltage detection channel 2- CN2-2 2 CN1-5 Voltage detection channel 3+ CN3-1 7 …… …… …… ……
[0072] Table-2
[0073] In Table 2, the first column is the test equipment channel number, the second column is the test equipment channel name, the third column is the functional terminal pin, and the fourth column is the test fixture pin point number.
[0074] To sum up, the technical solution provided in the embodiment of the present application also generates a standard wiring file for the test fixture. According to the standard wiring file for the test fixture, the technician finds the needle point position engraved with the same number on the test fixture and connects it to the corresponding test equipment channel number to complete the wiring work and improve wiring efficiency.
[0075] Combined with reference Figure 6 , which shows a flow chart of a test fixture auxiliary design method according to an embodiment of the present application. The method includes the following process.
[0076] S601 , displaying a test fixture debugging interface based on a test point selection file, a test point distribution map, and a test fixture standard wiring file.
[0077] The test fixture debugging interface includes a first sub-interface, a second sub-interface and a search sub-interface.
[0078] The first sub-interface is used to display the test point distribution diagram, that is, to graphically represent the distribution of each test point on the printed circuit board to be tested.
[0079] The test point sub-interface includes the location identifiers of each test point, and the number of the network name corresponding to the test point is also displayed around the location identifier of each test point.
[0080] The second sub-interface is used to display the test equipment channels. The test equipment channels displayed on the second sub-interface are completely consistent with the test equipment channels of the actual test equipment.
[0081] The search sub-interface includes at least one of a first search area, a second search area, and a third search area.
[0082] The first search area is used to search for test points. Optionally, the first search area includes a first search input box for inputting a desired test point. Optionally, the first search area also includes a first search control for triggering the electronic device to execute a test point search process and a first clear control for triggering the clearing of input information in the first search input box.
[0083] The second search area is used to search for functional terminals. Optionally, the second search area includes a second search input box for entering the desired functional terminal. Optionally, the second search area also includes a second search control for triggering the electronic device to execute the functional terminal search process. Optionally, the second search area also includes a first result chart for displaying the functional terminal search results, which typically include the network name and number corresponding to the functional terminal.
[0084] The third search area is used to search for test device channels. Optionally, the third search area includes a third search input box for inputting the desired test device channel. Optionally, the third search area also includes a third search control for triggering the electronic device to execute the test device channel search process. Optionally, the third search area also includes a second result chart for displaying the test device channel search results, which typically include the functional terminals corresponding to the test device channels and their numbers.
[0085] Combined with reference Figure 7 , which shows an interface diagram of a test fixture debugging interface 700 according to one embodiment of the present application. The test fixture debugging interface 70 includes a first sub-interface 7100, a second sub-interface 7200, and a search sub-interface 7300. The first sub-interface 7100 displays a test point distribution map. The second sub-interface 7200 displays test device channels. The search sub-interface 7300 includes a first search area 7310, a second search area 7320, and a third search area 7330. The first search area 7310 includes a first search input box 7311 for "Test Point Input" and a first search control 7312. The second search area 7320 includes a second search input box 7321 for "Function Terminal Input," a first search control 7322, and a first results list 7323. The third search area 7330 includes a third search input box 7331 for "Test Device Channel Input," a third search control 7332, and a second results list 7323.
[0086] S602: Obtain a first search instruction input in a first search area.
[0087] The first search instruction carries the test point to be searched. The technician inputs the test point to be searched in the first search input box, and then triggers the first search control. At this time, the electronic device obtains the first search instruction.
[0088] S603: highlighting the location identifier of the test point to be found in the test point distribution map, or / and highlighting the test device channel corresponding to the test point to be found in the second sub-interface.
[0089] Ways to highlight the location identifier of the test point to be found include but are not limited to: highlighting, boxing, etc. Similarly, ways to highlight the test device channel corresponding to the test point to be found include but are not limited to: highlighting, boxing, etc.
[0090] S604: Acquire a second search instruction input in the second search area.
[0091] The second search instruction carries the functional terminal to be searched. The technician inputs the test point to be searched in the second search input box, and then triggers the second search control. At this time, the electronic device obtains the second search instruction.
[0092] S605 , highlighting the position identifier of the test point corresponding to the functional terminal to be found in the test point distribution map, or / and highlighting the test equipment channel corresponding to the functional terminal to be found in the second sub-interface.
[0093] Ways to highlight the position identifier of the test point corresponding to the function terminal to be found include but are not limited to: highlighting, boxing, etc. Similarly, ways to highlight the test equipment channel corresponding to the function terminal to be found include but are not limited to: highlighting, boxing, etc.
[0094] Optionally, the electronic device may further display the network name and number corresponding to the functional terminal to be found in the first result chart.
[0095] S606: Acquire a third search instruction input in the third search area.
[0096] The third search instruction carries the test device channel to be searched. The technician enters the test point to be searched in the third search input box, and then triggers the third search control. At this time, the electronic device obtains the third search instruction.
[0097] S607: highlighting the location identifier of the test point corresponding to the test pass to be found in the test point distribution map, or / and highlighting the test device channel to be found in the second sub-interface.
[0098] Ways to highlight the location identifier of the test point corresponding to the test device channel to be found include but are not limited to: highlighting, boxing, etc. Similarly, highlighting the test device channel to be found includes but is not limited to: highlighting, boxing, etc.
[0099] Optionally, the electronic device may further display the functional terminals and their numbers corresponding to the channels of the test device to be found in the second result chart.
[0100] During the actual test fixture debugging process, if a test step fails, the name of the test device channel called by the faulty step can be confirmed by checking the test steps of the host computer. Then, in the test fixture debugging interface, the test device channel name is entered, and the test device channel position and test point position corresponding to the test device channel will be highlighted. The debugger can then confirm the channel position used by the actual test device and the wiring position on the test fixture, quickly locate the problem point, and then check whether the wiring is normal according to the instructions in the test fixture standard wiring file, thereby improving the efficiency of problem troubleshooting and thus improving testing efficiency.
[0101] To sum up, the technical solution provided by the embodiment of the present application displays the test fixture debugging interface and provides a test point search function, a functional terminal search function, and a test equipment channel search function. When a test step fails during the test process, the problem occurrence point can be quickly located based on the test fixture debugging interface, thereby improving the problem troubleshooting efficiency and thereby improving the test efficiency.
[0102] Please refer to Figure 8 , which shows a block diagram of a test fixture auxiliary design device provided by an embodiment of the present application. The device includes: a file acquisition module 810, a functional terminal determination module 820, and a file generation module 830.
[0103] The file acquisition module 810 is used to acquire a target file, where the target file indicates at least one of the following: functional terminals included in the printed circuit board mainboard to be tested, pins of the functional terminals, and network names corresponding to the pins of the functional terminals.
[0104] The functional terminal determination module 820 is configured to determine a plurality of target functional terminals to be tested from the functional terminals included in the printed circuit board to be tested.
[0105] The file generation module 830 is used to determine the network name corresponding to the pin of the target functional terminal based on the target file for each target functional terminal, and obtain a test point selection file. The network name corresponding to the pin is configured to determine the target test point, and the target test point is configured to cooperate with the test fixture to realize functional testing of the target functional terminal.
[0106] In some embodiments, the functional terminal determination module 820 is configured to display a functional terminal selection interface based on a target file. The functional terminal selection interface includes a first area and a second area. The first area includes multiple functional terminals, each of which has a corresponding selection control. The functional terminal corresponding to the selection control that receives the trigger signal is determined as the target functional terminal. The file generation module 830 is configured to respectively determine the network name corresponding to the pin of the target functional terminal and generate a number for each network name; display the pin of the target functional terminal, the network name corresponding to the pin, and the network name number in the second area; and generate a test point selection file based on the display content in the second area.
[0107] In some embodiments, the file generation module 830 is used to delete the at least two sets of data displayed in the second area into one set of data if there are at least two sets of data in the second area with the same network name, and the at least two sets of data include the pins of the corresponding target functional terminals, the network names corresponding to the pins, and the numbers of the network names.
[0108] In some embodiments, the apparatus further includes: a test point distribution map generation module (not shown in the figure). The test point distribution map generation module is configured to respectively obtain test point location information corresponding to a network name, the test point location information corresponding to the network name representing the location of the test point corresponding to the network name on the printed circuit board to be tested; and generate a test point distribution map based on the test point location information corresponding to the network name, the test point distribution map including location identifiers of the test points corresponding to the network name, and the number of the network name within a preset range including the location identifiers of the test points corresponding to the network name.
[0109] In some embodiments, the apparatus further includes a test fixture standard wiring file generation module (not shown in the figure), which is configured to respectively determine the test equipment channels corresponding to the pins of the plurality of target functional terminals and obtain a test fixture standard wiring file.
[0110] In some embodiments, the apparatus further includes: a display module (not shown in the figure). The display module is used to display a test fixture debugging interface based on a test point selection file, a test point distribution map, and a test fixture standard wiring file, the test fixture debugging interface including a first sub-interface, a second sub-interface, and a query sub-interface, wherein the first sub-interface is used to display a test point distribution map, the second sub-interface is used to display a test equipment channel, and the query sub-interface includes at least one of the following: a first query area, a second query area, and a third query area, the first query area is used to query test points, the second query sub-interface is used to query functional terminals, and the third query sub-interface is used to query test equipment channels.
[0111] In some embodiments, the apparatus further includes: a first query module (not shown in the figure). The first query module is configured to obtain a first query instruction input in the first query area, the first query instruction carrying a test point to be queried; highlight a location identifier of the test point to be queried in the test point distribution map; and / or highlight a test device channel corresponding to the test point to be queried in the second sub-interface.
[0112] In some embodiments, the device further includes: a second query module (not shown in the figure). The second query module is configured to obtain a second query instruction input in the second query area, the second query instruction carrying the functional terminal to be queried; highlight the position identifier of the test point corresponding to the functional terminal to be queried in the test point distribution map, or / and highlight the test device channel corresponding to the functional terminal to be queried in the second sub-interface.
[0113] In some embodiments, the apparatus further includes: a third query module (not shown in the figure). The third query module is configured to obtain a third query instruction input in the third query area, the third query instruction carrying the test device channel to be queried; highlight the location identifier of the test point corresponding to the test pass to be queried in the test point distribution map; and / or highlight the test device channel to be queried in the second sub-interface.
[0114] In summary, the technical solution provided by the embodiment of the present application is that after the electronic device obtains the target file, it first determines the target functional terminal to be tested, and then determines the network names corresponding to each pin of the target functional terminal based on the target file. Since the network name is used to indicate the position of the pin on the pin on the printed circuit board to be tested, and the test point corresponding to each network name is predetermined and stored, the network name corresponding to the pin can be used to determine the target test point, and the test fixture implements the test of the target functional terminal through the target test point. Compared with the related technology in which the technicians select the test points based on their experience, the technical solution provided by the embodiment of the present application can quickly and accurately locate the test points corresponding to the functional terminals to be tested, improve the efficiency of determining the test points, and thereby improve the testing efficiency of the printed circuit board.
[0115] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described devices and modules can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.
[0116] In several embodiments provided in this application, the coupling between modules may be electrical, mechanical or other forms of coupling.
[0117] In addition, the functional modules in the various embodiments of the present application may be integrated into a processing module, or each module may exist physically separately, or two or more modules may be integrated into a single module. The above-mentioned integrated modules may be implemented in the form of hardware or software functional modules.
[0118] See also Figure 9 , which shows that an embodiment of the present application further provides an electronic device 900, which includes: one or more multi-core processors 910, a memory 920, and one or more applications. The one or more applications are stored in the memory 920 and configured to be executed by the one or more multi-core processors 99, and the one or more applications are configured to execute the methods described in the above embodiments.
[0119] The multi-core processor 910 may include one or more processing cores. The multi-core processor 99 utilizes various interfaces and circuits to connect various components within the battery management system. It executes instructions, programs, code sets, or instruction sets stored in the memory 920, as well as accesses data stored in the memory 920, to perform various functions of the battery management system and process data. Optionally, the multi-core processor 99 may be implemented using at least one of the following hardware forms: a digital signal processing (DSP), a field-programmable gate array (FPGA), or a programmable logic array (PLA). The multi-core processor 910 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU primarily handles the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing display content; and the modem handles wireless communications. It is understood that the modem may not be integrated into the multi-core processor 910 and may be implemented separately via a communication chip.
[0120] The memory 920 may include a random access memory 920 (Random Access Memory, RAM), and may also include a read-only memory 920 (Read-Only Memory). The memory 920 may be used to store instructions, programs, codes, code sets, or instruction sets. The memory 920 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the various method embodiments described below, etc. The data storage area may also store data created by the electronic device during use (such as a phone book, audio and video data, chat record data), etc.
[0121] An embodiment of the present application further provides a computer-readable storage medium, which stores computer program instructions. The computer program instructions can be called by a processor to execute the method described in the above embodiment.
[0122] The computer-readable storage medium may be an electronic memory such as a flash memory, an EEPROM (Electrically Erasable Programmable Read-Only Memory), an EPROM, a hard disk, or a ROM. Alternatively, the computer-readable storage medium includes a non-transitory computer-readable storage medium. The computer-readable storage medium has storage space for computer program instructions for executing any of the method steps described above. These computer program instructions may be read from or written to one or more computer program products. The computer program instructions may be compressed in a suitable form.
[0123] The above is only a preferred embodiment of the present application and does not constitute any form of limitation to the present application. Although the present application has been disclosed as above with preferred embodiments, it is not intended to limit the present application. Any technical personnel in this field can make some changes or modifications to equivalent embodiments using the technical contents disclosed above without departing from the scope of the technical solution of the present application. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present application without departing from the content of the technical solution of the present application are still within the scope of the technical solution of the present application.
Claims
1. A test fixture auxiliary design method, characterized in that: The method comprises: Obtaining a target file, wherein the target file indicates at least one of the following: a functional terminal included in the printed circuit board mainboard to be tested, a pin of the functional terminal, and a network name corresponding to the pin of the functional terminal; Determining a plurality of target functional terminals to be tested among the functional terminals included in the printed circuit board to be tested; For each of the target functional terminals, the network name corresponding to the pin of the target functional terminal is determined based on the target file, and a test point selection file is obtained. The network name corresponding to the pin is configured to determine the target test point, and the target test point is configured to cooperate with the test fixture to realize functional testing of the target functional terminal.
2. The method according to claim 1, characterized in that Determining a target functional terminal to be tested among the plurality of functional terminals includes: Displaying a function terminal selection interface based on the target file, the function terminal selection interface includes a first area and a second area, the first area includes a plurality of the function terminals, and the plurality of the function terminals respectively correspond to selection controls; Determine the function terminal corresponding to the selection control that obtains the trigger signal as the target function terminal; The step of determining, for each target functional terminal, a network name corresponding to a pin of the target functional terminal and obtaining a test point selection file includes: respectively determining the network names corresponding to the pins of the target functional terminals, and respectively generating numbers for the network names; Displaying the pin of the target functional terminal, the network name corresponding to the pin, and the number of the network name in the second area; The test point selection file is generated based on the display content of the second area.
3. The method according to claim 2, characterized in that After displaying the pin of the target functional terminal, the network name corresponding to the pin, and the number of the network name in the second area, the method further includes: If there are at least two sets of data in the second area with the same network name, the at least two sets of data displayed in the second area are deleted into one set of data, and the at least two sets of data include the pins of the corresponding target functional terminals, the network names corresponding to the pins, and the numbers of the network names.
4. The method according to claim 1, wherein After determining, for each target functional terminal, the net name corresponding to the pin of the target functional terminal based on the target file and obtaining the test point selection file, the method further includes: respectively acquiring test point location information corresponding to the network names, wherein the test point location information corresponding to the network names represents a location of the test point corresponding to the network names on the printed circuit board to be tested; Based on the test point location information corresponding to the network name, a test point distribution map is generated, the test point distribution map includes the location identifiers of the test points corresponding to the network name, and the number of the network name is included in a preset range of the location identifiers of the test points corresponding to the network name.
5. The method according to claim 1, wherein After determining, for each target functional terminal, the net name corresponding to the pin of the target functional terminal based on the target file and obtaining the test point selection file, the method further includes: The test equipment channels corresponding to the pins of the target functional terminals are respectively determined to obtain a test fixture standard wiring file.
6. The method according to any one of claims 1 to 5, characterized in that The method further comprises: A test fixture debugging interface is displayed based on the test point selection file, the test point distribution map and the test fixture standard wiring file, wherein the test fixture debugging interface includes a first sub-interface, a second sub-interface and a query sub-interface, wherein the first sub-interface is used to display the test point distribution map, the second sub-interface is used to display the test equipment channel, and the query sub-interface includes at least one of the following: a first query area, a second query area and a third query area, the first query area is used to query test points, the second query sub-interface is used to query functional terminals, and the third query sub-interface is used to query test equipment channels.
7. The method according to claim 6, characterized in that After displaying the test fixture debugging interface based on the test point selection file, the test point distribution map, and the test fixture standard wiring file, the method further includes: Obtaining a first query instruction input in the first query area, where the first query instruction carries a test point to be queried; The position identifier of the test point to be queried is highlighted in the test point distribution map, or / and the test equipment channel corresponding to the test point to be queried is highlighted in the second sub-interface.
8. The method according to claim 6, characterized in that After displaying the test fixture debugging interface based on the test point selection file, the test point distribution map, and the test fixture standard wiring file, the method further includes: Acquire a second query instruction input in the second query area, where the second query instruction carries the functional terminal to be queried; The position identifier of the test point corresponding to the functional terminal to be queried is highlighted in the test point distribution map, or / and the test equipment channel corresponding to the functional terminal to be queried is highlighted in the second sub-interface.
9. The method according to claim 6, characterized in that After displaying the test fixture debugging interface based on the test point selection file, the test point distribution map, and the test fixture standard wiring file, the method further includes: Obtaining a third query instruction input in the third query area, wherein the third query instruction carries a test device channel to be queried; The position identifier of the test point corresponding to the test to be queried is highlighted in the test point distribution map, or / and the channel of the test device to be queried is highlighted in the second sub-interface.
10. A test fixture auxiliary design device, characterized in that: The device comprises: A file acquisition module is used to acquire a target file, wherein the target file indicates at least one of the following: a functional terminal included in the printed circuit board mainboard to be tested, a pin of the functional terminal, and a network name corresponding to the pin of the functional terminal; A function terminal determination module, configured to determine a plurality of target function terminals to be tested among the function terminals included in the printed circuit board to be tested; A file generation module is used to determine, for each target functional terminal, the network name corresponding to the pin of the target functional terminal based on the target file, and obtain a test point selection file. The network name corresponding to the pin is configured to determine the target test point, and the target test point is configured to cooperate with the test fixture to realize functional testing of the target functional terminal.
11. An electronic device, characterized in that: include: Memory; one or more processors coupled to the memory; One or more programs, wherein the one or more application programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs are configured to perform the method according to any one of claims 1 to 9.
12. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer program instructions, which can be called by a processor to execute the method according to any one of claims 1 to 9.