Upgrading test method of storage hardware equipment, electronic equipment and storage medium

Abstract

The invention provides an upgrade testing method for storage hardware equipment, electronic equipment and a storage medium, and belongs to the field of hardware testing. The problem of complex hardware test is solved; the method specifically comprises the following steps: acquiring equipment information of original storage hardware equipment to form initial data; testing the upgraded storage hardware equipment to obtain upgrading information, and processing the upgrading information to obtain comparison data; analyzing the stability of the equipment to obtain a stable value; according to the initial data and the comparison data, the original device and the upgraded device are analyzed, and a lifting value of the device is obtained; judging whether the equipment can be upgraded or not according to the lifting value; if the equipment can be upgraded, according to the stable value, carrying out weighted calculation on the lifting value of the equipment to obtain an optimized value, and upgrading the equipment according to the optimized value; according to the method, the storage hardware equipment is tested, reference is provided for upgrading of the storage hardware equipment according to the test result, and the stability and optimization of upgrading of the storage hardware equipment are guaranteed.

Description

Technical Field

[0001] The present invention discloses an upgrade test method for storage hardware equipment, electronic equipment and storage medium, and relates to the field of hardware testing. Background Art

[0002] Existing upgrade testing methods for storage hardware devices have the following deficiencies:

[0003] Limited test scope: Existing upgrade testing methods for storage hardware devices primarily focus on basic performance testing and simple comparison of test data; this makes it difficult to capture the differences brought about by the upgrade.

[0004] Insufficient data analysis: Only simple test results, such as average read and write speeds, are recorded, but in-depth analysis and mining of test data is lacking;

[0005] Lack of ability to provide reference for equipment upgrades: Existing technologies may not provide sufficient test data to support equipment upgrade decisions, and cannot predict the performance improvements that may be brought about by different upgrade solutions. Summary of the Invention

[0006] In view of the shortcomings of the prior art, the present invention aims to provide an upgrade test method for a storage hardware device, aiming to solve the problem of complex hardware testing.

[0007] In order to achieve the above object, the present invention is implemented through the following technical solutions: A method for upgrading and testing a storage hardware device comprises:

[0008] Step S1: obtaining device information of the original storage hardware device to form initial data;

[0009] Step S2: testing the upgraded storage hardware device to obtain device information of the upgraded storage hardware device, processing the device information of the upgraded storage hardware device to obtain comparison data; analyzing the stability of the device information to obtain a stability value;

[0010] Step S3: Based on the initial data and the comparison data, the original device information and the upgraded device information are analyzed and calculated to obtain the upgrade value of the storage hardware device; based on the upgrade value, it is determined whether the device can be upgraded;

[0011] Step S4: If the upgrade is possible, weighted calculation is performed on the improvement value of the storage hardware device according to the stable value to obtain an optimized value, and the storage hardware device is upgraded according to the optimized value.

[0012] Furthermore, the specific steps of step S1 are as follows:

[0013] Step S11: writing data to the original storage hardware device, obtaining the maximum capacity rl of the original storage hardware device based on the size of the written data, obtaining the time sj for writing the data, and calculating the transmission rate sl;

[0014] Step S12: Perform n read and write operations on the original storage hardware device, record the operation instruction issuance time fc(s) and the actual operation running time yx(s), and calculate the response time xy of the original storage hardware device;

[0015]

[0016] Step S13: The maximum capacity rl, transmission rate sl, and response time xy of the original storage hardware device are saved to form initial data.

[0017] Furthermore, the specific steps of step S2 are as follows:

[0018] Step S21: testing the upgraded storage hardware device, testing the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device, and obtaining device information of the upgraded storage hardware device;

[0019] Based on the data generated during the maximum capacity DRL test, the stable capacity value of the storage hardware device is obtained;

[0020] Based on the data generated during the transmission rate DSL test, the transmission stability value of the storage hardware device is obtained;

[0021] Based on the data generated during the response time dxy test, the response stability value of the storage hardware device is obtained;

[0022] Step S22: saving the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device to form comparison data;

[0023] The capacity stability value, transmission stability value, and response stability value of the upgraded storage hardware device are saved to form a stability value.

[0024] Furthermore, the specific steps of step S21 are as follows:

[0025] Step S211: Testing the maximum capacity of the upgraded storage hardware device:

[0026] Writing data to the storage hardware device to obtain the capacity sjr(w) of the upgraded storage hardware device, formatting the storage hardware device, and repeatedly obtaining the capacity of the upgraded storage hardware device; determining abnormal values of the capacity;

[0027] According to the judgment results, the number of abnormal values ycz and the number of normal values zcz are obtained, the abnormal values are deleted, and the normal capacity sjr(w) is calculated to obtain the maximum capacity drl;

[0028]

[0029] Calculate the ratio between the number of abnormal values ycz and the number of normal values zcz to obtain the stable capacity value Rwd of the storage hardware device;

[0030] Step S212: Testing the transmission rate of the upgraded storage hardware device:

[0031] Write data to the device, calculate the transmission rate based on the size and time of the data written, and calculate the transmission stability Swd based on the change in the transmission rate;

[0032] Step S213: Testing the response time of the upgraded storage hardware device:

[0033] The response time is calculated based on the instruction operation duration of the upgraded storage hardware device, and data analysis is performed on the response time to obtain a response stability value of the storage hardware device.

[0034] Furthermore, the specific steps of step S211 are as follows:

[0035] Get the capacity of the storage hardware device obtained by v tests sjr(1), sjr(2), sjr(3) ... sjr(v);

[0036] Construct a two-dimensional coordinate system, where the horizontal axis represents the capacity of the storage hardware device and the vertical axis represents the number of tests corresponding to the capacity size. Display the capacity of the storage hardware device obtained by v tests in the coordinate system to obtain the number of tests of different capacity sizes, rcs.

[0037] Get the maximum value MX of the number of capacity occurrences; and its corresponding capacity as the standard capacity sjr(m); combine sjr(1), sjr(2), sjr(3) ... sjr(v) with the number of occurrences of the corresponding capacity size, and calculate the probability value Yjs of the abnormal value:

[0038] Yjs=(sjr(w)-sjr(m)) 2 ×(MX-rcs);

[0039] Get the mean of the probability value Yjs of the outlier to get JZ;

[0040] If Yjs≥JZ, the capacity size is an abnormal value and the abnormal value is recorded.

[0041] Furthermore, the specific steps of step S212 are as follows:

[0042] Obtain the time bt required for unit data transmission and the size of data transmitted per unit time tb during data writing, and calculate the transmission rate tsl of the current data writing;

[0043]

[0044] The transmission rate during data writing is recorded, and combined with the change in the device's capacity for writing data, a linear relationship between the transmission rate and the writing capacity is obtained;

[0045] According to the linear relationship between the transmission rate and the write capacity, the transmission rate under different write capacities is obtained, which is recorded as tsl(x);

[0046] According to the transmission rates under different write capacities, the mode of the transmission rates is obtained to obtain the transmission rate dsl of the upgraded storage hardware device;

[0047] Obtain arbitrary write capacities x1 and x2; obtain the transmission rates tsl(x1) and tsl(x2) corresponding to the write capacities; calculate the change in the transmission rate corresponding to the write capacities under different write capacities to obtain the change in the transmission rate bh;

[0048]

[0049] Traverse and increase x2 within its value range [0, drl], and calculate the change value bh of the transmission rate at the same time. When bh increases continuously, x2 stops increasing;

[0050] Set the value of x1 to x2, and traverse and decrease it within its value range [0, x2]. When tsl(x1) remains stable, obtain the corresponding write capacity and the transmission rate change threshold mx.

[0051] Calculate the transmission stability value Swd based on the transmission rate change threshold mx and the maximum capacity drl of the upgraded storage hardware device;

[0052]

[0053] Furthermore, the specific steps of step S213 are as follows:

[0054] Perform command operations on the upgraded storage hardware device and write data to the storage hardware device, the data size is DX; obtain the time ft when the command is issued and the time wt when the command is completed;

[0055] Obtain the transfer rate dsl of the upgraded storage hardware device and combine it with the data size DX of the written data; calculate the time it takes to write the data to obtain the instruction execution time yys;

[0056] According to the time ft when the instruction is issued and the time wt when the instruction is completed, the actual time sys when the instruction is executed is obtained; sys = wt-ft;

[0057] The difference between the command execution time and the actual execution time is calculated to obtain the response time dxy of the upgraded storage hardware device; dxy = sys - yys;

[0058] The upgraded storage hardware device performs dg instruction operations to obtain the response time dxy(g). The mode of the response time dxy(g) is obtained as the reference value ck. The response time dxy(g) is combined with the reference value to make a judgment.

[0059] Get the normal error range tt of the response time;

[0060] If ck = dxy(g), it indicates that the response time dxy(g) is normal;

[0061] If ck≠dxy(g) and |ck-dxy(g)|>tt, it indicates that the response time dxy(g) is abnormal. The number of abnormal response times xyc is counted.

[0062] According to the number of response time anomalies xyc and the number of instruction operations dg, the response stability value of the storage hardware device is calculated to obtain the response stability value Xwd;

[0063]

[0064] Furthermore, the specific steps of step S3 are as follows:

[0065] Step S31: obtaining the maximum capacity rl of the original storage hardware device and the maximum capacity drl of the upgraded storage hardware device, and calculating an increased value Rts of the maximum capacity of the storage hardware device;

[0066]

[0067] Judge Rts:

[0068] If the upgrade value Rts is less than 0, the upgrade reduces the maximum capacity of the storage hardware device and the upgrade is excluded;

[0069] If the upgrade value Rts ≥ 0, the upgrade increases the maximum capacity of the storage hardware device;

[0070] Step S32: obtaining the transmission rate sl of the original storage hardware device and the transmission rate dsl of the upgraded storage hardware device, and calculating the improved value Sts of the transmission rate of the storage hardware device;

[0071]

[0072] Make a judgment on Sts:

[0073] If the upgrade value Sts is less than 0, the upgrade will reduce the transmission rate of the storage hardware device, so the upgrade is excluded.

[0074] If the upgrade value Sts ≥ 0, the upgrade will increase the transmission rate of the storage hardware device;

[0075] Step S33: Obtain the response time xy of the original storage hardware device and the response time dxy of the upgraded storage hardware device, and calculate the improvement value Xts of the response time of the storage hardware device;

[0076]

[0077] Judge Xts:

[0078] If the improvement value Xts is less than 0, the upgrade will increase the response time of the storage hardware device, so the upgrade should be excluded.

[0079] If the improvement value Xts ≥ 0, the upgrade reduces the response time of the storage hardware device and improves the response speed.

[0080] An electronic device comprises a processor and a memory, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the steps in the method according to any one of claims 1 to 6 are executed.

[0081] A storage medium stores a computer program thereon, wherein when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are executed.

[0082] Compared with the prior art, the present invention has the following beneficial effects:

[0083] Comprehensive test scope: This invention performs multiple operations on the hardware to test the maximum capacity, transmission rate, and response time of the hardware. The stability of the maximum capacity is determined based on the write results. The transmission rate of different remaining capacities is analyzed in combination with the maximum capacity. The transmission rate is determined based on the analysis results. The response time is tested in multiple ways to ensure test accuracy.

[0084] Enhanced data analysis: This invention conducts in-depth analysis of test data, such as transmission rate, obtained through different test methods during testing. The test data is combined to enhance accuracy. According to the hardware capacity and the transmission rate, a transmission rate change curve is drawn. The stable range of the transmission rate is obtained from the change of the change curve.

[0085] Provide reference for equipment upgrades: Based on the results of various tests, the present invention can provide more specific suggestions for equipment upgrades. The present invention quantifies the test results before and after the upgrade by using the improvement value, and performs comprehensive calculations based on the quantified results combined with the stability value to obtain the optimized values obtained by different upgrades, so that users can more intuitively understand the benefits brought by the upgrade. BRIEF DESCRIPTION OF THE DRAWINGS

[0086] Other features, objects and advantages of the present invention will become more apparent upon reading the detailed description of non-limiting embodiments with reference to the following drawings:

[0087] Figure 1 Schematic diagram of the method of the present invention;

[0088] Figure 2 Schematic diagram of the proportional relationship between the difference and the probability of the present invention;

[0089] Figure 3 This is a schematic diagram of the transmission rate change of the present invention;

[0090] Figure 4 This is a schematic diagram of the main data processing of the present invention. DETAILED DESCRIPTION

[0091] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0092] Example 1, please refer to Figure 1 , a storage hardware device upgrade test method includes:

[0093] Step S1: obtaining device information of the original storage hardware device to form initial data;

[0094] Step S11: writing data to the original storage hardware device, obtaining the maximum capacity rl of the original storage hardware device based on the size of the data written, obtaining the time sj for writing the data, and calculating the transmission rate sl based on the maximum capacity rl and the time sj for writing the data;

[0095]

[0096] Step S12: Perform n read and write operations on the original storage hardware device, record the operation instruction issuance time fc(s) and the actual operation execution time yx(s), calculate the n operation instruction issuance time and the actual operation execution time, and obtain the response time xy of the original storage hardware device;

[0097]

[0098] It should be noted that the operation instruction issuance time fc(s) and the actual operation running time yx(s) refer to the Unix timestamp of the current time provided by the system; they mainly indicate the time interval between the issuance and running of the operation instruction.

[0099] Step S13: The maximum capacity rl, transmission rate sl, and response time xy of the original storage hardware device are saved to form initial data, where initial data = [rl, sl, xy].

[0100] Step S2: testing the upgraded storage hardware device to obtain device information of the upgraded storage hardware device, processing the device information of the upgraded storage hardware device to obtain comparison data and a stable value;

[0101] Step S21: testing the upgraded storage hardware device, testing the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device, and obtaining device information of the upgraded storage hardware device;

[0102] Based on the data generated during the maximum capacity DRL test, the stable capacity value of the storage hardware device is obtained;

[0103] Based on the data generated during the transmission rate DSL test, the transmission stability value of the storage hardware device is obtained;

[0104] The response stability value of the storage hardware device is obtained based on the data generated during the response time dxy test.

[0105] Step S211: Testing the maximum capacity of the upgraded storage hardware device, specifically as follows: writing data to the storage hardware device to obtain the capacity sjr(w) of the upgraded storage hardware device, formatting the storage hardware device, and repeatedly obtaining the capacity of the upgraded storage hardware device; judging abnormal values of the capacity:

[0106] The specific judgment process is as follows:

[0107] Step S2111: Obtain the capacity of the storage hardware device sjr(1), sjr(2), sjr(3) ... sjr(v) obtained from v tests;

[0108] Step S2112: construct a two-dimensional coordinate system, where the horizontal axis represents the capacity of the storage hardware device and the vertical axis represents the number of times the capacity size is tested. The capacity of the storage hardware device obtained by v tests is displayed in the coordinate system to obtain the number of times rcs obtained by tests of different capacity sizes.

[0109] Step S2113: Obtain the maximum value MX of the number of capacity occurrences; and its corresponding capacity as the standard capacity sjr(m); combine sjr(1), sjr(2), sjr(3) ... sjr(v) with the number of occurrences of the corresponding capacity sizes to calculate the probability value Yjs of the abnormal value:

[0110] Yjs=(sjr(w)-sjr(m)) 2 ×(MX-rcs);

[0111] Where: sjr(w) represents sjr(1), sjr(2), sjr(3) ... sjr(v);

[0112] For example, when testing capacity, the number of units with a capacity of 100 is 10, and the number of units with a capacity of 90 is 5. The total number of tests is 10+5=15, where 100 appears the most times. The maximum value MX of the capacity appearance is 10, and its corresponding capacity is 100.

[0113] Please note: Please refer to Figure 2 , the difference between the capacity sjr(w) and the standard capacity sjr(m) is proportional to the probability value of the capacity sjr(w) being an abnormal value,

[0114] The difference between the number of occurrences MX of the standard capacity sjr(m) and the number of occurrences of the capacity sjr(w) is proportional to the probability value of the capacity sjr(w) being an abnormal value;

[0115] The probability value of the abnormal value is obtained by calculating the difference between the maximum value MX of the capacity occurrence frequency and the frequency of the capacity sjr(w).

[0116] Get the mean of the probability value Yjs of the outlier to get JZ;

[0117] If Yjs≥JZ, the capacity size is an abnormal value and the abnormal value is recorded.

[0118] Get the number of outliers ycz and the number of normal values zcz, delete the outliers, calculate the normal capacity sjr(w), and get the maximum capacity drl;

[0119]

[0120] Calculate the ratio between the number of abnormal values ycz and the number of normal values zcz to obtain the stable capacity value Rwd of the storage hardware device;

[0121]

[0122] For example, if the capacity of the upgraded storage hardware device is repeatedly obtained 100 times and abnormal value judgment is performed on the capacity, the number of abnormal values ycz=5 and the number of normal values zcz=95 are obtained; then the stable value Rwd of the capacity of the storage hardware device is 95%.

[0123] Step S212: Testing the transmission rate of the upgraded storage hardware device, writing data to the device, calculating the transmission rate based on the size and time of the data written, and calculating the transmission stability Swd based on the change in the transmission rate;

[0124] Step S2121: Obtain the time bt required for unit data transmission and the size of data transmitted per unit time tb during the data writing process, and calculate the time bt required for unit data transmission and the size of data transmitted per unit time to obtain the current data writing transmission rate tsl;

[0125]

[0126] For example, if the time required for unit data transmission during data writing is bt = 0.0005s / bit, and the data transmission size per unit time is tb = 2022bit / s, substitute this into the formula for calculation:

[0127]

[0128] Get tsl = 2011 bit / s;

[0129] The time bt required for unit data transmission and the size of data transmitted per unit time tb are comprehensively calculated during the data writing process to improve the accuracy of the calculation and avoid large errors.

[0130] The transmission rate during data writing is recorded, and combined with the change in the device's capacity for writing data, a linear relationship between the transmission rate and the writing capacity is obtained;

[0131] According to the linear relationship between the transmission rate and the write capacity, the transmission rate under different write capacities is obtained, which is recorded as tsl(x), where x represents the data size of the write capacity, 0≤x≤drl;

[0132] According to the transmission rates under different write capacities, the mode of the transmission rates is obtained to obtain the transmission rate dsl of the upgraded storage hardware device;

[0133] For example, according to the change of write capacity, the transmission rates are 1024bps, 1024bps, 1024bps, 1024bps, 1024bps, 1024bps, 1022bps, 1020bps, 1000bps, 980bps, 680bps, 180bps, 80bps, and 0bps respectively; the transmission rate DSL of the upgraded storage hardware device is 1024bps;

[0134] Obtaining the transmission rate dsl of the upgraded storage hardware device through the mode is more representative and expresses the transmission rate of the upgraded storage hardware device under normal circumstances.

[0135] Step S2122: Please refer to Figure 3 , obtain arbitrary write capacities x1 and x2; obtain the transmission rates tsl(x1) and tsl(x2) corresponding to the write capacities; calculate the change in the transmission rate corresponding to the write capacities under different write capacities to obtain the change in the transmission rate bh;

[0136]

[0137] Among them: 0≤x1<x2≤drl;

[0138] Step S2123: x2 is traversed and increased within its value range [0, drl], while calculating the change in the transmission rate bh. When bh increases continuously, x2 stops increasing.

[0139] At the same time, the value of x1 is set to x2, and the value is traversed and decreased within the range [0, x2]. When tsl(x1) is stable, the corresponding write capacity is obtained to obtain the transmission rate change threshold mx.

[0140] Step S2124: according to the transmission rate change threshold mx and the maximum capacity drl of the upgraded storage hardware device, the stability of the transmission rate within the capacity range is calculated to obtain a transmission stability value Swd;

[0141]

[0142] Step S213: testing the response time of the upgraded storage hardware device, obtaining the response time according to the instruction operation duration of the upgraded storage hardware device, performing data analysis on the response time, and obtaining a response stability value of the storage hardware device.

[0143] Step S2131: perform a command operation on the upgraded storage hardware device, write data to the storage hardware device, and the data size is DX; obtain the time ft when the command is issued, and obtain the time wt when the command is completed;

[0144] Obtain the transfer rate dsl of the upgraded storage hardware device and combine it with the data size DX of the written data; calculate the time it takes to write the data to obtain the instruction execution time yys;

[0145]

[0146] According to the time ft when the instruction is issued and the time wt when the instruction is completed, the actual time sys when the instruction is executed is obtained;

[0147] sys=wt-ft;

[0148] The difference between the command execution time and the actual execution time is calculated to obtain the response time dxy of the upgraded storage hardware device;

[0149] dxy=sys-yys;

[0150] Step S2132: Perform dg instruction operations on the upgraded storage hardware device to obtain a response time dxy(g), obtain the mode of the response time dxy(g) as a reference value ck; and judge the response time dxy(g) in combination with the reference value.

[0151] Get the normal error range tt of the response time;

[0152] If ck = dxy(g), it indicates that the response time dxy(g) is normal;

[0153] If ck≠dxy(g) and |ck-dxy(g)|>tt, it indicates that the response time dxy(g) is abnormal. The number of abnormal response times xyc is counted.

[0154] According to the number of response time anomalies xyc and the number of instruction operations dg, the response stability value of the storage hardware device is calculated to obtain the response stability value Xwd;

[0155]

[0156] It should be noted that the error range of the data processing task is mainly 10%-20%. The median value 15% is taken and combined with the reference value ck to multiply and obtain the error range tt.

[0157] Step S22: saving the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device to form comparison data;

[0158] The capacity stability value, transmission stability value, and response stability value of the upgraded storage hardware device are saved to form a stability value.

[0159] Step S3: Based on the initial data and the comparison data, analyze and calculate the device information of the original storage hardware device and the device information of the upgraded storage hardware device to obtain the improvement value of the storage hardware device; and determine the feasibility of the device upgrade based on the improvement value.

[0160] Step S31: obtaining the maximum capacity rl of the original storage hardware device and the maximum capacity drl of the upgraded storage hardware device, and calculating an increased value Rts of the maximum capacity of the storage hardware device;

[0161]

[0162] Determine the maximum capacity increase value Rts of the storage hardware device:

[0163] If the improvement value Rts is less than 0, the maximum capacity of the upgraded storage hardware device is lower than that of the original storage hardware device, and the upgrade effect is negative, the upgrade is rejected;

[0164] If the improvement value Rts≥0, the maximum capacity of the upgraded storage hardware device is higher than that of the original storage hardware device, and the upgrade has an improvement.

[0165] Step S32: obtaining the transmission rate sl of the original storage hardware device and the transmission rate dsl of the upgraded storage hardware device, and calculating the improved value Sts of the transmission rate of the storage hardware device;

[0166]

[0167] Determine the transfer rate increase value Sts of the storage hardware device:

[0168] If the improvement value Sts is less than 0, the transmission rate of the upgraded storage hardware device is lower than that of the original storage hardware device, and the upgrade effect is negative, the upgrade is rejected;

[0169] If the improvement value Sts ≥ 0, the upgraded storage hardware device has a higher transmission rate than the original storage hardware device, and the upgrade has an improvement;

[0170] Step S33: Obtain the response time xy of the original storage hardware device and the response time dxy of the upgraded storage hardware device, and calculate the improvement value Xts of the response time of the storage hardware device;

[0171]

[0172] Determine the improvement value Xts of the response time of the storage hardware device:

[0173] If the improvement value Xts is less than 0, the response time of the upgraded storage hardware device is higher than that of the original storage hardware device, and the upgrade effect is negative, the upgrade is rejected.

[0174] If the improvement value Xts≥0, the response time of the upgraded storage hardware device is lower than that of the original storage hardware device, and the upgrade improves the response speed.

[0175] Step S4: performing weighted calculation on the improvement value of the storage hardware device according to the stable value to obtain an optimized value, and selecting the storage hardware device to be upgraded according to the optimized value;

[0176] Step S41: obtaining a capacity stability value, a transmission stability value, and a response stability value of the storage hardware device, and obtaining an improvement value of the maximum capacity, the transmission rate, and the response time of the storage hardware device;

[0177] Step S42: Please refer to Figure 4 , using the capacity stability value Rwd, transmission stability value Swd, and response stability value Xwd of the storage hardware device as weights, perform weighted calculation on the maximum capacity improvement value Rts, transmission rate improvement value Sts, and response time improvement value Xts of the storage hardware device to obtain the optimized value yhz of the storage hardware device;

[0178]

[0179] For example, if the capacity stability value Rwd of the storage hardware device is 98%, the transmission stability value Swd is 90%, and the response stability value Xwd is 95%, the maximum capacity improvement value Rts of the storage hardware device is 50%, the transmission rate improvement value Sts is 20%, and the response time improvement value Xts is 10%, the optimized value yhz of the storage hardware device is calculated;

[0180]

[0181] We get yhz≈0.53;

[0182] The improvement value is weighted by the stability value. The larger the stability value, the higher the integrity of the improvement value. If the stability is low, the improvement value is reduced to a certain extent, thereby improving the accuracy of the optimization value calculation. The improvement value of the maximum capacity, transmission rate, and response time of the storage hardware device are comprehensively calculated to more intuitively display the improvement of the storage hardware device.

[0183] Step S43: Analyze the optimized value yhz of the storage hardware device, obtain the storage hardware device with the largest optimized value, and upgrade the original storage hardware device;

[0184] Embodiment 2, second aspect, the present application provides an electronic device, including a processor and a memory, the memory storing computer-readable instructions, when the computer-readable instructions are executed by the processor, the steps in any one of the above methods are executed. Through the above technical solution, the processor and the memory are interconnected and communicate with each other through a communication bus and / or other forms of connection mechanisms (not shown), the memory stores a computer program executable by the processor, and when the electronic device is running, the processor executes the computer program to execute the method in any optional implementation of the above embodiment to achieve the following functions: obtain the device information of the original storage hardware device to obtain initial data; test the upgraded device to obtain upgrade information, process the upgrade information to obtain comparison data; analyze the stability of the upgrade information to obtain a stable value; analyze and calculate the original device information and the upgrade information based on the initial data and the comparison data to obtain an improved value; judge whether the device can be upgraded based on the improved value; if it can be upgraded, then combine the stable value to perform weighted calculation on the improved value of the storage hardware device to obtain an optimized value, and upgrade the storage hardware device based on the optimized value.

[0185] Embodiment 3, third aspect, the present application provides a storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps in any one of the above methods are executed. Through the above technical solution, when the computer program is executed by the processor, the method in any optional implementation of the above embodiment is executed to achieve the following functions: obtaining the device information of the original storage hardware device to obtain initial data; testing the upgraded device to obtain upgrade information, processing the upgrade information to obtain comparison data; analyzing the stability of the upgrade information to obtain a stable value; analyzing and calculating the original device information and the upgrade information based on the initial data and the comparison data to obtain an improved value; judging whether the device can be upgraded based on the improved value; if it can be upgraded, combining the stable value to perform weighted calculation on the improved value of the storage hardware device to obtain an optimized value, and upgrading the storage hardware device based on the optimized value.

[0186] The above formulas are all dimensionless and calculated by taking their numerical values. The formula is a formula for the most recent real situation obtained by collecting a large amount of data and performing software simulation. The preset parameters in the formula are set by technicians in this field according to actual conditions. For example, if there are weight coefficients and proportional coefficients, the size of the settings is to quantify each parameter to obtain a specific value, which is convenient for subsequent comparison. Regarding the size of the weight coefficient and the proportional coefficient, as long as it does not affect the proportional relationship between the parameter and the quantized value, it is fine.

[0187] Finally, it should be noted that the above-described embodiments are only specific implementations of the present invention, which are used to illustrate the technical solutions of the present invention, rather than to limit them. The scope of protection of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the above-described embodiments, those skilled in the art should understand that any person skilled in the art can modify or easily conceive of changes to the technical solutions described in the above-described embodiments within the technical scope disclosed by the present invention, or replace some of the technical features therein with equivalents. Such modifications, changes, or replacements do not deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.

Claims

1. A method for upgrading and testing a storage hardware device, characterized in that: Test methods include: Step S1: obtaining device information of the original storage hardware device to form initial data; Step S2: testing the upgraded storage hardware device to obtain device information of the upgraded storage hardware device, processing the device information of the upgraded storage hardware device to obtain comparison data; analyzing the stability of the device information to obtain a stability value; Step S3: Based on the initial data and the comparison data, the original device information and the upgraded device information are analyzed and calculated to obtain the upgrade value of the storage hardware device; based on the upgrade value, it is determined whether the device has been upgraded; Step S4: If it is determined to be an upgrade, a weighted calculation is performed on the improvement value of the storage hardware device according to the stable value to obtain an optimized value, and the storage hardware device is upgraded according to the optimized value.

2. The upgrade test method of a storage hardware device according to claim 1, characterized in that: The specific steps of step S1 are as follows: Step S11: writing data to the original storage hardware device, obtaining the maximum capacity rl of the original storage hardware device based on the size of the written data, obtaining the time sj for writing the data, and calculating the transmission rate sl; Step S12: Perform n read and write operations on the original storage hardware device, record the operation instruction issuance time fc(s) and the actual operation running time yx(s), and calculate the response time xy of the original storage hardware device; Step S13: The maximum capacity rl, transmission rate sl, and response time xy of the original storage hardware device are saved to form initial data.

3. The upgrade test method of a storage hardware device according to claim 1, characterized in that: The specific steps of step S2 are as follows: Step S21: testing the upgraded storage hardware device, testing the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device, and obtaining device information of the upgraded storage hardware device; Based on the data generated during the maximum capacity DRL test, the stable capacity value of the storage hardware device is obtained; Based on the data generated during the transmission rate DSL test, the transmission stability value of the storage hardware device is obtained; Based on the data generated during the response time dxy test, the response stability value of the storage hardware device is obtained; Step S22: saving the maximum capacity drl, transmission rate dsl, and response time dxy of the upgraded storage hardware device to form comparison data; The capacity stability value, transmission stability value, and response stability value of the upgraded storage hardware device are saved to form a stability value.

4. The upgrade test method of a storage hardware device according to claim 3, characterized in that: The specific steps of step S21 are as follows: Step S211: Testing the maximum capacity of the upgraded storage hardware device: Writing data to the storage hardware device to obtain the capacity sjr(w) of the upgraded storage hardware device, formatting the storage hardware device, and repeatedly obtaining the capacity of the upgraded storage hardware device; determining abnormal values of the capacity; According to the judgment results, the number of abnormal values ycz and the number of normal values zcz are obtained, the abnormal values are deleted, and the normal capacity sjr(w) is calculated to obtain the maximum capacity drl; Calculate the ratio between the number of abnormal values ycz and the number of normal values zcz to obtain the stable capacity value Rwd of the storage hardware device; Step S212: Testing the transmission rate of the upgraded storage hardware device: Write data to the device, calculate the transmission rate based on the size and time of the data written, and calculate the transmission stability Swd based on the change in the transmission rate; Step S213: Testing the response time of the upgraded storage hardware device: The response time is calculated based on the instruction operation duration of the upgraded storage hardware device, and data analysis is performed on the response time to obtain a response stability value of the storage hardware device.

5. The upgrade test method of a storage hardware device according to claim 4, characterized in that: The specific steps of step S211 are as follows: Get the capacity of the storage hardware device sjr(1) to sjr(v) obtained from v tests; Construct a two-dimensional coordinate system, where the horizontal axis represents the capacity of the storage hardware device and the vertical axis represents the number of tests corresponding to the capacity size. Display the capacity of the storage hardware device obtained by v tests in the coordinate system to obtain the number of tests of different capacity sizes, rcs. Get the maximum value MX of the capacity occurrence times; and its corresponding capacity as the standard capacity sjr(m); combine sjr(1) to sjr(v) and the number of occurrences of the corresponding capacity sizes to calculate the probability value Yjs of the abnormal value: Yjs=(sjr(w)-sjr(m)) 2 ×(MX-rcs); Get the mean of the probability value Yjs of the outlier to get JZ; If Yjs≥JZ, the capacity size is an abnormal value and the abnormal value is recorded.

6. The upgrade test method of a storage hardware device according to claim 4, characterized in that: The specific steps of step S212 are as follows: Obtain the time bt required for unit data transmission and the size of data transmitted per unit time tb during data writing, and calculate the transmission rate tsl of the current data writing; The transmission rate during data writing is recorded, and combined with the change in the device's capacity for writing data, a linear relationship between the transmission rate and the writing capacity is obtained; According to the linear relationship between the transmission rate and the write capacity, the transmission rate under different write capacities is obtained, which is recorded as tsl(x); According to the transmission rates under different write capacities, the mode of the transmission rates is obtained to obtain the transmission rate dsl of the upgraded storage hardware device; Obtain arbitrary write capacities x1 and x2; obtain the transmission rates tsl(x1) and tsl(x2) corresponding to the write capacities; calculate the change in the transmission rate corresponding to the write capacities under different write capacities to obtain the change in the transmission rate bh; Traverse and increase x2 within its value range [0, drl], and calculate the change value bh of the transmission rate at the same time. When bh increases continuously, x2 stops increasing; Set the value of x1 to x2, and traverse and decrease it within its value range [0, x2]. When tsl(x1) remains stable, obtain the corresponding write capacity and the transmission rate change threshold mx. Calculate the transmission stability value Swd based on the transmission rate change threshold mx and the maximum capacity drl of the upgraded storage hardware device; 7. The upgrade test method of a storage hardware device according to claim 4, characterized in that: The specific steps of step S213 are as follows: Perform command operations on the upgraded storage hardware device and write data to the storage hardware device, the data size is DX; obtain the time ft when the command is issued and the time wt when the command is completed; Obtain the transfer rate dsl of the upgraded storage hardware device and combine it with the data size DX of the written data; calculate the time it takes to write the data to obtain the instruction execution time yys; According to the time ft when the instruction is issued and the time wt when the instruction is completed, the actual time sys when the instruction is executed is obtained; sys = wt-ft; The difference between the command execution time and the actual execution time is calculated to obtain the response time dxy of the upgraded storage hardware device; dxy = sys - yys; The upgraded storage hardware device performs dg instruction operations to obtain the response time dxy(g). The mode of the response time dxy(g) is obtained as the reference value ck. The response time dxy(g) is combined with the reference value to make a judgment. Get the normal error range tt of the response time; If ck = dxy(g), it indicates that the response time dxy(g) is normal; If ck≠dxy(g) and |ck-dxy(g)|>tt, it indicates that the response time dxy(g) is abnormal. The number of abnormal response times xyc is counted. According to the number of response time anomalies xyc and the number of instruction operations dg, the response stability value of the storage hardware device is calculated to obtain the response stability value Xwd; 8. The upgrade test method of a storage hardware device according to claim 1, characterized in that: The specific steps of step S3 are as follows: Step S31: obtaining the maximum capacity rl of the original storage hardware device and the maximum capacity drl of the upgraded storage hardware device, and calculating an increased value Rts of the maximum capacity of the storage hardware device; Judge Rts: If the upgrade value Rts is less than 0, the upgrade reduces the maximum capacity of the storage hardware device and the upgrade is excluded; If the upgrade value Rts ≥ 0, the upgrade increases the maximum capacity of the storage hardware device; Step S32: obtaining the transmission rate sl of the original storage hardware device and the transmission rate dsl of the upgraded storage hardware device, and calculating the improved value Sts of the transmission rate of the storage hardware device; Make judgment on Sts: If the upgrade value Sts is less than 0, the upgrade will reduce the transmission rate of the storage hardware device, so the upgrade is excluded. If the upgrade value Sts ≥ 0, the upgrade will increase the transmission rate of the storage hardware device; Step S33: Obtain the response time xy of the original storage hardware device and the response time dxy of the upgraded storage hardware device, and calculate the improvement value Xts of the response time of the storage hardware device; Judge Xts: If the improvement value Xts is less than 0, the upgrade will increase the response time of the storage hardware device, so the upgrade should be excluded. If the improvement value Xts ≥ 0, the upgrade reduces the response time of the storage hardware device and improves the response speed.

9. An electronic device, characterized in that: The method comprises a processor and a memory, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the steps in the method according to any one of claims 1 to 8 are executed.

10. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are executed.

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