Server Project Testing Methods and Electronic Equipment

Abstract

This application discloses a server project testing method and electronic device, relating to the field of server testing technology, including: determining multiple test projects for a type of server; determining the type of a shared testing platform to divide each test project into a corresponding test project cluster; finding the intersection according to the type of the shared testing platform to obtain multiple intersection categories; filtering each test project cluster according to the multiple intersection categories to obtain the intersection of each test project; testing any target test project in any test project intersection to obtain a target test result; determining the target test result as the target test result for the remaining target test projects; determining each target test result in the intersection of each test project; testing the remaining test projects in the multiple test projects to obtain each test result; and integrating each target test result and each test result into a test result for the type of server, thereby improving the testing efficiency of the server project.

Description

Technical Field

[0001] This application relates to the field of server testing technology, and in particular to a server project testing method and electronic device. Background Technology

[0002] Server project testing, as a crucial stage in building reliable computing infrastructure, involves systematically testing the entire process of verifying whether various server metrics meet standards, covering core dimensions such as functionality, performance, and security. Server testing is primarily used for basic functional checks, stress testing, and disaster recovery capability verification. Its test results provide a scientific basis for server deployment optimization and operation and maintenance decisions, ensuring that servers operate reliably, efficiently, and securely in real business scenarios.

[0003] Current server project testing methods in related technologies require acquiring multiple test items on the server platform, testing each test item one by one, obtaining corresponding test results, and determining the final test result based on these results. However, this method of obtaining test results by testing each test item sequentially can lead to low testing efficiency when dealing with a large number of test items. Summary of the Invention

[0004] This application provides a server project testing method and electronic device to at least solve the problem in related technologies where the detection method of obtaining test results by testing each test item sequentially results in low efficiency when faced with a large number of test items.

[0005] This application provides a server project testing method, including:

[0006] Identify multiple test items for any type of server, where each test item includes test information for multiple servers corresponding to that type of server, and each test item includes the test platform identifier for the corresponding server;

[0007] Identify the test items that belong to the shared test platform across multiple test projects;

[0008] Determine the type of shared testing platform;

[0009] Test projects that share the same type of testing platform are divided into test project clusters corresponding to the type of the shared testing platform, resulting in multiple test project clusters.

[0010] The intersection is calculated based on the type of shared testing platform, resulting in multiple intersection categories.

[0011] Each test item cluster is filtered based on multiple intersection categories to obtain the test item intersection corresponding to each intersection category;

[0012] Extract multiple target test items from the intersection of any test items;

[0013] Test any target test item and obtain the corresponding target test results;

[0014] The target test results are determined as the target test results for the remaining target test items;

[0015] Determine the target test results for each target test item within the intersection of all test items;

[0016] Test the remaining test items in multiple test items to obtain one or more test results;

[0017] The test results of each target and the test results of each target are integrated into the test results of the type server.

[0018] This application also provides an electronic device, including: a memory for storing a computer program; and a processor for implementing the steps of any of the above-described server project testing methods when executing the computer program.

[0019] This application also provides a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps of any of the above-described server project testing methods.

[0020] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of any of the above-described server project testing methods.

[0021] The server project testing method and electronic device provided in this application embodiment determine multiple test projects for a type of server; determine test projects belonging to a common testing platform among the multiple test projects; divide test projects of the same type on the common testing platform into corresponding multiple test project clusters; perform intersection processing according to the type of the common testing platform to obtain multiple intersection categories; filter each test project cluster according to the multiple intersection categories to obtain the intersection of each test project; extract multiple target test projects from any test project intersection; test any target test project to obtain the corresponding target test result; determine the target test result as the target test result of the remaining target test projects; determine the target test result of each target test project in the intersection of each test project; test the remaining test projects in the multiple test projects to obtain each test result; and integrate each target test result and each test result into a test result for the type of server. This eliminates the need for repeated testing of each test project in the intersection of each test project, thus improving the testing efficiency of server projects. Attached Figure Description

[0022] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram illustrating an application scenario of the server project testing method provided in the embodiments of this application;

[0024] Figure 2 A flowchart illustrating the server project testing method provided in this application embodiment. Figure 1 ;

[0025] Figure 3 A flowchart illustrating the server project testing method provided in this application embodiment. Figure 2 ;

[0026] Figure 4 This is a schematic diagram of the server project testing device provided in the embodiments of this application;

[0027] Figure 5 This is a schematic diagram of the hardware structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0028] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0029] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.

[0030] Server project testing, as a crucial stage in building reliable computing infrastructure, systematically verifies whether various server metrics meet standards throughout the entire process, covering core dimensions such as functionality, performance, and security. Server testing is primarily used for basic functional checks, stress testing, and disaster recovery capability verification. Its results provide a scientific basis for server deployment optimization and operational decisions, ensuring the server operates reliably, efficiently, and securely in real-world business scenarios. Current server project testing methods require acquiring multiple test items on the server platform and testing each item individually to obtain corresponding test results, then determining the final test result based on these results. However, this method of sequentially testing each item to obtain its result can lead to low efficiency when dealing with a large number of test items.

[0031] To address the aforementioned technical problems, this application proposes the following technical concept: Considering multiple test items for a type server, the inventors divide these test items according to the type of the shared test platform, resulting in multiple test item clusters. The obtained intersection categories are used to filter these clusters, yielding the intersection of each test item. Multiple target test items are extracted from any intersection of test items to obtain the corresponding target test results. These target test results are then used as the target test results for the remaining target test items. The target test results for each target test item in the intersection of all test items are determined. The remaining test items are tested to obtain the test results. Finally, the target test results and the test results are integrated into the test results for the type server. This eliminates the need for repeated testing of each test item in the intersection of all test items, thus improving the testing efficiency of the server project.

[0032] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0033] This section describes the specific application environment architecture or hardware architecture upon which the server project testing method depends. (References) Figure 1 , Figure 1 This is a schematic diagram illustrating an application scenario of the server project testing method provided in the embodiments of this application.

[0034] like Figure 1 As shown, the application scenarios of this server project testing method include: type server 101 and electronic device 102.

[0035] Type 101 server can be a single server or a cluster of multiple servers.

[0036] Electronic device 102 can be a test center or other equipment.

[0037] Electronic device 102 identifies multiple test items for any type of server 101; identifies test items belonging to a shared test platform among the multiple test items; determines the type of the shared test platform; assigns test items of the same shared test platform type to test item clusters corresponding to the shared test platform type, resulting in multiple test item clusters; performs intersection processing according to the shared test platform type, resulting in multiple intersection categories; filters each test item cluster based on the multiple intersection categories, resulting in test item intersections corresponding to each intersection category; extracts multiple target test items from any test item intersection; tests any target test item, obtaining the corresponding target test result; determines the target test result as the target test result for the remaining target test items; determines the target test result for each target test item in the intersection of all test items; tests the remaining test items among the multiple test items, obtaining one or more test results; and integrates each target test result and each test result into a test result for type server 101.

[0038] Figure 2 A flowchart illustrating the server project testing method provided in this application embodiment. Figure 1 ,like Figure 2 As shown, an embodiment of this application provides a server project testing method, which is described in detail below:

[0039] S201: Identify multiple test items for any type of server, wherein each test item includes test information for multiple servers corresponding to the type of server, and each test item includes the test platform identifier of the corresponding server.

[0040] In this embodiment, the type server can be a high-performance server or other types of servers.

[0041] For example, the multiple test items are P1, P2, P3, P4, P5, P6, P7, P8, P9 and P10.

[0042] The test platform identifier is used to indicate the model and type of the corresponding test platform.

[0043] S202: Identify test items that belong to a shared test platform among multiple test items.

[0044] For example, P1 and P2 share a 1U motherboard platform, P3 and P4 share a 2U motherboard platform, and P5 and P6 share a single-channel motherboard platform; P1, P2, P3, and P4 share a baseboard management controller code platform; and P1, P2, P5, and P6 share a basic input / output system code platform.

[0045] S203: Determine the type of shared test platform.

[0046] In this embodiment, the type of shared test platform includes one or more of the following: server motherboard platform, baseboard management controller code platform, and basic input / output system code platform.

[0047] For example, the server 1U motherboard platform, server 2U motherboard platform and server single-socket motherboard platform are identified as server motherboard platforms, and other common test platforms are identified as baseboard management controller code platforms and basic input / output system code platforms.

[0048] S204: Test projects that share the same test platform type are divided into test project clusters corresponding to the type of the shared test platform, resulting in multiple test project clusters.

[0049] In this embodiment, the types of shared test platforms are server motherboard platform, baseboard management controller code platform and basic input / output system code platform; accordingly, step S204 specifically includes: dividing the test items of the shared test platforms of the same type into test item clusters corresponding to the type of the shared test platform, resulting in multiple test item clusters, namely the test item cluster corresponding to the server motherboard platform, the test item cluster corresponding to the baseboard management controller code platform and the test item cluster corresponding to the basic input / output system code platform.

[0050] For example, P1, P2, P3, P4, P5 and P6 are identified as the test project cluster corresponding to the server motherboard platform; P1, P2, P3 and P4 are identified as the test project cluster corresponding to the baseboard management controller code platform; P1, P2, P5 and P6 are identified as the test project cluster corresponding to the basic input / output system code platform.

[0051] S205: Perform intersection processing according to the type of shared test platform to obtain multiple intersection categories.

[0052] Specifically, step S205 includes:

[0053] S2051: Obtain the code corresponding to the type of the shared test platform.

[0054] In this embodiment, the types of shared test platforms include server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; correspondingly, step S2051 specifically includes: obtaining the codes corresponding to the server motherboard platforms, the baseboard management controller code platforms, and the basic input / output system code platforms.

[0055] For example, the code corresponding to the server motherboard platform is A, the code corresponding to the baseboard management controller code platform is B, and the code corresponding to the basic input / output system code platform is C.

[0056] S2052: Perform intersection processing based on the encoding corresponding to the type of the shared test platform to obtain multiple intersection categories.

[0057] In this embodiment, the multiple intersection categories include the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform and the basic input / output system code platform. Accordingly, step S2052 specifically includes: performing intersection processing based on the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform and the code corresponding to the basic input / output system code platform to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform and the basic input / output system code platform.

[0058] For example, by performing intersection processing based on the codes corresponding to the server motherboard platform, the baseboard management controller code platform, and the basic input / output system code platform, the intersection of the server motherboard platform and the baseboard management controller code platform is obtained as A∩B, the intersection of the baseboard management controller code platform and the basic input / output system code platform is obtained as B∩C, the intersection of the server motherboard platform and the basic input / output system code platform is obtained as A∩C, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input / output system code platform is obtained as A∩B∩C.

[0059] Specifically, step S205 further includes: performing intersection processing according to the type and preset level of the shared test platform until no intersection can be found, resulting in multiple intersection categories.

[0060] In this embodiment, the preset hierarchy is a hierarchy based on the number of combinations from smallest to largest.

[0061] For example, according to the server motherboard platform A, the baseboard management controller code platform B, the basic input / output system code platform C and the preset hierarchy, the intersection between each pair of platforms is first calculated, then the intersection between the three platforms is calculated, until no intersection can be found, resulting in multiple intersection categories A∩B, B∩C, A∩C and A∩B∩C.

[0062] S206: Filter each test item cluster based on multiple intersection categories to obtain the test item intersection corresponding to each intersection category.

[0063] For example, based on S204, each test item cluster is filtered according to A∩B to obtain the test item intersections corresponding to each intersection category as P1, P2, P3 and P4; each test item cluster is filtered according to B∩C to obtain the test item intersections corresponding to each intersection category as P1 and P2; each test item cluster is filtered according to A∩C to obtain the test item intersections corresponding to each intersection category as P1, P2, P5 and P6.

[0064] S207: Extract multiple target test items from the intersection of any test items.

[0065] For example, multiple target test items are extracted from the intersection of test items corresponding to A∩B as P1, P2, P3 and P4.

[0066] S208: Test any target test item and obtain the corresponding target test result.

[0067] For example, any target test item P1 is tested to obtain the corresponding target test result.

[0068] S209: The target test result is determined as the target test result for the remaining target test items.

[0069] For example, the target test results are defined as target test results P2, P3, and P4.

[0070] S210: Determine the target test results for each target test item in the intersection of all test items.

[0071] For example, following the examples of steps S207 to S209, the target test results of each target test item in the intersection of the test items corresponding to A∩B, B∩C, A∩C, and A∩B∩C are determined.

[0072] S211: Test the remaining test items in a plurality of test items to obtain one or more test results.

[0073] For example, tests are performed on multiple test items, excluding the intersection of the test items, for the remaining test items P7, P8, P9 and P10, to obtain multiple test results.

[0074] S212: Combine the test results of each target and each test result into the test results of the type server.

[0075] In addition, the method for determining the test results of the type server can also be steps a~d:

[0076] Step a: Obtain the server model of the type server.

[0077] Step b: Locate the corresponding reference server information based on the server model.

[0078] For example, the corresponding reference server information is searched in a structured database based on the server model.

[0079] Step c: Obtain the reference test results corresponding to the reference server information.

[0080] Specifically, step c includes:

[0081] Step c1: Determine each test platform in the corresponding reference server based on the reference server information.

[0082] Taking any test platform, namely the baseboard management controller code platform, as an example, the baseboard management controller code platform of the corresponding reference server is determined according to the reference server information.

[0083] Step c2: Obtain the software test results from each test platform and determine each software test result as the reference test result.

[0084] For example, the software test results in the baseboard management controller code platform are obtained, and the corresponding software test results are determined as reference test results.

[0085] The software test results can be program error data that has been executed and submitted with the same test cases, or other test outputs.

[0086] Step d: Determine the reference test results as the test results for the type server.

[0087] In summary, the server project testing method provided in this embodiment improves server project testing efficiency and shortens the server development cycle by: identifying multiple test projects for a server type; identifying test projects belonging to a shared testing platform among the multiple test projects; dividing test projects of the same type within the shared testing platform into corresponding test project clusters; performing intersection processing according to the type of the shared testing platform to obtain multiple intersection categories; filtering each test project cluster based on the multiple intersection categories to obtain the intersection of each test project; extracting multiple target test projects from any test project intersection; testing any target test project to obtain the corresponding target test result; determining the target test result as the target test result for the remaining target test projects; determining the target test results for each target test project in the intersection of each test project; testing the remaining test projects among the multiple test projects to obtain each test result; and integrating each target test result and each test result into a test result for the server type. This eliminates the need for repeated testing of each test project in the intersection of each test project, thus improving server project testing efficiency and shortening the server development cycle.

[0088] In addition, the server project testing method provided in this embodiment improves the testing efficiency of server projects by obtaining the server model of the type server; finding the corresponding reference server information based on the server model; obtaining the reference test results corresponding to the reference server information; and determining the reference test results as the test results of the type server.

[0089] Figure 3 A flowchart illustrating the server project testing method provided in this application embodiment. Figure 2 In the embodiments of this application, in Figure 2 Based on the provided embodiments, a detailed explanation is given of the specific implementation method for testing any target test item in step S208 to obtain the corresponding target test result. For example... Figure 3 As shown, the testing methods for this server project include:

[0090] S301: Obtain server component information in the test project.

[0091] S302: Determine the corresponding server components based on the server component information for each test.

[0092] In this embodiment, each server component may be a central processing unit, memory, network card, hard disk, and other server components.

[0093] S303: Perform tests on each server component and obtain the test results for each server component.

[0094] Specifically, step S303 includes:

[0095] S3031: Obtain multiple sub-test items corresponding to each server component.

[0096] In this embodiment, the multiple sub-test items include one or more of the following: performance test items, stress test items, stability test items, functional test items, location information identification items, and bandwidth identification items.

[0097] S3032: Based on multiple sub-test items, perform test processing on each server component to obtain the test results of each server component.

[0098] Specifically, based on multiple sub-test items, each server component is tested and processed to obtain the test results for each server component, including performance test results, stress test results, stability test results, functional test results, location information identification results, and bandwidth identification results.

[0099] Furthermore, if a test item in S301 belongs to the intersection of test items corresponding to A∩B∩C, then other test items belonging to the same test item intersection can use the performance test results, stress test results, stability test results, functional test results, location information identification results, and bandwidth identification results corresponding to each server component of that test item.

[0100] Furthermore, if the test item in S301 belongs to the intersection of test items corresponding to A∩B or the intersection of test items corresponding to A∩C, then other test items belonging to the same test item intersection can use the performance test results, stress test results, stability test results, and functional test results corresponding to each server component of the test item, but the location information identification item and bandwidth identification item corresponding to each server component need to be executed separately.

[0101] Furthermore, if the test item in S301 belongs to the intersection of the test items corresponding to B∩C, then other test items belonging to the same test item intersection can use the location information identification results and bandwidth identification results of each server component corresponding to the test item, but the performance test items, stress test items, stability test items and functional test items corresponding to each server component need to be executed separately.

[0102] S304: Determine the target test results for the test items based on the test results of each server component.

[0103] In summary, the server project testing method provided in this embodiment improves the comprehensiveness of server project testing by obtaining server component information in the test project; determining the corresponding server components based on the server component information; performing test processing on each server component to obtain the test results of each server component; and determining the target test results of the test project based on the test results of each server component.

[0104] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method.

[0105] Figure 4 This is a schematic diagram of the server project testing device provided in an embodiment of this application. Figure 4 As shown, embodiments of this application also provide a server project testing device, including: a first determining module 401, a second determining module 402, a third determining module 403, a dividing module 404, a processing module 405, a filtering module 406, an extraction module 407, a first testing module 408, a fourth determining module 409, a fifth determining module 410, a second testing module 411, and an integration module 412.

[0106] The first determining module 401 is used to determine multiple test items for any type of server, wherein each test item includes test information for multiple servers corresponding to the type of server, and each test item includes the test platform identifier of the corresponding server.

[0107] The second determining module 402 is used to determine the test items that belong to the common test platform among multiple test items;

[0108] The third determining module 403 is used to determine the type of the shared test platform;

[0109] The partitioning module 404 is used to partition test projects of the same type that share a common test platform into test project clusters corresponding to the type of the common test platform, thereby obtaining multiple test project clusters.

[0110] Processing module 405 is used to perform intersection processing according to the type of the shared test platform to obtain multiple intersection categories;

[0111] The filtering module 406 is used to filter each test item cluster according to multiple intersection categories to obtain the test item intersection corresponding to each intersection category;

[0112] Extraction module 407 is used to extract multiple target test items from the intersection of any test items;

[0113] The first test module 408 is used to test any target test item and obtain the corresponding target test result;

[0114] The fourth determination module 409 is used to determine the target test result as the target test result of the remaining target test items;

[0115] The fifth determination module 410 is used to determine the target test results of each target test item in the intersection of each test item;

[0116] The second test module 411 is used to test the remaining test items in multiple test items and obtain one or more test results;

[0117] Integration module 412 is used to integrate the test results of each target and each test result into the test results of the type server.

[0118] In one possible implementation, the common test platform is of the type of server motherboard platform, baseboard management controller code platform, and basic input / output system code platform; accordingly, the partitioning module 404 is specifically used to: partition the test items of the common test platform of the same type into test item clusters corresponding to the type of the common test platform, thereby obtaining multiple test item clusters, namely the test item cluster corresponding to the server motherboard platform, the test item cluster corresponding to the baseboard management controller code platform, and the test item cluster corresponding to the basic input / output system code platform.

[0119] In one possible implementation, processing module 405 specifically includes:

[0120] The acquisition unit is used to obtain the code corresponding to the type of the shared test platform.

[0121] The processing unit is used to perform intersection processing based on the encoding corresponding to the type of the shared test platform to obtain multiple intersection categories.

[0122] In one possible implementation, the types of the shared test platform include a server motherboard platform, a baseboard management controller code platform, and a basic input / output system code platform; correspondingly, the acquisition unit is specifically used to: acquire the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform.

[0123] In one possible implementation, the multiple intersection categories include the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input / output system code platform; correspondingly, the processing unit is specifically used to: perform intersection processing based on the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform, and the basic input / output system code platform.

[0124] In one possible implementation, the processing module 405 is specifically used to: perform intersection processing according to the type and preset level of the shared test platform until no intersection can be found, and obtain multiple intersection categories.

[0125] In one possible implementation, the first test module 408 specifically includes:

[0126] The acquisition unit is used to acquire information about server components in the test project.

[0127] The first determining unit is used to determine the corresponding server components based on the server component information.

[0128] The testing unit is used to perform tests on each server component and obtain the test results for each server component.

[0129] The second determining unit is used to determine the target test results of the test items based on the test results of each server component.

[0130] In one possible implementation, the test unit specifically includes:

[0131] The acquisition unit is used to acquire multiple sub-test items corresponding to each server component;

[0132] The test unit is used to perform test processing on each server component according to multiple sub-test items and obtain the test results of each server component.

[0133] In one possible implementation, the multiple sub-test items include one or more of the following: performance test items, stress test items, stability test items, functional test items, location information identification items, and bandwidth identification items.

[0134] In one possible implementation, the device further includes:

[0135] The first acquisition module is used to acquire the server model of the type server;

[0136] The lookup module is used to find the corresponding reference server information based on the server model.

[0137] The second acquisition module is used to acquire the reference test results corresponding to the reference server information;

[0138] The sixth determination module is used to determine the reference test results as the test results for the type server.

[0139] In one possible implementation, the second acquisition module specifically includes:

[0140] The first determining unit is used to determine each test platform in the corresponding reference server based on the reference server information.

[0141] The second determining unit is used to obtain the software test results from each test platform and determine each software test result as a reference test result.

[0142] In one possible implementation, the type of shared test platform includes one or more of the following: server motherboard platform, baseboard management controller code platform, and basic input / output system code platform.

[0143] For a description of the features in the embodiment corresponding to the server project testing device, please refer to the relevant description in the embodiment corresponding to the server project testing method, which will not be repeated here.

[0144] Figure 5 A schematic diagram of the structure of the electronic device provided in this application. Figure 5 As shown, the electronic device provided in this embodiment includes at least one processor 501 and a memory 502. Optionally, the electronic device further includes a communication component 503. The processor 501, memory 502, and communication component 503 are connected via a bus.

[0145] In the specific implementation process, at least one processor 501 executes computer execution instructions stored in memory 502, causing at least one processor 501 to execute the above-described server project test method embodiment.

[0146] The specific implementation process of processor 501 can be found in the above method embodiments, and its implementation principle and technical effect are similar. It will not be repeated here.

[0147] In the above embodiments, it should be understood that the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in the application can be directly manifested as being executed by a hardware processor, or executed by a combination of hardware and software modules within the processor.

[0148] The memory may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage device.

[0149] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of illustration, the buses shown in the accompanying drawings are not limited to a single bus or a single type of bus.

[0150] Embodiments of this application also provide a computer-readable storage medium storing a computer program configured to execute the steps in any of the above-described server project testing method embodiments at runtime.

[0151] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0152] Embodiments of this application also provide a computer program product, which includes a computer program that, when executed by a processor, implements the steps in any of the above-described server project testing method embodiments.

[0153] Embodiments of this application also provide another computer program product, including a non-volatile computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in any of the above-described server project testing method embodiments.

[0154] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0155] The above provides a detailed description of a server project testing method and electronic device provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are merely for the purpose of helping to understand the method and its core ideas. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of this application.

Claims

1. A server project testing method, characterized in that, include: Multiple test items are identified for any type of server, wherein each test item includes test information for multiple servers corresponding to the server type, and each test item includes the test platform identifier of the corresponding server. Identify the test items that belong to the shared test platform among the multiple test items; Determine the type of shared testing platform; Test projects that share the same type of testing platform are divided into test project clusters corresponding to the type of the shared testing platform, resulting in multiple test project clusters. The intersection of the shared testing platforms is performed to obtain multiple intersection categories. Each test item cluster is filtered based on the multiple intersection categories to obtain the test item intersection corresponding to each intersection category; Extract multiple target test items from the intersection of any test items; Test any target test item and obtain the corresponding target test results; The target test results are determined as the target test results for the remaining target test items; Determine the target test results for each target test item within the intersection of all test items; The remaining test items in the plurality of test items are tested to obtain one or more test results; The test results of each target and the test results of each target are integrated into the test results of the server of the described type; The process of testing any target test item and obtaining the corresponding target test result includes: Obtain server component information from the test project to identify the corresponding server components; Each server component is tested to obtain the test results for each server component; The target test result for the test item is determined based on the test results of each server component.

2. The server project testing method according to claim 1, characterized in that, The types of shared test platforms mentioned above include server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; Accordingly, the test projects of the same type of shared test platform are divided into test project clusters corresponding to the type of the shared test platform, resulting in multiple test project clusters, including: For test items of the same type that share a test platform, the test items of the shared test platform are divided into test item clusters corresponding to the type of the shared test platform, resulting in multiple test item clusters, namely the test item cluster corresponding to the server motherboard platform, the test item cluster corresponding to the baseboard management controller code platform, and the test item cluster corresponding to the basic input / output system code platform.

3. The server project testing method according to claim 1, characterized in that, The intersection process, performed according to the type of the shared testing platform, yields multiple intersection categories, including: Obtain the code corresponding to the type of the shared testing platform; The intersection of the common test platform types is calculated by performing an intersection analysis on the corresponding codes to obtain multiple intersection categories.

4. The server project testing method according to claim 3, characterized in that, The types of shared test platforms mentioned above include server motherboard platforms, baseboard management controller code platforms, and basic input / output system code platforms; Accordingly, obtaining the encoding corresponding to the type of the shared testing platform includes: Obtain the code corresponding to the server motherboard platform, the code corresponding to the baseboard management controller code platform, and the code corresponding to the basic input / output system code platform.

5. The server project testing method according to claim 3, characterized in that, The aforementioned multiple intersection categories include the intersection of server motherboard platform and baseboard management controller code platform, the intersection of baseboard management controller code platform and basic input / output system code platform, the intersection of server motherboard platform and basic input / output system code platform, and the intersection of server motherboard platform, baseboard management controller code platform and basic input / output system code platform; Accordingly, the intersection processing based on the encoding corresponding to the type of the shared testing platform yields multiple intersection categories, including: The intersection of the server motherboard platform code, the baseboard management controller code platform code, and the basic input / output system code platform code is calculated to obtain the intersection of the server motherboard platform and the baseboard management controller code platform, the intersection of the baseboard management controller code platform and the basic input / output system code platform, the intersection of the server motherboard platform and the basic input / output system code platform, and the intersection of the server motherboard platform, the baseboard management controller code platform and the basic input / output system code platform.

6. The server project testing method according to claim 1, characterized in that, The intersection process, performed according to the type of the shared testing platform, yields multiple intersection categories, including: The intersection process is performed according to the type and preset level of the shared testing platform until no intersection can be found, resulting in multiple intersection categories.

7. The server project testing method according to claim 1, characterized in that, The process of testing each server component to obtain test results for each server component includes: Obtain multiple sub-test items corresponding to each server component; Based on the multiple sub-test items, each server component is tested to obtain the test results for each server component.

8. The server project testing method according to claim 7, characterized in that, The multiple sub-test items include one or more of the following: Performance testing projects, stress testing projects, stability testing projects, functional testing projects, location information identification projects, and bandwidth identification projects.

9. The server project testing method according to claim 1, characterized in that, Also includes: Obtain the server model of the server type; Find the corresponding reference server information based on the server model; Obtain the reference test results corresponding to the reference server information; The reference test results are determined as the test results for the server of that type.

10. The server project testing method according to claim 9, characterized in that, The step of obtaining the reference test results corresponding to the reference server information includes: Determine the test platforms in the corresponding reference server based on the reference server information; Obtain the software test results from each test platform, and determine each software test result as the reference test result.

11. The server project testing method according to claim 1, characterized in that, The shared test platform includes one or more of the following types: server motherboard platform, baseboard management controller code platform, and basic input / output system code platform.

12. An electronic device, characterized in that, include: Memory, used to store computer programs; A processor, configured to implement the steps of the server project testing method as described in any one of claims 1 to 11 when executing the computer program.

13. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, it implements the steps of the server project testing method as described in any one of claims 1 to 11.

14. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the server project testing method as described in any one of claims 1 to 11.

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