Component parameter determination device and method

Abstract

The invention relates to the technical field of debugging devices, and discloses a device and a method for determining component parameters, the device is used for determining component parameters of a circuit to be measured, and the device comprises an adjusting unit, a parameter measuring unit, a signal acquisition unit and a control unit, the adjusting unit comprises a driving assembly and an adjustable impedance device, and the control unit is used for obtaining a preset waveform requirement, adjusting parameters of the adjustable impedance device through the driving assembly, obtaining first waveform data in real time through the signal acquisition unit, analyzing the first waveform data, and outputting the analyzed first waveform data; and when the first waveform data meets the preset waveform requirement, a stop instruction is sent to the driving assembly so as to stop adjustment of the adjustable impedance device, finally, the adjustable impedance device and the parameter measurement unit are communicated, parameters of the adjustable impedance device are obtained through the parameter measurement unit, and optimal component parameters are obtained. By means of the mode, automatic debugging can be carried out, and accurate component parameters meeting requirements can be selected.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of debugging devices, and specifically to a component parameter determination device and a component parameter determination method. Background Art

[0002] In the development and production of electronic devices, circuit boards (such as motherboards) are core components, and the selection of their component parameters is crucial. If component parameters are selected based on theoretical calculations or empirical values, factors such as PCB routing, electromagnetic interference, and board temperature can lead to deviations between theoretical values and actual test results. However, inappropriate component parameters can lead to problems such as malfunctioning interfaces, unstable output signals, and even component damage, seriously impacting the performance and quality of electronic devices. Summary of the Invention

[0003] In view of the above problems, the embodiments of the present application provide a component parameter determination device and a component parameter determination method, which are used to solve the problem in the prior art that selecting component parameters based on theoretical calculations or empirical values will lead to deviations between theoretical values and actual test results.

[0004] According to one aspect of an embodiment of the present application, a device for determining component parameters is provided, the device being used to determine component parameters of a circuit to be measured, the device comprising: an adjustment unit, a parameter measurement unit, a signal acquisition unit and a control unit; the adjustment unit comprising a driving component and an adjustable impedance device, the driving component being connected to the adjustable impedance device, the driving component being used to adjust the parameters of the adjustable impedance device; the adjustable impedance device being electrically connected to the parameter measurement unit via a first switching unit, the adjustable impedance device being used to be electrically connected to the circuit to be measured via a second switching unit; the parameter measurement unit being used to obtain the parameters of the adjustable impedance device; the signal acquisition unit being used to be electrically connected to the circuit to be measured to collect waveform data of the circuit to be measured; the control unit being signal-connected to the parameter measurement unit, the signal acquisition unit, the first switching unit and the second switching unit respectively; the control unit being used to obtain a preset waveform requirement of the circuit to be measured, and controlling the first switching unit in response to a parameter determination instruction The unit disconnects the electrical connection between the adjustable impedance device and the parameter measurement unit, and controls the second switch unit to connect the adjustable impedance device to the circuit to be measured; the control unit is used to generate a device adjustment instruction and send the device adjustment instruction to the drive component to adjust the parameters of the adjustable impedance device through the drive component; and obtain first waveform data of the circuit to be measured in real time through the signal acquisition unit; analyze the first waveform data, generate a stop instruction when the first waveform data meets the preset waveform requirements, and send the stop instruction to the drive component to cause the drive component to stop adjusting the adjustable impedance device; the control unit is also used to control the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured when the first waveform data meets the preset waveform requirements, and control the first switch unit to connect the adjustable impedance device to the parameter measurement unit; and obtain the parameters of the adjusted adjustable impedance device through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured.

[0005] According to another aspect of an embodiment of the present application, a component parameter determination method is provided, which is applied to the above-mentioned component parameter determination device, the method comprising: obtaining a preset waveform requirement of the circuit to be measured; in response to a parameter determination instruction, controlling the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and controlling the second switch unit to connect the adjustable impedance device and the circuit to be measured; generating a device adjustment instruction, and sending the device adjustment instruction to the drive component to adjust the parameters of the adjustable impedance device through the drive component; obtaining first waveform data of the circuit to be measured in real time through the signal acquisition unit; analyzing the first waveform data and determining whether the first waveform data meets the preset waveform requirement; if the first waveform data meets the preset waveform requirement, generating a stop instruction, and sending the stop instruction to the drive component to cause the drive component to stop adjusting the adjustable impedance device; controlling the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured, and controlling the first switch unit to connect the adjustable impedance device and the parameter measurement unit; obtaining the parameters of the adjusted adjustable impedance device through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured.

[0006] The embodiment of the present application controls the second switch unit to connect the adjustable impedance device and the circuit to be measured, and selects accurate component parameters that meet the requirements through debugging by the drive component, signal acquisition unit, and parameter measurement unit. This ensures the performance and quality of the circuit board product integrated with the circuit to be measured after the user selects the component with the corresponding parameters and connects it to the circuit to be measured. Furthermore, the control unit controls the conduction or disconnection of the first and second switch units to achieve automatic debugging and parameter measurement. The user only needs to input preset waveform requirements, and the component parameter determination device automatically debugs and provides appropriate component parameters, reducing manual intervention and improving debugging accuracy. It also avoids damage to the circuit board caused by repeated disassembly and soldering of components during manual parameter adjustment, thereby improving production efficiency and reducing R&D and production costs.

[0007] The above description is only an overview of the technical solutions of the embodiments of the present application. In order to more clearly understand the technical means of the embodiments of the present application, they can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the embodiments of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] The accompanying drawings are only used to illustrate the embodiments and are not to be considered as limiting the present application. In addition, the same reference symbols are used to represent the same components throughout the drawings. In the drawings:

[0009] Figure 1 A structural block diagram of a device for determining component parameters provided by an embodiment of the present application is shown;

[0010] Figure 2 A schematic structural diagram of a device for determining component parameters provided in an embodiment of the present application is shown;

[0011] Figure 3 shows a circuit diagram of a parameter measurement unit provided in the first embodiment of the present application;

[0012] Figure 4 The following is a schematic diagram showing the structure of a data conversion module provided in an embodiment of the present application;

[0013] Figure 5 shows a circuit diagram of a parameter measurement unit provided in a second embodiment of the present application;

[0014] Figure 6 shows a circuit diagram of a parameter measurement unit provided in a third embodiment of the present application;

[0015] Figure 7 A circuit diagram of a circuit protection unit provided in an embodiment of the present application is shown;

[0016] Figure 8 A schematic diagram showing a flow chart of a component parameter determination method provided in an embodiment of the present application is shown;

[0017] Figure 9 A schematic structural diagram of an electronic device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0018] The exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application can be implemented in various forms and should not be limited to the embodiments set forth herein.

[0019] In electronic circuit design, theoretical calculations are typically based on ideal models (such as lossless conductors, interference-free environments, and constant temperature conditions). However, the actual operating environment of circuit boards is complex and is affected by multiple factors, including physical implementation, electromagnetic environment, and thermodynamic effects. This can lead to deviations between theoretical values and measured results. For example, in an AC circuit, the circuit's impedance determines the relationship between voltage and current, power distribution, frequency response, and signal transmission efficiency. Impedance refers to a comprehensive measure of the AC resistance in the circuit, encompassing not only the obstructive effect of resistance but also the dynamic effects of inductance and capacitance on AC. If the parameters of components such as resistance, capacitance, and inductance are determined through theoretical calculations, the actual circuit output current waveform will differ significantly from the expected value.

[0020] Although components can be soldered to the circuit board using a soldering iron, hot air gun, or soldering station, and the component parameters can be determined by manually adjusting the parameters, this process requires repeated disassembly and soldering of the components. This is not only cumbersome, time-consuming, and labor-intensive, but multiple high-temperature soldering operations can easily cause irreversible damage to the circuit board, increasing R&D costs.

[0021] Based on this, in order to accurately determine the parameters of components, the present application provides a component parameter determination device, which includes an adjustment unit, a parameter measurement unit, a signal acquisition unit, and a control unit. The adjustment unit includes a connected driving component and an adjustable impedance device, so that the parameters of the adjustable impedance device are adjusted by the driving component. When determining the component parameters of the circuit to be measured, the control unit first connects the adjustable impedance device to the circuit to be measured, that is, connects the adjustable impedance device to the actual access point in the circuit to be measured, so that the adjustment result is closer to the actual test result.

[0022] Then, the control device controls the driving component to adjust the parameters of the adjustable impedance device while obtaining the output waveform of the circuit to be measured through the signal acquisition unit. When the output waveform of the circuit to be measured meets the expected value, the driving component is controlled to stop adjusting the adjustable impedance device. This can realize the automation of circuit debugging, reduce human intervention, and improve the accuracy of debugging results. Finally, the adjustable impedance device is connected to the parameter measurement unit, and the parameters of the adjusted adjustable impedance device are determined by the parameter measurement unit to obtain the component parameters of the circuit to be measured. The component parameter determination device can realize the full process automation of circuit debugging and component parameter determination. The user only needs to input the final desired output state of the circuit to be measured, and the component parameter determination device can automatically adjust and give the appropriate component parameters. The operation is simple and convenient.

[0023] According to one aspect of the embodiments of the present application, a device for determining component parameters is provided, such as Figure 1 As shown, Figure 1 The structure of a device for determining component parameters is shown. The device is used to determine the component parameters of a circuit to be measured 10. The device includes an adjustment unit 20, a parameter measurement unit 30, a signal acquisition unit 40, and a control unit 50. The adjustment unit 20 includes a driving component 21 and an adjustable impedance device 22. The driving component 21 is connected to the adjustable impedance device 22 and is used to adjust the parameters of the adjustable impedance device 22. The adjustable impedance device 22 is electrically connected to the parameter measurement unit 30 via a first switch unit 60. The adjustable impedance device 22 is electrically connected to the circuit to be measured 10 via a second switch unit 70. The parameter measurement unit 30 is used to obtain the parameters of the adjustable impedance device 22. The signal acquisition unit 40 is used to electrically connect to the circuit to be measured 10 to collect waveform data of the circuit to be measured 10.

[0024] The control unit 50 is signal-connected to the parameter measurement unit 30, the signal acquisition unit 40, the first switch unit 60, and the second switch unit 70, respectively. The control unit 50 is used to obtain the preset waveform requirements of the circuit to be measured 10, and in response to the parameter determination instruction, control the first switch unit 60 to disconnect the electrical connection between the adjustable impedance device 22 and the parameter measurement unit 30, and control the second switch unit 70 to connect the adjustable impedance device 22 and the circuit to be measured 10.

[0025] The control unit 50 is used to generate a device adjustment instruction and send the device adjustment instruction to the driving component 21 so as to adjust the parameters of the adjustable impedance device 22 through the driving component 21; and obtain the first waveform data of the circuit to be measured 10 in real time through the signal acquisition unit 40, analyze the first waveform data, generate a stop instruction when the first waveform data meets the preset waveform requirements, and send the stop instruction to the driving component 21 so that the driving component 21 stops adjusting the adjustable impedance device 22.

[0026] The control unit 50 is also used to control the second switch unit 70 to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10 when the first waveform data meets the preset waveform requirements, and control the first switch unit 60 to connect the adjustable impedance device 22 and the parameter measurement unit 30, and obtain the adjusted parameters of the adjustable impedance device 22 through the parameter measurement unit 30 to obtain the optimal component parameters of the circuit to be measured 10.

[0027] The circuit to be measured 10 is a circuit that needs to be debugged during the research and development and production of electronic equipment. It can be a circuit on various circuit boards such as the main board and power board. During the research and development and production process, various components (including resistors, capacitors, and inductors) need to be connected to the circuit to be debugged. Through debugging, accurate component parameters that meet the requirements are selected so that the user can select components with corresponding parameters to be connected to the circuit to be measured 10, thereby ensuring the performance and quality of the circuit board product with the circuit to be measured 10.

[0028] The control unit 50 is the main control unit of the component parameter determination device. It can be a main control chip such as a controller, a central processing unit (CPU), or an application-specific integrated circuit (ASIC), or it can be an electronic device such as a mobile phone, tablet, or computer. The control unit 50 is connected to the parameter measurement unit 30, the signal acquisition unit 40, and the first and second switch units 60 and 70 via signals, and is responsible for the control, calculation, display, and communication of the entire component parameter determination device.

[0029] Specifically, a wireless signal channel can be established between the control unit 50 and the parameter measurement unit 30, the signal acquisition unit 40, the first switch unit 60, and the second switch unit 70 via Bluetooth, WIFI, or the like, or they can be connected via wires. When the control unit 50 is a chip and is integrated with the parameter measurement unit 30, the signal acquisition unit 40, the first switch unit 60, and the second switch unit 70 on the circuit board 1, signal connection can also be achieved via PCB wiring.

[0030] Components are the fundamental units that make up circuit functionality, such as resistors, capacitors, inductors, and relays. Component parameters are a set of technical specifications that describe a component's electrical and physical characteristics, performance metrics, and operating conditions. These parameters determine how a component behaves within a circuit and are the core basis for component selection during circuit design.

[0031] The adjustable impedance device 22 refers to an electronic component whose impedance value (i.e., the parameter of the component, such as the resistance value of a resistor, the capacitance value of a capacitor, the inductance value of an inductor, etc.) can be dynamically adjusted by mechanical adjustment, such as an adjustable resistor, an adjustable capacitor, an adjustable inductor, etc. Specifically, as Figure 2 As shown, Figure 2 The schematic diagram of the structure of the component parameter determination device is shown. The adjustable impedance device 22 has an adjustment part 23. After the adjustable impedance device 22 is connected to the circuit, the parameters of the adjustable impedance device 22 can be changed by rotating the adjustment part 23. Taking a 1kΩ adjustable resistor as an example, the resistance of the adjustable resistor can be changed by rotating the adjustment part 23. If the effective stroke of the adjustment part 23 is 30 turns, then the resistance of the adjustable resistor can be increased or decreased by 33.3Ω by rotating the adjustment part 23 one turn.

[0032] The driving component 21 can be a stepper motor, a servo motor, a torque motor, etc. The output end of the driving component 21 is connected to the adjusting portion 23 of the adjustable impedance device 22, so that the parameters of the adjustable impedance device 22 can be adjusted by driving the adjusting portion 23 to rotate through the driving component 21. Taking the driving component 21 as a 0.9-degree stepper motor as an example, each step of the stepper motor can drive the adjusting portion 23 to rotate 0.9 degrees. If the maximum resistance of the adjustable impedance device 22 is 1kΩ, the resistance of the adjustable impedance device 22 changes by 1000 / 30 / 360×0.9=0.083Ω, which can achieve precise adjustment and improve the accuracy of debugging. Specifically, if Figure 2 As shown, the driving component 21 and the adjustable impedance device 22 can be connected through the adjustment rod 24, and the driving component 21 is controlled to rotate by the control unit 50, thereby driving the adjustment part 23 of the adjustable impedance device 22 to rotate, so that the parameters of the adjustable impedance device 22 change accordingly.

[0033] The first switch unit 60 is used to control the connection or disconnection between the adjustable impedance device 22 and the circuit to be measured 10, and the second switch unit 70 is used to control the connection or disconnection between the adjustable impedance device 22 and the parameter measurement unit 30. The first switch unit 60 and the second switch unit 70 can be composed of switching devices such as relays, data logic switches, and power electronic switches.

[0034] Specifically, the control unit 50 controls the first switch unit 60 to connect the adjustable impedance device 22 and the circuit to be measured 10. The adjustable impedance device 22 can be connected to the position where the corresponding device should actually be connected on the circuit to be measured 10, so as to select the component parameters that meet the requirements by debugging the parameters of the adjustable impedance device 22. After debugging is completed, the control unit 50 controls the second switch unit 70 to connect the adjustable impedance device 22 and the parameter measurement unit 30, so that the parameters of the adjustable impedance device 22 can be measured by the parameter measurement unit 30. The parameters of the component that should actually be connected to the circuit to be measured 10 can be selected based on the parameters of the adjustable impedance device 22. The parameter measurement unit 30 can be a measuring device such as an ammeter, a voltmeter, or a multimeter, or a corresponding measurement circuit can be designed according to the characteristics of the adjustable impedance device 22 to form the parameter measurement unit 30.

[0035] The signal acquisition unit 40 is controlled by the control unit 50 through instructions and reads data information to accurately measure the waveform data output by the circuit to be measured 10. The signal acquisition unit 40 can be an oscilloscope, etc. Specifically, the control unit 50 can realize coordinated debugging with the signal acquisition unit 40 through a USB interface and the Python programming language, sending protocol instructions to the signal acquisition unit 40 to read the waveform data (such as frequency and amplitude) output by the circuit to be measured. In addition, when the signal acquisition unit 40 is an oscilloscope, it can also be controlled to display the waveform output by the circuit to be measured 10 on the oscilloscope, achieving visual debugging.

[0036] Specifically, when determining the component parameters of the circuit to be measured 10, the component parameter determination device is connected to the debugging point of the circuit to be measured 10, which is the actual access point of the corresponding device. Specifically, the component parameter determination device can be connected to the circuit to be measured 10 through the wire 2, that is, the second switch unit 70 is connected to the circuit to be measured 10, so as to connect the adjustable impedance device 22 and the circuit to be measured 10 through the second switch unit 70, or disconnect the connection between the adjustable impedance device 22 and the circuit to be measured 10 through the second switch unit 70.

[0037] Then, the signal acquisition unit 40 is connected to the signal output terminal of the circuit to be measured 10 to monitor the signal of the circuit to be measured 10 (i.e., the waveform data output by the circuit to be measured 10) in real time. The signal acquisition unit 40 also receives control instructions from the control unit 50 to send the collected waveform data to the control unit 50. Specifically, the signal acquisition unit 40 and the control unit 50 can be connected via a USB interface.

[0038] Next, the control unit 50 obtains the final desired adjustment state (i.e., the preset waveform requirement), for example, outputting a voltage of 3.3V with a ripple less than 30mV; in response to the parameter determination instruction, the first switch unit 60 is controlled to disconnect the electrical connection between the adjustable impedance device 22 and the parameter measurement unit 30, and the second switch unit 70 is controlled to connect the adjustable impedance device 22 and the circuit to be measured 10.

[0039] During debugging, the control unit 50 generates a device adjustment instruction to control the driving component 21 to adjust the parameters of the adjustable impedance device 22. At the same time, during the adjustment process, the waveform data output by the circuit to be measured 10 is obtained through the signal acquisition unit 40, and the obtained waveform data is compared with the preset waveform requirements until the circuit to be measured 10 outputs waveform data that meets the preset waveform requirements. The debugging process is completed and a stop instruction is generated to control the driving component 21 to stop adjusting the adjustable impedance device 22 and fix the parameters of the adjustable impedance device 22.

[0040] When controlling the driver component 21 to adjust the adjustable impedance device 22, to increase the debugging speed, the adjustable impedance device 22 can be coarsely adjusted using a first preset step size with a larger value. When the waveform data output by the circuit to be measured 10 is close to the preset waveform requirement, the adjustable impedance device 22 can be finely adjusted using a second preset step size with a smaller value. Furthermore, during the adjustment process, if the waveform data output by the circuit to be measured 10 exceeds the preset waveform data, the driver component 21 can be controlled to reversely adjust the adjustable impedance device 22.

[0041] Finally, the second switch unit 70 is controlled to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10, and the first switch unit 60 is controlled to connect the adjustable impedance device 22 and the parameter measurement unit 30. The parameters of the adjustable impedance device at this time are obtained through the parameter measurement unit 30, so that the optimal component parameters of the circuit to be measured can be obtained. That is, the device corresponding to the optimal component parameters is connected to the corresponding position of the circuit to be measured 10, and the circuit to be measured 10 can output waveform data that meets the preset waveform requirements.

[0042] In the above embodiment, by controlling the second switch unit 70 to connect the adjustable impedance device 22 and the circuit to be measured 10, and debugging and selecting the required, accurate component parameters through the driver assembly 21, signal acquisition unit 40, and parameter measurement unit 30, the performance and quality of the circuit board product integrated with the circuit to be measured 10 can be ensured after the user selects the component with the corresponding parameters and connects it to the circuit to be measured 10. In addition, the control unit 50 controls the conduction or disconnection of the first switch unit 60 and the second switch unit 70 to achieve automatic debugging and parameter measurement. The user only needs to input the preset waveform requirements, and the component parameter determination device automatically debugs and determines the appropriate component parameters. This reduces manual intervention, improves debugging accuracy, and avoids damage to the circuit board caused by repeated disassembly and soldering of components during manual parameter adjustment, thereby improving production efficiency and reducing R&D and production costs.

[0043] Furthermore, in order to accurately measure the resistance of the adjustable impedance device, in some embodiments, as Figure 3 and Figure 4 As shown, Figure 3 FIG. 4 shows the circuit structure of the parameter measurement unit provided by the first embodiment. Figure 4 The structure of the data conversion module is shown. The adjustable impedance device 22 is an adjustable resistor RX1. The first switch unit 60 includes a first switch RLY1. The parameter measurement unit 30 includes a first voltage-dividing resistor RREF1, an operational amplifier module 31 and a data conversion module 32. One end of the first switch RLY1 is electrically connected to the first voltage-dividing resistor RREF1, and the other end of the first switch RLY1 is electrically connected to the adjustable resistor RX1 and the input end of the operational amplifier module 31 respectively. The output end of the operational amplifier module 31 is electrically connected to the first input end AIN0 of the data conversion module 32. The data conversion module 32 is signal-connected to the control unit 50.

[0044] The control unit 50 is used to control the first switch RLY1 to connect the first voltage-dividing resistor RREF1 and the adjustable resistor RX1 when the first waveform data meets the preset waveform requirements, obtain the voltage signal between the adjustable resistor RX1 and the first voltage-dividing resistor RREF1 through the operational amplifier module 31 and the data conversion module 32, obtain the first voltage value, and determine the parameters of the adjustable resistor RX1 based on the first voltage value and the resistance value of the first voltage-dividing resistor RREF1.

[0045] After the adjustment of the adjustable resistor RX1 is completed, the adjustable resistor RX1 needs to be connected to the parameter measurement unit 30. Specifically, this is achieved through the first switch unit 60. When adjusting the adjustable resistor RX1, the control unit 50 controls GPIO9 to output a high level and the first switch RLY1 is disconnected. When the adjustment is completed, GPIO9 is controlled to output a low level, so that the first switch RLY1 is closed, and the adjustable resistor RX1 is connected to the parameter measurement unit 30.

[0046] The parameter measurement unit 30 corresponding to the adjustable resistor RX1 can use the principle of resistor voltage division. The first voltage-dividing resistor RREF1 and the adjustable resistor RX1 are connected in series via a first switch RLY1. The divided signal (i.e., the signal between the first voltage-dividing resistor RREF1 and the adjustable resistor RX1) is amplified by an operational amplifier module 31, then connected to a data conversion module 32 for analog-to-digital conversion. The converted data is then transmitted to the control unit. The operational amplifier module 31 can be a non-inverting / inverting amplifier, a differential amplifier, or the like.

[0047] The data conversion module 32 can be an AD chip, that is, Figure 4 In U2, AIN0-AIN3 are four sampling channels, of which the first input terminal AIN0 is electrically connected to the output terminal of the operational amplifier module 31 to collect the signal between the first voltage divider resistor RREF1 and the adjustable resistor RX1 through the first input terminal AIN0. The 9th pin (SDA, data) and the 10th pin (SCL, clock) of the data conversion module 32 are IIC protocol interfaces. The data conversion module 32 is connected to the control unit 50 through the 9th pin and the 10th pin. The control unit 50 can send instructions to the data conversion module 32. After receiving the instructions, the data conversion module 32 starts sampling (i.e., collecting voltage signals), and then converts them into digital signals and transmits them to the control unit 50 through the 9th pin and the 10th pin. The control unit 50 then calculates the parameters of the adjustable resistor RX1.

[0048] Specifically, if Figure 3 As shown, the adjustable resistor RX1 is the resistor to be measured, and the first voltage-dividing resistor RREF1 is a reference resistor with a known resistance. After the adjustable resistor RX1 and the first voltage-dividing resistor RREF1 are connected in series, according to Ohm's law and the characteristics of the series circuit, the voltage between the adjustable resistor RX1 and the first voltage-dividing resistor RREF1 can be calculated by the following formula:

[0049]

[0050] The voltage after passing through the operational amplifier module 31 is:

[0051]

[0052] RF1 and R1 are reference resistors with known resistance values in the operational amplifier module 31 .

[0053] As can be seen from the above formula, after the control unit 50 obtains the first voltage value AIN0, the parameter of the adjustable resistor RX1 can be calculated using the following formula:

[0054]

[0055] In the above embodiment, after the control unit 50 collects the first voltage value AIN0 between the first voltage divider resistor RREF1 and the adjustable resistor RX1 through the parameter measurement unit 30, the parameters of the adjustable resistor RX1 can be quickly calculated using formula (2), and the parameters of the adjustable resistor RX1 can be quickly determined without the need for other measuring equipment.

[0056] Furthermore, if the resistance of the adjustable resistor RX1 is much larger than the first voltage-dividing resistor RREF1, the voltage divided by the first voltage-dividing resistor RREF1 will be very small, and the first voltage value AIN0 will be a very small value, which may affect the accuracy of the calculation result of formula (2). Therefore, in order to improve the accuracy of the parameter measurement result, in some embodiments, such as Figure 3 As shown, the first switch unit 60 further includes a second switch RLY2, and the parameter measurement unit 30 further includes a second voltage-dividing resistor RREF2. The resistance of the second voltage-dividing resistor RREF2 is greater than the resistance of the first voltage-dividing resistor RREF1. One end of the second switch RLY2 is electrically connected to the second voltage-dividing resistor RREF2, and the other end of the second switch RLY2 is electrically connected to the adjustable resistor RX1 and the input end of the operational amplifier module 31.

[0057] The control unit 50 is configured to, in response to a parameter determination instruction, control the second switch RLY2 to disconnect the electrical connection between the second voltage-dividing resistor RREF2 and the adjustable resistor RX1. The control unit 50 is further configured to, when the first voltage value is less than a preset voltage value, control the first switch RLY1 to disconnect the electrical connection between the first voltage-dividing resistor RREF1 and the adjustable resistor RX1, control the second switch RLY2 to connect the second voltage-dividing resistor RREF2 and the adjustable resistor RX1, and obtain a voltage signal between the adjustable resistor RX1 and the second voltage-dividing resistor RREF2 via the operational amplifier module 31 and the data conversion module 32 to obtain a second voltage value, and determine the parameter of the adjustable resistor RX1 based on the second voltage value and the resistance value of the second voltage-dividing resistor RREF2.

[0058] From formula (1), we can see that if the resistance of the adjustable resistor RX1 is much larger than the resistance of the first voltage-dividing resistor RREF1, then after voltage division, the proportion of the voltage on the first voltage-dividing resistor RREF1 is very small, that is, This value is very small, so that the voltage between the adjustable resistor RX1 and the first voltage-dividing resistor RREF1 is also very small. When the control unit 50 calculates the parameters of the adjustable resistor RX1 through formula (2), the control unit 50 may lose valid information due to rounding errors due to the limited number of bits that can be processed, thereby affecting the accuracy of the calculation structure.

[0059] A second voltage-dividing resistor RREF2 with a larger resistance is added to the parameter measurement unit 30, and a preset voltage value is set so that the component parameter determination device automatically selects the first voltage-dividing resistor RREF1 or the second voltage-dividing resistor RREF2 based on the preset voltage value (i.e., the resistance value of the adjustable resistor RX1). When the parameter measurement unit 30 obtains the parameters of the adjustable resistor RX1, the first voltage-dividing resistor RREF1 is first selected, that is, the first switch RLY1 is first controlled to connect the adjustable resistor RX1 and the first voltage-dividing resistor RREF1. When the collected first voltage value is too small, that is, when the first voltage value is less than the preset voltage value, the second voltage-dividing resistor RREF2 with a larger resistance is selected to recalculate the parameters of the adjustable resistor RX1.

[0060] Specifically, when adjusting the adjustable resistor RX1, the control unit 50 controls GPIO9 and GPIO10 to output a high level, and controls the first switch RLY1 and the second switch RLY2 to be disconnected; when the adjustment is completed, GPIO9 is first controlled to output a low level signal, and the first switch RLY1 is closed to connect the adjustable resistor RX1 and the first voltage divider resistor RREF1; when the first voltage value is less than the preset voltage value, GPIO9 is controlled to output a high level, and GPIO10 is controlled to output a low level signal to switch the first voltage divider resistor RREF1 and the second voltage divider resistor RREF2. The control unit 50 then calculates the parameters of the adjustable resistor RX1 using the following formula:

[0061]

[0062] In the above embodiment, by setting the second voltage divider resistor RREF2 having a resistance greater than the resistance of the first voltage divider resistor RREF1, and a preset voltage value, the control unit 50 can automatically switch between the first voltage divider resistor RREF1 and the second voltage divider resistor RREF2 according to the size relationship between the first voltage value and the preset voltage value, so as to select a more suitable voltage divider resistor to measure the parameters of the adjustable resistor RX1, thereby improving the accuracy of the measurement results.

[0063] Furthermore, the adjustable impedance device 22 may be an adjustable capacitor in addition to an adjustable resistor. In order to accurately measure the capacitance value of the adjustable capacitor, in some embodiments, for example, Figure 5 As shown, Figure 5The circuit structure of the parameter measurement unit provided in the second embodiment of the present application is shown. The adjustable impedance device 22 is an adjustable capacitor. The first switch unit 60 includes a third switch RLY3. The parameter measurement unit 30 includes a power supply VCC5, a charging resistor R9 and a voltage comparison module 33. One end of the charging resistor R9 is electrically connected to one end of the adjustable capacitor CX1 and the input end of the voltage comparison module 33 respectively. The other end of the charging resistor R9 is electrically connected to one end of the third switch RLY3. The other end of the adjustable capacitor CX1 is grounded. The other end of the third switch RLY3 is electrically connected to the power supply VCC5. The output end of the voltage comparison module 33 is electrically connected to the control unit 50.

[0064] The control unit 50 is configured to control the third switch RLY3 to conduct when the first waveform data meets the preset waveform requirements, so that the power supply VCC5 charges the adjustable capacitor CX1 through the third switch RLY3 and the charging resistor R9. The control unit 50 starts a timer and stops the timer when the voltage comparison module 33 outputs a high-level signal to record the charging time of the adjustable capacitor CX1. The timer obtains the charging time from the timer and determines the parameters of the adjustable capacitor CX1 based on the charging time. The voltage comparison module 33 can be a single comparator, a dual / quad comparator, a high-speed comparator, or the like.

[0065] The parameter measurement unit 30 corresponding to the adjustable capacitor CX1 can adopt the capacitance charging and discharging principle, and the specific formula is as follows:

[0066]

[0067] Among them, V t is the charging voltage when the charging time is t, V0 is the initial voltage, V u is the power supply voltage, R is the resistance of the resistor, and C is the capacitance of the capacitor.

[0068] When time t = RC, substituting into formula (3), we can obtain the following formula:

[0069] V t =0+V u ×(1-e -1 )≈0.63V u

[0070] That is, when the charging time is RC, the charging voltage is 0.63V u .

[0071] From the above, we can see that Figure 5As shown, the adjustable capacitor CX1 starts charging from 0V. When the voltage across the adjustable capacitor CX1 reaches 0.63 times the voltage of the power supply VCC5, at time t = R9 × CX1, a voltage comparison module 33 can be set to determine whether the voltage across the adjustable capacitor CX1 reaches 0.63 times the voltage of the power supply VCC5. Specifically, the voltage comparison module 33 includes a voltage comparator U3A, a third voltage-dividing resistor R11, and a fourth voltage-dividing resistor R12. The voltage-dividing value of the third voltage-dividing resistor R11 and the fourth voltage-dividing resistor R12 is set as the reference voltage of the voltage comparator U3A (i.e., the voltage value at the middle position of the third voltage-dividing resistor R11 and the fourth voltage-dividing resistor R12), and the reference voltage is set to 0.63 × VCC5.

[0072] When measuring the adjustable capacitor CX1, the third switch RLY3 is controlled to conduct to begin charging the adjustable capacitor CX1, and a timer is started to record the charging time of the adjustable capacitor CX1. When the adjustable capacitor CX1 is charged to the time t = R9 × CX1, the voltage comparator U3A outputs a high level and is connected to the GPIO12 pin of the control unit 50, thereby configuring the GPIO12 pin of the control unit 50 in interrupt mode. That is, when the voltage comparator U3A outputs a high level, the control unit 50 immediately responds and turns off the timer. After obtaining the charging time t from the timer, the charging resistor R9 and the charging time t are both known parameters, that is, the adjustable capacitor CX1 can be calculated as t / R9.

[0073] In the above embodiment, the adjustable capacitor CX1 is charged by setting a charging resistor R9 of a known resistance, and the voltage comparison module 33 determines whether the charging time t of the adjustable capacitor CX1 satisfies t=R9×CX1. If so, the parameters of the adjustable capacitor CX1 are calculated using the charging resistor R9 and the charging time t. In this way, the parameters of the adjustable capacitor CX1 can be quickly calculated, which helps to improve the research and development efficiency of the circuit to be measured 10. Moreover, the parameters of the adjustable capacitor CX1 can be quickly determined without the need for other measurement equipment.

[0074] Furthermore, the adjustable impedance device 22 may also be an adjustable inductor. In order to accurately measure the inductance value of the adjustable inductor, in some embodiments, as shown in FIG. Figure 6 As shown, Figure 6The circuit structure of the parameter measurement unit provided in the third embodiment of the present application is shown. The adjustable impedance device 22 is an adjustable inductor LX1. The first switch unit 60 includes a fourth switch RLY4. The parameter measurement unit 30 includes a resonant capacitor C2, a signal generating module 34 and a data conversion module 32. One end of the fourth switch RLY4 is electrically connected to the output end of the signal generating module 34, the other end of the fourth switch RLY4 is electrically connected to one end of the adjustable inductor LX1, one end of the resonant capacitor C2 is electrically connected to the other end of the adjustable inductor LX1, the other end of the resonant capacitor C2 is electrically connected to the second input end AIN1 of the data conversion module 32, and the data conversion module 32 is signal-connected to the control unit 50.

[0075] The control unit 50 is used to control the fourth switch RLY4 to connect the signal generating module 34 and the adjustable inductor LX1 when the first waveform data meets the preset waveform requirements, and send a frequency adjustment instruction to the signal generating module 34 to adjust the signal frequency output by the signal generating module 34; obtain the voltage signal of the circuit where the adjustable inductor LX1 is located through the data conversion module 32 in real time, determine whether the circuit where the adjustable inductor LX1 is located is in a resonant state based on the voltage signal, and obtain the current signal frequency output by the signal generating module 34 and the capacitance value of the resonant capacitor C2 when the circuit where the adjustable inductor LX1 is located is in a resonant state, and determine the parameters of the adjustable inductor LX1 based on the current output signal frequency and the capacitor.

[0076] The parameter measurement unit 30 of the adjustable inductor LX1 can use the LRC resonance principle to measure the parameters of the adjustable inductor LX1. The signal generating module 34 can use an analog signal generator, a digital signal generator, a vector signal generator, etc. As an example, the signal generating module 34 can use a Wien bridge oscillation circuit, usually selecting resistors R16 and R17 with a resistance value of R, and capacitors C12 and C13 with a capacitance value of C. The signal generating module 34 outputs a frequency f s It can be calculated by the following formula:

[0077]

[0078] Among them, R16 and R17 are dual resistors, that is, when R16 is adjusted, the resistance value of R17 will also change with the same amplitude. C12 and C13 are dual capacitors, and the principle is the same as that of dual resistors.

[0079] The signal generating module 34 is connected to the adjustable inductor LX1 via the fourth switch RLY4. The parameters of the resistors R16 and R17 (or the capacitors C12 and C13) are adjusted to change the output frequency of the signal generating module 34. For ease of adjustment, when adjusting the output frequency of the signal generating module 34, the resistance of the dual resistors can be fixed first and only the capacitance of the dual capacitors can be adjusted. Alternatively, the capacitance of the dual capacitors can be fixed first and only the resistance of the dual resistors can be adjusted. As an example, when adjusting the output frequency of the signal generating module 34, the capacitors C12 and C13 can be fixed first, and then the resistors R16 and R17 can be adjusted from small to large. As can be seen from formula (4), the output frequency of the signal generating module 34 gradually decreases. If the circuit where the adjustable inductor LX1 is located has not reached a resonant state when the resistors R16 and R17 are adjusted to their limit values, the resistance value at that time is fixed, and the capacitors C12 and C13 are continued to be adjusted from small to large.

[0080] A circuit composed of inductors, resistors, and capacitors will exhibit significant impedance characteristic changes at a specific frequency (i.e., resonant frequency). Specifically, Figure 6 In the circuit shown, when the circuit where the adjustable inductor LX1 is located is in a resonant state, the inductive reactance X of the adjustable inductor LX1 is L =2πf×LX1 and the capacitive reactance of the resonant capacitor C2 The equal magnitude and opposite phase result in the reactance components canceling out, making the circuit purely resistive and the voltage in the circuit reaching its maximum value. At this point, the following formula can be obtained:

[0081]

[0082] Among them, the resonant capacitor C2 is a capacitor with a known capacitance value. Further considering the calculation accuracy, a capacitor of nF and uF level can be selected. f0 is the final output frequency of the signal generating module 34, which can be calculated by resistors R16 and R17, capacitors C12 and C13, and formula (4).

[0083] By transforming formula (5), we can get the following formula:

[0084]

[0085] The parameters of the adjustable inductor LX1 are calculated based on the resonant capacitor C2, the output frequency of the signal generating module 34, and formula (6).

[0086] In the above embodiment, a signal generating module 34 is provided, and the signal generating module 34 outputs signals of different frequencies. The voltage signal of the circuit where the adjustable inductor LX1 is located is obtained to determine whether the circuit is in a resonant state. Then, when the circuit is in a resonant state, the inductance value of the adjustable inductor LX1 is calculated based on the signal frequency output by the signal generating module 34 and the capacitance value of the resonant capacitor C2. In this way, the parameters of the adjustable inductor LX1 can be quickly calculated, which helps to improve the research and development efficiency of the circuit to be measured 10, and the parameters of the adjustable inductor LX1 can be quickly determined without the need for other measuring equipment.

[0087] Furthermore, when the parameters of the adjustable impedance device change, the voltage across it and the current passing through it will also change. When the voltage or current is too large, the adjustable impedance device will be irreversibly damaged. Therefore, in order to protect the adjustable impedance device, in some embodiments, such as Figure 7 As shown, Figure 7 The circuit structure of the circuit protection unit provided in an embodiment of the present application is shown. The device also includes a circuit protection unit 80, which is electrically connected to the control end of the adjustable impedance device 22 and the second switch unit 70 (i.e., the fifth switch RLY5), respectively. The circuit protection unit 80 is used to detect the voltage of the adjustable impedance device 22 and output a high-level signal to the control end of the second switch unit 70 when the voltage value of the adjustable impedance device 22 is greater than a preset voltage value, so as to control the second switch unit 70 to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10.

[0088] The circuit protection unit 80 is used to protect the circuit to be measured 10 and the adjustable impedance device 22. Specifically, Figure 7 As shown, the circuit protection unit 80 includes a voltage monitoring module 81, which is used to detect the voltage across the adjustable impedance device 22 and control the fifth switch RLY5 to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10 when the voltage across the adjustable impedance device 22 exceeds a preset voltage value, so as to protect the adjustable impedance device 22.

[0089] The voltage monitoring module 81 can use a voltage comparator, a voltage monitoring IC, a digital monitoring based on ADC, etc. In the embodiment of the present application, as an example, Figure 7As shown, the voltage monitoring module 81 utilizes a common-mode hysteresis comparator U5A, and by setting thresholds, the common-mode hysteresis comparator U5A outputs either a high-level signal or a low-level signal. Specifically, VSEN1 is the monitored voltage across the adjustable impedance device 22. When VSEN1 is greater than a preset voltage value VH, the common-mode hysteresis comparator U5A outputs a high-level signal, thereby controlling the disconnection of the fifth switch RLY5. Furthermore, a low threshold voltage VL can be set. When VSEN1 is less than the low threshold voltage VL, the common-mode hysteresis comparator U5A resumes outputting a low-level signal. By setting the preset voltage value VH and the low threshold voltage VL, repeated opening and closing of the fifth switch RLY5 during voltage fluctuations can be avoided.

[0090] In addition, the preset voltage value VH and the low threshold voltage VL are the overvoltage protection points of the voltage monitoring module 81. The specific values can be set by adjusting the ratio of the resistors R19 and R22. Specifically, as shown in the following formula:

[0091]

[0092] From the above formula, we can know the relationship between the resistors R18, R19, R20, R22, R32, the preset voltage value VH and the low threshold voltage VL. When setting the preset voltage value VH and the low threshold voltage VL, the corresponding resistors R18, R22 and R32 can be selected based on empirical values. For example, R18 = 2MΩ, R22 = 1MΩ, R32 = 100kΩ are selected, and the remaining resistors are calculated based on the preset voltage value VH, the low threshold voltage VL and the above formula.

[0093] In the above embodiment, by providing the circuit protection unit 80 , when the voltage across the adjustable impedance device 22 is greater than a preset voltage value, the second switch unit 70 is controlled to be disconnected, thereby protecting the circuit to be measured 10 and the adjustable impedance device 22 .

[0094] Furthermore, if Figure 7 As shown, the circuit protection unit 80 is further used to detect the current passing through the adjustable impedance device 22, and output a high-level signal to the control end of the second switch unit 70 (i.e., the fifth switch RLY5) when the current value of the adjustable impedance device 22 is greater than a preset current value, so as to control the second switch unit 70 to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10.

[0095] like Figure 7As shown, the circuit protection unit 80 includes a current monitoring module 82. The current monitoring module 82 is used to detect the current passing through the adjustable impedance device 22 and, when the current passing through the adjustable impedance device 22 exceeds a preset current value, control the fifth switch RLY5 to disconnect the electrical connection between the adjustable impedance device 22 and the circuit to be measured 10, thereby protecting the adjustable impedance device 22 and the circuit to be measured 10. Specifically, a sampling resistor R27 is arranged in series with the adjustable impedance device 22. According to Ohm's law I = U / R, the current signal passing through the sampling resistor R27 is converted into a voltage signal. In addition, the sampling resistor R27 is generally a very low resistance, for example, a resistance of 1Ω, so the voltage across it is very small. The voltage signal across the sampling resistor R27 is amplified by an operational amplifier circuit U5B and then connected to a hysteresis comparator U7A. The hysteresis comparator U7A determines whether the current value passing through the adjustable impedance device 22 is greater than the preset current value. The working principle of the hysteresis comparator U7A is similar to that of the in-phase hysteresis comparator U5A in the voltage monitoring module 81 and will not be described in detail here.

[0096] In the above embodiment, by providing the circuit protection unit 80 , when the current passing through the adjustable impedance device 22 is greater than a preset current value, the second switch unit 70 is controlled to be disconnected, thereby protecting the circuit to be measured 10 and the adjustable impedance device 22 .

[0097] In addition, if Figure 7 As shown, when the circuit protection unit 80 includes both a voltage monitoring module 81 and a current monitoring module 82, the output terminals of the in-phase hysteresis comparator U5A in the voltage monitoring module 81 and the hysteresis comparator U7A in the current monitoring module 82 are connected to the second switch unit 70 (i.e., the fifth switch RLY5) through an OR gate U8. The control terminal of the fifth switch RLY5 is connected when it receives a low-level signal and disconnected when it receives a high-level signal. Therefore, when one of the in-phase hysteresis comparator U5A or the hysteresis comparator U7A outputs a high-level signal, that is, the voltage across the adjustable impedance device 22 is greater than a preset voltage value, or the current through the adjustable impedance device 22 is greater than a preset current value, if either of these two conditions is met, the fifth switch RLY5 will disconnect, thereby protecting the adjustable impedance device 22 and the circuit to be measured 10.

[0098] Furthermore, the component parameter determination device may also include a button for inputting the type of the adjustable impedance device 22, so that after the debugging of the adjustable impedance device 22 is completed, the parameters of the adjustable impedance device 22 are determined by selecting the corresponding measurement circuit according to the type of the adjustable impedance device 22. Specifically, the user can select the impedance mode (i.e., the type of the adjustable impedance device 22) through the button, for example, impedance modes such as resistance, capacitance, and inductance. In addition, the button can also be used to input a preset voltage value and a preset current value, so that the component parameter determination device can implement overvoltage or overcurrent protection according to the preset voltage value and the preset current value. Furthermore, the button can also be used to input a preset waveform requirement of the current to be measured, so as to debug the adjustable impedance device 22 according to the preset waveform requirement.

[0099] Furthermore, the component parameter determination device may also include a display module, which can be used to display information input through buttons (for example, impedance module, preset voltage value, preset current value, preset waveform requirements, etc.), circuit operation status information (for example, waveform data of the circuit to be measured), and parameters of the adjustable impedance device 22, etc.

[0100] According to another aspect of the embodiments of the present application, a component parameter determination method is also provided, which is applied to the component parameter determination device described in any of the above embodiments, and the method is executed by a control unit of the component parameter determination device. The control unit can be a microcontroller unit MCU, a specific integrated circuit ASIC (Application Specific Integrated Circuit) or other control chip, or it can be an electronic device such as a mobile phone, tablet, or computer. Figure 8 As shown, Figure 8 A schematic diagram of a method for determining component parameters provided in an embodiment of the present application is shown, and the method includes the following steps:

[0101] Step S110: obtaining a preset waveform requirement of the circuit to be measured.

[0102] Among them, the preset waveform requirement is used to guide the adjustment of the adjustable impedance device, and is the final desired adjustment state of the circuit to be measured, that is, the waveform data that the user expects the circuit to be measured to output, for example, outputting a voltage of 3.3V and a waveform less than 30mV. As an example, the preset waveform requirement can be input through the buttons on the component parameter determination device.

[0103] Step S120: in response to the parameter determination instruction, controlling the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and controlling the second switch unit to connect the adjustable impedance device and the circuit to be measured.

[0104] First, after the circuit to be measured is connected to the component parameter determination device, the control unit controls the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit to prevent the parameter measurement unit from affecting the debugging process of the adjustable impedance device, and controls the second switch unit to connect the adjustable impedance device and the circuit to be measured, so as to connect the adjustable impedance device to the position where the corresponding component in the circuit to be measured (that is, the component whose parameter is to be determined in the circuit to be measured) should actually be connected, thereby improving the accuracy of the debugging result.

[0105] Step S130: Generate a device adjustment instruction, and send the device adjustment instruction to the driving component, so as to adjust the parameters of the adjustable impedance device through the driving component.

[0106] Step S140: acquiring first waveform data of the circuit to be measured in real time through a signal acquisition unit.

[0107] Step S150: Analyze the first waveform data and determine whether the first waveform data meets the preset waveform requirements.

[0108] Then, the control unit generates a device adjustment instruction to control the driving component to debug the parameters of the adjustable impedance device, and during the debugging process, the signal acquisition unit obtains the first waveform data of the circuit to be measured in real time, that is, the real-time output waveform of the circuit to be measured during the debugging process. Specifically, the driving component can be controlled to adjust the parameters of the adjustable impedance device according to a fixed step size. For example, if the driving component is a stepper motor with a step angle of 0.9 degrees, the step size can be set to 0.9 degrees; or the driving component can be controlled to adjust the parameters of the adjustable impedance device according to a larger step size first, and then the driving component can be controlled to adjust the parameters of the adjustable impedance device according to a smaller step size. For example, if the driving component is a stepper motor with a step angle of 0.9 degrees, the step size can be set to a larger value such as 9 degrees or 18 degrees first, so that the adjustable impedance device is coarsely adjusted by the driving component, and at the same time, the first waveform data of the circuit to be measured is obtained in real time by the signal acquisition unit, and the first waveform data is compared with the final desired adjustment state (that is, the preset waveform requirement). When the comparison result is close, the step size is reset to 0.9 degrees to finely adjust the adjustable impedance device according to a smaller step size.

[0109] Furthermore, when adjusting the adjustable impedance device, the adjustable impedance device can be adjusted in one direction first. When the first waveform data output by the circuit to be measured exceeds a preset waveform requirement, the adjustable impedance device can be adjusted in the opposite direction. Specifically, the drive component can be controlled to rotate clockwise to adjust the parameters of the adjustable impedance device. If the first waveform data exceeds the preset waveform requirement, the drive component can be controlled to rotate counterclockwise to adjust the parameters of the adjustable impedance device until the first waveform data meets the preset waveform requirement.

[0110] Step S160: If the first waveform data meets the preset waveform requirement, a stop instruction is generated and sent to the driving component to cause the driving component to stop adjusting the adjustable impedance device.

[0111] The stop instruction is used to control the driving component to stop adjusting the adjustable impedance device to fix the parameters of the adjustable impedance device at this time, that is, to fix the parameters of the adjustable impedance device to the parameters when the first waveform data meets the preset waveform requirements.

[0112] Step S170: controlling the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured, and controlling the first switch unit to connect the adjustable impedance device and the parameter measurement unit.

[0113] Step S180: obtaining the adjusted parameters of the adjustable impedance device through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured.

[0114] Finally, the parameters of the adjusted adjustable impedance device are determined by the parameter measurement unit. Specifically, the second switch unit is first controlled to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured to prevent the circuit to be measured from affecting the measurement result of the parameter measurement unit. Then, the first switch unit is controlled to connect the adjustable impedance device and the parameter measurement unit to connect the adjustable impedance device to the parameter measurement unit, and the parameters of the adjustable impedance device are determined by the parameter measurement unit.

[0115] In addition, there are many types of adjustable impedance devices, specifically adjustable resistors, adjustable capacitors, adjustable inductors, etc., and the specific circuits of the parameter measurement units used by different types of adjustable impedance devices are different. In order to improve the practicality of the component parameter determination device, parameter measurement circuits corresponding to each type of adjustable impedance device can be set in the parameter measurement unit, and multiple switches can be set in the first switch unit to control the connection or disconnection of the adjustable impedance device with different parameter measurement circuits. Specifically, the type of the adjustable impedance device can be obtained when obtaining the preset waveform requirements. After debugging is completed, the corresponding switch in the first switch unit is controlled according to the type of the adjustable impedance device to connect the adjustable impedance device and the parameter measurement circuit corresponding to the type of the adjustable impedance device.

[0116] In the above embodiment, by controlling the first switch unit to be disconnected and the second switch unit to be turned on, the driving component can be controlled to debug the adjustable impedance device to achieve automatic debugging, and after the debugging is completed, the second switch unit is controlled to be disconnected and the first switch unit is turned on, so that the parameters of the adjustable impedance device can be automatically obtained through the parameter measurement unit. The user only needs to input the preset waveform requirements to achieve automatic debugging and provide appropriate component parameters through the component parameter determination method, thereby reducing manual intervention and improving the accuracy of debugging.

[0117] Furthermore, the optimal component parameters of the circuit to be measured are obtained by detecting the adjustable impedance device by the parameter measurement unit. The value of the optimal component parameter can be any value within the debugging range of the adjustable impedance device. Taking the adjustable impedance device as an example, the optimal component parameter can be any value between 0Ω and 1kΩ. However, the specifications of actual components are limited, and not all numerical parameters correspond to actual components. In order to further determine the components that should actually be connected to the circuit to be measured, in some embodiments, after step S180, the method further includes:

[0118] Step S190: searching a preset component library according to the optimal component parameters, and determining whether there is a component in the component library whose parameters are equal to the optimal component parameters.

[0119] Among them, the component library is used to store the values of actual components. The component library can be stored in a storage device in advance, such as a memory card. If a new component appears, the new component is imported into the component library to update the component library. Since the adjustable impedance device can be an adjustable resistor, an adjustable capacitor, and components such as an adjustable inductor, in order to facilitate the search for component libraries, corresponding component libraries can be generated according to different types of components, or corresponding data tables can be generated in a component library according to different types of components. Then, when searching for a component library, the corresponding component library or data table can be found according to the type of adjustable impedance device.

[0120] If there is a component with parameters equal to the optimal component parameters in the component library, it means that there is a component corresponding to the optimal component parameters in the actual components. That is, the user can directly obtain the component corresponding to the optimal component parameters from the actual components and connect it to the circuit to be measured, and then execute step S200;

[0121] If there is no component in the component library with parameters equal to the optimal component parameters, it means that there is no component corresponding to the optimal component parameters in the actual components. That is, the user cannot directly obtain the component corresponding to the optimal device parameters from the actual components and connect it to the circuit to be measured. The optimal component parameters need to be further verified to obtain the parameters corresponding to the actual components, and step S210 is executed.

[0122] Step S200: determining the optimal component parameters as the target component parameters of the circuit to be measured.

[0123] The target component parameters represent the components that should be connected to the circuit under measurement. This means that users can directly obtain components corresponding to the target component parameters from the actual components and connect them to the circuit under measurement. If a component with parameters equal to the optimal component parameters exists in the component library, the optimal component parameters are directly determined as the target component parameters for the circuit under measurement.

[0124] Step S210: Calculate the absolute value of the difference between the optimal component parameters and the parameters of each component in the component library to obtain error data corresponding to each component, determine the parameters to be verified based on the error data, verify the parameters to be verified through the circuit to be measured, and determine the target component parameters of the circuit to be measured based on the verification results.

[0125] If the component library does not contain a component with parameters equal to the optimal device parameters, the parameters of the component in the component library closest to the optimal component parameters can be determined as the parameters to be verified, and verification can be performed based on the parameters to be verified. Taking the adjustable impedance device as an example, if the optimal component parameters are 9Ω, and there is no 9Ω resistor in the component library, the parameters of the component in the component library closest to 9Ω are determined as the parameters to be verified. That is, if the resistor closest to 9Ω in the component library is 10Ω, 10Ω is determined as the parameter to be verified, and the parameter to be verified is verified using the circuit to be measured.

[0126] In the above embodiment, the target component parameters of the circuit to be measured are determined by searching the component library, so that the user can directly select corresponding actual components according to the target component parameters and connect them to the circuit to be measured, which helps to improve the research and development efficiency of the circuit to be measured.

[0127] Furthermore, in order to improve the accuracy of the verification result, in some embodiments, step S210 may include the following steps:

[0128] Step S310: controlling the driving component to adjust the parameters of the adjustable impedance device according to the parameters to be verified, so that the parameters of the adjustable impedance device are equal to the parameters to be verified.

[0129] Step S320: controlling the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and controlling the second switch unit to connect the adjustable impedance device and the circuit to be measured.

[0130] Step S330: obtaining second waveform data of the circuit to be measured through the signal acquisition unit.

[0131] Step S340: Analyze the second waveform data and determine whether the second waveform data meets the preset waveform requirements.

[0132] Step S350: If the second waveform data meets the preset waveform requirement, the parameter to be verified is determined as the target component parameter of the circuit to be measured.

[0133] After determining the parameter to be verified, the control driving component adjusts the parameter of the adjustable impedance device to adjust the parameter of the adjustable impedance device to be equal to the parameter to be verified. Taking the adjustable impedance device as an adjustable resistor as an example, if the optimal component parameter is 9Ω, and the resistance value closest to the optimal component parameter in the component library is 10Ω, then the parameter to be verified is 10Ω. According to the parameter to be verified, the control driving component adjusts the parameter of the adjustable impedance device to 10Ω, and the adjusted adjustable impedance device is connected to the circuit to be measured, and then the parameter to be verified is verified through the circuit to be measured.

[0134] If the second waveform data output by the circuit to be measured still meets the preset waveform requirements after the adjusted adjustable impedance device is connected to the circuit to be measured, the parameters to be verified are determined as the target component parameters of the circuit to be measured, and the optimal component parameters and the target component parameters are displayed simultaneously when displayed; if the second waveform data does not meet the preset waveform requirements, only the optimal component parameters of the circuit to be measured are determined, that is, when displayed, only the optimal component parameters are displayed, or the optimal component parameters and the parameters to be verified are displayed simultaneously, and a prompt is given that the verification result of the parameters to be verified does not meet the preset waveform requirements. In addition, when determining whether the second waveform data meets the preset waveform requirements, a preset error range can be set. If the error between the second waveform data and the preset waveform requirement is within the preset error range, it is determined that the second waveform data meets the preset waveform requirements.

[0135] In the above embodiment, after determining the parameters to be verified, the parameters of the adjustable impedance device are adjusted to the parameters to be verified, and the adjustable impedance device is connected to the circuit to be measured for verification, thereby effectively improving the accuracy of the verification result and ensuring the accuracy of the target component parameters.

[0136] Furthermore, the effect of resistors connected in series or in parallel is similar to that of a single resistor. Therefore, when the adjustable impedance device is an adjustable resistor, the parameters of the resistors connected in series or in parallel need to be considered when determining the parameters to be verified. Specifically, step S210 may include the following steps:

[0137] Step S410: Divide the component library into a series component set and a parallel component set according to the optimal component parameters.

[0138] The total resistance of resistors connected in series is the sum of the resistances of all the resistors in series, so the total resistance in series is always greater than the resistance of any one resistor. The total resistance of resistors connected in parallel is calculated by summing the reciprocals and then taking the reciprocal, so the total resistance in parallel is always less than the resistance of any one resistor. Therefore, components in the component library with parameters less than the optimal component parameters can be grouped into the series component set, and components in the component library with parameters greater than the optimal component parameters can be grouped into the parallel component set.

[0139] Step S420: generating series resistor pairs according to the series component set, and calculating the series resistance value of each series resistor pair.

[0140] Step S430: Calculate the absolute value of the difference between the optimal component parameters and the series resistance value to obtain error data corresponding to the series resistance pair.

[0141] Among them, all series resistance pairs are generated by combining any two resistors in the series component set, and the same resistor is reused. For example, if the series component set includes 10Ω, 15Ω, and 22Ω resistors, all generated series resistance pairs include 10Ω+10Ω, 10Ω+15Ω, 10Ω+22Ω, 15Ω+15Ω, 15Ω+22Ω, and 22Ω+22Ω. Therefore, six series resistance values of 20Ω, 25Ω, 32Ω, 30Ω, 37Ω, and 44Ω can be obtained.

[0142] Step S440: generating parallel resistor pairs according to the parallel component set, and calculating the parallel resistance value of each parallel resistor pair.

[0143] Step S450: Calculate the absolute value of the difference between the optimal component parameters and the parallel resistance value to obtain error data corresponding to the parallel resistance pair.

[0144] The method of generating parallel resistor pairs based on parallel component sets is similar to the method of generating series resistor pairs based on series component sets, which will not be described here. The parallel resistance value corresponding to each parallel resistor pair is calculated.

[0145] In the above embodiment, by generating a series resistor set and a parallel resistor set, and fully considering the series and parallel connection of resistors when determining the parameters to be verified, the practicality of the component parameter determination method is effectively improved.

[0146] Furthermore, in order to accurately display the target component parameters, in some embodiments, step S350 specifically includes the following steps:

[0147] Step S460: If the parameter to be verified is the series resistance value of a series resistor pair, the parameters of each component in the series resistor pair are determined as target component parameters of the circuit to be measured, and a component connection mode is generated, wherein the component connection mode is series connection.

[0148] As an example, if the optimal component parameter is 164Ω, since there is actually no 164Ω resistor, but there are 160Ω resistors and 3.9Ω resistors, the parameter to be verified can be the total resistance of the series resistor pair 160Ω+3.9Ω, which is 163.9Ω. After the parameters of the adjustable impedance device are adjusted to 163.9Ω, the second waveform data output by the circuit to be measured can still meet the preset waveform requirements. Then, 160Ω and 3.9Ω can both be determined as the target component parameters of the circuit to be measured, and the component connection method can be set to series.

[0149] Step S470: If the parameter to be verified is the parallel resistance value of a parallel resistor pair, the parameters of each component in the parallel resistor pair are determined as the target component parameters of the circuit to be measured, and a component connection method is generated, wherein the component connection method is parallel.

[0150] As an example, if the optimal component parameter is 7.4Ω, since there is no actual 7.4Ω resistor, but there are 10Ω and 30Ω resistors, the parameter to be verified can be the total resistance of the parallel resistor pair 10Ω||30Ω in parallel, which is 7.5Ω. After the parameters of the adjustable impedance device are adjusted to 7.5Ω, the second waveform data output by the circuit to be measured can still meet the preset waveform requirements. In this case, 10Ω and 30Ω can both be determined as the target component parameters of the circuit to be measured, and the component connection method can be set to parallel.

[0151] In the above embodiment, when the parameter to be verified is the total resistance of resistors connected in parallel or series, the parameters of all resistors connected in parallel or series are determined as target component parameters, and the component connection method is set to series or parallel, so that the user can directly select the corresponding components according to the target component parameters and component connection method and connect them in the corresponding method, thereby improving the research and development efficiency of the circuit to be measured.

[0152] According to another aspect of the embodiments of the present application, an electronic device is provided. Figure 9 A schematic structural diagram of an electronic device provided in an embodiment of the present application is shown. The specific embodiment of the present application does not limit the specific implementation of the electronic device.

[0153] like Figure 9 As shown, the electronic device 9 may include: a processor (processor) 91 and a memory (memory) 92.

[0154] The memory 92 is used to store a computer program 93. The memory 92 may include a high-speed RAM memory, or may also include a non-volatile memory, such as at least one disk memory. The computer program 93 may include computer-executable instructions.

[0155] The processor 91 is configured to execute the computer program 93 to implement the above-mentioned embodiment of the component parameter determination method.

[0156] The processor 91 may be a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application. The one or more processors included in the electronic device 9 may be processors of the same type, such as one or more CPUs, or may be processors of different types, such as one or more CPUs and one or more ASICs.

[0157] An embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the embodiment of the component parameter determination method is implemented.

[0158] An embodiment of the present application provides a computer program, which can be executed by a processor to implement the above-mentioned embodiment of the component parameter determination method.

[0159] An embodiment of the present application provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the computer program implements the above-mentioned embodiment of the component parameter determination method.

[0160] In the several embodiments provided in this application, if any function is implemented in the form of a software function module / unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, part or all of the technical solution of this application can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for enabling a computer device (which can be a personal computer, server or other electronic device) to execute all or part of the steps of the method described in each embodiment of this application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), magnetic disk or optical disk, and other media that can store computer program code.

[0161] The algorithm or demonstration provided here are not inherently relevant to any particular computer, virtual system or other equipment. Various general purpose systems can also be used together with the teachings based on this. According to the above description, it is obvious that the structure required for constructing this type of system. In addition, the present application embodiment is not directed to any specific programming language yet. It should be understood that various programming languages can be utilized to realize the content of the present application described here, and the above description of specific languages is for the purpose of disclosing the best mode of implementation of the present application.

[0162] It should be noted that the above embodiments illustrate rather than limit the present application, and that a person skilled in the art may devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between brackets should not be construed as limiting the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present application may be implemented by means of hardware comprising several different elements and by means of a suitably programmed computer. In claims that list several means, several units or modules of these means may be embodied by the same item of hardware. The use of the words first, second, and third etc. does not indicate any order. These words may be interpreted as names. The steps in the above embodiments should not be understood as limiting the order of execution unless otherwise specified.

[0163] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A device for determining component parameters, characterized in that: The device is used to determine the parameters of components of a circuit to be measured, and the device includes: an adjustment unit, a parameter measurement unit, a signal acquisition unit and a control unit; The adjustment unit includes a driving component and an adjustable impedance device, wherein the driving component is connected to the adjustable impedance device, and the driving component is used to adjust the parameters of the adjustable impedance device; The adjustable impedance device is electrically connected to the parameter measurement unit through a first switch unit, and the adjustable impedance device is used to be electrically connected to the circuit to be measured through a second switch unit; The parameter measuring unit is used to obtain the parameters of the adjustable impedance device; The signal acquisition unit is used to be electrically connected to the circuit to be measured to acquire waveform data of the circuit to be measured; The control unit is respectively connected to the parameter measurement unit, the signal acquisition unit, the first switch unit and the second switch unit by signals; The control unit is used to obtain a preset waveform requirement of the circuit to be measured, and in response to a parameter determination instruction, control the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and control the second switch unit to connect the adjustable impedance device and the circuit to be measured; The control unit is configured to generate a device adjustment instruction and send the device adjustment instruction to the driving component so that the driving component adjusts the parameters of the adjustable impedance device; and obtain first waveform data of the circuit to be measured in real time through the signal acquisition unit; analyze the first waveform data, generate a stop instruction when the first waveform data meets the preset waveform requirements, and send the stop instruction to the driving component so that the driving component stops adjusting the adjustable impedance device; The control unit is further configured to control the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured, and control the first switch unit to connect the adjustable impedance device and the parameter measurement unit when the first waveform data meets the preset waveform requirements; and obtain the adjusted parameters of the adjustable impedance device through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured.

2. The component parameter determination device according to claim 1, characterized in that: The adjustable impedance device is an adjustable resistor, the first switch unit includes a first switch, and the parameter measurement unit includes a first voltage divider resistor, an operational amplifier module and a data conversion module; One end of the first switch is electrically connected to the first voltage-dividing resistor, the other end of the first switch is electrically connected to the adjustable resistor and the input end of the operational amplifier module respectively, the output end of the operational amplifier module is electrically connected to the first input end of the data conversion module, and the data conversion module is signal-connected to the control unit; The control unit is configured to control the first switch to connect the first voltage-dividing resistor and the adjustable resistor when the first waveform data meets the preset waveform requirements, obtain a voltage signal between the adjustable resistor and the first voltage-dividing resistor through the operational amplifier module and the data conversion module, obtain a first voltage value, and determine a parameter of the adjustable resistor based on the first voltage value and the resistance value of the first voltage-dividing resistor.

3. The component parameter determination device according to claim 2, characterized in that: The first switch unit further includes a second switch, and the parameter measurement unit further includes a second voltage-dividing resistor, wherein the resistance of the second voltage-dividing resistor is greater than the resistance of the first voltage-dividing resistor; One end of the second switch is electrically connected to the second voltage-dividing resistor, and the other end of the second switch is electrically connected to the adjustable resistor and the input end of the operational amplifier module respectively; The control unit is configured to control the second switch to disconnect the electrical connection between the second voltage-dividing resistor and the adjustable resistor in response to the parameter determination instruction; The control unit is further configured to control the first switch to disconnect the electrical connection between the first voltage-dividing resistor and the adjustable resistor, and control the second switch to connect the second voltage-dividing resistor and the adjustable resistor when the first voltage value is less than a preset voltage value; The voltage signal between the adjustable resistor and the second voltage-dividing resistor is obtained through the operational amplifier module and the data conversion module to obtain a second voltage value, and the parameters of the adjustable resistor are determined according to the second voltage value and the resistance value of the second voltage-dividing resistor.

4. The component parameter determination device according to claim 1, characterized in that: The adjustable impedance device is an adjustable capacitor, the first switch unit includes a third switch, and the parameter measurement unit includes a power supply, a charging resistor and a voltage comparison module; One end of the charging resistor is electrically connected to one end of the adjustable capacitor and the input end of the voltage comparison module respectively, the other end of the charging resistor is electrically connected to one end of the third switch, the other end of the adjustable capacitor is grounded, the other end of the third switch is electrically connected to the power supply, and the output end of the voltage comparison module is electrically connected to the control unit; The control unit is configured to control the third switch to be turned on when the first waveform data meets the preset waveform requirements, so that the power supply charges the adjustable capacitor through the third switch and the charging resistor, start a timer, and turn off the timer when the voltage comparison module outputs a high-level signal to record the charging time of the adjustable capacitor, obtain the charging time from the timer, and determine the parameters of the adjustable capacitor based on the charging time.

5. The device for determining component parameters according to claim 1, wherein: The adjustable impedance device is an adjustable inductor, the first switch unit includes a fourth switch, and the parameter measurement unit includes a resonant capacitor, a signal generation module and a data conversion module; One end of the fourth switch is electrically connected to the output end of the signal generating module, the other end of the fourth switch is electrically connected to one end of the adjustable inductor, one end of the resonant capacitor is electrically connected to the other end of the adjustable inductor, the other end of the resonant capacitor is electrically connected to the second input end of the data conversion module, and the data conversion module is signal-connected to the control unit; The control unit is used to control the fourth switch to connect the signal generating module and the adjustable inductor when the first waveform data meets the preset waveform requirements, and send a frequency adjustment instruction to the signal generating module to adjust the signal frequency output by the signal generating module; obtain the voltage signal of the circuit where the adjustable inductor is located through the data conversion module in real time, determine whether the circuit where the adjustable inductor is located is in a resonant state based on the voltage signal, and obtain the signal frequency currently output by the signal generating module and the capacitance value of the resonant capacitor when the circuit where the adjustable inductor is located is in a resonant state, and determine the parameters of the adjustable inductor based on the currently output signal frequency and the capacitance value.

6. The device for determining component parameters according to claim 1, wherein: The device further includes a circuit protection unit; The circuit protection unit is electrically connected to the control end of the adjustable impedance device and the control end of the second switch unit respectively; The circuit protection unit is used to detect the voltage of the adjustable impedance device and output a high-level signal to the control end of the second switch unit when the voltage value of the adjustable impedance device is greater than a preset voltage value, so as to control the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured; and / or, the circuit protection unit is also used to detect the current passing through the adjustable impedance device and output a high-level signal to the control end of the second switch unit when the current value passing through the adjustable impedance device is greater than a preset current value, so as to control the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured.

7. A method for determining component parameters, characterized in that: The device for determining component parameters according to any one of claims 1 to 6, wherein the method comprises: Obtaining preset waveform requirements for the circuit to be measured; In response to the parameter determination instruction, controlling the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and controlling the second switch unit to connect the adjustable impedance device and the circuit to be measured; generating a device adjustment instruction, and sending the device adjustment instruction to a driving component, so as to adjust the parameters of the adjustable impedance device through the driving component; Acquire first waveform data of the circuit to be measured in real time through a signal acquisition unit; Analyzing the first waveform data and determining whether the first waveform data meets the preset waveform requirements; If the first waveform data meets the preset waveform requirement, a stop instruction is generated, and the stop instruction is sent to the driving component to cause the driving component to stop adjusting the adjustable impedance device; Controlling the second switch unit to disconnect the electrical connection between the adjustable impedance device and the circuit to be measured, and controlling the first switch unit to connect the adjustable impedance device and the parameter measurement unit; The parameters of the adjusted adjustable impedance device are acquired through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured.

8. The component parameter determination method according to claim 7, characterized in that: After obtaining the adjusted parameters of the adjustable impedance device through the parameter measurement unit to obtain the optimal component parameters of the circuit to be measured, the method further includes: Searching a preset component library according to the optimal component parameters, and determining whether there is a component with parameters equal to the optimal component parameters in the component library; If so, determining the optimal component parameters as target component parameters of the circuit to be measured; Otherwise, the absolute value of the difference between the optimal component parameters and the parameters of each component in the component library is calculated to obtain error data corresponding to each component, the parameters to be verified are determined based on the error data, the parameters to be verified are verified through the circuit to be measured, and the target component parameters of the circuit to be measured are determined based on the verification results.

9. The component parameter determination method according to claim 8, characterized in that: Verifying the parameters to be verified by the circuit to be measured and determining target component parameters of the circuit to be measured according to the verification result specifically includes: controlling the driving component to adjust the parameter of the adjustable impedance device according to the parameter to be verified, so that the parameter of the adjustable impedance device is equal to the parameter to be verified; Controlling the first switch unit to disconnect the electrical connection between the adjustable impedance device and the parameter measurement unit, and controlling the second switch unit to connect the adjustable impedance device and the circuit to be measured; Acquiring second waveform data of the circuit to be measured by the signal acquisition unit; Analyzing the second waveform data and determining whether the second waveform data meets the preset waveform requirements; If the second waveform data meets the preset waveform requirement, the parameter to be verified is determined as the target component parameter of the circuit to be measured.

10. The component parameter determination method according to claim 9, characterized in that: The adjustable impedance device is an adjustable resistor; After calculating the absolute value of the difference between the optimal component parameters and the parameters of each component in the component library to obtain error data corresponding to each component, the method further includes: Dividing the component library into a series component set and a parallel component set according to the optimal component parameters; generating a series resistor pair according to the series component set, and calculating a series resistance value of each of the series resistor pairs; Calculating the absolute value of the difference between the optimal component parameter and the series resistance value to obtain error data corresponding to the series resistance pair; generating parallel resistor pairs according to the parallel component set, and calculating the parallel resistance value of each parallel resistor pair; Calculating the absolute value of the difference between the optimal component parameter and the parallel resistance value to obtain error data corresponding to the parallel resistance pair; Determining the parameter to be verified as the target component parameter of the circuit to be measured specifically includes: If the parameter to be verified is the series resistance value of the series resistor pair, the parameters of each component in the series resistor pair are determined as the target component parameters of the circuit to be measured, and a component connection mode is generated, wherein the component connection mode is series connection; If the parameter to be verified is the parallel resistance value of the parallel resistor pair, the parameters of each component in the parallel resistor pair are determined as the target component parameters of the circuit to be measured, and a component connection method is generated, wherein the component connection method is parallel.

Images