Length measuring machine-based step gauge measuring method and step gauge measuring system

Abstract

The invention provides a step gauge measuring method and a step gauge measuring system based on a length measuring machine, the length measuring machine comprises a guide rail, a measuring seat arranged on the guide rail and capable of moving along the guide rail and a measuring head arranged on the measuring seat, the step gauge comprises a plurality of gauge blocks arranged linearly, the step gauge is arranged on one side of the guide rail through a bearing table, and the measuring head is arranged on the measuring seat. With the direction of the guide rail as a first axis, the step gauge measurement method comprises the following steps: enabling the step gauge to be parallel to the guide rail; the measuring head is controlled to move in the direction perpendicular to the first shaft and the measuring seat is controlled to move along the guide rail so that the measuring head can make contact with the to-be-measured surface, the to-be-measured surface, close to the gap between the adjacent measuring blocks, of the adjacent measuring blocks in the multiple measuring blocks is called as a gap surface, and the measuring head firstly moves to the gap between the adjacent measuring blocks and then moves to the gap between the adjacent measuring blocks. Then contacting with the surface of the gap; and recording the position of the measuring seat as the position of the surface to be measured in response to the fact that the stress of the measuring head indicated by the measured value of the measuring head reaches a preset range. Therefore, the equipment cost for measuring the step gauge can be reduced.

Description

Technical Field

[0001] The present disclosure relates to the intelligent manufacturing equipment industry, and in particular to a step gauge measurement method and a step gauge measurement system based on a length measuring machine. Background Art

[0002] A step gauge is a high-precision measuring instrument consisting of multiple gauge blocks arranged in a straight line. It is widely used to calibrate coordinate measuring machines and test the motion accuracy of machine tool worktables. To ensure the accuracy of the step gauge, it must be calibrated before use. This requires measuring each gauge block.

[0003] Currently, step gauge measurement primarily relies on the combined use of a three-dimensional coordinate measuring machine (CMM) and a laser interferometer. The laser interferometer's reflector and step gauge are mounted on the CMM's workbench. The optical path is adjusted so that the laser beam is parallel to the workbench's direction of motion. Each face of the step gauge is aligned with the CMM, and the laser interferometer's indication is used for measurement.

[0004] However, existing step gauge measurement methods suffer from high equipment costs. Coordinate measuring machines and laser interferometers are both high-precision metrology equipment, not only expensive to purchase but also requiring regular maintenance and calibration, resulting in high operating costs. Furthermore, the operation and maintenance of these devices requires specialized technicians, which increases labor costs. Summary of the Invention

[0005] The present disclosure is proposed in view of the above-mentioned situation, and its object is to provide a step gauge measurement method and a step gauge measurement system based on a length measuring machine, which can reduce the equipment cost of measuring the step gauge.

[0006] To this end, a first aspect of the present disclosure provides a step gauge measurement method based on a length measuring machine, the length measuring machine comprising a guide rail, a measuring base disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring base, the step gauge comprising a plurality of gauge blocks arranged in a straight line, the step gauge being disposed on one side of the guide rail via a carrier, with the direction of the guide rail being a first axis, the step gauge measurement method comprising: making the step gauge parallel to the guide rail; controlling the probe to move in a direction perpendicular to the first axis and controlling the measuring base to move along the guide rail so that the probe contacts a surface to be measured, the surface to be measured being a surface to be measured of a gauge block among the plurality of gauge blocks, wherein, for adjacent gauge blocks among the plurality of gauge blocks, the surface to be measured of the adjacent gauge blocks that is close to a gap between the adjacent gauge blocks is referred to as a gap surface, the probe first moving to the gap between the adjacent gauge blocks and then contacting the gap surface; and in response to the force on the gauge block represented by a measurement value of the probe reaching a preset range, recording a position of the measuring base as the position of the surface to be measured.

[0007] In a first aspect of the present disclosure, a step gauge is used to determine the position of a surface to be measured (i.e., to measure the position of the surface to be measured) using a length measuring machine, thereby reducing the equipment cost for the step gauge. Furthermore, the position of the surface to be measured is determined using the position of the measuring base unique to the length measuring machine, and the position of the measuring base is recorded based on the measurement values of the stylus unique to the length measuring machine when the forces acting on each surface to be measured remain substantially the same. This ensures consistent measurement conditions and improves the accuracy of the step gauge. Furthermore, the step gauge is placed on one side of a guide rail. This prevents the length of the step gauge from limiting the range of movement of the measuring base, thereby increasing the measurement range of the step gauge. Furthermore, it prevents the measuring base from colliding with the step gauge, potentially damaging it or the step gauge. Furthermore, it reduces the requirements for the stylus position and minimizes modifications to the original structure of the length measuring machine. Furthermore, the step gauge is placed on one side of the guide rail via a support platform, which secures the step gauge during measurement, reducing interference caused by the step gauge's movement and facilitating adjustment of the step gauge's posture via the support platform. In addition, the probe first moves to the gap between adjacent gauge blocks and then contacts the gap surface. The step-by-step operation makes it easy to control the movement speed of different steps, which can take into account both measurement efficiency and the safety of the probe or the surface to be measured.

[0008] Furthermore, in the step gauge measurement method according to the first aspect of the present disclosure, optionally, a second axis is defined as a direction that is coplanar with and perpendicular to the first axis, and the stylus is parallel to the second axis. In this case, when the step gauge is placed on one side of the guide rail, the probability of the stylus striking the bottom of the step gauge is reduced, thereby reducing the risk of damage to the stylus. Furthermore, the stylus being parallel to the second axis improves the ease with which the stylus can be controlled.

[0009] In addition, in the step gauge measurement method according to the first aspect of the present disclosure, optionally, a second axis is defined as a direction coplanar with and perpendicular to the first axis, and a third axis is defined as a direction perpendicular to both the first and second axes. The support platform can be rotated or tilted about at least the second and third axes. This allows the step gauge's posture to be adjusted.

[0010] In addition, in the step gauge measurement method involved in the first aspect of the present disclosure, optionally, making the step gauge parallel to the guide rail includes: controlling the measuring seat to move along the guide rail so that the probe contacts a reference surface, the reference surface being a surface of a gauge block among the plurality of gauge blocks; repeating the following steps until the change in the measurement value of the probe during the current reciprocating movement is no greater than a preset value: controlling the probe to reciprocate in the direction of the second axis, and in response to the change being greater than the preset value, adjusting the carrier to rotate about the third axis; and repeating the following steps until the change is no greater than the preset value: controlling the probe to reciprocate in the direction of the third axis, and in response to the change being greater than the preset value, adjusting the carrier to rotate about the second axis. In this way, it is convenient to make the step gauge parallel to the guide rail.

[0011] In addition, in the step gauge measurement method according to the first aspect of the present disclosure, the measuring base is optionally controlled to move along the guide rail so that the stylus is aligned with the gap; the stylus is controlled to move in a direction perpendicular to the first axis so that the stylus aligned with the gap enters the gap; and the measuring base is controlled to move along the guide rail so that the stylus located in the gap contacts the gap surface. This further improves both measurement efficiency and the safety of the stylus or the surface to be measured.

[0012] In addition, in the step gauge measurement method according to the first aspect of the present disclosure, optionally, the gap surface includes a first surface to be measured and a second surface to be measured that are opposite to each other. After the probe moves to the gap, it first contacts the first surface to be measured to measure its position, then contacts the second surface to be measured to measure its position, and then measures the position of the next surface to be measured in the gap. This helps to reduce the travel time of the probe and improve measurement efficiency.

[0013] Additionally, in the step gauge measurement method according to the first aspect of the present disclosure, the stylus may optionally be mounted on the measuring base via a fixture; the fixture may be configured to control movement of the stylus in a direction perpendicular to the first axis. In this case, the combination of the measuring base and the fixture enables movement of the stylus in multiple mutually perpendicular directions, thereby facilitating movement of the stylus to a target location (e.g., an adjacent area of a surface to be measured).

[0014] In addition, in the step gauge measurement method according to the first aspect of the present disclosure, the fixture optionally includes a pressure plate, a vertical slider, and a horizontal push rod; the pressure plate is mounted on the measuring base; the vertical slider is vertically movable on a side wall of the pressure plate; and the horizontal push rod is horizontally movable on the vertical slider and connected to the probe. This facilitates control of the probe's movement in the second and third axis directions.

[0015] In addition, in the step gauge measurement method involved in the first aspect of the present disclosure, optionally, the measuring seat includes a driving wheel for controlling the movement of the measuring seat along the guide rail, and a fine-tuning wheel for controlling the fine-tuning movement of the measuring seat along the guide rail; the driving wheel controls the movement of the measuring seat along the guide rail so that the probe is in one of the following states: aligned with an adjacent area of the surface to be measured and in contact with or away from the surface to be measured; after the probe contacts the surface to be measured, the fine-tuning wheel controls the fine-tuning movement of the measuring seat along the guide rail so that the probe force represented by the measurement value reaches the preset range. In this case, it is convenient to move to the vicinity of the target area at a higher speed by using the driving wheel, reducing the travel time to improve the measurement efficiency, and then slowly adjust by using the fine-tuning wheel to reduce the positioning error caused by inertia or overshoot.

[0016] A second aspect of the present disclosure provides a step gauge measurement system based on a length measuring machine, comprising a length measuring machine and a supporting platform, the length measuring machine comprising a guide rail, a measuring base disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring base, the step gauge comprising a plurality of gauge blocks arranged in a straight line, the step gauge being disposed on one side of the guide rail via the supporting platform; with the direction of the guide rail being a first axis, when measuring a surface to be measured of the step gauge, the probe moves in a direction perpendicular to the first axis and the measuring base moves along the guide rail so that the probe contacts the surface to be measured, wherein, for adjacent gauge blocks among the plurality of gauge blocks, the surfaces to be measured of the adjacent gauge blocks that are close to the gap between the adjacent gauge blocks are referred to as gap surfaces, the probe first moves to the gap between the adjacent gauge blocks and then contacts the gap surface, and in response to the probe force indicated by the measurement value of the probe reaching a preset range, the position of the measuring base is recorded and used as the position of the surface to be measured, wherein the surface to be measured is the surface to be measured of the gauge blocks among the plurality of gauge blocks.

[0017] According to the present disclosure, a step gauge measuring method and a step gauge measuring system based on a length measuring machine are provided, which can reduce the equipment cost of measuring the step gauge. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The present disclosure will now be explained in further detail, by way of example only, with reference to the accompanying drawings.

[0019] Figure 1 Schematic diagram showing a measurement environment of a step gauge according to an example of the present disclosure.

[0020] Figure 2 1 is a schematic diagram showing the assembly of the length measuring machine and the clamp involved in the example of the present disclosure.

[0021] Figure 3 is a schematic diagram showing a user interface involved in an example of the present disclosure.

[0022] Figure 4 1 is an exemplary plan view showing a step gauge according to an example of the present disclosure.

[0023] Figure 5 Schematic diagram showing the assembly of the fixture and probe involved in the example of the present disclosure.

[0024] Figure 6 is an exemplary flow chart illustrating a measurement method according to an example of the present disclosure.

[0025] Figure 7 FIG. 1 is an exemplary flow chart illustrating a method of making a step gauge parallel to a guide rail according to an example of the present disclosure.

[0026] Figure 8 Schematic diagram showing a change in position of a probe when measuring gap surfaces between adjacent gauge blocks according to an example of the present disclosure.

[0027] Figure 9 is an exemplary flow chart illustrating contacting a stylus with clearance surfaces of adjacent gauge blocks according to examples of the present disclosure.

[0028] Figure 10 FIG. 1 is an exemplary flow chart illustrating an embodiment of a measurement method according to an example of the present disclosure. DETAILED DESCRIPTION

[0029] Hereinafter, with reference to the accompanying drawings, preferred embodiments of the present disclosure will be described in detail. In the following description, identical symbols are assigned to identical components, and repeated descriptions are omitted. In addition, the accompanying drawings are only schematic diagrams, and the ratio of the dimensions of the components to each other or the shapes of the components, etc. may be different from the actual ones. It should be noted that the terms "include" and "have" in the present disclosure and any variations thereof, such as a process, method, system, product or device that includes or has a series of steps or units, are not necessarily limited to those steps or units clearly listed, but may include or have other steps or units that are not clearly listed or that are inherent to these processes, methods, products or devices.

[0030] To address the above-mentioned issues, the inventors, after research, have proposed a solution based on a length measuring machine, which uses the length measuring machine to measure the step gauge. This reduces the equipment cost for measuring the step gauge. Specifically, the inventors modified the existing length measuring machine structure, which typically places the workpiece on a workbench on the length measuring machine's guide rails. Instead, they placed the step gauge on one side of the guide rails, enabling the length measuring machine to measure the step gauge (i.e., enabling the length measuring machine to be used for step gauge measurements).

[0031] In addition, for ease of description, the surface to be measured of the gauge blocks in the step gauge is referred to as the measured surface. The direction of the guide rail of the length measuring machine is referred to as the first axis, the direction in the same horizontal plane as the first axis and perpendicular to the first axis is referred to as the second axis, and the direction perpendicular to both the first and second axes is referred to as the third axis. Taking the guide rail as the horizontal direction as an example, the direction of the first axis can be the horizontal direction, the direction of the second axis can be another horizontal direction perpendicular to the direction of the first axis, and the direction of the third axis can be the vertical direction. In some examples, the first axis can be referred to as the X-axis, the second axis can be referred to as the Y-axis, and the third axis can be referred to as the Z-axis.

[0032] Figure 1 Schematic diagram showing the measurement environment of the step gauge 200 involved in the example of the present disclosure. Figure 1 FIG. 1 shows a portion of the length measuring machine 100 .

[0033] In some examples, the step gauge measurement method (described later) involved in the examples of the present disclosure can be applied to Figure 1 It should be noted that this does not limit the present disclosure.

[0034] In some examples, reference Figure 1 The measurement environment may include a length measuring machine 100 and a step gauge 200. The length measuring machine 100 may be configured to measure the position of a surface 211 to be measured of the step gauge 200, thereby achieving measurement of the step gauge 200. In some examples, the measurement environment may further include a carrier 300, which may be configured to carry (e.g., support or fix) the step gauge 200. In some examples, the measurement environment may further include a fixture 400, which may be configured to clamp a probe 130 (described later) of the length measuring machine 100 and control the movement of the probe 130 in a non-guide rail direction of the length measuring machine 100.

[0035] Additionally, the length measuring machine 100 may be a length measuring instrument. That is, the length measuring machine 100 may be configured to measure a length parameter of a measured object. In some examples, the length measuring machine 100 may be a contact length measuring machine. In some examples, the contact length measuring machine may include at least one of a grating length measuring machine and a mechanical length measuring machine.

[0036] In some examples, the length measuring machine 100 can be configured to determine positional information of a corresponding position of the measured object (e.g., the position of the measured surface 211 of the step gauge 200) using the position of its measuring base 120 (described later). For example, the measuring base 120 can be moved so that the stylus 130 of the length measuring machine 100 contacts the measured object, and the position of the measuring base 120 corresponding to the corresponding position of the measured object is sampled to obtain positional information of the corresponding position. In some examples, the length measuring machine 100 can be configured to determine positional information of the corresponding position of the measured object using the position of its measuring base 120 and the measurement value of the stylus 130. In some examples, the measuring base 120 can also be referred to as a head base.

[0037] Figure 2 1 is a schematic diagram showing the assembly of the length measuring machine 100 and the clamp 400 according to an example of the present disclosure. Figure 3 is a schematic diagram illustrating a user interface 500 according to an example of the present disclosure.

[0038] In some examples, reference Figure 2 The length measuring machine 100 may include a guide rail 110, a measuring base 120, and a stylus 130. The measuring base 120 may be disposed on the guide rail 110 and may be movable along the guide rail 110. This facilitates determining the position information of the corresponding position of the workpiece under test by the position of the measuring base 120. Furthermore, the stylus 130 may be disposed on the measuring base 120. In this case, the consistency of the contact state between the stylus 130 and the workpiece under test when recording the position of the measuring base 120 can be ensured by combining the measurement value of the stylus 130 (i.e., ensuring the consistency of the measurement conditions), thereby improving the accuracy of measuring the workpiece under test. In some examples, the stylus 130 may be disposed on the measuring base 120 via a fixture 400. In this case, the fixture 400 facilitates adjusting the position of the stylus 130 in the non-guide rail direction in the length measuring machine 100.

[0039] The following describes the relevant components of the length measuring machine 100 by taking the corresponding position of the measured workpiece as the measured surface 211 of the step gauge 200 as an example. It should be noted that this does not limit the present disclosure.

[0040] In some examples, for a grating length measuring machine, the guide rail 110 may include a first grating scale. The position of the measuring base 120 may be determined by the grating value measured by the first grating scale. In other words, the grating value of the first grating scale may represent the position of the measuring base 120. Thus, using a grating length measuring machine can improve the accuracy of the position of the measuring base 120. Furthermore, the grating value measured by the first grating scale may also be referred to as the guide rail grating value. In some examples, the guide rail 110 may include a grating groove, and the first grating scale may be mounted within the grating groove.

[0041] In some examples, reference Figure 2The measuring base 120 may include a driving wheel 121 and a fine-tuning wheel 122. The driving wheel 121 may control the movement of the measuring base 120 along the guide rail 110 (i.e., the driving wheel 121 may initially adjust the position of the measuring base 120). The fine-tuning wheel 122 may control the fine-tuning movement of the measuring base 120 along the guide rail 110 (i.e., the fine-tuning wheel 122 may fine-tune the position of the measuring base 120). In other words, the speed at which the measuring base 120 is moved along the guide rail 110 by the fine-tuning wheel 122 may be slower than the speed at which the measuring base 120 is moved along the guide rail 110 by the driving wheel 121. In this case, the driving wheel 121 may be used to move the measuring base 120 to the vicinity of the target area at a higher speed, reducing travel time and improving measurement efficiency, and then the fine-tuning wheel 122 may be used to adjust the measuring base 120 at a slower speed to reduce positioning errors caused by inertia or overshoot.

[0042] In some examples, reference Figure 2 The measuring base 120 may further include a locking handle 123 for locking the drive wheel 121. Before the measuring base 120 is moved along the guide rail 110 by controlling the fine-tuning wheel 122, the drive wheel 121 may be locked by the locking handle 123. Before the measuring base 120 is moved along the guide rail 110 by controlling the drive wheel 121, the drive wheel 121 may be released by the locking handle 123 in response to the locking state of the locking handle 123. This reduces interference with the drive wheel 121 during fine-tuning of the measuring base 120.

[0043] In some examples, the measuring base 120 may further include a body portion 124 , which may be configured to function as a support. In some examples, the measuring base 120 may further include a measuring rod (not shown) fixed to the body portion 124 .

[0044] Additionally, stylus 130 can be configured to sense the force acting between the measured surface 211 and stylus 130 by contacting the measured surface 211. The measurement value of stylus 130 (i.e., the reading of stylus 130) can represent the force acting on the stylus. Furthermore, the stylus force can refer to the force acting on stylus 130. In other words, the stylus force can be the force acting between the measured surface 211 and stylus 130. In some examples, stylus 130 can be a contact sensor.

[0045] In some examples, when the stylus 130 is not in contact with the surface to be measured 211, the measurement value of the stylus 130 may be a fixed value (e.g., 0). When the stylus 130 is in contact with the surface to be measured 211, the measurement value of the stylus 130 may change relative to the fixed value. In this way, the force applied to the stylus 130 can be determined based on the measurement value of the stylus 130.

[0046] In some examples, for a grating length measuring machine, the stylus 130 may include a second grating scale. The measured value may be the grating value obtained by the second grating scale, in which case the measured value may also be referred to as the stylus grating value. In other words, the grating value of the second grating scale may represent the force acting on the stylus 130. Thus, using a grating length measuring machine can improve the accuracy of the measured value.

[0047] In some examples, reference Figure 2 When measuring the step gauge 200, the stylus 130 can be parallel to the second axis F2. In this case, when the step gauge 200 is placed to one side of the guide rail 110, the probability of the stylus 130 hitting the bottom of the step gauge 200 is reduced, thereby reducing the risk of damage to the stylus 130. Furthermore, the stylus 130 being parallel to the second axis F2 improves the ease of controlling the stylus 130.

[0048] In some examples, the length measuring machine 100 may further include a tailstock 140. In some examples, the position of the tailstock 140 may serve as a reference position for determining the position of the measuring base 120. In some examples, the position of the tailstock 140 may be fixed. In some examples, the tailstock 140 may be configured to assist in supporting and positioning the measured workpiece. In some examples, the tailstock 140 may include a fixed base and a measuring rod (not shown) fixed to the top of the fixed base.

[0049] In some examples, the length measuring machine 100 may further include a worktable (not shown) mounted on the guide rails 110. The worktable may be configured to carry other test pieces in addition to the step gauge 200. That is, the worktable mounted on the guide rails 110 is not the aforementioned support platform 300. In this case, the step gauge 200 can be supported while maintaining the same measurable workpiece types as the length measuring machine 100, facilitating measurement of a wide range of test pieces. This, in turn, increases the measurement range of the length measuring machine 100.

[0050] In addition, the worktable can at least control the rotation and / or tilt of the workpiece. In some examples, the worktable can include at least one of a two-axis worktable and a five-axis worktable.

[0051] In some examples, the length measuring machine 100 may further include a base 150. In some examples, the guide rail 110 and the tailstock 140 may be mounted on the base 150. In some examples, the base 150 may be made of marble. This helps prevent deformation of the length measuring machine 100 during operation and reduces interference from external vibrations, thereby improving the stability and reliability of the length measuring machine 100.

[0052] In some examples, the length measuring machine 100 may further include leveling feet (not shown) disposed below the base 150 . The leveling feet may be configured to adjust the levelness of the base 150 .

[0053] In some examples, the length measuring machine 100 can display measurement data. In some examples, the measurement data can include at least one of the measurement value of the measuring head 130 and the position of the measuring base 120. In some examples, the reference Figure 2 The length measuring machine 100 may include a display device 160 (eg, a display), and the display device 160 may be configured to display measurement data.

[0054] In some examples, the display device 160 may display a user interface 500 (see Figure 3 ), the user interface 500 can be configured to display measurement data and / or set information of the device under test.

[0055] In some examples, reference Figure 3 , the user interface 500 may include a first area 510, and the first area 510 may be configured to display measurement data. As an example, Figure 3 The position of the measuring base 120 is shown in the frame 511 of the first area 510, wherein the position of the measuring base 120 is represented by the grating value of the first grating scale. Figure 3 FIG. 5 also shows an example in which the measurement value of the probe 130 is displayed in the frame 512 of the first area 510 , wherein the measurement value of the probe 130 is represented by the grating value of the second grating scale.

[0056] In some examples, the first area 510 may further include a sampling button 513 . The sampling button 513 may be configured to record the position of the measurement base 120 in response to receiving a click operation from the user.

[0057] In some examples, reference Figure 3 The user interface 500 may further include a second area 520 , which may be configured to set information of the device under test (eg, select a standard of the device under test and input parameters such as specifications of the device under test).

[0058] Figure 4 FIG. 1 is an exemplary plan view showing a step gauge 200 according to an example of the present disclosure.

[0059] In some examples, reference Figure 1 and Figure 4 The step gauge 200 may include a plurality of gauge blocks 210 arranged in a straight line. There may be gaps between adjacent gauge blocks of the plurality of gauge blocks 210.

[0060] In addition, the surface to be measured 211 of the gauge block 210 may be located between the two ends of the step gauge 200 (see Figure 4 The first surface to be measured 211a and the second surface to be measured 211b in the figure may also be located at the end of the step gauge 200 (see Figure 4Therefore, the adjacent area of the surface to be measured 211 may include at least one of the gaps between adjacent gauge blocks in the plurality of gauge blocks 210 and the area near the end of the step gauge 200. For ease of description, the surface to be measured 211 near the gap of the adjacent gauge blocks is referred to as the gap surface. Figure 4 , the gap surface may include a first surface to be measured 211 a and a second surface to be measured 211 b opposite to each other.

[0061] In addition, the step gauge 200 may be disposed at a position that does not block the movement of the measuring base 120 . For example, the step gauge 200 may not be disposed on the workbench on the guide rail 110 .

[0062] In some examples, the step gauge 200 can be placed on one side of the guide rail 110. In this case, when measuring the step gauge 200, the length of the step gauge 200 can be prevented from limiting the range of movement of the measuring base 120, thereby increasing the measurement range of the step gauge 200 (i.e., enabling measurement of longer step gauges 200). Furthermore, the measurement base 120 can be prevented from colliding with the step gauge 200, thereby damaging the measuring base 120 or the step gauge 200. Furthermore, the position requirements for the stylus 130 can be reduced (for example, if the step gauge 200 is placed on a workbench on the guide rail 110, the length of the step gauge 200 limits the range of movement of the measuring base 120, and consideration must be given to whether the range of movement of the stylus 130 in the direction of the guide rail is sufficient to cover the area to be measured by the step gauge 200). Furthermore, modifications to the original structure of the length measuring machine 100 can be reduced.

[0063] In some examples, the step gauge 200 can be placed on one side of the guide rail 110 via the carrier 300. Figure 1 , the carrying platform 300 can be placed on one side of the guide rail 110, and the step gauge 200 can be placed on the carrying platform 300. In this case, the step gauge 200 can be fixed during measurement to reduce interference caused by the shaking of the step gauge 200.

[0064] In some examples, the step gauge 200 may also be placed above the guide rail 110 to allow the measuring base 120 to pass through. For example, the probe 130 may be parallel to the third axis F3 and pass under the step gauge 200 as the measuring base 120 moves, thereby measuring each surface 211 to be measured.

[0065] As described above, the support platform 300 can be configured to support the step gauge 200. In some examples, the support platform 300 can be rotated or tilted at least about the second axis F2 and the third axis F3, thereby enabling the posture of the step gauge 200 to be adjusted.

[0066] Figure 5FIG. 1 is a schematic diagram showing an exemplary assembly of the fixture 400 and the probe 130 according to an example of the present disclosure.

[0067] In addition, to increase the number of movement directions for the stylus 130, the inventors have also designed a fixture 400 that controls the movement of the stylus 130 in a direction other than the guide rail (i.e., a direction other than the first axis F1). In some examples, the fixture 400 can be configured to control the movement of the stylus 130 in a direction perpendicular to the first axis F1. In this case, the combination of the measuring base 120 and the fixture 400 enables the stylus 130 to move in multiple mutually perpendicular directions, thereby facilitating movement of the stylus 130 to a target location (e.g., an area adjacent to the surface to be measured 211). In some examples, the fixture 400 can be configured to control the movement of the stylus 130 in the direction of the second axis F2 and the direction of the third axis F3.

[0068] In some examples, reference Figure 5 The fixture 400 may include a pressure plate 410, a vertical slider 420, and a horizontal push rod 430. The pressure plate 410 may be mounted on the measuring base 120, the vertical slider 420 may be disposed on the side wall of the pressure plate 410 in a manner that allows it to move in the vertical direction, and the horizontal push rod 430 may be disposed on the vertical slider 420 in a manner that allows it to move in the horizontal direction and be connected to the measuring head 130. This facilitates controlling the movement of the measuring head 130 in the direction of the second axis F2 and the direction of the third axis F3. In addition, the horizontal push rod 430 may be used to control the movement of the measuring head 130 in the direction of the second axis F2 by pushing or pulling the horizontal push rod 430. In some examples, the pressure plate 410 may be mounted on the measuring base 120 by screws.

[0069] In some examples, reference Figure 5 The fixture 400 may further include a vertical push rod 440, which may be disposed on the pressure plate 410 and configured to control the movement of the vertical slider 420 along the third axis F3. Thus, the vertical push rod 440 can be used to control the movement of the probe 130 along the third axis F3 by pushing or pulling the vertical push rod 440.

[0070] The examples of the present disclosure relate to a step gauge measurement method (also referred to as a step gauge calibration method, a step gauge calibration method, etc.) based on a length measuring machine 100. When the step gauge 200 is positioned on one side of a guide rail 110, the length measuring machine 100 is used to measure the step gauge 200. In some examples, the stylus 130 can be parallel to the second axis F2. The step gauge measurement method based on the length measuring machine 100 involved in the examples of the present disclosure will hereinafter be referred to as the measurement method. It should be noted that, unless there is a conflict, the above descriptions regarding the length measuring machine 100, step gauge 200, support platform 300, and fixture 400 also apply to the measurement method.

[0071] Figure 6is an exemplary flow chart illustrating a measurement method according to an example of the present disclosure.

[0072] In some examples, reference Figure 6 The measurement method may include aligning the step gauge 200 with the guide rail 110 of the length measuring machine 100 (step S101), controlling the measuring base 120 of the length measuring machine 100 to move along the guide rail 110 and controlling the stylus 130 of the length measuring machine 100 to move in a direction perpendicular to the first axis F1 so that the stylus 130 contacts the surface to be measured 211 (step S102), and in response to the stylus force indicated by the measurement value of the stylus 130 reaching a preset range (i.e., the force between the stylus 130 and the surface to be measured 211 reaches a certain level), recording the position of the measuring base 120 as the position of the surface to be measured 211 (step S103). In this case, using the length measuring machine 100 to measure the step gauge 200 to obtain the position of the surface to be measured 211 (i.e., measuring the position of the surface to be measured 211) can reduce the equipment cost for measuring the step gauge 200. In addition, the position of the measuring base 120 unique to the length measuring machine 100 is used to determine the position of the surface to be measured 211. In combination with the measurement value of the stylus 130 unique to the length measuring machine 100, the position of the measuring base 120 is recorded when the forces acting on each surface to be measured 211 remain substantially the same. This ensures consistency in measurement conditions, thereby improving the accuracy of the measuring step gauge 200.

[0073] In some examples, reference Figure 6 In step S101, the step gauge 200 can be placed on one side of the guide rail 110 via the carrier 300, and the carrier 300 can be adjusted to make the step gauge 200 parallel to the guide rail 110. In addition, the step gauge 200 being parallel to the guide rail 110 can mean that the axis of the step gauge 200 is parallel to the axis of the guide rail 110.

[0074] Figure 7 FIG. 1 is an exemplary flow chart illustrating the process of making the step gauge 200 parallel to the guide rail 110 according to an example of the present disclosure.

[0075] In some examples, the step gauge 200 can be adjusted to determine whether it is parallel to the guide rail 110 by combining the measurement value of the probe 130. To this end, the examples of the present disclosure also provide an exemplary process for adjusting the carrier 300 to make the step gauge 200 parallel to the guide rail 110. When controlling the probe 130 to move in the direction of one of the second axis F2 and the third axis F3, the carrier 300 is adjusted to rotate around the other axis and the change in the measurement value of the probe 130 is combined to confirm whether the reference plane is parallel to the axis. Figure 7 , the exemplary process includes:

[0076] Step S201 : controlling the measuring base 120 to move along the guide rail 110 so that the probe 130 contacts a reference surface.

[0077] Alternatively, the reference surface may be a surface of a gauge block 210 among the plurality of gauge blocks 210. That is, the reference surface may be a surface of any gauge block 210 among the plurality of gauge blocks 210. In some examples, the reference surface may be a surface of a gauge block 210 at the end of the step gauge 200, such as two surfaces at both ends of the step gauge 200. This facilitates quick positioning of the reference surface. In some examples, there may be multiple reference surfaces.

[0078] Step S202 : controlling the probe 130 to reciprocate in the direction of the second axis F2 .

[0079] In some examples, the movement of the stylus 130 in the direction of the second axis F2 can be controlled by the horizontal push rod 430. In some examples, the measurement value of the stylus 130 can be recorded or observed during the movement process.

[0080] Step S203 : determining whether the change in the measurement value of the probe 130 during the current reciprocating movement is greater than a preset value.

[0081] If the change is greater than the preset value, step S204 is executed. That is, during the movement of the probe 130, if the measurement value of the probe 130 changes, step S204 is executed. If the change is not greater than the preset value, step S205 is executed.

[0082] Step S204: Adjust the support platform 300 to rotate around the third axis F3. In some examples, after executing step S204, step S202 may be continued.

[0083] In other words, steps S202 and S204 are repeatedly executed until the measured value of the stylus 130 during the current reciprocating movement does not change by more than a preset value. This allows the reference plane to be parallel to the second axis F2. In other words, the stylus 130 maintains contact with the reference plane as it moves in the direction of the second axis F2. If the reference plane is not parallel to the second axis F2, the measured value will change. If the reference plane is parallel to the second axis F2, the measured value may remain unchanged or change only slightly.

[0084] In addition, the present disclosure does not specifically limit the value of the preset value, and the preset value can be any value that can measure whether the reference plane is considered to be parallel to the axis (such as the second axis F2 or the third axis F3). In some examples, an appropriate preset value can be selected based on calibration requirements.

[0085] Step S205 : controlling the probe 130 to move back and forth in the direction of the third axis F3 .

[0086] In some examples, the stylus 130 can be controlled to move in the direction of the third axis F3 by the vertical push rod 440. In some examples, the measurement value of the stylus 130 can be recorded or observed during the movement process.

[0087] Step S206 : determining whether the change in the measurement value of the probe 130 during the current reciprocating movement is greater than a preset value.

[0088] If the change is greater than the preset value, step S207 is executed. That is, during the movement of the probe 130, if the measurement value of the probe 130 changes, step S207 is executed. If the change is not greater than the preset value, the execution is terminated.

[0089] Step S207: adjusting the support platform 300 to rotate around the second axis F2.

[0090] In some examples, after executing step S207 , step S205 may be continued.

[0091] That is, steps S205 and S207 are repeated until the change in the measured value of the probe 130 during the current reciprocating movement is no greater than a preset value. This allows the reference plane to be parallel to the third axis F3. The basic principles are similar to those of steps S202 and S204 and will not be repeated here.

[0092] In some examples, reference Figure 6 In step S102, the probe 130 is brought into contact with the surface to be measured 211 by combining two movement modes of the probe 130, namely, controlling the measuring base 120 of the length measuring machine 100 to move along the guide rail 110 and controlling the probe 130 of the length measuring machine 100 to move in a direction perpendicular to the first axis F1.

[0093] In some examples, the direction perpendicular to the first axis F1 may include at least one of the direction of the second axis F2 and the direction of the third axis F3. That is, the measuring head 130 can be brought into contact with the surface to be measured 211 by controlling the measuring base 120 of the length measuring machine 100 to move along the guide rail 110 and controlling the measuring head 130 to move in any direction perpendicular to the guide rail.

[0094] In some examples, the stylus 130 can be controlled to move in a direction perpendicular to the first axis F1 and the measuring base 120 can be controlled to move along the guide rail 110 so that the stylus 130 first moves to an area adjacent to the surface to be measured 211 and then contacts the surface to be measured 211. In other words, the stylus 130 is first moved to the vicinity of the surface to be measured 211 and then contacts the surface to be measured 211. In this case, the step-by-step operation facilitates control of the movement speed of different steps, which can balance measurement efficiency and the safety of the stylus 130 or the surface to be measured 211 (for example, the risk of damage to the stylus 130 or the surface to be measured 211 can be reduced). In some examples, before the stylus 130 moves to the area adjacent to the surface to be measured 211, the measuring base 120 can be controlled to move along the guide rail 110 so that the stylus 130 is aligned with the area adjacent to the surface to be measured 211. That is, when the position of a certain surface to be measured 211 is to be measured, the probe 130 can first be aligned with an adjacent area of the surface to be measured 211, then moved to the adjacent area of the surface to be measured 211, and then contacted with the surface to be measured 211. In this way, both measurement efficiency and the safety of the probe 130 or the surface to be measured 211 can be further taken into account.

[0095] As described above, the measuring base 120 may include a drive wheel 121. In some examples, the drive wheel 121 may be used to control the measuring base 120 to move along the guide rail 110 so that the probe 130 is in one of the following states: aligned with an adjacent area of the surface to be measured 211, in contact with the surface to be measured 211, or moved away from the surface to be measured 211. In some examples, the drive wheel 121 may be used to control the measuring base 120 to move along the guide rail 110 so that the probe 130: first aligned with an adjacent area of the surface to be measured 211, then in contact with the surface to be measured 211 after the probe 130 moves to the adjacent area of the surface to be measured 211, and then moved away from the surface to be measured 211 after completing the measurement of the surface to be measured 211.

[0096] The following describes the process of the probe 130 contacting the surface to be measured 211 by taking the adjacent areas of the surface to be measured 211 as the gaps between adjacent gauge blocks as an example. Figure 8 1 is a schematic diagram illustrating a position change of the stylus 130 when measuring the gap surfaces of adjacent gauge blocks according to an example of the present disclosure. Figure 9 FIG. 1 is an exemplary flow chart illustrating contacting the stylus 130 with the clearance surfaces of adjacent gauge blocks according to an example of the present disclosure.

[0097] For adjacent gauge blocks in the plurality of gauge blocks 210, the adjacent area of the surface to be measured 211 may be the gap between the adjacent gauge blocks. That is, in some examples, the probe 130 may be controlled to move in a direction perpendicular to the first axis F1 and the measuring base 120 may be controlled to move along the guide rail 110 so that the probe 130 first moves to the gap between the adjacent gauge blocks and then contacts the gap surface. Specifically, the probe 130 may be controlled to move in a direction perpendicular to the first axis F1 so that the probe 130 enters the gap (see Figure 8 102), the measuring base 120 is controlled to move along the guide rail 110 so that the probe 130 located in the gap contacts the gap surface of the adjacent gauge block (see Figure 8 In some examples, before the probe 130 moves to the gap between adjacent gauge blocks, the measuring base 120 may be controlled to move along the guide rail 110 so that the probe 130 is aligned with the gap between adjacent gauge blocks (see FIG. Figure 8 box D101).

[0098] As described above, the direction perpendicular to the first axis F1 may include at least one of the direction of the second axis F2 and the direction of the third axis F3. To this end, the example disclosed herein further provides an exemplary process for controlling the probe 130 to move in the direction of the second axis F2 and controlling the measuring base 120 to move along the guide rail 110 so that the probe 130 contacts the gap surface, wherein the probe 130 enters the gap between adjacent gauge blocks from the side of the step gauge 200. Figure 9 , the exemplary process may include:

[0099] Step S301: Control the measuring base 120 to move along the guide rail 110 so that the probe 130 is aligned with the gap between adjacent gauge blocks (see Figure 8 box D101).

[0100] Step S302: Control the probe 130 to move in the direction of the second axis F2 so that the probe 130 aligned with the gap enters the gap (see Figure 8 box D102).

[0101] Step S303: Control the measuring base 120 to move along the guide rail 110 so that the probe 130 located in the gap contacts the gap surface of the adjacent gauge block (see Figure 8 ).

[0102] Furthermore, the process of controlling the movement of the stylus 130 in the direction of the third axis F3 and the movement of the measuring head 120 along the guide rail 110 to bring the stylus 130 into contact with the surface to be measured 211 is similar to the exemplary process, and similar details are not repeated here. For example, the stylus 130 can enter the gap between adjacent gauge blocks from above the step gauge 200. Specifically, the stylus 130 can be positioned above the step gauge 200, the measuring head 120 can be controlled to move along the guide rail 110 to align the stylus 130 with the gap, and the stylus 130 can be controlled to move in the direction of the third axis F3 to allow the stylus 130, already aligned with the gap, to enter the gap.

[0103] In some examples, when measuring gap surfaces, after the stylus 130 moves to the gap between adjacent gauge blocks, it can first contact the first measured surface 211a to measure its position, then contact the second measured surface 211b to measure its position, and then measure the position of the next gap surface. That is, it first contacts the first measured surface 211a to determine its position, and then contacts the second measured surface 211b to determine its position. This helps reduce the travel time of the stylus 130 and improve measurement efficiency. For details on how to determine the position of a single measured surface 211 after contact, see step S103.

[0104] As described above, the stylus 130 can be brought into contact with the surface to be measured 211. In some examples, when the measurement value of the stylus 130 begins to change relative to a fixed value (for example, when a reading is obtained on the second scale of the stylus 130), the stylus 130 can be considered to be in contact with the surface to be measured 211. This facilitates improving the consistency of controlling the contact between the stylus 130 and the surface to be measured 211.

[0105] As described above, the measuring stand 120 may include a fine adjustment wheel 122. In some examples, reference Figure 6 In step S103, after the stylus 130 contacts the measured surface 211, the measuring base 120 can be finely moved along the guide rail 110 using the fine adjustment wheel 122 to ensure that the stylus force, as indicated by the measured value, falls within a predetermined range. In this case, fine adjustment of the measuring base 120's position using the fine adjustment wheel 122 of the length measuring machine 100 ensures that the forces acting on each measured surface 211 remain substantially the same, thereby reducing measurement errors.

[0106] Furthermore, the present disclosure does not specifically limit the value of the preset range; an appropriate preset range can be selected based on calibration requirements. In some examples, based on calibration requirements, a suitable range can be selected from a measurement value of 0.0001 mm (millimeter) to 0.5 mm to represent the preset range to which the probe force is to be applied. For example, when the measurement value is 0.3 ± 0.001 mm, the force between the probe 130 and the surface to be measured 211 can be considered to have reached a certain level.

[0107] In some examples, the position of the measurement mount 120 may be recorded by clicking a sample button 513 of the user interface 500 .

[0108] In some examples, the plurality of surfaces to be measured 211 of the step gauge 200 can be traversed to obtain the positions of the plurality of surfaces to be measured 211. In some examples, after completing the measurement of the current surface to be measured 211, the probe 130 can be moved away from the current surface to be measured 211 by controlling the probe 130 to move in a direction perpendicular to the first axis F1 and controlling the measuring base 120 to move along the guide rail 110, and the measurement of the next surface to be measured 211 can be continued until the measurement of the surface of each of the plurality of gauge blocks 210 of the step gauge 200 is completed. In some examples, the plurality of surfaces to be measured 211 of the step gauge 200 can be traversed in order from one end of the step gauge 200 to the other end.

[0109] Take the gap surfaces of adjacent gauge blocks as an example. In some examples, after completing the measurement of at least one surface to be measured 211 of the gap surface of the current adjacent gauge block, the probe 130 can be moved out of the gap between the current adjacent gauge blocks by controlling the probe 130 to move in a direction perpendicular to the first axis F1 (e.g., the direction of the second axis F2 or the direction of the third axis F3) and controlling the measuring base 120 to move along the guide rail 110 (see Figure 8 105), and continue to measure the position of the next surface to be measured 211 (for example, the gap surface of the next adjacent gauge block (see Figure 8 Frame D106) or the surface to be measured 211) at the end, until the measurement of the surface of each gauge block 210 in the plurality of gauge blocks 210 of the step gauge 200 is completed.

[0110] Figure 10 This is an exemplary flow chart showing an embodiment of the measurement method involved in the example of the present disclosure. The example of the present disclosure also provides an embodiment of the measurement method, referring to Figure 8 and Figure 10 , the embodiment includes:

[0111] Step S401 : Make the guide rail 110 and the step gauge 200 parallel.

[0112] Step S402 : Rotate the driving wheel 121 to move the measuring base 120 , so that the probe 130 is aligned with the gap between adjacent gauge blocks.

[0113] Step S403 : Controlling the probe 130 to move along the second axis F2 to enter the gap between adjacent gauge blocks. As described above, in some examples, the probe 130 may be controlled to move along the second axis F2 by the fixture 400 .

[0114] Step S404 : rotating the driving wheel 121 to move the measuring base 120 , so that the measuring head 130 contacts a surface to be measured 211 of the gap surface.

[0115] Step S405 : Lock the driving wheel 121 by locking the handle 123 .

[0116] Step S406: Rotate the fine-tuning wheel 122 so that the force between the stylus 130 and the measured surface 211 reaches a preset range. The force can be determined based on the measurement value of the stylus 130. In some examples, for measurement values represented by the grating values of the second grating scale, when the measured surfaces 211 face opposite directions (e.g., the first measured surface 211a and the second measured surface 211b), the grating values may be opposite, and the preset range represented by the preset grating value range is also opposite.

[0117] Step S407 : Recording the position of the measuring base 120 . As described above, in some examples, the position of the measuring base 120 may be a grating value of the first grating scale of the guide rail 110 .

[0118] Step S408 : releasing the driving wheel 121 by locking the handle 123 .

[0119] Step S409: Rotate the drive wheel 121 to move the measuring base 120, so that the probe 130 contacts the other surface to be measured 211 of the gap surface to measure the position of the other surface to be measured 211. In other words, steps S405 to S408 are repeated to obtain the position of the measuring base 120 corresponding to the other surface to be measured 211 of the gap surface.

[0120] This embodiment further includes moving the probe 130 out of the gap between adjacent gauge blocks and repeating steps S402 to S409 until the gap surfaces of each adjacent gauge block of the step gauge 200 are measured. Furthermore, for measuring the surface to be measured 211 at the end of the step gauge 200, the probe 130 can be aligned with an area adjacent to the surface to be measured 211 and then similar measurements can be performed on the gap surfaces, which will not be further described here.

[0121] In addition, the examples of the present disclosure also relate to a step gauge measurement system (also referred to as a step gauge calibration system, or a step gauge calibration system, etc.) based on the length measuring machine 100. It should be noted that, unless there is a contradiction, the relevant description of the above measurement method is also applicable to the step gauge measurement system.

[0122] In some examples, a step gauge measurement system may include a length measuring machine 100 and a carrier 300. The length measuring machine 100 may include a guide rail 110, a measuring base 120, and a stylus 130. The measuring base 120 may be mounted on the guide rail 110 and movable along the guide rail 110. The stylus 130 may be mounted on the measuring base 120. Furthermore, the step gauge 200 may be mounted on one side of the guide rail 110 of the length measuring machine 100 via the carrier 300.

[0123] In some examples, when the step gauge measurement system measures the surface to be measured 211 of the step gauge 200, the measuring base 120 can move along the guide rail 110 and the probe 130 can move in a direction perpendicular to the first axis F1 so that the probe 130 contacts the surface to be measured 211. In response to the probe force represented by the measurement value of the probe 130 reaching a preset range, the position of the measuring base 120 is recorded and used as the position of the surface to be measured 211.

[0124] In some examples, the step gauge measurement system may further include a fixture 400 . The probe 130 may be disposed on the measurement base 120 via the fixture 400 .

[0125] Although the present disclosure has been described in detail above with reference to the accompanying drawings and examples, it will be understood that the above description does not limit the present disclosure in any form. Those skilled in the art may modify and change the present disclosure as needed without departing from the spirit and scope of the present disclosure, and such modifications and variations all fall within the scope of the present disclosure.

Claims

1. A method for measuring a step gauge using a length measuring machine, wherein the length measuring machine comprises a guide rail, a measuring base disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring base, wherein the step gauge comprises a plurality of gauge blocks arranged in a straight line, wherein: The step gauge is set on one side of the guide rail through a supporting platform, with the direction of the guide rail as the first axis, and the step gauge measurement method includes: making the step gauge parallel to the guide rail; controlling the probe to move in a direction perpendicular to the first axis and controlling the measuring seat to move along the guide rail to make the probe contact with the surface to be measured, and the surface to be measured is the surface to be measured of the gauge blocks among the multiple gauge blocks, wherein, for adjacent gauge blocks among the multiple gauge blocks, the surface to be measured of the adjacent gauge blocks close to the gap between the adjacent gauge blocks is called the gap surface, the probe first moves to the gap between the adjacent gauge blocks, and then contacts the gap surface; and in response to the probe force represented by the measurement value of the probe reaching a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured.

2. The step gauge measurement method according to claim 1, characterized in that: A direction that is in the same horizontal plane as the first axis and perpendicular to the first axis is taken as the second axis, and the probe is parallel to the second axis.

3. The step gauge measurement method according to claim 1, characterized in that: The direction in the same horizontal plane as the first axis and perpendicular to the first axis is the second axis, and the direction perpendicular to both the first axis and the second axis is the third axis. The supporting platform can rotate or tilt around at least the second axis and the third axis.

4. The step gauge measurement method according to claim 3, characterized in that: Making the step gauge parallel to the guide rail includes: controlling the measuring seat to move along the guide rail so that the probe contacts a reference surface, wherein the reference surface is a surface of a gauge block among the plurality of gauge blocks; Repeat the following steps until the change in the measurement value of the probe during the current reciprocating movement is no greater than a preset value: controlling the probe to reciprocate in the direction of the second axis, and in response to the change being greater than the preset value, adjusting the carrier to rotate about the third axis; and Repeat the following steps until the variation is no greater than the preset value: control the probe to move back and forth in the direction of the third axis, and in response to the variation being greater than the preset value, adjust the support platform to rotate around the second axis.

5. The step gauge measurement method according to claim 1, characterized in that: The measuring seat is controlled to move along the guide rail so that the probe is aligned with the gap; the probe is controlled to move in a direction perpendicular to the first axis so that the probe aligned with the gap enters the gap; and the measuring seat is controlled to move along the guide rail so that the probe located in the gap contacts the gap surface.

6. The step gauge measurement method according to claim 1, characterized in that: The gap surface includes a first surface to be measured and a second surface to be measured that are opposite to each other. After the probe moves to the gap, it first contacts the first surface to be measured to measure the position of the first surface to be measured, then contacts the second surface to be measured to measure the position of the second surface to be measured, and then measures the position of the next gap surface.

7. The step gauge measuring method according to any one of claims 1 to 6, characterized in that: The probe is arranged on the measuring seat through a fixture; the fixture is configured to control the probe to move in a direction perpendicular to the first axis.

8. The step gauge measurement method according to claim 7, characterized in that: The fixture includes a pressure plate, a vertical slider and a horizontal push rod; the pressure plate is installed on the measuring seat; the vertical slider is arranged on the side wall of the pressure plate in a manner that can be moved in the vertical direction; the horizontal push rod is arranged on the vertical slider in a manner that can be moved in the horizontal direction and is connected to the probe.

9. The step gauge measurement method according to claim 1, characterized in that: The measuring seat includes a driving wheel for controlling the movement of the measuring seat along the guide rail, and a fine adjustment wheel for controlling the fine movement of the measuring seat along the guide rail; Controlling the measuring seat to move along the guide rail by the driving wheel so that the measuring head is in one of the following states: aligning with an adjacent area of the surface to be measured and contacting or moving away from the surface to be measured; After the measuring head contacts the surface to be measured, the measuring base is controlled by the fine adjustment wheel to move slightly along the guide rail so that the measuring head force represented by the measurement value reaches the preset range.

10. A step gauge measurement system based on a length measuring machine, comprising a length measuring machine and a carrier platform, wherein the length measuring machine comprises a guide rail, a measuring base disposed on the guide rail and movable along the guide rail, and a probe disposed on the measuring base, and the step gauge comprises a plurality of gauge blocks arranged in a straight line, characterized in that: The step gauge is set on one side of the guide rail through the support platform; with the direction of the guide rail as the first axis, when measuring the surface to be measured of the step gauge, the probe moves in a direction perpendicular to the first axis and the measuring seat moves along the guide rail to make the probe contact with the surface to be measured, wherein, for adjacent gauge blocks among the multiple gauge blocks, the surface to be measured of the adjacent gauge blocks close to the gap between the adjacent gauge blocks is called the gap surface, the probe first moves to the gap between the adjacent gauge blocks, and then contacts the gap surface, in response to the probe force represented by the measurement value of the probe reaching a preset range, the position of the measuring seat is recorded and used as the position of the surface to be measured, wherein the surface to be measured is the surface to be measured of the gauge blocks among the multiple gauge blocks.

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