Pin detection tool

Abstract

The invention relates to a pin detection jig which is used for detecting pins of a backlight module, the backlight module is provided with a plurality of pin groups, each pin group is provided with a plurality of to-be-detected pins which are electrically communicated with one another, each to-be-detected pin is provided with a corresponding pin clamping groove, and the pin detection jig comprises a power supply unit, a connecting unit and an indicating device, the connecting unit comprises a first connecting module and a second connecting module which are electrically connected with different potential ends of the power supply unit respectively, and the first connecting module and the second connecting module are clamped with pin clamping grooves of different to-be-tested pins in the same pin group respectively; the plurality of indication units are respectively arranged in series on an electric connection path formed by the first connection module, the power supply unit and the second connection module which are electrically connected with each to-be-tested pin. According to the pin detection jig, efficient and accurate detection is realized, and the cost and the manpower consumption are reduced.

Description

Technical Field

[0001] The present application relates to the technical field of backlight module detection, and in particular to a pin detection jig. Background Art

[0002] In the production process of light-emitting diode (LED) backlight modules, LED testing is a critical step in ensuring their quality. Currently, fixtures are commonly used to test LEDs to determine whether they are functioning properly when powered. However, existing module testing technology has exposed some limitations in practical applications.

[0003] Current testing methods primarily focus on overall inspection of LED pins. This approach has limited accuracy and cannot delve into individual pins to accurately reveal their specific conduction status. Due to this limited testing capability, even after lighting tests during production, power-on anomalies, such as backlight failure or instability, can frequently occur during subsequent motherboard testing at the manufacturer. These failures not only impact overall product quality but can also cause significant inconvenience to users and potentially increase after-sales repair costs.

[0004] Therefore, there is an urgent need for a method that can realize efficient and accurate detection of each pin connected in multiple LED backlight modules. Summary of the Invention

[0005] Based on this, it is necessary to provide a pin detection fixture to address the problem in the prior art that it is impossible to achieve efficient and accurate detection of connected pins in multiple LED backlight modules.

[0006] To achieve the above objectives, on the one hand, the present application provides a pin detection fixture for detecting the pins of a backlight module, wherein the backlight module is provided with a plurality of pin groups, each of the pin groups is provided with a plurality of pins to be tested that are electrically connected to each other, and each of the pins to be tested is provided with a corresponding pin slot, and the pin detection fixture comprises:

[0007] Power supply unit;

[0008] A connection unit, comprising at least one first connection module and at least one second connection module, wherein the first connection module and the second connection module are respectively electrically connected to different potential ends of the power supply unit, wherein the first connection module and the second connection module are respectively used to engage with the pin slots of different pins to be tested in each pin group;

[0009] The indicating device includes a plurality of indicating units, which are respectively arranged in series on an electrical connection path formed by the first connection module, the power supply unit, and the second connection module electrically connected to each pin to be tested.

[0010] In one embodiment, the first connection module includes a first connection plug, which is used to engage with the pin slot at the corresponding pin to be tested, and / or the second connection module includes a second connection plug, which is used to engage with the pin slot at the corresponding pin to be tested.

[0011] In one embodiment, the first connection module further includes a first connection line, and the first connection plug is arranged at one end of the first connection line, and / or the second connection module further includes a second connection line, and the first connection plug is arranged at one end of the second connection line.

[0012] In one embodiment, the first connecting plug is a detachable structure, and / or the second connecting plug is a detachable structure.

[0013] In one embodiment, the first connection module includes multiple modules, and the first connection module is used to respectively engage and connect with the pin slot of one of the pins to be tested in each pin group; the second connection module includes multiple modules, and the second connection module is used to respectively engage and connect with the pin slots of the remaining pins to be tested in the same pin group.

[0014] In one embodiment, the indicator device is located on the electrical connection path between the second connection module and the power supply unit.

[0015] In one embodiment, the indicating device further includes a first connecting part and a second connecting part, the first connecting part is connected to a potential end of the power supply unit, and the plurality of indicating units are electrically connected to the first connecting part through the corresponding second connecting parts, and the other end of each indicating unit is electrically connected to the second connection module.

[0016] In one embodiment, the indication unit comprises an optical indication device.

[0017] In one embodiment, the power supply unit includes a battery power supply, a rechargeable battery pack or an external DC power adapter, and the supply voltage of the power supply unit is adapted to the operating voltage of the indicating device.

[0018] In one embodiment, the pin detection fixture further includes a fixing device for firmly mounting the power supply unit and the indicating device.

[0019] The pin detection fixture of the present application has the following beneficial effects: by setting up a pin detection fixture including a power supply unit, a connection unit and an indication device, and electrically connecting the first connection module and the second connection module to different potential ends of the power supply unit, and then respectively engaging with the pin slots of different pins to be tested in each pin group in the backlight module, accurate detection of the electrical connection status of each pin to be tested can be achieved, the operation process is simple, and the detection efficiency is improved; the multiple indication units on the indication device are arranged in series on the electrical connection path, which can quickly, in real time and intuitively reflect the conduction status of each pin to be tested, and realize independent and efficient detection of each pin to be tested in the pin group, significantly improving the accuracy and reliability of the detection, and by timely discovering abnormal conduction or poor connection of the pin to be tested, it can effectively avoid power-on abnormalities and backlight not lighting or flickering problems in the mainboard testing link, thereby greatly improving the production qualification rate and operation stability of the whole machine. In addition, the detection fixture of the present application has a simple structure, is easy to operate, and can be easily integrated into the testing process of the production line, reducing the detection cost and human resource consumption, and reducing the frequency of after-sales maintenance and related expenses. It has important practical value and broad promotion and application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the conventional technology, the following briefly introduces the drawings required for use in the embodiments or the conventional technology descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0021] Figure 1 Schematic diagram of the structure of a pin detection fixture provided in one embodiment.

[0022] Description of reference numerals:

[0023] 1-backlight module, 11-pin group, 111-test pin, 2-power supply unit, 3-connection unit, 31-first connection module, 32-second connection module, 4-indication device, 41-indication unit, 42-first connection part, 43-second connection part. DETAILED DESCRIPTION

[0024] To facilitate understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The accompanying drawings provide embodiments of the present application. However, the present application may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to make the disclosure of the present application more thorough and comprehensive.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application.

[0026] It should be understood that when an element or layer is referred to as being "on, adjacent to, connected to, or coupled to" another element or layer, it can be directly on, adjacent to, connected to, or coupled to the other element or layer, or there can be intervening elements or layers. In contrast, when an element is referred to as being "directly on, directly adjacent to, directly connected to, or directly coupled to" another element or layer, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers, doping types, and / or portions, these elements, components, regions, layers, doping types, and / or portions should not be limited by these terms. These terms are merely used to distinguish one element, component, region, layer, doping type, or portion from another element, component, region, layer, doping type, or portion. Therefore, without departing from the teachings of the present invention, the first element, component, region, layer, doping type, or portion discussed below may be represented as a second element, component, region, layer, or portion.

[0027] Spatially relative terms such as "under," "beneath," "beneath," "under," "above," "above," etc., may be used herein to describe the relationship of an element or feature shown in the figures to other elements or features. It should be understood that in addition to the orientations shown in the figures, spatially relative terms also include different orientations of the device in use and operation. For example, if the device in the drawings is turned over, the element or feature described as "under" or "beneath" or "beneath" the other elements will be oriented as "above" the other elements or features. Thus, the exemplary terms "under" and "under" can include both upper and lower orientations. In addition, the device can also include alternative orientations (e.g., rotated 90 degrees or other orientations), and the spatial descriptors used herein are interpreted accordingly.

[0028] As used herein, the singular forms "a," "an," and "the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include," "comprising," "having," and the like specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, in this specification, the term "and / or" includes any and all combinations of the relevant listed items.

[0029] The backlight module includes a backlight LED module, which is provided with a plurality of pin groups, each of which contains a plurality of pins to be tested that are electrically connected to each other, and each pin to be tested is equipped with a corresponding pin slot. Each pin group is used to realize the electrical connection between the positive and negative poles of the backlight LED module. The structural design of the above-mentioned pin group makes it possible for the backlight LED module to light up normally as long as any pair of positive and negative pins is turned on, but this structure can easily cover up hidden dangers such as poor welding or disconnection of some pins. In the production or quality control links, these pin defects that are not discovered in time will not directly lead to lighting failure, but may cause power-on abnormalities, backlight failure or unstable flickering and other faults in actual use, thereby affecting the reliability of the module and the product quality of the entire machine.

[0030] In view of the above issues, please refer to Figure 1 The present application provides a pin detection fixture for detecting the pins of a backlight module 1, wherein the backlight module 1 is provided with a plurality of pin groups 11, each pin group 11 is provided with a plurality of pins to be tested 111 electrically connected to each other, and each pin to be tested 111 is provided with a corresponding pin slot (not shown), the pin detection fixture includes: a power supply unit 2, a connection unit 3 and an indication device 4, wherein the connection unit 3 includes at least one first connection module 31 and at least one second connection module 32, and the first connection module 31 and the second connection module 32 are respectively electrically connected to different potential ends of the power supply unit 2, wherein the first connection module 31 and the second connection module 32 are respectively used to engage and connect with the pin slots of different pins to be tested 111 in each pin group 11; the indication device 4 includes a plurality of indication units 41, and the plurality of indication units 41 are respectively arranged in series on an electrical connection path formed by the first connection module 31 electrically connected to each pin to be tested 111, the power supply unit 2, and the second connection module 32.

[0031] In the above example, by setting up a pin detection fixture including a power supply unit 2, a connection unit 3 and an indicator device 4, and electrically connecting the first connection module 31 and the second connection module 32 to different potential ends of the power supply unit 2, and then respectively engaging with the pin slots of different pins to be tested 111 in each pin group 11 in the backlight module 1, it is possible to accurately detect the electrical connection status of each pin to be tested 111, the operation process is simple, and the detection efficiency is improved; the multiple indicator units 41 on the indicator device 4 are arranged in series on the electrical connection path, which can further quickly, in real time and intuitively reflect the conduction status of each pin to be tested, and realize independent and efficient detection of each pin to be tested 111 in the pin group 11, significantly improving the accuracy and reliability of the detection, and by promptly discovering abnormal conduction or poor connection of the pin 111 to be tested, it can effectively avoid power-on abnormalities and backlight not lighting or flickering problems in the mainboard testing link, thereby greatly improving the production qualification rate and operation stability of the whole machine. In addition, the detection fixture of the present application has a simple structure, is easy to operate, and can be easily integrated into the testing process of the production line, reducing the detection cost and human resource consumption, and reducing the frequency of after-sales maintenance and related expenses. It has important practical value and broad promotion and application prospects.

[0032] In one embodiment, the pin detection jig also includes a fixing device (not shown) for firmly mounting the power supply unit 2 and the indicating device 4 to enhance the convenience and safety of the device. The fixing device may include a shell structure, a nested bracket, a sliding buckle or an adhesive device, etc., which can effectively prevent the power supply unit 2 and the indicating device 4 from shifting, loosening or disconnecting during operation, thereby improving the detection accuracy and user experience.

[0033] The power supply unit 2 is used to provide a stable operating voltage for the detection circuit. The power supply unit 2 is the core component of the pin detection fixture. Its stability and adaptability directly affect the accuracy and reliability of the detection results.

[0034] In one embodiment, the power supply unit 2 includes a battery power source, a rechargeable battery pack, or an external DC power adapter. Exemplarily, the battery power source includes a dry cell battery, a lithium battery, or a button cell battery, which can provide a stable DC voltage and has good portability and replaceability. In this embodiment, the power supply unit 2 is a battery power source.

[0035] The first connection module 31 is electrically connected to one potential end (e.g., the positive electrode) of the power supply unit 2, and the second connection module 32 is electrically connected to the other potential end (e.g., the negative electrode) of the power supply unit 2. The first connection module 31 and the second connection module 32 are respectively electrically connected to different pins to be tested in each pin group to form an effective closed loop.

[0036] Exemplarily, both the first connection module 31 and the second connection module 32 are made of high-precision, low-resistance conductive materials to ensure good conductivity and connection stability during the test process. For example, the first connection module 31 may be made of copper, aluminum, gold, silver, or other conductive materials suitable for electrical connection; the second connection module 32 may be made of copper, aluminum, gold, silver, or other conductive materials with excellent electrical properties.

[0037] In one embodiment, the first connection module 31 includes a first connection plug, which is used to engage with the pin slot at the corresponding pin to be tested 111; the second connection module 32 includes a second connection plug, which is used to engage with the pin slot at the corresponding pin to be tested 111, wherein the structure of the first connection plug and the second connection plug is designed to be a structure that engages with the shape and size of the pin slot at the pin to be tested 111, and has a stable mechanical connection and good electrical contact performance, thereby ensuring that the detection current flows stably in the path, and the module plug matches the pin slot structure, plugging and unplugging are smooth, and the assembly process does not require additional tools, which is suitable for rapid detection on the production site, lowering the operating threshold and improving detection efficiency. In addition, the above structural design can directly achieve electrical connection with the power supply unit 2 through the connection plug.

[0038] Furthermore, in one embodiment, the first connection module 31 also includes a first connection line, and the first connection plug is arranged at one end of the first connection line, and / or the second connection module 32 also includes a second connection line, and the first connection plug is arranged at one end of the second connection line. The design of the first connection line and the second connection line facilitates the detection process and the adjustment of the detection fixture, and has greater flexibility, and the other end of the first connection line and the other end of the second connection line are both electrically connected to a potential end of the power supply unit 2.

[0039] Furthermore, in order to adapt to pin groups 11 of different types, different spacings, and different arrangements, the first connecting plug is a detachable structure, and / or the second connecting plug is a detachable structure, which is convenient for rapid replacement and deployment in different detection scenarios and has good versatility and scalability.

[0040] It should be noted that the first connection module 31 and / or the second connection module 32 can also adopt a one-line multi-plug structure, where one connection line passes through several branches to connect multiple connection plugs respectively, and each connection plug is connected to a corresponding pin to be tested. It is suitable for simultaneous detection of multiple parallel pin groups to improve detection efficiency, especially suitable for parallel connection test scenarios of large-scale pin arrays, which can significantly simplify manual wiring operations and reduce the risks of mis-insertion and missed insertion.

[0041] In one embodiment, the first connection module 31 includes a plurality of first connection modules 31, and the plurality of first connection modules 31 are used to respectively engage with the pin slots of one pin to be tested 111 in each pin group 11, and the second connection module 32 includes a plurality of second connection modules 32, and the plurality of second connection modules 32 are used to respectively engage with the pin slots of the remaining pins to be tested 111 in the same pin group 11. For example, when the backlight module 1 includes two pin groups 11, wherein one pin group 11 includes two connected pins to be tested 111, and the other pin group 11 includes four connected pins to be tested 111, the first connection module 31 includes two, and the two first connection modules 31 are respectively engaged with one of the pins to be tested 111 in the two pin groups 11. Electrical connection, the second connection module 32 includes four, and the four second connection modules 32 are respectively engaged and electrically connected with the remaining pins to be tested 111 in the two pin groups 11. Through the above-mentioned structural arrangement, each pin to be tested 111 in each pin group 11 forms an independent detection circuit through the first connection module 31 and the second connection module 32, and can judge the conduction state of each pin to be tested 111 separately, avoiding the internal electrical connection of the pin group 11, and then covering up the problems of cold soldering, desoldering or disconnection of individual pins, avoiding the occurrence of misjudgment, and significantly improving the accuracy and reliability of detection. The connection module is flexibly arranged, and the adaptive quantity can be configured according to the scale of different pin groups, with good versatility and scalability.

[0042] In one embodiment, the indicating device 4 is located on the electrical connection path between the second connecting module 32 and the power supply unit 2 , and serves as a state feedback unit in the current path, for reflecting the conduction state of the pin to be tested 111 .

[0043] In one embodiment, the indicator device 4 further includes a first connection portion 42 and a second connection portion 43. The first connection portion 42 is connected to a potential terminal of the power supply unit 2. The plurality of indicator units 41 are electrically connected to the first connection portion 42 via corresponding second connection portions 43, and the other end of each indicator unit 41 is electrically connected to the second connection module 32. Specifically, the first connection portion 42 serves as a common power input terminal for the indicator device 4. Each indicator unit 41 is connected to the first connection portion 42 via its respective second connection portion 43, forming an independent and parallel indication path. This enables each indicator unit 41 to detect the electrical connection status of a pin 111 under test, enabling individual monitoring of each pin and avoiding misjudgment of a series connection. Furthermore, the segmented connection structure of the first connection portion 42 and the second connection portion 43 ensures stable circuit connections within the indicator device 4, reduces instability caused by complex circuits, and improves detection accuracy. Furthermore, the indicator device 4 can be designed with flexible connection components, facilitating maintenance, replacement, and expansion. The number of indicator units can be adjusted according to actual needs to accommodate the detection requirements of pin groups 11 of varying sizes.

[0044] In one embodiment, the indicating unit 41 includes an optical indicating device, such as a light emitting diode (LED) or other forms of photoelectric display elements, which uses optical signals to intuitively reflect the conduction state of the pin to be tested 111 .

[0045] During the test process, when the connected pin 111 to be tested is electrically connected normally, the current can smoothly pass through the corresponding pin detection circuit, driving the corresponding optical indicator device to emit light, thereby making the indicator unit 41 in a lit state. On the contrary, if there is an abnormality such as a cold solder joint, a broken circuit or no connection in the pin 111 to be tested, the current cannot pass through the pin detection path, the corresponding optical indicator device cannot be illuminated, and the indicator unit 41 is in a non-illuminated state. That is, if all indicator units are illuminated, it means that all pins 111 to be tested are electrically connected well, the backlight module 1 pin is in a normal conductive state, and the test result is qualified; if at least one indicator unit 41 is not illuminated, it means that at least one pin 111 to be tested has an abnormal electrical connection and needs further repair or replacement, thereby improving the accuracy of the test and the reliability of the product.

[0046] The optical indicator can quickly and accurately identify the conduction state of each pin under test in the backlight module 1 through the obvious visual difference between being lit and not lit. Therefore, using an optical indicator as status feedback has the advantages of fast response, low energy consumption, and clear visual effects. It facilitates operators to judge test results on site, reduces the error rate, and improves test efficiency.

[0047] In addition, in order to ensure the effective flow of current and load adaptation in the detection circuit, the output voltage of the power supply unit 2 is adapted to the working voltage of the indicating device 4. For example, when the indicating device adopts a 5~12V light-emitting diode (LED) as an optical indicating device, the power supply voltage can be controlled at about 9V to ensure that the optical indicating device can achieve a clear lighting or extinguishing state under normal operating current, thereby intuitively reflecting the electrical connection status of the pin 111 to be tested.

[0048] Furthermore, in addition to the optical indicator, the indicator unit 41 may also include other forms such as a buzzer and a display device. For example, a buzzer can sound an alarm when a pin abnormality is detected, further alerting the operator; a display device can provide more detailed detection information, such as the specific faulty pin number in digital or text form, and the selection can be based on the needs of the detection scenario.

[0049] To sum up, the power supply unit 2 is used to provide the working voltage for the pin detection fixture, and the first connection module 31 and the second connection module 32 of the pin detection fixture are respectively engaged and fixed with the pin slots of the corresponding pins to be tested 111, so that the first connection module 31 and the second connection module 32 are electrically connected to the corresponding pins to be tested 111, and the indication status of each indication unit is observed, so that each pin to be tested 111 in the backlight module 1 can be quickly and accurately detected, thereby improving the detection efficiency and quality reliability of the product.

[0050] Throughout this specification, references to terms such as "some embodiments," "other embodiments," and "desired embodiments" indicate that a particular feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. Although these terms are used interchangeably throughout this specification, they do not necessarily refer to the same embodiment or example.

[0051] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features of the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0052] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A pin detection fixture for detecting the pins of a backlight module, wherein: The backlight module is provided with a plurality of pin groups, each of the pin groups is provided with a plurality of pins to be tested that are electrically connected to each other, and each of the pins to be tested is provided with a corresponding pin slot, and the pin detection fixture includes: Power supply unit; A connection unit, comprising at least one first connection module and at least one second connection module, wherein the first connection module and the second connection module are respectively electrically connected to different potential ends of the power supply unit, wherein the first connection module and the second connection module are respectively used to engage with the pin slots of different pins to be tested in each pin group; The indicating device includes a plurality of indicating units, which are respectively arranged in series on an electrical connection path formed by the first connection module, the power supply unit, and the second connection module electrically connected to each pin to be tested.

2. The pin detection jig according to claim 1, characterized in that: The first connection module includes a first connection plug, which is used to engage with the pin slot at the corresponding pin to be tested, and / or the second connection module includes a second connection plug, which is used to engage with the pin slot at the corresponding pin to be tested.

3. The pin detection jig according to claim 2, characterized in that: The first connection module further includes a first connection line, the first connection plug is provided at one end of the first connection line, and / or the second connection module further includes a second connection line, the first connection plug is provided at one end of the second connection line.

4. The pin detection jig according to claim 2, characterized in that: The first connecting plug is a detachable structure, and / or the second connecting plug is a detachable structure.

5. The pin detection jig according to claim 1, characterized in that: The first connection modules include multiple modules, and the first connection modules are used to respectively engage and connect with the pin slots of one of the pins to be tested in each pin group; the second connection modules include multiple modules, and the second connection modules are used to respectively engage and connect with the pin slots of the remaining pins to be tested in the same pin group.

6. The pin detection jig according to claim 1, characterized in that: The indicating device is located on the electrical connection path between the second connecting module and the power supply unit.

7. The pin detection jig according to claim 1, characterized in that: The indicating device also includes a first connecting part and a second connecting part, the first connecting part is connected to a potential end of the power supply unit, and the multiple indicating units are electrically connected to the first connecting part through the corresponding second connecting parts, and the other end of each indicating unit is electrically connected to the second connection module.

8. The pin detection jig according to claim 1, characterized in that: The indicating unit includes an optical indicating device.

9. The pin detection jig according to claim 1, characterized in that: The power supply unit includes a battery power supply, a rechargeable battery assembly or an external DC power adapter, and the supply voltage of the power supply unit is adapted to the operating voltage of the indicating device.

10. The pin detection jig according to claim 1, characterized in that: The pin detection fixture further includes a fixing device for firmly mounting the power supply unit and the indicating device.

Images