Method for generating shipment file of wafer product, product and equipment

Abstract

The invention provides a method for generating a shipment file of a wafer product, a computer program product and computer equipment. The method for generating the shipment file of the wafer product comprises the steps that a file sample, a file format name, a preset information item and description information of the file format name, the preset information item and the description information of the file sample are obtained, analyzing the file sample by using a preset information item and the description information thereof to obtain a file format, and naming the file format by a file format name; and generating a product delivery file according to the file format. According to the scheme, rapid analysis and naming of the sample file format are realized, the analysis time efficiency of the file sample is remarkably shortened, the working efficiency is greatly improved, the shipment process is accelerated, the shipment time is shortened, and the user experience is improved.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor wafer manufacturing and testing, and in particular to a method, product, and device for generating shipping documents for wafer products. Background Art

[0002] In wafer manufacturing, after wafer production or yield testing is completed, the wafers need to be sent to the packaging and testing factory for cutting and packaging according to customer requirements. For the grains on the wafer that are contaminated by defects, or the different failed grains during the yield test, there will be different handling methods during cutting, so the packaging and testing factory will require that a text file (called a shipping file) be included with the shipment of the physical wafer, which contains the status of each grain on the wafer. This file usually contains information on whether the grain is contaminated by defects, or displays the failure information of each grain. Generally, each packaging and testing factory has its own file format requirements, and the manufacturer needs to generate the corresponding shipping file according to the file format requirements of each packaging and testing factory.

[0003] The current common practice for required file formats is for users to provide sample files in advance, and developers to parse the sample files using scripts to obtain the file formats. The scripts then name the file formats for subsequent batch generation of shipping files. However, in these existing solutions, developers must individually implement code for parsing the sample files, naming the file formats, modifying the sample file formats, and changing the file format names. Each time a sample file format is added or a file format name is modified, developers must write new code to support it. This not only significantly increases the amount of code required but is also time-consuming and inefficient, potentially leading to shipping delays and impacting customer experience. Furthermore, since developers parse the sample files using backend scripts, users cannot compare the resulting file formats with the provided sample files, posing a significant risk. After generating shipping files using the shipping product, testing whether the shipping files conform to the required file formats is time-consuming. Summary of the Invention

[0004] In view of the above problems, the present invention proposes a method, product and device for generating shipping documents for wafer products that overcome the above problems or at least partially solve the above problems.

[0005] One object of the present invention is to provide a method for generating shipping documents for wafer products, so as to significantly shorten the parsing time of file samples, thereby greatly improving work efficiency and shortening shipping time.

[0006] A further object of the present invention is to reduce the amount of code.

[0007] In particular, according to one aspect of the present invention, a method for generating a shipping document for a wafer product is provided, comprising:

[0008] Obtain a file sample and the file format name, preset information items, and description information configured for the file sample;

[0009] Parsing the file sample using the preset information items and their description information to obtain the file format, and the file format is named with the file format name;

[0010] Generate product shipping documents according to the file format.

[0011] Optionally, the step of obtaining a file sample and a file format name, preset information items, and description information configured for the file sample includes:

[0012] Outputting a preset system display interface, the system display interface is configured with input areas for file samples, file format names, and preset information items and their descriptions;

[0013] Obtain the file sample received on the system display interface and the file format name, preset information items and description information configured for the file sample.

[0014] Optionally, after the file sample is parsed using the preset information item and its description information to obtain the file format, and the file format is named with a file format name, the method further includes:

[0015] Display the file format name on the system display interface;

[0016] The steps to generate product shipping files according to the file format include:

[0017] Obtaining a file format name selection command received on a system display interface;

[0018] In response to the selection command, a product shipping file is generated according to the file format named with the selected file format name.

[0019] Optionally, after the file sample is parsed using the preset information item and its description information to obtain the file format, and the file format is named with a file format name, the method further includes:

[0020] Get sample format modification commands and modified file samples;

[0021] In response to the sample format modification command, the modified file sample is parsed using the preset information items and their description information to obtain a modified file format, and the original file format is replaced with the modified file format.

[0022] Optionally, after the file sample is parsed using the preset information item and its description information to obtain the file format, and the file format is named with a file format name, the method further includes:

[0023] Obtaining a sample format modification command, a modified file sample, and modified preset information items configured for the modified file sample and their description information;

[0024] In response to the sample format modification command, the modified file sample is parsed using the modified preset information item and its description information to obtain a modified file format, and the original file format is replaced with the modified file format.

[0025] Optionally, after the file sample is parsed using the preset information item and its description information to obtain the file format, and the file format is named with a file format name, the method further includes:

[0026] Get the name change command and the new file format name configured for the file sample;

[0027] In response to the name modification command, the file format is renamed with a new file format name.

[0028] Optionally, the preset information items include one or more of product name, product number, batch number, number of tested products, marker direction, test result graph position, defect rate, and defect identifier.

[0029] Optionally, after generating the product shipping document, the method further includes:

[0030] Store product shipping files in the specified path.

[0031] According to another aspect of the present invention, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the steps of any of the above-mentioned methods for generating a shipping document for a wafer product.

[0032] According to another aspect of the present invention, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, and when the processor executes the computer program, the steps of the method for generating a shipping document for a wafer product described above are implemented.

[0033] The method for generating shipping files for wafer products of the present invention, after obtaining a file sample and the file format name, preset information items, and their description information configured for the file sample, can then automatically parse the file sample using the preset information items and their description information to obtain the file format, and name the obtained file format with the file format name. Compared with existing solutions, this method eliminates the need for developers to parse file samples and name the parsed file formats one by one through code, achieving rapid parsing and naming of sample file formats. It can also reduce the parsing time for a single file sample from, for example, seven days to a few minutes, significantly improving work efficiency, accelerating the shipping process, shortening shipping time, and enhancing the user experience.

[0034] Furthermore, the method for generating shipping files for wafer products of the present invention receives the file sample to be parsed and the file format name, preset information items and description information configured for the file sample through a preset system display interface. In this way, only one code development is required to provide the preset system display interface, which can support users to upload file samples and the file format name, preset information items and description information configured for the file sample through the system display interface an unlimited number of times. Compared with the prior art where developers need to write new code to support each additional sample file format, the amount of code is greatly reduced. At the same time, the method of uploading through the system display interface is more intuitive, friendly, and easy to operate for users.

[0035] Furthermore, the method for generating a shipping file for a wafer product of the present invention, after obtaining a sample format modification command, and a modified file sample, or a modified file sample and a modified preset information item and its description information configured for the modified file sample, can automatically parse the modified file sample to obtain a modified file format to replace the original file format, thereby completing the modification of the sample file format. Similarly, after obtaining a name modification command and a new file format name configured for the file sample, the file format can be automatically named with the new file format name, thereby completing the modification of the file format naming. In particular, the above-mentioned modification command, as well as the modified file sample, the modified preset information item and its description information configured for the modified file sample, and the new file format name can all be obtained through a preset system display interface (entered by the user through the system display interface). In this way, the modification of the sample file format or the file format naming is greatly facilitated.

[0036] Based on the following detailed description of specific embodiments of the present invention in conjunction with the accompanying drawings, those skilled in the art will become more aware of the above and other objects, advantages and features of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Hereinafter, some specific embodiments of the present invention will be described in detail in an exemplary and non-limiting manner with reference to the accompanying drawings. The same reference numerals in the accompanying drawings indicate the same or similar components or parts. It should be understood by those skilled in the art that these drawings are not necessarily drawn to scale. In the accompanying drawings:

[0038] Figure 1a and Figure 1b is a schematic diagram of a sample file as an example;

[0039] Figure 2a and Figure 2b They are respectively Figure 1a and Figure 1b The file sample corresponds to the schematic diagram of the generated shipping file;

[0040] Figure 3 1 is a flow chart of a method for generating a shipping document for a wafer product according to an embodiment of the present invention;

[0041] Figure 4 is a flow chart of a method for generating a shipping document for a wafer product according to another embodiment of the present invention;

[0042] Figure 5 is an exemplary schematic diagram of a preset system display interface according to one embodiment of the present invention;

[0043] Figure 6 is a schematic diagram of a process for generating shipping documents for wafer products according to one embodiment of the present invention;

[0044] Figure 7 A schematic structural diagram of a computer program product according to an embodiment of the present invention; and

[0045] Figure 8 FIG. 1 is a schematic structural diagram of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0046] Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present invention to those skilled in the art.

[0047] In the current solution for generating the shipping files required by the packaging and testing factory, the corresponding result file format (i.e., file sample) is provided by the user in advance, and the developer parses the file sample and names it. The user selects the format through the named file, and the system automatically generates batch shipping files according to the selected format. Figure 1a and Figure 1bThis is a diagram of a sample file as an example. Figure 2a and Figure 2b They are respectively Figure 1a and Figure 1b The sample file corresponds to the diagram of the generated shipping file. If you want to modify the sample file format or file format name, you must also use the script by the developer.

[0048] As can be seen, in the existing process, the crucial step of parsing sample files and naming the file format requires two steps: 1) the user provides a sample file; 2) the developer writes code to parse the sample file, generate the file format, and then uses the code to name the file format. This approach relies heavily on the developer's work efficiency and schedule, requiring the developer to parse each sample file and name the file format one by one. Whenever the sample file format or file format name is modified, the developer must use code to parse and name each file format individually. This results in long and uncertain user wait times, potentially leading to shipping delays and impacting customer experience. Furthermore, since the developer parses the file format using a backend script, users cannot compare the generated file format with the provided sample file, which presents a significant risk. After using the shipping product to generate the shipping file, testing whether the shipping file conforms to the required file format is time-consuming.

[0049] In response to the above problems, the present invention provides a method for generating shipping documents for wafer products.

[0050] Figure 3 FIG is a flow chart of a method for generating a shipping document for a wafer product according to an embodiment of the present invention. Figure 3 As shown, the method for generating a shipping document for a wafer product in this embodiment may at least include the following steps S302 to S306 .

[0051] Step S302: Obtain a file sample and a file format name, preset information items, and description information configured for the file sample.

[0052] Specifically, the file sample can be uploaded by the user, and the file format name, preset information items and description information thereof are also set by the user correspondingly for the file sample.

[0053] In actual applications, the number of acquired file samples may be multiple, and they may be uploaded by the same user or different users. For each file sample, the file format name, preset information items, and description information set therefor are acquired accordingly.

[0054] Step S304: parse the file sample using the preset information items and their description information to obtain a file format, and name the file format with a file format name.

[0055] Step S306: Generate product shipping files according to the file format.

[0056] The method for generating a shipping file for a wafer product according to an embodiment of the present invention, after obtaining a file sample and the file format name, preset information items, and their description information configured for the file sample, can then automatically parse the file sample using the preset information items and their description information to obtain the file format, and name the obtained file format with the file format name. Compared to existing solutions, this method eliminates the need for developers to parse file samples and name the parsed file formats one by one through code, achieving rapid parsing and naming of sample file formats. It can also reduce the parsing time for a single file sample from, for example, seven days to a few minutes, greatly improving work efficiency, accelerating the shipping process, shortening shipping time, and enhancing the user experience.

[0057] In some embodiments, step S306 may specifically include: receiving a command for selecting a file format, and generating a product shipping file according to the selected file format in response to the selection command.

[0058] The preset information items may be key indicator items that appear in the file sample, which may be items that customers are interested in. Information or data related to each preset information item in the file sample may be set as the description information of the preset information item.

[0059] In some embodiments, the preset information items may include one or more of the following: product name, product number, batch number, number of tested products, direction of marker, location of test result graph, defect rate, defect identifier, etc. In some other embodiments, the preset information items may also include other items, such as the number of passed products, the number of failed products, etc., which are specifically set according to the file format requirements of the shipping document. Figure 1a and Figure 1b Let me give you an example to illustrate this.

[0060] For example, for Figure 1a The sample file shown contains information about key indicators, where BBCCDD-EE represents the product name, R0001.02 represents the batch number, and -08 represents the product number. In the test result image (i.e., wafer image), defective dies are represented by an "X." Therefore, the following preset information items can be configured: product name, batch number, product number, defect identifier, etc., and the descriptions of these preset information items can be set to "BBCCDD-EE," "R0001.02," "-08," and "X," respectively.

[0061] For example, for Figure 1bThe file sample shown contains the following key indicator items and their related information or data: product name: AAAA1; batch number: BBBBB2; product number: BBBBB2#01; marker direction (e.g., Flat / Notch): DOWN; test result graph position (column position / row position): 200 / 100; number of tested products: 5000; number of passed products: 4995; number of failed products: 5; defective rate: 0.1%; defect identifier: 0 (i.e., the symbol "0" is used to represent defective grains in the test result graph), etc. Therefore, the following preset information items can be configured for it: product name, batch number, product number, marker direction, test result graph position (specifically divided into column position and row position), number of tested products, number of passed products, number of failed products, defect rate, defect identifier, etc., and the description information of these preset information items can be set as: "AAAA1", "BBBBB2", "#01", "DOWN", "200", "100", "5000", "4995", "5", "0.1%", "0". The above specific information contents are for illustration only. Those skilled in the art can configure the specific content of the types of information items based on the solution provided in this embodiment and the characteristics of the product.

[0062] Thus, by using the preset information items and their descriptions configured for each file sample, the file sample can be automatically and accurately parsed, identifying the location and expression specifications of each preset information item in the file, thereby obtaining the corresponding file format. By setting the preset information items and their descriptions, the accuracy of parsing the content of the file sample can be improved.

[0063] In some embodiments, after the file format is obtained and named with a file format name, the file format may also be stored in a designated location for subsequent use by the user.

[0064] In some embodiments, the method for generating a shipping document for a wafer product may further include a first step of modifying the sample file format, specifically including:

[0065] Get sample format modification commands and modified file samples;

[0066] In response to the sample format modification command, the modified file sample is parsed using the preset information items and their description information to obtain a modified file format, and the original file format is replaced with the modified file format.

[0067] If the file format of the sample needs to be modified, and the preset information items and their descriptions in the sample file do not need to be changed, a first step of modifying the sample file format can be performed. The first step of modifying the sample file format can be performed at any stage after the sample file is parsed using the preset information items and their descriptions to obtain the file format in step S304, and the file format is named with a file format name.

[0068] In this embodiment, it is only necessary to obtain the modified file sample to automatically parse the modified file sample, thereby completing the modification of the sample file format, without the need to add additional script code to parse the modified file sample to support the modification of the sample file format, thereby reducing the amount of code and improving work efficiency.

[0069] In other embodiments, the method for generating a shipping document for a wafer product may further include a second step of modifying the sample file format, specifically including:

[0070] Obtaining a sample format modification command, a modified file sample, and modified preset information items configured for the modified file sample and their description information;

[0071] In response to the sample format modification command, the modified file sample is parsed using the modified preset information item and its description information to obtain a modified file format, and the original file format is replaced with the modified file format.

[0072] If the file format of the sample needs to be modified and the preset information items and their descriptions in the sample file also change, a second modification step of the sample file format can be performed. The second modification step can be performed at any stage after the sample file is parsed using the preset information items and their descriptions to obtain the file format in step S304 and the file format is named with the file format name.

[0073] In this embodiment, it is only necessary to obtain the modified file sample and the modified preset information items and description information configured for the modified file sample, so as to automatically parse the modified file sample and complete the modification of the sample file format. There is no need to add additional script code to parse the modified file sample to support the modification of the sample file format, thereby reducing the amount of code and improving work efficiency.

[0074] In some further embodiments, the method for generating a shipping file for a wafer product may further include a step of modifying a file format name, specifically including:

[0075] Get the name change command and the new file format name configured for the file sample;

[0076] In response to the name modification command, the file format is renamed with a new file format name.

[0077] The step of modifying the file format name can be performed at any stage after the file format is obtained by parsing the file sample using the preset information items and their description information in step S304 and the file format is named with the file format name.

[0078] In this embodiment, it is only necessary to obtain the new file format name configured for the file sample and then directly name the file format with the new file format name, thereby completing the modification of the format naming without adding additional script code to support the modification of the format naming, thereby reducing the amount of code and improving work efficiency.

[0079] Those skilled in the art will appreciate that the aforementioned first or second modification steps of the sample file format and the modification step of the file format name are performed on a specific sample file to be modified. If multiple sample files are to be modified, the corresponding modification steps are performed on each sample file to be modified.

[0080] In some embodiments, after generating the product shipping file, the method for generating the wafer product shipping file further includes:

[0081] Store product shipping files to a specified path (such as an FTP path).

[0082] Figure 4 FIG is a flow chart of a method for generating a shipping document for a wafer product according to another embodiment of the present invention. Figure 4 As shown, in some embodiments, step S302 may include:

[0083] Step S402: outputting a preset system display interface, wherein the system display interface is provided with input areas for file samples, file format names, and preset information items and their descriptions;

[0084] Step S404: Acquire the file sample received on the system display interface and the file format name, preset information items and description information configured for the file sample.

[0085] This embodiment receives the file sample to be parsed and the file format name, preset information items and description information configured for the file sample through a preset system display interface. In this way, only one code development is required to provide the preset system display interface, which can support users to upload file samples and the file format name, preset information items and description information configured for the file sample through the system display interface an unlimited number of times. Compared with the prior art, which requires developers to write new code to support each additional sample file format, the amount of code is greatly reduced. At the same time, the method of uploading through the system display interface is more intuitive, friendly, and easy to operate for users.

[0086] Step S406 is the same as the aforementioned step S304 and is not described in detail.

[0087] In some further embodiments, after step S406, the method for generating the shipping document of the wafer product may further include:

[0088] Step S408: Display the file format name on the system display interface.

[0089] In some further embodiments, step S306 may specifically include:

[0090] Step S410, obtaining a file format name selection command received on a system display interface;

[0091] Step S412 , in response to the selection command, generating a product shipping file according to the file format named with the selected file format name.

[0092] Figure 5 Schematic diagram of a preset system display interface according to an embodiment of the present invention. Figure 5 This section describes the steps for obtaining a file sample and configuring a file format name, preset information items, and their description information for the file sample.

[0093] See also Figure 5 As shown, when a new sample file format needs to be created, the user can trigger the operation of creating a new file format on the system display interface (for example, by clicking the New File Format button), and make corresponding inputs in the file sample input area, the file format name input area, the preset information item input area, and its description information input area. The system then obtains the file sample received on the system display interface and the file format name, preset information item, and its description information configured for the file sample.

[0094] Furthermore, a sample format modification command, a modified sample file, or a modified sample file and the modified preset information items configured for the modified sample file and their descriptions can also be input through the preset system display interface. Similarly, a name modification command and a new file format name configured for the sample file can also be input through the preset system display interface.

[0095] Figure 6 FIG. 1 is a schematic diagram of a process for generating a shipping document for a wafer product according to an embodiment of the present invention. Figure 6 As shown, combined with Figure 5When it is necessary to modify the sample file format or file format naming, the user can enter a sample format modification command or a name modification command on the system display interface (for example, by clicking the Modify Sample Format button or the Modify Format Name button), and enter the modified file sample, the modified preset information items configured for the modified file sample and their description information, or the new file format name in the file sample input area, the preset information item input area and its description information input area, or the file format name input area as needed. Then, the system obtains the sample format modification command or name modification command received on the system display interface, as well as the modified file sample, the modified preset information items configured for the modified file sample and their description information, or the new file format name.

[0096] It should be noted that Figure 5 The system display interface shown is merely exemplary and does not limit the present invention.

[0097] In this way, when the sample file format is modified or the file format name is modified, the user only needs to upload the modified file sample, or the modified file sample and the modified preset information items and their description information configured for the modified file sample on the system display interface, or upload the new file format name to rename it, which is extremely convenient.

[0098] In some embodiments, the method for generating shipping documents for wafer products of the present invention may be executed by an Ink system (also known as an ink dot system).

[0099] The present invention also provides a computer program product and a computer device. Figure 7 is a schematic diagram of the structure of a computer program product 700 according to an embodiment of the present invention. Figure 8 FIG. 8 is a schematic structural diagram of a computer device 800 according to an embodiment of the present invention.

[0100] The computer program product 700 stores a computer program 710 thereon. When the computer program 710 is executed by a processor, the method for generating a shipping document for a wafer product according to any of the above embodiments is implemented.

[0101] The computer device 800 may include a memory 820, a processor 810, and a computer program 821 stored in the memory 820 and running on the processor 810, and when the processor 810 executes the computer program 821, the method for generating a shipping document for a wafer product according to any of the above embodiments is implemented.

[0102] It should be noted that the logic and / or steps represented in the flowchart or described in other ways herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be specifically implemented in any computer program product for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or used in combination with these instruction execution systems, devices or apparatuses.

[0103] For the purposes of the description of this embodiment, computer program product 700 can be any device that can contain, store, communicate, propagate, or transmit a program for use with or in conjunction with an instruction execution system, device, or apparatus. More specific examples (not an exhaustive list) of computer program product 700 include the following: an electrical connection portion having one or more wires (electronic device), a portable computer disk cartridge (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disc read-only memory (CDROM). In addition, computer program product 700 can even be paper or other suitable medium on which the program can be printed, as the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering, or processing in other suitable ways as necessary, and then stored in a computer memory.

[0104] It should be understood that each part of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system.

[0105] The computer device 800 can be, for example, a server, a desktop computer, a laptop computer, a tablet computer, or a smartphone. In some examples, the computer device 800 can be a cloud computing node. The computer device 800 can be described in the general context of computer system executable instructions (such as program modules) executed by a computer system. Generally, program modules can include routines, programs, object programs, components, logic, data structures, etc. that perform specific tasks or implement specific abstract data types. The computer device 800 can be implemented in a distributed cloud computing environment where remote processing devices linked through a communication network perform tasks. In a distributed cloud computing environment, program modules can be located on local or remote computing system storage media including storage devices.

[0106] The computer device 800 may include a processor 810 adapted to execute stored instructions, and a memory 820 that provides temporary storage for the instructions during operation. The processor 810 may be a single-core processor, a multi-core processor, a computing cluster, or any number of other configurations. The memory 820 may include random access memory (RAM), read-only memory, flash memory, or any other suitable storage system.

[0107] The flowchart provided in this embodiment is not intended to indicate that the operations of the method will be performed in any particular order, or that all operations of the method are included in all every case. In addition, the method may include additional operations. Within the scope of the technical ideas provided by the method of this embodiment, additional changes can be made to the above method.

[0108] At this point, those skilled in the art will recognize that, although a number of exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications consistent with the principles of the present invention may be directly determined or derived from the disclosure of the present invention without departing from the spirit and scope of the present invention. Therefore, the scope of the present invention should be understood and deemed to cover all such other variations or modifications.

Claims

1. A method for generating a shipping document for a wafer product, comprising: Obtaining a file sample and a file format name, preset information items, and description information configured for the file sample; Parsing the file sample using the preset information item and its description information to obtain a file format, and naming the file format with the file format name; Generate product shipping files according to the file format.

2. The method for generating a shipping document for a wafer product according to claim 1, wherein: The step of obtaining a file sample and configuring a file format name, preset information items, and description information thereof for the file sample comprises: Outputting a preset system display interface, wherein the system display interface is configured with input areas for file samples, file format names, and preset information items and their descriptions; The file sample received on the system display interface and the file format name, preset information items and description information configured for the file sample are obtained.

3. The method for generating a shipping document for a wafer product according to claim 2, wherein: After the file sample is parsed using the preset information item and its description information to obtain a file format, and the file format is named with the file format name, the method further includes: Displaying the file format name on the system display interface; The step of generating a product shipping file according to the file format includes: Acquire a selection command for the file format name received on the system display interface; In response to the selection command, a product shipping file is generated according to the file format named with the selected file format name.

4. The method for generating a shipping document for a wafer product according to claim 1, wherein: After the file sample is parsed using the preset information item and its description information to obtain a file format, and the file format is named with the file format name, the method further includes: Get sample format modification commands and modified file samples; In response to the sample format modification command, the modified file sample is parsed using the preset information item and its description information to obtain a modified file format, and the original file format is replaced by the modified file format.

5. The method for generating a shipping document for a wafer product according to claim 1, wherein: After the file sample is parsed using the preset information item and its description information to obtain a file format, and the file format is named with the file format name, the method further includes: Obtaining a sample format modification command, a modified file sample, and modified preset information items configured for the modified file sample and their description information; In response to the sample format modification command, the modified file sample is parsed using the modified preset information item and its description information to obtain a modified file format, and the original file format is replaced by the modified file format.

6. The method for generating a shipping document for a wafer product according to claim 1, wherein: After the file sample is parsed using the preset information item and its description information to obtain a file format, and the file format is named with the file format name, the method further includes: Obtain a name modification command and a new file format name configured for the file sample; In response to the name modification command, the file format is renamed with the new file format name.

7. The method for generating a shipping document for a wafer product according to claim 1, wherein: The preset information items include one or more of product name, product number, batch number, number of tested products, direction of marker, position of test result graph, defect rate, and defect identifier.

8. The method for generating a shipping document for a wafer product according to claim 1, wherein: After generating the product shipping file, the method further includes: Store the product shipping file in the specified path.

9. A computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the method for generating a shipping document for a wafer product according to any one of claims 1 to 8 is implemented.

10. A computer device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the processor executes the computer program, the method for generating a shipping document for a wafer product according to any one of claims 1 to 8 is implemented.

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